Breaker life prediction method and device based on degradation index and Weber distribution

Abstract

The embodiment of the invention provides a circuit breaker service life prediction method and device based on a degradation index and Weber distribution. The method comprises the steps that the current fault probability of individual equipment is determined according to the current degradation index of the circuit breaker equipment and an individual fault probability function obtained through fitting; fitting historical fault data of the equipment group based on Weber distribution to obtain a group fault probability function; correcting the group fault probability function through the current fault probability of the individual equipment to obtain a corrected individual fault probability function; determining the residual life of the current equipment according to the corrected individual fault probability function and the actual service age of the equipment; according to the method, the state evaluation and fault probability of the circuit breaker can be improved, the calculation method of the reliable residual life and the limit residual life is established, and the prediction precision and reliability of the residual life are improved by comprehensively considering the current state of the individual equipment, the historical fault data and the fault characteristics of the equipment group.

Description

Technical Field

[0001] The present application relates to the field of power grid security, and in particular to a circuit breaker life prediction method and device based on degradation index and Weibull distribution. Background Art

[0002] In recent years, with the increase of voltage level and the expansion of power grid scale, the power system has increasingly increased the requirements for equipment reliability and healthy operation. Among these devices, the importance of core equipment circuit breakers is self-evident. The reliable operation of circuit breakers is crucial to ensure the safety and stability of the power grid. Therefore, it is of great significance to accurately evaluate and predict the remaining life of circuit breakers and adopt corresponding maintenance and management strategies.

[0003] The remaining life of equipment refers to the available time that the equipment can continue to operate within a controllable risk range. By evaluating the remaining life of the circuit breaker, the risk level of the equipment in the future planned service time under the current health state can be intuitively reflected. At present, the remaining life prediction algorithm of power equipment is mainly based on the health index evaluation method, and the health index model is introduced to predict the remaining life of the equipment.

[0004] In 2021, the industry proposed a new mechanical life prediction algorithm. The algorithm uses the least squares method to fit the relationship curve between the number of opening and closing times and the opening and closing time, and predicts the mechanical life through the upper limit of the opening and closing time (Research on a mechanical life prediction algorithm for high-voltage circuit breakers [J]. Electronic Design Engineering, 2021, 29(07): 68-71+76.). In 2022, a predictive maintenance strategy for high-voltage circuit breakers based on data and degradation models was proposed. The time feature quantity was extracted using the opening and closing coil current waveform signals and the circuit breaker auxiliary contact voltage waveform signals, and a degradation degree index considering the uncertainty of monitoring data was constructed (Predictive maintenance strategy for high-voltage circuit breakers based on real-time state evaluation and remaining life calculation [J]. High Voltage Technology, 2022, 48(07): 2716-2726.). In 2023, a high-voltage circuit breaker refusal failure probability prediction method based on Bayesian network was proposed. The qualitative characteristics of the influencing factors were converted into quantitative characteristics by using the operating conditions and refusal defects / events of the high-voltage circuit breakers in the entire network, and the Bayesian network inference algorithm was used to realize the prediction of the high-voltage circuit breaker refusal failure probability (Prediction of high-voltage circuit breaker refusal failure probability based on Bayesian network [J]. Yunnan Electric Power Technology, 2023, 51(02): 23-28+32.).

[0005] However, the above methods have not been fully studied from aspects such as equipment aging, life of key components and the impact of maintenance on circuit breakers. Summary of the invention

[0006] In response to the problems in the prior art, the present application provides a circuit breaker life prediction method and device based on degradation index and Weibull distribution, which can improve the circuit breaker status assessment and failure probability, and establish a calculation method for reliable remaining life and limit remaining life. By comprehensively considering the current status of individual equipment, historical fault data and failure characteristics of equipment groups, the prediction accuracy and reliability of the remaining life are improved.

[0007] In order to solve at least one of the above problems, the present application provides the following technical solutions:

[0008] According to a first aspect of an embodiment of the present application, the present application provides a circuit breaker life prediction method based on a degradation index and a Weibull distribution, comprising:

[0009] Determine the current failure probability of the individual device according to the current degradation index of the circuit breaker device and the fitted individual failure probability function, wherein the degradation index is determined according to the natural aging index of the device and a preset total degradation correction factor, and the natural aging index is determined according to the use parameters and current state of the device;

[0010] The historical failure data of the equipment group is fitted based on Weibull distribution to obtain the group failure probability function;

[0011] Correcting the group failure probability function by the current failure probability of the individual device to obtain a corrected individual failure probability function;

[0012] The remaining life of the current equipment is determined according to the corrected individual failure probability function and the actual service age of the equipment.

[0013] According to any embodiment of the present application, before determining the current failure probability of the individual device according to the current degradation index of the circuit breaker device and the fitted individual failure probability function, the method further includes:

[0014] Determine the aging coefficient of the equipment based on the initial aging index, final aging index and design life of the equipment;

[0015] The natural aging index is determined based on the aging coefficient, the initial aging index, the year in which the new equipment is put into operation, and the corresponding year of the equipment.

[0016] According to any embodiment of the present application, the total degradation correction coefficient includes one or any combination of the following:

[0017] Equipment status correction factor, used to characterize the actual degradation status of the equipment;

[0018] The historical defect correction coefficient is used to characterize the impact of historical defects on the equipment within a preset time;

[0019] Environmental correction factor, used to characterize the impact of environmental factors on equipment performance;

[0020] The deterioration repair coefficient is used to characterize the repair effect of the deterioration degree of equipment after maintenance or modification.

[0021] According to any implementation manner of the present application, the group failure probability function is corrected by the current failure probability of the individual device to obtain a corrected individual failure probability function, including:

[0022] By discretizing the degradation index and the group failure probability function, a conversion relationship between the degradation index and the group failure probability is constructed;

[0023] The equivalent service age of the equipment is determined according to the conversion relationship, and the corrected individual failure probability function is determined based on the equivalent service age, the actual service age of the equipment and the group failure probability function.

[0024] According to any embodiment of the present application, the determining the remaining life of the current equipment according to the modified individual failure probability function and the actual service age of the equipment includes:

[0025] Determine the low-risk level failure probability and medium-risk level failure probability of the equipment according to the modified individual failure probability function and the preset risk level standard;

[0026] Determine the remaining life of the equipment when the failure probability of the equipment is at a low risk level according to the low risk level failure probability and the actual service age of the equipment;

[0027] The remaining life of the equipment when the failure probability is at the medium risk level is determined according to the medium risk level failure probability and the actual service age of the equipment.

[0028] According to any embodiment of the present application, after determining the remaining life of the current equipment according to the modified individual failure probability function and the actual service age of the equipment, it also includes:

[0029] In response to the circuit breaker device being used to project reactive power, determining the mechanical remaining life of the device according to the number of device operations, the total number of device operations preset, and the device design life, and correcting the remaining life of the current device according to the mechanical remaining life;

[0030] In response to the circuit breaker device not being used to project reactive power, the electrical remaining life of the device is determined according to the current value of each breaking of the device, the rated short-circuit breaking current and the design life of the device, and the remaining life of the current device is corrected according to the electrical remaining life.

[0031] According to a second aspect of an embodiment of the present application, the present application provides a circuit breaker life prediction device based on a degradation index and a Weibull distribution, comprising:

[0032] An individual fault probability determination module is used to determine the current fault probability of an individual device according to the current degradation index of the circuit breaker device and the fitted individual fault probability function, wherein the degradation index is determined according to the natural aging index of the device and a preset total degradation correction coefficient, and the natural aging index is determined according to the use parameters and current state of the device;

[0033] A group failure probability determination module is used to: fit the historical failure data of the equipment group based on Weibull distribution to obtain a group failure probability function;

[0034] An individual fault probability correction module is used to correct the group fault probability function according to the current fault probability of the individual device to obtain a corrected individual fault probability function;

[0035] The remaining life determination module is used to determine the remaining life of the current equipment according to the corrected individual failure probability function and the actual service age of the equipment.

[0036] According to any embodiment of the present application, a natural aging index determination module is also included, including:

[0037] An aging coefficient determination unit is used to determine the aging coefficient of the equipment according to the initial aging index, the final aging index and the design life of the equipment;

[0038] The natural aging index determination unit is used to determine the natural aging index according to the aging coefficient, the initial aging index, the year when the new equipment is put into operation, and the corresponding year of the equipment.

[0039] According to any embodiment of the present application, the total degradation correction coefficient includes one or any combination of the following:

[0040] Equipment status correction factor, used to characterize the actual degradation status of the equipment;

[0041] The historical defect correction coefficient is used to characterize the impact of historical defects on the equipment within a preset time;

[0042] Environmental correction factor, used to characterize the impact of environmental factors on equipment performance;

[0043] The deterioration repair coefficient is used to characterize the repair effect of the deterioration degree of equipment after maintenance or modification.

[0044] According to any implementation of the present application, the individual fault probability correction module includes:

[0045] A conversion relationship determination unit, configured to: construct a conversion relationship between the degradation index and the group failure probability by discretizing the degradation index and the group failure probability function;

[0046] The individual failure probability correction unit is used to determine the equivalent service age of the equipment according to the conversion relationship, and determine the corrected individual failure probability function based on the equivalent service age, the actual service age of the equipment and the group failure probability function.

[0047] According to any implementation of the present application, the remaining life determination module includes:

[0048] A risk probability determination unit, used to determine a low-risk level failure probability and a medium-risk level failure probability of the equipment according to the modified individual failure probability function and a preset risk level standard;

[0049] A reliable remaining life determination unit, used to: determine the remaining life of the equipment when the failure probability of the equipment is at a low risk level according to the low risk level failure probability and the actual service age of the equipment;

[0050] The limit remaining life determination unit is used to determine the remaining life of the equipment when the failure probability of the equipment is at the medium risk level according to the medium risk level failure probability and the actual service age of the equipment.

[0051] According to any embodiment of the present application, a life compensation module is also included, including:

[0052] A mechanical remaining life compensation unit, used to: in response to the circuit breaker device being used to project reactive power, determine the mechanical remaining life of the device according to the number of device operations, the total number of device operations preset, and the device design life, and correct the remaining life of the current device according to the mechanical remaining life;

[0053] The electrical remaining life compensation unit is used to: in response to the circuit breaker device not being used to project reactive power, determine the electrical remaining life of the device according to the current value of each breaking of the device, the rated short-circuit breaking current and the design life of the device, and correct the remaining life of the current device according to the electrical remaining life.

[0054] According to a third aspect of an embodiment of the present application, the present application provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the program, the steps of the circuit breaker life prediction method based on degradation index and Weibull distribution are implemented.

[0055] According to a fourth aspect of an embodiment of the present application, the present application provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of the circuit breaker life prediction method based on degradation index and Weibull distribution.

[0056] According to a fifth aspect of an embodiment of the present application, the present application provides a computer program product, comprising a computer program / instruction, which, when executed by a processor, implements the steps of the circuit breaker life prediction method based on degradation index and Weibull distribution.

[0057] It can be seen from the above technical scheme that the present application provides a circuit breaker life prediction method and device based on degradation index and Weibull distribution, which determines the current failure probability of individual equipment according to the current degradation index of the circuit breaker equipment and the fitted individual failure probability function, wherein the degradation index is determined according to the natural aging index of the equipment and a preset total degradation correction coefficient, and the natural aging index is determined according to the use parameters and current state of the equipment; the historical failure data of the equipment group is fitted based on the Weibull distribution to obtain a group failure probability function; the group failure probability function is corrected according to the current failure probability of the individual equipment to obtain a corrected individual failure probability function; the remaining life of the current equipment is determined according to the corrected individual failure probability function and the actual service age of the equipment; the circuit breaker state evaluation and failure probability can be improved, and a calculation method for reliable remaining life and limit remaining life can be established, so as to improve the prediction accuracy and reliability of the remaining life by comprehensively considering the current state of the individual equipment, historical failure data and failure characteristics of the equipment group. BRIEF DESCRIPTION OF THE DRAWINGS

[0058] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0059] Figure 1 One of the flow charts of the circuit breaker life prediction method based on degradation index and Weibull distribution in the embodiment of the present application;

[0060] Figure 2 The second flowchart of the circuit breaker life prediction method based on degradation index and Weibull distribution in the embodiment of the present application;

[0061] Figure 3 The third flowchart of the circuit breaker life prediction method based on degradation index and Weibull distribution in the embodiment of the present application;

[0062] Figure 4 This is a fourth flow chart of a circuit breaker life prediction method based on degradation index and Weibull distribution in an embodiment of the present application;

[0063] Figure 5 This is a fourth flow chart of a circuit breaker life prediction method based on degradation index and Weibull distribution in an embodiment of the present application;

[0064] Figure 6 The fifth flowchart of the circuit breaker life prediction method based on degradation index and Weibull distribution in the embodiment of the present application;

[0065] Figure 7 This is one of the structural diagrams of a circuit breaker life prediction device based on degradation index and Weibull distribution in an embodiment of the present application;

[0066] Figure 8 This is the second structural diagram of the circuit breaker life prediction device based on degradation index and Weibull distribution in the embodiment of the present application;

[0067] Fig. 9 This is the third structural diagram of the circuit breaker life prediction device based on degradation index and Weibull distribution in the embodiment of the present application;

[0068] Fig.10 This is the fourth structural diagram of the circuit breaker life prediction device based on degradation index and Weibull distribution in the embodiment of the present application;

[0069] Fig.11 This is the fifth structural diagram of the circuit breaker life prediction device based on degradation index and Weibull distribution in the embodiment of the present application;

[0070] Fig.12 It is a schematic diagram of the structure of an electronic device in an embodiment of the present application. DETAILED DESCRIPTION

[0071] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0072] The acquisition, storage, use, and processing of data in the technical solution of this application comply with the relevant provisions of national laws and regulations.

[0073] Taking into account the problem that the existing methods have not yet fully studied the impact of equipment aging, key component life and maintenance on circuit breakers, this application provides a circuit breaker life prediction method and device based on degradation index and Weibull distribution, improves circuit breaker status assessment and failure probability, and establishes a calculation method for reliable remaining life and limit remaining life, and improves the prediction accuracy and reliability of the remaining life by comprehensively considering the current status of individual equipment, historical fault data and failure characteristics of equipment groups.

[0074] In order to improve the circuit breaker status assessment and failure probability, and establish a calculation method for reliable remaining life and limit remaining life, the prediction accuracy and reliability of the remaining life are improved by comprehensively considering the current status of individual equipment, historical fault data and the failure characteristics of the equipment group. This application provides an embodiment of a circuit breaker life prediction method based on degradation index and Weibull distribution, see Figure 1 The circuit breaker life prediction method based on degradation index and Weibull distribution specifically includes the following contents:

[0075] Step S101: determining the current failure probability of individual equipment according to the current degradation index of the circuit breaker equipment and the fitted individual failure probability function, wherein the degradation index is determined according to the natural aging index of the equipment and a preset total degradation correction factor, and the natural aging index is determined according to the use parameters and current state of the equipment.

[0076] The current failure probability of the individual device is determined according to the current degradation index of the circuit breaker device and the fitted individual failure probability function. The degradation index is a comprehensive indicator used to quantify the degradation state of the device, which aims to reflect the overall degradation degree of the device under the influence of natural aging (natural aging index) and internal and external factors (correction coefficient).

[0077] The natural aging index reflects the degree of deterioration of the equipment due to the natural aging process during its service life, and is usually related to the equipment's usage parameters (such as number of operations, ambient temperature, etc.) and current status (such as health status, historical defects, etc.).

[0078] The total degradation correction factor of the equipment takes into account the impact of environmental factors, historical defects, maintenance records and other factors on equipment degradation. Through the comprehensive calculation of parameters, the current degradation index of the equipment is obtained, which can be used to determine the current failure probability of the equipment, so as to more accurately evaluate the degradation status and failure risk of individual equipment, thereby providing a scientific basis for subsequent failure probability calculations.

[0079] The individual failure probability function is obtained by statistically analyzing and fitting the historical failure data of similar equipment, and can reflect the change law of the failure probability of the equipment under different degradation states. By substituting the current degradation index of the individual equipment into the function, the failure probability of the equipment under the current degradation state can be obtained.

[0080] Step S102: fitting the historical failure data of the equipment group based on the Weibull distribution to obtain a group failure probability function.

[0081] Weibull distribution is a statistical method to describe the laws of equipment failure. By analyzing and processing a large number of historical failure data of circuit breakers, a group failure probability function can be fitted, which can describe the failure probability change trend of circuit breaker groups in different usage time periods.

[0082] Specifically, the Weibull distribution function has three parameters: shape parameter, scale parameter and location parameter, which are obtained by fitting historical data. The shape parameter determines the shape of the failure probability curve, the scale parameter determines the extension range of the curve, and the location parameter determines the starting point of the curve. By fitting these parameters, a probability function that can reflect the failure behavior of the entire equipment group can be obtained, providing a reference for the subsequent correction of the failure probability of individual equipment.

[0083] Step S103: Correcting the group failure probability function according to the current failure probability of the individual device to obtain a corrected individual failure probability function.

[0084] Among them, based on the specific usage history and current status of individual devices, their characteristics are superimposed on the group failure probability function to obtain a more accurate individual failure probability function.

[0085] Specifically, the current failure probability of an individual device is calculated using its degradation index, which incorporates the device's natural aging index and various correction factors. The current failure probability of an individual device is applied to the group failure probability function, which is corrected to reflect the specific usage and degradation state of the individual device. This application takes into account the differences in usage history and current state between individual devices and group devices, making the corrected failure probability function closer to the actual situation of the individual device and improving the accuracy of fault prediction.

[0086] Step S104: determining the remaining life of the current equipment according to the corrected individual failure probability function and the actual service life of the equipment.

[0087] The actual service life refers to the time that the equipment has been put into use. Through the modified individual failure probability function, the failure probability of the equipment in the future can be predicted to estimate its remaining life. Specifically, the modified individual failure probability function combines the use history, degradation state and group failure probability model of the individual equipment to provide a more accurate failure probability prediction. Then, using the failure probability prediction, according to the actual service life of the equipment, the time when the equipment may fail in the future is calculated to determine its remaining life.

[0088] From the above description, it can be seen that the circuit breaker life prediction method based on degradation index and Weibull distribution provided in the embodiment of the present application can improve the circuit breaker status assessment and failure probability, and establish a calculation method for reliable remaining life and limit remaining life, and improve the prediction accuracy and reliability of the remaining life by comprehensively considering the current status of individual equipment, historical fault data and failure characteristics of the equipment group.

[0089] In one embodiment of the circuit breaker life prediction method based on degradation index and Weibull distribution of the present application, see Figure 2 , before determining the current failure probability of the individual device according to the current degradation index of the circuit breaker device and the fitted individual failure probability function, it also includes:

[0090] Step S101A: Determine the aging coefficient of the equipment according to the initial aging index, the final aging index and the design life of the equipment.

[0091] The aging coefficient B refers to the natural aging rate of the equipment during its life cycle. This coefficient can be calculated based on the initial aging index and the final aging index of the equipment. The specific calculation can be derived according to formula (1), which is as follows:

[0092]

[0093] In the formula, represents the termination aging index, T end Indicates the design life of the equipment, and its value may be determined according to the specific equipment.

[0094] Step S101B: determining the natural aging index according to the aging coefficient, the initial aging index, the year when the new equipment is put into operation, and the corresponding year of the equipment.

[0095] Furthermore, the natural aging index is constructed through the health index model, and the calculation formula is as follows:

[0096]

[0097] in, represents the initial aging index, B represents the aging coefficient, T1 represents the year when the new equipment was put into operation, and T2 represents the x to be calculatedHI The closer the index is to 1, the more serious the natural wear and tear of the equipment is, and vice versa.

[0098] In an optional embodiment, the total degradation correction coefficient includes one or any combination of the following:

[0099] Equipment status correction factor, used to characterize the actual degradation status of the equipment;

[0100] The historical defect correction coefficient is used to characterize the impact of historical defects on the equipment within a preset time;

[0101] Environmental correction factor, used to characterize the impact of environmental factors on equipment performance;

[0102] The deterioration repair coefficient is used to characterize the repair effect of the deterioration degree of equipment after maintenance or modification.

[0103] Exemplarily, the construction process of each correction coefficient is as follows:

[0104] 1. Construct equipment status correction coefficient a con .

[0105] The coefficient for adjusting the equipment degradation state is set according to the current health state of the equipment. This coefficient is intended to more accurately reflect the actual degradation condition of the equipment. The coefficient reference value is formulated based on the health state of the equipment and according to specific engineering practices.

[0106] 2. Construct historical defect correction coefficient a def .

[0107] The historical defect correction factor considers the coefficient of the impact of defects on the equipment in the past year. This coefficient not only takes into account the defect level (general, serious, critical), but also comprehensively considers the potential impact of defect frequency on equipment degradation. In particular, the defect frequency, because frequent defects are often one of the important factors that accelerate equipment degradation, is calculated as follows:

[0108]

[0109] Where S represents the cumulative value of historical defects; n i represents the number of occurrences of the i-th defect level; ζ i Represents the cardinality of the i-th defect level.

[0110] 3. Construction environment correction factor a env .

[0111] Environmental correction coefficients are used to consider the effects of different environmental factors on equipment performance. They mainly include ambient temperature correction coefficients and pollution degree correction coefficients.

[0112] 4. Construct the degradation repair coefficient a rep .

[0113] The deterioration repair coefficient is used to evaluate the repair effect of the equipment deterioration degree after comprehensive maintenance, targeted technical transformation and other measures. This coefficient reflects the degree of significant improvement in the deterioration state of the equipment after maintenance, transformation and other measures.

[0114] Furthermore, the formula for calculating the degradation index is as follows:

[0115]

[0116] in,

[0117] a Π =a con ·a def ·a env ·(1-a rep ) (5)

[0118] In the formula, a ∏ represents the total degradation correction factor, x HI Represents the natural aging index.

[0119] In an optional embodiment, fitting the historical failure data of the equipment group based on the Weibull distribution to obtain the group failure probability function may specifically include:

[0120] Collect historical fault information and use Weibull distribution to fit the group fault probability curve. The fault probability formula is as follows:

[0121]

[0122] In the formula, β is used to characterize the shape of the distribution curve; α is used to characterize the scale of the ordinate; and τ is used to characterize the position of the starting point of the abscissa of the curve. In general, it is assumed that the equipment has no life loss when it is put into operation, so τ = 0. Therefore, the failure probability function of electrical equipment can be simplified as:

[0123]

[0124] Wherein, when β>1, λ(t) is an increasing function; when β=1, λ(t) is a constant function; when β<1, λ(t) is a decreasing function.

[0125] In one embodiment of the circuit breaker life prediction method based on degradation index and Weibull distribution of the present application, see Figure 3 , the group failure probability function is corrected by the current failure probability of the individual device to obtain a corrected individual failure probability function, including:

[0126] Step S103A: constructing a conversion relationship between the degradation index and the group failure probability by discretizing the degradation index and the group failure probability function.

[0127] Among them, by discretizing the degradation index and failure probability data, the conversion relationship between the degradation index and the failure probability is constructed, and the relationship is as follows:

[0128]

[0129] Step S103B: determining the equivalent service age of the equipment according to the conversion relationship, and determining the corrected individual failure probability function based on the equivalent service age, the actual service age of the equipment and the group failure probability function.

[0130] Using formula (8), the individual equivalent service life and current failure probability are obtained. The individual equivalent service life is calculated as shown in formula (9).

[0131]

[0132] The failure probability function of a single device is shown in formula (10).

[0133]

[0134] In the formula, Δt is the actual service age t a Equivalent service age t e When the equivalent service age is greater than the actual service age, it indicates that the actual operating state of the equipment is worse than the group operating state, and the fault probability curve is shifted to the left for correction, and the correction amount is Δt = t e -t a ; When the equivalent service age is less than or equal to the actual service age, it indicates that the actual operating status of the equipment is not inferior to the group operating status. Taking into account the equipment operation risks comprehensively, the failure probability curve shall be based on the group failure probability curve.

[0135] In one embodiment of the circuit breaker life prediction method based on degradation index and Weibull distribution of the present application, see Figure 4 , the determining the remaining life of the current equipment according to the modified individual failure probability function and the actual service age of the equipment comprises:

[0136] Step S104A: determining a low-risk level failure probability and a medium-risk level failure probability of the equipment according to the modified individual failure probability function and a preset risk level standard;

[0137] Step S104B: determining the remaining life of the equipment when the failure probability of the equipment is at a low risk level according to the low risk level failure probability and the actual service life of the equipment;

[0138] Step S104C: Determine the remaining life of the equipment when the failure probability of the equipment is at the medium risk level according to the medium risk level failure probability and the actual service life of the equipment.

[0139] The remaining life may include the reliable remaining life and the limit remaining life of the equipment.

[0140] Reliable remaining life refers to the available time when the equipment failure probability is at a low risk level. Assume that the low risk level failure probability is less than or equal to λ zd , t = f (λ) is the inverse function of the individual failure probability function. At this time, the calculation formula for the reliable remaining life of the individual equipment is as follows:

[0141] L re =f(λ zd )-t a (11)

[0142] Where, L re Indicates the reliable remaining life.

[0143] The limit remaining life refers to the available time when the equipment failure probability is at a medium-low risk level. Assume that the medium-risk level failure probability is less than or equal to λ zg , at this time, the ultimate remaining life of individual equipment is shown in formula (12).

[0144] L lim =f(λ zg )-t a (12)

[0145] Where, L lim Indicates the ultimate remaining life.

[0146] Furthermore, in order to solve the problem that the current method has not been fully studied from the aspects of equipment aging, life of key components and the impact of maintenance on circuit breakers, and there is also a lack of evaluation of the remaining life of circuit breakers at different risk levels, see Figure 5 , after determining the remaining life of the current equipment according to the modified individual failure probability function and the actual service age of the equipment, it also includes:

[0147] Step S105A: In response to the circuit breaker device being used to project reactive power, the mechanical remaining life of the device is determined according to the number of device operations, the total number of device operations preset and the device design life, and the remaining life of the current device is corrected according to the mechanical remaining life.

[0148] For the circuit breaker of reactive equipment, the remaining life correction mainly considers the mechanical remaining life. The mechanical remaining life calculation is as shown in formula (13).

[0149]

[0150] Where, L m Indicates the remaining mechanical life. n indicates the number of times the circuit breaker has been operated. N total Indicates the total number of operations designed for the circuit breaker, that is, the maximum number of operations that the circuit breaker can withstand during its entire life cycle. d Indicates the design life of the equipment.

[0151] Step S105B: In response to the circuit breaker device not being used to project reactive power, the electrical remaining life of the device is determined according to the current value of each breaking of the device, the rated short-circuit breaking current and the design life of the device, and the remaining life of the current device is corrected according to the electrical remaining life.

[0152] For other circuit breakers, the electrical remaining life is mainly considered when correcting the remaining life. The electrical remaining life calculation formula is as shown in formula (14).

[0153]

[0154] Where, L e Indicates the remaining electrical life, I m Indicates the breaking current value each time, I e Indicates the rated short-circuit breaking current, T d Indicates the design life of the equipment.

[0155] For devices with action mechanisms or arc extinguishing mechanisms in circuit breakers, the remaining life depends not only on the probability of failure, but also on the strict limitations of the working performance of related dynamic components. Therefore, by carrying out calculations based on the remaining life of dynamic components (electrical remaining life and mechanical remaining life), and comparing the remaining life of dynamic components with the reliable remaining life and the limit remaining life, the shortest remaining life is finally used.

[0156] In order to further illustrate the present solution, the present application also provides a specific application example of using the above-mentioned circuit breaker life prediction device based on degradation index and Weibull distribution to implement the circuit breaker life prediction method based on degradation index and Weibull distribution, see Figure 6 , specifically including the following contents:

[0157] First, the current failure probability of individual equipment is calculated based on the current degradation index of the equipment and the fitted individual failure probability function. Starting from the evaluation of the health status of the equipment, the natural degradation degree of the equipment is reflected by calculating the natural aging index. The total degradation index of the equipment is obtained by combining the natural aging index and various correction coefficients, thereby obtaining the current degradation status of the equipment.

[0158] Then, using statistical analysis methods such as Weibull distribution, the historical fault data of the circuit breaker group is fitted to obtain the group failure probability function.

[0159] Next, the group failure probability function is corrected by the current failure probability of the individual equipment to obtain a corrected individual failure probability function.

[0160] Finally, the electrical remaining life and mechanical remaining life of the equipment are comprehensively considered and combined with the risk level factor to correct the remaining life of the equipment to improve the accuracy and reliability of the prediction.

[0161] Through the above steps, this application can systematically combine the current health status of the equipment, historical fault data and statistical analysis methods to accurately predict the remaining life of the circuit breaker. Not only does it take into account the statistical laws of the group, but it also integrates the specific usage and degradation status of individual equipment, thereby achieving a more accurate life prediction.

[0162] In order to improve the circuit breaker status assessment and failure probability, and establish a calculation method for reliable remaining life and limit remaining life, the prediction accuracy and reliability of the remaining life are improved by comprehensively considering the current status of individual equipment, historical fault data and the failure characteristics of the equipment group. The present application provides an embodiment of a circuit breaker life prediction device based on degradation index and Weibull distribution for realizing all or part of the circuit breaker life prediction method based on degradation index and Weibull distribution, see Figure 7 The circuit breaker life prediction device based on degradation index and Weibull distribution specifically includes the following contents:

[0163] The individual fault probability determination module 1101 is used to determine the current fault probability of the individual device according to the current degradation index of the circuit breaker device and the fitted individual fault probability function, wherein the degradation index is determined according to the natural aging index of the device and a preset total degradation correction coefficient, and the natural aging index is determined according to the use parameters and current state of the device;

[0164] A group failure probability determination module 1102 is used to: fit the historical failure data of the equipment group based on Weibull distribution to obtain a group failure probability function;

[0165] The individual fault probability correction module 1103 is used to correct the group fault probability function according to the current fault probability of the individual device to obtain a corrected individual fault probability function;

[0166] The remaining life determination module 1104 is used to determine the remaining life of the current equipment according to the corrected individual failure probability function and the actual service age of the equipment.

[0167] According to any embodiment of the present application, see Figure 8 , also includes a natural aging index determination module, including:

[0168] The aging coefficient determination unit 1101A is used to determine the aging coefficient of the equipment according to the initial aging index, the final aging index and the design life of the equipment;

[0169] The natural aging index determination unit 1101B is used to determine the natural aging index according to the aging coefficient, the initial aging index, the commissioning year of the new equipment and the corresponding year of the equipment.

[0170] According to any embodiment of the present application, the total degradation correction coefficient includes one or any combination of the following:

[0171] Equipment status correction factor, used to characterize the actual degradation status of the equipment;

[0172] The historical defect correction coefficient is used to characterize the impact of historical defects on the equipment within a preset time;

[0173] Environmental correction factor, used to characterize the impact of environmental factors on equipment performance;

[0174] The deterioration repair coefficient is used to characterize the repair effect of the deterioration degree of equipment after maintenance or modification.

[0175] According to any embodiment of the present application, see Fig. 9 , the individual fault probability correction module includes:

[0176] The conversion relationship determination unit 1103A is used to: construct a conversion relationship between the degradation index and the group failure probability by discretizing the degradation index and the group failure probability function;

[0177] The individual failure probability correction unit 1103B is used to determine the equivalent service age of the equipment according to the conversion relationship, and determine the corrected individual failure probability function based on the equivalent service age, the actual service age of the equipment and the group failure probability function.

[0178] According to any embodiment of the present application, see Fig.10 , the remaining life determination module includes:

[0179] The risk probability determination unit 1104A is used to determine the low risk level failure probability and the medium risk level failure probability of the equipment according to the modified individual failure probability function and the preset risk level standard;

[0180] A reliable remaining life determining unit 1104B is used to determine the remaining life of the equipment when the failure probability of the equipment is at a low risk level according to the low risk level failure probability and the actual service age of the equipment;

[0181] The limit remaining life determination unit 1104C is used to determine the remaining life of the equipment when the failure probability of the equipment is at the medium risk level according to the medium risk level failure probability and the actual service age of the equipment.

[0182] According to any embodiment of the present application, see Fig.11 , also includes life compensation module, including:

[0183] The mechanical remaining life compensation unit 1105A is used to: in response to the circuit breaker device being used to project reactive power, determine the mechanical remaining life of the device according to the number of device operations, the total number of device operations preset, and the device design life, and correct the remaining life of the current device according to the mechanical remaining life;

[0184] The electrical remaining life compensation unit 1105B is used to: in response to the circuit breaker device not being used to project reactive power, determine the electrical remaining life of the device according to the current value of each breaking of the device, the rated short-circuit breaking current and the design life of the device, and correct the remaining life of the current device according to the electrical remaining life.

[0185] From the above description, it can be seen that the circuit breaker life prediction device based on degradation index and Weibull distribution provided in the embodiment of the present application can improve the circuit breaker status assessment and failure probability, and establish a calculation method for reliable remaining life and limit remaining life, and improve the prediction accuracy and reliability of the remaining life by comprehensively considering the current status of individual equipment, historical fault data and failure characteristics of the equipment group.

[0186] From the hardware level, in order to improve the circuit breaker status assessment and failure probability, and establish a calculation method for reliable remaining life and limit remaining life, the prediction accuracy and reliability of the remaining life are improved by comprehensively considering the current status of individual equipment, historical fault data and the fault characteristics of the equipment group. The present application provides an embodiment of an electronic device for implementing all or part of the contents of the circuit breaker life prediction method based on degradation index and Weibull distribution, and the electronic device specifically includes the following contents:

[0187] Processor, memory, communication interface and bus; wherein the processor, memory and communication interface communicate with each other through the bus; the communication interface is used to realize information transmission between the circuit breaker life prediction device based on degradation index and Weibull distribution and related equipment such as core business system, user terminal and related database; the logic controller can be a desktop computer, tablet computer and mobile terminal, etc., and the present embodiment is not limited thereto. In the present embodiment, the logic controller can be implemented with reference to the embodiment of the circuit breaker life prediction method based on degradation index and Weibull distribution and the embodiment of the circuit breaker life prediction device based on degradation index and Weibull distribution in the embodiment, and the contents thereof are incorporated herein, and the repeated parts are not repeated.

[0188] It is understandable that the user terminal may include a smart phone, a tablet electronic device, a network set-top box, a portable computer, a desktop computer, a personal digital assistant (PDA), a vehicle-mounted device, a smart wearable device, etc. Among them, the smart wearable device may include smart glasses, a smart watch, a smart bracelet, etc.

[0189] In practical applications, part of the circuit breaker life prediction method based on degradation index and Weibull distribution can be executed on the electronic device side as described above, or all operations can be completed in the client device. The specific selection can be based on the processing capability of the client device and the limitations of the user's usage scenario. This application does not limit this. If all operations are completed in the client device, the client device may also include a processor.

[0190] The client device may have a communication module (i.e., a communication unit) that can communicate with a remote server to achieve data transmission with the server. The server may include a server on the task scheduling center side, and other implementation scenarios may also include a server on an intermediate platform, such as a server on a third-party server platform that has a communication link with the task scheduling center server. The server may include a single computer device, or a server cluster consisting of multiple servers, or a server structure of a distributed device.

[0191] Fig.12 FIG. 9 is a schematic block diagram of the system structure of the electronic device 9600 according to an embodiment of the present application. Fig.12 As shown, the electronic device 9600 may include a central processor 9100 and a memory 9140; the memory 9140 is coupled to the central processor 9100. It is worth noting that Fig.12 is exemplary; other types of structures may also be used to supplement or replace this structure to implement telecommunication functions or other functions.

[0192] In one embodiment, the circuit breaker life prediction method function based on degradation index and Weibull distribution can be integrated into the central processor 9100. The central processor 9100 can be configured to perform the following control:

[0193] Step S101: determining the current failure probability of the individual device according to the current degradation index of the circuit breaker device and the fitted individual failure probability function, wherein the degradation index is determined according to the natural aging index of the device and a preset total degradation correction coefficient, and the natural aging index is determined according to the use parameters and current state of the device;

[0194] Step S102: fitting the historical failure data of the equipment group based on Weibull distribution to obtain a group failure probability function;

[0195] Step S103: correcting the group failure probability function by the current failure probability of the individual device to obtain a corrected individual failure probability function;

[0196] Step S104: determining the remaining life of the current equipment according to the corrected individual failure probability function and the actual service life of the equipment.

[0197] From the above description, it can be seen that the electronic device provided in the embodiment of the present application improves the circuit breaker status assessment and failure probability, and establishes a calculation method for reliable remaining life and limit remaining life, thereby improving the prediction accuracy and reliability of the remaining life by comprehensively considering the current status of individual equipment, historical fault data and failure characteristics of the equipment group.

[0198] In another embodiment, the circuit breaker life prediction device based on the degradation index and the Weibull distribution can be configured separately from the central processor 9100. For example, the circuit breaker life prediction device based on the degradation index and the Weibull distribution can be configured as a chip connected to the central processor 9100, and the function of the circuit breaker life prediction method based on the degradation index and the Weibull distribution can be realized through the control of the central processor.

[0199] like Fig.12 As shown, the electronic device 9600 may also include: a communication module 9110, an input unit 9120, an audio processor 9130, a display 9160, and a power supply 9170. It is worth noting that the electronic device 9600 does not necessarily have to include Fig.12 In addition, the electronic device 9600 may also include Fig.12 For components not shown, reference may be made to the prior art.

[0200] like Fig.12As shown, the central processing unit 9100 is sometimes also referred to as a controller or an operation control, and may include a microprocessor or other processor device and / or logic device. The central processing unit 9100 receives input and controls the operation of various components of the electronic device 9600.

[0201] The memory 9140 may be, for example, one or more of a cache, a flash memory, a hard drive, a removable medium, a volatile memory, a non-volatile memory or other suitable devices. The above-mentioned information related to the failure may be stored, and a program for executing the relevant information may also be stored. The CPU 9100 may execute the program stored in the memory 9140 to implement information storage or processing, etc.

[0202] The input unit 9120 provides input to the central processing unit 9100. The input unit 9120 is, for example, a key or a touch input device. The power supply 9170 is used to provide power to the electronic device 9600. The display 9160 is used to display display objects such as images and texts. The display may be, for example, an LCD display, but is not limited thereto.

[0203] The memory 9140 may be a solid-state memory, such as a read-only memory (ROM), a random access memory (RAM), a SIM card, etc. It may also be a memory that saves information even when the power is off, can be selectively erased, and is provided with more data, examples of which are sometimes referred to as EPROMs, etc. The memory 9140 may also be some other type of device. The memory 9140 includes a buffer memory 9141 (sometimes referred to as a buffer). The memory 9140 may include an application / function storage unit 9142, which is used to store application programs and function programs or processes for executing the operation of the electronic device 9600 through the central processor 9100.

[0204] The memory 9140 may also include a data storage unit 9143 for storing data, such as contacts, digital data, pictures, sounds, and / or any other data used by the electronic device. The driver storage unit 9144 of the memory 9140 may include various drivers for communication functions of the electronic device and / or for executing other functions of the electronic device (such as messaging applications, address book applications, etc.).

[0205] The communication module 9110 is a transmitter / receiver 9110 that sends and receives signals via an antenna 9111. The communication module (transmitter / receiver) 9110 is coupled to the central processor 9100 to provide input signals and receive output signals, which may be the same as the case of a conventional mobile communication terminal.

[0206] Based on different communication technologies, multiple communication modules 9110 may be provided in the same electronic device, such as a cellular network module, a Bluetooth module and / or a wireless LAN module, etc. The communication module (transmitter / receiver) 9110 is also coupled to a speaker 9131 and a microphone 9132 via an audio processor 9130 to provide an audio output via the speaker 9131 and receive an audio input from the microphone 9132, thereby realizing a common telecommunication function. The audio processor 9130 may include any suitable buffer, decoder, amplifier, etc. In addition, the audio processor 9130 is also coupled to the central processor 9100, so that recording can be performed on the local machine through the microphone 9132, and the sound stored on the local machine can be played through the speaker 9131.

[0207] The embodiments of the present application also provide a computer-readable storage medium capable of implementing all steps of the circuit breaker life prediction method based on degradation index and Weibull distribution in the above embodiment, where the execution subject is a server or a client. The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, all steps of the circuit breaker life prediction method based on degradation index and Weibull distribution in the above embodiment are implemented. For example, when the processor executes the computer program, the following steps are implemented:

[0208] Step S101: determining the current failure probability of the individual device according to the current degradation index of the circuit breaker device and the fitted individual failure probability function, wherein the degradation index is determined according to the natural aging index of the device and a preset total degradation correction coefficient, and the natural aging index is determined according to the use parameters and current state of the device;

[0209] Step S102: fitting the historical failure data of the equipment group based on Weibull distribution to obtain a group failure probability function;

[0210] Step S103: correcting the group failure probability function by the current failure probability of the individual device to obtain a corrected individual failure probability function;

[0211] Step S104: determining the remaining life of the current equipment according to the corrected individual failure probability function and the actual service life of the equipment.

[0212] From the above description, it can be seen that the computer-readable storage medium provided in the embodiment of the present application improves the circuit breaker status assessment and failure probability, and establishes a calculation method for reliable remaining life and limit remaining life, thereby improving the prediction accuracy and reliability of the remaining life by comprehensively considering the current status of individual equipment, historical failure data and failure characteristics of the equipment group.

[0213] The embodiments of the present application also provide a computer program product capable of implementing all the steps of the circuit breaker life prediction method based on degradation index and Weibull distribution in the above embodiments, where the execution subject is a server or a client. When the computer program / instruction is executed by a processor, the steps of the circuit breaker life prediction method based on degradation index and Weibull distribution are implemented. For example, the computer program / instruction implements the following steps:

[0214] Step S101: determining the current failure probability of the individual device according to the current degradation index of the circuit breaker device and the fitted individual failure probability function, wherein the degradation index is determined according to the natural aging index of the device and a preset total degradation correction coefficient, and the natural aging index is determined according to the use parameters and current state of the device;

[0215] Step S102: fitting the historical failure data of the equipment group based on Weibull distribution to obtain a group failure probability function;

[0216] Step S103: correcting the group failure probability function by the current failure probability of the individual device to obtain a corrected individual failure probability function;

[0217] Step S104: determining the remaining life of the current equipment according to the corrected individual failure probability function and the actual service life of the equipment.

[0218] From the above description, it can be seen that the computer program product provided in the embodiment of the present application improves the circuit breaker status assessment and failure probability, and establishes a calculation method for reliable remaining life and limit remaining life, and improves the prediction accuracy and reliability of the remaining life by comprehensively considering the current status of individual equipment, historical fault data and failure characteristics of the equipment group.

[0219] It will be appreciated by those skilled in the art that embodiments of the present invention may be provided as methods, devices, or computer program products. Therefore, the present invention may take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware. Moreover, the present invention may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0220] The present invention is described with reference to flowcharts and / or block diagrams of methods, devices (apparatus), and computer program products according to embodiments of the present invention. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as the combination of processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0221] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0222] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 A step that specifies a function in one or more boxes.

[0223] The present invention uses specific embodiments to illustrate the principles and implementation methods of the present invention. The description of the above embodiments is only used to help understand the method of the present invention and its core idea. At the same time, for those skilled in the art, according to the idea of ​​the present invention, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as a limitation on the present invention.

Claims

1. A circuit breaker life prediction method based on degradation index and Weibull distribution, characterized in that: The method comprises: Determine the current failure probability of the individual device according to the current degradation index of the circuit breaker device and the fitted individual failure probability function, wherein the degradation index is determined according to the natural aging index of the device and a preset total degradation correction factor, and the natural aging index is determined according to the use parameters and current state of the device; The historical failure data of the equipment group is fitted based on Weibull distribution to obtain the group failure probability function; Correcting the group failure probability function by the current failure probability of the individual device to obtain a corrected individual failure probability function; The remaining life of the current equipment is determined according to the corrected individual failure probability function and the actual service age of the equipment.

2. The circuit breaker life prediction method based on degradation index and Weibull distribution according to claim 1, characterized in that: Before determining the current failure probability of the individual device according to the current degradation index of the circuit breaker device and the fitted individual failure probability function, the method further includes: Determine the aging coefficient of the equipment based on the initial aging index, final aging index and design life of the equipment; The natural aging index is determined based on the aging coefficient, the initial aging index, the year in which the new equipment is put into operation, and the corresponding year of the equipment.

3. The circuit breaker life prediction method based on degradation index and Weibull distribution according to claim 1, characterized in that: The total degradation correction factor includes one or any combination of the following: Equipment status correction factor, used to characterize the actual degradation status of the equipment; The historical defect correction coefficient is used to characterize the impact of historical defects on the equipment within a preset time; Environmental correction factor, used to characterize the impact of environmental factors on equipment performance; The deterioration repair coefficient is used to characterize the repair effect of the deterioration degree of equipment after maintenance or modification.

4. The circuit breaker life prediction method based on degradation index and Weibull distribution according to claim 1, characterized in that: The method of correcting the group failure probability function by using the current failure probability of the individual device to obtain a corrected individual failure probability function includes: By discretizing the degradation index and the group failure probability function, a conversion relationship between the degradation index and the group failure probability is constructed; The equivalent service age of the equipment is determined according to the conversion relationship, and the corrected individual failure probability function is determined based on the equivalent service age, the actual service age of the equipment and the group failure probability function.

5. The circuit breaker life prediction method based on degradation index and Weibull distribution according to claim 1, characterized in that: Determining the remaining life of the current equipment according to the corrected individual failure probability function and the actual service age of the equipment includes: Determine the low-risk level failure probability and medium-risk level failure probability of the equipment according to the modified individual failure probability function and the preset risk level standard; Determine the remaining life of the equipment when the failure probability of the equipment is at a low risk level according to the low risk level failure probability and the actual service age of the equipment; The remaining life of the equipment when the failure probability is at the medium risk level is determined according to the medium risk level failure probability and the actual service age of the equipment.

6. The circuit breaker life prediction method based on degradation index and Weibull distribution according to claim 1, characterized in that: After determining the remaining life of the current equipment according to the modified individual failure probability function and the actual service age of the equipment, the method further includes: In response to the circuit breaker device being used to project reactive power, determining the mechanical remaining life of the device according to the number of device operations, the total number of device operations preset, and the device design life, and correcting the remaining life of the current device according to the mechanical remaining life; In response to the circuit breaker device not being used to project reactive power, the electrical remaining life of the device is determined according to the current value of each breaking of the device, the rated short-circuit breaking current and the design life of the device, and the remaining life of the current device is corrected according to the electrical remaining life.

7. A circuit breaker life prediction device based on degradation index and Weibull distribution, characterized in that: The device comprises: An individual fault probability determination module is used to determine the current fault probability of an individual device according to the current degradation index of the circuit breaker device and the fitted individual fault probability function, wherein the degradation index is determined according to the natural aging index of the device and a preset total degradation correction coefficient, and the natural aging index is determined according to the use parameters and current state of the device; A group failure probability determination module is used to: fit the historical failure data of the equipment group based on Weibull distribution to obtain a group failure probability function; An individual fault probability correction module is used to correct the group fault probability function according to the current fault probability of the individual device to obtain a corrected individual fault probability function; The remaining life determination module is used to determine the remaining life of the current equipment according to the corrected individual failure probability function and the actual service age of the equipment.

8. The circuit breaker life prediction device based on degradation index and Weibull distribution according to claim 7, characterized in that: Also included is a module for determining the natural aging index, including: An aging coefficient determination unit is used to determine the aging coefficient of the equipment according to the initial aging index, the final aging index and the design life of the equipment; The natural aging index determination unit is used to determine the natural aging index according to the aging coefficient, the initial aging index, the year when the new equipment is put into operation, and the corresponding year of the equipment.

9. The circuit breaker life prediction device based on degradation index and Weibull distribution according to claim 7, characterized in that: The total degradation correction factor includes one or any combination of the following: Equipment status correction factor, used to characterize the actual degradation status of the equipment; The historical defect correction coefficient is used to characterize the impact of historical defects on the equipment within a preset time; Environmental correction factor, used to characterize the impact of environmental factors on equipment performance; The deterioration repair coefficient is used to characterize the repair effect of the deterioration degree of equipment after maintenance or modification.

10. The circuit breaker life prediction device based on degradation index and Weibull distribution according to claim 7, characterized in that: The individual fault probability correction module includes: A conversion relationship determination unit, configured to: construct a conversion relationship between the degradation index and the group failure probability by discretizing the degradation index and the group failure probability function; The individual failure probability correction unit is used to determine the equivalent service age of the equipment according to the conversion relationship, and determine the corrected individual failure probability function based on the equivalent service age, the actual service age of the equipment and the group failure probability function.

11. The circuit breaker life prediction device based on degradation index and Weibull distribution according to claim 7, characterized in that: The remaining life determination module comprises: A risk probability determination unit, used to determine a low-risk level failure probability and a medium-risk level failure probability of the equipment according to the modified individual failure probability function and a preset risk level standard; A reliable remaining life determination unit, used to: determine the remaining life of the equipment when the failure probability of the equipment is at a low risk level according to the low risk level failure probability and the actual service age of the equipment; The limit remaining life determination unit is used to determine the remaining life of the equipment when the failure probability of the equipment is at the medium risk level according to the medium risk level failure probability and the actual service age of the equipment.

12. The circuit breaker life prediction device based on degradation index and Weibull distribution according to claim 7, characterized in that: Also included is a lifetime compensation module, including: A mechanical remaining life compensation unit, used to: in response to the circuit breaker device being used to project reactive power, determine the mechanical remaining life of the device according to the number of device operations, the total number of device operations preset, and the device design life, and correct the remaining life of the current device according to the mechanical remaining life; The electrical remaining life compensation unit is used to: in response to the circuit breaker device not being used to project reactive power, determine the electrical remaining life of the device according to the current value of each breaking of the device, the rated short-circuit breaking current and the design life of the device, and correct the remaining life of the current device according to the electrical remaining life.

13. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the program, the steps of the circuit breaker life prediction method based on degradation index and Weibull distribution according to any one of claims 1 to 6 are implemented.

14. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the circuit breaker life prediction method based on degradation index and Weibull distribution as described in any one of claims 1 to 6 are implemented.

15. A computer program product comprising a computer program / instructions, characterized in that When the computer program / instruction is executed by a processor, the steps of the circuit breaker life prediction method based on degradation index and Weibull distribution as described in any one of claims 1 to 6 are implemented.

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