Atmospheric vertical refraction correction method and device based on local meteorological field model

Abstract

The invention relates to the technical field of precision engineering intelligent monitoring, in particular to an atmospheric vertical refraction correction method and device based on a local meteorological field model, and the method comprises the steps: obtaining meteorological data with matched time based on initial meteorological data of a measurement point in a target observation station and measurement data affected by atmospheric vertical refraction; constructing a local meteorological field model based on meteorological data and DEM data including a target observation station and a measurement point; determining the position of the refractive index profile structure in combination with model data in the profile where the ranging optical path curve is located; and in combination with the snell law and the refractive index profile structure, atmospheric vertical refraction correction is carried out on the measured data to obtain a horizontal distance and a height difference which weaken the influence of atmospheric vertical refraction, and further a three-dimensional coordinate of a measuring point with higher precision is obtained. Therefore, the problems that in the related technology, under the complex atmospheric environment, the monitoring precision of the horizontal and vertical displacement of the measuring point is low, the measuring point cannot be used under the actual monitoring environment, and high-precision monitoring and early warning results are difficult to obtain are solved.

Description

Technical Field

[0001] The present application relates to the field of precision engineering intelligent monitoring technology, and in particular to a method and device for atmospheric vertical refraction correction based on a local meteorological field model. Background Art

[0002] Atmospheric vertical refraction is mainly affected by meteorological factors such as temperature, air pressure and humidity, among which air pressure and temperature play the most significant role. These meteorological factors themselves are affected by changes in seasons, weather and altitude. Therefore, in the process of precision engineering intelligent monitoring, it is necessary to reduce the impact of meteorological factors on trigonometric height measurement.

[0003] In the related technologies, there are two commonly used methods for precision engineering intelligent monitoring: first, using the electromagnetic wave ranging principle and the Barrell-Sears formula, the original slant distance observation value is directly corrected through the meteorological data collected by the measuring station; second, the influence of the atmospheric vertical refraction coefficient k is determined or weakened by introducing the atmospheric vertical refraction coefficient. The method for calculating the refraction coefficient k can use redundant observations and adopt different additional atmospheric refraction adjustment models to calculate the refraction coefficient k; it can also derive a precise calculation formula based on atmospheric thermodynamics and atmospheric physics, and use the measured meteorological elements to calculate the refraction coefficient k.

[0004] However, in the related technologies, the first method mainly considers the meteorological factors of a single measuring station, and the vertical displacement monitoring accuracy is low; while the second method has a large deviation in the calculation results in the actual complex environment. Therefore, how to obtain more accurate atmospheric vertical refraction correction is still a key issue that needs to be solved urgently. Summary of the invention

[0005] The present application provides an atmospheric vertical refraction correction method and device based on a local meteorological field model to solve the problems in related technologies, such as low accuracy of horizontal and vertical displacement monitoring of measuring points in complex atmospheric environments, large deviations, inability to be used under high-precision actual monitoring environment requirements, and difficulty in obtaining high-precision monitoring and early warning results.

[0006] In a first aspect, an embodiment of the present application provides an atmospheric vertical refraction correction method based on a local meteorological field model, comprising the following steps: obtaining initial meteorological data of a measuring point in a target measuring station and measurement data affected by atmospheric vertical refraction, and determining, based on the initial meteorological data and the measurement data, the measurement time of the initial meteorological data and the meteorological data whose measurement time satisfies a preset matching time; constructing a local meteorological field model including the target measuring station and the measuring point based on the meteorological data and DEM (Digital Elevation Model) data including the target measuring station and the measuring point; determining the location of a refractive index profile structure in combination with the measurement data and the local meteorological field model data in the profile where a ranging light path curve is located, wherein the refractive index profile structure is composed of at least one refractive index layer, and different refractive index profile structures have different layer thicknesses; performing atmospheric vertical refraction correction on the measurement data in combination with Snell's law and the refractive index profile structure, obtaining a horizontal distance and a height difference that reduce the influence of atmospheric vertical refraction, and obtaining a three-dimensional coordinate of the measuring point with higher accuracy based on the horizontal distance and the height difference.

[0007] Optionally, in an embodiment of the present application, it also includes: determining the resolution of the local meteorological field model according to the DEM data; and determining the resolution of the refractive index profile structure based on the resolution.

[0008] Optionally, in one embodiment of the present application, the measurement data is corrected for atmospheric vertical refraction in combination with Snell's law and the refractive index profile structure to obtain a horizontal distance and elevation difference that reduce the influence of atmospheric vertical refraction, including: calculating the light propagation time of each refractive index layer in combination with the refractive index profile structure and the layer thickness; accumulating the light propagation time of the refractive index layer until the accumulated light propagation time is greater than the propagation time of the slant distance measurement value in the measurement data, and correcting the last layer of the refractive index profile structure based on the accumulated light propagation time to obtain the corrected last layer; based on the corrected last layer, accumulating all layers in the refractive index profile structure to calculate the horizontal distance and elevation difference of the measurement data.

[0009] Optionally, in one embodiment of the present application, the calculation formulas for the horizontal distance and the height difference may be, but are not limited to, respectively:

[0010]

[0011] Where n0 is the reference refractive index of the measuring robot, S ce is the slope distance measurement value, n i is the fixed refractive index constant obtained from the refractive index profile structure, ΔS i is the optical path length in the i-th layer, Hi is the height, S sum , D sum and H sum They are the corrected slope distance, horizontal distance and height difference respectively.

[0012] Optionally, in one embodiment of the present application, the calculation formula for the three-dimensional coordinates of the measuring point may be, but is not limited to,:

[0013]

[0014] Among them, (X ce ,Y ce ,H ce ) is the coordinate of the measuring station, α is the measuring horizontal angle, i is the instrument height, and v is the prism height.

[0015] According to a second aspect of the present application, an atmospheric vertical refraction correction device based on a local meteorological field model is provided, comprising: a matching module, for acquiring initial meteorological data of a measuring point in a target measuring station and measurement data affected by atmospheric vertical refraction, and determining, based on the initial meteorological data and the measurement data, the measurement time of the initial meteorological data and the meteorological data whose measurement time satisfies a preset matching time; a construction module, for constructing a local meteorological field model including the target measuring station and the measuring point based on the meteorological data and DEM data including the target measuring station and the measuring point; a generation module, for determining the location of a refractive index profile structure in combination with the measurement data and the local meteorological field model data in the profile where the ranging light path curve is located, wherein the refractive index profile structure is composed of at least one refractive index layer, and the layer thicknesses of different refractive index profile structures are different; an elimination module, for performing atmospheric vertical refraction correction on the measurement data in combination with Snell's law and the refractive index profile structure, obtaining a horizontal distance and a height difference that reduce the influence of atmospheric vertical refraction, and obtaining the three-dimensional coordinates of the measuring point with higher accuracy based on the horizontal distance and the height difference.

[0016] Optionally, in one embodiment of the present application, it also includes: a first determination module, used to determine the resolution of the local meteorological field model according to the DEM data; and a second determination module, used to determine the resolution of the refractive index profile structure based on the resolution.

[0017] Optionally, in one embodiment of the present application, the elimination module includes: a first calculation unit, used to calculate the light propagation time of each refractive index layer in combination with the refractive index profile structure and the layer thickness; a determination unit, used to accumulate the light propagation time of the refractive index layer until the accumulated light propagation time is greater than the propagation time of the slant distance measurement value in the measurement data, and correct the last layer of the refractive index profile structure based on the accumulated light propagation time to obtain the corrected last layer; a second calculation unit, based on the corrected last layer, accumulates all layers in the refractive index profile structure to calculate the horizontal distance and height difference of the measurement data.

[0018] Optionally, in one embodiment of the present application, the calculation formulas for the horizontal distance and the height difference may be, but are not limited to, respectively:

[0019]

[0020] Where n0 is the reference refractive index of the measuring robot, S ce is the slope distance measurement value, n i is the fixed refractive index constant obtained from the refractive index profile structure, ΔS i is the optical path length in the i-th layer, H i is the height, S sum , D sum and H sum They are the corrected slope distance, horizontal distance and height difference respectively.

[0021] Optionally, in one embodiment of the present application, the calculation formula for the three-dimensional coordinates of the measuring point may be, but is not limited to,:

[0022]

[0023] Among them, (X ce ,Y ce ,H ce ) is the coordinate of the measuring station, α is the measuring horizontal angle, i is the instrument height, and v is the prism height.

[0024] The third aspect of the present application provides an electronic device, comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the atmospheric vertical refraction correction method based on the local meteorological field model as described in the above embodiment.

[0025] The fourth aspect of the present application provides a computer-readable storage medium, which stores a computer program. When the program is executed by a processor, it implements the above-mentioned atmospheric vertical refraction correction method based on the local meteorological field model.

[0026] The fifth aspect of the present application provides a computer program product, including a computer program, which, when executed, implements the above-mentioned atmospheric vertical refraction correction method based on the local meteorological field model.

[0027] The embodiment of the present application can obtain meteorological data by combining the initial meteorological data and the measurement data affected by the vertical refraction of the atmosphere, and construct a local meteorological field model based on the meteorological data, on this basis, further construct a refractive index profile structure. The refractive index profile structure is layered and tracked in combination with the obtained measurement data, and then a three-dimensional coordinate that eliminates the influence of the vertical refraction of the atmosphere is obtained, thereby reducing the influence of the vertical refraction of the atmosphere on the distance measurement value, correcting the horizontal distance measurement value in the horizontal plane and the height difference measurement value in the vertical plane, improving the horizontal displacement monitoring accuracy and vertical displacement monitoring accuracy of the monitoring point, and providing more accurate data support for precision intelligent engineering monitoring. Thus, the problems in the related art that the horizontal and vertical displacement monitoring accuracy of the measuring point is low in a complex atmospheric environment, there is a large deviation, it cannot be used under the requirements of the actual monitoring environment with high precision, and it is difficult to obtain high-precision monitoring and early warning results are solved.

[0028] Additional aspects and advantages of the present application will be given in part in the description below, and in part will become apparent from the description below, or will be learned through the practice of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] The above and / or additional aspects and advantages of the present application will become apparent and easily understood from the following description of the embodiments in conjunction with the accompanying drawings, in which:

[0030] Figure 1 A flowchart of an atmospheric vertical refraction correction method based on a local meteorological field model provided according to an embodiment of the present application;

[0031] Figure 2 A schematic block diagram of a constant refractive index ray tracing principle within a layer provided according to an embodiment of the present application;

[0032] Figure 3 A schematic block diagram of the timing changes of the coordinates of point L5-7X before and after correction according to an embodiment of the present application;

[0033] Figure 4 A schematic block diagram of the timing changes of the Y coordinates of point L5-7 before and after correction according to an embodiment of the present application;

[0034] Figure 5 A schematic block diagram of the timing changes of the coordinates of points L5-7H before and after correction according to an embodiment of the present application;

[0035] Figure 6A flowchart of the working principle of an atmospheric vertical refraction correction method based on a local meteorological field model provided according to an embodiment of the present application;

[0036] Figure 7 A schematic block diagram of an atmospheric vertical refraction correction device based on a local meteorological field model provided according to an embodiment of the present application;

[0037] Figure 8 It is a schematic diagram of the structure of an electronic device provided according to an embodiment of the present application. DETAILED DESCRIPTION

[0038] Embodiments of the present application are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended to be used to explain the present application, and should not be construed as limiting the present application.

[0039] The following is a description of the atmospheric vertical refraction correction method and device based on the local meteorological field model of the embodiment of the present application with reference to the accompanying drawings. In view of the problem mentioned in the above background technology that the horizontal and vertical displacement monitoring accuracy of the measuring point is low under a complex atmospheric environment, there is a large deviation, it cannot be used under the requirements of the actual monitoring environment with high precision, and it is difficult to obtain high-precision monitoring and early warning results, the present application provides an atmospheric vertical refraction correction method based on a local meteorological field model, in which the initial meteorological data and the measurement data affected by the atmospheric vertical refraction can be combined to obtain meteorological data, and a local meteorological field model is constructed based on the meteorological data, on this basis, a refractive index profile structure is further constructed. The refractive index profile structure is hierarchically tracked in combination with the obtained measurement data, and then a three-dimensional coordinate that eliminates the influence of atmospheric vertical refraction is obtained, thereby reducing the influence of atmospheric vertical refraction on the distance measurement value, correcting the horizontal distance measurement value in the horizontal plane and the height difference measurement value in the vertical plane, improving the horizontal displacement monitoring accuracy and vertical displacement monitoring accuracy of the monitoring point, and providing more accurate data support for precision intelligent engineering monitoring. As a result, the problems in related technologies such as low monitoring accuracy of horizontal and vertical displacements of measuring points in complex atmospheric environments, large deviations, inability to be used under high-precision actual monitoring environments, and difficulty in obtaining high-precision monitoring and early warning results are solved.

[0040] Specifically, Figure 1 The present invention provides a flowchart of an atmospheric vertical refraction correction method based on a local meteorological field model according to an embodiment of the present application.

[0041] like Figure 1 As shown, the atmospheric vertical refraction correction method based on the local meteorological field model includes the following steps:

[0042] In step S101, initial meteorological data of a measuring point in a target measuring station and measurement data affected by atmospheric vertical refraction are obtained, and based on the initial meteorological data and the measurement data, the measurement time of the initial meteorological data and the measurement time of the measurement data satisfying a preset matching time are determined.

[0043] It can be understood that the initial meteorological data of the embodiment of the present application can be but is not limited to being obtained by meteorological stations such as discrete meteorological stations or automatic meteorological stations, and the measurement data can be but is not limited to being obtained by a measurement robot in the target measuring station. The specific settings can be made by technicians in this field according to actual conditions, and this application does not impose any specific restrictions.

[0044] In some embodiments, the embodiments of the present application can match the initial meteorological data obtained by discrete meteorological stations and the measurement data affected by atmospheric vertical refraction collected by the measurement robot in the target measuring station based on the measurement time, ensuring that the measurement time of the initial meteorological data and the measurement time of the measurement data meet a certain matching time, and then obtain meteorological data that meets a certain matching time, so that the obtained meteorological data and the measurement data are consistent and relevant.

[0045] Among them, the certain matching time can be set by technicians in this field according to actual conditions, and this application does not make any specific restrictions.

[0046] Exemplarily, the embodiment of the present application matches the initial meteorological data obtained by the discrete meteorological station with the measurement data affected by atmospheric vertical refraction collected by the measurement robot in the target station to ensure the consistency of the measurement time. For example, if the data of the discrete meteorological station is missing, the meteorological station is deleted and only the remaining stations are used.

[0047] In step S102, a local meteorological field model including the target station and the measuring points is constructed based on the meteorological data and the DEM data including the target station and the measuring points.

[0048] It can be understood by those skilled in the art that the embodiments of the present application can merge the meteorological data obtained by matching the initial meteorological data with the DEM data containing the target measuring station and measuring points, and use the local thin plate smooth spline model to perform interpolation simulation in the area covered by the DEM data to obtain the interpolation results of the meteorological factors at the three-dimensional grid point locations as a local meteorological field model.

[0049] Exemplarily, the theoretical statistical model expression of the local meteorological field model in the embodiment of the present application may be, but is not limited to,:

[0050] z i =f(x i )+b T y i +e i (i=1,2,3...),

[0051] Among them, z i is the meteorological factor at point i in space, and f is the spline independent variable x i The smooth function is used to describe the functional relationship between meteorological factors and horizontal and vertical coordinates, y i is the P-dimensional independent covariate, b is its coefficient, which is used to describe the influence of height difference factors on the interpolation surface, and ei is the random error, which is usually ignored.

[0052] Further, in the embodiment of the present application, the function f and the coefficient b may be determined by least squares estimation, wherein the expression of the least squares estimation may be, but is not limited to,:

[0053]

[0054] Among them, J m (f) is the function f(x i ), which is the m-order partial derivative of the function f, and ρ is a positive smooth function, which is determined by minimizing GCV (Generalized Cross Validation).

[0055] It can be understood that the embodiment of the present application can adopt the "one point move" method to remove one meteorological collection target site in turn, use the remaining sites to perform surface fitting under certain smoothing parameters, obtain the estimated value of the site, and then calculate the variance of the observed value and the estimated value, and then obtain the interpolation result of the meteorological factors at the three-dimensional grid point position as a local meteorological field model.

[0056] In step S103, the location of the refractive index profile structure is determined by combining the measurement data and the local meteorological field model data within the profile where the ranging light path curve is located, wherein the refractive index profile structure is composed of at least one refractive index layer, and different refractive index profile structures have different layer thicknesses.

[0057] It can be understood that the embodiments of the present application can combine the measurement data and the plumb plane where the ranging light path curve is located to determine at least one profile of the meteorological data. The profile may include but is not limited to a small-scale meteorological field including the ranging light path curve profile to improve the computer speed, and perform a more detailed simulation of the meteorological field based on the DEM data in the target side station to extract the meteorological factors of the interpolation points on the ranging light path curve path.

[0058] In other words, the embodiment of the present application can extract the meteorological field simulation results of the grid points in the profile and calculate the refractive index values ​​of these grid points. In the embodiment of the present application, the refractive index can be calculated by the Rüeger refractive index formula, and the expression of the Rüeger refractive index formula can be but is not limited to:

[0059]

[0060] Among them, T is the actual temperature in the environment, P is the actual atmospheric pressure in the environment, e is the water vapor pressure, N sg It is the atmospheric group refraction under standard atmospheric environment.

[0061] Further, in the embodiment of the present application, the expression of the atmospheric group refractivity under the standard atmospheric environment may be, but is not limited to,:

[0062]

[0063] Where λ is the wavelength of the modulation wave of the measurement robot, 650μm.

[0064] The water vapor pressure e in the embodiment of the present application can be calculated from the relative humidity f and the ambient temperature T, and its expression can be but is not limited to:

[0065]

[0066] Among them, e0 is the natural base, and E is the saturated water vapor pressure, which can be calculated by the BUCK model, or a higher-precision calculation model can be selected according to actual engineering needs. This application does not make any specific restrictions.

[0067] During the actual implementation process, the embodiments of the present application can be combined with the measurement data, with the plumb plane where the ranging light path curve is located as the section, to obtain at least one section of the measurement data, and extract the meteorological field simulation results of the grid points in the section, calculate the refractive index values ​​of these grid points, and the refractive index at the grid points constitutes a vertical section of the refractive index.

[0068] It should be noted that the embodiment of the present application can approximate the refractive index vertical profile structure as being composed of multiple refractive index layers of simple structure, and use the refractive index constant in each independent layer to replace the continuous change of the entire refractive index vertical profile.

[0069] In addition, the embodiment of the present application can cut the ranging light path curve into different layers by a fixed layer thickness ΔH, and select the refractive index of the center point in the layer as the constant refractive index of the layer, and combine them into a vertical refractive index profile, that is, the layer thickness of different refractive index profile structures is different. Moreover, the smaller the selected value of the layer thickness ΔH in the embodiment of the present application, the more layers of light tracing, and the closer the fitted light propagation path is to the curve, but limited by the accuracy of the vertical refractive index profile, the more accumulated layers, the greater the accumulated refractive index fitting error, so that the atmospheric vertical refraction correction deviates from the actual light path propagation situation, so the layer thickness ΔH needs to be specifically determined after comprehensive consideration of the actual height difference of the measurement line and the refractive index fitting accuracy. As a possible implementation method, the embodiment of the present application can combine the accuracy of the refractive index profile structure and the height difference hc between the measurement point and the target measurement station to flexibly determine the fixed value of the layer thickness ΔH of each measurement point, which can be but not limited to expressed as:

[0070] The specific configuration can be made by technicians in this field according to actual conditions, and this application does not impose any specific limitations.

[0071] Optionally, in one embodiment of the present application, it also includes: determining the resolution of the local meteorological field model according to the DEM data; and determining the resolution of the refractive index profile structure based on the resolution.

[0072] In the actual implementation process, the resolution of the local meteorological field model of the embodiment of the present application can be determined according to the DEM data. It should be noted that the higher the resolution, the smoother the fitting of each spatial point, the finer the grid point meteorological value obtained, and the more accurate the vertical profile of the refractive index. However, the amount of calculation will increase, and the requirements for computer hardware will also be higher. For example, the plane range of the monitoring area of ​​the target site of the embodiment of the present application is about 650m×400m, the maximum height difference of the measuring point is 140m, and 7 automatic weather stations are distributed inside and outside the monitoring area. Combined with the DEM data in the measuring area, the interpolation grid point resolution of the local meteorological field is determined. Therefore, the embodiment of the present application can reasonably determine the resolution of the local meteorological field model after comprehensively considering the actual needs. It can be set by technicians in this field according to the actual situation, and this application does not make specific restrictions.

[0073] In step S104, the atmospheric vertical refraction correction is performed on the measured data in combination with Snell's law and the refractive index profile structure to obtain the horizontal distance and height difference that reduce the influence of atmospheric vertical refraction, and the three-dimensional coordinates of the measuring point with higher accuracy are obtained based on the horizontal distance and height difference. The calculation formula of the three-dimensional coordinates of the measuring point can be, but is not limited to, as follows:

[0074]

[0075] Among them, (X ce ,Y ce ,Hce ) is the coordinate of the measuring station, α is the measuring horizontal angle, i is the instrument height, and v is the prism height.

[0076] Furthermore, the embodiment of the present application can use the layer thickness to track the light propagation path of each measuring point and correct the last layer, see Figure 2 , at height H i In the corresponding i-th layer, the fixed refractive index constant n is obtained from the refractive index profile result i , according to the principle of ray tracing, see Figure 2 , the tracing results of the light propagation path in each layer can be expressed as but not limited to:

[0077]

[0078] ΔD i =(H i+1 -H i )×tanθ i

[0079] Among them, ΔS i is the optical path length in the i-th layer, ΔD i is the horizontal distance length within the i-th layer.

[0080] It should be noted that the embodiment of the present application can calculate the horizontal distance and height difference that eliminate the influence of vertical refraction of the atmosphere through the above steps, and then calculate the three-dimensional coordinates of the measuring point used to eliminate the influence of vertical refraction of the atmosphere.

[0081] Among them, in the embodiment of the present application, the three-dimensional coordinate calculation formula of the measuring point for precision engineering measurement is:

[0082]

[0083] Where R is the radius of curvature of the earth.

[0084] It should be noted that in the embodiment of the present application, the earth curvature correction is not necessary in the precision engineering measurement. Therefore, the embodiment of the present application can decide whether to implement this correction according to the actual situation of the project. The specific setting can be made by technicians in this field according to the actual situation. The present application does not make specific restrictions. The calculation formula of the corrected three-dimensional coordinates can be but is not limited to:

[0085]

[0086] Among them, (X ce ,Y ce ,H ce ) is the coordinate of the measuring station, α is the measuring horizontal angle, i is the instrument height, v is the prism height, and further, in the embodiment of the present application, the correction results of some points refer to Figure 3 , 4, 5.

[0087] Optionally, in one embodiment of the present application, the atmospheric vertical refraction correction is performed on the measurement data in combination with Snell's law and the refractive index profile structure to obtain the horizontal distance and height difference that reduce the influence of atmospheric vertical refraction, including: calculating the light propagation time of each refractive index layer in combination with the refractive index profile structure and layer thickness; accumulating the light propagation time of the refractive index layer until the accumulated light propagation time is greater than the propagation time of the slant distance measurement value in the measurement data, and correcting the last layer of the refractive index profile structure based on the accumulated light propagation time to obtain the corrected last layer; based on the corrected last layer, accumulating all layers in the refractive index profile structure to calculate the horizontal distance and height difference of the measurement data. Among them, the calculation formulas for the horizontal distance and height difference can be, but are not limited to, respectively:

[0088]

[0089] Where n0 is the reference refractive index of the measuring robot, S ce is the slope distance measurement value, n i is the fixed refractive index constant obtained from the refractive index profile results, ΔS i is the optical path length in the i-th layer, H i is the height, S sum , D sum and H sum They are the corrected slope distance, horizontal distance and height difference respectively.

[0090] As a possible implementation method, the embodiment of the present application can combine the refractive index profile structure and layer thickness to calculate the light propagation time of each refractive index layer. When the accumulated light propagation time is greater than the propagation time of the slant distance measurement value in the measurement data, the last layer of the refractive index profile structure is corrected, and based on the corrected last layer, all layers in the refractive index profile structure are accumulated to calculate the horizontal distance and height difference of the measurement data.

[0091] For example, the embodiment of the present application can combine the refractive index profile structure and Snell's law to determine the layer thickness ΔH and then track the light propagation path layer by layer, using n i ×ΔS i The equivalent one-way propagation time of the light, when the cumulative N+1 layer propagation time is greater than n0×S ce When , the tracking is stopped and the last layer is calculated to obtain the corrected slant distance S sum , horizontal distance D sum and height difference H sum .

[0092] That is to say, in the embodiment of the present application, since the propagation speed of light in the air is t=n*S / C0, where C0 is the speed of light in a vacuum and is a constant, the embodiment of the present application can use ni ×ΔS i The equivalent one-way propagation time of the light, when the cumulative N+1 layer propagation time is greater than n0×S ce When , the tracking is stopped and the last layer is calculated, then the horizontal distance D after the tracking is ended sum and height difference H sum The calculation formulas can be, but are not limited to, respectively:

[0093]

[0094] Where n0 is the reference refractive index of the measuring robot, S ce is the slope distance measurement value, n i is the fixed refractive index constant obtained from the refractive index profile structure, ΔS i is the optical path length in the i-th layer, H i is the height, S sum , D sum and H sum They are the corrected slope distance, horizontal distance and height difference respectively.

[0095] The working principle of the atmospheric vertical refraction correction method based on the local meteorological field model proposed in the embodiment of the present application is described in detail below in conjunction with a specific embodiment.

[0096] Figure 6 The present invention is a flowchart of the working principle of an atmospheric vertical refraction correction method based on a local meteorological field model provided according to an embodiment of the present application.

[0097] Step S601: Matching initial meteorological data.

[0098] It can be understood that the embodiment of the present application can match the initial meteorological data obtained by the discrete meteorological station and the measurement data collected by the measurement robot in the target measuring station according to the measurement time, ensuring that the measurement time of the initial meteorological data and the measurement time of the measurement data meet a certain matching time, and thus obtain meteorological data that meets a certain matching time.

[0099] Step S602: Survey area DEM data.

[0100] It can be understood that the embodiment of the present application can obtain DEM data of the survey area based on the survey points in the target survey station.

[0101] Step S603: Local meteorological field model.

[0102] Among them, the embodiment of the present application can integrate the meteorological data obtained by processing the initial meteorological data with the DEM data containing the target measuring station and measuring points. In the area covered by the DEM data, the local thin plate smooth spline model is used to perform interpolation simulation to obtain the interpolation results of meteorological factors at the three-dimensional grid point location as a local meteorological field model.

[0103] Step S604: refractive index profile structure.

[0104] Among them, the embodiment of the present application can determine the profile of meteorological data according to the vertical plane where the ranging light path curve is located, extract the meteorological field simulation results of the grid points in the profile, calculate the refractive index values ​​of these grid points, and the refractive index at the grid points constitutes a vertical profile of refractive index.

[0105] Step S605: measuring data.

[0106] Among them, the embodiment of the present application can obtain the measured zenith distance, slant distance and horizontal angle based on the measurement data affected by the vertical refraction of the atmosphere collected by the measurement robot, and then obtain the three-dimensional coordinates of the measurement point affected by the vertical refraction of the atmosphere.

[0107] Step S606: Ray tracing improvement.

[0108] The embodiment of the present application can combine the refractive index profile structure and Snell's law to determine the layer thickness ΔH and then track the light propagation path layer by layer. i ×ΔS i The equivalent one-way propagation time of the light, when the cumulative N+1 layer propagation time is greater than n0×S ce When , the tracking is stopped and the last layer is calculated to obtain the corrected slant distance S sum , horizontal distance D sum and height difference H sum .

[0109] Step S607: height difference improvement result.

[0110] It can be understood that the embodiments of the present application can use the horizontal distance and height difference to reduce the influence of the vertical refraction of the atmosphere to obtain the three-dimensional coordinates of the measuring point with higher accuracy.

[0111] According to the atmospheric vertical refraction correction method based on the local meteorological field model proposed in the embodiment of the present application, the meteorological data can be obtained by combining the initial meteorological data and the measurement data affected by the atmospheric vertical refraction, and the local meteorological field model is constructed based on the meteorological data. On this basis, the refractive index profile structure is further constructed. The refractive index profile structure is layered and tracked in combination with the obtained measurement data, and then the three-dimensional coordinates that eliminate the influence of the atmospheric vertical refraction are obtained, thereby weakening the influence of the atmospheric vertical refraction on the distance measurement value, correcting the horizontal distance measurement value in the horizontal plane and the height difference measurement value in the vertical plane, improving the horizontal displacement monitoring accuracy and vertical displacement monitoring accuracy of the monitoring point, and providing more accurate data support for precision intelligent engineering monitoring. Therefore, the problems in the related technology that the horizontal and vertical displacement monitoring accuracy of the measuring point is low in a complex atmospheric environment, there is a large deviation, it cannot be used under the requirements of the actual monitoring environment with high precision, and it is difficult to obtain high-precision monitoring and early warning results are solved.

[0112] Next, the atmospheric vertical refraction correction device based on the local meteorological field model proposed in accordance with the embodiment of the present application is described with reference to the accompanying drawings.

[0113] Figure 7 It is a block diagram of an atmospheric vertical refraction correction device based on a local meteorological field model provided according to an embodiment of the present application.

[0114] like Figure 7 As shown, the atmospheric vertical refraction correction device 10 based on the local meteorological field model includes: a matching module 100, a construction module 200, a generation module 300 and an elimination module 400.

[0115] Among them, the matching module 100 is used to obtain the initial meteorological data of the measuring point in the target measuring station and the measurement data affected by the vertical refraction of the atmosphere, and based on the initial meteorological data and the measurement data, determine the meteorological data whose measurement time of the initial meteorological data and the measurement time of the measurement data meet the preset matching time.

[0116] The construction module 200 is used to construct a local meteorological field model including the target measuring station and measuring points based on the meteorological data and the DEM data including the target measuring station and measuring points.

[0117] The generation module 300 is used to determine the location of the refractive index profile structure by combining the measurement data and the local meteorological field model data within the profile where the ranging light path curve is located, wherein the refractive index profile structure is composed of at least one refractive index layer, and the layer thicknesses of different refractive index profile structures are different.

[0118] Elimination module 400 is used to combine Snell's law and refractive index profile structure to correct the atmospheric vertical refraction of the measurement data, obtain horizontal distance and height difference that reduce the influence of atmospheric vertical refraction, and obtain three-dimensional coordinates of the measurement point with higher accuracy based on the horizontal distance and height difference.

[0119] Optionally, in one embodiment of the present application, it further includes: a first determination module and a second determination module.

[0120] Among them, the first determination module is used to determine the resolution of the local meteorological field model according to the DEM data.

[0121] The second determination module is used to determine the resolution of the refractive index profile structure based on the resolution.

[0122] Optionally, in one embodiment of the present application, the elimination module 400 includes: a first calculation unit, a determination unit and a second calculation unit.

[0123] The first calculation unit is used to calculate the light propagation time of each refractive index layer by combining the refractive index profile structure and the layer thickness.

[0124] The determination unit is used to accumulate the light propagation time of the refractive index layer until the accumulated light propagation time is greater than the propagation time of the slant distance measurement value in the measurement data, and to correct the last layer of the refractive index profile structure based on the accumulated light propagation time to obtain the corrected last layer.

[0125] The second calculation unit is used to calculate the horizontal distance and height difference of the measurement data based on the corrected last layer and all layers in the cumulative refractive index profile structure.

[0126] Optionally, in one embodiment of the present application, the calculation formulas for the horizontal distance and the height difference may be, but are not limited to, respectively:

[0127]

[0128] Where n0 is the reference refractive index of the measuring robot, S ce is the slope distance measurement value, n i is the fixed refractive index constant obtained from the refractive index profile structure, ΔS i is the optical path length in the i-th layer, H i is the height, S sum , D sum and H sum They are the corrected slope distance, horizontal distance and height difference respectively.

[0129] Optionally, in one embodiment of the present application, the calculation formula for the three-dimensional coordinates of the measuring point may be, but is not limited to,:

[0130]

[0131] Among them, (X ce ,Y ce ,H ce) is the coordinate of the measuring station, α is the measuring horizontal angle, i is the instrument height, and v is the prism height.

[0132] It should be noted that the aforementioned explanation of the embodiment of the atmospheric vertical refraction correction method based on the local meteorological field model is also applicable to the atmospheric vertical refraction correction device based on the local meteorological field model of this embodiment, and will not be repeated here.

[0133] According to the atmospheric vertical refraction correction device based on the local meteorological field model proposed in the embodiment of the present application, meteorological data can be obtained by combining the initial meteorological data and the measurement data affected by the atmospheric vertical refraction, and a local meteorological field model can be constructed based on the meteorological data, and on this basis, a refractive index profile structure is further constructed. The refractive index profile structure is layered and tracked in combination with the obtained measurement data, and then a three-dimensional coordinate that eliminates the influence of atmospheric vertical refraction is obtained, thereby weakening the influence of atmospheric vertical refraction on the distance measurement value, correcting the horizontal distance measurement value in the horizontal plane and the height difference measurement value in the vertical plane, improving the horizontal displacement monitoring accuracy and vertical displacement monitoring accuracy of the monitoring point, and providing more accurate data support for precision intelligent engineering monitoring. Therefore, the problems in the related technology that the horizontal and vertical displacement monitoring accuracy of the measuring point is low in a complex atmospheric environment, there is a large deviation, it cannot be used under the requirements of a high-precision actual monitoring environment, and it is difficult to obtain high-precision monitoring and early warning results are solved.

[0134] Figure 8 This is a schematic diagram of the structure of an electronic device provided according to an embodiment of the present application. The electronic device may include:

[0135] A memory 801 , a processor 802 , and a computer program stored in the memory 801 and executable on the processor 802 .

[0136] When the processor 802 executes the program, the atmospheric vertical refraction correction method based on the local meteorological field model provided in the above embodiment is implemented.

[0137] Furthermore, the electronic device further comprises:

[0138] The communication interface 803 is used for communication between the memory 801 and the processor 802 .

[0139] The memory 801 is used to store computer programs that can be executed on the processor 802 .

[0140] The memory 801 may include a high-speed RAM memory, and may also include a non-volatile memory (non-volatile memory), such as at least one disk memory.

[0141] If the memory 801, the processor 802 and the communication interface 803 are implemented independently, the communication interface 803, the memory 801 and the processor 802 can be connected to each other through a bus and communicate with each other. The bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus or an Extended Industry Standard Architecture (EISA) bus. The bus can be divided into an address bus, a data bus, a control bus, etc. For ease of representation, Figure 8 Only one thick line is used in the diagram, but this does not mean that there is only one bus or only one type of bus.

[0142] Optionally, in a specific implementation, if the memory 801, the processor 802 and the communication interface 803 are integrated on a chip, the memory 801, the processor 802 and the communication interface 803 can communicate with each other through an internal interface.

[0143] The processor 802 may be a central processing unit (CPU), or an application specific integrated circuit (ASIC), or one or more integrated circuits configured to implement the embodiments of the present application.

[0144] An embodiment of the present application also provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the above-mentioned atmospheric vertical refraction correction method based on a local meteorological field model.

[0145] An embodiment of the present application also provides a computer program product, including a computer program, which, when executed, implements the above-mentioned atmospheric vertical refraction correction method based on the local meteorological field model.

[0146] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or N embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine the different embodiments or examples described in this specification and the features of the different embodiments or examples, without contradiction.

[0147] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the features. In the description of this application, "N" means at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0148] Any process or method description in a flowchart or otherwise described herein may be understood to represent a module, fragment or portion of code comprising one or N executable instructions for implementing the steps of a custom logical function or process, and the scope of the preferred embodiments of the present application includes alternative implementations in which functions may not be performed in the order shown or discussed, including performing functions in a substantially simultaneous manner or in reverse order depending on the functions involved, which should be understood by technicians in the technical field to which the embodiments of the present application belong.

[0149] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as an ordered list of executable instructions for implementing logical functions, and can be embodied in any computer-readable medium for use by an instruction execution system, device or apparatus (such as a computer-based system, a system including a processor, or other system that can fetch instructions from an instruction execution system, device or apparatus and execute instructions), or in combination with these instruction execution systems, devices or apparatuses. For the purpose of this specification, "computer-readable medium" can be any device that can contain, store, communicate, propagate or transmit a program for use by an instruction execution system, device or apparatus, or in combination with these instruction execution systems, devices or apparatuses. More specific examples of computer-readable media (a non-exhaustive list) include the following: an electrical connection with one or N wirings (electronic devices), a portable computer disk box (magnetic device), a random access memory (RAM), a read-only memory (ROM), an erasable and programmable read-only memory (EPROM or flash memory), a fiber optic device, and a portable compact disk read-only memory (CDROM). In addition, the computer-readable medium may even be paper or other suitable medium on which the program is printed, since the program may be obtained electronically by optically scanning the paper or other medium and then editing, interpreting or processing in other suitable ways as necessary and then storing it in a computer memory.

[0150] It should be understood that the various parts of the present application can be implemented by hardware, software, firmware or a combination thereof. In the above embodiment, the N steps or methods can be implemented by software or firmware stored in a memory and executed by a suitable instruction execution system. If implemented by hardware, as in another embodiment, it can be implemented by any one or a combination of multiple of the following technologies known in the art: a discrete logic circuit having a logic gate circuit for implementing a logic function for a data signal, a dedicated integrated circuit having a suitable combination of logic gate circuits, a programmable gate array (PGA), a field programmable gate array (FPGA), etc.

[0151] A person skilled in the art may understand that all or part of the steps in the method for implementing the above-mentioned embodiment may be completed by instructing related hardware through a program, and the program may be stored in a computer-readable storage medium, which, when executed, includes one or a combination of the steps of the method embodiment.

[0152] In addition, each functional unit in each embodiment of the present application may be integrated into a processing module, or each unit may exist physically separately, or two or more units may be integrated into one module. The above-mentioned integrated module may be implemented in the form of hardware or in the form of a software functional module. If the integrated module is implemented in the form of a software functional module and sold or used as an independent product, it may also be stored in a computer-readable storage medium.

[0153] The storage medium mentioned above may be a read-only memory, a magnetic disk or an optical disk, etc. Although the embodiments of the present application have been shown and described above, it can be understood that the above embodiments are exemplary and cannot be understood as limiting the present application. A person of ordinary skill in the art may change, modify, replace and modify the above embodiments within the scope of the present application.

Claims

1. A method for correcting atmospheric vertical refraction based on a local meteorological field model, characterized in that: The following steps are involved: Acquire initial meteorological data of a measuring point in a target measuring station and measurement data affected by atmospheric vertical refraction, and determine, based on the initial meteorological data and the measurement data, meteorological data whose measurement time of the initial meteorological data and the measurement time of the measurement data meet a preset matching time; Based on the meteorological data and the digital elevation model DEM data including the target measuring station and the measuring point, a local meteorological field model including the target measuring station and the measuring point is constructed; Determine the location of the refractive index profile structure by combining the measurement data and the local meteorological field model data in the section where the ranging light path curve is located, wherein the refractive index profile structure is composed of at least one refractive index layer, and the layer thicknesses of different refractive index profile structures are different; Combining Snell's law and the refractive index profile structure, the measurement data is corrected for atmospheric vertical refraction to obtain a horizontal distance and a height difference that reduce the influence of atmospheric vertical refraction, and based on the horizontal distance and the height difference, the three-dimensional coordinates of the measurement point with higher accuracy are obtained.

2. The method according to claim 1, characterized in that Also includes: Determining the resolution of the local meteorological field model according to the DEM data; A resolution of the refractive index profile structure is determined based on the resolution.

3. The method according to claim 1, characterized in that Combining Snell's law and the refractive index profile structure, the measurement data is corrected for atmospheric vertical refraction to obtain a horizontal distance and height difference that reduce the influence of atmospheric vertical refraction, including: Calculating the light propagation time for each refractive index layer in combination with the refractive index profile structure and the layer thickness; Accumulating the light propagation time of the refractive index layer until the accumulated light propagation time is greater than the propagation time of the slant distance measurement value in the measurement data, and correcting the last layer of the refractive index profile structure based on the accumulated light propagation time to obtain a corrected last layer; Based on the corrected last layer, all layers in the refractive index profile structure are accumulated to calculate the horizontal distance and height difference of the measurement data.

4. The method according to claim 1, characterized in that: The calculation formulas for the horizontal distance and the height difference are respectively: Where n0 is the reference refractive index of the measuring robot, S ce is the slope distance measurement value, n i is the fixed refractive index constant obtained from the refractive index profile structure, ΔS i is the optical path length in the i-th layer, H i is the height, S sum , D sum and H sum They are the corrected slope distance, horizontal distance and height difference respectively.

5. The method according to claim 1, characterized in that The calculation formula of the three-dimensional coordinates of the measuring point is: Among them, (X ce ,Y ce ,H ce ) is the coordinate of the measuring station, α is the measuring horizontal angle, i is the instrument height, and v is the prism height.

6. An atmospheric vertical refraction correction device based on a local meteorological field model, characterized in that: include: A matching module, used to obtain initial meteorological data of a measuring point in a target measuring station and measurement data affected by atmospheric vertical refraction, and determine, based on the initial meteorological data and the measurement data, meteorological data whose measurement time of the initial meteorological data and the measurement time of the measurement data meet a preset matching time; A construction module, used to construct a local meteorological field model including the target station and the measuring point based on the meteorological data and the DEM data including the target station and the measuring point; A generating module, used for combining the measurement data and the local meteorological field model data in the section where the ranging light path curve is located, to determine the location of the refractive index profile structure, wherein the refractive index profile structure is composed of at least one refractive index layer, and the layer thicknesses of different refractive index profile structures are different; The elimination module is used to combine Snell's law and the refractive index profile structure to perform atmospheric vertical refraction correction on the measurement data, obtain the horizontal distance and height difference that reduce the influence of atmospheric vertical refraction, and obtain the three-dimensional coordinates of the measurement point with higher accuracy based on the horizontal distance and the height difference.

7. The device according to claim 6, characterized in that Also includes: A first determination module is used to determine the resolution of the local meteorological field model according to the DEM data; A second determination module is used to determine the resolution of the refractive index profile structure based on the resolution.

8. The device according to claim 6, characterized in that The elimination module comprises: a first calculation unit for calculating the light propagation time of each refractive index layer in combination with the refractive index profile structure and the layer thickness; a determination unit, configured to accumulate the light propagation time of the refractive index layer until the accumulated light propagation time is greater than the propagation time of the slant distance measurement value in the measurement data, and to correct the last layer of the refractive index profile structure based on the accumulated light propagation time to obtain a corrected last layer; The second calculation unit is used to accumulate all layers in the refractive index profile structure based on the corrected last layer, and calculate the horizontal distance and height difference of the measurement data.

9. The device according to claim 6, characterized in that The calculation formulas for the horizontal distance and the height difference are respectively: Where n0 is the reference refractive index of the measuring robot, S ce is the slope distance measurement value, n i is the fixed refractive index constant obtained from the refractive index profile structure, ΔS i is the optical path length in the i-th layer, H i is the height, S sum , D sum and H sum They are the corrected slope distance, horizontal distance and height difference respectively.

10. The device according to claim 6, characterized in that The calculation formula of the three-dimensional coordinates of the measuring point is: Among them, (X ce ,Y ce ,H ce ) is the coordinate of the measuring station, α is the measuring horizontal angle, i is the instrument height, and v is the prism height.

11. An electronic device, characterized in that: include: A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the atmospheric vertical refraction correction method based on a local meteorological field model as described in any one of claims 1 to 5.

12. A computer-readable storage medium having a computer program stored thereon, characterized in that: The program is executed by a processor to implement the atmospheric vertical refraction correction method based on a local meteorological field model as described in any one of claims 1 to 5.

13. A computer program product, characterized in that It comprises a computer program, which, when executed, is used to implement the atmospheric vertical refraction correction method based on the local meteorological field model as described in any one of claims 1 to 5.

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