Ultra-high voltage transmission line parameter test control system and method

Abstract

The invention provides an ultra-high voltage transmission line parameter test control system and method, and belongs to the technical field of ultra-high voltage transmission line parameter test control. The technical problem to be solved is to provide a hardware structure of an ultra-high voltage transmission line parameter test control system and an improvement of a control method. According to the technical scheme adopted for solving the technical problem, the system comprises a wireless console, a parameter tester, a first main station switching device, a second main station switching device, a first auxiliary station switching device and a second auxiliary station switching device; the parameter tester is connected with the first master station switching device and the second master station switching device through test wires. The first main station switching device as a head end is connected with the first auxiliary station switching device as a tail end through a first test power transmission line; the second main station switching device serving as the head end is connected with the second auxiliary station switching device serving as the tail end through a second test power transmission line; the method is applied to parameter testing of the ultra-high voltage transmission line.

Description

Technical Field

[0001] The invention provides a UHV transmission line parameter test control system and method, belonging to the technical field of UHV transmission line parameter test control. Background Art

[0002] Transmission line parameters are important basic data for power flow calculations, relay protection, etc. The "Regulations" require that new and rebuilt lines of 110kV and above must be measured. At present, there are few 1000kV UHV lines in China, and there is no special set of equipment for UHV parameter testing. The parameter test items for 1000kV UHV lines are more than those for conventional lines, the wiring is complex, and the testing workload is large.

[0003] In addition, according to the "DLT 1179-2012 1000kV AC Overhead Transmission Line Power Frequency Parameter Measurement Guidelines" and "QGDW11454-2015 UHV AC Transmission Line Power Frequency Phase Parameter Measurement Guidelines", a UHV line needs to test not only conventional sequence parameters, but also phase parameters. There is a lot of data. A double-circuit UHV line on the same tower needs to test hundreds of parameters. The test time using conventional testing methods is about three days. During this period, the tester needs to constantly change the test wiring according to the test items. The process also has risks such as instrument miswiring and induced electric shock. At the same time, given the tight time for UHV commissioning, the test time is also required to be as short as possible. Summary of the invention

[0004] In order to overcome the deficiencies in the prior art, the present invention aims to solve the technical problem of providing an improvement in the hardware structure and control method of a UHV transmission line parameter test control system.

[0005] In order to solve the above technical problems, the technical solution adopted by the present invention is: a UHV transmission line parameter test control system, including a wireless console, a parameter tester, a first master station switching device, a second master station switching device, a first slave station switching device, and a second slave station switching device; The parameter tester is connected to the first master station switching device and the second master station switching device respectively through test wires; A first master station switching device as a head end is connected to a first slave station switching device as a terminal end through a first test transmission line; The second main station switching device as the head end is connected to the second secondary station switching device as the end end through the second test transmission line; The wireless console is wirelessly connected to the parameter tester, the first master station switching device, the second master station switching device, the first secondary station switching device, and the second secondary station switching device through a wireless network; A current test circuit and a voltage test circuit are provided inside the first master station switching device, wherein relays K11, K12, K13, K14, K21, K22, K23, K24, K31, K32, K33, K34, K35 are provided in the current test circuit, and relays K51, K52, K53 are provided in the voltage test circuit; The structure of the current test circuit is: The common node of the relay K11 is connected to the A1 phase output terminal of the first master station switching device, the normally closed end of the relay K11 is connected to the common node of the relay K12, the normally open end of the relay K12 is respectively connected to one end of the contact of the relay K14 and one end of the contact of the relay K23, and the other end of the contact of the relay K14 is connected to the A phase input terminal of the parameter tester; The common node of the relay K21 is connected to the B1 phase output terminal of the first master station switching device, the normally closed end of the relay K21 is connected to the common node of the relay K22, the normally open end of the relay K22 is respectively connected to one end of the contact of the relay K24, one end of the contact of the relay K33, and the other end of the contact of the relay K23, and the other end of the contact of the relay K24 is connected to the B phase input terminal of the parameter tester; The common node of the relay K31 is connected to the C1 phase output terminal of the first master station switching device, the normally closed end of the relay K31 is connected to the common node of the relay K32, the normally open end of the relay K32 is respectively connected to one end of the contact of the relay K34, one end of the contact of the relay K35, and the other end of the contact of the relay K33, and the other end of the contact of the relay K34 is connected to the C phase input terminal of the parameter tester; The other end of the contact of the relay K35 is connected to the Id end of the parameter tester; The structure of the voltage test circuit is: One end of the contact of the relay K51 is connected to the A1 phase voltage test end of the first master station switching device, and the other end of the contact of the relay K51 is connected to the UA test end of the parameter tester; One end of the contact of the relay K52 is connected to the B1 phase voltage test end of the first master station switching device, and the other end of the contact of the relay K52 is connected to the UB test end of the parameter tester; One end of the contact of the relay K53 is connected to the C1 phase voltage test end of the first master station switching device, and the other end of the contact of the relay K53 is connected to the UC test end of the parameter tester; A current test circuit and a voltage test circuit are provided inside the second master station switching device, wherein relays J11, J12, J13, J14, J21, J22, J23, J24, J31, J32, J33, J34, J35 are provided in the current test circuit, and relays J51, J52, J53 are provided in the voltage test circuit; The structure of the current test circuit is: The common node of the relay J11 is connected to the A2 phase output terminal of the first master station switching device, the normally closed end of the relay J11 is connected to the common node of the relay J12, the normally open end of the relay J12 is respectively connected to one end of the contact of the relay J14 and one end of the contact of the relay J23, and the other end of the contact of the relay J14 is connected to the A phase input terminal of the parameter tester; The common node of the relay J21 is connected to the B2 phase output terminal of the first master station switching device, the normally closed end of the relay J21 is connected to the common node of the relay J22, the normally open end of the relay J22 is respectively connected to one end of the contact of the relay J24, one end of the contact of the relay J33, and the other end of the contact of the relay J23, and the other end of the contact of the relay J24 is connected to the B phase input terminal of the parameter tester; The common node of the relay J31 is connected to the C2 phase output terminal of the first master station switching device, the normally closed end of the relay J31 is connected to the common node of the relay J32, the normally open end of the relay J32 is respectively connected to one end of the contact of the relay J34, one end of the contact of the relay J35, and the other end of the contact of the relay J33, and the other end of the contact of the relay J34 is connected to the C phase input terminal of the parameter tester; The other end of the relay J35 contact is connected to the ID end of the parameter tester; The structure of the voltage test circuit is: One end of the contact of the relay J51 is connected to the A2 phase voltage test end of the first master station switching device, and the other end of the contact of the relay J51 is connected to the UA test end of the parameter tester; One end of the contact of the relay J52 is connected to the B2 phase voltage test end of the first master station switching device, and the other end of the contact of the relay J52 is connected to the UB test end of the parameter tester; One end of the contact of the relay J53 is connected to the C2 phase voltage test end of the first master station switching device, and the other end of the contact of the relay J53 is connected to the UC test end of the parameter tester; The first secondary station switching device or the second secondary station switching device is provided with relays K1, K2, K3, and the circuit structure inside the first secondary station switching device is: The common node of the relay K1 is connected to the A-phase input terminal of the first secondary station switching device, the normally closed terminal of the relay K1 is connected to the current transformer, and the control coil of the relay K1 is connected to the signal output terminal of the built-in controller of the first secondary station switching device; The common node of the relay K2 is connected to the B-phase input terminal of the first secondary station switching device, the normally closed terminal of the relay K2 is connected to the current transformer, and the control coil of the relay K2 is connected to the signal output terminal of the built-in controller of the first secondary station switching device; The common node of the relay K3 is connected to the C-phase input terminal of the first secondary station switching device, the normally closed terminal of the relay K3 is connected to the current transformer, and the control coil of the relay K3 is connected to the signal output terminal of the built-in controller of the first secondary station switching device; The circuit structure inside the second secondary station switching device is the same as that of the first secondary station switching device.

[0006] A method for controlling a UHV transmission line parameter test control system, comprising the following control steps: Step 1: Connect the parameter tester, the first master station switching device, the second master station switching device, the first slave station switching device, and the second slave station switching device to form a test circuit for testing the UHV transmission line; Step 2: Perform instrument testing and network the master station switching device and the slave station switching device; Step 3: Enter the operation interface of the UHV test module, and perform double-circuit positive-sequence short-circuit impedance test, double-circuit zero-sequence short-circuit impedance test, double-circuit positive-sequence open-circuit impedance test, double-circuit zero-sequence open-circuit impedance test, self-impedance test, self-capacitance test, mutual impedance test, and mutual capacitance test respectively; Step 4: Store and upload the data recorded by each test item to complete remote test control.

[0007] The specific method for performing the double-loop positive sequence short-circuit impedance test in step 3 is: Control the relay in the first master station switching device to perform the following actions: The relays K11, K21, and K31 in the control current loop are normally closed, K12, K22, and K32 are normally open, K14 is closed, the relay K51 in the voltage loop is closed, and the other relays are all open; Control the relay in the second master station switching device to perform the following actions: Relays J11, J21, and J31 in the control current loop are normally closed, J12, J22, and J32 are normally open, J24 is closed, relay J52 in the voltage loop is closed, and all other relays are open; Relays K1, K2 and K3 in the first and second secondary station switching devices are controlled to be normally closed respectively; The parameter tester applies a two-phase positive sequence power supply at the head end for testing. After the test is completed, the instrument automatically records the relevant data.

[0008] The specific method for performing the double-loop zero-sequence short-circuit impedance test in step 3 is: Control the relay in the first master station switching device to perform the following actions: The relays K11, K21, and K31 in the control current loop are normally closed, K12, K22, and K32 are normally open, K14 is closed, the relay K51 in the voltage loop is closed, and the other relays are all open; Control the relay in the second master station switching device to perform the following actions: Relays J11, J21, and J31 in the control current loop are normally closed, J12, J22, and J32 are normally open, J24 is closed, relay J52 in the voltage loop is closed, and all other relays are open; Relays K1, K2 and K3 in the first and second secondary station switching devices are controlled to be normally closed respectively; The parameter tester applies single-phase zero-sequence power to the A and B phases at the head end for testing. After the test is completed, the instrument automatically records the relevant data.

[0009] The specific method for performing the double-loop positive sequence open-circuit impedance test in step 3 is: Control the relay in the first master station switching device to perform the following actions: The relays K11, K21, and K31 in the control current loop are normally closed, K12, K22, and K32 are normally open, K14 is closed, the relay K51 in the voltage loop is closed, and the other relays are all open; Control the relay in the second master station switching device to perform the following actions: Relays J11, J21, and J31 in the control current loop are normally closed, J12, J22, and J32 are normally open, J24 is closed, relay J52 in the voltage loop is closed, and all other relays are open; Relays K1, K2 and K3 in the first and second secondary station switching devices are controlled to be normally open respectively; The parameter tester applies two-phase positive sequence power to the A and B phases at the head end for testing. After the test is completed, the instrument automatically records the relevant data.

[0010] The specific method for performing the double-loop zero-sequence open-circuit impedance test in step 3 is: Control the relay in the first master station switching device to perform the following actions: The relays K11, K21, and K31 in the control current loop are normally closed, K12, K22, and K32 are normally open, K14 is closed, the relay K51 in the voltage loop is closed, and the other relays are all open; Control the relay in the second master station switching device to perform the following actions: Relays J11, J21, and J31 in the control current loop are normally closed, J12, J22, and J32 are normally open, J24 is closed, relay J52 in the voltage loop is closed, and all other relays are open; Relays K1, K2 and K3 in the first and second secondary station switching devices are controlled to be normally open respectively; The parameter tester applies single-phase zero-sequence power to the A and B phases at the head end for testing. After the test is completed, the instrument automatically records the relevant data.

[0011] The specific method for performing the self-impedance test in step 3 is: The self-impedance test for the double circuits on the same tower needs to be done separately: A1 single item, B1 single item, C1 single item, A2 single item, B2 single item, C2 single item, a total of 6 sets of data, including: When performing the A1 single test, the relay in the first master station switching device is controlled to perform the following actions: The relay K11 in the control current loop is normally closed, K12 is normally open, and K14 is closed. The relay K51 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the second master station to open; Control the relay K1 in the first secondary station switching device to be normally closed, and K2 and K3 to be normally open; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally open; The parameter tester applies a single-phase zero-sequence power supply to the A phase of the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B1 single test, the relay in the first master station switching device is controlled to perform the following actions: Relay K21 in the control current loop is normally closed, K22 is normally open, K24 is closed, K52 in the voltage loop is closed, and all other relays are open; Control all relays in the switching device of the second master station to open; Control the relay K2 in the first secondary station switching device to be normally closed, and K1 and K3 to be normally open; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally open; The parameter tester applies a single-phase zero-sequence power supply to the B phase of the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the C1 single test, the relay in the first master station switching device is controlled to perform the following actions: The relay K31 in the control current loop is normally closed, K32 is normally open, and K34 is closed. The relay K53 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the second master station to open; Control the relay K3 in the first secondary station switching device to be normally closed, and K2 and K2 to be normally open; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally open; The parameter tester applies a single-phase zero-sequence power supply to the C phase at the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the A2 single test, the relay in the second master station switching device is controlled to perform the following actions: Relay J11 in the control current loop is normally closed, J12 is normally open, and J14 is closed. Relay J51 in the voltage loop is closed, and all other relays are open. Control all relays in the switching device of the first master station to open; Control the relay K1 in the second secondary station switching device to be normally closed, and K2 and K3 to be normally open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally open; The parameter tester applies a single-phase zero-sequence power supply to the A phase of the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B2 single test, the relay in the second master station switching device is controlled to perform the following actions: The relay J21 in the control current loop is normally closed, J22 is normally open, and J24 is closed. The relay J52 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the first master station to open; Control the relay K2 in the second secondary station switching device to be normally closed, and K1 and K3 to be normally open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally open; The parameter tester applies a single-phase zero-sequence power supply to the B phase of the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the C2 single test, the relay in the second master station switching device is controlled to perform the following actions: Relay J31 in the control current loop is normally closed, J32 is normally open, and J34 is closed. Relay J53 in the voltage loop is closed, and all other relays are open. Control all relays in the switching device of the first master station to open; Control the relay K3 in the second secondary station switching device to be normally closed, and K1 and K2 to be normally open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally open; The parameter tester applies a single-phase zero-sequence power supply to the C phase at the head end for testing. After the test is completed, the instrument automatically records the relevant data.

[0012] The specific method for performing the self-capacitance test in step 3 is: The self-capacitance test for the double circuits on the same tower needs to be done separately: A1 single item, B1 single item, C1 single item, A2 single item, B2 single item, C2 single item, a total of 6 sets of data, including: When performing the A1 single test, the relay in the first master station switching device is controlled to perform the following actions: The relay K11 in the control current loop is normally closed, K12 is normally open, and K14 is closed. The relay K51 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the second master station to open; Control the relay K1 in the first secondary station switching device to be normally open, and K2 and K3 to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the A phase of the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B1 single test, the relay in the first master station switching device is controlled to perform the following actions: The relay K21 in the control current loop is normally closed, K22 is normally open, and K24 is closed. The relay K52 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the second master station to open; Control the relay K2 in the first secondary station switching device to be normally open, and K1 and K3 to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the B phase of the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the C1 single test, the relay in the first master station switching device is controlled to perform the following actions: The relay K31 in the control current loop is normally closed, K32 is normally open, and K34 is closed. The relay K53 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the second master station to open; Control the relay K3 in the first secondary station switching device to be normally open, and K1 and K2 to be closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the C1 phase at the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the A2 single test, the relay in the second master station switching device is controlled to perform the following actions: Relay J11 in the control current loop is normally closed, J12 is normally open, and J14 is closed. Relay J51 in the voltage loop is closed, and all other relays are open. Control all relays in the switching device of the first master station to open; Control the relay K1 in the second secondary station switching device to be normally open, and K2 and K3 to be normally closed; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the A phase of the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B2 single test, the relay in the second master station switching device is controlled to perform the following actions: The relay J21 in the control current loop is normally closed, J22 is normally open, and J24 is closed. The relay J52 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the first master station to open; Control the relay K2 in the second secondary station switching device to be normally open, and K1 and K3 to be normally closed; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the B phase of the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the C2 single test, the relay in the second master station switching device is controlled to perform the following actions: Relay J31 in the control current loop is normally closed, J32 is normally open, and J34 is closed. Relay J53 in the voltage loop is closed, and all other relays are open. Control all relays in the switching device of the first master station to open; Control the relay K3 in the second secondary station switching device to be normally open, and K1 and K2 to be normally closed; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the C phase at the head end for testing. After the test is completed, the instrument automatically records the relevant data.

[0013] The specific method for performing the mutual impedance test in step 3 is: The mutual impedance test of the double circuits on the same tower needs to be done separately: A1-B1, A1-C1, A1-A2, A1-B2, A1-C2, B1-C1, B1-A2, B1-B2, B1-C2, C1-A2, C1-B2, C1-C2, A2-B2, A2-C2, B2-C2, a total of 15 groups of data, including: When performing the A1-B1 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: Relay K11 in the control current loop is normally closed, K12 is normally open, and K14 is closed. Relay K52 in the voltage loop is closed, and all other relays are open. Control all relays in the switching device of the second master station to open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies single-phase zero-sequence power to the A1 phase at the head end and tests the induced voltage on the B1 phase for testing. After the test is completed, the instrument automatically records the relevant data; The control principles of the remaining test processes are the same as A1-B1.

[0014] The specific method for performing mutual capacitance testing in step 3 is: The mutual capacitance test of the dual circuits on the same tower needs to be done separately: A1-B1, A1-C1, A1-A2, A1-B2, A1-C2, B1-C1, B1-A2, B1-B2, B1-C2, C1-A2, C1-B2, C1-C2, A2-B2, A2-C2, B2-C2, a total of 15 groups of data, among which: When performing the A1-B1 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K11 in the A1 current loop to be normally closed, K12 to be normally open, and K14 to be closed; the relay K51 in the A1 voltage loop to be closed; the relay K21 in the B1 current loop to be normally closed, K22 to be normally open, and K33 and K35 to be closed; and all other relays to be opened; Control all relays in the switching device of the second master station to open; Control the relays K1 and K2 in the first secondary station switching device to be normally open and K3 to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the A1 phase at the head end and tests the induced current at B1 to perform the test. After the test is completed, the instrument automatically records the relevant data; The control principles of the remaining test processes are the same as A1-B1.

[0015] The beneficial effects of the present invention compared with the prior art are as follows: the present invention provides an automated testing system that can replace manual wiring in the process of ultra-high voltage transmission line parameter testing. The system adopts a combination of software and hardware, and adaptively adjusts the test circuit structure inside the control system for different test items. The entire process can be remotely wirelessly operated through a wireless operating console, thereby realizing full-process automated testing of 1000kV ultra-high voltage line parameter testing, ensuring the personal safety of test personnel, shortening test time, and improving test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The present invention will be further described below in conjunction with the accompanying drawings: Figure 1 It is a structural schematic diagram of the UHV transmission line parameter testing system of the present invention; Figure 2 This is a schematic diagram of the circuit wiring structure at the head end of the test circuit of the present invention; Figure 3 It is a schematic diagram of the circuit wiring structure at the end of the test circuit of the present invention; Figure 4 It is a schematic diagram of the structure of the internal control circuit of the first and second master station switching devices of the present invention; Figure 5 It is a schematic diagram of the structure of the internal control circuit of the first and second secondary station switching devices of the present invention; Figure 6 A circuit schematic diagram of a double-loop positive-sequence short-circuit impedance test in an embodiment of the present invention; Figure 7 A circuit schematic diagram for performing a double-loop zero-sequence short-circuit impedance test in an embodiment of the present invention; Figure 8 A circuit schematic diagram of a double-loop positive sequence open-circuit impedance test in an embodiment of the present invention; Fig. 9 A circuit schematic diagram for performing a double-loop zero-sequence open-circuit impedance test in an embodiment of the present invention; Fig.10 Schematic diagram of a circuit for performing A1 loop self-impedance test in an embodiment of the present invention; Fig.11 Schematic diagram of a circuit for performing the self-capacitance test of item A1 in an embodiment of the present invention; Fig.12 Schematic diagram of a circuit for performing A1-B1 mutual impedance testing in an embodiment of the present invention; Fig.13 4 is a circuit schematic diagram for performing A1-B1 mutual capacitance test in an embodiment of the present invention. DETAILED DESCRIPTION

[0017] like Figures 1 to 5As shown, the present invention provides a system for automatic testing of UHV transmission line parameters. By building a full-process intelligent operation platform for parameter testing, a Bluetooth communication module is set in a parameter tester and a full-automatic switching device, and the real-time status of the current line is generated by collecting the positions of each contact of the switching device to achieve linkage control. During the test, the full-automatic switching device of the secondary station is remotely controlled through a mobile network terminal, so that the main and secondary stations can be intelligently controlled to cooperate when testing different projects.

[0018] When in use, the fully automatic switching device provided by the present invention requires the use of an intelligent switch module to change the connection state of the test line to achieve fully automatic switching testing, which eliminates the risk of electric shock due to induced electricity from a technical level. At the same time, the device integrates a lightning protection module and an induced voltage test module, which can achieve integrated safety protection against induced electricity and lightning protection.

[0019] The console provided by the present invention is a wireless operating console, which is mainly based on a notebook or a computer, and has a built-in integrated line parameter test and protection software. It controls the parameter tester and the corresponding switching device through preset program steps, and can transmit back the real-time status data of the line. The operating principle is: first adjust the line to the test state of the corresponding project by controlling the switching device, and then control the parameter test instrument to perform parameter testing and transmit data back after confirming that the (line test structure) state is correct.

[0020] Furthermore, before the present invention automatically tests the parameters of the ultra-high voltage transmission line, the following instruments are first prepared, including: a parameter tester, a first master station switching device, a second master station switching device, a first secondary station switching device, and a second secondary station switching device, and the test instruments are connected to the test line. Specifically, the communication port of the parameter tester is respectively connected to the first master station switching device and the second master station switching device, the first master station switching device is connected as the head end to the first secondary station switching device as the end through line one, and the second master station switching device is connected as the head end to the second secondary station switching device as the end through line two, thereby forming a test circuit for testing the ultra-high voltage transmission line.

[0021] Then, the instrument is tested and the main station switching device and the secondary station switching device are networked and interconnected.

[0022] The head-end device supplies power to the ARM mainboard through a switching power supply. The ARM receives control instructions from the tablet computer and drives the circuit through the I / O port to specifically drive the corresponding relay to complete the wiring switching of the external line.

[0023] The terminal device uses a lithium battery to power the ARM mainboard. The ARM receives instructions from the mobile phone / tablet and drives the corresponding relay through the I / O port to complete the wiring switching of the external line. The device itself can also directly control the reversal operation through buttons. The mobile phone / tablet communicates with the computer at the head end through the 4G network to receive and send data.

[0024] After the above communication settings are completed, the device indicator light on the tablet will light up, indicating that the communication is successful.

[0025] Then enter the operation interface of the UHV test module, and perform double-circuit positive-sequence short-circuit impedance test, double-circuit zero-sequence short-circuit impedance test, double-circuit positive-sequence open-circuit impedance test, double-circuit zero-sequence open-circuit impedance test, self-impedance test, self-capacitance test, mutual impedance test, and mutual capacitance test. The specific test methods are as follows: (1) If Figure 6 As shown, when performing a double-circuit positive sequence short-circuit impedance test, the relay in the first master station switching device is controlled to perform the following actions: The relays K11, K21, and K31 in the control current loop are normally closed, K12, K22, and K32 are normally open, K14 is closed, the relay K51 in the voltage loop is closed, and the other relays are all open; Control the relay in the second master station switching device to perform the following actions: Relays J11, J21, and J31 in the control current loop are normally closed, J12, J22, and J32 are normally open, J24 is closed, relay J52 in the voltage loop is closed, and all other relays are open; Relays K1, K2 and K3 in the first and second secondary station switching devices are controlled to be normally closed respectively; By controlling the actions of the related relays in the above-mentioned master and slave station switching devices, the test instrument and the test line can be adjusted to a double-circuit line two-phase positive sequence short-circuit impedance test circuit, such as Figure 6 As shown, the parameter tester applies a two-phase positive sequence power supply at the head end to perform the test. After the test is completed, the instrument automatically records the relevant data.

[0026] (2) If Figure 7 As shown, when performing a double-circuit zero-sequence short-circuit impedance test, the relay in the first master station switching device is controlled to perform the following actions: The relays K11, K21, and K31 in the control current loop are normally closed, K12, K22, and K32 are normally open, K14 is closed, the relay K51 in the voltage loop is closed, and the other relays are all open; Control the relay in the second master station switching device to perform the following actions: Relays J11, J21, and J31 in the control current loop are normally closed, J12, J22, and J32 are normally open, J24 is closed, relay J52 in the voltage loop is closed, and all other relays are open; Relays K1, K2 and K3 in the first and second secondary station switching devices are controlled to be normally closed respectively; By controlling the actions of the related relays in the above-mentioned master and slave station switching devices, the test instrument and the test line can be adjusted to a double-circuit line two-phase zero-sequence short-circuit impedance test circuit, such as Figure 7 As shown, the parameter tester applies single-phase zero-sequence power to the A and B phases at the head end for testing. After the test is completed, the instrument automatically records the relevant data.

[0027] (3) If Figure 8 As shown, when performing a double-circuit positive sequence open circuit impedance test, the relay in the first master station switching device is controlled to perform the following actions: The relays K11, K21, and K31 in the control current loop are normally closed, K12, K22, and K32 are normally open, K14 is closed, the relay K51 in the voltage loop is closed, and the other relays are all open; Control the relay in the second master station switching device to perform the following actions: Relays J11, J21, and J31 in the control current loop are normally closed, J12, J22, and J32 are normally open, J24 is closed, relay J52 in the voltage loop is closed, and all other relays are open; Relays K1, K2 and K3 in the first and second secondary station switching devices are controlled to be normally open respectively; By controlling the actions of the related relays in the above-mentioned master and slave station switching devices, the test instrument and the test line can be adjusted to a double-circuit line two-phase positive sequence open circuit impedance test circuit, such as Figure 8 As shown, the parameter tester applies two-phase positive sequence power to the A and B phases at the head end for testing. After the test is completed, the instrument automatically records the relevant data.

[0028] (4) If Fig. 9 As shown, when performing a double-circuit zero-sequence open-circuit impedance test, the relay in the first master station switching device is controlled to perform the following actions: The relays K11, K21, and K31 in the control current loop are normally closed, K12, K22, and K32 are normally open, K14 is closed, the relay K51 in the voltage loop is closed, and the other relays are all open; Control the relay in the second master station switching device to perform the following actions: Relays J11, J21, and J31 in the control current loop are normally closed, J12, J22, and J32 are normally open, J24 is closed, relay J52 in the voltage loop is closed, and all other relays are open; Relays K1, K2 and K3 in the first and second secondary station switching devices are controlled to be normally open respectively; By controlling the actions of the related relays in the above-mentioned master and slave station switching devices, the test instrument and the test line can be adjusted to a double-circuit line two-phase zero-sequence open-circuit impedance test circuit, such as Fig. 9 As shown, the parameter tester applies single-phase zero-sequence power to the A and B phases at the head end for testing. After the test is completed, the instrument automatically records the relevant data.

[0029] (5) When conducting self-impedance test, the self-impedance test for the double circuits on the same tower needs to be done separately: A1 single item, B1 single item, C1 single item, A2 single item, B2 single item, C2 single item, a total of 6 sets of data, including: When performing the A1 single test, the relay in the first master station switching device is controlled to perform the following actions: The relay K11 in the control current loop is normally closed, K12 is normally open, and K14 is closed. The relay K51 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the second master station to open; Control the relay K1 in the first secondary station switching device to be normally closed, and K2 and K3 to be normally open; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally open; At this time Fig.10 As shown, the parameter tester applies a single-phase zero-sequence power supply to the A phase at the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B1 single test, the relay in the first master station switching device is controlled to perform the following actions: Relay K21 in the control current loop is normally closed, K22 is normally open, K24 is closed, K52 in the voltage loop is closed, and all other relays are open; Control all relays in the switching device of the second master station to open; Control the relay K2 in the first secondary station switching device to be normally closed, and K1 and K3 to be normally open; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally open; The parameter tester applies a single-phase zero-sequence power supply to the B phase of the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the C1 single test, the relay in the first master station switching device is controlled to perform the following actions: The relay K31 in the control current loop is normally closed, K32 is normally open, and K34 is closed. The relay K53 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the second master station to open; Control the relay K3 in the first secondary station switching device to be normally closed, and K2 and K2 to be normally open; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally open; The parameter tester applies a single-phase zero-sequence power supply to the C phase at the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the A2 single test, the relay in the second master station switching device is controlled to perform the following actions: Relay J11 in the control current loop is normally closed, J12 is normally open, and J14 is closed. Relay J51 in the voltage loop is closed, and all other relays are open. Control all relays in the switching device of the first master station to open; Control the relay K1 in the second secondary station switching device to be normally closed, and K2 and K3 to be normally open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally open; The parameter tester applies a single-phase zero-sequence power supply to the A phase of the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B2 single test, the relay in the second master station switching device is controlled to perform the following actions: The relay J21 in the control current loop is normally closed, J22 is normally open, and J24 is closed. The relay J52 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the first master station to open; Control the relay K2 in the second secondary station switching device to be normally closed, and K1 and K3 to be normally open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally open; The parameter tester applies a single-phase zero-sequence power supply to the B phase of the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the C2 single test, the relay in the second master station switching device is controlled to perform the following actions: Relay J31 in the control current loop is normally closed, J32 is normally open, and J34 is closed. Relay J53 in the voltage loop is closed, and all other relays are open. Control all relays in the switching device of the first master station to open; Control the relay K3 in the second secondary station switching device to be normally closed, and K1 and K2 to be normally open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally open; The parameter tester applies a single-phase zero-sequence power supply to the C phase at the head end for testing. After the test is completed, the instrument automatically records the relevant data.

[0030] By controlling the actions of the related relays in the above-mentioned master and slave station switching devices, the test instrument and the test line can be adjusted to a self-impedance end grounding test circuit, such as Fig.10 As shown in the figure (the test circuit for A1 single test, the same applies to other tests), the instrument applies a single-phase zero-sequence power supply to the A phase at the head end for testing. After the test is completed, the instrument automatically records the relevant data.

[0031] (6) When conducting the self-capacitance test, the self-capacitance test for the double circuits on the same tower needs to be done separately: A1 single item, B1 single item, C1 single item, A2 single item, B2 single item, C2 single item, a total of 6 sets of data, including: When performing the A1 single test, the relay in the first master station switching device is controlled to perform the following actions: The relay K11 in the control current loop is normally closed, K12 is normally open, and K14 is closed. The relay K51 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the second master station to open; Control the relay K1 in the first secondary station switching device to be normally open, and K2 and K3 to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; At this time Fig.11 As shown, the parameter tester applies a single-phase zero-sequence power supply to the A phase at the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B1 single test, the relay in the first master station switching device is controlled to perform the following actions: The relay K21 in the control current loop is normally closed, K22 is normally open, and K24 is closed. The relay K52 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the second master station to open; Control the relay K2 in the first secondary station switching device to be normally open, and K1 and K3 to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the B phase of the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the C1 single test, the relay in the first master station switching device is controlled to perform the following actions: The relay K31 in the control current loop is normally closed, K32 is normally open, and K34 is closed. The relay K53 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the second master station to open; Control the relay K3 in the first secondary station switching device to be normally open, and K1 and K2 to be closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the C1 phase at the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the A2 single test, the relay in the second master station switching device is controlled to perform the following actions: Relay J11 in the control current loop is normally closed, J12 is normally open, and J14 is closed. Relay J51 in the voltage loop is closed, and all other relays are open. Control all relays in the switching device of the first master station to open; Control the relay K1 in the second secondary station switching device to be normally open, and K2 and K3 to be normally closed; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the A phase of the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B2 single test, the relay in the second master station switching device is controlled to perform the following actions: The relay J21 in the control current loop is normally closed, J22 is normally open, and J24 is closed. The relay J52 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the first master station to open; Control the relay K2 in the second secondary station switching device to be normally open, and K1 and K3 to be normally closed; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the B phase of the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the C2 single test, the relay in the second master station switching device is controlled to perform the following actions: Relay J31 in the control current loop is normally closed, J32 is normally open, and J34 is closed. Relay J53 in the voltage loop is closed, and all other relays are open. Control all relays in the switching device of the first master station to open; Control the relay K3 in the second secondary station switching device to be normally open, and K1 and K2 to be normally closed; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the C phase at the head end for testing. After the test is completed, the instrument automatically records the relevant data.

[0032] By controlling the actions of the related relays in the above-mentioned master and slave station switching devices, the test instrument and the test circuit can be adjusted to a self-capacitor end open circuit test circuit, such as Fig.11 As shown in the figure (the test circuit for A1 single test, the same applies to other tests), the parameter tester applies a single-phase zero-sequence power supply to the A phase at the head end for testing. After the test is completed, the instrument automatically records the relevant data.

[0033] (7) Carry out mutual impedance test. The mutual impedance test of the double circuits on the same tower needs to be carried out separately: A1-B1, A1-C1, A1-A2, A1-B2, A1-C2, B1-C1, B1-A2, B1-B2, B1-C2, C1-A2, C1-B2, C1-C2, A2-B2, A2-C2, B2-C2, a total of 15 sets of data.

[0034] When performing the A1-B1 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: Relay K11 in the control current loop is normally closed, K12 is normally open, and K14 is closed. Relay K52 in the voltage loop is closed, and all other relays are open. Control all relays in the switching device of the second master station to open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; By controlling the actions of the related relays in the above-mentioned master and slave station switching devices, the test instrument and the test line can be adjusted to a phase-to-phase mutual impedance test circuit, such as Fig.12 As shown in the figure (the test circuit for A1-B1 test, the same applies to other tests), the parameter tester applies single-phase zero-sequence power to the A1 phase at the head end and tests the induced voltage on the B1 phase for testing. After the test is completed, the instrument automatically records the relevant data.

[0035] When performing the A1-C1 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: Relay K11 in the control current loop is normally closed, K12 is normally open, and K14 is closed. Relay K53 in the voltage loop is closed, and all other relays are open. Control all relays in the switching device of the second master station to open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the A1 phase at the head end and tests the induced voltage on the C1 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the A1-A2 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: Relay K11 in the control current loop is normally closed, K12 is normally open, K14 is closed, and the rest of the relays are all open; Control the relay in the second master station switching device to perform the following actions: Relay J51 in the control voltage loop is closed, and all other relays are open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies single-phase zero-sequence power to the A1 phase at the head end and tests the induced voltage on the A2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the A1-B2 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: Relay K11 in the control current loop is normally closed, K12 is normally open, K14 is closed, and the rest of the relays are all open; Control the relay in the second master station switching device to perform the following actions: Relay J52 in the control voltage loop is closed, and all other relays are open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies single-phase zero-sequence power to the A1 phase at the head end and tests the induced voltage on the B2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the A1-C2 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: Relay K11 in the control current loop is normally closed, K12 is normally open, K14 is closed, and the rest of the relays are all open; Control the relay in the second master station switching device to perform the following actions: Relay J53 in the control voltage loop is closed, and all other relays are open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies single-phase zero-sequence power to the A1 phase at the head end and tests the induced voltage on the C2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B1-C1 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: The relay K21 in the control current loop is normally closed, K22 is normally open, and K24 is closed. The relay K53 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the second master station to open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies single-phase zero-sequence power to the B1 phase at the head end and tests the induced voltage on the C1 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B1-A2 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: Relay K21 in the control current loop is normally closed, K22 is normally open, K24 is closed, and the rest of the relays are all open; Control the relay in the second master station switching device to perform the following actions: Relay J51 in the control voltage loop is closed, and all other relays are open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the B1 phase at the head end and tests the induced voltage at A2 to perform the test. After the test is completed, the instrument automatically records the relevant data; When performing the B1-B2 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: Relay K21 in the control current loop is normally closed, K22 is normally open, K24 is closed, and the rest of the relays are all open; Control the relay in the second master station switching device to perform the following actions: Relay J52 in the control voltage loop is closed, and all other relays are open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the B1 phase at the head end and tests the induced voltage on the B2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B1-C2 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: Relay K21 in the control current loop is normally closed, K22 is normally open, K24 is closed, and the rest of the relays are all open; Control the relay in the second master station switching device to perform the following actions: Relay J53 in the control voltage loop is closed, and all other relays are open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies single-phase zero-sequence power to the B1 phase at the head end and tests the induced voltage on the C2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the C1-A2 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: Relay K31 in the control current loop is normally closed, K32 is normally open, K34 is closed, and the rest of the relays are all open; Control the relay in the second master station switching device to perform the following actions: Relay J51 in the control voltage loop is closed, and all other relays are open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the C1 phase at the head end and tests the induced voltage on the A2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the C1-B2 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: Relay K31 in the control current loop is normally closed, K32 is normally open, K34 is closed, and the rest of the relays are all open; Control the relay in the second master station switching device to perform the following actions: Relay J52 in the control voltage loop is closed, and all other relays are open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the C1 phase at the head end and tests the induced voltage on the B2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the C1-C2 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: Relay K31 in the control current loop is normally closed, K32 is normally open, K34 is closed, and the rest of the relays are all open; Control the relay in the second master station switching device to perform the following actions: Relay J53 in the control voltage loop is closed, and all other relays are open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the C1 phase at the head end and tests the induced voltage on the C2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the A2-B2 mutual impedance test, the relay in the second master station switching device is controlled to perform the following actions: Relay J11 in the control current loop is normally closed, J12 is normally open, and J14 is closed. Relay J52 in the voltage loop is closed, and all other relays are open. Control all relays in the switching device of the first master station to open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies single-phase zero-sequence power to the A2 phase at the head end and tests the induced voltage on the B2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the A2-C2 mutual impedance test, the relay in the second master station switching device is controlled to perform the following actions: The relay J11 in the control current loop is normally closed, J12 is normally open, and J14 is closed. The relay J53 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the first master station to open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies single-phase zero-sequence power to the A2 phase at the head end and tests the induced voltage on the C2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B2-C2 mutual impedance test, the relay in the second master station switching device is controlled to perform the following actions: Relay J21 in the control current loop is normally closed, J22 is normally open, and J24 is closed. Relay J53 in the voltage loop is closed, and all other relays are open. Control all relays in the switching device of the first master station to open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the B1 phase at the head end and tests the induced voltage on the C2 phase for testing. After the test is completed, the instrument automatically records the relevant data.

[0036] (8) Conduct mutual capacitance test. The mutual capacitance test of the double circuits on the same tower needs to be performed separately: A1-B1, A1-C1, A1-A2, A1-B2, A1-C2, B1-C1, B1-A2, B1-B2, B1-C2, C1-A2, C1-B2, C1-C2, A2-B2, A2-C2, B2-C2, a total of 15 groups of data. The following takes A1-B1 as an example. The principles of the other items are the same.

[0037] When performing the A1-B1 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K11 in the A1 current loop to be normally closed, K12 to be normally open, and K14 to be closed; the relay K51 in the A1 voltage loop to be closed; the relay K21 in the B1 current loop to be normally closed, K22 to be normally open, and K33 and K35 to be closed; and all other relays to be opened; Control all relays in the switching device of the second master station to open; Control the relays K1 and K2 in the first secondary station switching device to be normally open and K3 to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; By controlling the actions of the related relays in the above-mentioned master and slave station switching devices, the test instrument and the test circuit can be adjusted to a phase-to-phase mutual capacitance test circuit, such as Fig.13 As shown in the figure (the test circuit for A1-B1 test, the same applies to other tests), the parameter tester applies single-phase zero-sequence power to the A1 phase at the head end and tests the induced current of the B1 phase for testing. After the test is completed, the instrument automatically records the relevant data.

[0038] When performing the A1-C1 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K11 in the A1 current loop to be normally closed, K12 to be normally open, and K14 to be closed; the relay K51 in the A1 voltage loop to be closed; the relay K31 in the C1 current loop to be normally closed, K32 to be normally open, and K35 to be closed; and all other relays to be opened; Control all relays in the switching device of the second master station to open; Control the relays K1 and K3 in the first secondary station switching device to be normally open and K2 to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the A1 phase at the head end and tests the induced current at C1 to perform the test. After the test is completed, the instrument automatically records the relevant data; When performing the A1-A2 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K11 in the A1 current loop to be normally closed, K12 to be normally open, and K14 to be closed, the relay K51 in the A1 voltage loop to be closed, and the other relays to be all open; Control the relay in the second master station switching device to perform the following actions: Control the relay J11 in the A2 current loop to be normally closed, J12 to be normally open, J23, J33, and J35 to be closed, and all other relays to be open; Control the relay K1 in the first secondary station switching device to be normally open, and K2 and K3 to be normally closed; Control the relay K1 in the second secondary station switching device to be normally open, and K2 and K3 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the A1 phase at the head end and tests the induced current at A2 to perform the test. After the test is completed, the instrument automatically records the relevant data; When performing the A1-B2 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K11 in the A1 current loop to be normally closed, K12 to be normally open, and K14 to be closed, the relay K51 in the A1 voltage loop to be closed, and the other relays to be all open; Control the relay in the second master station switching device to perform the following actions: Control the relay J21 in the B2 current loop to be normally closed, J22 to be normally open, J33 and J35 to be closed, and all other relays to be open; Control the relay K1 in the first secondary station switching device to be normally open, and K2 and K3 to be normally closed; Control the relay K2 in the second secondary station switching device to be normally open, and K1 and K3 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the A1 phase at the head end and tests the induced current at B2 for testing. After the test is completed, the instrument automatically records the relevant data; When performing the A1-C2 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K11 in the A1 current loop to be normally closed, K12 to be normally open, and K14 to be closed, the relay K51 in the A1 voltage loop to be closed, and the other relays to be all open; Control the relay in the second master station switching device to perform the following actions: Control the relay J31 in the C2 current loop to be normally closed, J32 to be normally open, J35 to be closed, and all other relays to be open; Control the relay K1 in the first secondary station switching device to be normally open, and K2 and K3 to be normally closed; Control the relay K3 in the second secondary station switching device to be normally open, and K1 and K2 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the A1 phase at the head end and tests the induced current on the C2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B1-C1 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K21 in the B1 current loop to be normally closed, K22 to be normally open, and K24 to be closed; control the relay K52 in the B1 voltage loop to be closed; control the relay K31 in the C1 current loop to be normally closed, K32 to be normally open, and K35 to be closed; and all other relays to be opened; Control all relays in the switching device of the second master station to open; Control the relays K2 and K3 in the first secondary station switching device to be normally open and K1 to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the B1 phase at the head end and tests the induced current on the C1 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B1-A2 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K21 in the B1 current loop to be normally closed, K22 to be normally open, and K24 to be closed; control the relay K52 in the B1 voltage loop to be closed, and all other relays to be open; Control the relay in the second master station switching device to perform the following actions: Control the relay J11 in the A2 current loop to be normally closed, J12 to be normally open, J23, J33, and J35 to be closed, and all other relays to be open; Control the relay K2 in the first secondary station switching device to be normally open, and K1 and K3 to be normally closed; Control the relay K1 in the second secondary station switching device to be normally open, and K2 and K3 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the B1 phase at the head end and tests the induced current at A2 to perform the test. After the test is completed, the instrument automatically records the relevant data; When performing the B1-B2 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K21 in the B1 current loop to be normally closed, K22 to be normally open, and K24 to be closed, the relay K52 in the B1 voltage loop to be closed, and the other relays to be all open; Control the relay in the second master station switching device to perform the following actions: Control the relay J21 in the B2 current loop to be normally closed, J22 to be normally open, J33 and J35 to be closed, and all other relays to be open; Control the relay K2 in the first secondary station switching device to be normally open, and K1 and K3 to be normally closed; Control the relay K2 in the second secondary station switching device to be normally open, and K1 and K3 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the B1 phase at the head end and tests the induced current on the B2 phase for testing. After the test is completed, the instrument automatically records the relevant numbers; When performing the B1-C2 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K21 in the B1 current loop to be normally closed, K22 to be normally open, and K24 to be closed, the relay K52 in the B1 voltage loop to be closed, and the other relays to be all open; Control the relay in the second master station switching device to perform the following actions: Control the relay J31 in the C2 current loop to be normally closed, J32 to be normally open, J35 to be closed, and all other relays to be open; Control the relay K2 in the first secondary station switching device to be normally open, and K1 and K3 to be normally closed; Control the relay K3 in the second secondary station switching device to be normally open, and K1 and K2 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the B1 phase at the head end and tests the induced current at C2 to perform the test. After the test is completed, the instrument automatically records the relevant data; When performing the C1-A2 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K31 in the C1 current loop to be normally closed, K32 to be normally open, and K34 to be closed, the relay K53 in the C1 voltage loop to be closed, and the other relays to be all open; Control the relay in the second master station switching device to perform the following actions: Control the relay J11 in the A2 current loop to be normally closed, J12 to be normally open, J23, J33, and J35 to be closed, and all other relays to be open; Control the relay K3 in the first secondary station switching device to be normally open, and K1 and K2 to be normally closed; Control the relay K1 in the second secondary station switching device to be normally open, and K2 and K3 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the C1 phase at the head end and tests the induced current at A2 to perform the test. After the test is completed, the instrument automatically records the relevant data; When performing the C1-B2 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K31 in the C1 current loop to be normally closed, K32 to be normally open, and K34 to be closed, the relay K53 in the C1 voltage loop to be closed, and the other relays to be all open; Control the relay in the second master station switching device to perform the following actions: Control the relay J21 in the B2 current loop to be normally closed, J22 to be normally open, J33 and J35 to be closed, and all other relays to be open; Control the relay K3 in the first secondary station switching device to be normally open, and K1 and K2 to be normally closed; Control the relay K2 in the second secondary station switching device to be normally open, and K1 and K3 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the C1 phase at the head end and tests the induced current at B2 to perform the test. After the test is completed, the instrument automatically records the relevant data; When performing the C1-C2 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K31 in the C1 current loop to be normally closed, K32 to be normally open, and K34 to be closed, the relay K53 in the C1 voltage loop to be closed, and the other relays to be all open; Control the relay in the second master station switching device to perform the following actions: Control the relay J31 in the C2 current loop to be normally closed, J32 to be normally open, J35 to be closed, and all other relays to be open; Control the relay K3 in the first secondary station switching device to be normally open, and K1 and K2 to be normally closed; Control the relay K3 in the second secondary station switching device to be normally open, and K1 and K2 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the C1 phase at the head end and tests the induced current at the C2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the A2-B2 mutual capacitance test, the relay in the second master station switching device is controlled to perform the following actions: Control the relay J11 in the A2 current loop to be normally closed, J12 to be normally open, and J14 to be closed; the relay J51 in the A2 voltage loop to be closed; the relay J21 in the B2 current loop to be normally closed, J22 to be normally open, and J33 and J35 to be closed; and all other relays to be opened; Control all relays in the switching device of the first master station to open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1 and K2 in the second secondary station switching device to be normally open and K3 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the A2 phase at the head end and tests the induced current at B2 to perform the test. After the test is completed, the instrument automatically records the relevant data; When performing the A2-C2 mutual capacitance test, the relay in the second master station switching device is controlled to perform the following actions: Control the relay J11 in the A2 current loop to be normally closed, J12 to be normally open, and J14 to be closed; the relay J51 in the A2 voltage loop to be closed; the relay J31 in the C2 current loop to be normally closed, J32 to be normally open, and J35 to be closed; and all other relays to be opened; Control all relays in the switching device of the first master station to open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1 and K3 in the second secondary station switching device to be normally open and K2 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the A2 phase at the head end and tests the induced current at C2 to perform the test. After the test is completed, the instrument automatically records the relevant data; When performing the B2-C2 mutual capacitance test, the relay in the second master station switching device is controlled to perform the following actions: Control the relay J21 in the B2 current loop to be normally closed, J22 to be normally open, and J24 to be closed; control the relay J52 in the B2 voltage loop to be closed; control the relay J31 in the C2 current loop to be normally closed, J32 to be normally open, and J35 to be closed; and all other relays to be opened; Control all relays in the switching device of the first master station to open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K2 and K3 in the second secondary station switching device to be normally open and K1 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the B2 phase at the head end and tests the induced current at C2 to perform the test. After the test is completed, the instrument automatically records the relevant data.

[0039] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A UHV transmission line parameter test control system, characterized in that: It includes a wireless console, a parameter tester, a first master station switching device, a second master station switching device, a first slave station switching device, and a second slave station switching device; The parameter tester is connected to the first master station switching device and the second master station switching device respectively through test wires; A first master station switching device as a head end is connected to a first slave station switching device as a terminal end through a first test transmission line; The second main station switching device as the head end is connected to the second secondary station switching device as the end end through the second test transmission line; The wireless console is wirelessly connected to the parameter tester, the first master station switching device, the second master station switching device, the first secondary station switching device, and the second secondary station switching device through a wireless network; A current test circuit and a voltage test circuit are provided inside the first master station switching device, wherein relays K11, K12, K13, K14, K21, K22, K23, K24, K31, K32, K33, K34, K35 are provided in the current test circuit, and relays K51, K52, K53 are provided in the voltage test circuit; The structure of the current test circuit is: The common node of the relay K11 is connected to the A1 phase output terminal of the first master station switching device, the normally closed end of the relay K11 is connected to the common node of the relay K12, the normally open end of the relay K12 is respectively connected to one end of the contact of the relay K14 and one end of the contact of the relay K23, and the other end of the contact of the relay K14 is connected to the A phase input terminal of the parameter tester; The common node of the relay K21 is connected to the B1 phase output terminal of the first master station switching device, the normally closed end of the relay K21 is connected to the common node of the relay K22, the normally open end of the relay K22 is respectively connected to one end of the contact of the relay K24, one end of the contact of the relay K33, and the other end of the contact of the relay K23, and the other end of the contact of the relay K24 is connected to the B phase input terminal of the parameter tester; The common node of the relay K31 is connected to the C1 phase output terminal of the first master station switching device, the normally closed end of the relay K31 is connected to the common node of the relay K32, the normally open end of the relay K32 is respectively connected to one end of the contact of the relay K34, one end of the contact of the relay K35, and the other end of the contact of the relay K33, and the other end of the contact of the relay K34 is connected to the C phase input terminal of the parameter tester; The other end of the contact of the relay K35 is connected to the Id end of the parameter tester; The structure of the voltage test circuit is: One end of the contact of the relay K51 is connected to the A1 phase voltage test end of the first master station switching device, and the other end of the contact of the relay K51 is connected to the UA test end of the parameter tester; One end of the contact of the relay K52 is connected to the B1 phase voltage test end of the first master station switching device, and the other end of the contact of the relay K52 is connected to the UB test end of the parameter tester; One end of the contact of the relay K53 is connected to the C1 phase voltage test end of the first master station switching device, and the other end of the contact of the relay K53 is connected to the UC test end of the parameter tester; A current test circuit and a voltage test circuit are provided inside the second master station switching device, wherein relays J11, J12, J13, J14, J21, J22, J23, J24, J31, J32, J33, J34, J35 are provided in the current test circuit, and relays J51, J52, J53 are provided in the voltage test circuit; The structure of the current test circuit is: The common node of the relay J11 is connected to the A2 phase output terminal of the first master station switching device, the normally closed end of the relay J11 is connected to the common node of the relay J12, the normally open end of the relay J12 is respectively connected to one end of the contact of the relay J14 and one end of the contact of the relay J23, and the other end of the contact of the relay J14 is connected to the A phase input terminal of the parameter tester; The common node of the relay J21 is connected to the B2 phase output terminal of the first master station switching device, the normally closed end of the relay J21 is connected to the common node of the relay J22, the normally open end of the relay J22 is respectively connected to one end of the contact of the relay J24, one end of the contact of the relay J33, and the other end of the contact of the relay J23, and the other end of the contact of the relay J24 is connected to the B phase input terminal of the parameter tester; The common node of the relay J31 is connected to the C2 phase output terminal of the first master station switching device, the normally closed end of the relay J31 is connected to the common node of the relay J32, the normally open end of the relay J32 is respectively connected to one end of the contact of the relay J34, one end of the contact of the relay J35, and the other end of the contact of the relay J33, and the other end of the contact of the relay J34 is connected to the C phase input terminal of the parameter tester; The other end of the relay J35 contact is connected to the ID end of the parameter tester; The structure of the voltage test circuit is: One end of the contact of the relay J51 is connected to the A2 phase voltage test end of the first master station switching device, and the other end of the contact of the relay J51 is connected to the UA test end of the parameter tester; One end of the contact of the relay J52 is connected to the B2 phase voltage test end of the first master station switching device, and the other end of the contact of the relay J52 is connected to the UB test end of the parameter tester; One end of the contact of the relay J53 is connected to the C2 phase voltage test end of the first master station switching device, and the other end of the contact of the relay J53 is connected to the UC test end of the parameter tester; The first secondary station switching device or the second secondary station switching device is provided with relays K1, K2, K3, and the circuit structure inside the first secondary station switching device is: The common node of the relay K1 is connected to the A-phase input terminal of the first secondary station switching device, the normally closed terminal of the relay K1 is connected to the current transformer, and the control coil of the relay K1 is connected to the signal output terminal of the built-in controller of the first secondary station switching device; The common node of the relay K2 is connected to the B-phase input terminal of the first secondary station switching device, the normally closed terminal of the relay K2 is connected to the current transformer, and the control coil of the relay K2 is connected to the signal output terminal of the built-in controller of the first secondary station switching device; The common node of the relay K3 is connected to the C-phase input terminal of the first secondary station switching device, the normally closed terminal of the relay K3 is connected to the current transformer, and the control coil of the relay K3 is connected to the signal output terminal of the built-in controller of the first secondary station switching device; The circuit structure inside the second secondary station switching device is the same as that of the first secondary station switching device.

2. The method for controlling a UHV transmission line parameter test control system according to claim 1, characterized in that: The control steps include the following: Step 1: Connect the parameter tester, the first master station switching device, the second master station switching device, the first slave station switching device, and the second slave station switching device to form a test circuit for testing the UHV transmission line; Step 2: Perform instrument testing and network the master station switching device and the slave station switching device; Step 3: Enter the operation interface of the UHV test module, and perform double-circuit positive-sequence short-circuit impedance test, double-circuit zero-sequence short-circuit impedance test, double-circuit positive-sequence open-circuit impedance test, double-circuit zero-sequence open-circuit impedance test, self-impedance test, self-capacitance test, mutual impedance test, and mutual capacitance test respectively; Step 4: Store and upload the data recorded by each test item to complete remote test control.

3. The method for controlling a UHV transmission line parameter test control system according to claim 2, characterized in that: The specific method for performing the double-loop positive sequence short-circuit impedance test in step 3 is: Control the relay in the first master station switching device to perform the following actions: The relays K11, K21, and K31 in the control current loop are normally closed, K12, K22, and K32 are normally open, K14 is closed, the relay K51 in the voltage loop is closed, and the other relays are all open; Control the relay in the second master station switching device to perform the following actions: Relays J11, J21, and J31 in the control current loop are normally closed, J12, J22, and J32 are normally open, J24 is closed, relay J52 in the voltage loop is closed, and all other relays are open; Relays K1, K2 and K3 in the first and second secondary station switching devices are controlled to be normally closed respectively; The parameter tester applies a two-phase positive sequence power supply at the head end for testing. After the test is completed, the instrument automatically records the relevant data.

4. The method for controlling a UHV transmission line parameter test control system according to claim 2, characterized in that: The specific method for performing the double-loop zero-sequence short-circuit impedance test in step 3 is: Control the relay in the first master station switching device to perform the following actions: The relays K11, K21, and K31 in the control current loop are normally closed, K12, K22, and K32 are normally open, K14 is closed, the relay K51 in the voltage loop is closed, and the other relays are all open; Control the relay in the second master station switching device to perform the following actions: Relays J11, J21, and J31 in the control current loop are normally closed, J12, J22, and J32 are normally open, J24 is closed, relay J52 in the voltage loop is closed, and all other relays are open; Relays K1, K2 and K3 in the first and second secondary station switching devices are controlled to be normally closed respectively; The parameter tester applies single-phase zero-sequence power to the A and B phases at the head end for testing. After the test is completed, the instrument automatically records the relevant data.

5. The method for controlling a UHV transmission line parameter test control system according to claim 2, characterized in that: The specific method for performing the double-loop positive sequence open-circuit impedance test in step 3 is: Control the relay in the first master station switching device to perform the following actions: The relays K11, K21, and K31 in the control current loop are normally closed, K12, K22, and K32 are normally open, K14 is closed, the relay K51 in the voltage loop is closed, and the other relays are all open; Control the relay in the second master station switching device to perform the following actions: Relays J11, J21, and J31 in the control current loop are normally closed, J12, J22, and J32 are normally open, J24 is closed, relay J52 in the voltage loop is closed, and all other relays are open; Relays K1, K2 and K3 in the first and second secondary station switching devices are controlled to be normally open respectively; The parameter tester applies two-phase positive sequence power to the A and B phases at the head end for testing. After the test is completed, the instrument automatically records the relevant data.

6. The method for controlling a UHV transmission line parameter test control system according to claim 2, characterized in that: The specific method for performing the double-loop zero-sequence open-circuit impedance test in step 3 is: Control the relay in the first master station switching device to perform the following actions: The relays K11, K21, and K31 in the control current loop are normally closed, K12, K22, and K32 are normally open, K14 is closed, the relay K51 in the voltage loop is closed, and the other relays are all open; Control the relay in the second master station switching device to perform the following actions: Relays J11, J21, and J31 in the control current loop are normally closed, J12, J22, and J32 are normally open, J24 is closed, relay J52 in the voltage loop is closed, and all other relays are open; Relays K1, K2 and K3 in the first and second secondary station switching devices are controlled to be normally open respectively; The parameter tester applies single-phase zero-sequence power to the A and B phases at the head end for testing. After the test is completed, the instrument automatically records the relevant data.

7. The method for controlling a UHV transmission line parameter test control system according to claim 2, characterized in that: The specific method for performing the self-impedance test in step 3 is: The self-impedance test for the double circuits on the same tower needs to be done separately: A1 single item, B1 single item, C1 single item, A2 single item, B2 single item, C2 single item, a total of 6 sets of data, including: When performing the A1 single test, the relay in the first master station switching device is controlled to perform the following actions: The relay K11 in the control current loop is normally closed, K12 is normally open, and K14 is closed. The relay K51 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the second master station to open; Control the relay K1 in the first secondary station switching device to be normally closed, and K2 and K3 to be normally open; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally open; The parameter tester applies a single-phase zero-sequence power supply to the A phase of the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B1 single test, the relay in the first master station switching device is controlled to perform the following actions: Relay K21 in the control current loop is normally closed, K22 is normally open, K24 is closed, K52 in the voltage loop is closed, and all other relays are open; Control all relays in the switching device of the second master station to open; Control the relay K2 in the first secondary station switching device to be normally closed, and K1 and K3 to be normally open; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally open; The parameter tester applies a single-phase zero-sequence power supply to the B phase of the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the C1 single test, the relay in the first master station switching device is controlled to perform the following actions: The relay K31 in the control current loop is normally closed, K32 is normally open, and K34 is closed. The relay K53 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the second master station to open; Control the relay K3 in the first secondary station switching device to be normally closed, and K2 and K2 to be normally open; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally open; The parameter tester applies a single-phase zero-sequence power supply to the C phase at the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the A2 single test, the relay in the second master station switching device is controlled to perform the following actions: Relay J11 in the control current loop is normally closed, J12 is normally open, and J14 is closed. Relay J51 in the voltage loop is closed, and all other relays are open. Control all relays in the switching device of the first master station to open; Control the relay K1 in the second secondary station switching device to be normally closed, and K2 and K3 to be normally open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally open; The parameter tester applies a single-phase zero-sequence power supply to the A phase of the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B2 single test, the relay in the second master station switching device is controlled to perform the following actions: The relay J21 in the control current loop is normally closed, J22 is normally open, and J24 is closed. The relay J52 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the first master station to open; Control the relay K2 in the second secondary station switching device to be normally closed, and K1 and K3 to be normally open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally open; The parameter tester applies a single-phase zero-sequence power supply to the B phase of the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the C2 single test, the relay in the second master station switching device is controlled to perform the following actions: Relay J31 in the control current loop is normally closed, J32 is normally open, and J34 is closed. Relay J53 in the voltage loop is closed, and all other relays are open. Control all relays in the switching device of the first master station to open; Control the relay K3 in the second secondary station switching device to be normally closed, and K1 and K2 to be normally open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally open; The parameter tester applies a single-phase zero-sequence power supply to the C phase at the head end for testing. After the test is completed, the instrument automatically records the relevant data.

8. The method for controlling a UHV transmission line parameter test control system according to claim 2, characterized in that: The specific method for performing the self-capacitance test in step 3 is: The self-capacitance test for the double circuits on the same tower needs to be done separately: A1 single item, B1 single item, C1 single item, A2 single item, B2 single item, C2 single item, a total of 6 sets of data, including: When performing the A1 single test, the relay in the first master station switching device is controlled to perform the following actions: The relay K11 in the control current loop is normally closed, K12 is normally open, and K14 is closed. The relay K51 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the second master station to open; Control the relay K1 in the first secondary station switching device to be normally open, and K2 and K3 to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the A phase of the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B1 single test, the relay in the first master station switching device is controlled to perform the following actions: Relay K21 in the control current loop is normally closed, K22 is normally open, and K24 is closed. Relay K52 in the voltage loop is closed, and all other relays are open. Control all relays in the switching device of the second master station to open; Control the relay K2 in the first secondary station switching device to be normally open, and K1 and K3 to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the B phase of the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the C1 single test, the relay in the first master station switching device is controlled to perform the following actions: The relay K31 in the control current loop is normally closed, K32 is normally open, and K34 is closed. The relay K53 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the second master station to open; Control the relay K3 in the first secondary station switching device to be normally open, and K1 and K2 to be closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the C1 phase at the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the A2 single test, the relay in the second master station switching device is controlled to perform the following actions: Relay J11 in the control current loop is normally closed, J12 is normally open, and J14 is closed. Relay J51 in the voltage loop is closed, and all other relays are open. Control all relays in the switching device of the first master station to open; Control the relay K1 in the second secondary station switching device to be normally open, and K2 and K3 to be normally closed; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the A phase of the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B2 single test, the relay in the second master station switching device is controlled to perform the following actions: The relay J21 in the control current loop is normally closed, J22 is normally open, and J24 is closed. The relay J52 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the first master station to open; Control the relay K2 in the second secondary station switching device to be normally open, and K1 and K3 to be normally closed; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the B phase of the head end for testing. After the test is completed, the instrument automatically records the relevant data; When performing the C2 single test, the relay in the second master station switching device is controlled to perform the following actions: Relay J31 in the control current loop is normally closed, J32 is normally open, and J34 is closed. Relay J53 in the voltage loop is closed, and all other relays are open. Control all relays in the switching device of the first master station to open; Control the relay K3 in the second secondary station switching device to be normally open, and K1 and K2 to be normally closed; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the C phase at the head end for testing. After the test is completed, the instrument automatically records the relevant data.

9. The method for controlling a UHV transmission line parameter test control system according to claim 2, characterized in that: The specific method for performing the mutual impedance test in step 3 is: The mutual impedance test of the double circuits on the same tower needs to be done separately: A1-B1, A1-C1, A1-A2, A1-B2, A1-C2, B1-C1, B1-A2, B1-B2, B1-C2, C1-A2, C1-B2, C1-C2, A2-B2, A2-C2, B2-C2, a total of 15 groups of data, including: When performing the A1-B1 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: The relay K11 in the control current loop is normally closed, K12 is normally open, and K14 is closed. The relay K52 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the second master station to open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies single-phase zero-sequence power to the A1 phase at the head end and tests the induced voltage on the B1 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the A1-C1 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: The relay K11 in the control current loop is normally closed, K12 is normally open, and K14 is closed. The relay K53 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the second master station to open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the A1 phase at the head end and tests the induced voltage on the C1 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the A1-A2 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: Relay K11 in the control current loop is normally closed, K12 is normally open, K14 is closed, and the rest of the relays are all open; Control the relay in the second master station switching device to perform the following actions: Relay J51 in the control voltage loop is closed, and all other relays are open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the A1 phase at the head end and tests the induced voltage on the A2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the A1-B2 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: Relay K11 in the control current loop is normally closed, K12 is normally open, K14 is closed, and the rest of the relays are all open; Control the relay in the second master station switching device to perform the following actions: Relay J52 in the control voltage loop is closed, and all other relays are open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies single-phase zero-sequence power to the A1 phase at the head end and tests the induced voltage on the B2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the A1-C2 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: Relay K11 in the control current loop is normally closed, K12 is normally open, K14 is closed, and the rest of the relays are all open; Control the relay in the second master station switching device to perform the following actions: Relay J53 in the control voltage loop is closed, and all other relays are open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies single-phase zero-sequence power to the A1 phase at the head end and tests the induced voltage on the C2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B1-C1 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: The relay K21 in the control current loop is normally closed, K22 is normally open, and K24 is closed. The relay K53 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the second master station to open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the B1 phase at the head end and tests the induced voltage on the C1 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B1-A2 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: Relay K21 in the control current loop is normally closed, K22 is normally open, K24 is closed, and the rest of the relays are all open; Control the relay in the second master station switching device to perform the following actions: Relay J51 in the control voltage loop is closed, and all other relays are open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the B1 phase at the head end and tests the induced voltage at A2 to perform the test. After the test is completed, the instrument automatically records the relevant data; When performing the B1-B2 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: Relay K21 in the control current loop is normally closed, K22 is normally open, K24 is closed, and the rest of the relays are all open; Control the relay in the second master station switching device to perform the following actions: Relay J52 in the control voltage loop is closed, and all other relays are open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the B1 phase at the head end and tests the induced voltage on the B2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B1-C2 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: Relay K21 in the control current loop is normally closed, K22 is normally open, K24 is closed, and the rest of the relays are all open; Control the relay in the second master station switching device to perform the following actions: Relay J53 in the control voltage loop is closed, and all other relays are open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies single-phase zero-sequence power to the B1 phase at the head end and tests the induced voltage on the C2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the C1-A2 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: Relay K31 in the control current loop is normally closed, K32 is normally open, K34 is closed, and the rest of the relays are all open; Control the relay in the second master station switching device to perform the following actions: Relay J51 in the control voltage loop is closed, and all other relays are open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the C1 phase at the head end and tests the induced voltage on the A2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the C1-B2 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: Relay K31 in the control current loop is normally closed, K32 is normally open, K34 is closed, and the rest of the relays are all open; Control the relay in the second master station switching device to perform the following actions: Relay J52 in the control voltage loop is closed, and all other relays are open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the C1 phase at the head end and tests the induced voltage on the B2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the C1-C2 mutual impedance test, the relay in the first master station switching device is controlled to perform the following actions: Relay K31 in the control current loop is normally closed, K32 is normally open, K34 is closed, and the rest of the relays are all open; Control the relay in the second master station switching device to perform the following actions: Relay J53 in the control voltage loop is closed, and all other relays are open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the C1 phase at the head end and tests the induced voltage on the C2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the A2-B2 mutual impedance test, the relay in the second master station switching device is controlled to perform the following actions: Relay J11 in the control current loop is normally closed, J12 is normally open, and J14 is closed. Relay J52 in the voltage loop is closed, and all other relays are open. Control all relays in the switching device of the first master station to open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies single-phase zero-sequence power to the A2 phase at the head end and tests the induced voltage on the B2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the A2-C2 mutual impedance test, the relay in the second master station switching device is controlled to perform the following actions: The relay J11 in the control current loop is normally closed, J12 is normally open, and J14 is closed. The relay J53 in the voltage loop is closed, and the other relays are all open. Control all relays in the switching device of the first master station to open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies single-phase zero-sequence power to the A2 phase at the head end and tests the induced voltage on the C2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B2-C2 mutual impedance test, the relay in the second master station switching device is controlled to perform the following actions: Relay J21 in the control current loop is normally closed, J22 is normally open, and J24 is closed. Relay J53 in the voltage loop is closed, and all other relays are open. Control all relays in the switching device of the first master station to open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the B1 phase at the head end and tests the induced voltage on the C2 phase for testing. After the test is completed, the instrument automatically records the relevant data.

10. The method for controlling a UHV transmission line parameter test control system according to claim 2, characterized in that: The specific method for performing mutual capacitance testing in step 3 is: The mutual capacitance test of the dual circuits on the same tower needs to be done separately: A1-B1, A1-C1, A1-A2, A1-B2, A1-C2, B1-C1, B1-A2, B1-B2, B1-C2, C1-A2, C1-B2, C1-C2, A2-B2, A2-C2, B2-C2, a total of 15 groups of data, among which: When performing the A1-B1 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K11 in the A1 current loop to be normally closed, K12 to be normally open, and K14 to be closed; the relay K51 in the A1 voltage loop to be closed; the relay K21 in the B1 current loop to be normally closed, K22 to be normally open, and K33 and K35 to be closed; and all other relays to be opened; Control all relays in the switching device of the second master station to open; Control the relays K1 and K2 in the first secondary station switching device to be normally open and K3 to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the A1 phase at the head end and tests the induced current at B1 to perform the test. After the test is completed, the instrument automatically records the relevant data; When performing the A1-C1 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K11 in the A1 current loop to be normally closed, K12 to be normally open, and K14 to be closed; the relay K51 in the A1 voltage loop to be closed; the relay K31 in the C1 current loop to be normally closed, K32 to be normally open, and K35 to be closed; and all other relays to be opened; Control all relays in the switching device of the second master station to open; Control the relays K1 and K3 in the first secondary station switching device to be normally open and K2 to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the A1 phase at the head end and tests the induced current at C1 to perform the test. After the test is completed, the instrument automatically records the relevant data; When performing the A1-A2 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K11 in the A1 current loop to be normally closed, K12 to be normally open, and K14 to be closed, the relay K51 in the A1 voltage loop to be closed, and the other relays to be all open; Control the relay in the second master station switching device to perform the following actions: Control the relay J11 in the A2 current loop to be normally closed, J12 to be normally open, J23, J33, and J35 to be closed, and all other relays to be open; Control the relay K1 in the first secondary station switching device to be normally open, and K2 and K3 to be normally closed; Control the relay K1 in the second secondary station switching device to be normally open, and K2 and K3 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the A1 phase at the head end and tests the induced current at A2 to perform the test. After the test is completed, the instrument automatically records the relevant data; When performing the A1-B2 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K11 in the A1 current loop to be normally closed, K12 to be normally open, and K14 to be closed, the relay K51 in the A1 voltage loop to be closed, and the other relays to be all open; Control the relay in the second master station switching device to perform the following actions: Control the relay J21 in the B2 current loop to be normally closed, J22 to be normally open, J33 and J35 to be closed, and all other relays to be open; Control the relay K1 in the first secondary station switching device to be normally open, and K2 and K3 to be normally closed; Control the relay K2 in the second secondary station switching device to be normally open, and K1 and K3 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the A1 phase at the head end and tests the induced current at B2 for testing. After the test is completed, the instrument automatically records the relevant data; When performing the A1-C2 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K11 in the A1 current loop to be normally closed, K12 to be normally open, and K14 to be closed, the relay K51 in the A1 voltage loop to be closed, and the other relays to be all open; Control the relay in the second master station switching device to perform the following actions: Control the relay J31 in the C2 current loop to be normally closed, J32 to be normally open, J35 to be closed, and all other relays to be open; Control the relay K1 in the first secondary station switching device to be normally open, and K2 and K3 to be normally closed; Control the relay K3 in the second secondary station switching device to be normally open, and K1 and K2 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the A1 phase at the head end and tests the induced current on the C2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B1-C1 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K21 in the B1 current loop to be normally closed, K22 to be normally open, and K24 to be closed; control the relay K52 in the B1 voltage loop to be closed; control the relay K31 in the C1 current loop to be normally closed, K32 to be normally open, and K35 to be closed; and all other relays to be opened; Control all relays in the switching device of the second master station to open; Control the relays K2 and K3 in the first secondary station switching device to be normally open and K1 to be normally closed; Control the relays K1, K2 and K3 in the second secondary station switching device to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the B1 phase at the head end and tests the induced current on the C1 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the B1-A2 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K21 in the B1 current loop to be normally closed, K22 to be normally open, and K24 to be closed; control the relay K52 in the B1 voltage loop to be closed, and all other relays to be open; Control the relay in the second master station switching device to perform the following actions: Control the relay J11 in the A2 current loop to be normally closed, J12 to be normally open, J23, J33, and J35 to be closed, and all other relays to be open; Control the relay K2 in the first secondary station switching device to be normally open, and K1 and K3 to be normally closed; Control the relay K1 in the second secondary station switching device to be normally open, and K2 and K3 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the B1 phase at the head end and tests the induced current at A2 to perform the test. After the test is completed, the instrument automatically records the relevant data; When performing the B1-B2 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K21 in the B1 current loop to be normally closed, K22 to be normally open, and K24 to be closed, the relay K52 in the B1 voltage loop to be closed, and the other relays to be all open; Control the relay in the second master station switching device to perform the following actions: Control the relay J21 in the B2 current loop to be normally closed, J22 to be normally open, J33 and J35 to be closed, and all other relays to be open; Control the relay K2 in the first secondary station switching device to be normally open, and K1 and K3 to be normally closed; Control the relay K2 in the second secondary station switching device to be normally open, and K1 and K3 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the B1 phase at the head end and tests the induced current on the B2 phase for testing. After the test is completed, the instrument automatically records the relevant numbers; When performing the B1-C2 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K21 in the B1 current loop to be normally closed, K22 to be normally open, and K24 to be closed, the relay K52 in the B1 voltage loop to be closed, and the other relays to be all open; Control the relay in the second master station switching device to perform the following actions: Control the relay J31 in the C2 current loop to be normally closed, J32 to be normally open, J35 to be closed, and all other relays to be open; Control the relay K2 in the first secondary station switching device to be normally open, and K1 and K3 to be normally closed; Control the relay K3 in the second secondary station switching device to be normally open, and K1 and K2 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the B1 phase at the head end and tests the induced current at C2 to perform the test. After the test is completed, the instrument automatically records the relevant data; When performing the C1-A2 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K31 in the C1 current loop to be normally closed, K32 to be normally open, and K34 to be closed, the relay K53 in the C1 voltage loop to be closed, and the other relays to be all open; Control the relay in the second master station switching device to perform the following actions: Control the relay J11 in the A2 current loop to be normally closed, J12 to be normally open, J23, J33, and J35 to be closed, and all other relays to be open; Control the relay K3 in the first secondary station switching device to be normally open, and K1 and K2 to be normally closed; Control the relay K1 in the second secondary station switching device to be normally open, and K2 and K3 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the C1 phase at the head end and tests the induced current at A2 to perform the test. After the test is completed, the instrument automatically records the relevant data; When performing the C1-B2 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K31 in the C1 current loop to be normally closed, K32 to be normally open, and K34 to be closed, the relay K53 in the C1 voltage loop to be closed, and the other relays to be all open; Control the relay in the second master station switching device to perform the following actions: Control the relay J21 in the B2 current loop to be normally closed, J22 to be normally open, J33 and J35 to be closed, and all other relays to be open; Control the relay K3 in the first secondary station switching device to be normally open, and K1 and K2 to be normally closed; Control the relay K2 in the second secondary station switching device to be normally open, and K1 and K3 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the C1 phase at the head end and tests the induced current at B2 to perform the test. After the test is completed, the instrument automatically records the relevant data; When performing the C1-C2 mutual capacitance test, the relay in the first master station switching device is controlled to perform the following actions: Control the relay K31 in the C1 current loop to be normally closed, K32 to be normally open, and K34 to be closed, the relay K53 in the C1 voltage loop to be closed, and the other relays to be all open; Control the relay in the second master station switching device to perform the following actions: Control the relay J31 in the C2 current loop to be normally closed, J32 to be normally open, J35 to be closed, and all other relays to be open; Control the relay K3 in the first secondary station switching device to be normally open, and K1 and K2 to be normally closed; Control the relay K3 in the second secondary station switching device to be normally open, and K1 and K2 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the C1 phase at the head end and tests the induced current at the C2 phase for testing. After the test is completed, the instrument automatically records the relevant data; When performing the A2-B2 mutual capacitance test, the relay in the second master station switching device is controlled to perform the following actions: Control the relay J11 in the A2 current loop to be normally closed, J12 to be normally open, and J14 to be closed; the relay J51 in the A2 voltage loop to be closed; the relay J21 in the B2 current loop to be normally closed, J22 to be normally open, and J33 and J35 to be closed; and all other relays to be opened; Control all relays in the switching device of the first master station to open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1 and K2 in the second secondary station switching device to be normally open and K3 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the A2 phase at the head end and tests the induced current at B2 to perform the test. After the test is completed, the instrument automatically records the relevant data; When performing the A2-C2 mutual capacitance test, the relay in the second master station switching device is controlled to perform the following actions: Control the relay J11 in the A2 current loop to be normally closed, J12 to be normally open, and J14 to be closed; the relay J51 in the A2 voltage loop to be closed; the relay J31 in the C2 current loop to be normally closed, J32 to be normally open, and J35 to be closed; and all other relays to be opened; Control all relays in the switching device of the first master station to open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K1 and K3 in the second secondary station switching device to be normally open and K2 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the A2 phase at the head end and tests the induced current at C2 to perform the test. After the test is completed, the instrument automatically records the relevant data; When performing the B2-C2 mutual capacitance test, the relay in the second master station switching device is controlled to perform the following actions: Control the relay J21 in the B2 current loop to be normally closed, J22 to be normally open, and J24 to be closed; control the relay J52 in the B2 voltage loop to be closed; control the relay J31 in the C2 current loop to be normally closed, J32 to be normally open, and J35 to be closed; and all other relays to be opened; Control all relays in the switching device of the first master station to open; Control the relays K1, K2 and K3 in the first secondary station switching device to be normally closed; Control the relays K2 and K3 in the second secondary station switching device to be normally open and K1 to be normally closed; The parameter tester applies a single-phase zero-sequence power supply to the B2 phase at the head end and tests the induced current at C2 to perform the test. After the test is completed, the instrument automatically records the relevant data.

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