Temperature detection circuit, temperature detection method, chip and battery manufacturing equipment

Abstract

The embodiment of the invention provides a temperature detection circuit, a temperature detection method, a chip and battery manufacturing equipment, and the temperature detection circuit comprises a calibration resistor array which is connected with an analog switch array and is used for connecting a calibration resistor to a circuit based on the closing of an analog switch corresponding to the calibration resistor in the calibration resistor in the analog switch array; the temperature sensor array is connected with the analog switch array and is used for communicating the temperature sensor corresponding to the temperature detection channel to the circuit based on closing of an analog switch corresponding to one temperature sensor in the temperature sensor array in the analog switch array; the signal acquisition controller is connected with the analog switch array and is used for controlling the closing of corresponding analog switches in the analog switch array; determining a temperature detection coefficient of the temperature monitoring channel based on the calibration voltage of the corresponding calibration resistor; and based on the detection voltage of the corresponding temperature sensor, determining the temperature value of the to-be-detected object in the temperature detection channel where the temperature sensor is located.

Description

Technical Field

[0001] The embodiments of the present application relate to the field of power electronics technology, and specifically to a temperature detection circuit, a temperature detection method, a chip, and a battery manufacturing device. Background Art

[0002] During the charge and discharge test of batteries, battery manufacturing equipment needs to monitor the surface temperature of the battery to be tested in a timely manner through a temperature detection circuit. If the detected temperature reaches the set safety protection trigger condition, fire-fighting measures can be initiated in time to avoid possible production safety accidents.

[0003] However, the temperature detection circuits in existing battery manufacturing equipment do not support automatic calibration of the temperature detection coefficient. Moreover, as the power density requirements of the equipment increase, the number of detection channels of the temperature detection circuit gradually increases, resulting in a decrease in the calibration efficiency of the temperature detection circuit and a decrease in the temperature detection accuracy of the temperature detection circuit.

[0004] In this context, what kind of temperature detection circuit to provide in order to improve its calibration efficiency and improve its temperature detection accuracy has become a technical problem that technical personnel in this field urgently need to solve. Summary of the invention

[0005] In view of this, the embodiments of the present application provide a temperature detection circuit, a temperature detection method, a chip, and a battery manufacturing device to improve the calibration efficiency of the temperature detection circuit and enhance the temperature detection accuracy.

[0006] To solve the above problems, an embodiment of the present application provides a temperature detection circuit, including: an analog switch array, a calibration resistor array, a temperature sensor array and a signal acquisition controller;

[0007] The calibration resistor array is connected to the analog switch array, and is used to connect the calibration resistor to the circuit based on the closing of the analog switch in the analog switch array corresponding to a calibration resistor in the calibration resistor, so as to determine the temperature detection coefficient of the temperature detection channel; wherein the temperature detection coefficient indicates the rate of change of the physical property of the temperature detection channel with the change of temperature; the temperature detection channel corresponds to the calibration resistor;

[0008] The temperature sensor array is connected to the analog switch array, and is used to connect the temperature sensor corresponding to the temperature detection channel to the circuit based on the closing of the analog switch in the analog switch array corresponding to a temperature sensor in the temperature sensor array, so as to determine the temperature value of the object to be measured in the temperature detection channel;

[0009] The signal acquisition controller is connected to the analog switch array to control the closing of the corresponding analog switch in the analog switch array; and based on the calibration voltage of the corresponding calibration resistor in the calibration resistor array, the temperature detection coefficient of the temperature monitoring channel is determined; based on the detection voltage of the corresponding temperature sensor in the temperature sensor array, the temperature value of the object to be measured in the temperature detection channel where the temperature sensor is located is determined.

[0010] Optionally, the temperature detection circuit further includes: an operational amplifier;

[0011] The operational amplifier is connected to the analog switch array, and is used to obtain the calibration voltage of the corresponding calibration resistor in the calibration resistor array, and convert the calibration voltage into a calibration voltage digital signal; and obtain the detection voltage of the corresponding temperature sensor in the temperature sensor array, and convert the detection voltage into a detection voltage digital signal;

[0012] The operational amplifier is connected to the signal acquisition controller and is used to send the calibration voltage digital signal and the detection voltage digital signal to the signal acquisition controller, so that the signal acquisition controller determines the temperature detection coefficient of the temperature monitoring channel based on the calibration voltage of the corresponding calibration resistor in the calibration resistor array; and determines the temperature value of the object to be measured in the temperature detection channel where the temperature sensor is located based on the detection voltage of the corresponding temperature sensor in the temperature sensor array.

[0013] Optionally, the temperature detection circuit further includes: a constant current source device;

[0014] The constant current source device is connected to the analog switch array and is used to connect the constant current source device to the circuit based on the closing of the corresponding analog switch in the analog switch array to provide a constant current to the circuit.

[0015] Optionally, the analog switch array includes a first analog switch array, a second analog switch array and a third analog switch array;

[0016] The constant current source device is connected to the analog switch array, specifically: the constant current source device is connected to the first analog switch array;

[0017] The calibration resistor array is connected to the analog switch array, specifically: the calibration resistor array is connected to the second analog switch array;

[0018] The temperature sensor array is connected to the analog switch array, specifically: the temperature sensor array is connected to the third analog switch array;

[0019] The operational amplifier is connected to the analog switch array, specifically: the operational amplifier is connected to the second analog switch array and the third analog switch array.

[0020] Optionally, a calibration resistor in the calibration resistor array includes a calibration pin, which is connected to the corresponding second analog switch in the second analog switch array, and the first node of the connecting line connected to the second analog switch at the calibration pin is connected to the corresponding first analog switch in the first analog switch array.

[0021] Optionally, a temperature sensor in the temperature sensor array includes a first pin and a second pin, the first pin is connected to the corresponding third-first analog switch in the third analog switch array, the second pin is connected to the corresponding third-second analog switch in the third analog switch array, and the second node of the connecting line connected to the third-first analog switch at the first pin is connected to the corresponding first analog switch in the first analog switch array.

[0022] Optionally, if the second analog switch corresponding to the calibration resistor in the second switch analog array is closed, the third analog switch in the third switch analog array corresponding to the temperature sensor of the object to be measured in the temperature monitoring channel corresponding to the calibration resistor is opened; or,

[0023] If the third analog switch corresponding to the temperature sensor in the third switch analog array is closed, the second analog switch corresponding to the calibration resistor corresponding to the temperature monitoring channel corresponding to the temperature sensor in the second switch analog array is opened.

[0024] The present application provides a temperature detection method, which is applied to the temperature detection circuit as described above. The method includes:

[0025] Obtaining a calibration voltage of a calibration resistor corresponding to a temperature detection channel, and determining a temperature detection coefficient of the temperature detection channel according to the calibration voltage;

[0026] A detection voltage of a temperature sensor corresponding to the temperature detection channel is acquired, and based on the temperature detection coefficient, a temperature value of the object to be measured in the temperature detection channel where the temperature sensor is located is determined.

[0027] An embodiment of the present application also provides a chip, comprising the temperature detection circuit as described above.

[0028] An embodiment of the present application also provides a battery manufacturing device, including the chip as described above.

[0029] Compared with the prior art, the technical solution of the embodiment of the present application has the following advantages:

[0030] In the temperature detection circuit, temperature detection method, chip and battery manufacturing equipment provided in the embodiments of the present application, the temperature detection circuit includes: an analog switch array, a calibration resistor array, a temperature sensor array and a signal acquisition controller; the calibration resistor array is connected to the analog switch array, and is used to connect the calibration resistor to the circuit based on the closing of the analog switch corresponding to a calibration resistor in the analog switch array, so as to determine the temperature detection coefficient of the temperature detection channel; wherein the temperature detection coefficient indicates the rate of change of the physical property of the temperature detection channel with the temperature change; the temperature detection channel corresponds to the calibration resistor; the temperature sensor array is connected to the analog switch array The analog switch array is used to connect the temperature sensor corresponding to the temperature detection channel to the circuit based on the closure of the analog switch corresponding to a temperature sensor in the temperature sensor array in the analog switch array, so as to determine the temperature value of the object to be measured in the temperature detection channel; the signal acquisition controller is connected to the analog switch array, and is used to control the closure of the corresponding analog switch in the analog switch array; and based on the calibration voltage of the corresponding calibration resistor in the calibration resistor array, the temperature detection coefficient of the temperature monitoring channel is determined; based on the detection voltage of the corresponding temperature sensor in the temperature sensor array, the temperature value of the object to be measured in the temperature detection channel where the temperature sensor is located is determined.

[0031] It can be seen that the embodiment of the present application can determine the temperature detection coefficient of the corresponding temperature detection channel based on the corresponding connection between the analog switch array and the calibration resistor array, thereby realizing automatic calibration of the temperature detection channel and improving the calibration efficiency of the temperature detection circuit. Furthermore, based on the connection between the temperature sensor array and the analog switch array, the temperature value of the object to be measured detected by the temperature sensor corresponding to the calibrated temperature detection channel is determined, thereby improving the temperature detection accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on the provided drawings without paying any creative work.

[0033] Figure 1 is a schematic diagram of the structure of a temperature detection circuit provided in an embodiment of the present application;

[0034] Figure 2 It is a flow chart of the temperature detection method provided in the embodiment of the present application;

[0035] Figure 3 It is a schematic diagram of the current transmission path corresponding to the connecting wire of the temperature sensor provided in an embodiment of the present application. DETAILED DESCRIPTION

[0036] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0037] As described in the background technology, the temperature detection circuits in existing battery manufacturing equipment do not support automatic calibration of the temperature detection coefficient. Moreover, as the power density requirements of the equipment increase, the number of detection channels of the temperature detection circuit gradually increases, resulting in a decrease in the calibration efficiency of the temperature detection circuit and a decrease in the temperature detection accuracy of the temperature detection circuit.

[0038] In view of this, the embodiment of the present application provides an improved temperature detection circuit solution, which can determine the temperature detection coefficient of the corresponding temperature detection channel based on the corresponding connection between the analog switch array and the calibration resistor array, thereby realizing automatic calibration of the temperature detection channel and improving the calibration efficiency of the temperature detection circuit. Furthermore, based on the connection between the temperature sensor array and the analog switch array, the temperature value of the object to be measured detected by the temperature sensor corresponding to the calibrated temperature detection channel is determined, thereby improving the temperature detection accuracy. .

[0039] Based on the above ideas, Figure 1 The schematic diagram of the structure of the temperature detection circuit provided by the embodiment of the present application is shown as an example. Figure 1 As shown, the temperature detection circuit includes an analog switch array (shown in the figure as a first analog switch array S1, a second analog switch array S2, and a third analog switch array S3), a calibration resistor array (RS1, RS2, ..., RSn), a temperature sensor array (RTD1, RTD2, ..., RTDn) and a signal acquisition controller.

[0040] The calibration resistor array is connected to the analog switch array and is used to connect the calibration resistor to the circuit based on the closing of an analog switch in the analog switch array corresponding to a calibration resistor in the calibration resistor to determine the temperature detection coefficient of the temperature detection channel.

[0041] It can be understood that based on the closing of the analog switch in the analog switch array corresponding to a calibration resistor in the calibration resistor, the calibration resistor is connected to the circuit, so that a corresponding calibration voltage can be generated based on the calibration resistor, and the temperature detection coefficient of the temperature detection channel is determined based on the relationship between the voltage value-resistance value-temperature value. Wherein, the temperature detection channel can be corresponding to the calibration resistor, and the temperature detection coefficient can indicate the rate of change of the physical property of the temperature detection channel with the temperature change.

[0042] It should be noted that the analog switch array in the embodiment of the present application can correspond to the temperature detection channel, for example, analog switch 1 corresponds to temperature detection channel 1, and analog switch 2 corresponds to temperature detection channel 2, so that when an analog switch in the analog switch array is closed and a calibration resistor in the calibration resistor array is connected to the circuit, the calibration resistor in the calibration resistor array can correspond to the temperature detection channel.

[0043] The temperature sensor array is connected to the analog switch array and is used to connect the temperature sensor corresponding to the temperature detection channel to the circuit based on the closing of the analog switch in the analog switch array corresponding to a temperature sensor in the temperature sensor array, so as to determine the temperature value of the object to be measured in the temperature detection channel.

[0044] The signal acquisition controller is connected to the analog switch array and is used to control the closing of the corresponding analog switch in the analog switch array. The signal acquisition controller can be a chip with computing capabilities, such as a CPU (central processing unit), so that the signal acquisition controller can determine the temperature detection coefficient of the temperature monitoring channel based on the calibration voltage of the corresponding calibration resistor in the calibration resistor array; and determine the temperature value of the object to be measured in the temperature detection channel where the temperature sensor is located based on the detection voltage of the corresponding temperature sensor in the temperature sensor array.

[0045] It should be noted that, in order to ensure that the calibration resistors in the calibration resistor array and the temperature sensors in the temperature sensor array are not damaged, one end of each device in the calibration resistor array and the temperature sensor array is grounded.

[0046] It can be seen that the embodiment of the present application can determine the temperature detection coefficient of the corresponding temperature detection channel based on the corresponding connection between the analog switch array and the calibration resistor array, thereby realizing automatic calibration of the temperature detection channel and improving the calibration efficiency of the temperature detection circuit. Furthermore, based on the connection between the temperature sensor array and the analog switch array, the temperature value of the object to be measured detected by the temperature sensor corresponding to the calibrated temperature detection channel is determined, thereby improving the temperature detection accuracy.

[0047] In some embodiments, in order to realize the calculation of the temperature detection coefficient and the temperature value by the signal acquisition controller, the temperature detection circuit of the embodiment of the present application may also include an operational amplifier. In a specific example, the operational amplifier circuit may be specifically an AD converter, which converts the analog signal into a digital signal.

[0048] The operational amplifier can be connected to the analog switch array to obtain the calibration voltage of the corresponding calibration resistor in the calibration resistor array and convert the calibration voltage into a calibration voltage digital signal. Also, the operational amplifier can be connected to the analog switch array to obtain the detection voltage of the corresponding temperature sensor in the temperature sensor array and convert the detection voltage into a detection voltage digital signal.

[0049] The operational amplifier can be connected to the signal acquisition controller, and is used to send the calibration voltage digital signal and the detection voltage digital signal to the signal acquisition controller, so that the signal acquisition controller determines the temperature detection coefficient of the temperature monitoring channel based on the calibration voltage of the corresponding calibration resistor in the calibration resistor array. And, based on the detection voltage of the corresponding temperature sensor in the temperature sensor array, the temperature value of the object to be measured in the temperature detection channel where the temperature sensor is located is determined.

[0050] In some embodiments, the temperature detection circuit of the embodiment of the present application may further include a constant current source device, wherein the constant current source device is connected to the analog switch array, and is used to connect the constant current source device to the circuit based on the closing of the corresponding analog switch in the analog switch array to provide a constant current for the circuit.

[0051] In some embodiments, to achieve connection between different devices in a circuit, the analog switch array in the embodiment of the present application may include a first analog switch array S1 , a second analog switch array S2 , and a third analog switch array S3 .

[0052] The constant current source device being connected to the analog switch array may specifically be connected to the first analog switch array S1. For example, the constant current source device may be connected to an analog switch in S1.

[0053] The calibration resistor array being connected to the analog switch array may specifically be that the calibration resistor array is connected to the second analog switch array S2. For example, RS1 in the calibration resistor array is connected to a corresponding analog switch in S2.

[0054] The temperature sensor array being connected to the analog switch array may specifically be that the temperature sensor array is connected to the third analog switch array S3. For example, RTD1 in the temperature sensor array is connected to a corresponding analog switch in S3.

[0055] The operational amplifier connecting the analog switch array may specifically be: the operational amplifier connecting the second analog switch array S2 and the third analog switch array S3. Wherein, by connecting the second analog switch array S2 and the third analog switch array S3 through the operational amplifier, a calibration voltage obtained based on a calibration resistor connected to a corresponding analog switch may be transmitted to the operational amplifier, or a detection voltage obtained based on a temperature sensor connected to a corresponding analog switch may be transmitted to the operational amplifier.

[0056] In some embodiments, based on the correspondence between calibration resistors and temperature detection channels, and the correspondence between temperature detection channels and analog switches, a calibration resistor in the calibration resistor array may include a calibration pin, the calibration pin is connected to the corresponding second analog switch in the second analog switch array, and the first node T1 of the connection line connected to the second analog switch at the calibration pin is connected to the corresponding first analog switch in the first analog switch array.

[0057] In some embodiments, based on the correspondence between the temperature sensor and the temperature detection channel, and the correspondence between the temperature detection channel and the analog switch, a temperature sensor in the temperature sensor array may include a first pin and a second pin, the first pin being connected to the corresponding third-first analog switch in the third analog switch array, the second pin being connected to the corresponding third-second analog switch in the third analog switch array, and the second node T2 of the connecting line connecting the third-first analog switch at the first pin is connected to the corresponding first analog switch in the first analog switch array.

[0058] Further, in some embodiments, the calibration of the temperature detection channel and the temperature detection in the embodiments of the present application may be performed separately. As an optional implementation, if the second analog switch corresponding to the calibration resistor in the second switch analog array is closed, the third analog switch corresponding to the temperature sensor of the object to be measured in the temperature monitoring channel corresponding to the calibration resistor in the third switch analog array is opened.

[0059] As another optional implementation, if the third analog switch corresponding to the temperature sensor in the third switch analog array is closed, the second analog switch corresponding to the calibration resistor corresponding to the temperature monitoring channel corresponding to the temperature sensor in the second switch analog array is opened.

[0060] It should be noted that the number of analog switches in the second analog switch array and the third analog switch array in the embodiment of the present application is the same, and each analog switch in the second analog switch array and the third analog switch array corresponds to the temperature detection channel; the number of analog switches in the first analog switch array can be twice the number of analog switches in the second analog switch array or the third analog switch array, one part is used to connect the constant current source device to the calibration resistor, and one part is used to connect the constant current source to the temperature sensor. In addition, in order to achieve accurate calibration of the temperature detection circuit, the calibration resistor connected to the second analog switch in the second analog switch array can be different calibration resistors corresponding to the same temperature detection channel.

[0061] It can be understood that based on the correspondence between the calibration resistor and the temperature detection channel, by closing the second analog switch array, the calibration resistor can be connected to the corresponding temperature detection channel to determine the temperature detection coefficient of the temperature detection channel, thereby eliminating the need to adjust the temperature detection channels one by one, thereby improving the convenience of calibration of the temperature detection circuit and effectively reducing the calibration cost of the temperature detection circuit, such as the time cost and labor cost of adjusting the temperature detection channels one by one.

[0062] In some embodiments, the temperature detection circuit of the embodiment of the present application may further include an interface circuit, which is connected to the signal acquisition controller and is used to output the signal of the signal acquisition controller to an external device so that the external device can obtain corresponding data, such as temperature value and other information.

[0063] The temperature detection circuit of the embodiment of the present application includes: an analog switch array, a calibration resistor array, a temperature sensor array and a signal acquisition controller; the calibration resistor array is connected to the analog switch array, and is used to connect the calibration resistor to the circuit based on the closing of the analog switch corresponding to a calibration resistor in the analog switch array, so as to determine the temperature detection coefficient of the temperature detection channel; wherein the temperature detection coefficient indicates the rate of change of the physical property of the temperature detection channel with the temperature change; the temperature detection channel corresponds to the calibration resistor; the temperature sensor array is connected to the analog switch array, and is used to connect the temperature sensor corresponding to the temperature detection channel to the circuit based on the closing of the analog switch corresponding to a temperature sensor in the temperature sensor array in the analog switch array, so as to determine the temperature value of the object to be measured in the temperature detection channel; the signal acquisition controller is connected to the analog switch array, and is used to control the closing of the corresponding analog switch in the analog switch array; and based on the calibration voltage of the corresponding calibration resistor in the calibration resistor array, the temperature detection coefficient of the temperature monitoring channel is determined; based on the detection voltage of the corresponding temperature sensor in the temperature sensor array, the temperature value of the object to be measured in the temperature detection channel where the temperature sensor is located is determined.

[0064] It can be seen that the embodiment of the present application can determine the temperature detection coefficient of the corresponding temperature detection channel based on the corresponding connection between the analog switch array and the calibration resistor array, thereby realizing automatic calibration of the temperature detection channel and improving the calibration efficiency of the temperature detection circuit. Furthermore, based on the connection between the temperature sensor array and the analog switch array, the temperature value of the object to be measured detected by the temperature sensor corresponding to the calibrated temperature detection channel is determined, thereby improving the temperature detection accuracy.

[0065] To further understand the determination of the temperature value by the temperature detection circuit of the present application, Figure 2 The flow chart of the temperature detection method of the embodiment of the present application is exemplarily shown, and the temperature detection method can be applied to the temperature detection circuit described above, and can be specifically implemented by the signal acquisition controller of the temperature detection circuit. Among them, the content of the following detection method can be referenced to the above content.

[0066] like Figure 2 As shown, the temperature detection method may include the following steps.

[0067] Step S11, obtaining a calibration voltage of a calibration resistor corresponding to a temperature detection channel, and determining a temperature detection coefficient of the temperature detection channel according to the calibration voltage.

[0068] To ensure the accuracy of the temperature detection coefficient, there may be at least two calibration voltages, and the at least two calibration voltages may correspond to different calibration resistors, respectively.

[0069] In an optional example, by drawing a relationship graph based on at least two calibration voltages, a temperature detection coefficient of the temperature detection channel can be obtained, wherein the temperature detection coefficient can be obtained by the slope of the drawn relationship graph.

[0070] Corresponding reference Figure 1 The structure shown is an optional application example. The constant current source circuit can generate a stable current. The signal acquisition controller selects one analog switch in the analog switch array S1, and applies the circuit in the circuit to the corresponding calibration resistor of the calibration resistor array, such as RS1, so as to generate a corresponding calibration voltage; the weak calibration voltage is amplified into a stronger calibration voltage signal by the operational amplifier and AD converted, and then transmitted to the signal acquisition controller. The signal acquisition controller performs a table lookup calculation to obtain the temperature value (such as 0°C) corresponding to the voltage value and the resistance value. Among them, the table queried by the signal acquisition controller can be a record table of voltage-resistance-temperature values ​​recorded in the corresponding program, and the content of the table can be obtained based on the corresponding experimental data.

[0071] By repeating the above steps, the constant current source circuit can generate a stable current. The signal acquisition controller selects one analog switch in the analog switch array S1, and applies the circuit in the circuit to the corresponding calibration resistor of the calibration resistor array, such as RS2, so as to generate a corresponding calibration voltage; the weak calibration voltage is amplified by the operational amplifier into a stronger calibration voltage signal and AD converted, and then transmitted to the signal acquisition controller, which performs a table lookup calculation to obtain the temperature value (for example, 100°C) corresponding to the voltage value and the resistance value.

[0072] Furthermore, based on the above steps, two calibration voltages corresponding to the two calibration resistors are obtained, and the signal acquisition controller performs linear fitting processing based on the two calibration voltages to obtain a relationship graph, so that the slope of the relationship graph can be determined as the temperature detection coefficient.

[0073] Step S12, acquiring the detection voltage of the temperature sensor corresponding to the temperature detection channel, and determining the temperature value of the object to be measured in the temperature detection channel where the temperature sensor is located based on the temperature detection coefficient.

[0074] Among them, when the temperature sensor of the embodiment of the present application includes two pins, the temperature value of the object to be measured in the temperature detection channel where the temperature sensor is located can be determined by reading the two-point detection voltages corresponding to the two pins based on the "three-wire method".

[0075] Corresponding reference Figure 1 The structure shown is an optional application example. When performing temperature detection, the constant current source circuit can generate a stable current (i.e., constant current source current). The signal acquisition controller enables one analog switch in the analog switch array S1, and applies the constant current source current to the temperature sensor corresponding to the temperature detection channel, such as RTD1; then, the signal acquisition controller enables one analog switch in the analog switch array S3, thereby generating a corresponding detection voltage, such as U1. The signal acquisition controller enables one analog switch in the analog switch array S3, and the analog switch can be considered as the second acquisition point corresponding to the same temperature sensor, thereby generating a corresponding detection voltage, such as U2. Furthermore, two detection voltages corresponding to the same temperature detection channel, namely U1 and U2, can be obtained.

[0076] Furthermore, the voltage difference corresponding to U1 and U2 is determined according to the "three-wire method" to eliminate the error, determine the resistance value corresponding to the voltage after the error is eliminated, and determine the temperature value corresponding to the resistance value. Among them, the three wires can be understood as the three transmission lines corresponding to the temperature sensor, that is, the connection between the two pins, and the ground wire of the temperature sensor. The embodiment of the present application can also eliminate the error of the detection voltage based on the "four-wire system, six-wire system" and other methods. The embodiment of the present application does not limit the method of eliminating the error, as long as the error elimination of the detection voltage is satisfied.

[0077] To facilitate understanding of the above content, Figure 3 The schematic diagram of the current transmission path corresponding to the connection line of the temperature sensor is shown as an example, where RT is the temperature sensor, rL1, rL2, and rL3 are the line resistances of the three lines of the temperature sensor, and rL1 = rL2 = rL3, and the direction indicated by the dotted line is the flow direction of the current I.

[0078] When calculating the resistance of the temperature sensor, it can be obtained according to the following formula:

[0079] U1=I*(rL1+RT+rL3)=I*(2rL1+RT);

[0080] U2=I*rL3=I*rL1;

[0081] U1-2U2=I*RT;

[0082] RT=(U1-2U2) / I.

[0083] Based on the determined resistance value, the corresponding "resistance value-temperature value" specification table of the temperature sensor is queried to obtain the corresponding actual temperature value. Among them, the temperature value is the value obtained after excluding the influence of the temperature sensor's own line resistance. It can be seen that the temperature detection circuit of the embodiment of the present application can effectively improve the sampling accuracy of the temperature detection circuit.

[0084] It can be seen that the temperature detection method of the embodiment of the present application can realize automatic calibration of the temperature detection coefficient and improve the calibration efficiency of the temperature detection circuit; further, based on the improvement of the calibration efficiency, the sampling accuracy of the temperature is also improved.

[0085] An embodiment of the present application also provides a chip, which may include the temperature detection circuit as described above.

[0086] An embodiment of the present application also provides a battery manufacturing device, which may include the chip as described above.

[0087] The above describes multiple implementation schemes provided by the embodiments of the present application. The various optional methods introduced in each implementation scheme can be combined and cross-referenced with each other without conflict, thereby extending a variety of possible implementation schemes, which can all be considered as implementation schemes disclosed and open in the embodiments of the present application.

[0088] Although the embodiments of the present application are disclosed above, the present application is not limited thereto. Any person skilled in the art may make various changes and modifications without departing from the spirit and scope of the present application. Therefore, the scope of protection of the present application shall be subject to the scope defined by the claims.

Claims

1. A temperature detection circuit, characterized in that: include: Analog switch array, calibration resistor array, temperature sensor array and signal acquisition controller; The calibration resistor array is connected to the analog switch array, and is used to connect the calibration resistor to the circuit based on the closing of the analog switch in the analog switch array corresponding to a calibration resistor in the calibration resistor, so as to determine the temperature detection coefficient of the temperature detection channel; wherein the temperature detection coefficient indicates the rate of change of the physical property of the temperature detection channel with the change of temperature; the temperature detection channel corresponds to the calibration resistor; The temperature sensor array is connected to the analog switch array, and is used to connect the temperature sensor corresponding to the temperature detection channel to the circuit based on the closing of the analog switch in the analog switch array corresponding to a temperature sensor in the temperature sensor array, so as to determine the temperature value of the object to be measured in the temperature detection channel; The signal acquisition controller is connected to the analog switch array to control the closing of the corresponding analog switch in the analog switch array; and based on the calibration voltage of the corresponding calibration resistor in the calibration resistor array, the temperature detection coefficient of the temperature monitoring channel is determined; based on the detection voltage of the corresponding temperature sensor in the temperature sensor array, the temperature value of the object to be measured in the temperature detection channel where the temperature sensor is located is determined.

2. The temperature detection circuit according to claim 1, characterized in that: The temperature detection circuit also includes: an operational amplifier; The operational amplifier is connected to the analog switch array, and is used to obtain the calibration voltage of the corresponding calibration resistor in the calibration resistor array, and convert the calibration voltage into a calibration voltage digital signal; and obtain the detection voltage of the corresponding temperature sensor in the temperature sensor array, and convert the detection voltage into a detection voltage digital signal; The operational amplifier is connected to the signal acquisition controller and is used to send the calibration voltage digital signal and the detection voltage digital signal to the signal acquisition controller, so that the signal acquisition controller determines the temperature detection coefficient of the temperature monitoring channel based on the calibration voltage of the corresponding calibration resistor in the calibration resistor array; and determines the temperature value of the object to be measured in the temperature detection channel where the temperature sensor is located based on the detection voltage of the corresponding temperature sensor in the temperature sensor array.

3. The temperature detection circuit according to claim 2, characterized in that: The temperature detection circuit also includes: a constant current source device; The constant current source device is connected to the analog switch array and is used to connect the constant current source device to the circuit based on the closing of the corresponding analog switch in the analog switch array to provide a constant current to the circuit.

4. The temperature detection circuit according to claim 3, characterized in that: The analog switch array includes a first analog switch array, a second analog switch array and a third analog switch array; The constant current source device is connected to the analog switch array, specifically: the constant current source device is connected to the first analog switch array; The calibration resistor array is connected to the analog switch array, specifically: the calibration resistor array is connected to the second analog switch array; The temperature sensor array is connected to the analog switch array, specifically: the temperature sensor array is connected to the third analog switch array; The operational amplifier is connected to the analog switch array, specifically: the operational amplifier is connected to the second analog switch array and the third analog switch array.

5. The temperature detection circuit according to claim 4, characterized in that: A calibration resistor in the calibration resistor array includes a calibration pin, which is connected to the corresponding second analog switch in the second analog switch array, and a first node of a connection line connected to the second analog switch at the calibration pin is connected to the corresponding first analog switch in the first analog switch array.

6. The temperature detection circuit according to claim 4, characterized in that: A temperature sensor in the temperature sensor array includes a first pin and a second pin, the first pin is connected to the corresponding third-first analog switch in the third analog switch array, the second pin is connected to the corresponding third-second analog switch in the third analog switch array, and the second node of the connecting line connected to the third-first analog switch at the first pin is connected to the corresponding first analog switch in the first analog switch array.

7. The temperature detection circuit according to any one of claims 5 or 6, characterized in that: If the second analog switch corresponding to the calibration resistor in the second switch analog array is closed, the third analog switch in the third switch analog array corresponding to the temperature sensor of the object to be measured in the temperature monitoring channel corresponding to the calibration resistor is opened; or, If the third analog switch corresponding to the temperature sensor in the third switch analog array is closed, the second analog switch corresponding to the calibration resistor corresponding to the temperature monitoring channel corresponding to the temperature sensor in the second switch analog array is opened.

8. A temperature detection method, characterized in that: Applied to the temperature detection circuit according to any one of claims 1 to 7, the method comprises: Obtaining a calibration voltage of a calibration resistor corresponding to a temperature detection channel, and determining a temperature detection coefficient of the temperature detection channel according to the calibration voltage; A detection voltage of a temperature sensor corresponding to the temperature detection channel is acquired, and based on the temperature detection coefficient, a temperature value of the object to be measured in the temperature detection channel where the temperature sensor is located is determined.

9. A chip, characterized in that: The temperature detection circuit comprises the temperature detection circuit according to any one of claims 1 to 7.

10. A battery manufacturing device, characterized in that: Comprising the chip as claimed in claim 9.

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