Dynamic total temperature probe comb of film platinum resistor for measuring unsteady flow field

Abstract

The invention belongs to the technical field of dynamic temperature testing, and particularly relates to a dynamic total temperature probe comb for measuring a thin film platinum resistor of an unsteady flow field, which comprises a probe support rod, a positioning block, a probe, a thin film platinum resistor, a circular pipeline and a lead hole. A circular pipeline is arranged in the probe supporting rod, a positioning block is arranged at the tail of the probe supporting rod, the probes are cylinders with circular truncated cones at the heads, the number of the probes is determined according to measurement requirements, the probes are fixed to different spanwise measurement positions of the probe supporting rod respectively, and lead holes are formed in the centers of the top faces of the circular truncated cones of the probes and communicated with the circular pipeline. And a film platinum resistor is arranged above the lead hole, and a film platinum resistor lead passes through the lead hole and the circular pipeline and is led out from the tail part of the probe. The dynamic total temperature probe comb of the film platinum resistor for measuring the unsteady flow field is calibrated, is suitable for measuring the distribution of the dynamic total temperature of the unsteady flow field of turbomachinery along the height direction of a blade, and can simultaneously measure incoming flow parameters of a plurality of spatial positions, shorten the measurement time to the greatest extent and reduce the test cost compared with the existing dynamic temperature measurement probe.

Description

Technical Field

[0001] The present invention belongs to the technical field of dynamic temperature testing, and specifically relates to a dynamic total temperature probe comb of a thin film platinum resistor for measuring unsteady flow fields. The present invention is suitable for measuring transient information of three-dimensional unsteady flow fields in impeller machines. The core of the probe comb is to quickly and accurately measure and monitor the distribution of transient temperature of the three-dimensional unsteady flow field of the impeller machine along the blade height direction.

[0002] Compared with the existing temperature probes for measuring three-dimensional flow fields, it does not need to use a probe displacement mechanism to change the measuring point position. It can instantly complete the measurement of the incoming flow temperature distribution along the blade height direction of the three-dimensional unsteady flow field of the impeller machinery and reduce the test cost. Background Art

[0003] The three-dimensional flow field at the inlet, outlet and between stages of the impeller is essentially non-steady due to fluid viscosity, shock waves, rotor rotation, the existence of tip clearance, the staggered arrangement of moving and static blade rows, etc. This makes it very difficult to quickly and accurately obtain the change of the temperature field at the inlet, outlet and between stages of the impeller over time. Due to the distortion of the inlet temperature of the impeller, the impeller experiment needs to measure the temperature distribution along the blade height direction. In some impeller tests, the effective test time is short, only a few minutes or even seconds. The existing temperature probe cannot complete the measurement of the distribution of the three-dimensional flow field parameters at the inlet and outlet of the test piece along the blade height direction within a few seconds. Therefore, in order to quickly and accurately obtain the transient temperature field at the inlet, outlet and between stages of the impeller, more targeted testing methods must be developed.

[0004] At present, thermocouple temperature probes are generally used. The probe displacement mechanism is used to drive the probe to different blade height positions for measurement. Since it is a single-point measurement, the probe needs to be moved to complete multi-point measurement. The experimental measurement time is long and the experimental cost is high. Thermocouple temperature sensors are often used to obtain dynamic temperature signals of the flow field. However, due to limited frequency, the fine-wire thermocouple temperature sensor with the highest frequency response cannot fully meet the test requirements of the transient temperature field at the inlet, outlet and stage of the impeller under special working conditions. Compared with thin-film platinum resistance temperature sensors, thermocouples have lower accuracy. During long-term use, thermocouples may drift due to material aging and thermoelectric effects, resulting in increased measurement errors and are easily affected by environmental factors.

[0005] Therefore, in order to quickly and accurately obtain the transient temperature field at the inlet, outlet and between stages of the impeller, it is urgent to develop a testing technology that is fast, high-precision, resistant to airflow erosion, has a small spatial resolution and little interference to the flow field, so as to achieve accurate measurement of the dynamic temperature of the unsteady flow field and provide reliable measurement means and technical support for the high-performance design and optimization of the impeller machinery. Summary of the invention

[0006] The present invention discloses a dynamic total temperature probe comb of a thin film platinum resistor for measuring an unsteady flow field, comprising a probe support rod, a positioning block, a probe head, a thin film platinum resistor, a circular pipe, and a lead hole. The probe support rod has a circular pipe inside, and a positioning block is provided at the tail of the probe support rod. The probe head is a cylinder with a truncated cone. The number of the probe heads is determined according to the measurement requirements, and the probe heads are at least three, which are respectively fixed at different spanwise measurement positions of the probe support rod. A lead hole is provided at the center of the truncated cone top surface of the probe head, and the lead hole is connected to the circular pipe. A thin film platinum resistor is installed above the lead hole. The lead wire of the thin film platinum resistor passes through the lead hole and the circular pipe and is led out from the tail of the probe.

[0007] In the calibration wind tunnel, a dynamic total temperature probe comb of a thin film platinum resistor for measuring unsteady flow fields is calibrated over a wide range. The calibration speed range is 0.1 Mach to 2 Mach, the deflection angle range is -80° to 80°, and the pitch angle range is -40° to 40°. During the wind tunnel test calibration, two thin film platinum resistors are used to measure the temperature simultaneously. The two thin film thermal resistors are provided with different constant currents by a signal generator. The two resistors have different initial temperatures, but have the same convective heat transfer surface heat transfer coefficient h. The ratio of the heat flux density of the two thin film platinum resistors under different working conditions can be obtained. The heat flux ratio is defined as S and satisfies the following equation:

[0008] q1=h(T t -T w1 )

[0009] q2=h(T t -T w2 )

[0010]

[0011] Where, q1, q2——heat flux density of thin film thermal resistor, unit W / m 2 ; Tw1, Tw2——temperature measured by thin film thermal resistor, unit K; Tt——total temperature of the calibration wind tunnel inflow, unit K. The ratio S of heat flux density under different calibration conditions can be obtained by the above calibration method;

[0012] During the test measurement, when the incoming flow condition is known, the corresponding heat flux ratio S can be found from the calibration data. The total temperature T of the measured airflow can be calculated from the measured Tw1 and Tw2 data by the following formula: g :

[0013]

[0014] The present invention is based on a dynamic total temperature probe with double thin film platinum resistors. The temperature analytical transfer function coefficients are obtained through calibration experiments, the temperature measurement transfer function of the dynamic total temperature probe with double thin film platinum resistors is constructed, and the total airflow temperature of the measured flow field is reconstructed, which can greatly improve the frequency response and measurement accuracy of the dynamic total temperature probe.

[0015] The present invention provides a dynamic total temperature probe comb of a thin film platinum resistor for measuring unsteady flow fields. The technical problems to be solved are: first, the problem of insufficient accuracy of existing dynamic temperature probe combs is solved. Second, the problem that existing temperature probe combs are limited by the low frequency response of traditional dynamic temperature sensors is solved. Third, in view of the problem that existing temperature probes cannot complete the distribution measurement of the temperature parameters of the three-dimensional flow fields at the inlet and outlet of the impeller machinery test piece along the blade height direction within a few seconds, compared with the existing temperature probes, it can simultaneously measure the incoming flow parameters of multiple spatial positions, which can shorten the measurement time to the greatest extent, complete the measurement of the incoming flow temperature distribution of the three-dimensional flow fields at the inlet and outlet of the impeller machinery test piece along the blade height direction, and reduce the test cost.

[0016] The technical solution of the present invention is:

[0017] 1. A dynamic total temperature probe comb of a thin film platinum resistor for measuring an unsteady flow field, comprising a probe support rod (1), a positioning block (2), a probe (3), a right thin film platinum resistor (4), a left thin film platinum resistor (5), a circular pipe (6), and a lead hole (7), characterized in that: the circular pipe (6) is provided inside the probe support rod (1), a positioning block (2) is provided at the tail of the probe support rod (1), the probe (3) is a cylinder with a truncated cone at the head, the number of the probes (3) is determined according to measurement requirements, and is at least 3, and is respectively fixed at different spanwise measurement positions of the probe support rod (1), a lead hole (7) is provided at the center of the truncated cone top surface of the probe (3), the lead hole (7) is communicated with the circular pipe (6), a right thin film platinum resistor (4) and a left thin film platinum resistor (5) are installed above the lead hole (7), and the leads of the right thin film platinum resistor (4) and the left thin film platinum resistor (5) pass through the lead hole (7) and the circular pipe (6) and are led out from the tail of the probe.

[0018] 2. The probe support rod (1) is a cylinder, and the diameter of the cylinder is d, and the value range of d is 2 mm ≤ d ≤ 10 mm. The probe support rod (2) is provided with a circular pipe (6) along the axial inside, and the diameter of the circular pipe is a, and the value range of a is 1 mm ≤ a ≤ 8 mm. The thin film platinum resistance wire passes through the lead hole and is connected to the external collection equipment through the circular pipe (6).

[0019] 3. The top diameter of the cone of the probe (3) is 1 mm to 3 mm, the bottom diameter is 3 mm to 6 mm, the cone angle of the cone of the probe (1) is 30° to 100°, the probe (3) may also be a pyramid, and the probe (3) is made of insulating and heat-insulating material to reduce the thermal conductivity error during measurement and improve the measurement accuracy and frequency response of the probe.

[0020] 4. The center of the lead hole (7) coincides with the center of the top surface of the truncated cone, and the diameter is 0.2 mm to 1 mm.

[0021] 5. The right thin film platinum resistor (4) and the left thin film platinum resistor (5) are installed on the lead hole. The thin film platinum resistor (4) adopts a miniature four-wire thin film platinum resistor with a length of 0.5 mm to 3 mm, a width of 0.1 mm to 1.5 mm, and a thickness of 0.01 mm to 0.2 mm. The four-wire measurement can effectively eliminate the influence of the lead resistance on the measurement result, improve the measurement accuracy, and ensure the stability and accuracy of the data.

[0022] 6. The installation distance between the right thin film platinum resistor (4) and the left thin film platinum resistor (5) is x, and the value range of x is 0.2 mm ≤ x ≤ 1 mm.

[0023] 7. The cross section of the positioning block (2) is a regular quadrilateral, and the cross section shape can be a regular pentagon, a regular hexagon or a regular heptagon. The center line of the cross section is in the same plane as the axis of the probe support rod (1). The thickness of the positioning block is a, and the value range of a is 2 mm ≤ d ≤ 10 mm. The distance between the positioning block (2) and the bottom of the probe support rod (1) is b, and the value range of b is 5 mm ≤ b ≤ 20 mm.

[0024] The present invention provides a dynamic total temperature probe comb for measuring a thin film platinum resistor for an unsteady flow field, which has the following beneficial effects:

[0025] Beneficial effect 1: The present invention has been calibrated in a standard wind tunnel, has high measurement accuracy and fast response speed, the sensing part is not affected by the structure of the probe itself, and first senses the pulsation of the incoming flow, the flow field information is not distorted, and the measurement accuracy is high. Through the precise calibration process, it is ensured that the response of the thin film platinum resistor at different temperature points is accurate and reliable, and when measuring, only the incoming flow parameters need to be obtained, and there is no need to understand the physical properties of the measured medium.

[0026] Beneficial effect 2: The present invention is based on the design of a double-thin-film platinum resistor. The two thin-film platinum resistors compensate each other during temperature measurement. The temperature analysis transfer function coefficient is obtained through calibration tests, and the temperature measurement transfer function of the double-thin-film platinum resistor dynamic total temperature probe is constructed to reconstruct the total airflow temperature of the measured flow field, which can greatly improve the frequency response of the dynamic total temperature probe. Compared with traditional sensors, the double-thin-film platinum resistor can respond to temperature changes more quickly and adapt to the measurement requirements of transient temperature fields, especially under complex working conditions at the inlet and outlet of the impeller and between stages, and can accurately capture the dynamic changes of temperature.

[0027] Beneficial effect three: The present invention is suitable for the distribution of the three-dimensional flow field parameters of the impeller machinery inlet and outlet along the blade height direction. Compared with the existing temperature probe for measuring the three-dimensional flow field, it can simultaneously measure the flow parameters of multiple spatial positions, which can shorten the measurement time to the greatest extent, complete the measurement of the distribution of the three-dimensional flow field parameters of the impeller machinery inlet and outlet along the blade height direction, and reduce the test cost.

[0028] Beneficial effect four: The probe of the present invention has a self-positioning function, the positioning block forms a positioning reference, the probe is easy and convenient to install, does not need to be rotated during measurement, has no periodicity requirement for the measured flow field, and has a wide range of applications. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] Figure 1 It is a schematic structural diagram of a dynamic total temperature probe comb of a thin film platinum resistor for measuring a subsonic unsteady flow field in an embodiment of the present invention.

[0030] Figure 2 yes Figure 1 Top view of the .

[0031] Figure 3 yes Figure 1 Side view of.

[0032] Figure 4 yes Figure 1 C-section view.

[0033] Figure 5 yes Figure 1 B-direction cross-sectional view.

[0034] Figure 6 yes Figure 1 A-section view.

[0035] Figure 7 yes Figure 6 A partial enlarged view of .

[0036] Among them: 1-probe support rod, 2-positioning block, 3-probe, 4-right thin film platinum resistor, 5-left thin film platinum resistor, 6-circular pipe, 7-lead hole.

[0037] Figure 8 It is a schematic structural diagram of a dynamic total temperature probe comb of a thin film platinum resistor for measuring a transonic unsteady flow field in an embodiment of the present invention.

[0038] Fig. 9 yes Figure 8 Top view of the .

[0039] Fig.10 yes Figure 8 Side view of.

[0040] Fig.11 yes Figure 8 C-section view.

[0041] Fig.12 yes Figure 8 B-direction cross-sectional view.

[0042] Fig.13 yes Figure 8 A-section view.

[0043] Fig.14 yes Fig.13 A partial enlarged view of .

[0044] Among them: 1-probe support rod, 2-positioning block, 3-probe, 4-right thin film platinum resistor, 5-left thin film platinum resistor, 6-circular pipe, 7-lead hole. Specific implementation method one:

[0046] The present invention is described in detail below in conjunction with the accompanying drawings and specific implementation examples so that the advantages and features of the present invention can be more easily understood by those skilled in the art, thereby making a clearer and more definite definition of the protection scope of the present invention.

[0047] like Figures 1 to 7 The present invention shows a dynamic total temperature probe comb of a thin film platinum resistor for measuring a subsonic unsteady flow field, which is composed of a probe support rod (1), a positioning block (2), a probe (3), a right thin film platinum resistor (4), a left thin film platinum resistor (5), a circular pipe (6), and a lead hole (7). The present invention is characterized in that: a circular pipe (6) is provided inside the probe support rod (1), a positioning block (2) is provided at the tail of the probe support rod (1), the probe (3) is a cylinder with a truncated cone at the head, the number of which is determined according to the measurement requirements and is at least 3, and the probes (3) are respectively fixed at different spanwise measurement positions of the probe support rod (1), a lead hole (7) is provided at the center of the truncated cone top surface of the probe (3), the lead hole (7) is communicated with the circular pipe (6), the right thin film platinum resistor (4) and the left thin film platinum resistor (5) are installed above the lead hole (7), and the leads of the right thin film platinum resistor (4) and the left thin film platinum resistor (5) pass through the lead hole (6) and the circular pipe (5) and are led out from the tail of the probe;

[0048] The probe support rod (1) is a cylinder, and the diameter of the cylinder is d, and the value of d is 10 mm; the probe support rod (2) is provided with a circular pipe (6) along the axial direction, and the diameter of the circular pipe is a, and the value of a is 6 mm. The thin film platinum resistance wire passes through the lead hole and is connected to the external collection equipment through the circular pipe (6);

[0049] The top diameter of the truncated cone of the probe (3) is 2 mm, the bottom diameter is 4 mm, the cone angle of the truncated cone of the probe (1) is 54°, and the probe (3) is made of insulating heat-insulating material to reduce the thermal conductivity error during measurement and improve the measurement accuracy and frequency response of the probe;

[0050] The center of the lead hole (7) coincides with the center of the top surface of the truncated cone, and the diameter is 0.5 mm;

[0051] The right thin-film platinum resistor (4) and the left thin-film platinum resistor (5) are installed on the lead hole. The right thin-film platinum resistor (4) and the left thin-film platinum resistor (5) are miniature four-wire thin-film platinum resistors with a length of 1 mm, a width of 0.5 mm, and a thickness of 0.1 mm. The four-wire measurement can effectively eliminate the influence of the lead resistance on the measurement result, improve the measurement accuracy, and ensure the stability and accuracy of the data.

[0052] The installation distance between the right thin film platinum resistor (4) and the left thin film platinum resistor (5) is x, and the value of x is 0.5 mm;

[0053] The cross section of the positioning block (2) is a regular quadrilateral, the center line of the cross section and the center line of the thin film platinum resistor (4) are in the same plane as the axis of the probe support rod (1), the thickness of the positioning block is a, the value of a is 8 mm, the distance between the positioning block (2) and the bottom of the probe support rod (1) is b, the value of b is 20 mm;

[0054] The present invention proposes a data processing method based on a dynamic total temperature probe comb of a thin film platinum resistor for measuring a subsonic unsteady flow field. A dynamic total temperature probe comb of a thin film platinum resistor for measuring a subsonic unsteady flow field is calibrated over a wide range in a calibration wind tunnel. The calibration speed range is 0.1 Mach to 1 Mach, with an interval of 0.1 Mach, a deflection angle range is -80° to 80°, with an interval of 5°, and a pitch angle range is -40° to 40°, with an interval of 5°. During the wind tunnel test calibration, two thin film platinum resistors are used to perform temperature measurement simultaneously. The two thin film thermal resistors are provided with different constant currents by a signal generator. The two resistors have different initial temperatures but have the same convective heat transfer surface heat transfer coefficient h. The heat flux density ratio of the two thin film platinum resistors under different working conditions can be obtained. The heat flux density ratio is defined as S and satisfies the following equation:

[0055] q1=h(T t -T w1 )

[0056] q2=h(T t -T w2 )

[0057]

[0058] Where, q1, q2——heat flux density of thin film thermal resistor, unit W / m 2 ; Tw1, Tw2——temperature measured by thin film thermal resistor, unit K; Tt——total temperature of the calibration wind tunnel inflow, unit K. The ratio S of heat flux density under different calibration conditions can be obtained by the above calibration method;

[0059] During the test measurement, when the incoming flow condition is known, the corresponding heat flux ratio S can be found from the calibration data. The total temperature T of the measured airflow can be calculated from the measured Tw1 and Tw2 data by the following formula:g :

[0060]

[0061] The present invention is based on a dynamic total temperature probe with double thin film platinum resistors. The temperature analytical transfer function coefficients are obtained through calibration experiments, the temperature measurement transfer function of the dynamic total temperature probe with double thin film platinum resistors is constructed, and the total temperature of the airflow in the measured subsonic unsteady flow field is reconstructed, which can greatly improve the frequency response and measurement accuracy of the dynamic total temperature probe. Specific implementation method 2:

[0063] The present invention is described in detail below in conjunction with the accompanying drawings and specific implementation examples so that the advantages and features of the present invention can be more easily understood by those skilled in the art, thereby making a clearer and more definite definition of the protection scope of the present invention.

[0064] like Figures 8 to 14 The present invention shows a dynamic total temperature probe comb of a thin film platinum resistor for measuring a transonic unsteady flow field, which is composed of a probe support rod (1), a positioning block (2), a probe (3), a right thin film platinum resistor (4), a left thin film platinum resistor (5), a circular pipe (6), and a lead hole (7). The present invention is characterized in that: a circular pipe (6) is provided inside the probe support rod (1), a positioning block (2) is provided at the tail of the probe support rod (1), the head of the probe (3) is a pyramid, the number of which is determined according to the measurement requirements and is at least 3, and the probes (3) are respectively fixed at different spanwise measurement positions of the probe support rod (1), a lead hole (7) is provided at the center of the pyramid top surface of the probe (3), the lead hole (7) is communicated with the circular pipe (6), the right thin film platinum resistor (4) and the left thin film platinum resistor (5) are installed above the lead hole (7), and the leads of the right thin film platinum resistor (4) and the left thin film platinum resistor (5) pass through the lead hole (6) and the circular pipe (5) and are led out from the tail of the probe;

[0065] The probe support rod (1) is a cylinder, and the diameter of the cylinder is d, and the value of d is 10 mm; the probe support rod (2) is provided with a circular pipe (6) along the axial direction, and the diameter of the circular pipe is a, and the value of a is 6 mm. The thin film platinum resistance wire passes through the lead hole and is connected to the external collection equipment through the circular pipe (6);

[0066] The top surface of the pyramid of the probe (3) is 5 mm long and 3 mm wide, the angle between the top surface and the inclined surface of the probe (3) is 120°, and the probe (3) is made of insulating heat-insulating material to reduce the thermal conductivity error during measurement and improve the measurement accuracy and frequency response of the probe;

[0067] The center of the lead hole (7) coincides with the center of the top surface of the pyramid, and the diameter is 0.5 mm;

[0068] The right thin-film platinum resistor (4) and the left thin-film platinum resistor (5) are installed on the lead hole. The right thin-film platinum resistor (4) and the left thin-film platinum resistor (5) are miniature four-wire thin-film platinum resistors with a length of 1 mm, a width of 0.5 mm, and a thickness of 0.1 mm. The four-wire measurement can effectively eliminate the influence of the lead resistance on the measurement result, improve the measurement accuracy, and ensure the stability and accuracy of the data.

[0069] The installation distance between the right thin film platinum resistor (4) and the left thin film platinum resistor (5) is x, and the value of x is 0.5 mm;

[0070] The cross section of the positioning block (2) is a regular quadrilateral, the center line of the cross section and the center line of the thin film platinum resistor (4) are in the same plane as the axis of the probe support rod (1), the thickness of the positioning block is a, the value of a is 8 mm, the distance between the positioning block (2) and the bottom of the probe support rod (1) is b, the value of b is 20 mm;

[0071] The present invention proposes a data processing method based on a dynamic total temperature probe comb of a thin film platinum resistor for measuring a transonic unsteady flow field. A dynamic total temperature probe comb of a thin film platinum resistor for measuring a transonic unsteady flow field is calibrated over a wide range in a calibration wind tunnel. The calibration speed range is 1 Mach to 2 Mach, with an interval of 0.1 Mach, a deflection angle range is -80° to 80°, with an interval of 5°, and a pitch angle range is -40° to 40°, with an interval of 5°. During the wind tunnel test calibration, two thin film platinum resistors are used to simultaneously measure the temperature. The two thin film thermal resistors are provided with different constant currents by a signal generator. The two resistors have different initial temperatures but have the same convective heat transfer surface heat transfer coefficient h. The ratio of the heat flux densities of the two thin film platinum resistors under different working conditions can be obtained. The ratio of the heat flux densities is defined as S, and the following equation is satisfied:

[0072] q1=h(T t -T w1 )

[0073] q2=h(T t -T w2 )

[0074]

[0075] Where, q1, q2——heat flux density of thin film thermal resistor, unit W / m 2 ; Tw1, Tw2——temperature measured by thin film thermal resistor, unit K; Tt——total temperature of the calibration wind tunnel inflow, unit K. The ratio S of heat flux density under different calibration conditions can be obtained by the above calibration method;

[0076] During the test measurement, when the incoming flow condition is known, the corresponding heat flux ratio S can be found from the calibration data. The total temperature T of the measured airflow can be calculated from the measured Tw1 and Tw2 data by the following formula:g :

[0077]

[0078] The present invention is based on a dynamic total temperature probe with double thin film platinum resistors. The temperature analytical transfer function coefficients are obtained through calibration experiments, the temperature measurement transfer function of the dynamic total temperature probe with double thin film platinum resistors is constructed, and the total temperature of the airflow in the measured transonic unsteady flow field is reconstructed, which can greatly improve the frequency response and measurement accuracy of the dynamic total temperature probe.

Claims

1. A dynamic total temperature probe comb for measuring unsteady flow field using a thin film platinum resistor, comprising a probe support rod (1), a positioning block (2), a probe (3), a right thin film platinum resistor (4), a left thin film platinum resistor (5), a circular pipe (6), and a lead hole (7), characterized in that: The probe support rod (1) has a circular pipe (6) inside, and a positioning block (2) is provided at the tail of the probe support rod (1). The probe head (3) is a cylinder with a truncated cone at the head. The number of the probe heads is determined according to the measurement requirements and is at least three, and the probe heads (3) are respectively fixed at different spanwise measurement positions of the probe support rod (1). A lead hole (7) is provided at the center of the truncated cone top surface of the probe head (3). The lead hole (7) is connected to the circular pipe (6). A right thin film platinum resistor (4) and a left thin film platinum resistor (5) are installed above the lead hole (7). The leads of the right thin film platinum resistor (4) and the left thin film platinum resistor (5) pass through the lead hole (7) and the circular pipe (6) and are led out from the tail of the probe head. The probe support rod (1) is a cylinder, and the diameter of the cylinder is d, and the value range of d is 2 mm ≤ d ≤ 10 mm; the probe support rod (2) is provided with a circular pipe (6) along the axial direction, and the diameter of the circular pipe is a, and the value range of a is 1 mm ≤ a ≤ 8 mm. The thin film platinum resistance wire passes through the lead hole and is connected to the external collection equipment through the circular pipe (6); The top diameter of the truncated cone of the probe (3) is 1 mm to 3 mm, the bottom diameter is 3 mm to 6 mm, the cone angle of the truncated cone of the probe (1) is 30° to 100°, the probe (3) may also be a pyramidal shape, and the probe (3) is made of insulating and heat-insulating materials to reduce thermal conductivity errors during measurement and improve the measurement accuracy and frequency response of the probe; The center of the lead hole (7) coincides with the center of the top surface of the truncated cone, and the diameter is 0.2 mm to 1 mm; The right thin film platinum resistor (4) and the left thin film platinum resistor (5) are installed on the lead hole. The thin film platinum resistor (4) adopts a miniature four-wire thin film platinum resistor with a length of 0.5 mm to 3 mm, a width of 0.1 mm to 1.5 mm, and a thickness of 0.01 mm to 0.2 mm. The four-wire measurement can effectively eliminate the influence of the lead resistance on the measurement result, improve the measurement accuracy, and ensure the stability and accuracy of the data. The installation distance between the right thin film platinum resistor (4) and the left thin film platinum resistor (5) is x, and the value range of x is 0.2 mm ≤ x ≤ 1 mm; The cross section of the positioning block (2) is a regular quadrilateral, and the cross section shape can be a regular pentagon, a regular hexagon or a regular heptagon. The center line of the cross section is in the same plane as the axis of the probe support rod (1). The thickness of the positioning block is a, and the value range of a is 2 mm ≤ d ≤ 10 mm. The distance between the positioning block (2) and the bottom of the probe support rod (1) is b, and the value range of b is 5 mm ≤ b ≤ 20 mm. The present invention proposes a data processing method based on a dynamic total temperature probe comb of a thin film platinum resistor for measuring an unsteady flow field. A dynamic total temperature probe comb of a thin film platinum resistor for measuring an unsteady flow field is calibrated over a wide range in a calibration wind tunnel. The calibration speed range is 0.1 Mach to 2 Mach, the deflection angle range is -80° to 80°, and the pitch angle range is -40° to 40°. During the wind tunnel test calibration, two thin film platinum resistors are used to measure the temperature simultaneously. The two thin film thermal resistors are provided with different constant currents by a signal generator. The two resistors have different initial temperatures but have the same convective heat transfer surface heat transfer coefficient h. The heat flux density ratio of the two thin film platinum resistors under different working conditions can be obtained. The heat flux density ratio is defined as S and satisfies the following equation: q1=h(T t -T w1 ) q2=h(T t -T w2 ) Where, q1, q2——heat flux density of thin film thermal resistor, unit W / m 2 ; Tw1, Tw2——Temperature measured by thin film thermal resistor, unit K; Tt——total temperature of the calibrated wind tunnel inflow, unit K. The ratio S of heat flux density under different calibration conditions can be obtained through the above calibration method; During the test measurement, when the incoming flow condition is known, the corresponding heat flux ratio S can be found from the calibration data. The total temperature T of the measured airflow can be calculated from the measured Tw1 and Tw2 data by the following formula: g : The present invention is based on a dynamic total temperature probe with double thin film platinum resistors. The temperature analysis transfer function coefficient is obtained through calibration experiments, the temperature measurement transfer function of the dynamic total temperature probe with double thin film platinum resistors is constructed, and the total airflow temperature of the measured flow field is reconstructed. The frequency response and measurement accuracy of the dynamic total temperature probe can be greatly improved. During measurement, only the incoming flow parameters need to be obtained, and there is no need to understand the physical properties of the measured medium.

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