Multi-station test method and system for AWG chip
Through multi-station testing methods and systems, efficient and flexible testing of AWG chips is achieved, solving the problems of low testing efficiency, high cost and insufficient adaptability in the existing technology, significantly improving the testing efficiency and accuracy, and reducing costs .
Patent Information
- Application Number
- CN202411541912.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-31
- Publication Date
- 2025-01-10
AI Technical Summary
The existing AWG chip testing methods have problems such as low testing efficiency, high cost, insufficient adaptability and untimely data processing, which is difficult to meet the needs of large-scale production testing.
Using multi-station testing methods and systems, the AWG chip parameters to be tested are set through the central control module, and the chip automatic alignment module and high-speed optical switch are used for automatic alignment and scanning test. Multiple stations work in parallel, and the test management control center handles it. Data and output reports.
It significantly improves testing efficiency, reduces costs, enhances testing flexibility and accuracy, reduces equipment idle time, and improves equipment utilization and testing efficiency.
Smart Images
Figure CN119291469A_ABST
Abstract
Description
Technical Field
[0001] The invention belongs to the technical field of optoelectronics, and in particular relates to a multi-station testing method for an AWG chip and a multi-station testing system for an AWG chip. Background Art
[0002] In the field of optoelectronics, AWG (arrayed waveguide grating) chips are widely used in wavelength division multiplexing and demultiplexing of optical signals, especially in optical communications, optical networks and optical monitoring systems. To test the performance of AWG chips, it is usually necessary to measure their wavelength selectivity, insertion loss, channel spacing and other optical parameters. At present, the test methods available in the industry mainly include:
[0003] Single-station test system: Most AWG chip tests rely on a single test device, usually a one-to-one test based on a spectrum analyzer and a light source. This method is simple and direct, but inefficient. Automated test system: Some modern test systems have introduced robotic arms and automated equipment, which can improve test efficiency to a certain extent, but are still limited to a single chip or station.
[0004] Customized test solutions for specific scenarios: Some high-end devices support customized test solutions that can adapt to specific application requirements, but they are usually costly and require professional operation.
[0005] Although the existing test methods meet the test requirements of AWG chips to a certain extent, they still have the following defects:
[0006] Low testing efficiency: When using a single station or a single test solution, testing multiple chips often requires frequent configuration changes, which takes a long time and reduces overall production capacity.
[0007] High cost: Although existing automated testing systems improve flexibility, they are often expensive and require professional maintenance and operation personnel, which increases the company's operating costs.
[0008] Accuracy limitations: Since the test may be affected by equipment errors and human operation, the existing test methods may not guarantee the consistency and accuracy of the results under certain conditions.
[0009] Insufficient adaptability: Existing test systems are often not flexible enough and cannot quickly adapt to the test requirements of AWG chips of different types or specifications, requiring a lot of time and resources to adjust.
[0010] Data processing efficiency: The data processing methods of existing systems may not be efficient enough, resulting in delays in data analysis and result feedback, hindering the real-time and dynamic adjustment capabilities of the test.
[0011] Therefore, further improvements are made to the above problems. Summary of the invention
[0012] The main purpose of the present invention is to provide a multi-station testing method and system for AWG chips, aiming to solve the problems of low efficiency, high cost, insufficient adaptability and untimely data processing in the prior art, and to provide a more efficient and flexible AWG chip testing solution.
[0013] To achieve the above object, the present invention provides a multi-station testing method for an AWG chip, comprising the following steps:
[0014] Step S1: The central control module sets the relevant parameters of the AWG chip to be tested, initializes the system and tests the reference data of each station;
[0015] Step S2: clean the surface of the AWG chip to be tested, and then place it in the chip test area in the chip alignment module;
[0016] Step S3: Each station starts working, and the chip automatic alignment module controls the electric six-dimensional adjustment frame to align the input fiber array, the AWG chip and the output fiber array, and when the station completes the automatic alignment, the station sends an alignment signal to the test management and control center;
[0017] Step S4: the test management and control center receives an alignment signal from a workstation, controls the workstation to access a scanning test light source, starts scanning testing, tests the current AWG chip, and synchronizes the test data to the test management and control center, then accesses the alignment light source, aligns the next AWG chip to be tested, and performs a cyclic test;
[0018] Step S5: The test management and control center processes the test data of each workstation and outputs a test report.
[0019] As a further preferred technical solution of the above technical solution, for step S1, the relevant parameters of the AWG chip to be tested include a tunable light source, a starting wavelength, an ending wavelength, a scanning speed and a scanning step length;
[0020] The polarized light required for scanning test is switched by high-speed polarization controller; the output is scanned from the starting wavelength to the ending wavelength according to the setting by tunable light source, which is a scanning cycle (the time of a scanning cycle is: (ending wavelength-starting wavelength) / scanning step length*scanning speed);
[0021] The optical power value is collected by a high-speed optical power meter. The number of sampling times is the time of a scanning cycle divided by the sampling time. A scanning cycle is: the number of different polarization states output by the high-speed polarization controller multiplied by the time of a scanning cycle of the tunable light source. At the beginning of a scanning cycle, the tunable light source will send a signal A, indicating the start of a scanning cycle.
[0022] As a further preferred technical solution of the above technical solution, for step S1:
[0023] System initialization: Load the relevant parameters of the AWG chip to be tested into the system, switch the high-speed optical switch of each station to state 1, and the electric six-dimensional adjustment frame of the chip automatic alignment module performs self-check. When there is no relevant signal, the tunable light source and high-speed polarization controller are in a non-working state;
[0024] Test the reference data of each station: When the station successfully connects the output end of the high-speed optical switch to the high-speed optical power meter, the station uses the high-speed transmission line to send a signal B to the test management and control center. At this time, the high-speed optical switch of the station switches to state 2, and the high-speed optical power meter is ready to collect data. The tunable light source and the high-speed polarization controller quickly respond to output a scanning test light source with a scanning cycle. The high-speed optical power meter of the station collects the optical power value according to the set parameters;
[0025] When the first station sends an alignment signal B to the test management and control center, the tunable light source and high-speed polarization controller quickly respond to the non-working state and start working;
[0026] In a scanning cycle, if other test stations also output signal B to the test management and control center, the high-speed optical switch of the station is switched to state 2, and the high-speed optical power meter is ready to collect data. When the high-speed optical power meter collects the set number of collections, the high-speed optical power meter ends the collection. At this time, the high-speed optical switch is switched to state 1, and the high-speed optical power meter transmits the collected data to the test management and control center, indicating that the reference data collection of one channel of a high-speed power meter at the station is completed;
[0027] If the output signal B of the workstation is not received within a scanning cycle, the output of the scanning test of this scanning cycle is completed, and the work of the tunable light source and the high-speed polarization controller is terminated.
[0028] As a further preferred technical solution of the above technical solution, for step S4:
[0029] Test the data of each station: When the station successfully completes the alignment of the AWG chip, the station uses the high-speed transmission line to send an alignment signal to the test management and control center. The high-speed optical switch of this station switches to state 2, and the high-speed optical power meter of this station is ready to collect data. At this time, the tunable light source and the high-speed polarization controller quickly respond to output a cycle of scanning test light source, and the high-speed optical power meter collects optical power values according to the number of parameters set by initialization;
[0030] When the first station sends an alignment signal to the test management and control center, the tunable light source and the high-speed polarization controller quickly respond from the non-working state to the starting state, and are ready to output the scanning test light source;
[0031] In a test scanning cycle, if other test stations also output alignment signals to the test management and control center, the high-speed optical switch of the station is switched to state 2, and the high-speed optical power meter of the station is ready to collect data. When the high-speed optical power meter collects the set number of collections, the high-speed optical power meter ends the collection, and the high-speed optical switch is switched to state 1, and the high-speed optical power meter transmits the collected data to the test management and control center, indicating that the scanning test of the AWG chip at this station is completed;
[0032] If no output alignment signal is received from the workstation during a scanning cycle, the output of the scanning test of this cycle is completed, and the work of the tunable light source and the high-speed polarization controller is terminated.
[0033] As a further preferred technical solution of the above technical solution, for step S5, the output test report includes relevant optical parameters (such as insertion loss and PDL, etc.) of each AWG chip, and determines whether the AWG chip is qualified according to relevant standards.
[0034] To achieve the above object, the present invention also provides a multi-station test system for AWG chips, including multiple test stations and a test management control center, wherein:
[0035] The multi-test station includes an alignment light source, a high-speed optical switch, a chip automatic alignment module, and a high-speed optical power meter, among which:
[0036] The alignment light source is used to provide input light for automatic chip alignment for the workstation;
[0037] High-speed optical switch is used to quickly switch the scanning test light source and the alignment light source;
[0038] The chip automatic alignment module is used to automatically align the optical fiber array and the AWG chip;
[0039] High-speed optical power meter is used to collect test-related data;
[0040] The test management and control center includes a tunable light source, a high-speed polarization controller, a 1×N optical splitter and a central control module, among which:
[0041] The tunable light source is used to generate the required scanning test light source;
[0042] The high-speed polarization controller is used to convert the light output by the tunable light source into light of a required polarization state;
[0043] The 1×N optical splitter is used to distribute the scanning test light source generated by the tunable light source and the high-speed polarization controller to each test station;
[0044] The central control module is used to implement relevant control and regulation and related test data processing.
[0045] The beneficial effects of the present invention are:
[0046] Solve the test efficiency problem:
[0047] In traditional AWG chip testing, a single test station is often used to test the chips one by one. This method is not only time-consuming, but also inefficient and difficult to meet the needs of large-scale production testing. By adopting a multi-station test method, multiple AWG chips can be tested at the same time, thereby significantly improving the test efficiency. In addition, this multi-station test can also save waiting time during the test process and improve the utilization rate of the equipment.
[0048] Reduce testing costs: Through the multi-station testing system, the reuse of manpower and equipment can be reduced, thereby reducing the overall testing costs. BRIEF DESCRIPTION OF THE DRAWINGS
[0049] Figure 1 It is a schematic diagram of the process of the present invention.
[0050] Figure 2 It is a structural schematic diagram of the present invention. DETAILED DESCRIPTION
[0051] The following description is used to disclose the present invention so that those skilled in the art can implement the present invention. The preferred embodiments described below are only examples, and those skilled in the art can think of other obvious variations. The basic principles of the present invention defined in the following description can be applied to other embodiments, variations, improvements, equivalents, and other technical solutions that do not deviate from the spirit and scope of the present invention.
[0052] In the preferred embodiment of the present invention, those skilled in the art should note that the AWG chip and the like involved in the present invention may be regarded as prior art.
[0053] Preferred embodiments.
[0054] like Figure 1-2 As shown, the present invention discloses a multi-station testing method for an AWG chip, comprising the following steps:
[0055] Step S1: The central control module sets the relevant parameters of the AWG chip to be tested, initializes the system and tests the reference data of each station;
[0056] Step S2: clean the surface of the AWG chip to be tested, and then place it in the chip test area in the chip alignment module;
[0057] Step S3: Each station starts working, and the chip automatic alignment module controls the electric six-dimensional adjustment frame to align the input fiber array, the AWG chip and the output fiber array, and when the station completes the automatic alignment, the station sends an alignment signal to the test management and control center;
[0058] Step S4: the test management and control center receives an alignment signal from a workstation, controls the workstation to access a scanning test light source, starts scanning testing, tests the current AWG chip, and synchronizes the test data to the test management and control center, then accesses the alignment light source, aligns the next AWG chip to be tested, and performs a cyclic test;
[0059] Step S5: The test management and control center processes the test data of each workstation and outputs a test report.
[0060] Specifically, for step S1, the relevant parameters of the AWG chip to be tested include a tunable light source, a starting wavelength, an ending wavelength, a scanning speed, and a scanning step length;
[0061] The polarized light required for scanning test is switched by high-speed polarization controller; the output is scanned from the starting wavelength to the ending wavelength according to the setting by tunable light source, which is a scanning cycle (the time of a scanning cycle is: (ending wavelength-starting wavelength) / scanning step length*scanning speed);
[0062] The optical power value is collected by a high-speed optical power meter. The number of sampling times is the time of a scanning cycle divided by the sampling time. A scanning cycle is: the number of different polarization states output by the high-speed polarization controller multiplied by the time of a scanning cycle of the tunable light source. At the beginning of a scanning cycle, the tunable light source will send a signal A, indicating the beginning of a scanning cycle, where:
[0063] Through the high-speed optical switch, the optical signal can be flexibly switched to different output ports according to actual needs and control signals. The specific operation is as follows: State 1: After receiving a specific control signal, the high-speed optical switch will connect port A with port C. At this time, the alignment light source will be connected to the input end of the workstation. State 2: When another set of control signals is received, the high-speed optical switch will switch the optical path and connect port B with port C, so that the scanning test light can establish an optical path connection with the input end of the workstation.
[0064] More specifically, for step S1:
[0065] System initialization: Load the relevant parameters of the AWG chip to be tested into the system, switch the high-speed optical switch of each station to state 1, and the electric six-dimensional adjustment frame of the chip automatic alignment module performs self-check. When there is no relevant signal, the tunable light source and high-speed polarization controller are in a non-working state;
[0066] Test the reference data of each station: When the station successfully connects the output end of the high-speed optical switch to the high-speed optical power meter, the station uses the high-speed transmission line to send a signal B to the test management and control center. At this time, the high-speed optical switch of the station switches to state 2, and the high-speed optical power meter is ready to collect data. The tunable light source and the high-speed polarization controller quickly respond to output a scanning test light source with a scanning cycle. The high-speed optical power meter of the station collects the optical power value according to the set parameters;
[0067] When the first station sends an alignment signal B to the test management and control center, the tunable light source and high-speed polarization controller quickly respond to the non-working state and start working;
[0068] In a scanning cycle, if other test stations also output signal B to the test management and control center, the high-speed optical switch of the station is switched to state 2, and the high-speed optical power meter is ready to collect data. When the high-speed optical power meter collects the set number of collections, the high-speed optical power meter ends the collection. At this time, the high-speed optical switch is switched to state 1, and the high-speed optical power meter transmits the collected data to the test management and control center, indicating that the reference data collection of one channel of a high-speed power meter at the station is completed;
[0069] If the output signal B of the workstation is not received within a scanning cycle, the output of the scanning test of this scanning cycle is completed, and the work of the tunable light source and the high-speed polarization controller is terminated.
[0070] Furthermore, for step S4:
[0071] Test the data of each station: When the station successfully completes the alignment of the AWG chip, the station uses the high-speed transmission line to send an alignment signal to the test management and control center. The high-speed optical switch of this station switches to state 2, and the high-speed optical power meter of this station is ready to collect data. At this time, the tunable light source and the high-speed polarization controller quickly respond to output a cycle of scanning test light source, and the high-speed optical power meter collects optical power values according to the number of parameters set by initialization;
[0072] When the first station sends an alignment signal to the test management and control center, the tunable light source and the high-speed polarization controller quickly respond from the non-working state to the starting state, and are ready to output the scanning test light source;
[0073] In a test scanning cycle, if other test stations also output alignment signals to the test management and control center, the high-speed optical switch of the station is switched to state 2, and the high-speed optical power meter of the station is ready to collect data. When the high-speed optical power meter collects the set number of collections, the high-speed optical power meter ends the collection, and the high-speed optical switch is switched to state 1, and the high-speed optical power meter transmits the collected data to the test management and control center, indicating that the scanning test of the AWG chip at this station is completed;
[0074] If no output alignment signal is received from the workstation during a scanning cycle, the output of the scanning test of this cycle is completed, and the work of the tunable light source and the high-speed polarization controller is terminated.
[0075] Furthermore, for step S5, the output test report includes relevant optical parameters (such as insertion loss and PDL, etc.) of each AWG chip, and determines whether the AWG chip is qualified according to relevant standards.
[0076] The present invention also discloses a multi-station test system for an AWG chip, comprising multiple test stations and a test management control center, wherein:
[0077] The multi-test station includes an alignment light source, a high-speed optical switch, a chip automatic alignment module, and a high-speed optical power meter, among which:
[0078] The alignment light source is used to provide input light for automatic chip alignment for the workstation;
[0079] High-speed optical switches are used to quickly switch between scanning test light sources and alignment light sources to provide input light for workstations;
[0080] The chip automatic alignment module is used to automatically align the optical fiber array and the AWG chip;
[0081] High-speed optical power meter is used to collect test-related data;
[0082] The test management and control center includes a tunable light source, a high-speed polarization controller, a 1×N optical splitter and a central control module, among which:
[0083] The tunable light source is used to generate the required scanning test light source;
[0084] The high-speed polarization controller is used to convert the light output by the tunable light source into light of a required polarization state;
[0085] The 1×N optical splitter is used to distribute the scanning test light source generated by the tunable light source and the high-speed polarization controller to each test station;
[0086] The central control module is used to implement relevant control and regulation and related test data processing.
[0087] Compared with the existing technology, it has the following significant advantages:
[0088] Significantly improve testing efficiency:
[0089] This patent adopts a multi-station parallel testing method to test multiple AWG chips at the same time, thereby significantly shortening the test cycle and improving test efficiency. Compared with the traditional single-station or a few-station testing method, this patent can greatly reduce the time and labor cost required for testing.
[0090] Enhanced testing flexibility:
[0091] The test method and system of this patent support flexible configuration according to the test requirements of different AWG chips, such as adjusting the test wavelength range, test power, etc. This flexibility enables this patent to be widely used in different types of AWG chip testing to meet the customized needs of different customers.
[0092] Reduce costs:
[0093] Since this patent improves test efficiency and accuracy, reduces the time and labor costs required for testing, it helps to reduce the overall test cost. In addition, this patent also supports multiple test stations working in parallel, reducing equipment idle time, and further improving equipment utilization and test efficiency. In addition, the design of multiple stations sharing a test management and control center abandons the traditional practice of equipping each station with a tunable light source and a high-speed polarization controller, thereby achieving significant cost savings.
[0094] Simplify processing and installation:
[0095] With its own modular design, the installation and maintenance of the test system becomes easier, which can reduce the construction time and installation cost, and reduce the dependence on professional technicians.
[0096] It is worth mentioning that the technical features such as the AWG chip involved in the patent application of this invention should be regarded as the prior art. The specific structure, working principle and possible control method and spatial layout method of these technical features can be selected by conventional methods in the field and should not be regarded as the inventive point of the patent of this invention. The patent of this invention will not be further elaborated.
[0097] For those skilled in the art, it is still possible to modify the technical solutions described in the aforementioned embodiments, or to make equivalent substitutions for some of the technical features therein. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.
Claims
1. A multi-station testing method for AWG chips, characterized in that: The following steps are involved: Step S1: The central control module sets the relevant parameters of the AWG chip to be tested, initializes the system and tests the reference data of each station; Step S2: clean the surface of the AWG chip to be tested, and then place it in the chip test area in the chip alignment module; Step S3: Each station starts working, and the chip automatic alignment module controls the electric six-dimensional adjustment frame to align the input fiber array, the AWG chip and the output fiber array, and when the station completes the automatic alignment, the station sends an alignment signal to the test management and control center; Step S4: the test management and control center receives an alignment signal from a workstation, controls the workstation to access a scanning test light source, starts scanning testing, tests the current AWG chip, and synchronizes the test data to the test management and control center, then accesses the alignment light source, aligns the next AWG chip to be tested, and performs a cyclic test; Step S5: The test management and control center processes the test data of each workstation and outputs a test report.
2. A multi-station testing method for an AWG chip according to claim 1, characterized in that: For step S1, the relevant parameters of the AWG chip to be tested include a tunable light source, a starting wavelength, an ending wavelength, a scanning speed, and a scanning step length; The high-speed polarization controller is used to switch the polarized light required for scanning test; the tunable light source is used to output a scan from the starting wavelength to the ending wavelength according to the settings, which is a scanning cycle; The optical power value is collected by a high-speed optical power meter. The number of sampling times is the time of a scanning cycle divided by the sampling time. A scanning cycle is: the number of different polarization states output by the high-speed polarization controller multiplied by the time of a scanning cycle of the tunable light source. At the beginning of a scanning cycle, the tunable light source will send a signal A, indicating the start of a scanning cycle.
3. A multi-station testing method for an AWG chip according to claim 2, characterized in that: For step S1: System initialization: Load the relevant parameters of the AWG chip to be tested into the system, switch the high-speed optical switch of each station to state 1, and the electric six-dimensional adjustment frame of the chip automatic alignment module performs self-check. When there is no relevant signal, the tunable light source and high-speed polarization controller are in a non-working state; Test the reference data of each station: When the station successfully connects the output end of the high-speed optical switch to the high-speed optical power meter, the station uses the high-speed transmission line to send a signal B to the test management and control center. At this time, the high-speed optical switch of the station switches to state 2, and the high-speed optical power meter is ready to collect data. The tunable light source and the high-speed polarization controller quickly respond to output a scanning test light source with a scanning cycle. The high-speed optical power meter of the station collects the optical power value according to the set parameters; When the first station sends an alignment signal B to the test management and control center, the tunable light source and high-speed polarization controller quickly respond to the non-working state and start working; In a scanning cycle, if other test stations also output signal B to the test management and control center, the high-speed optical switch of the station is switched to state 2, and the high-speed optical power meter is ready to collect data. When the high-speed optical power meter collects the set number of collections, the high-speed optical power meter ends the collection. At this time, the high-speed optical switch is switched to state 1, and the high-speed optical power meter transmits the collected data to the test management and control center, indicating that the reference data collection of one channel of a high-speed power meter at the station is completed; If the output signal B of the workstation is not received within a scanning cycle, the output of the scanning test of this scanning cycle is completed, and the work of the tunable light source and the high-speed polarization controller is terminated.
4. A multi-station testing method for an AWG chip according to claim 3, characterized in that: For step S4: Test the data of each station: When the station successfully completes the alignment of the AWG chip, the station uses the high-speed transmission line to send an alignment signal to the test management and control center. The high-speed optical switch of this station switches to state 2, and the high-speed optical power meter of this station is ready to collect data. At this time, the tunable light source and the high-speed polarization controller quickly respond to output a cycle of scanning test light source, and the high-speed optical power meter collects optical power values according to the number of parameters set by initialization; When the first station sends an alignment signal to the test management and control center, the tunable light source and the high-speed polarization controller quickly respond from the non-working state to the starting state, and are ready to output the scanning test light source; In a test scanning cycle, if other test stations also output alignment signals to the test management and control center, the high-speed optical switch of the station is switched to state 2, and the high-speed optical power meter of the station is ready to collect data. When the high-speed optical power meter collects the set number of collections, the high-speed optical power meter ends the collection, and the high-speed optical switch is switched to state 1, and the high-speed optical power meter transmits the collected data to the test management and control center, indicating that the scanning test of the AWG chip at this station is completed; If no output alignment signal is received from the workstation during a scanning cycle, the output of the scanning test of this cycle is completed, and the work of the tunable light source and the high-speed polarization controller is terminated.
5. A multi-station testing method for an AWG chip according to claim 4, characterized in that: For step S5, the output test report includes relevant optical parameters of each AWG chip, and determines whether the AWG chip is qualified according to relevant standards.
6. A multi-station test system for AWG chips, characterized in that: It includes multiple test stations and a test management and control center, including: The multi-test station includes an alignment light source, a high-speed optical switch, a chip automatic alignment module, and a high-speed optical power meter, among which: The alignment light source is used to provide input light for automatic chip alignment for the workstation; High-speed optical switches are used to quickly switch between scanning test light sources and alignment light sources to provide input light for workstations; The chip automatic alignment module is used to automatically align the optical fiber array and the AWG chip; High-speed optical power meter is used to collect test-related data; The test management and control center includes a tunable light source, a high-speed polarization controller, a 1×N optical splitter and a central control module, among which: The tunable light source is used to generate the required scanning test light source; The high-speed polarization controller is used to convert the light output by the tunable light source into light of a required polarization state; The 1×N optical splitter is used to distribute the scanning test light source generated by the tunable light source and the high-speed polarization controller to each test station; The central control module is used to implement relevant control and regulation and related test data processing.
Citation Information
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