Test anomaly analysis method, device and equipment and medium

Abstract

The invention discloses a test exception analysis method and device, equipment and a medium, and relates to the technical field of tests.The test exception analysis method comprises the steps that when an exception occurs in the process of testing equipment to be tested, rule matching is conducted on a preset fault analysis rule set summary table through current test exception information to obtain a corresponding rule matching result; generating a target fault analysis rule corresponding to the rule matching result based on the test exception information, and performing corresponding grading analysis on the test exception information by using the target fault analysis rule to obtain a corresponding fault analysis result; and performing a corresponding fault positioning operation by using the fault analysis result, and determining a corresponding target maintenance strategy based on the fault positioning result and the fault analysis result, so as to trigger a fault maintenance operation based on the target maintenance strategy. Accurate abnormity analysis can be effectively and automatically carried out, so that the equipment production cost is reduced.

Description

Technical Field

[0001] The present invention relates to the field of testing technology, and in particular to a test anomaly analysis method, device, equipment and medium. Background Art

[0002] In existing equipment testing, if the general stress test tool fails to execute or the equipment information check is abnormal, the test program will stop directly and prompt an error message. Testers and maintenance personnel will perform positioning analysis based on the error information and complete the repair of the error-reporting equipment. However, on the one hand, the error information of this solution often does not show the specific fault location and the actual cause of the fault, and the accuracy is low; on the other hand, testers rely on their personal subjective experience to analyze and locate the error information, which not only cannot guarantee accuracy, resulting in quality risks for the equipment, but also consumes more manpower and time, increasing production costs.

[0003] It can be seen that how to effectively and automatically perform accurate anomaly analysis when an abnormality occurs during equipment testing and reduce production costs and quality risks is a problem that technical personnel in this field need to solve. Summary of the invention

[0004] The purpose of the embodiments of the present invention is to provide a test anomaly analysis method, device, equipment and medium, which can solve the problem of how to effectively and automatically perform accurate anomaly analysis when anomalies occur in factory test equipment, and reduce production costs and quality risks. The specific scheme is as follows:

[0005] In a first aspect, an embodiment of the present invention provides a test exception parsing method, comprising:

[0006] When an abnormality occurs during the test of the device to be tested, the current test abnormality information is used to perform rule matching on the preset fault analysis rule set summary table to obtain the corresponding rule matching result;

[0007] Generating a target fault analysis rule corresponding to the rule matching result based on the test abnormality information, and performing corresponding hierarchical analysis on the test abnormality information using the target fault analysis rule to obtain a corresponding fault analysis result;

[0008] The fault analysis result is used to perform a corresponding fault location operation, and a corresponding target maintenance strategy is determined based on the fault location result and the fault analysis result, so as to trigger a fault maintenance operation based on the target maintenance strategy.

[0009] Optionally, when an exception occurs during the test of the device to be tested, using the current test exception information to perform rule matching on the preset fault analysis rule set summary table includes:

[0010] After the current device to be tested is assembled and powered on, a preset test component is downloaded to the device to be tested, and a device test is performed based on a preset test item sequence and the preset test component in the device to be tested;

[0011] When an exception occurs during the device test, the preset fault analysis rule set summary table is matched with the machine model information, error test item, and error type in the current test exception information to obtain a corresponding rule matching result.

[0012] Optionally, the generating a target fault analysis rule corresponding to the rule matching result based on the test exception information includes:

[0013] If the rule matching result indicates that the match is successful, then the corresponding rule subcategory details table is determined based on the matched rule set encoding information;

[0014] The test exception information is matched with the matching index information corresponding to each rule subclass in the rule subclass details table to obtain a corresponding subclass matching result;

[0015] A first target fault analysis rule corresponding to the rule matching result is determined according to the preset rule subclass priority information and the subclass matching result, so as to perform hierarchical analysis on the test abnormality information using the first target fault analysis rule.

[0016] Optionally, the generating a target fault analysis rule corresponding to the rule matching result based on the test exception information includes:

[0017] If the rule matching result indicates that the match fails, querying the historical maintenance records in the preset factory maintenance database based on the preset parsing rule generation engine and using the machine model information in the test abnormality information to determine the corresponding target historical maintenance record;

[0018] Generate a corresponding fault maintenance set based on the operation record information in the target historical maintenance record; wherein the operation record information includes the corresponding machine serial number, fault location information, fault type, and maintenance record;

[0019] The fault maintenance set is analyzed based on a preset maintenance set analysis rule, and a second target fault analysis rule corresponding to the rule matching result is determined using the fault analysis rule element obtained by the analysis, so as to perform hierarchical analysis on the test abnormality information using the second target fault analysis rule.

[0020] Optionally, analyzing the fault maintenance set based on a preset maintenance set parsing rule includes:

[0021] After downloading the corresponding whole machine log from the preset log storage server based on the test error time information corresponding to the test exception information, searching the fault location information and fault description information in the fault repair set in the whole machine log based on the preset search instruction, and determining the corresponding log file to be processed according to the obtained search result; wherein the whole machine log includes the error test item log, BMC log, system log, and stress testing tool log;

[0022] Determine whether the log file to be processed is a target log file corresponding to the error type in the test exception information to obtain a corresponding log determination result;

[0023] If the log judgment result is yes, the log file to be processed is stored as a data set element in the first type of data set;

[0024] If the log judgment result is no, the target log file is searched according to the preset blacklist to determine the corresponding target log line, and the log file to be processed and the target log line are combined and stored as a data set element in the second type of data set;

[0025] Performing text parsing on the log line including the fault location information in the log file to be processed and the target log line, and using the obtained log parsing results to update the corresponding fault location information and the name of the log file to be processed, so as to complete the refinement operation on the first type of data set and the second type of data set;

[0026] The first type of data set and the second type of data set are parsed using a preset big data platform based on the dimensions of the data set elements in the first type of data set to obtain corresponding fault analysis rule elements.

[0027] Optionally, performing a corresponding fault location operation using the fault analysis result includes:

[0028] Based on the machine model information and the equipment package number information in the fault analysis result, a preset equipment physical location topology table is searched to obtain a corresponding equipment mapping set;

[0029] Determine corresponding device information from the device mapping set based on the BMC symbol, the device number under the system, and the BDF number corresponding to the fault analysis result;

[0030] After obtaining the corresponding link device tree using the preset instructions, the corresponding device link is determined based on the faulty device number in the device information, and the corresponding physical location information of the device link is supplemented based on the preset device physical location topology table to complete the corresponding fault location operation and obtain the target fault physical location information and target fault link information corresponding to the test abnormality information.

[0031] Optionally, performing corresponding hierarchical analysis on the test abnormality information by using the target fault analysis rule to obtain a corresponding fault analysis result includes:

[0032] Performing hierarchical analysis on the test abnormality information based on the target rule subclass of the first priority in the target fault analysis rule to obtain a corresponding first information analysis result;

[0033] If the first information parsing result indicates that the parsing fails, determining whether there is a target rule subclass in the target fault parsing rule that has not completed the hierarchical parsing operation corresponding to the test abnormality information, so as to obtain a corresponding rule subclass determination result;

[0034] When the rule subclass analysis result indicates existence, performing hierarchical analysis on the test abnormality information based on the target rule subclass of the second priority in the target fault analysis rule to obtain a corresponding second information analysis result;

[0035] If the second information analysis result indicates that the analysis is successful, the second information analysis result is used as the fault analysis result corresponding to the test abnormality information.

[0036] In a second aspect, an embodiment of the present invention provides a test exception analysis device, comprising:

[0037] The parsing rule matching module is used to match the preset fault parsing rule set summary table with the current test exception information when an exception occurs during the test of the device to be tested, so as to obtain the corresponding rule matching result;

[0038] A fault analysis module, used to generate a target fault analysis rule corresponding to the rule matching result based on the test abnormality information, and perform corresponding hierarchical analysis on the test abnormality information using the target fault analysis rule to obtain a corresponding fault analysis result;

[0039] The fault repair module is used to perform a corresponding fault location operation using the fault analysis result, and determine a corresponding target repair strategy based on the fault location result and the fault analysis result, so as to trigger a fault repair operation based on the target repair strategy.

[0040] In a third aspect, an embodiment of the present invention provides an electronic device, including:

[0041] Memory, used to store computer programs;

[0042] The processor is used to execute the computer program to implement the steps of the aforementioned test exception analysis method.

[0043] In a fourth aspect, an embodiment of the present invention provides a computer-readable storage medium for storing a computer program, wherein the computer program implements the steps of the aforementioned test exception parsing method when executed by a processor.

[0044] It can be seen that when an abnormality occurs during the testing of the equipment to be tested, the present application uses the current test abnormality information to perform rule matching on the preset fault analysis rule set summary table to obtain a corresponding rule matching result; based on the test abnormality information, a target fault analysis rule corresponding to the rule matching result is generated, and the target fault analysis rule is used to perform corresponding hierarchical analysis on the test abnormality information to obtain a corresponding fault analysis result; the fault analysis result is used to perform a corresponding fault location operation, and based on the fault location result and the fault analysis result, a corresponding target maintenance strategy is determined to trigger a fault maintenance operation based on the target maintenance strategy.

[0045] Beneficial effects: When an abnormality occurs during the test of the equipment to be tested, the present application uses the current test abnormality information to match the preset fault analysis rule set summary table to obtain the corresponding rule matching result; based on the test abnormality information, a target fault analysis rule corresponding to the rule matching result is generated, and the target fault analysis rule is used to perform a corresponding hierarchical analysis on the test abnormality information to obtain the corresponding fault analysis result; the fault analysis result is used to perform a corresponding fault location operation, and a corresponding target maintenance strategy is determined based on the fault location result and the fault analysis result, so as to trigger a fault maintenance operation based on the target maintenance strategy. It can be seen from the above technical scheme that when a fault occurs during the equipment test, the present application first matches the pre-configured fault analysis rule based on the current test abnormality information and the preset fault analysis rule set summary table, and then determines the target fault analysis rule corresponding to the matching result based on the test abnormality information, and automatically performs analysis using the target fault analysis rule. Then, the fault is located based on the obtained fault analysis result, and the fault analysis result and the fault location result are used for maintenance. In this way, when an abnormality occurs in the factory test equipment, accurate abnormality analysis can be automatically performed, thereby reducing the equipment production cost, and while improving production efficiency, reducing the possibility of fault repair errors, thereby improving shipment quality. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] In order to more clearly illustrate the embodiments of the present invention, the following briefly introduces the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0047] Figure 1A flow chart of a test exception analysis method provided by an embodiment of the present invention;

[0048] Figure 2 A schematic diagram of a fault analysis process provided by an embodiment of the present invention;

[0049] Figure 3 A schematic diagram of the classification of parsing rules provided by an embodiment of the present invention;

[0050] Figure 4 A schematic diagram of a hierarchical analysis process provided by an embodiment of the present invention;

[0051] Figure 5 A schematic diagram of a link resolution process provided by an embodiment of the present invention;

[0052] Figure 6 A flow chart of a specific test exception analysis method provided by an embodiment of the present invention;

[0053] Figure 7 A schematic diagram of the structure of a test anomaly analysis device provided by an embodiment of the present invention;

[0054] Figure 8 A structural diagram of an electronic device provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0055] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0056] The terms "including" and "having" in the specification of the present invention and the above-mentioned drawings, as well as any variations thereof, are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device including a series of steps or units is not limited to the listed steps or units, but may include steps or units that are not listed.

[0057] In order to enable those skilled in the art to better understand the solution of the present invention, the present invention is further described in detail below in conjunction with the accompanying drawings and specific implementation methods.

[0058] In existing equipment testing, on the one hand, the error message of the solution often does not show the specific fault location and the actual cause of the fault, and the accuracy is low; on the other hand, the tester relies on personal subjective experience to analyze and locate the error message, which not only cannot guarantee the accuracy, but also leads to quality risks of the equipment, and will also consume more manpower and time, increasing production costs. To this end, the embodiment of the present invention provides a test abnormality analysis solution, which can effectively and automatically perform accurate abnormality analysis when an abnormality occurs in the factory test equipment, reducing the equipment production cost, and reducing the possibility of fault repair errors while improving production efficiency, thereby improving the quality of shipments.

[0059] See also Figure 1 As shown, an embodiment of the present invention discloses a test exception analysis method, comprising:

[0060] Step S11: when an exception occurs during the test of the device to be tested, the preset fault analysis rule set summary table is matched with the current test exception information to obtain a corresponding rule matching result.

[0061] Specifically, in this embodiment, the device to be tested is tested based on the preset device test item sequence and the preset test components in the current device to be tested, and when an exception occurs during the test of the device to be tested, the preset fault analysis rule set summary table is matched by using the current test exception information, including: after the current device to be tested is assembled and powered on, the preset test component is downloaded to the device to be tested, and the device test is performed based on the preset test item sequence and the preset test components in the device to be tested; when an exception occurs during the device test, the model information, error test items, and error types in the current test exception information are used to match the preset fault analysis rule set summary table to obtain the corresponding rule matching result. Among them, the device to be tested can be a server or other device. It can be understood that the device startup method includes but is not limited to IPXE (a PXE (Preboot Execution Environment)) startup. The test items about the device can include configuration check, health check, function test, stress test, etc. When each test item starts and ends, the preset test component enters the device information and the corresponding test status into the database, so that the corresponding preset test monitoring component can display the device test status in real time.

[0062] Furthermore, in this embodiment, if an exception occurs during the test and causes the test to fail, the preset test component will call the preset fault analysis component and pass the current test exception information to the preset fault analysis component. The preset fault analysis component will then use the test exception information to start the corresponding fault analysis process. Figure 2 As shown, first, it is necessary to use the model information, error test items, and error types in the test exception information to match the preset fault analysis rule set summary table to obtain the corresponding rule set code. If the match is successful, the acquisition is successful, and if the match fails, it indicates that the acquisition failed. In this way, using configurable fault analysis rules can save R&D personnel the work of program adaptation for different errors, improve the flexibility of fault analysis methods, and reduce R&D costs.

[0063] Regarding the preset fault analysis component, it should be understood that it includes three parts: rule management, preset analysis rule generation engine, and fault analysis. Among them, the fault analysis part performs hierarchical analysis on the test abnormality information of the preset test component according to the analysis rules to obtain detailed fault content. For the automatically generated analysis rules that do not match the analysis rules, the fault analysis is performed. In addition, the structure of the analysis rule set (which is a major category of analysis rules) corresponding to the preset fault analysis rule set summary table is as follows: Figure 3 As shown, the parsing rules finally obtained based on the parsing rule set are subcategories of parsing rules (also called rule subcategories). Each of the rule subcategories supports three levels of parsing. After the first level of parsing, the second level of parsing is performed, and then the third level of parsing is performed. The second and third levels of parsing are not necessary. The rule management part supports operations such as adding, deleting, modifying, and querying parsing rules through World Wide Web pages, and performs data management through the database. That is, the fault parsing rules are stored in three tables of the database, of which Table 1 is a summary table of the preset parsing rule set, Table 2 is a detailed table of the preset rule subcategories, and Table 3 is a detailed table of the preset parsing rules.

[0064] It is necessary to further understand that (1) Table 1 includes: rule set code (OID, Object Identifier, also known as object identifier): unique code; model (Product Name): can be configured as ALL or model name, ALL means all device models are applicable; test item (Test Item): error test item, ALL means all test items are applicable; error type (Error Type): the source of the test error, such as SEL (Server Event Log, device event log), MESSAGE, FIO (Flexible IO Teste, flexible IO tester), NVQUAL (a device certification standard), etc. (2) Table 2 includes: rule subcategory code (OID): unique code; rule set code (Rule OID): OID corresponding to Table 1. Match Index: Keywords of the original error information that can be used for fault analysis; Priority: The priority of the rule subcategory, 0 is the highest; Match Number: Records the number of matches of the rule subcategory, the default value for new additions is 0; First-level parsing code, second-level parsing code, and third-level parsing code: Correspond to the OID of Table3, used to obtain the rule details of the three levels of this rule. (3) Regarding the said Table 3, it includes: rule details code (OID): unique code; log type (Log Type): the log file acquisition method used, including Command (command) and File (file); type content (Type Content): the execution content corresponding to the parsing type, the command type here is the command to be executed, and the file type here is the absolute file path; time interval (Time Interval): the log time interval for parsing alarms; analysis index (Analysis Index): the preset matching index when parsing logs, using the shell regular format; analysis command (Analysis Cmd): the parsing command after matching the index, in shell format; fault description (Fault Des): the fault description corresponding to the details of this rule; maintenance strategy code (Maintenance ID): the fault maintenance strategy code parsed by this rule.

[0065] The three tables establish database table indexes in commonly used fields to improve query efficiency. The three tables are supported by adding, deleting, modifying and querying functions using the World Wide Web page menu to facilitate the maintenance and management of rule information.

[0066] In addition, in this embodiment, a background scheduled task can be created to analyze the number of matches of the rule subclass every three months. If the number of matches is 0 within three months, the rule subclass (Table 2) is invalidated and no longer available; if it is not 0, the priority of the rule subclass is adjusted according to the number of matches, and the priority of the rule subclass with a higher number of matches is increased.

[0067] Step S12: generating a target fault analysis rule corresponding to the rule matching result based on the test abnormality information, and performing corresponding hierarchical analysis on the test abnormality information using the target fault analysis rule to obtain a corresponding fault analysis result.

[0068] In this embodiment, in the process of fault analysis based on the preset fault analysis component, if the rule matching result indicates that the match is successful, the corresponding rule subclass details table is determined based on the matched rule set encoding information; the test abnormal information is matched with the matching index information corresponding to each rule subclass in the rule subclass details table to obtain the corresponding subclass matching result; the first target fault analysis rule corresponding to the rule matching result is determined according to the preset rule subclass priority information and the subclass matching result, so as to use the first target fault analysis rule to perform hierarchical analysis on the test abnormal information. Among them, the same analysis rule set can correspond to multiple rule subclasses, and the difference between each rule subclass is the difference in the matching index, so as to refine the fault type into multiple abnormal scenarios, and the same rule subclass is divided into multiple fault analysis situations according to priority. Then, a list of matching indexes and test abnormal information is obtained, and sorted by priority to obtain the corresponding first target fault analysis rule. In this way, when the match is successful, the corresponding analysis rule can be determined through a series of matching operations, and automatic analysis can be completed.

[0069] At the same time, in this embodiment, if the matching analysis rule set fails, it is necessary to use the preset analysis rule generation engine in the preset fault analysis component to automatically generate rules. That is, the generation of the target fault analysis rule corresponding to the rule matching result based on the test abnormality information includes: if the rule matching result indicates that the match fails, the historical maintenance records in the preset factory maintenance database are queried based on the preset analysis rule generation engine and using the machine model information in the test abnormality information to determine the corresponding target historical maintenance record; the corresponding fault maintenance set is generated based on the operation record information in the target historical maintenance record; wherein the operation record information includes the corresponding machine serial number, fault location information, fault type, and maintenance record; the fault maintenance set is analyzed based on the preset maintenance set analysis rule, and the fault analysis rule elements obtained by the analysis are used to determine the second target fault analysis rule corresponding to the rule matching result, so as to use the second target fault analysis rule to perform hierarchical analysis on the test abnormality information.

[0070] Specifically, first, according to the model information in the test exception information, the preset factory fault repair library is queried in the priority order of "current model > similar configuration model". That is, in the order system, the model with the same platform as the current error model (that is, the model information) and the board and component configuration information duplication P greater than 0.5 is searched as a similar configuration model. Among them, the expression of the component configuration information duplication P is as follows:

[0071] ;

[0072] Where n is the total number of categories; n1 is the number of repeated categories; Xi is the value after calculating the weight of each category. In a specific embodiment, the weight values ​​are: CPU (Central Processing Unit), GPU (Graphics Processing Unit) is 3, RAID (Redundant Array of Independent Disks) card, network card, motherboard, etc. is 2, and other boards, hard disks, etc. are 1.

[0073] Afterwards, in each of the target historical maintenance records obtained, take the last operation record, sort the machine serial number, fault location, fault type, maintenance record, etc. by fault location and exclude duplicate data to generate the fault maintenance set. Then analyze and process the fault maintenance set to obtain corresponding fault analysis rule elements. In the process of analyzing the fault maintenance set, it is necessary to download the corresponding whole machine log from the preset log storage server based on the test error time information corresponding to the test exception information, and use the test exception information, the whole machine log and the big data platform to complete the analysis of the fault maintenance set. That is, this embodiment provides a method for automatically generating analysis rules, using a big data platform to process and analyze historical data, and the data source is the factory's maintenance database. A maximum of two levels of analysis rules are generated in a result-to-cause manner.

[0074] Further, after obtaining the first target fault analysis rule or the second target fault analysis rule, in this embodiment, the first target fault analysis rule or the second target fault analysis rule is used to automatically perform hierarchical analysis on the test abnormal information. Specifically, regarding hierarchical analysis, the use of the target fault analysis rule to perform corresponding hierarchical analysis on the test abnormal information to obtain a corresponding fault analysis result includes: hierarchical analysis of the test abnormal information based on the target rule subclass of the first priority in the target fault analysis rule to obtain a corresponding first information analysis result; if the first information analysis result indicates that the analysis fails, then determine whether there is a target rule subclass in the target fault analysis rule that has not completed the hierarchical analysis operation corresponding to the test abnormal information to obtain a corresponding rule subclass judgment result; when the rule subclass analysis result indicates that there is, hierarchical analysis of the test abnormal information based on the target rule subclass of the second priority in the target fault analysis rule to obtain a corresponding second information analysis result; if the second information analysis result indicates that the analysis is successful, then the second information analysis result is used as the fault analysis result corresponding to the test abnormal information. That is, the test abnormal information is analyzed in sequence according to the sorted rule subclass details list. If the analysis fails, the analysis is performed according to the rule sub-category of the next priority. If the analysis is successful, the obtained fault analysis result is returned to the preset test component. If all rule sub-categories fail to be analyzed, the failure information is returned.

[0075] Combination Figure 4 As shown, taking one of the rule subcategories as an example, the hierarchical parsing process is introduced. Specifically, according to the three-level parsing code configured for the rule subcategory, the process starts from the first level. First, query Table 3 using the corresponding code to obtain the corresponding parsing rule details:

[0076] 1) Get the log file.

[0077] When the log type in the queried analysis rule details is of Command type, the execution command configured by TypeContent is called to obtain the log content and save it in the analysis file (Analysis File); when it is of File type, the file configured by Type Content is used as the analysis file. The file path configured by Type Content is an absolute path, and the file name supports shell regular matching to adapt to the situation where the log file name generated by the system test has a timestamp, etc.

[0078] 2) Get the log block.

[0079] In the obtained parsing file, according to the test error time information time1 passed by the preset test component and the configured time interval interval Time, the parsing log block (log time range is time1-interval Time to time1+intervalTime) is intercepted. If the time interval is configured to 0, the entire parsing file is used as the parsing log block.

[0080] 3) Perform analysis.

[0081] In the parsing log block, search according to the matching index. If the search is successful, configure the shell command line through the parsing command field, parse the parsing log line in one step and obtain the parsing result. If the matching index is not retrieved or the parsing command returns 1, the parsing failure is returned. After the parsing at this level is completed, continue to the next level of parsing. The fault information, fault description, maintenance strategy code and other information that are finally parsed successfully are output as the fault parsing result, and the number of matches of the rule subcategory (Table2) used is increased by 1.

[0082] It is understandable that in this embodiment, if all the rule subcategories fail to parse, the preset parsing rule generation engine is called to generate new parsing rules, and the fault parsing is performed according to the newly generated parsing rules. If the parsing is still unsuccessful, the original test abnormality information is returned, and the relevant test maintenance personnel are prompted to enter the fault parsing rules of the error after analysis and maintenance.

[0083] Step S13: performing a corresponding fault location operation using the fault analysis result, and determining a corresponding target maintenance strategy based on the fault location result and the fault analysis result, so as to trigger a fault maintenance operation based on the target maintenance strategy.

[0084] Combination Figure 5As shown, in this embodiment, after the test abnormal information is analyzed for fault, fault location is also required. That is, the corresponding fault location operation is performed using the fault analysis result, including: searching the preset device physical location topology table based on the model information and device package number information in the fault analysis result to obtain the corresponding device mapping set; determining the corresponding device information from the device mapping set based on the BMC (Baseboard Management Controller, Baseboard Management Controller) symbol, the system device number, and the BDF number (Bus Number, Device Number, Function Number, a set of numbers used to uniquely identify devices on the PCIe (Peripheral Component Interconnect Express, a computer bus standard) bus, used to distinguish and locate each device on the PCIe bus) corresponding to the fault analysis result; after obtaining the corresponding link device tree using the preset instruction, determining the corresponding device link based on the fault device number in the device information, and supplementing the corresponding physical location information of the device link based on the preset device physical location topology table to complete the corresponding fault location operation, and obtaining the target fault physical location information and target fault link information corresponding to the test abnormal information. It should be understood that after the preset test component obtains the fault analysis result returned by the preset fault analysis component, it calls the preset link analysis component to pass the fault location, such as the drive letter / dev / sda, etc., to the preset link analysis component to obtain the physical location of the device mapped by the analysis, and the physical link from the CPU to the fault location.

[0085] Specifically, in the process of fault location, it is first necessary to obtain Table 4, that is, the preset device physical location topology table, which contains model information, device package number, system symbol, BMC symbol, BDF number, physical location, etc. By classifying the device model and package number, the topological relationship is entered into the table during the device development stage. In this way, the adverse effects caused by the physical location corresponding to a certain part of the current device often cannot be queried under the device system and the devices cannot be unified can be solved. Afterwards, based on the model information and device package number information in the fault analysis result, the device mapping set corresponding to the device model configuration is obtained in the preset device physical location topology table. Then, the device information is obtained using the BMC symbol, the device number under the system, and the BDF number in the device mapping set. Then, the link device tree of the device currently sending the fault is obtained through the "lspci" related command, the device link is determined by the current fault device number, and the order is sorted from the CPU to the terminal device, and the devices on the link are supplemented with the corresponding physical position through Table 4. Thus, the corresponding fault device physical information and physical link (that is, the target fault physical location information and the target fault link information) are obtained and returned to the preset test component.

[0086] Furthermore, in this embodiment, after the fault location is completed, the fault repair is required. Specifically, the preset test component uploads the fault analysis result, the target fault physical location information, and the target fault link information to the preset test monitoring component. Then, the preset test monitoring component uses the received information to match the corresponding target repair strategy, and then integrates the information such as the faulty device, the physical location, the physical link, the fault description, and the fault repair strategy, and performs visual prompts in the form of pop-up windows to guide the maintenance personnel to perform the maintenance operation.

[0087] Among them, it is necessary to understand that, with respect to the visualization page corresponding to the test monitoring module, if there are multiple different maintenance prompt information that need to be displayed at the same time, in the first embodiment, they can be displayed in sequence according to the size of the corresponding equipment numbers to be shipped out; in the second embodiment, a preset number of maintenance prompt information can be integrated each time based on a preset template, and the information can be displayed according to the fault category classification; in the third embodiment, corresponding functional buttons can be configured in the visualization page, so that testers and / or maintenance personnel can independently choose to display in sequence according to the size of the corresponding equipment numbers to be shipped out or to display information based on the preset template integration.

[0088] In summary, in this embodiment, 1) by configuring parsing rules, known error information is parsed and the maintenance of parsing rules is supported. This avoids the need for test program developers to continuously adapt the test program, ensures the stability of the test program, and reduces the probability of factory test errors. 2) By automatically generating and optimizing parsing rules, the intelligence of fault analysis is improved, saving subsequent maintenance work.

[0089] 3) Through multi-level in-depth analysis of equipment test anomalies, it can cover various scenarios of fault occurrence and clearly report faulty equipment and links. No further problem location is required by factory testers and maintenance personnel, saving manpower and time costs. 4) Through the one-to-one relationship between preset faults and maintenance strategies, fault analysis, fault content, and fault maintenance strategies are combined to output clear fault content and maintenance suggestions. The maintenance analysis and verification process is simplified to ensure the accuracy of maintenance. While improving production efficiency, it reduces the possibility of fault repair errors and improves delivery quality.

[0090] It can be seen that, when an abnormality occurs during the test of the equipment to be tested, the present application uses the current test abnormality information to match the preset fault analysis rule set summary table to obtain the corresponding rule matching result; based on the test abnormality information, a target fault analysis rule corresponding to the rule matching result is generated, and the target fault analysis rule is used to perform a corresponding hierarchical analysis on the test abnormality information to obtain the corresponding fault analysis result; the fault analysis result is used to perform a corresponding fault location operation, and a corresponding target maintenance strategy is determined based on the fault location result and the fault analysis result, so as to trigger a fault maintenance operation based on the target maintenance strategy. It can be seen from the above technical scheme that, when a fault occurs during the equipment test, the present application first matches the pre-configured fault analysis rule based on the current test abnormality information and the preset fault analysis rule set summary table, and then determines the target fault analysis rule corresponding to the matching result based on the test abnormality information, and automatically performs analysis using the target fault analysis rule. Then, the fault is located based on the obtained fault analysis result, and the fault analysis result and the fault location result are used for maintenance. In this way, when an abnormality occurs in the factory test equipment, accurate abnormality analysis can be automatically performed, thereby reducing the equipment production cost, and while improving production efficiency, reducing the possibility of fault repair errors, thereby improving shipment quality.

[0091] As can be seen from the previous embodiment, in the process of executing the fault analysis rule generation operation, the present application needs to analyze the fault maintenance set determined based on the preset factory maintenance database to determine the second target fault analysis rule corresponding to the matching result. To this end, the present embodiment will next describe in detail the process of analyzing the fault maintenance set.

[0092] See also Figure 6 As shown, an embodiment of the present invention discloses a test exception analysis method, comprising:

[0093] Step S21, after downloading the corresponding whole machine log from the preset log storage server based on the test error time information corresponding to the test exception information, search the fault location information and fault description information in the fault repair set in the whole machine log based on the preset retrieval instruction, and determine the corresponding log file to be processed according to the obtained retrieval result; wherein the whole machine log includes the error test item log, BMC log, system log, and stress testing tool log.

[0094] In this embodiment, after obtaining the whole machine log, the fault location and fault description in the preset maintenance set are searched in the whole machine log through commands such as awk and grep to obtain log blocks. The search rules are the same file, adjacent matching, and only the test item time range is taken. Among them, the log block is used as individual data Xi.

[0095] Step S22: determine whether the log file to be processed is a target log file corresponding to the error type in the test exception information to obtain a corresponding log determination result.

[0096] Step S23: If the log judgment result is yes, the log file to be processed is stored as a data set element in the first type of data set.

[0097] In this embodiment, if the retrieved log file to be processed is a log file corresponding to the error type, Xi is added to the first type of data set D1.

[0098] Step S24: If the log judgment result is no, the target log file is searched according to the preset blacklist to determine the corresponding target log line, and the log file to be processed and the target log line are combined and stored as a data set element in the second type of data set.

[0099] In this embodiment, if the retrieved log file to be processed is not a log file corresponding to the error type, the log line is retrieved from the log file corresponding to the error type according to the blacklist, and the retrieval results within the non-test item time range are excluded, and the log line is used as the individual data Yi. Then, Xi and Yi in this case are combined into sequential individual data Zi (Xi, Yi) and added to the second type of data set D2.

[0100] Step S25, perform text parsing on the log lines including the fault location information in the log file to be processed and the target log lines, and use the obtained log parsing results to update the corresponding fault location information and the name of the log file to be processed, so as to complete the refinement operation for the first type of data set and the second type of data set.

[0101] Specifically, in this embodiment, text parsing is performed on the log line containing the fault location in Xi and the log line of Yi to obtain the text position KP of the fault location or the black and white name keyword. The rule is: take the first symbol as the position reference, calculate the relative position to get KP. If the fault location in the log line is the first position after [ (space separation), then KP=[1, if it is the second position before ], then KP=2].

[0102] Then, the fault locations are classified, and the same parts are classified into one category to obtain the newly classified fault locations FP. The file names of the log files to be processed are removed from non-fixed symbols such as timestamps to obtain the corresponding matching file names MFx and MFy. FP, fault description (FD), MFx, MFy, KP, and blacklist key index (BK) are added to the Xi and Yi individual data, respectively, thereby dividing the D1 and D2 data sets into smaller data sets D1i and D2ti.

[0103] It should be understood that the Yi data is analyzed through big data to obtain the same keyword group Wyi for different Yi in the D2 set. Take Wyi with a frequency of 0 in the corresponding log file non-Yi line as the auxiliary key index of the Yi dimension in the data set, and divide D2 into smaller sets D2i by Wyi. Construct the matching parsing command of Yi data in the minimum set through BK and Wyi, such as grep "BK" | grep "Wyi".

[0104] Step S26: Analyze the first type of data set and the second type of data set based on the dimensions of the data set elements in the first type of data set by using the preset big data platform to obtain corresponding fault analysis rule elements.

[0105] Specifically, in this embodiment, since the format and content of the same fault cause in the same log are often the same, the parsing command in the corresponding rule is implemented by the expression of individual data in the overall log and in the minimum set. First, count the number of rows Li of the relative position of FP and FD in Xi, and take the maximum value Lm in the set. Then, statistical analysis is performed on the Xi in the data set to obtain the same keyword group Wxi in the row where the fault position is located in different Xi individual data, and take Wxi with a frequency of 0 in the row where the non-fault position of the corresponding log file is located as the auxiliary key index of the Xi dimension in the set, and divide D1 into smaller sets D1i by Wxi. .

[0106] After that, according to the relative relationship among FD, Lm, Wxi, and KP, the shell text parsing command is used to construct the parsing command: get FP from FD. The construction rule is: take the log blocks of Lm lines above and below FD in MFx and MFy. If the log block contains Wxi, get FP according to the KP rule, such as: grep -C7 "ECC" | grep "fault" | awk -F '-' '{print $1}' | awk'{print $2}'.

[0107] In addition, in this embodiment, the maintenance operations in the D1i and D2i data sets can also be processed using a big data platform, and the same maintenance operations are classified into one category. Different maintenance operations in the same set are sorted by the statistical number of times and integrated in the format of "Maintenance strategy one: XXXX. Maintenance strategy two: XXXX..." The processed maintenance strategy is compared with the maintenance strategy of the preset fault maintenance component. If they are the same, the maintenance strategy code is assigned to the corresponding set; if they are different, the new maintenance strategy is imported into the preset fault maintenance component, and a new maintenance strategy code is generated and assigned to the corresponding set.

[0108] Furthermore, the analyzed data needs to be imported into the corresponding table according to the fault analysis rule model. Among them, the D1i data set corresponds to only one level of analysis; the D2i data set corresponds to two levels of analysis, in which the Xi dimension corresponds to the second level and the Yi dimension corresponds to the first level. The two sets correspond to the Table2 table. Afterwards, the Table2 table is queried according to the new test abnormality information. If it exists, the newly added analysis rule is appended after the original priority sequence number. The newly added analysis rules are sorted by the amount of data contained in the D1i and D2i data sets, and the priority is high for the large amount of data. The matching index is the keyword of the current error information, and the analysis code at each level corresponds to the OID of the Table3 table, and the number of matches is initialized to 0. As for the data in the Table3 table: the log type and type content are determined by the matching file type. The preset sel, sensor, dmesg and other log types are obtained by their respective acquisition commands, such as ipmitool sel elist; the time interval is set to 0; the analysis index, the Xi dimension corresponds to FD, the Yi dimension corresponds to BK; the analysis command corresponds to the analysis command of each dimension. The fault description is consistent with the matching index. The same data is no longer added repeatedly and reused. Regarding the data in Table 1: query the information of the current error machine. If it is found, use the original one. If it is not found, add it. The machine model is set to ALL.

[0109] It can be seen that in the embodiment of the present application, in the process of automatically generating the second target fault analysis rule, the fault maintenance set corresponding to the test abnormality information is determined based on the preset factory maintenance database, and then the analysis of the fault maintenance set is analyzed using the whole machine log corresponding to the test abnormality information, so as to determine the second target fault analysis rule using the fault analysis rule elements obtained by the analysis. In this way, when it is impossible to process based on the analysis rules of known faults, it is possible to effectively improve the intelligence and efficiency of fault analysis while ensuring the accuracy of fault analysis, and save subsequent maintenance work.

[0110] See also Figure 7 As shown, the embodiment of the present application also discloses a test exception analysis device, including:

[0111] The analysis rule matching module 11 is used to match the preset fault analysis rule set summary table with the current test exception information when an exception occurs during the test of the device to be tested, so as to obtain the corresponding rule matching result;

[0112] A fault analysis module 12 is used to generate a target fault analysis rule corresponding to the rule matching result based on the test abnormality information, and perform a corresponding hierarchical analysis on the test abnormality information using the target fault analysis rule to obtain a corresponding fault analysis result;

[0113] The fault repair module 13 is used to perform a corresponding fault location operation using the fault analysis result, and determine a corresponding target repair strategy based on the fault location result and the fault analysis result, so as to trigger a fault repair operation based on the target repair strategy.

[0114] Among them, for more specific working processes of the above-mentioned modules, please refer to the corresponding contents disclosed in the aforementioned embodiments, which will not be repeated here.

[0115] It can be seen that when a fault occurs during equipment testing, the present application first matches the pre-configured fault analysis rules based on the current test exception information and the preset fault analysis rule set summary table, and then determines the target fault analysis rule corresponding to the matching result based on the test exception information, and automatically analyzes using the target fault analysis rule. The fault is then located based on the obtained fault analysis result, and repairs are performed using the fault analysis result and fault location result. In this way, accurate abnormality analysis can be automatically performed when an abnormality occurs in the factory test equipment, thereby reducing the equipment production cost, and reducing the possibility of fault repair errors while improving production efficiency, thereby improving delivery quality.

[0116] In some specific embodiments, the parsing rule matching module 11 may specifically include:

[0117] A test component downloading unit, used to download a preset test component to the device to be tested after the current device to be tested is assembled and powered on, and perform device testing based on a preset test item sequence and the preset test component in the device to be tested;

[0118] The rule matching unit is used to match the preset fault analysis rule set summary table with the machine model information, error test item, and error type in the current test exception information when an exception occurs during the device test to obtain the corresponding rule matching result.

[0119] In some specific embodiments, the fault analysis module 12 may specifically include:

[0120] A rule subcategory details table determination unit, configured to determine a corresponding rule subcategory details table based on the matched rule set encoding information if the rule matching result indicates a successful match;

[0121] A rule subclass matching unit, used to match the test exception information with the matching index information corresponding to each rule subclass in the rule subclass details table to obtain a corresponding subclass matching result;

[0122] The first target fault analysis rule determination unit is used to determine a first target fault analysis rule corresponding to the rule matching result according to the preset rule subclass priority information and the subclass matching result, so as to perform hierarchical analysis on the test abnormality information using the first target fault analysis rule.

[0123] In some specific embodiments, the fault analysis module 12 may specifically include:

[0124] A historical maintenance record query unit, configured to query the historical maintenance records in a preset factory maintenance database based on a preset parsing rule generation engine and using the machine model information in the test abnormality information to determine a corresponding target historical maintenance record if the rule matching result indicates a match failure;

[0125] A fault maintenance set generating unit, configured to generate a corresponding fault maintenance set based on the operation record information in the target historical maintenance record; wherein the operation record information includes a corresponding machine serial number, fault location information, fault type, and maintenance record;

[0126] A second target fault analysis rule determination unit is used to analyze the fault maintenance set based on a preset maintenance set analysis rule, and use the fault analysis rule elements obtained by the analysis to determine a second target fault analysis rule corresponding to the rule matching result, so as to use the second target fault analysis rule to perform hierarchical analysis on the test abnormality information.

[0127] In some specific embodiments, the second target fault analysis rule determination unit may specifically include:

[0128] A log retrieval subunit is used to retrieve the fault location information and fault description information in the fault repair set from the whole machine log based on a preset retrieval instruction after downloading the corresponding whole machine log from the preset log storage server based on the test error time information corresponding to the test abnormality information, and determine the corresponding log file to be processed according to the obtained retrieval result; wherein the whole machine log includes an error test item log, a BMC log, a system log, and a stress testing tool log;

[0129] The log judgment subunit is used to judge whether the log file to be processed is a target log file corresponding to the error type in the test exception information, so as to obtain a corresponding log judgment result;

[0130] A first data set storage subunit, configured to store the log file to be processed as a data set element in a first type of data set if the log judgment result is yes;

[0131] A second data set storage subunit is used for searching the target log file according to a preset blacklist to determine a corresponding target log line if the log judgment result is negative, and storing the combination of the log file to be processed and the target log line as a data set element in the second type of data set;

[0132] A data set refinement subunit is used to perform text parsing on the log line including the fault location information in the log file to be processed and the target log line, and use the obtained log parsing results to perform corresponding updates on the fault location information and the name of the log file to be processed, so as to complete the refinement operation on the first type of data set and the second type of data set;

[0133] The data set parsing subunit is used to parse the first type of data set and the second type of data set by using a preset big data platform based on the dimensions of the data set elements in the first type of data set to obtain corresponding fault analysis rule elements.

[0134] In some specific embodiments, the fault repair module 13 may specifically include:

[0135] A device mapping set acquisition unit, configured to retrieve a preset device physical location topology table based on the machine model information and device package number information in the fault analysis result to obtain a corresponding device mapping set;

[0136] A device information determination unit, configured to determine corresponding device information from the device mapping set based on a BMC symbol, a device number under the system, and a BDF number corresponding to the fault analysis result;

[0137] A fault location unit is used to determine the corresponding device link based on the faulty device number in the device information after obtaining the corresponding link device tree using preset instructions, and to supplement the corresponding physical location information of the device link based on the preset device physical location topology table to complete the corresponding fault location operation and obtain the target fault physical location information and target fault link information corresponding to the test abnormality information.

[0138] In some specific embodiments, the fault analysis module 12 may specifically include:

[0139] A first hierarchical analysis unit, configured to perform hierarchical analysis on the test abnormality information based on a target rule subclass of a first priority in the target fault analysis rule to obtain a corresponding first information analysis result;

[0140] A rule subclass determination unit, configured to determine whether there is a target rule subclass in the target fault analysis rule that has not completed the hierarchical analysis operation corresponding to the test abnormality information, if the first information analysis result indicates that the analysis fails, so as to obtain a corresponding rule subclass determination result;

[0141] A second hierarchical parsing unit, configured to perform hierarchical parsing on the test abnormality information based on the target rule subclass of the second priority in the target fault parsing rule when the rule subclass parsing result indicates existence, so as to obtain a corresponding second information parsing result;

[0142] A fault analysis result determining unit is used to use the second information analysis result as the fault analysis result corresponding to the test abnormality information if the second information analysis result indicates that the analysis is successful.

[0143] Furthermore, the present application also discloses an electronic device. Figure 8 It is a structural diagram of an electronic device according to an exemplary embodiment, and the content in the figure cannot be regarded as any limitation on the scope of use of this application. The electronic device may specifically include: at least one processor 21, at least one memory 22, a power supply 23, a communication interface 24, an input and output interface 25 and a communication bus 26. Among them, the memory 22 is used to store a computer program, and the computer program is loaded and executed by the processor 21 to implement the relevant steps in the test anomaly analysis method disclosed in any of the aforementioned embodiments. In addition, the electronic device in this embodiment may specifically be an electronic computer.

[0144] In this embodiment, the power supply 23 is used to provide working voltage for each hardware device on the electronic device; the communication interface 24 can create a data transmission channel between the electronic device and the external device, and the communication protocol it follows is any communication protocol that can be applied to the technical solution of the present application, and is not specifically limited here; the input and output interface 25 is used to obtain external input data or output data to the outside world, and its specific interface type can be selected according to specific application needs and is not specifically limited here.

[0145] In addition, the memory 22, as a carrier for storing resources, can be a read-only memory, a random access memory, a disk or an optical disk, etc. The resources stored thereon can include an operating system 221, a computer program 222, etc., and the storage method can be temporary storage or permanent storage.

[0146] The operating system 221 is used to manage and control various hardware devices on the electronic device and the computer program 222, which can be Windows Server, Netware, Unix, Linux, etc. In addition to including a computer program that can be used to complete the test anomaly analysis method performed by the electronic device disclosed in any of the aforementioned embodiments, the computer program 222 can further include a computer program that can be used to complete other specific tasks.

[0147] Furthermore, the present application also discloses a computer-readable storage medium for storing a computer program; wherein, when the computer program is executed by a processor, the test exception analysis method disclosed above is implemented. The specific steps of the method can refer to the corresponding contents disclosed in the above embodiments, and will not be repeated here.

[0148] In this specification, each embodiment is described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same or similar parts between the embodiments can be referred to each other. For the device disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and the relevant parts can be referred to the method part.

[0149] Professionals may further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the composition and steps of each example have been generally described in the above description according to function. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians may use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0150] The steps of the method or algorithm described in conjunction with the embodiments disclosed herein may be implemented directly using hardware, a software module executed by a processor, or a combination of the two. The software module may be placed in a random access memory (RAM), a memory, a read-only memory (ROM), an electrically programmable ROM, an electrically erasable programmable ROM, a register, a hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.

[0151] Finally, it should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the presence of other identical elements in the process, method, article or device including the elements.

[0152] The technical solution provided by the present application is introduced in detail above. Specific examples are used in this article to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the method of the present application and its core idea. At the same time, for general technicians in this field, according to the idea of ​​the present application, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as a limitation on the present application.

Claims

1. A test exception analysis method, characterized in that: include: When an abnormality occurs during the test of the device to be tested, the current test abnormality information is used to perform rule matching on the preset fault analysis rule set summary table to obtain the corresponding rule matching result; Generating a target fault analysis rule corresponding to the rule matching result based on the test abnormality information, and performing corresponding hierarchical analysis on the test abnormality information using the target fault analysis rule to obtain a corresponding fault analysis result; The fault analysis result is used to perform a corresponding fault location operation, and a corresponding target maintenance strategy is determined based on the fault location result and the fault analysis result, so as to trigger a fault maintenance operation based on the target maintenance strategy.

2. The test anomaly analysis method according to claim 1, characterized in that: When an exception occurs during the test of the device to be tested, the preset fault analysis rule set summary table is matched by using the current test exception information, including: After the current device to be tested is assembled and powered on, a preset test component is downloaded to the device to be tested, and a device test is performed based on a preset test item sequence and the preset test component in the device to be tested; When an exception occurs during the device test, the preset fault analysis rule set summary table is matched with the machine model information, error test item, and error type in the current test exception information to obtain a corresponding rule matching result.

3. The test anomaly analysis method according to claim 1, characterized in that: The generating a target fault analysis rule corresponding to the rule matching result based on the test abnormality information includes: If the rule matching result indicates that the match is successful, then the corresponding rule subcategory details table is determined based on the matched rule set encoding information; The test exception information is matched with the matching index information corresponding to each rule subclass in the rule subclass details table to obtain a corresponding subclass matching result; A first target fault analysis rule corresponding to the rule matching result is determined according to the preset rule subclass priority information and the subclass matching result, so as to perform hierarchical analysis on the test abnormality information using the first target fault analysis rule.

4. The test anomaly analysis method according to claim 1, characterized in that: The generating a target fault analysis rule corresponding to the rule matching result based on the test abnormality information includes: If the rule matching result indicates that the match fails, querying the historical maintenance records in the preset factory maintenance database based on the preset parsing rule generation engine and using the machine model information in the test abnormality information to determine the corresponding target historical maintenance record; Generate a corresponding fault maintenance set based on the operation record information in the target historical maintenance record; wherein the operation record information includes the corresponding machine serial number, fault location information, fault type, and maintenance record; The fault maintenance set is analyzed based on a preset maintenance set analysis rule, and a second target fault analysis rule corresponding to the rule matching result is determined using the fault analysis rule element obtained by the analysis, so as to perform hierarchical analysis on the test abnormality information using the second target fault analysis rule.

5. The test anomaly analysis method according to claim 4, characterized in that: The analyzing the fault maintenance set based on the preset maintenance set parsing rule includes: After downloading the corresponding whole machine log from the preset log storage server based on the test error time information corresponding to the test exception information, searching the fault location information and fault description information in the fault repair set in the whole machine log based on the preset search instruction, and determining the corresponding log file to be processed according to the obtained search result; wherein the whole machine log includes the error test item log, BMC log, system log, and stress testing tool log; Determine whether the log file to be processed is a target log file corresponding to the error type in the test exception information to obtain a corresponding log determination result; If the log judgment result is yes, the log file to be processed is stored as a data set element in the first type of data set; If the log judgment result is no, the target log file is searched according to the preset blacklist to determine the corresponding target log line, and the log file to be processed and the target log line are combined and stored as a data set element in the second type of data set; Performing text parsing on the log line including the fault location information in the log file to be processed and the target log line, and using the obtained log parsing results to update the corresponding fault location information and the name of the log file to be processed, so as to complete the refinement operation on the first type of data set and the second type of data set; The first type of data set and the second type of data set are parsed using a preset big data platform based on the dimensions of the data set elements in the first type of data set to obtain corresponding fault analysis rule elements.

6. The test anomaly analysis method according to claim 1, characterized in that: The using the fault analysis result to perform corresponding fault location operations includes: Based on the machine model information and the equipment package number information in the fault analysis result, a preset equipment physical location topology table is searched to obtain a corresponding equipment mapping set; Determine corresponding device information from the device mapping set based on the BMC symbol, the device number under the system, and the BDF number corresponding to the fault analysis result; After obtaining the corresponding link device tree using the preset instructions, the corresponding device link is determined based on the faulty device number in the device information, and the corresponding physical location information of the device link is supplemented based on the preset device physical location topology table to complete the corresponding fault location operation and obtain the target fault physical location information and target fault link information corresponding to the test abnormality information.

7. The test anomaly analysis method according to any one of claims 1 to 6, characterized in that: The using the target fault analysis rule to perform corresponding hierarchical analysis on the test abnormality information to obtain corresponding fault analysis results includes: Performing hierarchical analysis on the test abnormality information based on the target rule subclass of the first priority in the target fault analysis rule to obtain a corresponding first information analysis result; If the first information parsing result indicates that the parsing fails, determining whether there is a target rule subclass in the target fault parsing rule that has not completed the hierarchical parsing operation corresponding to the test abnormality information, so as to obtain a corresponding rule subclass determination result; When the rule subclass analysis result indicates existence, performing hierarchical analysis on the test abnormality information based on the target rule subclass of the second priority in the target fault analysis rule to obtain a corresponding second information analysis result; If the second information analysis result indicates that the analysis is successful, the second information analysis result is used as the fault analysis result corresponding to the test abnormality information.

8. A test anomaly analysis device, characterized in that: include: The parsing rule matching module is used to match the preset fault parsing rule set summary table with the current test exception information when an exception occurs during the test of the device to be tested, so as to obtain the corresponding rule matching result; A fault analysis module, used to generate a target fault analysis rule corresponding to the rule matching result based on the test abnormality information, and perform corresponding hierarchical analysis on the test abnormality information using the target fault analysis rule to obtain a corresponding fault analysis result; The fault repair module is used to perform a corresponding fault location operation using the fault analysis result, and determine a corresponding target repair strategy based on the fault location result and the fault analysis result, so as to trigger a fault repair operation based on the target repair strategy.

9. An electronic device, characterized in that: include: Memory for storing computer programs; A processor is used to execute the computer program to implement the steps of the test exception analysis method as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the test exception analysis method according to any one of claims 1 to 7 are implemented.

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