Digital equipment management method based on parameterized rapid modeling

Abstract

The invention relates to a digital equipment management method based on parameterization rapid modeling, which comprises the following steps of: constructing a digital definition information base for managing equipment information data of each equipment in a system, including equipment information and assembly information for realizing digital definition based on a model; calling equipment information of each piece of target equipment from the digital definition information library, constructing a digital definition model based on the equipment information, and storing the digital definition model into an infrastructure library; respectively calling the digital definition model and the assembly information of each target device from the basic device library and the digital definition information library of the target test system, generating an assembly design scheme of the digital definition model according to the assembly information, and storing the assembly design scheme into a test system library; and performing digital equipment management of the target test system based on the basic equipment library and the test system library. According to the invention, modeling and assembling of equipment required by the test can be completed rapidly and efficiently, and efficient digital equipment management of the model and the test system based on the model is realized at the same time.

Description

Technical Field

[0001] The invention relates to the field of computer technology, and in particular to a digital equipment management method based on parameterized rapid modeling. Background Art

[0002] The technology of aircraft structure modeling mainly involves three-dimensional digital modeling, especially full three-dimensional modeling technology (MBD). This technology has gone through several development stages from manual drawing to the application of two-dimensional CAD, to two-dimensional + three-dimensional design mode, and now to the full three-dimensional modeling technology MBD. The importance of aircraft structure modeling technology lies in that it can realize the digital display, processing and exchange of information at different stages of the product throughout the product life cycle. Digital modeling technology occupies an extremely important position in product design and manufacturing, and is an important means of product development.

[0003] However, aircraft structure modeling also has some technical deficiencies and challenges:

[0004] Modeling complexity: Aircraft structural parts models usually have complex shapes, and the modeling work is tedious and repetitive. The modeling techniques are complex and varied, and they need to meet the constraints of the relevant assembly design environment positioning benchmarks;

[0005] Low design efficiency: Traditional structural design is usually completed manually by aircraft design and development personnel, which requires consulting a large number of design manuals, standard documents and design specifications. The modeling efficiency is low, the workload is large, the design process is not unified, and the modeling techniques are not standardized.

[0006] Technical challenges: The existing CAD design systems (such as CATIA) have not yet provided a design environment with a user-friendly interface that can easily modify the design model according to the desired design constraints, and lack customized solutions for the characteristics of aircraft structural parts;

[0007] Insufficient parameterization: The difficulty of parametric design modeling lies in how to use the model's dimensional parameters to drive the generation of a three-dimensional solid model and reflect the changes in dimensional parameters in the three-dimensional model.

[0008] The current system has difficulties in dealing with the problem of aerospace structural parts with many dimensional parameters and complex internal relationships between the parameters. Summary of the invention

[0009] The technical problem to be solved by the present invention is to provide a digital equipment management method based on parameterized rapid modeling, which can quickly and efficiently complete the equipment modeling and assembly required for the test.

[0010] The technical solution adopted by the present invention to solve the technical problem is: to provide a digital equipment management method based on parameterized rapid modeling, comprising the following steps:

[0011] Constructing a digital definition information library, wherein the digital definition information library is used to manage device information data of each device in the system, wherein the device information data includes device information and assembly information used to implement model-based digital definition;

[0012] Acquire the target test system and the target equipment it includes;

[0013] Retrieving the device information of each target device from the digital definition information library, constructing a digital definition model based on the device information and storing it in a basic device library of the corresponding target test system;

[0014] Retrieving the digital definition model and the assembly information of each target device from the basic device library and the digital definition information library of the target test system respectively, generating an assembly design scheme of the digital definition model according to the assembly information and storing it in the test system library of the corresponding target test system;

[0015] Digital equipment management of the target test system is performed based on the basic equipment library and the test system library.

[0016] Furthermore, the device information includes size parameters and non-size information, and the step of retrieving the device information of each target device from the digital definition information library and constructing a digital definition model based on the device information includes:

[0017] Determine a first target device for individual modeling and a second target device for batch modeling among the target devices;

[0018] Performing designated device modeling on each of the first target devices respectively to obtain the digital definition model corresponding to the first target device;

[0019] Retrieving the size parameters of each of the second target devices from the digital definition information library and analyzing the structural classification thereof;

[0020] Batch device modeling is performed on each of the second target devices of the same structural classification to obtain the digital definition model corresponding to the second target device.

[0021] Furthermore, the designated device modeling includes:

[0022] Retrieving the device information of the current first target device from the digital definition information library and analyzing the structural classification thereof;

[0023] Writing the size parameter and the non-size information of the current first target device into the size parameter interface and other parameter interfaces of the designated modeling function of the corresponding structural classification respectively;

[0024] The designated modeling function is called to establish a three-dimensional structure model of the current first target device according to the dimension parameters, and the dimension parameters and the non-dimensional information are written into a model file to realize a digital definition of the model, thereby obtaining the digital definition model.

[0025] Furthermore, the batch equipment modeling includes:

[0026] Get the structure type template of the current structure classification;

[0027] Creating a size parameter template for the current structural classification, wherein the size parameter template uses the names of all the size parameters corresponding to the current structural classification as column names and uses the values ​​of the size parameters of all the second target devices in the current structural classification as column data;

[0028] Determine that all the size parameters to be modeled in the size parameter template are configured size parameters;

[0029] The configured size parameters are traversed, and the three-dimensional structure model corresponding to the second target device is established using the structure type template. After retrieving the non-size information corresponding to the configured size parameters from the digital definition information library, the non-size information is written into the corresponding model file together with the size parameters to realize the digital definition of the model, thereby obtaining the digital definition model.

[0030] Furthermore, the three-dimensional structural model is provided with a size constraint, and the size of the three-dimensional structural model is linked to the size parameter through a relational formula.

[0031] Furthermore, generating an assembly design scheme of the digitally defined model according to the assembly information includes:

[0032] Acquiring three-dimensional structural model information of each of the digitally defined models;

[0033] The assembly position is calculated according to the assembly information and the three-dimensional structure model information to form an assembly design scheme, wherein the assembly design scheme includes the translation mode, translation position and rotation mode of each of the digitally defined models.

[0034] Furthermore, the three-dimensional structural model information includes the plane where the model is located, two-dimensional sketch features, three-dimensional entity features, and the size parameters.

[0035] Furthermore, the digital device management of the target test system based on the basic device library and the test system library includes:

[0036] Viewing and deleting the digital definition model by viewing and deleting the model file in the basic equipment library;

[0037] The modification and reconstruction of the digital definition model is achieved by modifying the model file in the basic equipment library.

[0038] Furthermore, the modification and reconstruction of the digital definition model is realized by modifying the model file in the basic equipment library, including:

[0039] Obtain the target model file and the target parameters to be modified;

[0040] Extract all the device information from the target model file;

[0041] Traversing the extracted device information according to parameter category, parameter name or parameter value, and searching for the target parameter;

[0042] Deleting the target parameter by deleting the parameter category of the target parameter;

[0043] Adding the target parameters is achieved by retrieving the target parameters from the digital definition information library and adding them to the target model file;

[0044] The reconstruction of the digital definition model is achieved by updating the parameter value of the target parameter.

[0045] Furthermore, the construction of the digital definition information library includes:

[0046] Get device information data of each device in the system;

[0047] Analyzing the data properties and access requirements of the device information data, wherein the data properties include data type, data size, and relationship between data;

[0048] According to the device information data, define data entities, data attributes and the relationship between the two, and then design a data table structure;

[0049] Based on the data properties, the access requirements and the data table structure, a digital definition information library is constructed.

[0050] Beneficial Effects

[0051] Due to the adoption of the above technical solution, the present invention has the following advantages and positive effects compared with the prior art:

[0052] (1) The present invention realizes parametric modeling of the equipment model with one click by constructing an equipment model based on dimensional parameters, without the need to calculate coordinates to meet dimensional requirements, and can batch build models of the same category without repeated operations; at the same time, by adding all the information of the model during modeling, the digital definition of the equipment is completed without manually adding more information, and the model can be reconstructed by only inputting new dimensional information without modifying the coordinates and other values ​​of the model; it is conducive to personnel who cannot use structural modeling software to quickly and efficiently complete the equipment modeling and assembly required for the test, shorten the test preparation cycle, and facilitate the subsequent digital equipment library management;

[0053] (2) The present invention can manage the models of each model library, realizing one-key opening, one-key deletion, one-key acquisition of parameter information, one-key addition of parameter information, one-key deletion of parameter information, one-key model reconstruction, etc., which is convenient for model preview, modification and management. BRIEF DESCRIPTION OF THE DRAWINGS

[0054] Figure 1 is a flow chart of an embodiment of the present invention;

[0055] Figure 2 is a management flow chart of a digital definition library according to an embodiment of the present invention;

[0056] Figure 3 is a flow chart of modeling a designated device according to an embodiment of the present invention;

[0057] Figure 4 is a flow chart of a modeling function according to an embodiment of the present invention;

[0058] Figure 5 is a schematic diagram of a device model that completes digital definition according to an embodiment of the present invention;

[0059] Figure 6 is a flow chart of establishing a size parameter template according to an embodiment of the present invention;

[0060] Figure 7 is a flow chart of batch modeling according to an embodiment of the present invention;

[0061] Figure 8 is a flow chart of establishing a test system library according to an embodiment of the present invention;

[0062] Fig. 9 4 is a flow chart of digital device management according to an embodiment of the present invention. DETAILED DESCRIPTION

[0063] The present invention will be further described below in conjunction with specific embodiments. It should be understood that these embodiments are only used to illustrate the present invention and are not intended to limit the scope of the present invention. In addition, it should be understood that after reading the content taught by the present invention, those skilled in the art can make various changes or modifications to the present invention, and these equivalent forms fall within the scope limited by the appended claims of the application equally.

[0064] The embodiment of the present invention relates to a digital equipment management method based on parameterized rapid modeling, such as Figure 1 As shown, the following steps are included:

[0065] S1. Building a digital definition library: Building a digital definition library of relevant information for the equipment in the test system; Step S1 specifically includes:

[0066] S101, obtaining information of each device in the test system;

[0067] S102, the process of building a digital definition library includes: demand analysis, conceptual design, logical design, physical design, database creation, and application development; step S102 specifically includes:

[0068] S1021. Requirements analysis: the data types and scope of device information, such as data type, size, relationship between data and access requirements;

[0069] S1022. Conceptual design: define entities, attributes and the relationships between them for device information;

[0070] S1023. Logical design: Design the data table structure and determine the primary key, foreign key and index strategy of each table;

[0071] S1024, physical design: design data access path;

[0072] S1025. Database creation: Use the tools or commands provided by the database management system (DBMS) to create a database and the required tables.

[0073] S1026, Application Development: Write the database access code of the application according to the database structure to implement basic operations such as adding, deleting, modifying and checking data in the S106 data table;

[0074] S2, rapid modeling, building a basic equipment library: establish a basic equipment model in the test system, and interact with the digital definition library in S1 to achieve digital definition of the model; step S2 specifically includes:

[0075] S201, structural model classification, analyze the structure of the equipment in the test system;

[0076] S202, establishing a structural model template according to the structural classification in S201;

[0077] S203, establishing a size parameter template;

[0078] S204, establishing a basic model, which is divided into two ways, one is to model a specific device; the other is to model the same category of models in batches;

[0079] S3, quick assembly, building a test system library: select structural models corresponding to different test systems from the basic equipment library built in S2 for assembly, and complete the establishment of the test system library; step S3 specifically includes:

[0080] S301, obtaining the storage path of the basic equipment library in each test system;

[0081] S302, setting the storage path and name of the test system library;

[0082] S303, selecting a basic equipment model to be assembled;

[0083] S304, designing an assembly plan according to the equipment selected in S303;

[0084] S305, completing the assembly of the equipment according to the assembly plan in S304;

[0085] S306, saving the assembly in S306 to form a test system library;

[0086] S4, digital equipment management: perform file management, parameter management, model reconstruction and other management on the models in the basic equipment library of S2 and the test system library of S3; step S4 specifically includes:

[0087] S401, locate the storage paths of the basic equipment library and the test system library;

[0088] S402, model file management: file information acquisition, model selection, model display, model deletion, etc.;

[0089] S403, model parameter management: model parameter acquisition, model parameter addition, model parameter deletion, etc.;

[0090] S404, model reconstruction: modify the model size and reconstruct it.

[0091] The above steps are further explained below.

[0092] Step S1: construct a digital definition library to implement model-based digital definition (MBD). The digital definition library obtained in step S101 includes:

[0093] (1) Geometric information: such as size parameters;

[0094] (2) Non-geometric information: such as functional parameters, state parameters, etc.;

[0095] (3) Attribute information: such as name, number, product specifications, manufacturer, quality inspection date, etc.;

[0096] (4) Assembly information: such as assembly relationship, etc.

[0097] According to step S102, to construct a digital definition library, it is necessary to select a suitable database management system, use command statements to create a digital definition library Structural_health_monitoring, and create the required table ND_Equipment.

[0098] According to step S1026, a suitable software development platform and programming language are selected to write the access code of the digital definition library to realize the addition, deletion, modification and query of data. Figure 2 As shown, the general process is to establish a database connection, create an SQL command, execute the command and process the result, close the connection and release resources.

[0099] Step S2: On the basis of building the digital definition library, establish a basic equipment library. There are two ways: specifying equipment modeling and batch modeling of the same category of models.

[0100] A. Specify equipment modeling, such as Figure 3 As shown, including:

[0101] S2041, obtaining the dimension parameters and other information of the specified device from the digital definition library obtained in step S102 through step S1026, inputting the dimension information into the dimension parameter interface of the modeling, and inputting other digital information into the other parameter interface of the modeling;

[0102] S2042, setting the storage path and device model name of the test system to which the specified device belongs, and inputting the information into the modeling file saving interface;

[0103] S2043. Call the modeling function to complete the modeling of the specified device, and write the size parameters and other information into the model file to complete the digital definition of the device model.

[0104] The flowchart of the modeling function Modeling_Fun() is as follows Figure 4 As shown, the specific steps are as follows:

[0105] S20431. Set device size parameters, and assign the size information of the specified device obtained in step S1026 to the size parameters. For example, the size parameters of a cuboid include length C, width K, and height G; the size parameters of a cylinder include radius R and height H; the units are all mm, and the formula is as follows:

[0106] 'Length C' = 440 mm (1)

[0107] 'Width K' = 420mm (2)

[0108] 'High G' = 170mm (3)

[0109] 'Radius R' = 19mm (4)

[0110] 'Height H' = 22mm (5)

[0111] S20432. Select the plane where the sketch is located: XY plane, XZ plane or YZ plane;

[0112] S20433. Draw geometric figures in the sketch and set constraints on the dimensions, and edit the formula to link to the dimension parameters. For example, set constraints on the length of the rectangle and edit the formula to link to the length C, set constraints on the width of the rectangle and edit the formula to link to the width K; set constraints on the radius of the circle and edit the formula to link to the radius R;

[0113] S20434. Complete the establishment of the 3D model based on the geometric figure obtained in S20433, set constraints on the size of the 3D model, and edit the formula to link to the size parameters to obtain the relationship between the size of the 3D model and the size parameters. For example, after the rectangle passes through the boss to form a cuboid, the formula for the height of the cuboid is edited to link to the size parameter height G; after the circle passes through the boss to form a cylinder, the formula for the height of the cylinder is edited to link to the size parameter height H. The relationship is as follows:

[0114] 'Parts Assembly\Sketch.1\Length.\Length' = 'Length C' (6)

[0115] 'Parts assembly\Sketch.1\Length.6\Length' = 'Width K' (7)

[0116] 'Parts assembly\boss.1\first limit\length' = 'height G' (8)

[0117] 'Parts Assembly\Sketch.1\Radius.1\Radius' = 'Radius R' (9)

[0118] 'Parts assembly\boss.1\first limit\length' = 'height H' (10)

[0119] S20435: Establish a device information parameter set based on the size parameters and other device information obtained in S1026, and write the device information into the parameter set of the model obtained in S20434, such as Figure 5 As shown;

[0120] S20436. Save the device model according to the storage path and file name of the specified device.

[0121] B. Batch modeling of the same category of models:

[0122] The prerequisite for batch modeling of models of the same category is to first establish the structural model template and size parameter template.

[0123] The steps to establish a structural model template are roughly the same as those for the modeling function. The difference is that the size parameters are assigned the values ​​of the default device rather than the size values ​​of the specified device, and the storage path and file name are the template path and template name.

[0124] The flowchart for establishing the size parameter template is as follows Figure 6 As shown, the specific steps are:

[0125] S2031, creating a design table for the structural model template constructed in S202, with the size parameter names of the equipment as column names and the size parameter values ​​as column data;

[0126] S2032. Statistical test equipment size information. For example, equipment: the data acquisition host is a cuboid, and the size information is 440mm*420mm*170mm; equipment: the sensor is a cylinder, and the size information is R=19mm\H=22mm;

[0127] S2033. Add the dimension information in S2032 to the structural model design table in step S2031 to form a dimension parameter template. When creating a model using the design table, modeling is achieved by setting the following formula. If it is set to 1, a model of the first row of dimension parameters is created. If it is set to 2, a model of the second row of dimension parameters is created, and so on.

[0128] 'Configuration' = 1 (11)

[0129] After completing the establishment of the structural model template and the size parameter template, start batch modeling of all the equipment in the test system. The flow chart of batch modeling is as follows: Figure 7 As shown, the specific steps are:

[0130] S2044, setting the model library storage path of different test systems;

[0131] S2045, select the structure type template created in S202, such as a rectangular template, a cylindrical template, etc.;

[0132] S2046, select the size parameter template corresponding to the structure, such as rectangular parameter template, cylindrical parameter template, etc.;

[0133] S2047. Call the batch modeling function Batch_Modeling_Fun(): traverse all dimension information in the dimension parameter template in S2046 for modeling; query all device information of the device in the digital definition library S1025 through the dimension information, and write it into the model file; traverse the storage path of each device and store the model file to the corresponding path; complete the establishment of all device models in the test system and the digital definition of the equipment.

[0134] Step S3: After the basic equipment library is built, a test system library is established. The flowchart for establishing the test system library is as follows: Figure 8 As shown, the steps of assembly scheme design are as follows (i.e., the specific implementation method of the assembly scheme design function Assemblydesign function()):

[0135] S3041. Obtain the three-dimensional structural model information of each device, including but not limited to: (1) the plane where the model is located; (2) geometric features including: basic voxels such as cubes, cylinders, spheres, cones and tori; point coordinates of geometric figures; features established based on sketches such as stretching (bosses), grooving (grooves), punching, rotating bodies, rotating grooves, ribs, slots and stiffeners, etc.; (3) dimensional parameters.

[0136] S3042, obtaining assembly information of the test system library from the digital definition library obtained in S102 through S1026, the assembly information including but not limited to: relative position relationship between components, assembly connection relationship, etc.;

[0137] S3043. Based on the three-dimensional structural model information and assembly information of the equipment, calculate the position where each device needs to be translated, the translation method (including multiple methods such as specifying coordinate values ​​and defining direction distances), and whether rotation is required, so as to form an assembly design plan.

[0138] The construction process of the test system library is illustrated by taking an example. The test system library includes an acoustic emission test system, a grating optical fiber test system, etc. but is not limited thereto.

[0139] A. Assembly design of acoustic emission health test system, specifically:

[0140] (1) The structure type of the data acquisition host is a cuboid, and the geometric features of the part geometry are obtained: the coordinates of point 3 of the geometric figure in the sketch (H 数据 , V 数据 );

[0141] (2) The structure type of the host signal line is a cylinder. The part is defined as a vector as the coordinate, and the axis system is translated to a reasonable position in the default (absolute) way to connect with the data acquisition host. The coordinate value is set as follows:

[0142] X=H 数据 mm (12)

[0143] Y=V 数据 mm (13)

[0144] Z=0m (14)

[0145] (3) The structure type of the preamplifier is a rectangular parallelepiped. Obtain the parameters of the host signal line parts: length C 主机 ; Get the parameters of the preamplifier part: width K 前置 ; Move the preamplifier part to a reasonable position and connect it to the host signal line in a way that the vector defines the direction and distance. The direction and distance are set as follows:

[0146] Direction = X 部件 (15)

[0147] Distance = C 主机 +K 前置 mm (16)

[0148] (4) The structure type of the probe signal line is a cylinder. The part is defined as a vector as the coordinate, and the axis system is translated to a reasonable position in the default (absolute) way to connect with the preamplifier. The coordinate values ​​are set as follows:

[0149] X=H 数据 +C 主机 +K 前置 mm (17)

[0150] Y=V 数据 mm (18)

[0151] Z=0mm (19)

[0152] (5) The structural type of the sensor is a cylinder. The parameters of the probe signal line are obtained: length C probe; the parameters of the sensor part are obtained: radius R sensor; the sensor part is defined as a vector as the coordinate, and the axis system is the default (absolute) method. It is translated to a reasonable position and connected to the probe signal line. The coordinate values ​​are set as follows:

[0153] X=H 数据 +C 主机 +K 前置 +C 探头 +2R 传感器 mm (20)

[0154] Y=V 数据 mm (21)

[0155] Z=0mm (22)

[0156] (6) All equipment in the acoustic emission test system is placed in a reasonable position and connected together, the assembly is saved, and the assembly design is completed.

[0157] B. Assembly design of grating optical fiber test system, specifically:

[0158] (1) The structure type of the debugger is a cuboid, and the geometric features of the part geometry are obtained: the coordinates of point 3 of the geometric figure in the sketch (H 调试 , V 调试 );

[0159] (2) The structure type of the optical fiber cable is a cylinder. The part is defined as a vector as the coordinate, and the axis system is translated to a reasonable position in the default (absolute) way to connect with the debugging modem. The coordinate values ​​are set as follows:

[0160] X=H 调试 mm (23)

[0161] Y=V 调试 mm (24)

[0162] Z=0mm (25)

[0163] (3) The computer structure type is a cuboid. First, the computer part is rotated in the defined mode of axis-angle, with the axis being the Y axis and the angle being 90 degrees, to obtain the rotated part. Secondly, the parameters of the optical fiber cable part are obtained: length C 光纤 ; Get the parameters of this part of the computer: width K 电脑 ; Define the part as a vector coordinate, and translate it to a reasonable position in the default (absolute) axis system. The coordinate values ​​are set as follows:

[0164] X=C 光纤 +K 电脑 mm (26)

[0165] Y=0mm (27)

[0166] Z=0mm (28)

[0167] (4) All devices in the grating fiber test system are placed in reasonable positions and connected together, the assembly is saved, and the assembly design is completed.

[0168] Step S4: After the basic equipment library is created, the test system library is created through digital equipment management. The basic equipment library and the test system library can be managed simultaneously. Digital equipment management mainly includes file management, parameter management, model reconstruction, etc. The flow chart is as follows: Figure 8 shown.

[0169] A. File Management:

[0170] S4021. Select the model library folder, which refers to the system library storage path, and load all files:

[0171] S4022, select a model file;

[0172] S4022. Check the file information in S4022, including name, type, size, creation time, modification time, directory, etc.

[0173] S4023. The file in S4022 can be deleted or viewed.

[0174] B. Parameter management:

[0175] S4031. Select a model file;

[0176] S4032. Parameter acquisition is mainly achieved by calling the parameter acquisition function Parame_Acq_Fun(): iterates through all parameters in the model parameter set in S4031 (information in the digital definition library added during modeling), and acquires parameters by parameter category, parameter name, and parameter value.

[0177] S4033: The premise of parameter deletion is to select the parameter category for deletion after the parameter is acquired;

[0178] S4034, parameter addition is to select the device information to be added from the digital definition library in step S102 through step S1026;

[0179] S4035. Add the device information in S4034 to the model file;

[0180] S4036. Save the model and complete parameter addition.

[0181] C. Model reconstruction:

[0182] S4041. Select a model file;

[0183] S4042, obtaining model parameters;

[0184] S4043, reassign the parameter value in S4041;

[0185] S4044, updating the model after step S4043;

[0186] S4045. Save the model to complete the model reconstruction.

[0187] Taking the reconstruction of a rectangular model as an example, the reconstruction methods include: reconstructing length, width, height, length and width, length and height, width and height, and length and width and height.

[0188] In summary, the present invention uses the secondary development technology of structural modeling software, combined with the software development platform, database management system, system instruction operation and other technologies, to achieve the rapid establishment of digital device models based on parameters and the management of digital device libraries. The key is to obtain digital information through the interaction between the software and the database management system, and then access the structural modeling software and its function calls through the interface to achieve rapid parametric modeling and rapid assembly, wherein the rapid modeling includes the digital definition of digital devices. The management related to digital devices is achieved through the interaction between the software and the operating system, and the parameter management and model reconstruction are achieved through the call of the software and the structural modeling software and its functions, wherein the parameter management includes the digital definition of digital devices.

Claims

1. A digital equipment management method based on parametric rapid modeling, characterized in that: The following steps are involved: Constructing a digital definition information library, wherein the digital definition information library is used to manage device information data of each device in the system, wherein the device information data includes device information and assembly information used to implement model-based digital definition; Acquire the target test system and the target equipment it includes; Retrieving the device information of each target device from the digital definition information library, constructing a digital definition model based on the device information and storing it in a basic device library of the corresponding target test system; Retrieving the digital definition model and the assembly information of each target device from the basic device library and the digital definition information library of the target test system respectively, generating an assembly design scheme of the digital definition model according to the assembly information and storing it in the test system library of the corresponding target test system; Digital equipment management of the target test system is performed based on the basic equipment library and the test system library.

2. The method according to claim 1, characterized in that The device information includes size parameters and non-size information, and the extracting the device information of each target device from the digital definition information library and constructing a digital definition model based on the device information includes: Determine a first target device for individual modeling and a second target device for batch modeling among the target devices; Performing designated device modeling on each of the first target devices respectively to obtain the digital definition model corresponding to the first target device; The size parameters of each second target device are retrieved from the digital definition information library and the structural classification thereof is analyzed; batch device modeling is performed on each second target device of the same structural classification to obtain the digital definition model corresponding to the second target device.

3. The method according to claim 2, characterized in that The specified equipment modeling includes: Retrieving the device information of the current first target device from the digital definition information library and analyzing the structural classification thereof; Writing the size parameter and the non-size information of the current first target device into the size parameter interface and other parameter interfaces of the designated modeling function of the corresponding structural classification respectively; The designated modeling function is called to establish a three-dimensional structure model of the current first target device according to the dimension parameters, and the dimension parameters and the non-dimensional information are written into a model file to realize a digital definition of the model, thereby obtaining the digital definition model.

4. The method according to claim 3, characterized in that The batch equipment modeling includes: Get the structure type template of the current structure classification; Creating a size parameter template for the current structural classification, wherein the size parameter template uses the names of all the size parameters corresponding to the current structural classification as column names and uses the values ​​of the size parameters of all the second target devices in the current structural classification as column data; Determine that all the size parameters to be modeled in the size parameter template are configured size parameters; The configured size parameters are traversed, and the three-dimensional structure model corresponding to the second target device is established using the structure type template. After retrieving the non-size information corresponding to the configured size parameters from the digital definition information library, the non-size information is written into the corresponding model file together with the size parameters to realize the digital definition of the model, thereby obtaining the digital definition model.

5. The method according to claim 4, characterized in that The three-dimensional structural model is provided with a size constraint, and the size of the three-dimensional structural model is linked to the size parameter through a relational formula.

6. The method according to claim 5, characterized in that The step of generating an assembly design scheme of the digitally defined model according to the assembly information comprises: Acquiring three-dimensional structural model information of each of the digitally defined models; The assembly position is calculated according to the assembly information and the three-dimensional structure model information to form an assembly design scheme, wherein the assembly design scheme includes the translation mode, translation position and rotation mode of each of the digitally defined models.

7. The method according to claim 6, characterized in that The three-dimensional structure model information includes the plane where the model is located, two-dimensional sketch features, three-dimensional entity features, and the size parameters.

8. The method according to claim 5, characterized in that The digital device management of the target test system based on the basic device library and the test system library includes: Viewing and deleting the digital definition model by viewing and deleting the model file in the basic equipment library; The modification and reconstruction of the digital definition model is achieved by modifying the model file in the basic equipment library.

9. The method according to claim 8, characterized in that The modification and reconstruction of the digital definition model by modifying the model file in the basic equipment library includes: Obtain the target model file and the target parameters to be modified; Extract all the device information from the target model file; Traversing the extracted device information according to parameter category, parameter name or parameter value, and searching for the target parameter; Deleting the target parameter by deleting the parameter category of the target parameter; Adding the target parameters is achieved by retrieving the target parameters from the digital definition information library and adding them to the target model file; The reconstruction of the digital definition model is achieved by updating the parameter value of the target parameter.

10. The method according to claim 1, characterized in that The construction of the digital definition information database includes: Get device information data of each device in the system; Analyzing the data properties and access requirements of the device information data, wherein the data properties include data type, data size, and relationship between data; According to the device information data, define data entities, data attributes and the relationship between the two, and then design a data table structure; Based on the data properties, the access requirements and the data table structure, a digital definition information library is constructed.

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