Charging pile test platform and detection method

Abstract

The invention provides a charging pile test platform and a detection method. The charging pile test platform comprises an ARM + MCU integrated chip, a load interface, a high-voltage source, a charging gun interface, a display panel, a 32-pin temperature sampling wiring terminal and a power converter.

Description

Technical Field

[0001] The present invention relates to the field of new energy, and in particular to a charging pile test platform and a detection method. Background Art

[0002] With the popularization of power electronics technology and electric vehicles, the demand for DC charging piles is increasing. At present, the power of DC charging piles is getting higher and higher, which brings better charging experience and faster charging rate, but it is also accompanied by the problems of larger charging piles, more complex charging control, and more cumbersome production and maintenance. Especially under the increasingly complex control logic, the complexity of production wiring is also increasing. In this case, the production error rate is getting higher and higher, and the personnel cost and time cost of quality inspection are increasing, which depends on the quality inspectors to check whether the cables are connected incorrectly one by one. Therefore, the existing charging pile test reliability is low and the test cost is high. Summary of the invention

[0003] The embodiments of the present invention provide a charging pile test platform and a detection method, which can effectively improve the reliability of charging pile testing and reduce testing costs.

[0004] In a first aspect, an embodiment of the present invention provides a charging pile test platform, which includes: an ARM+MCU integrated chip, a load interface, a high voltage source, a charging gun interface, a display panel, a 32-pin temperature sampling terminal, and a power converter; wherein,

[0005] The ARM+MCU integrated chip includes: the first RS485 interface, 16-channel DI+DO interface, RS485+CAN interface, LVDS interface, second RS485 interface, indicator light interface, 12V input power interface, 16-channel temperature sampling interface, CAN interface and multiple sampling interfaces; among them,

[0006] The LVDS interface, the second RS485 interface, and the indicator light interface of the ARM+MCU integrated chip are connected to the display panel;

[0007] The 12V input power interface of the ARM+MCU integrated chip is connected to the external power supply, the 16-channel temperature sampling interface is connected to the 32-pin temperature sampling terminal, and the CAN interface is connected to the charging gun interface and the display panel;

[0008] The A+ / A line of the charging gun interface connects the first sampling interface of the multiple sampling interfaces and the display panel, the CC1 / CC2 / PE line of the charging gun interface connects the second sampling interface of the multiple sampling interfaces and the display panel, the first load interface of the charging gun interface is connected to FU1 and then connected to the load interface through the first switch K1, and the second load interface of the charging gun interface is connected to IF1 and then connected to the load interface through the second switch K2;

[0009] The RS485+CAN interface of the ARM+MCU integrated chip is connected to the RS485+CAN interface of the load interface;

[0010] The high voltage source is connected to the first RS485 interface of the ARM+MCU integrated chip and the external power supply, and the 16-channel DI+DO interface of the ARM+MCU integrated chip is connected to the first switch K1, the second switch K2, the third switch K3, and the fourth switch K4;

[0011] The first load interface of the charging gun interface is also connected to the high voltage source through the third switch K3 , and the first load interface of the charging gun interface is also connected to the high voltage source through the fourth switch K4 .

[0012] In a second aspect, a detection method of the charging pile test platform of the first aspect is provided, the method comprising the following steps:

[0013] When entering the test, set the TCU / CCU to enter the support module and set the TCU / CCU time;

[0014] The ARM+MCU integrated chip runs the charging pile self-test program. If the charging pile self-test fails, the charging pile self-test failure is output. If the charging pile self-test is successful, the CUU is set to enter the self-test mode. If the self-test is successful, perform the following steps. If the self-test fails, the CUU self-test fault is output and the test is completed. If the self-test is successful, enter the auxiliary function test. If the test fails, the test is completed. If the test is successful, perform the electronic lock test. If the test fails, the electronic lock fault is output and the test is completed. If the test is successful, perform the K1 / K2 test. If the test fails, the K1 / K2 fault is output and the test is completed. If the test is successful, enter the auxiliary source output test. If the test fails, the bus control and feedback fault is output and the test is completed. If the test is successful, enter the bus control and feedback test. If the test fails, the bus control and feedback fault is output and the test is completed. If the test is successful, confirm that the CUU test is completed and output the CUU test success.

[0015] In a third aspect, a computer-readable storage medium is provided, wherein a computer program is stored in the computer-readable storage medium, and when the computer-readable storage medium is run on a control system, the method steps provided in the second aspect are executed.

[0016] Implementing the embodiments of the present invention has the following beneficial effects:

[0017] The technical solution of the present application can promptly and quickly determine whether the entire pile production is qualified by controlling the logic and feedback within the pile, controlling the load, and sampling within the test platform, and give a judgment result. If it is unqualified, the specific unqualified points are displayed to facilitate timely rectification, which can effectively improve the efficiency of quality inspection, and quality inspection test items will not be missed, etc. This can improve the reliability of detection, and automatic detection can reduce manual participation and reduce labor costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings in the following description are some embodiments of the present invention. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without paying creative work.

[0019] Figure 1 It is a structural schematic diagram of an energy storage system provided by this application;

[0020] Figure 2 A schematic diagram of the structure of a charging pile test platform provided in this application;

[0021] Figure 3 It is a flow chart of a detection method of a charging pile test platform provided in Example 2 of the present application. DETAILED DESCRIPTION

[0022] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0023] The terms "first", "second", "third" and "fourth" etc. in the specification and claims of the present invention and the drawings are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units that are not listed, or may optionally include other steps or units that are inherent to these processes, methods, products or devices.

[0024] Reference to "embodiments" herein means that a particular feature, result, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present invention. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0025] At present, the generation of new energy generally relies on photovoltaics, wind power, and hydropower, while wind and solar energy generally have problems of strong intermittency and volatility, which will cause instability in the power grid, insufficient electricity during peak hours, and too much electricity during valley hours. Unstable voltage will also cause damage to electricity. Therefore, insufficient electricity demand or insufficient grid acceptance capacity may cause the problem of "abandoning wind and light". To solve these problems, we must rely on energy storage. That is, converting electrical energy into other forms of energy through physical or chemical means and storing it, and converting energy into electrical energy and releasing it when needed. In simple terms, energy storage is similar to a large "power bank". When photovoltaic and wind energy are sufficient, electrical energy is stored and the stored electricity is released when needed.

[0026] Taking electrochemical energy storage as an example, this solution provides an energy storage device, which has a group of chemical batteries in it. The chemical elements in the batteries are mainly used as energy storage media. The charging and discharging process is accompanied by chemical reactions or changes in the energy storage media. Simply put, the electricity generated by wind and solar energy is stored in chemical batteries. When the use of external electricity reaches its peak, the stored electricity is released for use, or transferred to places where electricity is scarce for use.

[0027] See also Figure 1 , Figure 1 This is a schematic diagram of the structure of the energy storage system 400 provided in this application, and this application Figure 1 The embodiment is described by taking the shared energy storage scenario on the power generation / distribution side as an example, and the energy storage device 100 of the present application is not limited to the energy storage scenario on the power generation / distribution side.

[0028] The present application provides an energy storage system 400, which includes: a high-voltage cable 410, a first electric energy conversion device 420, a second electric energy conversion device 430 and an energy storage device 100 provided in the present application. In the case of power generation, the first electric energy conversion device 420 and the second electric energy conversion device 430 are used to convert other forms of energy into electric energy, connected to the high-voltage cable 410 and supplied to the power distribution network for use. When the power load is low and the first electric energy conversion device 420 and the second electric energy conversion device 430 generate excess power, the excess power is stored in the energy storage device 100, thereby reducing the wind and solar power abandonment rates and improving the problem of new energy power generation and consumption. When the power load is high, the power grid issues an instruction to transmit the power stored in the energy storage device 100 in conjunction with the high-voltage cable 410 in a grid-connected mode to the power consumption side, thereby providing peak shaving, frequency regulation, standby and other services for the operation of the power grid, giving full play to the peak shaving role of the power grid, promoting peak shaving and valley filling of the power grid, and alleviating the power supply pressure of the power grid. The first power conversion device 420 and the second power conversion device 430 can convert at least one of solar energy, light energy, wind energy, thermal energy, tidal energy, biomass energy, and mechanical energy into electrical energy.

[0029] See also Figure 2, Figure 2 A structural diagram of a charging pile test platform is provided for this application, such as Figure 2 As shown, the charging pile test platform includes: ARM+MCU integrated chip, load interface, high voltage source, charging gun interface, display panel, 32pin (pin) temperature sampling terminal, AC-DC / 50W 220-12V power converter;

[0030] Among them, the ARM+MCU integrated chip includes: the first RS485 interface, 16-channel DI+DO interface, RS485+CAN interface, computer interface (D89NET), LVDS interface, second RS485 interface, indicator light interface, 12V input power interface, 16-channel temperature sampling interface, CAN interface and multiple sampling interfaces; among them,

[0031] The computer interface, LVDS interface, second RS485 interface and indicator light interface of the ARM+MCU integrated chip are connected to the display panel;

[0032] The 12V input power interface of the ARM+MCU integrated chip is connected to the external power supply, the 16-channel temperature sampling interface is connected to the 32-pin temperature sampling terminal, and the CAN interface is connected to the charging gun interface and the display panel;

[0033] The A+ / A line of the charging gun interface connects the first sampling interface of the multiple sampling interfaces and the display panel, the CC1 / CC2 / PE line of the charging gun interface connects the second sampling interface of the multiple sampling interfaces and the display panel, the first load interface of the charging gun interface is connected to FU1 and then connected to the load interface through the first switch K1, and the second load interface of the charging gun interface is connected to IF1 and then connected to the load interface through the second switch K2;

[0034] The RS485+CAN interface of the ARM+MCU integrated chip is connected to the RS485+CAN interface of the load interface;

[0035] The high voltage source is connected to the first RS485 interface of the ARM+MCU integrated chip and the external power supply, and the 16-channel DI+DO interface of the ARM+MCU integrated chip is connected to the first switch K1, the second switch K2, the third switch K3, and the fourth switch K4;

[0036] The first load interface of the charging gun interface is also connected to the high voltage source through the third switch K3 , and the first load interface of the charging gun interface is also connected to the high voltage source through the fourth switch K4 .

[0037] The technical solution provided in the present application can promptly and quickly determine whether the entire pile production is qualified by controlling the logic and feedback within the pile, controlling the load, and sampling within the test platform, and give a judgment result. If it is unqualified, the specific unqualified points will be displayed to facilitate timely rectification. It can effectively improve the efficiency of quality inspection, and quality inspection test items will not be missed, etc. This can improve the reliability of detection, and automatic detection can reduce manual participation and reduce labor costs.

[0038] For example, during testing, the ARM+MCU integrated chip is used to control the closing of the first switch K1 and the second switch K2, run the self-test program to generate the self-test results of the control logic and the communication circuit in the charging pile, and display the self-test results through the display panel.

[0039] For example, during testing, the ARM+MCU integrated chip is used to control the closing of the third switch K3 and the fourth switch K4, run the high-voltage self-test program to generate a self-test result of the power circuit in the charging pile, and display the power circuit through the display panel.

[0040] For example, the ARM+MCU integrated chip is also used to sample the output voltage, output current, auxiliary source output, and guide current in the charging pile, generate detection results based on the sampling data, and display the detection results through the display panel.

[0041] The present application also provides a method for detecting the above charging pile test platform, the method comprising the following steps:

[0042] When entering the test, set the TCU / CCU to enter the support module and set the TCU / CCU time;

[0043] The ARM+MCU integrated chip runs the charging pile self-test program. If the charging pile self-test fails, the charging pile self-test failure is output. If the charging pile self-test is successful, the CUU is set to enter the self-test mode. If the self-test is successful, perform the following steps. If the self-test fails, the CUU self-test fault is output and the test is completed. If the self-test is successful, enter the auxiliary function test. If the test fails, the test is completed. If the test is successful, perform the electronic lock test. If the test fails, the electronic lock fault is output and the test is completed. If the test is successful, perform the K1 / K2 test. If the test fails, the K1 / K2 fault is output and the test is completed. If the test is successful, enter the auxiliary source output test. If the test fails, the bus control and feedback fault is output and the test is completed. If the test is successful, enter the bus control and feedback test. If the test fails, the bus control and feedback fault is output and the test is completed. If the test is successful, confirm that the CUU test is completed and output the CUU test success.

[0044] For example,

[0045] The ARM+MCU integrated chip performs a high-voltage sampling test. If the test fails, a high-voltage sampling fault is output and the detection ends. If the test succeeds, an insulation test is performed. If the test fails, an insulation fault is output and the detection ends. If the test succeeds, the detection ends and the detection success is output.

[0046] The above scheme executes the corresponding test items in the order of the program, so that no items are missed, and the above self-check is completed based on program implementation without manual participation, thereby improving reliability and reducing labor costs.

[0047] Embodiment 1

[0048] The embodiment of the present application discloses a charging pile test platform, which adopts an ARM+MCU solution. Serial port or CAN, or serial port + CAN communication is adopted between ARM and MCU. ARM and MCU are centrally placed on a PCB board, and the PCB board is powered by 12V.

[0049] In addition to the smallest operating unit of ARM+MCU, the PCB board also includes 3 RS485, 1 RS232, 2 CAN, 16 DI+DO, 1 network port, 1 LVDS interface, 16 temperature sampling, 1 high voltage (0-1000Vdc) sampling, 1 current (0-75mV) sampling, 1 auxiliary source (0-30Vdc), 1 guide (0-15Vdc) sampling and other circuits.

[0050] The PCB board is placed in a portable shell, inside which there are 220Vac ship-type power input terminals and 220Vac to 12Vdc power module (used to power the PCB board), 1 national standard charging dock, 1 high-voltage DC fuse, 1 300A&75mV shunt, 2 pairs of high-voltage DC contactors K1-K4, 1 high-voltage power supply (input 220Vac, output 0-1000Vdc), 1 display panel (the display panel includes a touch screen (the size of the touch screen can be adjusted according to the product size, preferably 7 inches or 10 inches), 1*DB9 terminal block, 1*NET network port, 2 indicator lights, CAN line lead-out terminals of the gun mount, high-voltage lead-out terminals, guide terminals, auxiliary source terminals, RS485 terminals), a load interface, and 16 external temperature sampling interfaces.

[0051] On the board, 1 RS485 is connected to the high-voltage source, 1 RS485+1 CAN is reserved for external loads, and the A / B line of 1 RS485 is connected to the reserved 2PIN terminal on the panel. 1 CAN is connected to the charging gun holder. 1 RS232 is connected to the reserved DB9 terminal on the display panel. 1 NET circuit is connected to the reserved NET terminal on the panel. 16 temperature sampling reserved 32pin terminals are connected to the shell. The 2 busbars DC± of the charging gun interface are connected to the load interface through fuses, shunts, and a pair of high-voltage DC contactors. The high-voltage sampling circuit is connected to the charging gun DC±. The current sampling circuit is connected to both ends of the shunt. The auxiliary source sampling circuit is connected to the A+ / A- lines of the charging gun holder. The guide sampling circuit is connected to the CC and PE lines of the charging gun holder.

[0052] The specific implementation of the above test platform may include:

[0053] Connect the assembled charging pile AC input to the external power supply, and the gun line to the charging gun holder of the test platform. Connect the AC220 input power interface to the external 220Vac power supply. Connect the external load to the load interface of the test platform, and the external load power supply interface to the external power interface.

[0054] Connect the 16-channel temperature sampling interface to 16 external thermistors as needed and connect them to the inside of the charging pile. Close switches K1 and K2, and test the charging pile test platform with power on. The touch screen of the test platform controls the internal controller of the charging pile to run the self-test program. The control and feedback inside the pile can detect whether the control logic inside the pile is correct. The self-test program can be used to determine whether the communication circuit is correct. The power circuit can be determined by starting the control module and controlling the high-voltage DC contactors inside the pile and the test platform. The sampling of the test platform can determine whether the output voltage and current of the module in the pile are correct, whether the auxiliary source output is correct, and whether the pilot circuit is correct. The temperature sampling can be used to determine whether the power devices and copper busbars in the pile are reliable and the screws are tightened. The above sampling values ​​and test items will be displayed in real time on the display screen, and it will clearly show whether the test items are qualified.

[0055] Embodiment 2

[0056] Embodiment 2 of the present application provides a detection method for a charging pile test platform. Figure 3 A flow chart of a detection method of a charging pile test platform provided for implementation 2 of this application is as follows: Figure 3 As shown, the following steps are included:

[0057] Step S301, start setting the test platform TCU / CCU to enter the support mode and set the TCU / CCU time;

[0058] Step S302, charging pile self-test; if the self-test succeeds, proceed to the following steps; if the self-test fails, output self-test failure and the test ends;

[0059] Step S303, setting the CUU to enter the self-test mode; if the self-test succeeds, proceed to the following steps; if the self-test fails, outputting a CUU self-test failure, and the test ends;

[0060] Step S304: Auxiliary function test. If the test succeeds, proceed to the following steps. If the test fails, the test ends.

[0061] The above auxiliary functions include but are not limited to: gun temperature detection, system temperature detection, emergency stop detection, access control detection, lightning arrester detection, smoke detection, anti-dumping test, and fan speed control test.

[0062] Step S305, electronic lock test, if the test is successful, proceed to the following steps, if the test fails, output electronic lock failure, and the test ends;

[0063] Step S306, K1 / K2 test, if the test is successful, proceed to the following steps, if the test fails, output K1 / K2 fault, and the test ends;

[0064] Step S307, auxiliary source output test, if the test is successful, proceed to the following steps, if the test fails, the auxiliary source output failure is output, and the test ends;

[0065] Step S308: Bus coupling control and feedback test. If the test succeeds, proceed to the following steps. If the test fails, output bus coupling control and feedback fault, and the test ends.

[0066] Step S309, setting CUU to exit self-test mode;

[0067] Step S310, high voltage sampling test, if the test is successful, proceed to the following steps, if the test fails, output high voltage sampling fault, and the test ends;

[0068] Step S311, insulation test, if the test is successful, the test is completed and the test is successful. If the test fails, the insulation fault is output and the test is completed.

[0069] The technical solution provided in the present application can promptly and quickly determine whether the entire pile production is qualified by controlling the logic and feedback within the pile, controlling the load, and sampling within the test platform, and give a judgment result. If it is unqualified, the specific unqualified points will be displayed to facilitate timely rectification. It can effectively improve the efficiency of quality inspection, and quality inspection test items will not be missed, etc. This can improve the reliability of detection, and automatic detection can reduce manual participation and reduce labor costs.

[0070] The present application also provides a computer-readable storage medium in which a computer program is stored. When the computer-readable storage medium is run on a control system, the computer program executes the following steps: Figure 3 The method steps are shown.

[0071] It should be noted that, for the above-mentioned method embodiments, for the sake of simplicity, they are all described as a series of action combinations, but those skilled in the art should know that the present invention is not limited by the described order of actions, because according to the present invention, certain steps can be received in other orders or performed simultaneously. Secondly, those skilled in the art should also know that the embodiments described in the specification are all optional embodiments, and the actions and modules involved are not necessarily required by the present invention.

[0072] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0073] In the several embodiments provided in the present application, it should be understood that the disclosed device can be implemented in other ways. For example, the device embodiments described above are only schematic, such as the division of the units, which is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, and the indirect coupling or communication connection of the device or unit can be electrical or other forms.

[0074] A person skilled in the art can understand that all or part of the steps in the various methods of the above embodiments can be completed by instructing related hardware through a program, and the program can be stored in a computer-readable memory, and the memory can include: a flash drive, a read-only memory (English: Read-Only Memory, abbreviated as: ROM), a random access memory (English: Random Access Memory, abbreviated as: RAM), a magnetic disk or an optical disk, etc.

[0075] The embodiments of the present invention are described in detail above. Specific examples are used herein to illustrate the principles and implementation methods of the present invention. The description of the above embodiments is only used to help understand the method of the present invention and its core idea. At the same time, for those skilled in the art, according to the idea of ​​the present invention, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as limiting the present invention.

Claims

1. A charging pile test platform, characterized in that: The charging pile test platform includes: ARM+MCU integrated chip, load interface, high voltage source, charging gun interface, display panel, 32-pin temperature sampling terminal, power converter; The ARM+MCU integrated chip includes: the first RS485 interface, 16-channel DI+DO interface, RS485+CAN interface, LVDS interface, second RS485 interface, indicator light interface, 12V input power interface, 16-channel temperature sampling interface, CAN interface and multiple sampling interfaces; among them, The LVDS interface, the second RS485 interface, and the indicator light interface of the ARM+MCU integrated chip are connected to the display panel; The 12V input power interface of the ARM+MCU integrated chip is connected to the external power supply, the 16-channel temperature sampling interface is connected to the 32-pin temperature sampling terminal, and the CAN interface is connected to the charging gun interface and the display panel; The A+ / A line of the charging gun interface connects the first sampling interface of the multiple sampling interfaces and the display panel, the CC1 / CC2 / PE line of the charging gun interface connects the second sampling interface of the multiple sampling interfaces and the display panel, the first load interface of the charging gun interface is connected to FU1 and then connected to the load interface through the first switch K1, and the second load interface of the charging gun interface is connected to IF1 and then connected to the load interface through the second switch K2; The RS485+CAN interface of the ARM+MCU integrated chip is connected to the RS485+CAN interface of the load interface; The high voltage source is connected to the first RS485 interface of the ARM+MCU integrated chip and the external power supply, and the 16-channel DI+DO interface of the ARM+MCU integrated chip is connected to the first switch K1, the second switch K2, the third switch K3, and the fourth switch K4; The first load interface of the charging gun interface is also connected to the high voltage source through the third switch K3 , and the first load interface of the charging gun interface is also connected to the high voltage source through the fourth switch K4 .

2. The charging pile test platform according to claim 1, characterized in that: The ARM+MCU integrated chip also includes: a computer interface, and the computer interface is connected to the display panel.

3. The charging pile test platform according to claim 1, characterized in that: During the test, the ARM+MCU integrated chip is used to control the closing of the first switch K1 and the second switch K2, run the self-test program to generate the self-test results of the control logic and the communication circuit in the charging pile, and display the self-test results through the display panel.

4. The charging pile test platform according to claim 1, characterized in that: During the test, the ARM+MCU integrated chip is used to control the closing of the third switch K3 and the fourth switch K4, run the high-voltage self-test program to generate the self-test result of the power circuit in the charging pile, and display the power circuit through the display panel.

5. The charging pile test platform according to claim 3, characterized in that: The ARM+MCU integrated chip is also used to sample the output voltage, output current, auxiliary source output, and guide current in the charging pile, generate detection results based on the sampling data, and display the detection results through the display panel.

6. A detection method for a charging pile test platform as claimed in claim 1, characterized in that: The method comprises the following steps: When entering the test, set the TCU / CCU to enter the support module and set the TCU / CCU time; The ARM+MCU integrated chip runs the charging pile self-test program. If the charging pile self-test fails, the charging pile self-test failure is output. If the charging pile self-test is successful, the CUU is set to enter the self-test mode. If the self-test is successful, perform the following steps. If the self-test fails, the CUU self-test fault is output and the test is completed. If the self-test is successful, enter the auxiliary function test. If the test fails, the test is completed. If the test is successful, perform the electronic lock test. If the test fails, the electronic lock fault is output and the test is completed. If the test is successful, perform the K1 / K2 test. If the test fails, the K1 / K2 fault is output and the test is completed. If the test is successful, enter the auxiliary source output test. If the test fails, the bus control and feedback fault is output and the test is completed. If the test is successful, enter the bus control and feedback test. If the test fails, the bus control and feedback fault is output and the test is completed. If the test is successful, confirm that the CUU test is completed and output the CUU test success.

7. The method according to claim 6, characterized in that The method further comprises: The ARM+MCU integrated chip performs a high-voltage sampling test. If the test fails, a high-voltage sampling fault is output and the detection ends. If the test succeeds, an insulation test is performed. If the test fails, an insulation fault is output and the detection ends. If the test succeeds, the detection ends and the detection success is output.

8. A computer-readable storage medium, characterized in that: The computer readable storage medium stores a computer program, which, when executed on a control system, executes the method steps as claimed in any one of claims 6 to 7.

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