Material testing device and material testing method

Abstract

The invention provides a material testing device and a material testing method, and belongs to the technical field of concrete structure reinforcement. The material testing device and the material testing method comprise a testing column, an adjusting structure and a driving part; the test column is used for winding the first part of the memory alloy wire; the adjusting structure comprises a first adjusting part and a second adjusting part; the first adjusting piece is used for winding a second part of the memory alloy wire, the second adjusting piece is used for winding a third part of the memory alloy wire, and at least one of the first adjusting piece and the second adjusting piece can move relative to the test column; the driving part is at least used for driving the first adjusting part and the second adjusting part to get close to each other or get away from each other. The problems that the process of installing the memory alloy wire on the test column is troublesome, and the test period of the memory alloy wire is long can be solved.

Description

Technical Field

[0001] The present application relates to the field of concrete structure reinforcement, and in particular to a material testing device and a material testing method. Background Art

[0002] Memory alloy wire is a special metal material with shape memory effect and is widely used in the construction field. In the material test of memory alloy wire, it is usually necessary to fix the memory alloy wire on the test column, and then stretch the memory alloy wire to adjust the prestress of the memory alloy wire, so as to obtain the bearing capacity of the memory alloy wire.

[0003] However, the process of installing the memory alloy wire on the test column is cumbersome and the test cycle of the memory alloy wire is long. Summary of the invention

[0004] In view of this, the embodiments of the present application provide a material testing device and a material testing method to solve the problem that the process of installing the memory alloy wire on the test column is complicated and the test cycle of the memory alloy wire is long.

[0005] To achieve the above-mentioned purpose, the present application provides a material testing device, which includes a test column, an adjustment structure and a driving member;

[0006] The test column is used to wind the first part of the memory alloy wire;

[0007] The adjustment structure includes a first adjustment member and a second adjustment member;

[0008] The first adjusting member is used for winding the second portion of the memory alloy wire, and the second adjusting member is used for winding the third portion of the memory alloy wire. At least one of the first adjusting member and the second adjusting member is movable relative to the test column.

[0009] The driving member is at least used to drive the first adjusting member and the second adjusting member to move closer to or away from each other.

[0010] In a possible implementation manner, the first adjusting member and the second adjusting member are arranged in parallel and spaced apart from each other, and an extension direction of the first adjusting member and the second adjusting member is arranged in parallel with an extension direction of the test column.

[0011] In a possible implementation, it further includes a control structure, wherein the control structure includes a first control element and a second control element;

[0012] The first control member is fixed to the first adjusting member, the second control member is fixed to the second adjusting member, and both the first control member and the second control member are connected to the driving member.

[0013] In a possible implementation, the driving member is disposed through the first control member and the second control member;

[0014] The driving member is threadedly connected to the first control member, and the driving member drives the first adjusting member to move through the first control member; the driving member is rotationally connected to the second control member.

[0015] In a possible implementation, the driving member is disposed through the first control member and the second control member, the driving member is rotationally connected to the first control member, and the driving member is rotationally connected to the second control member;

[0016] The driving member is provided with at least one adjusting nut, the adjusting nut is threadedly connected to the driving member, and the adjusting nut is at least used to fix the first adjusting member or the second adjusting member to the driving member.

[0017] In a possible implementation, the extension direction of the driving member is perpendicular to the extension direction of the test column;

[0018] The material testing device further comprises at least one guide member, the extension direction of the guide member is arranged parallel to the extension direction of the driving member, and the guide member is arranged through the first adjusting member and the second adjusting member.

[0019] In a possible implementation, the number of the guide members is set to two, and the two guide members are arranged on both sides of the driving member along the extending direction of the driving member.

[0020] In a possible implementation, it further includes a fixing structure, wherein the fixing structure includes a first fixing member and a second fixing member;

[0021] The first fixing member is at least used to fix the second portion of the memory alloy wire to the first adjusting member, and the second fixing member is at least used to fix the third portion of the memory alloy wire to the second adjusting member.

[0022] In a possible implementation, the first adjusting member and the second adjusting member are movable relative to the test column;

[0023] The first adjusting member is fixedly connected to the first fixing member, and the second adjusting member is fixedly connected to the second fixing member.

[0024] On the other hand, the present application provides a material testing method, comprising the following steps:

[0025] S1: placing a first adjusting member and a second adjusting member close to a test column, wherein at least one of the first adjusting member and the second adjusting member is movable relative to the test column;

[0026] S2: Winding the memory alloy wire around the first adjusting member, the second adjusting member and the test column; the first part of the memory alloy wire is wound around the test column, the second part of the memory alloy wire is wound around the first adjusting member, and the third part of the memory alloy wire is wound around the second adjusting member;

[0027] S3: driving the first adjusting member and the second adjusting member to move closer to or away from each other via a driving member.

[0028] The material testing device and material testing method provided in the embodiments of the present application use the design of the adjustment structure and the driving member so that the memory alloy wire can be quickly fixed on the test column, thereby reducing the complexity of manual operation;

[0029] By using a driving member to drive the first adjusting member and the second adjusting member to move closer to or farther from each other, the distance between the first adjusting member and the second adjusting member can be accurately controlled. By changing the distance between the first adjusting member and the second adjusting member, the prestress level of the memory alloy wire can be controlled, thereby ensuring that the prestress adjustment of the memory alloy wire in the test is more accurate.

[0030] The adjustment structure can adapt to memory alloy wires of different sizes and shapes, increasing the versatility of the device;

[0031] By using the driving member, the first adjusting member and the second adjusting member can slide in opposite directions along the bolt, the fixed memory alloy wire can be stretched for a second time, and the prestress strength of the memory alloy wire can be studied at multiple levels;

[0032] The material testing device of the embodiment of the present application can adjust the spacing of the wound test column before applying prestress to the memory alloy wire, which can effectively reduce costs; different reinforcement spacings have different reinforcement degrees for the test column, and the spacing and degree of the memory alloy wire on the test column can be determined by the chloride ion content in the saline-alkali land in different regions and the seismic fortification intensity. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0034] Figure 1 A schematic diagram of a material testing device provided in an embodiment of the present application;

[0035] Figure 2 A schematic diagram of an adjusting nut of a material testing device provided in an embodiment of the present application;

[0036] Figure 3 A schematic diagram of a fixing structure in a material testing device provided in an embodiment of the present application;

[0037] Figure 4 A schematic diagram of a memory metal wire winding method in a material testing device provided in an embodiment of the present application;

[0038] Figure 5 A flow chart of a material testing method provided in an embodiment of the present application.

[0039] In the accompanying drawings, the components represented by the reference numerals are listed as follows:

[0040] 100. Test column;

[0041] 210, first adjusting member; 220, second adjusting member;

[0042] 300, driving member; 310, adjusting nut;

[0043] 410, first control element; 420, second control element;

[0044] 500, guide member; 510, limit ring;

[0045] 601, first clamp; 602, second clamp; 603, winding bolt; 604, fixing nut; 610, first fixing member; 620, second fixing member.

[0046] The above drawings have shown clear embodiments of the present application, which will be described in more detail later. These drawings and text descriptions are not intended to limit the scope of the present application in any way, but to illustrate the concept of the present application to those skilled in the art by referring to specific embodiments. DETAILED DESCRIPTION

[0047] In order to make the purpose, technical scheme and advantages of the present application clearer, the technical scheme in the embodiment of the present application will be described in more detail below in conjunction with the drawings in the preferred embodiments of the present application. In the drawings, the same or similar reference numerals throughout represent the same or similar parts or parts with the same or similar functions. The described embodiments are part of the embodiments of the present application, not all of the embodiments. The embodiments described below with reference to the drawings are exemplary and are intended to be used to explain the present application, and should not be construed as limitations on the present application. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present application. The embodiments of the present application are described in detail below in conjunction with the drawings.

[0048] In the description of the embodiments of the present application, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, or it can be an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0049] In the description of the embodiments of the present application, it should be understood that the terms "upper", "lower", "front", "back", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0050] In the description of the embodiments of the present application, “plurality” means two or more than two, unless otherwise precisely and specifically specified.

[0051] The terms "first", "second", "third", "fourth", etc. in the specification and claims of this application and the above-mentioned drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence.

[0052] In addition, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover non-exclusive inclusions. For example, a process, method, system, product, or apparatus that includes a series of steps or elements is not necessarily limited to those steps or elements explicitly listed, but may include other steps or elements not explicitly listed or inherent to such process, method, product, or apparatus.

[0053] Shape Memory Alloy (SMA) is a special metal material with shape memory effect and superelastic properties. Common memory alloy wire materials include nickel-titanium alloy (NiTi), copper-based alloy (such as Cu-Al-Ni), etc. Memory alloy wire is widely used in the fields of construction, aviation, medical treatment, etc., especially in occasions where shape recovery or high strain recovery ability is required. Prestress strength is a key parameter affecting its performance. Through research, the composition and processing technology of the alloy can be optimized to meet the needs of specific applications.

[0054] Prestress refers to an initial stress artificially applied to a material or structure to improve its performance or meet specific functional requirements. Memory alloy wire has a shape memory effect. After being deformed at a specific temperature, it can be restored to its original shape by heating. Memory alloy wire also has superelasticity, can withstand large strains within a certain temperature range, and return to its original shape after unloading.

[0055] For memory alloy wires, prestress is usually applied during the manufacturing or processing process so that it can better exert the shape memory effect or superelastic effect during use.

[0056] As mentioned in the background, fiber reinforced polymer (FRP) cloth is usually used for prestress measurement tests on memory alloy wires. Among them, fiber reinforced polymer cloth is referred to as FRP cloth (Fiber Reinforced Polymer, FRP). It is a material composed of high-strength fibers (such as glass fibers, carbon fibers or aramid fibers) and resin matrices (such as epoxy resins, polyester resins, etc.). Fiber reinforced polymer cloth has the advantages of high strength, light weight, corrosion resistance, and fatigue resistance, so it is widely used in construction, bridges, aerospace, automobile manufacturing and other fields.

[0057] The test process is as follows:

[0058] Mark the fixing position of the memory alloy wire on the concrete column;

[0059] Use a high-strength adhesive (such as epoxy resin) to stick the memory alloy wire to the concrete column. When sticking, make sure that the memory alloy wire is close to the surface of the concrete column and remains straight;

[0060] Use fixing clamps at both ends of the memory alloy wire to ensure that the memory alloy wire does not move during the curing process of the adhesive;

[0061] Cut fiber reinforced polymer cloth of appropriate size according to the size of concrete column and test requirements;

[0062] Apply adhesive evenly on the surface of concrete column and fiber reinforced polymer cloth;

[0063] Paste the fiber-reinforced polymer cloth on the concrete column, cover it with the memory alloy wire, and use a roller or other tools to compact the fiber-reinforced polymer cloth to ensure that it is tightly bonded to the surface of the concrete column;

[0064] According to the shape memory effect of the memory alloy wire, the wire is restored to a predetermined shape by heating, thereby applying prestress;

[0065] After the memory alloy wire is restored to a predetermined shape and prestress is applied, the memory alloy wire is cooled and ensured to be fixed in a prestressed state;

[0066] Install strain gauges or other sensors on the memory alloy wire and the fiber-reinforced polymer cloth to monitor stress and strain in real time;

[0067] A data acquisition system was used to record the stress and strain data of the memory alloy wire and fiber-reinforced polymer cloth during the test.

[0068] The above process takes a long time to install the memory alloy wire of the test material, the installation effect is poor, and the test data is not accurate enough.

[0069] Based on the above technical problems, the embodiments of the present application provide a material testing device and a material testing method. By using the design of an adjustment structure and a driving member, the memory alloy wire can be quickly fixed on the test column, reducing the complexity of manual operation; by using the driving member to drive the first adjusting member and the second adjusting member to move closer to or away from each other, the distance between the first adjusting member and the second adjusting member can be accurately controlled, and by changing the distance between the first adjusting member and the second adjusting member, the prestress level of the memory alloy wire can be controlled to ensure that the prestress adjustment of the memory alloy wire in the test is more accurate; the adjustment structure can adapt to memory alloy wires of different sizes and shapes, increasing the versatility of the device; by using the driving member, the first adjusting member and the second adjusting member can be slid in opposite directions along the bolt, the fixed memory alloy wire can be stretched for the second time, and the prestress strength of the memory alloy wire can be studied at multiple levels.

[0070] The present application is described in detail below with reference to the accompanying drawings and specific embodiments:

[0071] like Figure 1 As shown, the embodiment of the present application provides a material testing device, including a test column 100, an adjustment structure and a driving member 300;

[0072] The test column 100 is used to wind the first part of the memory alloy wire;

[0073] The adjustment structure includes a first adjustment member 210 and a second adjustment member 220;

[0074] The first adjusting member 210 is used to wind the second portion of the memory alloy wire, and the second adjusting member 220 is used to wind the third portion of the memory alloy wire. At least one of the first adjusting member 210 and the second adjusting member 220 is movable relative to the test column 100.

[0075] The driving member 300 is at least used to drive the first adjusting member 210 and the second adjusting member 220 to move closer to or away from each other.

[0076] It should be noted that the test column 100 may be a concrete column, which has high compressive strength and durability and can withstand large loads and long-term use.

[0077] In a possible implementation, the first adjusting member 210 and the second adjusting member 220 are steel rods. Using the above technical solution, the first adjusting member 210 and the second adjusting member 220 have high strength and are not easily deformed, thereby avoiding affecting the test results.

[0078] By using the design of the adjustment structure and the driving member, the memory alloy wire can be quickly fixed on the test column, reducing the complexity of manual operation; by using the driving member 300 to drive the first adjustment member 210 and the second adjustment member 220 to move closer to or away from each other, the distance between the first adjustment member 210 and the second adjustment member 220 can be accurately controlled, and the prestress level of the memory alloy wire can be controlled by changing the distance between the first adjustment member 210 and the second adjustment member 220, ensuring that the prestress adjustment of the memory alloy wire in the test is more accurate; the adjustment structure can adapt to memory alloy wires of different sizes and shapes, increasing the versatility of the device.

[0079] By using the driving member 300, the first adjusting member 210 and the second adjusting member 220 can slide in opposite directions along the bolt, the fixed memory alloy wire can be stretched for a second time, and the prestress strength of the memory alloy wire can be studied at multiple levels;

[0080] This device can adjust the spacing of the wound test column 100 before applying prestress to the memory alloy wire. Different reinforcement spacings have different reinforcement degrees for the test column 100. The spacing and degree of reinforcement can be determined by the chloride ion content in saline-alkali land in different regions and the seismic fortification intensity, which can effectively reduce costs.

[0081] It should be noted that the memory alloy wire may include a first portion, a second portion and a third portion connected to each other, the first portion being wound around the test column 100, the second portion being wound around the first adjusting member 210, and the third portion being wound around the second adjusting member 220. The second portion may be connected to the third portion through the first portion.

[0082] The memory alloy wire can be configured as follows: the first adjusting member 210 and the second adjusting member 220 are spaced apart, and then the memory alloy wire is wound around the second adjusting member 220 and when the outer sides of the second adjusting member 220 are in contact with the first adjusting member, part of the memory alloy wire contacts with the second adjusting member.

[0083] When the portion of the memory alloy wire that is not in contact with the first adjusting member 210 and the second adjusting member 220 is wrapped around the outside of the test column 100 , the portion in contact with the test column 100 is set as the first portion of the memory alloy wire.

[0084] When the part of the memory alloy wire not in contact with the first adjusting member 210 and the second adjusting member 220 is wrapped around the outside of the test column, the part in contact with the first adjusting member 210 is set as the second part of the memory alloy wire, and the part in contact with the second adjusting member 220 is set as the third part of the memory alloy wire.

[0085] In a possible implementation manner, the first adjusting member 210 and the second adjusting member 220 are arranged in parallel and spaced apart from each other, and the extension direction of the first adjusting member 210 and the second adjusting member 220 is arranged in parallel with the extension direction of the test column 100 .

[0086] There is a certain interval between the first adjusting member 210 and the second adjusting member 220, which means that they are not closely connected, but have a certain distance therebetween. This interval setting can ensure that during the adjustment process, the first adjusting member 210 and the second adjusting member 220 will not interfere with each other, thereby ensuring the accuracy and stability of the adjustment.

[0087] The first adjusting member 210 and the second adjusting member 220 arranged in parallel can ensure that when the memory alloy wire is stretched, the force is evenly distributed along the extension direction of the memory alloy wire, avoiding local stress concentration, which helps to obtain more accurate bearing capacity data of the memory alloy wire and obtain more precise test data.

[0088] In a possible implementation, a control structure is further included, and the control structure includes a first control component 410 and a second control component 420 .

[0089] The first control member 410 is fixed to the first adjusting member 210 , the second control member 420 is fixed to the second adjusting member 220 , and both the first control member 410 and the second control member 420 are connected to the driving member 300 .

[0090] The first control member 410 is relatively fixed to the first adjustment member 210 so that they can move synchronously during operation. The second control member 420 is also relatively fixed to the second adjustment member 220 to ensure synchronous movement.

[0091] It should be understood that during the test, the connection relationship between the first control member 410 and the first adjusting member 210, and the second control member 420 and the second adjusting member 220 is relatively fixed, so that the first control member 410 can push the first adjusting member 210 and / or the second fixing member 620 can push the second adjusting member 220. There is no need for a specific connection structure between the first control member 410 and the first adjusting member 210, and the second control member 420 and the second adjusting member 220. As long as the first control member 410 pushes the first adjusting member 210 and / or the second fixing member 620 pushes the second adjusting member 220, the embodiments of the present application do not limit this fixed relationship.

[0092] The driving member 300 is connected to the first control member 410 and the second control member 420, and can drive both of them to perform adjustment operations at the same time. In this way, the operating steps are simplified, the complexity of manual adjustment is reduced, and the convenience of operation is improved. The most important thing is that the first fixing member 610 drives the first adjusting member 210 and / or the second fixing member 620 drives the second adjusting member 220, so that the first adjusting member 210 and / or the second adjusting member 220 are subjected to more uniform force when moving, thereby avoiding the accuracy of the test results being affected by uneven force.

[0093] In a possible implementation manner, the driving member 300 is disposed through the first control member 410 and the second control member 420 .

[0094] The driving member 300 is threadedly connected to the first control member 410 , and the driving member 300 drives the first adjusting member 210 to move through the first control member 410 ; the driving member 300 is rotationally connected to the second control member 420 .

[0095] Exemplarily, the driving member 300 passes through the first control member 410 , the first adjusting member 210 , the second adjusting member 220 , and the second control member 420 in sequence.

[0096] In a possible implementation, the first control member 410 and the second control member 420 are steel rods. Using the above technical solution, the first control member 410 and the second control member 420 have high strength and are not easy to deform, thereby avoiding affecting the test results. At the same time, the physical and chemical properties of the steel are uniform and the quality is stable, thereby being able to provide consistent performance and ensuring the reliability of the first adjustment member 210 and the second adjustment member 220.

[0097] In a possible implementation, the diameters of the first control member 410 and the second control member 420 are smaller than the diameters of the first adjusting member 210 and the second adjusting member 220. The smaller diameters of the first control member 410 and the second control member 420 mean that smaller driving force is required during the adjustment process, thereby reducing the wear of the control structure and the adjusting structure and extending the service life of the equipment.

[0098] The driving member 300 is a long strip-shaped element, one end of which passes through the first control member 410 and the other end of which passes through the second control member 420 to form a stable overall structure. The surface of the driving member 300 has threads that match the internal threads of the first control member 410. By rotating the driving member 300, the first control member 410 can be moved axially along the driving member 300.

[0099] Since the first control member 410 is fixed relative to the first adjusting member 210, the driving member 300 can drive the first adjusting member 210 through the first control member 410, and the driving member 300 can rotate freely in the second control member 420 but will not move axially. The second control member 420 supports and limits the axial movement of the driving member 300 to ensure that the driving member 300 will not be offset due to the axial force.

[0100] By using the above technical solution, during the test process of the memory alloy wire on the test column 100, it is only necessary to rotate the driving member 300 to adjust the position of the first adjusting member 210, thereby pulling the memory alloy wire.

[0101] Since the adjustment process of the first control member 410 and the second control member 420 is simpler and faster, the test cycle of the memory alloy wire can be significantly shortened and the test efficiency can be improved; through the precise adjustment of the threaded connection, the prestress of the memory alloy wire can be more accurately controlled, thereby obtaining more accurate test data.

[0102] like Figure 2 As shown, in a possible implementation, the driving member 300 is disposed through the first control member 410 and the second control member 420 , the driving member 300 is rotationally connected to the first control member 410 , and the driving member 300 is rotationally connected to the second control member 420 .

[0103] The driving member 300 is provided with at least one adjusting nut 310 , which is threadedly connected to the driving member 300 . The adjusting nut 310 is at least used to fix the first adjusting member 210 or the second adjusting member 220 to the driving member 300 .

[0104] Exemplarily, the driving member 300 passes through the first control member 410 , the first adjusting member 210 , the second adjusting member 220 , and the second control member 420 in sequence.

[0105] During use, a wrench is used to tighten the adjusting nut 310, and the adjusting nut 310 starts to move axially along the driving member 300, so that the first control member 410 squeezes the first adjusting member 210 and the second control member 420 squeezes the second adjusting member 220, thereby stretching the memory alloy wire fixed on the first adjusting member 210 and the second adjusting member 220.

[0106] The driving member 300 is provided with an adjusting nut 310 , which is fixed to the driving member 300 by a threaded connection. This threaded connection allows the adjusting nut 310 to move axially along the driving member 300 , thereby adjusting the positions of the first control member 410 and the second control member 420 .

[0107] The driving member 300 passes through the first control member 410 , the first adjusting member 210 , the second adjusting member 220 , and the second control member 420 in sequence, and then the adjusting nut 310 is fixed on the driving member 300 .

[0108] By using the above technical solution, the threaded connection between the adjusting nut 310 and the driving member 300 allows the position of the adjusting member to be accurately adjusted, so that the prestress of the memory alloy wire can be more accurately controlled to ensure the accuracy of the test results. The adjustment structure can fix and adjust the memory alloy wire by simply rotating the adjusting nut 310, thereby greatly simplifying the installation process, improving the test efficiency, and accurately controlling the prestress of the memory alloy wire.

[0109] In a possible implementation manner, the extension direction of the driving member 300 is perpendicular to the extension direction of the test column 100 .

[0110] The material testing device further includes at least one guide member 500 . The extending direction of the guide member 500 is arranged parallel to the extending direction of the driving member 300 . The guide member 500 penetrates the first adjusting member 210 and the second adjusting member 220 .

[0111] The extension direction of the driving member 300 is arranged perpendicular to the extension direction of the test column 100, ensuring that the movement direction of the driving member 300 is transverse to the direction of the test column 100, thereby being able to effectively control the relative movement of the first adjusting member 210 and the second adjusting member 220, making the movement of the adjusting member more direct and effective, avoiding complex transmission mechanisms, and simplifying the structural design.

[0112] The guide member 500 provides a stable guide path to ensure that the first adjustment member 210 and the second adjustment member 220 can move smoothly and accurately under the action of the driving member 300, thereby ensuring the accuracy and stability of the adjustment.

[0113] Compared with the traditional manual adjustment method, this design can significantly improve installation efficiency and reduce test preparation time.

[0114] In a possible implementation, the guide member 500 has limiting collars 510 at both ends, the limiting collars 510 are detachably connected to the guide member 500 , and the diameter of the limiting collars 510 is greater than the diameter of the guide member 500 .

[0115] In a possible implementation, the guide member 500 is a rod-shaped member and the limiting loop 510 can be threadedly connected to the guide member 500. This connection method is more secure and prevents the limiting loop 510 from falling off the guide member 500.

[0116] The guide member 500 and the limiting ring 510 may also be snap-connected. As long as the guide member 500 and the limiting ring 510 are detachably connected, the embodiment of the present application does not limit the connection structure between the limiting ring 510 and the guide member 500.

[0117] In a possible implementation manner, the guide member 500 passes through the first control member 410 , the first adjustment member 210 , the second adjustment member 220 , and the second control member 420 in sequence.

[0118] By using the above technical solution, the first control member 410, the first adjusting member 210, the second adjusting member 220 and the second control member 420 can be quickly installed and fixed on the test column 100, and the limiting snare 510 can prevent the first control member 410, the first adjusting member 210, the second adjusting member 220 and the second control member 420 from detaching laterally along the driving member 300.

[0119] In a possible implementation manner, the number of the guide members 500 is set to two, and the two guide members 500 are arranged on both sides of the driving member 300 along the extending direction of the driving member 300 .

[0120] The number of the guide members 500 is set to two, which can provide better support and guiding effects, prevent the adjustment structure from tilting or shifting during movement, and enable it to maintain a stable and parallel movement trajectory.

[0121] Two guide members 500 are arranged on both sides of the driving member 300. This ensures that the adjustment structure moves parallel to the direction of the guide member 500 under the push of the driving member 300, avoiding tilt or imbalance caused by unilateral force, thereby ensuring the uniformity of force on the memory alloy wire during the test, thereby improving the accuracy and reliability of the material test.

[0122] In a possible implementation, a fixing structure is further included, and the fixing structure includes a first fixing member 610 and a second fixing member 620;

[0123] The first fixing member 610 is at least used to fix the second portion of the memory alloy wire to the first adjusting member 210 , and the second fixing member 620 is at least used to fix the third portion of the memory alloy wire to the second adjusting member 220 .

[0124] By providing the first fixing member 610 and the second fixing member 620 , the memory alloy wire can be quickly and firmly fixed on the test device, which simplifies the installation process of the memory alloy wire and reduces the test preparation time.

[0125] By using the first fixing member 610, the second part of the memory alloy wire can be firmly fixed on the first adjusting member 210, thereby ensuring that the second part of the memory alloy wire will not slide or move during the test. By using the second fixing member 620, the third part of the memory alloy wire can be firmly fixed on the second adjusting member 220, thereby ensuring that the third part of the memory alloy wire will not slide or move during the test. Through the fixing structure, the second part and the third part of the memory alloy wire can be firmly fixed on the adjusting structure, avoiding the sliding or displacement of the memory alloy wire during the test, and ensuring the accuracy and reliability of the test data.

[0126] In a possible implementation manner, the first adjusting member 210 and the second adjusting member 220 are movable relative to the test column 100 .

[0127] The first adjusting member 210 is fixedly connected to the first fixing member 610 , and the second adjusting member 220 is fixedly connected to the second fixing member 620 .

[0128] The first adjusting member 210 and the second adjusting member 220 are designed to be movable relative to the test column 100, so that the adjusting structure can flexibly adjust its position during installation and testing. Compared with the traditional method of manually adjusting and fixing the memory alloy wire, which is cumbersome and time-consuming, the present design significantly improves efficiency through mechanized operation.

[0129] The first adjusting member 210 is fixedly connected to the first fixing member 610, and the second adjusting member 220 is fixedly connected to the second fixing member 620, so that when the adjusting members move, the two ends of the memory alloy wire also move accordingly, ensuring that the memory alloy wire remains fixed during the prestress adjustment process.

[0130] The drive member 300 drives the adjustment structures to move closer or farther from each other, thereby achieving precise control of the prestress of the memory alloy wire. The extension direction of the drive member 300 is perpendicular to the extension direction of the test column 100, ensuring that the movement direction of the adjustment structure is consistent with the stretching direction of the memory alloy wire.

[0131] like Figure 3As shown, in a possible embodiment, the first fixing member 610 and the second fixing member 620 have the same structure, including a first clip 601, a second clip 602, a winding bolt 603 and a fixing nut 604. One of the first clip 601 and the second clip 602 is fixedly connected to the first adjusting member 210 or the second adjusting member 220. A winding bolt 603 is passed between the first clip 601 and the second clip 602. The winding bolt 603 is used to fix the winding memory alloy wire. The fixing nut 604 is threadedly connected to the winding bolt 603 and is used to fix the position of the first clip 601 and the second clip 602 on the winding bolt 603. When the first clip 601 and the second clip 602 are in close contact, the first clip 601 and the second clip 602 can clamp the memory alloy wire to achieve a fixing effect.

[0132] During use, first separate the fixing nut 604 and the winding bolt 603 so that the first clamp 601 and the second clamp 602 can be relatively far apart, and then wind the memory alloy wire around the winding bolt 603. After confirming that the memory alloy wire is wrapped around the winding bolt 603, close the first clamp 601 and the second clamp 602, and tighten the fixing nut 604 on the winding bolt 603 so that the first clamp 601 and the second clamp 602 firmly clamp the memory alloy wire.

[0133] Exemplarily, there are multiple winding bolts 603 and fixing nuts 604, which can provide a better and more secure fixing effect on the memory alloy wire.

[0134] By using the above technical solution, the fixing structure of the memory alloy wire is not only firm, but also simple and fast to operate.

[0135] like Figure 5 As shown, the present application provides a material testing method on the other hand, comprising the following steps:

[0136] S1: The first adjusting member 210 and the second adjusting member 220 are brought close to the test column 100 , and at least one of the first adjusting member 210 and the second adjusting member 220 is movable relative to the test column 100 .

[0137] S2: Winding the memory alloy wire around the first adjusting member 210 , the second adjusting member 220 and the test column 100 ; the first portion of the memory alloy wire is wound around the test column 100 , the second portion of the memory alloy wire is wound around the first adjusting member 210 , and the third portion of the memory alloy wire is wound around the second adjusting member 220 .

[0138] S3: The driving member 300 drives the first adjusting member 210 and the second adjusting member 220 to move closer to or away from each other.

[0139] It should be noted that the memory alloy wire may include a first portion, a second portion and a third portion connected to each other, the first portion being wound around the test column 100, the second portion being wound around the first adjusting member 210, and the third portion being wound around the second adjusting member 220. The second portion may be connected to the third portion through the first portion.

[0140] In a possible implementation manner, the following steps are specifically included:

[0141] S1: Move the first adjusting member and the second adjusting member close to the test column, and at least one of the first adjusting member and the second adjusting member can move relative to the test column.

[0142] S2: Winding the memory alloy wire around the first adjusting member 210 , the second adjusting member 220 and the test column 100 ; the first portion of the memory alloy wire is wound around the test column 100 , the second portion of the memory alloy wire is wound around the first adjusting member 210 , and the third portion of the memory alloy wire is wound around the second adjusting member 220 .

[0143] Among them, after the first clamp 601 fixes the initial end of the memory alloy wire, the memory alloy wire is first wound evenly at intervals upward on the outer wall of the first adjusting member 210 starting from the bottom of the first adjusting member 210; when the memory alloy wire finishes winding around the first adjusting member 210, the memory alloy wire is used to wind the memory alloy wire evenly at intervals downward on the outer wall of the test column 100. At this time, the spacing of the memory alloy wire on the test column 100 can be determined according to the chloride ion content in the saline-alkali land in different areas of the test purpose and the seismic fortification intensity; when the memory alloy wire finishes winding around the test column 100, the memory alloy wire is used to wind the memory alloy wire evenly at intervals downward. The second adjusting member 220 is evenly wound upward on the outer wall of the second adjusting member 220; when the memory alloy wire finishes winding around the second adjusting member 220, the end of the memory alloy wire extending out of the second adjusting member 220 is fixed to the second fixing member 620; the guide member 500 is passed through the first control member 410, the first adjusting member 210, the second adjusting member 220 and the second control member 420 in sequence, and then the limiting snare 510 is fixed to the guide member 500; the driving member 300 is passed through the first control member 410, the first adjusting member 210, the second adjusting member 220 and the second control member 420 in sequence.

[0144] It should be noted that the memory alloy wire may be first fixed by the second fixing member 620 , and then the memory alloy wire is wound around the second adjusting member 220 to start the winding process of the memory alloy wire.

[0145] S3: The first adjusting member and the second adjusting member are driven to move closer to or away from each other by the driving member, so that the prestress of the memory alloy wire is evenly applied on the outer surface of the test column 100, and the prestress level of the memory metal wire is controlled by the indentation between the first adjusting member 210 and the second adjusting member 220. The indentation can be measured by a vernier caliper. When the distance between the first adjusting member 210 and the second adjusting member 220 reaches the estimated value, the tensioning of the memory metal wire is completed.

[0146] In a possible implementation manner, the following steps are specifically included:

[0147] S1: Move the first adjusting member and the second adjusting member close to the test column, and at least one of the first adjusting member and the second adjusting member can move relative to the test column.

[0148] S2: Winding the memory alloy wire around the first adjusting member 210 , the second adjusting member 220 and the test column 100 ; the first portion of the memory alloy wire is wound around the test column 100 , the second portion of the memory alloy wire is wound around the first adjusting member 210 , and the third portion of the memory alloy wire is wound around the second adjusting member 220 .

[0149] Among them, Figure 4 As shown, after the first clamp 601 fixes the initial end of the memory alloy wire, the first circle of memory alloy wire is firstly wound on the outer wall of the first adjusting member 210 from the bottom, the memory alloy wire extending from the first adjusting member 210 is bypassed along the outer wall of the test column 100 by the test column 100, and the first circle of memory alloy wire is wound from the bottom of the outer wall of the second adjusting member 220; the memory alloy wire extending from the second adjusting member 220 is again bypassed along the outer wall of the test column 100 by the test column 100 in the reverse direction, and the second circle of memory alloy wire is wound on the outer wall of the first adjusting member 210 and the first circle of memory alloy wire on the first adjusting member 210 at intervals, the memory alloy wire extending from the first adjusting member 210 is bypassed along the outer wall of the test column 100 by the test column 100, and the first circle of memory alloy wire on the second adjusting member 220 is wound at intervals. Winding a second circle of memory alloy wire; the memory alloy wire extending from the second adjusting member 220 is again passed around the test column 100 in reverse along the outer wall of the test column 100, and is evenly wound around the first adjusting member 210, and so on, to complete the winding of the test column 100. When the memory alloy wire finishes winding around the second adjusting member 220, the end of the memory alloy wire extending from the second adjusting member 220 is fixed to the second fixing member 620; the guide member 500 is passed through the first control member 410, the first adjusting member 210, the second adjusting member 220 and the second control member 420 in sequence, and then the limit snare 510 is fixed to the guide member 500; the drive member 300 is passed through the first control member 410, the first adjusting member 210, the second adjusting member 220 and the second control member 420 in sequence.

[0150] It should be noted that the memory alloy wire may be first fixed by the second fixing member 620 , and then the memory alloy wire is wound around the second adjusting member 220 to start the winding process of the memory alloy wire.

[0151] S3: The first adjusting member and the second adjusting member are driven to move closer to or away from each other by the driving member, so that the prestress of the memory alloy wire is evenly applied on the outer surface of the test column 100, and the prestress level of the memory metal wire is controlled by the indentation between the first adjusting member 210 and the second adjusting member 220. The indentation can be measured by a vernier caliper. When the distance between the first adjusting member 210 and the second adjusting member 220 reaches the estimated value, the tensioning of the memory metal wire is completed.

[0152] Other embodiments of the present application will be apparent to those skilled in the art from consideration of the specification and practice of the application disclosed herein.

[0153] The embodiments of the present application are intended to cover any variation, use or adaptation of the present application, which follows the general principles of the present application and includes common knowledge or customary technical means in the technical field not disclosed in the present application. The description and embodiments are only to be regarded as exemplary, and the true scope and spirit of the present application are indicated by the claims.

[0154] It should be understood that the present application is not limited to the precise structures that have been described above and shown in the drawings, and that various modifications and changes may be made without departing from the scope thereof. The scope of the present application is limited only by the appended claims.

Claims

1. A material testing device, characterized in that: It comprises a test column (100), an adjustment structure and a driving member (300); The test column (100) is used to wind the first part of the memory alloy wire; The adjustment structure comprises a first adjustment member (210) and a second adjustment member (220); The first adjusting member (210) is used to wind the second portion of the memory alloy wire, and the second adjusting member (220) is used to wind the third portion of the memory alloy wire, and at least one of the first adjusting member (210) and the second adjusting member (220) is movable relative to the test column (100); The driving member (300) is at least used to drive the first adjusting member (210) and the second adjusting member (220) to move closer to or farther from each other.

2. The material testing device according to claim 1, characterized in that: The first adjusting member (210) and the second adjusting member (220) are arranged in parallel and spaced apart, and the extension direction of the first adjusting member (210) and the second adjusting member (220) is arranged in parallel with the extension direction of the test column (100).

3. The material testing device according to claim 1, characterized in that: Also included is a control structure, the control structure including a first control member (410) and a second control member (420); The first control member (410) is fixed to the first adjusting member (210), the second control member (420) is fixed to the second adjusting member (220), and both the first control member (410) and the second control member (420) are connected to the driving member (300).

4. The material testing device according to claim 3, characterized in that: The driving member (300) is disposed through the first control member (410) and the second control member (420); The driving member (300) is threadedly connected to the first control member (410), and the driving member (300) drives the first adjusting member (210) to move through the first control member (410); the driving member (300) is rotationally connected to the second control member (420).

5. The material testing device according to claim 3, characterized in that: The driving member (300) is disposed through the first control member (410) and the second control member (420), the driving member (300) is rotationally connected to the first control member (410), and the driving member (300) is rotationally connected to the second control member (420); The driving member (300) is provided with at least one adjusting nut (310), the adjusting nut (310) being threadedly connected to the driving member (300), and the adjusting nut (310) being used at least to fix the first adjusting member (210) or the second adjusting member (220) to the driving member (300).

6. The material testing device according to claim 4, characterized in that: The extending direction of the driving member (300) is arranged perpendicular to the extending direction of the test column (100); The material testing device further comprises at least one guide member (500), the extension direction of the guide member (500) being arranged parallel to the extension direction of the driving member (300), and the guide member (500) being arranged through the first adjusting member (210) and the second adjusting member (220).

7. The material testing device according to claim 6, characterized in that: The number of the guide members (500) is set to two, and the two guide members (500) are arranged on both sides of the driving member (300) along the extending direction of the driving member (300).

8. The material testing device according to any one of claims 1 to 7, characterized in that: Also included is a fixing structure, the fixing structure comprising a first fixing member (610) and a second fixing member (620); The first fixing member (610) is at least used to fix the second portion of the memory alloy wire to the first adjusting member (210), and the second fixing member (620) is at least used to fix the third portion of the memory alloy wire to the second adjusting member (220).

9. The material testing device according to claim 8, characterized in that: The first adjusting member (210) and the second adjusting member (220) are movable relative to the test column (100); The first adjusting member (210) is fixedly connected to the first fixing member (610), and the second adjusting member (220) is fixedly connected to the second fixing member (620).

10. A material testing method, characterized in that: The following steps are involved: Placing a first adjusting member (210) and a second adjusting member (220) close to a test column (100), wherein at least one of the first adjusting member (210) and the second adjusting member (220) is movable relative to the test column (100); Winding the memory alloy wire around the first adjusting member (210), the second adjusting member (220) and the test column (100); a first portion of the memory alloy wire is wound around the test column (100), a second portion of the memory alloy wire is wound around the first adjusting member (210), and a third portion of the memory alloy wire is wound around the second adjusting member (220); The first adjusting member (210) and the second adjusting member (220) are driven by a driving member (300) to move closer to or farther from each other.

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