Surface energy testing device and method based on infrared light reflection

Abstract

The invention discloses a surface energy testing device and method based on infrared light reflection, and belongs to the technical field of optical sensors. The technical problems that an existing surface energy tester is poor in measurement repeatability, low in response speed, complex in equipment operation and large in size are solved. According to the technical scheme, the surface energy testing device comprises a shell, an infrared light source, a photoelectric probe, a computer system, a reflecting layer, a hydrophobic surface, a micro sample injector, a water outlet and a detection port, the surface energy test method comprises the steps of light path adjustment, device installation, standard test solution injection and data acquisition. The method has the beneficial effects that the surface energy of the to-be-tested material is calculated according to the intensity change of infrared light reflection, so that a simple, convenient, rapid and accurate surface energy testing means is provided.

Description

Technical Field

[0001] The invention belongs to the field of optical sensors, and in particular relates to a surface energy testing device and method based on infrared light reflection. Background Art

[0002] The working principle of the surface energy tester is mainly based on measuring the interface energy between solids, standard test solutions and them. Surface energy is a measure of the intermolecular forces on the surface of a substance. It has important applications in materials science, chemical engineering and other fields. At present, according to different test principles, the test methods of the surface energy tester are divided into contact angle method, splitting work method, solution heat method, thin film flotation method and particle sedimentation method. Compared with other methods, the contact angle method obtains data by observing the contact angle of the standard test solution on the solid surface. It is non-destructive to the material, and the operation process is simple and easy to automate, thereby reducing human errors and improving the repeatability and accuracy of the measurement. Therefore, it has become the preferred method for material surface energy testing in the industry.

[0003] Specifically, the contact angle test is a technique for indirectly evaluating the surface energy of a solid by measuring the contact angle formed by a standard test solution on the solid surface. It involves dropping a drop of a standard test solution with known surface energy on a solid sample and then measuring the contact angle using an optical device. Although this method is easy to operate, fast, and suitable for quickly evaluating the surface properties of materials, it also has disadvantages that cannot be ignored: for samples with very small areas, it becomes difficult to accurately measure the contact angle because the tiny sample size may lead to increased angle measurement errors; for samples with uneven surfaces, the contact angle measurement will be affected by the surface roughness, thereby affecting the accurate evaluation of the surface energy. Therefore, most of the existing patents are for flat surfaces such as silicon wafers (CN118443532A), fibers (CN116106098B), and planes with small concavities (CN219552185U); in addition, the contact angle test method usually requires fixed laboratory equipment to complete, which limits its use in application scenarios that require portable measurement or on-site testing. The existing portable contact angle test instruments are still large in size. Since the traditional optical image analysis method still requires precise installation when testing (CN116858729B), it is not conducive to rapid and anytime detection in industrial production.

[0004] In recent years, with the rapid development of materials science and surface engineering, the industry's demand for accurate measurement of material surface properties, especially surface energy, has increased significantly. For example, in coating technology and surface treatment processes, in order to achieve precise control of the hydrophilicity and hydrophobicity of the material surface, the surface energy measurement accuracy is required to reach the microjoule level, which places extremely high demands on the accuracy and reliability of the surface energy tester; for another example, in the manufacturing process of micro-nanoelectronic devices, the energy state of the material surface directly affects the adhesion and uniformity of the coating, so it is necessary to accurately measure and control the surface energy of the material.

[0005] At present, there are still some unresolved key technical problems in the application of surface energy testers, which seriously restrict the improvement of measurement accuracy and the expansion of application scope:

[0006] (1) Poor measurement repeatability: When the surface energy tester measures the same material multiple times, there may be large data fluctuations, resulting in inconsistent measurement results. This phenomenon is mainly caused by uneven solution distribution during the test, insufficient injection accuracy, or changes in detector sensitivity;

[0007] (2) Slow response speed: When measuring surface energy, the signal response time of the test instrument is long, and it is unable to timely feedback the energy state of the material surface. This is particularly evident in application scenarios that require rapid regulation or continuous monitoring, affecting the real-time performance and work efficiency of the equipment;

[0008] (3) Complex equipment operation: Current surface energy testers usually require complex calibration and operation procedures, which requires a high level of professionalism from the operator and increases the difficulty of use. The complexity of the operation process may also lead to human errors, thus affecting the accuracy of the measurement;

[0009] (4) The test equipment is large in size: Current surface energy test equipment is usually large in size, especially the optical elements and cavities used to reflect light. This limits the miniaturization and portability of the device and makes it difficult to adapt to the needs of measuring the surface energy of materials at the micro-nano scale. Summary of the invention

[0010] In view of the technical problems of poor measurement repeatability, slow response speed, complex equipment operation and large size of existing surface energy testers, the purpose of the present invention is to provide a surface energy testing device and method based on infrared light reflection, which calculates the surface energy of the material to be tested by the intensity change of infrared light reflection, thereby providing a simple, fast and accurate surface energy testing means.

[0011] To achieve the above purpose, the present invention adopts the following technical scheme: a surface energy testing device based on infrared light reflection, the surface energy testing device includes a shell, the shell is a hollow cavity structure, an infrared light source is arranged around the outer periphery of the inner cavity top surface of the shell, a photoelectric probe is installed in the middle of the inner cavity top surface of the shell, a detection port is arranged on the same axis as the photoelectric probe on the bottom surface of the shell, the opening end area of ​​the detection port is the same as the photosensitive surface area of ​​the photoelectric probe, a water outlet is arranged on the inner side wall of the detection port along the circumferential direction, and the water outlet is connected to a micro-injector; the infrared light source is used to generate infrared light, and the photoelectric probe is used to receive the reflected light of the infrared light; the opening end of the detection port is tightly fitted with the surface of the material to be tested, and the micro-injector is used to discharge the standard test solution through the water outlet and cover the surface of the material to be tested.

[0012] Furthermore, a hydrophobic surface is provided on the inner side wall of the detection port along the circumferential direction, and the hydrophobic surface is located above the water outlet. The hydrophobic surface is used for the standard test solution to infiltrate only the surface of the material to be tested, ensuring that the solution forms a stable liquid film on the surface of the material to be tested.

[0013] Furthermore, the photoelectric probe and the infrared light source are on the same axis and the lower surface of the photoelectric probe and the lower surface of the infrared light source are on the same plane.

[0014] Furthermore, the inner wall of the shell is coated with a reflective layer, and the reflective layer is used to reflect the infrared light multiple times.

[0015] Furthermore, the surface energy testing device also includes a computer system, which is connected to the photoelectric probe and the infrared light source respectively. The computer system is used to adjust the intensity of the infrared light and receive and process the reflected light of the infrared light to calculate the surface energy of the material to be tested.

[0016] Furthermore, the wavelength of the infrared light is 1000-2000 nm, and needs to be selected in pairs according to the infrared absorption capacity of the standard test solution.

[0017] Furthermore, the material of the reflective layer is Ag, Al, TiO 2 、SiO 2 、Al 2 O 3 Or organic glass, and the thickness is more than 100 μm, and the reflective layer should have excellent reflective performance for infrared light within the wavelength emitted by the infrared light source.

[0018] The material of the shell should have good mechanical strength, processability, and the ability to block external light interference; the diameter of the cylindrical cavity formed by the shell is within 5mm, and the size of the device can be further reduced depending on the processing accuracy, improving the integration and miniaturization of the device. The computer system or data acquisition display card should have the ability to process the input digital signal, specifically, it needs to process the input and output signals in an algorithm-dependent manner, and finally obtain the surface energy size of the material to be tested; the diameter d of the detection port is 3mm, and the size of the device can be further reduced depending on the processing accuracy, improving the integration and miniaturization of the device; the selection of the standard test solution needs to meet the requirement of having a large gap with the infrared light reflectivity of the surface of the material to be tested, and R s As is known, water, ethylene glycol, glycerol, diiodomethane, formamide, etc. are generally selected. The surface energy of the standard test solution is determined by the specific selection of the standard test solution.

[0019] The testing method based on the above-mentioned surface energy testing device comprises the following steps:

[0020] (1) Optical path adjustment: adjust the infrared light source to emit infrared light so that the infrared light forms a stable beam at the opening end of the detection port;

[0021] (2) Device installation: Fix the material to be tested under the surface energy testing device, and make the opening end of the detection port fit tightly with the surface of the material to be tested;

[0022] (3) Injection of standard test solution: Use a micro-injector to discharge the standard test solution through the outlet and cover the surface of the material to be tested;

[0023] (4) Data acquisition: Start the computer system, the photoelectric probe receives the reflected light of the infrared light and converts it into an electrical signal, the computer system processes the electrical signal and calculates the surface energy of the material to be tested.

[0024] Furthermore, the computer system calculates the surface energy γ of the material to be tested. m The formula is:

[0025]

[0026] Among them, γ m is the surface energy of the material to be tested, in mJ / m 2 ;I 0 is the intensity of infrared light, in W; I s R is the reflected light intensity after the material to be tested is covered by the standard test solution, in W; s is the reflectivity of the surface of the standard test solution to infrared light, ranging from 0 to 1; R m is the reflectivity of the material to be tested to infrared light; sis the surface energy of the standard test solution, in mJ / m 2 ;

[0027] For the intensity of infrared light I 0 , the formula is:

[0028] I 0 =Pλ / hc

[0029] Where h is Planck's constant, h≈6.626×10 -34 J·s, c is the speed of light, c≈3.00×10 8 m / s, λ is the wavelength of infrared light, the value range of λ is 1000~2000nm, P is the optical power of infrared light, among which, when the thickness of the material to be tested is less than 100nm, the value of P is 0.1W / cm 2 ; When the thickness of the material to be tested is greater than 100nm and less than 5μm, the value of P is 0.5W / cm 2 ; When the thickness of the material to be tested is greater than 5μm, the value of P is 1W / cm 2 ;

[0030] For the reflectivity R of the material to be tested to infrared light m , the calculation formula is:

[0031] R m =I m / I 0

[0032] Among them, I m It is the reflected light intensity of the material to be tested when it is not covered by the standard test solution, in W.

[0033] Compared with the prior art, the present invention has the following beneficial effects:

[0034] (1) The present invention can significantly improve the measurement repeatability of the test device by optimizing the design of the device structure. When the traditional surface energy test equipment measures the same material multiple times, the data fluctuates greatly, resulting in inconsistency of the results of more than 10%. However, the present invention can control the measurement error within 2%.

[0035] (2) The test device of the present invention uses a high-speed response photoelectric probe and an optimized signal processing algorithm, which greatly shortens the data collection and processing time during the measurement process. Compared with the traditional equipment that usually takes more than 5 seconds to measure, the present invention can complete the measurement of the surface energy of the material within 2 seconds, and the response speed is increased by more than 60%. This makes the device suitable for industrial production lines that require high-frequency measurements, and can reduce production stagnation caused by waiting time.

[0036] (3) The present invention simplifies the equipment operation process and introduces the matching algorithm of the device, so that users can complete the test without complicated calibration and adjustment. Traditional equipment usually requires manual calibration, parameter adjustment and multiple measurements, but the present invention does not require the pre-test link, which further improves the ease of use of the equipment.

[0037] (4) The present invention effectively reduces the size of the device through the integrated design of the outer shell, reflective layer and internal components. Traditional surface energy testing equipment usually requires a large space to accommodate the light source, camera and reflective components, resulting in a bulky device that is not convenient to carry and use. The present invention reduces the diameter of the detection port to less than 3 mm and streamlines the layout of the internal components, thereby reducing the volume of the overall device by more than 70% and significantly reducing the weight. This miniaturized design not only facilitates the movement and installation of the device, but also makes it easier to integrate into other test systems, making it widely applicable to the different needs of laboratories and production sites. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] Figure 1 This is a schematic structural diagram of a surface energy testing device based on infrared light reflection according to Example 1 of the present invention;

[0039] FIG2( a ) is a schematic diagram of the structure of the material to be tested that is not covered by the standard test solution;

[0040] FIG2( b ) is a schematic diagram of the structure in which the material to be tested is covered by the standard test solution;

[0041] Among them, 1. Shell; 2. Infrared light source; 3. Photoelectric probe; 4. Computer system; 5. Reflective layer; 6. Hydrophobic surface; 7. Micro-injector; 8. Water outlet; 9. Detection port. DETAILED DESCRIPTION

[0042] The present invention is further described below in conjunction with the accompanying drawings and specific embodiments.

[0043] The present invention provides a surface energy testing device based on infrared reflection. Figure 1 As shown, the opening end of the detection port of the surface energy testing device is closely attached to the surface of the material to be tested, the infrared light source 2 is turned on, and the infrared light in the cavity will be reflected multiple times by the Ag reflection layer on the inner wall of the wall. The surface of the material to be tested absorbs a certain proportion, and the reflected light will return to the upper photoelectric probe 3 of the cavity to be captured, and the signal value is I m , then turn off the light source. Through this step, R m .

[0044] The standard test solution with a volume of V (V is a relatively small value) is input through the micro-injector. The standard test solution will be introduced from the lower water outlet 8 to the surface of the material to be tested. The standard test solution will form a ring on the surface of the material to be tested and the liquid surface will gradually expand, covering a certain area ratio of the material surface. After this area ratio is stable, the infrared light source 2 is turned on, and the infrared light in the cavity will be reflected multiple times by the Ag reflective layer on the inner wall of the wall, and absorbed by the solution surface and the surface layer of the material to be tested. The reflected light will return to the upper photoelectric probe 3 of the cavity to be captured. The principle of selecting the standard test solution is that the reflection ability of infrared light should be greatly different from that of the surface of the material to be tested. For the surface of the material with large surface energy, the standard test solution will be spread more and the area will be larger. If the standard test solution has a stronger reflection ability of infrared light than the surface of the material to be tested, the electrical signal obtained on the photoelectric probe will be enhanced at this time, and the surface energy of the surface of the material to be tested can be calculated by the value of the electrical signal.

[0045] Since the surface of materials with high surface energy is not stable, it is easier to attract other materials with high specific surface energy (or tension) (standard test solution). The two form a new contact surface, so that the original contact surface is covered and avoided from being exposed, the energy of the entire system is reduced, and the system tends to be stable.

[0046] Then, the limit thinking can be introduced here. The present invention considers that the surface of the material is covered with a standard test solution with a surface energy of γs (the size of γs is known, for water, γs = 75.4 mJ / m 2 )

[0047] a. When the surface energy of the material γm<<γs, it is similar to the water droplets on the surface of the lotus leaf. The standard test solution will be completely expelled, and the interface contact area between the solid and the standard test solution is S. m =0;

[0048] b. When the surface energy of the material γm=γs, the material is extremely compatible with the standard test solution. The standard test solution will be completely spread on the surface of the material, making the contact interface area S m Equal to the surface area of ​​the material to be tested, A, S m =A;

[0049] c. When the surface energy of the material is 0<γm<γs, the energy of the system decreases, which is positively correlated with the area of ​​the new contact surface formed and conforms to a linear relationship, and the following relationship exists:

[0050] γ m =a×γ s (1) Here a represents the proportion of the solid surface covered by the standard test solution, satisfying:

[0051]

[0052] Combining formula (1) and formula (2), we can get:

[0053]

[0054] A and γs are known quantities, so we need to further determine S m The numerical value of .

[0055] It can be seen that it is necessary to further perform S m Calculation:

[0056] At this time, it is necessary to introduce optical parameters: the reflectivity R of the surface of the material to be tested to infrared light m , the reflectivity R of the surface of the standard test solution to infrared light s .

[0057] Since the light emitted by the light source will first be partially absorbed by the surface of the material, then the remaining energy will be reflected and finally captured by the photoelectric probe; if the standard test solution covers the surface of the material, since the infrared light reflectivity of the selected standard test solution is much higher than that of the material surface (the prerequisite for the selection of the standard test solution), the signal value obtained on the photoelectric probe is different from S m The reflectivity of solid to infrared light is much lower than that of standard test solution, i.e. R m < <R s .

[0058] a. When the standard test solution is not injected, the material to be tested is not covered by the standard test solution as shown in Figure 2(a):

[0059] I m =R m ×I 0 (4)

[0060] b. After the standard test solution is injected, the material to be tested is covered by the standard test solution as shown in Figure 2(b):

[0061] At this time, the area that mainly reflects infrared light is the surface of the standard test solution, and its area is S m ; The area that plays a secondary role in reflecting infrared light is the uncovered surface of the material to be tested, and its area is AS m ;

[0062] At this time, the reflected light intensity I of the material to be tested after being covered by the standard test solution s Should meet:

[0063] I s =I 1 +I 2 (5)

[0064] I 1 is the light energy component reflected from the surface of the standard test solution and captured by the photodetector, I 2 It is the component of light energy reflected from the surface of the material to be tested that is not covered by the standard test solution and captured by the photodetector;

[0065]

[0066]

[0067] Combining Formula 5, Formula 6 and Formula 7, we can get:

[0068]

[0069] After simplification, we can get:

[0070]

[0071] Combining Formula 3 with Formula 9, we get:

[0072]

[0073] Example 1

[0074] This embodiment provides a surface energy testing device based on infrared light reflection. Figure 1 , including a shell 1, an infrared light source 2, a photoelectric probe 3, a computer system 4, a reflective layer 5, a hydrophobic surface 6, a micro-injector 7, a water outlet 8, and a detection port 9. Among them, the shell 1 is used to form a test cavity to ensure the stability of the internal environment and prevent external light interference. The material of the shell 1 is selected from materials with good mechanical strength, processability and the ability to block external light interference. The shell 1 is a hollow cylindrical cavity structure, and the inner diameter of the cylindrical cavity structure is within 5mm.

[0075] The infrared light source 2 is an annular structure, which is arranged around the outer periphery of the inner cavity top surface of the housing 1, and is used to emit infrared light during the test. The wavelength range of the infrared light is 1000-2000nm, and the specific wavelength selection needs to be matched according to the infrared absorption characteristics of the standard test solution.

[0076] The photoelectric probe 3 is installed at the center of the inner cavity top surface of the shell 1 to receive the reflected light of the infrared light. The photoelectric probe 3 and the infrared light source 2 are on the same axis and the lower surface of the photoelectric probe 3 and the infrared light source 2 are on the same plane to ensure the accuracy of reception.

[0077] The computer system 4 is connected to the photoelectric probe 3 and the infrared light source 2 respectively, and is used to adjust the power of the infrared light and receive and process the reflected light of the infrared light to calculate the surface energy of the material to be tested. The computer system 4 has a built-in algorithm that can accurately analyze the electrical signal fed back by the photoelectric probe to obtain the surface energy of the material to be tested.

[0078] The reflective layer 5 is coated on the inner wall of the housing 1 to reflect infrared light multiple times and enhance the intensity of the reflected light. The reflective layer is made of Ag coating with a thickness of more than 100 μm, which ensures efficient reflection of infrared light.

[0079] The detection port 9 is provided on the bottom surface of the housing 1 and is on the same axis as the photoelectric probe 3. The opening end area of ​​the detection port 9 is the same as the photosensitive surface area of ​​the photoelectric probe 3. The opening end of the detection port 9 is closely fitted to the surface of the material to be tested. The diameter of the detection port 9 is 3 mm, and can be further reduced depending on the processing accuracy to improve the integration and miniaturization of the device.

[0080] The inner wall of the detection port 9 is provided with a water outlet 8 along the circumferential direction, and the water outlet 8 is connected to the micro-injector 7 for discharging the standard test solution. The micro-injector 7 is used to discharge the standard test solution through the water outlet 8 and cover the surface of the material to be tested, ensuring accurate control of the test liquid volume.

[0081] The inner wall of the detection port 9 is provided with a hydrophobic surface 6 along the circumferential direction. The hydrophobic surface 6 is located above the water outlet 8. The hydrophobic surface 6 is used to control the standard test solution to infiltrate only the surface of the material to be tested, ensuring that the standard test solution forms a stable liquid film on the surface of the material to be tested.

[0082] This embodiment also provides a testing method based on the above surface energy testing device, comprising the following steps:

[0083] (1) Optical path adjustment: adjust the infrared light source to emit infrared light so that the infrared light forms a stable beam at the opening end of the detection port;

[0084] (2) Device installation: Fix the material to be tested under the surface energy testing device, and make the opening end of the detection port fit tightly with the surface of the material to be tested;

[0085] (3) Injection of standard test solution: Use a micro-injector to discharge the standard test solution through the outlet and cover the surface of the material to be tested;

[0086] (4) Data acquisition: Start the computer system, the photoelectric probe receives the reflected light of the infrared light and converts it into an electrical signal, the computer system processes the electrical signal and calculates the surface energy of the material to be tested.

[0087] Among them, the computer system calculates the surface energy γ of the material to be tested m The formula is:

[0088]

[0089] Among them, γ m is the surface energy of the material to be tested, in mJ / m 2 ;I 0 is the intensity of infrared light, in W; I s R is the reflected light intensity after the material to be tested is covered by the standard test solution, in W; s is the reflectivity of the surface of the standard test solution to infrared light, ranging from 0 to 1; R m is the reflectivity of the material to be tested to infrared light; s is the surface energy of the standard test solution, in mJ / m 2 ;

[0090] For the intensity of infrared light I 0 , the formula is:

[0091] I 0 =Pλ / hc

[0092] Where h is Planck's constant, h≈6.626×10 -34 J·s, c is the speed of light, c≈3.00×10 8 m / s, λ is the wavelength of infrared light, the value range of λ is 1000~2000nm, P is the optical power of infrared light, among which, when the thickness of the material to be tested is less than 100nm, the value of P is 0.1W / cm 2 ; When the thickness of the material to be tested is greater than 100nm and less than 5μm, the value of P is 0.5W / cm 2 ; When the thickness of the material to be tested is greater than 5μm, the value of P is 1W / cm 2 ;

[0093] For the reflectivity R of the material to be tested to infrared light m , the calculation formula is:

[0094] R m =I m / I 0

[0095] Among them, I m It is the reflected light intensity of the material to be tested when it is not covered by the standard test solution, in W.

[0096] In this embodiment, the wavelength of infrared light emitted by the infrared light source 2 is set to 1500nm. The reflective layer 5 is made of Ag material with a thickness of 150μm to ensure that multiple reflections enhance the signal strength. The photoelectric probe 3 is located at the center of the top surface of the inner cavity of the shell 1 and maintains the same axis as the infrared light source 2. Deionized water is selected as the standard detection solution, and the volume of deionized water injected at a single time is 0.5μL. The materials to be tested are respectively selected from a series of materials with known surface energy for testing and verification, as shown in Table 1. The algorithm built into the computer system processes the received signal data and outputs the surface energy of the material to be tested. By selecting an infrared light wavelength of 1500nm and a detection port diameter of 3mm, the system completes the surface energy measurement within 2 seconds. As shown in the measurement results in Table 1, the error of the material surface energy is controlled within ±2%, which proves the high precision and fast response performance of the present invention.

[0097] Table 1 Technical conditions and performance test results of Example 1 in the present invention

[0098]

[0099]

Claims

1. A surface energy testing device based on infrared light reflection, characterized in that: The surface energy testing device comprises a shell (1), the shell (1) is a hollow cavity structure, an infrared light source (2) is arranged in a surrounding manner on the outer periphery of the inner cavity top surface of the shell (1), a photoelectric probe (3) is installed in the middle of the inner cavity top surface of the shell (1), a detection port (9) is arranged on the bottom surface of the shell (1) and is located on the same axis as the photoelectric probe (3), the opening end area of ​​the detection port (9) is the same as the photosensitive surface area of ​​the photoelectric probe (3), the inner side wall of the detection port (9) is provided with a water outlet (8) along the circumferential direction, and the water outlet (8) is connected to a micro-injector (7); the infrared light source (2) is used to generate infrared light, and the photoelectric probe (3) is used to receive reflected light of the infrared light; the opening end of the detection port (9) is tightly fitted with the surface of the material to be tested, and the micro-injector (7) is used to discharge a standard test solution through the water outlet (8) and cover the surface of the material to be tested.

2. The surface energy testing device based on infrared light reflection according to claim 1 is characterized in that: The inner side wall of the detection port (9) is provided with a hydrophobic surface (6) along the circumferential direction. The hydrophobic surface (6) is located above the water outlet (8). The hydrophobic surface (6) is used for the standard test solution to infiltrate only the surface of the material to be tested.

3. The surface energy testing device based on infrared light reflection according to claim 1 is characterized in that: The photoelectric probe (3) and the infrared light source (2) are located on the same axis, and the lower surface of the photoelectric probe (3) and the lower surface of the infrared light source (2) are located on the same plane.

4. The surface energy testing device based on infrared light reflection according to claim 1 is characterized in that: The inner wall of the housing (1) is coated with a reflective layer (5), and the reflective layer (5) is used to reflect the infrared light multiple times.

5. The surface energy testing device based on infrared light reflection according to claim 1 is characterized in that: The surface energy testing device further comprises a computer system (4), wherein the computer system (4) is connected to the photoelectric probe (3) and the infrared light source (2) respectively, and the computer system (4) is used to adjust the intensity of the infrared light and receive and process the reflected light of the infrared light, so as to calculate the surface energy of the material to be tested.

6. The surface energy testing device based on infrared light reflection according to claim 1, characterized in that: The wavelength of the infrared light is 1000-2000nm.

7. The surface energy testing device based on infrared light reflection according to claim 4, characterized in that: The material of the reflective layer (5) is Ag, Al, TiO2, SiO2, Al2O3 or organic glass, and the thickness is greater than 100 μm.

8. A testing method based on the surface energy testing device according to any one of claims 1 to 7, characterized in that: The steps include: (1) Optical path adjustment: adjust the infrared light source to emit infrared light so that the infrared light forms a stable beam at the opening end of the detection port; (2) Device installation: Fix the material to be tested under the surface energy testing device, and make the opening end of the detection port fit tightly with the surface of the material to be tested; (3) Injection of standard test solution: Use a micro-injector to discharge the standard test solution through the outlet and cover the surface of the material to be tested; (4) Data acquisition: Start the computer system, the photoelectric probe receives the reflected light of the infrared light and converts it into an electrical signal, the computer system processes the electrical signal and calculates the surface energy of the material to be tested.

9. The testing method according to claim 8, characterized in that: The computer system calculates the surface energy γ of the material to be tested m The formula is: Among them, γ m is the surface energy of the material to be tested, in mJ / m 2 ; I0 is the intensity of infrared light, unit is W; I s R is the reflected light intensity after the material to be tested is covered by the standard test solution, in W; s is the reflectivity of the surface of the standard test solution to infrared light, ranging from 0 to 1; R m is the reflectivity of the material to be tested to infrared light; s is the surface energy of the standard test solution, in mJ / m 2 ; For the intensity of infrared light I0, the formula is: I0=Pλ / hc Where h is Planck's constant, h≈6.626×10 -34 J·s, c is the speed of light, c≈3.00×10 8 m / s, λ is the wavelength of infrared light, the value range of λ is 1000~2000nm, P is the optical power of infrared light, among which, when the thickness of the material to be tested is less than 100nm, the value of P is 0.1W / cm 2 ; When the thickness of the material to be tested is greater than 100nm and less than 5μm, the value of P is 0.5W / cm 2 ; When the thickness of the material to be tested is greater than 5μm, the value of P is 1W / cm 2 ; For the reflectivity R of the material to be tested to infrared light m , the calculation formula is: R m =I m / I0 Among them, I m It is the reflected light intensity of the material to be tested when it is not covered by the standard test solution, in W.

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