Method for measuring temperature of thin-wall test piece in quartz lamp heating system

Abstract

The invention belongs to the technical field of temperature measurement, and particularly relates to a method for measuring the temperature of a thin-wall test piece in a quartz lamp heating system. The method comprises the following steps: in a test preparation stage, arranging a first thermocouple on the upper surface of a test piece; arranging a plurality of second thermocouples on the lower surface of the test piece; performing radiation heating on the test piece through a quartz lamp tube heater, and respectively collecting the upper surface temperature of the test piece measured by the first thermocouple and the lower surface temperature of the test piece measured by the second thermocouple; a temperature calculation model is built according to the upper surface temperature and the lower surface temperature of the test piece, the input of the temperature calculation model is the lower surface temperature of the test piece, and the output is the upper surface temperature of the test piece; in the test stage, the first thermocouple is removed; performing radiation heating on the test piece through a quartz lamp tube heater, and collecting the lower surface temperature of the test piece measured by a second thermocouple; inputting the lower surface temperature of the test piece into the temperature calculation model, and outputting the upper surface temperature of the test piece.

Description

Technical Field

[0001] The present application belongs to the technical field of temperature measurement, and in particular relates to a method for measuring the temperature of a thin-walled test piece in a quartz lamp heating system. Background Art

[0002] Heating thin-walled test pieces with quartz lamps is a common aircraft heating test. During the test, a quartz lamp heater is placed above the test piece to heat the upper surface of the test piece by radiation, and a high-temperature thermocouple is arranged on the upper surface of the test piece to measure the upper surface temperature of the test piece.

[0003] For high temperature tests above 600℃, the surface temperature of the high temperature thermocouple reaches above 1000℃ under the radiation of the quartz lamp heater. In the test, high temperature resistant structures such as ceramic woven mesh or high temperature resistant corundum tube with complex installation process must be used to protect the thermocouple, which increases the diameter of the thermocouple from 1mm to more than 3mm, and causes part of the test piece under the thermocouple to be blocked, destroying the uniformity of the temperature field and interfering with the heating process.

[0004] Therefore, it is desired to have a technical solution to overcome or at least alleviate at least one of the above-mentioned defects of the prior art. Summary of the invention

[0005] The purpose of the present application is to provide a method for measuring the temperature of a thin-walled test piece in a quartz lamp heating system to solve at least one problem existing in the prior art.

[0006] The technical solution of this application is:

[0007] A method for measuring the temperature of a thin-walled test piece in a quartz lamp heating system, comprising:

[0008] During the test preparation phase:

[0009] A first thermocouple is arranged on the upper surface of the test piece;

[0010] Arranging a plurality of second thermocouples on the lower surface of the test piece;

[0011] Radiantly heating the test piece by a quartz lamp heater, and collecting the upper surface temperature of the test piece measured by the first thermocouple and the lower surface temperature of the test piece measured by the second thermocouple;

[0012] Constructing a temperature calculation model according to the upper surface temperature of the test piece and the lower surface temperature of the test piece, wherein the input of the temperature calculation model is the lower surface temperature of the test piece, and the output is the upper surface temperature of the test piece;

[0013] During the trial phase:

[0014] Remove the first thermocouple;

[0015] Radiantly heating the test piece by a quartz lamp heater, and collecting the lower surface temperature of the test piece measured by the second thermocouple;

[0016] The lower surface temperature of the test piece is input into the temperature calculation model, and the upper surface temperature of the test piece is output.

[0017] In at least one embodiment of the present application, three second thermocouples are arranged on the lower surface of the test piece, wherein:

[0018] A second thermocouple A is arranged at a position on the lower surface of the test piece corresponding to the first thermocouple arranged on the upper surface of the test piece. 下1 ;

[0019] In the second thermocouple A 下1 The second thermocouple A is symmetrically arranged at a predetermined distance on the left and right sides of 下2 and the second thermocouple A 下3 .

[0020] In at least one embodiment of the present application, the temperature calculation model is:

[0021] w 上 =f(w 下1 , w 下2 , w 下3 )

[0022] Among them, w 上 is the calculated value of the surface temperature of the test piece, w 下1 The second thermocouple A 下1 The measured value, w 下2 The second thermocouple A 下2 The measured value, w 下3 The second thermocouple A 下3 The measured value.

[0023] In at least one embodiment of the present application, the temperature calculation model is a model constructed using a Kalman filter.

[0024] In at least one embodiment of the present application, the temperature calculation model is a model constructed using a convolutional neural network.

[0025] In at least one embodiment of the present application, the temperature calculation model is corrected or trained so that the error between the calculated value of the surface temperature of the test piece and the measured value of the first thermocouple meets the accuracy requirement.

[0026] The invention has at least the following beneficial technical effects:

[0027] The temperature measurement method of a thin-walled test piece in a quartz lamp heating system of the present application constructs a temperature calculation model, uses thermocouples arranged on the lower surface of the test piece to collect temperature data, and obtains the temperature value of the upper surface of the test piece through calculation. It has the characteristics of low cost, little interference with the heating process, and accurate measurement results. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 It is a schematic diagram of thermocouple arrangement in the test preparation stage of one embodiment of the present application;

[0029] Figure 2 It is a schematic diagram of the arrangement of thermocouples in the test phase of one embodiment of the present application.

[0030] in,

[0031] 1-quartz lamp heater; 2-test piece; 3-first thermocouple; 4-second thermocouple. DETAILED DESCRIPTION

[0032] In order to make the purpose, technical scheme and advantages of the implementation of this application clearer, the technical scheme in the embodiment of this application will be described in more detail below in conjunction with the drawings in the embodiment of this application. In the drawings, the same or similar reference numerals throughout represent the same or similar elements or elements with the same or similar functions. The described embodiments are part of the embodiments of this application, not all of them. The embodiments described below with reference to the drawings are exemplary and are intended to be used to explain this application, and should not be construed as limitations on this application. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application. The embodiments of this application are described in detail below in conjunction with the drawings.

[0033] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the scope of protection of the present application.

[0034] The following is combined with Figure 1 to Figure 2 This application is described in further detail.

[0035] The present application provides a method for measuring the temperature of a thin-walled test piece in a quartz lamp heating system, comprising:

[0036] During the test preparation phase:

[0037] A first thermocouple is arranged on the upper surface of the test piece;

[0038] Arranging a plurality of second thermocouples on the lower surface of the test piece;

[0039] Radiantly heating the test piece by a quartz lamp heater, and collecting the upper surface temperature of the test piece measured by a first thermocouple and the lower surface temperature of the test piece measured by a second thermocouple;

[0040] A temperature calculation model is constructed according to the upper surface temperature of the test piece and the lower surface temperature of the test piece, wherein the input of the temperature calculation model is the lower surface temperature of the test piece, and the output is the upper surface temperature of the test piece;

[0041] During the trial phase:

[0042] Remove the first thermocouple;

[0043] Radiantly heating the test piece by a quartz lamp heater, and collecting the lower surface temperature of the test piece measured by a second thermocouple;

[0044] The lower surface temperature of the test piece is input into the temperature calculation model, and the upper surface temperature of the test piece is output.

[0045] The method for measuring the temperature of a thin-walled test piece in a quartz lamp heating system of the present application collects temperature during the test preparation stage by using thermocouples respectively arranged on the upper and lower surfaces of the test piece, and constructs a temperature calculation model that calculates the relationship between the upper surface temperature of the test piece and the lower surface temperature of the test piece based on the collected temperature data; during the test stage, the upper surface temperature of the test piece is inferred by inputting the lower surface temperature of the test piece into the temperature calculation model.

[0046] Specifically, the quartz lamp heating system includes a quartz lamp heater 1 and a test piece 2 arranged below the quartz lamp heater 1. In a preferred embodiment of the present application, in the test preparation stage, a first thermocouple 3 is arranged on the upper surface of the test piece, and a plurality of second thermocouples 4 are arranged on the lower surface of the test piece, and the plurality of second thermocouples 4 are arranged in an array. In this embodiment, Figure 1 As shown, first, a first thermocouple 3 is pasted on an appropriate position on the upper surface of the test piece, and three second thermocouples 4 are pasted on the lower surface of the test piece, wherein a second thermocouple A is arranged on the lower surface of the test piece corresponding to the first thermocouple 3 arranged on the upper surface of the test piece. 下1 , and in the second thermocouple A 下1 The second thermocouple A is symmetrically arranged at a predetermined distance on the left and right sides of the specific position 下2 and the second thermocouple A 下3 After the thermocouples are arranged, the quartz lamp heater 1 is turned on to radiate and heat the test piece 2. During the heating process of the test piece 2, the measurement values ​​of the four thermocouples are collected and recorded.

[0047] In this embodiment, the following temperature calculation model is established based on the temperature data:

[0048] w 上 =f(w 下1 , w 下2 , w 下3 )

[0049] Among them, w 上 is the calculated value of the surface temperature of the test piece, w 下1 The second thermocouple A 下1 The measured value, w 下2 The second thermocouple A 下2 The measured value, w 下3 The second thermocouple A 下3 The measured value.

[0050] If the temperature calculation model does not include w 下2 and w 下3 , the calculation results are easily disturbed and the error is large. 下2 and w 下3 Later, two calculation dimensions were added to make the calculation results more robust.

[0051] Advantageously, in this embodiment, the temperature calculation model is a model constructed using a Kalman filter or a model constructed using a convolutional neural network. After the temperature calculation model is established, it must be corrected or trained so that the error between the calculated value of the surface temperature of the test piece and the measured value of the first thermocouple 3 meets the accuracy requirement.

[0052] In a preferred embodiment of the present application, Figure 2 As shown, during the test phase, the first thermocouple 3 on the upper surface of the test piece is removed, and the test piece 2 is radiantly heated by the quartz lamp heater 1. The measurement values ​​of the three second thermocouples 4 on the lower surface of the test piece are collected, and the upper surface temperature of the test piece is calculated in real time by the temperature calculation model. Since there is no thermocouple on the upper surface of the test piece, the test piece 2 will not be blocked and the heating process will not be affected; the second thermocouple 4 on the lower surface of the test piece will not be radiated by the quartz lamp heater 1, so there is no need for sheath protection, which simplifies the thermocouple installation process and saves test costs.

[0053] The temperature measurement method of a thin-walled test piece in a quartz lamp heating system of the present application transfers the thermocouple from the upper surface of the test piece to the lower surface of the test piece, increases the number of thermocouples from 1 to 3, and infers the upper surface temperature through the value of the lower surface temperature array of the test piece. The present application is not only applicable to heating tests of military aircraft, but also to other similar occasions, so it also has broad application prospects in the civilian field.

[0054] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any changes or substitutions that can be easily thought of by a person skilled in the art within the technical scope disclosed in the present application should be included in the protection scope of the present application. Therefore, the protection scope of the present application shall be based on the protection scope of the claims.

Claims

1. A method for measuring the temperature of a thin-walled test piece in a quartz lamp heating system, characterized in that: include: During the test preparation phase: A first thermocouple is arranged on the upper surface of the test piece; Arranging a plurality of second thermocouples on the lower surface of the test piece; Radiantly heating the test piece by a quartz lamp heater, and collecting the upper surface temperature of the test piece measured by the first thermocouple and the lower surface temperature of the test piece measured by the second thermocouple; Constructing a temperature calculation model according to the upper surface temperature of the test piece and the lower surface temperature of the test piece, wherein the input of the temperature calculation model is the lower surface temperature of the test piece, and the output is the upper surface temperature of the test piece; During the trial phase: Remove the first thermocouple; Radiantly heating the test piece by a quartz lamp heater, and collecting the lower surface temperature of the test piece measured by the second thermocouple; The lower surface temperature of the test piece is input into the temperature calculation model, and the upper surface temperature of the test piece is output.

2. The method for measuring the temperature of a thin-walled test piece in a quartz lamp heating system according to claim 1, characterized in that: The second thermocouples are arranged in three pieces on the lower surface of the test piece, among which: A second thermocouple A is arranged at a position on the lower surface of the test piece corresponding to the first thermocouple arranged on the upper surface of the test piece. 下1 ; In the second thermocouple A 下1 The second thermocouple A is symmetrically arranged at a predetermined distance on the left and right sides of 下2 and the second thermocouple A 下3 .

3. The method for measuring the temperature of a thin-walled test piece in a quartz lamp heating system according to claim 2, characterized in that: The temperature calculation model is: w 上 =f(w 下1 ,w 下2 ,w 下3 ) Among them, w 上 is the calculated value of the surface temperature of the test piece, w 下1 The second thermocouple A 下1 The measured value, w 下2 The second thermocouple A 下2 The measured value, w 下3 The second thermocouple A 下3 The measured value of 4. The method for measuring the temperature of a thin-walled test piece in a quartz lamp heating system according to claim 3, characterized in that: The temperature calculation model is a model constructed using a Kalman filter.

5. The method for measuring the temperature of a thin-walled test piece in a quartz lamp heating system according to claim 3, characterized in that: The temperature calculation model is a model constructed using a convolutional neural network.

6. The method for measuring the temperature of a thin-walled test piece in a quartz lamp heating system according to claim 4 or 5, characterized in that: By correcting or training the temperature calculation model, the error between the calculated value of the surface temperature of the test piece and the measured value of the first thermocouple meets the accuracy requirement.

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