A test device for an optoelectronic device

Abstract

The present invention discloses a test device for optoelectronic devices, which relates to the technical field of optoelectronic device test equipment. It includes a workbench, on the top of which a frame is fixedly connected. At the upper end of the frame, a stamping test piece is fixedly connected. It also includes: an intermittent feeding mechanism, an auxiliary test mechanism, and a follow-up protection mechanism. The intermittent feeding mechanism is used to intermittently feed the optoelectronic devices to be tested to the test position. The auxiliary test mechanism is used to press the end of the optoelectronic device during the test. The follow-up protection mechanism is used to shield the optoelectronic device from the outside during the test. Through the setting of the intermittent feeding mechanism, by using the cooperation between the dial rod and the straight groove and the arc groove on the intermittent plate, the intermittent feeding of the optoelectronic device can be realized. Compared with continuous feeding, this method can more precisely control the feeding timing and position, ensure that each device undergoes stamping tests at the optimal position, and reduce test errors or damages caused by improper positions.

Description

Technical Field

[0001] The present invention relates to the technical field of optoelectronic device testing equipment, and specifically relates to a testing device for optoelectronic devices. Background Art

[0002] In the prior art, optoelectronic devices are devices that convert optical signals into electrical signals or electrical signals into optical signals using principles such as the photoelectric effect. During the production process of optoelectronic devices, in order to evaluate their stability and reliability when subjected to mechanical shocks, ensure normal operation in actual applications, and avoid performance degradation or damage caused by shocks, it is usually necessary to conduct mechanical stamping tests on optoelectronic devices;

[0003] However, during the stamping test of optoelectronic devices by existing stamping test equipment for optoelectronic devices, a continuous feeding method is usually adopted. It is often difficult to precisely control the feeding timing and position of each optoelectronic device when the optoelectronic devices are moving. Due to factors such as mechanical vibration and friction during the feeding process, the position of the devices when they reach the test area is deviated, which in turn affects the accuracy and reliability of the test. The inaccuracy of the feeding position makes the optoelectronic devices unable to be in the optimal test position during the stamping test, resulting in a deviation between the data generated during the test and the actual performance, increasing the test error, and reducing the reference value of the test results;

[0004] In addition, during the stamping test process, traditional test procedures often rely on manual operation or simple mechanical structures to achieve the positioning and stamping test of the devices, which not only increases the probability of human error, but also if the optoelectronic devices are not correctly positioned and fixed, it is often necessary to conduct multiple repeated tests to ensure the reliability of the results, thereby increasing the test time, raising the test cost, reducing the overall test efficiency, and the deviation in position will also cause the optoelectronic devices to receive uneven impact forces, thus affecting the accuracy of the stamping test.

[0005] Therefore, in view of this, the present invention proposes a testing device for optoelectronic devices to make up for and improve the deficiencies of the prior art. Summary of the Invention

[0006] To solve the above technical problems, the present invention provides a testing device for optoelectronic devices to solve the corresponding technical problems raised in the above background art.

[0007] To achieve the above object, the technical solution adopted by the present invention is: a testing device for optoelectronic devices, including a workbench, a frame is fixedly connected to the top of the workbench, a stamping test piece is fixedly connected to the upper end of the frame, and further includes: an intermittent feeding mechanism, an auxiliary testing mechanism, and a follow-up protection mechanism, and the intermittent feeding mechanism, the auxiliary testing mechanism, and the follow-up protection mechanism are all arranged on the workbench;

[0008] The intermittent feeding mechanism is used to intermittently feed the optoelectronic device to be tested to the testing position;

[0009] The auxiliary testing mechanism is used to press the end of the optoelectronic device during the testing of the optoelectronic device;

[0010] The follow-up protection mechanism is used to shield the optoelectronic device from the outside during the testing of the optoelectronic device.

[0011] Preferably, the intermittent feeding mechanism includes a driving motor fixedly connected to the bottom of the workbench. The output end of the driving motor penetrates through the workbench and is fixedly connected with a rotating shaft. A turntable is fixedly connected to the outer surface of the rotating shaft. A crescent disk is fixedly connected to the outer surface of the upper end of the rotating shaft. A lever is fixedly connected to one side of the turntable towards the crescent disk and is offset from the center. A linkage shaft is rotatably connected to the top of the workbench. An intermittent plate is fixedly connected to the outer surface of the linkage shaft. Arc-shaped grooves are annularly and equidistantly formed on the outer surface of the intermittent plate. Straight grooves are formed between every two arc-shaped grooves on the outer surface of the intermittent plate.

[0012] Preferably, a driven plate is fixedly connected to the outer surface of the upper end of the linkage shaft. Fixed plates are annularly and equidistantly fixedly connected to the outer surface of the driven plate. A touch rod is fixedly connected to one side of the fixed plate away from the linkage shaft. A placement plate is fixedly connected to the top of the fixed plate. Frames are symmetrically and fixedly connected to the fixed plate. Card slots are symmetrically and equidistantly formed on the inner walls of both sides of the frame.

[0013] Preferably, the auxiliary testing mechanism includes a second fixing frame rotatably connected to the top of the linkage shaft. A first fixing frame is fixedly connected to the top of the workbench. U-shaped connecting frames are symmetrically and fixedly connected between the first fixing frame and the second fixing frame. Electric push rods are fixedly connected to both the first fixing frame and the second fixing frame. Sliding plates penetrate through and are slidably connected to the opposite ends of the first fixing frame and the second fixing frame, and the sliding plates are fixedly connected to the electric push rods.

[0014] Preferably, a moving frame is fixedly connected between the sliding plates. Side plates are symmetrically and fixedly connected to both the bottoms of both sides of the moving frame. A bidirectional reciprocating lead screw is rotatably connected between the same horizontal side plates. One of the bidirectional reciprocating lead screws penetrates through the side plate and is fixedly connected with a rotating rod. A transmission member is connected between the bidirectional reciprocating lead screws. Moving blocks are symmetrically threadedly connected to the outer surface of the bidirectional reciprocating lead screw, and the moving blocks are slidably connected to the bottom of the moving frame. A pressing plate is fixedly connected between the bottoms of the same vertical moving blocks.

[0015] Preferably, sliding columns are symmetrically and fixedly connected to both ends of the bottom of the pressing plate. Elastic telescopic columns are symmetrically and fixedly connected to the lower ends of the sliding columns, and bump blocks are fixedly connected to the opposite ends of the elastic telescopic columns.

[0016] Preferably, a mounting plate is fixedly connected to the lower end of the first fixing frame on a side facing the second fixing frame, a first switch is provided on the side of the mounting plate facing the second fixing frame, and the first switch is electrically connected to the stamping test piece.

[0017] Preferably, a horizontal plate is fixedly connected to the lower end of the stamping test piece, a telescopic rod is fixedly connected to the top of the first fixing frame and the second fixing frame, and the top of the telescopic rod is fixedly connected to the horizontal plate, a first vertical plate is fixedly connected to the top of the first fixing frame, a second switch is provided on the upper end of the first vertical plate facing the telescopic rod, and the second switch is electrically connected to the electric push rod.

[0018] Preferably, the follow-up protection mechanism includes an extension plate symmetrically fixedly connected to both sides of one of the slides, a first piston rod is fixedly connected to the bottom of the extension plate, a first piston cylinder is symmetrically fixedly connected to the top of the workbench with the first fixed frame as the center, and the first piston rod is movably connected to the first piston cylinder.

[0019] Preferably, the top of the workbench is symmetrically fixedly connected with a second vertical plate with the first fixed frame as the center, the upper end of the second vertical plate is penetrated and fixedly connected with a second piston cylinder, the second piston cylinder and the first piston cylinder are fixedly connected with an air cylinder, the second piston cylinder is movably connected to the end away from the air cylinder with a second piston rod, the end of the second piston rod away from the second vertical plate is fixedly connected to a V-shaped splash plate, the opposite side of the V-shaped splash plate is fixedly connected with a sliding rod, and the top of the sliding rod is slidably connected to the U-shaped connecting frame.

[0020] Compared with the prior art, the present invention has the following beneficial effects:

[0021] (1) By setting up an intermittent feeding mechanism and utilizing the cooperation between the lever and the straight and arc grooves on the intermittent plate, intermittent feeding of optoelectronic devices can be achieved. Compared with continuous feeding, this method can more accurately control the feeding timing and position, ensuring that each device is stamped and tested at the best position, reducing test errors or damage caused by improper position;

[0022] Among them, the fitting design of the crescent disk and the arc groove can make the feeding process have a certain adaptive adjustment ability. As the crescent disk rotates, its complete side can gradually approach and fit the arc groove, thereby ensuring that the intermittent plate can obtain stable rotational power every time it is turned, which helps to maintain the uniformity and stability of the feeding speed;

[0023] In addition, the precise fit between the lever and the straight groove on the intermittent plate ensures that the intermittent plate can be pushed stably during rotation, thereby driving the linkage shaft and the driven plate to rotate, reducing errors caused by friction or looseness and improving the accuracy and reliability of feeding.

[0024] (2) Through the setting of the auxiliary test mechanism, when the intermittent plate rotates intermittently to move the optoelectronic device to be tested under the stamping test piece, the contact rod touches the first switch synchronously to start the operation of the stamping test piece. When the stamping test piece is operating, the cross plate touches the second switch, causing the electric push rod to start synchronously, pulling the sliding plate and the moving frame downward, so that the moving frame arrives in place in advance before the stamping test piece contacts the optoelectronic device and presses and positions the optoelectronic device with the pressing plate provided at its bottom. This effectively avoids inaccurate testing or device damage caused by position deviation during the stamping test, reduces the number of repeated tests required due to inaccurate testing, saves testing time and costs, and improves testing efficiency;

[0025] Among them, by using the contact design between the contact rod and the first switch, the automatic linkage of feeding and test start can be realized. When the placement plate rotates under the stamping test piece, the contact rod automatically triggers the first switch to start the stamping test piece to perform stamping test on the optoelectronic device below, thus eliminating the need for manual intervention and improving testing efficiency;

[0026] In addition, while the pressing plate pre-presses and positions the optoelectronic device, the convex block on the sliding column can be pushed and locked into the card slot under the action of the elastic telescopic column, further fixing the position of the pressing plate. Thus, the close fit and positioning between the pressing plate and the optoelectronic device placed on the placement plate are realized, which not only enhances the stability of the pressing plate pressing the optoelectronic device, but also further effectively prevents the offset of the optoelectronic device during the stamping test;

[0027] Among them, the combined design of the cross plate provided on the stamping test piece and the telescopic rods on the two fixing frames, when the stamping test piece performs stamping test on the optoelectronic device below, due to the direct action of the impact force, large vibrations and impact forces will be generated. If these impact forces are directly transmitted to the two fixing frames, it will cause damage to the equipment structure and even affect the accuracy and stability of the test. The design of the telescopic rod allows it to contract when subjected to impact, thereby absorbing and dispersing part of the impact force, reducing the impact force directly transmitted to the fixing frame during the stamping process, playing a buffering role. Thus, through the intervention of the telescopic rod, the impact generated by the stamping test piece on the equipment itself during use can be reduced, protecting the equipment from damage and extending its service life;

[0028] Among them, the elastic telescopic column not only plays the role of pushing the protrusion into the slot, but also has a certain buffering and shock-absorbing effect. When the pressure plate contacts the surface of the optoelectronic device, the elastic telescopic column arranged under the pressure plate absorbs part of the impact caused by the downward pressure of the pressure plate, thereby reducing the impact force generated by the direct contact between the pressure plate and the surface of the optoelectronic device, protecting the optoelectronic device from damage, and in the process of the pressure plate's downward movement, through the precise control of the elastic telescopic column and the guiding effect of the sliding column downward into the frame, the pressure plate can be more accurately positioned on the surface of the optoelectronic device, ensuring the consistency and accuracy of the pressing position each time.

[0029] (3) By setting up a follow-up protection mechanism, while the pressing plate is used to press and fix the optoelectronic device, the first piston rod is driven to move downward synchronously, and the first piston rod is used to slide down in the first piston cylinder to push the gas and transmit it to the second piston cylinder through the gas cylinder, thereby pushing the second piston rod to slide the V-shaped splash plate toward the placement plate. The design can automatically and timely move the V-shaped splash plate to both sides of the optoelectronic device, effectively shielding the fragments flying out due to the rupture of the optoelectronic device during the stamping test, thereby protecting nearby workers from injury and improving the safety of the stamping test;

[0030] The design skillfully combines the first piston cylinder, the first piston rod, the gas cylinder, the second piston cylinder, the second piston rod and the V-shaped splash plate to form a system with a compact structure and strong linkage. This design not only reduces the space occupation, but also improves the collaborative working efficiency between the various components, so that the entire splash-proof process is completely completed automatically by the mechanical structure without manual intervention, which not only reduces the labor intensity of the staff, but also avoids the safety hazards caused by improper human operation.

[0031] Among them, the V-shaped structure design of the V-shaped splash plate can make it cover both sides of the placement plate more comprehensively, especially its sharp V-shaped tip can point to the area where debris is generated, effectively blocking the flying debris caused by the rupture of the optoelectronic device during the stamping test, and increasing the blocking range of the splash, reducing the potential damage to the surrounding personnel and equipment;

[0032] Among them, the V-shaped structure design also has good mechanical stability. When the V-shaped splash guard is impacted or hit by debris, the V-shaped design can better help disperse and absorb the impact force, reduce damage to the V-shaped splash guard itself, and reduce the risk of failure of the entire mechanism due to excessive local force;

[0033] In addition, the entire mechanism adopts a symmetric design. Components such as the slide plate, extension plate, first piston rod, first piston cylinder, and second piston cylinder are symmetrically arranged, which not only improves the overall stability of the mechanism but also enables each component to evenly share the load during the stress process, reducing the risk of deformation or damage caused by uneven stress.

[0034] (4) After the stamping of the optoelectronic device is completed, through the upward movement of the stamping test piece, the pressing on the optoelectronic device can be released, and at the same time, the V-shaped splash guard can be moved from both sides of the optoelectronic device to restore its initial position, and the next round of feeding and subsequent tests can be continued. By immediately releasing the pressing after the stamping test piece rises, the unnecessary time in the test cycle can be effectively reduced, making the entire test process more compact and efficient. At the same time, the rapid reset of the V-shaped splash guard also prepares for the next round of feeding and testing, avoiding unnecessary waiting time. Brief Description of the Drawings

[0035] Figure 1 Schematic diagram of the overall structure of a preferred embodiment shown in the present invention;

[0036] Figure 2 Schematic diagram of the split structure of the driven plate and the intermittent plate shown in the present invention;

[0037] Figure 3 As shown in the present invention Figure 2 Enlarged schematic diagram of part A;

[0038] Figure 4 As shown in the present invention Figure 2 Enlarged schematic diagram of part B;

[0039] Figure 5 Schematic diagram of the connection structure between the first fixing bracket and the second fixing bracket shown in the present invention;

[0040] Figure 6 As shown in the present invention Figure 5 Enlarged schematic diagram of part C;

[0041] Figure 7 Schematic diagram of the connection structure of the cross plate shown in the present invention;

[0042] Figure 8 As shown in the present invention Figure 7 Enlarged schematic diagram of part D;

[0043] Figure 9 Schematic diagram of the connection structure of the extension plate shown in the present invention.

[0044] The reference numerals in the figure are:

[0045] 1, workbench; 2, frame; 3, stamping test piece;

[0046] 4. Intermittent feeding mechanism; 401. Driving motor; 402. Rotating shaft; 403. Turntable; 404. Crescent disk; 405. Poking rod; 406. Linkage shaft; 407. Intermittent plate; 408. Arc groove; 409. Straight groove; 410. Driven plate; 411. Fixed plate; 412. Placing plate; 413. Frame; 414. Card slot; 415. Touch rod;

[0047] 5. Auxiliary testing mechanism; 501. First fixing bracket; 502. Second fixing bracket; 503. U-shaped connecting bracket; 504. Mounting plate; 505. First switch; 506. Electric push rod; 507. Slide plate; 508. Moving frame; 509. Side plate; 510. Rotating rod; 511. Bi-directional reciprocating lead screw; 512. Moving block; 513. Pressing plate; 514. Slide column; 515. Elastic telescopic column; 516. Convex block; 517. Cross plate; 518. Telescopic rod; 519. First vertical plate; 520. Second switch; 521. Transmission part;

[0048] 6. Follow-up protection mechanism; 601. Extension plate; 602. First piston rod; 603. First piston cylinder; 604. Air delivery cylinder; 605. Second piston cylinder; 606. Second vertical plate; 607. Second piston rod; 608. V-shaped splash guard; 609. Slide rod. Specific embodiments

[0049] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0050] Embodiments of the present invention:

[0051] Please refer to Figures 1 to 9 As shown, a testing device for optoelectronic devices includes a workbench 1. A machine frame 2 is fixedly connected to the top of the workbench 1, and a stamping test piece 3 is fixedly connected to the upper end of the machine frame 2. It further includes: an intermittent feeding mechanism 4, an auxiliary testing mechanism 5, and a follow-up protection mechanism 6, and the intermittent feeding mechanism 4, the auxiliary testing mechanism 5, and the follow-up protection mechanism 6 are all arranged on the workbench 1;

[0052] The intermittent feeding mechanism 4 is used to intermittently feed the optoelectronic devices to be tested to the testing position;

[0053] The auxiliary testing mechanism 5 is used to press the end of the optoelectronic device during the testing of the optoelectronic device;

[0054] The follow-up protection mechanism 6 is used to shield the optoelectronic device from the outside during the testing of the optoelectronic device;

[0055] The intermittent feeding mechanism 4 includes a driving motor 401 fixedly connected to the bottom of the workbench 1. The output end of the driving motor 401 penetrates through the workbench 1 and is fixedly connected with a rotating shaft 402. A turntable 403 is fixedly connected to the outer surface of the rotating shaft 402. A crescent disk 404 is fixedly connected to the outer surface of the upper end of the rotating shaft 402. A dial rod 405 is fixedly connected to one side of the turntable 403 towards the crescent disk 404 and is offset from the center. A linkage shaft 406 is rotatably connected to the top of the workbench 1. An intermittent plate 407 is fixedly connected to the outer surface of the linkage shaft 406. Arc-shaped grooves 408 are annularly and equidistantly formed on the outer surface of the intermittent plate 407. Straight grooves 409 are formed between every two arc-shaped grooves 408 on the outer surface of the intermittent plate 407.

[0056] A driven plate 410 is fixedly connected to the outer surface of the upper end of the linkage shaft 406. Fixing plates 411 are annularly and equidistantly fixedly connected to the outer surface of the driven plate 410. A contact rod 415 is fixedly connected to one side of the fixing plate 411 away from the linkage shaft 406. A placing plate 412 is fixedly connected to the top of the fixing plate 411. Frames 413 are symmetrically and fixedly connected to the fixing plate 411. Card slots 414 are symmetrically and equidistantly formed on the inner walls of both sides of the frame 413.

[0057] The effects achieved by this embodiment are as follows: Compared with the prior art, through the setting of the intermittent feeding mechanism 4, by using the cooperation of the dial rod 405 with the straight grooves 409 and arc-shaped grooves 408 on the intermittent plate 407, intermittent feeding of optoelectronic devices can be realized. This method can more precisely control the feeding timing and position compared with continuous feeding, ensuring that each device is subjected to stamping tests at the optimal position and reducing test errors or damages caused by improper positions.

[0058] Further embodiments:

[0059] Please refer to Figures 1 to 9 As shown, the auxiliary testing mechanism 5 includes a second fixing frame 502 rotatably connected to the top of the linkage shaft 406. A first fixing frame 501 is fixedly connected to the top of the workbench 1. U-shaped connecting frames 503 are symmetrically and fixedly connected between the first fixing frame 501 and the second fixing frame 502. Electric push rods 506 are fixedly connected to both the first fixing frame 501 and the second fixing frame 502. Slide plates 507 penetrate through and are slidably connected to the opposite ends of the first fixing frame 501 and the second fixing frame 502, and the slide plates 507 are fixedly connected to the electric push rods 506.

[0060] A moving frame 508 is fixedly connected between the skateboards 507. Symmetrically and fixedly connected to the bottoms of both sides of the moving frame 508 are side plates 509. A bi-directional reciprocating lead screw 511 is rotatably connected between the same horizontal side plates 509. One of the bi-directional reciprocating lead screws 511 passes through the side plate 509 and is fixedly connected to a rotating rod 510. A transmission member 521 is connected between the bi-directional reciprocating lead screws 511. Symmetrically threadedly connected to the outer surface of the bi-directional reciprocating lead screw 511 are moving blocks 512, and the moving blocks 512 are slidably connected to the bottom of the moving frame 508. A pressing plate 513 is fixedly connected between the bottoms of the same longitudinal moving blocks 512;

[0061] Symmetrically and fixedly connected to both ends of the bottom of the pressing plate 513 are sliding columns 514. Symmetrically and fixedly connected to the lower ends of the sliding columns 514 are elastic telescopic columns 515, and opposite ends of the elastic telescopic columns 515 are fixedly connected with bump blocks 516;

[0062] Fixedly connected to the lower end of the side of the first fixing frame 501 facing the second fixing frame 502 is a mounting plate 504. A first switch 505 is arranged on the side of the mounting plate 504 facing the second fixing frame 502, and the first switch 505 is electrically connected to the stamping test piece 3;

[0063] Fixedly connected to the lower end of the stamping test piece 3 is a cross plate 517. Telescopic rods 518 are fixedly connected to the tops of both the first fixing frame 501 and the second fixing frame 502, and the tops of the telescopic rods 518 are fixedly connected to the cross plate 517. Fixedly connected to the top of the first fixing frame 501 is a first vertical plate 519. A second switch 520 is arranged at the upper end of the side of the first vertical plate 519 facing the telescopic rod 518, and the second switch 520 is electrically connected to the electric push rod 506.

[0064] The effects achieved by this embodiment are as follows: Compared with the prior art, through the setting of the auxiliary test mechanism 5, when the intermittent plate 407 intermittently rotates to move the optoelectronic device to be tested below the stamping test piece 3, the contact rod 415 synchronously touches the first switch 505 to start the operation of the stamping test piece 3. When the stamping test piece 3 is operating, by touching the second switch 520 with the cross plate 517, the electric push rod 506 is synchronously started to pull the skateboard 507 and the moving frame 508 downward, so that the moving frame 508 arrives in place in advance before the stamping test piece 3 contacts the optoelectronic device and uses the pressing plate 513 arranged at its bottom to press and position the optoelectronic device. Thus, it effectively avoids inaccurate testing or device damage caused by position deviation during the stamping test, reduces the number of repeated tests required due to inaccurate testing, saves testing time and costs, and improves testing efficiency.

[0065] A further embodiment:

[0066] Please refer to Figures 1 to 9As shown in the figure, the follow-up protection mechanism 6 includes extension plates 601 symmetrically and fixedly connected to both sides of one of the sliding plates 507. A first piston rod 602 is fixedly connected to the bottom of the extension plate 601. The top of the workbench 1 is symmetrically and fixedly connected with first piston cylinders 603 centered on the first fixing frame 501, and the first piston rod 602 is movably connected to the first piston cylinders 603;

[0067] The top of the workbench 1 is also symmetrically and fixedly connected with second vertical plates 606 centered on the first fixing frame 501. A second piston cylinder 605 is fixedly connected through the upper end of the second vertical plate 606. An air delivery cylinder 604 is fixedly connected between the second piston cylinder 605 and the first piston cylinder 603. A second piston rod 607 is movably connected to one end of the second piston cylinder 605 away from the air delivery cylinder 604. A V-shaped splash guard 608 is fixedly connected to one end of the second piston rod 607 away from the second vertical plate 606. Slide rods 609 are fixedly connected to opposite sides of the V-shaped splash guard 608, and the tops of the slide rods 609 are slidably connected to the U-shaped connecting frame 503.

[0068] The effects achieved by this embodiment are as follows: Compared with the prior art, through the setting of the follow-up protection mechanism 6, while using the pressing plate 513 to press and fix the optoelectronic device, the first piston rod 602 is synchronously driven to descend and move. By using the downward slide of the first piston rod 602 in the first piston cylinder 603, the gas is pushed and transported to the second piston cylinder 605 through the air delivery cylinder 604, and then the second piston rod 607 is pushed to make the V-shaped splash guard 608 slide towards the placement plate 412. This design can automatically and timely move the V-shaped splash guard 608 to both sides of the optoelectronic device, effectively blocking the fragments flying out due to the rupture of the optoelectronic device during the stamping test, thereby protecting the nearby staff from harm and improving the safety of the stamping test.

[0069] The complete usage steps and working principle of the above embodiment are as follows:

[0070] The following is the working process of the intermittent feeding mechanism 4 intermittently feeding the optoelectronic device to be tested to the test location:

[0071] During the stamping test of the optoelectronic device, first, the optoelectronic device to be tested can be placed on the placement plate 412. Subsequently, through the set driving motor 401, the rotating shaft 402 fixedly connected to its output end can be driven to rotate synchronously on the workbench 1, as Figure 2 and Figure 4As shown, the outer surface of the upper end of the rotating shaft 402 is fixedly connected with the crescent plate 404 and the rotating disk 403 in sequence from top to bottom, and the top of the rotating disk 403 is fixedly provided with a lever 405 eccentrically. A linkage shaft 406 is also rotatably provided on the workbench 1, and the outer surface of the linkage shaft 406 is fixedly connected with the intermittent plate 407. The outer surface of the intermittent plate 407 is annularly provided with arc grooves 408 at equal intervals, and a straight groove 409 adapted to the lever 405 is provided between every two arc grooves 408. When the rotating shaft 402 rotates, it can drive the rotating disk 403 to rotate synchronously, and drive the lever 405 thereon to rotate with the rotating shaft 402 as the axis. When the lever 405 rotates, the lever 405 will enter the inside of the straight groove 409. As the lever 405 continues to move The intermittent plate 407 can be driven by the straight groove 409 to provide a pushing force to the intermittent plate 407, so that the intermittent plate 407 can rotate synchronously on the workbench 1 in coordination with the linkage shaft 406. At the same time, when the rotating shaft 402 rotates to drive the turntable 403 to rotate, the crescent plate 404 rotates synchronously. At this time, the side of the crescent plate 404 with the notch will gradually move away from the intermittent plate 407, and as the lever 405 moves the intermittent plate 407, the complete side of the crescent plate 404 will gradually rotate toward the direction of the intermittent plate 407, and finally make the outer surface of the crescent plate 404 fit with the arc groove 408. When the crescent plate 404 fits with the arc groove 408, the lever 405 has rotated the intermittent plate 407 once. Figure 1 and Figure 2 As shown, with the rotation of the intermittent plate 407, the driven plate 410 installed on the outer surface of the upper end of the linkage shaft 406 rotates synchronously, so that the position of the fixed plate 411 arranged on the outer side thereof is replaced, and the optoelectronic device to be tested placed on the top of the placement plate 412 is rotated and sent to the bottom of the stamping test piece 3 in turn, so as to realize the intermittent feeding of the optoelectronic device. The whole feeding system is driven by a single driving motor 401, and through the chain reaction of the rotating shaft 402, the turntable 403, the lever 405 and other components, the linkage shaft 406 and the driven plate 410 are finally driven to rotate, so as to realize the effective transmission of power, greatly simplify the power transmission path, reduce energy loss, and improve the overall efficiency of the system. Through the cooperation of the lever 405 with the straight groove 409 and the arc groove 408 on the intermittent plate 407, the intermittent feeding of the optoelectronic device is realized. Compared with continuous feeding, this method can more accurately control the feeding timing and position, ensure that each device is stamped at the best position for testing, and reduce the test error or damage caused by improper position.

[0072] Please refer to the above working process Figures 1 to 9 .

[0073] The following is the working process of the auxiliary testing mechanism 5 pressing the end of the optoelectronic device during the test:

[0074] While the toggle lever 405 toggles the intermittent plate 407 to rotate, driving the placement plate 412 and the optoelectronic devices placed thereon to rotate and move under the stamping test piece 3, since the placement plate 412 is fixedly arranged on the fixed plate 411, and the outer surface of the fixed plate 411 is fixedly connected with a contact rod 415, thus while the fixed plate 411 rotates, the contact rod 415 will also move synchronously. As Figure 5 shown, at the lower end of the first fixing frame 501, there is an installation plate 504, and on the installation plate 504, there is a first switch 505 electrically connected to the stamping test piece 3. As the fixed plate 411 rotates, the contact rod 415 will eventually contact the first switch 505 and turn on the first switch 505, thereby starting the operation of the stamping test piece 3 to perform a stamping test on the optoelectronic devices to be tested placed on the lower placement plate 412 (during this process, by using the contact design between the contact rod 415 and the first switch 505, the automatic linkage of feeding and test start can be realized. When the placement plate 412 rotates under the stamping test piece 3, the contact rod 415 automatically triggers the first switch 505 to start the stamping test piece 3 to perform a stamping test on the lower optoelectronic devices, thus eliminating the need for manual intervention and improving the test efficiency). As Figure 7 and Figure 8 shown, since a cross plate 517 is fixedly connected to the stamping test piece 3, and telescopic rods 518 are fixedly arranged between both ends of the cross plate 517 and the tops of the first fixing frame 501 and the second fixing frame 502. During the process of the stamping test piece 3 downward impacting to perform a stamping test on the optoelectronic devices, the cross plate 517 moves downward synchronously, and the telescopic rods 518 contract synchronously (during this process, when the cross plate 517 moves downward driven by the stamping test piece 3, the telescopic rods 518 contract synchronously, which can play a buffering and stabilizing role, reduce the impact of the stamping test piece 3 on the equipment, protect the equipment from damage, and extend its service life). As Figure 5 shown, sliding plates 507 are slidably arranged through the first fixing frame 501 and the second fixing frame 502, electric push rods 506 are arranged on both the first fixing frame 501 and the second fixing frame 502, and the tops of the electric push rods 506 are fixedly connected to the bottoms of the sliding plates 507. Referring to Figure 7 , a first vertical plate 519 is fixedly connected to the top of the first fixing frame 501, and a second switch 520 electrically connected to the electric push rod 506 is arranged on the upper end of the first vertical plate 519 facing the side of the telescopic rod 518. During the process of the stamping test piece 3 driving the cross plate 517 to move downward, the cross plate 517 will touch the second switch 520 and turn on the second switch 520. At this time, the electric push rod 506 is started synchronously to pull the sliding plate 507 downward. Since a moving frame 508 is fixedly connected between the two sliding plates 507, as Figure 5 and Figure 6As shown, as the skateboard 507 is driven downward by the electric push rod 506, the moving frame 508 will also move downward synchronously (it should be noted here that the moving frame 508 is arranged below the stamping test piece 3. When the second switch 520 is turned on, the moving frame 508 will first approach the optoelectronic device below for subsequent contact pressing, and then the stamping test piece 3 will contact the optoelectronic device for stamping test. Therefore, when the cross plate 517 touches the second switch 520, the electric push rod 506 is started synchronously, pulling the skateboard 507 and the moving frame 508 downward. This design can ensure that before the stamping test piece 3 contacts the optoelectronic device, the moving frame 508 is in place first and the pressing plate 513 is used for pressing and positioning, avoiding position deviation during the test). Also, since side plates 509 are symmetrically and fixedly arranged at both ends of the bottom of the moving frame 508, a bidirectional reciprocating lead screw 511 is threadedly connected between the two horizontal side plates 509, and a moving block 512 is threadedly connected to the outer surface of the bidirectional reciprocating lead screw 511. A pressing plate 513 for pressing the surface of the optoelectronic device is fixedly connected between the bottoms of the two longitudinal moving blocks 512. During the downward movement of the moving frame 508, the pressing plate 513 gradually approaches the optoelectronic device on the lower placement plate 412, and under the action of the downward movement of the moving frame 508, it fits on the surface of the optoelectronic device and presses the optoelectronic device accordingly, as Figure 6 shown. Since sliding columns 514 are symmetrically and fixedly arranged at both ends of the bottom of the pressing plate 513, elastic telescopic columns 515 are symmetrically and fixedly connected to the lower ends of the sliding columns 514, and convex blocks 516 are fixedly arranged at the opposite ends of the elastic telescopic columns 515, as Figure 2 and Figure 3 shown. Frameworks 413 are symmetrically arranged on the fixed plate 411, and card slots 414 are symmetrically and equidistantly formed on the inner walls of both sides of the frameworks 413. While the pressing plate 513 moves downward to press the optoelectronic device placed on the placement plate 412, the sliding columns 514 will move into the interior of the frameworks 413. At this time, blocked and restricted by the side walls of the frameworks 413, the convex blocks 516 will be squeezed towards each other, causing the elastic telescopic columns 515 to contract. As the sliding columns 514 slide in, the convex blocks 516 will be pushed by the elastic force of the elastic telescopic columns 515 and snapped into the interior of the card slots 414, forming a clamping relationship between the convex blocks 516 and the card slots 414. At this time, the sliding columns 514 are positioned within the frameworks 413, enabling the pressing plate 513 to tightly press on the optoelectronic device, pressing and positioning the optoelectronic device, and avoiding the situation of the optoelectronic device shifting during the subsequent stamping test. This design enables the convex blocks 516 on the sliding columns 514 to be pushed and snapped into the card slots 414 under the action of the elastic telescopic columns 515, realizing the tight fitting and positioning between the pressing plate 513 and the optoelectronic device placed on the placement plate 412, thereby not only enhancing the stability of pressing but also further effectively preventing the optoelectronic device from shifting during the stamping test;

[0075] AsFigure 5 and Figure 6 As shown, one end of a bidirectional reciprocating lead screw 511 penetrates through the side plate 509 and is fixedly connected to a rotating rod 510. Before the stamping test, according to the size specifications of the optoelectronic device, the distance between the two pressing plates 513 can be adaptively adjusted. During adjustment, the staff can drive one of the bidirectional reciprocating lead screws 511 to rotate between the two side plates 509 by rotating the rotating rod 510. Since there is a transmission member 521 connected between the two bidirectional reciprocating lead screws 511 (it should be noted here that the transmission member 521 is composed of two transmission wheels and a transmission belt connected between the two transmission wheels, and the two transmission wheels are respectively fixedly connected to the outer surfaces of the two bidirectional reciprocating lead screws 511. When one of the bidirectional reciprocating lead screws 511 rotates, the transmission wheel fixedly installed on it rotates synchronously. Through the transmission connection of the transmission belt, the other transmission wheel can be driven to rotate synchronously with the other bidirectional reciprocating lead screw 511 installed on its axis. The synchronous rotation of the two bidirectional reciprocating lead screws 511 can be realized by the setting of the transmission member 521. When one bidirectional reciprocating lead screw 511 is rotated through the rotating rod 510, the other bidirectional reciprocating lead screw 511 will also rotate synchronously through the transmission of the transmission belt. This synchronous transmission mechanism ensures that the distances between the two pressing plates 513 can be adjusted simultaneously and evenly, improving the accuracy and efficiency of the adjustment), when driving one of the bidirectional reciprocating lead screws 511 to rotate through the rotating rod 510, through the transmission of the transmission member 521, the other bidirectional reciprocating lead screw 511 can be driven to rotate synchronously between the other two side plates 509. As the bidirectional reciprocating lead screw 511 rotates, the moving blocks 512 symmetrically thread-connected thereto move towards or away from each other synchronously along the outer surface of the bidirectional reciprocating lead screw 511. And because the pressing plate 513 is installed at the bottom of the moving block 512, the distance between the pressing plates 513 can be adjusted synchronously when controlling the movement of the moving block 512, so as to adapt to the optoelectronic device to be tested. By rotating the bidirectional reciprocating lead screw 511, the moving blocks 512 symmetrically thread-connected thereto can be controlled to move towards or away from each other. This design enables the distance between the pressing plates 513 to be flexibly adjusted according to the size specifications of the optoelectronic device, thus meeting the test requirements of different devices and making the test equipment more flexible and versatile. As Figure 3 shown, a plurality of card slots 414 are provided on the inner walls of both sides of the frame 413, which can facilitate the subsequent clamping with the convex blocks 516, thereby enhancing the structural stability;

[0076] After the stamping test of the optoelectronic device, the stamping test piece 3 retracts upward, causing the cross plate 517 to contact the second switch 520 again. At this time, the electric push rod 506 can be controlled to push the sliding plate 507 upward, so that the pressing plate 513 releases the pressing on the optoelectronic device, and finally realizes the reset of the pressing plate 513, so as to facilitate the rotation of the driven plate 410, so as to facilitate the stamping test of the optoelectronic device on the next placement plate 412. Among them, when the stamping test piece 3 retracts upward, the cross plate 517 contacts the second switch 520 again, triggering the electric push rod 506 to push the sliding plate 507 upward, so that the pressing plate 513 can quickly release the pressing on the optoelectronic device and reset, reducing the preparation time of the test and improving the overall test efficiency. And by timely resetting the pressing plate 513 after the test is completed, the potential interference to the subsequent test is reduced, so as to ensure that each test is carried out under the same initial conditions, thus improving the accuracy and comparability of the test;

[0077] Please refer to the above working process Figures 1 to 9 。

[0078] The following is the working process of the follow-up protection mechanism 6 to shield the optoelectronic device from the outside during the test of the optoelectronic device:

[0079] During the process of the moving frame 508 moving downward to drive the pressing plate 513 to perform a stamping test on the optoelectronic device on the lower placement plate 412, such as Figure 1 and Figure 9As shown, since extension plates 601 are symmetrically and fixedly arranged on both sides of one of the sliding plates 507, and a first piston rod 602 is fixedly arranged at the bottom of the extension plates 601, first piston cylinders 603 are symmetrically and fixedly arranged on the top of the workbench 1 with the first fixing frame 501 as the center. The first piston cylinders 603 and the first piston rod 602 are movably connected. Therefore, as the sliding plate 507 moves downward, the first piston rod 602 will synchronously slide downward in the first piston cylinder 603, pushing the gas inside the first piston cylinder 603. Since second vertical plates 606 are also symmetrically arranged on the top of the workbench 1 with the first fixing frame 501 as the center, second piston cylinders 605 are fixedly arranged through the second vertical plates 606, and an air delivery cylinder 604 is fixedly connected between the second piston cylinders 605 and the first piston cylinders 603. Therefore, when the first piston rod 602 moves downward and pushes the gas inside the second piston cylinder 605, these gases will be delivered into the second piston cylinder 605 through the air delivery cylinder 604. Also, since a second piston rod 607 is movably connected inside the second piston cylinder 605, and a V-shaped splash guard 608 is fixedly arranged at the other end of the second piston rod 607, and the V-shaped splash guard 608 is slidably connected to the U-shaped connecting frame 503 through a sliding rod 609. Therefore, in the process of the first piston rod 602 pushing the gas inside the first piston cylinder 603 into the second piston cylinder 605 through the air delivery cylinder 604, the second piston rod 607 can be driven to move away from the second piston cylinder 605 by the gas pushing effect, thereby driving the V-shaped splash guard 608 to slide in the direction of the placing plate 412 under the U-shaped connecting frame 503 through the sliding rod 609, and finally enabling the V-shaped splash guard 608 to move to both sides of the placing plate 412 (in this process, through the sliding of the first piston rod 602 in the first piston cylinder 603, mechanical energy can be converted into the pressure energy of the gas, and then these gases can be efficiently transmitted to the second piston cylinder 605 through the air delivery cylinder 604, and the pressure energy is converted into the mechanical energy of the second piston rod 607 again, thereby driving the V-shaped splash guard 608 to move. This gas pressure transmission method has a high energy conversion efficiency and reduces the energy loss during the transmission process), blocking the optoelectronic devices placed on the placing plate 412, thereby avoiding the safety hazards caused by the rupture of the optoelectronic devices and the flying out of fragments during the subsequent stamping test, and further protecting the nearby staff from being injured, improving the safety of the optoelectronic device stamping test. Moreover, the entire mechanism adopts a symmetric design, and components such as the sliding plate 507, extension plates 601, first piston rod 602, first piston cylinder 603, and second piston cylinder 605 are symmetrically arranged, which not only improves the overall stability of the mechanism but also enables each component to evenly share the load during the stress process, reducing the risk of deformation or damage caused by uneven stress;

[0080] Please refer to the above working process Figures 1 to 9 。

[0081] The circuits and controls involved in the present invention are all prior arts and will not be elaborated here.

[0082] Although the embodiments of the present invention have been shown and described, those of ordinary skill in the art can understand that various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principle and spirit of the present invention. The scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A test device for an optoelectronic device, comprising a workbench (1), a frame (2) fixedly connected to the top of the workbench (1), and a stamping test piece (3) fixedly connected to the upper end of the frame (2), characterized in that, It further includes: an intermittent feeding mechanism (4) for intermittently feeding the optoelectronic device to be tested to the testing position; an auxiliary testing mechanism (5) for pressing the end of the optoelectronic device during testing; a follow-up protection mechanism (6) for shielding the optoelectronic device from the outside during testing; the intermittent feeding mechanism (4) includes a driving motor (401) fixedly connected to the bottom of the workbench (1), the output end of the driving motor (401) penetrates through the workbench (1) and is fixedly connected to a rotating shaft (402), a turntable (403) is fixedly connected to the outer surface of the rotating shaft (402), a crescent disk (404) is fixedly connected to the outer surface of the upper end of the rotating shaft (402), a dial rod (405) is fixedly connected to one side of the turntable (403) deviating from the axis towards the crescent disk (404), a linkage shaft (406) is rotatably connected to the top of the workbench (1), an intermittent plate (407) is fixedly connected to the outer surface of the linkage shaft (406), arc-shaped grooves (408) are annularly and equidistantly formed on the outer surface of the intermittent plate (407), and straight grooves (409) are formed between every two arc-shaped grooves (408) on the outer surface of the intermittent plate (407); a driven plate (410) is fixedly connected to the outer surface of the upper end of the linkage shaft (406), fixing plates (411) are annularly and equidistantly fixedly connected to the outer surface of the driven plate (410), a contact rod (415) is fixedly connected to one side of the fixing plate (411) away from the linkage shaft (406), a placement plate (412) is fixedly connected to the top of the fixing plate (411), frames (413) are symmetrically and fixedly connected to the fixing plate (411), and clamping grooves (414) are symmetrically and equidistantly formed on the inner walls of both sides of the frame (413); the auxiliary testing mechanism (5) includes a second fixing frame (502) rotatably connected to the top of the linkage shaft (406), a first fixing frame (501) is fixedly connected to the top of the workbench (1), U-shaped connecting frames (503) are symmetrically and fixedly connected between the first fixing frame (501) and the second fixing frame (502), electric push rods (506) are fixedly connected to both the first fixing frame (501) and the second fixing frame (502), sliding plates (507) penetrate through and are slidably connected to the opposite ends of the first fixing frame (501) and the second fixing frame (502), and the sliding plates (507) are fixedly connected to the electric push rods (506).

2. The test device for an optoelectronic device according to claim 1, characterized in that, A moving frame (508) is fixedly connected between the skateboards (507). Symmetrically fixed to the bottom of both sides of the moving frame (508) are side plates (509). A bi-directional reciprocating lead screw (511) is rotatably connected between the same horizontal side plates (509). One of the bi-directional reciprocating lead screws (511) passes through the side plate (509) and is fixedly connected to a rotating rod (510). A transmission member (521) is drivingly connected between the bi-directional reciprocating lead screws (511). Symmetrically threadedly connected to the outer surface of the bi-directional reciprocating lead screw (511) are moving blocks (512), and the moving blocks (512) are slidably connected to the bottom of the moving frame (508). A pressing plate (513) is fixedly connected between the bottoms of the same vertical moving blocks (512).

3. The test device for an optoelectronic device according to claim 2, characterized in that, Symmetrically fixed to both ends of the bottom of the pressing plate (513) are sliding columns (514). Symmetrically fixed to the lower ends of the sliding columns (514) are elastic telescopic columns (515), and convex blocks (516) are fixedly connected to the opposite ends of the elastic telescopic columns (515).

4. The test device for an optoelectronic device according to claim 1, characterized in that, Fixedly connected to the lower end of the side of the first fixing frame (501) facing the second fixing frame (502) is a mounting plate (504). A first switch (505) is arranged on the side of the mounting plate (504) facing the second fixing frame (502), and the first switch (505) is electrically connected to the stamping test piece (3).

5. The test device for an optoelectronic device according to claim 4, wherein Fixedly connected to the lower end of the stamping test piece (3) is a cross plate (517). Telescopic rods (518) are fixedly connected to the tops of both the first fixing frame (501) and the second fixing frame (502), and the tops of the telescopic rods (518) are fixedly connected to the cross plate (517). Fixedly connected to the top of the first fixing frame (501) is a first vertical plate (519). A second switch (520) is arranged at the upper end of the side of the first vertical plate (519) facing the telescopic rod (518), and the second switch (520) is electrically connected to the electric push rod (506).

6. The test device for an optoelectronic device according to claim 1, characterized in that, The follow-up protection mechanism (6) includes extension plates (601) symmetrically and fixedly connected to both sides of one of the skateboards (507). Fixedly connected to the bottom of the extension plate (601) is a first piston rod (602). First piston cylinders (603) are symmetrically and fixedly connected to the top of the workbench (1) with the first fixing frame (501) as the center, and the first piston rod (602) is movably connected to the first piston cylinder (603).

7. The test device for an optoelectronic device according to claim 6, characterized in that, On the top of the workbench (1), second vertical plates (606) are symmetrically and fixedly connected with the first fixing frame (501) as the center. The upper ends of the second vertical plates (606) are fixedly connected through a second piston cylinder (605). An air delivery cylinder (604) is fixedly communicated between the second piston cylinder (605) and the first piston cylinder (603). A second piston rod (607) is movably connected to one end of the second piston cylinder (605) away from the air delivery cylinder (604). One end of the second piston rod (607) away from the second vertical plate (606) is fixedly connected with a V-shaped splash guard (608). Slide bars (609) are fixedly connected to the opposite sides of the V-shaped splash guard (608), and the tops of the slide bars (609) are slidably connected with a U-shaped connecting frame (503).

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