The invention discloses a direct analysis device of solid samples, wherein a sample pool is installed on a three-dimensional moving platform, a microscopic imaging system is aligned to a solid sample in the sample pool, a laser beam emitted by a picosecond laser is focused onto the surface of the sample in the sample pool through a laser optical system, particles generated by laser ablation enter an inductively coupled plasma source mass spectrometer through an aerosol transmission system, the direct analysis device has the advantages that the laser wavelength can be selected from 1064 nm, 532 nm, 355 nm and 266 nm, the pulse width is 30 ps, the pulse frequency is 20 Hz, the pulse energy is continuously adjustable, and the maximal pulse energy of 266 nm reaches 3.0 mJ; the position of the sample pool is three-dimensional controllable, and the transmission pipeline of the aerosol transmission system switched by a tee solenoid valve is short; a non-coaxial system is adopted to quickly focus and position the sample ablation position. As shown in analysis, basically no element fractionation effect exists in the elements of low alloy steel, pure copper, pure aluminum and the like, and basically no matrix effect exists in the elements of iron base, copper base, aluminum base and the like.