Trigger type probe fault detection method and system

Abstract

The invention provides a trigger-type probe fault detection method and system, and relates to the technical field of fault detection, and the method comprises the steps: obtaining the information of a built-in sensor of a to-be-detected trigger-type probe, configuring a test circuit and a test scene, connecting the probe to the test circuit through an interface of the probe, executing the fastening verification of a connection structure, and when the verification is passed, carrying out the fault detection of the to-be-detected trigger-type probe. Controlling the test circuit according to the first test scene and the second test scene, receiving an output signal of the probe, generating a first test signal sequence and a second test signal sequence, performing fault analysis by combining the first test signal sequence and the second test signal sequence, and generating a fault detection result. The technical effects that the accuracy of fault detection is improved, early warning is carried out in advance, and faults are rapidly and accurately positioned are achieved.

Description

Technical Field

[0001] The present invention relates to the technical field of fault detection, and in particular to a trigger probe fault detection method and system. Background Art

[0002] In industrial applications, trigger probes are an important sensor device that is widely used in various precision detection and control systems. These probes can provide real-time data on the production line to ensure product quality and process accuracy. Trigger probes usually need to operate under extreme or changing environmental conditions, such as temperature fluctuations, mechanical vibrations, etc., all of which may affect the accuracy and stability of the probe. Therefore, it is crucial to ensure the reliability and accuracy of the probe. Traditional trigger probe fault detection methods mostly rely on regular maintenance inspections or troubleshooting after the fault occurs. These methods usually cannot detect potential faults in real time or in advance, resulting in downtime or inaccurate data during critical production periods. In addition, existing fault detection technologies have limitations in simulating probe performance detection in test environments, and cannot fully evaluate the stability and reliability of probes in actual applications.

[0003] In summary, existing trigger probe fault detection often has the technical problem of being unable to accurately identify and prevent faults in real time, resulting in low production efficiency. Summary of the invention

[0004] The present application provides a trigger probe fault detection method and system, which are used to solve the technical problem that the existing trigger probe fault detection has the inability to accurately identify and prevent faults in real time, resulting in low production efficiency.

[0005] In view of the above problems, the present application provides a trigger probe fault detection method and system.

[0006] In a first aspect, the present application provides a trigger probe fault detection method, the method comprising: Acquire sensor information built into the trigger probe to be detected; configure a test circuit and a test scenario based on the sensor information, wherein the test scenario includes a first test scenario and a second test scenario, the first test scenario is a signal stability scenario, and the second test scenario is a signal fluctuation scenario; connect the trigger probe to be detected to the test circuit through the interface of the trigger probe to be detected, and perform a tightness verification of the connection structure; when the tightness verification passes, control the test circuit according to the first test scenario and the second test scenario, receive the output signal of the trigger probe to be detected, and generate a first test signal sequence and a second test signal sequence; perform a fault analysis in combination with the first test signal sequence and the second test signal sequence to generate a fault detection result.

[0007] In a second aspect, the present application provides a trigger probe fault detection system, the system comprising: A sensor information acquisition module, used to acquire sensor information built into the trigger probe to be detected; a test configuration module, used to configure a test circuit and a test scenario based on the sensor information, wherein the test scenario includes a first test scenario and a second test scenario, the first test scenario is a signal stability scenario, and the second test scenario is a signal fluctuation scenario; a tightness verification execution module, used to connect the trigger probe to be detected to the test circuit through the interface of the trigger probe to be detected, and perform tightness verification of the connection structure; a signal sequence generation module, used to control the test circuit according to the first test scenario and the second test scenario when the tightness verification passes, and receive the output signal of the trigger probe to be detected to generate a first test signal sequence and a second test signal sequence; a fault analysis module, used to perform fault analysis in combination with the first test signal sequence and the second test signal sequence to generate a fault detection result.

[0008] One or more technical solutions provided in this application have at least the following technical effects or advantages: The present application provides a method for detecting faults of a trigger probe, which obtains sensor information built into the trigger probe to be detected; configures a test circuit and a test scenario based on the sensor information, wherein the test scenario includes a first test scenario and a second test scenario, the first test scenario being a signal stability scenario, and the second test scenario being a signal fluctuation scenario; connects the trigger probe to be detected to the test circuit through an interface of the trigger probe to be detected, and performs a tightness verification of the connection structure; when the tightness verification passes, controls the test circuit according to the first test scenario and the second test scenario, receives the output signal of the trigger probe to be detected, and generates a first test signal sequence and a second test signal sequence; performs a fault analysis in combination with the first test signal sequence and the second test signal sequence, and generates a fault detection result, thereby solving the technical problem that the existing trigger probe fault detection cannot accurately identify and prevent faults in real time, resulting in low production efficiency, ensures the reliability of the probe under different conditions through a dual test scenario of stability and change, and judges the functional state of the probe in combination with signal deviation analysis, thereby improving the accuracy of fault detection, achieving the technical effect of early warning, rapid and accurate fault location, and significantly improving production stability. BRIEF DESCRIPTION OF THE DRAWINGS

[0009] Figure 1 A schematic flow chart of a trigger probe fault detection method is provided for this application.

[0010] Figure 2A structural schematic diagram of a trigger probe fault detection system is provided for this application.

[0011] Explanation of reference numerals: sensor information acquisition module 11 , test configuration module 12 , tightness verification execution module 13 , signal sequence generation module 14 , fault analysis module 15 . DETAILED DESCRIPTION

[0012] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0013] Embodiment 1, as Figure 1 As shown, the present application provides a trigger probe fault detection method, the method comprising: Get the sensor information built into the trigger probe to be inspected.

[0014] A test circuit and a test scenario are configured based on the sensor information, wherein the test scenario includes a first test scenario and a second test scenario, the first test scenario is a signal stability scenario, and the second test scenario is a signal fluctuation scenario.

[0015] Specifically, the trigger probe, also known as the trigger probe or contact probe, is a precision measuring tool commonly used in industrial and scientific research fields, especially in coordinate measuring machines, CNC machine tools and other automated measuring equipment. Its main function is to trigger a signal when it contacts the surface of the object to be measured to accurately measure the size, shape and position of the object. The basic structure of a trigger probe usually includes a probe body, a trigger mechanism, a sensor, a signal processing unit and an interface. Among them, the probe body is the main part of the probe, usually made of metal or high-strength plastic, used to support other components; the trigger mechanism is the core component of the probe, including one or more movable contacts (needles) that can move and trigger measurement signals when they contact the object to be measured; the sensor is used to detect the movement of the contacts and convert the physical contact into electrical signals; the signal processing unit converts the sensor signal into a digital signal for computer analysis and processing; the interface connects the probe to the measuring machine to ensure the transmission of signals and the fixation of the probe. Due to its high precision and high efficiency, trigger probes are widely used in aerospace, automobile manufacturing, precision machinery and other industrial fields, and play a vital role in improving product quality and production efficiency.

[0016] In this embodiment, the sensor information built into the trigger probe to be detected is first obtained. The sensor is a key component of the probe and is used to detect and convert the change of contact force into an electrical signal. The sensor information generally includes the type of sensor, the measurement range, the sensitivity, the output signal type, etc., which are crucial for the subsequent test configuration. After the sensor information is obtained, the test circuit and the test scenario are configured based on this information. The configuration of the test circuit needs to ensure that it can adapt to the output signal type and electrical signal processing requirements of the sensor, and provide the necessary power supply and interface connection for the sensor. The setting of the test scenario includes two main parts, namely the first test scenario and the second test scenario. Among them, the first test scenario is a signal stability scenario, that is, in this scenario, the test environment and external conditions are maintained in a controlled and stable state, so as to evaluate the performance of the probe when there is no external disturbance. For example, parameters such as temperature, humidity and pressure can be set to remain constant, while the frequency and amplitude of the input signal are also fixed or the frequency of change is slow, so as to ensure the stability of the environment and the consistency of the signal. The second test scenario is a signal fluctuation scenario, which is intended to simulate various unstable factors that may be encountered in actual use. In this test scenario, certain parameters of the environment or signal are set to change continuously, and the signal to be detected changes dramatically and changes frequently. For example, temperature fluctuations, vibrations, or fluctuations in the amplitude and frequency of electrical signals can be simulated to test the sensitivity and responsiveness of the probe to environmental changes. Through the above two test scenarios, the performance and stability of the trigger probe can be comprehensively evaluated, so as to effectively perform fault analysis. This method not only improves the accuracy of fault detection, but also can better predict the performance of the probe in actual use by simulating situations that may be encountered in real applications.

[0017] The trigger probe to be detected is connected to the test circuit through the interface of the trigger probe to be detected, and the tightness verification of the connection structure is performed.

[0018] Optionally, the trigger probe to be tested is connected to the test circuit through its interface. During this connection process, the type of interface, such as D-SUB, USB or other industrial standard interfaces, must be fully matched with the corresponding port of the test circuit to ensure the integrity and accuracy of signal transmission. After the physical connection is completed, the tightness of the connection structure is verified, which is a necessary condition to ensure the stable operation of the probe during the test. Tightness verification can be carried out by combining image vision with machine learning, or performing vibration testing to evaluate the stability of the connection. For example, in the verification method using image vision combined with machine learning, a high-resolution camera can be used to capture an image of the interface connection state, and the trained machine learning model can be used to analyze potential defects or incomplete contacts in the image. This method can accurately identify tiny cracks, gaps or other factors that may affect the stability of the connection. On the other hand, if a vibration environment is involved, the vibration test monitors the physical performance of the interface when it is affected by vibration by simulating the vibration conditions during operation in a controlled environment. In this test, the vibration platform will operate at a set frequency and amplitude to simulate the vibration environment that may be encountered in actual use. During the test, the slight movement or looseness of the connection point can be monitored by an additional sensor to evaluate its reliability under actual working conditions. Through tightness verification, it can be ensured that the connection between the trigger probe and the test circuit is both firm and reliable, thereby ensuring the accuracy and efficiency of subsequent tests. This rigorous verification process is a key link in ensuring the reliability of the probe test results and is of great significance for preventing misdiagnosis and missed diagnosis of faults.

[0019] When the tightness verification passes, the test circuit is controlled according to the first test scenario and the second test scenario, and the output signal of the trigger probe to be tested is received to generate a first test signal sequence and a second test signal sequence.

[0020] Furthermore, the test circuit is controlled according to the first test scenario and the second test scenario, and if the output signal of the trigger probe to be detected cannot be received, a probe internal circuit fault warning signal is issued.

[0021] Fault analysis is performed in combination with the first test signal sequence and the second test signal sequence to generate a fault detection result.

[0022] Specifically, after the tightness verification is passed, the test circuit is controlled to execute according to the designed first test scenario and second test scenario, while monitoring and recording the output signal of the trigger probe. This process involves precisely controlling the circuit behavior to simulate the performance of the probe in different operating environments to ensure that its performance and stability can be fully evaluated. First, the test circuit adjusts the circuit settings to maintain the stable output of the test signal according to the settings of the first test scenario, that is, the signal stability scenario. This scenario is designed to verify the responsiveness and accuracy of the probe under stable conditions. For example, a standard working state of the probe can be simulated in the absence of external interference by setting an electrical signal with a fixed frequency and amplitude, thereby generating a first test signal sequence. Subsequently, the test circuit switches to the second test scenario, that is, the signal fluctuation scenario, and simulates the impact of environmental changes on the probe by changing the frequency, amplitude or other parameters of the signal. This scenario is used to test the stability and reliability of the probe when encountering external disturbances such as mechanical vibration, temperature fluctuations, etc., thereby generating a second test signal sequence. During the test, if the test circuit cannot receive the output signal of the trigger probe to be tested, the system will automatically diagnose it as a possible internal circuit fault and issue a fault warning signal in time. This mechanism ensures that the problem can be identified and handled before it develops into a more serious fault. Finally, the system will comprehensively analyze the first test signal sequence and the second test signal sequence, and evaluate the consistency and deviation of the signal by comparing the output signals under these two different conditions, so as to perform fault analysis. During the analysis process, algorithms may be used to perform in-depth mathematical processing on the signal sequence, such as calculating deviations, stability indicators, etc., to accurately determine the performance status of the probe and the specific problems that exist. The generated fault detection results will provide guidance for maintenance work to ensure that the probe can operate in the best condition. Through the above steps, not only can faults be effectively discovered and diagnosed, but also the reliability and accuracy of the probe in actual applications can be greatly improved by simulating a variety of work scenarios.

[0023] Further, configuring a test circuit and a test scenario based on the sensor information includes: A predetermined detection signal type is read based on the sensor information, wherein the predetermined detection signal type includes one or more detection signal types.

[0024] The test circuit is configured based on the predetermined detection signal type, wherein the test circuit includes a circuit control terminal, and the circuit control terminal is used to adjust a signal state of the predetermined detection signal type.

[0025] Acquire detection accuracy information of the trigger probe to be detected.

[0026] The first test scenario and the second test scenario are configured based on the detection accuracy information.

[0027] Exemplarily, sensor information is read from the trigger probe to be tested, including but not limited to sensor type, output signal characteristics, etc., and this information is the basis for subsequent test configuration.

[0028] Next, the test circuit is configured according to the predetermined detection signal type provided by the sensor. The predetermined detection signal type includes an analog signal, a digital signal, or a composite signal of a specific frequency and amplitude. These signal types directly affect the complexity and function of the circuit design. The test circuit includes a circuit control terminal, which has the function of adjusting the signal state, and can enhance or weaken the signal as needed, or adjust the parameters such as the frequency and waveform of the signal. For example, if the sensor information indicates that the probe outputs a low-amplitude analog signal, the circuit control terminal will be configured to amplify such a signal and convert it into a format suitable for analysis. In addition, the system also needs to obtain the detection accuracy information of the trigger probe, which can evaluate the performance of the probe in fine measurement. The detection accuracy information includes indicators such as the resolution, error range, and response time of the probe. Based on this accuracy information, the first test scenario and the second test scenario are further configured. The first test scenario is a signal stability scenario, which is intended to test the performance of the probe under an ideal interference-free state. In this scenario configuration, the test circuit will provide a constant signal source that matches the probe accuracy to verify whether the probe can maintain the consistency and accuracy of the output under continuous and stable input. For example, if the error range of the probe is ±0.01%, the signal source will be designed to provide a measurement signal within this accuracy range. The second test scenario is the signal fluctuation scenario, which is used to simulate the changing conditions that may be encountered in actual applications. In this scenario, the circuit control terminal will adjust the signal according to a predetermined change pattern, such as periodic fluctuations or random amplitude changes, to test the adaptability and accuracy of the probe to dynamic changes. This scenario design helps determine the reliability and performance stability of the probe under actual working conditions. Through the above steps, the configuration of the test circuit and scenario is not only optimized based on the technical characteristics and performance requirements of the probe, but also can fully simulate the various conditions that the probe may encounter in actual applications, ensuring the comprehensiveness and effectiveness of fault detection.

[0029] Further, configuring the first test scenario and the second test scenario based on the detection accuracy information includes: A signal test range corresponding to the predetermined detection signal type is determined based on the detection accuracy information.

[0030] A plurality of groups of fixed signal features are configured in the signal test range to generate the first test scenario.

[0031] In the signal test range, a plurality of groups of continuously changing signal features are randomly configured according to a predetermined changing frequency to generate the second test scenario.

[0032] Furthermore, the configuration of the test scenario is based on the detection accuracy information of the probe, which provides precise guidance for the design of the test signal. The detection accuracy information generally includes indicators such as the minimum change that the probe can identify, the maximum tolerance error, and the speed of the signal response. This information is crucial to ensure that the test scenario can effectively evaluate the performance of the probe. First, the signal test range corresponding to the predetermined detection signal type applicable to the probe to be detected is determined based on the acquired detection accuracy information. The signal test range refers to the minimum and maximum thresholds of the signal that the probe can accurately process. For example, if the detection accuracy of the probe is ±0.1%, the signal test range will be set to a signal strength that can cover this accuracy requirement to ensure that all test signals are within the effective working range of the probe. Then, the first test scenario is configured based on this signal test range. In the first test scenario, multiple groups of fixed signal features are set, each group of signal features is fixed at a specific value or mode without any change. This setting is intended to simulate a stable measurement environment to test the stability and repeatability of the probe when there is no external interference. For example, a set of periodic signals with fixed frequency and amplitude can be set to observe whether the probe responds to these unchanging signals consistently. Furthermore, for the second test scenario, within the same signal test range, multiple groups of continuously changing signal features are randomly configured according to a predetermined change frequency. These signal features include not only frequency changes, but may also involve random changes in other parameters such as amplitude and waveform to simulate various complex and unstable test conditions that the probe may encounter in the real world. For example, a signal sequence can be designed in which the amplitude of the signal fluctuates rapidly according to a randomly generated pattern to test the responsiveness and accuracy of the probe in a rapidly changing environment. Through such a refined test scenario configuration, not only can the performance of the trigger probe under ideal and challenging conditions be comprehensively evaluated, but it can also help identify the problems and limitations that the probe may face in actual applications, thereby effectively guiding the further optimization and application of the probe. This method ensures the efficiency and practicality of probe fault detection and enhances the reliability and application value of the test results.

[0033] Further, performing fault analysis in combination with the first test signal sequence and the second test signal sequence to generate a fault detection result includes: Analyze the signal deviation between the first test signal sequence and the first test scenario to generate a first fault analysis result.

[0034] Analyze the signal deviation between the second test signal sequence and the second test scenario to generate a second fault analysis result.

[0035] The fault detection result is generated by combining the first fault analysis result and the second fault analysis result.

[0036] Optionally, the first fault analysis result is generated, and this step focuses on the deviation stability analysis. In the first test scenario, the probe receives a fixed signal feature, so the analysis purpose of this scenario is to detect whether the deviation between the output signal of the probe and the input signal remains stable. The specific operation includes calculating the deviation of each point between the output signal and the preset signal, and then analyzing the statistical distribution of these deviations, such as the mean value, standard deviation, etc. For example, if a probe shows a very small signal deviation or little change under continuous stable input, then it can be considered that the probe works normally under stable conditions; if the deviation is large or the volatility is high, it may indicate that the probe is faulty or the performance is degraded. Next, the second test signal sequence is analyzed to generate the second fault analysis result, which focuses on the sensitivity of the probe. In the second test scenario, the input signal features are constantly changing, and the analysis goal is to evaluate the ability of the probe to respond to these changes. The sensitivity of the probe to signal changes can be determined by comparing the corresponding relationship between the output of the probe and the rapidly changing input signal, such as the response time, the ratio of the output amplitude to the input amplitude, etc. If the probe can accurately and quickly follow the changes in the input signal, it means that its sensitivity is good; otherwise, it may indicate insufficient sensitivity or delayed response. Finally, the first and second fault analysis results are combined to generate a comprehensive fault detection result. This result does not involve the identification of a specific fault type, but a comprehensive assessment of whether the probe has a fault or an abnormality. By comparing the analysis results in the two scenarios, if both show that the probe performs normally, the probe is judged to be fault-free; if any result shows an abnormality, such as unstable deviation or low sensitivity, the probe is judged to be likely to have a fault. Through the above analysis process, important information about the operating status of the trigger probe can be provided, helping the maintenance team to promptly discover and solve problems, thereby ensuring the stable operation and measurement accuracy of the probe.

[0037] Further, analyzing the signal deviation between the first test signal sequence and the first test scenario to generate a first fault analysis result includes: The first test signal sequence is compared with the signal deviation of the first test scenario to generate a first signal deviation sequence.

[0038] A stability analysis is performed on a plurality of deviation data in the first signal deviation sequence to generate a deviation stability index.

[0039] It is determined whether the deviation stability index is within a preset stability interval and whether the plurality of deviation data are within a preset deviation range, and a first abnormality mark is generated according to the determination result to indicate whether the test is abnormal.

[0040] The first fault analysis result is generated using the first abnormality identifier.

[0041] Exemplarily, the generation of the first fault analysis result is completed through detailed data processing and analysis steps, aiming to evaluate the performance of the probe under a stable test environment. This process starts with a detailed comparison of the first test signal sequence and the signal deviation in the first test scenario to ensure the accuracy and systematicness of the analysis. First, the first test signal sequence is collected from the first test scenario, which records the output signal of the probe under stable conditions. These output signals are compared with the preset ideal signal (i.e., the signal of the first test scenario) to generate a first signal deviation sequence. The signal deviation sequence consists of the difference between the actual output signal and the ideal signal of each measuring point, and these differences intuitively represent the accuracy and consistency of the probe output. Next, a stability analysis is performed on multiple deviation data in the first signal deviation sequence. This analysis involves calculating statistical indicators of the deviation sequence, such as the mean deviation, standard deviation, etc., which are used to generate deviation stability indicators. These indicators help evaluate the degree of fluctuation of the probe output signal and the regularity of deviation from the preset signal, and are key factors in judging the stability of the probe performance.

[0042] Subsequently, further evaluation is performed based on the deviation stability index and deviation data. This step includes determining whether the deviation stability index is within the preset stability interval and checking whether all deviation data remain within the allowable deviation range. The preset stability interval and deviation range are defined in advance according to the design parameters and application requirements of the probe to ensure the reliability and accuracy of the probe in actual applications. Finally, the first abnormality mark is generated based on the above analysis and judgment results. If the deviation stability index and the deviation data meet the preset conditions, the first abnormality mark indicates that no abnormality is found in the test, that is, the probe performs normally. On the contrary, if any parameter exceeds the preset range, the first abnormality mark will mark the test result as abnormal, indicating a possible probe failure or performance degradation. The first fault analysis result provides the maintenance team with important information about the operating status of the probe in a stable environment, helps identify and prevent potential failures, and ensures the high performance and long-term stable operation of the probe. The implementation of this method helps to improve production efficiency and product quality.

[0043] Further, analyzing the signal deviation between the second test signal sequence and the second test scenario to generate a second fault analysis result includes: The second test signal sequence is time-aligned with the control signal of the second test scenario to generate a dual-column timing alignment signal.

[0044] The dual-column timing alignment signal is analyzed to establish a probe detection delay sequence.

[0045] The variation analysis of the probe detection delay sequence is analyzed to generate a detection delay fluctuation stability index under continuous signal fluctuation.

[0046] It is determined whether the detection delay fluctuation stability index is within a preset range, and a second abnormality mark is generated.

[0047] The second fault analysis result is generated using the second abnormality identifier.

[0048] Specifically, the second fault analysis results are specifically used to evaluate the responsiveness and sensitivity of the probe in a dynamic test environment. This process involves detailed signal processing and timing analysis to ensure that the performance of the probe can be accurately evaluated when facing rapidly changing signals. First, the second test signal sequence is time-aligned with the control signal in the second test scenario. The purpose of timing alignment is to ensure that the response data collected from the probe strictly corresponds to the input control signal, so that the response time and accuracy of the probe can be accurately evaluated. For example, if the control signal sets the temperature to 15 degrees Celsius at the first time point and quickly jumps to 30 degrees Celsius at the second time point, the data after timing alignment will clearly show the reaction time and behavior of the probe to this change. Next, a probe detection delay sequence is established based on the time-aligned signal. This sequence records the reaction time of the probe at each control signal change point, that is, the time difference between the control signal being sent and the actual reaction of the probe. As in the above-mentioned temperature change example, if the probe delays for a few seconds after the temperature jumps to 30 degrees Celsius before starting to react, this delay time will be recorded in the detection delay sequence. Subsequently, the detection delay sequence is analyzed for changes, and the detection delay fluctuation stability index under continuous signal fluctuation is generated. This index reflects the stability and predictability of the delay response of the probe in continuous dynamic testing. By calculating the mean value, standard deviation and other statistical parameters of the delay time, the performance stability of the probe in the face of rapid and continuous changes can be evaluated. Finally, it is determined whether the detection delay fluctuation stability index is within the preset stability range. If the delay fluctuation stability index shows that the delay time is relatively consistent and meets the expected stability requirements, the second abnormality mark will be marked as no abnormality, indicating that the probe performs well in a dynamic environment; on the contrary, if the delay fluctuation is large or exceeds the preset range, the second abnormality mark will be marked as abnormal, indicating possible performance problems or faults. Through the above steps, the second fault analysis results provide the maintenance team with important information about the performance of the probe in a dynamic test environment, which helps to evaluate and optimize the response speed and stability of the probe, and ensure its reliability and efficiency in practical applications. This method is of great significance for ensuring the long-term stable operation of the probe and reducing downtime.

[0049] Through the technical solutions of the above-mentioned embodiments, a trigger probe fault detection method provided by the present application solves the technical problem that the existing trigger probe fault detection cannot accurately identify and prevent faults in real time, resulting in low production efficiency. The reliability of the probe under different conditions is ensured through dual test scenarios of stability and change, and the functional status of the probe is judged in combination with signal deviation analysis, thereby improving the accuracy of fault detection, achieving the technical effect of early warning, rapid and accurate fault positioning, and significantly improving production stability.

[0050] Embodiment 2, based on the same inventive concept as the trigger probe fault detection method in the above embodiment, Figure 2 As shown, the present application provides a trigger probe fault detection system, the system comprising: The sensor information acquisition module 11 is used to acquire the sensor information built into the trigger probe to be detected.

[0051] The test configuration module 12 is used to configure a test circuit and a test scenario based on the sensor information, wherein the test scenario includes a first test scenario and a second test scenario, the first test scenario is a signal stability scenario, and the second test scenario is a signal fluctuation scenario.

[0052] The tightness verification execution module 13 is used to connect the trigger probe to be detected to the test circuit through the interface of the trigger probe to be detected, and execute the tightness verification of the connection structure.

[0053] The signal sequence generating module 14 is used to control the test circuit according to the first test scenario and the second test scenario when the tightness verification passes, and receive the output signal of the trigger probe to be detected to generate a first test signal sequence and a second test signal sequence.

[0054] The fault analysis module 15 is used to perform fault analysis in combination with the first test signal sequence and the second test signal sequence to generate a fault detection result.

[0055] Furthermore, the test configuration module 12 is also used to perform the following steps: A predetermined detection signal type is read based on the sensor information, wherein the predetermined detection signal type includes one or more detection signal types.

[0056] The test circuit is configured based on the predetermined detection signal type, wherein the test circuit includes a circuit control terminal, and the circuit control terminal is used to adjust a signal state of the predetermined detection signal type.

[0057] Acquire detection accuracy information of the trigger probe to be detected.

[0058] The first test scenario and the second test scenario are configured based on the detection accuracy information.

[0059] Furthermore, the test configuration module 12 is also used to perform the following steps: A signal test range corresponding to the predetermined detection signal type is determined based on the detection accuracy information.

[0060] A plurality of groups of fixed signal features are configured in the signal test range to generate the first test scenario.

[0061] In the signal test range, a plurality of groups of continuously changing signal features are randomly configured according to a predetermined changing frequency to generate the second test scenario.

[0062] Furthermore, the fault analysis module 15 is further configured to perform the following steps: Analyze the signal deviation between the first test signal sequence and the first test scenario to generate a first fault analysis result.

[0063] Analyze the signal deviation between the second test signal sequence and the second test scenario to generate a second fault analysis result.

[0064] The fault detection result is generated by combining the first fault analysis result and the second fault analysis result.

[0065] Furthermore, the fault analysis module 15 is further configured to perform the following steps: The first test signal sequence is compared with the signal deviation of the first test scenario to generate a first signal deviation sequence.

[0066] A stability analysis is performed on a plurality of deviation data in the first signal deviation sequence to generate a deviation stability index.

[0067] It is determined whether the deviation stability index is within a preset stability interval and whether the plurality of deviation data are within a preset deviation range, and a first abnormality mark is generated according to the determination result to indicate whether the test is abnormal.

[0068] The first fault analysis result is generated using the first abnormality identifier.

[0069] Furthermore, the fault analysis module 15 is further configured to perform the following steps: The second test signal sequence is time-aligned with the control signal of the second test scenario to generate a dual-column timing alignment signal.

[0070] The dual-column timing alignment signal is analyzed to establish a probe detection delay sequence.

[0071] The variation analysis of the probe detection delay sequence is analyzed to generate a detection delay fluctuation stability index under continuous signal fluctuation.

[0072] It is determined whether the detection delay fluctuation stability index is within a preset range, and a second abnormality mark is generated.

[0073] The second fault analysis result is generated using the second abnormality identifier.

[0074] Furthermore, the signal sequence generating module 14 is further configured to perform the following steps: The test circuit is controlled according to the first test scenario and the second test scenario, and if the output signal of the trigger probe to be detected cannot be received, a probe internal circuit fault warning signal is issued.

[0075] Through the above-mentioned detailed description of a trigger probe fault detection method in this specification, those skilled in the art can clearly understand a trigger probe fault detection system in this embodiment. For the system disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and the relevant parts can be referred to the method part description.

[0076] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present application. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application will not be limited to the embodiments shown herein, but will conform to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A trigger probe fault detection method, characterized in that: include: Obtain the sensor information built into the trigger probe to be detected; Configure a test circuit and a test scenario based on the sensor information, wherein the test scenario includes a first test scenario and a second test scenario, the first test scenario is a signal stability scenario, and the second test scenario is a signal fluctuation scenario; Connecting the trigger probe to be tested to the test circuit via the interface of the trigger probe to be tested, and performing tightness verification of the connection structure; When the tightness verification passes, the test circuit is controlled according to the first test scenario and the second test scenario, and an output signal of the trigger probe to be tested is received to generate a first test signal sequence and a second test signal sequence; Fault analysis is performed in combination with the first test signal sequence and the second test signal sequence to generate a fault detection result.

2. A trigger probe fault detection method as claimed in claim 1, characterized in that: Configuring a test circuit and a test scenario based on the sensor information includes: reading a predetermined detection signal type based on the sensor information, wherein the predetermined detection signal type includes one or more detection signal types; configuring the test circuit based on the predetermined detection signal type, wherein the test circuit includes a circuit control terminal, the circuit control terminal being used to adjust a signal state of the predetermined detection signal type; Acquiring detection accuracy information of the trigger probe to be detected; The first test scenario and the second test scenario are configured based on the detection accuracy information.

3. A trigger probe fault detection method as claimed in claim 2, characterized in that: Configuring the first test scenario and the second test scenario based on the detection accuracy information includes: Determining a signal test range corresponding to the predetermined detection signal type based on the detection accuracy information; Configuring multiple groups of fixed signal features in the signal test range to generate the first test scenario; In the signal test range, a plurality of groups of continuously changing signal features are randomly configured according to a predetermined changing frequency to generate the second test scenario.

4. A trigger probe fault detection method as claimed in claim 1, characterized in that: Performing fault analysis in combination with the first test signal sequence and the second test signal sequence to generate a fault detection result includes: Analyzing a signal deviation between the first test signal sequence and the first test scenario to generate a first fault analysis result; analyzing a signal deviation between the second test signal sequence and the second test scenario to generate a second fault analysis result; The fault detection result is generated by combining the first fault analysis result and the second fault analysis result.

5. A trigger probe fault detection method as claimed in claim 4, characterized in that: Analyzing the signal deviation between the first test signal sequence and the first test scenario to generate a first fault analysis result includes: comparing the first test signal sequence with the signal deviation of the first test scenario to generate a first signal deviation sequence; Performing stability analysis on a plurality of deviation data in the first signal deviation sequence to generate a deviation stability index; Determine whether the deviation stability index is within a preset stability interval, and whether the plurality of deviation data are within a preset deviation range, and generate a first abnormality mark to indicate whether the test is abnormal according to the determination result; The first fault analysis result is generated using the first abnormality identifier.

6. A trigger probe fault detection method as claimed in claim 4, characterized in that: Analyzing the signal deviation between the second test signal sequence and the second test scenario to generate a second fault analysis result, including: Performing timing alignment on the second test signal sequence and the control signal of the second test scenario to generate a dual-column timing alignment signal; Analyzing the dual-column timing alignment signal to establish a probe detection delay sequence; Analyze the change of the probe detection delay sequence to generate a detection delay fluctuation stability index under continuous signal fluctuation; Determining whether the detection delay fluctuation stability index is within a preset range, and generating a second abnormality mark; The second fault analysis result is generated using the second abnormality identifier.

7. A trigger probe fault detection method as claimed in claim 1, characterized in that: The test circuit is controlled according to the first test scenario and the second test scenario, and if the output signal of the trigger probe to be detected cannot be received, a probe internal circuit fault warning signal is issued.

8. A trigger probe fault detection system, characterized in that: A method for detecting faults of a trigger probe according to any one of claims 1 to 7, the system comprising: A sensor information acquisition module is used to acquire the sensor information built into the trigger probe to be detected; A test configuration module, configured to configure a test circuit and a test scenario based on the sensor information, wherein the test scenario includes a first test scenario and a second test scenario, the first test scenario is a signal stability scenario, and the second test scenario is a signal fluctuation scenario; A tightness verification execution module, used to connect the trigger probe to be detected to the test circuit through the interface of the trigger probe to be detected, and perform tightness verification of the connection structure; a signal sequence generating module, configured to, when the tightness verification passes, control the test circuit according to the first test scenario and the second test scenario, and receive the output signal of the trigger probe to be tested to generate a first test signal sequence and a second test signal sequence; A fault analysis module is used to perform fault analysis in combination with the first test signal sequence and the second test signal sequence to generate a fault detection result.

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