Combining multiple ultrasound beam skews

Abstract

Techniques for ultrasonic detection with different beam skews arranged in groups are described. For example, the techniques described herein may group multiple different beam skews into a single group as part of the same channel, resulting in simpler processing and calibration. The technique also describes a new scanned image that displays the different beam skews together so that an analyst can easily select and switch between the different beam skews.

Description

[0001] Priority declaration

[0002] This patent application claims the benefit of priority to U.S. Provisional Patent Application Serial No. 63 / 365,047, filed on May 20, 2022, entitled “METHOD FOR COMBINING MULTIPLEPHASED ARRAY ULTRASONIC BEAM SKEW FOCALLAWS INTO ASINGLE GROUP,” which is hereby incorporated by reference in its entirety. Technical Field

[0003] The present application relates to ultrasonic testing. Background Art

[0004] Phased Array Ultrasonic Testing (PAUT) is an advanced non-destructive testing technique that utilizes an ultrasonic testing (UT) probe array consisting of many small elements, pulses are applied to each UT probe individually with computer-calculated timing, and PAUT can be used to inspect more complex geometries that are difficult and much slower to inspect with a single probe. PAUT can be used to inspect almost any material that has been inspected using traditional UT methods (e.g., weld inspection, crack inspection, and corrosion monitoring), and can be used in a wide range of industries, including aerospace, power generation, petrochemicals, metal billet and pipe suppliers, pipeline construction and maintenance, structural metals, and general manufacturing.

[0005] PAUT has several advantages over other forms of UT: (i) PAUT can be performed faster than other forms of UT; (ii) it can be easily used for repeated scans because it is highly repeatable; (iii) by sequentially transmitting beams at different angles, PAUT is able to create detailed and accurate cross-sections of a component; and (iv) it is also particularly useful in situations where there is little space for mechanical scanning because PAUT testing is able to scan the beam without moving the probe. Summary of the invention

[0006] Examples described herein relate to methods, systems, and computer program products for ultrasound detection using different beam deflections. Examples include: receiving scan control parameters, the scan control parameters including a beam deflection configuration for arranging a plurality of beam deflections in a group; performing calibration for a corresponding beam deflection in the plurality of beam deflections; establishing a calibration value for at least one other beam deflection in the plurality of beam deflections based on the calibration performed for the corresponding beam deflection; receiving data indicating an electrical response signal caused by scanning an object, the scanning being based on the scan control parameters; and generating data for presentation based on the data indicating the electrical response signal corresponding to the plurality of beam deflections in the channel. BRIEF DESCRIPTION OF THE DRAWINGS

[0007] The subject matter of this disclosure may be better understood by referring to the following description in conjunction with the accompanying drawings. The accompanying drawings are not intended to limit the scope of the claims included herein. For clarity, not every component is labeled in every figure. The drawings are not necessarily drawn to scale, but rather the emphasis is placed on illustrating the embodiments, principles, and concepts. Therefore, the features and advantages of the disclosure will become more apparent through the following detailed description of the embodiments of the disclosure in conjunction with the accompanying drawings, in which:

[0008] Figure 1A is a block diagram illustrating a system for ultrasonic inspection defect screening according to an example implementation of the present subject matter;

[0009] Figure 1B Different probe types are shown according to example implementations of the present subject matter;

[0010] Figure 1C shows graphical representations of different types of scan data according to example implementations of the present subject matter;

[0011] Figure 2A An example of a probe performing beam steering according to an example implementation of the present subject matter is shown in top view and isometric view;

[0012] Figure 2B shows example B-scan images from different beams in a beam steering inspection according to an example implementation of the present subject matter;

[0013] Figure 3 A flow chart illustrating a method for performing detection using beam-steering detection according to an example implementation of the present subject matter is shown;

[0014] Figure 4 shows an example graphical representation of a beam deflection configuration according to an example implementation of the present subject matter;

[0015] Figure 5 shows an example of a T-scan according to an example implementation of the present subject matter;

[0016] Figure 6 shows an example of a display layout according to an example implementation of the present subject matter; and

[0017] Figure 7 An example of a display layout according to an example implementation of the present subject matter is shown. DETAILED DESCRIPTION

[0018] Phased Array Ultrasonic Testing (PAUT) inspection data (e.g., indications) often include geometric echoes, which can complicate the search for true flaw echoes. In practice, inspection analysts face a challenging task that involves striking a balance in their performance. There can be a tradeoff between the inspection workload and the thoroughness of the inspection performed by a single analyst.

[0019] Techniques for beam-performing PAUT using beam steering are described herein. Beam steering involves generating a beam to interrogate an object for defects, wherein the beam is projected from a probe at different angles and is therefore capable of detecting defects at different locations and orientations in the object. Techniques described herein may simplify the inspection process for an analyst (e.g., an operator). For example, the techniques described herein may group multiple different beam deflections into a single group as part of the same channel, resulting in simpler processing and calibration. The techniques also describe new scan images that display different beam deflections together, allowing an analyst to easily select and switch between different beam deflections. Thus, the techniques may allow an analyst to perform inspections in a straightforward, simple manner. Thus, the techniques may save time involved in the inspection process and improve accuracy by reducing the chances of missed or mischaracterized indications.

[0020] Figure 1A 1 is a block diagram showing a system 100 for ultrasonic defect screening according to an example embodiment of the present subject matter. The system 100 includes several functional units, such as a processor 110, a pulse generator 115, a receiver 145, a probe (e.g., a transducer) 125, and a display device 150. Figure 1AAs shown, the system 100 includes an instrument 105 having a processor 110, a pulse generator 115, a receiver 145, a display 150, and a memory 155. The pulse generator 115 can generate high voltage electrical pulses. Under the control of the processor 110 and driven by a trigger 120 from the pulse generator 115, the probe (e.g., transducer) 125 generates high frequency ultrasonic energy. The acoustic energy is introduced into the target 130 in the form of an incident wave 127 and propagates through the target 130. When there is a discontinuity or other indication 135 (e.g., a crack) in the wave path, part of the energy will be reflected back from the defect surface as a reflected wave 137. The reflected wave 137 is converted by the probe 125 into an electrical response signal 140 and received by the receiver 145, which can convert the response signal 140 into scan data 140' (e.g., A-scan data and scan axis position data). The processor 110 can then receive the scan data 140' for analysis. In some embodiments, scan data 140' is analyzed in real time using display 150 as it is received from probe 125, and in other embodiments, scan data 140' may be stored to memory 155 for offline analysis using instrument display 150 or an external computer (not shown).

[0021] Figure 1B Different probe types of probe 125 are shown. A linear probe includes a series of elements (e.g., carbon steel) distributed along a length, which corresponds to the active axis of the probe. A matrix probe includes elements arranged on both the active axis and the secondary axis of the probe. The beam can be controlled using delayed transmission of the elements. The matrix probe can be arranged in a rectangular arrangement with different numbers of rows and columns of elements (1.5D) or a square arrangement with the same number of rows and columns of elements (2D). In a single probe configuration, the probe transmits an incident wave 127 and also receives a reflected wave 137. In a dual probe configuration, transmission and reception are separated, with one probe transmitting the incident wave 127 and another probe also located on the surface of the target 130 receiving the reflected wave 137. A wedge structure can also be coupled to the bottom surface of the probe to improve the acoustic propagation of the ultrasound. The wedge structure can include a rigid thermosetting polymer with known acoustic propagation properties (e.g., available from C-Lec Plastics, Inc. ).

[0022] Figure 1CA graphical representation of different types of scan data 140' is shown. The scan data 140' may include information of different scan axis positions 180 and ultrasonic axis positions 185. The scan axis may refer to a common axis shared by the probe 125 and the target 130 (e.g., the component being inspected) along an inspection path (e.g., the path that the probe 125 traverses the target 130). For example, for weld inspection, the scan axis may be defined as an axis parallel to the long axis of the weld line, where the scan axis defines the inspection path of the probe. The ultrasonic axis may refer to a propagation direction in which ultrasonic waves (e.g., incident waves 127 and reflected waves 137) propagate, such as represented as rays extending toward or from echo features within the target 130 being inspected.

[0023] A-scan 160 may refer to the amplitude values ​​(amplitude axis) of the reflected waves along the ultrasound axis. B-scan 165 may refer to the combined amplitude values ​​(A-scan values) along the scan axis. S-scan 170 may refer to a sector scan of the amplitude values ​​(A-scan values) along the ultrasound axis position for a sector at a given scan axis position. Other scans may be included, such as C-scans, which may refer to the combined amplitude values ​​of each beam along the scan axis.

[0024] Figure 2A An example of a probe performing beam steering is shown in top view and isometric view. The probe 202 can use the delay of the active element to generate multiple beams at different angles. For example, the probe 202 can generate a first beam 204 at a nominal angle, a second beam 206 at -15°, and a third beam 208 at +15°. Figure 2B Example B-scan images from different beams are shown. As shown, B-scan images for different angled beams can reveal different information about the target. Image 210 is a B-scan result corresponding to the first beam 204 at a nominal angle. Image 210 shows the weld root in the target. Image 212 is a B-scan result corresponding to the second beam 206 at -15°. Image 210 shows different characteristics of the target. Image 214 is a B-scan result corresponding to the third beam 208 at +15°. Image 214 shows different characteristics of the target. For example, mis-oriented defects (or defects of different orientations), such as skewed ID cracks, are better detected and sized using the third beam 208 at +15° compared to the first beam 204 at the nominal angle.

[0025] In some conventional systems, different beam deflections are managed separately as their own separate deflection groups (also called beam sets). In these conventional systems, each beam deflection is a separate channel and requires its own processing, simulation, and calibration. This may result in many steps for the operator to perform. For example, in these conventional systems, the operator needs to set up a separate channel for each beam deflection angle and calibrate each channel separately.

[0026] The present subject matter includes a single group / beam set that includes multiple different beam deflection angles, each with multiple beam angles, which can simplify preparation and management. Multiple beam deflections can be arranged in the same group, called "3D sector scanning" (also called "3D compound scanning"). 3D sector scanning can support conventional sector scanning as well as compound S sector scanning, which can further reduce the number of groups.

[0027] In addition, calibration can be performed on one of the beam skew angles of a plurality of different beam skew angles in a group, and the calibration result for one beam skew angle can be used for other beam skew angles in the group. In other words, calibration is performed on one beam skew angle or a subset of beam skew angles in a group, rather than performing individual calibrations on each corresponding beam skew angle.

[0028] Figure 3 A flow chart of a method 300 for performing detection using beam steering is shown. At operation 302, as described above, a probe or a set of probes in a dual probe configuration is placed on an object under test. At operation 304, scan plan control parameters are received from a user (e.g., a technician, an operator). The scan plan control parameters may include the identification of a main axis element (including a first element, a last element) and the number of elements associated with the main axis. The main axis is associated with controlling the beam angle. The scan plan control parameters may include the identification of a secondary axis element (including a first element, a last element) and the number of elements associated with the secondary axis. The secondary axis is associated with controlling the deflection angle. The scan plan control parameters may include main axis controls, such as angle start, angle end, and angle step.

[0029] Scan plan control parameters related to beam deflection include the beam deflection configuration of the secondary axis, such as deflection start, deflection end, and deflection step size. Figure 4 An example graphical representation of a beam deflection configuration is shown. Deflection start may represent the angle of the first beam deflection relative to the nominal deflection (0°). Figure 4 In the example of , the skew start is set to -15°. The skew end can represent the angle of the last beam skew relative to the nominal skew. Figure 4 In the example of , the skew stop is set to +15°. The skew step size may represent the step size of the angle between beam skews. Figure 4In the example of FIG. 1 , the deflection step size is set to 5°, so that between the starting deflection and the ending deflection, there is a beam deflection every 5° (e.g., -15°, -10°, -5°, 0°, +5°, +10°, +15°). These corresponding beam deflections are arranged into a group / beam set. That is, one channel is used for different beam deflections because they are part of a group / beam set. A single channel corresponds to a single group (beam set).

[0030] Multiple active elements on different axes in the probe can be used to steer the beam. This can apply to both the primary and secondary axes of the probe. For example, two or more elements on the primary axis can be used to control the angle, while two or more elements on the secondary axis can be used to control the beam deflection. In this example, at least four elements (2×2) are used to control on both the primary and secondary axes.

[0031] Back to Figure 3 At operation 306, calibration may be performed on the beam skew group. The calibration may include determining a time corrected gain (TCG) value for a selected beam skew angle from the beam skew group. The TCG value for the selected beam skew angle may be deployed for other beam skew angles in the beam skew group. That is, calibration for one beam skew may be used for the entire beam skew group without requiring separate calibration for each beam skew. For example, a TCG value may be calculated for a nominal beam skew and may be extrapolated to apply to other beam skews in the group.

[0032] In some examples, more than one beam deflection in a group may be calibrated (but less than the total amount of beam deflections in the group). In these examples, interpolation may be used to provide calibration data for the other beam deflections in the group.

[0033] At operation 308, a scan of the object under test is performed based on the scan control parameters. For example, the probe can generate an incident wave based on the scan control parameters to penetrate the object under test. A reflected wave from the indication in the object under test can be received by the probe. The reflected wave can be converted into an electrical response signal.

[0034] At operation 310, scan data may be generated based on the response signal. As described above, the scan data may include A-scan data, B-scan data, C-scan data, and S-scan data. The scan data may also include T-scan data associated with the beam deflection result. T-scan may refer to a sub-axis sector scan (beam control) of an amplitude value (A-scan value) along an ultrasound axis position for a sector at a given scan axis position. T-scan displays data slices, not volumes. T-scans are associated with the probe, not the object being measured. T-scans represent each beam deflection in 2D with the UT axis and the scan axis as the background. In some examples, a nominal deflection representing a 0° beam deflection may be located at the center of the display.

[0035] S-scans and T-scans are similar in that, for a given scanning axis position, they represent the amplitude of more than one beam relative to the ultrasound axis. However, the difference between S-scans and T-scans is that S-scans represent beams at different angles for a given beam deflection, while T-scans represent beams at different beam deflections for a given beam angle. Each PAUT beam emitted in a 3D scan contains a unique set of refracted beam deflection parameters. Consider an example: 30 refracted angles and 5 beam deflections from the main axis can be emitted. That is, 30 (refracted angle beams) × 5 (beam deflections) = 150 different beams are generated. An S-scan can show 30 refracted beams for a given beam deflection, while a T-scan can show 5 beam deflections for a given refracted angle. Therefore, compared to other scans, T-scans provide different perspectives and information.

[0036] Figure 5 An example of a T-scan is shown. As shown, the horizontal axis is the UT axis and the vertical axis is the scan axis. The scan axis can be updated with the scan position. Each beam deflection is represented in 2D. A data cursor can select the active beam deflection. Figure 5 In the example of , a beam deflection of -5° is selected. The weld overlay can be refreshed according to the data cursor value (deflection angle). The T-scan can display the data slice selected by the corresponding angle of the data cursor. The T-scan shows the uncorrected technique presenting different beam deflections in a single display. As mentioned above, the T-scan can be 90° perpendicular to the S-scan.

[0037] Different beam deflections are grouped into a single group and can therefore be displayed in a single channel. Thus multiple scans can be displayed together with the T-scan, enabling the operator to select a specific beam deflection and have the other scan displays change accordingly for the selected beam deflection.

[0038] Figure 6 Examples of display layouts are shown. Display layout 602 includes portions of A-scan, B-scan, T-scan, and S-scan (ABTS). Display layout 604 includes portions of A-scan, B-scan, S-scan, and T-scan (ACST). Display layout 606 includes portions of C-scan, B-scan, T-scan, and S-scan (CBTS). As described above, in response to a user selecting a particular beam deflection in the T-scan portion, information for the other scan portions may be changed or refreshed corresponding to the selected beam deflection.

[0039] Figure 7An example of a display layout is shown. The display layout includes portions (ACST) of an A-scan, a B-scan, an S-scan, and a T-scan. Portion 702 shows a T-scan with a selected skew beam 704 indicated by a data cursor. Portion 706 shows A-scan data corresponding to the selected skew beam. Portion 708 shows C-scan data corresponding to the selected skew beam. Portion 710 shows S-scan data.

[0040] Processing (e.g., performing one or more methods described herein) may be implemented in hardware, software, or a combination of both. Processing may be implemented in a computer program executed on a programmable computer / machine, each of which includes a processor, a storage medium or other articles of manufacture readable by the processor (including volatile and non-volatile memory and / or storage elements), at least one input device, and one or more output devices. Program code may be applied to data input using an input device to perform processing and generate output information. The memory may include a machine-readable medium having stored thereon one or more sets of data structures or instructions (e.g., software) implemented or utilized by any one or more of the techniques or functions described herein.

[0041] In some embodiments, the system may be implemented by one or more programmable processors executing one or more computer programs to perform the functions of the system. In some other embodiments, all or part of the system may be implemented as a dedicated logic circuit system (e.g., a field programmable gate array (FPGA) and / or an application specific integrated circuit (ASIC)). In some other embodiments, all or part of the system may be implemented using the following electronic hardware circuit system: The electronic hardware circuit system includes an electronic device such as at least one of a processor, a memory, a programmable logic device, or a logic gate.

[0042] In one embodiment, the methods described herein are not limited to the specific examples described. In other embodiments, any method steps can be reordered, combined or removed as needed, or performed in parallel or serially to achieve the above results.

[0043] In some embodiments, the system can be implemented at least in part by a computer program product (e.g., in a non-transient machine-readable storage medium such as a non-transient computer-readable medium), which is executed by a data processing device (e.g., a programmable processor, a computer or a plurality of computers) or used to control the operation of the data processing device. In some embodiments, each such program can be implemented with a high-level process or object-oriented programming language to communicate with a computer system. However, in some other embodiments, the program can be implemented with an assembly or machine language. In some embodiments, the language can be a compiled language or an interpreted language, and it can be deployed in any form, including as an independent program or as a module, component, subroutine or other unit suitable for use in a computing environment. In some other embodiments, the computer program can be deployed to execute on a computer or on multiple computers, and the multiple computers are distributed at a site or across multiple sites and interconnected by a communication network.

[0044] The methods and apparatus of the present disclosure may take, at least in part, the form of program code (i.e., instructions) implemented in a tangible, non-transitory medium (e.g., a floppy disk, a CD-ROM, a hard drive, a random access or read-only memory, or any other machine-readable storage medium). When the program code is loaded into a computer such as a Figure 4 When the program code is implemented in and executed by a computer machine, the machine becomes a device for practicing the examples of the present subject matter. When implemented on one or more general-purpose processors, the program code is combined with such a processor to provide a unique device that operates similarly to a specific logic circuit. In this way, a general-purpose digital machine can be converted into a special-purpose digital machine. In some other embodiments, the non-transitory machine-readable medium may include, but is not limited to, a hard drive, a compact disk, a flash memory, a non-volatile memory, a volatile memory, a magnetic disk, etc., but does not itself include a transient signal.

[0045] The term "machine-readable medium" or "machine-readable storage medium" may include any medium that can store, encode, or carry instructions for execution by a machine and cause the machine to perform any one or more of the techniques of the present disclosure, or any medium that can store, encode, or carry data structures used by or associated with such instructions. Non-limiting examples of machine-readable media may include solid-state memory and optical and magnetic media. Thus, machine-readable media are not transient propagating signals. Specific examples of high-capacity machine-readable media may include: non-volatile memory, such as semiconductor memory devices (e.g., electrically programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM)) and flash memory devices; magnetic or other phase change or state change memory circuits; magnetic disks, such as internal hard disks and removable disks; magneto-optical disks; and CD-ROM and DVD-ROM disks.

[0046] Although the foregoing examples have been described in some detail for the purpose of clear understanding, it is obvious that certain changes and modifications can be practiced within the scope of the appended claims. The scope of the present invention is limited only by the claims, and the present invention includes many alternatives, modifications and equivalents. Many specific details are set forth in the above description in order to provide a thorough understanding of the present invention. These details are provided for the purpose of example, and the present invention can be practiced according to the claims without some or all of these specific details. For the sake of clarity, the technical materials known in the technical field related to the present invention are not described in detail so that the present invention will not be unnecessarily obscured. Therefore, the above implementation is considered to be illustrative rather than restrictive, and the present invention is not limited to the details given herein, but can be modified within the scope of the appended claims and their equivalents.

[0047] Various embodiments of the present disclosure have been described with reference to the accompanying drawings. It is understood that these example embodiments are provided only to enable those skilled in the art to better understand the present disclosure and then further implement the present disclosure, and are not intended to limit the scope of the present disclosure in any way. It should be noted that these drawings and descriptions are presented only as examples of embodiments, and based on this description, alternative embodiments with the structures and methods disclosed herein can be imagined, and such alternative embodiments can be used without departing from the principles of the present disclosure claimed in the present disclosure.

[0048] It can be noted that the flow chart and block diagram in the figure can illustrate the device, method and architecture, function and operation that can be performed by a computer program product according to various embodiments of the present disclosure. In this regard, each frame in the flow chart or block diagram can represent a part of a module, a program segment or a code, which can include one or more executable instructions for performing a specified logical function. It should also be noted that in some alternative implementations, the function indicated in the frame can occur in an order different from the order shown in the figure. For example, the two frames shown in succession can be performed substantially in parallel, or sometimes performed in reverse order, depending on the function involved. It should also be noted that each frame in the block diagram or flow chart and the combination of frames can be realized by a dedicated, hardware-based system or by a combination of dedicated hardware and computer instructions for performing a specified function or operation.

[0049] As used herein, the terms "comprising," "including," their derivatives, and similar expressions should be construed as open ended (i.e., "including / includes, but not limited to"). The term "based on" means "based at least in part on," the term "one embodiment" means "at least one embodiment," and the term "another embodiment" means "at least one other embodiment." Relevant definitions of other terms are provided.

[0050] As is common in patent literature, the terms "a" or "an" are used herein to include one or more than one, independent of any other instance or usage of "at least one" or "one or more". As used herein, unless otherwise indicated, the term "or" is used to refer to a non-exclusive or, such that "A or B" includes "A but not B", "B but not A", and "A and B". In this document, the terms "including" and "in which" are used as the plain English equivalents of the respective terms "comprising" and "wherein". In addition, in the appended claims, the terms "including" and "comprising" are open-ended, that is, systems, devices, articles, compositions, formulas, or processes that include elements in addition to those listed after such terms in the claim are still considered to fall within the scope of the claim. Furthermore, in the appended claims, the terms "first", "second", and "third", etc., are used merely as labels and are not intended to impose numerical requirements on their objects.

[0051] The method examples described herein may be at least partially machine or computer-implemented. Some examples may include a computer-readable medium or machine-readable medium encoded with instructions, which can be operated to configure an electronic device to perform the method described in the above example. The implementation of such a method may include code, such as microcode, assembly language code, higher-level language code, etc. Such code may include computer-readable instructions for performing various methods. The code may form a part of a computer program product. In addition, in an example, for example, during execution or at other times, the code may be tangibly stored on one or more volatile, non-transient, or non-volatile tangible computer-readable media. Examples of these tangible computer-readable media may include, but are not limited to, hard disks, removable disks, removable optical disks (e.g., compact disks and digital video disks), cassettes, memory cards or memory sticks, random access memory (RAM), read-only memory (ROM), etc.

[0052] The above description is intended to be illustrative rather than restrictive. For example, the examples described above (or one or more aspects of the examples) can be used in combination with each other. For example, a person of ordinary skill in the art can use other implementations after reading the above description. An abstract is provided to enable the reader to quickly determine the nature of the technical disclosure. The abstract is submitted with the following understanding: the abstract will not be used to interpret or limit the scope or meaning of the claims. In addition, in the above-mentioned specific embodiments, various features can be combined together to streamline the disclosure. This should not be interpreted as meaning that the public features that are not claimed for protection are necessary for any claim. Instead, the subject matter of the invention can be less than all the features of a specific disclosed implementation. Therefore, the attached claims are incorporated into the specific embodiments as examples or implementations, wherein each claim exists independently as a separate implementation, and it is expected that such implementations can be combined with each other in various combinations or arrangements. The scope of the present invention should be determined with reference to the attached claims and the full scope of equivalents enjoyed by these claims.

Claims

1. A method for ultrasonic testing using different beam deflections, the method comprising: receiving scan control parameters including a beam deflection configuration for arranging a plurality of beam deflections in groups; performing calibration on corresponding beam deflections of the plurality of beam deflections; establishing a calibration value for at least one other beam bias of the plurality of beam biases based on the calibration performed for the corresponding beam bias; receiving data indicative of an electrical response signal induced by scanning an object, the scanning being based on the scan control parameters; as well as Data for presentation is generated based on data indicative of electrical response signals corresponding to the plurality of beam deflections in the channel.

2. The method according to claim 1, further comprising: A scanned image showing the set of multiple beam deflections is generated.

3. The method according to claim 2, wherein: The scan image includes a horizontal axis corresponding to an ultrasound detection axis and a vertical axis corresponding to a scan axis.

4. The method according to claim 2, wherein: The scanned image represents each beam deflection of the plurality of beam deflections in the set in two dimensions.

5. The method according to claim 4, further comprising: A selection of an active beam deflection is received based on the scanned image.

6. The method according to claim 5, further comprising: Refreshes the scan data to display the data slice corresponding to the selected active beam deflection.

7. The method according to claim 6, wherein: The display includes a layout having a plurality of scans associated with the selected active beam deflection.

8. A system comprising: One or more processors of the machine: and a memory storing instructions that, when executed by the one or more processors, cause the machine to perform operations comprising: receiving scan control parameters including a beam deflection configuration for arranging a plurality of beam deflections in groups; performing calibration on corresponding beam deflections of the plurality of beam deflections; establishing a calibration value for at least one other beam bias of the plurality of beam biases based on the calibration performed for the corresponding beam bias; receiving data indicative of an electrical response signal induced by scanning an object, the scanning being based on the scan control parameters; and Data for presentation is generated based on data indicative of electrical response signals corresponding to the plurality of beam deflections in the channel.

9. The system of claim 8, wherein the operations further comprise: A scanned image showing the set of multiple beam deflections is generated.

10. The system according to claim 9, wherein: The scan image includes a horizontal axis corresponding to an ultrasound detection axis and a vertical axis corresponding to a scan axis.

11. The system according to claim 9, wherein: The scanned image represents each beam deflection of the plurality of beam deflections in the set in two dimensions.

12. The system of claim 11, the operations further comprising: A selection of an active beam deflection is received based on the scanned image.

13. The system of claim 12, the operations further comprising: Refreshes the scan data to display the data slice corresponding to the selected active beam deflection.

14. The system of claim 13, wherein the operation The display includes a layout having a plurality of scans associated with the selected active beam deflection.

15. A machine-readable storage medium, when executed by a machine, causes the machine to perform operations, the operations comprising: receiving scan control parameters including a beam deflection configuration for arranging a plurality of beam deflections in groups; performing calibration on corresponding beam deflections of the plurality of beam deflections; establishing a calibration value for at least one other beam bias of the plurality of beam biases based on the calibration performed for the corresponding beam bias; receiving data indicative of an electrical response signal induced by scanning an object, the scanning being based on the scan control parameters; as well as Data for presentation is generated based on data indicative of electrical response signals corresponding to the plurality of beam deflections in the channel.

16. The machine-readable storage medium of claim 15, further comprising: A scanned image showing the set of multiple beam deflections is generated.

17. The machine-readable storage medium of claim 16, wherein: The scan image includes a horizontal axis corresponding to an ultrasound detection axis and a vertical axis corresponding to a scan axis.

18. The machine-readable storage medium of claim 16, wherein: The scanned image represents each beam deflection of the plurality of beam deflections in the set in two dimensions.

19. The machine-readable storage medium of claim 18, further comprising: A selection of an active beam deflection is received based on the scanned image.

20. The machine-readable storage medium of claim 19, further comprising: Refreshes the scan data to display the data slice corresponding to the selected active beam deflection.

Images