Switch integrated test method

Abstract

A switch integration test method comprises the steps that a test request is received, all target test items needing to test a three-phase switch to be tested are recorded in the test request, and a switch test module corresponding to each target test item is determined; and controlling the state of each switch unit of the matrix switching isolation circuit, so that the switch test module corresponding to each target test item is electrically connected with the to-be-tested three-phase switch, and the to-be-tested three-phase switch is correspondingly tested. Each switch test module is electrically connected with the to-be-tested three-phase switch through the matrix switching isolation circuit; during test, the test items of the three-phase switch to be tested can be tested correspondingly only by controlling the states of the switch units of the matrix switching isolation circuit to conduct the corresponding conductive circuits between the switch test modules corresponding to the target test items and the three-phase switch to be tested. Therefore, the test efficiency of the existing three-phase switch is greatly improved.

Description

Technical Field

[0001] The invention relates to the technical field of electrical component testing, and in particular to a switch integration testing method. Background Art

[0002] Three-phase switches (such as AIS switches and GIS switches) are core components in the power grid field. They need to be tested and maintained regularly to ensure their normal operation. There are many test items for three-phase switches. When performing multiple test items, multiple test instruments are required. The traditional method is to first perform corresponding line wiring for each test item or a set of test items. After one or a set of test items are completed, the staff will re-perform corresponding line wiring according to another or a set of test items. The entire test process is inefficient and time-consuming. Summary of the invention

[0003] In view of the technical defects and technical drawbacks in the prior art, the embodiment of the present invention provides a switch integration test method that overcomes the above problems or at least partially solves the above problems. The specific scheme is as follows: A switch integration test method, the method comprising: Receive a test request, wherein the test request records all target test items that need to be tested on the three-phase switch to be tested, and determine a switch test module corresponding to each target test item, wherein the corresponding switch test module is the switch test module required to be used for the target test item; Controlling the states of the switch units of the matrix switching isolation circuit so that the switch test modules corresponding to the target test items are electrically connected to the three-phase switch to be tested, and performing corresponding tests on the three-phase switch to be tested; Wherein, each switch test module is electrically connected to the three-phase switch to be tested through a matrix switching isolation circuit.

[0004] Further, the matrix switching isolation circuit includes a plurality of conductive circuits, each of which is provided with a switch unit for controlling the on and off of the conductive circuit, one end of the conductive circuit is connected to the corresponding switch test module, and the other end of the conductive circuit is connected to the corresponding signal terminal of the three-phase switch to be tested; The three-phase switch to be tested includes a plurality of signal terminals, and at least two switch test modules are connected to the same signal terminal through different conductive lines.

[0005] Further, the switch test module includes: an insulation resistance test module, a loop resistance test module and a switch mechanical characteristic test module; the insulation resistance test module is configured with a line terminal and a first ground terminal; The loop resistance test module is configured with: a positive current terminal, a positive voltage terminal, a negative voltage terminal and a negative current terminal; The switch mechanical characteristics test module is configured with: A-phase positive voltage terminal, B-phase positive voltage terminal, C-phase positive voltage terminal, A-phase negative voltage terminal, B-phase negative voltage terminal, C-phase negative voltage terminal, positive DC power supply terminal, opening control terminal, closing control terminal and negative DC power supply terminal; The three-phase switch to be tested is configured with: A-phase positive signal terminal, A-phase negative signal terminal, B-phase positive signal terminal, B-phase negative signal terminal, C-phase positive signal terminal, C-phase negative signal terminal, positive DC power supply signal terminal, opening signal terminal, closing signal terminal, negative DC power supply signal terminal, auxiliary opening signal terminal and earth signal terminal; The circuit terminal is respectively connected to the A-phase positive signal terminal, the B-phase positive signal terminal, the C-phase positive signal terminal, the auxiliary branch signal terminal, the positive DC power supply signal terminal, the opening signal terminal, the closing signal terminal, and the negative DC power supply signal terminal through different conductive circuits; The first grounding terminal is respectively connected to the A-phase negative signal terminal, the B-phase negative signal terminal, the C-phase negative signal terminal, and the earth signal terminal through different conductive lines; The positive current terminal is respectively connected to the A-phase positive signal terminal, the B-phase positive signal terminal, and the C-phase positive signal terminal through different conductive lines; The positive voltage terminal is respectively connected to the A-phase positive signal terminal, the B-phase positive signal terminal, and the C-phase positive signal terminal through different conductive circuits; The negative voltage terminal is respectively connected to the A-phase negative signal terminal, the B-phase negative signal terminal, and the C-phase negative signal terminal through different conductive circuits; The negative current terminal is respectively connected to the A-phase negative signal terminal, the B-phase negative signal terminal, the C-phase negative signal terminal, and the earth signal terminal through different conductive lines; The A-phase positive voltage terminal is connected to the A-phase positive signal terminal via a corresponding conductive circuit; The B-phase positive voltage terminal is connected to the B-phase positive signal terminal via a corresponding conductive circuit; The C-phase positive voltage terminal is connected to the C-phase positive signal terminal via a corresponding conductive circuit; The A-phase negative voltage terminal is connected to the A-phase negative signal terminal via a corresponding conductive circuit; The B-phase negative voltage terminal is connected to the B-phase negative signal terminal via a corresponding conductive circuit; The C-phase negative voltage terminal is connected to the C-phase negative signal terminal via a corresponding conductive circuit; The positive DC power terminal is connected to the positive DC power signal terminal via a corresponding conductive circuit; The opening control terminal is respectively connected to the opening signal terminal and the auxiliary opening signal terminal through different conductive lines; The closing control terminal is connected to the closing signal terminal through a corresponding conductive line; The negative DC power terminal is connected to the negative DC power signal terminal through a corresponding conductive circuit.

[0006] Furthermore, the A-phase positive signal terminal, the A-phase negative signal terminal, the B-phase positive signal terminal, the B-phase negative signal terminal, the C-phase positive signal terminal and the C-phase negative signal terminal are also respectively connected to the earth signal terminal through corresponding first grounding control switches.

[0007] Furthermore, the plurality of signal terminals further include: a sensor signal terminal, the sensor signal terminal is a multi-core aviation signal terminal, the switch mechanical characteristic test module is further configured with a plurality of sensor connection terminals, each of the sensor connection terminals is connected to a different core of the sensor signal terminal through a different conductive line; And / or, the multiple wiring signal terminals also include: an analog signal terminal, the analog signal terminal is a multi-core aviation signal terminal, and the switch mechanical characteristics test module is also configured with multiple analog connection terminals, each of the analog connection terminals is connected to a different core in the analog signal terminal through a different conductive circuit.

[0008] Furthermore, the method further comprises: Obtaining the test requirement switch state of each of the target test items, and classifying the target test items based on the test requirement switch state of each of the target test items, wherein the test requirement switch state of the target test item is one of an open state, a closed state, switching from a closed state to an open state, switching from an open state to a closed state, and switching from an open state to a closed state and then to an open state; Obtain the initial switch state of the three-phase switch to be tested, determine the test order of the target test items based on the initial switch state and the test requirement switch state of each target test item, and perform corresponding tests on the three-phase switch to be tested based on the test order, wherein the initial switch state includes an open state and a closed state.

[0009] Further, when the initial switch state of the three-phase switch to be tested is an open state, the test order of the target test items is determined based on the initial switch state and the test requirement switch state of each target test item, and the corresponding test is performed on the three-phase switch to be tested based on the test order as follows: Step S101, determining whether there is a target test item in the test request that the switch state is an open state; If the judgment result of step S101 is yes, then execute step S102; if the judgment result of step S101 is no, then execute step S103; Step S102, placing all the target test items whose test requirement switch state is the open state in the test item sequence in sequence to update the test item sequence; after step S102 is completed, executing step S103; Step S103, determining whether there is a target test item in the test request that requires the switch state to be switched from an open state to a closed state; If the judgment result of step S103 is yes, then execute step S104; if the judgment result of step S103 is no, then execute step S105; Step S104, placing one of the target test items whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence to update the test item sequence; after step S104 is completed, executing step S105; Step S105, determining whether there is a target test item in the test request that the switch state is a closed state; If the judgment result of step S105 is yes, then execute step S106; if the judgment result of step S105 is no, then execute step S107; Step S106, placing all the target test items whose test requirement switch state is the open state in sequence at the end of the test item sequence to update the test item sequence; after step S106 is completed, executing step S107; Step S107, determining whether there is a target test item in the test request that requires the switch state to be switched from the closed state to the open state; If the judgment result of step S107 is yes, then execute step S108; if the judgment result of step S107 is no, then execute step S113; Step S108, placing one of the target test items whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S108 is completed, executing step S109; Step S109, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requirement switch state is switched from the open state to the closed state; If the judgment result of step S109 is yes, then execute step S110; if the judgment result of step S109 is no, then execute step S111; Step S110, placing one of the target test items that is not placed in the test item sequence and whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence to update the test item sequence; after step S110 is completed, executing step S107 again; Step S111, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the closed state to the open state; If the judgment result of step S111 is yes, then execute step S112; if the judgment result of step S111 is no, then execute step S115; Step S112, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence, so as to update the test item sequence; after step S112, executing step S115; Step S113, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requirement switch state is switched from the open state to the closed state; If the judgment result of step S113 is yes, then execute step S114; if the judgment result of step S113 is no, then execute step S115; Step S114, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence, so as to update the test item sequence; Step S115, determining whether there is a target test item in the test request that switches from an open state to a closed state and then to an open state; If the judgment result of step S115 is yes, then execute step S116; if the judgment result of step S115 is no, then execute step S117; Step S116, placing all target test items that are switched from the open state to the closed state and then to the open state at the end of the test item sequence to update the test item sequence; after step S116 is completed, executing step S117; Step S117: output the final test item sequence.

[0010] Further, when the initial switch state of the three-phase switch to be tested is the closed state, the test order of the target test items is determined based on the initial switch state and the test requirement switch state of each target test item, and the corresponding test is performed on the three-phase switch to be tested based on the test order as follows: Step S201, determining whether there is a target test item in the test request that the switch state is a closed state; If the judgment result of step S201 is yes, then execute step S202; if the judgment result of step S201 is no, then execute step S203; Step S202, placing all the target test items whose test requirement switch state is the closed state in the test item sequence in sequence, so as to update the test item sequence; after step S202 is completed, executing step S203; Step S203, determining whether there is a target test item in the test request that requires the switch state to be switched from the closed state to the open state; If the judgment result of step S203 is yes, then execute step S204; if the judgment result of step S203 is no, then execute step S205; Step S204, placing one of the target test items whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S204 is completed, executing step S205; Step S205, determining whether there is a target test item in the test request whose test requirement switch state is an open state; If the judgment result of step S205 is yes, then execute step S206; if the judgment result of step S205 is no, then execute step S207; Step S206, placing all the target test items whose test requirement switch state is the closed state in sequence at the end of the test item sequence to update the test item sequence; after step S206 is completed, executing step S207; Step S207, determining whether there is a target test item in the test request that requires the switch state to be switched from an open state to a closed state; If the judgment result of step S207 is yes, then execute step S208; if the judgment result of step S207 is no, then execute step S213; Step S208, placing one of the target test items whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence to update the test item sequence; after step S208 is completed, executing step S209; Step S209, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requirement switch state is switched from the closed state to the open state; If the judgment result of step S209 is yes, then execute step S210; if the judgment result of step S209 is no, then execute step S211; Step S210, placing one of the target test items that is not placed in the test item sequence and whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S210 is completed, executing step S207 again; Step S211, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requirement switch state is switched from the open state to the closed state; If the judgment result of step S211 is yes, then execute step S212; if the judgment result of step S211 is no, then execute step S215; Step S212, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence, so as to update the test item sequence; after step S212, executing step S215; Step S213, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the closed state to the open state; If the judgment result of step S213 is yes, then execute step S214; if the judgment result of step S213 is no, then execute step S215; Step S214, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence, so as to update the test item sequence; Step S215, determining whether there is a target test item in the test request that switches from an open state to a closed state and then to an open state; If the judgment result of step S215 is yes, then execute step S216; if the judgment result of step S215 is no, then execute step S217; Step S216, placing all target test items that are switched from the open state to the closed state and then to the open state at the end of the test item sequence to update the test item sequence; After step S216, execute step S217; Step S217: output the final test item sequence.

[0011] Further, all the target test items whose test requirement switch state is the open state are sequentially placed in the test item sequence according to the following steps: Step Sa1, randomly selecting one of the target test items whose test requirement switch state is an open state, and placing it at the end of the test item sequence to update the test item sequence; Step Sa2, determining whether the test request contains the target test item that is not included in the test item sequence and whose test requirement switch state is an open state; If the judgment result of step Sa2 is yes, then step Sa3 is executed; if the judgment result of step Sa2 is no, then the process ends; Step Sa3, taking each of the target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is the open state as the first test item to be scheduled, and calculating the set similarity between the set of on-switch units configured for each first test item to be scheduled and the set of on-switch units of the target test item at the end of the test item sequence; Step Sa4, placing the first test item to be arranged, which has the largest set similarity with the target test item at the end of the test item sequence, at the end of the test item sequence to update the test item sequence; after step Sa4 is completed, executing step Sa2 again; And / or, all the target test items whose test requirement switch state is the closed state are sequentially placed in the test item sequence according to the following steps: Step Sb1, randomly selecting one of the target test items whose test requirement switch state is the closed state, and placing it at the end of the test item sequence to update the test item sequence; Step Sb2, determining whether the test request includes the target test item that is not included in the test item sequence and whose test requirement switch state is the closed state; If the judgment result of step Sb2 is yes, then step Sb3 is executed; if the judgment result of step Sb2 is no, then the process ends; Step Sb3, taking each of the target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is the closed state as the second test item to be scheduled, and calculating the set similarity between the set of conductive switch units configured for each second test item to be scheduled and the set of conductive switch units of the target test item at the end of the test item sequence; Step Sb4, placing the second test item to be arranged which has the largest set similarity with the target test item at the end of the test item sequence at the end of the test item sequence to update the test item sequence; after step Sb4, executing step Sb2 again.

[0012] The present invention has the following beneficial effects: The present invention provides a switch integration test method, in which each switch test module is electrically connected to the three-phase switch to be tested through a matrix switching isolation circuit. During testing, it is only necessary to control the states of each switch unit of the matrix switching isolation circuit so that the switch test module corresponding to each target test item is connected to the corresponding conductive circuit between the three-phase switch to be tested, and the test items of the three-phase switch to be tested can be tested accordingly. This method can greatly improve the existing three-phase switch testing efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 A schematic diagram of a flow chart of a switch integration test method provided in an embodiment of the present disclosure; Figure 2 A schematic diagram of the structure of a switch test module and a matrix switching isolation circuit in an embodiment of the present disclosure; Figure 3 It is a structural schematic diagram of a three-phase switch in an embodiment of the present disclosure; Figure 4 It is a schematic diagram of the structure of the control power supply circuit in the three-phase switch in the embodiment of the present disclosure; Figure 5 A schematic diagram of the corresponding relationship between each test item and the switch state of the test requirement, the switch test module, and the set of the conduction switch units in the embodiment of the present disclosure; DETAILED DESCRIPTION

[0014] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0015] Unless otherwise defined, the technical terms or scientific terms used in the present disclosure should be understood by people with ordinary skills in the field to which the present disclosure belongs. The "first", "second" and similar words used in the present disclosure do not indicate any order, quantity or importance, but are only used to distinguish different components. Similarly, similar words such as "one", "one" or "the" do not indicate quantity restrictions, but indicate that there is at least one. Similar words such as "include" or "comprise" mean that the elements or objects appearing before the word cover the elements or objects listed after the word and their equivalents, without excluding other elements or objects. Similar words such as "connect" or "connected" are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. "Up", "down", "left", "right" and the like are only used to indicate relative positional relationships. When the absolute position of the described target changes, the relative positional relationship may also change accordingly.

[0016] In each of the accompanying drawings, identical elements are represented by similar reference numerals. For the sake of clarity, the various parts in the accompanying drawings are not all drawn to scale. In addition, some well-known parts may not be shown in the drawings.

[0017] Many specific details of the present disclosure are described below to provide a clearer understanding of the present disclosure. However, as those skilled in the art will appreciate, the present disclosure may be implemented without following these specific details.

[0018] like Figure 1 The present invention provides a switch integration test method, which includes: Receive a test request, wherein the test request records all target test items that need to be tested on the three-phase switch to be tested, and determine a switch test module corresponding to each target test item, wherein the corresponding switch test module is the switch test module required to be used for the target test item; Controlling the states of the switch units of the matrix switching isolation circuit so that the switch test modules corresponding to the target test items are electrically connected to the three-phase switch to be tested, and performing corresponding tests on the three-phase switch to be tested; Wherein, each switch test module is electrically connected to the three-phase switch to be tested through a matrix switching isolation circuit.

[0019] The present invention provides a switch integration test method, in which each switch test module is electrically connected to the three-phase switch to be tested through a matrix switching isolation circuit. During testing, it is only necessary to control the states of each switch unit of the matrix switching isolation circuit so that the switch test module corresponding to each target test item is connected to the corresponding conductive circuit between the three-phase switch to be tested, and the test items of the three-phase switch to be tested can be tested accordingly. This method can greatly improve the existing three-phase switch testing efficiency.

[0020] The three-phase switch in the present disclosure may be an AIS switch or a GIS switch of 220 kV or less, and the three-phase switch includes an A-phase switch, a B-phase switch and a C-phase switch.

[0021] In the present disclosure, the switch test module may be selected from some existing switch test modules, such as an insulation resistance test module, a loop resistance test module, and a switch mechanical characteristic test module.

[0022] Among them, the insulation resistance test module is used to perform at least one of the opening coil insulation resistance test, closing coil insulation resistance test, auxiliary branch coil insulation resistance test, switch break insulation test, switch body insulation test and phase-to-phase insulation test.

[0023] The loop resistance test module is used to perform at least one of an A-phase loop test, a B-phase loop test, and a C-phase loop test.

[0024] The switch mechanical characteristics test module is used to perform at least one of the switch opening and closing state judgment test, opening operation test, closing operation test, auxiliary opening operation test, energy storage test, opening mechanical characteristics test, closing mechanical characteristics test, closing mechanical characteristics test, auxiliary opening mechanical characteristics test, opening action voltage test, closing action voltage test, auxiliary opening action voltage test, opening non-tripping test, closing non-tripping test, auxiliary opening non-tripping test, opening coil DC resistance test, closing coil DC resistance test, and auxiliary opening coil DC resistance test.

[0025] In the present disclosure, the selected switch test module can be pre-selected according to actual test needs. The switch test module itself is not the inventive point of the present disclosure and is not described in detail here.

[0026] The matrix switching isolation circuit includes multiple conductive circuits, one end of which is connected to the corresponding switch test module, and the other end of which is connected to the corresponding signal terminal of the three-phase switch to be tested. A switch unit for controlling the on and off of the conductive circuit is provided in the conductive circuit.

[0027] In the present disclosure, the number of conductive lines in the matrix switching isolation circuit is designed according to the number and type of switch test modules provided. The switch unit can realize fast and stable opening and closing switching, and the switch unit can be a digital switch or an analog switch.

[0028] In some embodiments, a control processor is connected to each switch test module and each switch unit, and is used to control each target switch unit corresponding to the target test item to be in a conducting state (also referred to as a closed state) when a target test item needs to be performed on the three-phase switch to be tested, so that the target switch test module corresponding to the target test item is electrically connected to the three-phase switch to be tested through the conductive lines belonging to each target switch unit, and the target switch test module is controlled to perform corresponding tests on the three-phase switch to be tested.

[0029] In the present disclosure, before testing, all switch units are in the cut-off state (also called the open state) by default, that is, all conductive circuits are in the open circuit state, and all switch test modules are cut off from the three-phase switch to be tested.

[0030] When a certain test item needs to be performed, the control processor can control the corresponding switch unit to be in the on state (other switch units remain in the off state) so that the corresponding switch test module is electrically connected to the three-phase switch to be tested (other switch test modules and the three-phase switch to be tested remain in the off state), and then the control processor controls the corresponding switch test module to perform the test. When other test items are required later, the control processor only needs to be used to control the corresponding switch unit in the matrix switching isolation circuit so that the corresponding switch test module is electrically connected to the three-phase switch to be tested, and control the corresponding switch test module to perform the test process.

[0031] In the present disclosure, since multiple switch test modules are integrated, the three-phase switch test device provided by the present disclosure can support more test items compared to a conventional single switch test module; in addition, due to the existence of a matrix switching isolation circuit and a control processor, it can support the three-phase switch to be tested. When the three-phase switch test device is connected to the three-phase switch to be tested once, many test items can be performed on the three-phase switch to be tested. Therefore, the technical solution of the present disclosure can effectively improve the technical problems existing in the prior art that the switch test instrument has a single function and needs to be manually frequently changed during the test to switch different switch test instruments.

[0032] In some embodiments, the switch test module includes: an insulation resistance test module, a loop resistance test module, and a switch mechanical characteristic test module. The insulation resistance test module, the loop resistance test module, and the switch mechanical characteristic test module are conventional test modules in the art, and the present disclosure does not describe their internal structures, test items, and specific processes of each test item.

[0033] Figure 2 A structural schematic diagram of a test module and a matrix switching isolation circuit in an embodiment of the present disclosure. Figure 3 Schematic diagram of a three-phase switch to be tested in an embodiment of the present disclosure. Figure 4 Schematic diagram of the control power supply in the three-phase switch in the embodiment of the present disclosure. Figures 2 to 4 As shown, in some embodiments, the insulation resistance test module is configured with: a line terminal L and a first ground terminal E. The loop resistance test module is configured with: a positive current terminal I+, a positive voltage terminal V+, a negative voltage terminal V- and a negative current terminal I-. The switch mechanical characteristics test module is configured with: a positive voltage terminal A+ for phase A, a positive voltage terminal B+ for phase B, a positive voltage terminal C+ for phase C, a negative voltage terminal A- for phase A, a negative voltage terminal B- for phase B, a negative voltage terminal C- for phase C, a positive DC power supply terminal KM+, a gate opening control terminal TQ, a gate closing control terminal HQ and a negative DC power supply terminal KM-.

[0034] The three-phase switch to be tested is configured with: A-phase positive signal terminal, A-phase negative signal terminal, B-phase positive signal terminal, B-phase negative signal terminal, C-phase positive signal terminal, C-phase negative signal terminal, positive DC power supply signal terminal PKM+, opening signal terminal PTQ, closing signal terminal PHQ, negative DC power supply signal terminal PKM-, auxiliary opening signal terminal PTQ', and earth signal terminal PG.

[0035] On the insulation resistance test module, the line terminal L is respectively connected to the A-phase positive signal terminal, the B-phase positive signal terminal, the C-phase positive signal terminal, the auxiliary branch signal terminal PTQ', the positive DC power supply signal terminal PKM+, the opening signal terminal PTQ, the closing signal terminal PHQ, and the negative DC power supply signal terminal PKM- through different conductive circuits (the switch units included are KLA+, KLB+, KLC+, KLTQ', KLKM+, KLTQ, KLHQ, KLKM-); the first grounding terminal E is respectively connected to the A-phase negative signal terminal, the B-phase negative signal terminal, the C-phase negative signal terminal, and the earth signal terminal PG through different conductive circuits (the switch units included are KEA-, KEB-, KEC-, KEG).

[0036] On the loop resistance test module, the positive current terminal I+ is connected to the A-phase positive signal terminal, the B-phase positive signal terminal, and the C-phase positive signal terminal through different conductive circuits (the switch units included are KIA+, KIB+, and KIC+ respectively); the positive voltage terminal V+ is connected to the A-phase positive signal terminal, the B-phase positive signal terminal, and the C-phase positive signal terminal through different conductive circuits (the switch units included are KVA+, KVB+, and KVC+ respectively); the negative voltage terminal V- is connected to the A-phase negative signal terminal, the B-phase negative signal terminal, and the C-phase negative signal terminal through different conductive circuits (the switch units included are KVA-, KVB-, and KVC- respectively); the negative current terminal I- is connected to the A-phase negative signal terminal, the B-phase negative signal terminal, the C-phase negative signal terminal, and the earth signal terminal PG through different conductive circuits (the switch units included are KIA-, KIB-, KIC-, and KI- respectively).

[0037] On the switch mechanical characteristics test module, the A-phase positive voltage terminal A+ is connected to the A-phase positive signal terminal through the corresponding conductive circuit (the switch unit included is KA+); the B-phase positive voltage terminal B+ is connected to the B-phase positive signal terminal through the corresponding conductive circuit (the switch unit included is KB+); the C-phase positive voltage terminal C+ is connected to the C-phase positive signal terminal through the corresponding conductive circuit (the switch unit included is KC+); the A-phase negative voltage terminal A- is connected to the A-phase negative signal terminal through the corresponding conductive circuit (the switch unit included is KA-); the B-phase negative voltage terminal B- is connected to the B-phase negative signal terminal through the corresponding conductive circuit (the switch unit included is KB-); the C-phase negative voltage terminal Sub C- is connected to the negative signal terminal of phase C through the corresponding conductive circuit (the switch unit included is KC-); the positive DC power terminal KM+ is connected to the positive DC power signal terminal PKM+ through the corresponding conductive circuit (the switch unit included is KKM+); the opening control terminal TQ is respectively connected to the opening signal terminal PTQ and the auxiliary opening signal terminal PTQ' through different conductive circuits (the switch units included are KTQ and KTQ'); the closing control terminal HQ is connected to the closing signal terminal PHQ through the corresponding conductive circuit (the switch unit included is KHQ); the negative DC power terminal KM- is connected to the negative DC power signal terminal PKM- through the corresponding conductive circuit (the switch unit included is KKM-).

[0038] As an optional implementation scheme, the A-phase positive signal terminal includes an A-phase positive current lead-out port IA+ and an A-phase positive voltage lead-out port VA+, and the A-phase positive current lead-out port IA+ and the A-phase positive voltage lead-out port VA+ are respectively connected to the same conductive clip through different connecting wires, and the conductive clip clamps one end of the A-phase switch. Figure 3The upper end of the A-phase switch; the A-phase negative signal terminal includes the A-phase negative current lead port IA- and the A-phase negative voltage lead port VA-, the A-phase negative current lead port IA- and the A-phase negative voltage lead port VA- are respectively connected to the same conductive clip through different connecting wires and the conductive clip clamps the other end of the A-phase switch, Figure 3 The lower end of the A-phase switch in the middle, wherein the upper end of the A-phase switch is the A-phase positive signal terminal, and the lower end of the A-phase switch is the A-phase negative signal terminal.

[0039] The B-phase positive signal terminal includes a B-phase positive current lead port IB+ and a B-phase positive voltage lead port VB+, and the B-phase positive current lead port IB+ and the B-phase positive voltage lead port VB+ are respectively connected to the same conductive clip through different connecting wires, and the conductive clip clamps one end of the B-phase switch. Figure 3 The upper end of the B-phase switch; the B-phase negative signal terminal includes a B-phase negative current lead port IB- and a B-phase negative voltage lead port VB-, and the B-phase negative current lead port IB- and the B-phase negative voltage lead port VB- are respectively connected to the same conductive clip through different connecting lines and the conductive clip clamps the other end of the B-phase switch, Figure 3 The lower end of the B-phase switch is the B-phase positive signal terminal, and the lower end of the B-phase switch is the B-phase negative signal terminal.

[0040] The C-phase positive signal terminal includes a C-phase positive current lead-out port IC+ and a C-phase positive voltage lead-out port VC+. The C-phase positive current lead-out port IC+ and the C-phase positive voltage lead-out port VC+ are respectively connected to the same conductive clip through different connecting wires, and the conductive clip clamps one end of the C-phase switch ( Figure 3 The upper end of the C-phase switch in the middle); the C-phase negative signal terminal includes a C-phase negative current lead-out port IC- and a C-phase negative voltage lead-out port VC-, and the C-phase negative current lead-out port IC- and the C-phase negative voltage lead-out port VC- are respectively connected to the same conductive clip through different connecting wires, and the conductive clip clamps the other end of the C-phase switch Figure 3 The lower end of the C-phase switch in the middle, wherein the upper end of the C-phase switch is the C-phase positive signal terminal, and the lower end of the C-phase switch is the C-phase negative signal terminal.

[0041] See also Figure 4 As shown, the control power supply circuit in the three-phase switch includes: a closing control branch, an opening control branch and an auxiliary branch control branch, and the closing control branch, the opening control branch and the auxiliary branch control branch are connected in parallel between the positive DC supply line and the negative DC supply line. Among them, the positive DC power supply signal terminal PKM+ is connected to the positive DC supply line through a corresponding connecting line, and the negative DC power supply signal terminal PKM- is connected to the negative DC supply line through a corresponding connecting line.

[0042] The closing signal terminal PHQ is connected to the closing control branch through a corresponding connecting line. Specifically, the closing control branch includes a closing control switch and a closing coil connected in series between the positive DC supply line and the negative DC supply line, and the closing signal terminal PHQ is connected between the closing control switch and the closing coil through a corresponding connecting line.

[0043] The opening signal terminal PTQ is connected to the opening control branch through a corresponding connecting line. Specifically, the opening control branch includes an opening control switch and an opening coil connected in series between the positive DC supply line and the negative DC supply line, and the opening signal terminal PTQ is connected between the opening control switch and the opening coil through a corresponding connecting line.

[0044] The secondary signal terminal PTQ' is connected to the secondary control branch through a corresponding connection line. Specifically, the secondary control branch includes a secondary control switch and a secondary coil connected in series between the positive DC supply line and the negative DC supply line, and the secondary signal terminal PTQ' is connected between the secondary control switch and the secondary coil through a corresponding connection line.

[0045] In some embodiments, the A-phase positive signal terminal A+, the A-phase negative signal terminal A-, the B-phase positive signal terminal B+, the B-phase negative signal terminal B-, the C-phase positive signal terminal C+ and the C-phase negative signal terminal C- are respectively connected to the earth signal terminal through the corresponding first grounding control switch. More specifically, the A-phase positive voltage lead port VA+, the A-phase negative voltage lead port VA-, the B-phase positive voltage lead port VB+, the B-phase negative voltage lead port VB-, the C-phase positive voltage lead port VC+ and the C-phase negative voltage lead port VC- are respectively connected to the earth signal terminal PG through the corresponding first grounding control switch KG1.

[0046] Different from the switch unit being in a normally off state, the first grounding control switch KG1 in the present disclosure is in a normally on state. That is, when no test is performed, the first grounding control switch KG1 is in an on state, so that the A-phase positive signal terminal A+, the A-phase negative signal terminal A-, the B-phase positive signal terminal B+, the B-phase negative signal terminal B-, the C-phase positive signal terminal C+ and the C-phase negative signal terminal C- are all electrically connected to the earth signal terminal PG, thereby preventing the accumulation of high-voltage charges at the above-mentioned signal terminals; when a test is required, the first grounding control switch KG1 is switched to an off state to ensure the normal conduct of the test.

[0047] In some embodiments, the insulation resistance testing module is also configured with: a shielding connection terminal G; the multiple signal terminals also include: a positive shielding signal terminal PV+ and a negative shielding signal terminal PV-; the shielding connection terminal G is connected to the positive shielding signal terminal PV+ through a corresponding conductive circuit, and the switching unit on the conductive circuit is KG.

[0048] Further optionally, the positive shielding signal terminal and the negative shielding signal terminal are respectively connected to the earth signal terminal PG through different second grounding control switches KG2. Similar to the first grounding control switch KG1, the second grounding control switch KG2 is also in a normally on state. That is, when no test is performed, the second grounding control switch KG2 is in an on state; when a test is required, the second grounding control switch KG2 is switched to an off state to ensure the normal conduct of the test.

[0049] In some embodiments, the switch mechanical characteristic test module is further configured with a common voltage terminal COM, which is connected to the ground signal terminal PG through a corresponding conductive line (the switch unit included is KCOM). Inside the switch mechanical characteristic test module, the common voltage terminal is electrically connected to the A-phase negative voltage terminal V-, the B-phase negative voltage connection terminal, and the C-phase negative voltage connection terminal.

[0050] In actual applications, some sensors (such as photoelectric sensors, angle sensors, etc.) will be set on the switch to be tested according to the test requirements to detect some characteristics of the three-phase switch. To cope with this scenario, in the present disclosure, the multiple signal terminals optionally also include: sensor signal terminals, which are multi-core aviation signal terminals. The switch mechanical characteristics test module is also equipped with multiple sensor connection terminals (not shown), and each sensor connection terminal is connected to different cores in the sensor signal terminal through different conductive lines.

[0051] In practical applications, the number of sensor connection terminals is determined by the switch mechanical characteristic test module itself. In the present disclosure, it is only necessary to ensure that the number of pins in the sensor signal terminal is greater than or equal to the number of sensor connection terminals.

[0052] In some embodiments, the plurality of signal terminals further include: a simulation signal terminal, which is a multi-core aviation signal terminal. The switch mechanical characteristic test module is also equipped with a plurality of simulation connection terminals (not shown), each of which is connected to a different core in the simulation signal terminal through a different conductive line. The simulation connection terminal can simulate the voltage, current and other conditions in the actual power grid to test the performance of the three-phase switch under different working conditions.

[0053] In practical applications, the number of analog connection terminals is determined by the switch mechanical characteristic test module itself. In the present disclosure, it is only necessary to ensure that the number of cores in the analog signal terminals is greater than or equal to the number of analog connection terminals.

[0054] Figure 5Schematic diagram of the corresponding relationship between each test item and the test requirement switch state, switch test module, and conductive switch unit set in the embodiment of the present disclosure. Figure 5 As shown, the corresponding relationship data can be manually pre-organized and stored in the control processor for use by the control processor. Each test item is configured with a corresponding set of conductive switch units, and the conductive switch unit set records the switch units that need to be in the conductive state when performing the corresponding test item.

[0055] In some embodiments, the control processor includes: a receiving unit, an orchestration unit, and a control unit.

[0056] The receiving unit is used to receive a test request, in which all target test items to be tested on the three-phase switch to be tested are recorded. The test request can be sent to the control processor by the user according to actual needs.

[0057] As an example, the method further includes: providing a display module (e.g., a display screen) and an operation module (e.g., a mouse or a case), wherein the display module is used to display a screen, and the operation module is used for a user to operate. The display module and the operation module are provided on an operation panel, and the display module can provide a list of all supported test items, and the user can select a desired test item from the list through the operation module, thereby generating a corresponding test request.

[0058] As another example, the method further includes: providing a communication module, the communication module is connected to the control processor, and the communication module is used for the control processor to communicate data with an external device. At this time, the external device can also be used to send a test request to the control processor.

[0059] Of course, the display module in the present disclosure can also display other content, such as displaying test results and displaying some pre-designed program interfaces. The communication module in the present disclosure can also be used for other data communications, such as controlling the processor to upload the test results to the server through the communication module. Examples are not given one by one here.

[0060] The arrangement unit is used to arrange the order of the target test items according to the test requirement switch states respectively corresponding to the target test items in the test request to obtain a test item sequence.

[0061] In the present disclosure, the test requirement switch state refers to the state of the three-phase switch to be tested that needs to be in during the process of performing the corresponding test items on the three-phase switch to be tested. The test requirement switch state of each target test item is one of the following: open state, closed state, switching from closed state to open state, switching from open state to closed state, switching from open state to closed state and then switching to open state. In the test item sequence, all target test items whose test requirement switch state is open state are arranged in sequence, and all target test items whose test requirement switch state is closed state are arranged in sequence.

[0062] In the present disclosure, the function of automatically arranging the order of test items is also supported. By arranging all target test items whose test requirements are that the switch state is the open state in sequence, and arranging all target test items whose test requirements are that the switch state is the closed state in sequence, the test items that require the three-phase switch to be tested to be in the open state can be performed continuously, and the test items that require the three-phase switch to be tested to be in the open state can be performed continuously. Such a design can effectively reduce the number of state switching times of the three-phase switch to be tested during the entire test process, which is beneficial to reducing the risk of damage to the three-phase switch to be tested due to frequent switching, and is beneficial to shortening the processing time of the entire test process.

[0063] The control unit is used to control the matrix switching isolation circuit and the test module to perform corresponding test items on the three-phase switch to be tested one by one according to the test item sequence.

[0064] In some embodiments, the control processor further includes: an initial switch state detection unit, which is used to detect the initial switch state of the three-phase switch to be tested before the scheduling unit performs the scheduling work, that is, the switch state of the three-phase switch to be tested before starting the entire test process. The initial switch state of the three-phase switch to be tested includes: an open state or a closed state.

[0065] In some embodiments, in response to the initial switch state of the three-phase switch to be tested being an open state, the scheduling unit schedules the target test items in the test request according to the following steps: Step S101: Determine whether there is a target test item in the test request that the switch state is an open state.

[0066] If the judgment result of step S101 is yes, then step S102 is executed; if the judgment result of step S101 is no, then step S103 is executed.

[0067] Step S102, placing all target test items whose test requirement switch state is the open state in sequence into the test item sequence to update the test item sequence; after step S102 is completed, executing step S103.

[0068] Step S103: determine whether there is a target test item in the test request that requires the switch state to be switched from the open state to the closed state.

[0069] If the judgment result of step S103 is yes, then step S104 is executed; if the judgment result of step S103 is no, then step S105 is executed.

[0070] Step S104, placing a target test item whose test requirement switch state is switched from an open state to a closed state at the end of the test item sequence to update the test item sequence; after step S104 is completed, executing step S105.

[0071] Step S105: determine whether there is a target test item in the test request whose test requirement switch state is a closed state.

[0072] If the judgment result of step S105 is yes, then step S106 is executed; if the judgment result of step S105 is no, then step S107 is executed.

[0073] Step S106, placing all target test items whose test requirement switch state is the open state at the end of the test item sequence in sequence to update the test item sequence; after step S106 is completed, executing step S107.

[0074] Step S107 , determining whether there is a target test item in the test request that requires the switch state to be switched from the closed state to the open state.

[0075] If the judgment result of step S107 is yes, then step S108 is executed; if the judgment result of step S107 is no, then step S113 is executed.

[0076] Step S108, placing a target test item whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S108, executing step S109.

[0077] Step S109 , determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the open state to the closed state.

[0078] If the judgment result of step S109 is yes, then step S110 is executed; if the judgment result of step S109 is no, then step S111 is executed.

[0079] Step S110, placing a target test item that is not placed in the test item sequence and whose test requirement switch state is to switch from the open state to the closed state at the end of the test item sequence to update the test item sequence; after step S110 is completed, execute step S107 again.

[0080] Step S111 : determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the closed state to the open state.

[0081] If the judgment result of step S111 is yes, then step S112 is executed; if the judgment result of step S111 is no, then step S115 is executed.

[0082] Step S112, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S112, executing step S115.

[0083] Step S113: determine whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the open state to the closed state.

[0084] If the judgment result of step S113 is yes, then step S114 is executed; if the judgment result of step S113 is no, then step S115 is executed.

[0085] Step S114: placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence to update the test item sequence.

[0086] Step S115, determining whether there is a target test item in the test request that switches from the open state to the closed state and then to the open state.

[0087] If the judgment result of step S115 is yes, then step S116 is executed; if the judgment result of step S115 is no, then step S117 is executed.

[0088] Step S116, placing all target test items that are switched from the open state to the closed state and then to the open state at the end of the test item sequence to update the test item sequence; after step S116, executing step S117.

[0089] Step S117: output the final test item sequence.

[0090] Through the above steps S101 to S117, the number of switching times of the switch state of the three-phase switch to be tested in the entire test process can be reduced as much as possible, which is beneficial to reducing the risk of damage to the three-phase switch to be tested due to frequent switching, and is beneficial to shortening the processing time of the entire test process.

[0091] In some embodiments, in response to the initial switch state of the three-phase switch to be tested being the closed state, the scheduling unit schedules the target test items in the test request according to the following steps: Step S201: Determine whether there is a target test item in the test request that the switch state is the closed state.

[0092] If the judgment result of step S201 is yes, then step S202 is executed; if the judgment result of step S201 is no, then step S203 is executed.

[0093] Step S202, placing all target test items whose test requirement switch state is the closed state in sequence into the test item sequence to update the test item sequence; after step S202 is completed, executing step S203.

[0094] Step S203: determine whether there is a target test item in the test request that requires the switch state to be switched from the closed state to the open state.

[0095] If the judgment result of step S203 is yes, then step S204 is executed; if the judgment result of step S203 is no, then step S205 is executed.

[0096] Step S204, placing a target test item whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S204 is completed, executing step S205.

[0097] Step S205: Determine whether there is a target test item in the test request whose test requirement switch state is changed from open state.

[0098] If the judgment result of step S205 is yes, then step S206 is executed; if the judgment result of step S205 is no, then step S207 is executed.

[0099] Step S206, placing all target test items whose test requirement switch state is the closed state at the end of the test item sequence in sequence to update the test item sequence; after step S206 is completed, executing step S207.

[0100] Step S207: determine whether there is a target test item in the test request that requires the switch state to be switched from the open state to the closed state.

[0101] If the judgment result of step S207 is yes, then step S208 is executed; if the judgment result of step S207 is no, then step S213 is executed.

[0102] Step S208, placing a target test item whose test requirement switch state is switched from an open state to a closed state at the end of the test item sequence to update the test item sequence; after step S208, executing step S209.

[0103] Step S209 , determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the closed state to the open state.

[0104] If the judgment result of step S209 is yes, then step S210 is executed; if the judgment result of step S209 is no, then step S211 is executed.

[0105] Step S210, placing a target test item that is not placed in the test item sequence and whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S210 is completed, execute step S207 again.

[0106] Step S211 , determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the open state to the closed state.

[0107] If the judgment result of step S211 is yes, then execute step S212; if the judgment result of step S211 is no, then execute step S215.

[0108] Step S212, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence to update the test item sequence; after step S212, executing step S215.

[0109] Step S213: determine whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the closed state to the open state.

[0110] If the judgment result of step S213 is yes, then execute step S214; if the judgment result of step S213 is no, then execute step S215.

[0111] Step S214: Place all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is to switch from the closed state to the open state at the end of the test item sequence to update the test item sequence.

[0112] Step S215, determining whether there is a target test item in the test request that switches from the open state to the closed state and then to the open state.

[0113] If the judgment result of step S215 is yes, then step S216 is executed; if the judgment result of step S215 is no, then step S217 is executed.

[0114] Step S216, placing all target test items that are switched from the open state to the closed state and then to the open state at the end of the test item sequence to update the test item sequence; after step S216, executing step S217.

[0115] Step S217: output the final test item sequence.

[0116] Through the above steps S101 to S117, the number of switching times of the switch state of the three-phase switch to be tested in the entire test process can be reduced as much as possible, which is beneficial to reducing the risk of damage to the three-phase switch to be tested due to frequent switching, and is beneficial to shortening the processing time of the entire test process.

[0117] In some embodiments, the scheduling unit sequentially places all target test items whose test requirement switch state is the open state into the test item sequence according to the following steps: Step Sa1: randomly select a target test item whose test requirement switch state is an open state, and place it at the end of the test item sequence to update the test item sequence.

[0118] Step Sa2: Determine whether there is a target test item in the test request that is not included in the test item sequence and whose test requirement switch state is an open state.

[0119] If the judgment result of step Sa2 is yes, step Sa3 is executed; if the judgment result of step Sa2 is no, the process ends.

[0120] Step Sa3: each target test item in the test request that is not placed in the test item sequence and whose test requirement switch state is the open state is taken as the first test item to be scheduled, and the set similarity between the set of on-switch units configured for each first test item to be scheduled and the set of on-switch units of the target test item at the end of the test item sequence is calculated.

[0121] Step Sa4, placing a first test item to be arranged that has the greatest set similarity with the target test item at the end of the test item sequence at the end of the test item sequence to update the test item sequence; after step Sa4 is completed, executing step Sa2 again.

[0122] The arrangement unit sequentially places all target test items whose test requirement switch state is a closed state into the test item sequence according to the following steps.

[0123] Step Sb1, randomly selecting a target test item whose test requirement switch state is the closed state, and placing it at the end of the test item sequence to update the test item sequence.

[0124] Step Sb2: determine whether there is a target test item in the test request that is not included in the test item sequence and whose test requirement switch state is the closed state.

[0125] If the judgment result of step Sb2 is yes, step Sb3 is executed; if the judgment result of step Sb2 is no, the process ends.

[0126] Step Sb3, each target test item in the test request that is not placed in the test item sequence and whose test requirement switch state is the closed state is taken as the second test item to be scheduled, and the set similarity between the set of conductive switch units configured for each second test item to be scheduled and the set of conductive switch units of the target test item at the end of the test item sequence is calculated.

[0127] Step Sb4, placing a second test item to be arranged that has the greatest set similarity with the target test item at the end of the test item sequence at the end of the test item sequence to update the test item sequence; after step Sb4 is completed, executing step Sb2 again.

[0128] Optionally, the set similarity can be obtained by using the Jaccard similarity algorithm. Of course, other existing similarity algorithms can also be used in the present disclosure to calculate the similarity between two sets.

[0129] In the present disclosure, the greater the set similarity of the conductive switch unit sets configured for the two test items, the more similar the switch units required to be conductive when the two test items are performed are, and the fewer the number of switch units that need to adjust the switch state when the previous test item of the two test items ends and the next test item begins. Based on this, the test items with larger corresponding set similarity can be set adjacent to each other, so that the switch unit can be effectively prevented from frequently switching between the conductive state and the cut-off state, which is conducive to extending the service life of the switch unit.

[0130] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A switch integration test method, characterized in that: The method comprises: Receive a test request, wherein the test request records all target test items to be tested on the three-phase switch to be tested, and determine a switch test module corresponding to each target test item; Controlling the states of the switch units of the matrix switching isolation circuit so that the switch test modules corresponding to the target test items are electrically connected to the three-phase switch to be tested, and performing corresponding tests on the three-phase switch to be tested; Wherein, each switch test module is electrically connected to the three-phase switch to be tested through a matrix switching isolation circuit.

2. The switch integration test method according to claim 1, characterized in that: The matrix switching isolation circuit comprises a plurality of conductive circuits, each of which is provided with a switch unit for controlling the on and off of the conductive circuit, one end of the conductive circuit is connected to the corresponding switch test module, and the other end of the conductive circuit is connected to the corresponding signal terminal of the three-phase switch to be tested; The three-phase switch to be tested includes a plurality of signal terminals, and at least two switch test modules are connected to the same signal terminal through different conductive lines.

3. The switch integration test method according to claim 2, characterized in that: The switch test module includes: an insulation resistance test module, a loop resistance test module and a switch mechanical characteristic test module.

4. The switch integration test method according to claim 3, characterized in that: The insulation resistance test module is configured with a line terminal and a first ground terminal; The loop resistance test module is configured with: a positive current terminal, a positive voltage terminal, a negative voltage terminal and a negative current terminal; The switch mechanical characteristics test module is configured with: A-phase positive voltage terminal, B-phase positive voltage terminal, C-phase positive voltage terminal, A-phase negative voltage terminal, B-phase negative voltage terminal, C-phase negative voltage terminal, positive DC power supply terminal, opening control terminal, closing control terminal and negative DC power supply terminal; The three-phase switch to be tested is configured with: A-phase positive signal terminal, A-phase negative signal terminal, B-phase positive signal terminal, B-phase negative signal terminal, C-phase positive signal terminal, C-phase negative signal terminal, positive DC power supply signal terminal, opening signal terminal, closing signal terminal, negative DC power supply signal terminal, auxiliary opening signal terminal and earth signal terminal; The circuit terminal is respectively connected to the A-phase positive signal terminal, the B-phase positive signal terminal, the C-phase positive signal terminal, the auxiliary branch signal terminal, the positive DC power supply signal terminal, the opening signal terminal, the closing signal terminal, and the negative DC power supply signal terminal through different conductive circuits; The first grounding terminal is respectively connected to the A-phase negative signal terminal, the B-phase negative signal terminal, the C-phase negative signal terminal, and the earth signal terminal through different conductive lines; The positive current terminal is respectively connected to the A-phase positive signal terminal, the B-phase positive signal terminal, and the C-phase positive signal terminal through different conductive lines; The positive voltage terminal is respectively connected to the A-phase positive signal terminal, the B-phase positive signal terminal, and the C-phase positive signal terminal through different conductive circuits; The negative voltage terminal is respectively connected to the A-phase negative signal terminal, the B-phase negative signal terminal, and the C-phase negative signal terminal through different conductive circuits; The negative current terminal is respectively connected to the A-phase negative signal terminal, the B-phase negative signal terminal, the C-phase negative signal terminal, and the earth signal terminal through different conductive lines; The A-phase positive voltage terminal is connected to the A-phase positive signal terminal via a corresponding conductive circuit; The B-phase positive voltage terminal is connected to the B-phase positive signal terminal via a corresponding conductive circuit; The C-phase positive voltage terminal is connected to the C-phase positive signal terminal via a corresponding conductive circuit; The A-phase negative voltage terminal is connected to the A-phase negative signal terminal via a corresponding conductive circuit; The B-phase negative voltage terminal is connected to the B-phase negative signal terminal via a corresponding conductive circuit; The C-phase negative voltage terminal is connected to the C-phase negative signal terminal via a corresponding conductive circuit; The positive DC power terminal is connected to the positive DC power signal terminal via a corresponding conductive circuit; The opening control terminal is respectively connected to the opening signal terminal and the auxiliary opening signal terminal through different conductive lines; The closing control terminal is connected to the closing signal terminal through a corresponding conductive line; The negative DC power terminal is connected to the negative DC power signal terminal through a corresponding conductive circuit.

5. The switch integration test method according to claim 4, characterized in that: The A-phase positive signal terminal, A-phase negative signal terminal, B-phase positive signal terminal, B-phase negative signal terminal, C-phase positive signal terminal and C-phase negative signal terminal are also connected to the earth signal terminal through corresponding first grounding control switches.

6. The switch integration test method according to claim 4, characterized in that: The plurality of signal terminals also include: a sensor signal terminal, the sensor signal terminal is a multi-core aviation signal terminal, the switch mechanical characteristic test module is also configured with a plurality of sensor connection terminals, each of the sensor connection terminals is connected to a different core of the sensor signal terminal through a different conductive line; And / or, the multiple wiring signal terminals also include: an analog signal terminal, the analog signal terminal is a multi-core aviation signal terminal, and the switch mechanical characteristics test module is also configured with multiple analog connection terminals, each of the analog connection terminals is connected to a different core in the analog signal terminal through a different conductive circuit.

7. The switch integration test method according to claim 2, characterized in that: The method further comprises: Obtaining the test requirement switch state of each of the target test items, and classifying the target test items based on the test requirement switch state of each of the target test items, wherein the test requirement switch state of the target test item is one of an open state, a closed state, switching from a closed state to an open state, switching from an open state to a closed state, and switching from an open state to a closed state and then to an open state; Obtain the initial switch state of the three-phase switch to be tested, determine the test order of the target test items based on the initial switch state and the test requirement switch state of each target test item, and perform corresponding tests on the three-phase switch to be tested based on the test order, wherein the initial switch state includes an open state and a closed state.

8. The switch integration test method according to claim 7, characterized in that: When the initial switch state of the three-phase switch to be tested is the open state, the test sequence of the target test items is determined based on the initial switch state and the test requirement switch state of each target test item, and the corresponding test is performed on the three-phase switch to be tested based on the test sequence as follows: Step S101, determining whether there is a target test item in the test request that the switch state is an open state; If the judgment result of step S101 is yes, then execute step S102; if the judgment result of step S101 is no, then execute step S103; Step S102, placing all the target test items whose test requirement switch state is the open state in the test item sequence in sequence to update the test item sequence; after step S102 is completed, executing step S103; Step S103, determining whether there is a target test item in the test request that requires the switch state to be switched from an open state to a closed state; If the judgment result of step S103 is yes, then execute step S104; if the judgment result of step S103 is no, then execute step S105; Step S104, placing one of the target test items whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence to update the test item sequence; after step S104 is completed, executing step S105; Step S105, determining whether there is a target test item in the test request that the switch state is a closed state; If the judgment result of step S105 is yes, then execute step S106; if the judgment result of step S105 is no, then execute step S107; Step S106, placing all the target test items whose test requirement switch state is the open state in sequence at the end of the test item sequence to update the test item sequence; after step S106 is completed, executing step S107; Step S107, determining whether there is a target test item in the test request that requires the switch state to be switched from the closed state to the open state; If the judgment result of step S107 is yes, then execute step S108; if the judgment result of step S107 is no, then execute step S113; Step S108, placing one of the target test items whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S108 is completed, executing step S109; Step S109, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requirement switch state is switched from the open state to the closed state; If the judgment result of step S109 is yes, then execute step S110; If the judgment result of step S109 is no, then execute step S111; Step S110, placing one of the target test items that is not placed in the test item sequence and whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence to update the test item sequence; after step S110 is completed, executing step S107 again; Step S111, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the closed state to the open state; If the judgment result of step S111 is yes, then execute step S112; if the judgment result of step S111 is no, then execute step S115; Step S112, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence, so as to update the test item sequence; after step S112, executing step S115; Step S113, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requirement switch state is switched from the open state to the closed state; If the judgment result of step S113 is yes, then execute step S114; if the judgment result of step S113 is no, then execute step S115; Step S114, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence, so as to update the test item sequence; Step S115, determining whether there is a target test item in the test request that switches from an open state to a closed state and then to an open state; If the judgment result of step S115 is yes, then execute step S116; if the judgment result of step S115 is no, then execute step S117; Step S116, placing all target test items that are switched from the open state to the closed state and then to the open state at the end of the test item sequence to update the test item sequence; after step S116 is completed, executing step S117; Step S117: output the final test item sequence.

9. The switch integration test method according to claim 7, characterized in that: When the initial switch state of the three-phase switch to be tested is the closed state, the test sequence of the target test items is determined based on the initial switch state and the test requirement switch state of each target test item, and the corresponding test is performed on the three-phase switch to be tested based on the test sequence as follows: Step S201, determining whether there is a target test item in the test request that the switch state is a closed state; If the judgment result of step S201 is yes, then execute step S202; if the judgment result of step S201 is no, then execute step S203; Step S202, placing all the target test items whose test requirement switch state is the closed state in the test item sequence in sequence, so as to update the test item sequence; after step S202 is completed, executing step S203; Step S203, determining whether there is a target test item in the test request that requires the switch state to be switched from the closed state to the open state; If the judgment result of step S203 is yes, then execute step S204; if the judgment result of step S203 is no, then execute step S205; Step S204, placing one of the target test items whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S204 is completed, executing step S205; Step S205, determining whether there is a target test item in the test request whose test requirement switch state is an open state; If the judgment result of step S205 is yes, then execute step S206; if the judgment result of step S205 is no, then execute step S207; Step S206, placing all the target test items whose test requirement switch state is the closed state in sequence at the end of the test item sequence to update the test item sequence; after step S206 is completed, executing step S207; Step S207, determining whether there is a target test item in the test request that requires the switch state to be switched from an open state to a closed state; If the judgment result of step S207 is yes, then execute step S208; if the judgment result of step S207 is no, then execute step S213; Step S208, placing one of the target test items whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence to update the test item sequence; after step S208 is completed, executing step S209; Step S209, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requirement switch state is switched from the closed state to the open state; If the judgment result of step S209 is yes, then execute step S210; If the judgment result of step S209 is no, then execute step S211; Step S210, placing one of the target test items that is not placed in the test item sequence and whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S210 is completed, executing step S207 again; Step S211, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requirement switch state is switched from the open state to the closed state; If the judgment result of step S211 is yes, then execute step S212; if the judgment result of step S211 is no, then execute step S215; Step S212, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence, so as to update the test item sequence; After step S212, step S215 is executed; Step S213, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the closed state to the open state; If the judgment result of step S213 is yes, then execute step S214; if the judgment result of step S213 is no, then execute step S215; Step S214, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence, so as to update the test item sequence; Step S215, determining whether there is a target test item in the test request that switches from an open state to a closed state and then to an open state; If the judgment result of step S215 is yes, then execute step S216; if the judgment result of step S215 is no, then execute step S217; Step S216, placing all target test items that are switched from the open state to the closed state and then to the open state at the end of the test item sequence to update the test item sequence; After step S216, execute step S217; Step S217: output the final test item sequence.

10. The switch integration test method according to claim 8 or 9, characterized in that: According to the following steps, all the target test items whose test requirement switch state is the open state are sequentially placed in the test item sequence: Step Sa1, randomly selecting one of the target test items whose test requirement switch state is an open state, and placing it at the end of the test item sequence to update the test item sequence; Step Sa2, determining whether the test request contains the target test item that is not included in the test item sequence and whose test requirement switch state is an open state; If the judgment result of step Sa2 is yes, then step Sa3 is executed; if the judgment result of step Sa2 is no, then the process ends; Step Sa3, taking each of the target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is the open state as the first test item to be scheduled, and calculating the set similarity between the set of on-switch units configured for each first test item to be scheduled and the set of on-switch units of the target test item at the end of the test item sequence; Step Sa4, placing the first test item to be arranged, which has the largest set similarity with the target test item at the end of the test item sequence, at the end of the test item sequence to update the test item sequence; after step Sa4 is completed, executing step Sa2 again; And / or, all the target test items whose test requirement switch state is the closed state are sequentially placed in the test item sequence according to the following steps: Step Sb1, randomly selecting one of the target test items whose test requirement switch state is the closed state, and placing it at the end of the test item sequence to update the test item sequence; Step Sb2, determining whether the test request includes the target test item that is not included in the test item sequence and whose test requirement switch state is the closed state; If the judgment result of step Sb2 is yes, then execute step Sb3; If the judgment result of step Sb2 is no, the process ends; Step Sb3, taking each of the target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is the closed state as the second test item to be scheduled, and calculating the set similarity between the set of conductive switch units configured for each second test item to be scheduled and the set of conductive switch units of the target test item at the end of the test item sequence; Step Sb4, placing the second test item to be arranged, which has the largest set similarity with the target test item at the end of the test item sequence, at the end of the test item sequence to update the test item sequence; After step Sb4 is completed, step Sb2 is executed again.

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