Classified collection mechanism of semiconductor laser screening equipment

Abstract

The invention relates to the technical field of semiconductor laser screening equipment, in particular to a classified collection mechanism of semiconductor laser screening equipment, which comprises a rack and a conveying belt arranged on the rack, and a mounting frame is arranged on the rack; when the device is used, under the combined action of the screening mechanism and the collecting mechanism, if the semiconductor lasers have no problems, the semiconductor lasers continue to be conveyed through the conveying belt, if the semiconductor lasers have problems, the semiconductor lasers with the quality problems are blown into the collecting bin together, and in the rotating process of a second connecting rod, a rotating shaft and a static electricity eliminating roller are driven to rotate synchronously; therefore, static electricity elimination processing is carried out on the collecting bin and the semiconductor laser in the collecting bin, lateral non-contact detection and automatic classified collection of the semiconductor laser are achieved, and the semiconductor laser can be rapidly cooled no matter whether quality problems occur or not. And irreversible damage to internal elements of the semiconductor laser due to a long-time high-temperature state is avoided.

Description

Technical Field

[0001] The present invention relates to the technical field of semiconductor laser screening equipment, and in particular to a classification and collection mechanism of semiconductor laser screening equipment. Background Art

[0002] The screening of semiconductor lasers is to ensure that the final product can meet specific performance requirements and quality standards, including high-temperature reliability testing and spectral characteristics testing. The specific process is usually to transport the semiconductor laser to the inspection point via a conveyor belt, and the inspection mechanism cooperates with the clamping component and storage component to automatically screen the semiconductor laser, and collect it after screening.

[0003] For example, the Chinese patent with application number CN202320087989.9 discloses a semiconductor laser aging screening device, which relates to the field of semiconductor laser aging screening technology, including a base, and a No. 1 conveyor belt and a No. 2 conveyor belt are arranged at the upper end of the base. The upper end of the No. 1 conveyor belt is provided with a detection mechanism, which realizes the automatic screening of qualified and unqualified semiconductor lasers after the semiconductor laser detection, thereby improving the working efficiency of the equipment. However, in the collection process after screening, friction will occur when the semiconductor laser contacts various materials, and friction will cause the generation and accumulation of static charge. Both hard contact and electrostatic damage will affect the performance of the semiconductor laser, and the collection process is to send all semiconductor lasers back to the initial position, and it is impossible to complete the automatic classification of problematic and non-problematic semiconductor lasers. Summary of the invention

[0004] In view of this, the purpose of the present invention is to propose a classification and collection mechanism for semiconductor laser screening equipment to solve the technical problems in the prior art that hard contact and electrostatic damage will affect the performance of semiconductor lasers, and it is impossible to automatically classify problematic and non-problematic semiconductor lasers.

[0005] Based on the above purpose, the present invention provides a classification and collection mechanism of a semiconductor laser screening device, comprising a frame and a conveyor belt arranged on the frame, the frame is provided with a mounting frame, the mounting frame is provided with a heat insulation cover; the mounting frame is provided with a guide opening, and the classification and collection mechanism further comprises:

[0006] A feeding rack, the feeding rack is a layered structure, the feeding rack is used to transport semiconductor lasers, and is installed in the heat shield, a movable baffle is provided in the middle of the feeding rack, and a plurality of nozzles are provided on the other side of the movable baffle on the feeding rack;

[0007] A vortex tube, the vortex tube is mounted on the frame, and the gas outlet end of the vortex tube is placed in the heat insulation cover;

[0008] A screening mechanism for performing high temperature reliability testing on semiconductor lasers, the screening mechanism being mounted on the frame;

[0009] A collecting mechanism for automatically classifying semiconductor lasers is also installed on the frame.

[0010] Furthermore, the screening mechanism comprises:

[0011] A fixing seat installed in the guide opening, wherein a toggle member is rotatably mounted on the fixing seat via a torsion spring;

[0012] A threaded rod, the threaded rod is fixedly connected to the toggle member, and the threaded rod is threadably mounted on the fixing seat;

[0013] A detection head, the detection head is installed on the top of the threaded rod;

[0014] There are at least two top support columns, the two top support columns are installed on the collecting mechanism, the two top support columns are also slidably arranged in the guide opening, and the two top support columns are respectively matched with the toggle member.

[0015] Furthermore, the top end of the top support column extends into the heat insulation cover, and when the top end of the top support column is at the lowest point, the semiconductor laser is placed in the upper structure of the feeding rack, and when the top end of the top support column is at the highest point, the semiconductor laser is placed in the lower structure of the feeding rack.

[0016] Furthermore, the collection mechanism includes:

[0017] A driving motor, wherein the driving motor is mounted on the frame;

[0018] A lead screw, the lead screw is mounted on the output end of the drive motor, and the other end of the lead screw is rotatably mounted on the frame;

[0019] Slider 1, wherein the slider 1 is slidably disposed on the frame, the slider 1 is also threadedly mounted on the lead screw, and connecting rod 1 is hingedly connected to both sides of the slider 1;

[0020] Connecting rod 2, the connecting rod 2 is rotatably installed on the frame through a rotating shaft, one end of the connecting rod 2 is hinged to the connecting rod 1, and the other end of the connecting rod 2 is hinged with a slider 2, the slider 2 is slidably arranged on the frame, and the slider 2 is fixedly connected to the top support column.

[0021] Furthermore, a collecting bin is installed at the upper end of the sliding block 1, and a side opening of the collecting bin penetrates the heat insulation cover and cooperates with the movable baffle.

[0022] Furthermore, a static electricity eliminating roller is installed on the top of the rotating shaft.

[0023] Furthermore, the surface of the static elimination roller is wrapped with a hydrophilic wrapping layer, and the surface of the static elimination roller matches the side surface of the collection bin.

[0024] Furthermore, a reinforcing rod is hinged on the frame at the side end of the second connecting rod, and the other end of the reinforcing rod is hinged on the second sliding block.

[0025] Furthermore, the reinforcing rod remains parallel to the second connecting rod.

[0026] The beneficial effects of the present invention are as follows: when the classification and collection mechanism of the semiconductor laser screening equipment of the present invention is used, under the joint action of the screening mechanism and the collecting mechanism, if there is no problem with the semiconductor laser, the semiconductor laser continues to be transported via the conveyor belt; if there is a problem with the semiconductor laser, the semiconductor laser with the quality problem is blown into the collection bin together; during the rotation of the connecting rod 2, the rotating shaft and the static elimination roller are driven to rotate synchronously, and then the collection bin and the semiconductor laser inside are subjected to static elimination treatment, thereby realizing non-contact detection and automatic classification and collection of the semiconductor laser from the side, and regardless of whether there is a quality problem, the semiconductor laser can be quickly cooled to avoid irreversible damage to the internal components of the semiconductor laser due to long-term high temperature. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] In order to more clearly illustrate the technical solutions in the present invention or the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings in the following description are only for the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0028] Figure 1 It is a structural schematic diagram of the present invention;

[0029] Figure 2 It is a schematic diagram of the assembly of the screening mechanism and the mounting frame in the present invention;

[0030] Figure 3 It is a schematic diagram of the assembly of the screening mechanism and the mounting frame in another perspective of the present invention;

[0031] Figure 4 It is a schematic diagram of the assembly of the collecting mechanism and some structures in the present invention;

[0032] Figure 5 It is a schematic diagram of the structure of the collecting mechanism in the present invention.

[0033] The markings in the figure are:

[0034] 1. Frame; 2. Conveyor belt; 3. Mounting frame; 4. Heat shield; 5. Guide opening; 6. Feeding rack; 7. Movable baffle; 8. Injection head; 9. Vortex tube; 10. Fixed seat; 11. Toggle piece; 12. Threaded rod; 13. Detection head; 14. Top support column; 15. Drive motor; 16. Lead screw; 17. Slider 1; 18. Connecting rod 1; 19. Connecting rod 2; 20. Rotating shaft; 21. Slider 2; 22. Collection bin; 23. Static elimination roller; 24. Reinforcement rod. DETAILED DESCRIPTION

[0035] In order to make the objectives, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with specific embodiments.

[0036] It should be noted that, unless otherwise defined, the technical terms or scientific terms used in the present invention should be understood by people with ordinary skills in the field to which the present invention belongs. The "first", "second" and similar words used in the present invention do not indicate any order, quantity or importance, but are only used to distinguish different components. "Include" or "comprise" and similar words mean that the elements or objects appearing before the word include the elements or objects listed after the word and their equivalents, without excluding other elements or objects. "Connect" or "connected" and similar words are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "Up", "down", "left", "right" and the like are only used to indicate relative positional relationships. When the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0037] The embodiment of the present invention provides a classification and collection mechanism for semiconductor laser screening equipment, such as Figure 1-5 As shown, it includes a frame 1 and a conveyor belt 2 arranged on the frame 1, a mounting frame 3 is arranged on the frame 1, a heat insulation cover 4 is arranged on the mounting frame 3, and a guide opening 5 is arranged on the mounting frame 3. The classification and collection mechanism also includes:

[0038] A feeding rack 6, which is a layered structure, is used to transport semiconductor lasers and is installed in the heat shield 4. A movable baffle 7 is provided in the middle of the feeding rack 6. A plurality of air jets 8 are provided on the other side of the movable baffle 7 on the feeding rack 6;

[0039] A vortex tube 9 is installed on the frame 1, and an air outlet end of the vortex tube 9 is placed in the heat insulation cover 4;

[0040] A screening mechanism for performing high temperature reliability testing on semiconductor lasers, the screening mechanism being mounted on the frame 1;

[0041] A collecting mechanism for automatically classifying semiconductor lasers is also installed on the frame 1.

[0042] In this embodiment, the screening mechanism includes:

[0043] A fixed seat 10 is installed in the guide opening 5, and a toggle member 11 is rotatably mounted on the fixed seat 10 through a torsion spring;

[0044] A threaded rod 12, the threaded rod 12 is fixedly connected to the toggle member 11, and the threaded rod 12 is threadedly mounted on the fixing seat 10;

[0045] A detection head 13, which is mounted on the top of the threaded rod 12;

[0046] There are at least two top support columns 14 , which are installed on the collecting mechanism. The two top support columns 14 are also slidably disposed in the guide opening 5 , and the two top support columns 14 are respectively matched with the toggle member 11 .

[0047] It should be noted that the top end of the top support column 14 extends into the heat insulation cover 4, and when the top end of the top support column 14 is at the lowest point, the semiconductor laser is placed in the upper structure of the feed rack 6, and when the top end of the top support column 14 is at the highest point, the semiconductor laser is placed in the lower structure of the feed rack 6.

[0048] In this embodiment, the collection mechanism includes:

[0049] A driving motor 15, wherein the driving motor 15 is mounted on the frame 1;

[0050] A lead screw 16, the lead screw 16 is mounted on the output end of the drive motor 15, and the other end of the lead screw 16 is rotatably mounted on the frame 1;

[0051] Slider 17, the slider 17 is slidably disposed on the frame 1, the slider 17 is also threadedly mounted on the lead screw 16, and both sides of the slider 17 are hinged with a connecting rod 18;

[0052] Connecting rod 2 19 is rotatably mounted on the frame 1 via a rotating shaft 20 , one end of connecting rod 29 is hinged to connecting rod 1 18 , and the other end of connecting rod 29 is hinged to slider 21 , which is slidably mounted on the frame 1 , and is fixedly connected to the top support column 14 .

[0053] In this embodiment, when in use, the semiconductor laser to be detected is placed on the conveyor belt 2, and is transported into the mechanism in the lower structure of the feeding rack 6 until it reaches the position of the detection head 13, and the driving motor 15 is started so that its output end drives the lead screw 16 to rotate, and then through the movement of the slider 17, the connecting rod 18 and the connecting rod 2 19 are cooperated to drive the two sliders 21 to slide toward each other on the frame 1. During the sliding process of the slider 21, the toggle member 11 is rotated by the top support column 14, and the two top support columns 14 complete the positioning of the semiconductor laser, and then the detection head 13 is pushed upward by the threaded rod 12, so that the semiconductor laser on the detection head 13 rotates upward synchronously, so that it is placed in the upper structure of the feeding rack 6. At this time, the high temperature test is completed by the detection head 13 in the high temperature environment created by the vortex tube 9. After the test is completed, the jet port of the vortex tube 9 is adjusted to cold air, so that a low temperature environment is quickly created in the heat insulation cover 4;

[0054] If there is no problem with the semiconductor laser, the semiconductor laser continues to be transported via the conveyor belt 2. If there is a problem with the semiconductor laser, the drive motor 15 is started in reverse to make its output end rotate in the opposite direction, and the collecting bin 22 is driven to extend into the heat insulation cover 4 through the slider 17, and the nozzle 8 is started to push open the movable baffle 7, and the semiconductor laser with quality problems is blown into the collecting bin 22. During the rotation of the connecting rod 2 19, the rotating shaft 20 and the static elimination roller 23 are driven to rotate synchronously, and then the collecting bin 22 and the semiconductor laser inside are subjected to static elimination treatment, thereby realizing side contactless detection and automatic classification collection of semiconductor lasers, and regardless of whether there is a quality problem, the semiconductor laser can be quickly cooled.

[0055] In this embodiment, if Figure 1 , Figure 4 , Figure 5 As shown, a collecting bin 22 is installed at the upper end of the slider 17. The side opening of the collecting bin 22 passes through the heat insulation cover 4 and cooperates with the movable baffle 7. Semiconductor lasers with quality problems can still be collected one by one in the collecting bin 22. After subsequent inspection, it is comprehensively considered whether they need to be repaired, avoiding direct manual violent removal methods that may cause further mechanical damage to the semiconductor laser.

[0056] In this embodiment, if Figure 4 , Figure 5 As shown, an anti-static roller 23 is installed on the top of the rotating shaft 20. The surface of the anti-static roller 23 is wrapped with a hydrophilic wrapping layer. The surface of the anti-static roller 23 cooperates with the side surface of the collecting bin 22 to eliminate the electrostatic damage to the semiconductor laser caused by static electricity.

[0057] In this embodiment, if Figure 4 , Figure 5As shown, a reinforcing rod 24 is hinged on the side end of the connecting rod 19 on the frame 1, and the other end of the reinforcing rod 24 is hinged on the slider 21. The reinforcing rod 24 remains parallel to the connecting rod 19, so that the slider 21 can slide stably on the frame 1 and be used for a long time, avoiding the slider 21 in an unstable state from affecting the screening result of the semiconductor laser due to its own fluctuation.

[0058] Those skilled in the art should understand that the discussion of any of the above embodiments is merely illustrative and is not intended to imply that the scope of the present invention (including the claims) is limited to these examples. Under the concept of the present invention, the technical features in the above embodiments or different embodiments may be combined, the steps may be implemented in any order, and there are many other variations of the different aspects of the present invention as described above, which are not provided in detail for the sake of simplicity.

[0059] The present invention is intended to cover all such substitutions, modifications and variations that fall within the broad scope of the appended claims. Therefore, any omissions, modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A classification and collection mechanism for semiconductor laser screening equipment, comprising a frame (1) and a conveyor belt (2) arranged on the frame (1), a mounting frame (3) being arranged on the frame (1), and a heat insulation cover (4) being arranged on the mounting frame (3); characterized in that: The mounting frame (3) is provided with a guide opening (5), and the classification and collection mechanism further comprises: A feeding rack (6), the feeding rack (6) is a top-bottom layered structure, the feeding rack (6) is used to transport semiconductor lasers, and is installed in the heat shield (4), a movable baffle (7) is provided in the middle of the feeding rack (6), and a plurality of nozzles (8) are provided on the feeding rack (6) on the other side of the movable baffle (7); A vortex tube (9), wherein the vortex tube (9) is mounted on the frame (1), and an air outlet end of the vortex tube (9) is placed in the heat insulation cover (4); A screening mechanism for performing high temperature reliability testing on semiconductor lasers, the screening mechanism being mounted on the frame (1); A collecting mechanism for automatically classifying semiconductor lasers, wherein the collecting mechanism is also installed on the frame (1).

2. The classification and collection mechanism of a semiconductor laser screening device according to claim 1, characterized in that: The screening mechanism comprises: A fixed seat (10) installed in the guide opening (5), wherein a toggle member (11) is rotatably mounted on the fixed seat (10) via a torsion spring; A threaded rod (12), the threaded rod (12) being fixedly connected to the toggle member (11), and the threaded rod (12) being threadably mounted on the fixing seat (10); A detection head (13), the detection head (13) being mounted on the top of the threaded rod (12); There are at least two top support columns (14), and the two top support columns (14) are installed on the collecting mechanism. The two top support columns (14) are also slidably arranged in the guide opening (5), and the two top support columns (14) are respectively matched with the toggle member (11).

3. The classification and collection mechanism of a semiconductor laser screening device according to claim 1 or 2, characterized in that: The top end of the top support column (14) extends into the heat insulation cover (4), and when the top end of the top support column (14) is at the lowest point, the semiconductor laser is placed in the upper structure of the feeding rack (6), and when the top end of the top support column (14) is at the highest point, the semiconductor laser is placed in the lower structure of the feeding rack (6).

4. The classification and collection mechanism of a semiconductor laser screening device according to claim 2, characterized in that: The collection agencies include: A driving motor (15), wherein the driving motor (15) is mounted on the frame (1); A lead screw (16), the lead screw (16) being mounted on the output end of the drive motor (15), and the other end of the lead screw (16) being rotatably mounted on the frame (1); A slider (17), wherein the slider (17) is slidably mounted on the frame (1), the slider (17) is also threadedly mounted on the lead screw (16), and both sides of the slider (17) are hinged with a connecting rod (18); A second connecting rod (19), the second connecting rod (19) is rotatably mounted on the frame (1) via a rotating shaft (20), one end of the second connecting rod (19) is hinged to the first connecting rod (18), the other end of the second connecting rod (19) is hinged to a second sliding block (21), the second sliding block (21) is slidably mounted on the frame (1), and the second sliding block (21) is fixedly connected to the top support column (14).

5. The classification and collection mechanism of the semiconductor laser screening device according to claim 4, characterized in that: A collecting bin (22) is installed at the upper end of the sliding block (17), and a side opening of the collecting bin (22) penetrates the heat insulation cover (4) and cooperates with the movable baffle (7).

6. The classification and collection mechanism of the semiconductor laser screening device according to claim 4, characterized in that: A static electricity eliminating roller (23) is installed on the top of the rotating shaft (20).

7. The classification and collection mechanism of the semiconductor laser screening device according to claim 6, characterized in that: The surface of the static elimination roller (23) is wrapped with a hydrophilic wrapping layer, and the surface of the static elimination roller (23) matches the side surface of the collection bin (22).

8. The classification and collection mechanism of the semiconductor laser screening device according to claim 4, characterized in that: A reinforcing rod (24) is hingedly connected to the side end of the second connecting rod (19) on the frame (1), and the other end of the reinforcing rod (24) is hingedly connected to the second sliding block (21).

9. The classification and collection mechanism of the semiconductor laser screening device according to claim 8, characterized in that: The reinforcing rod (24) remains parallel to the second connecting rod (19).

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