Device and method for testing infrared detector

Abstract

The invention provides a testing device and method of an infrared detector, the infrared detector comprises a photoelectric device, the testing device comprises a testing box, a controller, and a photoelectric testing part, a temperature testing part and a parameter acquisition part which are in communication connection with the controller; the controller is used for controlling the photoelectric test component to drive the infrared detector to work; the controller is used for controlling the operation of the target equipment, so that the actual device temperature of the photoelectric device reaches a preset device temperature; wherein the target equipment comprises a temperature testing part and / or a thermoelectric refrigerating unit in the infrared detector; and the controller is also used for controlling the parameter acquisition part to acquire test data of the infrared detector when the actual device temperature of the photoelectric device reaches the preset device temperature, so as to test the infrared detector based on the test data. According to the invention, the actual working condition of the infrared detector can be simulated, the performance of a photoelectric device at different temperatures can be effectively tested, and the level of the infrared detector can be tested under a variable temperature condition.

Description

Technical Field

[0001] The present disclosure relates to the field of semiconductor technology, and in particular to a testing device and method for an infrared detector. Background Art

[0002] With the advancement and development of science and technology, the application of semiconductor devices is becoming more and more extensive in various fields and industries. Among them, optoelectronic semiconductor devices are key core components in the fields of sensing, monitoring, security, detection, etc., with a wide range of application scenarios, and are also the direction of vigorous development of various high-tech enterprises. Infrared detectors are integrated with optoelectronic semiconductor devices (referred to as optoelectronic devices). The cost reduction and performance improvement of infrared detectors enable them to be used in more diverse environments, and the ambient temperature will affect the performance of the detector. Therefore, testing the optoelectronic performance of the detector at different temperatures is an important means to evaluate its usability in special scenarios.

[0003] The existing tests under variable temperature environment are chip-level performance tests of optoelectronic semiconductor devices in infrared detectors, and the optoelectronic performance of infrared detectors is inferred from the chip performance.

[0004] The existing infrared detector test device tests the photoelectric performance of the infrared detector at room temperature, lacks the actual application environment simulation test with active / passive heat dissipation structure under actual working conditions, and lacks the test of the photoelectric performance of the infrared detector in a variable temperature environment. Therefore, how to effectively test the photoelectric performance of the infrared detector at different temperatures is an urgent problem to be solved. Summary of the invention

[0005] The technical problem to be solved by the present disclosure is to overcome the defect in the prior art that the photoelectric performance of the infrared detector cannot be tested in a variable temperature environment, and to provide a testing device and method for the infrared detector.

[0006] The present invention solves the above technical problems through the following technical solutions:

[0007] In a first aspect, a test device for an infrared detector is provided, wherein the infrared detector includes a photoelectric device, and the test device includes a test box, a controller, and a photoelectric test component, a temperature test component, and a parameter acquisition component that are communicatively connected to the controller;

[0008] The photoelectric test component is in communication connection with the infrared detector, and the controller is used to control the photoelectric test component to drive the infrared detector to work;

[0009] The infrared detector and the temperature testing component are both arranged inside the testing box, and the photoelectric testing component is arranged outside the testing box;

[0010] The controller is used to control the operation of the target device so that the actual device temperature of the optoelectronic device reaches a preset device temperature;

[0011] Wherein, the target device includes the temperature test component and / or a thermoelectric cooler inside the infrared detector;

[0012] The controller is also used to control the parameter acquisition component to acquire test data of the infrared detector when the actual device temperature of the photoelectric device reaches the preset device temperature, so as to test the infrared detector based on the test data.

[0013] Preferably, the infrared detector includes a heat dissipation surface;

[0014] The target device is the temperature test component, and the test data is photoelectric test data;

[0015] The controller is used to control the temperature testing component to conduct the first heat to the heat dissipation surface until the actual device temperature of the optoelectronic device reaches the preset device temperature;

[0016] Wherein, different first heat amounts correspond to different preset device temperatures;

[0017] The controller is also used to control the parameter acquisition component to acquire the photoelectric test data when the actual device temperature of the photoelectric device reaches the preset device temperature, so as to perform a photoelectric test on the infrared detector based on the photoelectric test data.

[0018] Preferably, the temperature testing component includes a temperature controller and a heat conduction module;

[0019] The thermostat is used to generate the first heat;

[0020] The heat conduction module is used to conduct the first heat to the heat dissipation surface so that the actual device temperature of the optoelectronic device meets the preset device temperature.

[0021] Preferably, the temperature testing component further includes a temperature acquisition module and a first power supply module;

[0022] The temperature acquisition module is used to acquire the actual heat dissipation temperature of the heat dissipation surface;

[0023] The controller is used to control the first power module to output the corresponding first power supply power to the thermostat based on the preset heat dissipation temperature and the actual heat dissipation temperature, so that the thermostat outputs the first heat.

[0024] Preferably, the temperature testing component further comprises a heat dissipation module, and the heat dissipation module is used to dissipate heat for the temperature controller;

[0025] And / or, the temperature controller is a thermoelectric cooler, and the thermoelectric cooler corresponds to a cooling mode and a heating mode.

[0026] Preferably, the target device is the thermoelectric cooler, and the thermoelectric cooler is used to adjust the actual device temperature of the optoelectronic device so that the actual device temperature meets the preset device temperature;

[0027] The test data is temperature control test data;

[0028] The controller is used to control the temperature testing component to transfer the second heat to the heat dissipation surface of the infrared detector based on heat conduction, until the actual heat dissipation temperature of the heat dissipation surface reaches a preset heat dissipation temperature;

[0029] Wherein, different second heat amounts correspond to different preset heat dissipation temperatures;

[0030] When the photoelectric device reaches the preset device temperature and the heat dissipation surface reaches the preset heat dissipation temperature, the controller is used to control the parameter acquisition component to acquire the temperature control test data of the thermoelectric cooler, so as to perform a temperature control test on the infrared detector based on the temperature control test data.

[0031] Preferably, the infrared detector further comprises a temperature sensor, and the temperature sensor is used to collect the actual device temperature of the photoelectric device;

[0032] The temperature testing component also includes a second power supply module;

[0033] The controller is used to control the second power module to output a corresponding second power supply to the thermoelectric cooler based on the actual device temperature and the preset device temperature, so that the actual device temperature meets the preset device temperature.

[0034] Preferably, the testing device further comprises an environmental parameter adjustment component;

[0035] The test box is a closed test box;

[0036] The controller is used to control the environmental parameter adjustment component to adjust the actual environmental state data inside the test box so that the actual environmental state data conforms to the preset environmental state data.

[0037] Preferably, the closed test box is a positive pressure test box;

[0038] And / or, the environmental parameter adjustment component includes an environmental parameter adjustment module and an environmental parameter acquisition module;

[0039] The environmental parameter adjustment module is arranged outside the closed test box, and the environmental parameter acquisition module is arranged inside the closed test box;

[0040] The environmental parameter acquisition module is used to collect the actual environmental status data;

[0041] The environmental parameter adjustment module is used to adjust the input gas source so that the actual environmental state data conforms to the preset environmental state data.

[0042] In a second aspect, a method for testing an infrared detector is also provided, and the method is implemented based on the above-mentioned infrared detector testing device;

[0043] The test method includes:

[0044] Controlling the photoelectric testing component to drive the infrared detector to work;

[0045] Controlling the operation of the target device so that the actual device temperature of the optoelectronic device reaches a preset device temperature;

[0046] Wherein, the target device includes a temperature test component and / or a thermoelectric cooler inside the infrared detector;

[0047] When the actual device temperature of the optoelectronic device reaches the preset device temperature, the parameter acquisition component is controlled to acquire test data of the infrared detector, so as to test the infrared detector based on the test data.

[0048] On the basis of being in accordance with the common sense in the art, the above-mentioned preferred conditions can be arbitrarily combined to obtain the preferred embodiments of the present disclosure.

[0049] The positive and progressive effects of this disclosure are:

[0050] The infrared detector testing device and method disclosed in the present invention can simulate the actual working conditions of the infrared detector by controlling the operation of the target device so that the actual device temperature of the optoelectronic device reaches the preset device temperature, effectively test the performance of the optoelectronic device at different temperatures, and realize the infrared detector level test under variable temperature conditions. BRIEF DESCRIPTION OF THE DRAWINGS

[0051] Figure 1 A schematic diagram of the structure of a testing device for an infrared detector provided in Example 1 of the present disclosure;

[0052] Figure 2 A schematic diagram of the structure of a temperature test component in a test device for an infrared detector provided in Example 1 of the present disclosure;

[0053] Figure 3A schematic diagram of the structure of an environmental parameter adjustment component in a test device for an infrared detector provided in Example 1 of the present disclosure;

[0054] Figure 4 A first flow chart of a method for testing an infrared detector provided in Embodiment 2 of the present disclosure;

[0055] Figure 5 A second flow chart of the infrared detector testing method provided in Example 2 of the present disclosure. DETAILED DESCRIPTION

[0056] The present disclosure is further described below by way of examples, but the present disclosure is not limited to the scope of the examples.

[0057] Example 1

[0058] This embodiment provides a testing device for an infrared detector, such as Figure 1 As shown, the infrared detector includes a photoelectric device;

[0059] The test device includes a test box 1, a controller 2, and a photoelectric test component 3, a temperature test component 4 and a parameter acquisition component 5 which are communicatively connected with the controller 2;

[0060] The photoelectric test component 3 is connected to the infrared detector for communication, and the controller 2 is used to control the photoelectric test component 3 to drive the infrared detector to work;

[0061] The infrared detector and the temperature test component 4 are both arranged inside the test box 1, and the photoelectric test component 3 is arranged outside the test box 1;

[0062] The controller 2 is used to control the operation of the target device so that the actual device temperature of the optoelectronic device reaches the preset device temperature;

[0063] Wherein, the target device includes the temperature test component 4 and / or the thermoelectric cooler inside the infrared detector;

[0064] The controller 2 is also used to control the parameter acquisition component 5 to acquire test data of the infrared detector when the actual device temperature of the optoelectronic device reaches a preset device temperature, so as to test the infrared detector based on the test data.

[0065] The test device of infrared detector is used to test the performance of infrared detector. During the operation of infrared detector, its photoelectric device is used to convert infrared radiation into electrical signals. The temperature of the photoelectric device needs to be maintained at the preset device temperature to ensure that the infrared detector has stable photoelectric performance. The ambient temperature will affect the photoelectric performance of the infrared detector. Therefore, the photoelectric performance of the infrared detector needs to be tested to evaluate the performance of the infrared detector in a variable temperature environment.

[0066] The optoelectronic test component may include a light source, an optical structure, and a drive timing generator. The working principle of the optoelectronic test component is to power the infrared detector according to a typical working bias, drive the infrared detector to operate normally, collect relevant signal data of pixels under uniform light irradiation conditions through a parameter acquisition component, and obtain test data that can evaluate the performance of the detector through signal acquisition hardware and signal processing software, thereby realizing the test of the infrared detector. The optoelectronic test component is a prior art, and the specific structure will not be described in detail here.

[0067] By controlling the photoelectric test component, the operation state of the infrared detector is made into a normal operation state or a certain set operation state, so that the operation state of the infrared detector meets the test requirements.

[0068] The infrared detector test device of this embodiment controls the operation of the target device so that the actual device temperature of the photoelectric device reaches the preset device temperature, thereby simulating the actual working conditions of the infrared detector, effectively testing the performance of the photoelectric device at different temperatures, and realizing the infrared detector level test under variable temperature conditions.

[0069] In an optional embodiment, if Figure 1 and Figure 2 As shown, the infrared detector includes a heat dissipation surface;

[0070] The target device is the temperature test component 4, and the test data is the photoelectric test data;

[0071] The controller 2 is used to control the temperature testing component 4 to conduct the first heat to the heat dissipation surface until the actual device temperature of the photoelectric device reaches the preset device temperature;

[0072] Wherein, different first heat amounts correspond to different preset device temperatures;

[0073] The controller 2 is also used to control the parameter acquisition component 5 to acquire photoelectric test data when the actual device temperature of the photoelectric device reaches a preset device temperature, so as to perform a photoelectric test on the infrared detector based on the photoelectric test data.

[0074] Different first heat amounts correspond to different preset device temperatures, and a test may be performed in advance to obtain a corresponding relationship between the first heat amounts and the preset device temperatures.

[0075] The parameter acquisition component collects relevant signal data of pixels under uniform light irradiation conditions, and through signal acquisition hardware and signal processing software, test data that can evaluate the photoelectric performance of the detector is obtained, thereby realizing photoelectric testing of the infrared detector.

[0076] Photoelectric test data can also be called photoelectric performance data, which can be voltage data or current data. For example, the preset device temperature of the photoelectric device is minus 20 degrees, and the photoelectric device reaches the preset device temperature through the temperature test component. At this time, the photoelectric test data of the infrared detector is 3 volts or 2 amps.

[0077] During operation, the infrared detector generates heat, which is conducted to the outside through the heat dissipation surface of the infrared detector. Therefore, for an infrared detector without an integrated thermoelectric cooler, the temperature test component can transfer energy to the optoelectronic device based on heat conduction. Specifically, the temperature test component is controlled to conduct the first heat to the heat dissipation surface until the actual device temperature of the optoelectronic device reaches the preset device temperature, so as to simulate the actual working condition of the infrared detector.

[0078] The test device of the infrared detector in this embodiment is provided with a temperature testing component. The temperature testing component transfers the first heat to the heat dissipation surface of the infrared detector based on heat conduction, and then conducts the first heat through the heat dissipation surface, so that the photoelectric device reaches a preset device temperature, thereby simulating the actual working conditions of the infrared detector, effectively testing the photoelectric performance of the photoelectric device at different temperatures, and realizing the photoelectric performance test of the infrared detector level under variable temperature conditions.

[0079] In an optional embodiment, if Figure 1 and Figure 2 As shown, the temperature testing component 4 includes a temperature controller 41 and a heat conduction module 42;

[0080] The thermostat 41 is used to generate a first heat;

[0081] The heat conduction module 42 is used to conduct the first heat to the heat dissipation surface so that the actual device temperature of the optoelectronic device meets the preset device temperature.

[0082] The temperature controller is used to generate the first heat. Specifically, the temperature controller can be a thermoelectric cooler. The thermoelectric cooler corresponds to a cooling mode and a heating mode. When the photoelectric device needs to be heated to a preset device temperature, the thermoelectric cooler is controlled to be in the heating mode, and the heat conduction module conducts the first heat to the heat dissipation surface so that the actual device temperature of the photoelectric device meets the preset device temperature.

[0083] When the optoelectronic device needs to be cooled to a preset device temperature, the thermoelectric cooler is controlled to be in a cooling mode, and the heat conduction module conducts the first heat to the heat dissipation surface so that the actual device temperature of the optoelectronic device meets the preset device temperature.

[0084] The heat conduction module may also be called a temperature uniforming module. The heat conduction module may conduct heat in direct contact with the heat dissipation surface or in indirect contact with the heat dissipation surface.

[0085] The infrared detector test device of this embodiment conducts the first heat generated by the temperature controller to the heat dissipation surface through the heat conduction module, so that the actual device temperature of the photoelectric device meets the preset device temperature, thereby simulating the actual working conditions of the infrared detector, effectively testing the photoelectric performance of the photoelectric device at different temperatures, and realizing the photoelectric performance test of the infrared detector level under variable temperature conditions.

[0086] In an optional embodiment, if Figure 1 and Figure 2 As shown, the temperature testing component 4 also includes a temperature acquisition module 43 and a first power supply module 44;

[0087] The temperature acquisition module 43 is used to collect the actual heat dissipation temperature of the heat dissipation surface;

[0088] The controller 2 is used to control the first power module 44 to output the corresponding first power supply power to the thermostat based on the preset heat dissipation temperature and the actual heat dissipation temperature, so that the thermostat 41 outputs the first heat.

[0089] The temperature acquisition module can be a temperature sensor. The controller adjusts the power supply of the first power supply module according to the difference between the preset heat dissipation temperature and the actual heat dissipation temperature according to the PID (proportional-differential-integral) control program, outputs the first power supply power to the temperature controller, and drives the temperature controller to work to output the first heat.

[0090] In an optional embodiment, if Figure 1 and Figure 2 As shown, the temperature testing component 4 further includes a heat dissipation module 45 , which is used to dissipate heat for the temperature controller 41 .

[0091] The thermostat generates heat during operation, and a heat dissipation module is provided to dissipate heat for the thermostat. Specifically, the heat dissipation module may be a fan.

[0092] In an optional embodiment, the target device is a thermoelectric cooler, and the thermoelectric cooler is used to adjust the actual device temperature of the optoelectronic device so that the actual device temperature meets the preset device temperature; the test data is temperature control test data;

[0093] The controller 2 is used to control the temperature test component 4 to transfer the second heat to the heat dissipation surface of the infrared detector based on heat conduction, until the actual heat dissipation temperature of the heat dissipation surface reaches the preset heat dissipation temperature;

[0094] Wherein, different second heat amounts correspond to different preset heat dissipation temperatures;

[0095] When the optoelectronic device reaches a preset device temperature and the heat dissipation surface reaches a preset heat dissipation temperature, the controller 2 is used to control the parameter acquisition component 5 to acquire temperature control test data of the thermoelectric cooler to perform a temperature control test on the infrared detector based on the temperature control test data.

[0096] Different second heat amounts correspond to different preset heat dissipation temperatures, and a test may be performed in advance to obtain a corresponding relationship between the second heat amounts and the preset heat dissipation temperatures.

[0097] The infrared detector in this embodiment includes a thermoelectric cooler, that is, a thermoelectric cooler is configured inside the infrared detector. The infrared detector is a temperature-controlled infrared detector. The thermoelectric cooler serves as a temperature control component and can adjust the actual device temperature of the photoelectric device so that the actual device temperature of the photoelectric device meets the preset device temperature, thereby realizing the temperature adjustment of the photoelectric device by the thermoelectric cooler inside the infrared detector.

[0098] At this time, the controller is used to control the temperature test component to transfer the second heat to the heat dissipation surface of the infrared detector based on heat conduction until the heat dissipation surface reaches a preset heat dissipation temperature, meeting the heat dissipation requirements of the infrared detector, thereby realizing the simulation of the actual working conditions of the infrared detector.

[0099] When the optoelectronic device reaches the preset device temperature and the heat dissipation surface reaches the preset heat dissipation temperature, the temperature control test data of the thermoelectric cooler is collected to perform a temperature control test on the infrared detector, thereby realizing the test of the temperature control performance of the infrared detector.

[0100] The temperature control test data can also be called temperature control performance data, which can be specifically the correspondence between temperature (or temperature range) and voltage data or current data. For example, when the photoelectric device is at minus 20 degrees, the temperature control test data of the infrared detector is minus 20 degrees 3 volts or 2 amps. When the photoelectric device is at minus 30 degrees, the temperature control test data of the infrared detector is minus 30 degrees 5 volts or 6 amps.

[0101] In this embodiment, the actual working condition of the infrared detector is simulated by the temperature testing component, the temperature control performance of the temperature-controlled infrared detector at different temperatures is effectively tested, and the temperature control performance test of the infrared detector level under variable temperature conditions is realized.

[0102] In an optional embodiment, the infrared detector further includes a temperature sensor, and the temperature sensor is used to collect the actual device temperature of the photoelectric device;

[0103] The temperature testing component 4 further includes a second power supply module 46;

[0104] The controller 2 is used to control the second power module 46 to output the corresponding second power supply to the thermoelectric cooler based on the actual device temperature and the preset device temperature, so that the actual device temperature meets the preset device temperature.

[0105] For infrared detectors with thermoelectric coolers integrated inside (temperature-controlled infrared detectors), temperature sensors are also integrated inside them. The temperature sensor is used to collect the actual device temperature of the photoelectric device in order to control the working process of the thermoelectric cooler. During the operation of the temperature-controlled infrared detector, the thermoelectric cooler inside it needs to be driven by an external power supply to work.

[0106] The infrared detector in this embodiment may be a short-wave infrared detector.

[0107] In a specific example, the infrared detector is a temperature-controlled 1280×1024-element InGaAs (indium gallium arsenide) array infrared detector. The response spectrum range of this 1280×1024-element photoelectric detector is 0.9 to 1.7 microns. The designed normal chip temperature range is -20 to +50°C. A first-stage thermoelectric cooler is integrated inside, and the designed temperature difference between the two ends is 40°C.

[0108] In this embodiment, the controller controls the second power supply module to output the corresponding second power supply to the thermoelectric cooler based on the actual device temperature and the preset device temperature, so that the actual device temperature meets the preset device temperature, thereby realizing the normal operation of the temperature-controlled infrared detector. The actual working conditions of the infrared detector are simulated by the temperature testing component, and the temperature control performance of the temperature-controlled infrared detector at different temperatures is effectively tested, thereby realizing the temperature control performance test of the infrared detector level under variable temperature conditions.

[0109] In an optional embodiment, the test device further includes an environmental parameter adjustment component 6; the test box is a closed test box;

[0110] The controller 2 is used to control the environmental parameter adjustment component 6 to adjust the actual environmental state data inside the test box 1 so that the actual environmental state data conforms to the preset environmental state data.

[0111] Environmental status data can also be called atmosphere data, and includes but is not limited to temperature, humidity, oxygen content, and air pressure, etc. A closed test box can ensure the stability of the actual environmental status data in the test box.

[0112] If the infrared detector needs to be tested under preset environmental state data, the actual environmental state data inside the closed test box needs to be adjusted through the environmental parameter adjustment component so that the actual environmental state data inside the test box conforms to the preset environmental state data, thereby simulating the actual working conditions of the infrared detector.

[0113] The infrared detector test device of the present embodiment adjusts the actual environmental state data inside the test box through the environmental parameter adjustment component, so that the actual environmental state data inside the test box conforms to the preset environmental state data, thereby simulating the actual working conditions of the infrared detector, effectively testing the photoelectric performance of the photoelectric device at different temperatures, and realizing the photoelectric performance measurement of the infrared detector level under variable temperature conditions; for the temperature-controlled infrared detector, the temperature control performance of the temperature-controlled infrared detector at different temperatures can be effectively tested, and the temperature control performance test of the infrared detector level under variable temperature conditions can be realized.

[0114] In an optional embodiment, the sealed test box includes but is not limited to a positive pressure test box.

[0115] The pressure inside the positive pressure test box is higher than the pressure of the external environment, so that the gas in the external environment cannot enter the positive pressure test box, further ensuring the stability of the environmental status data inside the positive pressure test box.

[0116] In an optional embodiment, if Figure 1 and Figure 3 As shown, the environmental parameter adjustment component 6 includes an environmental parameter adjustment module 61 and an environmental parameter acquisition module 62;

[0117] The environmental parameter adjustment module 61 is arranged outside the closed test box, and the environmental parameter acquisition module 62 is arranged inside the closed test box;

[0118] The environmental parameter acquisition module 62 is used to collect actual environmental status data;

[0119] The environmental parameter adjustment module 61 is used to adjust the input gas source so that the actual environmental state data conforms to the preset environmental state data.

[0120] The environmental parameter acquisition module collects the actual environmental status data and sends it to the controller. When the actual environmental status data is consistent with the preset environmental status data, the controller controls the environmental parameter adjustment module to adjust the input gas source so that the actual environmental status data inside the closed test box is consistent with the preset environmental status data.

[0121] The environmental parameter adjustment module includes but is not limited to a temperature adjustment unit and a humidity adjustment unit.

[0122] For example, the preset environmental status data includes temperature data and humidity data, and the environmental parameter acquisition module includes a temperature sensor and a humidity sensor. If the actual working condition of the infrared detector is that the temperature of the external environment is 30 degrees and the humidity is 40%, then it is necessary to adjust the temperature of the air source leading to the inside of the closed test box through the temperature adjustment unit, and adjust the humidity of the air source leading to the inside of the closed test box through the humidity adjustment unit, so that the actual temperature data and actual humidity data inside the closed test box meet the preset temperature data and preset humidity data.

[0123] Among them, the temperature adjustment unit can heat up or cool down the air source, and the humidity adjustment unit can humidify or dehumidify the air source, and the specific adjustment is based on the actual working conditions corresponding to the infrared detector.

[0124] Example 2

[0125] This embodiment provides a test method for an infrared detector, and the test method is implemented based on the test device for the infrared detector in Embodiment 1; Figure 4 As shown, the test methods include:

[0126] S101, controlling the photoelectric test component to drive the infrared detector to work.

[0127] S102: Controlling the operation of the target device so that the actual device temperature of the optoelectronic device reaches a preset device temperature.

[0128] The target device includes a temperature test component and / or a thermoelectric cooler inside the infrared detector.

[0129] S103 . When the actual device temperature of the optoelectronic device reaches the preset device temperature, the control parameter acquisition component acquires test data of the infrared detector to test the infrared detector based on the test data.

[0130] The test method of the infrared detector in this embodiment is implemented based on the test device of the infrared detector in Example 1. Specifically, steps S101, S102 and S103 are all implemented based on the controller in the test device of the infrared detector controlling the corresponding components. Specifically, step S101 is implemented by the controller controlling the photoelectric test component, step S102 is implemented by the controller controlling the target device, and step S103 is implemented by the controller controlling the parameter acquisition component.

[0131] The test method of the infrared detector of this embodiment is implemented based on the test device of the infrared detector in Example 1. By controlling the operation of the target device so that the actual device temperature of the photoelectric device reaches the preset device temperature, the actual working condition of the infrared detector can be simulated, and the performance of the photoelectric device at different temperatures can be effectively tested, thereby realizing the test of the infrared detector level under variable temperature conditions.

[0132] The test process of the infrared detector is further described below. First, the controller controls the photoelectric test component to provide a wide-spectrum light source corresponding to the response spectrum, sets the preset device temperature, and starts the normal operation of the infrared detector. Specifically, the data output by the infrared detector is collected through the parameter acquisition component to determine whether the infrared detector is working normally.

[0133] When the target device is a temperature test component, the test data is photoelectric test data. The controller controls the temperature test component to transfer the first heat to the heat dissipation surface of the infrared detector until the actual device temperature of the photoelectric device reaches the preset device temperature. When the actual device temperature of the photoelectric device reaches the preset device temperature, the control parameter acquisition component acquires the photoelectric test data to perform a photoelectric test on the infrared detector based on the photoelectric test data.

[0134] When the target device is a thermoelectric cooler inside an infrared detector, the thermoelectric cooler is used to adjust the actual device temperature of the photoelectric device so that the actual device temperature meets the preset device temperature; the test data is temperature control test data; the controller controls the temperature test component to transfer the second heat to the heat dissipation surface of the infrared detector based on heat conduction until the actual heat dissipation temperature of the heat dissipation surface reaches the preset heat dissipation temperature; when the photoelectric device reaches the preset device temperature and the heat dissipation surface reaches the preset heat dissipation temperature, the controller controls the parameter acquisition component to acquire the temperature control test data of the thermoelectric cooler to perform a temperature control test on the infrared detector based on the temperature control test data.

[0135] The testing method of the infrared detector in this embodiment corresponds to the testing device of the infrared detector in Example 1. The working principle of the testing method of the infrared detector is the same as the working principle of the testing device of the infrared detector in Example 1, and will not be repeated here.

[0136] In an optional embodiment, if Figure 5 As shown, before step S101, the following steps are also included:

[0137] S100, controlling the environmental parameter adjustment component to adjust the actual environmental state data inside the test box so that the actual environmental state data conforms to the preset environmental state data.

[0138] For infrared detectors that have special requirements for the external environment, it is necessary to first adjust the actual environmental status data inside the test box through the environmental parameter adjustment component, so that the actual environmental status data conforms to the preset environmental status data, realize the simulation of the actual working conditions, and then carry out temperature control test or photoelectric test. The specific test method is the same as the aforementioned test method, so it will not be repeated here.

[0139] Although the specific embodiments of the present disclosure are described above, those skilled in the art should understand that this is only an example, and the protection scope of the present disclosure is defined by the appended claims. Those skilled in the art may make various changes or modifications to these embodiments without departing from the principles and essence of the present disclosure, but these changes and modifications all fall within the protection scope of the present disclosure.

Claims

1. A test device for an infrared detector, characterized in that: The infrared detector includes a photoelectric device, and the test device includes a test box, a controller, and a photoelectric test component, a temperature test component and a parameter acquisition component that are communicatively connected to the controller; The photoelectric test component is in communication connection with the infrared detector, and the controller is used to control the photoelectric test component to drive the infrared detector to work; The infrared detector and the temperature testing component are both arranged inside the testing box, and the photoelectric testing component is arranged outside the testing box; The controller is used to control the operation of the target device so that the actual device temperature of the optoelectronic device reaches a preset device temperature; Wherein, the target device includes the temperature test component and / or a thermoelectric cooler inside the infrared detector; The controller is also used to control the parameter acquisition component to acquire test data of the infrared detector when the actual device temperature of the photoelectric device reaches the preset device temperature, so as to test the infrared detector based on the test data.

2. The testing device according to claim 1, characterized in that: The infrared detector includes a heat dissipation surface; The target device is the temperature test component, and the test data is photoelectric test data; The controller is used to control the temperature testing component to conduct the first heat to the heat dissipation surface until the actual device temperature of the optoelectronic device reaches the preset device temperature; Wherein, different first heat amounts correspond to different preset device temperatures; The controller is also used to control the parameter acquisition component to acquire the photoelectric test data when the actual device temperature of the photoelectric device reaches the preset device temperature, so as to perform a photoelectric test on the infrared detector based on the photoelectric test data.

3. The testing device according to claim 2, characterized in that: The temperature testing component includes a temperature controller and a heat conduction module; The thermostat is used to generate the first heat; The heat conduction module is used to conduct the first heat to the heat dissipation surface so that the actual device temperature of the optoelectronic device meets the preset device temperature.

4. The testing device according to claim 3, characterized in that: The temperature testing component also includes a temperature acquisition module and a first power supply module; The temperature acquisition module is used to acquire the actual heat dissipation temperature of the heat dissipation surface; The controller is used to control the first power module to output the corresponding first power supply power to the thermostat based on the preset heat dissipation temperature and the actual heat dissipation temperature, so that the thermostat outputs the first heat.

5. The testing device according to claim 3 or 4, characterized in that: The temperature testing component further includes a heat dissipation module, and the heat dissipation module is used to dissipate heat for the temperature controller; And / or, the temperature controller is a thermoelectric cooler, and the thermoelectric cooler corresponds to a cooling mode and a heating mode.

6. The testing device according to claim 1, characterized in that: The target device is the thermoelectric cooler, and the thermoelectric cooler is used to adjust the actual device temperature of the optoelectronic device so that the actual device temperature meets the preset device temperature; The test data is temperature control test data; The controller is used to control the temperature testing component to transfer the second heat to the heat dissipation surface of the infrared detector based on heat conduction, until the actual heat dissipation temperature of the heat dissipation surface reaches a preset heat dissipation temperature; Wherein, different second heat amounts correspond to different preset heat dissipation temperatures; When the photoelectric device reaches the preset device temperature and the heat dissipation surface reaches the preset heat dissipation temperature, the controller is used to control the parameter acquisition component to acquire the temperature control test data of the thermoelectric cooler, so as to perform a temperature control test on the infrared detector based on the temperature control test data.

7. The testing device according to claim 6, characterized in that: The infrared detector further comprises a temperature sensor, and the temperature sensor is used to collect the actual device temperature of the photoelectric device; The temperature testing component also includes a second power supply module; The controller is used to control the second power module to output a corresponding second power supply to the thermoelectric cooler based on the actual device temperature and the preset device temperature, so that the actual device temperature meets the preset device temperature.

8. The testing device according to claim 1, characterized in that: The testing device also includes an environmental parameter adjustment component; The test box is a closed test box; The controller is used to control the environmental parameter adjustment component to adjust the actual environmental state data inside the test box so that the actual environmental state data conforms to the preset environmental state data.

9. The testing device according to claim 8, characterized in that: The closed test box is a positive pressure test box; And / or, the environmental parameter adjustment component includes an environmental parameter adjustment module and an environmental parameter acquisition module; The environmental parameter adjustment module is arranged outside the closed test box, and the environmental parameter acquisition module is arranged inside the closed test box; The environmental parameter acquisition module is used to collect the actual environmental status data; The environmental parameter adjustment module is used to adjust the input gas source so that the actual environmental state data conforms to the preset environmental state data.

10. A method for testing an infrared detector, characterized in that: The testing method is implemented based on the testing device of the infrared detector according to any one of claims 1 to 9; The test method includes: Controlling the photoelectric testing component to drive the infrared detector to work; Controlling the operation of the target device so that the actual device temperature of the optoelectronic device reaches a preset device temperature; Wherein, the target device includes a temperature test component and / or a thermoelectric cooler inside the infrared detector; When the actual device temperature of the optoelectronic device reaches the preset device temperature, the control parameter acquisition component acquires the test data of the infrared detector to test the infrared detector based on the test data.

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