A test method for detecting integrated circuit performance

Abstract

The present invention relates to the field of integrated circuit testing technology, and in particular to a testing method for detecting integrated circuit performance, including obtaining a detection voltage of a corresponding test contact in a circuit board; inputting test data into the circuit board, monitoring the data reporting frequency; filtering the circuit; determining whether the circuit board is qualified based on the detection voltage and the data volume of the test data, and when determining that the circuit board is abnormal, determining a processing method for the circuit board abnormality based on a voltage fluctuation parameter; when determining that the circuit board is qualified, or determining to issue an alarm message for the circuit board abnormality, testing the next circuit board. Obtaining the electrical parameters of the circuit board, detecting whether the circuit board is qualified, and when determining that the circuit board is abnormal, further adjusting the detection parameters of the circuit board based on the voltage fluctuation parameter, while improving the detection accuracy of the circuit board, further improving the detection efficiency of the circuit board.

Description

Technical Field

[0001] The present invention relates to the technical field of integrated circuit testing, and in particular to a testing method for detecting integrated circuit performance. Background Art

[0002] An integrated circuit is a miniature electronic device or component. Using a certain process, the transistors, resistors, capacitors, inductors and other components and wiring required in a circuit are interconnected and made on a small piece or several small pieces of semiconductor wafers or dielectric substrates, and then packaged in a tube shell to become a miniature structure with the required circuit function; all the components have formed a whole in structure, making electronic components a big step towards miniaturization, low power consumption, intelligence and high reliability.

[0003] Integrated circuits are new semiconductor devices. They are electronic devices that are manufactured through oxidation, photolithography, diffusion, epitaxy, aluminum evaporation and other semiconductor manufacturing processes. The semiconductors, resistors, capacitors and other components required to form a circuit with certain functions and the connecting wires between them are all integrated on a small piece of silicon wafer, and then welded and packaged in a tube shell. The package shell has many forms such as round shell, flat or dual in-line. Integrated circuit technology includes chip manufacturing technology and design technology, which is mainly reflected in the processing equipment, processing technology, packaging and testing, mass production and design innovation capabilities.

[0004] Since many integrated circuits are provided with interfaces, in traditional testing, manual testing is required, which is inefficient and cannot meet the requirements of industrial production. In existing technologies, a test interface board needs to be set up, and then the test interface is plugged into the test interface board for testing. This test method also requires manual assistance and is inefficient.

[0005] Chinese patent publication number: CN110404823B, discloses an integrated circuit performance detection device, including an electric control box, a test platform arranged on the upper part of the electric control box, a feed trough arranged at one end of the upper right side of the test platform, a flip mechanism is arranged at the left end of the feed trough, a loading and unloading mechanism is arranged at the rear end of the flip mechanism, a test positioning mechanism is arranged at the left end of the flip mechanism, a test plug mechanism is arranged at the rear end of the test positioning mechanism, a sorting mechanism is arranged at the left end of the test plug mechanism, a CCD camera detection mechanism is arranged at the left end of the sorting mechanism, and a discharge trough is arranged on the left side of the CCD camera detection mechanism; it can be seen that the above technical solution has the following problems: it is impossible to automatically adjust the detection parameters during the circuit board detection process, which affects the detection accuracy of the circuit board and further affects the detection efficiency of the circuit board. Summary of the invention

[0006] To this end, the present invention provides a testing method for detecting integrated circuit performance, so as to overcome the problem in the prior art that the detection parameters cannot be automatically adjusted during the circuit board detection process, which affects the detection accuracy of the circuit board and further affects the detection efficiency of the circuit board.

[0007] To achieve the above object, the present invention provides a testing method for detecting integrated circuit performance, comprising:

[0008] S1, the power output end of the power supply of the power supply clamping the power supply arm provides power to the circuit board fixed by the fixing fixture, and the output probe of the voltage meter clamping the detection arm obtains the detection voltage of the corresponding test contact in the circuit board;

[0009] S2, input the test data into the circuit board and monitor the data reporting frequency;

[0010] S3, filtering the circuit;

[0011] S4, determining whether the circuit board is qualified based on the detection voltage and the amount of test data. When the circuit board is determined to be abnormal, determining a processing method for the circuit board abnormality based on the voltage fluctuation parameter. The processing method is to adjust the test pressure applied by each mechanical arm to the corresponding contact of the circuit board to a corresponding value, or to adjust the filter interval of the circuit to a corresponding value;

[0012] When the circuit board is determined to be qualified, or when an alarm message is issued for an abnormality of the circuit board, the next circuit board is tested.

[0013] Further, in step S4, determining whether the circuit board is qualified based on the detection voltage includes:

[0014] If the detection voltage is less than or equal to the first preset voltage, it is determined that the circuit board is abnormal, and a processing method for the circuit board abnormality is determined based on the voltage fluctuation parameter;

[0015] If the detection voltage is less than or equal to the second preset voltage and greater than the first preset voltage, determining whether the circuit board is qualified in combination with the data volume of the test data;

[0016] If the detection voltage is greater than the second preset voltage, the circuit board is determined to be qualified, and it is determined to test the next circuit board.

[0017] Further, determining whether the circuit board is qualified based on the data volume of the test data includes:

[0018] If the data volume of the test data is less than or equal to the preset data volume, the circuit board is determined to be abnormal, and a processing method for the circuit board abnormality is determined based on the voltage fluctuation parameter;

[0019] If the data volume of the test data is greater than the preset data volume, the first preset voltage is adjusted to a corresponding value based on the data volume of the test data.

[0020] Further, the first preset voltage is adjusted to a corresponding value based on the data volume of the test data, wherein:

[0021] The increase range of the first preset voltage determined based on the data amount of the test data is proportional to the data amount of the test data.

[0022] Furthermore, a processing method for the circuit board abnormality is determined based on the voltage fluctuation parameter, including:

[0023] Determine the voltage fluctuation parameters, obtain the detected voltage values ​​at several time nodes, and solve the variance of each monitored voltage value to obtain the voltage fluctuation parameters;

[0024] If the voltage fluctuation parameter is less than or equal to the first preset voltage fluctuation parameter, determining a processing method for the circuit board abnormality based on the data reporting frequency;

[0025] If the voltage fluctuation parameter is less than or equal to the second preset voltage fluctuation parameter and greater than the first preset voltage fluctuation parameter, the test pressure applied by each mechanical arm to the corresponding contact is adjusted to a corresponding value based on the voltage fluctuation parameter;

[0026] If the voltage fluctuation parameter is greater than the second preset voltage fluctuation parameter, the filtering interval of the circuit is adjusted to a corresponding value based on the voltage integral parameter.

[0027] Furthermore, based on the data reporting frequency, a processing method for the circuit board abnormality is determined, including:

[0028] If the data reporting frequency is less than or equal to the preset data reporting frequency, the test pressure applied by each robot arm to the corresponding contact is adjusted to a corresponding value based on the voltage fluctuation parameter;

[0029] If the data reporting frequency is greater than the preset data reporting frequency, an alarm message for circuit board abnormality is issued.

[0030] Further, the test pressure applied by each mechanical arm to the corresponding contact is adjusted to a corresponding value based on the voltage fluctuation parameter, wherein:

[0031] The increase of the test pressure determined based on the voltage fluctuation parameter is proportional to the voltage fluctuation parameter.

[0032] Furthermore, when the adjustment of the test pressure is completed, the adjusted test pressure is compared with the preset maximum pressure. If the adjusted test pressure is less than or equal to the preset maximum pressure, the adjusted test pressure is used as the detection parameter for the circuit board; if the adjusted test pressure is greater than the preset maximum pressure, the preset maximum pressure is used as the detection parameter for the circuit board, and the preset clamping force adjustment coefficient is used to adjust the clamping force of the circuit board fixed by the fixing clamp to a corresponding value.

[0033] Further, adjusting the filter interval of the circuit to a corresponding value based on the voltage integral parameter includes:

[0034] Determine the voltage integral parameter, draw the voltage time domain curve based on the detected voltage values ​​at several time nodes, solve the integral value of the voltage time domain curve, and obtain the voltage integral parameter;

[0035] The reduction range of the filtering interval determined based on the voltage integral parameter is proportional to the voltage integral parameter.

[0036] Compared with the prior art, the beneficial effect of the present invention lies in that the electrical parameters of the circuit board are obtained to detect whether the circuit board is qualified, and when the circuit board is determined to be abnormal, the detection parameters of the circuit board are further adjusted according to the voltage fluctuation parameters, thereby improving the detection accuracy of the circuit board and further improving the detection efficiency of the circuit board.

[0037] Furthermore, whether the circuit board is qualified is determined based on the detection voltage. When the detection voltage is less than or equal to the second preset voltage and greater than the first preset voltage, the output voltage of the circuit board is low. In this case, the data processing capacity of the circuit board, that is, the data volume of the test data, is obtained. When the data volume of the test data is greater than the preset data volume, the data processing capacity of the circuit board is too large, and the transistor switches in the integrated circuit are frequently switched, resulting in an increase in the current demand inside the chip. When the current passes through the lines and components on the circuit board, a voltage drop is generated due to the line resistance and the internal resistance of the component, thereby reducing the voltage actually measured at the output end. In this case, the judgment standard of the circuit board is adjusted based on the data volume of the test data, so as to adaptively adjust the detection parameters for the circuit board according to the specific detection situation, thereby effectively improving the detection accuracy of the circuit board.

[0038] Furthermore, when determining that the circuit board is abnormal, the voltage fluctuation parameter and the data reporting frequency are obtained to further determine whether the circuit board is misjudged due to abnormalities in the detection parameters for the circuit board. When it is determined that there is no misjudgment, an alarm message for the circuit board abnormality is issued, and the next circuit board is detected; the voltage fluctuation parameter characterizes the fluctuation of several detection voltage values ​​obtained for a single circuit board. When the voltage fluctuation parameter is less than or equal to the second preset voltage fluctuation parameter and greater than the first preset voltage fluctuation parameter, the fluctuation of the detection voltage value is relatively large. In this case, due to poor contact with the contacts when detecting the circuit board, the detection data deviates. At this time, the test pressure applied by each robot arm to the corresponding contact is adjusted to the corresponding value to stabilize the circuit board. A certain standardized test is performed. When the voltage fluctuation parameter is less than or equal to the first preset voltage fluctuation parameter, the detection voltage is stable in this case, and the data report frequency is obtained at this time. When the data report frequency is greater than the preset data report frequency, in this case, due to a partial failure of the circuit board, the speed of data generation and transmission is accelerated, and the electromagnetic interference generated by the high-frequency data is coupled to the power supply line, causing the detection voltage to decrease, resulting in an abnormal working state. In this case, a single circuit board is determined to be abnormal, and the detection parameters for the circuit board are normal; when the data report frequency is less than or equal to the preset data report frequency, the data report frequency is normal in this case. Due to the unstable detection of the contacts, the circuit board is misjudged. At this time, the test pressure is adjusted to further improve the detection efficiency of the circuit board.

[0039] Furthermore, when the voltage fluctuation parameter is greater than the second preset voltage fluctuation parameter, the fluctuation of the detection voltage value is large. In this case, due to the presence of high-frequency noise signals in the circuit board, these noises affect the measurement and judgment of the normal working voltage of the integrated circuit. In this case, the filtering interval is adjusted to filter out the high-frequency noise through filtering, thereby improving the observation clarity of the detection voltage of the circuit board and further improving the detection efficiency of the circuit board. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] Figure 1 A flowchart of the steps of a test method for detecting integrated circuit performance according to an embodiment of the present invention;

[0041] Figure 2 This is a logic decision diagram for determining whether a circuit board is qualified based on the detection voltage according to an embodiment of the present invention. DETAILED DESCRIPTION

[0042] In order to make the objects and advantages of the present invention more clearly understood, the present invention is further described below in conjunction with embodiments; it should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention.

[0043] The preferred embodiments of the present invention are described below with reference to the accompanying drawings. It should be understood by those skilled in the art that these embodiments are only used to explain the technical principles of the present invention and are not intended to limit the protection scope of the present invention.

[0044] It should be noted that, in the description of the present invention, terms such as "up", "down", "left", "right", "inside" and "outside" indicating directions or positional relationships are based on the directions or positional relationships shown in the drawings. This is merely for the convenience of description and does not indicate or imply that the device or element must have a specific orientation, be constructed and operated in a specific orientation. Therefore, it cannot be understood as a limitation on the present invention.

[0045] In addition, it should be noted that in the description of the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For those skilled in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0046] See also Figure 1 as well as Figure 2 As shown, they are respectively a flow chart of the steps of a test method for detecting integrated circuit performance according to an embodiment of the present invention, and a logic determination diagram for determining whether a circuit board is qualified based on a detection voltage; a test method for detecting integrated circuit performance according to an embodiment of the present invention comprises:

[0047] S1, the power output end of the power supply of the power supply clamping the power supply arm provides power to the circuit board fixed by the fixing fixture, and the output probe of the voltage meter clamping the detection arm obtains the detection voltage of the corresponding test contact in the circuit board;

[0048] S2, input the test data into the circuit board and monitor the data reporting frequency;

[0049] S3, filtering the circuit;

[0050] S4, determining whether the circuit board is qualified based on the detection voltage and the amount of test data. When the circuit board is determined to be abnormal, determining a processing method for the circuit board abnormality based on the voltage fluctuation parameter. The processing method is to adjust the test pressure applied by each mechanical arm to the corresponding contact of the circuit board to a corresponding value, or to adjust the filter interval of the circuit to a corresponding value;

[0051] When the circuit board is determined to be qualified, or when an alarm message is issued for an abnormality of the circuit board, the next circuit board is tested.

[0052] Specifically, the electrical parameters of the circuit board are obtained to detect whether the circuit board is qualified. When the circuit board is determined to be abnormal, the detection parameters of the circuit board are further adjusted according to the voltage fluctuation parameters. While improving the detection accuracy of the circuit board, the detection efficiency of the circuit board is further improved.

[0053] Specifically, there is no limitation on the specific structure of the fixing fixture, which may be a fixing bracket. It is understandable that it can fix the circuit board to be tested, and no further details are given here.

[0054] Specifically, there is no limitation on the method for determining the test contacts of the circuit board, and the test contacts may include the output pins of the circuit board and any intermediate nodes, which will not be described in detail.

[0055] Specifically, the specific structure of the robot arm is not limited. It can be understood that the output probe or the power output terminal can be stably clamped, run to the corresponding contacts of the circuit board along a predetermined running trajectory, and apply pressure to the contacts. This will not be repeated.

[0056] Specifically, there is no limitation on the specific method of filtering the circuit. Filtering can be achieved by connecting a filter component or filter to a circuit board. The filtering frequency range of the circuit can be adjusted by adjusting the capacitance and inductance values ​​in the filter component. This is a prior art and will not be described in detail. The specific method of connecting the filter component or filter to the circuit board can be achieved by clamping the terminal of the filter component or filter with a robotic arm and movably fixing it to the corresponding contact interface of the circuit board. This will not be described in detail.

[0057] Specifically, the data reporting frequency can be measured by connecting a logic analyzer, an oscilloscope or a dedicated frequency measuring device to the data output port to monitor the data output frequency in real time during the data calculation test.

[0058] In step S4, determining whether the circuit board is qualified based on the detection voltage includes:

[0059] If the detection voltage is less than or equal to the first preset voltage, it is determined that the circuit board is abnormal, and a processing method for the circuit board abnormality is determined based on the voltage fluctuation parameter;

[0060] If the detection voltage is less than or equal to the second preset voltage and greater than the first preset voltage, determining whether the circuit board is qualified in combination with the data volume of the test data;

[0061] If the detection voltage is greater than the second preset voltage, the circuit board is determined to be qualified, and it is determined to test the next circuit board.

[0062] Specifically, the first preset voltage is selected within the interval [3.3, 3.5], and the second preset voltage is selected within the interval [4.1, 4.8], and the unit is V.

[0063] Specifically, whether the circuit board is qualified is determined based on the amount of test data, including:

[0064] If the data volume of the test data is less than or equal to the preset data volume, the circuit board is determined to be abnormal, and a processing method for the circuit board abnormality is determined based on the voltage fluctuation parameter;

[0065] If the data volume of the test data is greater than the preset data volume, the first preset voltage is adjusted to a corresponding value based on the data volume of the test data.

[0066] Specifically, the preset data volume Q0 is selected within the interval [480, 600], and the unit is MB.

[0067] Specifically, whether the circuit board is qualified is determined based on the detection voltage. When the detection voltage is less than or equal to the second preset voltage and greater than the first preset voltage, the output voltage of the circuit board is low. In this case, the data processing capacity of the circuit board, that is, the data volume of the test data, is obtained. When the data volume of the test data is greater than the preset data volume, the data processing capacity of the circuit board is too large, and the transistor switches in the integrated circuit are frequently switched, resulting in an increase in the current demand inside the chip. When the current passes through the lines and components on the circuit board, a voltage drop is generated due to the line resistance and the internal resistance of the component, thereby reducing the actual voltage measured at the output end. In this case, the judgment standard of the circuit board is adjusted according to the data volume of the test data, so as to adaptively adjust the detection parameters for the circuit board according to the specific detection situation, thereby effectively improving the detection accuracy of the circuit board.

[0068] Specifically, the first preset voltage is adjusted to a corresponding value based on the data amount of the test data, wherein:

[0069] The increase range of the first preset voltage determined based on the data amount of the test data is proportional to the data amount of the test data.

[0070] In this embodiment, optionally,

[0071] Comparing the data volume with a first preset data volume comparison threshold and a second preset data volume comparison threshold;

[0072] If the data volume is less than or equal to the first preset data volume comparison threshold, adjusting the first preset voltage to 1.11 times the initial first preset voltage;

[0073] If the data volume is less than or equal to the second preset data volume comparison threshold and greater than the first preset data volume comparison threshold, adjusting the first preset voltage to 1.21 times the initial first preset voltage;

[0074] If the data volume is greater than the second preset data volume comparison threshold, adjusting the first preset voltage to 1.29 times the initial first preset voltage;

[0075] The first preset data volume comparison threshold is 1.85Q0, and the second preset data volume comparison threshold is 2.63Q0.

[0076] Specifically, whether the circuit board is qualified is determined based on the adjusted first preset voltage. If the detection voltage is less than or equal to the adjusted first preset voltage, the circuit board is determined to be abnormal, and the handling method for the circuit board abnormality is determined based on the voltage fluctuation parameter; if the detection voltage is greater than the adjusted first preset voltage, the circuit board is determined to be qualified, and it is determined to test the next circuit board.

[0077] Specifically, the processing method for circuit board abnormality is determined based on the voltage fluctuation parameters, including:

[0078] Determine the voltage fluctuation parameters, obtain the detected voltage values ​​at several time nodes, and solve the variance of each monitored voltage value to obtain the voltage fluctuation parameters;

[0079] If the voltage fluctuation parameter is less than or equal to the first preset voltage fluctuation parameter, determining a processing method for the circuit board abnormality based on the data reporting frequency;

[0080] If the voltage fluctuation parameter is less than or equal to the second preset voltage fluctuation parameter and greater than the first preset voltage fluctuation parameter, the test pressure applied by each mechanical arm to the corresponding contact is adjusted to a corresponding value based on the voltage fluctuation parameter;

[0081] If the voltage fluctuation parameter is greater than the second preset voltage fluctuation parameter, the filtering interval of the circuit is adjusted to a corresponding value based on the voltage integral parameter.

[0082] Specifically, the first preset voltage fluctuation parameter B1 is selected within the interval [0.778D0, 0.87D0], the second preset voltage fluctuation parameter B2 is selected within the interval [1.22D0, 1.42D0], and D0 is the average value of the voltage fluctuation parameters of the detection voltages of each circuit board in the historical data.

[0083] Specifically, the test pressure is the pressure applied by the robot arm to the contacts.

[0084] Specifically, the handling method for circuit board abnormalities is determined based on the frequency of data reporting, including:

[0085] If the data reporting frequency is less than or equal to the preset data reporting frequency, the test pressure applied by each robot arm to the corresponding contact is adjusted to a corresponding value based on the voltage fluctuation parameter;

[0086] If the data reporting frequency is greater than the preset data reporting frequency, an alarm message for circuit board abnormality is issued.

[0087] Specifically, when determining that a circuit board is abnormal, the voltage fluctuation parameter and the data reporting frequency are obtained to further determine whether the circuit board is misjudged due to abnormalities in the detection parameters for the circuit board. When it is determined that there is no misjudgment, an alarm message for the circuit board abnormality is issued, and the next circuit board is detected. The voltage fluctuation parameter characterizes the fluctuation of several detection voltage values ​​obtained for a single circuit board. When the voltage fluctuation parameter is less than or equal to the second preset voltage fluctuation parameter and greater than the first preset voltage fluctuation parameter, the fluctuation of the detection voltage value is relatively large. In this case, due to poor contact with the contacts when detecting the circuit board, the detection data deviates. At this time, the test pressure applied by each robot arm to the corresponding contact is adjusted to the corresponding value to stabilize the circuit board. A certain standardized test is performed. When the voltage fluctuation parameter is less than or equal to the first preset voltage fluctuation parameter, the detection voltage is stable in this case, and the data report frequency is obtained at this time. When the data report frequency is greater than the preset data report frequency, in this case, due to a partial failure of the circuit board, the speed of data generation and transmission is accelerated, and the electromagnetic interference generated by the high-frequency data is coupled to the power supply line, causing the detection voltage to decrease, resulting in an abnormal working state. In this case, a single circuit board is determined to be abnormal, and the detection parameters for the circuit board are normal; when the data report frequency is less than or equal to the preset data report frequency, the data report frequency is normal in this case. Due to the unstable detection of the contacts, the circuit board is misjudged. At this time, the test pressure is adjusted to further improve the detection efficiency of the circuit board.

[0088] Specifically, the preset data reporting frequency is selected within the interval [120, 200], and the unit is times / second.

[0089] Specifically, the data reporting frequency refers to the number of times the circuit board sends data to the outside per unit time.

[0090] Specifically, the test pressure applied by each robot arm to the corresponding contact is adjusted to a corresponding value based on the voltage fluctuation parameter, wherein:

[0091] The increase of the test pressure determined based on the voltage fluctuation parameter is proportional to the voltage fluctuation parameter.

[0092] In this embodiment, optionally,

[0093] Comparing the voltage fluctuation parameter with a first preset fluctuation comparison threshold and a second preset fluctuation comparison threshold;

[0094] If the voltage fluctuation parameter is less than or equal to the first preset fluctuation comparison threshold, the test pressure is adjusted to 1.12 times the initial test pressure;

[0095] If the voltage fluctuation parameter is less than or equal to the second preset fluctuation comparison threshold and greater than the first preset fluctuation comparison threshold, the test pressure is adjusted to 1.21 times the initial test pressure;

[0096] If the voltage fluctuation parameter is greater than the second preset fluctuation comparison threshold, the test pressure is adjusted to 1.28 times the initial test pressure;

[0097] The first preset fluctuation comparison threshold is 0.35B2, and the second preset fluctuation comparison threshold is 0.79B2.

[0098] Specifically, when the adjustment of the test pressure is completed, the adjusted test pressure is compared with the preset maximum pressure. If the adjusted test pressure is less than or equal to the preset maximum pressure, the adjusted test pressure is used as the detection parameter for the circuit board; if the adjusted test pressure is greater than the preset maximum pressure, the preset maximum pressure is used as the detection parameter for the circuit board, and the preset clamping force adjustment coefficient is used to adjust the clamping force of the circuit board fixed by the fixing clamp to the corresponding value.

[0099] Specifically, the preset maximum pressure is selected within the interval [1.3, 1.8] and the unit is N.

[0100] In this embodiment, optionally, the clamping force of the circuit board fixed by the fixing fixture adjusted using a preset clamping force adjustment coefficient is 1.12 times the initial clamping force.

[0101] Specifically, adjusting the filter interval of the circuit to a corresponding value based on the voltage integral parameter includes:

[0102] Determine the voltage integral parameter, draw the voltage time domain curve based on the detected voltage values ​​at several time nodes, solve the integral value of the voltage time domain curve, and obtain the voltage integral parameter;

[0103] The reduction range of the filtering interval determined based on the voltage integral parameter is proportional to the voltage integral parameter.

[0104] In this embodiment, optionally,

[0105] Comparing the voltage integral parameter with the first preset integral parameter and the second preset integral parameter;

[0106] If the voltage integral parameter is less than or equal to the first preset integral parameter, the filtering interval is adjusted to 0.92 times the initial filtering interval;

[0107] If the voltage integral parameter is less than or equal to the second preset integral parameter and greater than the first preset integral parameter, the filtering interval is adjusted to 0.87 times the initial filtering interval;

[0108] If the voltage integral parameter is greater than the second preset integral parameter, the filtering interval is adjusted to 0.77 times the initial filtering interval;

[0109] Specifically, the first preset integral parameter is 13.5 V·S, and the second preset integral parameter is 20 V·S.

[0110] Specifically, when the voltage fluctuation parameter is greater than the second preset voltage fluctuation parameter, the fluctuation of the detection voltage value is large. In this case, due to the presence of high-frequency noise signals in the circuit board, these noises affect the measurement and judgment of the normal working voltage of the integrated circuit. In this case, the filtering interval is adjusted to filter out the high-frequency noise through filtering, thereby improving the observation clarity of the detection voltage of the circuit board and further improving the detection efficiency of the circuit board.

[0111] So far, the technical solutions of the present invention have been described in conjunction with the preferred embodiments shown in the accompanying drawings. However, it is easy for those skilled in the art to understand that the protection scope of the present invention is obviously not limited to these specific embodiments. Without departing from the principle of the present invention, those skilled in the art can make equivalent changes or substitutions to the relevant technical features, and the technical solutions after these changes or substitutions will fall within the protection scope of the present invention.

[0112] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A testing method for detecting the performance of an integrated circuit, characterized in that: include: S1, the power output end of the power supply of the power supply clamping the power supply arm provides power to the circuit board fixed by the fixing fixture, and the output probe of the voltage meter clamping the detection arm obtains the detection voltage of the corresponding test contact in the circuit board; S2, input the test data into the circuit board and monitor the data reporting frequency; S3, filtering the circuit; S4, determining whether the circuit board is qualified based on the detection voltage and the amount of test data. When the circuit board is determined to be abnormal, determining a processing method for the circuit board abnormality based on the voltage fluctuation parameter. The processing method is to adjust the test pressure applied by each mechanical arm to the corresponding contact of the circuit board to a corresponding value, or to adjust the filter interval of the circuit to a corresponding value; When the circuit board is determined to be qualified, or when an alarm message for abnormality of the circuit board is issued, the next circuit board is tested; In step S4, determining whether the circuit board is qualified based on the detection voltage includes: If the detection voltage is less than or equal to the first preset voltage, it is determined that the circuit board is abnormal, and a processing method for the circuit board abnormality is determined based on the voltage fluctuation parameter; If the detection voltage is less than or equal to the second preset voltage and greater than the first preset voltage, determining whether the circuit board is qualified in combination with the data volume of the test data; If the detection voltage is greater than the second preset voltage, the circuit board is determined to be qualified, and the next circuit board is determined to be tested; Determine whether the board is qualified based on the amount of test data, including: If the data volume of the test data is less than or equal to the preset data volume, the circuit board is determined to be abnormal, and a processing method for the circuit board abnormality is determined based on the voltage fluctuation parameter; If the data volume of the test data is greater than the preset data volume, the first preset voltage is adjusted to a corresponding value based on the data volume of the test data.

2. The test method for detecting integrated circuit performance according to claim 1, characterized in that: The first preset voltage is adjusted to a corresponding value based on the data amount of the test data, wherein: The increase range of the first preset voltage determined based on the data amount of the test data is proportional to the data amount of the test data.

3. The test method for detecting integrated circuit performance according to claim 2, characterized in that: Determine the handling method for circuit board abnormality based on voltage fluctuation parameters, including: Determine the voltage fluctuation parameters, obtain the detection voltage values ​​at several time nodes, and solve the variance of each monitored voltage value to obtain the voltage fluctuation parameters; If the voltage fluctuation parameter is less than or equal to the first preset voltage fluctuation parameter, determining a processing method for the circuit board abnormality based on the data reporting frequency; If the voltage fluctuation parameter is less than or equal to the second preset voltage fluctuation parameter and greater than the first preset voltage fluctuation parameter, the test pressure applied by each mechanical arm to the corresponding contact is adjusted to a corresponding value based on the voltage fluctuation parameter; If the voltage fluctuation parameter is greater than the second preset voltage fluctuation parameter, the filtering interval of the circuit is adjusted to a corresponding value based on the voltage integral parameter.

4. The testing method for detecting integrated circuit performance according to claim 3, characterized in that: Determine the handling method for circuit board abnormalities based on the frequency of data reporting, including: If the data reporting frequency is less than or equal to the preset data reporting frequency, the test pressure applied by each robot arm to the corresponding contact is adjusted to a corresponding value based on the voltage fluctuation parameter; If the data reporting frequency is greater than the preset data reporting frequency, an alarm message for circuit board abnormality is issued.

5. The test method for detecting integrated circuit performance according to claim 4, characterized in that: The test pressure applied by each robot arm to the corresponding contact is adjusted to a corresponding value based on the voltage fluctuation parameter, wherein: The increase of the test pressure determined based on the voltage fluctuation parameter is proportional to the voltage fluctuation parameter.

6. The testing method for detecting integrated circuit performance according to claim 5, characterized in that: When the adjustment of the test pressure is completed, the adjusted test pressure is compared with the preset maximum pressure. If the adjusted test pressure is less than or equal to the preset maximum pressure, the adjusted test pressure is used as the detection parameter for the circuit board; if the adjusted test pressure is greater than the preset maximum pressure, the preset maximum pressure is used as the detection parameter for the circuit board, and the preset clamping force adjustment coefficient is used to adjust the clamping force of the circuit board fixed by the fixing fixture to the corresponding value.

7. The testing method for detecting integrated circuit performance according to claim 6, characterized in that: Based on the voltage integral parameter, the filter interval of the circuit is adjusted to a corresponding value, including: Determine the voltage integral parameter, draw the voltage time domain curve based on the detected voltage values ​​at several time nodes, solve the integral value of the voltage time domain curve, and obtain the voltage integral parameter; The reduction range of the filtering interval determined based on the voltage integral parameter is proportional to the voltage integral parameter.

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