Ship electronic information system reliability quantitative analysis method, device and equipment based on AADL-GO method and medium

Abstract

The invention discloses a ship electronic information system reliability quantitative analysis method, device and equipment based on an AADL-GO method and a medium, and relates to the field of novel ship electronic information systems.The method comprises the steps that an AADL reliability model of a ship electronic information system is built based on the AADL method; the AADL reliability model is converted into a GO graph model; determining the state probability of the ship electronic information system based on the GO graph model; and correcting the state probability of the unit with the common cause failure to obtain the success probability of the ship electronic information system, and completing quantitative analysis of the reliability of the ship electronic information system. According to the method, the reliability of the electronic information system of the ship can be quantitatively analyzed, and a quick and effective way is provided for system designers and users to analyze the reliability of the system.

Description

Technical Field

[0001] The present application relates to the field of new ship electronic information systems, and in particular to a reliability quantitative analysis method, device, equipment and medium for ship electronic information systems based on the AADL-GO method. Background Art

[0002] Compared with the traditional architecture of "dedicated for dedicated use", the new ship electronic information system has the characteristics of "resource sharing and reuse, function reconstruction on demand, loose coupling of software and hardware, and business integration". Based on the model-based idea for reliability modeling and analysis, AADL (Architecture Analysis & Design Language) can realize the modeling of software and hardware coupling systems, but it cannot consider the quantitative prediction of reliability from the perspective of mission reliability. Summary of the invention

[0003] The purpose of this application is to provide a method, device, equipment and medium for quantitative analysis of the reliability of ship electronic information systems based on the AADL-GO method, which can perform quantitative analysis on the reliability of ship electronic information systems and provide a quick and effective way for system designers and users to analyze system reliability.

[0004] To achieve the above objectives, this application provides the following solutions:

[0005] In a first aspect, the present application provides a reliability quantitative analysis method for a ship electronic information system based on the AADL-GO method, comprising:

[0006] Construct the AADL reliability model of ship electronic information system based on AADL method;

[0007] Converting the AADL reliability model into a GO graph model;

[0008] Determine the state probability of the ship's electronic information system based on the GO graph model;

[0009] The state probability of the unit with common cause failure is corrected to obtain the success probability of the ship's electronic information system, and the quantitative analysis of the reliability of the ship's electronic information system is completed.

[0010] In a second aspect, the present application provides a reliability quantitative analysis device for a ship electronic information system based on the AADL-GO method, comprising:

[0011] AADL reliability model building module, used to build the AADL reliability model of the ship's electronic information system based on the AADL method;

[0012] A GO graph model building module, used to convert the AADL reliability model into a GO graph model;

[0013] A state probability determination module, used to determine the state probability of the ship's electronic information system based on the GO graph model;

[0014] The correction module is used to correct the state probability of the unit with common cause failure, obtain the success probability of the ship's electronic information system, and complete the quantitative analysis of the reliability of the ship's electronic information system.

[0015] In a third aspect, the present application provides a computer device, comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the above-mentioned quantitative analysis method for the reliability of a ship's electronic information system based on the AADL-GO method.

[0016] In a fourth aspect, the present application provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the above-mentioned quantitative analysis method for the reliability of a ship's electronic information system based on the AADL-GO method.

[0017] According to the specific embodiments provided in this application, this application discloses the following technical effects:

[0018] The present application provides a method, device, equipment and medium for quantitative analysis of the reliability of a ship's electronic information system based on the AADL-GO method. The AADL reliability model is converted into a GO graph model through mapping rules. The state probability of the ship's electronic information system is determined based on the GO graph model, and the state probability of units with common cause failures is corrected. The present application can automatically establish the GO graph model mapped by the AADL model on the GO method platform and complete the reliability analysis, thereby achieving the goal of reliability analysis of the ship's electronic information system, and providing a quick and intuitive way for system designers and users to analyze system reliability. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0020] Figure 1 A flowchart of a reliability quantitative analysis method for a ship electronic information system based on the AADL-GO method provided in one embodiment of the present application;

[0021] Figure 2It is the mapping relationship diagram between AADL reliability model and GO graph model;

[0022] Figure 3 It is a fault model mapping relationship diagram;

[0023] Figure 4 Schematic diagram of the process of converting AADL reliability model into GO graph model;

[0024] Figure 5 It is the common cause failure diagram of common mode failure;

[0025] Figure 6 Cascading failure diagram for common mode fault;

[0026] Figure 7 A schematic diagram of the structure of a computer device provided in one embodiment of the present application. DETAILED DESCRIPTION

[0027] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0028] AADL (Architecture Analysis & Design Language) is a modeling tool for the MBSE method. AADL is mainly used for modeling embedded system engineering, and has a relatively accurate description of application software and computer platform architecture. Among the basic elements of AADL, hardware and software are abstracted into different components, and these components communicate with each other through interfaces or mutual calls. The AADL error annex can provide a comprehensive and accurate description of the fault propagation rules within the components of the system and the propagation rules between components.

[0029] The GO method is a method for system reliability analysis. Compared with widely used modeling methods such as DFTA and FME(C)A, the GO method has the following advantages: (1) Different engineers create GO method models according to the strict requirements of system technology, design and circuit diagram, and use the developed analysis method to analyze, and the results are highly consistent; (2) The GO method model is easy to verify; (3) The GO method model is a direct development of the system diagram, including principle, engineering and structural diagrams, and is therefore closer to the actual product structure.

[0030] The purpose of this application is to solve the problem that the current AADL task reliability model cannot perform accurate reliability quantitative analysis based on the reliability analysis method of the AADL-GO method.

[0031] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, the present application is further described in detail below in conjunction with the accompanying drawings and specific implementation methods.

[0032] In an exemplary embodiment, Figure 1 As shown, a reliability quantitative analysis method for a ship electronic information system based on the AADL-GO method is provided. The method is executed by a computer device, specifically, it can be executed by a computer device such as a terminal or a server alone, or it can be executed by a terminal and a server together. In the embodiment of the present application, the method is applied to a server as an example for explanation, and includes the following steps S1 to S4. Among them:

[0033] S1: Construct the AADL reliability model of the ship electronic information system based on the AADL method.

[0034] S2: Convert the AADL reliability model into a GO graph model.

[0035] The AADL reliability model cannot be directly used for accurate quantitative analysis of reliability. Therefore, it is necessary to convert the AADL reliability model into a GO graph model that can be used for reliability analysis. The AADL reliability model includes a structural model, a behavioral model, and a fault model. The GO graph model includes functional operators, logical operators, and signal flows. Therefore, it is necessary to convert the three models in the AADL reliability model into elements in the GO graph model, that is, map the structural model and the behavioral model into functional operators and logical operators in the GO graph model, and map the fault model into the signal flow in the GO graph model. The mapping relationship between the AADL reliability model and the GO graph model is as follows: Figure 2 shown.

[0036] (1) Structural model mapping: The structural model includes: software class, computing service equipment class, display equipment class, network equipment class, weapon equipment class and sensor equipment class; functional operators include: signal conduction unit, two-state unit and single-input signal unit. Model mapping is performed between the components in the AADL reliability model and the functional operators in the GO graph model. The classes of different components are mapped to different functional operators in the GO graph model. The Task class in the AADL reliability model component is a software class. Software failure is affected by hardware failure and the failure of the previous level software. The hardware and software in the ship electronic information system have loose coupling characteristics. Therefore, the software class in the AADL reliability model is mapped to the signal conduction unit in the GO graph model. The computer class in the AADL reliability model component is a computing service equipment class. The computing service equipment class has two states: faulty and normal. Therefore, the computing service equipment class in the AADL reliability model is mapped to a two-state unit in the GO graph model. Similarly, the weapon equipment class, display equipment class and network equipment class in the AADL reliability model can be mapped to two-state units in the GO graph model. The radar class in the AADL reliability model component is a sensor class that needs to search for targets and pass information to the next level of software after finding the target. Therefore, the sensor class is mapped to a single input signal unit in the GO graph model. The mapping relationship of the structural model is shown in Table 1.

[0037] Table 1

[0038] Components Functional Operator Types Function Operator Name Software 6 Signal conduction unit Computing service equipment 1 Two-state unit Display device class 1 Two-state unit Network equipment 1 Two-state unit Sensing equipment 5 Single input signal Weapons and equipment 1 Two-state unit

[0039] (2) Behavioral model mapping: The behavioral model includes reconstruction behavior; the logical operator includes an OR gate; the reconstruction behavior in the AADL reliability model is mapped to the OR gate of the logical operator in the GO graph model. The software runs on two hardware that back up each other. When one hardware fails, the software can still run on the other hardware and the system can operate normally. Only when two hardware fail at the same time will the system fail.

[0040] (3) Fault model mapping: The AADL reliability model uses connection lines (Connection class) to realize information transmission between components. The elements of the Connection class include name, kind, destination, and source. Name represents the name of the connection line, and kind represents the type of connection line, including port connection and access connection. Destination represents the end point of the connection line, and source represents the starting point of the connection line. The GO graph model uses signal flow to represent fault transmission. The destination and source attributes of the connection line in the AADL reliability model are respectively assigned to the output and input of the signal flow in the GO graph model, and the name of the connection line is mapped to the signal flow name in the GO graph model to realize the mapping of the fault model. The mapping relationship is as follows: Figure 3 shown.

[0041] According to the characteristics of the modeling unit in the AADL reliability model and the fault transmission situation, the corresponding functional operator type in the GO graph model is selected, and the reconstruction behavior in the AADL reliability model is mapped to the OR gate in the GO graph model. Finally, the fault model in the AADL reliability model is mapped to the signal flow in the GO graph model, thereby constructing the mission reliability GO graph model of the ship electronic information system. The operator list corresponding to the component units and logical relationships of the ship electronic information system in the AADL reliability model is shown in Table 2.

[0042] Table 2

[0043]

[0044]

[0045] To facilitate system analysis and design, AADL provides an export file format, namely XML format, which is used to describe information such as system structure, components and their properties. To define the conversion of AADL reliability model to GO graph model, you first need to obtain the XML source document generated in OSATE. By instantiating the AADL reliability model built under the OSATE2 platform, you can obtain the XML format exported by the AADL reliability model. In AADL, the exported XML file usually contains the following content:

[0046] ① System structure: describes the hierarchical structure of the system, including systems, subsystems, components, etc.

[0047] ②Component description: describes the properties, input and output ports, subcomponents and other information of each component.

[0048] ③Connection description: describes the connection method between different components, the type of data transmitted, and other information.

[0049] ④ Property description: Describes the specific properties of the component and its ports, such as data type.

[0050] The XML format exported by the AADL reliability model is as follows:

[0051]

[0052]

[0053] The positions of the AADL reliability model elements in the XML file can be extracted, and the corresponding relationships are shown in Table 3.

[0054] Table 3

[0055]

[0056] The GO platform supports input and export files in JSON format. The following table is a description of the JSON format of the GO graph model elements. The corresponding relationship is shown in Table 4.

[0057] Table 4

[0058]

[0059]

[0060] The conversion process from AADL reliability model to GO graph model is as follows: Figure 4 As shown. To convert the XML file generated by the AADL reliability model into the JSON format supported by the GO platform, you must first parse the XML file, use ElementTree in Python to read the XML file and convert it into a tree structure. Secondly, traverse the XML tree, map the name in the Component Instance to the operator name, map the classifier in the Component Instance to the operator type according to the mapping rules, map the name in the connection Instance to the name of the signal flow, and map the destination and source in the ComponentInstance to the output and input types of the signal flow according to the mapping rules. Finally, build a JSON object and write the JSON object to the file.

[0061] S3: Determine the state probability of the ship's electronic information system based on the GO graph model.

[0062] S4: Correct the state probability of units with common cause failures to obtain the success probability of the ship's electronic information system and complete the quantitative analysis of the reliability of the ship's electronic information system.

[0063] Common mode failure is a dependent failure event, that is, due to the combined effect of multiple factors, two or more units (software or hardware) fail or become unavailable at the same time or within a specified time period, so that the failure event is no longer considered an independent event. These factors may come from multiple aspects such as design, space, environment, and human factors. Common mode failure exists in redundant structure systems. This failure may seriously affect the reliability of ship electronic information systems and even cause the failure of ship electronic information systems. Common mode failures of ship electronic information systems are mainly divided into common cause failures and cascading failures.

[0064] like Figure 5 As shown in Figure 1, multiple failures in a ship's electronic information system due to a common cause or simultaneous failures of two or more components occurring in a short period of time are called common cause failures. The number of failure units caused by this common cause is called the multiplicity of the common cause failure.

[0065] like Figure 6 As shown in Figure 1, cascading failure is a multiple failure caused by a failure in a ship's electronic information system, i.e., a chain reaction or domino effect failure. When the load of a ship's electronic information system is distributed across multiple components, the failure of one component may increase the load on other components, thereby greatly increasing the probability of failure of other components. For example, in a network device, if a network device fails and needs to be rerouted, this may cause a router with no other communication functions to crash due to overload.

[0066] According to the above classification, an instance library of common mode failures is established, as shown in Table 5.

[0067] Table 5

[0068]

[0069] By using the GO method to directly calculate the mission reliability of the ship's electronic information system, we can get the expression of the state probability of the ship's electronic information system represented by the operator state probability. However, since there are common cause failures in the failure mode of the ship's electronic information system, it is necessary to correct the state probability of the unit with common cause failure.

[0070] Assuming that there is a common cause failure in units A and B in the ship's electronic information system, the success probability R of the ship's electronic information system can be modified to formula (1):

[0071] R=c0+c1Q A +c2Q B +c3Q A,B (1)

[0072] Where: Q A and Q Bare the failure probabilities of units A and B, respectively, Q A,B is the probability of common cause failure units failing at the same time, c0 represents the basic failure rate or reliability level that is independent of the specific unit (A or B), c1 represents the contribution of unit A to the system reliability when it fails independently, c2 represents the contribution of unit B to the system reliability when it fails independently, and c3 represents the impact of unit A and unit B failing at the same time due to common cause failure on the overall reliability, reflecting the degree of impact of common cause failure on the system. The common cause failure probability of unit A and unit B is C A,B , the failure probability of unit A and unit B is:

[0073] Q A =Q AI +C A,B (2)

[0074] Q B =Q BI +C A,B (3)

[0075] Q A,B =Q AI,BI +C A,B (4)

[0076] Among them, Q AI and Q BI is the failure probability of unit A and unit B excluding common cause failures, Q AI,BI is the joint failure probability of unit A and unit B after eliminating common cause failure. Substituting into formula (1), we can get:

[0077] R=c0+c1Q AI +c2Q BI +c3Q AI,BI +(c1+c2+c3)C A,B (5)

[0078] Formula (5) can be rewritten as

[0079] R=R I +C A,B (R 00 -R 11 )(6)

[0080] Where: R I is the success probability excluding common cause failures, R 00 is the success probability of the ship's electronic information system when both units A and B contain common cause failures and the success probabilities of both units A and B are 0. 11 is the success probability of the ship electronic information system when the common cause failures of unit A and unit B are both 1. For a complex system with M common cause groups, the common cause failure probability of the mth group is evaluated as Cm , substituting into formula (6) we can get:

[0081]

[0082] The common cause failure model is calculated using the β factor model. Generally, the value range of the β factor is [0.0-2.5]. The larger the β factor, the greater the impact of the common cause failure on the system reliability. β 0 means that no common cause failure occurs. When using the β factor model to calculate common cause failures, the calculation formula is as follows:

[0083] C=λβ(8)

[0084] At present, the quantitative analysis method of ship electronic information system reliability based on the AADL-GO method provided in this application has been verified on a typical ship electronic information system. This method can realize the quantitative analysis of the mission reliability of the ship electronic information system and has a high degree of automation.

[0085] Based on the same inventive concept, the embodiment of the present application also provides a device for implementing the above-mentioned method for quantitative analysis of the reliability of ship electronic information systems based on the AADL-GO method. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above-mentioned method, so the specific limitations in the embodiments of one or more device embodiments for quantitative analysis of the reliability of ship electronic information systems based on the AADL-GO method provided below can refer to the limitations of the above-mentioned method for quantitative analysis of the reliability of ship electronic information systems based on the AADL-GO method, and will not be repeated here.

[0086] In an exemplary embodiment, a reliability quantitative analysis device for a ship electronic information system based on the AADL-GO method is provided, comprising:

[0087] The AADL reliability model building module is used to build the AADL reliability model of the ship's electronic information system based on the AADL method.

[0088] The GO graph model building module is used to convert the AADL reliability model into a GO graph model.

[0089] The state probability determination module is used to determine the state probability of the ship's electronic information system based on the GO graph model.

[0090] The correction module is used to correct the state probability of the unit with common cause failure, obtain the success probability of the ship's electronic information system, and complete the quantitative analysis of the reliability of the ship's electronic information system.

[0091] In an exemplary embodiment, a computer device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and the processor implements the steps in the above-mentioned method embodiments when executing the computer program. The computer device may be a server or a terminal, and its internal structure diagram may be as shown in FIG. Figure 7 As shown. The computer device includes a processor, a memory, an input / output interface (Input / Output, referred to as I / O) and a communication interface. Among them, the processor, the memory and the input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used for data to be processed. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a quantitative analysis method for the reliability of a ship electronic information system based on the AADL-GO method is implemented.

[0092] Those skilled in the art will understand that Figure 7 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components. In an exemplary embodiment, a computer device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and the processor implements the steps in the above-mentioned method embodiments when executing the computer program.

[0093] In an exemplary embodiment, a computer-readable storage medium is provided, storing a computer program, and when the computer program is executed by a processor, the steps in the above method embodiments are implemented.

[0094] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with relevant regulations.

[0095] Those of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM may be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM).

[0096] The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. The non-relational database may include a distributed database based on blockchain, etc., but is not limited thereto. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but is not limited thereto.

[0097] The technical features of the above embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0098] This article uses specific examples to illustrate the principles and implementation methods of this application. The description of the above embodiments is only used to help understand the method and core ideas of this application. At the same time, for those skilled in the art, according to the ideas of this application, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as limiting this application.

Claims

1. A reliability quantitative analysis method for ship electronic information system based on AADL-GO method, characterized in that: include: Construct the AADL reliability model of ship electronic information system based on AADL method; Converting the AADL reliability model into a GO graph model; Determine the state probability of the ship's electronic information system based on the GO graph model; The state probability of the unit with common cause failure is corrected to obtain the success probability of the ship's electronic information system, and the quantitative analysis of the reliability of the ship's electronic information system is completed.

2. The reliability quantitative analysis method of ship electronic information system based on AADL-GO method according to claim 1 is characterized in that: The AADL reliability model includes a structural model, a behavioral model and a fault model, and the GO graph model includes a functional operator, a logical operator and a signal flow.

3. The reliability quantitative analysis method of ship electronic information system based on AADL-GO method according to claim 2 is characterized in that: Converting the AADL reliability model into a GO graph model specifically includes: Mapping the structural model in the AADL reliability model to the functional operators in the GO graph model; Mapping the behavior model in the AADL reliability model to a logical operator in the GO graph model; The fault model in the AADL reliability model is mapped to a signal flow in a GO graph model to obtain a GO graph model.

4. The reliability quantitative analysis method of ship electronic information system based on AADL-GO method according to claim 3 is characterized in that: The structural model includes: software class, computing service equipment class, display equipment class, network equipment class, weapon equipment class and perception equipment class; the functional operator includes: signal conduction unit, two-state unit and single input signal unit; Mapping the structural model in the AADL reliability model to the functional operators in the GO graph model specifically includes: Mapping the software class to a signal conduction unit; Mapping the computing service device class, display device class, network device class and weapon device class into two-state units; The sensing device class is mapped to a single input signal unit.

5. The reliability quantitative analysis method of ship electronic information system based on AADL-GO method according to claim 3 is characterized in that: The behavior model includes a reconstruction behavior; the logic operator includes an OR gate; and the reconstruction behavior is mapped to the OR gate.

6. The reliability quantitative analysis method of ship electronic information system based on AADL-GO method according to claim 3 is characterized in that: Mapping the fault model in the AADL reliability model to a signal flow in the GO graph model specifically includes: The end point and the starting point of the connection line in the AADL reliability model are respectively assigned to the output and the input of the signal flow in the GO graph model, and the name of the connection line is mapped to the name of the signal flow in the GO graph model.

7. The reliability quantitative analysis method of ship electronic information system based on AADL-GO method according to claim 1 is characterized in that: The calculation formula for the success probability of the ship's electronic information system is: R=c0+c1Q A +c2Q B +c3Q A,B Q A =Q AI +C A,B Q B =Q BI +C A,B Q A,B =Q AI,BI +C A,B Among them, R is the success probability, Q A and Q B are the failure probabilities of unit A and unit B in the ship's electronic information system, Q A,B is the probability of common cause failure units failing at the same time, c0 represents the basic failure rate or reliability level that is independent of unit A or unit B, c1 represents the contribution of unit A to the reliability of the ship's electronic information system when it fails independently, c2 represents the contribution of unit B to the reliability of the ship's electronic information system when it fails independently, c3 represents the impact of unit A and unit B failing at the same time due to common cause failure on the reliability of the ship's electronic information system, Q AI and Q BI are the failure probabilities of unit A and unit B excluding common cause failures, C A,B is the common cause failure probability of unit A and unit B, Q AI,BI is the joint failure probability of unit A and unit B after eliminating common cause failures.

8. A reliability quantitative analysis device for ship electronic information system based on AADL-GO method, characterized in that: include: AADL reliability model building module, used to build the AADL reliability model of the ship's electronic information system based on the AADL method; A GO graph model building module, used to convert the AADL reliability model into a GO graph model; A state probability determination module, used to determine the state probability of the ship's electronic information system based on the GO graph model; The correction module is used to correct the state probability of the unit with common cause failure, obtain the success probability of the ship's electronic information system, and complete the quantitative analysis of the reliability of the ship's electronic information system.

9. A computer device comprising: A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the quantitative analysis method for reliability of a ship electronic information system based on the AADL-GO method as described in any one of claims 1 to 7.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the reliability quantitative analysis method of a ship electronic information system based on the AADL-GO method described in any one of claims 1 to 7 is implemented.

Images