A three-phase switch test device

Abstract

The present disclosure provides a three-phase switch test device, comprising: an operation panel, on which a test wiring area is provided, and a plurality of wiring lead-out ports are provided in the test wiring area; a test module, comprising at least two switch test modules independent of each other; a matrix switching isolation circuit, comprising: a plurality of conductive lines, one end of the conductive line is connected to the corresponding switch test module, and the other end of the conductive line is connected to the corresponding wiring lead-out port, and a switch unit for controlling the on-off of the conductive line is provided in the conductive line; a control processor, for controlling each target switch unit corresponding to the target test item to be in a conducting state when a target test item needs to be performed on the three-phase switch to be tested, so that the target switch test module corresponding to the target test item is electrically connected to the three-phase switch to be tested through the conductive line to which each target switch unit belongs, and controlling the target switch test module to perform a corresponding test on the three-phase switch to be tested.

Description

Technical Field

[0001] The present disclosure relates to the technical field of electrical component testing, and in particular to a three-phase switch testing device. Background Art

[0002] Three-phase switches (such as AIS switches and GIS switches) are core components in the power grid field and need to be tested and maintained regularly to ensure their normal operation. With the increasing requirements for three-phase switch testing, the entire test process requires multiple test items for the three-phase switch. In the actual process, it is found that due to the single function of the existing switch test instruments, multiple instruments are often required when performing multiple test items. At the same time, the test process is cumbersome and manual wiring changes (switching different switch test instruments for testing) are frequent. Summary of the invention

[0003] The present disclosure aims to at least improve the technical problems in the prior art that the switch test instrument has a single function and needs to be manually changed frequently during the test process to switch between different switch test instruments.

[0004] In a first aspect, the present disclosure provides a three-phase switch test device, comprising:

[0005] An operation panel, wherein a test wiring area is provided on the operation panel, and a plurality of wiring lead-out ports are provided in the test wiring area, and the wiring lead-out ports are used to be connected to a three-phase switch to be tested;

[0006] A test module, comprising at least two switch test modules independent of each other;

[0007] A matrix switching isolation circuit, comprising: a plurality of conductive lines, one end of each conductive line is connected to the corresponding switch test module, the other end of each conductive line is connected to the corresponding wiring lead-out port, and a switch unit for controlling the on and off of each conductive line is provided in each conductive line;

[0008] A control processor is connected to each of the switch test modules and each of the switch units, and is used to control each of the target switch units corresponding to the target test items to be in an on state when a target test item needs to be performed on the three-phase switch to be tested, so that the target switch test modules corresponding to the target test items are electrically connected to the three-phase switch to be tested through the conductive lines to which each of the target switch units belongs, and to control the target switch test modules to perform corresponding tests on the three-phase switch to be tested.

[0009] In some embodiments, the at least two independent switch test modules include: an insulation resistance test module, a loop resistance test module, and a switch mechanical characteristic test module.

[0010] In some embodiments, the insulation resistance test module is configured with a line terminal and a first ground terminal;

[0011] The loop resistance test module is configured with: a positive current terminal, a positive voltage terminal, a negative voltage terminal and a negative current terminal;

[0012] The switch mechanical characteristics test module is configured with: A-phase positive voltage terminal, B-phase positive voltage terminal, C-phase positive voltage terminal, A-phase negative voltage terminal, B-phase negative voltage terminal, C-phase negative voltage terminal, positive DC power supply terminal, opening control terminal, closing control terminal and negative DC power supply terminal;

[0013] The multiple wiring lead-out ports include: A phase positive current lead-out port, A phase positive voltage lead-out port, A phase negative current lead-out port, A phase negative voltage lead-out port, B phase positive current lead-out port, B phase positive voltage lead-out port, B phase negative current lead-out port, B phase negative voltage lead-out port, C phase positive current lead-out port, C phase positive voltage lead-out port, C phase negative current lead-out port, C phase negative voltage lead-out port, positive DC power lead-out port, opening lead-out port, closing lead-out port, negative DC power lead-out port, auxiliary branch lead-out port, and earth lead-out port;

[0014] The line terminal is respectively connected to the A-phase positive voltage lead-out port, the B-phase positive voltage lead-out port, the C-phase positive voltage lead-out port, the auxiliary branch lead-out port, the positive DC power lead-out port, the opening lead-out port, the closing lead-out port, and the negative DC power lead-out port through different conductive lines;

[0015] The first grounding terminal is respectively connected to the A-phase negative voltage lead-out port, the B-phase negative voltage lead-out port, the C-phase negative voltage lead-out port, and the earth lead-out port through different conductive lines;

[0016] The positive current wiring terminal is respectively connected to the A-phase positive current lead-out port, the B-phase positive current lead-out port, and the C-phase positive current lead-out port through different conductive lines;

[0017] The positive voltage terminal is respectively connected to the A-phase positive voltage lead-out port, the B-phase positive voltage lead-out port, and the C-phase positive voltage lead-out port through different conductive lines;

[0018] The negative voltage terminal is respectively connected to the A-phase negative voltage lead-out port, the B-phase negative voltage lead-out port, and the C-phase negative voltage lead-out port through different conductive lines;

[0019] The negative current terminal is respectively connected to the A-phase negative current lead-out port, the B-phase negative current lead-out port, the C-phase negative current lead-out port, and the earth lead-out port through different conductive lines;

[0020] The A-phase positive voltage wiring terminal is connected to the A-phase positive voltage lead-out port via a corresponding conductive circuit;

[0021] The B-phase positive voltage wiring terminal is connected to the B-phase positive voltage lead-out port through a corresponding conductive circuit;

[0022] The C-phase positive voltage wiring terminal is connected to the C-phase positive voltage lead-out port via a corresponding conductive circuit;

[0023] The A-phase negative voltage wiring terminal is connected to the A-phase negative voltage lead-out port via a corresponding conductive circuit;

[0024] The B-phase negative voltage wiring terminal is connected to the B-phase negative voltage lead-out port through a corresponding conductive circuit;

[0025] The C-phase negative voltage wiring terminal is connected to the C-phase negative voltage lead-out port through a corresponding conductive circuit;

[0026] The positive DC power supply terminal is connected to the positive DC power supply lead-out port through a corresponding conductive circuit;

[0027] The switch-off control terminal is respectively connected to the switch-off lead-out port and the auxiliary switch-off lead-out port through different conductive lines;

[0028] The closing lead-out port is connected to the closing lead-out port through a corresponding conductive line;

[0029] The negative DC power supply terminal is connected to the negative DC power supply lead-out port through a corresponding conductive line.

[0030] In some embodiments, the A-phase positive voltage lead port, the A-phase negative voltage lead port, the B-phase positive voltage lead port, the B-phase negative voltage lead port, the C-phase positive voltage lead port and the C-phase negative voltage lead port are respectively connected to the earth lead port through corresponding first grounding control switches.

[0031] In some embodiments, the plurality of wiring lead-out ports further include: a sensor lead-out port, the sensor lead-out port is a multi-core aviation lead-out port, the switch mechanical characteristics test module is further configured with a plurality of sensor connection terminals, each of the sensor connection terminals is connected to a different core in the sensor lead-out port through a different conductive line;

[0032] And / or, the multiple wiring lead-out ports also include: a simulation lead-out port, the simulation lead-out port is a multi-core aviation lead-out port, and the switch mechanical characteristics test module is also configured with multiple simulation connection terminals, each of the simulation connection terminals is connected to a different core in the simulation lead-out port through a different conductive circuit.

[0033] In some embodiments, the control processor comprises:

[0034] A receiving unit, configured to receive a test request, wherein the test request records all target test items to be tested on the three-phase switch to be tested;

[0035] An arrangement unit, configured to arrange the order of the target test items to obtain a test item sequence according to the test requirement switch status corresponding to each of the target test items in the test request;

[0036] The test requirement switch state of each of the target test items is one of an open state, a closed state, switching from the closed state to the open state, switching from the open state to the closed state, switching from the open state to the closed state and then switching to the open state;

[0037] In the test item sequence, all the target test items whose test requirements are that the switch state is an open state are arranged successively, and all the target test items whose test requirements are that the switch state is a closed state are arranged successively;

[0038] The control unit is used to control the matrix switching isolation circuit and the test module to perform corresponding tests on the three-phase switch to be tested in sequence according to the test item sequence.

[0039] In some embodiments, in response to the initial switch state of the three-phase switch to be tested being an open state, the scheduling unit schedules the target test items in the test request according to the following steps:

[0040] Step S101, determining whether there is a target test item in the test request that the switch state is an open state;

[0041] If the judgment result of step S101 is yes, then execute step S102; if the judgment result of step S101 is no, then execute step S103;

[0042] Step S102, placing all the target test items whose test requirement switch state is the open state in the test item sequence in sequence, so as to update the test item sequence; after step S102 is completed, executing step S103;

[0043] Step S103, determining whether there is a target test item in the test request that requires the switch state to be switched from the open state to the closed state;

[0044] If the judgment result of step S103 is yes, then execute step S104; if the judgment result of step S103 is no, then execute step S105;

[0045] Step S104, placing one of the target test items whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence, so as to update the test item sequence; after step S104 is completed, executing step S105;

[0046] Step S105, determining whether there is a target test item in the test request that the switch state is a closed state;

[0047] If the judgment result of step S105 is yes, then execute step S106; if the judgment result of step S105 is no, then execute step S107;

[0048] Step S106, placing all the target test items whose test requirement switch state is the open state in sequence at the end of the test item sequence to update the test item sequence; after step S106 is completed, executing step S107;

[0049] Step S107, determining whether there is a target test item in the test request that requires the switch state to be switched from the closed state to the open state;

[0050] If the judgment result of step S107 is yes, then execute step S108; if the judgment result of step S107 is no, then execute step S113;

[0051] Step S108, placing one of the target test items whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S108 is completed, executing step S109;

[0052] Step S109, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the open state to the closed state;

[0053] If the judgment result of step S109 is yes, then execute step S110; if the judgment result of step S109 is no, then execute step S111;

[0054] Step S110, placing one of the target test items that is not placed in the test item sequence and whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence, so as to update the test item sequence; after step S110 is completed, executing step S107 again;

[0055] Step S111, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the closed state to the open state;

[0056] If the judgment result of step S111 is yes, then execute step S112; if the judgment result of step S111 is no, then execute step S115;

[0057] Step S112, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence, so as to update the test item sequence; after step S112, executing step S115;

[0058] Step S113, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the open state to the closed state;

[0059] If the judgment result of step S113 is yes, then execute step S114; if the judgment result of step S113 is no, then execute step S115;

[0060] Step S114, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence, so as to update the test item sequence;

[0061] Step S115, determining whether there is a target test item in the test request that switches from an open state to a closed state and then to an open state;

[0062] If the judgment result of step S115 is yes, then execute step S116; if the judgment result of step S115 is no, then execute step S117;

[0063] Step S116, placing all target test items that are switched from the open state to the closed state and then to the open state at the end of the test item sequence to update the test item sequence; after step S116 is completed, executing step S117;

[0064] Step S117: output the final test item sequence.

[0065] In some embodiments, in response to the initial switch state of the three-phase switch to be tested being a closed state, the scheduling unit schedules the target test items in the test request according to the following steps:

[0066] Step S201, determining whether there is a target test item in the test request that the switch state is a closed state;

[0067] If the judgment result of step S201 is yes, then execute step S202; if the judgment result of step S201 is no, then execute step S203;

[0068] Step S202, placing all the target test items whose test requirement switch state is the closed state in the test item sequence in sequence, so as to update the test item sequence; after step S202 is completed, executing step S203;

[0069] Step S203, determining whether there is a target test item in the test request that requires the switch state to be switched from the closed state to the open state;

[0070] If the judgment result of step S203 is yes, then execute step S204; if the judgment result of step S203 is no, then execute step S205;

[0071] Step S204, placing one of the target test items whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S204 is completed, executing step S205;

[0072] Step S205, determining whether there is a target test item in the test request that the switch state is changed from an open state to a test demand;

[0073] If the judgment result of step S205 is yes, then execute step S206; if the judgment result of step S205 is no, then execute step S207;

[0074] Step S206, placing all the target test items whose test requirement switch state is the closed state in sequence at the end of the test item sequence to update the test item sequence; after step S206 is completed, executing step S207;

[0075] Step S207, determining whether there is a target test item in the test request that requires the switch state to be switched from the open state to the closed state;

[0076] If the judgment result of step S207 is yes, then execute step S208; if the judgment result of step S207 is no, then execute step S213;

[0077] Step S208, placing one of the target test items whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence to update the test item sequence; after step S208 is completed, executing step S209;

[0078] Step S209, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the closed state to the open state;

[0079] If the judgment result of step S209 is yes, then execute step S210; if the judgment result of step S209 is no, then execute step S211;

[0080] Step S210, placing one of the target test items that is not placed in the test item sequence and whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S210 is completed, executing step S207 again;

[0081] Step S211, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the open state to the closed state;

[0082] If the judgment result of step S211 is yes, then execute step S212; if the judgment result of step S211 is no, then execute step S215;

[0083] Step S212, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence, so as to update the test item sequence; after step S212, executing step S215;

[0084] Step S213, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the closed state to the open state;

[0085] If the judgment result of step S213 is yes, then execute step S214; if the judgment result of step S213 is no, then execute step S215;

[0086] Step S214, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence, so as to update the test item sequence;

[0087] Step S215, determining whether there is a target test item in the test request that switches from an open state to a closed state and then to an open state;

[0088] If the judgment result of step S215 is yes, then execute step S216; if the judgment result of step S215 is no, then execute step S217;

[0089] Step S216, placing all target test items that are switched from the open state to the closed state and then to the open state at the end of the test item sequence to update the test item sequence; after step S216 is completed, executing step S217;

[0090] Step S217: output the final test item sequence.

[0091] In some embodiments, each test item is configured with a corresponding set of conductive switch units, and the conductive switch unit set records the switch units that need to be in a conductive state when performing the corresponding test item;

[0092] The arrangement unit sequentially places all the target test items whose test requirement switch state is the open state into the test item sequence according to the following steps:

[0093] Step Sa1, randomly selecting one of the target test items whose test requirement switch state is the open state, and placing it at the end of the test item sequence to update the test item sequence;

[0094] Step Sa2, determining whether the test request contains the target test item that is not included in the test item sequence and whose test requirement switch state is an open state;

[0095] If the judgment result of step Sa2 is yes, then step Sa3 is executed; if the judgment result of step Sa2 is no, then the process ends;

[0096] Step Sa3, taking each of the target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is the open switch state as the first test item to be scheduled, and calculating the set similarity between the set of on-switch units configured for each first test item to be scheduled and the set of on-switch units of the target test item at the end of the test item sequence;

[0097] Step Sa4, placing the first test item to be arranged, which has the largest set similarity with the target test item at the end of the test item sequence, at the end of the test item sequence to update the test item sequence; after step Sa4 is completed, executing step Sa2 again;

[0098] And / or, the arrangement unit sequentially places all the target test items whose test requirement switch state is the closed state into the test item sequence according to the following steps:

[0099] Step Sb1, randomly selecting one of the target test items whose test requirement switch state is the closed state, and placing it at the end of the test item sequence to update the test item sequence;

[0100] Step Sb2, determining whether the test request includes the target test item that is not included in the test item sequence and whose test requirement switch state is the closed state;

[0101] If the judgment result of step Sb2 is yes, then step Sb3 is executed; if the judgment result of step Sb2 is no, then the process ends;

[0102] Step Sb3, taking each of the target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is the closed state as the second test item to be scheduled, and calculating the set similarity between the set of conductive switch units configured for each second test item to be scheduled and the set of conductive switch units of the target test item at the end of the test item sequence;

[0103] Step Sb4, placing the second test item to be arranged which has the largest set similarity with the target test item at the end of the test item sequence at the end of the test item sequence to update the test item sequence; after step Sb4, executing step Sb2 again.

[0104] In some embodiments, it also includes:

[0105] A display module, arranged on the operation panel, for displaying the screen;

[0106] And / or, a communication module is connected to the control processor and is used for data communication between the control processor and an external device.

[0107] The present disclosure provides a three-phase switch test device. Since a plurality of switch test modules are integrated in the three-phase switch test device, the three-phase switch test device provided by the present disclosure can support more test items compared with a conventional single switch test module. In addition, due to the presence of a matrix switching isolation circuit and a control processor, it can support a plurality of test items on the three-phase switch to be tested when the three-phase switch test device and the three-phase switch to be tested are connected to each other only once. BRIEF DESCRIPTION OF THE DRAWINGS

[0108] Figure 1 A structural block diagram of a three-phase switch test device provided in an embodiment of the present disclosure;

[0109] Figure 2 A schematic diagram of the structure of the test module and the matrix switching isolation circuit in the embodiment of the present disclosure;

[0110] Figure 3 It is a schematic diagram of the three-phase current / voltage wiring lead-out port in the embodiment of the present disclosure being respectively connected to the A-phase switch, the B-phase switch and the C-phase switch in the three-phase switch through connecting wires;

[0111] Figure 4 It is a schematic diagram of the embodiment of the present disclosure in which the positive DC power lead port, the opening lead port, the closing lead port, the negative DC power lead port, and the auxiliary branch lead port are respectively connected to the control power supply circuit in the three-phase switch through connecting lines;

[0112] Figure 5 A schematic diagram of the structure of a control panel in an embodiment of the present disclosure;

[0113] Figure 6 It is a schematic diagram of the correspondence between each test item and the switch state of the test requirement, the switch test module, and the set of conductive switch units in the embodiment of the present disclosure. DETAILED DESCRIPTION

[0114] In order to enable those skilled in the art to better understand the technical solution of the present disclosure, the present disclosure is further described in detail below in conjunction with the accompanying drawings and specific implementation methods.

[0115] Unless otherwise defined, the technical terms or scientific terms used in the present disclosure should be understood by people with ordinary skills in the field to which the present disclosure belongs. The "first", "second" and similar words used in the present disclosure do not indicate any order, quantity or importance, but are only used to distinguish different components. Similarly, similar words such as "one", "one" or "the" do not indicate quantity restrictions, but indicate that there is at least one. Similar words such as "include" or "comprise" mean that the elements or objects appearing before the word cover the elements or objects listed after the word and their equivalents, without excluding other elements or objects. Similar words such as "connect" or "connected" are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. "Up", "down", "left", "right" and the like are only used to indicate relative positional relationships. When the absolute position of the described target changes, the relative positional relationship may also change accordingly.

[0116] In each of the accompanying drawings, identical elements are represented by similar reference numerals. For the sake of clarity, the various parts in the accompanying drawings are not all drawn to scale. In addition, some well-known parts may not be shown in the drawings.

[0117] Many specific details of the present disclosure are described below to provide a clearer understanding of the present disclosure. However, as those skilled in the art will appreciate, the present disclosure may be implemented without following these specific details.

[0118] Figure 1 This is a structural block diagram of a three-phase switch test device provided by an embodiment of the present disclosure. Figure 1 As shown, the three-phase switch test device includes: an operation panel, a test module, a matrix switching isolation circuit and a control processor.

[0119] Among them, a test wiring area is arranged on the operation panel, and a plurality of wiring lead-out ports are arranged in the test wiring area. The wiring lead-out ports are used to be connected to the three-phase switch to be tested.

[0120] The three-phase switch in the present disclosure may be an AIS switch or a GIS switch of 220 kV or less, and the three-phase switch includes an A-phase switch, a B-phase switch and a C-phase switch.

[0121] In the actual test process, it is necessary to connect different wiring lead-out ports to corresponding positions on the three-phase switch to be tested through multiple connecting wires in advance. This will be described later with reference to specific examples.

[0122] The test module includes at least two switch test modules that are independent of each other. In the present disclosure, the switch test module can be selected from some existing switch test modules, such as an insulation resistance test module, a loop resistance test module, and a switch mechanical characteristic test module.

[0123] Among them, the insulation resistance test module is used to perform at least one of the opening coil insulation resistance test, closing coil insulation resistance test, auxiliary branch coil insulation resistance test, switch break insulation test, switch body insulation test and phase-to-phase insulation test.

[0124] The loop resistance test module is used to perform at least one of an A-phase loop test, a B-phase loop test, and a C-phase loop test.

[0125] The switch mechanical characteristics test module is used to perform at least one of the switch opening and closing state judgment test, opening operation test, closing operation test, auxiliary opening operation test, energy storage test, opening mechanical characteristics test, closing mechanical characteristics test, closing mechanical characteristics test, auxiliary opening mechanical characteristics test, opening action voltage test, closing action voltage test, auxiliary opening action voltage test, opening non-tripping test, closing non-tripping test, auxiliary opening non-tripping test, opening coil DC resistance test, closing coil DC resistance test, and auxiliary opening coil DC resistance test.

[0126] In the present disclosure, the selected switch test module can be pre-selected according to actual test needs. The switch test module itself is not the inventive point of the present disclosure and is not described in detail here.

[0127] The matrix switching isolation circuit includes multiple conductive circuits, one end of which is connected to the corresponding switch test module, and the other end of which is connected to the corresponding wiring lead-out port. A switch unit for controlling the on and off of the conductive circuit is provided in the conductive circuit.

[0128] In the present disclosure, the number of conductive lines in the matrix switching isolation circuit is designed according to the number and type of switch test modules provided. The switch unit can realize fast and stable opening and closing switching, and the switch unit can be a digital switch or an analog switch.

[0129] The control processor is connected to each switch test module and each switch unit, and is used to control each target switch unit corresponding to the target test item to be in a conducting state (also referred to as a conducting state) when a target test item needs to be performed on the three-phase switch to be tested, so that the target switch test module corresponding to the target test item is electrically connected to the three-phase switch to be tested through the conductive lines belonging to each target switch unit, and controls the target switch test module to perform corresponding tests on the three-phase switch to be tested.

[0130] In the present disclosure, before testing, all switch units are in the cut-off state (also called the disconnected state) by default, that is, all conductive circuits are in the open circuit state, and all switch test modules remain cut off from the three-phase switch to be tested.

[0131] When a certain test item needs to be performed, the control processor can control the corresponding switch unit to be in the on state (other switch units remain in the off state) so that the corresponding switch test module is electrically connected to the three-phase switch to be tested (other switch test modules and the three-phase switch to be tested remain in the off state), and then the control processor controls the corresponding switch test module to perform the test. When other test items are required later, the control processor only needs to be used to control the corresponding switch unit in the matrix switching isolation circuit so that the corresponding switch test module is electrically connected to the three-phase switch to be tested, and control the corresponding switch test module to perform the test process.

[0132] In the present disclosure, since a plurality of switch test modules are integrated in the three-phase switch test device, the three-phase switch test device provided by the present disclosure can support more test items compared with a conventional single switch test module; in addition, due to the existence of the matrix switching isolation circuit and the control processor, it can support the three-phase switch to be tested. When the three-phase switch test device and the three-phase switch to be tested are connected once, many test items can be performed on the three-phase switch to be tested. Therefore, the technical solution of the present disclosure can effectively improve the technical problems existing in the prior art that the switch test instrument has a single function and needs to be manually frequently changed to switch different switch test instruments during the test process.

[0133] In some embodiments, all switch test modules integrated in the test module include: an insulation resistance test module, a loop resistance test module, and a switch mechanical characteristic test module. The insulation resistance test module, the loop resistance test module, and the switch mechanical characteristic test module are conventional test modules in the art, and the present disclosure does not describe their internal structures, test items, and specific processes of each test item.

[0134] Figure 2 A structural schematic diagram of a test module and a matrix switching isolation circuit in an embodiment of the present disclosure. Figure 3 This is a schematic diagram of an embodiment of the present disclosure in which the three-phase current / voltage wiring lead-out port is respectively connected to the A-phase switch, the B-phase switch and the C-phase switch in the three-phase switch through connecting wires. Figure 4 This is a schematic diagram of the positive DC power lead port, the opening lead port, the closing lead port, the negative DC power lead port, and the auxiliary branch lead port in the embodiment of the present disclosure being respectively connected to the control power supply circuit in the three-phase switch through connecting lines. Figure 5 FIG. 1 is a schematic diagram of a structure of a control panel in an embodiment of the present disclosure. Figures 2 to 5 As shown, in some embodiments, the insulation resistance test module is configured with: a line terminal L and a first ground terminal E. The loop resistance test module is configured with: a positive current terminal I+, a positive voltage terminal V+, a negative voltage terminal V- and a negative current terminal I-. The switch mechanical characteristics test module is configured with: a positive voltage terminal A+ for phase A, a positive voltage terminal B+ for phase B, a positive voltage terminal C+ for phase C, a negative voltage terminal A- for phase A, a negative voltage terminal B- for phase B, a negative voltage terminal C- for phase C, a positive DC power supply terminal KM+, a gate opening control terminal TQ, a gate closing control terminal HQ and a negative DC power supply terminal KM-.

[0135] The multiple wiring lead-out ports on the control panel include: A-phase positive current lead-out port IA+, A-phase positive voltage lead-out port VA+, A-phase negative current lead-out port IA-, A-phase negative voltage lead-out port VA-, B-phase positive current lead-out port IB+, B-phase positive voltage lead-out port VB+, B-phase negative current lead-out port IB-, B-phase negative voltage lead-out port VB-, C-phase positive current lead-out port IC+, C-phase positive voltage lead-out port VC+, C-phase negative current lead-out port IC-, C-phase negative voltage lead-out port VC-, positive DC power lead-out port PKM+, opening lead-out port PTQ, closing lead-out port PHQ, negative DC power lead-out port PKM-, auxiliary branch lead-out port PTQ', and ground lead-out port PG.

[0136] On the insulation resistance test module, the line terminal L is respectively connected to the A-phase positive voltage lead port VA+, the B-phase positive voltage lead port VB+, the C-phase positive voltage lead port VC+, the secondary branch lead port PTQ', the positive DC power lead port PKM+, the opening lead port PTQ, the closing lead port PHQ, and the negative DC power lead port PKM- through different conductive lines (the switch units included are KLA+, KLB+, KLC+, KLTQ', KLKM+, KLTQ, KLHQ, KLKM-), respectively; the first grounding terminal E is respectively connected to the A-phase negative voltage lead port VA-, the B-phase negative voltage lead port VB-, the C-phase negative voltage lead port VC-, and the earth lead port PG through different conductive lines (the switch units included are KEA-, KEB-, KEC-, KEG, respectively).

[0137] On the loop resistance test module, the positive current terminal I+ is connected to the A-phase positive current lead-out port IA+, the B-phase positive current lead-out port IB+, and the C-phase positive current lead-out port IC+ through different conductive circuits (the switch units included are KIA+, KIB+, and KIC+ respectively); the positive voltage terminal V+ is connected to the A-phase positive voltage lead-out port VA+, the B-phase positive voltage lead-out port VB+, and the C-phase positive voltage lead-out port VC+ through different conductive circuits (the switch units included are KVA+, KVB+, and KVC+ respectively); the negative The voltage terminal V- is connected to the A-phase negative voltage lead-out port VA-, the B-phase negative voltage lead-out port VB-, and the C-phase negative voltage lead-out port VC- through different conductive circuits (the switch units included are KVA-, KVB-, and KVC- respectively); the negative current terminal I- is connected to the A-phase negative current lead-out port IA-, the B-phase negative current lead-out port IB-, the C-phase negative current lead-out port IC-, and the ground lead-out port PG through different conductive circuits (the switch units included are KIA-, KIB-, KIC-, and KI- respectively).

[0138] On the switch mechanical characteristics test module, the A-phase positive voltage terminal A+ is connected to the A-phase positive voltage lead-out port VA+ through the corresponding conductive circuit (the switch unit included is KA+); the B-phase positive voltage terminal B+ is connected to the B-phase positive voltage lead-out port VB+ through the corresponding conductive circuit (the switch unit included is KB+); the C-phase positive voltage terminal C+ is connected to the C-phase positive voltage lead-out port VC+ through the corresponding conductive circuit (the switch unit included is KC+); the A-phase negative voltage terminal A- is connected to the A-phase negative voltage lead-out port VA- through the corresponding conductive circuit (the switch unit included is KA-); the B-phase negative voltage terminal B- is connected to the B-phase negative voltage lead-out port VB- through the corresponding conductive circuit (the switch unit included is KB-). The C-phase negative voltage terminal C- is connected to the C-phase negative voltage lead-out port VC- through the corresponding conductive circuit (the switch unit included is KC-); the positive DC power supply terminal KM+ is connected to the positive DC power supply lead-out port PKM+ through the corresponding conductive circuit (the switch unit included is KKM+); the opening control terminal TQ is respectively connected to the opening lead-out port PTQ and the auxiliary opening lead-out port PTQ' through different conductive circuits (the switch units included are KTQ and KTQ'); the closing control terminal HQ is connected to the closing lead-out port PHQ through the corresponding conductive circuit (the switch unit included is KHQ); the negative DC power supply terminal KM- is connected to the negative DC power supply lead-out port PKM- through the corresponding conductive circuit (the switch unit included is KKM-).

[0139] As an optional implementation scheme, the A-phase positive current lead-out port IA+ and the A-phase positive voltage lead-out port VA+ are respectively connected to the same conductive clamp through different connecting wires, and the conductive clamp clamps one end of the A-phase switch ( Figure 3 The upper end of the A-phase switch in the middle); the A-phase negative current lead port IA- and the A-phase negative voltage lead port VA- are connected to the same conductive clip through different connecting wires, and the conductive clip clamps the other end of the A-phase switch ( Figure 3 The lower end of the A phase switch in the middle).

[0140] The B-phase positive current lead port IB+ and the B-phase positive voltage lead port VB+ are connected to the same conductive clamp through different connecting wires, and the conductive clamp clamps one end of the B-phase switch ( Figure 3 The upper end of the B-phase switch in the middle); the B-phase negative current lead port IB- and the B-phase negative voltage lead port VB- are connected to the same conductive clip through different connecting wires, and the conductive clip clamps the other end of the B-phase switch ( Figure 3 The lower end of the B phase switch in the circuit breaker).

[0141] The C-phase positive current lead port IC+ and the C-phase positive voltage lead port VC+ are connected to the same conductive clip through different connecting wires, and the conductive clip clamps one end of the C-phase switch ( Figure 3 The upper end of the C-phase switch in the middle); the C-phase negative current lead port IC- and the C-phase negative voltage lead port VC- are connected to the same conductive clip through different connecting wires, and the conductive clip clamps the other end of the C-phase switch ( Figure 3 The lower end of the C phase switch in the circuit breaker).

[0142] See also Figure 4 As shown, the control power supply circuit in the three-phase switch includes: a closing control branch, an opening control branch and a sub-branch control branch, and the closing control branch, the opening control branch and the sub-branch control branch are connected in parallel between the positive DC supply line and the negative DC supply line. Among them, the positive DC power supply lead port PKM+ is connected to the positive DC supply line through a corresponding connecting line, and the negative DC power supply lead port PKM- is connected to the negative DC supply line through a corresponding connecting line.

[0143] The closing lead-out port PHQ is connected to the closing control branch through a corresponding connection line. Specifically, the closing control branch includes a closing control switch and a closing coil connected in series between the positive DC supply line and the negative DC supply line, and the closing lead-out port PHQ is connected between the closing control switch and the closing coil through a corresponding connection line.

[0144] The opening gate lead-out port PTQ is connected to the opening gate control branch through a corresponding connecting line. Specifically, the opening gate control branch includes an opening gate control switch and an opening gate coil connected in series between the positive DC supply line and the negative DC supply line, and the opening gate lead-out port PTQ is connected between the opening gate control switch and the opening gate coil through a corresponding connecting line.

[0145] The secondary branch lead-out port PTQ' is connected to the secondary branch control branch through a corresponding connection line. Specifically, the secondary branch control branch includes a secondary branch control switch and a secondary branch coil connected in series between the positive DC supply line and the negative DC supply line, and the secondary branch lead-out port PTQ' is connected between the secondary branch control switch and the secondary branch coil through a corresponding connection line.

[0146] In some embodiments, the A-phase positive voltage lead port VA+, the A-phase negative voltage lead port VA-, the B-phase positive voltage lead port VB+, the B-phase negative voltage lead port VB-, the C-phase positive voltage lead port VC+ and the C-phase negative voltage lead port VC- are respectively connected to the ground lead port PG through the corresponding first ground control switch KG1.

[0147] Different from the switch unit being in a normally off state, the first grounding control switch KG1 in the present disclosure is in a normally on state. That is, when no test is performed, the first grounding control switch KG1 is in an on state, so that the A-phase positive voltage lead port VA+, the A-phase negative voltage lead port VA-, the B-phase positive voltage lead port VB+, the B-phase negative voltage lead port VB-, the C-phase positive voltage lead port VC+ and the C-phase negative voltage lead port VC- are all electrically connected to the earth lead port PG, thereby preventing the above-mentioned voltage lead ports from accumulating high-voltage charges; when a test is required, the first grounding control switch KG1 is switched to an off state to ensure the normal conduct of the test.

[0148] In some embodiments, the insulation resistance test module is also configured with: a shielding connection terminal G; multiple wiring lead-out ports also include: a positive shielding voltage lead-out port PV+ and a negative shielding voltage lead-out port PV-; the shielding connection terminal G is connected to the positive shielding voltage lead-out port PV+ through a corresponding conductive line.

[0149] In some three-phase switches, two shielding contacts (not shown) are respectively configured on each phase switch. To this end, in the present disclosure, three pairs of shielding voltage lead-out ports corresponding to the A-phase switch, the B-phase switch and the C-phase switch can be provided on the operation panel (each pair of shielding voltage lead-out ports includes a positive shielding voltage lead-out port and a negative shielding voltage lead-out port), and then each pair of shielding voltage lead-out ports is respectively connected to the two shielding contacts in the corresponding A / B / C-phase switch through a connecting line.

[0150] Further optionally, the positive shielding voltage lead-out port and the negative shielding voltage lead-out port are respectively connected to the earth lead-out port PG through different second grounding control switches KG2. Similar to the first grounding control switch KG1, the second grounding control switch KG2 is also in a normally on state. That is, when no test is performed, the second grounding control switch KG2 is in an on state; when a test is required, the second grounding control switch KG2 is switched to an off state to ensure the normal conduct of the test.

[0151] In some embodiments, the switch mechanical characteristic test module is further configured with a common voltage terminal COM, which is connected to the ground lead port PG through a corresponding conductive line (the switch unit included is KCOM). Inside the switch mechanical characteristic test module, the common voltage terminal is electrically connected to the A-phase negative voltage terminal V-, the B-phase negative voltage connection terminal, and the C-phase negative voltage connection terminal.

[0152] In actual applications, some sensors (such as digital sensors or analog sensors such as photoelectric sensors and angle sensors) are set on the switch to be tested according to the test requirements to detect some characteristics of the three-phase switch. To cope with this scenario, in the present disclosure, the multiple wiring lead-out ports optionally include: a sensor lead-out port (i.e. Figure 5 The sensor lead-out port is a multi-core aviation lead-out port. The switch mechanical characteristics test module is also configured with multiple sensor connection terminals (not shown). Each sensor connection terminal is connected to a different core in the sensor lead-out port through a different conductive line.

[0153] In practical applications, the number of sensor connection terminals is determined by the switch mechanical characteristic test module itself. In the present disclosure, it is only necessary to ensure that the number of pins in the sensor lead-out port is greater than or equal to the number of sensor connection terminals.

[0154] In some embodiments, the plurality of wiring lead-out ports further include: an analog lead-out port (i.e. Figure 5 The analog lead-out port is a multi-core aviation lead-out port. The switch mechanical characteristics test module is also equipped with multiple analog connection terminals (not shown). Each analog connection terminal is connected to a different core in the analog lead-out port through a different conductive line. The analog connection terminal can simulate the voltage, current and other conditions in the actual power grid to test the performance of the three-phase switch under different working conditions.

[0155] In practical applications, the number of analog connection terminals is determined by the switch mechanical characteristic test module itself. In the present disclosure, it is only necessary to ensure that the number of cores in the analog lead-out port is greater than or equal to the number of analog connection terminals.

[0156] Figure 6 Schematic diagram of the corresponding relationship between each test item and the test requirement switch state, switch test module, and conductive switch unit set in the embodiment of the present disclosure. Figure 6 As shown, the corresponding relationship data can be manually pre-organized and stored in the control processor for use by the control processor. Each test item is configured with a corresponding set of conductive switch units, and the conductive switch unit set records the switch units that need to be in the conductive state when performing the corresponding test item.

[0157] In some embodiments, the control processor includes: a receiving unit, an orchestration unit, and a control unit.

[0158] The receiving unit is used to receive a test request, in which all target test items to be tested on the three-phase switch to be tested are recorded. The test request can be sent to the control processor by the user according to actual needs.

[0159] As an example, a three-phase switch test device is provided with a display module (e.g., a display screen) and an operation module (e.g., a mouse or a case), the display module is used for displaying images, and the operation module is used for users to operate. The display module and the operation module are provided on an operation panel, the display module can provide a list of all supported test items, and the user can select the test item he wants to perform from the list through the operation module, thereby generating a corresponding test request.

[0160] As another example, a communication module is provided in the three-phase switch test device, the communication module is connected to the control processor, and the communication module is used for data communication between the control processor and the external device. At this time, the external device can also be used to send a test request to the control processor.

[0161] Of course, the display module in the present disclosure can also display other content, such as displaying test results and displaying some pre-designed program interfaces. The communication module in the present disclosure can also be used for other data communications, such as controlling the processor to upload the test results to the server through the communication module. Examples are not given one by one here.

[0162] The arrangement unit is used to arrange the order of the target test items according to the test requirement switch states respectively corresponding to the target test items in the test request to obtain a test item sequence.

[0163] In the present disclosure, the test required switch state refers to the state of the three-phase switch to be tested that is required to be in during the process of performing the corresponding test items on the three-phase switch to be tested. Figure 6 As shown, the test requirement switch state of each target test item is one of the open state, closed state, switching from closed state to open state, switching from open state to closed state, switching from open state to closed state and then switching to open state. In the test item sequence, all target test items whose test requirement switch state is the open state are arranged successively, and all target test items whose test requirement switch state is the closed state are arranged successively.

[0164] In the present disclosure, the three-phase switch test device also supports the function of automatically arranging the order of test items. By arranging all target test items that require the switch state to be in the open state in sequence, and arranging all target test items that require the switch state to be in the closed state in sequence, the test items that require the three-phase switch to be tested to be in the open state can be performed continuously, and the test items that require the three-phase switch to be tested to be in the open state can be performed continuously. Such a design can effectively reduce the number of state switching times of the three-phase switch to be tested during the entire test process, which is beneficial to reducing the risk of damage to the three-phase switch to be tested due to frequent switching, and is beneficial to shortening the processing time of the entire test process.

[0165] The control unit is used to control the matrix switching isolation circuit and the test module to perform corresponding test items on the three-phase switch to be tested one by one according to the test item sequence.

[0166] In some embodiments, the control processor further includes: an initial switch state detection unit, which is used to detect the initial switch state of the three-phase switch to be tested before the scheduling unit performs the scheduling work, that is, the switch state of the three-phase switch to be tested before starting the entire test process. The initial switch state of the three-phase switch to be tested includes: an open state or a closed state.

[0167] In some embodiments, in response to the initial switch state of the three-phase switch to be tested being the open state, the scheduling unit schedules the target test items in the test request according to the following steps:

[0168] Step S101, determining whether there is a target test item in the test request that requires the switch state to be the open state.

[0169] If the judgment result of step S101 is yes, then step S102 is executed; if the judgment result of step S101 is no, then step S103 is executed.

[0170] Step S102, placing all target test items whose test requirement switch state is the open state in sequence into the test item sequence to update the test item sequence; after step S102 is completed, executing step S103.

[0171] Step S103: determine whether there is a target test item in the test request that requires the switch state to be switched from the open state to the closed state.

[0172] If the judgment result of step S103 is yes, then step S104 is executed; if the judgment result of step S103 is no, then step S105 is executed.

[0173] Step S104, placing a target test item whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence to update the test item sequence; after step S104 is completed, executing step S105.

[0174] Step S105: determine whether there is a target test item in the test request whose test requirement switch state is a closed state.

[0175] If the judgment result of step S105 is yes, then step S106 is executed; if the judgment result of step S105 is no, then step S107 is executed.

[0176] Step S106, placing all target test items whose test requirement switch state is the open state at the end of the test item sequence in sequence to update the test item sequence; after step S106 is completed, executing step S107.

[0177] Step S107, determining whether there is a target test item in the test request that requires the switch state to be switched from the closed state to the open state.

[0178] If the judgment result of step S107 is yes, then step S108 is executed; if the judgment result of step S107 is no, then step S113 is executed.

[0179] Step S108, placing a target test item whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S108, executing step S109.

[0180] Step S109 , determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the open state to the closed state.

[0181] If the judgment result of step S109 is yes, then step S110 is executed; if the judgment result of step S109 is no, then step S111 is executed.

[0182] Step S110, placing a target test item that is not placed in the test item sequence and whose test requirement switch state is to switch from the open state to the closed state at the end of the test item sequence to update the test item sequence; after step S110 is completed, execute step S107 again.

[0183] Step S111 , determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the closed state to the open state.

[0184] If the judgment result of step S111 is yes, then step S112 is executed; if the judgment result of step S111 is no, then step S115 is executed.

[0185] Step S112, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S112, executing step S115.

[0186] Step S113, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the open state to the closed state.

[0187] If the judgment result of step S113 is yes, then step S114 is executed; if the judgment result of step S113 is no, then step S115 is executed.

[0188] Step S114: placing all target test items in the test request that are not placed in the test item sequence and whose test requirement is that the switch state is switched from the open state to the closed state at the end of the test item sequence to update the test item sequence.

[0189] Step S115, determining whether there is a target test item in the test request that switches from the open state to the closed state and then to the open state.

[0190] If the judgment result of step S115 is yes, then step S116 is executed; if the judgment result of step S115 is no, then step S117 is executed.

[0191] Step S116, placing all target test items that are switched from the open state to the closed state and then to the open state at the end of the test item sequence to update the test item sequence; after step S116 is completed, executing step S117.

[0192] Step S117: output the final test item sequence.

[0193] Through the above steps S101 to S117, the number of switching times of the switch state of the three-phase switch to be tested in the entire test process can be reduced as much as possible, which is beneficial to reducing the risk of damage to the three-phase switch to be tested due to frequent switching, and is beneficial to shortening the processing time of the entire test process.

[0194] In some embodiments, in response to the initial switch state of the three-phase switch to be tested being the closed state, the scheduling unit schedules the target test items in the test request according to the following steps:

[0195] Step S201: Determine whether there is a target test item in the test request that the switch state is the closed state.

[0196] If the judgment result of step S201 is yes, then step S202 is executed; if the judgment result of step S201 is no, then step S203 is executed.

[0197] Step S202, placing all target test items whose test requirement switch state is the closed state in sequence into the test item sequence to update the test item sequence; after step S202 is completed, executing step S203.

[0198] Step S203: determine whether there is a target test item in the test request that requires the switch state to be switched from the closed state to the open state.

[0199] If the judgment result of step S203 is yes, then step S204 is executed; if the judgment result of step S203 is no, then step S205 is executed.

[0200] Step S204, placing a target test item whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S204 is completed, executing step S205.

[0201] Step S205: determine whether there is a target test item in the test request that requires the switch state to be changed from open state to open state.

[0202] If the judgment result of step S205 is yes, then step S206 is executed; if the judgment result of step S205 is no, then step S207 is executed.

[0203] Step S206, placing all target test items whose test requirement switch state is the closed state at the end of the test item sequence in sequence to update the test item sequence; after step S206 is completed, executing step S207.

[0204] Step S207: determine whether there is a target test item in the test request that requires the switch state to be switched from the open state to the closed state.

[0205] If the judgment result of step S207 is yes, then step S208 is executed; if the judgment result of step S207 is no, then step S213 is executed.

[0206] Step S208, placing a target test item whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence to update the test item sequence; after step S208, executing step S209.

[0207] Step S209 , determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the closed state to the open state.

[0208] If the judgment result of step S209 is yes, then step S210 is executed; if the judgment result of step S209 is no, then step S211 is executed.

[0209] Step S210, placing a target test item that is not placed in the test item sequence and whose test requirement switch state is to switch from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S210 is completed, execute step S207 again.

[0210] Step S211, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the open state to the closed state.

[0211] If the judgment result of step S211 is yes, then execute step S212; if the judgment result of step S211 is no, then execute step S215.

[0212] Step S212, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence to update the test item sequence; after step S212, executing step S215.

[0213] Step S213: determine whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the closed state to the open state.

[0214] If the judgment result of step S213 is yes, then execute step S214; if the judgment result of step S213 is no, then execute step S215.

[0215] Step S214: Place all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence.

[0216] Step S215, determining whether there is a target test item in the test request that switches from the open state to the closed state and then to the open state.

[0217] If the judgment result of step S215 is yes, then step S216 is executed; if the judgment result of step S215 is no, then step S217 is executed.

[0218] Step S216, placing all target test items that are switched from the open state to the closed state and then to the open state at the end of the test item sequence to update the test item sequence; after step S216, executing step S217.

[0219] Step S217: output the final test item sequence.

[0220] Through the above steps S101 to S117, the number of switching times of the switch state of the three-phase switch to be tested in the entire test process can be reduced as much as possible, which is beneficial to reducing the risk of damage to the three-phase switch to be tested due to frequent switching, and is beneficial to shortening the processing time of the entire test process.

[0221] In some embodiments, the scheduling unit sequentially places all target test items whose test requirement switch state is the open state into the test item sequence according to the following steps:

[0222] Step Sa1: randomly select a target test item whose test requirement switch state is the open state, and place it at the end of the test item sequence to update the test item sequence.

[0223] Step Sa2: Determine whether there is a target test item in the test request that is not included in the test item sequence and whose test requirement switch state is the open state.

[0224] If the judgment result of step Sa2 is yes, step Sa3 is executed; if the judgment result of step Sa2 is no, the process ends.

[0225] Step Sa3, take each target test item in the test request that is not placed in the test item sequence and whose test requirement switch state is the open state as the first test item to be scheduled, and calculate the set similarity between the set of conductive switch units configured for each first test item to be scheduled and the set of conductive switch units of the target test item at the end of the test item sequence.

[0226] Step Sa4, placing a first test item to be arranged that has the greatest set similarity with the target test item at the end of the test item sequence at the end of the test item sequence to update the test item sequence; after step Sa4 is completed, executing step Sa2 again.

[0227] The arrangement unit sequentially places all target test items whose test requirement switch state is a closed state into the test item sequence according to the following steps.

[0228] Step Sb1, randomly selecting a target test item whose test requirement switch state is the closed state, and placing it at the end of the test item sequence to update the test item sequence.

[0229] Step Sb2: determine whether there is a target test item in the test request that is not included in the test item sequence and whose test requirement switch state is the closed state.

[0230] If the judgment result of step Sb2 is yes, step Sb3 is executed; if the judgment result of step Sb2 is no, the process ends.

[0231] Step Sb3, each target test item in the test request that is not placed in the test item sequence and whose test requirement switch state is the closed state is taken as the second test item to be scheduled, and the set similarity between the set of conductive switch units configured for each second test item to be scheduled and the set of conductive switch units of the target test item at the end of the test item sequence is calculated.

[0232] Step Sb4, placing a second test item to be arranged that has the greatest set similarity with the target test item at the end of the test item sequence at the end of the test item sequence to update the test item sequence; after step Sb4 is completed, executing step Sb2 again.

[0233] Optionally, the set similarity can be obtained by using the Jaccard similarity algorithm. Of course, other existing similarity algorithms can also be used in the present disclosure to calculate the similarity between two sets.

[0234] In the present disclosure, the greater the set similarity of the conductive switch unit sets configured for the two test items, the more similar the switch units required to be conductive when the two test items are performed are, and the fewer the number of switch units that need to adjust the switch state when the previous test item of the two test items ends and the next test item begins. Based on this, the test items with larger corresponding set similarity can be set adjacent to each other, so that the switch unit can be effectively prevented from frequently switching between the conductive state and the cut-off state, which is conducive to extending the service life of the switch unit.

[0235] In some embodiments, the three-phase switch testing device further includes a housing, in which the testing module, the matrix switching isolation circuit and the control processor are placed, and the operation panel is located on the surface of the housing.

[0236] It is to be understood that the above embodiments are merely exemplary embodiments used to illustrate the principles of the present disclosure, but the present disclosure is not limited thereto. For those of ordinary skill in the art, various modifications and improvements can be made without departing from the spirit and substance of the present disclosure, and these modifications and improvements are also considered to be within the scope of protection of the present disclosure.

Claims

1. A three-phase switch test device, characterized in that: include: An operation panel, wherein a test wiring area is provided on the operation panel, and a plurality of wiring lead-out ports are provided in the test wiring area, and the wiring lead-out ports are used to be connected to a three-phase switch to be tested; A test module, comprising at least two switch test modules independent of each other; A matrix switching isolation circuit, comprising: a plurality of conductive lines, one end of each conductive line is connected to the corresponding switch test module, the other end of each conductive line is connected to the corresponding wiring lead-out port, and a switch unit for controlling the on and off of each conductive line is provided in each conductive line; A control processor connected to each of the switch test modules and each of the switch units, and configured to control each of the target switch units corresponding to the target test items to be in a conducting state when a target test item needs to be performed on the three-phase switch to be tested, so that the target switch test modules corresponding to the target test items are electrically connected to the three-phase switch to be tested through the conductive lines to which each of the target switch units belongs, and control the target switch test modules to perform corresponding tests on the three-phase switch to be tested; The control processor comprises: A receiving unit, configured to receive a test request, wherein the test request records all target test items to be tested on the three-phase switch to be tested; An arrangement unit, configured to arrange the order of the target test items to obtain a test item sequence according to the test requirement switch states respectively corresponding to the target test items in the test request; The test requirement switch state of each of the target test items is one of an open state, a closed state, switching from the closed state to the open state, switching from the open state to the closed state, switching from the open state to the closed state and then switching to the open state; In the test item sequence, all the target test items whose test requirements are that the switch state is an open state are arranged successively, and all the target test items whose test requirements are that the switch state is a closed state are arranged successively; A control unit, used for controlling the matrix switching isolation circuit and the test module to sequentially perform corresponding tests on the three-phase switch to be tested according to the test item sequence; Each test item is configured with a corresponding set of conducting switch units, and the set of conducting switch units records the switch units that need to be in a conducting state when performing the corresponding test item; The step of the arrangement unit arranging the order of the target test items to obtain a test item sequence includes: placing all the target test items whose test requirement switch state is an open state in sequence into the test item sequence, and placing all the target test items whose test requirement switch state is a closed state in sequence into the test item sequence; The arrangement unit sequentially places all the target test items whose test requirement switch state is the open state into the test item sequence according to the following steps: Step Sa1, randomly selecting one of the target test items whose test requirement switch state is the open state, and placing it at the end of the test item sequence to update the test item sequence; Step Sa2, determining whether the test request contains the target test item that is not included in the test item sequence and whose test requirement switch state is an open state; If the judgment result of step Sa2 is yes, then step Sa3 is executed; if the judgment result of step Sa2 is no, then the process ends; Step Sa3, taking each of the target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is the open switch state as the first test item to be scheduled, and calculating the set similarity between the set of on-switch units configured for each first test item to be scheduled and the set of on-switch units of the target test item at the end of the test item sequence; Step Sa4, placing the first test item to be arranged, which has the largest set similarity with the target test item at the end of the test item sequence, at the end of the test item sequence to update the test item sequence; after step Sa4 is completed, executing step Sa2 again; And / or, the arrangement unit sequentially places all the target test items whose test requirement switch state is the closed state into the test item sequence according to the following steps: Step Sb1, randomly selecting one of the target test items whose test requirement switch state is the closed state, and placing it at the end of the test item sequence to update the test item sequence; Step Sb2, determining whether the test request includes the target test item that is not included in the test item sequence and whose test requirement switch state is the closed state; If the judgment result of step Sb2 is yes, then step Sb3 is executed; if the judgment result of step Sb2 is no, then the process ends; Step Sb3, taking each of the target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is the closed state as the second test item to be scheduled, and calculating the set similarity between the set of conductive switch units configured for each second test item to be scheduled and the set of conductive switch units of the target test item at the end of the test item sequence; Step Sb4, placing the second test item to be arranged which has the largest set similarity with the target test item at the end of the test item sequence at the end of the test item sequence to update the test item sequence; after step Sb4, executing step Sb2 again.

2. The three-phase switch test device according to claim 1, characterized in that: The at least two independent switch test modules include: an insulation resistance test module, a loop resistance test module and a switch mechanical characteristic test module.

3. The three-phase switch test device according to claim 2, characterized in that: The insulation resistance test module is configured with a line terminal and a first ground terminal; The loop resistance test module is configured with: a positive current terminal, a positive voltage terminal, a negative voltage terminal and a negative current terminal; The switch mechanical characteristics test module is configured with: A-phase positive voltage terminal, B-phase positive voltage terminal, C-phase positive voltage terminal, A-phase negative voltage terminal, B-phase negative voltage terminal, C-phase negative voltage terminal, positive DC power supply terminal, opening control terminal, closing control terminal and negative DC power supply terminal; The multiple wiring lead-out ports include: A phase positive current lead-out port, A phase positive voltage lead-out port, A phase negative current lead-out port, A phase negative voltage lead-out port, B phase positive current lead-out port, B phase positive voltage lead-out port, B phase negative current lead-out port, B phase negative voltage lead-out port, C phase positive current lead-out port, C phase positive voltage lead-out port, C phase negative current lead-out port, C phase negative voltage lead-out port, positive DC power lead-out port, opening lead-out port, closing lead-out port, negative DC power lead-out port, auxiliary branch lead-out port, and earth lead-out port; The line terminal is respectively connected to the A-phase positive voltage lead-out port, the B-phase positive voltage lead-out port, the C-phase positive voltage lead-out port, the auxiliary branch lead-out port, the positive DC power lead-out port, the opening lead-out port, the closing lead-out port, and the negative DC power lead-out port through different conductive lines; The first grounding terminal is respectively connected to the A-phase negative voltage lead-out port, the B-phase negative voltage lead-out port, the C-phase negative voltage lead-out port, and the earth lead-out port through different conductive lines; The positive current wiring terminal is respectively connected to the A-phase positive current lead-out port, the B-phase positive current lead-out port, and the C-phase positive current lead-out port through different conductive lines; The positive voltage terminal is respectively connected to the A-phase positive voltage lead-out port, the B-phase positive voltage lead-out port, and the C-phase positive voltage lead-out port through different conductive lines; The negative voltage terminal is respectively connected to the A-phase negative voltage lead-out port, the B-phase negative voltage lead-out port, and the C-phase negative voltage lead-out port through different conductive lines; The negative current terminal is respectively connected to the A-phase negative current lead-out port, the B-phase negative current lead-out port, the C-phase negative current lead-out port, and the earth lead-out port through different conductive lines; The A-phase positive voltage wiring terminal is connected to the A-phase positive voltage lead-out port via a corresponding conductive circuit; The B-phase positive voltage wiring terminal is connected to the B-phase positive voltage lead-out port through a corresponding conductive circuit; The C-phase positive voltage wiring terminal is connected to the C-phase positive voltage lead-out port via a corresponding conductive circuit; The A-phase negative voltage wiring terminal is connected to the A-phase negative voltage lead-out port via a corresponding conductive circuit; The B-phase negative voltage wiring terminal is connected to the B-phase negative voltage lead-out port through a corresponding conductive circuit; The C-phase negative voltage wiring terminal is connected to the C-phase negative voltage lead-out port through a corresponding conductive circuit; The positive DC power supply terminal is connected to the positive DC power supply lead-out port through a corresponding conductive circuit; The switch-off control terminal is respectively connected to the switch-off lead-out port and the auxiliary switch-off lead-out port through different conductive lines; The closing control terminal is connected to the closing lead-out port through a corresponding conductive line; The negative DC power supply terminal is connected to the negative DC power supply lead-out port through a corresponding conductive line.

4. The three-phase switch test device according to claim 3, characterized in that: The A-phase positive voltage lead port, the A-phase negative voltage lead port, the B-phase positive voltage lead port, the B-phase negative voltage lead port, the C-phase positive voltage lead port and the C-phase negative voltage lead port are respectively connected to the earth lead port through corresponding first grounding control switches.

5. The three-phase switch test device according to claim 3, characterized in that: The plurality of wiring lead-out ports also include: a sensor lead-out port, the sensor lead-out port is a multi-core aviation lead-out port, the switch mechanical characteristics test module is also configured with a plurality of sensor connection terminals, each of the sensor connection terminals is connected to a different core in the sensor lead-out port through a different conductive line; And / or, the multiple wiring lead-out ports also include: a simulation lead-out port, the simulation lead-out port is a multi-core aviation lead-out port, and the switch mechanical characteristics test module is also configured with multiple simulation connection terminals, each of the simulation connection terminals is connected to a different core in the simulation lead-out port through a different conductive circuit.

6. The three-phase switch test device according to claim 1, characterized in that: Also includes: A display module, arranged on the operation panel, for displaying the screen; And / or, a communication module is connected to the control processor and is used for data communication between the control processor and an external device.

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