Acceleration test fixture, acceleration test equipment and acceleration test method for piezoelectric ceramic piece

Abstract

According to the acceleration test fixture, the test equipment and the test method of the piezoelectric ceramic piece, when the piezoelectric ceramic piece is placed on the acceleration test fixture, the annular supporting assembly achieves appearance positioning of the piezoelectric ceramic piece, the middle of the piezoelectric ceramic piece is suspended, and the magnetic attraction assembly is automatically attracted to the piezoelectric ceramic piece. The piezoelectric ceramic piece is connected with acceleration testing equipment through the annular supporting assembly, the corresponding wire, the magnetic attraction assembly and the corresponding wire. In the testing process, the piezoelectric ceramic piece only needs to be placed on the acceleration testing clamp, a wire does not need to be welded to the piezoelectric ceramic piece, and the piezoelectric ceramic piece does not need to be bonded to the clamp either, so that nondestructive testing can be conducted on the piezoelectric ceramic piece, the accuracy of the testing result is improved, large-scale mass production testing is achieved, and the testing cost is reduced.

Description

Technical Field

[0001] The present application relates to the technical field of piezoelectric material testing, and in particular to an acceleration testing fixture, testing equipment and testing method for a piezoelectric ceramic sheet. Background Art

[0002] Piezoelectric ceramic sheets are shipped without wires. When performing acceleration tests on piezoelectric ceramic sheets, wires need to be welded to the piezoelectric ceramic sheets to transmit electrical signals, and the piezoelectric ceramic sheets are bonded to the fixture with adhesive so that they are suspended in the middle before performing acceleration tests. In the above test scheme, the presence of wires will destroy the integrity of the piezoelectric ceramic sheets and affect the test data. The way the piezoelectric ceramic sheets are fixed also has an adverse effect on the accuracy of the test results. Summary of the invention

[0003] The purpose of the embodiments of the present application is to provide an acceleration test fixture, test equipment and test method for a piezoelectric ceramic sheet, so as to solve the problem that the existing test scheme requires welding wires and adhesive bonding, which affects the integrity of the piezoelectric ceramic sheet and causes inaccurate test results.

[0004] An acceleration test fixture for a piezoelectric ceramic sheet provided in an embodiment of the present application includes: a base, an annular support assembly and a magnetic attraction assembly; the annular support assembly is fixedly mounted on the base, the magnetic attraction assembly is placed on the base and the magnetic attraction assembly is arranged at the center of the annular support assembly;

[0005] A groove is provided on the inner side of the top of the annular support component, and the groove is used to support the edge of the piezoelectric ceramic sheet so that the middle part of the piezoelectric ceramic sheet is suspended;

[0006] When the piezoelectric ceramic sheet is placed on the annular support assembly, the magnetic attraction assembly is adsorbed on the center of the lower surface of the piezoelectric ceramic sheet;

[0007] The annular support component and the magnetic attraction component are both made of conductive materials. The annular support component is connected to one end of the driving module through a first wire, and the magnetic attraction component is connected to the other end of the driving module through a second wire.

[0008] In the above technical solution, when the piezoelectric ceramic piece is placed on the acceleration test fixture, the annular support assembly realizes the external positioning of the piezoelectric ceramic piece, and makes the middle of the piezoelectric ceramic piece suspended in the air, and the magnetic suction assembly is automatically adsorbed on the piezoelectric ceramic piece. The piezoelectric ceramic piece is connected to the acceleration test equipment through the annular support assembly and the corresponding wires, as well as the magnetic suction assembly and the corresponding wires. When testing, the piezoelectric ceramic piece only needs to be placed on the acceleration test fixture. There is no need to weld wires on the piezoelectric ceramic piece, nor is there any need to bond the piezoelectric ceramic piece to the fixture. Therefore, the piezoelectric ceramic piece can be tested non-destructively, which improves the accuracy of the test results, realizes large-scale mass production testing, and reduces the testing cost.

[0009] In some optional embodiments, it further includes: a limiting structure;

[0010] The limiting structure is fixedly mounted on the base, and the limiting structure is located at the center of the annular support assembly;

[0011] The limiting structure has a cavity for accommodating the magnetic attraction component, and the top of the limiting structure has a first opening;

[0012] The limiting structure limits the upward and downward movement of the magnetic suction component in the Z-axis direction;

[0013] When the piezoelectric ceramic sheet is placed on the annular support assembly, the magnetic attraction assembly rises and passes through the first opening, so that the magnetic attraction assembly is adsorbed on the piezoelectric ceramic sheet.

[0014] In the above technical solution, the limiting structure limits the up and down movement of the magnetic suction component in the Z-axis direction, so that the magnetic suction component will not be offset in the X-axis or Y-axis direction, thereby improving the accuracy of the test results.

[0015] In some optional embodiments, the annular support assembly has a notch; and the limiting structure is provided with a second opening near the notch;

[0016] The bottom end of the magnetic attraction component is connected to the second wire, and the second wire passes through the second opening and the notch in sequence and then is connected to the driving module.

[0017] In the above technical solution, the notch design on the annular support assembly allows the second wire to pass through more smoothly, avoiding interference between the wire and other parts of the clamp and improving space utilization. The second opening of the limiting structure arranged near the notch facilitates the connection of the second wire while maintaining the compactness of the clamp structure.

[0018] In some optional embodiments, a threaded hole is provided on the outer side of the annular support assembly, and the threaded hole is used to insert the first wire.

[0019] In the above technical solution, the design of the threaded hole enables the first wire to be fixed to the annular support assembly by a threaded connection. This connection method is more secure than the traditional plug-in or binding method, and can effectively prevent the wire from loosening or falling off due to vibration or external force during the test.

[0020] In some optional embodiments, the annular support assembly is fixed to the base by bolts.

[0021] In the above technical solution, bolt connection is a very stable connection method, which can ensure a tight connection between the annular support assembly and the base, and is not easily loosened due to vibration or external force. Fixing the annular support assembly to the base by bolts can significantly improve the overall rigidity of the fixture, so that the fixture can maintain a stable shape during the test and reduce test errors caused by deformation. Bolt connection is easy to install and disassemble. If different specifications of piezoelectric ceramic sheets need to be tested, different annular supports may need to be replaced. Through bolt connection, they can be easily removed for repair or replacement without disassembling the entire fixture.

[0022] An acceleration test device for a piezoelectric ceramic piece provided in an embodiment of the present application comprises: an acceleration test fixture for a piezoelectric ceramic piece as described in any one of the above items, a drive module, and an acceleration probe structure;

[0023] The acceleration probe structure is arranged above the acceleration test fixture; the acceleration test fixture is connected to the driving module through a first wire and a second wire;

[0024] During the test, the piezoelectric ceramic sheet is placed on the acceleration test fixture, and the test contact head of the acceleration probe structure is brought into contact with the top surface of the piezoelectric ceramic sheet.

[0025] In the above technical solution, the acceleration test fixture includes an annular support component, a limit structure, a magnetic suction component, etc., which can stably support the piezoelectric ceramic sheet and ensure that the position and posture of the piezoelectric ceramic sheet remain unchanged during the test. The drive module is responsible for providing the required excitation signal to the piezoelectric ceramic sheet to trigger its vibration. The module is connected to the acceleration test fixture through a first wire and a second wire, and can accurately control the parameters such as the amplitude, frequency and waveform of the excitation signal. The acceleration probe structure is arranged above the acceleration test fixture, and its test contact head contacts the top surface of the piezoelectric ceramic sheet. The probe structure can accurately measure the acceleration response of the piezoelectric ceramic sheet under the action of the excitation signal.

[0026] In some optional embodiments, the acceleration probe structure includes: an acceleration sensor assembly and a test contact head;

[0027] The acceleration sensor assembly is connected to the top end of the test contact head, and the bottom end of the test contact head is used to contact the piezoelectric ceramic piece.

[0028] In some optional embodiments, it further includes: a linear guide shaft, a probe fixing plate and a linear bearing;

[0029] The linear bearing is fixedly connected to the probe fixing plate;

[0030] The top end of the acceleration sensor assembly is connected to a linear guide shaft, the linear guide shaft passes through a linear bearing, and the linear guide shaft moves freely along a Z direction in the linear bearing.

[0031] In some optional embodiments, it further includes: a bottom plate;

[0032] The probe fixing plate is fixedly connected to the base plate through a column;

[0033] The base of the acceleration test fixture is fixed to the bottom plate by bolts.

[0034] An acceleration testing method provided in an embodiment of the present application is applied to an acceleration testing device for a piezoelectric ceramic sheet as described in any one of the above items, and the method comprises:

[0035] Place the piezoelectric ceramic sheet on the acceleration test fixture;

[0036] Placing a test contact head of the accelerometer structure in contact with a top surface of the piezoelectric ceramic sheet;

[0037] Using a driving module to drive the piezoelectric ceramic piece to vibrate;

[0038] The piezoelectric ceramic piece vibrates and drives the acceleration probe structure to vibrate, and the acceleration sensor component of the acceleration probe structure senses the vibration to obtain the acceleration value. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments of the present application will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0040] Figure 1 A structural diagram of an acceleration test fixture for a piezoelectric ceramic sheet provided in an embodiment of the present application;

[0041] Figure 2 A cross-sectional view of the acceleration test fixture provided in an embodiment of the present application when no piezoelectric ceramic sheet is placed;

[0042] Figure 3 A cross-sectional view of an acceleration test fixture for placing a piezoelectric ceramic sheet provided in an embodiment of the present application;

[0043] Figure 4 A schematic diagram of an acceleration testing device for a piezoelectric ceramic sheet provided in an embodiment of the present application;

[0044] Figure 5 A flowchart of the steps of an acceleration testing method provided in an embodiment of the present application.

[0045] Icon: 1-acceleration test fixture, 11-base, 12-ring support assembly, 13-magnetic assembly, 14-limiting structure, 2-piezoelectric ceramic sheet, 3-test contact head, 4-acceleration sensor assembly, 5-linear bearing, 6-linear guide shaft, 7-probe fixing plate, 8-column, 9-base plate. DETAILED DESCRIPTION

[0046] The technical solutions in the embodiments of the present application will be described below in conjunction with the drawings in the embodiments of the present application.

[0047] Please refer to Figure 1 , Figure 1 A structural diagram of an acceleration test fixture for a piezoelectric ceramic piece provided in an embodiment of the present application includes: a base 11, an annular support assembly 12 and a magnetic assembly 13; the annular support assembly 12 is fixedly mounted on the base 11, the magnetic assembly 13 is placed on the base 11 and the magnetic assembly 13 is arranged at the center of the annular support assembly 12; a groove is arranged on the inner side of the top of the annular support assembly 12, and the groove is used to support the edge of the piezoelectric ceramic piece 2 so that the middle part of the piezoelectric ceramic piece 2 is suspended; when the piezoelectric ceramic piece 2 is placed on the annular support assembly 12, the magnetic assembly 13 is adsorbed on the center of the lower surface of the piezoelectric ceramic piece 2; the annular support assembly 12 and the magnetic assembly 13 are both made of conductive materials, the annular support assembly 12 is connected to one end of the driving module through a first wire, and the magnetic assembly 13 is connected to the other end of the driving module through a second wire.

[0048] The annular support component 12 may be made of copper conductive material. The magnetic attraction component 13 may be made of copper conductive material, and magnetic material may be embedded in the interior. The piezoelectric ceramic sheet of this embodiment is a circular structure, and the annular support component is a circular ring structure.

[0049] Please refer to Figure 2 , Figure 2 This is a cross-sectional view of the acceleration test fixture provided in an embodiment of the present application when no piezoelectric ceramic sheet is placed. When no piezoelectric ceramic sheet 2 is placed, the magnetic attraction component 13 is stationary on the base 11.

[0050] Please refer to Figure 3 , Figure 3 This is a cross-sectional view of the acceleration test fixture for placing a piezoelectric ceramic sheet provided in an embodiment of the present application. After the piezoelectric ceramic sheet 2 is placed, the magnetic suction component 13 rises until it is adsorbed on the piezoelectric ceramic sheet 2.

[0051] In the above technical solution, when the piezoelectric ceramic piece 2 is placed on the acceleration test fixture 1, the annular support component 12 realizes the outer shape positioning of the piezoelectric ceramic piece 2, and makes the piezoelectric ceramic piece 2 suspended in the middle, and the magnetic suction component 13 is automatically adsorbed on the piezoelectric ceramic piece 2. The piezoelectric ceramic piece 2 is connected to the acceleration test equipment through the annular support component 12 and the corresponding wire, and the magnetic suction component 13 and the corresponding wire. When testing, the piezoelectric ceramic piece 2 only needs to be placed on the acceleration test fixture 1. There is no need to weld wires on the piezoelectric ceramic piece 2, nor is there any need to bond the piezoelectric ceramic piece 2 to the fixture. Therefore, the piezoelectric ceramic piece 2 can be tested non-destructively, the accuracy of the test results can be improved, large-scale mass production testing can be achieved, and the test cost can be reduced.

[0052] In some optional embodiments, it further includes: a limiting structure 14;

[0053] The limiting structure 14 is fixedly mounted on the base 11, and the limiting structure 14 is located at the center of the annular support assembly 12;

[0054] The limiting structure 14 has a cavity for accommodating the magnetic attraction component 13, and the top of the limiting structure 14 has a first opening;

[0055] The limiting structure 14 limits the magnetic attraction component 13 to move up and down in the Z-axis direction;

[0056] When the piezoelectric ceramic sheet 2 is placed on the annular support assembly 12 , the magnetic attraction assembly 13 rises and passes through the first opening, so that the magnetic attraction assembly 13 is adsorbed on the piezoelectric ceramic sheet 2 .

[0057] In the above technical solution, the limiting structure 14 limits the up and down movement of the magnetic attraction component 13 in the Z-axis direction, so that the magnetic attraction component 13 will not be offset in the X-axis or Y-axis direction, thereby improving the accuracy of the test result.

[0058] In some optional embodiments, the annular support assembly 12 has a notch; the limiting structure 14 is provided with a second opening near the notch;

[0059] The bottom end of the magnetic attraction component 13 is connected to the second wire, and the second wire passes through the second opening and the notch in sequence and then is connected to the driving module.

[0060] In the above technical solution, the notch design on the annular support assembly 12 allows the second wire to pass through more smoothly, avoiding interference between the wire and other parts of the clamp, and improving space utilization. The second opening of the limiting structure 14 near the notch provides convenience for the connection of the second wire while maintaining the compactness of the clamp structure.

[0061] In some optional embodiments, a threaded hole is provided on the outer side of the annular support assembly 12, and the threaded hole is used to insert the first wire.

[0062] In the above technical solution, the design of the threaded hole enables the first wire to be fixed together with the annular support assembly 12 by threaded connection. This connection method is more secure than the traditional plug-in or binding method, and can effectively prevent the wire from loosening or falling off due to vibration or external force during the test.

[0063] In some optional embodiments, the annular support assembly 12 is fixed to the base 11 by bolts.

[0064] In the above technical solution, bolt connection is a very stable connection method, which can ensure the tight connection between the annular support assembly 12 and the base 11, and is not easy to loosen due to vibration or external force. Fixing the annular support assembly 12 to the base 11 by bolts can significantly improve the overall rigidity of the fixture, so that the fixture can maintain a stable shape during the test and reduce the test error caused by deformation. The bolt connection has the characteristics of easy installation and disassembly. If it is necessary to test piezoelectric ceramic sheets 2 of different specifications, different annular supports may need to be replaced. Through the bolt connection, it can be easily removed for maintenance or replacement without disassembling the entire fixture.

[0065] Please refer to Figure 4 , Figure 4 A schematic diagram of an acceleration test device for a piezoelectric ceramic sheet provided in an embodiment of the present application includes: an acceleration test fixture 1 for a piezoelectric ceramic sheet 2 as described in any one of the above items, a drive module, and an acceleration probe structure;

[0066] The acceleration probe structure is arranged above the acceleration test fixture 1; the acceleration test fixture 1 is connected to the driving module through a first wire and a second wire;

[0067] During the test, the piezoelectric ceramic sheet 2 is placed on the acceleration test fixture 1 , and the test contact head 3 of the acceleration probe structure is brought into contact with the top surface of the piezoelectric ceramic sheet 2 .

[0068] In the above technical solution, the acceleration test fixture 1 includes an annular support component 12, a limiting structure 14, a magnetic attraction component 13, etc., which can stably support the piezoelectric ceramic piece 2 and ensure that the position and posture of the piezoelectric ceramic piece 2 remain unchanged during the test. The driving module is responsible for providing the required excitation signal to the piezoelectric ceramic piece 2 to trigger its vibration. The module is connected to the acceleration test fixture 1 through a first wire and a second wire, and can accurately control the parameters such as the amplitude, frequency and waveform of the excitation signal. The acceleration probe structure is arranged above the acceleration test fixture 1, and its test contact head 3 contacts the top surface of the piezoelectric ceramic piece 2. The probe structure can accurately measure the acceleration response of the piezoelectric ceramic piece 2 under the action of the excitation signal.

[0069] In some optional embodiments, the acceleration probe structure includes: an acceleration sensor assembly 4 and a test contact head 3;

[0070] The acceleration sensor assembly 4 is connected to the top end of the test contact head 3 , and the bottom end of the test contact head 3 is used to contact the piezoelectric ceramic sheet 2 .

[0071] In some optional embodiments, it further includes: a linear guide shaft 6, a probe fixing plate 7 and a linear bearing 5;

[0072] The linear bearing 5 is fixedly connected to the probe fixing plate 7;

[0073] The top end of the acceleration sensor assembly 4 is connected to the linear guide shaft 6 , and the linear guide shaft 6 passes through the linear bearing 5 . The linear guide shaft 6 can move freely along the Z direction in the linear bearing 5 .

[0074] In some optional embodiments, it further includes: a bottom plate 9;

[0075] The probe fixing plate 7 is fixedly connected to the base plate 9 via the column 8;

[0076] The base 11 of the acceleration test fixture 1 is fixed on the bottom plate 9 by bolts.

[0077] Please refer to Figure 5 , Figure 5 A flowchart of an acceleration testing method provided in an embodiment of the present application, the method is applied to an acceleration testing device of a piezoelectric ceramic sheet 2 as described in any one of the above items, the method comprising:

[0078] Step 100, placing the piezoelectric ceramic sheet 2 on the acceleration test fixture 1;

[0079] Step 200, contacting the test contact head 3 of the acceleration probe structure with the top surface of the piezoelectric ceramic sheet 2;

[0080] Step 300, using a driving module to drive the piezoelectric ceramic piece 2 to vibrate;

[0081] Step 400: The piezoelectric ceramic piece 2 vibrates and drives the acceleration probe structure to vibrate, and the acceleration sensor assembly 4 of the acceleration probe structure senses the vibration to obtain an acceleration value.

[0082] In the embodiments provided in the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. The device embodiments described above are merely schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some communication interfaces, and the indirect coupling or communication connection of the devices or units can be electrical, mechanical or other forms.

[0083] In addition, the units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0084] Furthermore, the functional modules in the various embodiments of the present application may be integrated together to form an independent part, or each module may exist separately, or two or more modules may be integrated to form an independent part.

[0085] In this document, relational terms such as first and second, etc. are used merely to distinguish one entity or operation from another entity or operation, but do not necessarily require or imply any such actual relationship or order between these entities or operations.

[0086] The above description is only an embodiment of the present application and is not intended to limit the protection scope of the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. An acceleration test fixture for a piezoelectric ceramic sheet, characterized in that: include: A base, an annular support assembly and a magnetic attraction assembly; the annular support assembly is fixedly mounted on the base, the magnetic attraction assembly is placed on the base and the magnetic attraction assembly is arranged at the center of the annular support assembly; A groove is provided on the inner side of the top of the annular support component, and the groove is used to support the edge of the piezoelectric ceramic sheet so that the middle part of the piezoelectric ceramic sheet is suspended; When the piezoelectric ceramic sheet is placed on the annular support assembly, the magnetic attraction assembly is adsorbed on the center of the lower surface of the piezoelectric ceramic sheet; The annular support component and the magnetic attraction component are both made of conductive materials. The annular support component is connected to one end of the driving module via a first wire, and the magnetic attraction component is connected to the other end of the driving module via a second wire.

2. The acceleration test fixture as claimed in claim 1, characterized in that: Also includes: Limiting structure; The limiting structure is fixedly mounted on the base, and the limiting structure is located at the center of the annular support assembly; The limiting structure has a cavity for accommodating the magnetic attraction component, and the top of the limiting structure has a first opening; The limiting structure limits the upward and downward movement of the magnetic attraction component in the Z-axis direction; When the piezoelectric ceramic sheet is placed on the annular support assembly, the magnetic attraction assembly rises and passes through the first opening, so that the magnetic attraction assembly is adsorbed on the piezoelectric ceramic sheet.

3. The acceleration test fixture as claimed in claim 2, characterized in that: The annular support assembly has a notch; the limiting structure is provided with a second opening near the notch; The bottom end of the magnetic attraction component is connected to the second wire, and the second wire passes through the second opening and the notch in sequence and then is connected to the driving module.

4. The acceleration test fixture as claimed in claim 1, characterized in that: A threaded hole is provided on the outer side of the annular support assembly, and the threaded hole is used to insert the first wire.

5. The acceleration test fixture as claimed in claim 1, characterized in that: The annular support assembly is fixed to the base by bolts.

6. An acceleration test device for a piezoelectric ceramic sheet, characterized in that: include: An acceleration test fixture for a piezoelectric ceramic sheet, a drive module, and an acceleration probe structure as described in any one of claims 1 to 4; The acceleration probe structure is arranged above the acceleration test fixture; The acceleration test fixture is connected to the driving module via a first wire and a second wire; During the test, the piezoelectric ceramic sheet is placed on the acceleration test fixture, and the test contact head of the acceleration probe structure is brought into contact with the top surface of the piezoelectric ceramic sheet.

7. The acceleration testing device according to claim 6, characterized in that: The acceleration probe structure comprises: an acceleration sensor assembly and a test contact head; The acceleration sensor assembly is connected to the top end of the test contact head, and the bottom end of the test contact head is used to contact the piezoelectric ceramic sheet.

8. The acceleration testing device according to claim 7, characterized in that: Also includes: Linear guide shafts, probe fixing plates and linear bearings; The linear bearing is fixedly connected to the probe fixing plate; The top end of the acceleration sensor assembly is connected to the linear guide shaft, the linear guide shaft passes through the linear bearing, and the linear guide shaft moves freely along the Z direction in the linear bearing.

9. The acceleration testing device according to claim 8, characterized in that: Also includes: Base plate; The probe fixing plate is fixedly connected to the base plate via a column; The base of the acceleration test fixture is fixed to the bottom plate by bolts.

10. An acceleration testing method, characterized in that: An acceleration testing device for a piezoelectric ceramic sheet as claimed in any one of claims 6 to 9, the method comprising: Place the piezoelectric ceramic sheet on the acceleration test fixture; Placing a test contact head of the accelerometer structure in contact with a top surface of the piezoelectric ceramic sheet; Using a driving module to drive the piezoelectric ceramic piece to vibrate; The piezoelectric ceramic piece vibrates and drives the acceleration probe structure to vibrate, and the acceleration sensor component of the acceleration probe structure senses the vibration to obtain the acceleration value.

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