Point laser flatness testing method and testing device

Abstract

The invention discloses a point laser flatness testing method and device, and the method comprises the steps: obtaining the three-dimensional coordinates of Q testing points of a to-be-tested surface based on a point laser testing device; wherein Q is a positive integer greater than or equal to 3; determining a reference surface based on the three-dimensional coordinates of each test point; projecting at least part of the test points to the reference surface along the z-axis direction to obtain projection points in one-to-one correspondence with the part of the test points; calculating a height difference value between the corresponding test point and the projection point to obtain a plurality of height difference values; and determining the flatness of the to-be-measured surface based on each height difference value. By the adoption of the technical scheme, flatness errors caused by inclination of a product can be eliminated.

Description

Technical Field

[0001] The present invention relates to the technical field of flatness testing, and in particular to a point laser flatness testing method and testing device. Background Art

[0002] With the advancement of science and technology and the development of industrialization, the requirements for product flatness are increasing day by day. The traditional flatness measurement methods are generally multi-point contact measurement or multi-point non-contact measurement. These methods require a large number of detection heads to collect height information at the same time, and the fixed test points are not conducive to product changeover. In addition, there are large errors in the test of scenes where the product is placed slightly tilted. Summary of the invention

[0003] The invention provides a point laser flatness testing method and a testing device to eliminate the flatness error caused by product tilt.

[0004] According to one aspect of the present invention, a point laser flatness testing method is provided, comprising:

[0005] Based on the point laser testing device, the three-dimensional coordinates of Q test points on the surface to be tested are obtained; wherein Q is a positive integer greater than or equal to 3;

[0006] Determining a reference plane based on the three-dimensional coordinates of each of the test points;

[0007] Projecting at least part of the test points onto the reference plane along the z-axis direction to obtain projection points corresponding to the part of the test points one by one;

[0008] Calculate the height difference between the corresponding test point and the projection point to obtain a plurality of height difference values;

[0009] Based on each of the height difference values, the flatness of the surface to be measured is determined.

[0010] Optionally, the point laser testing device includes a motion platform and a point laser sensor;

[0011] Based on the point laser test device, the three-dimensional coordinates of Q test points on the surface to be tested are obtained, including:

[0012] Get the plane coordinates of the preset collection points;

[0013] Based on the plane coordinates of the preset collection point, output a control signal to the motion platform so that the motion platform drives the point laser sensor to move to the preset collection point;

[0014] When the point laser testing device moves to the preset collection point, the point laser sensor is controlled to detect the surface to be tested, and the height information of the surface to be tested at the preset collection point is obtained;

[0015] Based on the plane coordinates of the preset acquisition point and the height information, obtaining the three-dimensional coordinates of the test point on the surface to be tested;

[0016] According to the preset path, the plane coordinates of the preset collection points are adjusted, and the step of returning to the plane coordinates based on the preset collection points and outputting a control signal to the motion platform so that the motion platform drives the point laser sensor to move to the preset collection points is performed until the three-dimensional coordinates of Q test points are obtained.

[0017] Optionally, determining a reference plane based on the three-dimensional coordinates of each of the test points includes:

[0018] Based on the three-dimensional coordinates of each of the test points, a reference plane is determined using a three-point method.

[0019] Optionally, projecting at least part of the test points onto the reference plane along the z-axis direction to obtain projection points corresponding one-to-one to the part of the test points includes:

[0020] Determine M of the test points as a group, with a total of N groups of the test points; wherein M is a positive integer greater than or equal to 3, and N is a positive integer; the x coordinates or y coordinates of the three-dimensional coordinates of a group of the test points are equal, and at least two of the test points in a group of the test points are located on the reference plane;

[0021] Determine, according to two test points in each group of test points located on the reference plane, a reference line corresponding to each group of test points;

[0022] Along the z-axis direction, each of the test points in each group of the test points is projected onto the reference line corresponding to the group of the test points to obtain projection points corresponding one-to-one to each of the test points in each group of the test points.

[0023] Optionally, projecting each of the test points in each group of the test points onto the reference line corresponding to the group of the test points along the z-axis direction to obtain projection points corresponding one-to-one to each of the test points in each group of the test points includes:

[0024] Determine that the plane coordinates of the projection point are the same as the plane coordinates of the corresponding test point;

[0025] The z coordinate of the projection point is determined according to the plane coordinates of the projection point and the corresponding reference line.

[0026] Optionally, calculating the height difference between the corresponding test point and the projection point to obtain a plurality of the height difference values ​​includes:

[0027] The difference between the z coordinate of the corresponding test point and the z coordinate of the projection point is calculated to obtain a plurality of height difference values.

[0028] Optionally, determining the flatness of the surface to be measured based on each of the height difference values ​​includes:

[0029] Obtain the maximum height difference Dmax and the minimum height difference Dmin of all the height difference values;

[0030] When Dmax≥Dmin≥0, ​​the flatness of the surface to be measured is determined to be Dmax; when Dmax≤Dmin<0, the flatness of the surface to be measured is determined to be |Dmax|; when Dmax≥0>Dmin, the flatness of the surface to be measured is determined to be Dmax-Dmin.

[0031] According to another aspect of the present invention, there is provided a point laser flatness testing device, comprising:

[0032] A test point acquisition module, used to acquire the three-dimensional coordinates of Q test points on the surface to be tested based on the point laser test device; wherein Q is a positive integer greater than or equal to 3;

[0033] A reference plane determination module, used for determining a reference plane based on the three-dimensional coordinates of each of the test points;

[0034] A projection module, used for projecting at least part of the test points onto the reference plane along the z-axis direction to obtain projection points corresponding to the part of the test points one by one;

[0035] A calculation module, used for calculating the height difference between the corresponding test point and the projection point to obtain a plurality of height difference values;

[0036] The flatness determination module is used to determine the flatness of the surface to be measured based on each of the height difference values.

[0037] According to another aspect of the present invention, an electronic device is provided, the electronic device comprising:

[0038] at least one processor; and a memory communicatively coupled to the at least one processor;

[0039] The memory stores a computer program that can be executed by the at least one processor, and the computer program is executed by the at least one processor so that the at least one processor can execute the point laser flatness testing method described in any embodiment of the present invention.

[0040] According to another aspect of the present invention, a computer-readable storage medium is provided, wherein the computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a processor to implement the point laser flatness testing method described in any embodiment of the present invention when executed.

[0041] The technical solution of the present invention obtains the height information of each test point of the surface to be tested through a point laser testing device. On the one hand, it can be applicable to the surface flatness test of various products, and the test area, test points, etc. can be set according to the surface to be tested. The application scenarios are wide, especially suitable for industrial production scenarios where product styles are frequently changed. On the other hand, only one point laser sensor is required to follow the movement of the motion platform to complete the height measurement of the test points of the entire surface to be tested, and the testing cost is low. In addition, by determining the reference plane according to the three-dimensional coordinates of the test point, and determining the flatness according to the height difference between the test point and the projection point of the test point on the reference plane, the influence of the slight tilt of the product itself or the fixture on the test can be eliminated, which is beneficial to reducing the test error and improving the accuracy of the flatness. There is no need to calculate the distance between the measuring point and the reference plane, and the flatness can be determined by the height difference. The calculation is simple and the requirements for the computing device of the actual application are low, which is beneficial to reducing the equipment cost and the research and development cost.

[0042] It should be understood that the contents described in this section are not intended to identify the key or important features of the embodiments of the present invention, nor are they intended to limit the scope of the present invention. Other features of the present invention will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0044] Figure 1 is a flow chart of a point laser flatness testing method provided in Embodiment 1 of the present invention;

[0045] Figure 2 is a flow chart of a point laser flatness testing method provided by Embodiment 2 of the present invention;

[0046] Figure 3 It is a structural schematic diagram of a point laser flatness testing device provided in Embodiment 3 of the present invention;

[0047] Figure 4 A schematic diagram of the structure of an electronic device that can be used to implement an embodiment of the present invention is shown. DETAILED DESCRIPTION

[0048] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0049] It should be noted that the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or apparatus comprising a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to these processes, methods, products or apparatus.

[0050] Embodiment 1

[0051] Figure 1 This is a flow chart of a point laser flatness test method provided by the first embodiment of the present invention. This embodiment is applicable to the case of testing the surface flatness of a product. The method can be performed by a point laser flatness test device. The point laser flatness test device can be implemented in the form of hardware and / or software. The point laser flatness test device can be configured in a flatness test system. Figure 1 As shown, the method includes:

[0052] S110 , based on the point laser testing device, obtaining the three-dimensional coordinates of Q test points on the surface to be tested.

[0053] Wherein, Q is a positive integer greater than or equal to 3. The point laser test device includes a motion platform and a point laser sensor. The motion platform includes a motor, a track, etc. The motion platform can drive the point laser sensor to move to collect height information of the surface to be tested at a certain position at different positions.

[0054] Exemplarily, the motion platform can be an XY mobile platform. By controlling the servo motor, the point laser sensor can quickly collect height information at any position on the XY plane and record the coordinates of each position in the XY coordinate system. By taking points at different positions on the surface to be tested, multiple test points can be found. The coordinates of each test point in the XY coordinate system are the x-coordinate and y-coordinate of the test point, that is, the plane coordinates. The height information of each test point can be used as the z-coordinate. The x-coordinate, y-coordinate and z-coordinate form the three-dimensional coordinates of the test point.

[0055] S120 , determining a reference plane based on the three-dimensional coordinates of each test point.

[0056] Specifically, based on the three-dimensional coordinates of each test point, a plane fitting can be performed to obtain a reference plane, which can be used as a reference plane for the surface to be tested. It can be understood that the reference plane is a plane that is relatively close to the surface to be tested. When the surface to be tested differs greatly from the horizontal plane due to the tilt of the product placement, the reference plane will also differ greatly from the horizontal plane.

[0057] In an optional embodiment, determining the reference plane based on the three-dimensional coordinates of each test point includes: determining the reference plane using a three-point method based on the three-dimensional coordinates of each test point.

[0058] Exemplarily, three test points that are farthest apart and not on the same straight line may be selected from all the test points, and the principle of determining a plane using three points may be used to find the plane, which is the reference plane.

[0059] S130 , projecting at least part of the test points onto a reference plane along the z-axis direction to obtain projection points corresponding one-to-one to the part of the test points.

[0060] Exemplarily, some or all of the test points are selected and projected onto the reference plane. After the test points are projected, projection points located on the reference plane are formed. Compared with the test points, the x-coordinate and y-coordinate of the projection points do not change, but the z-coordinate may change, so that the projection points are located on the reference plane. If the test point is located on the reference plane, the z-coordinate of the corresponding projection point is equal to the z-coordinate of the test point; if the test point is not located on the reference plane, the z-coordinate of the corresponding projection point is greater than or less than the z-coordinate of the test point.

[0061] S140, calculating the height difference between the corresponding test point and the projection point to obtain multiple height difference values.

[0062] Specifically, the height difference between the corresponding test point and the projection point is the z-coordinate difference between the corresponding test point and the projection point, and the height difference is equal to the z-coordinate of the test point minus the z-coordinate of the projection point.

[0063] S150: Determine the flatness of the surface to be measured based on the height difference values.

[0064] Specifically, according to the height difference between the corresponding test point and the projection point, the distribution of the test point relative to the plane can be determined. For example, if the height difference is greater than zero, it means that the test point is above the reference plane; if the height difference is equal to zero, it means that the test point is located on the reference plane; if the height difference is less than zero, it means that the test point is below the reference plane. The larger the absolute value of the height difference, the farther the test point is from the reference plane, and the greater the flatness at this position; the smaller the absolute value of the height difference, the closer the test point is to the reference plane, and the smaller the flatness at this position. Therefore, according to the distribution of each height difference, the distribution of the test point relative to the reference plane can be obtained, and the flatness of the surface to be measured can be obtained.

[0065] In the first embodiment of the present invention, height information of each test point on the surface to be tested is obtained through a point laser testing device. On the one hand, it can be applicable to surface flatness testing of various products, and test areas, test points, etc. can be set according to the surface to be tested. The application scenarios are wide, especially suitable for industrial production scenarios where product styles are frequently changed. On the other hand, only one point laser sensor is required to follow the movement of the motion platform to complete the height measurement of the test points on the entire surface to be tested, and the testing cost is low. In addition, by determining the reference plane according to the three-dimensional coordinates of the test point, and determining the flatness according to the height difference between the test point and the projection point of the test point on the reference plane, the influence of slight tilt of the product itself or the fixture on the test can be eliminated, which is beneficial to reducing test errors and improving the accuracy of flatness. There is no need to calculate the distance between the measuring point and the reference plane, and the flatness can be determined by the height difference. The calculation is simple, and the requirements for the computing device of the actual application are low, which is beneficial to reducing equipment costs and R&D costs.

[0066] Optionally, the point laser testing device includes a motion platform and a point laser sensor; based on the point laser testing device, the three-dimensional coordinates of Q test points of the surface to be tested are obtained, including: obtaining the plane coordinates of a preset collection point; based on the plane coordinates of the preset collection point, outputting a control signal to the motion platform, so that the motion platform drives the point laser sensor to move to the preset collection point; when the point laser testing device moves to the preset collection point, the point laser sensor is controlled to detect the surface to be tested, and the height information of the surface to be tested at the preset collection point is obtained; based on the plane coordinates and height information of the preset collection point, the three-dimensional coordinates of the test point of the surface to be tested are obtained; according to the preset path, the plane coordinates of the preset collection point are adjusted, and the step of returning to execute based on the plane coordinates of the preset collection point, outputting a control signal to the motion platform, so that the motion platform drives the point laser sensor to move to the preset collection point, until the three-dimensional coordinates of the Q test points are obtained.

[0067] For example, the XY coordinates of all points that need to collect heights can be set according to the surface to be tested, that is, preset collection points. During the test, the motion platform is started to run to the first preset collection point, and the height information is collected after it reaches the position. Then, after the collection is completed, a signal is fed back to the motion platform. After receiving the signal, the motion platform runs to the second preset collection point according to the preset path, and so on, until the height information of the Qth preset collection point is tested, and the three-dimensional coordinates of the Q test points can be obtained.

[0068] The preset paths include but are not limited to S-shaped paths, zigzag paths, etc.

[0069] Optionally, based on each height difference value, determine the flatness of the surface to be measured, including: obtaining the maximum height difference Dmax and the minimum height difference Dmin of all height difference values; when Dmax≥Dmin≥0, ​​determine that the flatness of the surface to be measured is Dmax; when Dmax≤Dmin<0, determine that the flatness of the surface to be measured is |Dmax|; when Dmax≥0>Dmin, determine that the flatness of the surface to be measured is Dmax-Dmin.

[0070] Exemplarily, when Dmax≥0 and Dmin≥0, ​​it means that all the test points are on the upper side of the reference plane, and the flatness is Dmax; when Dmax<0 and Dmin<0, it means that all the test points are distributed on the lower side of the reference plane, and the flatness is |Dmax|; when Dmax≥0 and Dmin<0, it means that all the test points are distributed on the upper and lower sides of the reference plane, and the flatness is Dmax-Dmin.

[0071] Embodiment 2

[0072] Figure 2 FIG. 1 is a flow chart of a point laser flatness test method provided by Embodiment 2 of the present invention. Compared with the above-mentioned embodiments, this embodiment simplifies the projection process. Figure 2 As shown, the method includes:

[0073] S210 , based on the point laser testing device, obtaining the three-dimensional coordinates of Q test points on the surface to be tested.

[0074] S220 . Determine a reference plane based on the three-dimensional coordinates of each test point.

[0075] S230 , determining M test points as a group, with a total of N groups of test points.

[0076] Wherein, M is a positive integer greater than or equal to 3, N is a positive integer; the x coordinates or y coordinates of the three-dimensional coordinates of a group of test points are equal, and at least two test points in the group of test points are located on the reference plane.

[0077] S240: Determine a reference line corresponding to each group of test points according to two test points in each group of test points that are located on the reference plane.

[0078] Specifically, according to the test points in each group of test points located on the reference plane, the reference line can be obtained by applying the principle of two points determining a straight line. It can be understood that the reference line is located on the reference plane, and the reference line is the straight line where the projection points of each group of test points on the reference plane are located, that is, the projection points of each group of test points on the reference plane are located on the reference line of the group of test points.

[0079] S250 , projecting each test point in each group of test points onto a reference line corresponding to the group of test points along the z-axis direction, to obtain projection points corresponding to each test point in each group of test points.

[0080] Specifically, the projection point of the test point on the corresponding reference line is the projection point of the test point on the reference plane. Projecting the test point to the reference line can replace projecting the test point to the reference plane, which can simplify the calculation process.

[0081] In an optional embodiment, each test point in each group of test points is projected onto a reference line corresponding to the group of test points along the z-axis direction to obtain projection points corresponding one-to-one to each test point in each group of test points, including: determining that the plane coordinates of the projection point are the same as the plane coordinates of the corresponding test point; and determining the z coordinate of the projection point based on the plane coordinates of the projection point and the corresponding reference line.

[0082] Exemplarily, taking the case where the y coordinate of a group of test points are all y0, based on the two test points P1=(x1, y0, z1) and P2=(x2, y0, z2) located on the reference plane, the reference line formula can be determined as y=y0, (z-z1) / (x-x1)=(z2-z1) / (x2-x1), that is, z=z1+[(x-x1) / (x2-x1)]×(z2-z1). After determining the plane coordinates of the test point, the z coordinate of the test point projected on the reference line can be determined according to the above formula, thereby determining the projection point.

[0083] S260, calculating the height difference between the corresponding test point and the projection point to obtain multiple height difference values.

[0084] S270: Determine the flatness of the surface to be measured based on the height difference values.

[0085] In the second embodiment of the present invention, N groups of test points are selected at the test point, and straight line fitting is performed. The projection points of the test points on the reference line are determined by using equal proportion addition and subtraction, so that the projection points of the test points on the reference surface can be determined. The calculation is simple, and the requirements for the calculation device of the actual application are low, which is conducive to reducing the equipment cost and the research and development cost. Moreover, the present application only needs to select N groups of data with equal X values ​​and / or equal Y values ​​for calculation, and there is no need to calculate the data of all the test points. The calculation amount is small, and the flatness measurement is more efficient.

[0086] Embodiment 3

[0087] Figure 3 FIG. 1 is a schematic diagram of the structure of a point laser flatness testing device provided in Embodiment 3 of the present invention. Figure 3 As shown, the device comprises:

[0088] The test point acquisition module 310 is used to acquire the three-dimensional coordinates of Q test points on the surface to be tested based on the point laser testing device; wherein Q is a positive integer greater than or equal to 3;

[0089] A reference plane determination module 320, for determining a reference plane based on the three-dimensional coordinates of each test point;

[0090] The projection module 330 is used to project at least part of the test points onto the reference plane along the z-axis direction to obtain projection points corresponding to the part of the test points one by one;

[0091] A calculation module 340 is used to calculate the height difference between the corresponding test point and the projection point to obtain multiple height difference values;

[0092] The flatness determination module 350 is used to determine the flatness of the surface to be measured based on each height difference value.

[0093] Optionally, the test point acquisition module 310 includes:

[0094] A collection point acquisition unit, used to acquire the plane coordinates of a preset collection point;

[0095] A motion control unit, used for outputting a control signal to the motion platform based on the plane coordinates of the preset collection point, so that the motion platform drives the point laser sensor to move to the preset collection point;

[0096] A height acquisition unit is used to control the point laser sensor to detect the surface to be tested when the point laser test equipment moves to a preset acquisition point, so as to obtain the height information of the surface to be tested at the preset acquisition point;

[0097] A coordinate unit, used to obtain the three-dimensional coordinates of the test point on the surface to be tested based on the plane coordinates and height information of the preset acquisition point;

[0098] The adjustment unit is used to adjust the plane coordinates of the preset collection points according to the preset path, and then return to the motion control unit to execute the steps based on the plane coordinates of the preset collection points, output a control signal to the motion platform, so that the motion platform drives the point laser sensor to move to the preset collection points, until the three-dimensional coordinates of Q test points are obtained.

[0099] Optionally, the projection module 330 includes:

[0100] A grouping unit, used to determine M test points as one group, with a total of N groups of test points; wherein M is a positive integer greater than or equal to 3, and N is a positive integer; the x coordinates or y coordinates of the three-dimensional coordinates of a group of test points are equal, and at least two test points in a group of test points are located on the reference plane;

[0101] A reference line determination unit, used to determine the reference line corresponding to each group of test points according to two test points in each group of test points located on the reference plane;

[0102] The projection unit is used to project each test point in each group of test points onto a reference line corresponding to the group of test points along the z-axis direction to obtain projection points corresponding to each test point in each group of test points.

[0103] The point laser flatness testing device provided in the embodiment of the present invention can execute the point laser flatness testing method provided in any embodiment of the present invention, and has the corresponding functional modules and beneficial effects of the execution method.

[0104] Embodiment 4

[0105] Figure 4 A schematic diagram of an electronic device that can be used to implement an embodiment of the present invention is shown. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as personal digital processing, cellular phones, smart phones, wearable devices (such as helmets, glasses, watches, etc.) and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely examples and are not intended to limit the implementation of the present invention described and / or required herein.

[0106] like Figure 4 As shown, the electronic device 10 includes at least one processor 11, and a memory connected to the at least one processor 11, such as a read-only memory (ROM) 12, a random access memory (RAM) 13, etc., wherein the memory stores a computer program that can be executed by at least one processor, and the processor 11 can perform various appropriate actions and processes according to the computer program stored in the read-only memory (ROM) 12 or the computer program loaded from the storage unit 18 to the random access memory (RAM) 13. In the RAM 13, various programs and data required for the operation of the electronic device 10 can also be stored. The processor 11, the ROM 12, and the RAM 13 are connected to each other through a bus 14. The input / output (I / O) interface 15 is also connected to the bus 14.

[0107] A number of components in the electronic device 10 are connected to the I / O interface 15, including: an input unit 16, such as a keyboard, a mouse, etc.; an output unit 17, such as various types of displays, speakers, etc.; a storage unit 18, such as a disk, an optical disk, etc.; and a communication unit 19, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 19 allows the electronic device 10 to exchange information / data with other devices through a computer network such as the Internet and / or various telecommunication networks.

[0108] The processor 11 may be a variety of general and / or special processing components with processing and computing capabilities. Some examples of the processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any appropriate processor, controller, microcontroller, etc. The processor 11 executes the various methods and processes described above, such as the point laser flatness test method.

[0109] In some embodiments, the point laser flatness test method may be implemented as a computer program, which is tangibly contained in a computer-readable storage medium, such as a storage unit 18. In some embodiments, part or all of the computer program may be loaded and / or installed on the electronic device 10 via the ROM 12 and / or the communication unit 19. When the computer program is loaded into the RAM 13 and executed by the processor 11, one or more steps of the method XXX described above may be performed. Alternatively, in other embodiments, the processor 11 may be configured to perform the point laser flatness test method in any other appropriate manner (e.g., by means of firmware).

[0110] Various implementations of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field programmable gate arrays (FPGAs), application specific integrated circuits (ASICs), application specific standard products (ASSPs), systems on chips (SOCs), load programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various implementations can include: being implemented in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which can be a special purpose or general purpose programmable processor that can receive data and instructions from a storage system, at least one input device, and at least one output device, and transmit data and instructions to the storage system, the at least one input device, and the at least one output device.

[0111] Computer programs for implementing the methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, so that when the computer program is executed by the processor, the functions / operations specified in the flow chart and / or block diagram are implemented. The computer program may be executed entirely on the machine, partially on the machine, partially on the machine and partially on a remote machine as a stand-alone software package, or entirely on a remote machine or server.

[0112] In the context of the present invention, a computer-readable storage medium may be a tangible medium that may contain or store a computer program for use by or in conjunction with an instruction execution system, device, or equipment. A computer-readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices, or equipment, or any suitable combination of the foregoing. Alternatively, a computer-readable storage medium may be a machine-readable signal medium. A more specific example of a machine-readable storage medium may include an electrical connection based on one or more lines, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0113] To provide interaction with a user, the systems and techniques described herein may be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and a pointing device (e.g., a mouse or trackball) through which the user can provide input to the electronic device. Other types of devices may also be used to provide interaction with the user; for example, the feedback provided to the user may be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user may be received in any form (including acoustic input, voice input, or tactile input).

[0114] The systems and techniques described herein may be implemented in a computing system that includes backend components (e.g., as a data server), or a computing system that includes middleware components (e.g., an application server), or a computing system that includes frontend components (e.g., a user computer with a graphical user interface or a web browser through which a user can interact with implementations of the systems and techniques described herein), or a computing system that includes any combination of such backend components, middleware components, or frontend components. The components of the system may be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: a local area network (LAN), a wide area network (WAN), a blockchain network, and the Internet.

[0115] A computing system may include a client and a server. The client and the server are generally remote from each other and usually interact through a communication network. The client and server relationship is generated by computer programs running on the corresponding computers and having a client-server relationship with each other. The server may be a cloud server, also known as a cloud computing server or cloud host, which is a host product in the cloud computing service system to solve the defects of difficult management and weak business scalability in traditional physical hosts and VPS services.

[0116] It should be understood that the various forms of processes shown above can be used to reorder, add or delete steps. For example, the steps described in the present invention can be executed in parallel, sequentially or in different orders, as long as the desired results of the technical solution of the present invention can be achieved, and this document does not limit this.

[0117] The above specific implementations do not constitute a limitation on the protection scope of the present invention. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modification, equivalent substitution and improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A point laser flatness testing method, characterized in that: include: Based on the point laser testing device, the three-dimensional coordinates of Q test points on the surface to be tested are obtained; wherein Q is a positive integer greater than or equal to 3; Determining a reference plane based on the three-dimensional coordinates of each of the test points; Projecting at least part of the test points onto the reference plane along the z-axis direction to obtain projection points corresponding to the part of the test points one by one; Calculate the height difference between the corresponding test point and the projection point to obtain a plurality of height difference values; Based on each of the height difference values, the flatness of the surface to be measured is determined.

2. The point laser flatness testing method according to claim 1, characterized in that: The point laser testing device comprises a motion platform and a point laser sensor; Based on the point laser test device, the three-dimensional coordinates of Q test points on the surface to be tested are obtained, including: Get the plane coordinates of the preset collection points; Based on the plane coordinates of the preset collection point, output a control signal to the motion platform so that the motion platform drives the point laser sensor to move to the preset collection point; When the point laser testing device moves to the preset collection point, the point laser sensor is controlled to detect the surface to be tested, and the height information of the surface to be tested at the preset collection point is obtained; Based on the plane coordinates of the preset acquisition point and the height information, obtaining the three-dimensional coordinates of the test point on the surface to be tested; According to the preset path, the plane coordinates of the preset collection points are adjusted, and the step of returning to the plane coordinates based on the preset collection points and outputting a control signal to the motion platform so that the motion platform drives the point laser sensor to move to the preset collection points is performed until the three-dimensional coordinates of Q test points are obtained.

3. The point laser flatness testing method according to claim 1, characterized in that: Determining a reference plane based on the three-dimensional coordinates of each of the test points includes: Based on the three-dimensional coordinates of each of the test points, a reference plane is determined using a three-point method.

4. The point laser flatness testing method according to claim 1, characterized in that: Projecting at least part of the test points onto the reference plane along the z-axis direction to obtain projection points corresponding to the part of the test points in a one-to-one manner, including: Determine M of the test points as a group, with a total of N groups of the test points; wherein M is a positive integer greater than or equal to 3, and N is a positive integer; the x coordinates or y coordinates of the three-dimensional coordinates of a group of the test points are equal, and at least two of the test points in a group of the test points are located on the reference plane; Determine, according to two test points in each group of test points located on the reference plane, a reference line corresponding to each group of test points; Along the z-axis direction, each of the test points in each group of the test points is projected onto the reference line corresponding to the group of the test points to obtain projection points corresponding one-to-one to each of the test points in each group of the test points.

5. The point laser flatness testing method according to claim 4, characterized in that: Projecting each of the test points in each group of the test points to the reference line corresponding to the group of the test points along the z-axis direction to obtain projection points corresponding to each of the test points in each group of the test points, including: Determine that the plane coordinates of the projection point are the same as the plane coordinates of the corresponding test point; The z coordinate of the projection point is determined according to the plane coordinates of the projection point and the corresponding reference line.

6. The point laser flatness testing method according to claim 1, characterized in that: Calculating the height difference between the corresponding test point and the projection point to obtain a plurality of the height difference values ​​includes: The difference between the z coordinate of the corresponding test point and the z coordinate of the projection point is calculated to obtain a plurality of height difference values.

7. The point laser flatness testing method according to claim 1, characterized in that: Determining the flatness of the surface to be measured based on each of the height differences includes: Obtain the maximum height difference Dmax and the minimum height difference Dmin of all the height difference values; When Dmax≥Dmin≥0, ​​the flatness of the surface to be measured is determined to be Dmax; when Dmax≤Dmin<0, the flatness of the surface to be measured is determined to be |Dmax|; when Dmax≥0>Dmin, the flatness of the surface to be measured is determined to be Dmax-Dmin.

8. A point laser flatness testing device, characterized in that: include: A test point acquisition module, used to acquire the three-dimensional coordinates of Q test points on the surface to be tested based on the point laser test device; wherein Q is a positive integer greater than or equal to 3; A reference plane determination module, used for determining a reference plane based on the three-dimensional coordinates of each of the test points; A projection module, used for projecting at least part of the test points onto the reference plane along the z-axis direction to obtain projection points corresponding to the part of the test points one by one; A calculation module, used for calculating the height difference between the corresponding test point and the projection point to obtain a plurality of height difference values; The flatness determination module is used to determine the flatness of the surface to be measured based on each of the height difference values.

9. An electronic device, characterized in that: The electronic device comprises: at least one processor; and a memory communicatively coupled to the at least one processor; The memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor so that the at least one processor can execute the point laser flatness testing method described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a processor to implement the point laser flatness testing method according to any one of claims 1 to 7 when executed.

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