Test system

By designing a movable loading table and identifying binding devices in the infrared detector test equipment, efficient disassembly and assembly of infrared detectors is achieved, solving the problem of low testing efficiency of existing equipment, and improving testing efficiency and accuracy .

CN119290170APending Publication Date: 2025-01-10HANGZHOU HIKMICRO SENSING TECH CO LTD
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Patent Information

Application Number
CN202411337857.2
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-09-24
Publication Date
2025-01-10

AI Technical Summary

Technical Problem

Existing infrared detector testing equipment is inefficient in testing and cannot meet the increasing shipment demand.

Method used

A test system is designed, including a rack, drive parts, loading table, identification binding device and bold. Through the movement of the loading table on the rack, the installation position can be respectively connected to the disassembly and assembly station, identification binding station and The test station cooperates to realize efficient disassembly and assembly and testing of infrared detectors, and use the identification binding device and information interaction device to perform serial number binding and detection results interaction.

Benefits of technology

It improves the testing efficiency of infrared detectors, ensures that the detection results correspond to the serial number one by one, facilitates data calibration and storage, and improves the overall efficiency and accuracy of the test system.

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Abstract

The invention discloses a test system, which belongs to the technical field of test equipment, is used for testing an infrared detector mounted on a test tool, and is characterized in that a rack is provided with a disassembly and assembly station, an identification binding station and a test station, a loading table is provided with a plurality of mounting positions for mounting the test tool, and the loading table is connected with a driving part; the identifying and binding device is arranged at the identifying and binding station so as to acquire the serial number of any infrared detector at the mounting position matched with the identifying and binding device, and the binding relation between the identification mark of the test tool at the mounting position and the serial number is established; the black body is arranged at the test station, and the infrared detector at any mounting position matched with the test station detects the temperature of the black body to obtain a detection result; the identification binding device, the test tool and the infrared detector are all connected with the information interaction device, and the information interaction device is installed outside the disassembly and assembly station so as to send a binding relation and a detection result. The test system can solve the problem that the test efficiency of an existing test system is relatively low.
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Description

Technical Field

[0001] The present application belongs to the technical field of testing equipment, and specifically relates to a testing system. Background Art

[0002] Testing is usually a necessary process before mass production of products to determine whether the functions of the products produced are normal. Taking infrared detectors as an example, black bodies are usually used to test whether the infrared detectors are qualified. In current testing equipment, a black body is installed on the rack to provide testing functions. When testing is required, the infrared detector is installed at the corresponding position on the rack. By detecting the radiation temperature of the black body and comparing it with the known radiation temperature of the black body, it can be determined whether the infrared detector is qualified. After that, the infrared detector that has completed the test work is removed and replaced with another new infrared detector, and the new infrared detector continues to be tested. However, the current testing equipment has relatively low testing efficiency for infrared detectors and cannot meet the current increasing demand for shipments of infrared detectors. Summary of the invention

[0003] The purpose of the embodiments of the present application is to provide a testing system to solve the problem that the testing efficiency of infrared detectors by current testing equipment is relatively low.

[0004] The embodiment of the present application discloses a test system for testing an infrared detector, wherein the test system comprises a frame, a driving member, a loading platform, an identification binding device and a black body, wherein: The frame is provided with a disassembly and assembly station, an identification and binding station and a test station, the loading platform has a plurality of installation positions, any of which can be used to install a test tool, and the infrared detector can be installed on the test tool, the loading platform is connected to the driving member, and the driving member is used to drive the loading platform to move relative to the frame, so that any of the installation positions can cooperate with the disassembly and assembly station, the identification and binding station and the test station respectively; The identification and binding device is arranged at the identification and binding station, and is used to obtain the serial number of the infrared detector at any installation position matched with it, and to establish a binding relationship between the identification mark of the test tool located at the installation position and the serial number; The black body is arranged at the testing station, and the infrared detector at any installation position cooperating with the testing station can detect the temperature of the black body to obtain the detection result; The test system also includes an information interaction device, the identification binding device, the test tool and the infrared detector are all connected to the information interaction device, the information interaction device is installed outside the disassembly and assembly station, and the information interaction device is used to send the binding relationship and the detection result.

[0005] The embodiment of the present application discloses a test system, in which a loading platform is installed on a frame through a driving member, so that the loading platform can move relative to the frame through the driving member. The frame is provided with a disassembly and assembly station, an identification and binding station and a test station, and the loading platform has multiple installation positions, and each installation position can be used to install a test tool, and an infrared detector can be installed on any test tool, so that the infrared detector on each test tool can be installed in the test system, and the infrared detector interacts with the corresponding device in the test system. At the same time, the driving member can drive the loading platform to move relative to the frame. In this process, any installation position can cooperate with the disassembly and assembly station, the identification and binding station and the test station respectively, so that when the test tool is disassembled and assembled at the disassembly and assembly station, the test tool at other installation positions can perform identification and binding work or testing work, which makes the test efficiency of the test system disclosed in the embodiment of the present application relatively high.

[0006] At the same time, the black body is installed at the test station, so that when the test system is used to test the infrared detector, the infrared detector installed on the test fixture at any installation position can detect the temperature of the black body. After obtaining the test result, it can be determined whether the infrared detector is qualified by comparing it with the standard temperature of the black body. Of course, in order to realize data storage, or to facilitate the data calibration of the infrared detector, in the embodiment of the present application, the test system includes an identification and binding device and an information interaction device, wherein the identification and binding device is arranged at the identification and binding station, and the information interaction device is arranged outside the disassembly and assembly station, so as to ensure that the identification and binding process and the information interaction process will not hinder the disassembly and assembly process of the test fixture. Among them, the identification and binding device is used to identify and obtain the serial number of any infrared detector at the installation position that matches it, and the identification and binding device is also used to establish a binding relationship between the identification mark of the test tool located at the installation position and the aforementioned serial number. The identification and binding device, the test tool and the infrared detector are all connected to the information interaction device, and the information interaction device is used to send the binding relationship and the test results, so that when the test results of the infrared detector are subsequently stored, it can be ensured that the test data corresponds to the serial number of the infrared detector one by one, thereby facilitating the review of the test results and other work on the infrared detector such as data calibration. BRIEF DESCRIPTION OF THE DRAWINGS

[0007] The drawings described herein are used to provide a further understanding of the present application and constitute a part of the present application. The illustrative embodiments of the present application and their descriptions are used to explain the present application and do not constitute an improper limitation on the present application. In the drawings: Figure 1 A schematic diagram of the structure of the test system disclosed in the embodiment of the present application; Figure 2This is a schematic diagram of the assembly between the test tooling and the infrared detector in the test system disclosed in the embodiment of the present application.

[0008] Reference numerals: 1-frame, 2-driving part, 3-loading platform, 4-identification binding device, 5-column, 6-top plate, 7-information interaction device, 8-slip ring, 9-black body, 10-test tooling, 101-frame, 102-cover, 103-observation window, 104-light transmission hole, 11-indicator, 20-infrared detector, 21-temperature sensing unit, 22-connection plug-in. DETAILED DESCRIPTION

[0009] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0010] The terms "first", "second", etc. in the specification and claims of the present application are used to distinguish similar objects, and are not used to describe a specific order or sequence. It should be understood that the data used in this way can be interchangeable under appropriate circumstances, so that the embodiments of the present application can be implemented in an order other than those illustrated or described here, and the objects distinguished by "first", "second", etc. are generally of one type, and the number of objects is not limited. For example, the first object can be one or more. In addition, "and / or" in the specification and claims represents at least one of the connected objects, and the character " / " generally indicates that the objects associated with each other are in an "or" relationship.

[0011] like Figure 1 As shown, an embodiment of the present application discloses a testing system, which includes a frame 1, a driving member 2, a loading platform 3, an identification binding device 4 and a black body 9.

[0012] Among them, the rack 1 is the basic structure of the entire test system, and other devices such as the driver 2 can be directly or indirectly installed on the rack 1. Specifically, the loading platform 3 can be installed on the rack 1 through the driver 2, so that the loading platform 3 can move relative to the rack 1. In this case, a worker or disassembly and assembly equipment can be set at a specific position of the test system, so that during the movement of the loading platform 3, the position of the worker or the disassembly and assembly equipment can remain unchanged, and the disassembly and assembly of the test tooling at different installation positions on the loading platform 3 in the test tooling 10 can be completed. Intuitively speaking, in the embodiment of the present application, the worker or the disassembly and assembly equipment does not need to move to multiple installation positions for disassembly and assembly during the process of disassembling and assembling the test tooling.

[0013] In more detail, the frame 1 is provided with a disassembly and assembly station, an identification and binding station and a testing station. Correspondingly, the loading platform 3 has a plurality of installation positions. As mentioned above, the loading platform 3 is installed on the frame 1 through the driving member 2. To this end, by utilizing the driving action of the driving member 2, any installation position of the loading platform 3 can be respectively coordinated with the disassembly and assembly station, the identification and binding station and the testing station, so that the corresponding processes are respectively performed at the corresponding stations.

[0014] At the same time, any installation position can be used to install the test fixture 10, and the infrared detector 20 to be tested can be installed on the test fixture 10 to reduce the difficulty of assembling the infrared detector 20 and the test system. Optionally, an infrared detector 20 is installed on any test fixture 10. In order to further improve the test efficiency, in other embodiments of the present application, multiple infrared detectors 20 can be installed on each test fixture 10, so that when any test fixture 10 is in the test position, the multiple infrared detectors 20 installed on the test fixture 10 can detect the temperature of the black body 9 together. As described above, there are multiple installation positions. For this purpose, the test fixtures 10 can be respectively installed on the multiple installation positions of the loading platform 3, and by making any station on the frame 1 correspond to only one installation position of the loading platform 3 at a time, the multiple stations on the frame 1 can respectively correspond to the multiple installation positions of the loading platform 3, so that the testing process of the infrared detector 20 on the test fixture 10 installed at a certain installation position and the installation process of the test fixture 10 at another installation position can not interfere with each other, thereby improving the testing efficiency of the testing system.

[0015] Of course, in the test system disclosed in the embodiment of the present application, the identification binding device 4 and the black body 9 can both be installed on the frame 1, and in order to ensure that the test process of the infrared detector 20 and the installation process of the test tool 10 can be carried out simultaneously, in the test system disclosed in the embodiment of the present application, the aforementioned devices must be installed outside the disassembly and assembly station, so that at any point in time, it can be ensured that the staff or disassembly and assembly equipment can use the installation position opposite to the disassembly and assembly station to carry out the installation process of the test tool 10. Of course, in the case where the driving form of the driving member 2 is different, the number of disassembly and assembly stations can be one or two. When the number of disassembly and assembly stations is two, one disassembly and assembly station can be used to install the test tool, and the other disassembly and assembly station can be used to disassemble the test tool. In this case, the disassembly and assembly work of the test tool does not hinder the test process of the infrared detector 20 on the test tool 10 installed at other installation positions corresponding to other devices.

[0016] It should be noted that the aforementioned test process not only includes the process of measuring the temperature of the black body 9 by the infrared detector 20, but also includes the identification and binding process performed by the identification and binding device, and may even include other processes such as data transmission.

[0017] More specifically, the identification and binding device 4 is arranged at the identification and binding station, and the black body 9 is arranged at the test station. The identification and binding device 4 and the black body 9 are both used to interact accordingly with the infrared detector 20 on the test tool 10. To this end, on the rack 1, the positions of the disassembly and assembly station, the identification and binding station and the test station on the rack 1 must correspond to the positions of the installation positions on the loading platform 3, so as to ensure that any installation position can be respectively arranged relative to the functional components of the disassembly and assembly station, the identification and binding station and the test station during the movement of the loading platform 3.

[0018] Since the test system disclosed in the embodiment of the present application is used to test the infrared detector 20, the test system disclosed in the embodiment of the present application includes a black body 9 as described above, and the black body 9 is installed at the test station. During the movement of the loading platform 3 with the driving member 2 relative to the frame 1, the infrared detector 20 at any installation position that cooperates with the test station can detect the temperature of the black body 9 to obtain the test result. That is, in the embodiment of the present application, the black body 9 is used as a temperature radiation source, so that the infrared detector 20 to be tested can detect the temperature of the black body 9 to determine whether the infrared detector 20 is qualified. Among them, the temperature represented by the energy radiated by the black body 9 used is a fixed value and a known quantity. By comparing it with the temperature detection result of the infrared detector 20 to be tested, the temperature detection result of the infrared detector 20 can be determined, and then it is determined whether the infrared detector 20 to be tested is qualified.

[0019] As described above, the infrared detector 20 can obtain actual parameters such as specific measurement values ​​of the black body 9. In order to facilitate subsequent processing and calibration work such as data calibration of the infrared detector 20, in an embodiment of the present application, the specific test results of each infrared detector 20 can be recorded.

[0020] To this end, the test system disclosed in the embodiment of the present application includes an identification binding device 4 and an information interaction device 7. Similar to the black body 9, the identification binding device 4 can also interact with the infrared detector 20 under test, wherein the identification binding device 4 is installed at the identification binding station, and the working processes of the identification binding device 4 and the black body 9 do not interfere with each other. The identification binding device user obtains the serial number of the infrared detector 20 at any installation position that cooperates with it, and establishes a binding relationship between the identification mark of the test fixture 10 at the installation position and the aforementioned serial number, so that the test fixture 10 installed at any installation position can form a binding relationship with the infrared detector 20 located on the test fixture 10, so that when the infrared detector 20 transmits the detection result later, the one-to-one correspondence between the detection result and the infrared detector can be determined.

[0021] At the same time, in order to ensure that the test results of the infrared detector 20 installed on any test fixture 10 can be normally uploaded to the upper computer and other devices for storage, so that the subsequent calibration work of the infrared detector 20 can be carried out normally, in the test system disclosed in the embodiment of the present application, as mentioned above, the test system also includes an information interaction device 7, which can be directly or indirectly installed on the rack 1, and the identification binding device 4, the test fixture 10 and the infrared detector 20 are all connected to the information interaction device 7, so that the binding relationship established by the identification binding device 4 and the detection results of the infrared detector 20 installed on the test fixture 10 can be sent to the upper computer through the information interaction device 7. That is, the information interaction device 7 is used to send the binding relationship and the detection result. Of course, in order to prevent the information interaction device 7 from interfering with the disassembly and assembly work, in the embodiment of the present application, the information interaction device 7 is installed outside the disassembly and assembly station. Optionally, the rack 1 can also be provided with a separate data interaction station, or the information interaction device 7 can be installed outside the stations of the rack 1, which is not limited in this article. In addition, it should be noted that in the embodiment of the present application, the disassembly and assembly station, identification and binding station, and testing station arranged on the rack 1 do not necessarily have corresponding mechanical structures. The aforementioned ones can only be distinguished by positional relationships. For example, if a certain position on the rack 1 can be used to install the identification and binding device 4, then the aforementioned position can be used as the identification and binding station, and another position on the rack 1 can be used to install the black body 9, then the aforementioned position can be used as the testing station.

[0022] More specifically, the infrared detectors 20 can be distinguished from each other by serial numbers. Similarly, the test jigs 10 can also be distinguished from each other by serial numbers. In this case, the identification mark of the test jig 10 can include the serial number of the test jig 10. In other embodiments of the present application, the identification mark of the test jig 10 can also be the physical address of the test jig 10. In addition, the identification binding device can establish a connection relationship with each test jig 10 that cooperates with it through Bluetooth connection or wired connection, and obtain the identification mark of the test jig 10 and the serial number of the infrared detector 20 installed on the test jig 10, wherein the relationship between the identification mark and the serial number is the above-mentioned binding relationship, and the binding relationship can be transmitted to the information interaction device 7 by using the connection between the test jig 10 and the information interaction device 7. Afterwards, after the test jig 10 moves to the test station with the driving member 2, the infrared detector 20 installed on the test jig 10 can transmit the detection result to the information interaction device 7 using cables and other connecting parts after detecting the temperature of the black body 9. Since the connection relationship between the multiple infrared detectors 20 and the information interaction device 7 is independent of each other, the information interaction device 7 can make the multiple detection results correspond one-to-one with the installation positions where the multiple infrared detectors 20 are located. At the same time, the test jigs 10 installed at the multiple installation positions also correspond one-to-one with the multiple installation positions, and the above-mentioned binding relationship is also formed between each test jig 10 and the infrared detector 20 set thereon. Therefore, the information interaction device 7 can achieve the one-to-one correspondence between the multiple detection results and the respective serial numbers of the multiple infrared detectors, so that in the process of the information interaction device 7 uploading the detection results to the host computer and other equipment, it can be guaranteed that any detection result can form a corresponding data connection with the infrared detector that provides the detection result.

[0023] The embodiment of the present application discloses a test system, wherein the loading platform 3 is installed on the frame 1 through the driving member 2, so that the loading platform 3 can move relative to the frame 1 through the driving member 2. The frame 1 is provided with a disassembly and assembly station, an identification and binding station and a test station, and the loading platform 3 has a plurality of installation positions, and each installation position can be used to install a test tool 10, and an infrared detector 20 can be installed on any test tool 10, so that the infrared detector 20 on each test tool 10 can be installed in the test system, and the infrared detector 20 interacts with the corresponding device in the test system. At the same time, the driving member 2 can drive the loading platform 3 to move relative to the frame 1, and in this process, any installation position can cooperate with the disassembly and assembly station, the identification and binding station and the test station respectively, so that when the test tool is disassembled and assembled at the disassembly and assembly station, the test tool 10 at other installation positions can perform identification and binding work or testing work, which makes the test efficiency of the test system disclosed in the embodiment of the present application relatively high.

[0024] At the same time, the black body 9 is installed at the test station, so that when the test system is used to test the infrared detector 20, the infrared detector 20 installed on the test fixture 10 at any installation position can detect the temperature of the black body 9. After obtaining the test result, it can be determined whether the infrared detector 20 is qualified by comparing it with the standard temperature of the black body 9. Of course, in order to realize data storage, or to facilitate the data calibration of the infrared detector 20, in the embodiment of the present application, the test system includes an identification binding device 4 and an information interaction device 7, wherein the identification binding device 4 is arranged at the identification binding station, and the information interaction device 7 is arranged outside the disassembly station, so as to ensure that the identification binding process and the information interaction process will not hinder the disassembly and assembly process of the test fixture 10. Among them, the identification and binding device 4 is used to identify and obtain the serial number of any infrared detector 20 at any installation position that cooperates with it, and the identification and binding device 4 is also used to establish a binding relationship between the identification mark of the test tool 10 located at the installation position and the aforementioned serial number. The identification and binding device 4, the test tool 10 and the infrared detector 20 are all connected to the information interaction device 7, and the information interaction device 7 is used to send the binding relationship and the test results, so that when the test results of the infrared detector 20 are subsequently stored, it can be ensured that the test data corresponds to the serial number of the infrared detector 20 one by one, thereby facilitating the review of the test results and other work on the infrared detector 20 such as data calibration.

[0025] As described above, in order to further improve the test efficiency of the test system, multiple infrared detectors 20 can be installed on any test fixture 10. In this case, the multiple infrared detectors 20 installed on any test fixture 10 at the installation position can detect the temperature of the black body 9 at the corresponding position at the same time, thereby further improving the test efficiency of the infrared detector 20. Of course, the relative positions of the multiple infrared detectors 20 installed on the test fixture 10, or the distribution of the multiple infrared detectors 20 on the test fixture 10, can be flexibly determined according to actual conditions, and this document does not limit this. In a specific embodiment of the present application, the multiple infrared detectors 20 can be arranged in a determinant, so that the space occupied by the multiple infrared detectors 20 is relatively small, the number of infrared detectors 20 that can be installed on the test fixture 10 is increased, and the number of infrared detectors 20 tested by the black body 9 in a single test process can be increased.

[0026] Of course, the infrared detectors 20 installed on any test fixture 10 all have different serial numbers. In this case, in order to ensure that the test results and the infrared detectors 20 can still correspond one to one, in the embodiment of the present application, the identification binding device 4 is used to obtain the serial numbers of the multiple infrared detectors 20 at any installation position that matches it, and the positions of the multiple infrared detectors 20 on the corresponding test fixture 10. Correspondingly, the above binding relationship includes a first relationship between the multiple serial numbers and the identification mark of the test fixture 10, and a second relationship between the multiple serial numbers and the multiple positions, so that the multiple infrared detectors 20 installed on the test fixture 10 are distinguished by using the identification binding device 4 to ensure that the multiple test results generated during the test process can be matched one by one with the multiple infrared detectors 20 on any of the multiple test fixtures 10.

[0027] Of course, in the case where multiple infrared detectors 20 are installed on any test fixture 10, the identification binding device 4, the test fixture 10 and the multiple infrared detectors 20 also need to be connected to the information interaction device 7. More specifically, the test fixture 10 is installed with an interface board and an FPGA (Field Programmable Gate Array) function board, the information interaction device 7 can be connected to the interface board through the FPGA function board, and the multiple infrared detectors 20 installed on the test fixture 10 are connected to the interface board one by one, the interface board can supply power to the multiple infrared detectors 20, the FPGA function board can perform data collection, storage and processing, and use the information interaction device 7 to send the collected information to the host computer.

[0028] As described above, the identification binding device 4 can obtain the identification mark of the test jig 10, the positions of each of the multiple infrared detectors 20 installed on the test jig 10 on the test jig 10, and the serial numbers of each of the multiple infrared detectors 20, wherein the identification mark and each serial number can be specifically displayed in the form of a graphic code, and the installation position of each infrared detector 20 on the test jig 10 can also be written into the aforementioned graphic code. In this case, the identification binding device 4 can include a camera, which can be used to scan the graphic code, and obtain the identification mark of the test jig 10, the corresponding serial numbers and position information of each infrared detector 20. In addition, as described above, there is also a one-to-one matching relationship between the position of each infrared detector 20 and the connecting cables and other devices between the infrared detector 20 and the information interaction device 7, so that when the information interaction device 7 uploads the detection results of multiple infrared detectors 20 respectively, the detection results of the infrared detector 20 can be made to correspond to the serial number one by one, so as to ensure that the host computer can correctly record the detection results of the multiple infrared detectors 20 respectively, and use the serial number of each infrared detector 20 as an index to facilitate staff or other equipment to obtain the detection results of different infrared detectors 20.

[0029] In order to reduce the difficulty of establishing the binding relationship, in another embodiment of the present application, each infrared detector 20 includes a first graphic code, and the first graphic code has information on the serial number of the infrared detector 20, and each test jig 10 includes a second graphic code, and the second graphic code has information on the identification mark of the test jig 10. In this case, in order to obtain the identification mark of the test jig 10 and the position of each infrared detector 20 installed on the test jig 10 on the test jig 10 and the serial number of each infrared detector 20.

[0030] Based on this, the identification and binding device 4 may include a code scanning and positioning camera, which has the function of obtaining the image of each graphic code and the relative position relationship. The code scanning and positioning camera can be used to obtain the image of any test fixture 10, and extract the second graphic code of the test fixture 10 itself, and the first graphic code of each of the multiple infrared detectors 20 installed on the test fixture 10, as well as the relative position relationship between the multiple first graphic codes. During the data processing process, the code scanning and positioning camera can obtain the information of the serial number included in each of the multiple first graphic codes, and by analyzing the position relationship of the multiple first graphic codes, the multiple serial numbers and the locations of the multiple first graphic codes can be bound to each other in a one-to-one correspondence. In the embodiment of the present application, the first graphic code and the second graphic code can both be in the form of a two-dimensional code.

[0031] Among them, in the embodiment of the present application, the code scanning and positioning camera can specifically scan and position the first graphic code of each of the multiple infrared detectors 20 installed on the test fixture 10 through image processing, graphic code positioning and recognition and other processes. More specifically, in the process of scanning and positioning the first graphic code, in order to improve the reliability of the code scanning and positioning camera in obtaining the position of the first graphic code of the multiple infrared detectors 20, the following steps can be included: Detail enhancement: adjust the brightness, contrast and nonlinearity of the image to enhance the edge features of the image; Binarization: to highlight the outline information of the first graphic code; Corrosion algorithm: remove clutter in the image; Dilation algorithm: Smoothing the larger boundaries of the remaining connected domains to a certain extent; Feature filtering: filter out clean graphic code areas based on the characteristic parameters of the graphic code area (such as area, length, width, etc.); Coordinate matching: Match and bind the above-obtained pure graphic code coordinates with the actual detector area on the structure.

[0032] As described above, the infrared detector 20 includes a first graphic code. Optionally, the first graphic code on each infrared detector 20 is formed on the outer surface of the infrared detector 20. In another embodiment of the present application, the test system includes a test fixture 10. In this case, in order to facilitate the acquisition of the first graphic code of each infrared detector 20, the infrared detector 20 optionally includes a temperature sensing portion 21 and a connecting plug-in 22 connected to each other, wherein the connecting plug-in 22 is provided with the above-mentioned first graphic code. At the same time, in order to facilitate the installation of the infrared detector 20 of the above structure, in the embodiment of the present application, structures for installing the temperature sensing portion 21 and the connecting plug-in 22 respectively can be provided on the test fixture 10.

[0033] In a specific embodiment of the present application, the test fixture 10 is provided with a plurality of card slots and a plurality of blade needle fixtures, and the temperature sensing parts 21 of the plurality of infrared detectors 20 are respectively mounted on the test fixture 10 through the plurality of card slots, and the connection plug-ins 22 of the plurality of infrared detectors 20 are respectively mounted on the test fixture 10 through the plurality of blade needle fixtures. In addition, the blade needle fixture can also form an electrical connection with the temperature sensing part 21 by forming an electrical connection with the connection plug-in 22, so that the infrared detector 20 can form an electrical connection with the test fixture 10 while forming a fixed connection relationship, which can greatly reduce the difficulty of assembling the infrared detector 20 and the test fixture 10.

[0034] The test system disclosed in the embodiment of the present application includes an information interaction device 7, and the information interaction device 7 is installed outside the disassembly and assembly station. Of course, the information interaction device 7 also needs to be installed outside the test station and the identification and binding station. Optionally, a data interaction station is provided on the rack 1, which can be specifically a first data interaction station, and the first data interaction station can be located between the identification and binding station and the test station. Based on this, when any installation position cooperates with the first data interaction station, the information interaction device 7 can send the data of the above-mentioned binding relationship. In addition, when a first data interaction station is provided, the information interaction device 7 can be installed in the first data interaction station. In this case, any installation position can be driven by the driver 2 and pass through the identification and binding station, and can move to the position corresponding to the first data interaction station, and perform the sending of the binding relationship, etc.

[0035] Optionally, the rack 1 is also provided with a second data interaction station, which is located between the test station and the disassembly station, and when any installation position cooperates with the second data interaction station, the information interaction device 7 can send the detection result. Similarly, in the embodiment of the present application, the information interaction device 7 can also be installed in the second data interaction station, so that after the infrared detector 20 has completed the detection of the black body 9, the infrared detector 20 can move to the position corresponding to the second data interaction station under the drive of the driving member 2. In this case, the detection result of the infrared detector 20 can be sent by the information interaction device 7 to a device such as a host computer.

[0036] In another embodiment of the present application, if the time required for the information sending process of the information interaction device 7 is relatively short, for example, within the time required for a certain installation position of the loading platform 3 to move between the identification binding station, the test station and the disassembly and assembly station, the information interaction device 7 can complete the above-mentioned information sending work such as binding information and test results, then the first data interaction station and the second data interaction station may no longer be additionally arranged on the rack. In this case, the information interaction device 7 may no longer be distributed on the rack 1 along the driving direction of the driving member together with the identification binding device 4 and the black body 9. Optionally, the information interaction device 7 may be installed at a position such as the top of the rack 1, and the identification binding device 4, the test tooling 10 and multiple infrared detectors 20 are all connected to the information interaction device 7 through cables, etc.

[0037] As described above, the driving member 2 is used to drive the loading platform 3 to move relative to the frame 1. Optionally, the driving member 2 is a linear driving member. In another embodiment of the present application, the driving member 2 is a rotary driving member, so that the driving member 2 can drive the loading platform 3 to rotate relative to the frame 1. In this case, multiple installation positions can be distributed along the circumferential intervals of the loading platform 3. Correspondingly, the disassembly and assembly station, the identification and binding station, and the test station can also be arranged on the frame 1 along the axial intervals of the loading platform. In this case, the number of disassembly and assembly stations can be one, and at the disassembly and assembly station, after the staff or disassembly and assembly equipment removes the test tool 10 on the installation position, they can reinstall another test tool 10 to the installation position, which can further reduce the number of staff or the number of disassembly and assembly equipment, thereby further reducing the testing cost. Based on the above embodiments, in order to improve the structural compactness of the entire test system, considering that the test tool 10 has a certain size, and then the diameter of the entire loading platform 3 also needs to meet the corresponding requirements, in this case, the upper part of the middle area surrounded by multiple mounting positions can be used as the installation position of the information interaction device 7, that is, the information interaction device 7 can be installed on the side of the loading platform 3 away from the driving member 2, and multiple mounting positions are arranged around the information interaction device 7.

[0038] In the above embodiment, since the information interaction device 7 is installed on the loading platform 3, and then, when the driving member 2 is working, the information interaction device 7 will also rotate relative to the frame 1. In this case, it is usually impossible to directly use a cable to connect the information interaction device 7 and the power supply, and accordingly, it is also usually impossible to directly use a cable to connect the information interaction device 7 with the test fixture 10 and the identification binding device 4. For this reason, in the embodiment of the present application, the information interaction device 7 can be electrically connected to the power supply through a slip ring 8, and accordingly, the slip ring 8 can also be used to enable the test fixture 10 and the identification binding device 4 and other devices to form an electrical connection relationship with the information interaction device 7.

[0039] In addition, considering that the information exchange device 7 is installed above the loading platform 3, and the driving member 2 is installed below the loading platform 3, the power supply needs to be connected to the information exchange device 7 from the side of the slip ring 8 away from the information exchange device 7. Therefore, in order to ensure that the power supply cable can be stably installed on the rack 1, in the embodiment of the present application, Figure 1 As shown, the test system can also include a top plate 6, which is arranged above the loading platform 3, and the power supply cable can be fixed on the top plate 6. The top plate 6 can be connected to the frame 1 through the column 5. Of course, in order to ensure the installation stability of the top plate 6, the number of the column 5 can be multiple, and the multiple columns 5 are dispersedly arranged.

[0040] As described above, the test system disclosed in the embodiment of the present application includes a black body 9, and optionally, the number of black bodies 9 is one, and correspondingly, the number of test stations required to be set on the rack 1 is also one. In order to further improve the accuracy of the test results of the infrared detector 20, optionally, in the test system disclosed in the embodiment of the present application, the number of test stations and black bodies 9 is three, and each test station is arranged between the identification binding station and the disassembly station. A black body 9 is installed at any test station, and the standard parameters of each black body 9 are different, that is, the parameters of different black bodies 9 are different. In this case, the infrared detector 20 at any installation position can correspond to the three test stations in turn, and the infrared detector 20 measures the temperature of the black bodies installed at the three test stations respectively, so as to obtain the detection results corresponding to the three black bodies 9 respectively, so as to comprehensively consider the specific circumstances of the degree of difference between the standard parameters of the corresponding black bodies 9, and determine the test accuracy of the infrared detector 20 as a whole, so as to further improve the reliability of the test performed on the infrared detector 20.

[0041] As described above, after the infrared detector 20 detects the temperature of the black body 9, the information interaction device 7 can be used to send the detection result to the host computer for storage and the like, and by comparing it with the corresponding standard temperature of the black body 9, it is determined whether the infrared detector 20 is qualified. In the case where multiple infrared detectors 20 can be installed on any test jig 10, in order to enable the staff or disassembly and assembly equipment to quickly and accurately know which one or which of the multiple infrared detectors 20 on any test jig 10 have a qualified or unqualified test result or the test work has not been carried out normally, so as to facilitate timely retesting or calibration of the corresponding infrared detectors 20, in a specific embodiment of the present application, any test jig 10 can be provided with multiple groups of indicator devices 11. Based on this, in the case where multiple infrared detectors 20 are installed on the test jig 10, the multiple infrared detectors 20 installed on any test jig 10 can be made to correspond one-to-one with the multiple groups of indicator devices 11, so that the multiple groups of indicator devices 11 on the test jig 10 can respectively indicate the test results of the multiple infrared detectors 20 on the test jig 10, thereby ensuring that the staff or disassembly and assembly equipment can timely know the test results of the multiple infrared detectors 20 on any test jig 10, which is convenient for the staff or equipment to perform subsequent operations accordingly based on the different test results of the infrared detectors 20.

[0042] More specifically, each indicator device 11 has at least two indication results, that is, the indicator device 11 has at least two different indication methods. For example, the indicator device 11 has at least two indication methods for indicating that the product is qualified and the product is unqualified, or the two indication results also represent two test results, namely, the product is qualified or the product needs to be retested. Among them, the indication method of the indicator device can be specifically a sound or light signal, for example, when the test result of the product is qualified, the indicator device 11 can indicate a green light, and when the test result of the product is unqualified or needs to be retested, the indicator device 11 can indicate a red light. Of course, in other embodiments of the present application, other indication information methods can also be used to indicate the test results.

[0043] Of course, in order to ensure that the indicating device 11 can normally indicate the test results of the corresponding infrared detector 20, the test tooling must also be connected to the information interaction device 7. The information interaction device can specifically include equipment such as switches, and the multiple infrared detectors 20 on the test tooling 10 are also connected to the information interaction device, so that the test tooling 10 and the multiple infrared detectors 20 can all exchange information with the information interaction device, so that the data detected by each infrared detector 20 can be transmitted to the host computer via the information interaction device. Accordingly, the standard temperature parameters and other data of the black body 9 installed in the test system can be pre-stored in the host computer, and then after the host computer receives the temperature data detected by the infrared detector 20, the difference between the detected temperature and the standard temperature is determined, and based on the specific size of the difference, it is determined whether the infrared detector 20 is qualified. Afterwards, the host computer can transmit the determination result to the test fixture 10 through the information interaction device, and based on the received determination result, the multiple groups of indicator devices 11 on the test fixture 10 respectively display the corresponding determination result with the corresponding indication result. In this case, the staff or the disassembly and assembly equipment can accurately know the test results of each of the multiple infrared detectors 20 installed on any test fixture 10. To this end, in the embodiment of the present application, the information interaction device is used to send the test results of each of the multiple infrared detectors 20 installed on the test fixture 10, and the information interaction device is also used to receive the indication results corresponding to the multiple infrared detectors 20 one by one.

[0044] As described above, the indicator device 11 can indicate different test results by changing the specific circumstances of the displayed information. In other embodiments of the present application, each group of indicator devices 11 includes multiple sub-indicators, and the indication information of the multiple sub-indicators is different. In this case, by connecting the multiple sub-indicators of any indicator device 11 to an infrared detector 20 installed on the test fixture 10, different test results of the infrared detector 20 can be indicated separately by the multiple sub-indicators of the indicator device 11. In this case, each sub-indicator can have only one indication method, such as lighting a light or making a sound, so that the design difficulty of each sub-indicator is relatively low, and the indication reliability of the test result can also be improved to a certain extent.

[0045] Of course, in the embodiment of the present application, when the test jig 10 is installed on the installation position, the test jig 10 can be connected to the information interaction device to use the information interaction device to power the test jig 10, so that the multiple groups of indicator devices 11 on the test jig 10 work to indicate the corresponding information. In order to ensure that the indicator device 11 can still maintain a working state for a period of time after the test jig 10 is removed from the installation position, in the embodiment of the present application, the test jig 10 can also be provided with a battery and a register, so that after the test jig 10 is removed from the installation position, the register can still be powered by the battery, and the indicator device 11 can be ensured to maintain the indicating state, so that the infrared detectors 20 with different test results can be classified by the staff or the disassembly equipment. In addition, the test jig 10 can also be provided with devices such as a power switch or a reset switch, and the aforementioned devices are directly or indirectly connected to the indicator device 11, so that after the infrared detectors 20 with different test results are removed from the test jig 10 and the classification is completed, the power switch or the reset switch can be used to reset the corresponding indicator device 11, so that the subsequent use of the test jig 10 can proceed normally.

[0046] As described above, the test system disclosed in the embodiment of the present application may include a test fixture 10. Furthermore, the test fixture 10 may include a frame 101 and a cover 102, and a plurality of infrared detectors 20 may be installed on the frame 101, the cover 102 is provided on the plurality of infrared detectors 20, and the cover 102 and the frame 101 are connected to each other, so that the cover 102 is used to protect the plurality of infrared detectors 20, thereby preventing any infrared detector 20 from being damaged during the test process. Of course, in order to ensure that the test process can still proceed normally, in the embodiment of the present application, an observation window 103 is provided on the cover 102, and the observation window 103 is arranged opposite to the infrared detector 20 installed on the frame 101, so that the infrared detector 20 can measure the parameters of the black body 9 through the observation window 103. Of course, when multiple infrared detectors 20 can be installed on the test tool 10, the size of the observation window 103 can be made relatively large to cover the multiple infrared detectors 20. In another embodiment of the present application, multiple observation windows 103 can be set on the cover body 102, and the multiple observation windows 103 can correspond one-to-one to the multiple infrared detectors 20.

[0047] In addition, based on the embodiments of the present application, when the infrared detector 20 includes a temperature sensing part 21 and a connecting plug-in 22, only the temperature sensing part 21 can be arranged opposite to the observation window 103, and by further arranging other light-transmitting holes 104 on the cover body 102, it is ensured that the code scanning and positioning camera can obtain the first graphic code formed on the connecting plug-in 22 through the light-transmitting hole 104.

[0048] Optionally, the cover 102 is separately provided from the frame 101, and the two can be connected by means of screws and the like. In another embodiment of the present application, in order to improve the assembly efficiency between the infrared detector 20 and the test fixture 10, and thus improve the test efficiency, the cover 102 is optionally rotatably mounted on the frame 101. In this case, when the infrared detector 20 needs to be disassembled, the installation area of ​​the infrared detector 20 or the frame 101 can be exposed by rotating the cover 102, and after the disassembly and assembly of the infrared detector 20 is completed, the cover 102 is controlled to rotate in the opposite direction so that the cover 102 is covered at the installation area of ​​the infrared detector 20 or the frame 101. Of course, in order to ensure that a more reliable fixed relationship can be formed between the cover 102 and the frame 101, the cover 102 and the frame 101 can be fixedly connected by means of magnetic attraction and the like. In another embodiment of the present application, the cover 102 can also be fixedly connected to the frame 101 by means of elastic buckles.

[0049] As for the assembly method between the test jig 10 and the loading platform 3, screws and other connecting parts can also be used to enable the test jig 10 to be stably installed on the installation position of the loading platform 3. In another embodiment of the present application, the installation position can include a notch that runs through the loading platform 3. In this case, the overall shape of the test jig 10 can be designed so that during the assembly process of the test jig 10, a part of the test jig 10 can be inserted into the notch, and the other part of the test jig 10 can be supported on the upper surface of the outer edge of the notch along the rotation axis of the loading platform 3, so that the test jig 10 can form an assembly relationship with the loading platform 3, and the assembly difficulty between the test jig 10 and the loading platform 3 is greatly reduced.

[0050] Of course, in order to ensure that any test jig 10 can form a stable fixed relationship with the loading platform 3, the loading platform 3 is also provided with limit holes corresponding to multiple installation positions, and the test system can also include a limit pin, which can pass through the test jig 10 and be inserted into the limit hole to fix the test jig 10 and the loading platform 3, thereby ensuring that the test jig 10 supported on the loading platform 3 can form a relatively fixed relationship with the loading platform 3 in a direction perpendicular to the rotation axis of the loading platform 3.

[0051] It should be noted that, in this article, the terms "comprise", "include" or any other variant thereof are intended to cover non-exclusive inclusion, so that the process, method, article or device including a series of elements includes not only those elements, but also includes other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise one..." do not exclude the presence of other identical elements in the process, method, article or device including the element. In addition, it should be pointed out that the scope of the methods and devices in the embodiments of the present application is not limited to performing functions in the order shown or discussed, and may also include performing functions in a substantially simultaneous manner or in reverse order according to the functions involved, for example, the described method may be performed in an order different from that described, and various steps may also be added, omitted, or combined. In addition, the features described with reference to certain examples may be combined in other examples.

[0052] The embodiments of the present application are described above in conjunction with the accompanying drawings, but the present application is not limited to the above-mentioned specific implementation methods. The above-mentioned specific implementation methods are merely illustrative and not restrictive. Under the guidance of the present application, ordinary technicians in this field can also make many forms without departing from the purpose of the present application and the scope of protection of the claims, all of which are within the protection of the present application.

Claims

1. A test system for testing an infrared detector, characterized in that: The test system includes a frame, a driving member, a loading platform, an identification binding device and a black body, wherein: The frame is provided with a disassembly and assembly station, an identification and binding station and a test station, the loading platform has a plurality of installation positions, any of which can be used to install a test tool, and the infrared detector can be installed on the test tool, the loading platform is connected to the driving member, and the driving member is used to drive the loading platform to move relative to the frame, so that any of the installation positions can cooperate with the disassembly and assembly station, the identification and binding station and the test station respectively; The identification and binding device is arranged at the identification and binding station, and is used to obtain the serial number of the infrared detector at any installation position matched with it, and to establish a binding relationship between the identification mark of the test tool located at the installation position and the serial number; The black body is arranged at the testing station, and the infrared detector at any installation position cooperating with the testing station can detect the temperature of the black body to obtain the detection result; The test system also includes an information interaction device, the identification binding device, the test tool and the infrared detector are all connected to the information interaction device, the information interaction device is installed outside the disassembly and assembly station, and the information interaction device is used to send the binding relationship and the detection result.

2. The test system according to claim 1, characterized in that: The rack is also provided with a first data interaction station, which is located between the identification and binding station and the testing station. When any of the installation positions cooperates with the first data interaction station, the information interaction device is used to send the binding relationship.

3. The test system according to claim 1, characterized in that: The rack is also provided with a second data interaction station, which is located between the test station and the disassembly and assembly station. When any of the installation positions cooperates with the second data interaction station, the information interaction device is used to send the detection result.

4. The test system according to claim 1, characterized in that: The number of the test stations is three, each of which is arranged between the identification and binding station and the disassembly and assembly station, and each of the test stations is correspondingly equipped with a black body, and the parameters of each black body are different.

5. The test system according to claim 1, characterized in that: The plurality of mounting positions are spaced apart along the circumference of the loading platform, and the disassembly and assembly station, the identification and binding station and the testing station are spaced apart along the circumference of the loading platform on the frame, and the driving member is used to drive the loading platform to rotate.

6. The test system according to claim 5, characterized in that: The information interaction device is installed on a side of the loading platform away from the driving member, and a plurality of the installation positions are arranged around the information interaction device.

7. The test system according to claim 1, characterized in that: A plurality of the infrared detectors can be installed on any of the test jigs, and the identification binding device is used to obtain the serial numbers of each of the plurality of infrared detectors at any mounting position that matches it, as well as the positions of each of the plurality of infrared detectors on the test jig. The binding relationship includes a first relationship between the plurality of the serial numbers and the identification marks of the test jigs, and a second relationship of one-to-one correspondence between the plurality of the serial numbers and the plurality of the positions.

8. The test system according to claim 7, characterized in that: Each of the infrared detectors includes a first graphic code, which has information about the serial number. Each of the test tools includes a second graphic code, which has information about the identification mark. The identification and binding device includes a code scanning and positioning camera, which is used to scan the first graphic code of each of the multiple infrared detectors installed on the test tool, and the second graphic code of the test tool. The code scanning and positioning camera is also used to obtain the positions of the multiple first graphic codes on the test tool to establish the binding relationship.

9. The test system according to claim 8, characterized in that: The testing system includes the testing tool, the infrared detector includes a temperature sensing part and a connecting plug-in connected to each other, the connecting plug-in is provided with the first graphic code, the testing tool is provided with a plurality of card slots and a plurality of blade needle clamps, the temperature sensing parts of the plurality of infrared detectors are respectively installed on the testing tool through the plurality of card slots, the connecting plug-ins of the plurality of infrared detectors are respectively installed on the testing tool through the plurality of blade needle clamps, and the blade needle clamp is electrically connected to the connecting plug-in.

10. The test system according to claim 1, characterized in that: The testing system includes the testing tool, any one of the testing tools can be installed with a plurality of the infrared detectors, and any one of the testing tools is provided with a plurality of groups of indicating devices, the plurality of the infrared detectors installed on the testing tool correspond one-to-one to the plurality of groups of indicating devices, and each of the indicating devices has at least two indicating results, the testing tool is connected to the information interaction device, and the information interaction device is also used to receive the indicating results corresponding one-to-one to the plurality of the infrared detectors.

11. The test system according to claim 10, characterized in that: Each group of the indicating devices includes a plurality of sub-indicators, the indication information of the plurality of sub-indicators is different from each other, and the plurality of sub-indicators of any indicating device are connected to the information interaction device.

12. The test system according to claim 1, characterized in that: The test system includes the test tool, which includes a frame and a cover that are connected to each other. The infrared detector can be installed on the frame, and the cover is covered on the infrared detector. The cover is provided with an observation window, and the observation window is arranged opposite to the infrared detector installed on the frame.

13. The test system according to claim 1, characterized in that: The mounting position includes a notch that penetrates the loading platform, a portion of the test tool can extend into the notch, and another portion of the test tool can be supported on the upper surface of the outer edge of the notch along the rotation axis of the loading platform, and the loading platform is provided with limit holes corresponding to the plurality of mounting positions, and the test system also includes a limit pin that can pass through the test tool and be inserted into the limit hole to fix the test tool on the loading platform.