Film platinum resistor dynamic total temperature probe for measuring narrow interstage two-dimensional flow field

Abstract

The invention belongs to the technical field of dynamic temperature testing, and particularly relates to a film platinum resistor dynamic total temperature probe for measuring a narrow interstage two-dimensional flow field, which comprises a probe head, a positioning block, a film platinum resistor, a probe support rod, a lead hole and a circular pipeline. The probe head and the probe support rod are cylindrical, a circular pipeline is arranged in the probe support rod, a positioning block is additionally arranged at the tail part of the probe support rod, three lead holes are formed in the cylindrical surface of the probe head, film platinum resistors are arranged on the lead holes, and leads of the film platinum resistors are connected with external acquisition equipment through the lead holes and the circular pipeline. Compared with an existing temperature probe, through calibration of a calibration wind tunnel, the change of the total temperature, the static temperature, the deflection angle and the Mach number of the narrow interstage flow field of the turbomachinery along with time can be measured, and a means for efficiently and accurately measuring two-dimensional unsteady flow field parameters is provided for narrow interstage experiments of the turbomachinery.

Description

Technical Field

[0001] The present invention belongs to the technical field of dynamic temperature testing, and specifically relates to a thin-film platinum resistor dynamic total temperature probe for measuring a two-dimensional flow field between narrow stages. The probe is suitable for measuring transient information of a two-dimensional unsteady flow field between narrow stages of a turbomachinery. The core of the probe is to quickly and accurately measure and monitor the transient total temperature, static temperature, deflection angle and Mach number changes of the two-dimensional unsteady flow field between narrow stages of the turbomachinery. Background Art

[0002] The space between the stages of the turbomachinery is narrow, especially the gap between the later stages is smaller. Since the flow field between the stages is affected by the sweep of the impeller wake, leakage vortex, corner vortex and other secondary flows, the flow field has strong non-steady and swirling properties. This makes it very difficult to quickly and accurately obtain the change of the temperature field between the stages of the turbomachinery over time. For turbomachinery researchers, they hope to obtain the dynamic temperature distribution and airflow direction angle between the stages of the turbomachinery to verify the design and flow field diagnosis in order to improve the performance of the machine. Therefore, in order to quickly and accurately obtain the transient temperature field between the stages of the turbomachinery, more targeted testing methods must be developed.

[0003] At present, dynamic pressure probes are often used to obtain the deflection angle information of the incoming flow. Because the dynamic pressure sensor is affected by the test incoming flow temperature, the maximum test incoming flow temperature does not exceed 200°C under the premise of ensuring accuracy, which greatly limits its scope of use. Thin-film platinum resistance temperature sensors can be used in environments up to 800°C. For the total temperature of the flow field, thermocouple temperature sensors are often used to obtain the dynamic temperature signal of the flow field. However, due to limited frequency, the filament thermocouple temperature sensor with the highest frequency response cannot fully meet the test requirements of the transient temperature field at the inlet, outlet and stage of the impeller under special working conditions. Compared with thin-film platinum resistance temperature sensors, thermocouples have lower accuracy. During long-term use, thermocouples may increase measurement errors due to material aging and thermoelectric effect drift, and are easily affected by environmental factors. Hot-wire temperature probes have extremely fast thermal response time and can quickly capture transient changes in temperature and flow. Hot-wire temperature probes are usually very small and have high spatial resolution, but they are usually made of very thin metal wires. The manufacturing and maintenance costs of hot-wire temperature probes are high, and they are easy to break and damage. Their durability is poor, which increases the test cost and unreliability. When thermocouple temperature sensors and hot-wire temperature probes are used, they can only measure the total temperature, and cannot obtain the deflection angle and pitch angle changes of the high-subsonic three-dimensional unsteady flow field of the impeller machinery.

[0004] Therefore, in order to quickly and accurately obtain the transient temperature deflection angle between compressor stages, it is urgent to develop a fast, high-precision, airflow-resistant, low-spatial-resolution, and low-flow-field-interference testing technology to achieve accurate measurement of the dynamic temperature and deflection angle of the unsteady flow field, and provide reliable measurement means and technical support for the high-performance design and optimization of impeller machinery. Summary of the invention

[0005] The invention discloses a thin film platinum resistor dynamic total temperature probe for measuring a narrow interstage two-dimensional flow field. The probe comprises a probe head, a positioning block, a left thin film platinum resistor, a middle thin film platinum resistor, a right thin film platinum resistor, a probe support rod, a circular pipe and a lead hole. The probe head and the probe support rod are both cylindrical structures. The left thin film platinum resistor, the middle thin film platinum resistor and the right thin film platinum resistor are installed on the probe head. Three mutually unconnected lead holes are opened on the cylindrical surface. The left thin film platinum resistor, the middle thin film platinum resistor and the right thin film platinum resistor are respectively installed on the lead holes. A circular pipe is opened inside the probe support rod along the axial direction. The wires of the thin film thermal resistor are connected to external collection equipment through the lead holes and the circular pipe.

[0006] When in use, as the temperature changes, the resistance value of the thin film platinum resistor will also change accordingly, and the relationship is as follows:

[0007] R t =R0[1+AT+BT 2 ]

[0008] Among them, R0 is the resistance value at 0℃, and A and B are the graduation constants. Place the probe in the measured flow field. When the temperature of the measured flow field changes, before the formal test, statically calibrate the three thin film platinum resistors. To achieve higher precision measurement, it is necessary to use a standard temperature device and a standard resistance meter to calibrate a specific platinum resistor to obtain its characteristic curve, that is, to obtain the coefficients of each item in the characteristic curve, which is used to convert resistance value to temperature during measurement. Static calibration is performed, and the steps are as follows: connect the calibrated thin film platinum resistor sensor to a high-precision resistance meter and place it in the constant temperature bath of the dry-type metrology furnace to ensure that the calibrated thin film platinum resistor sensor is located in the center of the constant temperature bath of the dry-type metrology furnace to avoid contact between the calibrated sensor and the wall of the constant temperature bath. After completing the above installation preparations, turn on the dry-type metrology furnace and adjust it to the calibration point temperature value. After the reading is stable, wait for more than 30 minutes until the calibrated thin film platinum resistor sensor reaches thermal equilibrium (the reading of the thin film platinum resistor sensor remains unchanged). The calibration temperature point selection includes 0℃, and the temperature calibration is performed according to the actual temperature measurement range, and the calibration is performed every 10℃.

[0009] The thin-film platinum resistance sensor is placed at 0°C and two other temperature points within the measurement range to measure the resistance value, which is called the "three-point calibration method". The following equations can be obtained:

[0010]

[0011] The combined solution can be obtained:

[0012]

[0013] Finally, the temperature measurement formula of platinum resistance within the calibration range is obtained:

[0014]

[0015] After the above static calibration, the calibrated graduation constants A and B and the calculation formula for the measured temperature are obtained through data processing methods.

[0016] After the static calibration, a wide range calibration is performed in a calibration wind tunnel, the calibration speed range is 0.1 Mach to 1.4 Mach, and the deflection angle range is -80° to 80°; a thin film platinum resistor dynamic total temperature probe data processing method for measuring a narrow interstage two-dimensional flow field is used to obtain calibration curves of different deflection angles-deflection angle coefficients, deflection angles-total temperature coefficients, and deflection angles-static temperature coefficients at each Mach number. The thin film platinum resistor dynamic total temperature probe data processing method for measuring a narrow interstage two-dimensional flow field is as follows:

[0017] Define the deflection angle coefficient:

[0018]

[0019] Define the overall temperature coefficient:

[0020]

[0021] Define the static temperature coefficient:

[0022]

[0023] Wherein, yaw is the rotation deflection angle of the probe, T1, T2, and T3 are the calibration temperature data of the middle thin film platinum resistor, the left thin film platinum resistor, and the right thin film platinum resistor under different airflow deflection angles α, Tt is the total temperature of the calibration wind tunnel inflow, and Ts is the static temperature of the calibration wind tunnel inflow;

[0024] The present invention provides a thin-film platinum resistance dynamic total temperature probe for measuring a narrow interstage two-dimensional flow field. The technical problems to be solved are: first, the problem of insufficient accuracy of existing dynamic temperature probes is solved. Second, the problem that existing dynamic temperature probes are limited by the low frequency response of traditional dynamic temperature sensors is solved. Third, the problem that existing dynamic temperature probes cannot measure deflection angles, static temperatures, and Mach numbers is solved.

[0025] The technical solution of the present invention is:

[0026] 1. A thin film platinum resistor dynamic total temperature probe for measuring a narrow interstage two-dimensional flow field, comprising a probe head (1), a positioning block (2), a left thin film platinum resistor (3), a middle thin film platinum resistor (4), a right thin film platinum resistor (5), a probe support rod (6), a circular pipe (7), and a lead hole (8), characterized in that: the probe head (1) and the probe support rod (6) are both cylindrical structures, the left thin film platinum resistor (3), the middle thin film platinum resistor (4) and the right thin film platinum resistor (5) are installed on the probe head (1), three lead holes (8) that are not connected to each other are opened on the cylindrical surface, the left thin film platinum resistor (3), the middle thin film platinum resistor (4) and the right thin film platinum resistor (5) are respectively installed on the lead holes (8), the probe support rod (6) is opened with a circular pipe (7) along the axial direction, and the wire of the thin film thermal resistor is connected to an external collection device through the lead hole (8) and the circular pipe (7).

[0027] 2. Probe head (1) The diameter D of the cylinder is in the range of 2 mm ≤ D ≤ 10 mm. The probe head is made of insulating material to reduce the heat conduction between the sensing part and the substrate during the measurement of the thin film platinum resistance and improve the dynamic response of the thin film platinum resistance total temperature probe.

[0028] 3. The probe support rod (6) is a cylinder, and the diameter of the cylinder is d, and the value range of d is 2 mm ≤ d ≤ 10 mm. The probe support rod (6) is provided with a circular pipe (7) along the axial inside, and the diameter of the circular pipe is a, and the value range of a is 1 mm ≤ a ≤ 8 mm. The thin film platinum resistance wire passes through the lead hole (8) and is connected to the external collection equipment through the circular pipe (7).

[0029] 4. The cross section of the positioning block (2) is a regular quadrilateral, and the cross section shape can be a regular pentagon, a regular hexagon or a regular heptagon. The center line of the cross section and the center line of the thin film platinum resistor (4) are in the same plane as the axis of the probe support rod (6). The thickness of the positioning block is a, and the value range of a is 2 mm ≤ d ≤ 10 mm. The distance between the positioning block (2) and the bottom of the probe support rod (6) is b, and the value range of b is 5 mm ≤ b ≤ 20 mm.

[0030] 5. A left thin-film platinum resistor (3), a middle thin-film platinum resistor (4), and a right thin-film platinum resistor (5) are respectively installed on the three lead holes (8), and the plane where the center of the lead hole (8) is located is parallel to the bottom surface of the probe support rod (6), and the distance is 1 to 5 mm; the positions of the left thin-film platinum resistor (3) and the right thin-film platinum resistor (5) are symmetrically distributed with respect to the center line of the middle thin-film platinum resistor (4) and the center line of the cylinder, and the angle between the center lines of the left thin-film platinum resistor (3) and the right thin-film platinum resistor (5) is 60° to 100°.

[0031] 6. The left thin-film platinum resistor (3), the middle thin-film platinum resistor (4), and the right thin-film platinum resistor (5) are respectively installed on the corresponding lead holes (8). The left thin-film platinum resistor (3), the middle thin-film platinum resistor (4), and the right thin-film platinum resistor (5) are made of the same material and size. The left thin-film platinum resistor (3), the middle thin-film platinum resistor (4), the right thin-film platinum resistor (5), and the upper thin-film platinum resistor (6) are all miniature four-wire thin-film platinum resistors with a length of 0.5 mm to 3 mm, a width of 0.1 mm to 1.5 mm, and a thickness of 0.01 mm to 0.2 mm. The four-wire measurement can effectively eliminate the influence of the lead resistance on the measurement result, improve the measurement accuracy, and ensure the stability and accuracy of the data.

[0032] The present invention provides a thin-film platinum resistance dynamic total temperature probe for measuring a narrow interstage two-dimensional flow field, which has the following beneficial effects:

[0033] Beneficial effect 1: After being calibrated in a calibration wind tunnel, the present invention can obtain the transient total temperature, static temperature, deflection angle, and Mach number information of the incoming flow according to a unique data processing method.

[0034] Beneficial effect 2: After being calibrated in a calibration wind tunnel and a constant temperature furnace calibration box, the present invention can improve measurement accuracy and obtain deflection angle information; it provides an efficient and accurate means for testing unsteady flow fields between compressor stages.

[0035] Beneficial effect three: The probe of the present invention has a self-positioning function, the positioning block forms a positioning reference, the probe is easy and convenient to install, does not need to be rotated during measurement, has no periodicity requirements for the measured flow field, and has a wide range of applications.

[0036] Beneficial effect four: The probe head of the present invention has a simple and compact structure, is "I"-shaped, and has a small size. The three thin-film platinum resistors are arranged vertically, which improves the spatial resolution of the probe and is suitable for measurement between compressor stages.

[0037] Beneficial effect 5: The thin-film platinum resistor of the present invention is small in size and is a four-wire platinum resistor with high measurement accuracy. The sensing part is not affected by the structure of the probe itself and is the first to sense the pulsation of the incoming flow. The flow field information is not distorted and the measurement accuracy is high. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] Figure 1 The schematic diagram is a structural diagram of a thin-film platinum resistance dynamic total temperature probe for measuring a narrow interstage two-dimensional flow field in an embodiment of the present invention.

[0039] Figure 2 yes Figure 1 Top view of the .

[0040] Figure 3 yes Figure 1 Side view of.

[0041] Figure 4yes Figure 1 A-section view.

[0042] Figure 5 yes Figure 1 B-direction cross-sectional view.

[0043] Figure 6 yes Figure 5 A partial enlarged view of .

[0044] Figure 7 Figure 1 C-section view.

[0045] Among them: 1-probe head, 2-positioning block, 3-left thin film platinum resistor, 4-middle thin film platinum resistor, 5-right thin film platinum resistor, 6-probe support rod, 7-circular pipe, 8-lead hole. DETAILED DESCRIPTION

[0046] The present invention is described in detail below in conjunction with the accompanying drawings and specific implementation examples so that the advantages and features of the present invention can be more easily understood by those skilled in the art, thereby making a clearer and more definite definition of the protection scope of the present invention.

[0047] like Figures 1 to 7 The present invention shows a thin film platinum resistor dynamic total temperature probe for measuring a narrow interstage two-dimensional flow field, which is composed of a probe head (1), a positioning block (2), a left thin film platinum resistor (3), a middle thin film platinum resistor (4), a right thin film platinum resistor (5), a probe support rod (6), a circular pipe (7), and a lead hole (8). The present invention is characterized in that: the probe head (1) and the probe support rod (6) are both cylindrical structures, the left thin film platinum resistor (3), the middle thin film platinum resistor (4) and the right thin film platinum resistor (5) are installed on the probe head (1), three lead holes (8) that are not connected to each other are opened on the cylindrical surface, the left thin film platinum resistor (3), the middle thin film platinum resistor (4) and the right thin film platinum resistor (5) are respectively installed on the lead holes (8), the probe support rod (6) is opened with a circular pipe (7) along the axial direction, and the wire of the thin film thermal resistor is connected to the external collection equipment through the lead hole (8) and the circular pipe (7);

[0048] The diameter D of the cylinder of the probe head (1) is 10 mm.

[0049] The probe support rod (6) is a cylinder, and the diameter of the cylinder is d, and the value of d is 10 mm; the probe support rod (6) is provided with a circular pipe (7) along the axial direction, and the diameter of the circular pipe is a, and the value of a is 6 mm. The thin film platinum resistance wire passes through the lead hole (8) and is connected to the external collection equipment through the circular pipe (7);

[0050] The cross section of the positioning block (2) is a regular quadrilateral, the center line of the cross section and the center line of the thin film platinum resistor (4) are in the same plane as the axis of the probe support rod (6), the thickness of the positioning block (2) is a, the value of a is 5 mm, the distance between the bottom of the positioning block (2) and the bottom of the probe support rod (6) is b, the value of b is 15 mm;

[0051] The left thin-film platinum resistor (3), the middle thin-film platinum resistor (4), and the right thin-film platinum resistor (5) are respectively installed on the three lead holes (8), and the plane where the center of the lead hole (8) is located is parallel to the bottom surface of the probe support rod (6), and the distance is 3 mm; the positions of the left thin-film platinum resistor (3) and the right thin-film platinum resistor (5) are symmetrically distributed with respect to the center line of the middle thin-film platinum resistor (4) and the center line of the cylinder, and the angle between the center lines of the left thin-film platinum resistor (3) and the right thin-film platinum resistor (5) is 60°.

[0052] The left thin film platinum resistor (3), the middle thin film platinum resistor (4), and the right thin film platinum resistor (5) are respectively installed on the corresponding lead holes (8). The left thin film platinum resistor (3), the middle thin film platinum resistor (4), and the right thin film platinum resistor (5) are made of the same material and size. The left thin film platinum resistor (3), the middle thin film platinum resistor (4), the right thin film platinum resistor (5), and the upper thin film platinum resistor (6) are all miniature four-wire thin film platinum resistors with a length of 1 mm, a width of 0.5 mm, and a thickness of 0.1 mm. The four-wire measurement can effectively eliminate the influence of the lead resistance on the measurement result, improve the measurement accuracy, and ensure the stability and accuracy of the data.

[0053] A thin-film platinum resistor dynamic total temperature probe for measuring a narrow interstage two-dimensional flow field is first calibrated. As the temperature changes, the resistance value of the thin-film platinum resistor will also change. The relationship is as follows:

[0054] R t =R0[1+AT+BT 2 ]

[0055] Among them, R0 is the resistance value at 0℃, and A and B are the graduation constants. Place the probe in the measured flow field. When the temperature of the measured flow field changes, the four thin film platinum resistors are statically calibrated before the formal test. To achieve higher precision measurement, it is necessary to use a standard temperature device and a standard resistance meter to calibrate a specific platinum resistor to obtain its characteristic curve, that is, to obtain the coefficients of each item in the characteristic curve, which is used to convert resistance value to temperature during measurement. Static calibration is performed, and the steps are as follows: connect the calibrated thin film platinum resistor sensor to a high-precision resistance meter and place it in the constant temperature bath of the dry-type metrology furnace to ensure that the calibrated thin film platinum resistor sensor is located in the center of the constant temperature bath of the dry-type metrology furnace to avoid contact between the calibrated sensor and the wall of the constant temperature bath. After completing the above installation preparations, turn on the dry-type metrology furnace and adjust it to the calibration point temperature value. After the reading is stable, wait for more than 30 minutes until the calibrated thin film platinum resistor sensor reaches thermal equilibrium (the reading of the thin film platinum resistor sensor remains unchanged). The calibration temperature point selection includes 0℃, and the temperature calibration is performed according to the actual temperature measurement range, and the calibration is performed every 10℃.

[0056] The thin-film platinum resistance sensor is placed at 0°C and two other temperature points within the measurement range to measure the resistance value, which is called the "three-point calibration method". The following equations can be obtained:

[0057]

[0058] The combined solution can be obtained:

[0059]

[0060]

[0061] Finally, the temperature measurement formula of platinum resistance within the calibration range is obtained:

[0062]

[0063] After the above static calibration, the calibrated graduation constants A and B and the calculation formula for the measured temperature are obtained through data processing methods.

[0064] After the static calibration, a wide range calibration is performed in a calibration wind tunnel, the calibration speed range is 0.1 Mach to 1.4 Mach, the interval is 0.1 Mach; the deflection angle range is -80° to 80°, the interval is 5°; through a thin film platinum resistor dynamic total temperature probe data processing method for measuring a narrow interstage two-dimensional flow field, a calibration curve of different deflection angle-deflection angle coefficient, deflection angle-total temperature coefficient and deflection angle-static temperature coefficient is obtained at each Mach number, and the thin film platinum resistor dynamic total temperature probe data processing method for measuring a narrow interstage two-dimensional flow field is as follows:

[0065] Define the deflection angle coefficient:

[0066]

[0067] Define the overall temperature coefficient:

[0068]

[0069] Define the static temperature coefficient:

[0070]

[0071] Wherein, yaw is the rotation deflection angle of the probe, T1, T2, and T3 are the calibration temperature data of the middle thin film platinum resistor, the left thin film platinum resistor, and the right thin film platinum resistor under different airflow deflection angles α, Tt is the total temperature of the calibration wind tunnel inflow, and Ts is the static temperature of the calibration wind tunnel inflow;

[0072] According to the above definition, the calibration curves of deflection angle-deflection angle coefficient, deflection angle-total temperature coefficient and deflection angle-static temperature coefficient at different deflection angles for each incoming flow Mach number are calculated;

[0073] During real-time measurement, the deflection angle coefficient is calculated by the incoming flow temperature sensed by the thin film platinum resistor, the deflection angle is calculated using the calibration grid, and then the total temperature coefficient is interpolated on the deflection angle-total temperature coefficient calibration curve, and then the total temperature is calculated. The static temperature coefficient is interpolated on the deflection angle-static temperature coefficient calibration curve, and then the static temperature is calculated, and then the outflow Mach number is calculated based on the total temperature and static temperature.

Claims

1. A thin film platinum resistor dynamic total temperature probe for measuring a narrow interstage two-dimensional flow field, comprising a probe head (1), a positioning block (2), a left thin film platinum resistor (3), a middle thin film platinum resistor (4), a right thin film platinum resistor (5), a probe support rod (6), a circular pipe (7), and a lead hole (8), characterized in that: The probe head (1) and the probe support rod (6) are both cylindrical structures. A left thin-film platinum resistor (3), a middle thin-film platinum resistor (4) and a right thin-film platinum resistor (5) are installed on the probe head (1). Three mutually unconnected lead holes (8) are opened on the cylindrical surface. The left thin-film platinum resistor (3), the middle thin-film platinum resistor (4) and the right thin-film platinum resistor (5) are respectively installed on the lead holes (8). A circular pipe (7) is opened inside the probe support rod (6) along the axial direction. The wires of the thin-film thermal resistors are connected to external data collection equipment through the lead holes (8) and the circular pipe (7). The diameter D of the cylinder of the probe head (1) is in the range of 2 mm ≤ D ≤ 10 mm. The probe head is made of heat-insulating material to reduce the heat conduction between the sensing part and the substrate during the measurement of the thin film platinum resistance and improve the dynamic response of the thin film platinum resistance total temperature probe; The probe support rod (6) is a cylinder, and the diameter of the cylinder is d, and the value range of d is 2 mm ≤ d ≤ 10 mm; the probe support rod (6) is provided with a circular pipe (7) along the axial direction, and the diameter of the circular pipe is a, and the value range of a is 1 mm ≤ a ≤ 8 mm. The thin film platinum resistance wire passes through the lead hole (8) and is connected to the external collection equipment through the circular pipe (7); The cross section of the positioning block (2) is a regular quadrilateral, and the cross section shape can be a regular pentagon, a regular hexagon or a regular heptagon. The center line of the cross section and the center line of the thin film platinum resistor (4) are in the same plane as the axis of the probe support rod (6). The thickness of the positioning block is a, and the value range of a is 2 mm ≤ d ≤ 10 mm. The distance between the positioning block (2) and the bottom of the probe support rod (6) is b, and the value range of b is 5 mm ≤ b ≤ 20 mm. A left thin-film platinum resistor (3), a middle thin-film platinum resistor (4), and a right thin-film platinum resistor (5) are respectively installed on the three lead holes (8), and the plane where the center of the lead hole (8) is located is parallel to the bottom surface of the probe support rod (6), and the distance is 1 to 5 mm; the positions of the left thin-film platinum resistor (3) and the right thin-film platinum resistor (5) are symmetrically distributed with respect to the center line of the middle thin-film platinum resistor (4) and the center line of the cylinder, and the included angle between the center lines of the left thin-film platinum resistor (3) and the right thin-film platinum resistor (5) is 60° to 100°; The left thin film platinum resistor (3), the middle thin film platinum resistor (4), and the right thin film platinum resistor (5) are respectively installed on the corresponding lead holes (8). The left thin film platinum resistor (3), the middle thin film platinum resistor (4), and the right thin film platinum resistor (5) are made of the same material and size. The left thin film platinum resistor (3), the middle thin film platinum resistor (4), and the right thin film platinum resistor (5) are all miniature four-wire thin film platinum resistors with a length of 0.5 mm to 3 mm, a width of 0.1 mm to 1.5 mm, and a thickness of 0.01 mm to 0.2 mm. The four-wire measurement can effectively eliminate the influence of the lead resistance on the measurement result, improve the measurement accuracy, and ensure the stability and accuracy of the data. The present invention proposes a data processing method based on a thin-film platinum resistor dynamic total temperature probe for measuring a narrow interstage two-dimensional flow field. A wide range calibration is performed on the thin-film platinum resistor dynamic total temperature probe for measuring a narrow interstage two-dimensional flow field in a calibration wind tunnel, the calibration speed range is 0.1 Mach to 1.4 Mach, and the deflection angle range is -80° to 80°; by using a data processing method for a thin-film platinum resistor dynamic total temperature probe for measuring a narrow interstage two-dimensional flow field, calibration curves of different deflection angles-deflection angle coefficients, deflection angles-total temperature coefficients and deflection angles-static temperature coefficients at each Mach number are obtained. The data processing method for a thin-film platinum resistor dynamic total temperature probe for measuring a narrow interstage two-dimensional flow field is as follows: Define the deflection angle coefficient: Define the overall temperature coefficient: Define the static temperature coefficient: Wherein, yaw is the rotation deflection angle of the probe, T1, T2, and T3 are the calibration temperature data of the middle thin film platinum resistor, the left thin film platinum resistor, and the right thin film platinum resistor under different airflow deflection angles α, Tt is the total temperature of the calibration wind tunnel inflow, and Ts is the static temperature of the calibration wind tunnel inflow; According to the above definition, the calibration curves of deflection angle-deflection angle coefficient, deflection angle-total temperature coefficient and deflection angle-static temperature coefficient at different deflection angles for each incoming flow Mach number are calculated; In actual measurement, the deflection angle coefficient is calculated from the temperature data measured by each thin film platinum resistor, and the deflection angle is calculated using the calibration curve obtained by the above calibration experiment; then, the total temperature coefficient is obtained by interpolation on the deflection angle-total temperature coefficient calibration curve, and the total temperature is calculated by reverse calculation based on the definition of the total temperature coefficient; similarly, the static temperature coefficient is obtained by interpolation on the deflection angle-static temperature coefficient calibration curve, and the static temperature is calculated by reverse calculation based on the definition of the static temperature coefficient; finally, the incoming flow Mach number is calculated based on the obtained total airflow temperature and static temperature; The present invention is based on a dynamic total temperature probe of a thin film platinum resistor. The temperature resistance of the thin film platinum resistor is better than that of a dynamic pressure sensor. The total temperature, static temperature, deflection angle and Mach number of the downflow in a high temperature environment can be obtained through calibration tests and measurement data processing methods.

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