Electronic cyclotron radiometer and reflectometer integrated diagnosis system

Abstract

The invention discloses an electronic cyclotron radiometer and reflectometer integrated diagnosis system. The system comprises a microwave antenna, a waveguide power divider, an electronic cyclotron radiometer, a reflectometer, a program control voltage source and an industrial personal computer. The industrial personal computer is controlled to carry out time sequence editing on program control voltages which are respectively output to the electron cyclotron radiometer and the reflectometer by the program control voltage source, so that the output microwave frequencies of the voltage-controlled oscillator are different at the same time. Through the integrated design of the electron cyclotron radiometer and the reflectometer and the design of sharing the transmitting and receiving microwave antenna and the two program control voltage sources, the problem of signal interference of the reflectometer to the electron cyclotron radiometer is avoided, and meanwhile integration of a diagnosis window and a diagnosis annular space is achieved. The method can be applied to diagnosis of an electron cyclotron radiometer and a reflectometer of a Tokamak device, and can also be applied to any magnetic confinement device needing diagnosis of the electron cyclotron radiometer and the reflectometer at the same time.

Description

Technical Field

[0001] The invention relates to the technical field of tokamak plasma diagnosis, and in particular to an electron cyclotron radiometer and reflectometer integrated diagnosis system. Background Art

[0002] In tokamak plasma diagnostics, electron cyclotron radiometers and reflectometers are two microwave diagnostic systems that measure electron temperature and electron density profiles, respectively. In all tokamaks, these two diagnostic systems are two basic diagnostics with very high priority. The electron temperature and density profiles measured by them can be used in a wide range of research, such as plasma control, magnetohydrodynamic instability monitoring, micro-turbulent instability, bench-based physics, and magnetohydrodynamic instability research.

[0003] In actual use, since the electron cyclotron radiometer is a radiation receiver diagnostic system, and the reflectometer is a diagnostic system that transmits and receives reflected microwave signals, the electron cyclotron radiometer is often strongly interfered by the reflectometer's transmission signal. Especially for a highly sensitive electron cyclotron radiometer, even if it is far away from the reflectometer system space arrangement, it will be interfered by the reflectometer's transmission signal, so that the received electron cyclotron radiation signal is submerged in the interference signal, reducing the efficiency of the data.

[0004] In addition to signal interference, another disadvantage is that these two diagnostics for measuring different plasma parameters are usually distributed in different toroidal diagnostic windows, occupying a large amount of precious window resources. In tokamak plasma diagnostics, window resources are quite precious, especially in future engineering experimental reactors, demonstration reactors and other devices. A large number of windows are used for auxiliary heating and other systems, and the number of diagnostic windows is very limited. The electron cyclotron radiometer and reflectometer occupy different windows, which will cause a waste of window resources. Secondly, because the measured electron temperature and density profile data come from different toroidal positions, this makes it impossible to strictly provide data support for the interpretation of toroidal asymmetry physics in the physical research of toroidal asymmetry types.

[0005] In view of this, this application is hereby filed. Summary of the invention

[0006] The technical problem to be solved by the present invention is that in the diagnosis of tokamak plasma, the electron cyclotron radiometer and the reflectometer are two separate microwave diagnostic systems. However, in actual use, the electron cyclotron radiometer and the reflectometer have the problem of signal interference and occupying too many window resources. The purpose of the present invention is to provide an electron cyclotron radiometer and reflectometer integrated diagnostic system, which can realize the integration of the reflectometer and the electron cyclotron radiometer, improve the window utilization rate, and solve the problem of signal interference of the reflectometer on the electron cyclotron radiometer; at the same time, through the integrated design, it can also reduce the use of microwave devices and reduce the development cost of the diagnostic system.

[0007] The present invention is achieved through the following technical solutions:

[0008] An integrated diagnostic system of an electronic cyclotron radiometer and a reflectometer, the system comprising a microwave antenna, a waveguide power divider, an electronic cyclotron radiometer, a reflectometer, a programmable voltage source and an industrial computer;

[0009] The electron cyclotron radiometer is used for trapping, amplifying and isolating the plasma electron cyclotron radiation signal received from the microwave antenna after being divided by a waveguide power divider to obtain a processed radio frequency signal; inputting the processed radio frequency signal and the first local oscillator signal into a first mixer for mixing to obtain a first intermediate frequency signal; and performing bandpass filtering, intermediate frequency amplification and adjustment on the first intermediate frequency signal, and then outputting a radiation intensity signal that is not within the intermediate frequency detection range of the reflectometer through a detector; wherein the first local oscillator signal is obtained by controlling the local oscillator frequency by controlling the timing voltage signal of the programmable voltage source by an industrial computer;

[0010] The reflectometer is used to control the second voltage-controlled oscillator to output a microwave signal through an industrial computer to control the programmable voltage source. The microwave signal is first isolated, directional coupled and amplified before being emitted into the plasma through a microwave antenna; after being reflected by the cutoff layer in the plasma, it passes through the microwave antenna and a waveguide power divider to enter the reflectometer input end again. The received reflected signal is then notched, isolated and mixed with the second local oscillator signal of the second voltage-controlled oscillator through the directional coupling through end to obtain a second intermediate frequency signal;

[0011] The industrial computer is controlled to perform timing editing on the program-controlled voltage source output to the electron cyclotron radiometer and the reflectometer, so that the output microwave frequencies of the voltage-controlled oscillator are different at the same time.

[0012] Furthermore, the system also includes a collector;

[0013] The collector is used to receive the radiation intensity signal, the second intermediate frequency signal and the reference signal for subsequent integrated diagnosis.

[0014] Further, the electronic cyclotron radiometer includes a first notch filter, a first radio frequency amplifier, a first isolator, a first mixer, a first isolator, a first voltage-controlled oscillator, a first bandpass filter, a first intermediate frequency amplifier, an adjustable attenuator, a detector, a low-pass filter, and a video amplifier;

[0015] The first notch filter, the first radio frequency amplifier and the first isolator are connected in sequence, the first isolator is connected to the first input port of the first mixer, the second input port of the first mixer is connected to the microwave signal of the first frequency output by the first voltage-controlled oscillator through the first isolator, the output port of the first mixer is connected to the first band-pass filter, and the first band-pass filter, the first intermediate frequency amplifier, the adjustable attenuator, the detector, the low-pass filter and the video amplifier are connected in sequence;

[0016] The microwave signal of the first frequency is obtained by controlling the industrial computer to perform timing editing on the programmable voltage outputted from the programmable voltage source to the electron cyclotron radiometer, so that the output microwave frequency of the first voltage-controlled oscillator is different from that of the second voltage-controlled oscillator at the same time.

[0017] Further, the reflectometer includes a second voltage-controlled oscillator, a second-first isolator, a directional coupler, a second mixer, a second bandpass filter, a second intermediate frequency amplifier, a second-second isolator, a second notch filter, a second-third isolator and a second radio frequency amplifier;

[0018] The first path: the second voltage-controlled oscillator, the second-first isolator, the directional coupler, the second-third isolator and the second radio frequency amplifier are connected in sequence, and the second voltage-controlled oscillator is controlled by the industrial computer to output a microwave signal of the second frequency through the programmable voltage source. The microwave signal of the second frequency is first isolated by the second-first isolator, output to the second-third isolator through the coupling end of the directional coupler, and then amplified by the second radio frequency amplifier and emitted into the plasma through the microwave antenna;

[0019] The second path: the second notch filter, the second isolator, the second mixer, the second bandpass filter and the second intermediate frequency amplifier are connected in sequence, and the second mixer is also connected to the directional coupler; after the microwave signal of the second frequency is reflected by the cutoff layer in the plasma, it passes through the microwave antenna and the waveguide power divider to enter the input end of the reflectometer again, and the received reflected signal passes through the second notch filter to remove the microwave signal of the specific frequency, and is input to the second mixer through the second isolator; in the second mixer, it is mixed with the second local oscillator signal of the second voltage-controlled oscillator through the direct-through end of the directional coupler to obtain a second intermediate frequency signal; and then the second intermediate frequency signal of the specific frequency band is filtered by the second bandpass filter and output to the second intermediate frequency amplifier for output;

[0020] The microwave signal of the second frequency is obtained by controlling the industrial computer to perform timing editing on the programmable voltage outputted from the programmable voltage source to the reflectometer, so that the output microwave frequency of the second voltage-controlled oscillator is different from that of the first voltage-controlled oscillator at the same time.

[0021] The first frequency and the second frequency are different.

[0022] Furthermore, the waveguide power divider adopts a one-to-three V-band waveguide power divider.

[0023] Furthermore, the microwave antenna adopts a V-band standard antenna.

[0024] Further, the first voltage-controlled oscillator selects the E-band frequency synthesis source, and the voltage input is 0-5V;

[0025] The second voltage-controlled oscillator selects the V-band frequency source, and the voltage input is 0-5V.

[0026] Furthermore, the program-controlled voltage source is controlled by the industrial computer to perform timing editing on the program-controlled voltage output to the electron cyclotron radiometer and the reflectometer, respectively, so that the output microwave frequency of the voltage-controlled oscillator is different at the same time, including:

[0027] Assume that the relationship between the output voltage of the programmable voltage source and the output frequencies of the first voltage-controlled oscillator and the second voltage-controlled oscillator is an ideal linear relationship: 1V-10GHz;

[0028] The two output voltages of the programmable voltage source are 5-7V and 6-8V respectively. The 5-7V voltage is controlled to input the reflectometer, and the output frequency of the second voltage-controlled oscillator is 50-70GHz; the 6-8V voltage is controlled to input the electron cyclotron radiometer, and the output frequency of the first voltage-controlled oscillator is 60-80GHz.

[0029] In the above technical solution, it is assumed that the intermediate frequency range of the electron cyclotron radiometer is 1 GHz, the scanning cycle synchronization is 1 microsecond, and the operating frequency difference between the two systems (electron cyclotron radiometer and reflectometer) at the same time is about 9.5 GHz, and the electron cyclotron radiometer will not be interfered by the reflectometer signal.

[0030] Furthermore, the electron cyclotron radiometer and the reflectometer are of integrated design.

[0031] Furthermore, the system is applied to the electron cyclotron radiometer and reflectometer diagnostics of a tokamak device, or to any magnetic confinement device that requires both electron cyclotron radiometer and reflectometer diagnostics, such as a stellarator.

[0032] Compared with the prior art, the present invention has the following advantages and beneficial effects:

[0033] The present invention discloses an integrated diagnostic system for an electron cyclotron radiometer and a reflectometer. The present invention designs two programmable voltage sources for each of the electron cyclotron radiometer and the reflectometer according to the diagnostic frequency range of the electron cyclotron radiometer and the reflectometer in different tokamaks. The problem of interference of the reflectometer with the electron cyclotron radiometer is completely avoided. At the same time, the integrated design of the electron cyclotron radiometer and the reflectometer improves the integration of the system and saves precious diagnostic window resources. By diagnosing the electron temperature and electron density information in the same annular diagnostic space, the research requirements of various annular asymmetries can be met. For example, the simplest sawtooth wave programmable voltage timing design is adopted with a duty cycle of 50%, so that the diagnostic signals of the electron cyclotron radiometer and the reflectometer are outputted respectively in different time periods, directly avoiding signal interference. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] The drawings described herein are used to provide a further understanding of the embodiments of the present invention, constitute a part of this application, and do not constitute a limitation of the embodiments of the present invention. In the drawings:

[0035] Figure 1 It is a structural schematic diagram of an electron cyclotron radiometer and reflectometer integrated diagnostic system of the present invention;

[0036] Figure 2 4 is a sequence diagram of programmable voltage waveforms according to an embodiment of the present invention.

[0037] Reference numerals and corresponding component names:

[0038] 1-microwave antenna, 2-waveguide power divider, 3-first notch filter, 4-first RF amplifier, 5-first isolator, 6-first mixer, 7-first isolator, 8-first voltage-controlled oscillator, 9-first bandpass filter, 10-first intermediate frequency amplifier, 11-adjustable attenuator, 12-detector, 13-low-pass filter, 14-video amplifier, 15-collector, 16-programmable voltage source, 17-second voltage-controlled oscillator, 18-second isolator, 19-directional coupler, 20-second mixer, 21-second bandpass filter, 22-second intermediate frequency amplifier, 23-second isolator, 24-second notch filter, 25-second isolator, 26-second RF amplifier, 27-industrial computer. DETAILED DESCRIPTION

[0039] Hereinafter, the term "include" or "may include" used in various embodiments of the present invention indicates the presence of the invented function, operation or element, and does not limit the addition of one or more functions, operations or elements. In addition, as used in various embodiments of the present invention, the terms "include", "have" and their cognates are intended only to indicate specific features, numbers, steps, operations, elements, components or combinations of the foregoing items, and should not be understood as first excluding the presence of one or more other features, numbers, steps, operations, elements, components or combinations of the foregoing items or the possibility of adding one or more features, numbers, steps, operations, elements, components or combinations of the foregoing items.

[0040] In various embodiments of the present invention, the expression "or" or "at least one of A or / and B" includes any combination or all combinations of the words listed at the same time. For example, the expression "A or B" or "at least one of A or / and B" may include A, may include B, or may include both A and B.

[0041] The expressions (such as "first", "second", etc.) used in various embodiments of the present invention may modify the various constituent elements in various embodiments, but may not limit the corresponding constituent elements. For example, the above expressions do not limit the order and / or importance of the elements. The above expressions are only used for the purpose of distinguishing an element from other elements. For example, the first user device and the second user device indicate different user devices, although both are user devices. For example, without departing from the scope of various embodiments of the present invention, the first element may be referred to as the second element, and similarly, the second element may also be referred to as the first element.

[0042] It should be noted that if it is described that one component element is “connected” to another component element, the first component element may be directly connected to the second component element, and a third component element may be “connected” between the first component element and the second component element. Conversely, when one component element is “directly connected” to another component element, it can be understood that there is no third component element between the first component element and the second component element.

[0043] The terms used in various embodiments of the present invention are only used for the purpose of describing specific embodiments and are not intended to limit various embodiments of the present invention. As used herein, the singular form is intended to also include the plural form, unless the context clearly indicates otherwise. Unless otherwise limited, all terms used here (including technical terms and scientific terms) have the same meaning as the meaning generally understood by those of ordinary skill in the art to which the various embodiments of the present invention belong. The terms (such as the terms defined in the dictionary generally used) will be interpreted as having the same meaning as the contextual meaning in the relevant technical field and will not be interpreted as having an idealized meaning or an overly formal meaning, unless clearly defined in various embodiments of the present invention.

[0044] In order to make the objectives, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with embodiments and drawings. The exemplary embodiments of the present invention and their description are only used to explain the present invention and are not intended to limit the present invention.

[0045] Based on the traditional electron cyclotron radiometer and reflectometer, they are designed and developed separately; in tokamak plasma diagnosis, the electron cyclotron radiometer and reflectometer are two separate microwave diagnostic systems, and are distributed in different diagnostic windows on the tokamak. In actual use, the electron cyclotron radiometer and reflectometer have problems of signal interference and occupying too many window resources.

[0046] In order to avoid interference and improve window utilization, the present invention designs an integrated diagnostic system of an electron cyclotron radiometer and a reflectometer, which can realize the integration of the reflectometer and the electron cyclotron radiometer, improve window utilization, and solve the problem of signal interference of the reflectometer on the electron cyclotron radiometer; at the same time, through integrated design, it can also reduce the use of microwave devices and reduce the development cost of the diagnostic system.

[0047] Specifically, (1) the present invention can realize the same window measurement: the waveguide power divider 2 uses over-mode waveguide power division to transmit signals, and is compatible with the operating frequencies of the electron cyclotron radiometer and the reflectometer;

[0048] (2) The present invention solves the problem of signal interference of the reflectometer on the electron cyclotron radiometer: first, the electron cyclotron radiometer adopts a sweep frequency working mode, and the working frequency range is only within the narrow frequency range of the radio frequency RF±intermediate frequency bandwidth IF; secondly, the programmable voltage source 16 outputs a sweep frequency voltage signal to the first voltage-controlled oscillator 8 and the second voltage-controlled oscillator 17 corresponding to the electron cyclotron radiometer and the reflectometer respectively, so that the working frequency of the reflectometer is not within the RF±IF range.

[0049] The key technical point of the present invention is: through the integrated design of the electron cyclotron radiometer and the reflectometer, as well as the design of a shared transmitting and receiving microwave antenna and a two-way controlled voltage source, the problem of interference of the reflectometer with the electron cyclotron radiometer signal is avoided, and the integration of the diagnostic window and the diagnostic annular space is realized. The method of the present invention can not only adopt the continuous frequency modulation wave reflectometer technology, but also the continuous amplitude modulation wave reflectometer and other diagnostic technologies. In addition to being used in the diagnosis of the electron cyclotron radiometer and reflectometer of the tokamak device, this invention point can also be applied to any magnetic confinement device that requires both the electron cyclotron radiometer and the reflectometer for diagnosis, such as a stellarator.

[0050] Example

[0051] like Figure 1As shown, the present invention is an integrated diagnostic system of an electron cyclotron radiometer and a reflectometer, which is based on a swept-frequency electron cyclotron radiometer and a continuous frequency-modulated wave reflectometer, and designs an integrated diagnostic system of an electron cyclotron radiometer and a reflectometer whose frequency and time are unrelated; in the present invention, the electron cyclotron radiometer and the reflectometer are of an integrated design.

[0052] The system includes a microwave antenna 1, a waveguide power divider 2, an electronic cyclotron radiometer, a reflectometer, a programmable voltage source 16 and an industrial computer 27;

[0053] The electron cyclotron radiometer is used for trapping, amplifying and isolating the plasma electron cyclotron radiation signal received from the microwave antenna 1 after being divided by the waveguide power divider 2 to obtain a processed radio frequency signal; inputting the processed radio frequency signal and the first local oscillator signal into the first mixer 6 for mixing to obtain a first intermediate frequency signal; and performing bandpass filtering, intermediate frequency amplification and adjustment on the first intermediate frequency signal, and then outputting a radiation intensity signal that is not within the intermediate frequency detection range of the reflectometer through the detector 12; wherein the first local oscillator signal is obtained by controlling the timing voltage signal of the programmable voltage source 16 by the industrial computer 27 to control the local oscillator frequency;

[0054] The reflectometer is used to control the programmable voltage source 16 through the industrial computer 27 to control the second voltage-controlled oscillator 17 to output a microwave signal. The microwave signal is first isolated, directional coupled and amplified before being emitted into the plasma through the microwave antenna; after being reflected by the cutoff layer in the plasma, it passes through the microwave antenna 1 and the waveguide power divider 2 to enter the input end of the reflectometer again. The received reflected signal is then notched, isolated and mixed with the second local oscillator signal of the second voltage-controlled oscillator 17 through the directional coupling through end to obtain a second intermediate frequency signal;

[0055] The industrial computer 27 is controlled to perform timing editing on the program-controlled voltages outputted by the program-controlled voltage source 16 to the electron cyclotron radiometer and the reflectometer, respectively, so that the microwave frequencies outputted by the voltage-controlled oscillator are different at the same time.

[0056] As a further implementation, the system further includes a collector 15;

[0057] The collector 15 is used to receive the radiation intensity signal, the second intermediate frequency signal and the reference signal for subsequent integrated diagnosis.

[0058] In the above technical solutions, after the present invention obtains the three signals of the radiation intensity signal, the second intermediate frequency signal and the reference signal, the specific diagnosis process can be performed by existing well-known means, which will not be described in detail here.

[0059] As a further implementation, the electronic cyclotron radiometer includes a first notch filter 3, a first radio frequency amplifier 4, a first isolator 5, a first mixer 6, a first isolator 7, a first voltage-controlled oscillator 8, a first bandpass filter 9, a first intermediate frequency amplifier 10, an adjustable attenuator 11, a detector 12, a low-pass filter 13 and a video amplifier 14;

[0060] The first notch filter 3, the first radio frequency amplifier 4 and the first isolator 5 are connected in sequence, the first isolator 5 is connected to the first input port of the first mixer 6, the second input port of the first mixer 6 is connected to the microwave signal of the first frequency output by the first voltage-controlled oscillator 8 through the first isolator 7, the output port of the first mixer 6 is connected to the first band-pass filter 9, the first band-pass filter 9, the first intermediate frequency amplifier 10, the adjustable attenuator 11, the detector 12, the low-pass filter 13 and the video amplifier 14 are connected in sequence;

[0061] The microwave signal of the first frequency is obtained by controlling the industrial computer 27 to perform timing editing on the programmed voltage outputted from the programmed voltage source 16 to the electron cyclotron radiometer, so that the output microwave frequency of the first voltage-controlled oscillator 8 is different from that of the second voltage-controlled oscillator 17 at the same time.

[0062] In the above technical scheme, the electron cyclotron radiometer receives the plasma electron cyclotron radiation signal from the microwave antenna 1, passes through the waveguide power divider 2, and is branched to the first notch filter 3 to notch the microwave signal of a specific frequency; then the signal is low-noise amplified through the first radio frequency amplifier 4; the amplified radio frequency signal is input to the first mixer 6 through the first isolator 5, and the local oscillator input of the first mixer 6 is controlled by the industrial computer 27 to control the timing voltage signal of the programmable voltage source 16 to control the local oscillator frequency. The intermediate frequency signal obtained after mixing the radio frequency signal and the local oscillator signal passes through the intermediate frequency first bandpass filter 9 and is input to the first intermediate frequency amplifier 10 to the adjustable attenuator 11 to adjust the signal strength, so that the intermediate frequency detection signal is in the linear working range of the detector 12. Then, the detection voltage output by the detector 12 is input into the collector 15 through the video low-pass filter 13 and the video amplifier 14.

[0063] As a further implementation, the reflectometer includes a second voltage-controlled oscillator 17, a second first isolator 18, a directional coupler 19, a second mixer 20, a second bandpass filter 21, a second intermediate frequency amplifier 22, a second second isolator 23, a second notch filter 24, a second third isolator 25 and a second radio frequency amplifier 26;

[0064] The first path: the second voltage-controlled oscillator 17, the second-first isolator 18, the directional coupler 19, the second-third isolator 25 and the second radio frequency amplifier 26 are connected in sequence, and the programmable voltage source 16 is controlled by the industrial computer 27 to control the second voltage-controlled oscillator 17 to output a microwave signal of the second frequency. The microwave signal of the second frequency is first isolated by the second-first isolator 18, output to the second-third isolator 25 through the coupling end of the directional coupler 19, and then amplified by the second radio frequency amplifier 26 and emitted into the plasma through the microwave antenna 1;

[0065] The second path: the second notch filter 24, the second isolator 23, the second mixer 20, the second bandpass filter 21 and the second intermediate frequency amplifier 22 are connected in sequence, and the second mixer 20 is also connected to the directional coupler 19; after being reflected by the cutoff layer in the plasma, the microwave signal of the second frequency passes through the microwave antenna 1 and the waveguide power divider 2 to enter the input end of the reflectometer again, and the received reflected signal passes through the second notch filter 24 to remove the microwave signal of the specific frequency, and is input to the second mixer 20 through the second isolator 23; in the second mixer 20, the second local oscillator signal of the second voltage-controlled oscillator 17 is mixed with the second local oscillator signal of the direct-through end of the directional coupler 19 to obtain a second intermediate frequency signal; the second intermediate frequency signal of the specific frequency band is filtered by the second bandpass filter 21 and output to the second intermediate frequency amplifier 22 for output, and then directly input to the collector 15.

[0066] The microwave signal of the second frequency is obtained by controlling the industrial computer 27 to perform timing editing on the programmable voltage outputted from the programmable voltage source 16 to the reflectometer, so that the output microwave frequency of the second voltage-controlled oscillator 17 is different from that of the first voltage-controlled oscillator 8 at the same time.

[0067] In the above technical solution of the present invention, the program-controlled voltage outputted by the program-controlled voltage source 16 to the electron cyclotron radiometer and the reflectometer is time-sequence edited by controlling the industrial computer 27, so that the microwave frequency outputted by the first voltage-controlled oscillator 8 is different from that of the second voltage-controlled oscillator 17 at the same time, thereby avoiding the interference of the reflectometer to the electron cyclotron radiometer; at the same time, the integrated diagnosis of the electron cyclotron radiometer and the reflectometer can be realized by using one diagnostic window, that is, the interference problem is solved, and the utilization rate of the window is improved at the same time.

[0068] As a further implementation, the program-controlled voltage source 16 is controlled by the industrial computer 27 to perform timing editing on the program-controlled voltage output to the electron cyclotron radiometer and the reflectometer, respectively, so that the output microwave frequency of the voltage-controlled oscillator is different at the same time, including:

[0069] Assume that the relationship between the output voltage of the programmable voltage source 16 and the output frequency of the first voltage-controlled oscillator 8 and the second voltage-controlled oscillator 17 is an ideal linear relationship: 1V-10GHz;

[0070] The two output voltages of the programmable voltage source 16 are 5-7V and 6-8V respectively. The voltage of 5-7V is controlled to be input to the reflectometer, and the output frequency of the second voltage-controlled oscillator 17 is 50-70GHz; the voltage of 6-8V is controlled to be input to the electron cyclotron radiometer, and the output frequency of the first voltage-controlled oscillator 8 is 60-80GHz. Figure 2 .

[0071] Assuming that the intermediate frequency range of the radiometer is 1 GHz, the scanning cycle synchronization is 1 microsecond, and the operating frequency difference between the two systems at the same time is about 9.5 GHz, the radiometer will not be interfered by the reflectometer signal.

[0072] In the specific implementation, it is assumed that the diagnostic frequency range of the electron cyclotron radiometer on a certain tokamak device is 60-80GHz, the diagnostic frequency range of the reflectometer is 50-70GHz, and the notch frequency is 68GHz. The integrated diagnostic system of the electron cyclotron radiometer and the reflectometer uses microwave devices of the corresponding frequency band. The microwave antenna 1 selects a V-band standard antenna, the waveguide power divider 2 uses a one-to-three V-band waveguide power divider, the first notch filter 3 selects a 68GH notch, the first radio frequency amplifier 4 selects an E-band low-noise amplifier, the first isolator 5, the first mixer 6, and the first second isolator 7 select E-band full-band devices, the first voltage-controlled oscillator 8 selects an E-band frequency synthesizer source, and the voltage input is 0-5V; the first bandpass filter 9, the first intermediate frequency amplifier 10, the adjustable attenuator 11, and the detector 12 select 0.1-0.6GH filtering, amplifier, adjustable attenuator, and detector; the low-pass filter 13 selects a 200kHz video low-pass filter, and the video amplifier 14 selects an adjustable bias gain 1 -100 times video amplification, the sampling frequency of the collector 15 is 10MSa / s; the programmable voltage source 16 matches the input voltage range of the voltage-controlled oscillator to meet 0-5V; the second voltage-controlled oscillator 17 rotates the V-band frequency source, and the voltage input is 0-5V; the second isolator 18, the directional coupler 19, and the second mixer 20 select V-band full-band devices; the second bandpass filter 21 and the second intermediate frequency amplifier 22 are related to the frequency difference of the reflected microwave and are assumed to be 0.5-1MHz; the second isolator 23 selects a V-band isolator; the second notch filter 2468GHz; the second isolator 25 and the second RF amplifier 26 select V-band devices, and the industrial computer 27 selects an ordinary standard industrial computer.

[0073] In order to avoid the interference of the reflectometer on the electron cyclotron radiometer, the design Figure 2 The sampling rate of the collector 15 is 10MSa / s. Within 1 microsecond, the sampling points are as follows: Figure 2 As shown in the middle circle, the number of sampling points is 10. Figure 2The local oscillator frequency timing diagram of three frequency sweep cycles is shown. Since the programmable voltage source 16 is used to set the timing of the local oscillator frequency sources (first voltage-controlled oscillator 8, second voltage-controlled oscillator 17) of the electron cyclotron radiometer and the reflectometer, their respective operating frequencies are 50-70GHz and 60-80GHz respectively. At any same time, the operating frequencies of the two systems will not overlap. The reflected signal and the electron cyclotron radiation signal received by the microwave antenna 1 enter the reflectometer and the electron cyclotron radiometer respectively through the waveguide power divider. Due to the intermediate frequency filtering (first bandpass filter 9, second bandpass filter 21), the two systems can only respond to the signals of the local oscillator frequency and the intermediate frequency range at any time, thus avoiding the interference of the reflectometer on the electron cyclotron radiometer, and at the same time, the integrated system saves precious diagnostic window resources.

[0074] The present invention designs two programmable voltage sources for each electron cyclotron radiometer and reflectometer according to the diagnostic frequency range of the electron cyclotron radiometer and reflectometer in different tokamaks. The problem of interference of the reflectometer with the electron cyclotron radiometer is completely avoided. At the same time, the integration of the system is improved by the integrated design of the electron cyclotron radiometer and the reflectometer, saving precious diagnostic window resources. And by diagnosing the electron temperature and electron density information in the same annular diagnostic space, it can meet the research needs of various annular asymmetries. For example, the simplest sawtooth wave programmable voltage timing design is adopted, with a duty cycle of 50%, so that the diagnostic signals of the electron cyclotron radiometer and the reflectometer are output respectively in different time periods, directly avoiding signal interference.

[0075] The specific implementation methods described above further illustrate the objectives, technical solutions and beneficial effects of the present invention in detail. It should be understood that the above description is only a specific implementation method of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. An integrated diagnostic system of an electron cyclotron radiometer and a reflectometer, characterized in that: The system comprises a microwave antenna (1), a waveguide power divider (2), an electronic cyclotron radiometer, a reflectometer, a programmable voltage source (16) and an industrial computer (27); The electron cyclotron radiometer is used for trapping, amplifying and isolating a plasma electron cyclotron radiation signal received from a microwave antenna (1) after being branched by a waveguide power divider (2) to obtain a processed radio frequency signal; inputting the processed radio frequency signal and a first local oscillator signal into a first mixer (6) for mixing to obtain a first intermediate frequency signal; and performing bandpass filtering, intermediate frequency amplification and adjustment on the first intermediate frequency signal to output a radiation intensity signal that is not within the intermediate frequency detection range of the reflectometer through a detector (12); wherein the first local oscillator signal is obtained by controlling the local oscillator frequency by controlling a timing voltage signal of a programmable voltage source (16) by an industrial control computer (27); The reflectometer is used to control the output of microwave signals by controlling a programmable voltage source (16) through an industrial computer (27); the microwave signals are first isolated, directional coupled and amplified before being emitted into the plasma through a microwave antenna; after being reflected by a cutoff layer in the plasma, the microwave signals are passed through a microwave antenna (1) and a waveguide power divider (2) to enter the input end of the reflectometer again; the received reflected signals are then notched, isolated and mixed with a second local oscillator signal that passes through a directional coupled through end to obtain a second intermediate frequency signal; The industrial control computer (27) is controlled to perform time sequence editing on the program-controlled voltages outputted by the program-controlled voltage source (16) to the electron cyclotron radiometer and the reflectometer, respectively, so that the microwave frequencies outputted by the voltage-controlled oscillator are different at the same time.

2. The electron cyclotron radiometer and reflectometer integrated diagnostic system according to claim 1, characterized in that: The system also includes a collector (15); The collector (15) is used to receive the radiation intensity signal, the second intermediate frequency signal and the reference signal for subsequent integrated diagnosis.

3. The electron cyclotron radiometer and reflectometer integrated diagnostic system according to claim 1, characterized in that: The electronic cyclotron radiometer comprises a first notch filter (3), a first radio frequency amplifier (4), a first isolator (5), a first mixer (6), a first isolator (7), a first voltage-controlled oscillator (8), a first bandpass filter (9), a first intermediate frequency amplifier (10), an adjustable attenuator (11), a detector (12), a low-pass filter (13) and a video amplifier (14); A first wave trap (3), a first radio frequency amplifier (4) and a first isolator (5) are connected in sequence; the first isolator (5) is connected to a first input port of a first mixer (6); a second input port of the first mixer (6) is connected to a microwave signal of a first frequency output by a first voltage-controlled oscillator (8) through a first isolator (7); an output port of the first mixer (6) is connected to a first bandpass filter (9); and the first bandpass filter (9), a first intermediate frequency amplifier (10), an adjustable attenuator (11), a detector (12), a low-pass filter (13) and a video amplifier (14) are connected in sequence; The microwave signal of the first frequency is obtained by controlling the industrial control computer (27) to perform time-series editing on the program-controlled voltage outputted from the program-controlled voltage source (16) to the electron cyclotron radiometer, so that at the same time, the output microwave frequency of the first voltage-controlled oscillator (8) is different from that of the second voltage-controlled oscillator (17).

4. An electron cyclotron radiometer and reflectometer integrated diagnostic system according to claim 1 or 3, characterized in that: The reflectometer comprises: The first path: a second voltage-controlled oscillator (17), a second-first isolator (18), a directional coupler (19), a second-third isolator (25) and a second radio frequency amplifier (26) are connected in sequence, and the programmable voltage source (16) is controlled by an industrial computer (27) to control the second voltage-controlled oscillator (17) to output a microwave signal of a second frequency. The microwave signal of the second frequency is first isolated by the second-first isolator (18), output to the second-third isolator (25) through the coupling end of the directional coupler (19), and then amplified by the second radio frequency amplifier (26) and emitted into the plasma through the microwave antenna; The second path: a second notch filter (24), a second isolator (23), a second mixer (20), a second bandpass filter (21) and a second intermediate frequency amplifier (22) are connected in sequence, and the second mixer (20) is also connected to a directional coupler (19); after being reflected by a cutoff layer in the plasma, the microwave signal of the second frequency passes through a microwave antenna (1) and a waveguide power divider (2) and enters the input end of the reflectometer again; the received reflected signal passes through the second notch filter (24) to remove the microwave signal of the preset frequency, and is input into the second mixer (20) through the second isolator (23); in the second mixer (20), the second local oscillator signal of the second voltage-controlled oscillator (17) is mixed with the second local oscillator signal of the direct-through end of the directional coupler (19) to obtain a second intermediate frequency signal; the second intermediate frequency signal of the preset frequency band is filtered by the second bandpass filter (21) and output to the second intermediate frequency amplifier (22) for output; The microwave signal of the second frequency is generated by controlling the industrial control computer (27) to perform time-series editing on the program-controlled voltage outputted from the program-controlled voltage source (16) to the reflectometer, so that at the same time the output microwave frequency of the second voltage-controlled oscillator (17) is different from that of the first voltage-controlled oscillator (8).

5. The electron cyclotron radiometer and reflectometer integrated diagnostic system according to claim 1, characterized in that: The waveguide power divider (2) adopts a one-to-three V-band waveguide power divider.

6. The electron cyclotron radiometer and reflectometer integrated diagnostic system according to claim 1, characterized in that: The microwave antenna adopts a V-band standard antenna.

7. The electron cyclotron radiometer and reflectometer integrated diagnostic system according to claim 1, characterized in that: The first voltage-controlled oscillator (8) selects an E-band frequency synthesis source, and the voltage input is 0-5V; The second voltage-controlled oscillator (17) selects the V-band frequency source, and the voltage input is 0-5V.

8. The electron cyclotron radiometer and reflectometer integrated diagnostic system according to claim 1, characterized in that: The method of performing time sequence editing on the program-controlled voltages outputted by the program-controlled voltage source (16) to the electron cyclotron radiometer and the reflectometer respectively by controlling the industrial control computer (27) so that the microwave frequencies outputted by the voltage-controlled oscillator are different at the same time comprises: Assume that the relationship between the output voltage of the programmable voltage source (16) and the output frequencies of the first voltage-controlled oscillator (8) and the second voltage-controlled oscillator (17) is an ideal linear relationship: 1V-10GHz; The two output voltages of the programmable voltage source (16) are 5-7V and 6-8V respectively. The 5-7V voltage is controlled to input the reflectometer, and the second voltage-controlled oscillator (17) outputs a frequency of 50-70GHz. The 6-8V voltage is controlled to input the electron cyclotron radiometer, and the first voltage-controlled oscillator (8) outputs a frequency of 60-80GHz.

9. The electron cyclotron radiometer and reflectometer integrated diagnostic system according to claim 1, characterized in that: The electron cyclotron radiometer and the reflectometer are of integrated design.

10. The electron cyclotron radiometer and reflectometer integrated diagnostic system according to claim 1, characterized in that: The system is used for diagnostics of tokamaks, or any magnetic confinement device that requires both electron cyclotron radiometer and reflectometer diagnostics.

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