Data storage method and device, electronic equipment and automatic driving vehicle

Abstract

The invention provides a data storage method and device, electronic equipment and an automatic driving vehicle, and relates to the technical field of computers, in particular to the technical field of automatic driving. According to the specific implementation scheme, the data storage method is provided and applied to a calculation subsystem of a target object, the calculation subsystem conducts temperature regulation and control through a temperature control system of the target object, a short-term storage is arranged in the calculation subsystem, and the exterior of the calculation subsystem is connected with a long-term storage; the method comprises the following steps: storing running state data of a target object in a short-term memory; and transferring the running state data stored in the short-term memory to the long-term memory under the condition that the characterization temperature of the long-term memory meets the first working temperature requirement. According to the invention, the integrity of the operation state data can be ensured.

Description

Technical Field

[0001] The present disclosure relates to the field of computer technology, in particular to the field of autonomous driving technology, and specifically to a data storage method, device, electronic device and autonomous driving vehicle. Background Art

[0002] With the rapid development of autonomous driving technology, autonomous driving vehicles will collect their own operating status data in real time after starting, which is used to train and optimize autonomous driving models. At the same time, these operating status data can also be used as traceability evidence in emergency situations. Summary of the invention

[0003] The present disclosure provides a data storage method, device, electronic device and autonomous driving vehicle.

[0004] According to a first aspect of the present disclosure, a data storage method is provided, which is applied to a computing subsystem of a target object, wherein the computing subsystem performs temperature control through a temperature control system of the target object, and a short-term memory is provided inside the computing subsystem, and a long-term memory is connected to the outside of the computing subsystem; the method comprises:

[0005] The operating status data of the target object is stored in the short-term memory; when the characteristic temperature of the long-term memory meets the first operating temperature requirement, the operating status data stored in the short-term memory is transferred to the long-term memory.

[0006] According to a second aspect of the present disclosure, a data storage device is provided, which is applied to a computing subsystem of a target object, wherein the computing subsystem performs temperature control through a temperature control system of the target object, and a short-term memory is provided inside the computing subsystem, and a long-term memory is connected to the outside of the computing subsystem; the device comprises:

[0007] A data storage unit, used for storing the operation status data of the target object in a short-term memory;

[0008] The data transfer unit is used to transfer the operating status data stored in the short-term memory to the long-term memory when the characteristic temperature of the long-term memory meets the first operating temperature requirement.

[0009] According to a third aspect of the present disclosure, there is provided an electronic device, including:

[0010] at least one processor;

[0011] a memory communicatively coupled to the at least one processor;

[0012] The memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to execute any method provided by the embodiments of the present disclosure.

[0013] According to a fourth aspect of the present disclosure, an autonomous driving vehicle is provided, comprising the electronic device provided by an embodiment of the present disclosure.

[0014] According to a fifth aspect of the present disclosure, a non-transitory computer-readable storage medium storing computer instructions is provided, wherein the computer instructions are used to enable the computer to execute any method provided by the embodiments of the present disclosure.

[0015] According to a sixth aspect of the present disclosure, a computer program product is provided, including a computer program, which implements any method provided by the embodiments of the present disclosure when executed by a processor.

[0016] The present disclosure can be used to ensure the integrity of the operating status data.

[0017] It should be understood that the content described in this section is not intended to identify the key or important features of the embodiments of the present disclosure, nor is it intended to limit the scope of the present disclosure. Other features of the present disclosure will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The accompanying drawings are used to better understand the present solution and do not constitute a limitation of the present disclosure.

[0019] Figure 1 A schematic diagram of the application scenarios and processes of current data storage methods;

[0020] Figure 2 A schematic structural block diagram of an automatic driving system provided in an embodiment of the present disclosure;

[0021] Figure 3 A schematic diagram of the internal structure of an autonomous driving vehicle provided in an embodiment of the present disclosure;

[0022] Figure 4 A schematic diagram of a flow chart of a first data storage method provided in an embodiment of the present disclosure;

[0023] Figure 5 A schematic diagram of a flow chart of a second data storage method provided in an embodiment of the present disclosure;

[0024] Figure 6 A schematic diagram of a flow chart of a third data storage method provided in an embodiment of the present disclosure;

[0025] Figure 7 A schematic diagram of a flow chart of a fourth data storage method provided in an embodiment of the present disclosure;

[0026] Figure 8 A complete flow chart of a data storage method provided by an embodiment of the present disclosure;

[0027] Fig. 9 A schematic diagram of an application scenario of a data storage method provided by an embodiment of the present disclosure;

[0028] Fig.10 A schematic structural block diagram of a data storage device provided in an embodiment of the present disclosure;

[0029] Fig.11 A schematic structural block diagram of an electronic device provided in an embodiment of the present disclosure. DETAILED DESCRIPTION

[0030] The following is a description of exemplary embodiments of the present disclosure in conjunction with the accompanying drawings, including various details of the embodiments of the present disclosure to facilitate understanding, which should be considered as merely exemplary. Therefore, it should be recognized by those of ordinary skill in the art that various changes and modifications may be made to the embodiments described herein without departing from the scope of the present disclosure. Similarly, for the sake of clarity and conciseness, the description of well-known functions and structures is omitted in the following description.

[0031] As mentioned earlier, with the rapid development of autonomous driving technology, after starting, autonomous driving vehicles will collect their own operating status data in real time for training and optimizing autonomous driving models. At the same time, these operating status data can also be used as traceable evidence after a traffic accident occurs.

[0032] However, currently, after collecting the operating status data of the autonomous driving vehicle in real time, there is no relatively complete data storage method for the operating status data. Figure 1 , the current data storage method is applied to the computing subsystem of the autonomous driving vehicle. Among them, the computing subsystem is externally connected with a long-term storage for storing operating status data. Here, setting the long-term storage outside the computing subsystem is not only conducive to the access to the operating status data, but also simplifies the maintenance and replacement process of the long-term storage. In addition, the computing subsystem is temperature-controlled by the temperature control system of the autonomous driving vehicle, but due to cost considerations, the long-term storage is usually not equipped with a dedicated temperature control system, and the temperature is controlled by natural heating or natural cooling.

[0033] Current data storage methods include:

[0034] In response to a start-up operation for the autonomous driving vehicle, the autonomous driving vehicle is put into a start-up state, and operation state data of the autonomous driving vehicle is acquired;

[0035] Store operating status data in long-term storage.

[0036] Since the long-term storage is temperature-controlled by natural heating or natural cooling, therefore, in response to the startup operation for the autonomous driving vehicle, the autonomous driving vehicle is in the startup state, and after the operation status data of the autonomous driving vehicle is obtained, if the long-term storage happens to be in an extreme temperature state (for example, an extremely high temperature state or an extremely low temperature state), it is usually difficult to quickly control the real-time temperature of the long-term storage to meet the temperature requirements required for normal operation. In this case, after the operation status data of the autonomous driving vehicle is obtained, if the operation status data is directly and unconditionally stored in the long-term storage, the long-term storage will be forced to perform the storage task for the operation status data under an extreme temperature state, which will damage the working performance of the long-term storage, thereby increasing the risk of damage to the operation status data, and further affecting the integrity of the operation status data. In the case of lack of integrity of the operation status data, the training and optimization effect of the autonomous driving model will be weakened, thereby affecting the reliability of the autonomous driving model; at the same time, after a traffic accident occurs, these incomplete operation status data will also limit the ability to conduct in-depth analysis of the cause of the accident, making it difficult to obtain accurate analysis results of the cause of the accident.

[0037] In view of the above problems, an embodiment of the present disclosure provides a data storage method, which can be applied to a computing subsystem of a target object.

[0038] The target object may be an autonomous driving vehicle (e.g., a partially automated (L2), conditionally automated (L3), highly automated (L4), or fully automated (L5) autonomous driving vehicle), a drone, a robot, etc. Based on this, it can be understood that in the embodiments of the present disclosure, the data storage method can be applied to the computing subsystem of an autonomous driving vehicle, as well as the computing subsystem of an autonomous driving drone and the computing subsystem of a robot with an automatic driving function.

[0039] In the disclosed embodiment, the computing subsystem is also called the autonomous driving domain controller, which belongs to the autonomous driving system of the target object and is the core part of the autonomous driving system. Figure 2 In the embodiment of the present disclosure, the computing subsystem is used to process the perception data collected in real time by the perception subsystem in the autonomous driving system, and make driving decisions based on the object state data (that is, the target object's own state data) and these perception data, so as to control the driving state of the target object through the control subsystem in the autonomous driving system. In addition, in the embodiment of the present disclosure, the computing subsystem can be temperature-controlled by the temperature control system of the target object. Specifically, the temperature control system can control the temperature of the computing subsystem by liquid heating or liquid cooling.

[0040] Furthermore, in the disclosed embodiment, the computing subsystem may include a system packaging box, and a plurality of internal devices disposed inside the system packaging box, such as a central processing unit (CPU), a graphics processing unit (GPU), and a short-term memory, etc., and the computing subsystem may also be connected to a long-term memory disposed outside the system packaging box. That is to say, in the disclosed embodiment, internal devices such as a CPU, a GPU, and a short-term memory may be disposed inside the computing subsystem, and a long-term memory may be connected outside the computing subsystem. In addition, in the disclosed embodiment, based on cost considerations, the long-term memory is usually not equipped with a dedicated temperature control system, but is temperature-controlled by natural heating or natural cooling.

[0041] Among them, the short-term memory can be a solid state drive (SSD), for example, an SSD that uses an M.2 interface and supports the Serial Advanced Technology Attachment (SATA) protocol or the Non-Volatile Memory Express (NVMe) host controller interface specification; the long-term memory can be an SSD, for example, an SSD that uses a U.2 interface and supports NVMe. Here, the SSD can be a solid-state memory implemented based on non-volatile memory (NVM) or a solid-state memory implemented based on 3D magnetic memory (i.e., 3DXPoint).

[0042] In addition, it should be noted that in the embodiments of the present disclosure, since the short-term memory is arranged inside the computing subsystem, it is difficult to design the short-term memory into a larger volume due to the constraints of the physical space, which leads to certain limitations in the storage capacity of the short-term memory. In this case, since the storage capacity of the short-term memory is relatively limited, it can be used to temporarily store the object state data and the perception data collected by the perception subsystem in real time, but not for large-scale long-term storage of the object state data and the perception data collected by the perception subsystem in real time. For the long-term memory, since it is arranged outside the computing subsystem, thanks to the freedom of physical space, the long-term memory can be designed into a larger volume, thereby achieving a more considerable storage capacity. In this case, the long-term memory can be used for large-scale long-term storage of the object state data and the perception data collected by the perception subsystem in real time.

[0043] The following will be combined Figure 3 The internal structure schematic diagram shown illustrates the internal structure of the target object.

[0044] Exemplarily, the target object is an autonomous driving vehicle, and the computing subsystem can be set on the center console of the autonomous driving vehicle, or on the bottom of the vehicle body of the autonomous driving vehicle (for example, at the front or rear position of the bottom of the vehicle body), or in the trunk of the autonomous driving vehicle; the long-term storage can be set in the trunk of the autonomous driving vehicle, and can be set in a pluggable manner to facilitate the access to the operating status data, and at the same time, it can also simplify the maintenance and replacement process for the long-term storage. In addition, in this example, the computing subsystem can be temperature-controlled by the temperature control system of the autonomous driving vehicle. Specifically, the temperature control system can control the temperature of the computing subsystem by liquid heating or liquid cooling. Based on cost considerations, the long-term storage is usually not equipped with a dedicated temperature control system, and is temperature-controlled by natural heating or natural cooling.

[0045] The following, combined with Figure 4 The flowchart diagram shown in the figure illustrates the first data storage method provided by the embodiment of the present disclosure. It should be noted that although the logical order is shown in the flowchart diagram, in some cases, the steps shown or described may also be performed in other orders.

[0046] Step S401, storing the running status data of the target object in a short-term memory.

[0047] Among them, the operating status data may include object status data and perception data collected in real time by the perception subsystem. Here, the object status data may include the position information, speed information, acceleration information, posture information, etc. of the target object; the perception subsystem may include a camera, a millimeter-wave radar, a laser radar, etc. Correspondingly, the perception data collected in real time by the perception subsystem may include image data collected in real time by the camera, obstacle-related data collected in real time by the millimeter-wave radar, and three-dimensional environment representation data collected in real time by the laser radar.

[0048] In one example, in response to a startup operation for a target object, the target object can be put into a startup state, and when the target object is in the startup state, the running state data of the target object can be obtained, and the running state data of the target object can be stored in a short-term memory. The startup state can be a standby state or a driving state. Here, the standby state can be a state in which the target object has been started but has not yet driven; the driving state can be a state in which the target object has been started and has started to drive.

[0049] Step S402: when the characteristic temperature of the long-term memory meets the first operating temperature requirement, the operating status data stored in the short-term memory is transferred to the long-term memory.

[0050] Among them, the characterization temperature of the long-term memory can be used to characterize the real-time temperature of the long-term memory; the first operating temperature requirement can be used to characterize the temperature requirement required for the long-term memory to work normally. Here, the first operating temperature requirement of the long-term memory can be set according to multiple factors such as the hardware characteristics of the long-term memory, the working environment, the temperature control method, and the performance test results, and the embodiments of the present disclosure are not limited to this. In addition, it can be understood that in the embodiments of the present disclosure, when the characterization temperature of the long-term memory meets the first operating temperature requirement, it at least indicates that the long-term memory is not in an extreme temperature state.

[0051] In one example, the characterization temperature of the long-term memory can be obtained according to the first preset time interval, and when the characterization temperature of the long-term memory meets the first operating temperature requirement, the operating status data stored in the short-term memory is transferred to the long-term memory, and the new operating status data of the target object is stored in the long-term memory. That is to say, in the embodiment of the present disclosure, the new operating status data of the target object can be stored in the long-term memory after the new operating status data of the target object is subsequently reacquired. Among them, the first preset time interval can be set according to application requirements, for example, it can be set to 100Ms, 200Ms or 500Ms, and the embodiment of the present disclosure does not limit this.

[0052] According to the data storage method provided by the embodiment of the present disclosure, after the operation status data of the target object is acquired, the operation status data is not directly and unconditionally stored in the long-term storage, but the operation status data of the target object is first stored in the short-term storage. Since the short-term storage is arranged inside the computing subsystem, and the computing subsystem is temperature-controlled by the temperature control system of the target object, compared with the long-term storage that uses natural heating or natural cooling to control the temperature, even if the short-term storage happens to be in an extreme temperature state after the operation status data of the target object is acquired, the real-time temperature of the short-term storage can be quickly controlled to meet the temperature requirements required for the normal operation of the short-term storage. In this way, the possibility of the short-term storage performing the storage task for the operation status data under the extreme temperature state can be greatly reduced, so that the short-term storage can maintain good working performance when performing the storage task for the operation status data, thereby reducing the risk of damage to the operation status data, and then ensuring the integrity of the operation status data. On the other hand, after the running state data of the target object is stored in the short-term memory, the running state data stored in the short-term memory is not directly and unconditionally transferred to the long-term memory, but first determines whether the characteristic temperature of the long-term memory meets the first working temperature requirement (that is, the temperature requirement required for the long-term memory to work normally), and only when the characteristic temperature of the long-term memory meets the first working temperature requirement, the running state data stored in the short-term memory is transferred to the long-term memory. In this way, it can be avoided that the long-term memory performs the storage task for the running state data under extreme temperature conditions, so that the long-term memory can maintain good working performance when performing the storage task for the running state data, thereby further reducing the risk of damage to the running state data, and then ensuring the integrity of the running state data; at the same time, it can also increase the service life of the long-term memory.

[0053] Furthermore, in the embodiments of the present disclosure, the operating status data can be used to train and optimize the autonomous driving model on the basis of ensuring the integrity of the operating status data, so as to improve the reliability of the autonomous driving model; at the same time, using these operating status data as traceability evidence after a traffic accident occurs can also improve the ability to conduct in-depth analysis of the cause of the accident, thereby obtaining accurate analysis results of the cause of the accident.

[0054] In some optional embodiments, the characteristic temperature of the long-term storage can be obtained by:

[0055] Obtaining a temperature reading result of a first temperature sensing device; wherein the first temperature sensing device is disposed in a long-term memory;

[0056] Based on the temperature reading result of the first temperature sensing device, a representative temperature of the long-term memory is obtained.

[0057] In one example, the long-term memory may include a memory packaging box and a memory body disposed inside the memory packaging box. The memory body may be an SSD, for example, an SSD using a U.2 interface and supporting NVMe. In this case, the first temperature sensing device may be disposed in the memory packaging box, for example, may be disposed on the inner wall of the memory packaging box.

[0058] In one example, the temperature reading result of the first temperature sensor device can be obtained at a first preset time interval, and the representative temperature of the long-term memory can be obtained based on the temperature reading result of the first temperature sensor device, so that when the representative temperature of the long-term memory meets the first operating temperature requirement, the operating state data stored in the short-term memory can be transferred to the long-term memory. Wherein, obtaining the representative temperature of the long-term memory based on the temperature reading result of the first temperature sensor device can be: using the temperature reading result of the first temperature sensor device as the representative temperature of the long-term memory.

[0059] In the above manner, in the embodiment of the present disclosure, the temperature reading result of the first temperature sensing device (set in the long-term storage device) can be obtained, and based on the temperature reading result of the first temperature sensing device, the representative temperature of the long-term storage device can be obtained. Since the first temperature sensing device is directly set in the long-term storage device, the reliability of the temperature result of the first temperature sensing device can be improved, thereby improving the reliability of the representative temperature of the long-term storage device.

[0060] In some optional implementations, “the characteristic temperature of the long-term storage device meets the first operating temperature requirement” in step S402 may include:

[0061] The characteristic temperature of the long-term memory is in a first operating temperature range.

[0062] Among them, the first operating temperature range can be set according to multiple factors such as the hardware characteristics of the long-term memory, the working environment, the temperature control method, and the performance test results. For example, it can be set to [0°C, 70°C]. The embodiments of the present disclosure do not limit this.

[0063] In addition, in the embodiment of the present disclosure, when the representative temperature of the long-term memory exceeds the first operating temperature range, it can be determined that the representative temperature of the long-term memory does not meet the first operating temperature requirement.

[0064] Through the above manner, in the embodiment of the present disclosure, when the characterization temperature of the long-term storage is within the first operating temperature range, it can be determined that the characterization temperature of the long-term storage meets the first operating temperature requirement, and when the characterization temperature of the long-term storage exceeds the first operating temperature range, it can be determined that the characterization temperature of the long-term storage does not meet the first operating temperature requirement. That is to say, in the embodiment of the present disclosure, after obtaining the first operating temperature range of the long-term storage, it can be determined whether the characterization temperature of the long-term storage meets the first operating temperature requirement by directly comparing the characterization temperature of the long-term storage with the first operating temperature range, thereby simplifying the process of determining whether the characterization temperature of the long-term storage meets the first operating temperature requirement, so as to improve the execution efficiency of the data storage method.

[0065] In some optional implementations, “the characteristic temperature of the long-term storage device meets the first operating temperature requirement” in step S402 may also include:

[0066] The characteristic temperature of the long-term memory is within a first operating temperature range, and a change rate of the characteristic temperature of the long-term memory within a unit time is less than or equal to a first change rate threshold.

[0067] Among them, the first operating temperature range and the first change rate threshold can be set according to multiple factors such as the hardware characteristics of the long-term memory, the working environment, the temperature control method, and the performance test results. For example, the first operating temperature range can be set to [0°C, 70°C], and the first change rate threshold can be set to 0.1°C / Min, 5°C / H, etc., and the embodiments of the present disclosure do not impose any restrictions on this; the unit time can be set according to application requirements, for example, it can be set to 1Min, 1H, etc., and the embodiments of the present disclosure also do not impose any restrictions on this.

[0068] In addition, in the embodiment of the present disclosure, it can also be determined that the characterization temperature of the long-term memory does not meet the first operating temperature requirement when the characterization temperature of the long-term memory exceeds the first operating temperature range or the rate of change of the characterization temperature of the long-term memory per unit time is greater than the first change rate threshold.

[0069] In the above manner, in the embodiment of the present disclosure, when the characterization temperature of the long-term storage is within the first operating temperature range and the rate of change of the characterization temperature of the long-term storage within a unit time is less than or equal to the first rate of change threshold, it can be determined that the characterization temperature of the long-term storage meets the first operating temperature requirement, and when the characterization temperature of the long-term storage exceeds the first operating temperature range or the rate of change of the characterization temperature of the long-term storage within a unit time is greater than the first rate of change threshold, it can be determined that the characterization temperature of the long-term storage does not meet the first operating temperature requirement. That is to say, in the embodiment of the present disclosure, whether the characterization temperature of the long-term storage meets the first operating temperature requirement will be determined from the two dimensions of "whether the characterization temperature of the long-term storage is within the first operating temperature range" and "whether the rate of change of the characterization temperature of the long-term storage within a unit time is less than or equal to the first rate of change threshold", thereby improving the reliability of the judgment result of whether the characterization temperature of the long-term storage meets the first operating temperature requirement, avoiding misjudging the situation that the characterization temperature of the long-term storage does not meet the first operating temperature requirement as the situation that the characterization temperature of the long-term storage meets the first operating temperature requirement, so as to further ensure that the long-term storage can maintain good working performance when performing the storage task for the running state data, thereby further reducing the risk of damage to the running state data, and then ensuring the integrity of the running state data.

[0070] In some optional implementations, “transferring the operating status data stored in the short-term memory to the long-term memory” in step S402 may include:

[0071] determining remaining storage capacity of long-term storage;

[0072] When the remaining storage capacity of the long-term storage meets the first storage capacity requirement, the operating status data stored in the short-term storage is transferred to the long-term storage.

[0073] That is, in the embodiment of the present disclosure, when the remaining storage capacity of the long-term storage meets the first storage capacity requirement, the operating status data stored in the short-term storage can be fully transferred to the long-term storage.

[0074] In one example, the first storage capacity requirement may be that the remaining storage capacity of the long-term storage is greater than or equal to the first capacity threshold, or that the ratio of the remaining storage capacity of the long-term storage to the total storage capacity of the long-term storage is greater than or equal to the first ratio threshold. In this way, by introducing multiple judgment methods (a judgment method using the first capacity threshold and a judgment method using the first ratio threshold), the data storage method can be more flexibly adapted to different application requirements, thereby improving the availability of the data storage method.

[0075] In addition, in this example, the first capacity threshold can be set according to application requirements, and the embodiments of the present disclosure do not limit this; the first ratio threshold can be set according to the overall storage capacity of the long-term storage. For example, a first target ratio value that is negatively correlated with the overall storage capacity of the long-term storage can be obtained as the first ratio threshold. Here, the first target ratio value is negatively correlated with the overall storage capacity of the long-term storage, which can be understood as: the larger the overall storage capacity of the long-term storage, the smaller the first target ratio value; the smaller the overall storage capacity of the long-term storage, the larger the first target ratio value.

[0076] Through the above method, in the embodiment of the present disclosure, there is a prerequisite for transferring the operating status data stored in the short-term storage to the long-term storage, that is, the remaining storage capacity of the long-term storage meets the first storage capacity requirement, and the first storage capacity requirement can be that the remaining storage capacity of the long-term storage is greater than or equal to the first capacity threshold, or that the proportion of the remaining storage capacity of the long-term storage to the overall storage capacity of the long-term storage is greater than or equal to the first proportion threshold. In this way, it can be avoided that when the remaining storage capacity of the long-term storage is too small, the operating status data stored in the short-term storage is transferred to the long-term storage, so as to effectively prevent the loss of the operating status data due to insufficient remaining storage capacity of the long-term storage, thereby further ensuring the integrity of the operating status data.

[0077] Based on the above concept, in the embodiment of the present disclosure, for the case where the remaining storage capacity of the long-term storage does not meet the first storage capacity requirement, the following three optional implementations are provided:

[0078] (1) First Optional Implementation Method

[0079] The remaining storage capacity of the long-term storage is expanded, and the operation status data stored in the short-term storage is transferred to the long-term storage after the remaining storage capacity is expanded.

[0080] In one example, the operation status data stored in the long-term storage can be deleted to expand the remaining storage capacity of the long-term storage. Since deleting the operation status data stored in the long-term storage is a relatively simple processing flow, the execution efficiency of the data storage method can be improved.

[0081] Furthermore, in this example, the operation status data stored in the long-term storage may be deleted in the following manner:

[0082] Obtaining a first level threshold value that is negatively correlated with the remaining storage capacity of the long-term storage;

[0083] Determine, from the operation status data stored in the long-term storage, first-category non-important data whose importance level is lower than a first-level threshold;

[0084] Delete the first category of non-important data.

[0085] Among them, the first level threshold is negatively correlated with the remaining storage capacity of the long-term storage, which can be understood as: the larger the remaining storage capacity of the long-term storage, the smaller the first level threshold; the smaller the remaining storage capacity of the long-term storage, the larger the first level threshold.

[0086] In addition, as mentioned above, in the embodiments of the present disclosure, the operating status data may include object status data, and perception data collected in real time by the perception subsystem. Among them, the object status data may include the position information, speed information, acceleration information, posture information, etc. of the target object; the perception subsystem may include a camera, a millimeter-wave radar, a laser radar, etc., and correspondingly, the perception data collected in real time by the perception subsystem may include image data collected in real time by the camera, obstacle-related data collected in real time by the millimeter-wave radar, and three-dimensional environment representation data collected in real time by the laser radar. Here, the image data collected in real time by the camera belongs to visual perception data, which specifically includes forward visual perception data, backward visual perception data, and side visual perception data (including left visual perception data and right visual perception data); the obstacle-related data collected in real time by the millimeter-wave radar, and the three-dimensional environment representation data collected in real time by the laser radar belong to non-visual perception data.

[0087] In a specific example, the importance levels of object state data and forward visual perception data are the same and higher than the importance levels of backward visual perception data, side visual perception data and non-visual perception data, and the importance levels of backward visual perception data, side visual perception data and non-visual perception data decrease in sequence.

[0088] Exemplarily, the importance level of the object state data and the forward visual perception data is 4, the importance level of the backward visual perception data is 3, the importance level of the side visual perception data is 2, and the importance level of the non-visual perception data is 1. Assuming that the remaining storage capacity of the long-term storage is 2T, and the first level threshold value negatively correlated with the remaining storage capacity of the long-term storage is 2, then the non-visual perception data (importance level 1) with an importance level lower than the first level threshold value 2 can be determined from the operating state data stored in the long-term storage as the first category of non-important data, and the first category of non-important data is deleted; assuming that the remaining storage capacity of the long-term storage is 1T, and the first level threshold value negatively correlated with the remaining storage capacity of the long-term storage is 3, then the non-visual perception data (importance level 1) and the side visual perception data (importance level 2) with an importance level lower than the first level threshold value 3 can be determined from the operating state data stored in the long-term storage as the first category of non-important data, and the first category of non-important data is deleted.

[0089] Through the above method, in the embodiment of the present disclosure, a first level threshold value that is negatively correlated with the remaining storage capacity of the long-term storage can be obtained, and the first category of non-important data with an importance level lower than the first level threshold value can be determined from the operating status data stored in the long-term storage, and then the first category of non-important data can be deleted. In this way, when there is a need to delete the operating status data, the first category of non-important data with a relatively low importance level can be deleted first, so as to maintain the available value of the operating status data as much as possible.

[0090] In another example, the long-term storage may include multiple SSDs (i.e., an SSD array), and the multiple SSDs may be gradually enabled based on the amount of operating status data stored in the long-term storage. Based on this, in this example, if there are still idle SSDs that are not enabled among the multiple SSDs, the idle SSDs among the multiple SSDs may be enabled to expand the remaining storage capacity of the long-term storage.

[0091] (2) Second Optional Implementation Method

[0092] The operation status data stored in the short-term memory is deleted to obtain first remaining operation status data, and the first remaining operation status data is transferred to the long-term memory.

[0093] Since deleting the operating status data stored in the short-term memory is a relatively simple processing flow, the execution efficiency of the data storage method can be improved.

[0094] In one example, the operation status data stored in the short-term memory may be deleted in the following manner:

[0095] Obtaining a second level threshold value that is negatively correlated with the remaining storage capacity of the long-term storage;

[0096] Determine, from the operation status data stored in the short-term memory, second-category non-important data whose importance level is lower than a second level threshold;

[0097] Delete the second category of non-important data.

[0098] Among them, the second level threshold is negatively correlated with the remaining storage capacity of the long-term storage, which can be understood as: the larger the remaining storage capacity of the long-term storage, the smaller the second level threshold; the smaller the remaining storage capacity of the long-term storage, the larger the second level threshold.

[0099] In addition, as mentioned above, in the embodiments of the present disclosure, the operating status data may include object status data, and perception data collected in real time by the perception subsystem. Among them, the object status data may include the position information, speed information, acceleration information, posture information, etc. of the target object; the perception subsystem may include a camera, a millimeter-wave radar, a laser radar, etc. Correspondingly, the perception data collected in real time by the perception subsystem may include image data collected in real time by the camera, obstacle-related data collected in real time by the millimeter-wave radar, and three-dimensional environment representation data collected in real time by the laser radar. Here, the image data collected in real time by the camera belongs to visual perception data, which specifically includes forward visual perception data, backward visual perception data, and side visual perception data; the obstacle-related data collected in real time by the millimeter-wave radar, and the three-dimensional environment representation data collected in real time by the laser radar belong to non-visual perception data.

[0100] In a specific example, the importance levels of object state data and forward visual perception data are the same and higher than the importance levels of backward visual perception data, side visual perception data and non-visual perception data, and the importance levels of backward visual perception data, side visual perception data and non-visual perception data decrease in sequence.

[0101] Exemplarily, the importance level of the object state data and the forward visual perception data is 4, the importance level of the backward visual perception data is 3, the importance level of the side visual perception data is 2, and the importance level of the non-visual perception data is 1. Assuming that the remaining storage capacity of the long-term memory is 2T, and the second level threshold value negatively correlated with the remaining storage capacity of the long-term memory is 2, then the non-visual perception data (importance level 1) with an importance level lower than the second level threshold value 2 can be determined from the operating state data stored in the short-term memory as the second type of non-important data, and the second type of non-important data is deleted; assuming that the remaining storage capacity of the long-term memory is 1T, and the second level threshold value negatively correlated with the remaining storage capacity of the long-term memory is 3, then the non-visual perception data (importance level 1) and the side visual perception data (importance level 2) with an importance level lower than the second level threshold value 3 can be determined from the operating state data stored in the short-term memory as the second type of non-important data, and the second type of non-important data is deleted.

[0102] Through the above method, in the embodiment of the present disclosure, a second level threshold value that is negatively correlated with the remaining storage capacity of the long-term storage can be obtained, and the second type of non-important data with an importance level lower than the second level threshold value can be determined from the operating status data stored in the short-term storage, and then the second type of non-important data can be deleted. In this way, when there is a need to delete the operating status data, the second type of non-important data with a relatively low importance level can be deleted first, so as to maintain the available value of the operating status data as much as possible.

[0103] (3) The third optional implementation method

[0104] The remaining storage capacity of the long-term storage is expanded, and the operation status data stored in the short-term storage is deleted to obtain the first remaining operation status data, and the first remaining operation status data is transferred to the long-term storage after the remaining storage capacity is expanded.

[0105] Among them, the specific description of "expanding the remaining storage capacity of the long-term memory" can be found in the relevant description in the first optional implementation manner above, which will not be repeated here; the specific description of "deleting the operating status data stored in the short-term memory" can be found in the relevant description in the second optional implementation manner above, which will not be repeated here.

[0106] Through the above method, in the embodiment of the present disclosure, from the two dimensions of "expanding the remaining storage capacity of the long-term storage" and "deleting the operating status data stored in the short-term storage", more comprehensive response measures can be provided for the situation where the remaining storage capacity of the long-term storage does not meet the first storage capacity requirement, so as to better prevent the loss of operating status data due to insufficient remaining storage capacity of the long-term storage, thereby further ensuring the integrity of the operating status data.

[0107] The following, combined with Figure 5 The flowchart diagram shown in the figure illustrates the second data storage method provided by the embodiment of the present disclosure. It should be noted that although the logical order is shown in the flowchart diagram, in some cases, the steps shown or described may also be performed in other orders.

[0108] Step S501: storing the running status data of the target object in a short-term memory.

[0109] Among them, for the specific description of step S501, please refer to the relevant description of step S401, which will not be repeated here.

[0110] Step S502: when the characteristic temperature of the long-term memory meets the first operating temperature requirement, the operating status data stored in the short-term memory is transferred to the long-term memory.

[0111] Among them, for the specific description of step S502, reference may be made to the relevant description of step S402, which will not be repeated here.

[0112] Step S503 , when the characteristic temperature of the long-term memory changes from satisfying the first operating temperature requirement to not satisfying the first operating temperature requirement, copying the operating status data stored in the long-term memory to the short-term memory.

[0113] In one example, the operation status data stored in the long-term memory may be transferred to the short-term memory in the following manner:

[0114] determining remaining storage capacity of short-term storage;

[0115] determining an amount of operating status data stored in long-term storage;

[0116] When the remaining storage capacity of the short-term storage is greater than the amount of the operating status data stored in the long-term storage, and the difference between the remaining storage capacity of the short-term storage and the amount of the operating status data stored in the long-term storage is greater than or equal to a preset difference threshold, copying the operating status data stored in the long-term storage to the short-term storage;

[0117] Alternatively, when the remaining storage capacity of the short-term memory is less than or equal to the amount of operating status data stored in the long-term memory or the remaining storage capacity of the short-term memory is greater than the amount of operating status data stored in the long-term memory, and the difference between the remaining storage capacity of the short-term memory and the amount of operating status data stored in the long-term memory is less than a preset difference threshold, important operating status data is selected from the operating status data stored in the long-term memory and the important operating status data is copied to the short-term memory.

[0118] The preset difference threshold may be set according to application requirements, and the embodiments of the present disclosure do not limit this.

[0119] In addition, in this example, the important operating status data selected from the operating status data stored in the long-term storage may be other data in the operating status data stored in the long-term storage except the first type of non-important data. The method for determining the first type of non-important data may refer to the relevant description of the first data storage method provided in the embodiment of the present disclosure, and will not be described in detail here.

[0120] Furthermore, in the embodiment of the present disclosure, when the characteristic temperature of the long-term memory changes from not meeting the first operating temperature requirement to meeting the first operating temperature requirement, the operating status data stored in the short-term memory can be transferred to the long-term memory.

[0121] The data storage method provided by the embodiment of the present disclosure not only has the beneficial effect of the first data storage method provided by the embodiment of the present disclosure, but can also copy the operating status data stored in the long-term storage to the short-term storage when the characterization temperature of the long-term storage changes from satisfying the first operating temperature requirement to not satisfying the first operating temperature requirement, thereby avoiding damage to the operating performance of the long-term storage after the characterization temperature of the long-term storage changes from satisfying the first operating temperature requirement to not satisfying the first operating temperature requirement, and increasing the possibility of loss of the operating status data due to the damaged working performance of the long-term storage, thereby further reducing the risk of damage to the operating status data, and thus ensuring the integrity of the operating status data.

[0122] The following, combined with Figure 6 The flowchart diagram shown in the figure illustrates the third data storage method provided by the embodiment of the present disclosure. It should be noted that although the logical order is shown in the flowchart diagram, in some cases, the steps shown or described may also be performed in other orders.

[0123] Step S601: When the characteristic temperature of the short-term memory meets the second operating temperature requirement, the operating state data of the target object is stored in the short-term memory.

[0124] Among them, the characterization temperature of the short-term memory can be used to characterize the real-time temperature of the short-term memory; the second operating temperature requirement can be used to characterize the temperature requirement required for the short-term memory to work normally. Here, the second operating temperature requirement of the short-term memory can be set according to multiple factors such as the hardware characteristics, working environment, temperature control method, and performance test results of the short-term memory. For example, it can be set according to multiple factors such as the hardware characteristics, working environment, temperature control method, and performance test results of the short-term memory, and the embodiments of the present disclosure are not limited to this. In addition, it can be understood that in the embodiments of the present disclosure, when the characterization temperature of the short-term memory meets the second operating temperature requirement, it at least indicates that the short-term memory is not in an extreme temperature state.

[0125] Among them, the operating status data may include object status data and perception data collected in real time by the perception subsystem. Here, the object status data may include the position information, speed information, acceleration information, posture information, etc. of the target object; the perception subsystem may include a camera, a millimeter-wave radar, a laser radar, etc. Correspondingly, the perception data collected in real time by the perception subsystem may include image data collected in real time by the camera, obstacle-related data collected in real time by the millimeter-wave radar, and three-dimensional environment representation data collected in real time by the laser radar.

[0126] In one example, in response to a startup operation for a target object, the target object can be put into a startup state, and when the target object is in the startup state, the characterization temperature of the short-term memory is obtained according to a second preset time interval, and when the characterization temperature of the short-term memory meets the second operating temperature requirement, the operating state data of the target object is obtained, and the operating state data of the target object is stored in the short-term memory. The startup state can be a standby state or a driving state. Here, the standby state can be a state in which the target object has been started but has not yet driven; the driving state can be a state in which the target object has been started and has started to drive; the second preset time interval can be set according to application requirements, for example, it can be set to 100Ms, 200Ms or 500Ms, and the embodiments of the present disclosure are not limited to this.

[0127] Step S602: when the characteristic temperature of the long-term memory meets the first operating temperature requirement, the operating status data stored in the short-term memory is transferred to the long-term memory.

[0128] Among them, for the specific description of step S602, reference may be made to the relevant description of step S402, which will not be repeated here.

[0129] According to the data storage method provided by the embodiment of the present disclosure, after the operation status data of the target object is acquired, the operation status data is not directly and unconditionally stored in the short-term memory, but the operation status data of the target object is stored in the short-term memory only when the characterization temperature of the short-term memory meets the second working temperature requirement. In this way, it can be avoided that the short-term memory performs the storage task for the operation status data under the extreme temperature state, thereby damaging the working performance of the short-term memory. On the other hand, after the operation status data of the target object is stored in the short-term memory, the operation status data stored in the short-term memory is not directly and unconditionally transferred to the long-term memory, but first determines whether the characterization temperature of the long-term memory meets the first working temperature requirement (that is, the temperature requirement required for the long-term memory to work normally), and only when the characterization temperature of the long-term memory meets the first working temperature requirement, the operation status data stored in the short-term memory is transferred to the long-term memory. In this way, it can be avoided that the long-term memory performs the storage task for the operation status data under the extreme temperature state, so that the long-term memory can maintain good working performance when performing the storage task for the operation status data, thereby further reducing the risk of damage to the operation status data, and then ensuring the integrity of the operation status data; at the same time, the service life of the long-term memory can also be improved.

[0130] In addition, it should be noted that in the embodiment of the present disclosure, the operating status data of the target object can be stored in the temporary memory during the waiting period when the target object is in the startup state but the representative temperature of the short-term memory does not meet the second operating temperature requirement, so that the operating status data stored in the temporary memory can be transferred to the short-term memory when the representative temperature of the short-term memory meets the second operating temperature requirement.

[0131] That is, in the embodiment of the present disclosure, step S601 may include:

[0132] When the characteristic temperature of the short-term memory meets the second operating temperature requirement, the operating state data stored in the temporary memory is transferred to the short-term memory.

[0133] The temporary storage may be an SSD, and the overall storage capacity of the temporary storage is smaller than the storage capacity of the long-term storage.

[0134] In one example, the temporary storage may be outside the computing subsystem, and based on cost considerations, the temporary storage is usually not equipped with a dedicated temperature control system, but rather uses natural heating or natural cooling to control the temperature.

[0135] Through the above settings, in the embodiment of the present disclosure, when the characteristic temperature of the short-term memory meets the second operating temperature requirement, the operating status data stored in the temporary memory can be transferred to the short-term memory to avoid the loss of this part of the operating status data, thereby further ensuring the integrity of the operating status data.

[0136] Further, in some optional implementations, the characteristic temperature of the short-term memory may be obtained by:

[0137] Obtaining a temperature reading result of a second temperature sensing device; wherein the second temperature sensing device is disposed in the computing subsystem;

[0138] Based on the temperature reading result of the second temperature sensing device, a representative temperature of the short-term memory is obtained.

[0139] As mentioned above, in the embodiment of the present disclosure, the computing subsystem may include a system package box, and a plurality of internal devices disposed inside the system package box, such as a CPU, a GPU, and a short-term memory, etc. Based on this, in one example, the second temperature sensing device may be disposed in the computing subsystem, for example, in the short-term memory or the system package box.

[0140] In one example, the temperature reading result of the second temperature sensing device can be obtained at a second preset time interval, and the characterization temperature of the short-term memory can be obtained based on the temperature reading result of the second temperature sensing device, so that when the characterization temperature of the short-term memory meets the second operating temperature requirement, the operating status data of the target object can be obtained and stored in the short-term memory.

[0141] Through the above method, in the embodiment of the present disclosure, the temperature reading result of the second temperature sensing device (set in the computing subsystem) can be obtained, and based on the temperature reading result of the second temperature sensing device, the representative temperature of the short-term memory can be obtained. Since the second temperature sensing device is set in the computing subsystem, the reliability of the temperature result of the second temperature sensing device can be improved, thereby improving the reliability of the representative temperature of the short-term memory.

[0142] In addition, in the embodiment of the present disclosure, when the second temperature sensing device is arranged in the computing subsystem, the characterizing temperature of the short-term memory can be obtained based on the temperature reading result of the second temperature sensing device: the temperature reading result of the second temperature sensing device is used as the characterizing temperature of the short-term memory.

[0143] Based on this, in some optional implementations, “the characteristic temperature of the short-term memory meets the second operating temperature requirement” in step S601 may include:

[0144] The characteristic temperature of the short-term memory is within a second preset operating temperature range.

[0145] Among them, the second operating temperature range can be set according to multiple factors such as the hardware characteristics of the short-term memory, the working environment, the temperature control method, and the performance test results. For example, it can be set to [0°C, 85°C]. The embodiments of the present disclosure do not limit this.

[0146] In addition, in the embodiment of the present disclosure, when the representative temperature of the short-term memory exceeds the second operating temperature range, it can be determined that the representative temperature of the short-term memory does not meet the second operating temperature requirement.

[0147] In the above manner, in the embodiment of the present disclosure, when the characterization temperature of the short-term memory is within the second operating temperature range, it can be determined that the characterization temperature of the short-term memory meets the second operating temperature requirement, and when the characterization temperature of the short-term memory exceeds the second operating temperature range, it can be determined that the characterization temperature of the short-term memory does not meet the second operating temperature requirement. That is, in the embodiment of the present disclosure, after obtaining the second operating temperature range of the short-term memory, it can be determined whether the characterization temperature of the short-term memory meets the second operating temperature requirement by directly comparing the characterization temperature of the short-term memory with the second operating temperature range, thereby simplifying the process of determining whether the characterization temperature of the short-term memory meets the second operating temperature requirement, so as to improve the execution efficiency of the data storage method.

[0148] In some optional implementations, “the characteristic temperature of the short-term memory meets the second operating temperature requirement” in S601 may also include:

[0149] The representative temperature of the short-term memory is within the second operating temperature range, and the change rate of the representative temperature of the short-term memory within a unit time is less than or equal to a second change rate threshold.

[0150] Among them, the second operating temperature range and the second change rate threshold can be set according to multiple factors such as the hardware characteristics of the short-term memory, the working environment, the temperature control method, and the performance test results. For example, the second operating temperature range can be set to [0℃, 85℃], and the second change rate threshold can be set to 0.1℃ / Min, 5℃ / H, etc., and the embodiments of the present disclosure do not impose any restrictions on this; the unit time can be set according to application requirements, for example, it can be set to 1Min, 1H, etc., and the embodiments of the present disclosure also do not impose any restrictions on this.

[0151] In addition, in the embodiment of the present disclosure, when the representative temperature of the short-term memory exceeds the second operating temperature range or the rate of change of the representative temperature of the short-term memory per unit time is greater than the second change rate threshold, it can be determined that the representative temperature of the short-term memory does not meet the second operating temperature requirement.

[0152] In the above manner, in the embodiment of the present disclosure, when the characterization temperature of the short-term memory is within the second operating temperature range and the rate of change of the characterization temperature of the short-term memory within a unit time is less than or equal to the second rate of change threshold, it can be determined that the characterization temperature of the short-term memory meets the second operating temperature requirement, and when the characterization temperature of the short-term memory exceeds the second operating temperature range or the rate of change of the characterization temperature of the short-term memory within a unit time is greater than the second rate of change threshold, it can be determined that the characterization temperature of the short-term memory does not meet the second operating temperature requirement. That is to say, in the embodiment of the present disclosure, whether the characterization temperature of the short-term memory meets the second operating temperature requirement will be determined from the two dimensions of "whether the characterization temperature of the short-term memory is within the second operating temperature range" and "whether the rate of change of the characterization temperature of the short-term memory within a unit time is less than or equal to the second rate of change threshold", thereby improving the reliability of the judgment result on whether the characterization temperature of the short-term memory meets the second operating temperature requirement, avoiding misjudging the situation that the characterization temperature of the short-term memory does not meet the second operating requirement as the situation that the characterization temperature of the short-term memory meets the second operating temperature requirement, so as to further ensure that the short-term memory can maintain good working performance when performing the storage task for the running state data, thereby further reducing the risk of damage to the running state data, and then ensuring the integrity of the running state data.

[0153] In the embodiment of the present disclosure, the second temperature sensing device may also include multiple temperature sensors, and the multiple temperature sensors are arranged at different positions of the computing subsystem. For example, the multiple temperature sensors may be arranged at different positions of the system packaging box, specifically, they may be arranged at different positions of the inner wall of the system packaging box. In this case, the temperature reading result of the second temperature sensing device may include multiple temperature reading values ​​corresponding to the multiple temperature sensors one by one.

[0154] Based on this, in the embodiment of the present disclosure, based on the temperature reading result of the second temperature sensing device, the representative temperature of the short-term memory can be obtained by calculating the average value of multiple temperature reading values ​​as the representative temperature of the short-term memory. That is to say, in the embodiment of the present disclosure, the central tendency of multiple temperature reading values ​​can be effectively measured by the average value of multiple temperature reading values, thereby improving the reliability of the representative temperature of the short-term memory.

[0155] Based on this, in some optional implementations, “the characteristic temperature of the short-term memory meets the second operating temperature requirement” in step S601 may include:

[0156] The characteristic temperature of the short-term memory is located in a minimum temperature range among a plurality of preset operating temperature ranges.

[0157] Among them, multiple preset device operating temperature ranges correspond one-to-one to multiple internal devices of the computing subsystem.

[0158] Among them, for each internal device among the multiple internal devices, the preset device operating temperature range corresponding to the internal device can be set according to multiple factors such as the hardware characteristics, working environment, temperature control method, and performance test results of the internal device. For example, the multiple internal devices include CPU, GPU, short-term memory, etc. The preset device operating temperature range corresponding to the CPU can be set to [0℃, 95℃], the preset device operating temperature range corresponding to the GPU can be set to [0℃, 95℃], and the preset device operating temperature range corresponding to the short-term memory can be set to [0℃, 85℃]. Therefore, the preset device operating temperature range corresponding to the short-term memory can be used as the minimum temperature range among the multiple preset device operating temperature ranges, that is, the minimum temperature range among the multiple preset device operating temperature ranges is [0℃, 85℃].

[0159] In addition, in the embodiment of the present disclosure, when the characteristic temperature of the short-term memory exceeds the minimum temperature range among a plurality of preset device operating temperature ranges, it can be determined that the characteristic temperature of the short-term memory does not meet the second operating temperature requirement.

[0160] Through the above manner, in the embodiment of the present disclosure, when the characterization temperature of the short-term memory is within the minimum temperature range of multiple preset device operating temperature ranges, it can be determined that the characterization temperature of the short-term memory meets the second operating temperature requirement, and when the characterization temperature of the short-term memory exceeds the minimum temperature range of multiple preset device operating temperature ranges, it can be determined that the characterization temperature of the short-term memory does not meet the second operating temperature requirement. That is to say, in the embodiment of the present disclosure, after obtaining the minimum temperature range of multiple preset device operating temperature ranges, it can be determined whether the characterization temperature of the short-term memory meets the second operating temperature requirement by directly comparing the characterization temperature of the short-term memory with the minimum temperature range of multiple preset device operating temperature ranges, thereby simplifying the process of determining whether the characterization temperature of the short-term memory meets the second operating temperature requirement, thereby improving the execution efficiency of the data storage method.

[0161] In some optional implementations, “the characteristic temperature of the short-term memory meets the second operating temperature requirement” in step S601 may also include:

[0162] The representative temperature of the short-term memory is within a minimum temperature range of a plurality of preset operating temperature ranges, and a change rate of the representative temperature of the short-term memory within a unit time is less than or equal to a third change rate threshold.

[0163] Among them, multiple preset device operating temperature ranges correspond one-to-one to multiple internal devices of the computing subsystem.

[0164] Among them, for each internal device among the multiple internal devices, the preset device operating temperature range corresponding to the internal device can be set according to multiple factors such as the hardware characteristics, working environment, temperature control method, and performance test results of the internal device. For example, the multiple internal devices include CPU, GPU, short-term memory, etc. The preset device operating temperature range corresponding to the CPU can be set to [0℃, 95℃], the preset device operating temperature range corresponding to the GPU can be set to [0℃, 95℃], and the preset device operating temperature range corresponding to the short-term memory can be set to [0℃, 85℃]. Therefore, the preset device operating temperature range corresponding to the short-term memory can be used as the minimum temperature range among the multiple preset device operating temperature ranges, that is, the minimum temperature range among the multiple preset device operating temperature ranges is [0℃, 85℃].

[0165] Furthermore, in the embodiments of the present disclosure, the unit time can be set according to application requirements, for example, it can be set to 1 Min, 1 H, etc., and the embodiments of the present disclosure do not impose any restrictions on this; the third change rate threshold can be set according to multiple factors such as the hardware characteristics of the short-term memory, the working environment, the temperature control method, and the performance test results. For example, it can be set to 0.1°C / Min, 5°C / H, etc., and the embodiments of the present disclosure also do not impose any restrictions on this.

[0166] In addition, in the embodiment of the present disclosure, it is also possible to determine that the characterization temperature of the short-term memory does not meet the second operating temperature requirement when the characterization temperature of the short-term memory exceeds the minimum temperature range of multiple preset device operating temperature ranges or the rate of change of the characterization temperature of the short-term memory per unit time is greater than a third temperature change rate threshold.

[0167] Through the above method, in the embodiment of the present disclosure, when the characterization temperature of the short-term memory is within the minimum temperature range of multiple preset device operating temperature ranges and the rate of change of the characterization temperature of the short-term memory per unit time is less than or equal to the third temperature change rate threshold, it can be determined that the short-term characterization temperature meets the second operating temperature requirement; and when the characterization temperature of the short-term memory exceeds the minimum temperature range of multiple preset device operating temperature ranges or the rate of change of the characterization temperature of the short-term memory per unit time is greater than the third temperature change rate threshold, it can be determined that the characterization temperature of the short-term memory does not meet the second operating temperature requirement. That is to say, in the embodiment of the present disclosure, whether the characterization temperature of the short-term memory meets the second operating temperature requirement will be judged from two dimensions: "whether the characterization temperature of the short-term memory is within the minimum temperature range of multiple preset device operating temperature ranges" and "whether the rate of change of the characterization temperature of the short-term memory within unit time is less than or equal to the third temperature change rate threshold", thereby improving the reliability of the judgment result on whether the characterization temperature of the short-term memory meets the second operating temperature requirement, avoiding the situation where the characterization temperature of the short-term memory does not meet the second operating temperature requirement being misjudged as the situation where the characterization temperature of the short-term memory meets the second operating temperature requirement, so as to further ensure that the short-term memory can maintain good working performance when performing storage tasks for operating status data, thereby further reducing the risk of damage to the operating status data, and further ensuring the integrity of the operating status data.

[0168] In some optional implementations, "storing the target object's operating status data in a short-term memory" in step S601 may include:

[0169] determining remaining storage capacity of short-term storage;

[0170] When the remaining storage capacity of the short-term storage meets the second storage capacity requirement, the operating status data of the target object is stored in the short-term storage.

[0171] That is, in the embodiment of the present disclosure, when the remaining storage capacity of the short-term storage meets the second storage capacity requirement, the running status data of the target object can be stored in full in the short-term storage.

[0172] In one example, the second storage capacity requirement may be that the remaining storage capacity of the short-term memory is greater than or equal to the second capacity threshold, or that the ratio of the remaining storage capacity of the short-term memory to the total storage capacity of the short-term memory is greater than or equal to the second ratio threshold. In this way, by introducing multiple judgment methods (a judgment method using the second capacity threshold and a judgment method using the second ratio threshold), the data storage method can be more flexibly adapted to different application requirements, thereby improving the availability of the data storage method.

[0173] In addition, in this example, the second capacity threshold can be set according to application requirements, and the embodiments of the present disclosure do not limit this; the second ratio threshold can be set according to the overall storage capacity of the short-term memory. For example, a second target ratio value that is negatively correlated with the overall storage capacity of the short-term memory can be obtained as the second ratio threshold. Here, the second target ratio value is negatively correlated with the overall storage capacity of the short-term memory, which can be understood as: the larger the overall storage capacity of the short-term memory, the smaller the second target ratio value; the smaller the overall storage capacity of the short-term memory, the larger the second target ratio value.

[0174] Through the above method, in the embodiment of the present disclosure, there is a prerequisite for storing the running status data of the target object in the short-term memory, that is, the remaining storage capacity of the short-term memory satisfies the second storage capacity requirement, and the second storage capacity requirement can be that the remaining storage capacity of the short-term memory is greater than or equal to the second capacity threshold, or that the proportion of the remaining storage capacity of the short-term memory to the overall storage capacity of the short-term memory is greater than or equal to the second proportion threshold. In this way, it can be avoided that when the remaining storage capacity of the short-term memory is too small, the running status data of the target object is stored in the short-term memory, so as to effectively prevent the loss of the running status data due to insufficient remaining storage capacity of the short-term memory, thereby further ensuring the integrity of the running status data.

[0175] Based on the above concept, in the embodiment of the present disclosure, for the case where the remaining storage capacity of the short-term memory does not meet the second storage capacity requirement, the following three optional implementations are provided:

[0176] (1) First Optional Implementation Method

[0177] The remaining storage capacity of the short-term storage is expanded, and the operation status data of the target object is stored in the short-term storage after the remaining storage capacity is expanded.

[0178] In one example, the operating status data stored in the short-term memory can be deleted to expand the remaining storage capacity of the short-term memory. Since deleting the operating status data stored in the short-term memory is a relatively simple processing flow, the execution efficiency of the data storage method can be improved.

[0179] Furthermore, in this example, the operation status data stored in the short-term memory may be deleted in the following manner:

[0180] Obtaining a third level threshold value that is negatively correlated with the remaining storage capacity of the short-term memory;

[0181] determining, from the operation status data stored in the short-term memory, third-category non-important data whose importance level is lower than a third-level threshold;

[0182] Delete the third category of non-important data.

[0183] Among them, the third level threshold is negatively correlated with the remaining storage capacity of the short-term memory, which can be understood as: the larger the remaining storage capacity of the short-term memory, the smaller the third level threshold; the smaller the remaining storage capacity of the short-term memory, the larger the third level threshold.

[0184] In addition, as mentioned above, in the embodiments of the present disclosure, the operating status data may include object status data, and perception data collected in real time by the perception subsystem. Among them, the object status data may include the position information, speed information, acceleration information, posture information, etc. of the target object; the perception subsystem may include a camera, a millimeter-wave radar, a laser radar, etc. Correspondingly, the perception data collected in real time by the perception subsystem may include image data collected in real time by the camera, obstacle-related data collected in real time by the millimeter-wave radar, and three-dimensional environment representation data collected in real time by the laser radar. Here, the image data collected in real time by the camera belongs to visual perception data, which specifically includes forward visual perception data, backward visual perception data, and side visual perception data; the obstacle-related data collected in real time by the millimeter-wave radar, and the three-dimensional environment representation data collected in real time by the laser radar belong to non-visual perception data.

[0185] In a specific example, the importance levels of object state data and forward visual perception data are the same and higher than the importance levels of backward visual perception data, side visual perception data and non-visual perception data, and the importance levels of backward visual perception data, side visual perception data and non-visual perception data decrease in sequence.

[0186] Exemplarily, the importance level of the object state data and the forward visual perception data is 4, the importance level of the backward visual perception data is 3, the importance level of the side visual perception data is 2, and the importance level of the non-visual perception data is 1. Assuming that the remaining storage capacity of the short-term memory is 256G, and the third level threshold value negatively correlated with the remaining storage capacity of the short-term memory is 2, then the non-visual perception data (importance level 1) with an importance level lower than the third level threshold value 2 can be determined from the operating state data stored in the short-term memory as the third category of non-important data, and the third category of non-important data is deleted; assuming that the remaining storage capacity of the short-term memory is 128G, and the third level threshold value negatively correlated with the remaining storage capacity of the short-term memory is 3, then the non-visual perception data (importance level 1) and the side visual perception data (importance level 2) with an importance level lower than the third level threshold value 3 can be determined from the operating state data stored in the short-term memory as the third category of non-important data, and the third category of non-important data is deleted.

[0187] Through the above method, in the embodiment of the present disclosure, a third level threshold value that is negatively correlated with the remaining storage capacity of the short-term memory can be obtained, and the third category of non-important data whose importance level is lower than the third level threshold value can be determined from the operating status data stored in the short-term memory, and then the third category of non-important data can be deleted. In this way, when there is a need to delete the operating status data, the third category of non-important data with a relatively low importance level can be deleted first, so as to maintain the available value of the operating status data as much as possible.

[0188] (2) Second Optional Implementation Method

[0189] The running state data of the target object is deleted to obtain second remaining running state data, and the second remaining running state data is stored in the short-term memory.

[0190] Since deleting the running status data of the target object is a relatively simple processing flow, the execution efficiency of the data storage method can be improved.

[0191] In one example, the running status data of the target object may be deleted in the following manner:

[0192] Obtaining a fourth level threshold value that is negatively correlated with the remaining storage capacity of the short-term memory;

[0193] Determine, from the operating status data of the target object, a fourth category of non-important data whose importance level is lower than a fourth level threshold;

[0194] The fourth category of non-important data is deleted.

[0195] Among them, the fourth level threshold is negatively correlated with the remaining storage capacity of the short-term memory, which can be understood as: the larger the remaining storage capacity of the short-term memory, the smaller the fourth level threshold; the smaller the remaining storage capacity of the short-term memory, the larger the fourth level threshold.

[0196] In addition, as mentioned above, in the embodiments of the present disclosure, the operating status data may include object status data, and perception data collected in real time by the perception subsystem. Among them, the object status data may include the position information, speed information, acceleration information, posture information, etc. of the target object; the perception subsystem may include a camera, a millimeter-wave radar, a laser radar, etc. Correspondingly, the perception data collected in real time by the perception subsystem may include image data collected in real time by the camera, obstacle-related data collected in real time by the millimeter-wave radar, and three-dimensional environment representation data collected in real time by the laser radar. Here, the image data collected in real time by the camera belongs to visual perception data, which specifically includes forward visual perception data, backward visual perception data, and side visual perception data; the obstacle-related data collected in real time by the millimeter-wave radar, and the three-dimensional environment representation data collected in real time by the laser radar belong to non-visual perception data.

[0197] In a specific example, the importance levels of object state data and forward visual perception data are the same and higher than the importance levels of backward visual perception data, side visual perception data and non-visual perception data, and the importance levels of backward visual perception data, side visual perception data and non-visual perception data decrease in sequence.

[0198] Exemplarily, the importance level of the object state data and the forward visual perception data is 4, the importance level of the backward visual perception data is 3, the importance level of the side visual perception data is 2, and the importance level of the non-visual perception data is 1. Assuming that the remaining storage capacity of the short-term memory is 2T, and the fourth level threshold value negatively correlated with the remaining storage capacity of the short-term memory is 2, then the non-visual perception data (importance level 1) with an importance level lower than the fourth level threshold value 2 can be determined from the running state data of the target object as the fourth category of non-important data, and the fourth category of non-important data is deleted; assuming that the remaining storage capacity of the short-term memory is 1T, and the fourth level threshold value negatively correlated with the remaining storage capacity of the short-term memory is 3, then the non-visual perception data (importance level 1) and the side visual perception data (importance level 2) with an importance level lower than the fourth level threshold value 3 can be determined from the running state data of the target object as the fourth category of non-important data, and the fourth category of non-important data is deleted.

[0199] Through the above method, in the embodiment of the present disclosure, a fourth level threshold value that is negatively correlated with the remaining storage capacity of the short-term memory can be obtained, and the fourth category of non-important data with an importance level lower than the fourth level threshold value can be determined from the operating status data of the target object, and then the fourth category of non-important data can be deleted. In this way, when there is a need to delete the operating status data, the fourth category of non-important data with a relatively low importance level can be deleted first, so as to maintain the available value of the operating status data as much as possible.

[0200] (3) The third optional implementation method

[0201] The remaining storage capacity of the short-term memory is expanded, and the operation status data of the target object is deleted to obtain second remaining operation status data, and the second remaining operation status data is stored in the short-term memory after the remaining storage capacity is expanded.

[0202] Among them, the specific description of "expanding the remaining storage capacity of the short-term memory" can be found in the relevant description in the first optional implementation manner above, which will not be repeated here; the specific description of "deleting the operating status data of the target object" can be found in the relevant description in the second optional implementation manner above, which will not be repeated here.

[0203] Through the above method, in the embodiment of the present disclosure, starting from the two dimensions of "expanding the remaining storage capacity of the short-term memory" and "deleting the operating status data of the target object", more comprehensive response measures can be provided for the situation where the remaining storage capacity of the short-term memory does not meet the second storage capacity requirement, so as to better prevent the loss of operating status data due to insufficient remaining storage capacity of the short-term memory, thereby further ensuring the integrity of the operating status data.

[0204] The following, combined with Figure 7 The flowchart diagram shown is used to illustrate the fourth data storage method provided by the embodiment of the present disclosure. It should be noted that although the logical order is shown in the flowchart diagram, in some cases, the steps shown or described may also be performed in other orders.

[0205] Step S701, obtaining a characteristic temperature of a long-term memory and obtaining a characteristic temperature of a short-term memory.

[0206] The characteristic temperature of the long-term memory can be used to characterize the real-time temperature of the long-term memory; and the characteristic temperature of the short-term memory can be used to characterize the real-time temperature of the short-term memory.

[0207] Step S702, determining whether the representative temperature of the long-term memory does not meet the first operating temperature requirement, and the representative temperature of the short-term memory meets the second operating temperature requirement.

[0208] Among them, the first operating temperature requirement can be used to characterize the temperature requirement required for the long-term memory to work normally. Here, the first operating temperature requirement of the long-term memory can be set according to multiple factors such as the hardware characteristics of the long-term memory, the working environment, the temperature control method, and the performance test results, and the embodiments of the present disclosure do not limit this. In addition, it can be understood that in the embodiments of the present disclosure, when the characterization temperature of the long-term memory meets the first operating temperature requirement, it at least indicates that the long-term memory is not in an extreme temperature state.

[0209] Among them, the second operating temperature requirement can be used to characterize the temperature requirement required for the short-term memory to work normally. Here, the second operating temperature requirement of the short-term memory can be set according to multiple factors such as the hardware characteristics, working environment, temperature control method, and performance test results of the short-term memory. For example, it can be set according to multiple factors such as the hardware characteristics, working environment, temperature control method, and performance test results of the short-term memory, and the embodiments of the present disclosure are not limited to this. In addition, it can be understood that in the embodiments of the present disclosure, when the characterization temperature of the short-term memory meets the second operating temperature requirement, it at least indicates that the short-term memory is not in an extreme temperature state.

[0210] In addition, in the embodiment of the present disclosure, when the characterization temperature of the long-term memory does not meet the first operating temperature requirement and the characterization temperature of the short-term memory meets the second operating temperature requirement, step S703 and step S704 can be executed; when the characterization temperature of the long-term memory meets the first operating temperature requirement, step S705 can be executed.

[0211] Step S703: storing the running status data of the target object in a short-term memory.

[0212] Among them, the operating status data may include object status data and perception data collected in real time by the perception subsystem. Here, the object status data may include the position information, speed information, acceleration information, posture information, etc. of the target object; the perception subsystem may include a camera, a millimeter-wave radar, a laser radar, etc. Correspondingly, the perception data collected in real time by the perception subsystem may include image data collected in real time by the camera, obstacle-related data collected in real time by the millimeter-wave radar, and three-dimensional environment representation data collected in real time by the laser radar.

[0213] In one example, in response to a startup operation for a target object, the target object can be put into a startup state, and when the target object is in the startup state, the characterization temperature of the long-term memory is obtained according to a third preset time interval, and the characterization temperature of the short-term memory is obtained, and when the characterization temperature of the long-term memory does not meet the first operating temperature requirement and the characterization temperature of the short-term memory meets the second operating temperature requirement, the operating state data of the target object is obtained, and the operating state data of the target object is stored in the short-term memory. The startup state can be a standby state or a driving state. Here, the standby state can be a state in which the target object has been started but has not yet driven; the driving state can be a state in which the target object has been started and has started to drive; the third preset time interval can be set according to application requirements, for example, it can be set to 100Ms, 200Ms or 500Ms, and the embodiments of the present disclosure are not limited to this.

[0214] Step S704: when the characteristic temperature of the long-term memory meets the first operating temperature requirement, the operating status data stored in the short-term memory is transferred to the long-term memory.

[0215] Among them, for the specific description of step S704, please refer to the relevant description of step S402, which will not be repeated here.

[0216] Step S705 : When the characteristic temperature of the long-term storage meets the first operating temperature requirement, the operating status data of the target object is stored in the long-term storage.

[0217] In the embodiment of the present disclosure, in response to the startup operation for the target object, the target object can be put into the startup state, and when the target object is in the startup state, the characterization temperature of the long-term memory is obtained according to the third preset time interval, and the characterization temperature of the short-term memory is obtained, and when the characterization temperature of the long-term memory meets the first operating temperature requirement, the operating state data of the target object is obtained, and the operating state data of the target object is stored in the long-term memory. The startup state can be a standby state or a driving state. Here, the standby state can be a state in which the target object has been started but has not yet driven; the driving state can be a state in which the target object has been started and has started to drive; the third preset time interval can be set according to the application requirements, for example, it can be set to 100Ms, 200Ms or 500Ms, and the embodiment of the present disclosure does not limit this.

[0218] According to the data storage method provided by the embodiment of the present disclosure, after the running state data of the target object is stored in the short-term memory, the running state data stored in the short-term memory is not directly and unconditionally transferred to the long-term memory, but first determines whether the characterization temperature of the long-term memory meets the first working temperature requirement (that is, the temperature requirement required for the long-term memory to work normally), and only when the characterization temperature of the long-term memory meets the first working temperature requirement, the running state data stored in the short-term memory is transferred to the long-term memory. In this way, it can be avoided that the long-term memory performs the storage task for the running state data under the extreme temperature state, so that the long-term memory can maintain good working performance when performing the storage task for the running state data, thereby further reducing the risk of damage to the running state data, and then ensuring the integrity of the running state data; at the same time, the service life of the long-term memory can also be improved. On the other hand, when the characterization temperature of the long-term memory meets the first working temperature requirement, it is not necessary to consider whether the characterization temperature of the short-term memory meets the second working temperature requirement, and the running state data of the target object can be directly stored in the long-term memory. In this way, the use frequency of the short-term memory can be reduced, that is, the number of erasures of the short-term memory can be reduced, thereby improving the service life of the short-term memory.

[0219] The following will be combined Figure 8 , the integrity process of a data storage method provided by an embodiment of the present disclosure is introduced in detail.

[0220] Step S801: in response to a start-up operation on a target object, the target object is put into a start-up state.

[0221] The startup state may be a standby state or a driving state. Here, the standby state may be a state where the target object has been started but has not yet been driven; the driving state may be a state where the target object has been started and has started to drive.

[0222] Step S802, determining whether the characteristic temperature of the short-term memory meets the second operating temperature requirement.

[0223] Among them, the characterization temperature of the short-term memory can be used to characterize the real-time temperature of the short-term memory; the second operating temperature requirement can be used to characterize the temperature requirement required for the short-term memory to work normally. Here, the second operating temperature requirement of the short-term memory can be set according to multiple factors such as the hardware characteristics, working environment, temperature control method, and performance test results of the short-term memory. For example, it can be set according to multiple factors such as the hardware characteristics, working environment, temperature control method, and performance test results of the short-term memory, and the embodiments of the present disclosure are not limited to this. In addition, it can be understood that in the embodiments of the present disclosure, when the characterization temperature of the short-term memory meets the second operating temperature requirement, it at least indicates that the short-term memory is not in an extreme temperature state.

[0224] In one example, the characteristic temperature of the short-term memory can be obtained according to the second preset time interval, and it is determined whether the characteristic temperature of the short-term memory meets the second operating temperature requirement. The second preset time interval can be set according to application requirements, for example, it can be set to 100Ms, 200Ms or 500Ms, and the embodiments of the present disclosure are not limited to this.

[0225] In addition, in the embodiment of the present disclosure, when the representative temperature of the short-term memory does not meet the second operating temperature requirement, step S803 can be executed; when the representative temperature of the short-term memory meets the second operating temperature requirement, step S804 can be executed.

[0226] Step S803: temperature control the short-term storage device by using the temperature control system of the target object.

[0227] In one example, the temperature of the computing subsystem of the target object may be controlled by the temperature control system of the target object, thereby achieving the purpose of controlling the temperature of the short-term memory provided inside the computing subsystem by the temperature control system of the target object.

[0228] In addition, in the embodiment of the present disclosure, after executing step S803, that is, "temperature controlling the short-term memory through the temperature control system of the target object", it is possible to return to executing step S802, that is, "determine whether the characteristic temperature of the short-term memory meets the second operating temperature requirement".

[0229] Step S804: storing the running status data of the target object in a short-term memory.

[0230] Among them, the operating status data may include object status data and perception data collected in real time by the perception subsystem. Here, the object status data may include the position information, speed information, acceleration information, posture information, etc. of the target object; the perception subsystem may include a camera, a millimeter-wave radar, a laser radar, etc. Correspondingly, the perception data collected in real time by the perception subsystem may include image data collected in real time by the camera, obstacle-related data collected in real time by the millimeter-wave radar, and three-dimensional environment representation data collected in real time by the laser radar.

[0231] In one example, when the target object is in a startup state, the running status data of the target object may be acquired and stored in a short-term memory.

[0232] Step S805, determining whether the characteristic temperature of the long-term memory meets the first operating temperature requirement.

[0233] Among them, the characterization temperature of the long-term memory can be used to characterize the real-time temperature of the long-term memory; the first operating temperature requirement can be used to characterize the temperature requirement required for the long-term memory to work normally. Here, the first operating temperature requirement of the long-term memory can be set according to multiple factors such as the hardware characteristics of the long-term memory, the working environment, the temperature control method, and the performance test results, and the embodiments of the present disclosure are not limited to this. In addition, it can be understood that in the embodiments of the present disclosure, when the characterization temperature of the long-term memory meets the first operating temperature requirement, it at least indicates that the long-term memory is not in an extreme temperature state.

[0234] In one example, the characteristic temperature of the long-term memory can be obtained according to the first preset time interval, and it is determined whether the characteristic temperature of the long-term memory meets the first operating temperature requirement. The first preset time interval can be set according to application requirements, for example, it can be set to 100Ms, 200Ms or 500Ms, and the embodiments of the present disclosure are not limited to this.

[0235] In addition, in the embodiment of the present disclosure, when the representative temperature of the long-term storage does not meet the first operating temperature requirement, the process may return to step S804; when the representative temperature of the long-term storage meets the first operating temperature requirement, step S806 may be executed.

[0236] Step S806, determining whether the long-term storage is in a shutdown state.

[0237] In the embodiment of the present disclosure, when the long-term storage is in a shutdown state, step S807 may be executed; when the long-term storage is in a startup state, step S808 may be executed.

[0238] Step S807, in response to the power-on instruction for the long-term storage, the long-term storage is turned on.

[0239] In one example, in response to a power-on instruction for the long-term storage, a power switch of the long-term storage may be turned on, so that the long-term storage is switched from a power-off state to a power-on state.

[0240] In addition, in the embodiment of the present disclosure, after executing step S807, that is, "responding to the power-on instruction for the long-term storage, putting the long-term storage in the power-on state", step S808 can be executed.

[0241] Step S808: transferring the running status data stored in the short-term memory to the long-term memory, and storing the new running status data of the target object in the long-term memory.

[0242] That is to say, in the embodiment of the present disclosure, the operating status data stored in the short-term memory is transferred to the long-term memory only when it is determined that the characteristic temperature of the long-term memory meets the first operating temperature requirement, and after the new operating status data of the target object is subsequently reacquired, the new operating status data of the target object is stored in the long-term memory.

[0243] Step S809, determining whether the target object is in an ignition-off state.

[0244] In the embodiment of the present disclosure, when the target object is in the ignition-off state, step S810 may be executed; when the target object is in the ignition-on state, the process may return to step 805 .

[0245] Step S810, stop acquiring the running status data of the target object, and switch the long-term storage from the on state to the off state.

[0246] In one example, in response to a shutdown instruction for the long-term storage, a power switch of the long-term storage may be turned off, so that the long-term storage is switched from a power-on state to a power-off state.

[0247] For further information, see Fig. 9 , which is a schematic diagram of an application scenario of a data storage method provided in an embodiment of the present disclosure.

[0248] The data storage method provided by the embodiment of the present disclosure is applied to electronic devices.

[0249] Wherein, the electronic device may be a target object ( Fig. 9In the embodiment of the present disclosure, the computing subsystem of the target object is an autonomous driving vehicle). Here, the target object may be an autonomous driving vehicle (for example, a partially automated (L2), conditionally automated (L3), highly automated (L4), or fully automated (L5) autonomous driving vehicle), a drone, a robot, etc.; the computing subsystem is also called an autonomous driving domain controller, which belongs to the autonomous driving system of the target object and is the core part of the autonomous driving system. In the disclosed embodiment, the computing subsystem may be temperature-controlled by the temperature control system of the target object. Specifically, the temperature control system may temperature-control the computing subsystem by means of liquid heating or liquid cooling.

[0250] In one example, the computing subsystem may include a system packaging box, and a plurality of internal devices disposed inside the system packaging box, such as a CPU, a GPU, and a short-term memory, etc., and the computing subsystem may also be connected to a long-term memory disposed outside the system packaging box. That is, in the embodiment of the present disclosure, internal devices such as a CPU, a GPU, and a short-term memory may be disposed inside the computing subsystem, and a long-term memory may be connected outside the computing subsystem. In addition, in the embodiment of the present disclosure, based on cost considerations, the long-term memory is usually not equipped with a dedicated temperature control system, but is temperature-controlled by natural heating or natural cooling.

[0251] Furthermore, in the embodiments of the present disclosure, the electronic device may be used for:

[0252] The operating status data of the target object is stored in the short-term memory; when the characteristic temperature of the long-term memory meets the first operating temperature requirement, the operating status data stored in the short-term memory is transferred to the long-term memory.

[0253] Among them, the operating status data may include object status data and perception data collected in real time by the perception subsystem. Here, the object status data may include the position information, speed information, acceleration information, posture information, etc. of the target object; the perception subsystem may include a camera, a millimeter-wave radar, a laser radar, etc. Correspondingly, the perception data collected in real time by the perception subsystem may include image data collected in real time by the camera, obstacle-related data collected in real time by the millimeter-wave radar, and three-dimensional environment representation data collected in real time by the laser radar.

[0254] In the disclosed embodiment, the operating status data can be used to train and optimize the autonomous driving model, and can also be used as traceable evidence after a traffic accident occurs.

[0255] Based on this, in the embodiment of the present disclosure, the operating status data of the target object can be stored in a short-term memory, and the characterization temperature of the long-term memory can be obtained. Then, when the characterization temperature of the long-term memory meets the first working temperature requirement, the operating status data stored in the short-term memory can be transferred to the long-term memory, and then the operating status data can be uploaded from the long-term memory to the server according to the preset upload time interval to complete the backup of the operating status data, and the long-term memory can be erased to release the storage space of the long-term memory. Among them, the preset upload time interval can be a fixed time interval, for example, it can be 10 days, 1 month, 3 months, etc.; the preset upload time interval can also be a dynamic time interval determined according to the frequency of use of the target object, for example, a time interval value that is negatively correlated with the frequency of use of the target object can be obtained as the preset upload time interval. Here, the time interval value is negatively correlated with the frequency of use of the target object, which can be understood as: the higher the frequency of use of the target object, the smaller the time interval value; the lower the frequency of use of the target object, the larger the time interval value. In the embodiment of the present disclosure, the running state data of the target object can also be stored in the short-term storage and the characterization temperature of the long-term storage is obtained. Then, when the characterization temperature of the long-term storage meets the first working temperature requirement, the running state data stored in the short-term storage is transferred to the long-term storage. Then, when the driving distance reaches the preset distance threshold, the running state data can be uploaded from the long-term storage to the server to complete the backup of the running state data, and the long-term storage is erased to release the storage space of the long-term storage. Among them, the preset distance threshold can be determined according to the storage space size of the long-term storage, and the embodiment of the present disclosure does not limit this. In the embodiment of the present disclosure, the running state data of the target object can also be stored in the short-term storage and the characterization temperature of the long-term storage is obtained. Then, when the characterization temperature of the long-term storage meets the first working temperature requirement, the running state data stored in the short-term storage is transferred to the long-term storage. When the running state data in the long-term storage reaches the preset data magnitude threshold, the running state data is uploaded from the long-term storage to the server to complete the backup of the running state data, and the long-term storage is erased to release the storage space of the long-term storage. The preset data magnitude threshold may be determined according to the storage space size of the long-term storage device, and the embodiments of the present disclosure do not impose any limitation on this.

[0256] It should be noted that in the embodiments of the present disclosure, Fig. 9 The scene diagram shown is only illustrative and not restrictive. Those skilled in the art can Fig. 9 Various obvious changes and / or substitutions are made to the examples, and the obtained technical solutions still fall within the scope of the disclosure of the embodiments of the present disclosure.

[0257] In order to better implement the data storage method, the embodiment of the present disclosure also provides a data storage device, which can be integrated into the computing subsystem of the target object. The computing subsystem is temperature-controlled by the temperature control system of the target object, and the computing subsystem is internally provided with a short-term memory, and the computing subsystem is externally connected with a long-term memory. Fig.10 The schematic structural block diagram shown illustrates a data storage device 1000 provided in the disclosed embodiment.

[0258] The data storage device 1000 comprises:

[0259] The data storage unit 1001 is used to store the running status data of the target object in a short-term memory;

[0260] The data transfer unit 1002 is used to transfer the operating status data stored in the short-term memory to the long-term memory when the characteristic temperature of the long-term memory meets the first operating temperature requirement.

[0261] In some optional implementations, the data storage device 1000 further includes a first temperature acquisition unit, configured to:

[0262] Obtaining a temperature reading result of a first temperature sensing device; wherein the first temperature sensing device is disposed in a long-term memory;

[0263] Based on the temperature reading result of the first temperature sensing device, a representative temperature of the long-term memory is obtained.

[0264] In some optional embodiments, the characteristic temperature of the long-term memory meets the first operating temperature requirement, including:

[0265] The characterization temperature of the long-term memory is within a first operating temperature range;

[0266] Alternatively, the representative temperature of the long-term memory is within the first operating temperature range, and a change rate of the representative temperature of the long-term memory within a unit time is less than or equal to a first change rate threshold.

[0267] In some optional implementations, the data transfer unit 1002 is used to:

[0268] determining remaining storage capacity of long-term storage;

[0269] When the remaining storage capacity of the long-term storage meets the first storage capacity requirement, the operating status data stored in the short-term storage is transferred to the long-term storage.

[0270] In some optional implementations, the data transfer unit 1002 is further used for one of the following:

[0271] When the remaining storage capacity of the long-term storage does not meet the first storage capacity requirement, the remaining storage capacity of the long-term storage is expanded, and the operation status data stored in the short-term storage is transferred to the long-term storage after the remaining storage capacity is expanded;

[0272] When the remaining storage capacity of the long-term storage does not meet the first storage capacity requirement, the operation status data stored in the short-term storage is deleted to obtain first remaining operation status data, and the first remaining operation status data is transferred to the long-term storage;

[0273] When the remaining storage capacity of the long-term storage does not meet the first storage capacity requirement, the remaining storage capacity of the long-term storage is expanded, and the operating status data stored in the short-term storage is deleted to obtain first remaining operating status data, and the first remaining operating status data is transferred to the long-term storage after the remaining storage capacity is expanded.

[0274] In some optional implementations, the data transfer unit 1002 is used to:

[0275] The operating status data stored in the long-term memory is deleted to expand the remaining storage capacity of the long-term memory.

[0276] In some optional implementations, the data transfer unit 1002 is used to:

[0277] Obtaining a first level threshold value that is negatively correlated with the remaining storage capacity of the long-term storage;

[0278] Determine, from the operation status data stored in the long-term storage, first-category non-important data whose importance level is lower than a first-level threshold;

[0279] Delete the first category of non-important data.

[0280] In some optional implementations, the data transfer unit 1002 is used to:

[0281] Obtaining a second level threshold value that is negatively correlated with the remaining storage capacity of the long-term storage;

[0282] Determine, from the operation status data stored in the short-term memory, second-category non-important data whose importance level is lower than a second level threshold;

[0283] Delete the second category of non-important data.

[0284] In some optional implementations, the remaining storage capacity of the long-term storage meets the first storage capacity requirement, including:

[0285] The remaining storage capacity of the long-term storage is greater than or equal to a first capacity threshold;

[0286] Alternatively, the ratio of the remaining storage capacity of the long-term storage to the overall storage capacity of the long-term storage is greater than or equal to a first ratio threshold.

[0287] In some optional embodiments, the data storage device 1000 further includes a dynamic transfer unit, which is used to:

[0288] When the characteristic temperature of the long-term memory changes from satisfying the first operating temperature requirement to not satisfying the first operating temperature requirement, the operating status data stored in the long-term memory is copied to the short-term memory.

[0289] In some optional implementations, the data storage unit 1001 is used to:

[0290] When the representative temperature of the short-term memory meets the second operating temperature requirement, the operating status data of the target object is stored in the short-term memory.

[0291] In some optional embodiments, the data storage device 1000 further includes a second temperature acquisition unit, which is used to:

[0292] Obtaining a temperature reading result of a second temperature sensing device; wherein the second temperature sensing device is disposed in the computing subsystem;

[0293] Based on the temperature reading result of the second temperature sensing device, a representative temperature of the short-term memory is obtained.

[0294] In some optional implementations, the second temperature sensing device is disposed in a short-term memory disposed inside the computing subsystem; and the characteristic temperature of the short-term memory meets the second operating temperature requirement, including:

[0295] The characteristic temperature of the short-term memory is in a second operating temperature range;

[0296] Alternatively, the representative temperature of the short-term memory is within the second operating temperature range, and the change rate of the representative temperature of the short-term memory within a unit time is less than or equal to a second change rate threshold.

[0297] In some optional embodiments, the second temperature sensing device includes a plurality of temperature sensors, and the plurality of temperature sensors are disposed at different positions of the computing subsystem, and the temperature reading result of the second temperature sensing device includes a plurality of temperature reading values ​​corresponding one-to-one to the plurality of temperature sensors; the data storage unit 1001 is used for:

[0298] An average value of the plurality of temperature reading values ​​is calculated; wherein the average value of the plurality of temperature reading values ​​is a characteristic temperature of the short-term memory.

[0299] In some optional embodiments, the characteristic temperature of the short-term memory meets the second operating temperature requirement, including:

[0300] The characteristic temperature of the short-term memory is within a minimum temperature range of a plurality of preset operating temperature ranges; wherein the plurality of preset operating temperature ranges correspond one-to-one to a plurality of internal components of the computing subsystem;

[0301] Alternatively, the representative temperature of the short-term memory is within a minimum temperature range of a plurality of preset operating temperature ranges, and a change rate of the representative temperature of the short-term memory within a unit time is less than or equal to a third change rate threshold.

[0302] In some optional implementations, the data storage unit 1001 is used to:

[0303] determining remaining storage capacity of short-term storage;

[0304] When the remaining storage capacity of the short-term storage meets the second storage capacity requirement, the operating status data of the target object is stored in the short-term storage.

[0305] In some optional implementations, the data storage unit 1001 is further used for:

[0306] When the remaining storage capacity of the short-term storage does not meet the second storage capacity requirement, the remaining storage capacity of the short-term storage is expanded, and the operation status data of the target object is stored in the short-term storage after the remaining storage capacity is expanded;

[0307] When the remaining storage capacity of the short-term memory does not meet the second storage capacity requirement, the operation status data of the target object is deleted to obtain second remaining operation status data, and the second remaining operation status data is stored in the short-term memory;

[0308] When the remaining storage capacity of the short-term memory does not meet the second storage capacity requirement, the remaining storage capacity of the short-term memory is expanded, and the operating status data of the target object is deleted to obtain second remaining operating status data, and the second remaining operating status data is stored in the short-term memory after the remaining storage capacity is expanded.

[0309] In some optional implementations, the data storage unit 1001 is used to:

[0310] The operating status data stored in the short-term memory is deleted to expand the remaining storage capacity of the short-term memory.

[0311] In some optional implementations, the data storage unit 1001 is used to:

[0312] Obtaining a third level threshold value that is negatively correlated with the remaining storage capacity of the short-term memory;

[0313] determining, from the operation status data stored in the short-term memory, third-category non-important data whose importance level is lower than a third-level threshold;

[0314] Delete the third category of non-important data.

[0315] In some optional implementations, the data storage unit 1001 is used to:

[0316] Obtaining a fourth level threshold value that is negatively correlated with the remaining storage capacity of the short-term memory;

[0317] Determine, from the operating status data of the target object, a fourth category of non-important data whose importance level is lower than a fourth level threshold;

[0318] The fourth category of non-important data is deleted.

[0319] In some optional implementations, the remaining storage capacity of the short-term storage meets the second storage capacity requirement, including:

[0320] The remaining storage capacity of the short-term storage is greater than or equal to a second capacity threshold;

[0321] Alternatively, the ratio of the remaining storage capacity of the short-term memory to the overall storage capacity of the short-term memory is greater than or equal to a second ratio threshold.

[0322] In some optional embodiments, the operating state data includes object state data, forward visual perception data, backward visual perception data, side visual perception data, and non-visual perception data;

[0323] Among them, the importance levels of object state data and forward visual perception data are the same, and are higher than the importance levels of backward visual perception data, side visual perception data and non-visual perception data. The importance levels of backward visual perception data, side visual perception data and non-visual perception data decrease in turn.

[0324] In some optional implementations, the data storage unit 1001 is used to:

[0325] When the representative temperature of the long-term memory does not meet the first operating temperature requirement and the representative temperature of the short-term memory meets the second operating temperature requirement, the operating state data of the target object is stored in the short-term memory.

[0326] In the embodiment of the present disclosure, for the specific functions and examples of each unit of the data storage device 1000, reference may be made to the relevant descriptions of the corresponding steps in the above method embodiment, which will not be elaborated here.

[0327] In the technical solution disclosed herein, the acquisition, storage and application of user personal information involved are in compliance with the provisions of relevant laws and regulations and do not violate public order and good morals.

[0328] According to an embodiment of the present disclosure, the present disclosure also provides an electronic device, an autonomous driving vehicle, a readable storage medium, and a computer program product.

[0329] Fig.11 A schematic block diagram of an example electronic device 1100 that can be used to implement an embodiment of the present disclosure is shown. The electronic device may be a computing subsystem of a target object. Here, the target object may be an autonomous driving vehicle (e.g., a partially automated (L2), conditionally automated (L3), highly automated (L4), or fully automated (L5) autonomous driving vehicle), a drone, a robot, etc.; the computing subsystem is also called an autonomous driving domain controller, which belongs to the autonomous driving system of the target object and is the core part of the autonomous driving system.

[0330] In one example, the computing subsystem may include a system package box and a plurality of internal devices disposed inside the system package box, the plurality of internal devices may include a CPU, a GPU, a short-term memory, etc., and the short-term memory may be fixed inside the computing subsystem. In another example, the outside of the computing subsystem may also be connected to a long-term memory, that is, the computing subsystem may also be connected to the long-term memory disposed outside the system package box.

[0331] The following will be combined Fig.11 , a partial internal structure of the electronic device 1100 is described.

[0332] The electronic device 1100 includes a computing unit 1101, which can perform various appropriate actions and processes according to a computer program stored in a read-only memory (ROM) 1102 or a computer program loaded from a storage unit 1109 to a random access memory (RAM) 1103. In the RAM 1103, various programs and data required for the operation of the electronic device 1100 can also be stored. The computing unit 1101, the ROM 1102, and the RAM 1103 are connected to each other via a bus 1104. An input / output (I / O) interface 1105 is also connected to the bus 1104.

[0333] Multiple components in the electronic device 1100 are connected to the I / O interface 1105, including: an input unit 1106, such as a keyboard, a mouse, etc.; an output unit 1107, such as various types of displays, speakers, etc.; a storage unit 1109, such as a disk, an optical disk, etc.; and a communication unit 11011, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 11011 allows the electronic device 1100 to exchange information / data with other devices through a computer network such as the Internet and / or various telecommunication networks.

[0334] The computing unit 1101 may be a variety of general and / or special processing components with processing and computing capabilities. Some examples of the computing unit 1101 include, but are not limited to, the CPU and GPU as described above, as well as various dedicated artificial intelligence (AI) computing chips, various computing units running machine learning model algorithms, digital signal processors (DSPs), and any appropriate processors, controllers, microcontrollers, etc. The computing unit 1101 performs the various methods and processes described above, such as data storage methods. For example, in some embodiments, the data storage method may be implemented as a computer software program, which is tangibly included in a machine-readable medium, such as a storage unit 1109. In some embodiments, part or all of the computer program may be loaded and / or installed on the electronic device 1100 via the ROM 1102 and / or the communication unit 11011. When the computer program is loaded into the RAM 1103 and executed by the computing unit 1101, at least one step of the data storage method described above may be performed. Alternatively, in other embodiments, the computing unit 1101 may be configured to execute the data storage method in any other appropriate manner (eg, by means of firmware).

[0335] Various embodiments of the systems and techniques described above herein may be implemented in digital electronic circuit systems, integrated circuit systems, field programmable gate arrays (FPGAs), application specific integrated circuits (ASICs), application specific standard products (ASSPs), systems on chips (SOCs), complex programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various embodiments may include: being implemented in at least one computer program that can be executed and / or interpreted on a programmable system including at least one programmable processor, which may be a dedicated or general purpose programmable processor that can receive data and instructions from a storage system, at least one input device, and at least one output device, and transmit data and instructions to the storage system, the at least one input device, and the at least one output device.

[0336] The program code for implementing the method of the present disclosure may be written in any combination of at least one programming language. These program codes may be provided to a processor or controller of a general-purpose computer, a special-purpose computer, or other programmable data processing device, so that the program code, when executed by the processor or controller, enables the functions / operations specified in the flow chart and / or block diagram to be implemented. The program code may be executed entirely on the machine, partially on the machine, partially on the machine as a stand-alone software package and partially on a remote machine, or entirely on a remote machine or server.

[0337] In the context of the present disclosure, a machine-readable medium may be a tangible medium that may contain or store a program for use by or in conjunction with an instruction execution system, device, or equipment. A machine-readable medium may be a machine-readable signal medium or a machine-readable storage medium. A machine-readable medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices, or equipment, or any suitable combination of the foregoing. A more specific example of a machine-readable storage medium may include an electrical connection based on at least one line, a portable computer disk, a hard disk, a RAM, a ROM, an erasable programmable read-only memory (EPROM) or a flash memory, an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0338] To provide interaction with a user, the systems and techniques described herein can be implemented on a computer having: a display device (e.g., a cathode ray tube (CRT) display or a liquid crystal display (LCD)) for displaying information to the user; and a keyboard and a pointing device (e.g., a mouse or a trackball) through which the user can provide input to the computer. Other types of devices can also be used to provide interaction with the user; for example, the feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including acoustic input, voice input, or tactile input).

[0339] The systems and techniques described herein can be implemented in a computing system that includes back-end components (e.g., as a data server), or a computing system that includes middleware components (e.g., an application server), or a computing system that includes front-end components (e.g., a user computer with a graphical user interface or a web browser through which a user can interact with implementations of the systems and techniques described herein), or a computing system that includes any combination of such back-end components, middleware components, or front-end components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: Local Area Network (LAN), Wide Area Network (WAN), and the Internet.

[0340] A computer system may include a client and a server. The client and the server are generally remote from each other and usually interact through a communication network. The relationship of client and server is generated by computer programs running on respective computers and having a client-server relationship to each other. The server may be a cloud server, a server of a distributed system, or a server combined with a blockchain.

[0341] The disclosed embodiment also provides an autonomous driving vehicle, including an electronic device.

[0342] The embodiment of the present disclosure also provides a non-transitory computer-readable storage medium storing computer instructions, wherein the computer instructions are used to enable a computer to execute the data storage method.

[0343] The embodiment of the present disclosure also provides a computer program product, including a computer program, which implements the data storage method when executed by a processor.

[0344] It should be understood that the various forms of processes shown above can be used to reorder, add or delete steps. For example, the steps recorded in the present disclosure can be executed in parallel, sequentially or in a different order, as long as the desired results of the technical solutions disclosed in the present disclosure can be achieved, and this document is not limited here. In addition, in the present disclosure, relational terms such as "first", "second", "third", etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply the existence of any such actual relationship or order between these entities or operations. In addition, "multiple" in the present disclosure can be understood as at least two.

[0345] The above specific implementations do not constitute a limitation on the protection scope of the present disclosure. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modification, equivalent substitution and improvement made within the principles of the present disclosure shall be included in the protection scope of the present disclosure.

Claims

1. A data storage method, applied to a computing subsystem of a target object, wherein the computing subsystem is temperature controlled by a temperature control system of the target object, and a short-term memory is provided inside the computing subsystem, and a long-term memory is connected to the outside of the computing subsystem; The method comprises: storing the operating status data of the target object in the short-term memory; When the characteristic temperature of the long-term memory meets the first operating temperature requirement, the operating status data stored in the short-term memory is transferred to the long-term memory.

2. The method according to claim 1, further comprising: Obtaining a temperature reading result of a first temperature sensing device; wherein the first temperature sensing device is disposed in the long-term memory; Based on the temperature reading result of the first temperature sensing device, a representative temperature of the long-term memory is obtained.

3. The method according to claim 1, wherein: The characterization temperature of the long-term memory meets a first operating temperature requirement, including: The characteristic temperature of the long-term memory is within a first operating temperature range; Alternatively, the representative temperature of the long-term memory is within the first operating temperature range, and a change rate of the representative temperature of the long-term memory within a unit time is less than or equal to a first change rate threshold.

4. The method according to claim 1, wherein: The transferring the operation status data stored in the short-term memory to the long-term memory comprises: determining a remaining storage capacity of the long-term storage; When the remaining storage capacity of the long-term storage meets the first storage capacity requirement, the operating status data stored in the short-term storage is transferred to the long-term storage.

5. The method according to claim 4, wherein: The step of transferring the operation status data stored in the short-term memory to the long-term memory further comprises one of the following: When the remaining storage capacity of the long-term storage does not meet the first storage capacity requirement, the remaining storage capacity of the long-term storage is expanded, and the operation status data stored in the short-term storage is transferred to the long-term storage after the remaining storage capacity is expanded; When the remaining storage capacity of the long-term storage does not meet the first storage capacity requirement, the operation status data stored in the short-term storage is deleted to obtain first remaining operation status data, and the first remaining operation status data is transferred to the long-term storage; When the remaining storage capacity of the long-term storage does not meet the first storage capacity requirement, the remaining storage capacity of the long-term storage is expanded, and the operating status data stored in the short-term storage is deleted to obtain first remaining operating status data, and the first remaining operating status data is transferred to the long-term storage after the remaining storage capacity is expanded.

6. The method according to claim 5, wherein: The step of expanding the remaining storage capacity of the long-term storage device comprises: The operating status data stored in the long-term memory is deleted to expand the remaining storage capacity of the long-term memory.

7. The method according to claim 6, wherein: The deleting of the operation status data stored in the long-term storage includes: Obtaining a first level threshold value that is negatively correlated with the remaining storage capacity of the long-term storage; Determine, from the operation status data stored in the long-term storage, first-category non-important data whose importance level is lower than the first level threshold; The first category of non-important data is deleted.

8. The method according to claim 5, wherein: The deleting of the operation status data stored in the short-term memory includes: Obtaining a second level threshold value that is negatively correlated with the remaining storage capacity of the long-term storage; Determining, from the operation status data stored in the short-term memory, second-category non-important data whose importance level is lower than the second level threshold; The second type of non-important data is deleted.

9. The method according to claim 4, wherein: The remaining storage capacity of the long-term storage meets the first storage capacity requirement, including: The remaining storage capacity of the long-term storage is greater than or equal to a first capacity threshold; Alternatively, the ratio of the remaining storage capacity of the long-term storage to the overall storage capacity of the long-term storage is greater than or equal to a first ratio threshold.

10. The method according to claim 1, further comprising: When the representative temperature of the long-term memory changes from satisfying the first operating temperature requirement to not satisfying the first operating temperature requirement, the operating status data stored in the long-term memory is copied to the short-term memory.

11. The method according to any one of claims 1 to 10, wherein: The storing the operating status data of the target object in the short-term memory includes: When the representative temperature of the short-term memory meets the second operating temperature requirement, the operating status data of the target object is stored in the short-term memory.

12. The method according to claim 11, further comprising: Obtaining a temperature reading result of a second temperature sensing device; wherein the second temperature sensing device is disposed in the computing subsystem; Based on the temperature reading result of the second temperature sensing device, a representative temperature of the short-term memory is obtained.

13. The method according to claim 12, wherein: The second temperature sensing device is arranged in the short-term memory arranged inside the computing subsystem; The characteristic temperature of the short-term memory meets the second operating temperature requirement, including: The characteristic temperature of the short-term memory is within a second operating temperature range; Alternatively, the representative temperature of the short-term memory is within the second operating temperature range, and a change rate of the representative temperature of the short-term memory within a unit time is less than or equal to a second change rate threshold.

14. The method according to claim 12, wherein: The second temperature sensing device includes a plurality of temperature sensors, and the plurality of temperature sensors are arranged at different positions of the computing subsystem, and the temperature reading result of the second temperature sensing device includes a plurality of temperature reading values ​​corresponding to the plurality of temperature sensors one by one; The step of obtaining the representative temperature of the short-term memory based on the temperature reading result of the second temperature sensing device comprises: Calculate an average value of the plurality of temperature reading values; wherein the average value of the plurality of temperature reading values ​​is a representative temperature of the short-term memory.

15. The method according to claim 14, wherein: The characteristic temperature of the short-term memory meets the second operating temperature requirement, including: The characteristic temperature of the short-term memory is within a minimum temperature range of a plurality of preset operating temperature ranges; wherein the plurality of preset operating temperature ranges correspond one-to-one to a plurality of internal components of the computing subsystem; Alternatively, the representative temperature of the short-term memory is within the minimum temperature range of the plurality of preset operating temperature ranges, and a change rate of the representative temperature of the short-term memory within a unit time is less than or equal to a third change rate threshold.

16. The method according to claim 11, wherein: The storing the operating status data of the target object in the short-term memory includes: determining a remaining storage capacity of the short-term storage; When the remaining storage capacity of the short-term storage meets the second storage capacity requirement, the operating status data of the target object is stored in the short-term storage.

17. The method according to claim 16, wherein: The storing the operating status data of the target object in the short-term memory further comprises one of the following: When the remaining storage capacity of the short-term storage does not meet the second storage capacity requirement, the remaining storage capacity of the short-term storage is expanded, and the operation status data of the target object is stored in the short-term storage after the remaining storage capacity is expanded; When the remaining storage capacity of the short-term storage does not meet the second storage capacity requirement, deleting the operation status data of the target object to obtain second remaining operation status data, and storing the second remaining operation status data in the short-term storage; When the remaining storage capacity of the short-term memory does not meet the second storage capacity requirement, the remaining storage capacity of the short-term memory is expanded, and the operating status data of the target object is deleted to obtain second remaining operating status data, and the second remaining operating status data is stored in the short-term memory after the remaining storage capacity is expanded.

18. The method according to claim 17, wherein: The step of expanding the remaining storage capacity of the short-term memory comprises: The operating status data stored in the short-term memory is deleted to expand the remaining storage capacity of the short-term memory.

19. The method according to claim 18, wherein: The deleting of the operation status data stored in the short-term memory includes: Obtaining a third level threshold value that is negatively correlated with the remaining storage capacity of the short-term memory; Determining, from the operation status data stored in the short-term memory, third-category non-important data whose importance level is lower than the third level threshold; The third category of non-important data is deleted.

20. The method according to claim 17, wherein: The deleting the running status data of the target object includes: Obtaining a fourth level threshold value that is negatively correlated with the remaining storage capacity of the short-term memory; Determining, from the operating status data of the target object, fourth-category non-important data whose importance level is lower than the fourth-level threshold; The fourth category of non-important data is deleted.

21. The method according to claim 16, wherein: The remaining storage capacity of the short-term storage meets the second storage capacity requirement, including: The remaining storage capacity of the short-term memory is greater than or equal to a second capacity threshold; Alternatively, the ratio of the remaining storage capacity of the short-term memory to the overall storage capacity of the short-term memory is greater than or equal to a second ratio threshold.

22. The method according to any one of claims 7, 8, 19 and 20, wherein: The running status data includes object status data, forward visual perception data, backward visual perception data, side visual perception data and non-visual perception data; Among them, the importance levels of the object state data and the forward visual perception data are the same, and are higher than the importance levels of the backward visual perception data, the side visual perception data and the non-visual perception data, and the importance levels of the backward visual perception data, the side visual perception data and the non-visual perception data decrease in sequence.

23. The method according to claim 11, wherein: When the characteristic temperature of the short-term memory meets the second operating temperature requirement, storing the operating status data of the target object in the short-term memory includes: When the temperature represented by the long-term memory does not meet the first operating temperature requirement and the temperature represented by the short-term memory meets the second operating temperature requirement, the operating status data of the target object is stored in the short-term memory.

24. A data storage device, applied to a computing subsystem of a target object, wherein the computing subsystem is temperature controlled by a temperature control system of the target object, and a short-term memory is provided inside the computing subsystem, and a long-term memory is connected to the outside of the computing subsystem; The device comprises: A data storage unit, used to store the operating status data of the target object in the short-term memory; The data transfer unit is used to transfer the operating status data stored in the short-term memory to the long-term memory when the characteristic temperature of the long-term memory meets the first operating temperature requirement.

25. The device according to claim 24, further comprising a first temperature acquisition unit for: Obtaining a temperature reading result of a first temperature sensing device; wherein, The first temperature sensing device is disposed in the long-term storage device; Based on the temperature reading result of the first temperature sensing device, a representative temperature of the long-term memory is obtained.

26. The device according to claim 24, wherein: The characterization temperature of the long-term memory meets a first operating temperature requirement, including: The characteristic temperature of the long-term memory is within a first operating temperature range; Alternatively, the representative temperature of the long-term memory is within the first operating temperature range, and a change rate of the representative temperature of the long-term memory within a unit time is less than or equal to a first change rate threshold.

27. The device according to claim 24, wherein: The data transfer unit is used for: determining a remaining storage capacity of the long-term storage; When the remaining storage capacity of the long-term storage meets the first storage capacity requirement, the operating status data stored in the short-term storage is transferred to the long-term storage.

28. The device according to claim 27, wherein The data transfer unit is also used for one of the following: When the remaining storage capacity of the long-term storage does not meet the first storage capacity requirement, the remaining storage capacity of the long-term storage is expanded, and the operation status data stored in the short-term storage is transferred to the long-term storage after the remaining storage capacity is expanded; When the remaining storage capacity of the long-term storage does not meet the first storage capacity requirement, the operation status data stored in the short-term storage is deleted to obtain first remaining operation status data, and the first remaining operation status data is transferred to the long-term storage; When the remaining storage capacity of the long-term storage does not meet the first storage capacity requirement, the remaining storage capacity of the long-term storage is expanded, and the operating status data stored in the short-term storage is deleted to obtain first remaining operating status data, and the first remaining operating status data is transferred to the long-term storage after the remaining storage capacity is expanded.

29. The device according to claim 28, wherein The data transfer unit is used for: The operating status data stored in the long-term memory is deleted to expand the remaining storage capacity of the long-term memory.

30. The device according to claim 29, wherein: The data transfer unit is used for: Obtaining a first level threshold value that is negatively correlated with the remaining storage capacity of the long-term storage; Determine, from the operation status data stored in the long-term storage, first-category non-important data whose importance level is lower than the first level threshold; The first category of non-important data is deleted.

31. The apparatus of claim 28, wherein: The data transfer unit is used for: Obtaining a second level threshold value that is negatively correlated with the remaining storage capacity of the long-term storage; Determining, from the operation status data stored in the short-term memory, second-category non-important data whose importance level is lower than the second level threshold; The second type of non-important data is deleted.

32. The apparatus of claim 27, wherein: The remaining storage capacity of the long-term storage meets the first storage capacity requirement, including: The remaining storage capacity of the long-term storage is greater than or equal to a first capacity threshold; Alternatively, the ratio of the remaining storage capacity of the long-term storage to the overall storage capacity of the long-term storage is greater than or equal to a first ratio threshold.

33. The apparatus according to claim 24, further comprising a dynamic transfer unit for: When the representative temperature of the long-term memory changes from satisfying the first operating temperature requirement to not satisfying the first operating temperature requirement, the operating status data stored in the long-term memory is copied to the short-term memory.

34. The device according to any one of claims 24 to 33, wherein: The data storage unit is used for: When the representative temperature of the short-term memory meets the second operating temperature requirement, the operating status data of the target object is stored in the short-term memory.

35. The device according to claim 34, further comprising a second temperature acquisition unit, configured to: Obtaining the temperature reading result of the second temperature sensing device; wherein, The second temperature sensing device is arranged in the computing subsystem; Based on the temperature reading result of the second temperature sensing device, a representative temperature of the short-term memory is obtained.

36. The device according to claim 35, wherein The second temperature sensing device is arranged in the short-term memory arranged inside the computing subsystem; The characteristic temperature of the short-term memory meets the second operating temperature requirement, including: The characteristic temperature of the short-term memory is within a second operating temperature range; Alternatively, the representative temperature of the short-term memory is within the second operating temperature range, and a change rate of the representative temperature of the short-term memory within a unit time is less than or equal to a second change rate threshold.

37. The device according to claim 35, wherein: The second temperature sensing device includes a plurality of temperature sensors, and the plurality of temperature sensors are arranged at different positions of the computing subsystem, and the temperature reading result of the second temperature sensing device includes a plurality of temperature reading values ​​corresponding to the plurality of temperature sensors one by one; the data storage unit is used for: Calculate an average value of the plurality of temperature reading values; wherein the average value of the plurality of temperature reading values ​​is a representative temperature of the short-term memory.

38. The device according to claim 37, wherein The characteristic temperature of the short-term memory meets the second operating temperature requirement, including: The characteristic temperature of the short-term memory is within a minimum temperature range of a plurality of preset operating temperature ranges; wherein the plurality of preset operating temperature ranges correspond one-to-one to a plurality of internal components of the computing subsystem; Alternatively, the representative temperature of the short-term memory is within the minimum temperature range of the plurality of preset operating temperature ranges, and a change rate of the representative temperature of the short-term memory within a unit time is less than or equal to a third change rate threshold.

39. The device according to claim 34, wherein: The data storage unit is used for: determining a remaining storage capacity of the short-term storage; When the remaining storage capacity of the short-term storage meets the second storage capacity requirement, the operating status data of the target object is stored in the short-term storage.

40. The device according to claim 39, wherein The data storage unit is also used for: When the remaining storage capacity of the short-term storage does not meet the second storage capacity requirement, the remaining storage capacity of the short-term storage is expanded, and the operation status data of the target object is stored in the short-term storage after the remaining storage capacity is expanded; When the remaining storage capacity of the short-term storage does not meet the second storage capacity requirement, deleting the operation status data of the target object to obtain second remaining operation status data, and storing the second remaining operation status data in the short-term storage; When the remaining storage capacity of the short-term memory does not meet the second storage capacity requirement, the remaining storage capacity of the short-term memory is expanded, and the operating status data of the target object is deleted to obtain second remaining operating status data, and the second remaining operating status data is stored in the short-term memory after the remaining storage capacity is expanded.

41. The device according to claim 40, wherein The data storage unit is used for: The operating status data stored in the short-term memory is deleted to expand the remaining storage capacity of the short-term memory.

42. The device according to claim 41, wherein The data storage unit is used for: Obtaining a third level threshold value that is negatively correlated with the remaining storage capacity of the short-term memory; Determining, from the operation status data stored in the short-term memory, third-category non-important data whose importance level is lower than the third level threshold; The third category of non-important data is deleted.

43. The device according to claim 40, wherein: The data storage unit is used for: Obtaining a fourth level threshold value that is negatively correlated with the remaining storage capacity of the short-term memory; Determining, from the operating status data of the target object, fourth-category non-important data whose importance level is lower than the fourth-level threshold; The fourth category of non-important data is deleted.

44. The apparatus of claim 39, wherein: The remaining storage capacity of the short-term storage meets the second storage capacity requirement, including: The remaining storage capacity of the short-term memory is greater than or equal to a second capacity threshold; Alternatively, the ratio of the remaining storage capacity of the short-term memory to the overall storage capacity of the short-term memory is greater than or equal to a second ratio threshold.

45. The device according to any one of claims 30, 31, 42 and 43, wherein: The running status data includes object status data, forward visual perception data, backward visual perception data, side visual perception data and non-visual perception data; Among them, the importance levels of the object state data and the forward visual perception data are the same, and are higher than the importance levels of the backward visual perception data, the side visual perception data and the non-visual perception data, and the importance levels of the backward visual perception data, the side visual perception data and the non-visual perception data decrease in sequence.

46. ​​The apparatus of claim 34, wherein: The data storage unit is used for: When the temperature represented by the long-term memory does not meet the first operating temperature requirement and the temperature represented by the short-term memory meets the second operating temperature requirement, the operating status data of the target object is stored in the short-term memory.

47. An electronic device comprising: at least one processor; a memory communicatively coupled to the at least one processor; The memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to perform the method according to any one of claims 1 to 23.

48. An autonomous driving vehicle comprising the electronic device described in claim 47.

49. A non-transitory computer-readable storage medium storing computer instructions, wherein: The computer instructions are used to cause the computer to execute the method according to any one of claims 1 to 23.

50. A computer program product, comprising a computer program, wherein when the computer program is executed by a processor, the computer program implements the method according to any one of claims 1 to 23.

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