Test method, system and equipment of protection device in power supply system and medium

Abstract

The invention relates to a test method, system and equipment for a protection device in a power supply system and a medium. The method comprises the following steps: step a, acquiring a current test sequence; b, constructing a current test scene based on the current test sequence; c, calculating current simulation fault data in the current test scene based on the trained fault simulation model; step d, sending the current simulation fault data to a plurality of test devices, so that each test device tests the corresponding tested protection device; and e, obtaining current action behaviors generated by testing of each tested protection device, and comparing each current action behavior with the corresponding target action behavior to obtain a test result corresponding to the current test sequence. The fault data in the application can be more suitable for the real data when the fault occurs actually, the fault simulation of the fault point corresponding to the current test sequence can be automatically completed, and the safe and stable operation level of the power supply system such as the traction substation is improved.

Description

Technical Field

[0001] The present application relates to the technical field of power supply systems, and in particular to a testing method, system, equipment and medium for a protection device in a power supply system. Background Art

[0002] The AT (Auto-Transformer) power supply method has been widely used in traction power supply systems because of its advantages such as effectively improving the power supply voltage level, reducing power loss, and enhancing power supply capacity. However, the traction power supply system under the AT power supply method has a complex structure and involves a variety of stations, including traction substations, AT stations (auto-transformer stations) and substations, and the transmission and distribution of electric energy are achieved through complex electrical connections between stations. This complexity not only increases the difficulty of system operation, but also puts higher requirements on the flexibility and reliability of the power supply operation mode.

[0003] There are many modes of operation in the traction power supply system, such as full parallel AT power supply, direct supply with full AT decoupling, power supply with two feeders in a single feeder circuit breaker in a substation, parallel power supply with AT decoupling and substations, and single-line AT power supply. Although these diverse operation modes improve the flexibility and adaptability of the system, when a fault occurs, it is often difficult to quickly and accurately locate the fault point due to the complexity of the system structure and the diversity of operation modes, which affects the efficiency of fault repair and power supply restoration time.

[0004] At present, the traction power supply system includes protection devices such as transformer protection devices, feeder protection devices and autotransformer protection devices. When performing functional verification on each protection device, only independent functional verification can be performed on each protection device. Although this verification method can ensure the functional correctness of a single protection device, it cannot fully evaluate the coordination between multiple protection devices and the rationality of the setting value. Improper coordination between protection devices or unreasonable setting value may lead to false operation or refusal of protection, which may easily affect the safe and stable operation of the traction power supply system.

[0005] In addition, in the annual routine maintenance of protection devices, in order to shorten the power outage time and restore power supply as soon as possible, the function inspection of some protection devices may not be comprehensive and thorough, and there is a hidden danger of incomplete verification. This hidden danger is easy to accumulate gradually during the long-term operation of the system, and eventually lead to protection failure or malfunction, posing a threat to the safety of the traction power supply system. Summary of the invention

[0006] In order to check the coordination between multiple protection devices in a power supply system such as a traction substation and improve the safe and stable operation level of the traction power supply system, the present application provides a testing method, system, equipment and medium for protection devices in a power supply system.

[0007] In a first aspect, the present application provides a method for testing a protection device in a power supply system, comprising:

[0008] Step a, obtaining a current test sequence, wherein the current test sequence includes multiple fault test contents corresponding to the power supply system;

[0009] Step b: constructing a current test scenario based on the current test sequence, wherein the current test scenario is a parameter set of electrical parameters and operating status of the power supply system under the fault state corresponding to the current test sequence;

[0010] Step c, based on the trained fault simulation model, calculating the current simulated fault data in the current test scenario, wherein the current simulated fault data includes simulation data of multiple analog channels corresponding to each protection device under test;

[0011] Step d, sending the current simulated fault data to a plurality of test devices, so that each of the test devices tests the protection device under test corresponding to the respective test device;

[0012] Step e: obtaining the current action behaviors generated by the test of each of the tested protection devices, and comparing each of the current action behaviors with the corresponding target action behaviors to obtain the test results corresponding to the current test sequence.

[0013] The beneficial effects of the present application are: according to the constructed current test scenario, fault data is generated, and the fault data is more in line with the real data when the fault actually occurs. The fault simulation of the fault point corresponding to the current test sequence can be automatically completed. The fault point corresponding to the current test sequence can be any fault point, which ensures that fault simulation can be performed when a fault occurs at any fault location, thereby improving the safe and stable operation level of power supply systems such as traction substations.

[0014] Further, sending the current simulated fault data to a plurality of test devices includes:

[0015] For the simulation data of each analog channel in the current simulation fault data, based on the corresponding relationship between each test device and each analog channel, the simulation data of the analog channel is sent to the corresponding test device.

[0016] The beneficial effect of adopting the above further solution is that by sending the simulation data directly to the corresponding test equipment, it can be ensured that the simulation data received by each test equipment is for its specific analog channel, thereby avoiding the possibility of data confusion or mistransmission and improving the accuracy and reliability of the test. The simulation data can be accurately transmitted to the corresponding test equipment, which helps to shorten the test cycle and improve the overall efficiency of the test work.

[0017] Further, after sending the current simulated fault data to a plurality of test devices, the method further includes:

[0018] It is determined whether each of the test devices is in a clock synchronization state. If so, a same test output time is sent to each of the test devices. The test output time is the time when each of the test devices starts to test the corresponding protection device under test.

[0019] The beneficial effect of adopting the above further scheme is that when each test device is in a clock synchronization state, it can ensure that the clock errors of all test devices are within the allowable range, achieve a high degree of coordination between the operations of each test device, and improve the accuracy of the test results.

[0020] Further, the step a comprises:

[0021] The current test sequence is acquired based on a test sequence set, where the test sequence set includes a plurality of different test sequences, and different test sequences correspond to different fault test contents.

[0022] The beneficial effect of adopting the above further solution is: by generating a test sequence set including all test sequences, test conditions can be provided for subsequent automatic fault testing, which can ensure the comprehensiveness and systematicness of the test and reduce the potential risks caused by test omissions. The test master station can directly select the test sequence to be tested from the pre-built full-scenario test sequence set, thereby greatly improving the efficiency of the test work.

[0023] Further, after step e, the method further comprises:

[0024] If the current test sequence is not the last test sequence to be tested in the test sequence set, the next test sequence of the current test sequence in the test sequence set is used as the new current test sequence, and the method of step b to step e is repeated until all test sequences in the test sequence set are tested.

[0025] The beneficial effect of adopting the above further scheme is: by looping the method of executing steps b to e, the fault simulation of all fault points in the test sequence set can be automatically completed, ensuring that fault simulation can be performed when a fault occurs at any fault location, and automatically traversing all test sequences in the test sequence set, ensuring that each fault scenario is fully simulated and tested, greatly improving the comprehensiveness of the test, and reducing the possibility of missing fault points due to human negligence.

[0026] Further, after step e, the method further comprises:

[0027] Based on the test results, a test report for the current test sequence is generated.

[0028] The beneficial effect of adopting the above further solution is that by generating a test report corresponding to the test sequence, the test results corresponding to each test sequence can be traced back, which provides an important basis for subsequent troubleshooting and performance analysis.

[0029] Further, the step b comprises:

[0030] Based on the basic information corresponding to the current test sequence, a target test scenario is acquired, wherein the basic information includes a power supply mode, a fault point location, a fault type, and a fault duration;

[0031] Based on the current position status information of each circuit breaker in the power supply system, identifying the current power supply scenario;

[0032] If the current power supply scenario is inconsistent with the target test scenario, each current position state information is adjusted until the current power supply scenario is consistent with the target scenario, and the current power supply scenario is used as the current test scenario.

[0033] The beneficial effect of adopting the above further scheme is: by constructing a test scenario consistent with the target scenario, the authenticity of the test scenario is guaranteed. By flexibly adjusting the position status information of the circuit breaker, a variety of test scenarios can be quickly generated to meet various test requirements, which helps to fully cover various test sequences and improve the comprehensiveness and effectiveness of the test.

[0034] In a second aspect, the present application provides a testing system for a protection device in a power supply system, comprising:

[0035] An engineering management module, used to obtain a current test sequence, wherein the current test sequence includes a plurality of fault test contents corresponding to the power supply system;

[0036] A construction module, configured to construct a current test scenario based on the current test sequence, wherein the current test scenario is a parameter set of electrical parameters and operating status of the power supply system under a fault state corresponding to the current test sequence;

[0037] A simulation data calculation and generation module, used to calculate the current simulation fault data in the current test scenario based on the trained fault simulation model, wherein the current simulation fault data includes simulation data of multiple analog channels corresponding to each protection device under test;

[0038] A simulation data transmission module, used for sending the current simulation fault data to a plurality of test devices, so that each of the test devices tests the protection device under test corresponding to the respective test device;

[0039] The test result judgment module is used to obtain the current action behavior generated by the test of each of the tested protection devices, compare each of the current action behaviors with the corresponding target action behavior, and obtain the test result corresponding to the current test sequence.

[0040] In a third aspect, the present application provides an electronic device, including a processor and a memory, wherein the processor is coupled to the memory;

[0041] The processor is used to execute the computer program stored in the memory so that the electronic device performs the method as described in any one of the first aspects.

[0042] In a fourth aspect, the present application provides a computer-readable storage medium, comprising a computer program or instructions, which, when executed on a computer, enables the computer to execute the method as described in any one of the first aspects. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] Figure 1 A flow chart of a method for testing a protection device in a power supply system according to an embodiment of the present application;

[0044] Figure 2 A block diagram of the test master station connection structure of the embodiment of the present application;

[0045] Figure 3 A schematic diagram of a primary system of a power supply system according to an embodiment of the present application;

[0046] Figure 4 This is a structural block diagram of a testing system for a protection device in a power supply system according to an embodiment of the present application;

[0047] Figure 5 This is a structural block diagram of an electronic device according to an embodiment of the present application. DETAILED DESCRIPTION

[0048] The present application is further described in detail below in conjunction with the accompanying drawings.

[0049] The embodiment of the present application provides a testing method for a protection device in a power supply system, which can be executed by a device, which can be a server or a terminal device, wherein the server can be an independent physical server, a server cluster or a distributed system composed of multiple physical servers, or a cloud server providing cloud computing services. The terminal device can be a smart phone, a tablet computer, a desktop computer, etc., but is not limited thereto.

[0050] like Figure 1 As shown, a testing method for a protection device in a power supply system is performed by a test master station. The main process of the method is described as follows (step a to step e):

[0051] Step a: obtaining a current test sequence, wherein the current test sequence includes a plurality of fault test contents corresponding to the power supply system.

[0052] In this embodiment, the power supply system includes a primary system and a secondary system, and the power supply system can be a traction power supply system. The primary system is a system composed of power generation, transmission, transformation and distribution equipment such as generators, transmission lines, transformers, and circuit breakers. The power equipment of the primary system directly participates in the generation, transmission, transformation and distribution of electric energy. The secondary system is a system composed of protection devices, safety automatic control, system communication and dispatching automation. The main function of the secondary system is to monitor, control, protect and manage the primary system to ensure that the primary system can operate safely, stably and economically.

[0053] The protection device is an important part of the secondary system. The protection device monitors the operating status of the power equipment in the primary system in real time and quickly cuts off the faulty equipment or issues an alarm when a fault or abnormality is detected, thereby protecting the safe and stable operation of the primary system. In this embodiment, the protection device may include a transformer protection device, a feeder protection device, an autotransformer protection device, and the like.

[0054] like Figure 2 As shown, the test master station is installed in a portable computer, and multiple test devices are connected via wired Ethernet to perform networking tests on protection devices corresponding to the multiple test devices.

[0055] The test sequence also includes a test number, which is used to characterize the test sequence of the corresponding test sequence. The fault test content is the fault condition that may occur in the primary system. The current test sequence corresponds to a test fault point, which can be set inside the traction transformer, at the outlet of the traction power supply arm, in the middle of the traction power supply arm, at the end of the traction power supply arm, and inside the autotransformer.

[0056] Step b: constructing a current test scenario based on the current test sequence, wherein the current test scenario is a parameter set of electrical parameters and operating status of the power supply system under the fault state corresponding to the current test sequence.

[0057] Before step b, the test master station may first obtain the equipment parameters of the primary system, which may include equivalent parameters of the system voltage, traction transformer, autotransformer and traction power supply arm. In this embodiment, the equipment parameters of the primary system may be input to the test master station by the user during the test, or may be parameters stored in the test master station.

[0058] The current test scenario is the specific environment and conditions corresponding to the primary system, which may include the layout of the power plant, the direction of the transmission line, the configuration of the substation, and the distribution of the distribution network.

[0059] According to the equipment parameters of the primary system and the current test sequence, the current test scenario can be constructed, so that the simulated current fault data can better fit the real data when the fault actually occurs, thereby improving the accuracy of subsequent test results.

[0060] Step c: calculating the current simulated fault data in the current test scenario based on the trained fault simulation model, wherein the current simulated fault data includes simulation data of multiple analog channels corresponding to each protection device under test.

[0061] In this embodiment, the fault simulation model may be ATPDraw, which is a circuit simulation software developed based on the ATP-EMTP (The Alternative Transients Program-Electromagnetic Transients Program) program.

[0062] The current test scenario is used as the input of the trained fault simulation model, and the trained fault simulation model can output the current simulated fault data.

[0063] Multi-channel analog channels can include voltage channels and current channels. Analog channels are channels that can receive, convert and process analog signals. Analog signals are continuously changing physical quantities, such as voltage, current, temperature, pressure, etc. After being converted into electrical signals by sensors or transmitters, analog signals are further processed through analog channels. Analog channels are mainly used to collect and process analog signals (such as voltage and current) from primary systems, and convert these signals into digital signals for use in monitoring, control and protection devices.

[0064] like Figure 3 As shown, in this embodiment, the voltage channel may include 4 high-voltage side voltages (UA, UB, UC and U0), 4 low-voltage side voltages (UT1, UF1, UT2 and UF2), an upstream feeder voltage (UT2 and UF2) and a downstream feeder voltage (UT1 and UF1); the current channel may include 4 high-voltage side currents (IA, IB, IC and I0), 4 low-voltage side currents (IT1, IF1, IT2 and IF2), an upstream feeder current (IT2 and IF2), a downstream feeder current (IT1 and IF1), an absorption current (IAT1 and IAT2) and a parallel line current (ITb and IFb).

[0065] Step d: sending the current simulated fault data to a plurality of test devices, so that each of the test devices tests the protection device under test corresponding to the test device.

[0066] like Figure 2 As shown, in this embodiment, the protection device under test can be installed on the corresponding tooling cabinet according to the actual installation position. The test equipment can test the corresponding protection device under test according to the current simulated fault data.

[0067] Step e: obtaining the current action behaviors generated by the test of each of the tested protection devices, and comparing each of the current action behaviors with the corresponding target action behaviors to obtain the test results corresponding to the current test sequence.

[0068] In this embodiment, the current action behavior may include the switch position and action SOE information. The switch position can be expressed as "closed" or "open". The action SOE information refers to the time sequence record of various events in the power system (such as switch position changes and protection actions, etc.), which is used to record the specific time of the event (accurate to milliseconds) and the event type.

[0069] According to the test purpose of the current test sequence, the target action behavior corresponding to each tested protection device is obtained, and each target action behavior can meet the action results of the corresponding test content in response to the "Q / CR687 Technical Guidelines for Relay Protection Configuration and Setting Calculation of Traction Power Supply System".

[0070] By comparing each current action behavior with the corresponding target action behavior, a plurality of comparison results are obtained, and then the test result corresponding to the current test sequence is obtained according to the plurality of comparison results.

[0071] According to the current test scenario constructed, fault data is generated, and the fault data is more in line with the real data when the fault actually occurs. The fault simulation of the fault point corresponding to the current test sequence can be automatically completed. The fault point corresponding to the current test sequence can be any fault point, ensuring that fault simulation can be performed at any fault location, improving the safe and stable operation level of power supply systems such as traction substations.

[0072] In the present embodiment, there is no need to prepare multiple test schemes in advance and to manually set the voltage and current data of the test sequence. It is independent of the function and setting of the protection device under test, and the functional correctness of the protection device under test and the rationality of the setting can be verified. The coordination between multiple protection devices in the power supply system such as the traction substation can be checked, which reduces the requirements for testers. There is no need to manually change the test data on site, and the on-site testing process is simple.

[0073] In this embodiment, the step a specifically includes the following processing: based on a test sequence set, obtaining the current test sequence, the test sequence set includes a plurality of different test sequences, and different test sequences correspond to different fault test contents.

[0074] Each test sequence corresponds to basic information, which includes fault test content. The fault test content includes power supply mode, fault point location, transition resistance size, fault type and fault duration. The fault type of the fault point can include single-phase grounding, two-phase short circuit and two-phase short circuit grounding. The fault type of each fault point can set the transition resistance size, and the fault duration of the fault type of each fault point can include instantaneous and permanent.

[0075] By setting the power supply mode, all fault points that need to be tested, the fault type of each fault point, the transition resistance of each fault type and the fault duration, a test sequence set containing all test items of the full scenario of the test project can be formed.

[0076] By generating a test sequence set including all set fault points, fault types and fault duration, the test conditions are provided for the subsequent automatic fault test, which can ensure the comprehensiveness and systematicness of the test and reduce the potential risks caused by test omissions. The test master station can directly select the test sequence to be tested from the pre-built full-scenario test sequence set, which greatly improves the efficiency of the test work.

[0077] like Figure 3 As shown, in this embodiment, the locations where the fault point can be set include: the inside of the traction transformer (such as fault point K1), the low-voltage busbar of the traction substation (such as fault point K2), the outlet of the upward traction power supply arm (such as fault point K3), the middle of the upward traction power supply arm (such as fault point K4), the end of the upward traction power supply arm (such as fault point K5), the outlet of the downward traction power supply arm (such as fault point K6), the middle of the downward traction power supply arm (such as fault point K7), the end of the downward traction power supply arm (such as fault point K8) and the inside of the autotransformer (such as fault points K9, K10).

[0078] The fault types of each fault point include: single-phase grounding (such as TR fault, FR fault), two-phase short circuit (such as TF fault) and two-phase short circuit grounding (such as TFR fault). The fault type of each fault point can set the size of the transition resistance, including metallic short circuit and high resistance grounding. The fault duration of each fault point fault type includes: instantaneous (fault time 500ms) and permanent (fault time 10s).

[0079] In this embodiment, after step e, the following processing is also included: if the current test sequence is not the last test sequence to be tested in the test sequence set, the next test sequence of the current test sequence in the test sequence set is used as the new current test sequence, and the method of steps b to e is repeatedly executed until all test sequences in the test sequence set are tested.

[0080] By looping through the method of step b to step e, the fault simulation of all fault points in the test sequence set can be automatically completed, ensuring that fault simulation can be performed when a fault occurs at any fault location, and automatically traversing all test sequences in the test sequence set to ensure that each fault scenario is fully simulated and tested, greatly improving the comprehensiveness of the test and reducing the possibility of missing a fault point due to human negligence.

[0081] Automatically complete fault simulation of all fault types to ensure the reliability of fault simulation, and automatically complete fault simulation of all power supply modes to ensure the comprehensiveness of fault simulation. In the entire fault simulation process, all can be completed automatically by computer. Automated testing can greatly shorten the test cycle, reduce the repetitive work of testers, and thus save test time and testing manpower costs.

[0082] In this embodiment, the method for automatically testing a set of test sequences for the entire scenario includes: obtaining the test content of the first test sequence, namely, the first power supply mode (such as a full parallel AT power supply mode), the first fault point (such as fault point K1), the first fault type (such as a TR fault), the first transition resistance (such as a metallic short circuit) and the duration (such as an instantaneous fault time of 500ms), and testing the first test sequence.

[0083] After the first test sequence is completed, the test content of the second test sequence is obtained, that is, the duration is set (permanent fault time 10s), and the other test contents are the same as the test contents of the first test sequence, and the second test sequence is tested.

[0084] If all the test sequences with the same power supply mode, fault point, fault type and transition resistance and different fault durations are completed, then continue to test the next test sequence and obtain the test content of the next test sequence, that is, set the next transition resistance (high resistance grounding), the power supply mode is still the full parallel AT power supply mode, the fault point is still the fault point K1, and the fault type is still the TR fault, and test the test sequence. After the test sequence is completed, continue to obtain new test sequences until the power supply mode is the full parallel AT power supply mode, the fault point is the fault point K1, the fault type is the TR fault, and the test sequences of all fault durations and all transition resistances are completed. Then, the test sequence of the next fault type can be tested, and so on, until all test sequences are completed.

[0085] In this embodiment, sending the current simulation fault data to multiple test devices includes the following processing: for the simulation data of each analog channel in the current simulation fault data, based on the correspondence between each test device and each analog channel, sending the simulation data of the analog channel to the corresponding test device.

[0086] The test master station stores the correspondence between the test equipment and the analog channels. Based on the correspondence, the test master station can send the simulation data of each analog channel in the current simulation fault data to the corresponding test equipment. Figure 2 and Figure 3 As shown, illustratively, the plurality of test devices include a test cabinet 1, a test cabinet 2, and a test cabinet 3, and the corresponding relationship between the test cabinet 1, the test cabinet 2, and the test cabinet 3 and each analog channel is shown in Table 1:

[0087] Table 1

[0088]

[0089] Under the fault state of the current test sequence, the electrical quantities of each part of the power supply system (especially the analog channels listed in Table 1) will respond to this fault, that is, simulate which channels (that is, which electrical quantities) will be affected by the fault. The current simulated fault data includes how each analog channel is affected by the current test sequence.

[0090] In this embodiment, after sending the current simulated fault data to multiple test devices, the following processing is also included: determining whether each of the test devices is in a clock synchronization state, and if so, sending the same test output time to each of the test devices, and the test output time is the time when each of the test devices starts testing the corresponding protection device under test.

[0091] After all test devices have received the corresponding simulation data, the operations between each test device and each protection device under test need to be highly coordinated. Slight differences in time may lead to inaccurate test results. Therefore, it is necessary to ensure that the clocks between each test device and each protection device under test are synchronized.

[0092] like Figure 2 As shown, multiple test devices can be respectively connected to the Beidou time-synchronized clock server for communication, and each protection device under test can also be respectively connected to the clock server for communication. By synchronizing with the clock server, it is ensured that the clock errors of all test devices and the protection devices under test are within the allowable range, so that each test device and each protection device under test can achieve clock synchronization, so that the same test output time can be set.

[0093] In this embodiment, for each test device or each protection device under test, the test device or the protection device under test itself will have its own clock that changes normally. After successfully synchronizing with the Beidou standard clock, its own clock will be rewritten as Beidou time for the first time. Subsequently, the time will be read from the Beidou standard clock once every 1s and compared with the clock of the test device or the protection device under test. If the difference is less than 0.1ms, it is considered that the clocks are synchronized, that is, the test device or the protection device under test is in a clock synchronization state.

[0094] When each test device and each protection device under test are in a clock synchronization state, each test device simulates the changes in various electrical quantities in the power system under actual fault conditions based on the received simulation data, and simultaneously outputs corresponding test signals to the corresponding protection device under test. The test signals are used to test the action behavior of the protection device under test under specific fault conditions.

[0095] In this embodiment, after step e, the following processing is further included: generating a test report of the current test sequence based on the test result.

[0096] The contents recorded in the test report may include the electrical quantity applied to each tested protection device, the target action behavior corresponding to each tested protection device, the actual current action behavior of each tested device and the comparison results of each automatically judged current action behavior, so that the test results corresponding to each test sequence can be traced back, providing an important basis for subsequent troubleshooting and performance analysis.

[0097] In this embodiment, the step b includes the following processing: based on the basic information corresponding to the current test sequence, obtaining the target test scenario, the basic information including the power supply mode, the fault point location, the fault type and the fault duration; based on the current position status information of each circuit breaker in the power supply system, identifying the current power supply scenario; if the current power supply scenario is inconsistent with the target test scenario, adjusting each current position status information until the current power supply scenario is consistent with the target scenario, and using the current power supply scenario as the current test scenario.

[0098] According to the current position status information of each circuit breaker in the primary system, the current topology of the primary system is identified. The current topology is the current power supply scenario. The current position status information of the circuit breaker can be the closed position or the open position. Figure 3 As shown, exemplarily, multiple circuit breakers include QF101, QF201, QF211, QF212, QF221, QF222, QF224, QF231, QF232, QF234, QF225 and QF235, and the circuit breakers whose current position status information is the closed position include: QF101, QF201, QF211, QF212, QF221, QF222, QF224, QF231, QF232 and QF234, and the circuit breakers whose current position status information is the open position include QF225 and QF235.

[0099] By directly reflecting the actual position status (closed or open) of the circuit breaker in the power system, a test scenario consistent with the target scenario can be constructed, ensuring the authenticity of the test scenario. Different test sequences correspond to different basic information such as power supply methods and fault types, and different test scenarios need to be constructed. By flexibly adjusting the position status information of the circuit breaker, a variety of test scenarios can be quickly generated to meet various test requirements, which helps to fully cover various test sequences and improve the comprehensiveness and effectiveness of the test.

[0100] In this embodiment, the testing method of the protection device in the power supply system is not only applicable to the functional testing of the secondary system protection device of the power supply system such as the traction substation, but also applicable to the testing of the relay protection and automation device of the substation. In addition to being used for on-site arrival testing of the protection automation device, the method is also applicable to the professional testing of the certification body, and the functional verification test of the supplier in the research and development stage, and other functional tests in different links.

[0101] Based on the same technical concept, the present application also provides a testing system for a protection device in a power supply system, such as Figure 4 As shown, the testing system 200 of the protection device in the power supply system mainly includes:

[0102] The engineering management module 201 is used to obtain a current test sequence, where the current test sequence includes multiple fault test contents corresponding to the power supply system;

[0103] A construction module 202 is used to construct a current test scenario based on the current test sequence, where the current test scenario is a parameter set of electrical parameters and operating status of the power supply system under a fault state corresponding to the current test sequence;

[0104] A simulation data calculation and generation module 203 is used to calculate the current simulation fault data in the current test scenario based on the trained fault simulation model, wherein the current simulation fault data includes simulation data of multiple analog channels corresponding to each protection device under test;

[0105] A simulation data transmission module 204, used for sending the current simulation fault data to a plurality of test devices, so that each of the test devices tests the protection device under test corresponding to the respective test device;

[0106] The test result judgment module 205 is used to obtain the current action behaviors generated by the test of each of the tested protection devices, and compare each of the current action behaviors with the corresponding target action behaviors to obtain the test results corresponding to the current test sequence.

[0107] Optionally, the simulation data transmission module 204 includes:

[0108] The corresponding sending submodule is used to send the simulation data of each analog channel in the current simulated fault data to the corresponding test device based on the corresponding relationship between each test device and each analog channel.

[0109] Optionally, after the simulation data transmission module 204, the following further includes:

[0110] The judgment and sending module is used to judge whether each of the test devices is in a clock synchronization state. If so, a same test output time is sent to each of the test devices. The test output time is the time when each of the test devices starts testing the corresponding protection device under test.

[0111] Optionally, the project management module 201 includes:

[0112] The first acquisition submodule is used to acquire the current test sequence based on a test sequence set, where the test sequence set includes a plurality of different test sequences, and different test sequences correspond to different fault test contents.

[0113] Optionally, after the test result judgment module 205, the following further includes:

[0114] A repeated execution module is used to use the next test sequence of the current test sequence in the test sequence set as the new current test sequence, and repeatedly execute the processing from the construction module 202 to the test result judgment module 205 when the current test sequence is not the last test sequence to be tested in the test sequence set, until all the test sequences in the test sequence set are tested.

[0115] Optionally, after the test result judgment module 205, the following further includes:

[0116] A report generating module is used to generate a test report of the current test sequence based on the test result.

[0117] Optionally, the construction module 202 includes:

[0118] A second acquisition submodule is used to acquire a target test scenario based on basic information corresponding to the current test sequence, wherein the basic information includes a power supply mode, a fault point location, a fault type, and a fault duration;

[0119] An identification submodule, configured to identify a current power supply scenario based on current position status information of each circuit breaker in the power supply system;

[0120] The adjustment submodule is used to adjust each of the current position status information when the current power supply scenario is inconsistent with the target test scenario, until the current power supply scenario is consistent with the target scenario, and use the current power supply scenario as the current test scenario.

[0121] In one example, the module in any of the above devices can be one or more integrated circuits configured to implement the above methods, such as: one or more application specific integrated circuits (ASICs), or, one or more digital signal processors (DSPs), or, one or more field programmable gate arrays (FPGAs), or a combination of at least two of these integrated circuit forms.

[0122] For another example, when the modules in the device can be implemented in the form of a processing element scheduling program, the processing element can be a general-purpose processor, such as a central processing unit (CPU) or other processor that can call a program. For another example, these modules can be integrated together and implemented in the form of a system-on-a-chip (SOC).

[0123] Various objects such as various messages / information / equipment / network elements / systems / devices / actions / operations / processes / concepts that may appear in this application are named. It can be understood that these specific names do not constitute a limitation on the relevant objects. The names assigned may change with factors such as scenarios, contexts or usage habits. The understanding of the technical meaning of the technical terms in this application should be mainly determined from the functions and technical effects embodied / executed in the technical scheme.

[0124] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the systems, devices and modules described above can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0125] Those of ordinary skill in the art will appreciate that the modules and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0126] Based on the same technical concept, the present application also provides an electronic device, such as Figure 5 As shown, the electronic device 300 includes a processor 301 and a memory 302 , and may further include an information input / information output (I / O) interface 303 , one or more of a communication component 304 , and a communication bus 305 .

[0127] The processor 301 is used to control the overall operation of the electronic device 300 to complete all or part of the steps in the above-mentioned test method of the protection device in the power supply system; the memory 302 is used to store various types of data to support the operation of the electronic device 300, and these data may include, for example, instructions for any application or method used to operate on the electronic device 300, and data related to the application. The memory 302 can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (Static Random Access Memory, SRAM), electrically erasable programmable read-only memory (Electrically Erasable Programmable Read-Only Memory, EEPROM), erasable programmable read-only memory (Erasable Programmable Read-Only Memory, EPROM), programmable read-only memory (Programmable Read-Only Memory, PROM), read-only memory (Read-Only Memory, ROM), magnetic memory, flash memory, magnetic disk or optical disk.

[0128] The I / O interface 303 provides an interface between the processor 301 and other interface modules, and the above-mentioned other interface modules can be keyboards, mice, buttons, etc. These buttons can be virtual buttons or physical buttons. The communication component 304 is used to test the wired or wireless communication between the electronic device 300 and other devices. Wireless communication, such as Wi-Fi, Bluetooth, Near Field Communication (NFC), 2G, 3G or 4G, or a combination of one or more of them, so the corresponding communication component 304 can include: Wi-Fi components, Bluetooth components, NFC components.

[0129] The communication bus 305 may include a path to transmit information between the above components. The communication bus 305 may be a PCI (Peripheral Component Interconnect) bus or an EISA (Extended Industry Standard Architecture) bus, etc. The communication bus 305 may be divided into an address bus, a data bus, a control bus, etc.

[0130] The electronic device 300 can be implemented by one or more application specific integrated circuits (Application Specific Integrated Circuit, referred to as ASIC), digital signal processors (Digital Signal Processor, referred to as DSP), digital signal processing devices (Digital Signal Processing Device, referred to as DSPD), programmable logic devices (Programmable Logic Device, referred to as PLD), field programmable gate arrays (Field Programmable Gate Array, referred to as FPGA), controllers, microcontrollers, microprocessors or other electronic components, and is used to execute the test method of the protection device in the power supply system given in the above embodiment.

[0131] The electronic device 300 may include but is not limited to mobile terminals such as digital broadcast receivers, PDAs (personal digital assistants), PMPs (portable multimedia players), etc., and fixed terminals such as digital TVs, desktop computers, etc., and may also be servers, etc.

[0132] Based on the same technical concept, the present application also provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of the above-mentioned method for testing a protection device in a power supply system are implemented.

[0133] The computer-readable storage medium may include: a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk, and other media that can store program codes.

[0134] The terms "comprises," "comprising," or any other variations thereof are intended to cover non-exclusive inclusion such that a process, method, article, or apparatus that includes a list of elements includes not only those elements but also other elements not expressly listed, or also includes elements inherent to such process, method, article, or apparatus.

[0135] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In the description of this application, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0136] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine the different embodiments or examples described in this specification and the features of the different embodiments or examples, without contradiction.

[0137] Although the embodiments of the present application have been shown and described above, it can be understood that the above embodiments are exemplary and cannot be understood as limitations on the present application. Ordinary technicians in this field can change, modify, replace and modify the above embodiments within the scope of the present application.

Claims

1. A method for testing a protection device in a power supply system, characterized in that: include: Step a, obtaining a current test sequence, wherein the current test sequence includes multiple fault test contents corresponding to the power supply system; Step b: constructing a current test scenario based on the current test sequence, wherein the current test scenario is a parameter set of electrical parameters and operating status of the power supply system under the fault state corresponding to the current test sequence; Step c, based on the trained fault simulation model, calculating the current simulated fault data in the current test scenario, wherein the current simulated fault data includes simulation data of multiple analog channels corresponding to each protection device under test; Step d, sending the current simulated fault data to a plurality of test devices, so that each of the test devices tests the protection device under test corresponding to the respective test device; Step e: obtaining the current action behaviors generated by the test of each of the tested protection devices, and comparing each of the current action behaviors with the corresponding target action behaviors to obtain the test results corresponding to the current test sequence.

2. A method for testing a protection device in a power supply system according to claim 1, characterized in that: The sending of the current simulated fault data to a plurality of test devices comprises: For the simulation data of each analog channel in the current simulation fault data, based on the corresponding relationship between each test device and each analog channel, the simulation data of the analog channel is sent to the corresponding test device.

3. A method for testing a protection device in a power supply system according to claim 2, characterized in that: After sending the current simulated fault data to a plurality of test devices, the method further includes: It is determined whether each of the test devices is in a clock synchronization state. If so, a same test output time is sent to each of the test devices. The test output time is the time when each of the test devices starts to test the corresponding protection device under test.

4. A method for testing a protection device in a power supply system according to claim 1, characterized in that: The step a comprises: The current test sequence is acquired based on a test sequence set, where the test sequence set includes a plurality of different test sequences, and different test sequences correspond to different fault test contents.

5. A method for testing a protection device in a power supply system according to claim 4, characterized in that: After step e, the method further comprises: If the current test sequence is not the last test sequence to be tested in the test sequence set, the next test sequence of the current test sequence in the test sequence set is used as the new current test sequence, and the method of step b to step e is repeated until all test sequences in the test sequence set are tested.

6. A method for testing a protection device in a power supply system according to claim 5, characterized in that: After step e, the method further comprises: Based on the test results, a test report for the current test sequence is generated.

7. A method for testing a protection device in a power supply system according to claim 1, characterized in that: The step b comprises: Based on the basic information corresponding to the current test sequence, a target test scenario is acquired, wherein the basic information includes a power supply mode, a fault point location, a fault type, and a fault duration; Based on the current position status information of each circuit breaker in the power supply system, identifying the current power supply scenario; If the current power supply scenario is inconsistent with the target test scenario, each current position state information is adjusted until the current power supply scenario is consistent with the target scenario, and the current power supply scenario is used as the current test scenario.

8. A testing system for a protection device in a power supply system, characterized in that: include: An engineering management module, used to obtain a current test sequence, wherein the current test sequence includes a plurality of fault test contents corresponding to the power supply system; A construction module, configured to construct a current test scenario based on the current test sequence, wherein the current test scenario is a parameter set of electrical parameters and operating status of the power supply system under a fault state corresponding to the current test sequence; A simulation data calculation and generation module, used to calculate the current simulation fault data in the current test scenario based on the trained fault simulation model, wherein the current simulation fault data includes simulation data of multiple analog channels corresponding to each protection device under test; A simulation data transmission module, used for sending the current simulation fault data to a plurality of test devices, so that each of the test devices tests the protection device under test corresponding to the respective test device; The test result judgment module is used to obtain the current action behavior generated by the test of each of the tested protection devices, and compare each of the current action behaviors with the corresponding target action behavior to obtain the test result corresponding to the current test sequence.

9. An electronic device, characterized in that: comprising a processor and a memory, wherein the processor is coupled to the memory; The processor is configured to execute a computer program stored in the memory, so that the electronic device executes the method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The method comprises a computer program or an instruction, which, when executed on a computer, causes the computer to execute the method according to any one of claims 1 to 7.

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