Magnetic powder flaw detection equipment and detection method

Abstract

The invention relates to the field of locomotive part nondestructive inspection, in particular to magnetic powder inspection equipment and a magnetic powder inspection method. The magnetic powder flaw detection equipment comprises a first tool jig, a second tool jig and an overturning platform, wherein the first tool jig is used for supporting a to-be-detected workpiece on the first tool jig in a first posture; the second tool jig is used for enabling the to-be-detected workpiece to be supported on the second tool jig in a second posture, and the second posture is a posture in which the first posture is turned over by 90 degrees; the overturning platform comprises a first overturning plate and a second overturning plate, a first tool jig is arranged on the first overturning plate, a second tool jig is arranged on the second overturning plate, and the first overturning plate and the second overturning plate are rotationally connected through an overturning shaft so that the first overturning plate and the second overturning plate can be arranged in a relatively rotatable mode. According to the magnetic powder flaw detection equipment disclosed by the invention, the workpiece can be overturned by utilizing the detection equipment, so that manual overturning of the workpiece can be avoided, manpower can be saved, and conditions are provided for automatic flaw detection of a machine.

Description

Technical Field

[0001] The present disclosure relates to the field of nondestructive flaw detection of locomotive parts, and in particular to a magnetic particle flaw detection device and a detection method. Background Art

[0002] Magnetic particle testing is one of the non-destructive testing methods for materials, used to detect defects such as cracks on metal surfaces. The basic principle of magnetic particle testing is to magnetize the workpiece made of ferromagnetic materials, and use the leakage magnetic field of the defective part to absorb the magnetic powder. Through the accumulation and distribution of magnetic powder in the leakage magnetic field near the defect, the defects on the surface or near the surface of the workpiece are detected. Therefore, magnetic particle testing is intuitive and highly sensitive.

[0003] In the related art, when determining magnetic traces, the magnetized workpiece is usually directly lifted by a cantilever crane, and the workpiece is manually turned over to observe, identify and determine the magnetic traces on all sides of the workpiece using ultraviolet light. The inspectors are exposed to ultraviolet light in a dark room for a long time, the working environment is poor, and the labor intensity is high, which can easily cause visual fatigue, resulting in missed inspections and misjudgments.

[0004] It should be noted that the information disclosed in the above background technology section is only used to enhance the understanding of the background of the present disclosure, and therefore may include information that does not constitute the prior art known to ordinary technicians in the field. Summary of the invention

[0005] The purpose of the present disclosure is to provide a magnetic particle flaw detection device and a magnetic particle flaw detection method, which can use the detection device to flip the workpiece, thereby avoiding manual flipping of the workpiece, thereby saving manpower and providing conditions for automatic machine flaw detection.

[0006] According to one aspect of the present disclosure, there is provided a magnetic particle flaw detection device, comprising:

[0007] A first fixture, used to support the workpiece to be measured on the first fixture in a first posture;

[0008] A second fixture is used to support the workpiece to be measured on the second fixture in a second posture, where the second posture is a posture in which the first posture is flipped 90°;

[0009] The flipping platform comprises a first flipping plate and a second flipping plate. The first flipping plate is provided with a first tooling fixture, and the second flipping plate is provided with a second tooling fixture. The first flipping plate and the second flipping plate are rotationally connected through a flipping shaft so that the first flipping plate and the second flipping plate are relatively rotatably arranged.

[0010] In an exemplary embodiment of the present disclosure, the flip platform includes a support plate, the flip shaft is supported on the support plate through a support bearing, a first flip bearing and a second flip bearing are sleeved on the flip shaft, a first flip driven wheel is sleeved on an outer ring of the first flip bearing, and a second flip driven wheel is sleeved on an outer ring of the second flip bearing; the first flip plate is connected to the first flip driven wheel, and the second flip plate is connected to the second flip driven wheel;

[0011] Wherein, the first flip driven wheel drives the first flip plate to rotate around the flip axis under the drive of the first flip power mechanism; the second flip driven wheel drives the second flip plate to rotate around the flip axis under the drive of the second flip power mechanism.

[0012] In an exemplary embodiment of the present disclosure, the first flip driven wheel is a sector gear, and the center angle of the first flip driven wheel is not greater than 180° and not less than 100°; and / or, the second flip driven wheel is a sector gear, and the center angle of the second flip driven wheel is not greater than 180° and not less than 100°.

[0013] In an exemplary embodiment of the present disclosure, the first flipping power mechanism includes a first motor and a first flipping driving wheel transmission-connected to the first motor, the first flipping driving wheel meshes with the first flipping driven wheel, and the second flipping power mechanism includes a second motor and a second flipping driving wheel transmission-connected to the second motor, the second flipping driving wheel meshes with the second flipping driven wheel;

[0014] The axis of the first flip driving wheel and the axis of the second flip driving wheel are symmetrical with respect to the flip axis, and the first flip driving wheel and the second flip driving wheel are arranged opposite to each other in a direction perpendicular to the flip axis.

[0015] In an exemplary embodiment of the present disclosure, a first flip proximity switch is provided on the support plate, the first flip proximity switch faces the first flip driven wheel, a first mark is provided on the first flip driven wheel, and the first flip proximity switch is used to obtain the angle of the first mark rotating along with the first flip driven wheel; and / or, a second flip proximity switch is provided on the support plate, the second flip proximity switch faces the second flip driven wheel, a second mark is provided on the second flip proximity switch, and the second flip proximity switch is used to obtain the angle of the second mark rotating along with the second flip driven wheel.

[0016] In an exemplary embodiment of the present disclosure, the magnetic particle flaw detection equipment includes a base, a rotating driven wheel is provided between a support plate and the base, the axis of the rotating driven wheel intersects and is perpendicular to the axis of the flip axis, the support plate is rotatably connected to the base through the rotating driven wheel, and the rotating driven wheel rotates under the drive of a rotating power mechanism to drive the flip platform to rotate.

[0017] In an exemplary embodiment of the present disclosure, the rotating power mechanism is disposed on the base, and the rotating power mechanism includes a rotating driving wheel and a third motor, the rotating driving wheel is meshed with the rotating driven wheel, and the third motor is disposed on a side of the base away from the support plate.

[0018] In an exemplary embodiment of the present disclosure, a rotary proximity switch is provided between the base and the support plate, the rotary proximity switch faces the support plate, a third mark is provided on the support plate, and the rotary proximity switch is used to obtain the angle of the third mark as the support plate rotates.

[0019] In an exemplary embodiment of the present disclosure, the magnetic particle flaw detection equipment also includes a feeding mechanism, which includes a feeding rail and a feeding motor. The base is slidably connected to the feeding rail, and the feeding motor is used to drive the base to slide along the feeding rail so that the base has at least a feeding station and an inspection station on the feeding rail.

[0020] In an exemplary embodiment of the present disclosure, the magnetic particle flaw detection equipment also includes an image acquisition mechanism, including a manipulator and a camera installed on the manipulator; the manipulator is adjacent to the first flip plate, and the manipulator is used to drive the camera to capture an image of the workpiece to be tested located on the second flip plate; or, the manipulator is adjacent to the second flip plate, and the manipulator is used to drive the camera to capture an image of the workpiece to be tested located on the first flip plate.

[0021] According to one aspect of the present disclosure, a magnetic particle flaw detection method is provided, using any one of the magnetic particle flaw detection devices described above, the magnetic particle flaw detection method comprising:

[0022] Supporting the workpiece to be measured on a first fixture in a first posture;

[0023] Carry out the first image acquisition of the workpiece to be measured;

[0024] Driving the second flip plate to rotate 90° around the flip axis in the first direction so that the second fixture contacts the workpiece to be measured;

[0025] Driving the first flip plate and the second flip plate to synchronously rotate 90° around a second direction, the second direction being opposite to the first direction;

[0026] Driving the first flip plate to rotate 90° around the first direction so that the first flip plate is parallel to the second flip plate;

[0027] A second image acquisition is performed on the workpiece to be measured.

[0028] The magnetic particle flaw detection equipment disclosed in the present invention can use the first flip plate and the first fixture, the second flip plate and the second fixture to flip the workpiece to be tested by 90 degrees, thereby flipping the workpiece to be tested from the first posture to the second posture. The problem of high manual labor intensity and low detection efficiency in the determination of magnetic traces of locomotive castings is solved, which can replace manual labor to save costs and improve the efficiency of magnetic trace determination of locomotive castings. Moreover, since the workpiece to be tested can be flipped by the detection equipment, manual flipping and moving of the workpiece to be tested are eliminated, it can further cooperate with machine vision to completely liberate the manual operation in the defect detection of the workpiece to be tested and improve the automation level of magnetic particle flaw detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] The accompanying drawings herein are incorporated into the specification and constitute a part of the specification, illustrate embodiments consistent with the present disclosure, and together with the specification are used to explain the principles of the present disclosure. Obviously, the accompanying drawings described below are only some embodiments of the present disclosure, and for ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without creative work.

[0030] In order to better understand the present disclosure, reference may be made to the embodiments shown in the following drawings. The components in the drawings are not necessarily to scale, and related elements may be omitted in order to emphasize and clearly illustrate the technical features of the present disclosure. In addition, related elements or components may have different arrangements as known in the art. In addition, in the drawings, the same reference numerals represent the same or similar components in each drawing. Among them:

[0031] Figure 1 A schematic diagram of an exemplary embodiment of the magnetic particle flaw detection device disclosed in the present invention;

[0032] Figure 2 A schematic diagram of a flipping platform in an exemplary embodiment of the magnetic particle flaw detection device disclosed in the present invention;

[0033] Figure 3 A schematic diagram of a flipping platform in an exemplary embodiment of the magnetic particle flaw detection device disclosed in the present invention;

[0034] Figure 4 A schematic diagram of a flipping platform in an exemplary embodiment of the magnetic particle flaw detection device disclosed in the present invention;

[0035] Figure 5 It is a schematic diagram of placing a workpiece to be tested on a turning platform in an exemplary embodiment of the magnetic particle flaw detection device disclosed in the present invention;

[0036] Figure 6 It is a schematic diagram of placing a workpiece to be tested on a turning platform in an exemplary embodiment of the magnetic particle flaw detection device disclosed in the present invention;

[0037] Figure 7 It is a schematic diagram of an exemplary embodiment of the magnetic particle flaw detection device disclosed in the present invention, in which a workpiece to be tested is supported on a second tooling fixture in a second posture;

[0038] Figure 8 A schematic diagram of a rotating driven wheel and a rotating power mechanism in an exemplary embodiment of the magnetic particle flaw detection device disclosed in the present invention;

[0039] Fig. 9 It is a schematic diagram of a rotating driven wheel and a rotating power mechanism in an exemplary embodiment of the magnetic particle flaw detection device disclosed in the present invention.

[0040] The following are the descriptions of the reference numerals:

[0041] 100. workpiece to be measured; 101. first surface; 11. first flip plate; 12. second flip plate; 13. flip shaft; 21. support bearing; 22. support plate; 23. first flip bearing; 24. second flip bearing; 31. first flip driven wheel; 32. second flip driven wheel; 33. first flip driving wheel; 341. first flip proximity switch; 4. base; 41. rotating driven wheel; 42. rotating driving wheel; 43. third motor; 44. rotating proximity switch; 51. manipulator; 52. camera. DETAILED DESCRIPTION

[0042] The following will be combined with the accompanying drawings in the exemplary embodiments of the present disclosure to clearly and completely describe the technical solutions in the exemplary embodiments of the present disclosure. The exemplary embodiments described herein are only for illustrative purposes and are not intended to limit the scope of protection of the present disclosure. Therefore, it should be understood that various modifications and changes can be made to the exemplary embodiments without departing from the scope of protection of the present disclosure.

[0043] Unless otherwise specified or explained, the technical terms or scientific terms used in the present disclosure shall have the usual meanings understood by persons with ordinary skills in the field to which the present disclosure belongs. The present disclosure uses "first" and "second" etc. only as markings, and does not limit the quantity, importance or order of its objects. The words "include" or "comprise" mean that the elements appearing before the word include the elements listed after the word and their equivalents, without excluding other elements. The terms "connected", "fixed" etc. should be understood in a broad sense. For example, "connected" can be a fixed connection, a movable connection, an integral connection, or a detachable connection, and can be directly connected or indirectly connected through an intermediate medium.

[0044] The “Part A is arranged on Part B” mentioned in the present disclosure may mean that Part A is directly connected to Part B, or Part A may be arranged on Part C, and Part C may be arranged on Part B.

[0045] Furthermore, it should be understood that the directional words such as "upper", "lower", "inner side", "outer side" and the like described in the exemplary embodiments of the present disclosure are only used to indicate relative positional relationships. For convenience, the description is made according to the position and state of the detection device when it is actually working, or according to the angles shown in the drawings, which should not be understood as limiting the exemplary embodiments of the present disclosure. For example, the workpiece 100 to be measured is the upper side, the flip platform is the lower side, and the workpiece 100 to be measured is placed on the flip platform. For example, the side close to the image acquisition mechanism is the inner side, and the side away from the image acquisition mechanism is the outer side.

[0046] Those skilled in the art will appreciate that when the absolute position of the object being described changes, the relative position relationship may also change accordingly. For example, after rotating the structure in the exemplary embodiment of the present disclosure or changing the direction and viewing angle of observation, "up" may also become "down" or "left" or "right", and such changes will not cause obstacles to the understanding of those skilled in the art.

[0047] In the related art, the magnetic trace determination of castings is to directly lift the magnetized workpiece with a cantilever crane, manually flip the workpiece, and observe, identify and determine the magnetic traces on all sides of the workpiece using ultraviolet light. This method has the following disadvantages: the inspectors need to manually flip the workpiece, and are exposed to ultraviolet light in a dark room for a long time, which leads to poor working environment and visual fatigue, resulting in missed inspections; the inspection results are greatly affected by the experience level of the flaw detectors, and largely depend on the experience and sense of responsibility of the operators, which can easily lead to misjudgment and bury hidden dangers for product quality.

[0048] In view of the above problems, according to one aspect of the present disclosure, a magnetic particle flaw detection equipment is provided, including a first fixture, a second fixture and a flip platform, the first fixture is used to support the workpiece 100 to be tested on the first fixture in a first posture; the second fixture is used to support the workpiece 100 to be tested on the second fixture in a second posture, and the second posture is a posture in which the first posture is flipped 90°; the flip platform includes a first flip plate 11 and a second flip plate 12, the first flip plate 11 is provided with the first fixture, the second flip plate 12 is provided with the second fixture, and the first flip plate 11 and the second flip plate 12 are rotatably connected by a flip shaft 13, so that the first flip plate 11 and the second flip plate 12 are relatively rotatably arranged.

[0049] The magnetic particle flaw detection device disclosed in the present invention can flip the workpiece 100 to be tested. For ease of understanding, a process of flipping the workpiece 100 to be tested by the magnetic particle flaw detection device disclosed in the present invention is provided: the workpiece 100 to be tested is a motor hanger. In the initial state, the workpiece 100 to be tested is supported on the first tooling fixture on the first flip plate 11 in a first posture, and the first flip plate 11 is parallel to the second flip plate 12. Taking the counterclockwise flipping of the workpiece 100 to be tested as an example, when flipping, the second flip plate 12 flips 90° clockwise, so that the second tooling fixture contacts the side of the workpiece 100 to be tested. The second tooling fixture is adapted to the second posture of the workpiece 100 to be tested flipped 90° from the first posture, so the workpiece 100 to be tested can be supported on the side of the workpiece 100 to be tested, and the workpiece 100 to be tested is clamped by the first tooling fixture and the second tooling fixture (the first flip plate 11 and the second flip plate 12). The first flip plate 11 and the second flip plate 12 are flipped 90° counterclockwise at the same time, and the second flip plate 12 returns to a horizontal state, and the first flip plate 11 becomes an upright state. The workpiece 100 to be measured is also flipped 90° counterclockwise. The second fixture is supported on the bottom surface of the workpiece 100 to be measured in the second posture (the left side in the first posture), and the first fixture is supported on the right side of the workpiece 100 to be measured in the second posture (the bottom surface in the first posture). Finally, the first flip plate 11 can be flipped 90° clockwise, the first fixture is separated from the workpiece 100 to be measured, and the first flip plate 11 and the second flip plate 12 return to a state of being parallel to each other.

[0050] The magnetic particle flaw detection equipment disclosed in the present invention can use the first flip plate 11 and the first fixture, the second flip plate 12 and the second fixture to flip the workpiece 100 to be tested by 90 degrees, thereby flipping the workpiece 100 to be tested from the first posture to the second posture. The problem of high manual labor intensity and low detection efficiency in the determination of magnetic traces of locomotive castings is solved, and it can replace manual labor to save costs and improve the efficiency of magnetic trace determination of locomotive castings. Moreover, since the workpiece 100 to be tested can be flipped by the detection equipment, manual flipping and moving of the workpiece 100 to be tested are eliminated, it can further cooperate with machine vision to completely liberate the manual operation in the defect detection of the workpiece 100 to be tested, and improve the automation level of magnetic particle flaw detection.

[0051] In an exemplary embodiment of the present disclosure, the first fixture and the second fixture are used to contact the workpiece 100 to be measured. The parts include conical surfaces. Figure 1As shown, the first jig and the second jig both include a plurality of support columns, the positions of the support columns of the first jig are designed according to the first posture of the workpiece 100 to be measured, and the positions of the support columns of the second jig are designed according to the second posture of the workpiece 100 to be measured. The end of the support column away from the flip platform has a conical surface. The workpiece 100 to be measured is in contact with the conical surface of each support column, so that the workpiece 100 to be measured and the first jig and the second jig are in line contact, which can reduce the contact area between the first jig and the second jig and the workpiece 100 to be measured, thereby avoiding damage to the magnetic traces that have been formed.

[0052] The magnetic particle flaw detection device may further include an image acquisition mechanism, which includes a manipulator 51 and a camera 52 installed on the manipulator 51. Figure 1 As shown, the manipulator 51 is adjacent to the second flip plate 12, and the manipulator 51 is used to drive the camera 52 to collect images of the workpiece 100 to be measured on the first flip plate 11. Exemplarily, the manipulator 51 can also drive the camera 52 to collect images of the workpiece 100 to be measured on the second flip plate 12. The camera 52 collects images of the workpiece 100 to be measured in the first posture on the first flip plate 11 and the workpiece 100 to be measured in the second posture on the second flip plate 12, and can collect images of the entire periphery of the workpiece 100 to be measured. The collected images are uploaded to the industrial computer, and machine vision can replace manual labor to perform all-round magnetic trace observation and judgment of locomotive castings, thereby achieving the effect of improving detection efficiency, reducing the labor intensity of workers, and avoiding defects caused by manual judgment. Missed detection.

[0053] Exemplarily, the image acquisition mechanism also includes an ultraviolet light source, which is adjacent to the camera 52, and the manipulator 51 is used to drive the ultraviolet light source and the camera 52 to acquire images of the workpiece 100 to be measured. Exemplarily, the manipulator 51 can also drive the ultraviolet light source to move to the ultraviolet lamp irradiator to determine whether the ultraviolet irradiance meets the requirements. If so, the equipment continues to operate, otherwise, the equipment alarms and the staff checks the problem.

[0054] Or in another exemplary embodiment, the robot arm 51 is adjacent to the first flip plate 11 , which will not be described in detail in the present disclosure.

[0055] Please refer to Figure 1 The schematic diagram of the magnetic particle flaw detection equipment shown in FIG. Figures 2 to 4 The schematic diagram of the flip platform shown and Figure 5 , Figure 6 The workpiece 100 to be tested is placed on the turning platform. Figure 1 , Figure 6In the figure, the first jig on the first flip plate 11 and the second jig on the second flip plate 12 both show the workpiece 100 to be tested, but this expression is only to illustrate the first posture and the second posture of the workpiece 100 to be tested. In fact, during the flaw detection process, according to the process of the flip platform action given in the above exemplary embodiment, there is only one workpiece 100 to be tested on the flip platform (the first flip plate 11 and the second flip plate 12), for example Figure 7 shown.

[0056] In an exemplary embodiment of the present disclosure, reference Figure 5 As shown, the flip platform includes a support plate 22, and the flip shaft 13 is supported on the support plate 22 through a support bearing 21. The first flip plate 11 and the second flip plate 12 are respectively located on both sides of the flip shaft 13, and the first flip bearing 23 and the second flip bearing 24 are sleeved on the flip shaft 13. The outer ring of the bearing of the first flip bearing 23 is sleeved with a first flip driven wheel 31, and the outer ring of the bearing of the second flip bearing 24 is sleeved with a second flip driven wheel 32. The first flip plate 11 is connected to the first flip driven wheel 31, and the second flip plate 12 is connected to the second flip driven wheel 32. Among them, the first flip driven wheel 31 drives the first flip plate 11 to rotate around the flip shaft 13 under the drive of the first flip power mechanism; the second flip driven wheel 32 drives the second flip plate 12 to rotate around the flip shaft 13 under the drive of the second flip power mechanism.

[0057] Exemplarily, the first flipping power mechanism and the second flipping power mechanism independently drive the first flipping driven wheel 31 and the second flipping driven wheel 32 respectively, so that the first flipping plate 11 and the second flipping plate 12 flip relatively independently. Figure 3 as well as Figure 6 As shown, the first flipping power mechanism includes a first motor and a first flipping driving wheel 33 drivingly connected to the first motor, and the first flipping driving wheel 33 is meshed with the first flipping driven wheel 31. Similarly, the second flipping power mechanism includes a second motor and a second flipping driving wheel drivingly connected to the second motor, and the second flipping driving wheel is meshed with the second flipping driven wheel 32.

[0058] refer to Figure 2 As shown, exemplarily, the axis of the first flip driving wheel 33 and the axis of the second flip driving wheel are symmetrical with respect to the flip axis 13, and the first flip driving wheel 33 and the second flip driving wheel are arranged opposite to each other in a direction perpendicular to the flip axis 13. For example, the output shaft of the first motor is coaxial with the first flip driving wheel 33, the output shaft of the second motor is coaxial with the second flip driving wheel, the output shaft of the first motor and the output shaft of the second motor are opposite to each other, and are staggered in the axial direction.

[0059] In an exemplary embodiment of the present disclosure, the first flip driven wheel 31 and the second flip driven wheel 32 may both be incomplete gears, that is, the first flip driven wheel 31 and the second flip driven wheel 32 may both be sector gears. For example, the first flip driven wheel 31 is a sector gear, and the central angle of the first flip driven wheel 31 is not greater than 180° and not less than 100°. Figure 3 , Figure 4 , Figure 6 and Figure 7 As shown, Figure 3 The outline of the first flip driven wheel 31 is shown in FIG. 1 , and the pitch circle of the first flip driven wheel 31 is shown by a dashed line. Figure 4 for Figure 3 Side view of.

[0060] Exemplarily, the central angle of the first flip driven wheel 31 is 180°. When the first flip plate 11 and the second flip plate 12 are parallel to each other and flatly laid parallel to the support plate 22, the first flip driven wheel 31 is just below the bottom surfaces of the first flip plate 11 and the second flip plate 12.

[0061] In an exemplary embodiment of the present disclosure, the second flip driven wheel 32 may be a sector gear, and the central angle of the second flip driven wheel 32 is not greater than 180° and not less than 100°. Figure 3 , Figure 4 , Figure 5 , Figure 6 As shown, the central angle of the second flip driven wheel 32 can be equal to the central angle of the first flip driven wheel 31. For example, the central angle of the second flip driven wheel 32 is 180°, and when the first flip plate 11 and the second flip plate 12 are parallel to each other and flattened parallel to the support plate 22, the second flip driven wheel 32 is just below the bottom surface of the first flip plate 11 and the second flip plate 12. Figure 3 As shown, when the first flip plate 11 and the second flip plate 12 are flat, the orthographic projections of the pitch circles of the first flip driven wheel 31 and the second flip driven wheel 32 in the plane perpendicular to the flip axis 13 coincide.

[0062] For example, reference Figure 7 The workpiece 100 to be tested is shown as a schematic diagram of being supported on the second fixture in a second posture after being flipped 90°. The second flip plate 12 is parallel to the support plate 22, the first flip plate 11 is upright and perpendicular to the second flip plate 12, and in the plane of the vertical flip axis 13, the first flip driven wheel 31 rotates 90° clockwise relative to the second flip driven wheel 32.

[0063] In an exemplary embodiment of the present disclosure, reference Figure 4 and Figure 5As shown, a first flip proximity switch 341 is provided on the support plate 22, and the first flip proximity switch 341 faces the first flip driven wheel 31. A first mark is provided on the first flip driven wheel 31, and the first flip proximity switch 341 is used to obtain the angle at which the first mark rotates along with the first flip driven wheel 31. For example, the first mark is a small hole provided on the first flip driven wheel 31, and is used to mark the angle at which the first flip driven wheel 31 rotates. The first flip proximity switch 341 determines whether the first flip plate 11 is rotated in place or over-rotated by identifying the first mark, and sends a signal to the PLC when the first flip plate 11 is not rotated in place or over-rotated, and an alarm is issued through the PLC to prompt the operator to intervene.

[0064] In an exemplary embodiment of the present disclosure, a second flip proximity switch is provided on the support plate 22, the second flip proximity switch faces the second flip driven wheel 32, a second mark is provided on the second flip proximity switch, and the second flip proximity switch is used to obtain the angle at which the second mark rotates along with the second flip driven wheel 32. For example, the second mark is a small hole provided on the second flip driven wheel 32, which is used to mark the angle at which the second flip driven wheel 32 rotates. The second flip proximity switch determines whether the second flip plate 12 is rotated in place or over-rotated by identifying the second mark, and sends a signal to the PLC when the second flip plate 12 is not rotated in place or over-rotated, and an alarm is issued through the PLC to prompt the operator to intervene.

[0065] In an exemplary embodiment of the present disclosure, the magnetic particle flaw detection device may include a first flip proximity switch 341 but not a second flip proximity switch, or include a second flip proximity switch but not a first flip proximity switch 341, or include both the first flip proximity switch 341 and the second flip proximity switch. The first flip proximity switch 341 and the second flip proximity switch may be used to detect whether the rotation angles of the first flip plate 11 and the second flip plate 12 meet the requirements, respectively.

[0066] In an exemplary embodiment of the present disclosure, the magnetic particle flaw detection equipment includes a base 4, and a rotating driven wheel 41 is provided between the support plate 22 and the base 4. The axis of the rotating driven wheel 41 intersects and is perpendicular to the axis of the flip axis 13. The support plate 22 is rotatably connected to the base 4 through the rotating driven wheel 41. The rotating driven wheel 41 rotates under the drive of the rotating power mechanism to drive the flip platform to rotate.

[0067] refer to Figures 6 to 9 As shown, the rotating driven wheel 41 is arranged at the bottom of the supporting plate 22, and the rotating driven wheel 41 is driven to rotate by the rotating power mechanism, so that the flip platform can be rotated as a whole.

[0068] For ease of understanding, a process of performing image acquisition on a workpiece 100 by a magnetic particle flaw detection device disclosed in the present invention is provided: the workpiece 100 to be measured is a motor hanger, and in an initial state, the workpiece 100 to be measured is supported on a first fixture on a first flip plate 11 in a first posture, and the first flip plate 11 is parallel to the second flip plate 12. The manipulator 51 is adjacent to the second flip plate 12, and the manipulator 51 drives the camera 52 to perform a first image acquisition on the workpiece 100 to be measured in the first posture on the first flip plate 11.

[0069] After the first image acquisition is completed, the workpiece 100 to be measured is turned over onto the second turning plate 12 to Figure 1 As shown, the workpiece 100 to be measured is flipped counterclockwise as an example. When flipping, the second flip plate 12 flips 90° clockwise, so that the second fixture contacts the side of the workpiece 100 to be measured. The first flip plate 11 and the second flip plate 12 are flipped 90° counterclockwise at the same time, the second flip plate 12 returns to a horizontal state, and the first flip plate 11 becomes an upright state. The first flip plate 11 is flipped 90° clockwise, the first fixture is separated from the workpiece 100 to be measured, and the first flip plate 11 and the second flip plate 12 return to a state of being parallel to each other.

[0070] At this time, the workpiece 100 to be measured is supported by the second fixture on the second flip plate 12 in a second posture and is adjacent to the robot arm 51 .

[0071] The rotary driven wheel 41 is driven to rotate by the rotary power mechanism, so that the flip platform is rotated 180° as a whole, that is, the positions of the first flip plate 11 and the second flip plate 12 are exchanged, the first flip plate 11 is located on the side close to the manipulator 51, and the second flip plate 12 is located on the side away from the manipulator 51. The manipulator 51 drives the camera 52 to perform a second image acquisition of the workpiece 100 to be measured on the second flip plate 12.

[0072] During the first image acquisition process, the bottom surface of the workpiece 100 in contact with the first fixture cannot be captured, while this surface is flipped to the side that is not in contact with the second fixture during the second image acquisition process, so that it can be photographed by the camera 52.

[0073] At the same time, during the two image acquisition processes, the camera 52 acquires images of the workpiece 100 to be measured that is located at a position away from the manipulator 51. Compared with the implementation method in which the positions of the first flip plate 11 and the second flip plate 12 relative to the manipulator 51 are fixed, the travel of the camera 52 driven by the manipulator 51 can be reduced, thereby improving the detection accuracy.

[0074] In addition, in one embodiment, during the first image acquisition process, the camera 52 acquires images of all surfaces except the bottom surface of the workpiece 100 to be measured that contacts the first fixture and the first surface 101 away from the manipulator 51. During the second image acquisition process, the camera 52 acquires images of the side surface of the workpiece 100 to be measured that is close to the first flip plate 11 (the bottom surface that contacts the first fixture before flipping / in the first posture), and the first surface 101 (the top surface away from the second fixture after flipping / in the second posture).

[0075] During the first image acquisition process, the first surface 101 of the workpiece 100 to be measured, which is far away from the manipulator 51, is limited by the arm span of the manipulator 51, and the object distance is large, which easily leads to insufficient recognition accuracy. In the above exemplary embodiment, the image of the first surface 101 is acquired during the second image acquisition process, which can improve the recognition accuracy of the first surface 101.

[0076] In an exemplary embodiment of the present disclosure, the magnetic particle flaw detection device further includes a feeding mechanism, which may include a feeding track and a feeding motor. The base 4 is slidably connected to the feeding track, and the feeding motor is used to drive the base 4 to slide along the feeding track, so that the base 4 has at least a feeding station and a detection station on the feeding track.

[0077] Specifically, the detection station is adjacent to the image acquisition mechanism, for example Figure 1 , a schematic diagram of a base 4 located at a testing station in an exemplary embodiment is shown, and the loading mechanism and the loading station are not shown in the figure. For example, before the test, the base 4 is located at the loading station, and the workpiece 100 to be tested that has been magnetized and sprayed with the flaw detection liquid is hoisted to the loading station by a crane and placed on the first fixture. After placement, the loading motor is started, and the base 4 drives the workpiece 100 to be tested to slide along the loading track to the testing station, and performs the testing process given in the above exemplary embodiment.

[0078] After the image acquisition mechanism completes two image acquisitions, the image acquisition mechanism can transmit the acquired images to the industrial computer, and the algorithm system can output the detection results using software. At the same time, the base 4 returns to the loading station for unloading, and at the same time, the workpiece 100 to be tested can be marked. In an exemplary embodiment, after the marking is completed, the rotary power mechanism drives the rotary driven wheel 41 to rotate, so that the flip platform rotates 180° as a whole and returns to the initial position, and the subsequent workpiece 100 to be tested can be placed to enter the next cycle.

[0079] In an exemplary embodiment of the present disclosure, reference Figures 6 to 9 As shown, Figure 6 , Figure 7 A schematic diagram showing an exemplary embodiment of a magnetic particle flaw detection device (without showing the image acquisition mechanism), Figure 8 , Fig. 9 The schematic diagram of the rotating driven wheel 41 and the rotating power mechanism is shown. The rotating power mechanism is arranged on the base 4, and the rotating power mechanism includes a rotating driving wheel 42 and a third motor 43. The rotating driving wheel 42 is meshed with the rotating driven wheel 41, and the third motor 43 is arranged on the side of the base 4 away from the support plate 22. For example, the rotating driving wheel 42 is coaxial with the output shaft of the third motor 43, and the output shaft of the third motor 43 is arranged from bottom to top toward the support plate 22. By driving the larger rotating driven wheel 41 with the smaller rotating driving wheel 42, the effect of increasing torque and saving effort can be achieved.

[0080] In an exemplary embodiment of the present disclosure, reference Figure 6 As shown, a rotation proximity switch 44 is provided between the base 4 and the support plate 22, and the rotation proximity switch 44 is arranged toward the support plate 22. A third mark is provided on the support plate 22, and the rotation proximity switch 44 is used to obtain the angle at which the third mark rotates with the support plate 22. For example, the third mark is a small hole provided on the support plate 22, which is used to mark the angle at which the support plate 22 rotates. The rotation proximity switch 44 determines whether the rotation power mechanism and the rotation driven wheel 41 drive the support plate 22 to rotate in place or over-rotate by identifying the third mark, and sends a signal to the PLC when the support plate 22 is not rotated in place or rotated over-rotate, and alarms through the PLC to prompt the operator to intervene. For example, the single action stroke of the support plate 22 is 180°, and the third mark marks the position of the support plate 22 that should correspond to the rotation proximity switch 44 after rotating 180° from the initial position. The rotation proximity switch 44 can alarm when the third mark is not recognized, prompting the operator to intervene.

[0081] According to another aspect of the present disclosure, a magnetic particle flaw detection method is also provided, wherein any one of the magnetic particle flaw detection devices described above is used to detect a workpiece 100 to be detected, and the magnetic particle flaw detection method comprises:

[0082] Step S1000: supporting the workpiece 100 to be tested on a first fixture in a first posture;

[0083] Step S2000: performing a first image acquisition on the workpiece 100 to be measured;

[0084] Step S3000: driving the second flip plate 12 to rotate 90° around the flip axis 13 around the first direction, so that the second fixture is in contact with the workpiece 100 to be measured;

[0085] Step S4000: driving the first flip plate 11 and the second flip plate 12 to rotate synchronously by 90° around a second direction, the second direction being opposite to the first direction;

[0086] Step S5000: driving the first flip plate 11 to rotate 90° around the first direction so that the first flip plate 11 is parallel to the second flip plate 12;

[0087] Step S6000: performing a second image acquisition on the workpiece 100 to be measured.

[0088] Steps S1000 to S6000 have been described in detail in the above description of the magnetic particle flaw detection device, and will not be repeated here. The magnetic particle flaw detection method disclosed in the present invention can use the above magnetic particle flaw detection device to detect the workpiece 100 to be detected. The specific implementation and beneficial effects of the magnetic particle flaw detection method can refer to the above description of the exemplary implementation of the head-up display device.

[0089] Those skilled in the art will readily appreciate other embodiments of the present disclosure after considering the specification and practicing the invention disclosed herein. The present disclosure is intended to cover any variations, uses or adaptations of the present disclosure, which follow the general principles of the present disclosure and include common knowledge or customary techniques in the art that are not disclosed in the present disclosure. The description and examples are intended to be exemplary only, and the true scope and spirit of the present disclosure are indicated by the appended claims.

[0090] It should be understood that the present disclosure is not limited to the precise structures that have been described above and shown in the drawings, and that various modifications and changes may be made without departing from its scope. The scope of protection of the present disclosure is limited only by the appended claims.

Claims

1. A magnetic particle flaw detection device, characterized in that: include: A first jig and fixture, used to support the workpiece (100) to be measured on the first jig and fixture in a first posture; A second jig and fixture, used to support the workpiece (100) to be measured on the second jig and fixture in a second posture, wherein the second posture is a posture in which the first posture is flipped by 90 degrees; The flipping platform comprises a first flipping plate (11) and a second flipping plate (12); the first flipping plate (11) is provided with the first tooling fixture, and the second flipping plate (12) is provided with the second tooling fixture; the first flipping plate (11) and the second flipping plate (12) are rotationally connected via a flipping shaft (13) so that the first flipping plate (11) and the second flipping plate (12) are relatively rotatably arranged.

2. The magnetic particle flaw detection equipment according to claim 1, characterized in that: The flip platform comprises a support plate (22), the flip shaft (13) is supported on the support plate (22) through a support bearing (21), a first flip bearing (23) and a second flip bearing (24) are sleeved on the flip shaft (13), a first flip driven wheel (31) is sleeved on the outer ring of the first flip bearing (23), and a second flip driven wheel (32) is sleeved on the outer ring of the second flip bearing (24); the first flip plate (11) is connected to the first flip driven wheel (31), and the second flip plate (12) is connected to the second flip driven wheel (32); Wherein, the first flip driven wheel (31) is driven by the first flip power mechanism to drive the first flip plate (11) to rotate around the flip axis (13); and the second flip driven wheel (32) is driven by the second flip power mechanism to drive the second flip plate (12) to rotate around the flip axis (13).

3. The magnetic particle flaw detection equipment according to claim 2, characterized in that: The first flip driven wheel (31) is a sector gear, and the central angle of the first flip driven wheel (31) is not greater than 180° and not less than 100°; and / or the second flip driven wheel (32) is a sector gear, and the central angle of the second flip driven wheel (32) is not greater than 180° and not less than 100°.

4. The magnetic particle flaw detection equipment according to claim 2, characterized in that: The first flipping power mechanism comprises a first motor and a first flipping driving wheel (33) drivingly connected to the first motor, the first flipping driving wheel (33) meshing with the first flipping driven wheel (31), and the second flipping power mechanism comprises a second motor and a second flipping driving wheel drivingly connected to the second motor, the second flipping driving wheel meshing with the second flipping driven wheel (32); The axis of the first flip driving wheel (33) and the axis of the second flip driving wheel are symmetrical relative to the flip axis (13), and the first flip driving wheel (33) and the second flip driving wheel are arranged opposite to each other in a direction perpendicular to the flip axis (13).

5. The magnetic particle flaw detection equipment according to claim 2, characterized in that: The support plate (22) is provided with a first flip proximity switch (341), the first flip proximity switch (341) faces the first flip driven wheel (31), the first flip driven wheel (31) is provided with a first mark, and the first flip proximity switch (341) is used to obtain the angle through which the first mark rotates along with the first flip driven wheel (31); and / or, the support plate (22) is provided with a second flip proximity switch, the second flip proximity switch faces the second flip driven wheel (32), the second flip proximity switch is provided with a second mark, and the second flip proximity switch is used to obtain the angle through which the second mark rotates along with the second flip driven wheel (32).

6. The magnetic particle flaw detection equipment according to claim 2, characterized in that: The magnetic particle flaw detection device comprises a base (4), a rotating driven wheel (41) is provided between the support plate (22) and the base (4), the axis of the rotating driven wheel (41) intersects and is perpendicular to the axis of the flip shaft (13), the support plate (22) is rotatably connected to the base (4) via the rotating driven wheel (41), and the rotating driven wheel (41) rotates under the drive of a rotating power mechanism to drive the flip platform to rotate.

7. The magnetic particle flaw detection equipment according to claim 6, characterized in that: A rotational proximity switch (44) is provided between the base (4) and the support plate (22), the rotational proximity switch (44) faces the support plate (22), a third mark is provided on the support plate (22), and the rotational proximity switch (44) is used to obtain an angle at which the third mark rotates along with the support plate (22).

8. The magnetic particle flaw detection equipment according to claim 6, characterized in that: The magnetic particle flaw detection equipment also includes a feeding mechanism, which includes a feeding track and a feeding motor. The base (4) is slidably connected to the feeding track, and the feeding motor is used to drive the base (4) to slide along the feeding track, so that the base (4) has at least a feeding station and a detection station on the feeding track.

9. The magnetic particle flaw detection equipment according to claim 1, characterized in that: The magnetic particle flaw detection device further comprises an image acquisition mechanism, comprising a manipulator (51) and a camera (52) mounted on the manipulator (51); the manipulator (51) is adjacent to the first flip plate (11), and the manipulator (51) is used to drive the camera (52) to acquire an image of the workpiece (100) to be tested located on the second flip plate (12); or, the manipulator (51) is adjacent to the second flip plate (12), and the manipulator (51) is used to drive the camera (52) to acquire an image of the workpiece (100) to be tested located on the first flip plate (11).

10. A magnetic particle flaw detection method, characterized in that: Utilizing the magnetic particle flaw detection equipment according to any one of claims 1 to 9, the magnetic particle flaw detection method comprises: Supporting the workpiece (100) to be measured on the first tooling fixture in a first posture; Performing a first image acquisition on the workpiece (100) to be measured; driving the second flip plate (12) to rotate 90° around the flip axis (13) in a first direction, so that the second tooling fixture contacts the workpiece (100) to be measured; driving the first flip plate (11) and the second flip plate (12) to rotate synchronously by 90° around a second direction, the second direction being opposite to the first direction; driving the first flip plate (11) to rotate 90° around the first direction so that the first flip plate (11) is parallel to the second flip plate (12); A second image acquisition is performed on the workpiece (100) to be measured.

Images