Insulator surface cleaning method and device, equipment, storage medium and program product

Abstract

The embodiment of the invention provides an insulator surface cleaning method and device, equipment, a storage medium and a program product, relates to the technical field of insulator detection, and can realize automatic analysis and cleaning of insulator surface dirt, improve the objectivity of the cleaning process, enhance the cleaning effect and cleaning quality of the insulator surface dirt, shorten the cleaning time and improve the cleaning efficiency. The cleaning efficiency is improved. The method comprises the following steps: acquiring image information of dirt on the surface of the insulator and position information of the dirt; determining the pollution grade of the surface of the insulator according to the image information of the pollution; according to the pollution level, cleaning information of the pollution is determined, and the cleaning information comprises at least one of the cleaning mode, the cleaning duration and the cleaning intensity of the pollution; and cleaning the insulator according to the cleaning information and the position information of the dirt.

Description

Technical Field

[0001] The embodiments of the present application relate to the field of insulator detection technology, and in particular to an insulator surface cleaning method, device, equipment, storage medium and program product. Background Art

[0002] An insulator is a device that is installed between conductors at different potentials or between conductors and grounded components and can withstand voltage and mechanical stress. It is mainly used in electrical equipment to isolate and support, and can prevent current leakage and short circuit. Insulators are usually made of insulating materials such as ceramics, glass or polymers. Industrial activities, air pollution, etc. will cause dust, dirt, salt, etc. to accumulate on the surface of insulators, reducing their insulation performance. Dirty insulators are prone to leakage, flashover and other problems, affecting the normal operation of the power system and may even cause power outages. Therefore, contamination is a key indicator affecting the out-of-plane insulation performance of composite insulators. In order to ensure the good performance of the insulators and the reliability of the power system, they need to be cleaned and maintained regularly.

[0003] However, in traditional insulator surface cleaning, workers are usually required to make subjective judgments and clean the dirt on the insulator surface based on past experience, and it is difficult to accurately determine the cleaning intensity, cleaning tools, and cleaning time, resulting in poor cleaning effects, low operating efficiency, and long operating cycles, which will further increase cleaning costs and safety risks during the cleaning process. Summary of the invention

[0004] The insulator surface cleaning method, device, equipment, storage medium and program product provided in the embodiments of the present application can realize automatic analysis and cleaning of insulator surface contamination, enhance the objectivity of the cleaning process, thereby improving the cleaning effect and cleaning quality of insulator surface contamination, shortening the cleaning time, improving the cleaning efficiency, reducing the cleaning cost of insulator surface contamination, further reducing the safety risks of insulators, and improving safety.

[0005] A first aspect of an embodiment of the present application provides a method for cleaning an insulator surface, comprising:

[0006] Obtaining image information of contamination on the surface of the insulator and location information of the contamination;

[0007] Determining the contamination level of the surface of the insulator according to the contamination image information;

[0008] Determining cleaning information of the contamination according to the contamination level, wherein the cleaning information includes at least one of a cleaning method, a cleaning duration, and a cleaning intensity of the contamination;

[0009] The insulator is cleaned according to the cleaning information and the location information of the contamination.

[0010] In some embodiments, determining the contamination level of the surface of the insulator according to the contaminated image information includes:

[0011] Determine the type information of the dirt and the area information of the dirt according to the image information of the dirt;

[0012] The contamination level of the insulator surface is determined according to at least one of the contamination type information and the contamination area information.

[0013] In some embodiments, determining the contamination level of the surface of the insulator according to at least one of the contamination type information and the contamination area information includes:

[0014] Determining a first contamination level on the surface of the insulator according to the contamination type information;

[0015] A second pollution level on the surface of the insulator is determined according to the pollution area information, wherein the pollution level includes the first pollution level and the second pollution level.

[0016] In some embodiments, determining the cleaning information of the contamination according to the contamination level includes:

[0017] Determining a cleaning method for the dirt according to the first dirt level;

[0018] The cleaning time of the dirt is determined according to the second dirt level.

[0019] In some implementations, determining the first contamination level of the surface of the insulator according to the contamination type information includes:

[0020] In a case where the type of the contamination is solid contamination, determining the first contamination level on the surface of the insulator to be a first level;

[0021] In the case where the type of contamination is liquid contamination, the first contamination level of the insulator surface is determined to be a second level according to the composition of the liquid contamination, wherein the second level includes a plurality of sub-levels, and liquid contamination of different compositions corresponds to different sub-levels.

[0022] In some embodiments, determining the cleaning information of the contamination according to the contamination level includes:

[0023] In the case where the first contamination level is the first level, determining that the cleaning method of the contamination is physical cleaning, wherein the physical cleaning includes removing the contamination by spraying water mist on the contamination;

[0024] In the case where the first contamination level is the second level, it is determined that the cleaning method of the contamination is chemical cleaning, and the chemical cleaning includes decomposing the contamination by spraying liquid to the contamination.

[0025] A second aspect of an embodiment of the present application provides an insulator surface cleaning device, comprising:

[0026] An information acquisition module, the information acquisition module is used to obtain image information of contamination on the surface of the insulator and location information of the contamination;

[0027] A grading module, the grading module is used to determine the contamination level of the insulator surface according to the contamination image information;

[0028] A determination module, the determination module is used to determine the cleaning information of the dirt according to the dirt level, wherein the cleaning information includes at least one of the cleaning method, cleaning time and cleaning intensity of the dirt;

[0029] A cleaning module is used to clean the insulator according to the cleaning information and the location information of the contamination.

[0030] According to a third aspect of an embodiment of the present application, a computer device is provided, comprising a memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, the steps of the insulator surface cleaning method described in any one of the first aspects are implemented.

[0031] According to a fourth aspect of an embodiment of the present application, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps of the insulator surface cleaning method described in any one of the first aspects are implemented.

[0032] According to a fifth aspect of the embodiments of the present application, a computer program product is provided, comprising a computer program, which, when executed by a processor, implements the steps of the insulator surface cleaning method described in any one of the first aspects above.

[0033] The embodiments of the present application provide an insulator surface cleaning method, device, equipment, storage medium and program product, which can obtain image information of the dirt on the insulator surface, classify the dirt according to the image information, and further determine the cleaning information of the dirt according to the dirt level on the insulator surface, and can determine the cleaning method, cleaning time and cleaning intensity required to clean the dirt, so as to facilitate accurate cleaning of the dirt according to the cleaning information and the location information of the dirt. It can realize automatic analysis and cleaning of the dirt on the insulator surface, improve the objectivity of the cleaning process, enhance the cleaning effect and cleaning quality of the dirt on the insulator surface, and then shorten the cleaning time, improve the cleaning efficiency, reduce the cleaning cost of the dirt on the insulator surface, further reduce the safety risk of the insulator, and improve the safety. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the drawings required for use in the embodiments of the present application or related technical descriptions will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0035] FIG1 is a schematic flow chart of a method for cleaning the surface of an insulator provided in an embodiment of the present application;

[0036] FIG2 is a schematic structural diagram of an insulator surface cleaning method and device provided in an embodiment of the present application;

[0037] FIG3 is a schematic structural diagram of a computer device provided in an embodiment of the present application;

[0038] FIG4 is a schematic structural diagram of a computer-readable storage medium provided in an embodiment of the present application;

[0039] FIG5 is a schematic structural diagram of a computer program product provided in an embodiment of the present application. DETAILED DESCRIPTION

[0040] In order to facilitate understanding of the present application, the present application will be described more fully below with reference to the relevant drawings. Embodiments of the present application are provided in the drawings. However, the present application can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present application more thorough and comprehensive.

[0041] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application belongs. The terms used herein in the specification of this application are only for the purpose of describing specific embodiments and are not intended to limit this application.

[0042] When used herein, the singular forms "a", "an" and " / the" may also include the plural forms, unless the context clearly indicates otherwise. It should also be understood that the terms "include / comprise" or "have" and the like specify the presence of stated features, wholes, steps, operations, components, parts or combinations thereof, but do not exclude the possibility of the presence or addition of one or more other features, wholes, steps, operations, components, parts or combinations thereof. At the same time, in this specification, the term "and / or" includes any and all combinations of the relevant listed items.

[0043] An insulator is a device that is installed between conductors at different potentials or between conductors and grounded components and can withstand voltage and mechanical stress. It is mainly used in electrical equipment to isolate and support, and can prevent current leakage and short circuit. Insulators are usually made of insulating materials such as ceramics, glass or polymers. Industrial activities, air pollution, etc. will cause dust, dirt, salt, etc. to accumulate on the surface of insulators, reducing their insulation performance. Dirty insulators are prone to leakage, flashover and other problems, affecting the normal operation of the power system and may even cause power outages. Therefore, contamination is a key indicator affecting the out-of-plane insulation performance of composite insulators. In order to ensure the good performance of the insulators and the reliability of the power system, they need to be cleaned and maintained regularly.

[0044] However, in traditional insulator surface cleaning, workers are usually required to make subjective judgments and clean the dirt on the insulator surface based on past experience, and it is difficult to accurately determine the cleaning intensity, cleaning tools, and cleaning time, resulting in poor cleaning effects, low operating efficiency, and long operating cycles, which will further increase cleaning costs and safety risks during the cleaning process.

[0045] Therefore, proposing a method that can automatically detect and clean the contamination on the surface of insulators is an urgent problem to be solved.

[0046] As shown in Figure 1, Figure 1 is a schematic flow chart of a method for cleaning the surface of an insulator provided in an embodiment of the present application. In a first aspect of an embodiment of the present application, a method for cleaning the surface of an insulator is provided, comprising:

[0047] Step S110: Obtain image information of contamination on the surface of the insulator and information on the location of the contamination.

[0048] For example, the image information of the contamination on the surface of the insulator and the location information of the contamination can be obtained by an image acquisition device, such as a drone, etc. The image information can include a three-dimensional image, etc.

[0049] Step S120: determining the contamination level of the insulator surface according to the contamination image information.

[0050] For example, the degree of difficulty in cleaning the dirt can be determined based on the image information of the dirt, and the dirt level can be determined based on the degree of difficulty in cleaning. A higher dirt level means a higher degree of difficulty in cleaning the dirt.

[0051] For example, the BP neural network topology can be used to analyze the filthiness of the dirty image information. The input of the BP neural network is X1, X2, ...X n , the output of the neural network is Y1, Y2, ...Y m , the weight of BP neural network is W ij and W jk Among them, X1, X2, ...X n is the pixel information of the dirty image, including the length, width and dimension of the image, which is a one-dimensional sequence obtained after data processing and conversion, Y1, Y2, ...Y m To characterize the pollution level, the maximum value is taken as the size of the pollution level finally determined.

[0052] Exemplarily, the steps of BP neural network topology include: initializing the network. According to the input and output of the network, determine the number of nodes in the network input layer, the number of nodes in the hidden layer, the number of nodes in the output layer, and the connection weights between the neurons in the network input layer, hidden layer and output layer, and initialize the hidden layer threshold and output layer threshold. It is necessary to find the output of the hidden layer of the network, and its expression is as follows:

[0053]

[0054] In the formula, l represents the number of nodes in the hidden layer, and f represents the activation function of the hidden layer. The output of the network output layer needs to be calculated, and its expression is as follows:

[0055]

[0056] It is necessary to find the prediction error of the network, which is expressed as follows:

[0057]

[0058] According to the prediction error of the network, the weight of the network is appropriately modified as follows:

[0059]

[0060] In the formula, η represents the learning efficiency. The network connection threshold is refreshed according to the prediction error of the network, as shown in the formula:

[0061]

[0062] After the network training is completed, the samples to be tested are input into the network, and the output is the final result of the neural network recognition.

[0063] It should be noted that before training the network, the input sample data should be standardized. The so-called data standardization means converting all data into numbers between -1 and 1. The purpose is to eliminate the order of magnitude differences between sample data and avoid network output errors due to huge differences in data. The formula for normalizing the sample data size is:

[0064]

[0065] In the formula, x represents the value before normalization, and its subscript x min and x max Represent the minimum and maximum values ​​of the data, respectively, and the subscript x n Represents the normalized value. In this network training, normalization is used to train the BP neural network. In the training of both types of BP neural networks, the network weights initialized to random close to 0 are used, the maximum number of training times is adjusted to 2000, the additional momentum factor is adjusted to 0.95, the learning rate is initially set to 0.1, and the error e is adjusted to 0.0001.

[0066] Step S130: Determine the cleaning information of the dirt according to the dirt level, wherein the cleaning information includes at least one of the cleaning method, cleaning time and cleaning intensity of the dirt.

[0067] For example, the cleaning method may include high-pressure water gun cleaning, and the cleaning intensity may include the water pressure and moving speed of the high-pressure water gun, etc. The cleaning method may include brush cleaning, and the cleaning intensity may include the bristle hardness and brushing frequency of the brush, etc. The cleaning method may also include chemical cleaning, and the dirt may be decomposed by detergents or chemical reagents, etc.

[0068] Step S140: Clean the insulator according to the cleaning information and the location information of the dirt.

[0069] For example, a high-pressure water gun, a brush, a cleaning agent, a drying device, etc. may be clamped by a robotic arm, etc., and dirt on the surface of the insulator may be cleaned according to a cleaning process corresponding to the cleaning information.

[0070] The embodiment of the present application provides a method for cleaning the surface of an insulator, which obtains image information of dirt on the surface of the insulator, and grades the dirt according to the image information. It can further determine the cleaning information of the dirt according to the dirt level on the surface of the insulator, and can determine the cleaning method, cleaning time and cleaning intensity required to clean the dirt, so that it is convenient to accurately clean the dirt according to the cleaning information and the location information of the dirt. It can realize automatic analysis and cleaning of dirt on the surface of the insulator, improve the objectivity of the cleaning process, enhance the cleaning effect and cleaning quality of dirt on the surface of the insulator, and then shorten the cleaning time, improve the cleaning efficiency, reduce the cleaning cost of dirt on the surface of the insulator, further reduce the safety risk of the insulator, and improve safety.

[0071] In some feasible implementations, determining the contamination level of the insulator surface based on the contamination image information includes: determining contamination type information and contamination area information based on the contamination image information; determining the contamination level of the insulator surface based on at least one of the contamination type information and the contamination area information.

[0072] For example, the type information of the contaminants may include solid contaminants, liquid contaminants, water-soluble contaminants, and water-insoluble contaminants.

[0073] The insulator surface cleaning method provided in the embodiment of the present application can refine the classification basis of the pollution level, increase the number of pollution level classifications, and improve the pollution level's ability to summarize pollution by determining the pollution level according to the pollution type information and area information. It can further facilitate the determination of cleaning information through the pollution level, improve the accuracy and effectiveness of the cleaning information, thereby realizing automatic analysis and cleaning of the insulator surface pollution, improving the objectivity of the cleaning process, and enhancing the cleaning effect and cleaning quality of the insulator surface pollution, thereby shortening the cleaning time, improving the cleaning efficiency, and reducing the cleaning cost of the insulator surface pollution, further reducing the safety risks of the insulator, and improving safety.

[0074] In some feasible embodiments, the contamination level of the insulator surface is determined based on at least one of the contamination type information and the contamination area information, including: determining a first contamination level of the insulator surface based on the contamination type information; determining a second contamination level of the insulator surface based on the contamination area information, wherein the contamination level includes a first contamination level and a second contamination level.

[0075] For example, the larger the area of ​​the dirt is, the higher the second dirt level is. The second dirt level can also be determined according to the thickness of the dirt. The thicker the dirt is, the higher the second dirt level is.

[0076] The insulator surface cleaning method provided in the embodiment of the present application can further improve the objectivity of the classification of the pollution levels by dividing the pollution levels into a first pollution level and a second pollution level, avoid the difficulty in uniformly classifying pollution of different areas and different types, and reduce the difficulty of pollution classification, thereby reducing the difficulty of determining cleaning information according to the pollution level, improving the accuracy and effectiveness of the cleaning information, realizing automatic analysis and cleaning of the pollution on the insulator surface, improving the objectivity of the cleaning process, and enhancing the cleaning effect and cleaning quality of the pollution on the insulator surface, thereby shortening the cleaning time, improving the cleaning efficiency, reducing the cleaning cost of the pollution on the insulator surface, further reducing the safety risk of the insulator, and improving safety.

[0077] In some feasible implementations, determining the cleaning information of the dirt according to the dirt level includes: determining the cleaning method of the dirt according to the first dirt level; and determining the cleaning time of the dirt according to the second dirt level.

[0078] Exemplarily, the cleaning intensity of the contamination may be determined according to at least one of the first contamination level and the second contamination level. For example, the adhesion between the contamination and the insulator surface may be determined according to the contamination type information, and the cleaning intensity may be further determined.

[0079] The insulator surface cleaning method provided in the embodiment of the present application can further reduce the difficulty of determining cleaning information according to the pollution level, improve the accuracy and effectiveness of the cleaning information, realize automatic analysis and cleaning of the pollution on the insulator surface, improve the objectivity of the cleaning process, enhance the cleaning effect and cleaning quality of the pollution on the insulator surface, thereby shortening the cleaning time, improving the cleaning efficiency, reducing the cleaning cost of the pollution on the insulator surface, further reducing the safety risk of the insulator, and improving the safety.

[0080] In some feasible implementations, determining a first contamination level on the insulator surface based on contamination type information includes: when the contamination type is solid contamination, determining the first contamination level on the insulator surface as a first level; when the contamination type is liquid contamination, determining the first contamination level on the insulator surface as a second level based on the composition of the liquid contamination, wherein the second level includes multiple sub-levels, and liquid contamination of different compositions corresponds to different sub-levels.

[0081] Exemplarily, the second level may include multiple sub-levels, such as an oil sub-level, a glue sub-level, and the like.

[0082] The insulator surface cleaning method provided in the embodiment of the present application, by dividing the dirt into two categories, solid dirt and liquid dirt, and further dividing the liquid dirt into multiple sub-levels according to the dirt components, can facilitate the determination of the cleaning method of the dirt according to the type of dirt, improve the effectiveness of the cleaning method, further reduce the difficulty of determining the cleaning information according to the dirt level, realize automatic analysis and cleaning of the insulator surface dirt, improve the objectivity of the cleaning process, enhance the cleaning effect and cleaning quality of the insulator surface dirt, thereby shortening the cleaning time, improving the cleaning efficiency, reducing the cleaning cost of the insulator surface dirt, further reducing the safety risk of the insulator, and improving safety.

[0083] In some feasible implementations, based on the pollution level, determining the cleaning information of the pollution, including: when the first pollution level is the first level, determining the cleaning method of the pollution to be physical cleaning, physical cleaning includes spraying water mist on the pollution to remove the pollution; when the first pollution level is the second level, determining the cleaning method of the pollution to be chemical cleaning, chemical cleaning includes spraying liquid on the pollution to decompose the pollution.

[0084] Exemplarily, physical cleaning may also include brush cleaning, and chemical cleaning may include decomposing dirt by spraying a detergent on oily dirt, or spraying a debonding agent on adhesive dirt.

[0085] The insulator surface cleaning method provided in the embodiment of the present application can improve the effectiveness of the cleaning method by determining the cleaning method for contamination according to the first contamination level, can further reduce the difficulty of determining cleaning information according to the contamination level, realize automatic analysis and cleaning of contamination on the insulator surface, improve the objectivity of the cleaning process, enhance the cleaning effect and cleaning quality of contamination on the insulator surface, thereby shortening the cleaning time, improving the cleaning efficiency, reducing the cleaning cost of contamination on the insulator surface, further reducing the safety risk of the insulator, and improving safety.

[0086] Based on the same inventive concept, the embodiment of the present application also provides an insulator surface cleaning device for implementing the above-mentioned insulator surface cleaning method. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above-mentioned method, so the specific limitations in one or more embodiments of the insulator surface cleaning device provided below can refer to the limitations of the insulator surface cleaning method above, and will not be repeated here.

[0087] FIG2 is a schematic structural diagram of an insulator surface cleaning device provided in an embodiment of the present application. As shown in FIG2, the second aspect of the embodiment of the present application provides an insulator surface cleaning device, including: an information acquisition module 100, a grading module 200, a determination module 300 and a cleaning module 400. The information acquisition module 100 is used to obtain the image information of the dirt on the surface of the insulator and the location information of the dirt; the grading module 200 is used to determine the dirt level of the insulator surface according to the dirt image information; the determination module 300 is used to determine the cleaning information of the dirt according to the dirt level, wherein the cleaning information includes at least one of the cleaning method, cleaning time and cleaning intensity of the dirt; the cleaning module 400 is used to clean the insulator according to the cleaning information, the image information of the dirt and the location information of the dirt.

[0088] The insulator surface cleaning device provided in the embodiment of the present application can obtain the image information of the dirt on the surface of the insulator, classify the dirt according to the image information, and further determine the cleaning information of the dirt according to the dirt level on the surface of the insulator, and can determine the cleaning method, cleaning time and cleaning intensity required to clean the dirt, so as to facilitate accurate cleaning of the dirt according to the cleaning information and the location information of the dirt. It can realize automatic analysis and cleaning of the dirt on the surface of the insulator, improve the objectivity of the cleaning process, enhance the cleaning effect and cleaning quality of the dirt on the surface of the insulator, and then shorten the cleaning time, improve the cleaning efficiency, reduce the cleaning cost of the dirt on the surface of the insulator, further reduce the safety risk of the insulator, and improve the safety.

[0089] Each module in the above-mentioned insulator surface cleaning device can be implemented in whole or in part by software, hardware and a combination thereof. Each of the above-mentioned modules can be embedded in or independent of a processor in a computer device in the form of hardware, or can be stored in a memory in a computer device in the form of software, so that the processor can call and execute the operations corresponding to each of the above modules.

[0090] FIG3 is a schematic structural diagram of a computer device provided in an embodiment of the present application. As shown in FIG3, in a third aspect of an embodiment of the present application, a computer device is provided, which may be a server. The computer device includes a processor, a memory, an input / output interface (Input / Output, referred to as I / O) and a communication interface. Among them, the processor, the memory and the input / output interface are connected via a system bus, and the communication interface, the display unit and the input device are connected to the system bus via the input / output interface. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be implemented through WIFI, a mobile cellular network, a near field communication (Near Field Communication, NFC) or other technologies. When the computer program is executed by the processor, a method for cleaning the surface of an insulator is implemented. The display unit of the computer device is used to form a visually visible picture, and can be a display screen, a projection device, or a virtual reality imaging device. The display screen can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer device can be a touch layer covered on the display screen, or a key, trackball, or touchpad provided on the computer device housing, or an external keyboard, touchpad, or mouse, etc.

[0091] Those skilled in the art will understand that the structure shown in FIG. 3 is merely a block diagram of a partial structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than shown in the figure, or combine certain components, or have a different arrangement of components.

[0092] Fig. 4 is a schematic structural diagram of a computer-readable storage medium provided in an embodiment of the present application. As shown in Fig. 4, in a fourth aspect of an embodiment of the present application, a computer-readable storage medium is provided, on which a computer program is stored, and when the computer program is executed by a processor, the steps of any one of the insulator surface cleaning methods in the first aspect are implemented.

[0093] Fig. 5 is a schematic structural diagram of a computer program product provided in an embodiment of the present application. As shown in Fig. 5, in a fifth aspect of an embodiment of the present application, a computer program product is provided, comprising a computer program, which, when executed by a processor, implements the steps of any one of the insulator surface cleaning methods in the first aspect above.

[0094] A person of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment method can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, an artificial intelligence (AI) processor, etc., but are not limited to this.

[0095] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0096] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A method for cleaning the surface of an insulator, characterized in that: include: Obtaining image information of contamination on the surface of the insulator and location information of the contamination; Determining the contamination level of the surface of the insulator according to the contamination image information; Determining cleaning information of the contamination according to the contamination level, wherein the cleaning information includes at least one of a cleaning method, a cleaning duration, and a cleaning intensity of the contamination; The insulator is cleaned according to the cleaning information and the location information of the contamination.

2. The insulator surface cleaning method according to claim 1, characterized in that: Determining the contamination level of the surface of the insulator according to the contaminated image information includes: Determine the type information of the dirt and the area information of the dirt according to the image information of the dirt; The contamination level of the insulator surface is determined according to at least one of the contamination type information and the contamination area information.

3. The insulator surface cleaning method according to claim 2, characterized in that: The step of determining the contamination level of the surface of the insulator according to at least one of the contamination type information and the contamination area information comprises: Determining a first contamination level on the surface of the insulator according to the contamination type information; A second pollution level on the surface of the insulator is determined according to the pollution area information, wherein the pollution level includes the first pollution level and the second pollution level.

4. The insulator surface cleaning method according to claim 3, characterized in that: The step of determining the cleaning information of the contamination according to the contamination level includes: Determining a cleaning method for the dirt according to the first dirt level; The cleaning time of the dirt is determined according to the second dirt level.

5. The insulator surface cleaning method according to claim 3, characterized in that: Determining the first contamination level of the surface of the insulator according to the contamination type information includes: In a case where the type of the contamination is solid contamination, determining the first contamination level on the surface of the insulator to be a first level; In the case where the type of contamination is liquid contamination, the first contamination level of the insulator surface is determined to be a second level according to the composition of the liquid contamination, wherein the second level includes a plurality of sub-levels, and liquid contamination of different compositions corresponds to different sub-levels.

6. The insulator surface cleaning method according to claim 5, characterized in that: The step of determining the cleaning information of the contamination according to the contamination level includes: In the case where the first contamination level is the first level, determining that the cleaning method of the contamination is physical cleaning, wherein the physical cleaning includes removing the contamination by spraying water mist on the contamination; In the case where the first contamination level is the second level, it is determined that the cleaning method of the contamination is chemical cleaning, and the chemical cleaning includes decomposing the contamination by spraying liquid to the contamination.

7. An insulator surface cleaning device, characterized in that: include: An information acquisition module, the information acquisition module is used to obtain image information of contamination on the surface of the insulator and location information of the contamination; A grading module, the grading module is used to determine the contamination level of the insulator surface according to the contamination image information; A determination module, the determination module is used to determine the cleaning information of the dirt according to the dirt level, wherein the cleaning information includes at least one of the cleaning method, cleaning time and cleaning intensity of the dirt; A cleaning module is used to clean the insulator according to the cleaning information and the location information of the contamination.

8. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the insulator surface cleaning method according to any one of claims 1 to 6 are implemented.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the insulator surface cleaning method according to any one of claims 1 to 6 are implemented.

10. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the insulator surface cleaning method according to any one of claims 1 to 6 are implemented.

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