Wheel speed sensor simulation method, device, equipment and storage medium

Abstract

The present application relates to a wheel speed sensor simulation method, device, equipment and storage medium, which are applied in the field of automobile manufacturing technology, including obtaining wheel speed sensor configuration information, wherein the wheel speed sensor configuration information includes configuration information for simulating three types of wheel speed sensors; in response to a wheel speed cycle interruption signal, judging the type of wheel speed sensor to be simulated according to the wheel speed sensor configuration information, and outputting the corresponding wheel speed sensor signal according to the judgment result. The technical effect of the present application is: using a wheel speed sensor simulator to replace the actual wheel speed sensor actual vehicle rotation test, simulating the wheel speed sensor signal and various fault information in the actual vehicle test, improving the test efficiency, reducing the test cost, etc.

Description

Technical Field

[0001] The present application relates to the field of automobile manufacturing technology, and in particular to a wheel speed sensor simulation method, device, equipment and storage medium. Background Art

[0002] In the modern automobile manufacturing industry, the safety and reliability of automobiles are crucial factors, which are directly related to the life safety of passengers and the overall safety of road traffic. As an indispensable part of the automobile electronic control system, the wheel speed sensor is responsible for real-time monitoring of the wheel speed and transmitting this key information to the vehicle's braking system (such as ABS, ESP, One-Box, etc.) to ensure that the vehicle can maintain stable control and safety under various road conditions and driving conditions.

[0003] However, in the testing of vehicle braking systems (such as ABS, ESP, One-Box, etc.), real Hall wheel speed sensors are often installed, and rely on actual vehicle testing or simple simulation test platforms. Although actual vehicle testing can more realistically reflect the working status of sensors and braking systems; however, using real Hall wheel speed sensors for actual vehicle testing is difficult to simulate complex failure modes and dynamic changes under actual working conditions, thus affecting the test results of the vehicle. Summary of the invention

[0004] In order to help solve the problem that it is difficult to simulate complex failure modes and dynamic changes under actual working conditions when using real Hall wheel speed sensors for actual vehicle testing, which affects the test results of the vehicle, the present application provides a wheel speed sensor simulation method, device, equipment and storage medium.

[0005] In a first aspect, the present application provides a wheel speed sensor simulation method, which adopts the following technical solution: the method comprises:

[0006] Acquire wheel speed sensor configuration information, wherein the wheel speed sensor configuration information includes configuration information of three simulated wheel speed sensors;

[0007] In response to the wheel speed cycle interruption signal, the type of the wheel speed sensor to be simulated is determined according to the wheel speed sensor configuration information, and a corresponding wheel speed sensor signal is output according to the determination result.

[0008] In a specific implementation scheme, outputting a corresponding wheel speed sensor signal according to the judgment result includes:

[0009] If the wheel speed sensor to be simulated is the first or second wheel speed sensor, a high-level timing interrupt is started according to the wheel speed sensor configuration information, and a first wheel speed sensor signal is output;

[0010] If the wheel speed sensor to be simulated is the third type of wheel speed sensor, the second wheel speed sensor signal is output in units of half bits according to the wheel speed sensor configuration information.

[0011] In a specific implementation scheme, if the wheel speed sensor to be simulated is the first or second wheel speed sensor, then starting a high-level timing interrupt according to the wheel speed sensor configuration information and outputting a first wheel speed sensor signal includes:

[0012] Turn on the high-level timing interrupt and continuously output a high-level signal;

[0013] Determine whether the continuous output time of the high-level signal reaches the high-level timing interrupt;

[0014] If the high-level timing interrupt is reached, the high-level timing interrupt is turned off, and the low-level signal is continuously output until a wheel speed cycle ends.

[0015] In a specific implementation scheme, if the wheel speed sensor to be simulated is a third type of wheel speed sensor, then outputting the second wheel speed sensor signal in units of half bits according to the wheel speed sensor configuration information includes:

[0016] Converting the wheel speed sensor configuration information into half-bit data configuration information;

[0017] Enable half-bit time timing interrupt;

[0018] In response to the half-bit time timing interrupt signal, judging whether the current half-bit position signal is a speed pulse position signal according to the half-bit data configuration information;

[0019] If the current half-bit signal is a speed pulse signal, output a voltage signal corresponding to the speed pulse signal;

[0020] If the current half-bit signal is not a speed pulse signal, a corresponding voltage signal is output according to the value of the current half-bit signal.

[0021] In a specific implementation scheme, outputting a corresponding voltage signal according to the value of the current half-bit signal includes:

[0022] If the value of the current half-bit signal is 1, a high-level voltage signal is output;

[0023] If the value of the current half-bit signal is not 1, a low-level voltage signal is output.

[0024] In a specific implementation scheme, converting the wheel speed sensor configuration information into half-bit data configuration information includes:

[0025] Splitting one bit of data in the wheel speed sensor configuration information into half bits of data;

[0026] Among them, a one-bit data with a value of 1 is converted into two half-bit data with a value of 01, and a one-bit data with a value of 0 is converted into two half-bit data with a value of 10.

[0027] In a second aspect, the present application provides a wheel speed sensor simulation circuit, the wheel speed sensor simulation circuit comprising:

[0028] A main control chip, the main control chip is used to receive wheel speed sensor configuration information, and its output terminal outputs a voltage signal corresponding to the type of wheel speed sensor to be simulated;

[0029] A resistor R1 and a resistor R3 connected in series, the other end of the resistor R1 being connected to the output end of the main control chip;

[0030] A resistor R2, one end of the resistor R2 is connected to a connection point between the resistor R2 and the resistor R3, and the other end of the resistor R2 is grounded;

[0031] An operational amplifier U1, wherein the operational amplifier U1 has two input terminals and one output terminal, wherein the non-inverting input terminal is connected to the resistor R3, and the inverting input terminal is connected to the output terminal through the resistor R4;

[0032] NMOS tube Q1, whose gate is connected to the output end of the operational amplifier U1 through resistor R6, and whose source is grounded through current sampling resistor R7;

[0033] A resistor R5, one end of which is connected to the output end of the operational amplifier, and the other end of which is connected to the source of the NMOS transistor Q1;

[0034] A wheel speed sensor interface, wherein the VDD terminal of the wheel speed sensor interface is connected to the drain of the NMOS tube Q1, and the VSS terminal is grounded.

[0035] In a third aspect, the present application provides a wheel speed sensor simulation device, which adopts the following technical solution: the device comprises:

[0036] A configuration information acquisition module, used to acquire wheel speed sensor configuration information, wherein the wheel speed sensor configuration information includes configuration information of three simulated wheel speed sensors;

[0037] The wheel speed signal output module is used to respond to the wheel speed cycle interrupt signal, determine the type of the wheel speed sensor to be simulated according to the wheel speed sensor configuration information, and output the corresponding wheel speed sensor signal according to the determination result.

[0038] In a fourth aspect, the present application provides a computer device, which adopts the following technical solution: it includes a memory and a processor, and the memory stores a computer program that can be loaded by the processor and execute any of the above-mentioned wheel speed sensor simulation methods.

[0039] In a fifth aspect, the present application provides a computer-readable storage medium, which adopts the following technical solution: storing a computer program that can be loaded by a processor and execute any of the above-mentioned wheel speed sensor simulation methods.

[0040] In summary, this application has the following beneficial technical effects:

[0041] In the test application of vehicle braking system (such as ABS, ESP, One-Box, etc.), the wheel speed sensor simulator is used to replace the real wheel speed sensor in the actual vehicle rotation test. The simulator main control chip receives the wheel speed, rotation speed, fault and other information configured by the host computer, so as to simulate the wheel speed sensor signal and various fault information in the actual vehicle test, improve the test efficiency, reduce the test cost, etc. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] Figure 1 It is a schematic diagram for explaining the waveforms of the output signals of three wheel speed sensors;

[0043] Figure 2 is a structural diagram of a wheel speed sensor simulation circuit in an embodiment of the present application;

[0044] Figure 3 is a flow chart of a wheel speed sensor simulation method in an embodiment of the present application;

[0045] Figure 4 This is a schematic diagram of a complete workflow of a wheel speed sensor simulation in an embodiment of the present application;

[0046] Figure 5 is a schematic diagram of a wheel speed sensor simulation device in an embodiment of the present application;

[0047] Figure 6 It is a schematic diagram used to embody a computer device in an embodiment of the present application.

[0048] Reference numerals: 501, configuration information acquisition module; 502, wheel speed signal output module. DETAILED DESCRIPTION

[0049] The following combination Figure 1-Figure 6 This application is described in further detail.

[0050] The embodiment of the present application discloses a wheel speed sensor simulation method. The wheel speed sensor simulation circuit can be used as a wheel speed sensor simulator in the process of automobile testing. Different types of wheel speed sensors are configured by a host computer and relevant configuration information is transmitted to the wheel speed sensor simulator. The wheel speed sensor simulator outputs corresponding high and low level signals according to the configuration information to realize simulation testing. There are three commonly used wheel speed sensors, which can be divided into Type 1, Type 2 and Type 3. Figure 1 , the final output signals of Type1, Type2 and Type3 wheel speed sensors are all current modulation signals. The electronic control unit (ECU end) on the automobile system can obtain the wheel speed and additional information by parsing the current modulation information on the bus. Among them, Type2 and Type3 types have additional information. Type2 uses different T_H and T_L signals to modulate fixed additional information onto the bus, and Type3 uses fixed Manchester encoding to modulate additional information onto the bus. Both Type1 and Type2 wheel speed sensors have only two current modulation signals of 7mA and 14mA, while Type3 has three modulation current signals of 7mA, 14mA and 28mA. Type1 and Type2 are similar, and Type1 can be regarded as a variation of Type2 (T_H=T_L). The wheel speed sensor simulation circuit in the present application scheme is used as a wheel speed sensor simulator in the automobile testing process, which does not require actual vehicle testing or the use of a simulation test platform, thereby improving test efficiency and reducing test costs.

[0051] In the modern automobile manufacturing industry, the safety and reliability of automobiles are crucial factors, which are directly related to the life safety of passengers and the overall safety of road traffic. As an indispensable part of the automobile electronic control system, the wheel speed sensor is responsible for real-time monitoring of the wheel speed and transmitting this key information to the vehicle's braking system (such as ABS, ESP, One-Box, etc.) to ensure that the vehicle can maintain stable control and safety under various road conditions and driving conditions.

[0052] However, in the testing of vehicle braking systems (such as ABS, ESP, One-Box, etc.), real Hall wheel speed sensors are often installed, and rely on real vehicle testing or simple simulation test platforms. Although real vehicle testing can more realistically reflect the working status of sensors and braking systems; however, using real Hall wheel speed sensors for real vehicle testing or using simple simulation test platforms is difficult to simulate complex failure modes and dynamic changes under actual working conditions, and is costly and time-consuming. In addition, the simple simulation test platform has a single function, which may affect the test results of the car. In order to help improve the efficiency of automobile testing and reduce testing costs, the present application provides a wheel speed sensor simulation method, circuit, device, equipment and storage medium.

[0053] Reference Figure 2 A wheel speed sensor simulation circuit includes a main control chip. In the embodiment of the present application, the main control chip is CCFC3008PT. In actual application, the user can select the chip model according to the actual test situation. The main control chip is used to receive wheel speed sensor configuration information, and its output terminal outputs a voltage signal corresponding to the type of wheel speed sensor to be simulated; resistors R1 and R3 connected in series, and the other end of the resistor R1 is connected to the output end of the main control chip; resistor R2, one end of the resistor R2 is connected to the connection point of the resistor R2 and the resistor R3, and the other end is grounded; operational amplifier U1, the operational amplifier U1 has two input terminals and one output terminal, wherein the positive input terminal is connected to the resistor R3, and the negative input terminal is connected to the output terminal through the resistor R4; NMOS tube Q1, its gate is connected to the output terminal of the operational amplifier U1 through the resistor R6, and its source is grounded through the current sampling resistor R7; resistor R5, one end of the resistor R5 is connected to the output terminal of the operational amplifier, and the other end is connected to the source of the NMOS tube Q1; wheel speed sensor interface, the VDD end of the wheel speed sensor interface is connected to the drain of the NMOS tube Q1, and the VSS end is grounded.

[0054] The main control chip in the wheel speed sensor simulation circuit receives the control instructions of the host computer and realizes the information output of the sensor simulator. The wheel speed sensor simulation circuit uses NMOS tube Q1, current sampling resistor R7, and op amp U1 circuit to realize different wheel speed sensor I_sink current signals, where the current signal generated by NMOS tube Q1 and current sampling resistor R7 is the wheel speed sensor I_sink current signal. The main control chip DAC_AOUT outputs the voltage corresponding to different current signals, and generates current modulation signals corresponding to different types of sensors through the wheel speed sensor simulator; the output terminal DAC_AOUT of the main control chip outputs different voltage signals, which are input to the positive phase terminal of the op amp U1, and compared with the inverting input current acquisition signal of the op amp U1, driving the NMOS tube to work in the variable resistance area. Different DAC_AOUT input voltages have different on-resistances of the NMOS tube.

[0055] In the test application of vehicle braking system (such as ABS, ESP, One-Box, etc.), the wheel speed sensor simulator is used to replace the real wheel speed sensor in the actual vehicle rotation test. The simulator main control chip receives the wheel speed, rotation speed, fault and other information configured by the host computer, so as to simulate the wheel speed sensor signal and various fault information in the actual vehicle test, improve the test efficiency, reduce the test cost, etc.

[0056] Reference Figure 3 A wheel speed sensor simulation method is applied to the above wheel speed sensor simulation circuit, the method comprising the following steps:

[0057] S10, obtaining wheel speed sensor configuration information, where the wheel speed sensor configuration information includes configuration information of three simulated wheel speed sensors.

[0058] Specifically, the wheel speed sensor simulator composed of the above-mentioned wheel speed sensor simulation circuit is first powered on and initialized to make the wheel speed sensor simulator in a normal state. Then, the main control chip of the wheel speed sensor simulator receives the wheel speed sensor configuration information sent by the host computer in real time, and outputs the corresponding voltage signal according to the wheel speed sensor configuration information. After being processed by the wheel speed sensor simulation circuit, the output is a current modulation signal that can be used for vehicle testing.

[0059] Among them, the host computer can configure different information according to the type of wheel speed sensor, refer to Figure 1 Type 1 and Type 2 sensors have only two current modulation signals, 7mA and 14mA, while Type 3 has three current modulation signals, 7mA, 14mA and 28mA. The main control chip outputs different corresponding voltage signals according to the different current modulation signals received. The 7mA modulated current main control chip outputs a low-level signal, and the 14mA modulated current main control chip outputs a high-level signal. 28mA is the speed pulse signal bit in Type 3. After receiving the speed pulse signal bit, the main control chip can output the corresponding voltage signal according to the pre-set setting. The specific voltage value of the voltage signal can be set in advance by the user. The voltage values ​​corresponding to 7mA, 14mA and 28mA are set to what values. The main control chip outputs the corresponding voltage signal by analyzing and monitoring the current value to be output. Since Type 1 and Type 2 are similar, Type 1 can be regarded as a variation of Type 2 (T_H=T_L). Therefore, when the host computer configures the wheel speed sensor information, it configures 14mA T_H and the entire wheel speed cycle time length information for Type 1 and Type 2, and configures the additional information and wheel speed cycle time information sent for Type 3. The additional information can be understood as configuration information related to fault simulation.

[0060] S20, in response to the wheel speed cycle interruption signal, determining the type of the wheel speed sensor to be simulated according to the wheel speed sensor configuration information, and outputting a corresponding wheel speed sensor signal according to the determination result.

[0061] Specifically, the wheel speed sensor simulator is in a normal state. After receiving the sensor configuration information transmitted by the upper computer in real time, it first determines whether the wheel speed sensor simulator is in an enabled state. If it is not in an enabled state, the wheel speed sensor simulator is debugged until it is in an enabled state. After the wheel speed sensor simulator is in the enabled state, the wheel speed cycle timing interrupt is turned on. When the wheel speed cycle timing interrupt is reached, in response to the wheel speed cycle interrupt signal, the received wheel speed sensor configuration information is parsed to obtain the corresponding type of wheel speed sensor to be simulated, the type of wheel speed sensor is determined, and the corresponding wheel speed sensor signal is output according to the determination result.

[0062] It should be noted that the wheel speed sensing simulation method is applied to the main control chip of the wheel speed sensor simulator. The main control chip parses the relevant configuration information and outputs the corresponding voltage waveform through DAC_AOUT, and then uses the NMOS tube Q1, current sampling resistor R7, and operational amplifier U1 circuit in the circuit structure to output 7mA, 14mA or 28mA current modulation signals on the NMOS tube Q1 and the current sampling resistor R7. The current modulation signal is output through the wheel speed sensor interface P1 and acts on the system to be tested.

[0063] In this application, the wheel speed sensor is simulated by a wheel speed sensor simulator, and the designed wheel speed sensor simulator is connected to the system or device to be tested to realize the simulation test; the host computer is configured with relevant wheel speed information, including wheel speed, rotation speed and some fault simulation signals, so as to cover possible fault conditions, complex fault modes and dynamic changes in actual applications as much as possible. In addition, the use of a simulator can avoid the use of a real Hall wheel speed sensor and avoid real vehicle testing as much as possible, thereby saving test time, improving test efficiency and reducing test costs.

[0064] In one embodiment, the step of outputting the corresponding wheel speed sensor signal according to the judgment result may be specifically performed as follows:

[0065] If the wheel speed sensor to be simulated is the first or second wheel speed sensor, that is, if it is determined to be a Type 1 or Type 2 wheel speed sensor, the high-level timing interrupt is enabled according to the wheel speed sensor configuration information, and the first wheel speed sensor signal is output. Specifically, the high-level timing interrupt is enabled, and the high-level signal is continuously output; that is, the DAC_AOUT terminal of the main control chip continuously outputs a high-level signal, that is, a voltage signal corresponding to 14mA, and the timing interrupt of the end of the high-level signal output is enabled at the same time, which can also be understood as the end of the timer interrupt of the voltage output time (T_H) corresponding to 14mA.

[0066] After that, it is determined whether the continuous output time of the high-level signal reaches the high-level timing interrupt; if it reaches the high-level timing interrupt, the high-level timing interrupt is turned off, and the low-level signal is continuously output until a wheel speed cycle ends. It can also be understood that the DAC_AOUT terminal of the main control chip continuously outputs a low-level voltage signal corresponding to 7mA until a wheel speed cycle ends, and then enters the next wheel speed cycle. For Type 1 and Type 2 wheel speed sensors, the configuration information of the host computer mainly configures the 14mA T_H and the entire wheel speed cycle time length information. Therefore, according to the timer interrupt of the 14mA T_H and the timing interrupt of the entire wheel speed cycle, the voltage signal of the corresponding type of wheel speed sensor can be output, and the current modulation signal is finally output after being processed by the wheel speed sensor simulator.

[0067] If the wheel speed sensor to be simulated is the third type of wheel speed sensor, that is, if it is determined to be a Type 3 sensor, then according to the wheel speed sensor configuration information, the second wheel speed sensor signal is output in units of half bits. Specifically, the wheel speed sensor configuration information is converted into half-bit data configuration information; then, the half-bit time timing interrupt is turned on, that is, the half-bit time timing interrupt corresponding to tp / 2; the main control chip determines whether the half-bit time timing corresponding to tp / 2 has been reached. If the half-bit time timing corresponding to tp / 2 has been reached, then in response to the half-bit time timing interrupt signal, it determines whether the current half-bit position signal is a speed pulse position signal according to the half-bit data configuration information. Among them, the speed pulse position signal is also the Speed ​​Pulse position signal. The judgment of the Speed ​​Pulse position signal can be judged based on the initial bit position signal. For Type 3, in a wheel speed cycle, the first half-bit data sent is the initial bit position data, and the data immediately following the initial bit position is the Speed ​​Pulse position signal. The current of the Speed ​​Pulse position signal is 28mA.

[0068] Determine whether the current half-bit signal is a speed pulse signal. If the current half-bit signal is a speed pulse signal, then output the voltage signal corresponding to the speed pulse signal, that is, the DAC_AOUT terminal of the main control chip continuously outputs a level voltage signal corresponding to 28mA. The Speed ​​Pulse signal occupies 1 bit, and the duration of 1 bit is tp. If the current half-bit signal is not a speed pulse signal, then output the corresponding voltage signal according to the value of the current half-bit signal. Specifically, determine whether the current half-bit signal value is 1. If the current half-bit signal value is 1, then output a high-level voltage signal, that is, the DAC_AOUT terminal of the main control chip continuously outputs a high-level voltage signal corresponding to 14mA; if the current half-bit signal value is not 1, then output a low-level voltage signal, that is, the DAC_AOUT terminal of the main control chip continuously outputs a low-level voltage signal corresponding to 7mA.

[0069] Finally, since the number of half-bit signal bits in a wheel speed cycle has been pre-configured in the configuration information of the host computer, the host computer sends the half-bit signal data, and the main control chip receives and determines whether all the half-bit signals in the configuration information have been sent. If all the half-bit signals have been sent, the current wheel speed cycle ends and enters the next wheel speed cycle for a cycle. In the configuration information, the user can configure the number of times the simulator is enabled in advance. The configured number of times is also the number of cycles, and the user can freely configure it according to the actual test situation.

[0070] The step of converting the wheel speed sensor configuration information into half-bit data configuration information may be specifically performed as follows:

[0071] The one-bit data in the wheel speed sensor configuration information is divided into half-bit data, wherein the additional information Data in the configuration information is mainly converted into a half-bit signal. Specifically, a one-bit data with a value of 1 is converted into two half-bit data with a value of 01, and a one-bit data with a value of 0 is converted into two half-bit data with a value of 10; Figure 1 The conversion rule can be understood as cutting the 1-bit data (tp time) waveform into two half-bit (tp / 2) waveforms, converting Bit=1'b1 to half-Bit=2'b01, and converting Bit=1'b0 to half-Bit=2'b10.

[0072] In the present application scheme, the user can configure the relevant configuration information of the wheel speed sensor to be simulated in the host computer, and then transmit the configured information to the main control chip of the simulator. The main control chip can obtain the corresponding signal to be simulated by parsing the configuration information. The main control chip outputs the corresponding voltage signal and outputs the current modulation signal through the analog circuit structure, thereby simulating the wheel speed sensor signal and various fault information, thereby improving the test efficiency and reducing the test cost.

[0073] Reference Figure 4 , which is a schematic diagram of the complete workflow of the wheel speed sensor simulation in the embodiment of the present application. First, the wheel speed sensor simulation circuit is powered on and initialized, so that the wheel speed sensor simulation circuit is in a normal state, and the wheel speed sensor configuration information of the host computer is received to determine whether the simulator circuit is enabled. If it is in an enabled state, the wheel speed cycle timer interrupt is turned on to determine whether the wheel speed cycle interrupt has been reached. If the wheel speed cycle interrupt has been reached, the type of wheel speed sensor is determined. If it is Type 1 or Type 2, the DAC_AOUT terminal of the main control chip continuously outputs a voltage signal corresponding to 14mA, and turns on the T_H end timer interrupt. To determine whether the T_H end timer interrupt has been reached, the T_H end timer interrupt is turned off, and a voltage signal corresponding to 7mA is continuously output until a wheel speed cycle ends. If it is Type3, turn on the half-bit time timing interrupt corresponding to tp / 2, and judge whether the half-bit time timing interrupt corresponding to tp / 2 has arrived. If the half-bit time timing interrupt corresponding to tp / 2 has arrived, judge whether the signal is a Speed ​​Pulse signal. If it is a Speed ​​Pulse signal, the DAC_AOUT terminal of the main control chip continuously outputs a voltage signal corresponding to 28mA. If it is not a Speed ​​Pulse signal, judge whether the current half-bit signal value is 1. If the current half-bit signal value is 1, the DAC_AOUT terminal of the main control chip continuously outputs a high-level voltage signal corresponding to 14mA; if the current half-bit signal value is not 1, the DAC_AOUT terminal of the main control chip continuously outputs a low-level voltage signal corresponding to 7mA. Finally, judge whether all half-bit signals have been sent. If all half-bit signals have been sent, the current wheel speed cycle ends and enters the next wheel speed cycle for circulation.

[0074] Figure 3 FIG. 1 is a flow chart of a wheel speed sensor simulation method in one embodiment. It should be understood that although Figure 3 The steps in the flowchart are shown in sequence as indicated by the arrows, but the steps are not necessarily executed in the order indicated by the arrows; unless otherwise specified in this document, there is no strict order restriction for the execution of the steps, and the steps may be executed in other orders; and Figure 3At least part of the steps may include multiple sub-steps or multiple stages. These sub-steps or stages are not necessarily executed at the same time, but can be executed at different times. The execution order of these sub-steps or stages is not necessarily sequential, but can be executed in turn or alternately with other steps or at least part of the sub-steps or stages of other steps.

[0075] Based on the above method, an embodiment of the present application also discloses a wheel speed sensor simulation device.

[0076] Reference Figure 5 , the device includes the following modules:

[0077] The configuration information acquisition module 501 is used to acquire the wheel speed sensor configuration information, and the wheel speed sensor configuration information includes the configuration information of three simulated wheel speed sensors;

[0078] The wheel speed signal output module 502 is used to respond to the wheel speed cycle interrupt signal, determine the type of the wheel speed sensor to be simulated according to the wheel speed sensor configuration information, and output the corresponding wheel speed sensor signal according to the determination result.

[0079] In one embodiment, the wheel speed signal output module 502 is specifically used to enable a high-level timing interrupt and output a first wheel speed sensor signal according to the wheel speed sensor configuration information if the wheel speed sensor to be simulated is the first or second wheel speed sensor; if the wheel speed sensor to be simulated is the third wheel speed sensor, output a second wheel speed sensor signal in half-bit units according to the wheel speed sensor configuration information.

[0080] In one embodiment, the wheel speed signal output module 502 is specifically used to enable a high-level timing interrupt and continuously output a high-level signal; determine whether the continuous output time of the high-level signal reaches the high-level timing interrupt; if the high-level timing interrupt is reached, the high-level timing interrupt is disabled, and a low-level signal is continuously output until a wheel speed cycle ends.

[0081] In one embodiment, the wheel speed signal output module 502 is specifically used to convert the wheel speed sensor configuration information into half-bit data configuration information; start the half-bit time timing interrupt; in response to the half-bit time timing interrupt signal, determine whether the current half-bit position signal is a speed pulse position signal according to the half-bit data configuration information; if the current half-bit position signal is a speed pulse position signal, output the voltage signal corresponding to the speed pulse position signal; if the current half-bit position signal is not a speed pulse position signal, output the corresponding voltage signal according to the value of the current half-bit position signal.

[0082] In one embodiment, the wheel speed signal output module 502 is specifically configured to output a high level voltage signal if the value of the current half-bit signal is 1; and output a low level voltage signal if the value of the current half-bit signal is not 1.

[0083] In one embodiment, the wheel speed signal output module 502 is specifically used to divide one-bit data in the wheel speed sensor configuration information into half-bit data; wherein, a one-bit data with a value of 1 is converted into two half-bit data with a value of 01, and a one-bit data with a value of 0 is converted into two half-bit data with a value of 10.

[0084] The wheel speed sensor simulation device provided in the embodiment of the present application can be applied to the wheel speed sensor simulation method provided in the above embodiment. For relevant details, refer to the above method embodiment. The implementation principle and technical effect are similar and will not be repeated here.

[0085] It should be noted that: the wheel speed sensor simulation device provided in the embodiment of the present application only uses the division of the above-mentioned functional modules / functional units as an example when performing wheel speed sensor simulation. In actual applications, the above-mentioned functions can be assigned to different functional modules / functional units as needed, that is, the internal structure of the wheel speed sensor simulation device is divided into different functional modules / functional units to complete all or part of the functions described above. In addition, the implementation method of the wheel speed sensor simulation method provided in the above method embodiment and the implementation method of the wheel speed sensor simulation device provided in this embodiment belong to the same concept. The specific implementation process of the wheel speed sensor simulation device provided in this embodiment is detailed in the above method embodiment, which will not be repeated here.

[0086] The embodiment of the present application also discloses a computer device.

[0087] Specifically, if Figure 6As shown, the computer device can be a computer device such as a desktop computer, a laptop computer, a PDA, and a cloud server. The computer device may include, but is not limited to, a processor and a memory. The processor and the memory may be connected via a bus or other means. The processor may be a central processing unit (CPU). The processor may also be other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, graphics processors (GPU), embedded neural network processors (NPU) or other dedicated deep learning coprocessors, discrete gates or transistor logic devices, discrete hardware components and other chips, or a combination of the above chips.

[0088] As a non-transient computer-readable storage medium, the memory can be used to store non-transient software programs, non-transient computer executable programs and modules, such as program instructions / modules corresponding to the methods in the above-mentioned embodiments of the present application. The processor executes various functional applications and data processing of the processor by running the non-transient software programs, instructions and modules stored in the memory, that is, the method in the above-mentioned method implementation is realized. The memory may include a program storage area and a data storage area, wherein the program storage area may store an operating system, an application required for at least one function; the data storage area may store data created by the processor, etc. In addition, the memory may include a high-speed random access memory, and may also include a non-transient memory, such as at least one disk storage device, a flash memory device, or other non-transient solid-state storage device. In some embodiments, the memory may optionally include a memory remotely arranged relative to the processor, and these remote memories may be connected to the processor via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network and a combination thereof.

[0089] The embodiment of the present application also discloses a computer-readable storage medium.

[0090] Specifically, the computer-readable storage medium is used to store a computer program, and when the computer program is executed by the processor, the method in the above-mentioned method implementation is implemented. Those skilled in the art can understand that the implementation of all or part of the process in the above-mentioned implementation method of the present application can be completed by instructing the relevant hardware through a computer program, and the program can be stored in a computer-readable storage medium. When the program is executed, it may include the process of the implementation of the above-mentioned methods. Among them, the storage medium can be a disk, an optical disk, a read-only memory (ROM), a random access memory (RAM), a flash memory (Flash Memory), a hard disk (Hard Disk Drive, abbreviated: HDD) or a solid-state drive (SSD), etc.; the storage medium can also include a combination of the above-mentioned types of memory.

[0091] This specific embodiment is merely an explanation of the present invention and is not a limitation of the present invention. After reading this specification, those skilled in the art may make non-creative modifications to the present embodiment as needed. However, as long as they are within the scope of the claims of the present invention, they are protected by the patent law.

Claims

1. A wheel speed sensor simulation method, characterized in that: The method comprises: Acquire wheel speed sensor configuration information, wherein the wheel speed sensor configuration information includes configuration information of three simulated wheel speed sensors; In response to the wheel speed cycle interrupt signal, determining the type of the wheel speed sensor to be simulated according to the wheel speed sensor configuration information, and outputting a corresponding wheel speed sensor signal according to the determination result; Outputting the corresponding wheel speed sensor signal according to the judgment result includes: If the wheel speed sensor to be simulated is the first or second wheel speed sensor, a high-level timing interrupt is started according to the wheel speed sensor configuration information, and a first wheel speed sensor signal is output; If the wheel speed sensor to be simulated is the third type of wheel speed sensor, outputting a second wheel speed sensor signal in units of half bits according to the wheel speed sensor configuration information; If the wheel speed sensor to be simulated is the first or second wheel speed sensor, then starting a high-level timing interrupt according to the wheel speed sensor configuration information and outputting a first wheel speed sensor signal includes: Turn on the high-level timing interrupt and continuously output a high-level signal; Determine whether the continuous output time of the high-level signal reaches the high-level timing interrupt; If the high-level timing interrupt is reached, the high-level timing interrupt is turned off, and a low-level signal is continuously output until a wheel speed cycle ends; If the wheel speed sensor to be simulated is the third type of wheel speed sensor, then outputting the second wheel speed sensor signal in units of half bits according to the wheel speed sensor configuration information includes: Converting the wheel speed sensor configuration information into half-bit data configuration information; Enable half-bit time timing interrupt; In response to the half-bit time timing interrupt signal, judging whether the current half-bit position signal is a speed pulse position signal according to the half-bit data configuration information; If the current half-bit signal is a speed pulse signal, output a voltage signal corresponding to the speed pulse signal; If the current half-bit signal is not a speed pulse signal, the corresponding voltage signal is output according to the value of the current half-bit signal; The converting the wheel speed sensor configuration information into half-bit data configuration information comprises: Splitting one bit of data in the wheel speed sensor configuration information into half bits of data; Among them, a one-bit data with a value of 1 is converted into two half-bit data with a value of 01, and a one-bit data with a value of 0 is converted into two half-bit data with a value of 10.

2. The method according to claim 1, characterized in that: Outputting a corresponding voltage signal according to the value of the current half-bit signal includes: If the value of the current half-bit signal is 1, a high-level voltage signal is output; If the value of the current half-bit signal is not 1, a low-level voltage signal is output.

3. A wheel speed sensor simulation circuit, applied to the wheel speed sensor simulation method according to any one of claims 1 to 2, characterized in that: The wheel speed sensor simulation circuit comprises: A main control chip, the main control chip is used to receive wheel speed sensor configuration information, and its output terminal outputs a voltage signal corresponding to the type of wheel speed sensor to be simulated; A resistor R1 and a resistor R3 connected in series, the other end of the resistor R1 being connected to the output end of the main control chip; A resistor R2, one end of the resistor R2 is connected to a connection point between the resistor R2 and the resistor R3, and the other end of the resistor R2 is grounded; An operational amplifier U1, wherein the operational amplifier U1 has two input terminals and one output terminal, wherein the non-inverting input terminal is connected to the resistor R3, and the inverting input terminal is connected to the output terminal through the resistor R4; NMOS tube Q1, whose gate is connected to the output end of the operational amplifier U1 through resistor R6, and whose source is grounded through current sampling resistor R7; A resistor R5, one end of which is connected to the output end of the operational amplifier, and the other end of which is connected to the source of the NMOS transistor Q1; A wheel speed sensor interface, wherein the VDD terminal of the wheel speed sensor interface is connected to the drain of the NMOS tube Q1, and the VSS terminal is grounded.

4. A wheel speed sensor simulation device, applied to the wheel speed sensor simulation method according to any one of claims 1 to 2, characterized in that: The device comprises: A configuration information acquisition module (501) is used to acquire wheel speed sensor configuration information, wherein the wheel speed sensor configuration information includes configuration information of three simulated wheel speed sensors; The wheel speed signal output module (502) is used to respond to the wheel speed cycle interrupt signal, determine the type of the wheel speed sensor to be simulated according to the wheel speed sensor configuration information, and output the corresponding wheel speed sensor signal according to the determination result.

5. A computer device, characterized in that: The method comprises a memory and a processor, wherein the memory stores a computer program which can be loaded by the processor and execute the method according to any one of claims 1 to 2.

6. A computer-readable storage medium, characterized in that: A computer program is stored which can be loaded by a processor and execute the method as claimed in any one of claims 1 to 2.

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