Direct analysis device of solid samples

An analysis device and sample technology, applied in the preparation of test samples, measurement devices, analysis materials, etc., to achieve the effects of short transmission pipeline, three-dimensional controllable position, and controllable spot size

Active Publication Date: 2014-04-02
NINGBO ACAD OF SCI & TECH FOR INSPECTION & QUARANTINE
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Problems solved by technology

[0010] The present invention develops a set of picosecond ultraviolet laser ablation solid sampling system that is not commercialized in the world at present, realizes the combination with ICP-MS, debugs and optimizes it, and is used for direct analysis of fixed samples

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  • Direct analysis device of solid samples
  • Direct analysis device of solid samples

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Embodiment Construction

[0036] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0037] A device for direct analysis of solid samples, including a picosecond laser 1, a laser optical system 2, a sample pool 3, a three-dimensional mobile platform 4, a microscopic imaging system 5, an aerosol transmission system 6, and an inductively coupled plasma mass spectrometer 7, the sample The pool 3 is installed on the three-dimensional mobile platform 4, the microscopic imaging system 5 is aimed at the solid sample in the sample pool 3, the laser beam emitted by the picosecond laser 1 is focused on the sample surface in the sample pool 3 through the laser optical system 2, and is captured by the laser beam. The particles generated after ablation enter into the inductively coupled plasma mass spectrometer 7 through the aerosol transmission system 6 .

[0038] The laser optical system includes an aperture 8, a mirror 9 and a focusing ...

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Abstract

The invention discloses a direct analysis device of solid samples, wherein a sample pool is installed on a three-dimensional moving platform, a microscopic imaging system is aligned to a solid sample in the sample pool, a laser beam emitted by a picosecond laser is focused onto the surface of the sample in the sample pool through a laser optical system, particles generated by laser ablation enter an inductively coupled plasma source mass spectrometer through an aerosol transmission system, the direct analysis device has the advantages that the laser wavelength can be selected from 1064 nm, 532 nm, 355 nm and 266 nm, the pulse width is 30 ps, the pulse frequency is 20 Hz, the pulse energy is continuously adjustable, and the maximal pulse energy of 266 nm reaches 3.0 mJ; the position of the sample pool is three-dimensional controllable, and the transmission pipeline of the aerosol transmission system switched by a tee solenoid valve is short; a non-coaxial system is adopted to quickly focus and position the sample ablation position. As shown in analysis, basically no element fractionation effect exists in the elements of low alloy steel, pure copper, pure aluminum and the like, and basically no matrix effect exists in the elements of iron base, copper base, aluminum base and the like.

Description

technical field [0001] The invention relates to a component analysis device, in particular to a direct analysis device for solid samples. Background technique [0002] Inductively coupled plasma mass spectrometry (ICP-MS) is an element and isotope analysis technique developed in the 1980s that uses ICP as an ion source and generally uses a quadrupole as a mass analyzer. ICP-MS can perform qualitative analysis, semi-quantitative analysis, quantitative analysis, isotope ratio analysis, and element speciation analysis combined with separation techniques. ICP-MS detection limit is low (ppt level), linear dynamic range is wide (up to 9 orders of magnitude), the spectrum is relatively simple, the precision is good, the detection mass range is 6-260, almost all elements can be analyzed, and it can be replaced Atomic Absorption Spectroscopy, Inductively Coupled Plasma Spectroscopy, X-ray Fluorescence Spectroscopy, and more traditional Mass Spectrometry are powerful tools for the an...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/62G01N1/28G01N27/626
Inventor 金献忠陈建国谢健梅郭亮
Owner NINGBO ACAD OF SCI & TECH FOR INSPECTION & QUARANTINE
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