Integrated withstand voltage tester, voltage dividing resistor box and voltage dividing test system

Abstract

The invention provides an integrated withstand voltage tester, a voltage dividing resistance box and a voltage dividing test system. The integrated withstand voltage tester comprises a shell, a test module, a voltage dividing module, a first wiring terminal and a second wiring terminal. According to the invention, the insulation breakdown flashover phenomenon of the tested equipment can be avoided, and the tested equipment is prevented from being damaged.

Description

Technical Field

[0001] The present application relates to the technical field of withstand voltage testing, and in particular to an integrated withstand voltage tester, a voltage divider resistor box and a voltage divider testing system. Background Art

[0002] The electrical strength test is one of the main methods to test the overvoltage resistance of electrical appliances, electrical equipment, electrical devices, electrical circuits and electrical safety equipment. The result of the voltage test can reflect the safety performance parameters of the corresponding equipment, such as AC / DC voltage resistance, insulation resistance, leakage current, etc.

[0003] When using a withstand voltage test device to apply a test voltage to the device under test, it is very likely that insulation breakdown and flashover will occur inside the device under test due to defects in the device under test or defects in the test performance of the test device itself. At this time, overvoltage damage will be caused to the withstand voltage test device, making the safety of the tester and the test equipment unable to be guaranteed. Summary of the invention

[0004] The embodiments of the present application provide an integrated withstand voltage tester, a voltage divider resistor box and a voltage divider test system, which are used to solve the problem in the prior art that the tested equipment is prone to breakdown and cause safety accidents.

[0005] In a first aspect, an embodiment of the present application provides an integrated voltage withstand tester, including a housing, a test module, a voltage divider module, a first wiring terminal, and a second wiring terminal;

[0006] The test module is arranged in the shell; the voltage divider module includes a plurality of grounding terminals and a plurality of resistor components connected in series in sequence, the plurality of grounding terminals are arranged on the surface of the shell, the plurality of resistor components connected in series in sequence are arranged inside the shell, a connection point is arranged between any adjacent resistor components, the plurality of grounding terminals are connected to the corresponding connection points, and a target grounding terminal among the plurality of grounding terminals is used to connect to the ground terminal of the device under test;

[0007] The first wiring terminal and the second wiring terminal are arranged on the shell, the first wiring terminal is respectively connected to the high-voltage output end of the test module, the input end of the device under test and one end of the multiple resistance components connected in series, and the second wiring terminal is respectively connected to the measuring end of the test device, the output end of the device under test and the other end of the multiple resistance components connected in series. The test module is used to output a preset test voltage to the device under test through the first wiring terminal, and detect the resistance value of the insulation resistance in the device under test and the output leakage current value through the second wiring terminal.

[0008] The integrated voltage withstand tester provided in this embodiment includes a voltage divider module and a test module. The two ends of a plurality of resistor components connected in series in the voltage divider module are respectively connected to a first terminal and a second terminal. When testing the device under test, the target ground terminal of the voltage divider module is connected to the ground end of the device under test, and the first terminal and the second terminal are connected to the device under test. Therefore, during the test, the voltage divider module can divide the voltage to avoid insulation breakdown and flashover inside the device under test due to defects in the device under test or defects in the test performance of the test device itself, thereby ensuring the safety of testers and test equipment. The operation is simple. When testing the device under test, it is only necessary to connect the three terminals of the integrated voltage withstand tester to the device under test, and the test efficiency is high.

[0009] In addition, the multiple grounding terminals provided on the integrated voltage withstand tester can provide a variety of different voltage division effects by dividing the multiple resistance components into different proportions. The integrated voltage withstand tester can meet the needs of tested devices with a variety of different voltage division requirements and has good versatility. The above-mentioned integrated voltage withstand tester can also isolate the actual resistance components from the testers, reducing the risk of electric shock injuries to the testers.

[0010] In one embodiment, the voltage divider module further includes a circuit board, the plurality of resistor components connected in series are arranged on the circuit board, and the circuit board includes a first connection end and a second connection end;

[0011] One end of the plurality of resistor components connected in series is connected to the first connection end, and connected to the first wiring terminal through the first connection end; the other end of the plurality of resistor components connected in series is connected to the second connection end, and connected to the second wiring terminal through the second connection end. The integrated withstand voltage tester in this embodiment can use a circuit board to integrate and install multiple resistor components, thereby improving the integration of the voltage divider module, optimizing the space utilization inside the shell, and reducing the stability impact caused by external shocks and other factors.

[0012] In one embodiment, the connection point includes a pad disposed between two adjacent resistor components. The integrated withstand voltage tester in this embodiment uses a pad to provide a reliable electrical connection point for the resistor component, which can ensure a stable and reliable electrical connection between the resistor component and the ground terminal, and prevent the resistor component from loosening or falling off.

[0013] In one embodiment, the plurality of ground terminals correspond one-to-one to a plurality of voltage division ratios;

[0014] The target ground terminal is determined from the plurality of ground terminals based on a voltage division requirement of the device under test.

[0015] The integrated voltage withstand tester in this embodiment divides the multiple resistance components into different proportions by setting multiple grounding terminals, thereby providing a variety of different voltage division effects. The integrated voltage withstand tester can meet the needs of tested devices with a variety of different voltage division requirements and has good versatility.

[0016] In a second aspect, an embodiment of the present application further provides a voltage-dividing resistor box, comprising a first shell, a third wiring terminal, a fourth wiring terminal, a plurality of grounding terminals, and a plurality of resistor components connected in series in sequence, wherein the third wiring terminal, the fourth wiring terminal, and the plurality of grounding terminals are arranged on the surface of the first shell, the plurality of resistor components connected in series in sequence are arranged in the first shell, one end of the plurality of resistor components connected in series in sequence is connected to the third wiring terminal, the other end of the plurality of resistor components connected in series in sequence is connected to the fourth wiring terminal, a connection point is arranged between any adjacent resistor components, and a plurality of grounding terminals are connected to the corresponding connection point;

[0017] The third terminal is used to connect with the fifth terminal of the withstand voltage tester and the input terminal of the device under test, the fourth terminal is used to connect with the sixth terminal of the withstand voltage tester and the output terminal of the device under test, and the target grounding terminal among the multiple grounding terminals is connected to the grounding terminal of the device under test, so as to realize voltage division of the device under test;

[0018] The voltage withstand tester also includes a second shell and a test module, the test module is arranged in the second shell, the fifth terminal and the sixth terminal are arranged on the surface of the second shell, the fifth terminal is connected to the high-voltage output end of the test module, and is used to output the test voltage generated by the test module to the device under test; the sixth terminal is connected to the measuring end of the test module, and is used to detect the resistance value of the insulation resistance in the device under test and the output leakage current value.

[0019] The voltage-divider resistor box in this embodiment can pre-set multiple resistor components, and set connection points between any adjacent resistor components to connect to the ground terminal on the first shell. When the tested device is connected to different ground terminals, the resistor components connected in series can be divided into multiple different proportions, so as to achieve multiple different voltage-dividing effects. The voltage-divider resistor box can meet the needs of tested devices with multiple different voltage-dividing requirements, and has good versatility. The staff does not need to configure additional resistors for voltage division according to different voltage-dividing requirements, and the voltage-divider resistor box can be directly placed on the same workbench as the withstand voltage tester, which is convenient for the tester to connect the wires and is easy to use. The shell of the voltage-divider resistor box can also isolate the tester from the internal resistor components to ensure the test safety of the tester.

[0020] In one embodiment, the plurality of ground terminals correspond one-to-one to a plurality of voltage division ratios;

[0021] The target ground terminal is determined from the plurality of ground terminals based on a voltage division requirement of the device under test.

[0022] The voltage-dividing resistor box in this embodiment divides the multiple resistor components into different proportions by setting multiple grounding terminals, thereby providing a variety of different voltage-dividing effects. The voltage-dividing resistor box can meet the needs of tested devices with a variety of different voltage-dividing requirements and has good versatility.

[0023] In a third aspect, the present application further provides a voltage division test system, including a voltage division resistor box and a withstand voltage tester, the withstand voltage tester including a second shell, a test module, a fifth terminal and a sixth terminal, the test module is arranged in the second shell, the fifth terminal and the sixth terminal are arranged on the surface of the second shell, the fifth terminal is connected to the high voltage output end of the test module, and the sixth terminal is connected to the measuring end of the test module;

[0024] The voltage-dividing resistor box comprises a first shell, a third terminal, a fourth terminal, a plurality of grounding terminals and a plurality of resistor components connected in series in sequence, wherein the third terminal, the fourth terminal and the plurality of grounding terminals are arranged on the surface of the first shell, the plurality of resistor components connected in series in sequence are arranged in the first shell, one end of the plurality of resistor components connected in series in sequence is connected to the third terminal, the other end of the plurality of resistor components connected in series in sequence is connected to the fourth terminal, a connection point is arranged between any adjacent resistor components, a plurality of grounding terminals are connected to the corresponding connection points, and a target grounding terminal among the plurality of grounding terminals is used to be connected to a ground terminal of a device under test;

[0025] The fifth terminal is also used to connect the third terminal and the input end of the device under test, the sixth terminal is also used to connect the fourth terminal and the output end of the device under test, and the test module is used to output a preset test voltage to the device under test through the fifth terminal, and detect the resistance value of the insulation resistance in the device under test and the output leakage current value through the sixth terminal. The voltage division test system in this embodiment adopts a voltage division resistor box that can provide a variety of different voltage division effects, and can connect the corresponding grounding terminal on the voltage division resistor box according to the actual voltage division requirements of the device under test, so as to achieve more effective voltage division for the device under test and prevent insulation breakdown and flashover from occurring in the device under test as much as possible.

[0026] In one embodiment, the voltage-dividing resistor box also includes a circuit board, and the multiple resistor components connected in series are arranged on the circuit board, and the circuit board includes a first connection end and a second connection end, one end of the multiple resistor components connected in series is connected to the first connection end, and is connected to the third terminal through the first connection end, and the other end of the multiple resistor components connected in series is connected to the second connection end, and is connected to the fourth terminal through the second connection end. The voltage-dividing test system in this embodiment uses a circuit board to integrate and install multiple resistor components, which can improve the integration of the voltage-dividing resistor box, optimize the space utilization of the voltage-dividing resistor box, and reduce the stability impact caused by factors such as external shocks.

[0027] In one embodiment, the connection point includes a pad disposed between two adjacent resistor components. The voltage division test system in this embodiment uses a pad to provide a reliable electrical connection point for the resistor component, which can ensure that the electrical connection between the resistor component and the ground terminal is stable and reliable, and prevent the resistor component from loosening or falling off. In one embodiment, the multiple ground terminals correspond to the multiple voltage division ratios one by one;

[0028] The target ground terminal is determined from the multiple ground terminals based on the voltage division requirement of the device under test. The voltage division test system in this embodiment is provided with multiple ground terminals on the voltage division resistor box, so that multiple resistor components are divided into different proportions, thereby providing a variety of different voltage division effects. The voltage division test system can meet the needs of devices under test with different voltage division requirements and has good versatility. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0030] Figure 1 A schematic diagram of the structure of an integrated withstand voltage tester in one embodiment;

[0031] Figure 2 A schematic diagram of the structure of a test module and a voltage divider module in an integrated voltage withstand tester in one embodiment;

[0032] Figure 3 A schematic diagram of the structure of a housing in an integrated withstand voltage tester in one embodiment;

[0033] Figure 4 It is a structural schematic diagram of an integrated voltage withstand tester in another embodiment;

[0034] Figure 5 A schematic diagram of the connection between an integrated withstand voltage tester and a device under test in one embodiment;

[0035] Figure 6 A schematic diagram of the structure of a voltage-dividing resistor box in one embodiment;

[0036] Figure 7 A schematic diagram of the connection between a voltage-dividing resistor box, a withstand voltage tester and a device under test in one embodiment;

[0037] Figure 8 A schematic diagram of a withstand voltage test method in one embodiment;

[0038] Fig. 9 FIG. 1 is a schematic diagram of the structure of a device under test in an embodiment.

[0039] The above drawings have shown clear embodiments of the present application, which will be described in more detail later. These drawings and text descriptions are not intended to limit the scope of the present application in any way, but to illustrate the concept of the present application to those skilled in the art by referring to specific embodiments. DETAILED DESCRIPTION

[0040] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments made by ordinary technicians in this field under the enlightenment of the embodiments belong to the scope of protection of the present application.

[0041] The terms "first", "second", "third", "fourth", etc. (if any) in the specification and claims of the present application and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchangeable where appropriate, so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any of their variations are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0042] Glossary:

[0043] Withstand voltage test: also known as dielectric strength test, it is mainly used to evaluate the insulation performance of electrical appliances, electrical equipment, electrical devices, electrical lines and electrical safety equipment to ensure the safety of equipment under high voltage conditions.

[0044] Withstand voltage tester: Withstand voltage tester is a testing instrument used to test the withstand voltage capability of electrical appliances, electrical equipment, electrical devices, electrical circuits and electrical safety tools. It detects the insulation performance of the equipment and whether there is a potential insulation failure by applying a voltage higher than the normal operating voltage. Withstand voltage test is usually used to ensure the safety and reliability of equipment under high voltage conditions to prevent leakage, short circuit and other electrical safety accidents.

[0045] like Figure 1 As shown, an embodiment of the present application provides an integrated voltage withstand tester 100 , including a housing 110 , a test module 120 , a voltage divider module 130 , a first wiring terminal 140 and a second wiring terminal 150 .

[0046] The housing 110 may be made of insulating material to reduce the risk of electric shock injury to the tester.

[0047] like Figure 2 As shown, the test module 120 is arranged inside the housing 110. As an example, the test module 120 may include a controller, a high voltage generator, a voltmeter, an insulation resistance measuring instrument, etc. Among them, the controller is connected to the high voltage generator to control the high voltage generator to output a preset test voltage to the device under test 300; the voltmeter is connected in parallel with the high voltage generator to measure the voltage value of the test voltage generated by the high voltage generator; the insulation resistance measuring instrument is used to obtain the resistance value of the insulation resistance in the device under test 300.

[0048] The device under test 300 may be a power module, or may be a motor, transformer, switchgear, power distribution equipment, household appliances, industrial equipment, electrical components, etc., which require insulation performance evaluation. The power module refers to a component used for power conversion and management.

[0049] like Figure 3 As shown, the first wiring terminal 140 and the second wiring terminal 150 are both arranged on the shell 110, and the first wiring terminal 140 is respectively connected to the output end of the high voltage generator in the test module 120 and the input ends input+ / L / N and input- / L / N of the tested device 300 (the input end of the tested device 300 can input both direct current and alternating current), and is used to output a preset test voltage to the tested device 300, and the second wiring terminal 150 is respectively connected to the input end of the insulation resistance measuring instrument in the test module 120 and the output ends output+ and output- of the tested device 300, and is used to detect the resistance value of the insulation resistance in the tested device 300.

[0050] The output end of the high voltage generator can be connected to the input ends input+ / L / N and input- / L / N of the device under test 300 through the first terminal 140; the controller is used to generate an output instruction and send it to the high voltage generator when receiving a trigger instruction, so as to control the high voltage generator to output a preset test voltage to the device under test 300 through the first terminal 140; the input end of the insulation resistance meter can be connected to the output ends output+ and output- of the device under test 300 through the second terminal 150, so as to obtain the resistance value of the insulation resistance in the device under test 300. Among them, the output end of the high voltage generator can be understood as the high voltage output end of the test module 120, and the input end of the insulation resistance meter can be understood as the measuring end of the test module 120.

[0051] It should be noted that the first wiring terminal 140 can be connected to the input terminals input+ / L / N, input- / L / N of the device under test 300 and the output terminal of the high voltage generator through wires. The first wiring terminal 140 can be understood as the high voltage output interface of the integrated withstand voltage tester 100, which is used to output the test voltage generated by the high voltage generator inside the test module 120 to the device under test 300, so as to test the insulation performance and withstand voltage capability of the device under test 300. The second wiring terminal 150 can be connected to the input terminal of the insulation resistance measuring instrument and the output terminals output+, output- of the device under test 300 through wires, respectively. The second wiring terminal 150 can be understood as the measurement port of the integrated withstand voltage tester 100, which is used to detect the resistance value of the insulation resistance in the device under test 300 in real time through the insulation resistance measuring instrument, thereby ensuring the safety and accuracy during the test process.

[0052] like Figure 2 As shown, the voltage divider module 130 includes a circuit board 131, a resistor assembly 132 and a plurality of grounding terminals 133. The circuit board 131 is fixedly disposed in the housing 110, and the circuit board 131 is provided with a plurality of resistor assemblies 132 connected in series in sequence, and a connection point P is provided between any adjacent resistor assemblies 132; Figure 3 As shown, a plurality of grounding terminals 133 are provided on the housing 110 and are correspondingly connected to a plurality of connection points P, and the grounding terminal 133 is used to be connected to the grounding terminal PE of the device under test 300 to achieve voltage division of the device under test 300. It should be noted that the grounding terminal PE of the device under test 300 can be further connected to different connection points P on the circuit board 131 by connecting to different grounding terminals 133, so that the plurality of resistor components 132 can be divided into different proportions, thereby achieving the effect of voltage division of the device under test 300 in different proportions.

[0053] One end of the plurality of resistor components 132 connected in series may be connected to the first wiring terminal 140 , and the other end may be connected to the second wiring terminal 150 .

[0054] It should be noted that the voltage divider module 130 may not include the circuit board 131. In this embodiment, the multiple resistor components 132 connected in series may be packaged in advance inside the housing 110. If the circuit board 131 is used to integrate the multiple resistor components 132, the integration of the voltage divider module 130 can be improved, the space utilization inside the housing 110 can be optimized, and the stability impact caused by external shocks and other factors can be reduced. If the resistor component 132 is installed without the circuit board 131, the flexibility of the resistor component 132 can be guaranteed, and the disassembly and replacement of the resistor component 132 can be facilitated.

[0055] The resistor assembly 132 may be composed of a plurality of resistor components, and the resistor components may specifically be high-resistance chip resistors.

[0056] Multiple ground terminals correspond to multiple voltage division ratios. For example, Figure 2 As shown, four resistor components 132 connected in series in sequence can be provided on the circuit board 131, and accordingly, three grounding terminals 133 can be provided on the surface of the shell 110. The connection point P1 between any adjacent resistor components 132 is connected to the grounding terminal 133 set on the surface of the shell 110 through a wire. The grounding terminal 133 corresponding to the connection point P1 between the first resistor component 132 and the second resistor component 132 has a corresponding voltage division ratio of 1:3, the grounding terminal corresponding to the connection point P1 between the second resistor component 132 and the third resistor component 132 has a corresponding voltage division ratio of 1:1, and the grounding terminal corresponding to the connection point P1 between the third resistor component 132 and the fourth resistor component 132 has a corresponding voltage division ratio of 3:1.

[0057] It should be noted that the number of resistor components 132 set on the circuit board 131 and the number of resistor elements contained in each resistor component 132 can be adaptively adjusted according to actual voltage division requirements, so as to achieve different voltage division effects by changing the resistor configuration on the circuit board 131.

[0058] The housing 110 may also be provided with a control button, which is used to set test parameters during the withstand voltage test, such as the voltage value of the test voltage, the preset duration of the output test voltage, the threshold value of the leakage current value, etc.

[0059] like Figure 4As shown, the integrated withstand voltage tester 100 further includes a timer 160, which is disposed in the housing 110 and connected to the test module 120. The timer 160 is used to time the duration of the test module 120 outputting the test voltage. Specifically, the timer 160 can be connected to the above-mentioned controller. The controller can generate a timing instruction and send it to the timer 160 based on the received trigger instruction, generate an output instruction and send it to the high-voltage generator, so as to control the timer 160 to start timing. The controller can also generate a stop instruction and send it to the high-voltage generator when the timing of the timer 160 reaches a preset duration, so as to control the high-voltage generator to stop outputting the test voltage to the device under test 300.

[0060] like Figure 4 As shown, the integrated withstand voltage tester 100 further includes a measuring circuit 170, which is disposed in the housing 110 and connected to the second wiring terminal 150, and is used to measure the leakage current value output by the device under test 300. The second wiring terminal 150 is also used to detect the leakage current value output in the device under test 300 in real time through the measuring circuit 170, so as to test the insulation performance of the device under test 300. The controller can also issue an alarm to remind the staff that the insulation performance of the device under test 300 is poor when the leakage current value detected in real time by the measuring circuit 170 reaches the threshold value of the leakage current value.

[0061] The integrated voltage withstand tester 100 may also include a display screen, which is respectively connected to the above-mentioned voltmeter, insulation resistance measuring instrument, timer 160, and measuring circuit, and is used to obtain the voltage value of the test voltage generated by the high-voltage generator from the voltmeter, obtain the resistance value of the insulation resistance in the tested device 300 from the insulation resistance measuring instrument, obtain the duration of the high-voltage generator outputting the test voltage from the timer 160, and obtain the leakage current value output by the tested device 300 from the measuring circuit, and display them so that the staff can understand the working performance of the integrated voltage withstand tester 100, the insulation performance and voltage withstand capability of the tested device 300.

[0062] like Figure 5As shown, in the process of using the integrated voltage withstand tester 100 in this embodiment to perform a voltage withstand test on the tested device 300, the tester can connect the input terminals input+ / L / N and input- / L / N of the tested device 300 to the first terminal 140, connect the output terminals output+ and output- of the tested device 300 to the second terminal 150, and connect the ground terminal PE of the tested device 300 to the target ground terminal, which is one of the multiple ground terminals 133. Different ground terminals 133 correspond to resistor components 132 divided according to different proportions. After the ground terminal PE of the tested device 300 is connected to the target ground terminal, the resistor component 132 divided according to the proportion corresponding to the target ground terminal can be used to perform voltage division, thereby completing the wiring preparation work before the voltage withstand test.

[0063] It should be noted that the target ground terminal can be any ground terminal 133; alternatively, the target ground terminal is determined based on the actual voltage division requirement of the device under test 300, and the actual voltage division requirement of the device under test 300 can be determined based on the resistance distribution inside the device under test 300. When the device under test 300 includes a primary circuit and a secondary circuit, the equivalent resistance value of the primary circuit and the equivalent resistance value of the secondary circuit can be further obtained, and the resistance value ratio of the equivalent resistance value of the primary circuit to the equivalent resistance value of the secondary circuit can be calculated as the actual voltage division requirement of the device under test 300.

[0064] On this basis, the resistance value ratio of the device under test 300 is compared with the division ratio of the resistance component corresponding to each ground terminal 133, and the ground terminal 133 corresponding to the division ratio closest to the resistance value ratio is used as the target ground terminal. Through this setting, it is possible to determine the division method closest to the actual resistance distribution situation from the resistance components 132 divided according to different ratios according to the actual resistance distribution situation of the device under test 300, and use the ground terminal 133 corresponding to the division method as the target ground terminal, thereby achieving more effective voltage division for the device under test 300, and preventing the insulation breakdown flashover phenomenon of the device under test as much as possible. Further, the tester can control the integrated withstand voltage tester 100 to be powered on through the power switch set on the housing 110 of the integrated withstand voltage tester 100, and pre-set the voltage value of the test voltage during the withstand voltage test, the preset duration of the output test voltage, the threshold value of the leakage current value and other parameters through the control button on the housing 110.

[0065] Subsequently, the staff can issue a trigger command by clicking a fixed area on the display screen. After receiving the trigger command, the controller in the integrated voltage withstand tester 100 generates an output command and sends it to the high voltage generator to control the high voltage generator to output a preset test voltage to the device under test 300 through the first terminal 140, and at the same time generates a timing command and sends it to the timer 160 to control the timer 160 to start timing.

[0066] During the voltage withstand test, the voltmeter in the integrated voltage withstand tester 100 detects the voltage value of the test voltage generated by the high-voltage generator in real time, the insulation resistance measuring instrument in the integrated voltage withstand tester 100 detects the resistance value of the insulation resistance in the tested device 300 in real time through the second terminal 150, and the measuring circuit in the integrated voltage withstand tester 100 detects the leakage current value outputted from the tested device 300 in real time through the second terminal 150. The display screen can display the voltage value of the test voltage, the resistance value of the insulation resistance in the tested device 300, the leakage current value outputted from the tested device 300, and the duration of the high-voltage generator outputting the test voltage, so that the staff can understand the working performance of the integrated voltage withstand tester 100 and the insulation performance and voltage withstand capability of the tested device 300.

[0067] The above-mentioned integrated voltage withstand tester includes a voltage divider module and a test module. The two ends of the multiple resistance components connected in series in the voltage divider module are respectively connected to the first terminal and the second terminal. When testing the device under test, the target ground terminal of the voltage divider module is connected to the abutment end of the device under test, and the first terminal and the second terminal are connected to the device under test. Therefore, during the test, the voltage divider module can divide the voltage to avoid insulation breakdown and flashover inside the device under test due to defects in the device under test or defects in the test performance of the test device itself, thereby ensuring the safety of testers and test equipment. The operation is simple. When testing the device under test, it is only necessary to connect the three terminals of the integrated voltage withstand tester to the device under test, and the test efficiency is high.

[0068] In addition, the multiple grounding terminals provided on the integrated voltage withstand tester can provide a variety of different voltage division effects by dividing the multiple resistance components into different proportions. The integrated voltage withstand tester can meet the needs of tested devices with various different voltage division requirements and has good versatility. The above-mentioned integrated voltage withstand tester can also isolate the actual resistance components from the testers, reducing the risk of electric shock injuries to the testers.

[0069] like Figure 6As shown, the embodiment of the present application further provides a voltage-dividing resistor box 200, including a first shell 210, a third terminal 220, a fourth terminal 230, a plurality of grounding terminals 240 and a plurality of resistor components 250 connected in series in sequence, the third terminal 220, the fourth terminal 230 and the plurality of grounding terminals 240 are arranged on the surface of the first shell 210, the plurality of resistor components 250 connected in series in sequence are arranged in the first shell 210, one end of the plurality of resistor components 250 connected in series in sequence is connected to the third terminal 220, the other end of the plurality of resistor components 250 connected in series in sequence is connected to the fourth terminal 230, a connection point P2 is arranged between any adjacent resistor components 250, and the plurality of grounding terminals 240 are connected to the corresponding connection point P2;

[0070] The third terminal 220 is used to connect with the fifth terminal of the withstand voltage tester 400 and the input terminal of the device under test 300, the fourth terminal 230 is used to connect with the sixth terminal of the withstand voltage tester 400 and the output terminal of the device under test 300, and the target grounding terminal of the plurality of grounding terminals 240 is connected to the grounding terminal of the device under test 300 to realize voltage division of the device under test 300;

[0071] The withstand voltage tester 400 also includes a second shell and a test module. The test module is arranged in the second shell. The fifth terminal and the sixth terminal are arranged on the surface of the second shell. The fifth terminal is connected to the high-voltage output end of the test module and is used to output the test voltage generated by the test module to the device under test 300; the sixth terminal is connected to the measuring end of the test module and is used to detect the resistance value of the insulation resistance in the device under test 300 and the output leakage current value.

[0072] The above-mentioned multiple resistor components 250 connected in series can be packaged in advance inside the first housing 210. Alternatively, a circuit board can also be provided inside the first housing 210, and the multiple resistor components 250 connected in series are arranged on the circuit board. If a circuit board is used to integrate and install multiple resistor components 250, the integration of the voltage-dividing resistor box 200 can be improved, the space utilization inside the first housing 210 can be optimized, and the stability impact caused by external shocks and other factors can be reduced. If the resistor component 250 is not installed on a circuit board, the flexibility of the resistor component 250 can be guaranteed, and the disassembly, assembly and replacement of the resistor component 250 can be facilitated.

[0073] The first shell 210 can also be made of insulating material to reduce the risk of electric shock injury to the tester.

[0074] Multiple grounding terminals 240 correspond to multiple voltage division ratios one by one. As an example, the voltage division resistor box 200 is provided with four resistor components 250 connected in series in sequence. Accordingly, three grounding terminals 240 may be provided on the surface of the first shell 210. The three connection points between any adjacent resistor components 250 are connected to the three grounding terminals 240 provided on the surface of the first shell 210 through wires. The grounding terminal 240 corresponding to the connection point P2 between the first resistor component 250 and the second resistor component 250 has a corresponding voltage division ratio of 1:3. The grounding terminal 240 corresponding to the connection point P2 between the second resistor component 250 and the third resistor component 250 has a corresponding voltage division ratio of 1:1. The grounding terminal 240 corresponding to the connection point P2 between the third resistor component 250 and the fourth resistor component 250 has a corresponding voltage division ratio of 3:1.

[0075] The resistor assembly 250 may be composed of a plurality of resistor components, and the resistor components may specifically be high-resistance chip resistors.

[0076] In one embodiment, the voltage-dividing resistor box 200 is provided with five resistor components A, B, C, D, and E connected in series in sequence, and each resistor component is provided with two resistor elements, the resistor component A includes resistor elements R1 and R2, the resistor component B includes resistor elements R3 and R4, the resistor component C includes resistor elements R5 and R6, the resistor component D includes resistor elements R7 and R8, and the resistor component E includes resistor elements R9 and R10, and the resistances of the ten resistor elements are the same, and connection points t1, t2, t3, and t4 are sequentially arranged between the five resistor components A, B, C, D, and E, and the connection points t1, t2, t3, and t4 are respectively connected to four ground terminals arranged on the shell through wires, wherein the ground terminal connected to the connection point t1 corresponds to a voltage division ratio of 1:4, the ground terminal connected to the connection point t2 corresponds to a voltage division ratio of 2:3, the ground terminal connected to the connection point t3 corresponds to a voltage division ratio of 3:2, and the ground terminal connected to the connection point t4 corresponds to a voltage division ratio of 4:1.

[0077] It should be noted that the number of resistor components set in the voltage-dividing resistor box 200 and the number of resistor elements contained in each resistor component can be adaptively adjusted according to actual voltage-dividing requirements, so as to achieve different voltage-dividing effects by changing the resistor configuration inside the voltage-dividing resistor box 200.

[0078] The voltage-dividing resistor box 200 in this embodiment needs to be used in conjunction with a withstand voltage tester 400. The withstand voltage tester 400 here may be a common withstand voltage tester, and its structure generally includes a second shell, a test module, a fifth terminal and a sixth terminal. The test module is disposed in the second shell, and the fifth terminal and the sixth terminal are disposed on the surface of the second shell. The fifth terminal is connected to the high-voltage output end of the test module for outputting the test voltage generated by the test module to the device under test, and the sixth terminal is connected to the measuring end of the test module for detecting the resistance value of the insulation resistance in the device under test and the output leakage current value.

[0079] The second shell is usually also provided with control buttons, a display screen and a power switch, etc. The test module can be provided with a controller, a high-voltage generator, a measuring circuit, etc., wherein the control button is used to set the test parameters in the withstand voltage test process, such as the test voltage value, the test duration, the leakage current value threshold, etc., the power switch is used to control the on and off of the withstand voltage tester, and the controller is used to generate an output instruction to the high-voltage generator when receiving a trigger instruction, so as to control the high-voltage generator to convert the initial voltage provided by the AC power or the external power supply of the withstand voltage tester into the test voltage required for the withstand voltage test process, and the measuring circuit is used to measure the leakage current value output by the tested device 300 during the withstand voltage test.

[0080] A timer, an insulation resistance measuring instrument, etc. may also be provided inside the second shell. The timer is used to time the duration for which the withstand voltage tester outputs the test voltage to the device under test 300. The insulation resistance measuring instrument is used to detect the resistance value of the insulation resistance inside the device under test 300. The display screen is used to display parameters such as the resistance value of the insulation resistance inside the device under test 300, the leakage current value, and the duration for which the withstand voltage tester 400 outputs the test voltage to the device under test 300 during the actual withstand voltage test.

[0081] like Figure 7As shown, in the process of using the voltage divider resistor box 200 in this embodiment to perform a withstand voltage test on the device 300 under test, the tester can connect a wire between the high-voltage output end of the withstand voltage tester 400, the input ends input+ / L / N, input- / L / N of the device 300 under test and the third terminal 220 of the voltage divider resistor box 200, connect a wire between the measuring end of the withstand voltage tester, the output ends output+, output- of the device 300 under test and the fourth terminal 230 of the voltage divider resistor box 200, and connect a wire between the ground interface PE of the device 300 under test and the target ground terminal among the multiple ground terminals 240 of the voltage divider resistor box 200, thereby using the resistor component 250 divided according to different proportions to perform voltage division on the device 300 under test, and complete the wiring preparation work before the withstand voltage test. Among them, the target ground terminal is determined based on the voltage division requirement of the device under test 300. For example, if the resistance ratio of the primary circuit and the secondary circuit contained in the device under test 300 is 1:2, then the ground terminal 240 with a voltage division ratio of 1:2 can be used as the target ground terminal.

[0082] Furthermore, the tester can control the power supply of the voltage withstand tester 400 through the power switch set on the voltage withstand tester 400, and control the high-voltage generator in the voltage withstand tester 400 to convert the initial voltage into the test voltage required for the voltage withstand test process through the display screen on the voltage withstand tester 400, and output the test voltage to the tested device 300 through the high-voltage output terminal of the voltage withstand tester 400, and control the timer to start timing.

[0083] During the voltage withstand test, the voltmeter in the voltage withstand tester 400 detects the voltage value of the test voltage generated by the high-voltage generator in real time, the insulation resistance measuring instrument in the voltage withstand tester 400 detects the resistance value of the insulation resistance in the tested device 300 in real time through the measuring end of the voltage withstand tester 400, and the measuring circuit in the voltage withstand tester 400 detects the leakage current value outputted from the tested device 300 in real time through the measuring end of the voltage withstand tester 400. The display screen can display the voltage value of the test voltage, the resistance value of the insulation resistance in the tested device 300, the leakage current value outputted from the tested device 300, and the duration of the high-voltage generator outputting the test voltage, so that the staff can understand the working performance of the voltage withstand tester 400 and the insulation performance and voltage withstand capability of the tested device 300.

[0084] The above-mentioned voltage-divider resistor box, by pre-setting multiple resistor components and setting connection points between any adjacent resistor components, can achieve the effect of dividing the resistor components connected in series into a variety of connection structures by changing the connection points connected to external devices. Therefore, only one voltage-divider resistor box can be used to achieve a variety of voltage-dividing effects and meet the withstand voltage test requirements of a variety of different tested devices. The staff does not need to configure different voltage-divider resistors according to different requirements, and the voltage-divider resistor box can be directly placed on the same workbench as the withstand voltage tester, which is convenient for the tester to connect the wires and is easy to use. The shell of the voltage-divider resistor box can also isolate the tester from the internal resistor components to ensure the test safety of the tester.

[0085] The embodiment of the present application further provides a voltage division test system, comprising the above-mentioned voltage division resistor box 200 and a withstand voltage tester 400, wherein the withstand voltage tester 400 comprises a second housing, a test module, a fifth wiring terminal and a sixth wiring terminal, wherein the test module is arranged in the second housing, the fifth wiring terminal and the sixth wiring terminal are arranged on the surface of the second housing, the fifth wiring terminal is connected to the high voltage output end of the test module, and the sixth wiring terminal is connected to the measuring end of the test module;

[0086] The voltage-dividing resistor box 200 includes a first shell 210, a third terminal 220, a fourth terminal 230, a plurality of grounding terminals 240, and a plurality of resistor components 250 connected in series in sequence. The third terminal 220, the fourth terminal 230, and the plurality of grounding terminals 240 are arranged on the surface of the first shell 210, and the plurality of resistor components 250 connected in series in sequence are arranged in the first shell 210. One end of the plurality of resistor components 250 connected in series in sequence is connected to the third terminal 220, and the other end of the plurality of resistor components 250 connected in series in sequence is connected to the fourth terminal 230. A connection point P2 is arranged between any adjacent resistor components 250, and a plurality of grounding terminals 240 are connected to the corresponding connection point P2. A target grounding terminal among the plurality of grounding terminals 240 is used to connect to the grounding terminal of the device under test 300.

[0087] The fifth terminal is also used to connect the third terminal 220 and the input end of the device under test 300, and the sixth terminal is also used to connect the fourth terminal 230 and the output end of the device under test 300. The test module is used to output a preset test voltage to the device under test 300 through the fifth terminal, and to detect the resistance value of the insulation resistance in the device under test 300 and the output leakage current value through the sixth terminal.

[0088] Specifically, the voltage-dividing resistor box 200 also includes a circuit board 230, and the multiple resistor components 250 connected in series are arranged on the circuit board 230. The circuit board 230 includes a first connection end and a second connection end. One end of the multiple resistor components 250 connected in series is connected to the first connection end, and is connected to the third terminal 220 through the first connection end. The other end of the multiple resistor components 250 connected in series is connected to the second connection end, and is connected to the fourth terminal 230 through the second connection end.

[0089] The connection point P2 includes a pad disposed between two adjacent resistor components 250 .

[0090] Furthermore, the plurality of ground terminals 240 correspond to the plurality of voltage division ratios one by one; the target ground terminal is determined from the plurality of ground terminals 240 based on the voltage division requirement of the device under test.

[0091] like Figure 8 As shown, the embodiment of the present application further provides a withstand voltage test method, which can be applied to the above-mentioned integrated withstand voltage tester 100 or the withstand voltage tester 400 connected to the voltage dividing resistor box 200, and the withstand voltage test method includes:

[0092] Step 802: In response to the trigger instruction, output a preset test voltage to the device under test.

[0093] The trigger instruction refers to an instruction for controlling the integrated voltage withstand tester 100 or the voltage withstand tester 400 to output a specific test voltage to the device under test 300 .

[0094] As an example, a trigger instruction may be issued by a tester through a display screen on the housing of the integrated voltage withstand tester 100 or the voltage withstand tester 400. The display screen may specifically display a virtual button, which is used to represent triggering the high-voltage generator in the integrated voltage withstand tester 100 or the voltage withstand tester 400 to output a test voltage to the device under test 300. The tester may issue the above-mentioned trigger instruction by clicking the virtual button on the display screen of the integrated voltage withstand tester 100 or the voltage withstand tester 400. Upon receiving the trigger instruction, the controller in the integrated voltage withstand tester 100 or the voltage withstand tester 400 may control the high-voltage generator inside the integrated voltage withstand tester 100 or the voltage withstand tester 400, convert the initial voltage provided by the external power supply into a test voltage, and output it to the device under test 300.

[0095] It should be noted that before the tester issues a trigger command through the control button on the shell of the integrated voltage tester 100 or the voltage tester 400, the staff needs to first control the power supply of the integrated voltage tester 100 or the voltage tester 400 through the power switch on the shell of the integrated voltage tester 100 or the voltage tester 400, and pre-set parameters such as the voltage value of the test voltage during the voltage test, the preset duration of the output test voltage, the threshold of the leakage current value, etc. through the control buttons on the shell of the integrated voltage tester 100 or the voltage tester 400.

[0096] The tested device 300 may specifically be a motor, a transformer, a switchgear, a power distribution device, a household appliance, an industrial device, an electrical component, or other device that requires insulation performance evaluation.

[0097] As an example, the device under test 300 may be a transformer device, and a transformer circuit may be provided in the device under test 300; the transformer circuit includes a primary circuit, a transformer, and a secondary circuit connected in sequence; a first common-mode capacitor is connected between the primary circuit and the ground terminal of the device under test 300, and a second common-mode capacitor is connected between the secondary circuit and the ground terminal of the device under test 300. The primary circuit, the transformer, and the secondary circuit are connected between the input terminal and the output terminal of the device under test 300.

[0098] For transformer equipment, the insulation position between the primary circuit and the secondary circuit needs to meet the enhanced insulation protection requirements, and the insulation position between the primary circuit and the ground terminal only needs to meet the basic insulation protection requirements. At this time, the staff needs to use a withstand voltage test to check whether the two insulation positions between the primary circuit and the secondary circuit and between the primary circuit and the ground terminal have achieved sufficient insulation strength.

[0099] As an example, Fig. 9 As shown, the device under test 300 can be a power module, specifically including a transformer 901, a field effect transistor 902, an integrated circuit 903, a photoelectric converter 904, a first common mode capacitor 905 and a second common mode capacitor 906. Among them, one end of the primary winding in the transformer 901 serves as the input terminal input+ / L / N of the device under test 300, and the other end of the primary winding is connected to the drain of the field effect transistor 902, so that the input test voltage is efficiently controlled through the field effect transistor 902, and the source of the field effect transistor 902 serves as the input terminal input- / L / N of the device under test 300; after the two ends of the primary winding in the transformer 901 are short-circuited, they can be connected to the first terminal 140 of the integrated withstand voltage tester 100 or the high voltage output terminal of the withstand voltage tester 400, for receiving the test voltage output by the integrated withstand voltage tester 100 or the withstand voltage tester 400.

[0100] In the device under test 300, the gate of the field effect transistor 902 is connected to one end of the integrated circuit 903, and the other end of the integrated circuit 903 is connected to the receiver in the photoelectric converter 904, so as to realize the switch control of the field effect transistor 902 based on the current generated by the receiver in the photoelectric converter 904; the first common-mode capacitor 905 is connected between the other end of the primary winding and the housing of the device under test 300, and the housing of the device under test 300 can be understood as the ground terminal PE of the device under test 300; one end of the secondary winding in the transformer 901 is connected to the positive electrode of the light-emitting diode in the photoelectric converter 904, and the other end of the secondary winding in the transformer 901 is connected to the photoelectric converter 90 4 is used to form a closed photoelectric conversion loop; the second common-mode capacitor 906 is connected between the other end of the secondary winding and the housing of the device under test 300, one end of the secondary winding in the transformer 901 serves as the output terminal output+ of the device under test 300, and the other end of the secondary winding also serves as the output terminal output- of the device under test 300. After the two ends of the secondary winding in the transformer 901 are short-circuited, they can be connected to the second terminal 150 of the integrated withstand voltage tester 100 or the measuring end of the withstand voltage tester 400, so as to detect the resistance value of the insulation resistance in the device under test 300 and the output leakage current value through the second terminal 150 or the measuring end.

[0101] In this embodiment, the primary winding in the transformer 901, the field effect transistor 902, the integrated circuit 903, the receiver in the photoelectric converter 904 and the first common-mode capacitor 905 form a primary circuit, and the secondary winding in the transformer 901, the light-emitting diode in the photoelectric converter 904 and the second common-mode capacitor 906 form a secondary circuit.

[0102] As an example, when using the integrated voltage withstand tester 100 to perform a voltage withstand test on the reinforced insulation position between the primary circuit and the secondary circuit, the tester can connect a wire between the first terminal of the integrated voltage withstand tester 100 and the input terminals input+ / L / N, input- / L / N of the device under test 300, connect a wire between the second terminal of the integrated voltage withstand tester 100 and the output terminals output+, output- of the device under test 300, and connect a wire between any ground terminal of the integrated voltage withstand tester 100 and the ground terminal PE of the device under test 300. At this time, since a first common-mode capacitor 905 is connected between the primary circuit and the ground terminal PE of the device under test 300, and a second common-mode capacitor 906 is connected between the secondary circuit and the ground terminal PE of the device under test 300, the test voltage output by the integrated voltage withstand tester 100 to the device under test 300 may actually be loaded on the input terminals input+ / L / N, input- / L / N of the device under test 300-the first common-mode capacitor 905-the shell of the device under test 300-the second common-mode capacitor 906-the output terminals output+, output- of the device under test 300, or the input terminals input+ / L / N, input- / L / N of the device under test 300-the first common-mode capacitor 905-the shell of the device under test 300-the output terminals output+, output- of the device under test 300. These two paths cannot withstand the test voltage, which will cause the leakage current value to be greater than the threshold value of the leakage current value, thereby causing insulation breakdown flashover.

[0103] As an example, when a voltage withstand tester 400 connected to a voltage divider resistor box 200 is used to perform a voltage withstand test on the reinforced insulation position between the primary circuit and the secondary circuit, the tester can connect a wire between the high-voltage output terminal of the voltage withstand tester 400 and the input terminals input+ / L / N, input- / L / N of the device under test 300, connect a wire between the measuring terminal of the voltage withstand tester 400 and the output terminals output+, output- of the device under test 300, and connect a wire between any ground terminal of the voltage divider resistor box 200 and the ground terminal PE of the device under test 300. At this time, since a first common-mode capacitor 905 is connected between the primary circuit and the ground terminal PE of the device under test 300, and a second common-mode capacitor 906 is connected between the secondary circuit and the ground terminal of the device under test 300, the test voltage output by the withstand voltage tester 400 to the device under test 300 may actually be loaded on two paths: input terminals input+ / L / N, input- / L / N of the device under test 300-first common-mode capacitor 905-shell of the device under test 300-second common-mode capacitor 906-output terminals output+, output- of the device under test 300, or input terminals input+ / L / N, input- / L / N of the device under test 300-first common-mode capacitor 905-shell of the device under test 300-output terminals output+, output- of the device under test 300. These two paths cannot withstand the test voltage, which will cause the leakage current value to be greater than the threshold value of the leakage current value, thereby causing insulation breakdown flashover.

[0104] Specifically, the integrated voltage withstand tester 100 or the voltage divider resistance box 200 is provided with five resistance components A, B, C, D, and E connected in series in sequence, and each resistance component is provided with two resistance components, the resistance component A includes resistance components R1 and R2, the resistance component B includes resistance components R3 and R4, the resistance component C includes resistance components R5 and R6, the resistance component D includes resistance components R7 and R8, and the resistance component E includes resistance components R9 and R10, and the resistances of the ten resistance components are the same, and connection points t1, t2, t3, and t4 are sequentially arranged between the five resistance components A, B, C, D, and E, and the connection points t1, t2, t3, and t4 are respectively connected to the shell through wires. There are four grounding terminals. If the staff connects the grounding terminal of the tested device 300 to the first grounding terminal, it can be understood that the grounding terminal of the tested device 300 and the connection point t1 between the resistance components A and B are short-circuited. At this time, the resistance components R1 and R2 contained in the resistance component A are connected to the first common-mode capacitor of the tested device 300, and the resistance components R3, R4, R5, R6, R7, R8, R9 and R10 connected in sequence contained in the resistance components B, C, D and E are connected to the second common-mode capacitor of the tested device 300. At this time, the primary circuit can be allocated to 1 / 5 of the test voltage, and the secondary circuit can be allocated to 4 / 5 of the test voltage, thereby avoiding insulation breakdown and flashover.

[0105] Specifically, the ground terminal connected to the ground terminal of the device under test 300 can be determined based on the equivalent resistance ratio of the first common mode capacitor and the second common mode capacitor. When the equivalent resistance ratio of the first common mode capacitor and the second common mode capacitor is 1:4, the staff can connect the ground terminal of the device under test 300 to the ground terminal corresponding to the above connection point t1, and when the equivalent resistance ratio of another first common mode capacitor and the second common mode capacitor is 2:3, the staff can use the same integrated withstand voltage tester 100 or voltage divider resistance box 200, and connect the ground terminal of the device under test 300 to the ground terminal corresponding to the above connection point t2. It can be understood that the voltage division requirement of the device under test 300 refers to the equivalent resistance ratio of the first common mode capacitor and the second common mode capacitor, and the voltage division ratio of the ground terminal connected to the ground terminal of the device under test 300 is equal to or close to the equivalent resistance ratio of the first common mode capacitor and the second common mode capacitor.

[0106] Step 804: Collect the leakage current value output by the device under test.

[0107] After the controller controls the high voltage generator to output the test voltage to the device under test 300, the controller immediately controls the measurement circuit inside the integrated voltage withstand tester 100 or the voltage withstand tester 400 to detect the leakage current value output by the device under test 300. The measurement circuit may, for example, include a current sensor for accurately measuring the leakage current value output by the device under test 300.

[0108] Leakage current refers to the current formed between the charged non-insulating material inside the device under test 300 and the internal insulating material that should not be charged, through the medium around the internal insulating material or the surface of the insulating material when the device under test 300 is subjected to the test voltage. This current is usually caused by the imperfect insulation performance of the insulating material, resulting in a tiny current passing through. During the withstand voltage test, since the test voltage is usually higher than the normal operating voltage of the device under test, the size of the leakage current value corresponding to the leakage current can reflect the insulation performance of the device under test. If the leakage current value is too large, it means that the device under test has insulation defects, which may cause the device under test to malfunction or be damaged during normal operation, or even cause a safety accident. The leakage current value refers to the current value of the current flowing through the internal insulating material of the device under test 300 when the insulating material inside the device under test 300 is subjected to the test voltage.

[0109] As an example, the integrated voltage tester 100 or the voltage tester 400 can establish an electrical connection between the integrated voltage tester 100 and the device under test 300 or between the voltage tester 400 and the device under test 300 by connecting the high-voltage output port to the input end of the device under test 300 and connecting the test port to the output end of the device under test 300. It should be noted that in the actual test process, the high-voltage output port of the integrated voltage tester 100 or the voltage tester 400 can be understood as a red test lead connected to the integrated voltage tester 100 or the voltage tester 400. The test port of the tester 400 can be understood as a black test lead connected to the integrated voltage withstand tester 100 or the voltage withstand tester 400; the input end of the tested device 300 can be understood as a test lead socket of the tested device 300, and the output end of the tested device 300 can be understood as another test lead socket of the tested device 300. The tester establishes an electrical connection between the integrated voltage withstand tester 100 and the tested device 300 or between the voltage withstand tester 400 and the tested device 300 by inserting a red test lead into the test lead socket of the tested device 300 and a black test lead into the other test lead socket of the tested device 300.

[0110] Furthermore, the tester issues a trigger instruction by clicking a virtual button on the display screen of the integrated voltage withstand tester 100 or the voltage withstand tester 400. After receiving the trigger instruction, the controller in the integrated voltage withstand tester 100 or the voltage withstand tester 400 controls the high-voltage generator inside the integrated voltage withstand tester 100 or the high-voltage generator inside the voltage withstand tester 400 to convert the initial voltage provided by the external power supply into a test voltage, and outputs it to the device under test 300 through the red test lead.

[0111] At this time, the metal contact on the black test lead can contact the wire of the internal circuit of the device under test 300. When a current signal is formed between the charged non-insulating material inside the device under test 300 and the internal insulating material that should not be charged, through the medium around the internal insulating material or the surface of the insulating material, the signal will be collected by the black test lead through the metal contact. After collecting the current signal, the black test lead can send the current signal generated by the device under test 300 to the measurement circuit in the integrated withstand voltage tester 100 or the withstand voltage tester 400 through the wire. The measurement circuit can process and analyze the current signal in real time and obtain the current value corresponding to the current signal as the leakage current value. Step 806: Compare the leakage current value with the preset current value threshold, and obtain the withstand voltage test result of the device under test based on the comparison result.

[0112] The current value threshold is used to indicate the maximum leakage current value allowed when the test voltage is applied to the equipment that meets the safety requirements during the voltage withstand test. The setting of the current value threshold is usually dynamically set based on the safety requirements of the equipment.

[0113] The withstand voltage test result is used to indicate the insulation performance of the internal insulation material of the device under test 300 after being subjected to the test voltage. The withstand voltage test result can help testers determine the safety and reliability of the device under test 300.

[0114] The process of obtaining the withstand voltage test result of the tested device 300 based on the comparison result may include: when the comparison result indicates that the leakage current value of the tested device 300 is lower than the current value threshold, it can be considered that the tested device 300 has high safety and reliability; when the comparison result indicates that the leakage current value of the tested device 300 reaches the current value threshold, it can be considered that the safety and reliability of the tested device 300 are insufficient, and the controller can generate an alarm prompt at this time, which can be a text prompt or an audio and video prompt, etc., for issuing an alarm to remind the staff that the safety and reliability of the current tested device 300 are insufficient.

[0115] In the above-mentioned voltage withstand test method, the tester can perform voltage division of different proportions on the device under test through the voltage divider module or the voltage divider resistor box inside the integrated voltage withstand tester. Through voltage division, the actual voltage from the input end of the device under test to the ground end of the device under test and the actual voltage from the output end to the ground end of the device under test 300 are both controlled at a very low state, thereby preventing the device under test from insulation breakdown and flashover, and preventing the device under test from being damaged.

[0116] In one embodiment, step 802 includes:

[0117] In response to the trigger instruction, the test voltage is continuously output to the device under test 300 within a preset test duration.

[0118] Step 804 includes:

[0119] According to the preset frequency, the leakage current value output by the tested device 300 is continuously collected during the test duration. In this embodiment, the tester can select the voltage value of the test voltage and the preset duration of the output test voltage during the withstand voltage test through the integrated withstand voltage tester or the control button on the withstand voltage tester, wherein the preset duration of the output test voltage can be understood as the test duration.

[0120] In this embodiment, after receiving the trigger instruction, the controller controls the integrated voltage withstand tester or the high-voltage generator in the voltage withstand tester to output the test voltage to the tested device 300, generates a timing instruction and sends it to the timer inside the integrated voltage withstand tester or the voltage withstand tester to control the timer to start timing. When the timing reaches the test duration, the controller generates a stop instruction and sends it to the high-voltage generator to control the high-voltage generator to stop outputting the test voltage.

[0121] Correspondingly, after the controller controls the high voltage generator to output the test voltage to the device under test 300, the controller immediately generates an acquisition instruction and sends it to the integrated withstand voltage tester or the measuring circuit inside the withstand voltage tester to control the measuring circuit to detect the leakage current value of the device under test 300 according to the preset frequency. The preset frequency is, for example, 1 second / time, 3 seconds / time, 5 seconds / time, etc.

[0122] The controller can also collect leakage current values ​​at several specific key time points, such as: after the controller controls the high-voltage generator to output the test voltage to the device under test 300, the controller immediately collects the leakage current value of the device under test 300; or, when the controller controls the high-voltage generator to stop outputting the test voltage to the device under test 300, the controller collects the leakage current value of the device under test 300 again to view the final leakage current value.

[0123] Accordingly, after the controller controls the high-voltage generator to output the test voltage to the device under test 300, the controller immediately generates an acquisition instruction and sends it to the measurement circuit to control the measurement circuit to immediately detect the leakage current value of the device under test 300, and then continue to detect the leakage current value of the device under test 300 at a preset frequency, and when the controller controls the high-voltage generator to stop outputting the test voltage, detect the leakage current value of the device under test 300 again. By detecting the leakage current values ​​at these key time points, the leakage current of the device under test in a high-voltage test environment can be fully understood, which is helpful to evaluate the insulation performance and safety of the device under test 300.

[0124] In the above-mentioned withstand voltage test method, the tester can connect the device under test to an integrated withstand voltage tester or to a voltage divider resistor box or a withstand voltage tester, thereby using multiple resistor components in the integrated withstand voltage tester or multiple resistor components in the voltage divider resistor box to divide the voltage of the device under test, thereby avoiding insulation breakdown and flashover of the device under test and preventing damage to the device under test. After receiving the trigger signal, the controller can control the high-voltage generator in the integrated withstand voltage tester or the withstand voltage tester to continuously output the test voltage to the device under test, and continuously collect the leakage current value output by the device under test at a preset frequency, so as to fully understand the leakage current of the device under test in a high-voltage test environment, and further use the preset leakage current value threshold as a judgment standard to determine whether the leakage current value of the device under test is too large, so as to quickly determine whether the safety and reliability of the device under test meet the standards.

[0125] It should be understood that, although the steps in the flowcharts involved in the above embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps is not strictly limited in order, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above embodiments may include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0126] Each module in the above device can be implemented in whole or in part by software, hardware or a combination thereof. Each module can be embedded in or independent of a processor in a computer device in the form of hardware, or can be stored in a memory in a computer device in the form of software, so that the processor can call and execute operations corresponding to each module.

[0127] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, each step of the above-mentioned withstand voltage test method is implemented.

[0128] In one embodiment, a computer program product is provided, including a computer program, and when the computer program product is executed by a processor, each step of the above-mentioned withstand voltage test method is implemented.

[0129] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but are not limited to this.

[0130] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0131] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. An integrated withstand voltage tester, characterized in that: It includes a housing, a test module, a voltage dividing module, a first wiring terminal and a second wiring terminal; The test module is arranged in the shell; the voltage divider module includes a plurality of grounding terminals and a plurality of resistor components connected in series in sequence, the plurality of grounding terminals are arranged on the surface of the shell, the plurality of resistor components connected in series in sequence are arranged inside the shell, a connection point is arranged between any adjacent resistor components, the plurality of grounding terminals are connected to the corresponding connection points, and a target grounding terminal among the plurality of grounding terminals is used to connect to the ground terminal of the device under test; The first wiring terminal and the second wiring terminal are arranged on the shell, the first wiring terminal is respectively connected to the high-voltage output end of the test module, the input end of the device under test and one end of the multiple resistance components connected in series, and the second wiring terminal is respectively connected to the measuring end of the test device, the output end of the device under test and the other end of the multiple resistance components connected in series. The test module is used to output a preset test voltage to the device under test through the first wiring terminal, and detect the resistance value of the insulation resistance in the device under test and the output leakage current value through the second wiring terminal.

2. The integrated withstand voltage tester according to claim 1, characterized in that: The voltage dividing module further includes a circuit board, the plurality of resistor components connected in series are arranged on the circuit board, and the circuit board includes a first connection end and a second connection end; One end of the plurality of resistor components connected in series in sequence is connected to the first connection end, and is connected to the first terminal through the first connection end; the other end of the plurality of resistor components connected in series in sequence is connected to the second connection end, and is connected to the second terminal through the second connection end.

3. The integrated withstand voltage tester according to claim 1, characterized in that: The connection point includes a pad disposed between two adjacent resistor components.

4. The integrated withstand voltage tester according to claim 1, characterized in that: The multiple ground terminals correspond one-to-one to the multiple voltage division ratios; The target ground terminal is determined from the plurality of ground terminals based on a voltage division requirement of the device under test.

5. A voltage-dividing resistor box, characterized in that: The device comprises a first housing, a third terminal, a fourth terminal, a plurality of grounding terminals and a plurality of resistor components connected in series in sequence, wherein the third terminal, the fourth terminal and the plurality of grounding terminals are arranged on the surface of the first housing, the plurality of resistor components connected in series in sequence are arranged in the first housing, one end of the plurality of resistor components connected in series in sequence is connected to the third terminal, the other end of the plurality of resistor components connected in series in sequence is connected to the fourth terminal, a connection point is arranged between any adjacent resistor components, and a plurality of grounding terminals are connected to the corresponding connection point; The third terminal is used to connect with the fifth terminal of the withstand voltage tester and the input terminal of the device under test, the fourth terminal is used to connect with the sixth terminal of the withstand voltage tester and the output terminal of the device under test, and the target grounding terminal among the multiple grounding terminals is connected to the grounding terminal of the device under test, so as to realize voltage division of the device under test; The voltage withstand tester also includes a second shell and a test module, the test module is arranged in the second shell, the fifth terminal and the sixth terminal are arranged on the surface of the second shell, the fifth terminal is connected to the high-voltage output end of the test module, and is used to output the test voltage generated by the test module to the device under test; the sixth terminal is connected to the measuring end of the test module, and is used to detect the resistance value of the insulation resistance in the device under test and the output leakage current value.

6. The voltage-dividing resistor box according to claim 5, characterized in that: The multiple ground terminals correspond one-to-one to the multiple voltage division ratios; The target ground terminal is determined from the plurality of ground terminals based on a voltage division requirement of the device under test.

7. A voltage division test system, characterized in that: It includes a voltage-dividing resistor box and a withstand voltage tester, wherein the withstand voltage tester includes a second shell, a test module, a fifth terminal and a sixth terminal, wherein the test module is arranged in the second shell, the fifth terminal and the sixth terminal are arranged on the surface of the second shell, the fifth terminal is connected to the high-voltage output end of the test module, and the sixth terminal is connected to the measuring end of the test module; The voltage-dividing resistor box comprises a first shell, a third terminal, a fourth terminal, a plurality of grounding terminals and a plurality of resistor components connected in series in sequence, wherein the third terminal, the fourth terminal and the plurality of grounding terminals are arranged on the surface of the first shell, the plurality of resistor components connected in series in sequence are arranged in the first shell, one end of the plurality of resistor components connected in series in sequence is connected to the third terminal, the other end of the plurality of resistor components connected in series in sequence is connected to the fourth terminal, a connection point is arranged between any adjacent resistor components, a plurality of grounding terminals are connected to the corresponding connection points, and a target grounding terminal among the plurality of grounding terminals is used to be connected to a ground terminal of a device under test; The fifth terminal is also used to connect the third terminal and the input end of the device under test, and the sixth terminal is also used to connect the fourth terminal and the output end of the device under test. The test module is used to output a preset test voltage to the device under test through the fifth terminal, and detect the resistance value of the insulation resistance in the device under test and the output leakage current value through the sixth terminal.

8. The voltage division test system according to claim 7, characterized in that: The voltage-dividing resistor box also includes a circuit board, and the multiple resistor components connected in series are arranged on the circuit board. The circuit board includes a first connection end and a second connection end. One end of the multiple resistor components connected in series is connected to the first connection end, and is connected to the third terminal through the first connection end. The other end of the multiple resistor components connected in series is connected to the second connection end, and is connected to the fourth terminal through the second connection end.

9. The voltage division test system according to claim 7, characterized in that: The connection point includes a pad disposed between two adjacent resistor components.

10. The voltage division test system according to claim 7, characterized in that: The multiple ground terminals correspond one-to-one to the multiple voltage division ratios; The target ground terminal is determined from the plurality of ground terminals based on a voltage division requirement of the device under test.

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