Method and device for obtaining quantum bit simulation data, quantum computer
By establishing a simulation model to obtain the state evolution process of qubits, the problems of time consumption and susceptibility to interference in the acquisition of measured data in existing technologies are solved, and efficient and accurate acquisition of qubit simulation data is achieved.
Patent Information
- Application Number
- CN202310923161.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2023-07-26
- Publication Date
- 2025-11-18
- Estimated Expiration
- 2043-07-26
AI Technical Summary
In existing technologies, to verify the accuracy of quantum algorithms or neural network models, a large amount of experimental data needs to be acquired in quantum computers, which consumes a lot of machine time and is easily affected by external factors.
A simulation model is established, and by configuring the model input parameters such as the frequency of the quantum bit to be measured and the frequency of the quantum state control signal, the state evolution process of the quantum bit after receiving the quantum state control signal is simulated, and simulation data is obtained.
Without occupying quantum computer time, the obtained simulation data is highly accurate and unaffected by external factors, thus improving the accuracy of algorithm or neural network model verification.
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Figure CN119378466B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of quantum computing technology, and in particular to a method and apparatus for acquiring quantum bit simulation data, and a quantum computer. Background Technology
[0002] Quantum computing and quantum information is an interdisciplinary field that uses the principles of quantum mechanics to perform computational and information processing tasks. It is closely related to quantum physics, computer science, and informatics. It has experienced rapid development in the last two decades. Quantum algorithms based on quantum computers, such as factorization and unstructured search, have demonstrated performance far exceeding that of existing algorithms based on classical computers, leading to expectations that this field will surpass current computing capabilities. Because quantum computing has the potential to far exceed the performance of classical computers in solving specific problems, realizing a quantum computer requires a quantum chip containing a sufficient number and quality of qubits, capable of performing high-fidelity quantum logic gate operations and readouts on these qubits. The quantum chip is to a quantum computer what a CPU is to a traditional computer; it is the core component of a quantum computer, the processor that performs quantum computations. Before each quantum chip is officially put into use, the parameters of the qubits within the chip must be tested and characterized.
[0003] To solve certain quantum computing problems, classical algorithms or neural network models are needed. Understandably, to verify whether these algorithms or models meet the requirements, researchers need to input large amounts of data into them for evaluation. Current technologies often require a large amount of experimental data to support the verification of algorithms or neural network models. This experimental data needs to be obtained by running the algorithm or model on a real quantum computer, consuming a significant amount of the quantum computer's processing time.
[0004] Therefore, a method is needed to improve the efficiency of data acquisition.
[0005] It should be noted that the information disclosed in the background section of this application is intended only to enhance the understanding of the general background of this application, and should not be construed as an admission or in any way implying that the information constitutes prior art known to those skilled in the art. Summary of the Invention
[0006] The purpose of this invention is to provide a method and apparatus for acquiring quantum bit simulation data, and a quantum computer, to solve the problem that in the prior art, in order to verify whether these algorithms or neural network models meet the requirements, a large amount of measured data is needed to support the verification work of the algorithm or neural network model. This measured data needs to be obtained by running in an actual quantum computer, which occupies a large amount of the quantum computer's machine time.
[0007] To address the above technical problems, this invention proposes a method for acquiring quantum bit simulation data, comprising:
[0008] A simulation model is established, which is used to simulate the state evolution process of a measurand bit after receiving a quantum state control signal;
[0009] Configure the model input parameters of the simulation model, including the frequency of the sub-bit to be measured, the frequency of the quantum state control signal, and the anharmonicity of the sub-bit to be measured;
[0010] Based on the configured model input parameters and the simulation model, simulation data reflecting the state of the sub-bit to be measured is obtained.
[0011] Optionally, establishing the simulation model includes:
[0012] The simulation model is established based on the first Hamiltonian of the sub-bit to be measured and the second Hamiltonian of the quantum state control signal.
[0013] Optionally, establishing the simulation model based on the first Hamiltonian of the sub-bit to be measured and the second Hamiltonian of the quantum state control signal includes:
[0014] Construct the first Hamiltonian of the sub-bit to be measured and the second Hamiltonian of the quantum state control signal;
[0015] The density matrix of the sub-bit to be measured is obtained using the first Hamiltonian and the second Hamiltonian to establish the simulation model.
[0016] Optionally, the first Hamiltonian includes a bit Hamiltonian and a coupled Hamiltonian, wherein the bit Hamiltonian includes the Hamiltonian of the sub-bit to be measured, the Hamiltonian of the first qubit, and the Hamiltonian of the second qubit; the coupled Hamiltonian includes a Hamiltonian with a first coupling relationship and a Hamiltonian with a second coupling relationship, wherein the first coupling relationship is the coupling relationship between the sub-bit to be measured and the first qubit, and the second coupling relationship is the coupling relationship between the sub-bit to be measured and the second qubit; and the first qubit and the second qubit are two qubits in the quantum chip that have a direct coupling relationship with the sub-bit to be measured.
[0017] Optionally, the Hamiltonian of the sub-bit to be measured is obtained by the following formula:
[0018]
[0019] Wherein, H0 is the Hamiltonian of the sub-bit to be measured, ω0 is the frequency of the sub-bit to be measured, and α0 is the anharmonicity of the sub-bit to be measured. For annihilation operators, To generate operators.
[0020] Optionally, the Hamiltonian of the first qubit is obtained by the following formula:
[0021]
[0022] Where H1 is the Hamiltonian of the first qubit, ω1 is the frequency of the first qubit, and α1 is the anharmonicity of the first qubit. For annihilation operators, To generate operators.
[0023] Optionally, the Hamiltonian of the second qubit is obtained by the following formula:
[0024]
[0025] Where H2 is the Hamiltonian of the second qubit, ω2 is the frequency of the second qubit, and α2 is the anharmonicity of the second qubit. For annihilation operators, To generate operators.
[0026] Optionally, the Hamiltonian of the first coupling relationship is obtained by the following formula:
[0027]
[0028] Among them, H 01 Let g be the Hamiltonian of the first coupling relationship. 01 The coupling strength between the sub-bit to be measured and the first qubit is given. For annihilation operators, To generate operators.
[0029] Optionally, the Hamiltonian of the second coupling relationship is obtained by the following formula:
[0030]
[0031] Among them, H 02 Let g be the Hamiltonian of the second coupling relationship. 02 The coupling strength between the sub-bit to be measured and the second qubit. For annihilation operators, To generate operators.
[0032] Optionally, the first Hamiltonian is the sum of the bit Hamiltonian and the coupled Hamiltonian.
[0033] Optionally, the second Hamiltonian is obtained by the following formula:
[0034]
[0035]
[0036] Among them, H d This is the second Hamiltonian. For annihilation operators, To generate the operator, ω d Let be the frequency of the quantum state control signal, t be time, Ф be the phase of the quantum state control signal, and C be the frequency of the quantum state control signal. d C represents the capacitance of the quantum state control line. ∑ V0 is the sum of the capacitance of the sub-bit to be measured and the capacitance of the quantum state control line, where V0 is the voltage magnitude of the quantum state control signal, and Q is the capacitance of the quantum state control line. zpf For the zero-point fluctuation of the charge operator, Let i be Planck's constant and i be an imaginary number.
[0037] Optionally, the density matrix is:
[0038]
[0039] in, H q H is the first Hamiltonian. d This is the second Hamiltonian. Let ρ be the time derivative of the density matrix, and n be the density matrix. γ The number of thermal photons in the quantum state control line. Here, γ is the Dissipator operator, and γ is the relaxation rate. Where l is the pure decoherence rate, l is the inductance per unit length of the quantum state control line, c is the capacitance per unit length of the quantum state control line, and C bus-q C is the capacitance from the quantum state control line to the measured subqubit. q ω represents the capacitance of the sub-bit to be measured. d ω is the frequency of the quantum state control signal. q The frequency of the sub-bit to be measured.
[0040] Based on the same inventive concept, this invention also proposes a device for acquiring quantum bit simulation data, comprising:
[0041] The simulation model building unit is used to build a simulation model, which is used to simulate the state evolution process of a measurand bit after receiving a quantum state control signal;
[0042] The model input parameter configuration unit is used to configure the model input parameters of the simulation model, wherein the model input parameters include the frequency of the sub-bit to be measured, the frequency of the quantum state control signal, and the anharmonicity of the sub-bit to be measured;
[0043] The simulation data acquisition unit is used to acquire simulation data reflecting the state of the sub-bit to be measured, based on the configured model input parameters and the simulation model.
[0044] Based on the same inventive concept, the present invention also proposes a quantum control system, which utilizes the method for acquiring quantum bit simulation data as described in any of the above-described features, or includes the device for acquiring quantum bit simulation data as described in the above-described features.
[0045] Based on the same inventive concept, the present invention also proposes a quantum computer, including the quantum control system described in the above feature description.
[0046] Based on the same inventive concept, the present invention also proposes a readable storage medium storing a computer program thereon, which, when executed by a processor, enables the acquisition method of quantum bit simulation data as described in any of the above-described features.
[0047] Compared with the prior art, the present invention has the following beneficial effects:
[0048] This invention proposes a method for acquiring quantum bit simulation data. A simulation model is established to simulate the state evolution of a quantum bit after receiving a quantum state control signal. Then, the model input parameters are configured, including the frequency of the quantum bit, the frequency of the quantum state control signal, and the anharmonicity of the quantum bit. Based on the configured model input parameters and the simulation model, simulation data reflecting the state of the quantum bit is acquired. This method does not require the time of a quantum computer, making it far more efficient than methods for acquiring measured data. Furthermore, because this method uses a simulation model, the data is not affected by external factors, unlike measured data. The accuracy of the data obtained using this method is significantly higher than that of measured data, which can improve the accuracy of results when used to verify algorithms or neural network models.
[0049] The quantum bit simulation data acquisition device, quantum control system, quantum computer, and readable storage medium proposed in this invention belong to the same inventive concept as the quantum bit simulation data acquisition method, and therefore have the same beneficial effects, which will not be elaborated here. Attached Figure Description
[0050] Figure 1 This is a flowchart illustrating the method for acquiring quantum bit simulation data proposed in an embodiment of the present invention;
[0051] Figure 2 This is a simplified structural diagram of the device for acquiring quantum bit simulation data proposed in an embodiment of the present invention. Detailed Implementation
[0052] The specific embodiments of the present invention will now be described in more detail with reference to the accompanying drawings. The advantages and features of the present invention will become clearer from the following description and claims. It should be noted that the drawings are all in a very simplified form and use non-precise proportions, and are only used to facilitate and clarify the illustration of the embodiments of the present invention.
[0053] In the description of this invention, it should be understood that the terms "center", "upper", "lower", "left", "right", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this invention.
[0054] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this invention, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly specified.
[0055] A quantum chip is to a quantum computer what a CPU is to a traditional computer; it is the core component of a quantum computer, acting as the processor to perform quantum calculations. A quantum chip integrates multiple one-to-one, mutually coupled qubits and readout cavities. Before being officially put into use, each quantum chip requires testing and characterization. A quantum computer also includes a control system that provides the control environment for the quantum chip. This control system mainly consists of hardware devices located at room temperature and cryogenic devices and signal transmission lines located within a dilution refrigerator. After the quantum chip is packaged, it is fixed in the lowest cryogenic layer of the dilution refrigerator and ultimately connected to the room-temperature hardware devices via coaxial lines between layers. In this control system, two types of lines are mainly used to control the quantum states of the qubits: a first type of transmission line (i.e., quantum state control line) for driving the quantum states of the qubits, and a second type of transmission line (i.e., frequency control line) for controlling the frequency of the qubits. The signal transmitted on the quantum state control line is called the quantum state control signal, and the signal transmitted on the frequency control line is called the frequency control signal.
[0056] Please refer to Figure 1 This invention proposes a method for acquiring quantum bit simulation data, comprising:
[0057] S100: Establish a simulation model, which is used to simulate the state evolution process of a measurand bit after receiving a quantum state control signal;
[0058] S200: Configure the model input parameters of the simulation model, including the frequency of the sub-bit to be measured, the frequency of the quantum state control signal, and the anharmonicity of the sub-bit to be measured;
[0059] S300: Based on the configured model input parameters and the simulation model, obtain simulation data reflecting the state of the sub-bit to be measured.
[0060] Unlike existing technologies, the method for acquiring qubit simulation data proposed in this embodiment involves establishing a simulation model to simulate the state evolution of a qubit under test after receiving a quantum state control signal. Then, the model input parameters are configured, including the frequency of the qubit under test, the frequency of the quantum state control signal, and the anharmonicity of the qubit under test. Based on the configured model input parameters and the simulation model, simulation data reflecting the state of the qubit under test is acquired. This approach does not require the time of a quantum computer, making it far more efficient than methods for acquiring measured data. Furthermore, because this approach utilizes a simulation model, the data is not subject to interference from external factors, unlike measured data. The accuracy of the data obtained using this approach is significantly higher than that of measured data, which can improve the accuracy of results when used to verify algorithms or neural network models.
[0061] In this embodiment of the invention, the purpose of establishing the simulation model is to simulate the state evolution process of the quantum bit to be measured after receiving a quantum state control signal. The applicant considers constructing the total Hamiltonian of the quantum bit to be measured and the quantum state control signal. Those skilled in the art will understand that the density matrix can reflect the precise current state of the quantum bit, while the Hamiltonian can cause the density matrix to change over time. Therefore, the combination of the two can perfectly reproduce the evolution process of the quantum bit state with the quantum state control signal. Those skilled in the art will understand that in this embodiment, the simulation model can be considered as a function containing the Hamiltonian and the density matrix. This model can accurately reflect the evolution process of the quantum bit state with the quantum state control signal. Specifically, establishing the simulation model includes:
[0062] The simulation model is established based on the first Hamiltonian of the sub-bit to be measured and the second Hamiltonian of the quantum state control signal.
[0063] Specifically, in this embodiment, establishing the simulation model based on the first Hamiltonian of the sub-bit to be measured and the second Hamiltonian of the quantum state control signal includes:
[0064] Construct the first Hamiltonian of the sub-bit to be measured and the second Hamiltonian of the quantum state control signal;
[0065] The density matrix of the sub-bit to be measured is obtained using the first Hamiltonian and the second Hamiltonian to establish the simulation model.
[0066] Specifically, the first Hamiltonian includes a bit Hamiltonian and a coupled Hamiltonian. The bit Hamiltonian includes the Hamiltonian of the sub-bit to be measured, the Hamiltonian of the first qubit, and the Hamiltonian of the second qubit. The coupled Hamiltonian includes a Hamiltonian with a first coupling relationship and a Hamiltonian with a second coupling relationship. The first coupling relationship is the coupling relationship between the sub-bit to be measured and the first qubit, and the second coupling relationship is the coupling relationship between the sub-bit to be measured and the second qubit. The first qubit and the second qubit are two qubits in the quantum chip that have a direct coupling relationship with the sub-bit to be measured.
[0067] It should be noted that in this embodiment, the first Hamiltonian includes the bit Hamiltonian and the coupling Hamiltonian. We mainly consider two qubits that are directly coupled to the qubit to be measured in the quantum chip. In other quantum chip structures, there may be only one qubit directly coupled to the qubit to be measured, or there may be more qubits. The corresponding bit Hamiltonian and coupling Hamiltonian can be added according to the actual situation, which will not be elaborated here.
[0068] In this embodiment, we first construct the Hamiltonian of the sub-bit to be measured, which is obtained by the following formula:
[0069]
[0070] Wherein, H0 is the Hamiltonian of the sub-bit to be measured, ω0 is the frequency of the sub-bit to be measured, and α0 is the anharmonicity of the sub-bit to be measured. For annihilation operators, To generate operators.
[0071] Then, a first qubit and a second qubit that are directly coupled to the qubit to be measured are constructed. The Hamiltonian of the first qubit and the second qubit are identical in form. The Hamiltonian of the first qubit is obtained by the following formula:
[0072]
[0073] Where H1 is the Hamiltonian of the first qubit, ω1 is the frequency of the first qubit, and α1 is the anharmonicity of the first qubit. For annihilation operators, To generate operators.
[0074] Specifically, the Hamiltonian of the second qubit is obtained by the following formula:
[0075]
[0076] Where H2 is the Hamiltonian of the second qubit, ω2 is the frequency of the second qubit, and α2 is the anharmonicity of the second qubit. For annihilation operators, To generate operators.
[0077] In addition to the Hamiltonian of the qubit, it is also necessary to construct the Hamiltonian of the coupling relationship. The Hamiltonian of the first coupling relationship is obtained by the following formula:
[0078]
[0079] Among them, H 01 Let g be the Hamiltonian of the first coupling relationship. 01 The coupling strength between the sub-bit to be measured and the first qubit is given. For annihilation operators, To generate operators.
[0080] Specifically, the Hamiltonian of the second coupling relationship is obtained by the following formula:
[0081]
[0082] Among them, H 02 Let g be the Hamiltonian of the second coupling relationship. 02 The coupling strength between the sub-bit to be measured and the second qubit. For annihilation operators, To generate operators.
[0083] Specifically, in this embodiment, the first Hamiltonian H q The sum of the bit Hamiltonian and the coupled Hamiltonian, i.e., H q =H0+H1+H2+H 01 +H 02 .
[0084] We also need to establish the second Hamiltonian of the quantum state control signal, which is obtained by the following formula:
[0085]
[0086]
[0087] Among them, H d This is the second Hamiltonian. For annihilation operators, To generate the operator, ω dLet be the frequency of the quantum state control signal, t be time, Ф be the phase of the quantum state control signal, and C be the frequency of the quantum state control signal. d C represents the capacitance of the quantum state control line. ∑ V0 is the sum of the capacitance of the sub-bit to be measured and the capacitance of the quantum state control line, where V0 is the voltage magnitude of the quantum state control signal, and Q is the capacitance of the quantum state control line. zpf For the zero-point fluctuation of the charge operator, Let i be Planck's constant and i be an imaginary number.
[0088] Specifically, in this embodiment, the density matrix is:
[0089]
[0090] in, H q H is the first Hamiltonian. d This is the second Hamiltonian. Let ρ be the derivative of the density matrix with respect to time, and let ρ be the density matrix. The number of thermal photons in the quantum state control line. Here, γ is the Dissipator operator, and γ is the relaxation rate. Where l is the pure decoherence rate, l is the inductance per unit length of the quantum state control line, c is the capacitance per unit length of the quantum state control line, and C bus-q C is the capacitance from the quantum state control line to the measured subqubit. q ω represents the capacitance of the sub-bit to be measured. d ω is the frequency of the quantum state control signal. q The frequency of the sub-bit to be measured.
[0091] Those skilled in the art will understand that, in this embodiment For the Dissipator operator, where:
[0092]
[0093]
[0094]
[0095] In the computational equations for the three Dissipator operators above, the black dots (·) represent terms that need to be multiplied. Clearly, in this embodiment, the black dots (·) represent the density matrix ρ. This indicates that the two elements in the parentheses have commuted.
[0096] In addition, in this embodiment, γ is the relaxation rate. The pure decoherence rate is given by the formula: where the relaxation rate is equal to the reciprocal of the relaxation time T1. The pure decoherence rate is obtained using the decoherence time T2 and the relaxation rate, specifically through the following formula:
[0097]
[0098]
[0099] Based on the same inventive concept, please refer to Figure 2 This invention also proposes a device for acquiring quantum bit simulation data, comprising:
[0100] The simulation model establishment unit 100 is used to establish a simulation model, which is used to simulate the state evolution process of a measurand bit after receiving a quantum state control signal;
[0101] The model input parameter configuration unit 200 is used to configure the model input parameters of the simulation model, wherein the model input parameters include the frequency of the sub-bit to be measured, the frequency of the quantum state control signal, and the anharmonicity of the sub-bit to be measured;
[0102] The simulation data acquisition unit 300 is used to acquire simulation data reflecting the state of the sub-bit to be measured based on the configured model input parameters and the simulation model.
[0103] It is understood that the simulation model establishment unit 100, the model input parameter configuration unit 200, and the simulation data acquisition unit 300 can be implemented in a single device, or any one of these modules can be split into multiple sub-modules. Alternatively, at least some of the functions of one or more modules of the simulation model establishment unit 100, the model input parameter configuration unit 200, and the simulation data acquisition unit 300 can be combined with at least some of the functions of other modules and implemented in a single functional module. According to embodiments of the present invention, at least one of the simulation model establishment unit 100, the model input parameter configuration unit 200, and the simulation data acquisition unit 300 can be at least partially implemented as hardware circuitry, such as a field-programmable gate array (FPGA), a programmable logic array (PLA), a system-on-a-chip, a system-on-a-substrate, a system-on-package, an application-specific integrated circuit (ASIC), or can be implemented in hardware or firmware in any other reasonable manner by integrating or packaging the circuitry, or in a suitable combination of software, hardware, and firmware implementations. Alternatively, at least one of the simulation model establishment unit 100, the model input parameter configuration unit 200, and the simulation data acquisition unit 300 can be implemented at least partially as a computer program module, which can perform the functions of the corresponding module when the program is run by a computer.
[0104] Based on the same inventive concept, embodiments of the present invention also propose a quantum control system, which utilizes the method for acquiring quantum bit simulation data described in any of the above-described features, or includes the device for acquiring quantum bit simulation data as described in the above-described features.
[0105] Based on the same inventive concept, embodiments of the present invention also propose a quantum computer, including the quantum control system described in the above feature description.
[0106] Based on the same inventive concept, embodiments of the present invention also propose a readable storage medium storing a computer program thereon, wherein the computer program, when executed by a processor, can implement the method for acquiring quantum bit simulation data as described in any of the above-described features.
[0107] The readable storage medium can be a tangible device capable of holding and storing instructions for use by an instruction execution device, such as, but not limited to, electrical storage devices, magnetic storage devices, optical storage devices, electromagnetic storage devices, semiconductor storage devices, or any suitable combination thereof. More specific examples of readable storage media (a non-exhaustive list) include: portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), static random access memory (SRAM), portable compact disc read-only memory (CD-ROM), digital multifunction disc (DVD), memory sticks, floppy disks, mechanical encoding devices, such as punch cards or recessed protrusions storing instructions thereon, and any suitable combination thereof. The computer programs described herein can be downloaded from the readable storage medium to various computing / processing devices, or downloaded via a network, such as the Internet, local area network, wide area network, and / or wireless network, to an external computer or external storage device. The network can include copper transmission cables, fiber optic transmission, wireless transmission, routers, firewalls, switches, gateway computers, and / or edge servers. Each computing / processing device's network adapter card or network interface receives the computer program from the network and forwards it for storage in a readable storage medium within the respective computing / processing device. The computer program used to perform the operations of this invention can be assembly instructions, instruction set architecture (ISA) instructions, machine instructions, machine-dependent instructions, microcode, firmware instructions, status setting data, or source code or object code written in any combination of one or more programming languages, including object-oriented programming languages such as Smalltalk, C++, etc., and conventional procedural programming languages such as "C" or similar languages. The computer program can be executed entirely on the user's computer, partially on the user's computer, as a standalone software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In cases involving remote computers, the remote computer can be connected to the user's computer via any type of network, including a local area network (LAN) or a wide area network (WAN), or it can be connected to an external computer (e.g., via the Internet using an Internet service provider). In some embodiments, electronic circuits, such as programmable logic circuits, field-programmable gate arrays (FPGAs), or programmable logic arrays (PLAs), are personalized by utilizing state information from a computer program. These electronic circuits can execute computer-readable program instructions, thereby realizing various aspects of the present invention.
[0108] Various aspects of the present invention are described herein with reference to flowchart illustrations and / or block diagrams of methods, systems, and computer program products according to embodiments of the invention. It should be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by a computer program. These computer programs can be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing apparatus to produce a machine such that, when executed by the processor of the computer or other programmable data processing apparatus, they create means for implementing the functions / actions specified in one or more blocks of the flowchart illustrations and / or block diagrams. These computer programs can also be stored in a readable storage medium that causes a computer, programmable data processing apparatus, and / or other device to operate in a particular manner; thus, the readable storage medium storing the computer program comprises an article of manufacture including instructions for implementing aspects of the functions / actions specified in one or more blocks of the flowchart illustrations and / or block diagrams.
[0109] A computer program may also be loaded onto a computer, other programmable data processing apparatus, or other device to cause a series of operational steps to be performed on the computer, other programmable data processing apparatus, or other device to produce a computer-implemented process, thereby causing the computer program executing on the computer, other programmable data processing apparatus, or other device to perform the functions / actions specified in one or more boxes of a flowchart and / or block diagram.
[0110] In the description of this specification, references to terms such as "one embodiment," "some embodiments," "example," or "specific example," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments. In addition, those skilled in the art can combine and integrate the different embodiments or examples described in this specification.
[0111] The above are merely preferred embodiments of the present invention and do not constitute any limitation on the present invention. Any equivalent substitutions or modifications made by those skilled in the art to the technical solutions and content disclosed in the present invention without departing from the scope of the present invention shall be deemed to have remained within the protection scope of the present invention.
Claims
1. A method for acquiring quantum bit simulation data, characterized in that, include: A simulation model of a function containing Hamiltonian and density matrix is established. The simulation model is used to simulate the state evolution process of a sub-bit to be measured after receiving a quantum state control signal. The Hamiltonian includes the Hamiltonian of the sub-bit to be measured and the quantum state control signal. The density matrix is the density matrix of the sub-bit to be measured. Configure the model input parameters of the simulation model, including the frequency of the sub-bit to be measured, the frequency of the quantum state control signal, and the anharmonicity of the sub-bit to be measured; Based on the configured model input parameters and the simulation model, simulation data reflecting the state of the sub-bit to be measured is obtained.
2. The method as described in claim 1, characterized in that, The establishment of the simulation model includes: The simulation model is established based on the first Hamiltonian of the sub-bit to be measured and the second Hamiltonian of the quantum state control signal.
3. The method as described in claim 2, characterized in that, The simulation model is established based on the first Hamiltonian of the sub-bit to be measured and the second Hamiltonian of the quantum state control signal, including: Construct the first Hamiltonian of the sub-bit to be measured and the second Hamiltonian of the quantum state control signal; The density matrix of the sub-bit to be measured is obtained using the first Hamiltonian and the second Hamiltonian to establish the simulation model.
4. The method as described in claim 3, characterized in that, The first Hamiltonian includes a bit Hamiltonian and a coupled Hamiltonian. The bit Hamiltonian includes the Hamiltonian of the sub-bit to be measured, the Hamiltonian of the first qubit, and the Hamiltonian of the second qubit. The coupled Hamiltonian includes a Hamiltonian with a first coupling relationship and a Hamiltonian with a second coupling relationship. The first coupling relationship is the coupling relationship between the sub-bit to be measured and the first qubit, and the second coupling relationship is the coupling relationship between the sub-bit to be measured and the second qubit. The first qubit and the second qubit are two qubits in the quantum chip that have a direct coupling relationship with the sub-bit to be measured.
5. The method as described in claim 4, characterized in that, The Hamiltonian of the sub-bit to be measured is obtained by the following formula: Wherein, H0 is the Hamiltonian of the sub-bit to be measured, ω0 is the frequency of the sub-bit to be measured, and α0 is the anharmonicity of the sub-bit to be measured. For annihilation operators, To generate operators.
6. The method as described in claim 4, characterized in that, The Hamiltonian of the first qubit is obtained by the following formula: Where H1 is the Hamiltonian of the first qubit, ω1 is the frequency of the first qubit, and α1 is the anharmonicity of the first qubit. For annihilation operators, To generate operators.
7. The method as described in claim 4, characterized in that, The Hamiltonian of the second qubit is obtained by the following formula: Where H2 is the Hamiltonian of the second qubit, ω2 is the frequency of the second qubit, and α2 is the anharmonicity of the second qubit. For annihilation operators, To generate operators.
8. The method as described in claim 4, characterized in that, The Hamiltonian of the first coupling relationship is obtained by the following formula: Among them, H 01 Let g be the Hamiltonian of the first coupling relationship. 01 The coupling strength between the sub-bit to be measured and the first qubit is given. , For annihilation operators, , To generate operators.
9. The method as described in claim 4, characterized in that, The Hamiltonian of the second coupling relationship is obtained by the following formula: Among them, H 02 Let g be the Hamiltonian of the second coupling relationship. 02 The coupling strength between the sub-bit to be measured and the second qubit is given. , For annihilation operators, , To generate operators.
10. The method as described in claim 4, characterized in that, The first Hamiltonian is the sum of the bit Hamiltonian and the coupled Hamiltonian.
11. The method as described in claim 3, characterized in that, The second Hamiltonian is obtained by the following formula: Among them, H d This is the second Hamiltonian. For annihilation operators, To generate the operator, ω d The frequency of the quantum state control signal is t, where t is time. Ф Let C be the phase of the quantum state control signal. d The capacitance of the quantum state control line. V0 is the sum of the capacitance of the sub-bit to be measured and the capacitance of the quantum state control line, where V0 is the voltage magnitude of the quantum state control signal, and Q is the capacitance of the quantum state control line. zpf For the zero-point fluctuation of the charge operator, Let i be Planck's constant and i be an imaginary number.
12. The method as described in claim 3, characterized in that, The density matrix is: in, , , H q H is the first Hamiltonian. d This is the second Hamiltonian. Let ρ be the derivative of the density matrix with respect to time, and let ρ be the density matrix. The number of thermal photons in the quantum state control line. , , For the Dissipator operator, For relaxation rate, For pure decoherence rate, l Let c be the inductance per unit length of the quantum state control line, and let c be the capacitance per unit length of the quantum state control line. bus-q C is the capacitance from the quantum state control line to the measured subqubit. q ω represents the capacitance of the sub-bit to be measured. d Let ω be the frequency of the quantum state control signal. q The frequency of the sub-bit to be measured.
13. A device for acquiring quantum bit simulation data, characterized in that, include: The simulation model building unit is used to build a simulation model of a function containing Hamiltonian and density matrix. The simulation model is used to simulate the state evolution process of a sub-bit to be measured after receiving a quantum state control signal. The Hamiltonian includes the Hamiltonian of the sub-bit to be measured and the quantum state control signal. The density matrix is the density matrix of the sub-bit to be measured. The model input parameter configuration unit is used to configure the model input parameters of the simulation model, wherein the model input parameters include the frequency of the sub-bit to be measured, the frequency of the quantum state control signal, and the anharmonicity of the sub-bit to be measured; The simulation data acquisition unit is used to acquire simulation data reflecting the state of the sub-bit to be measured, based on the configured model input parameters and the simulation model.
14. A quantum control system, characterized in that, The method for acquiring quantum bit simulation data as described in any one of claims 1-12, or the apparatus for acquiring quantum bit simulation data as described in claim 13.
15. A quantum computer, characterized in that, Including the quantum control system as described in claim 14.
16. A readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it can implement the method for acquiring quantum bit simulation data as described in any one of claims 1 to 12.
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