Chip test probe socket with probe protection function and use method

Abstract

The present invention relates to the field of probe socket technology, and in particular to a probe socket for chip testing with a probe protection function and a method of using the same, comprising a device body and an upper end cover arranged above the device body, and also comprising a protection plate and a lower follower plate. The device body is provided with a fixing mechanism for fixing a chip on the device body at one end close to the upper end cover, and the device body is provided with a guiding mechanism for guiding the probe. The lower follower plate is located below the device body. When in use, a protection plate is provided at one end of the lower follower plate close to the probe connection end, so that the protection plate can effectively protect the connection section of the probe when it is not inserted into an external device, and does not affect the connection of the probe connection end during detection, thereby ensuring that the probe is stable and reliable during the detection process, and avoiding the problem that the lower probe of the conventional chip testing probe socket is exposed to the outside, and the probe is easily twisted and deformed during the detection process, resulting in errors or failures in chip detection.

Description

Technical Field

[0001] The present invention relates to the technical field of probe sockets, and in particular to a probe socket for chip testing with a probe protection function and a use method thereof. Background Art

[0002] If the chip fault is not discovered during chip testing, the cost of discovering the fault at the circuit board (PCB) level is ten times that of the chip level. Therefore, the higher the level and the smaller the process, the higher the requirement for the yield rate during the detection process, so the test probe plays a very important role.

[0003] However, the lower probes of the conventional chip test probe socket are exposed, and the probes are prone to twisting and deformation during operation, and even damage to the probe card, which can lead to errors or failures in chip detection. In addition, the lever arm used to control the lifting of the upper end cover in the conventional probe test socket is a fragile device and cannot be replaced. The above problems can easily lead to problems such as low yield and high detection costs during probe detection. Therefore, the development of a new probe test socket is imminent. Summary of the invention

[0004] The technical problem to be solved by the present invention is: in order to solve the problem that the lower probe of the traditional chip testing probe socket is exposed, the probe is easily twisted and deformed during the detection process, resulting in errors or failures in chip detection, a chip testing probe socket with probe protection function and a method of use are provided.

[0005] The technical solution adopted by the present invention to solve its technical problems is: a probe socket for chip testing with a probe protection function, comprising a device body and an upper end cover arranged above the device body, and also comprising a protection plate and a lower follower plate, wherein one end of the device body close to the upper end cover is provided with a fixing mechanism for fixing the chip on the device body, the device body is provided with a guiding mechanism for guiding the probe, the lower follower plate is located below the device body, a probe for detecting the chip is fixedly connected to the lower follower plate, the detection end of the probe is arranged on the guiding mechanism and arranged opposite to the chip, the connection end of the probe protrudes from the end surface of the lower follower plate away from the guiding mechanism, the lower follower plate is fixed on the upper end cover, the lower follower plate is located between the protection plate and the device body, a through hole is arranged on the protection plate, the through hole is arranged corresponding to the probe, a linkage mechanism is arranged between the protection plate and the upper end cover, and a first reset mechanism is arranged between the device body and the protection plate;

[0006] The linkage mechanism comprises a slide groove provided on the device body, a protrusion matching therewith is arranged in the slide groove, the protrusion is transmission-connected with the upper end cover, the protection plate is slidably arranged on the device body, a through groove matching the protrusion is arranged on the protection plate, the slide groove has a limiting section, a guide section and a reset section connected in sequence, the limiting section and the reset section are straight line sections staggered with each other, the guide section is an inclined surface arranged obliquely, the through groove and the limiting section are staggered with each other, and the through groove and the reset section are arranged correspondingly;

[0007] When the upper end cover is displaced toward the device body by force, the upper end cover drives the lower follower plate to displace synchronously, the probe displaces on the guide mechanism and clamps the pins of the chip on the fixing mechanism, when the protrusion displaces in the limit section, the protrusion contacts the protection plate and drives the protection plate to displace synchronously, when the protrusion passes through the guide section and enters the reset section, the protrusion corresponds to the through groove, the protection plate slides on the device body under the action of the first reset mechanism and returns to the initial position, and the connection end of the probe is connected to the external device. Compared with the prior art, this solution sets a protection plate at one end of the lower follower plate close to the probe connection end, and the protection plate and the upper end cover are connected by a linkage mechanism, so that the protection plate can effectively protect the connection section of the probe when it is not inserted into the external device, and does not affect the connection of the probe connection end during detection, thereby ensuring that the probe is stable and reliable during the detection process.

[0008] In order to realize the sliding of the protection plate on the device body, some embodiments are preferably provided with a track column at one end of the device body, and a track hole matching the track column is provided on the protection plate, the track column is provided in the track hole, the through groove is provided on the inner peripheral wall of the track hole, and the slide groove is provided on the track column. The track hole of the protection plate cooperates with the track column of the device body, and the track column is provided along the displacement direction of the upper end cover, so that the protection plate can slide on the device body, and the structure is simple, and it is easy to manufacture and install.

[0009] In order to realize the transmission connection between the upper end cover and the protrusion, some preferred embodiments are that a slide column is rotatably arranged on the upper end cover, the device body is provided with a slideway matching the slide column, the slideway extends from the device body to the track column, the slideway is connected to the slide groove, the slide column is slidably arranged in the slideway, and the protrusion is fixedly installed on the slide column. The protrusion is fixedly connected to the upper end cover through the slide column, the slide column slides in the slideway, and the upper end cover directly drives the protrusion to move synchronously, so as to realize the transmission connection between the upper end cover and the protrusion.

[0010] In order to realize the first reset mechanism, some embodiments are preferred, wherein the first reset mechanism includes a reset spring, a moving block is provided on the protection plate, a moving groove is provided on the device body, the moving block is provided in the moving groove, and the reset spring is provided between the moving block and the moving groove. The moving block of the protection plate cooperates with the moving groove of the device body to realize that the protection plate is restricted on the device body, and cooperates with the reset spring between the moving block and the moving groove to realize automatic reset of the protection plate.

[0011] In order to realize automatic resetting of the upper end cover, in some preferred embodiments, a second resetting mechanism is provided between the upper end cover and the device body. By providing the second resetting mechanism between the device body and the upper end cover, when the force acting on the upper end cover disappears, the second resetting mechanism can drive the upper end cover to move relative to the device body and reset to the initial position.

[0012] In order to realize the second reset mechanism, some embodiments are preferred, wherein the second reset mechanism comprises a crossbar, a left force arm and a right force arm, wherein the left force arm and the right force arm are mutually arranged on the crossbar, and the left force arm, the right force arm and the crossbar are mutually connected through a coil spring. Through the left force arm and the right force arm crossing on the crossbar, the left force arm and the right force arm are both connected to the crossbar through a coil spring.

[0013] In some preferred embodiments, a placement slot matching the second reset mechanism is provided on the device body, and one end of the second reset mechanism close to the cross bar is arranged in the placement slot, and one end of the left force arm and the right force arm both protrude from the placement slot and abut against the upper end cover.

[0014] In order to facilitate later maintenance, some preferred embodiments further include a pin shaft, a pin hole is provided on the device body, the pin hole passes through the outer peripheral wall of the device body to the inner peripheral wall of the placement groove, the pin hole corresponds to the center hole of the coil spring, one end of the pin shaft passes through the pin hole and is arranged in the center hole of the coil spring. By passing the pin shaft through the pin hole and being arranged in the center hole of the coil spring, the second reset mechanism is detachably mounted on the device body.

[0015] In some preferred embodiments, the guide mechanism includes a fixed plate, an intermediate plate and an upper slave plate, which are fixed on the device body in sequence from the lower slave plate to the upper end cover, and the fixed plate, the intermediate plate and the upper slave plate are all provided with holes matching the probes, and the detection ends of the probes pass through the holes on the fixed plate, the intermediate plate and the upper slave plate respectively.

[0016] A method for using the chip test probe socket with a probe protection function as described above,

[0017] S1. Fix the chip on the device body through a fixing mechanism;

[0018] S2. Apply downward pressure to the upper end cover, the upper end cover moves downward, and synchronously drives the lower slave plate to move, the probe on the lower slave plate moves downward on the guide mechanism, the probe is tightened by the pressure to clamp the pin of the detection chip, and at the same time, the protrusion moves in the slide groove, driving the protection plate to move downward synchronously with the probe;

[0019] S3. When the upper end cover is pressed downward to the limit, the protrusion passes through the limit section and the guide section to enter the reset section. The protrusion corresponds to the through groove. At this time, the protection plate loses the downward pressure of the protrusion. Under the action of the first reset mechanism, the protection plate moves upward to the initial position, so that the connection end of the probe is inserted into the external device to realize the detection of the chip;

[0020] S4, canceling the downward pressure applied to the upper end cover, and the upper end cover moves up to the initial position under the action of the second reset mechanism, and the probe releases the pin of the chip;

[0021] S5. Take out the detected chip on the device body.

[0022] The beneficial effects of the present invention are as follows: when in use, a chip testing probe socket with a probe protection function and a method of use of the present invention arrange a protection plate at one end of the lower slave plate close to the probe connection end, and the protection plate and the upper end cover are connected by a linkage mechanism, so that the protection plate can effectively protect the connection section of the probe when it is not inserted into an external device, and at the same time does not affect the connection of the probe connection end during detection, thereby ensuring that the probe is stable and reliable during the detection process, and avoiding the problem that the lower probe of the traditional chip testing probe socket is exposed to the outside, and the probe is easily twisted and deformed during the detection process, resulting in errors or failures in chip detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] The present invention is further described below in conjunction with the accompanying drawings and embodiments.

[0024] Figure 1 It is a schematic diagram of the three-dimensional structure of the present invention;

[0025] Figure 2 It is a front view of the present invention;

[0026] Figure 3 It is a left side view of the present invention;

[0027] Figure 4 is a top view of the present invention;

[0028] Figure 5 is a bottom view of the present invention;

[0029] Figure 6 yes Figure 2 Middle AA section view;

[0030] Figure 7 yes Figure 2Middle BB section view;

[0031] Figure 8 yes Figure 6 A partial enlarged view of middle C;

[0032] Fig. 9 The schematic diagram of the installation structure between the upper end cover, the lower follower plate and the track column in the present invention is Figure 1 ;

[0033] Fig.10 yes Fig. 9 A partial enlarged view of D in the middle;

[0034] Fig.11 The schematic diagram of the installation structure between the upper end cover, the lower follower plate and the track column in the present invention is Figure 2 ;

[0035] Fig.12 The schematic diagram of the installation structure between the upper end cover, the lower follower plate and the track column in the present invention is Figure 3 ;

[0036] Fig.13 It is a structural schematic diagram of the protection plate in the present invention;

[0037] Fig.14 It is a process control diagram of the present invention.

[0038] In the figure: 1. device body, 2. upper end cover, 3. protection plate, 301. through hole, 4. lower slave plate, 5. fixing mechanism, 6. guide mechanism, 7. probe, 8. slide groove, 9. protrusion, 10. through groove, 11. limit section, 12. guide section, 13. reset section, 14. track column, 15. track hole, 16. slide column, 17. slideway, 19. movable groove, 20. movable block, 22. left force arm, 23. right force arm, 24. coil spring, 26. pin shaft, 27. pin hole, 28. fixing plate, 29. middle plate, 30. upper slave plate, 31. gap. DETAILED DESCRIPTION

[0039] The present invention is further described in detail below in conjunction with embodiments:

[0040] The present invention is not limited to the following specific embodiments. A person skilled in the art can implement the present invention in various other specific embodiments according to the contents disclosed in the present invention, or any simple changes or modifications made to the design structure and ideas of the present invention fall within the protection scope of the present invention. It should be noted that the embodiments and features in the embodiments of the present invention can be combined with each other without conflict.

[0041] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "first", "second", and the like are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, features defined as "first", "second", and the like may explicitly or implicitly include one or more of the features. In the description of the present invention, unless otherwise specified, "multiple" means two or more.

[0042] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood by specific circumstances.

[0043] Embodiment 1, as Figure 1-13As shown, a chip test probe socket with a probe protection function comprises a device body 1, an upper end cover 2, a protection plate 3 and a lower slave plate 4, wherein the upper end cover 2 is arranged above the device body 1, and a fixing mechanism 5 is arranged at one end of the device body 1 close to the upper end cover 2, and the fixing mechanism 5 is used to fix the chip on the device body 1. In this embodiment, the fixing mechanism 5 is a fixing clip, which is hingedly mounted on the device body 1 through a rotating shaft, and can clamp and fix the chip on the device body 1 through a coil spring. A guiding mechanism 6 is arranged on the device body 1, and the guiding mechanism 6 is used to guide the probe 7. The lower slave plate 4 is located below the device body 1, and a probe 7 for detecting the chip is fixedly connected to the lower slave plate 4. In the embodiment, the probe 7 is a Y-shaped structure, the bifurcated structure at the upper end of the probe 7 is the detection end, and the lower end of the probe 7 is the connection end. The detection end of the probe 7 is arranged on the guide mechanism 6 and is arranged opposite to the chip. The guide mechanism 6 guides the probe 7 and controls the detection end of the bifurcated structure at the upper end of the probe 7 to move closer or apart, so as to clamp or loosen the pins on the chip. The connection end of the probe 7 protrudes from the end surface of the lower slave plate 4 away from the guide mechanism 6. The lower slave plate 4 is fixed on the upper end cover 2. The lower slave plate 4 and the upper end cover 2 achieve synchronous displacement. The lower slave plate 4 is located between the protection plate 3 and the device body 1. A linkage mechanism is arranged between the protection plate 3 and the upper end cover 2. A first reset mechanism is arranged between the device body 1 and the protection plate 3.

[0044] The linkage mechanism includes a slide groove 8 provided on the device body 1, a protrusion 9 matching therewith is arranged in the slide groove 8, the protrusion 9 is transmission-connected with the upper end cover 2 and used to realize synchronous displacement of the protrusion 9 and the upper end cover 2, the protection plate 3 is slidingly arranged on the device body 1, a through groove 10 is arranged on the protection plate 3, the through groove 10 matches the protrusion 9, the slide groove 8 has a limiting section 11, a guide section 12 and a reset section 13 connected in sequence, the limiting section 11 and the reset section 13 are straight line sections staggered from each other, the guide section 12 is an inclined surface arranged obliquely, the through groove 10 and the limiting section 11 are staggered from each other to ensure that the protrusion 9 contacts the protection plate 3 when moving downward and drives the protection plate 3 to move, the through groove 10 and the reset section 13 are arranged correspondingly to enable the protrusion 9 to pass through the through groove 10, realize the force of the protection plate 3 to separate from the protrusion 9, and the protection plate 3 is reset under the action of the first reset mechanism;

[0045] When the upper end cover 2 is forced to move toward the device body 1, the upper end cover 2 drives the lower slave plate 4 to move synchronously, the probe 7 moves on the guide mechanism 6 and clamps the pins of the chip on the fixing mechanism 5, and when the protrusion 9 moves in the limiting section 11, the protrusion 9 contacts the protection plate 3 and drives the protection plate 3 to move synchronously. When the protrusion 9 enters the reset section 13 through the guide section 12, the protrusion 9 corresponds to the through groove 10, and the protrusion 9 will not apply force to the protection plate 3. The protection plate 3 slides on the device body 1 under the action of the first reset mechanism and returns to its initial position, and the connection end of the probe 7 is connected to the external device.

[0046] A track column 14 is provided at one end of the device body 1, and a track hole 15 is provided on the protection plate 3. The track hole 15 matches the track column 14, the track column 14 is arranged in the track hole 15, the through groove 10 is arranged on the inner peripheral wall of the track hole 15, and the slide groove 8 is arranged on the track column 14.

[0047] A slide post 16 is rotatable on the upper end cover 2. In this embodiment, the slide post 16 is axially restricted on the upper end cover 2, and the slide post 16 can rotate on the upper end cover 2 along the circumferential direction. The device body 1 is provided with a slideway 17, and the slideway 17 matches the slide post 16. The slideway 17 extends from the device body 1 to the track column 14, and the slideway 17 is connected to the slide groove 8. There is also a slide groove 8 that extends inward from the outer peripheral surface of the track column 14 to the inner peripheral wall of the slideway 17. The slide post 16 is slidably set in the slideway 17, and the protrusion 9 is fixedly installed on the slide post 16, which can also limit the displacement range of the upper end cover 2.

[0048] The first reset mechanism includes a reset spring. A moving block 20 is provided on the protection plate 3 . A moving groove 19 is provided on the device body 1 . The moving block 20 is provided in the moving groove 19 . The spring is provided between the moving block 20 and the moving groove 19 .

[0049] A second reset mechanism is arranged between the upper end cover 2 and the device body 1, and the second reset mechanism includes a cross bar, a left force arm 22, a right force arm 23 and a pin 26. The left force arm 22 and the right force arm 23 are arranged crosswise on the cross bar, and the left force arm 22, the right force arm 23 and the cross bar are connected to each other through a coil spring 24, so that the left force arm 22 and the right force arm 23 have a certain elastic deformation ability on the cross bar. A placement groove is arranged on the device body 1, and the placement groove matches the second reset mechanism. One end of the second reset mechanism close to the cross bar is arranged in the placement groove, and one end of the left force arm 22 and the right force arm 23 both protrude from the placement groove and are against the upper end cover 2. A pin hole 27 is arranged on the device body 1, and the pin hole 27 passes through the outer peripheral wall of the device body 1 to the inner peripheral wall of the placement groove. The pin hole 27 corresponds to the center hole of the coil spring 24, and one end of the pin 26 passes through the pin hole 27 and is arranged in the center hole of the coil spring 24.

[0050] The guide mechanism 6 includes a fixed plate 28, an intermediate plate 29 and an upper follower plate 30, which are fixed on the device body 1 in sequence from the lower follower plate 4 to the upper end cover 2. The fixed plate 28, the intermediate plate 29 and the upper follower plate 30 are all provided with holes 31 matching the probe 7, and the holes 31 form a mesh structure. A fork on one side of the detection upper end is arranged in each mesh. The detection end of the probe 7 passes through the holes 31 on the fixed plate 28, the intermediate plate 29 and the upper follower plate 30 respectively. The holes 31 on the fixed plate 28, the intermediate plate 29 and the upper follower plate 30 are arranged at an angle to facilitate the detection end of the probe 7 to move closer or apart. After the chip is detected, the position of the protection plate 3 can be adjusted manually and the protrusion 9 is adjusted to the top of the protection plate 3, that is, the protrusion 9 is misaligned with the through groove 10.

[0051] Example 2: Example 2 is the test method of Example 1, specifically: Fig.14 As shown, a method for using the chip test probe socket with a probe protection function as described above,

[0052] S1. Hold the chip on both sides and place it in the groove of the upper end cover 2, and fix it on the device body 1 through the fixing clip of the fixing mechanism 5, so that each pin of the chip to be tested is accurately inserted into the fork of the upper half of the probe 7;

[0053] S2. Apply downward pressure to the upper end cover 2. The X-shaped lifting structure composed of the left force arm 22 and the right force arm 23 is under pressure. The upper end cover 2 moves downward and drives the lower follower plate 4 to move synchronously. The probe 7 on the lower follower plate 4 moves downward on the guide mechanism 6. Therefore, the part of the probe 7 located above the guide mechanism 6 moves downward so that the upper half of the probe 7 is tightened and clamps the pin of the detection chip when it is displaced in the hole 31, thereby preparing for chip detection. At the same time, during the downward pressing process of the upper end cover 2, the protrusion 9 in the track column 14 is driven by the slider column in the upper end cover 2 to move downward. When the protrusion 9 moves in the limiting section 11 of the slide groove 8, the protection plate 3 moves downward synchronously with the probe 7.

[0054] S3. When the upper end cover 2 is pressed downward to the limit, the protrusion 9 enters the reset section 13 from the limit section 11 through the guide section 12, and the protrusion 9 corresponds to the through groove 10. At this time, the protection plate 3 loses the downward pressure of the protrusion 9, and the protection plate 3 moves upward to the initial position under the action of the first reset mechanism, that is, the spring between the moving groove 19 and the moving block 20 drives the protection plate 3 to move upward to the initial position, so that the connection end of the probe 7 passes through the through hole 301 on the protection plate 3 and is inserted into the external device to realize the detection of the chip;

[0055] S4, cancel the downward pressure applied to the upper end cover 2, and the upper end cover 2 moves up to the initial position under the action of the second reset mechanism, that is, the X-shaped lifting structure composed of the left force arm 22 and the right force arm 23 restores the initial state so that the upper end cover 2 moves up to the initial position. During the upward movement of the upper end cover 2, the probe 7 fixed on the lower slave plate 4 moves upward accordingly, so that the upper half of the bifurcation of the probe 7 is opened because it is higher than the guide mechanism 6, thereby releasing the chip pins, and at the same time canceling the fixing of the fixed clip to the detection chip;

[0056] S5, taking out the detected chip on the device body 1.

[0057] The above-mentioned ideal embodiments of the present invention are for inspiration. Through the above-mentioned description, relevant staff can make various changes and modifications without departing from the technical idea of ​​the present invention. The technical scope of the present invention is not limited to the contents of the specification, and its technical scope must be determined according to the scope of the claims.

Claims

1. A chip test probe socket with a probe protection function, comprising a device body (1) and an upper end cover (2) arranged above the device body (1), characterized in that: The device also comprises a protective plate (3) and a lower follower plate (4); a fixing mechanism (5) for fixing the chip on the device body (1) is arranged at one end of the device body (1) close to the upper end cover (2); a guiding mechanism (6) for guiding the probe (7) is arranged on the device body (1); the lower follower plate (4) is located below the device body (1); a probe (7) for detecting the chip is fixedly connected to the lower follower plate (4); the detection end of the probe (7) is arranged on the guiding mechanism (6) and is arranged opposite to the chip; The connection end of the probe (7) protrudes from the end surface of the lower follower plate (4) away from the guide mechanism (6); the lower follower plate (4) is fixed on the upper end cover (2); the lower follower plate (4) is located between the protection plate (3) and the device body (1); a through hole (301) is provided on the protection plate (3); the through hole (301) is provided corresponding to the probe (7); a linkage mechanism is provided between the protection plate (3) and the upper end cover (2); and a first reset mechanism is provided between the device body (1) and the protection plate (3); The linkage mechanism comprises a slide groove (8) provided on the device body (1), a protrusion (9) matching the slide groove (8) being provided in the slide groove (8), the protrusion (9) being transmission-connected to the upper end cover (2), the protection plate (3) being slidably provided on the device body (1), the protection plate (3) being provided with a through groove (10) matching the protrusion (9), the slide groove (8) having a limiting section (11), a guide section (12) and a reset section (13) connected in sequence, the limiting section (11) and the reset section (13) being straight line sections staggered from each other, the guide section (12) being an inclined surface arranged obliquely, the through groove (10) and the limiting section (11) being staggered from each other, and the through groove (10) and the reset section (13) being arranged correspondingly; When the upper end cover (2) is forced to move toward the device body (1), the upper end cover (2) drives the lower plate (4) to move synchronously, the probe (7) moves on the guide mechanism (6) and clamps the pins of the chip on the fixing mechanism (5), when the protrusion (9) moves in the limiting section (11), the protrusion (9) contacts the protection plate (3) and drives the protection plate (3) to move synchronously, when the protrusion (9) passes through the guide section (12) and enters the reset section (13), the protrusion (9) corresponds to the through groove (10), the protection plate (3) slides on the device body (1) under the action of the first reset mechanism and returns to the initial position, and the connection end of the probe (7) is connected to the external device; A track column (14) is provided at one end of the device body (1), a track hole (15) matching the track column (14) is provided on the protection plate (3), the track column (14) is arranged in the track hole (15), the through groove (10) is arranged on the inner peripheral wall of the track hole (15), and the slide groove (8) is arranged on the track column (14); The first reset mechanism comprises a reset spring, a moving block (20) is provided on the protection plate (3), a moving groove (19) is provided on the device body (1), the moving block (20) is arranged in the moving groove (19), and the reset spring is arranged between the moving block (20) and the moving groove (19).

2. A chip test probe socket with a probe protection function according to claim 1, characterized in that: A slide column (16) is rotatably arranged on the upper end cover (2), and a slideway (17) matching the slide column (16) is provided on the device body (1), and the slideway (17) extends from the device body (1) to the track column (14), and the slideway (17) is connected to the slide groove (8), and the slide column (16) is slidably arranged in the slideway (17), and the protrusion (9) is fixedly mounted on the slide column (16).

3. A chip test probe socket with a probe protection function according to claim 1, characterized in that: A second reset mechanism is provided between the upper end cover (2) and the device body (1).

4. A chip test probe socket with a probe protection function according to claim 3, characterized in that: The second resetting mechanism comprises a crossbar, a left force arm (22) and a right force arm (23); the left force arm (22) and the right force arm (23) are arranged crosswise on the crossbar; the left force arm (22), the right force arm (23) and the crossbar are connected to each other via a coil spring (24).

5. A chip test probe socket with a probe protection function according to claim 4, characterized in that: The device body (1) is provided with a placement groove matching the second reset mechanism, and one end of the second reset mechanism close to the cross bar is arranged in the placement groove, and one end of the left force arm (22) and the right force arm (23) both protrude from the placement groove and abut against the upper end cover (2).

6. A chip test probe socket with a probe protection function according to claim 5, characterized in that: It also includes a pin shaft (26), and a pin hole (27) is provided on the device body (1). The pin hole (27) passes through the outer peripheral wall of the device body (1) to the inner peripheral wall of the placement groove, and the pin hole (27) corresponds to the center hole of the coil spring (24). One end of the pin shaft (26) passes through the pin hole (27) and is arranged in the center hole of the coil spring (24).

7. A chip testing probe socket with a probe protection function according to claim 6, characterized in that: The guide mechanism (6) comprises a fixed plate (28), an intermediate plate (29) and an upper follower plate (30); the fixed plate (28), the intermediate plate (29) and the upper follower plate (30) are fixed to the device body (1) in sequence from the lower follower plate (4) to the upper end cover (2); the fixed plate (28), the intermediate plate (29) and the upper follower plate (30) are each provided with a hole (31) matching the probe (7); the detection end of the probe (7) passes through the holes (31) on the fixed plate (28), the intermediate plate (29) and the upper follower plate (30), respectively.

8. A method for using the chip testing probe socket with a probe protection function as claimed in any one of claims 3 to 7, characterized in that: S1, fixing the chip on the device body (1) by means of a fixing mechanism (5); S2. Apply downward pressure to the upper end cover (2), so that the upper end cover (2) moves downward and simultaneously drives the lower slave plate (4) to move, and the probe (7) on the lower slave plate (4) moves downward on the guide mechanism (6). The probe (7) is tightened by the pressure to clamp the pins of the detection chip. At the same time, the protrusion (9) moves in the slide groove (8), driving the protection plate (3) to move downward synchronously with the probe (7); S3, when the upper end cover (2) is pressed downward to the limit, the protrusion (9) enters the reset section (13) from the limiting section (11) through the guide section (12), and the protrusion (9) corresponds to the through groove (10). At this time, the protection plate (3) loses the downward pressure of the protrusion (9), and under the action of the first reset mechanism, the protection plate (3) moves upward to the initial position, so that the connection end of the probe (7) is inserted into the external device, thereby realizing the detection of the chip; S4, the downward pressure applied to the upper end cover (2) is cancelled, and the upper end cover (2) moves upward to the initial position under the action of the second reset mechanism, and the probe (7) releases the pins of the chip; S5. Take out the detected chip from the device body (1).

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