Method for monitoring a circuit

Abstract

The invention relates to a method (100) for monitoring an electrical circuit (1), in particular for implementing predictive maintenance, the method (100) comprising the following steps: measuring (110) at least one parameter (I, U, T) at at least one measurement location (3), the at least one measurement location (3) being located on or in the electrical circuit (1); acquiring (120) the at least one parameter (I, U, T); calculating (130) at least one actual value (131) on the basis of the at least one parameter (I, U, T); determining (140) a deviation (142) of the at least one actual value (131) from a target value (141); analyzing (150) the deviation (142); an analysis result (161) based on the analysis (150) is output (160).

Description

Technical Field

[0001] The invention relates to a method having the features of independent claim 1, a computing unit having the features of independent claim 11, a measuring device having the features of independent claim 12, a computer program product 13 having the features of independent claim 13, a non-volatile computer-readable storage medium having the features of independent claim 14 and a vehicle having the features of independent claim 15. Background Art

[0002] Measuring devices for measuring parameters, such as voltage or current, are known. These measuring devices can be used to characterize and / or test electrical circuits.

[0003] However, the devices and methods known from the prior art have different disadvantages. Therefore, some tolerances are not partially taken into account, or if they are taken into account, they are not adjusted. The tolerances may be unknown in advance. In addition, within the scope of measurement, the measurement is not flexible in terms of the arrangement of the measurement position and / or the application position (Aufprägeposition). Knowledge or empirical values ​​cannot be used either, in particular in order to fully consider the change process. If previously less tested or completely new components, such as spare parts (which can also come from third-party providers in particular), are used, the measurement and / or measurement tolerance cannot be fully adjusted. Therefore, in general, sufficiently good and / or reliable predictive maintenance cannot be performed. In this case, in particular, the changed measurement tolerance cannot be distinguished from the actual error or aging process. In this case. Measurement offsets, in particular due to so-called ground shifts (in particular changes in potential or reference potential), cannot be taken into account or cannot be fully taken into account. Summary of the invention

[0004] The object of the present invention is therefore to at least partially overcome at least one of the above-mentioned disadvantages. In particular, the object of the present invention is to reliably determine aging processes and / or changes over time. In particular, measurement tolerances and / or temperature changes (which change over time, for example) can be differentiated or taken into account. As a result, not only can defects or impending errors be detected more accurately, but also unnecessary repairs, maintenance and / or misdiagnoses can be avoided.

[0005] The above-mentioned object is achieved by a method having the features of independent claim 1, by a computing unit having the features of independent claim 11, by a measuring device having the features of independent claim 12, by a computer program product having the features of independent claim 13, by a non-volatile computer-readable storage medium having the features of independent claim 14, and by a vehicle having the features of independent claim 15. Further features and details of the invention are given by the dependent claims, the description and the drawings. The features and details described here in conjunction with the method according to the invention naturally also apply in conjunction with the computing unit according to the invention and / or in conjunction with the measuring device according to the invention and / or in conjunction with the computer program product according to the invention and / or in conjunction with the non-volatile computer-readable storage medium and / or in conjunction with the vehicle according to the invention, and vice versa, respectively, so that the disclosures concerning the individual inventive aspects always refer to one another or can refer to one another. In particular, the advantages described within the scope of the first, second, third, fourth, fifth and / or sixth aspect also apply to the first, second, third, fourth, fifth and / or sixth aspect, respectively.

[0006] According to a first aspect of the invention, a method for monitoring an electrical circuit is provided, in particular for implementing predictive maintenance, wherein the method comprises at least one of the following steps, preferably all of the steps:

[0007] - measuring at least one parameter at at least one measurement location, said at least one measurement location being located on or in said electrical circuit,

[0008] - obtaining said at least one parameter,

[0009] - calculating at least one actual value based on said at least one parameter,

[0010] - determining a deviation of the at least one actual value from a setpoint value,

[0011] - analyzing said deviations,

[0012] - outputting analysis results based on the analysis.

[0013] Here, the method can be used to monitor circuits, in particular lines and / or electronic components, such as (switchable) electronic trigger units or fuses. Particularly preferably, measurement tolerances can be taken into account during measurement. Therefore, the method can be configured to: identify, take into account and / or compensate for measurement tolerances that vary over time. When measuring parameters, such as current, voltage and / or temperature and in particular resistance, measurement tolerances or errors in measurement may vary over time and / or in relation to the parameters. A simple example is a changed temperature, which affects the resistance of a conductor, for example. This may be difficult to estimate in advance, especially in more complex circuits that have not been tested for a long period of time (e.g., months or years). For example, this may be particularly severe in newly developed circuits and / or components. Here, predictive maintenance can be advantageously achieved according to the present invention, which in particular reduces costs and / or saves time. In addition, downtime can be reduced. For example, it is conceivable that circuits and / or vehicles, such as autonomous vehicles, are subjected to maintenance and / or repair outside of use time (e.g., at night), if the analysis of the deviation predictively makes this necessary and / or advisable. Furthermore, a longer or continuous availability of the circuit can be ensured, which in particular saves costs and / or time. This can also reduce and / or avoid downtimes, in particular at times when the circuit and / or the vehicle are needed (e.g. during the day for taxis or buses). Furthermore, a more robust and / or earlier error response strategy can be implemented. Furthermore, long-term knowledge about the circuit, in particular about the electronic trigger unit (e.g. eFUSE), can be collected, evaluated and / or used, for example in order to optimize the circuit and / or the electronic trigger unit. This makes it possible to provide more precise predictive maintenance.

[0014] The measurement can include detecting parameters. In the simplest case, current and / or voltage can be measured. The measurement can be performed by a measuring device and / or a computing unit. Preferably, monitoring of at least one or all current paths and current path diagnosis can thus be performed. In this case, the measuring device can be connected to the computing unit via a data connection for data communication. The measuring device can send the at least one (measured) parameter to the computing unit. The computing unit can control and / or regulate the measuring device via the data connection.

[0015] Here, all steps can be performed by the computing unit, in particular measuring, acquiring, calculating, determining, analyzing and / or outputting. Alternatively or additionally, these steps can also be performed by a (local) control device, another (local) control device (or a control device cluster) and / or an external computing cluster. Here, the external computing cluster can be a cloud and / or a high-performance computing unit, which is connected to the circuit and / or the computing unit, for example via a data connection. Here, this can be performed locally and / or in an external computing cluster, for example, depending on the cost. This can depend on the necessary memory and / or computing power.

[0016] The circuit may preferably be an electronic circuit, the individual components of which are electrically connected via lines.

[0017] The at least one measuring point can be on a line and / or on or in one of the devices, for example a control device. The at least one measuring point, in particular all measuring points, can be connected to the measuring device and / or the computing unit via a measuring connection.

[0018] In this case, the computing unit can be connected to the control device, wherein the computing unit is in particular designed separately from the control device in order to advantageously enable easier maintenance or replacement, redundancy and / or subsequent integration into existing systems. It can also be provided that the control device includes the computing unit, wherein the computing unit forms an additional computing unit within the control device, thereby advantageously enabling separate and / or more efficient calculations. In this case, the one or more control devices and / or the computing unit can be connected to an energy supply device, in particular a battery.

[0019] The calculation of at least one actual value based on the at least one parameter, in particular by a calculation unit, can use the at least one parameter as input. Two or more parameters can also be used. For example, the (measured) current and the (measured) voltage can be used, and in particular the actual value, such as the resistance, can be calculated taking into account the measured temperature (and / or other measured parameters). It can also be provided that at least one of the following parameters is taken into account:

[0020] -Line length

[0021] -Line cross section

[0022] -Coefficient of circuit heating

[0023] - Cable parameters (e.g. material, coefficient of thermal expansion, maximum heat resistance)

[0024] The determination, in particular the determination by the computing unit and / or the external computing cluster, can provide a deviation of the at least one actual value from a setpoint value.

[0025] The acquisition can in particular include signal processing, for example analog-to-digital conversion (ADC). Measured values, converted values, actual values, target values, measurement tolerances, deviations, analyses and / or analysis results can be stored, for example, in a non-volatile computer-readable storage medium that is connected to the computing unit, the control device and / or the measuring device.

[0026] In this case, the theoretical value can represent the desired or expected value that occurs, in particular under certain circumstances, conditions and / or (applied) parameters. For example, it can be provided that a theoretical value of 5 V should be measured at a current of 10 mA and 25° C. An actual value of 6 V (under otherwise identical conditions) can, for example, indicate an excessively high voltage, wherein the deviation here is, for example, 1 V. However, this can preferably depend on whether the measurement tolerance is less than 1 V here. If, for example, the measurement tolerance under the corresponding conditions is 2 V, it can be determined within the scope of the analysis that the deviation is within the measurement tolerance and therefore, in particular as a result of the analysis, no action (for example maintenance) is required.

[0027] The electrical circuit can here have a housing, in particular a one-piece or multi-part housing, which at least partially surrounds and advantageously protects the electrical circuit.

[0028] It can be advantageous within the scope of the invention if the circuit has at least one electronic trigger unit and / or at least one control device, wherein the at least one parameter comprises:

[0029] a voltage and / or a current which in particular characterizes at least one current path of the electronic triggering unit,

[0030] - a voltage and / or a current of the at least one control device, in particular a voltage and / or a current at an output of the control device, and / or

[0031] - The temperature at at least one measuring point of the circuit, in particular at the input and / or output of the electronic triggering unit.

[0032] In this case, the circuit can have at least one electronic trigger unit (eFUSE). The circuit particularly preferably has exactly one electronic trigger unit. This can provide adequate safety and, in particular, simultaneously enable the method to be implemented. The at least one measuring point is preferably arranged close to or on the at least one electronic trigger unit. In other words, the electronic trigger unit can be used as an abstract current sensor and / or voltage sensor during measurement, whereby the electronic trigger unit can advantageously be used not only for protection but also for monitoring without the need for additional components.

[0033] Alternatively or additionally, further parameters may be included, in particular temperature, (air) humidity, tilt position and / or (movement) speed. These may be measured, for example, via corresponding sensors, preferably sensors at the measuring point.

[0034] In addition, at least one control device connected to the electronic trigger unit can be provided. Here, the electronic trigger unit can also be arranged within the control device. It can be provided that the electronic trigger unit protects the control device, for example, to prevent overload, such as voltage peaks and / or increased current. In addition, at least one additional or multiple control devices can be provided. At least two control devices can form a control device cluster here. Here, multiple control devices can be connected by corresponding lines. The at least one measuring position can be arranged in, on and / or between the one or more control devices. Particularly preferably, at least one measuring position is located near the electronic trigger unit. The measuring position is preferably arranged before the electronic trigger unit, in particular immediately before the electronic trigger unit and / or after the electronic trigger unit, in particular immediately after the electronic trigger unit. In this way, deviations can be detected particularly effectively. Alternatively or additionally, the at least one measuring position can be located at the interface of the circuit, for example, the at least one control device, or in particular immediately after the interface. This allows measurements to be performed at any time and / or allows a compact structure despite this. In addition, the line between the at least one control device and other components can therefore be fully detected. Preferably, the at least one measuring point is arranged on an output channel of the at least one control device and / or all control devices or on all output channels. Comprehensive monitoring can thus be performed via a plurality of measuring points. Additionally or alternatively, it is conceivable that a measuring point is present at at least one power supply input of the at least one control device. Since fluctuations may occur there, for example due to switched loads of the control device, changes can be detected particularly effectively here.

[0035] By automatically and / or forcibly switching the electronic trigger unit, different switching states can be achieved. This can be used to perform a measurement and / or further method steps. Thus, different information can be collected in order to characterize the circuit and preferably enable an analysis of deviations.

[0036] The present invention may allow an analysis of the current path on the electronic triggering unit, in particular despite (negatively) influencing external influences, such as mass shifts and / or temperature dependencies, which lead to, for example, (varying) measurement tolerances.

[0037] It is conceivable within the scope of the invention that the at least one actual value comprises an actual resistance and that the theoretical value comprises a theoretical resistance,

[0038] and / or

[0039] The analysis of the deviation is carried out based on the deviation and / or the measurement tolerance, in particular the changing measurement tolerance.

[0040] For example, actual parameters or theoretical parameters, in particular actual resistance or theoretical resistance, can be calculated based on voltage and / or current. In the simplest case, the resistance can be determined here (with respect to the line) at least sectionally via the quotient of voltage and current. It can also be provided that an estimate of the actual parameter or theoretical parameter is calculated based on one of these parameters and / or other parameters. Alternatively or additionally, other parameters, in particular temperature, pressure, force action, (air) humidity, tilt position and / or (movement) speed can be considered. These can be measured, for example, via corresponding sensors, preferably sensors at the measuring point. This enables more accurate calculation of actual values ​​and / or theoretical values.

[0041] It can be provided that the measurement of the parameter is (particularly in principle) not exact but is subject to measurement tolerances, in particular changing measurement tolerances (particularly measurement errors). Particularly preferably, such changing measurement tolerances are taken into account within the scope of the method. For example, the measurement tolerances can be dependent on the at least one parameter and / or the applied parameters. In the calculation, preferably, a calculation of the (actual) measurement tolerance can be performed alternatively or additionally, preferably based on the at least one parameter. Particularly preferably, all parameters determined during the measurement (and acquisition) are taken into account.

[0042] Within the scope of the invention, it can be provided that a learning method is carried out before the measurement, in particular during the start-up operation, which learning method in particular comprises at least one of the following steps, preferably all of the steps:

[0043] - measuring said at least one parameter at said at least one measurement location, said at least one measurement location being located on or in said electrical circuit,

[0044] - obtaining said at least one parameter,

[0045] - calculating at least one actual value based on said at least one parameter,

[0046] - Based on the actual value, a setpoint value and / or a measurement tolerance is determined.

[0047] In this case, during the determination, an (initial) measurement tolerance can also be determined based on the actual value and / or the target value. The learning method is particularly preferably used to adjust the measurement tolerance. Furthermore, the target value can be determined based on the actual value and / or the measurement tolerance.

[0048] Preferably, the learning method is repeatedly performed within the scope of the method. The learning method can be actively performed at the beginning, for example, within the scope of assembly. During (subsequent) operation, the learning method can be used for readjustment.

[0049] The method and / or in particular the learning method can be computer-implemented, for example by a computing unit (the unit described above), a control device and / or an external computing cluster. In addition, artificial intelligence can be used, in particular to enable improved pattern recognition, for example pattern recognition with respect to the shape and / or configuration of the envelope curve.

[0050] The measurement can be performed by a measuring device (see above) and / or a computing unit. It can be provided that the remaining steps are performed, in particular acquired, calculated and / or determined, by the computing unit.

[0051] Firstly, a learning method can be performed to determine the properties of the individual lines, in particular in a vehicle. In this case, the at least one parameter can be determined at at least one measuring location, preferably at at least two measuring locations.

[0052] The (initial and / or updated) measurement tolerance can be determined by repeated measurements. For example, it can be assumed that a circuit (in which the individual components have passed all tests) can work properly. Under certain, preferably identical conditions (e.g., applied parameters), repeated measurements may produce different results. Therefore, the fluctuation range of these results can give the measurement tolerance for the above conditions. It can be provided here that different conditions are "demonstrated", especially by different combinations of applied parameters, wherein the corresponding measurement tolerance is determined respectively, for example, initially. It can be provided that these measurement tolerances are adjusted individually or additionally, especially during readjustment. Particularly preferably, it can be determined more accurately and / or more reliably later whether the deviation is attributed to the actual change of the circuit and / or components, such as the control device, the line and / or the electronic trigger unit, or whether, on the contrary, the considered excessive deviation is to be attributed to the changed measurement tolerance. Particularly preferably, the advantages described above according to the present invention can be achieved thereby.

[0053] It is also conceivable that the learning method comprises applying and / or measuring, in particular subsequently measuring, at least one of the following applied parameters:

[0054] a voltage and / or a current which in particular characterizes at least one current path of the electronic triggering unit,

[0055] - a voltage and / or a current of the at least one control device, in particular a voltage and / or a current at an output of the control device, and / or

[0056] - the temperature at at least one measuring point of the circuit, in particular at the input and / or output of the electronic triggering unit,

[0057] Preferably, at least one, preferably a plurality of applied parameters are applied in and / or to the circuit and - in particular subsequently and / or essentially time synchronously - measurements are carried out in order to in particular determine a plurality of actual values ​​and, based thereon, to obtain a plurality of (initial) target values ​​and / or measurement tolerances.

[0058] It can be provided that the steps of the learning method, in particular steps with the same name, correspond to essentially the same process according to the method. For example, measurements within the scope of the learning method can correspond to (conventional) measurements during operation or be essentially identical thereto.

[0059] In this case, it can be provided that a voltage is measured and / or applied between at least two measuring points.

[0060] In this case, the applied parameters may also include, in particular in addition to the current, voltage and / or temperature:

[0061] - applying (or subjecting) forces, in particular by force impacts and / or cyclic movements (e.g. shaking),

[0062] - applying (or subjecting to) reduced and / or increased pressure (especially compared to the atmosphere),

[0063] - applying (or subjecting to) (especially repeated) rotations, tilted positions and / or torsion,

[0064] - Removing components from the circuit and / or inserting (additional) components.

[0065] The applied parameters can be applied at the measuring position (at which the measurement can also be carried out in particular) or at a separate application position, which is advantageously easier to reach and / or can be positioned in a cost-saving manner (for example on the housing, in particular from the outside). The applied parameters can be simulated by applying the parameters at specific application positions. For example, a force effect can be applied near the suspension of the circuit in order to simulate the loosening of the fixing structure of the circuit. The influence on the parameters (in particular during the measurement and in the further method steps) can then be determined by a learning method. Thus, improved (predictive) maintenance and / or diagnosis can be subsequently performed, for example (with respect to the above example) a similar force effect that causes the corresponding measurement of the actual value, but the actual value is now attributed to the actual loosening of the fixing structure.

[0066] It can be provided that when applying, in particular each time applying, a certain combination of parameters, a measurement, acquisition, calculation and / or determination (as described above) is carried out. It is thereby possible to determine a set value and / or a measurement tolerance for different combinations of parameters. This can be advantageous because subsequently, in particular during operation, such a combination of parameters may only be partially applied, for example because a part of the circuit is defective or cannot be applied (for example deliberately subjected to shocks). By the fact that a certain combination is not possible and / or the deviation between the actual value and the set value is determined, it is possible to detect the defective part of the circuit as accurately as possible. It is thereby possible to replace the part in a targeted manner.

[0067] It is also conceivable that a spectral analysis is implemented in the learning method, which includes applying a plurality of frequencies, in particular frequencies for voltage and / or current, at at least one measuring point, wherein the measurement, acquisition, calculation and / or determination is carried out in particular continuously in order to determine a plurality of (initial) theoretical values ​​and / or measurement tolerances, which are used to form an initial envelope curve. In this case, the application can alternatively or additionally include measuring current and / or voltage, wherein in particular the generated frequencies, for example the ripple frequencies generated by the load, can be measured.

[0068] Particularly preferably, the (initial) envelope curve is determined here by the setpoint value and the measurement tolerance. A measurement tolerance can be assigned to each setpoint value. The measurement tolerance can preferably have a deviation or tolerance in at least one direction, preferably in two directions, in particular in the direction of a larger value or a smaller value. It is particularly conceivable here that the measurement tolerance is symmetrical (same in both directions) or asymmetrical (different in the upward direction and in the downward direction). Within the scope of the invention, the precise determination of the measurement tolerance can enable a particularly reliable and / or precise analysis here.

[0069] Here, the envelope curve can represent the trend of the theoretical value and / or the measurement tolerance, for example, within the scope of the envelope curve. For example, the theoretical value can be represented, wherein the measurement tolerance surrounds the theoretical value as an error bar or an error cloud. Here, the envelope curve can extend on both sides, especially above and below the theoretical value, so as to take into account the asymmetric distribution of the measurement tolerance in particular. Then, a one-dimensional or multi-dimensional sequence of theoretical values ​​with corresponding measurement tolerances can be surrounded by the envelope curve (or envelope cloud). Then, the analysis can be performed using a comparison between different envelope curves (the envelope curves preferably include substantially the same (applied) parameters). Preferably, a comparison between the actual value and the theoretical value can be performed here taking into account the measurement tolerance. Alternatively or additionally, the shape and / or trend of the envelope curve can also preferably allow a conclusion to be drawn about the cause, which in particular would not be identifiable in other cases. For example, a determined error, such as a short circuit or line interruption, may lead to a very specific change in the actual value, the measurement tolerance and / or (preferably) the envelope curve. For example, the envelope curve can also be used to detect smaller changes that would not be detectable, in particular if only one actual value and / or setpoint value were used. For example, changes in creep (in particular caused by ground movement), in particular increases in resistance, can be detected better and / or more reliably by using the envelope curve.

[0070] Preferably, the application is performed within the scope of the spectral analysis at at least two or more measuring locations and / or application locations. Particularly preferably, at least one measuring location and / or application location can be arranged between two components of the circuit.

[0071] The envelope curve can have at least one target value, in particular an initial target value. In the case of a plurality of parameters and / or a plurality of actual values ​​and / or target values, the one or more target values ​​and / or the envelope curve can be continuously readjusted.

[0072] Thus, an envelope curve can be determined for the frequency spectrum of the parameter changes (especially the voltage changes) in the (initial) standard state. A continuous spectrum analysis can then be performed (especially later within the scope of the method) or the (actual) envelope curve can be measured in order to enable a comparison and, in particular, to check the functionality.

[0073] By means of actual values, setpoint values, measurement tolerances and / or envelope curves, deviations or errors can be reliably determined or predicted and preferably differentiated from erroneous detections or measurement tolerances.

[0074] In this case, changes in frequency can be used to detect altered frequency characteristics (e.g. due to aging processes). Preferably, determined aging processes and / or defects can have a specific influence on the frequency characteristics and can advantageously be determined within the scope of spectral analysis. A simple example is a change in the frequency response in a coaxial cable if, for example, the dielectric is damaged.

[0075] It is optionally possible within the scope of the invention that the learning method - in particular after an initial startup operation, preferably during operation of the circuit - is continued over a readjustment time period, in particular in order to take into account changes over time of theoretical values ​​and / or measurement tolerances in the measurement and to adjust the theoretical values, measurement tolerances and / or the initial envelope curve based on this in order to obtain updated theoretical values, updated measurement tolerances and / or an updated envelope curve.

[0076] In this case, the readjustment period can include 12 months, in particular 6 months, preferably 4 months, particularly preferably 3 months, ideally 2 months, advantageously 4 weeks.

[0077] In this case, the readjustment time period can be set at the factory.

[0078] The duration of the readjustment period can be adjusted and / or extended. This can be determined by at least one characteristic of the actual value, the setpoint value, the measurement tolerance and / or the envelope curve. For example, a cessation of changes (e.g. readjustments) (particularly with substantially the same (applied) parameters) can indicate that no further adjustment is necessary.

[0079] Preferably, a deviation of the actual value from the setpoint value (preferably after expiration of a readjustment period) which lies outside a corresponding measurement tolerance can be detected as an aging phenomenon and / or a defect.

[0080] Within the scope of the present invention, if a plurality of actual values ​​and / or parameters are used, the target value may also refer to a plurality of target values. Here, each actual value or target value may preferably have a measurement tolerance.

[0081] It may be provided that if certain components are replaced, the readjustment time period and / or the learning method is at least partially restarted (particularly with regard to the corresponding parameters). This allows particularly good adaptation to changed circuits in order to achieve the advantages according to the invention.

[0082] Preferably, the spectrum analysis may be repeated during the readjustment period.

[0083] Furthermore, within the scope of the present invention, it can be provided that the learning method is continued during operation of the circuit, in particular after an initial startup operation, so that updated target values, updated measurement tolerances and / or updated envelope curves are ascertained, in particular continuously, wherein this is done based on at least one of the following criteria:

[0084] - receiving, in particular via a data connection, at least one updated setpoint value, an updated measurement tolerance and / or an updated envelope curve,

[0085] - determining an updated setpoint value, an updated measurement tolerance and / or an updated envelope curve based on the receiving and / or by a user input.

[0086] In this case, the user input may be performed by the driver and / or within the scope of maintenance.

[0087] Advantageously, short-term, medium-term and / or long-term deviations can thereby be better detected and / or differentiated.

[0088] Provision may be made here to re-measure and / or apply the parameters (as described above). As a result of carrying out essentially the same measurement, it may be determined how one or more measurement tolerances have changed.

[0089] In this case, it can be provided that, in particular in the case of readjustment, a comparison with the readjusted target value and / or the readjusted envelope curve is carried out from this point in time. This can be advantageous, for example, in the case where the determined measurement tolerance (for example, due to aging) subsequently changes. This is also advantageous in order to implement an emergency operating procedure, in which deviations, in particular deviations outside the measurement tolerance, are initially detected, but the functional capability of the circuit can be ensured at least temporarily, for example, as long as a workshop has not yet been visited. In this case, it can be provided that, if a newer deviation is determined, in particular starting from the readjusted target value and / or the readjusted envelope curve, a countermeasure, for example an emergency stop and / or a sharper warning, is output.

[0090] It can be provided that the method, in particular the reception via a data connection, includes receiving information from a further (preferably identically constructed) circuit, whereby in particular empirical values ​​of a further circuit can be used, which for example has been used longer, in a different way and / or more intensively. The circuit can be connected to a data connection, which sends and / or receives the corresponding data, for example via a LAN, WLAN, Bluetooth, mobile radio and / or an Internet connection.

[0091] In connection with the present invention, it is conceivable that the determination of the deviation comprises at least one of the following steps:

[0092] - calculating a difference between at least one actual value and a setpoint value, in particular a setpoint value of the response and / or an updated setpoint value,

[0093] A comparison is made between the initial envelope curve or the updated envelope curve and the actual envelope curve, wherein in particular a difference is calculated between the initial envelope curve or the updated envelope curve and the actual envelope curve.

[0094] In this case, the difference between all actual values ​​and the corresponding setpoint value can be calculated. Preferably, the value of the difference is determined within the scope of the calculation, in particular in order to determine the absolute deviation. This can be decisive for the urgency of an intervention (e.g. a visit to the workshop). In addition, the sign can be determined, in particular in order to define or determine the cause. For example, the absence of voltage can indicate a short circuit. This makes it possible to determine the source of the error more precisely.

[0095] The envelope curve can be determined by measurements (as described above), in particular by applying substantially identical applied parameters. The actual envelope curve can be determined in particular by measurements during operation, for example in the context of a control in a moving vehicle. The differences between the envelope curves can be related to the respective actual values ​​and the corresponding setpoint values. Alternatively or additionally, it can also be provided that envelope curves or envelope curve surfaces are used and the differences between the surfaces are determined. Within the scope of pattern recognition, certain deviations can be determined and in particular compared with historical data, in order, for example, to enable an improved determination of whether the deviation is within the measurement tolerance and / or to enable an improved determination of the cause.

[0096] The determination can be performed here alternatively or additionally based on information of at least one further system, vehicle and / or the entire fleet. This can be done, for example, via a data connection, in particular the Internet and / or the cloud. For example, actual values ​​and / or setpoint values ​​can be provided thereby. Deviations can thus potentially be identified earlier and / or more reliably. For example, strong changes, which according to experience have already caused problems at other locations, can thus be detected earlier, in particular compared to the case where no replacement has been carried out.

[0097] Furthermore, it is conceivable that the analysis determines whether the deviation lies within the measurement tolerance and / or the updated measurement tolerance and thus in particular whether the deviation is permissible or impermissible.

[0098] and / or

[0099] The analysis based on the deviation includes: determining the cause of the deviation,

[0100] and / or

[0101] In particular, the analysis results are output to the user, the analysis results including a summary of the analysis, a classification of the analysis and / or a processing suggestion.

[0102] In this case, the difference can be compared with the (updated) measurement tolerance. If the difference is within the measurement tolerance or the measurement tolerance is greater, it can be concluded that the deviation is "permissible" or "normal", in particular, the deviation is not caused by errors and / or aging processes. If the difference is greater than the measurement tolerance, in particular at least 20%, for example 40%, preferably 60%, particularly preferably 80% greater than the measurement tolerance, it can be concluded that the deviation is "inadmissible", in particular, the deviation is due to a fault, a defect and / or (excessive) aging. In this case, the determination of the cause can be given as follows: the component is damaged, there is a short circuit, there is a break, there is a cable fire and / or there is a defective (and possibly dangerous) electrical connection. This can be output in particular as an analysis result.

[0103] In this case, measurement tolerances and / or target values ​​can be set (in particular initially) at the factory. These can be adjusted (in particular continuously) within the scope of the learning method, in particular in order to be able to take into account changes in (applied) parameters, such as aging processes.

[0104] It can be particularly preferred that the analysis includes a comparison of the deviations and / or measurement tolerances with historical deviations and / or historical measurement tolerances. In this case, current and / or historical (or past) deviations and / or measurement tolerances can be stored, for example, in a non-volatile computer-readable storage medium, in particular in a non-volatile computer-readable storage medium of a computing unit, an external computing cluster and / or a control device. It can be particularly preferred that a time period is taken into account, in particular over which the deviations and / or measurement tolerances occur. The following categories can be distinguished here:

[0105] The deviation has a short-term deviation, in particular, which is attributable to temporarily limited influences, such as a particularly high temperature at at least one measuring point. An example is a short-term deviation of an extremely high external temperature (e.g. 48° C.). The short-term deviation can here include the last 48 hours, in particular the last 24 hours, preferably the last hour, particularly preferably the last minute, ideally the last 20 seconds.

[0106] The deviation has a medium-term deviation, which is in particular attributable to a temporarily limited but recurring influence, a relatively high temperature at at least one measuring location. A simple example here is a trip to a particularly warm place, for example where the average temperature is 45° C. The medium-term deviation can here include the last 4 months, in particular the last 2 months, preferably the last month, particularly preferably the last 3 weeks, ideally the last 2 weeks, advantageously the last week.

[0107] The deviation has a long-term deviation, in particular, the long-term deviation is attributable to temporarily unrestricted influences, such as geometric deformations of at least a part of the circuit, at least partial oxidation, electrical disconnection and / or short circuits. The long-term deviation may include the last 36 months, in particular the last 24 months, preferably the last 12 months, particularly preferably the last 6 months, ideally the last 4 months, advantageously the last 2 months.

[0108] The output result is preferably outputted according to a category which comprises a handling suggestion and / or a fault diagnosis, wherein the output result is preferably outputted acoustically and / or visually.

[0109] In this case, the short-term and / or medium-term deviations are particularly preferably calculated locally, in particular by a computing unit, a control device and / or a measuring device. In this case, the medium-term and / or long-term deviations can be calculated externally, in particular by an external computing cluster. In this way, data can be provided to others in a simpler and / or more data-efficient manner, and other information (for example, information from other identically constructed circuits) can be taken into account more simply and / or more data-efficiently.

[0110] In this case, it can be provided that a deviation of the actual parameter from the theoretical parameter, for example an absolute deviation in value, is determined, which is 0.0001 to 10000%, in particular 0.001 to 1000%, preferably 0.01 to 100%, particularly preferably 0.1 to 10%. For example, a deviation of at least 10 ohms, in particular 1 ohm, preferably 0.1 ohm, particularly preferably 0.01 ohm, ideally up to 0.004 ohm can preferably be determined. As a result, even small deviations in (relatively complex) circuits, for example in vehicles, can be detected.

[0111] It is also conceivable that the user is asked to state the changed parameters (e.g. via a display), which is advantageously also used for output. For example, rising temperatures for several days may indicate a trip to a particularly warm country. However, if there are reasonable doubts about the analysis, certain errors can be excluded. The user can thus enter the corresponding content (existing parameters) via an input device, for example. This can prevent erroneous diagnoses.

[0112] The handling suggestion may include stopping as soon as possible, stopping immediately and / or visiting a workshop. The user, in particular the driver, can thereby be warned.

[0113] In this case, the fault diagnosis can include a specific explanation for the cause of the deviation, for example a fault in the electronic trigger unit, the control device and / or the cable. For example, a current that cannot be measured (especially repeatedly) at the input of a component can mean a circuit break. This can achieve improved maintenance and / or simplified fault finding, which can advantageously save costs and / or materials.

[0114] The output result can be output acoustically, for example, via a loudspeaker, earphones and / or a mobile terminal device, such as a mobile phone and / or a watch. Alternatively or additionally, the output result can be displayed visually, for example (particularly in a vehicle) via a screen, a head-up display, a console, a mobile terminal device, such as a screen of a mobile phone and / or a watch.

[0115] In this case, the output can alternatively or additionally also include a transmission via a data connection. Deviations and / or analysis results can thus also be made available to other circuits, computing units, control devices and / or vehicles. This makes it possible to also use corresponding external information and / or to create statistics about faults, defects, repairs, maintenance, aging processes, classifications and / or treatment recommendations. This makes it possible to provide more precise predictive maintenance. Downtimes can also be reduced in this way.

[0116] According to a second aspect, the above object is further achieved by a computing unit according to the invention, comprising means for executing a method according to any of the preceding claims.

[0117] According to a third aspect, the above object is further achieved by a measuring device for controlling a measuring circuit, wherein the measuring device is configured to perform a substantially time-synchronous measurement of at least one parameter and in particular to implement the method according to the first aspect.

[0118] In this case, it can be provided that the measuring device is designed to measure at least two parameters, preferably a plurality of parameters.

[0119] In this case, the measuring device can have a computing unit, in particular a computing unit according to the invention. This allows a particularly compact and / or cost-effective design.

[0120] A device may also be provided, which in particular comprises a circuit which is configured to implement the method according to the first aspect.

[0121] According to a fourth aspect, the above object is further solved by a computer program product according to the invention, the computer program product comprising instructions executable by a computing unit, which instructions cause the computing unit to carry out the method according to the first aspect when the program is executed by the computing unit.

[0122] According to a fifth aspect, the above object is further achieved by a non-volatile computer-readable storage medium according to the present invention, said non-volatile computer-readable storage medium comprising a computer program product according to the fourth aspect.

[0123] The above object is further achieved by a vehicle according to the invention, comprising at least one non-volatile computer-readable storage medium according to the fifth aspect.

[0124] Further advantages, features and details of the invention are apparent from the following description, in which several embodiments of the invention are described in detail with reference to the accompanying drawings. The features mentioned in the claims and the description may be important for the invention individually or in any combination. BRIEF DESCRIPTION OF THE DRAWINGS

[0125] The invention is schematically illustrated in the following figures:

[0126] Figure 1 Circuit 1 is shown;

[0127] Figure 2 A method 100 is shown;

[0128] Figure 3 A method 100 is shown;

[0129] Figure 4 A method 100 is shown;

[0130] Figure 5 A learning method 200 is shown;

[0131] Figure 6 illustrates a learning method 200; and

[0132] Figure 7 A method 100 is shown. DETAILED DESCRIPTION

[0133] Figure 1A circuit 1 is shown, which has a control device 11 and which currently has a further control device 12. The control device and the further control device can together form a control device cluster. The circuit can have an energy supply device 60, for example a battery 60. The components of the circuit 1 can be connected via a line 2. The control device 11 has a computing unit 20, which includes the following device 21, which is particularly designed to implement the method 100. In addition, the computing unit 20 can be connected to a storage medium 40 or have the storage medium. The storage medium includes a computer program 50. Parameters such as voltage U, current I and / or temperature T can be applied and / or measured at one or more measuring locations 3. In this case, the circuit 1 or the control device 11 can have an electronic trigger unit 10.

[0134] Figure 2 The method 100 is shown as an example, and the method comprises the following steps:

[0135] - measuring 110 at least one parameter I, U, T

[0136] -Get 120 parameters

[0137] - Calculate 130 actual value

[0138] -140 deviations confirmed

[0139] -Analysis 150 deviations

[0140] - Output 160 analysis results

[0141] Figure 3 Further details of the method 100 are shown by way of example, wherein an actual value is calculated 130 based on the at least one parameter I, U, T. In this case, the resistance can be calculated from the current and the voltage, for example, taking into account the temperature. A deviation 142 of the at least one actual value from a theoretical value 141 or an updated theoretical value 144 can furthermore be determined 140 in order to obtain a deviation 142, which can be generated, for example, from a difference 143 between the theoretical value and the actual value.

[0142] Figure 4 Further details of method 100 are shown by way of example, wherein analysis 150 can be based on deviation 142. Furthermore, (initial) measurement tolerance 145 and / or updated measurement tolerance 146 can also be taken into account here. In a final step, analysis result 160 can be output.

[0143] Figure 5 The learning method 200 is shown as an example, and the learning method comprises the following steps:

[0144] - measuring 210 said at least one parameter (I, U, T),

[0145] - obtaining 220 said at least one parameter (I, U, T),

[0146] - calculating 230 at least one actual value,

[0147] - Determine 240 theoretical values ​​and / or measurement tolerances.

[0148] Figure 6 A learning method 200 is shown by way of example, which includes applying applied parameters I, U, T. In this case, a spectral analysis 206 can be performed. This can be performed repeatedly, in particular within a readjustment time period, which can be used to adjust target values ​​and / or measurement tolerances.

[0149] Figure 7 By way of example, a method 100 is shown in which an actual envelope curve 209 is compared with an initial envelope curve 207 and / or an updated envelope curve 208. Initial envelope curve 207 is preferably readjusted within the scope of a learning method 200, which is in particular provided as part of method 100, in order to obtain an updated envelope curve. In this way, setpoint values, envelope curves and / or measurement tolerances can be readjusted.

[0150] Reference numerals list

[0151] 1 Circuit

[0152] 2 lines

[0153] 3 Measurement location

[0154] I Parameter / measurement location for current

[0155] U Parameter / measurement location for voltage

[0156] T Parameter / measurement location for temperature

[0157] 10 Electronic trigger unit

[0158] 11 Control Device

[0159] 12 Additional Control Devices

[0160] 20 computing units

[0161] 21 devices

[0162] 40 Storage Media

[0163] 50 Computer program products

[0164] 60 Energy supply device, battery

[0165] 100 Methods

[0166] 110Measure at least one parameter

[0167] 120Get parameters

[0168] 130 Calculate the actual value

[0169] 131 Actual value

[0170] 140 Determination bias

[0171] 141Theoretical value

[0172] 142 Deviation

[0173] 143 bad

[0174] 144Updated theoretical value

[0175] 145 Measurement Error

[0176] 146Updated measurement tolerances

[0177] 150 Analysis Bias

[0178] 160 Output analysis results

[0179] 200 Learning Methods

[0180] 205 Apply the applied parameters (I, U, T)

[0181] 206 Spectrum Analysis

[0182] 207 Initial envelope curve

[0183] 208 Updated envelope curve

[0184] 209 Actual envelope curve

[0185] 210 Measure the at least one parameter (I, U, T)

[0186] 220 Obtaining the at least one parameter (I, U, T)

[0187] 230 Calculate at least one actual value

[0188] 240 Determination of theoretical values ​​and / or measurement tolerances

Claims

1. A method (100) for monitoring an electrical circuit (1), in particular for implementing predictive maintenance, wherein: The method (100) comprises the following steps: - measuring (110) at least one parameter (I, U, T) at at least one measuring location (3), said at least one measuring location (3) being located on or in said circuit (1), - acquiring (120) said at least one parameter (I, U, T), - calculating (130) at least one actual value (131) based on the at least one parameter (I, U, T), - determining (140) a deviation (142) of the at least one actual value (131) from a setpoint value (141), - analyzing (150) said deviation (142), An analysis result (161) based on the analysis (150) is output (160).

2. The method according to any one of the preceding claims, It is characterized in that The circuit (1) comprises at least one electronic trigger unit (10) and / or at least one control device (11), and the at least one parameter (I, U, T) comprises: a voltage (U) and / or a current (I), which in particular characterizes at least one current path of the electronic triggering unit (10), - a voltage (U) and / or a current (I) of the at least one control device (11), in particular a voltage and / or a current at an output of the control device (11), and / or - a temperature (T) at at least one measuring point (3) of the circuit (1), in particular at the input and / or output of an electronic trigger unit (10).

3. The method according to any one of the preceding claims, It is characterized in that The at least one actual value comprises an actual resistance and the theoretical value comprises a theoretical resistance, and / or The analysis (150) of the deviation is performed based on the deviation (142) and / or a measurement tolerance (145), in particular a changing measurement tolerance.

4. The method according to any one of the preceding claims, It is characterized in that Before the measurement, in particular during the start-up operation, a learning method (200) is carried out, which includes at least one of the following steps: - measuring (210) the at least one parameter (I, U, T) at the at least one measuring location (3), the at least one measuring location being located on or in the electrical circuit, - acquiring (220) said at least one parameter (I, U, T), - calculating (230) at least one actual value based on the at least one parameter (I, U, T), - Determining (240) a target value and / or a measurement tolerance (145) based on the actual value.

5. The method according to claim 4, It is characterized in that The learning method comprises applying (205) and / or measuring (210), in particular subsequently measuring, at least one of the following applied parameters (I, U, T): a voltage (U) and / or a current (I), which in particular characterizes at least one current path of the electronic triggering unit (10), - a voltage (U) and / or a current (I) of the at least one control device (11), in particular a voltage and / or a current at an output of the control device (11), and / or a temperature (T) at at least one measuring point (3) of the circuit (1), in particular at the input and / or output of the electronic trigger unit (10), Preferably, at least one, preferably a plurality of applied parameters (I, U, T) are applied in and / or to the circuit (1) and - in particular subsequently and / or essentially synchronously with time - measurements (210) are carried out in order in particular to determine a plurality of actual values ​​and, based thereon, to obtain a plurality of setpoint values ​​(141) and / or measurement tolerances (145).

6. The method according to any one of the preceding claims 4 or 5, It is characterized in that In the learning method (200), a spectral analysis (206) is performed, which includes applying (205) a plurality of frequencies, in particular frequencies for voltage and / or current, at at least one measuring position (3), wherein measurement (210), acquisition (220), calculation (230) and / or determination (240) are performed in particular continuously in order to determine a plurality of theoretical values ​​(141) and / or measurement tolerances (145), which are used to form an initial envelope curve (207).

7. The method according to any one of claims 4 to 6, It is characterized in that The learning method (200) is continued over a readjustment period, in particular after an initial start-up operation, preferably during operation of the circuit (1), in particular in order to take into account changes over time of the setpoint value (141) and / or the measurement tolerance (145) in the measurement (110, 210) and to adjust the setpoint value (141), the measurement tolerance (145) and / or the initial envelope curve (207) based on this, in order to obtain an updated setpoint value (144), an updated measurement tolerance (146) and / or an updated envelope curve (208).

8. The method according to any one of the preceding claims 4 to 7, It is characterized in that The learning method (200) is continued during operation of the circuit (1), in particular after an initial startup operation, thereby determining, in particular continuously, updated setpoint values ​​(144), updated measurement tolerances (146) and / or updated envelope curves (208), wherein this is performed based on at least one of the following criteria: - receiving, in particular via a data connection, at least one updated setpoint value (144), an updated measurement tolerance (146) and / or an updated envelope curve (208), - determining an updated setpoint value (144), an updated measurement tolerance (146) and / or an updated envelope curve (208) based on the receiving and / or by means of a user input.

9. The method according to any one of the preceding claims, It is characterized in that The determination (140) of the deviation (142) comprises at least one of the following steps: - calculating a difference (143) between at least one actual value (131) and a setpoint value (141) and / or an updated setpoint value (144), A comparison is made between the initial envelope curve (207) or the updated envelope curve (208) and the actual envelope curve (209), wherein in particular a difference (143) is calculated between the initial envelope curve (207) or the updated envelope curve (208) and the actual envelope curve (209).

10. The method according to any one of the preceding claims, It is characterized in that The analysis ( 150 ) determines whether the deviation lies within a measurement tolerance and / or an updated measurement tolerance and thus in particular whether the deviation is permissible or impermissible. and / or The analysis (150) based on the deviation (142) includes: determining a cause of the deviation (142), and / or In particular, an analysis result (161) is output (160) to a user, the analysis result (161) comprising a summary of the analysis (150), a classification of the analysis (150) and / or a processing suggestion.

11. A computing unit (20) comprising means (21) for carrying out the method (100) according to any one of the preceding claims.

12. A measuring device (10) for controlling a measuring circuit, wherein: The measuring device (10) is provided for carrying out a substantially time-synchronous measurement of at least one parameter (I, U, T) and in particular for carrying out a method according to any one of claims 1 to 10.

13. A computer program product (50), comprising instructions executable by a computing unit (20), which instructions cause the computing unit (20) to carry out the method (100) according to any one of claims 1 to 10 when the program is executed by the computing unit (20).

14. A non-volatile computer-readable storage medium (40) comprising a computer program product (50) according to the preceding claim.

15. A vehicle comprising at least one non-volatile computer-readable storage medium (40) according to the preceding claim.

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