Abnormality detection device, abnormality detection method, and abnormality detection system

Abstract

The invention provides anomaly detection equipment, an anomaly detection method and an anomaly detection system. The anomaly detection equipment comprises a circuit board, a universal serial bus (USB) interface expander and a conversion chip, wherein the USB interface expander and the conversion chip are both arranged on the circuit board, and the anomaly detection device is connected with an external terminal through a USB interface; the USB interface expander is used for expanding the number of external terminal USB interfaces from one to multiple; and the conversion chip is used for converting the expanded USB interface protocols into a target protocol, and the target protocol is a protocol for communicating with the to-be-tested equipment. Batch abnormal testing of to-be-tested equipment can be realized, and the testing efficiency is improved.

Description

Technical Field

[0001] The present application relates to the field of testing technology, and in particular to an anomaly detection device, an anomaly detection method and an anomaly detection system. Background Art

[0002] As the number of layers of 3D NAND (NAND memory) increases, the capacity of a single die (minimum independent unit) of NAND is also gradually increasing, and has now reached a capacity of 1Tb per die. Therefore, low-capacity hard drives are facing elimination due to rising manufacturing costs. However, some manufacturers still have a certain demand for low-capacity hard drives, so manufacturers have launched a product with a lower cost that can replace low-capacity hard drives. However, when facing performance anomaly detection of large-scale products, how to achieve efficient anomaly detection of mass-produced products has become an urgent problem to be solved. Summary of the invention

[0003] The present application provides an anomaly detection device, an anomaly detection method and an anomaly detection system to at least solve the above technical problems existing in the prior art.

[0004] According to a first aspect of the present application, an abnormality detection device is provided, the abnormality detection device comprising: a circuit board, a universal serial bus (USB) interface expander, and a conversion chip; wherein the USB interface expander and the conversion chip are both arranged on the circuit board, and the abnormality detection device is connected to an external terminal via a USB interface;

[0005] The USB interface expander is used to expand the number of USB interfaces of the external terminal from one to multiple;

[0006] The conversion chip is used to convert the expanded multiple USB interface protocols into a target protocol, where the target protocol is a protocol for communicating with the device to be tested.

[0007] In one possible implementation, the USB interface expander includes a primary USB interface expander, a secondary USB interface expander, and a tertiary USB interface expander;

[0008] The first-level USB interface expander is used to expand the number of external terminal USB interfaces from one to M;

[0009] The secondary USB interface expander is used to expand the number of M external terminal USB interfaces to N;

[0010] The three-level USB interface expander is used to expand the number of N external terminal USB interfaces to K; wherein M, N, and K are all integers greater than 1, K is greater than N, and N is greater than M.

[0011] In one possible implementation, the device to be tested is a universal flash storage UFS device, and the target protocol is the UFS protocol.

[0012] In one possible implementation, it further includes:

[0013] The connection slot is used to connect the device to be tested so as to perform anomaly detection on the device to be tested based on the target protocol.

[0014] In one possible implementation manner, the number of the conversion chips is the same as the number of the expanded USB interfaces.

[0015] According to a second aspect of the present application, there is provided an anomaly detection method, which is applied to the aforementioned anomaly detection device, and the method comprises:

[0016] When the anomaly detection device is connected to the device to be tested,

[0017] Receiving a test instruction for a device to be tested through a USB interface; the number of the device to be tested is multiple;

[0018] Based on the conversion chip and the test instructions, the target performance of each device to be tested is tested to obtain an abnormality detection result for each device to be tested, and the abnormality detection result is used to characterize whether the performance of each device to be tested is abnormal.

[0019] In one possible implementation manner, the number of the target performance is at least one; the target performance of each device to be tested is tested based on the conversion chip and the test instruction to obtain an abnormality detection result for each device to be tested, including:

[0020] For any device under test among the devices under test,

[0021] The USB interface protocol of the test instruction is converted into a target protocol by a conversion chip, and each target performance of the device to be tested is tested to obtain a test result of each target performance of the device to be tested;

[0022] Based on the test results of the device to be tested for each target performance, an abnormality detection result for the device to be tested is obtained.

[0023] In one possible implementation manner, obtaining an abnormality detection result for the device to be tested based on the test result of each target performance of the device to be tested includes:

[0024] When the test results of the device to be tested for each target performance all indicate that the test has passed, a test result indicating that the performance of the device to be tested is normal is obtained;

[0025] When at least one test result among the test results of the device to be tested for each target performance indicates that the test has failed, a detection result indicating that the performance of the device to be tested is abnormal is obtained.

[0026] In one possible implementation manner, the target performance includes at least one or more of the following: parameter interaction performance, instruction sending and receiving performance, state response performance, and signal transmission performance.

[0027] According to a third aspect of the present application, there is provided an anomaly detection system, which includes the aforementioned anomaly detection device and an external terminal, wherein the external terminal includes a USB interface, and the anomaly detection device is connected to the external terminal via the USB interface.

[0028] The abnormality detection device of the present application includes: a circuit board, a universal serial bus USB interface expander and a conversion chip; wherein the USB interface expander and the conversion chip are both arranged on the circuit board, and the abnormality detection device is connected to an external terminal via a USB interface; the USB interface expander is used to expand the number of USB interfaces of the external terminal from one to multiple; the conversion chip is used to convert the expanded multiple USB interface protocols into a target protocol, and the target protocol is a protocol for communicating with the device to be tested. It can realize batch abnormality testing of the device to be tested and improve the test efficiency.

[0029] It should be understood that the content described in this section is not intended to identify the key or important features of the embodiments of the present application, nor is it intended to limit the scope of the present application. Other features of the present application will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] By reading the detailed description below with reference to the accompanying drawings, the above and other purposes, features and advantages of the exemplary embodiments of the present application will become easily understood. In the accompanying drawings, several embodiments of the present application are shown in an exemplary and non-limiting manner, wherein:

[0031] In the drawings, the same or corresponding reference numerals represent the same or corresponding parts.

[0032] Figure 1 The overall structural diagram of the abnormality detection device according to the embodiment of the present application is shown;

[0033] Figure 2 A schematic diagram showing the specific structure of an abnormality detection device according to an embodiment of the present application is shown;

[0034] Figure 3 A schematic diagram of the implementation process of the abnormality detection method according to the embodiment of the present application is shown;

[0035] Figure 4A schematic diagram of the structure of an abnormality detection system according to an embodiment of the present application is shown. DETAILED DESCRIPTION

[0036] In order to make the purpose, features, and advantages of the present application more obvious and easy to understand, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present application.

[0037] The embodiment of the present application provides an abnormality detection device, an abnormality detection method and an abnormality detection system, wherein the abnormality detection device comprises: a circuit board, a universal serial bus USB interface expander and a conversion chip; wherein the USB interface expander and the conversion chip are both arranged on the circuit board, and the abnormality detection device is connected to an external terminal via a USB interface; the USB interface expander is used to expand the number of USB interfaces of the external terminal from one to multiple; the conversion chip is used to convert the expanded multiple USB interface protocols into a target protocol, wherein the target protocol is a protocol for communicating with the device to be tested. It is possible to implement batch abnormality testing of the device to be tested and improve the test efficiency.

[0038] The present application provides an abnormality detection device. Figure 1 The figure is a schematic diagram of the overall structure of an abnormality detection device, which includes: a circuit board, a universal serial bus (USB) interface expander, and a conversion chip; wherein the USB interface expander and the conversion chip are both arranged on the circuit board, and the abnormality detection device is connected to an external terminal via a USB interface;

[0039] The USB interface expander is used to expand the number of USB interfaces of the external terminal from one to multiple;

[0040] The conversion chip is used to convert the expanded multiple USB interface protocols into a target protocol, where the target protocol is a protocol for communicating with the device to be tested.

[0041] It is understandable that when the factory usually detects abnormality on the product, the product to be detected will be inserted into the test terminal, and the product to be detected will be tested by the test terminal through the built-in software test program. But usually the test terminal has only one interface, and can only test one product at a time, which is inefficient. In the embodiment of the present application, the abnormal detection device includes a USB (Universal Serial Bus) interface expander and a conversion chip arranged on the circuit board. Wherein, in the case where the abnormal detection device is connected to the external terminal via a USB interface, the USB interface expander is used to expand the number of the external terminal USB interface from one to multiple, so as to facilitate testing of multiple products to be tested at the same time. In addition, considering that the interface protocol of the product to be tested (device to be tested) may not be a USB protocol, in order to be able to test the product to be tested, the abnormal detection device of the embodiment of the present application also includes a conversion chip, which is used to convert the multiple USB interface protocols obtained after the expansion into a target protocol (i.e., the protocol supported by the product to be tested), so as to ensure that it can communicate with the device to be tested.

[0042] The abnormality detection device of the present application includes: a circuit board, a universal serial bus USB interface expander and a conversion chip; wherein the USB interface expander and the conversion chip are both arranged on the circuit board, and the abnormality detection device is connected to an external terminal via a USB interface; the USB interface expander is used to expand the number of USB interfaces of the external terminal from one to multiple; the conversion chip is used to convert the expanded multiple USB interface protocols into a target protocol, and the target protocol is a protocol for communicating with the device to be tested. It can realize batch abnormality testing of the device to be tested and improve the test efficiency.

[0043] In an optional solution, the USB interface expander includes a primary USB interface expander, a secondary USB interface expander and a tertiary USB interface expander;

[0044] The first-level USB interface expander is used to expand the number of external terminal USB interfaces from one to M;

[0045] The secondary USB interface expander is used to expand the number of M external terminal USB interfaces to N;

[0046] The three-level USB interface expander is used to expand the number of N external terminal USB interfaces to K; wherein M, N, and K are all integers greater than 1, K is greater than N, and N is greater than M.

[0047] refer to Figure 2As shown, the USB interface expander in the embodiment of the present application is a three-level topology structure, which is a primary USB interface expander, a secondary USB interface expander and a tertiary USB interface expander. Specifically, the USB interface expander in the embodiment of the present application is a USB Hub (Universal Serial Bus Hub). Figure 2 As shown, one USB interface expander can expand 4 USB interfaces, and the first-level USB interface expander is connected to the external terminal through the USB interface, and the number of USB interfaces of the external terminal is expanded from one to four. The four USB interfaces are respectively connected to a second-level USB interface expander, and the number of USB interfaces is expanded to 16. The 16 USB interfaces are respectively connected to a third-level USB interface expander, and the number of USB interfaces is expanded to 64. That is, after the expansion of the first-level USB interface expander, the second-level USB interface expander and the third-level USB interface expander, the number of USB interfaces of the external terminal is expanded from one to multiple, which provides a basis for realizing batch testing of products to be tested.

[0048] In an optional solution, the device to be tested is a universal flash storage UFS device, and the target protocol is the UFS protocol.

[0049] In the embodiment of the present application, the device to be tested is a UFS (Universal Flash Storage) device. Compared with the traditional low-capacity hard disk, the manufacturing cost of UFS is lower, and it can achieve the same storage performance as the low-capacity hard disk. Therefore, UFS can be provided to the factory as a substitute for low-capacity hard disks. When the UFS device is detected for abnormality, the communication protocol of the UFS device is the UFS protocol. In order to smoothly detect the UFS, it is necessary to convert the aforementioned expanded multiple USB interface protocols into the target protocol, namely the UFS protocol, so as to ensure the abnormal detection of the UFS device.

[0050] In an optional solution, it also includes:

[0051] The connection slot is used to connect the device to be tested so as to perform anomaly detection on the device to be tested based on the target protocol.

[0052] In the embodiment of the present application, the anomaly detection device also includes a connection slot, and the device to be tested can establish a connection with the anomaly detection device through the connection slot, and perform anomaly detection on the device to be tested based on the aforementioned target protocol, which is simple and easy to implement.

[0053] In an optional solution, the number of the conversion chips is the same as the number of the expanded USB interfaces.

[0054] In the present application examples, reference Figure 2As shown, in 4 groups of three-level USB interface expanders (4 in a group), each three-level USB interface expander in each group will be expanded into 4 USB interfaces, and each group of three-level USB interface expanders will be expanded into 16 USB interfaces, and each corresponding USB interface has a conversion chip to convert its USB interface protocol into a target protocol. That is, the number of conversion chips is the same as the number of USB interfaces after expansion. Each USB interface can be connected to different devices to be tested for testing.

[0055] The present application also provides an abnormality detection method, characterized in that the method is applied to the aforementioned abnormality detection device, such as Figure 3 As shown, the method includes:

[0056] S301: When an abnormality detection device is connected to a device to be tested, a test instruction for the device to be tested is received through a USB interface; the number of the device to be tested is multiple.

[0057] In this step, as shown above, the abnormality detection device is connected to the external terminal via a USB interface. When the abnormality detection device is connected to the device to be tested through the connection slot thereon, the external terminal is powered on to determine whether the connected device to be tested can be identified, and if not, the reason is reported. If it can be identified, the test program built into the external terminal automatically runs and sends a test instruction for the device to be tested. Among them, the test instruction sent by the test program built into the external terminal is received through the USB interface connecting the abnormality detection device and the external terminal, and is sent to each device to be tested for testing via the multiple USB interfaces obtained after expansion.

[0058] S302: Based on the conversion chip and the test instruction, the target performance of each device to be tested is tested to obtain an abnormality detection result for each device to be tested, wherein the abnormality detection result is used to characterize whether there is an abnormality in the performance of each device to be tested.

[0059] In this step, the conversion chip converts the protocols of multiple USB interfaces into the target protocol to ensure that the test instructions can be sent to each device to be tested through the USB interface, and then tests the target performance of each device to be tested based on the test instructions, obtains the abnormality detection results for each device to be tested, and realizes large-scale abnormality detection.

[0060] In the scheme shown in step S301 to step S302, the USB interface and the conversion chip of the abnormality detection device can be used to receive and transmit the test instructions, thereby realizing batch testing of the devices to be tested.

[0061] In an optional solution, the number of the target performance is at least one; the target performance of each device to be tested is tested based on the conversion chip and the test instruction to obtain an abnormality detection result for each device to be tested, including:

[0062] For any device under test among the devices under test,

[0063] The USB interface protocol of the test instruction is converted into a target protocol by a conversion chip, and each target performance of the device to be tested is tested to obtain a test result of each target performance of the device to be tested;

[0064] Based on the test results of the device to be tested for each target performance, an abnormality detection result for the device to be tested is obtained.

[0065] In the present application, the number of target performance is at least one, that is, multiple performances of the device to be tested can be tested. Specifically, for each device to be tested, the interface protocol of the USB interface connected thereto is converted into the target protocol through a conversion chip, so that the test instruction is sent to the device to be tested to test each of its target performances, and the test results of the device to be tested for each target performance are obtained. According to the test results of the device to be tested for each target performance, the abnormality detection results for the device to be tested can be obtained. Comprehensive and detailed abnormality detection can be achieved for the device to be tested. For the specific detection process, please refer to the detailed description of the relevant parts below, which will not be repeated.

[0066] In an optional solution, obtaining an abnormality detection result for the device to be tested based on the test result of each target performance of the device to be tested includes:

[0067] When the test results of the device to be tested for each target performance all indicate that the test has passed, a test result indicating that the performance of the device to be tested is normal is obtained;

[0068] When at least one test result among the test results of the device to be tested for each target performance indicates that the test has failed, a detection result indicating that the performance of the device to be tested is abnormal is obtained.

[0069] In this application, when the test results of the device under test for multiple target performances all indicate that the test has passed, the performance of the device under test is considered normal and the device under test has passed the test. When at least one test result among the test results of the device under test for multiple target performances indicates that the test has failed, the performance of the device under test is considered abnormal, and the cause of the abnormal performance is reported for quality inspection or tracking.

[0070] In an optional solution, the target performance includes at least one or more of the following: parameter interaction performance, instruction sending and receiving performance, state response performance, and signal transmission performance.

[0071] In the present application, the target performance includes at least one or more of parameter interaction performance, instruction transceiver performance, state response performance and signal transmission performance. Among them, the parameter interaction performance is mainly whether the external terminal can obtain the basic parameter information of the device to be tested, such as the parameter interaction performance of obtaining the device name, device serial number, etc. of the device to be tested. The instruction transceiver performance is mainly the performance of checking whether the cmd instruction of the device to be tested can be sent and received normally. The state response performance is mainly the performance of verifying whether the device to be tested is in a sleep state or a deep sleep state. The signal transmission performance is mainly the performance of detecting the signal transmission quality such as the rate and integrity of the signal transmission. In addition, the high and low temperature reading and writing performance, data comparison function, bit error rate check performance and other performances of the device to be tested can also be tested.

[0072] The present application also provides an abnormality detection system. Figure 4 As shown, the abnormality detection system includes the aforementioned abnormality detection device and an external terminal, the external terminal includes a USB interface, and the abnormality detection device is connected to the external terminal through the USB interface.

[0073] It can be understood that the anomaly detection device of the anomaly detection system in the embodiment of the present application is connected to the external terminal, and can directly perform anomaly detection on the device to be tested through the external terminal when the anomaly detection device is connected to the device to be tested through the connection slot. This is convenient, fast, and easy to implement, and can achieve efficient anomaly detection for a large number of devices to be tested.

[0074] It should be understood that the various forms of processes shown above can be used to reorder, add or delete steps. For example, the steps recorded in this application can be executed in parallel, sequentially or in different orders, as long as the expected results of the technical solution disclosed in this application can be achieved, and this document is not limited here.

[0075] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the features. In the description of this application, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0076] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art who is familiar with the present technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

Claims

1. An abnormality detection device, characterized in that: The abnormality detection device comprises: a circuit board, a universal serial bus (USB) interface expander and a conversion chip; wherein the USB interface expander and the conversion chip are both arranged on the circuit board, and the abnormality detection device is connected to an external terminal via a USB interface; The USB interface expander is used to expand the number of USB interfaces of the external terminal from one to multiple; The conversion chip is used to convert the expanded multiple USB interface protocols into a target protocol, where the target protocol is a protocol for communicating with the device to be tested.

2. The abnormality detection device according to claim 1, characterized in that The USB interface expander includes a primary USB interface expander, a secondary USB interface expander and a tertiary USB interface expander; The first-level USB interface expander is used to expand the number of external terminal USB interfaces from one to M; The secondary USB interface expander is used to expand the number of M external terminal USB interfaces to N; The three-level USB interface expander is used to expand the number of N external terminal USB interfaces to K; wherein M, N, and K are all integers greater than 1, K is greater than N, and N is greater than M.

3. The abnormality detection device according to claim 1 or 2, characterized in that: The device to be tested is a universal flash storage UFS device, and the target protocol is the UFS protocol.

4. The abnormality detection device according to claim 1, characterized in that Also includes: The connection slot is used to connect the device to be tested so as to perform anomaly detection on the device to be tested based on the target protocol.

5. The abnormality detection device according to claim 1, characterized in that The number of the conversion chips is the same as the number of the expanded USB interfaces.

6. An anomaly detection method, characterized in that: The method is applied to the abnormality detection device according to any one of claims 1 to 5, and the method comprises: When the anomaly detection device is connected to the device under test, Receiving a test instruction for a device to be tested through a USB interface; the number of the device to be tested is multiple; Based on the conversion chip and the test instructions, the target performance of each device to be tested is tested to obtain an abnormality detection result for each device to be tested, and the abnormality detection result is used to characterize whether the performance of each device to be tested is abnormal.

7. The abnormality detection method according to claim 6, characterized in that: The number of the target performance is at least one; the target performance of each device to be tested is tested based on the conversion chip and the test instruction to obtain an abnormality detection result for each device to be tested, including: For any device under test among the devices under test, The USB interface protocol of the test instruction is converted into a target protocol by a conversion chip, and each target performance of the device to be tested is tested to obtain a test result of each target performance of the device to be tested; Based on the test results of the device to be tested for each target performance, an abnormality detection result for the device to be tested is obtained.

8. The abnormality detection method according to claim 7, characterized in that: The obtaining of an abnormality detection result for the device to be tested based on the test result for each target performance of the device to be tested includes: When the test results of the device to be tested for each target performance all indicate that the test has passed, a test result indicating that the performance of the device to be tested is normal is obtained; When at least one test result among the test results of the device to be tested for each target performance indicates that the test has failed, a detection result indicating that the performance of the device to be tested is abnormal is obtained.

9. The anomaly detection method according to any one of claims 6 to 8, characterized in that: The target performance includes at least one or more of the following: parameter interaction performance, instruction receiving and sending performance, state response performance and signal transmission performance.

10. An anomaly detection system, characterized in that: The abnormality detection system comprises the abnormality detection device according to any one of claims 1 to 5 and an external terminal, wherein the external terminal comprises a USB interface, and the abnormality detection device is connected to the external terminal via the USB interface.

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