Universal device for screening test of photoelectric products

Abstract

The invention discloses a universal device for a screening test of photoelectric products. The universal device comprises automatic test equipment, a test cable and a communication cable, automatic test equipment is utilized to cooperate with a test cable and a communication cable; one end of the test cable is connected with the automatic test equipment, and the other end of the test cable is an electric connector matched with a tested photoelectric product connector and is used for connecting the automatic test equipment with a photoelectric product; one end of the communication cable is connected with the automatic test equipment, and the other end of the communication cable is connected with the vibration table and the high-low temperature test box, so that automatic control and real-time data interaction of the automatic test equipment on the vibration table and the high-low temperature test box are realized. According to the invention, automatic process control, automatic test and inspection of screening tests of various types of photoelectric products can be realized, manual process operation is transformed, the automation level and the production efficiency are improved, manual operation is replaced, and the test reliability can be greatly improved.

Description

Technical Field

[0001] The invention belongs to the technical field of automated testing and relates to a universal device for photoelectric product screening tests. Background Art

[0002] In order to ensure that the environmental stress adaptability of various types of optoelectronic products can meet the requirements of technical indicators, random vibration and temperature cycle stress need to be applied to optoelectronic products during the production process to identify and eliminate early failures caused by product processes and components. At present, the environmental stress screening of various types of optoelectronic products requires operators to set the test condition parameters of the vibration table and the test condition parameters of the high and low temperature test chamber. Operators are required to test the optoelectronic equipment according to the test time nodes and fill in paper record sheets. Human errors are easily introduced during the test, data consistency is poor, and production efficiency is low, which makes it difficult to meet the task requirements of large-scale production. In addition, the original process method lacks universality and automation capabilities, resulting in each workstation being unable to undertake the co-production of multiple models, and the ability to quickly and flexibly convert is insufficient, and it is unable to adapt to automatic scheduling and rapid flexible switching of multiple models. To this end, we propose a universal device for optoelectronic product screening tests to solve the above problems. Summary of the invention

[0003] (I) Purpose of the invention

[0004] The purpose of the present invention is to provide a universal device for photoelectric product screening test in order to solve the problem that the screening test process of multiple models of photoelectric products is a manual process, the data consistency is poor, and the production efficiency is low.

[0005] (II) Technical solution

[0006] In order to solve the above technical problems, the present invention provides a universal device for optoelectronic product screening tests, which includes: automated testing equipment, test cables, and communication cables; utilizing automated testing equipment in conjunction with test cables and communication cables; one end of the test cable is connected to the automated testing equipment, and the other end is an electrical connector that matches the connector of the optoelectronic product being tested, and is used to connect the automated testing equipment and the optoelectronic product; one end of the communication cable is connected to the automated testing equipment, and the other end is connected to a vibration table and a high and low temperature test chamber, so as to realize automated control of the vibration table and the high and low temperature test chamber by the automated testing equipment and real-time data interaction.

[0007] Among them, the test cable is replaceable and can be used to realize automated testing and inspection of screening tests of different types of optoelectronic products.

[0008] Among them, the automated testing equipment includes host computer software, temperature and humidity detection module, vibration table control module, high and low temperature test chamber control module, and optoelectronic product test module; the host computer software is used to control other modules, control each module to perform automated operation and testing according to the test process, and automatically identify and save the test results; the temperature and humidity detection module is used to monitor the temperature and humidity of the test environment, output data to the host computer software, save it together with the test data, and alarm when the temperature and humidity indicators exceed the requirements of the process documents; the vibration table control module is used to automatically control the magnitude and vibration time of the vibration table according to the mechanical vibration test conditions of the optoelectronic product input by the host computer, monitor the vibration control curve in real time and output it to the host computer software; the high and low temperature test chamber control module is used to automatically control the test chamber temperature, temperature change rate and insulation time according to the temperature test conditions of the optoelectronic product input by the host computer, monitor the temperature control curve in real time and output it to the host computer software; the optoelectronic product test module is used to perform automated testing according to the optoelectronic product test items and test time input by the host computer, automatically interpret the test data, and output the test data electronic form.

[0009] (III) Beneficial effects

[0010] The universal device for optoelectronic product screening tests provided by the above technical solution is used for automated testing and inspection of optoelectronic product screening tests. It can realize automated process control, automated testing and inspection of screening tests for various types of optoelectronic products, transform manual process operations, improve automation levels and production efficiency, replace manual operations, and can greatly improve test reliability. By replacing test cables and modifying upper computer software parameters, co-line production and flexible switching of screening tests for multiple types of optoelectronic products can be realized, and it has strong versatility and capacity expansion capabilities. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] Figure 1 It is a structural schematic diagram of the present invention.

[0012] Figure 2 It is a schematic diagram of the application scenario of the present invention. DETAILED DESCRIPTION

[0013] In order to make the purpose, content and advantages of the present invention more clear, the specific implementation methods of the present invention are further described in detail below in conjunction with the drawings and examples.

[0014] Reference Figure 1 and Figure 2As shown, the universal device for optoelectronic product screening test in this embodiment includes automated test equipment, test cables, and communication cables; the automated test equipment is used in conjunction with the test cables and communication cables; one end of the test cable is connected to the automated test equipment, and the other end is an electrical connector that matches the connector of the optoelectronic product being tested, which is used to connect the automated test equipment and the optoelectronic product; one end of the communication cable is connected to the automated test equipment, and the other end is connected to a vibration table and a high and low temperature test chamber, so as to realize automated control of the vibration table and the high and low temperature test chamber by the automated test equipment and real-time data interaction.

[0015] The test cables are replaceable and can be used to realize automated testing and inspection of screening tests for different types of optoelectronic products.

[0016] The present invention can automatically control the vibration table and the high and low temperature test box, realize the automated process and automated test of screening tests for multiple models of optoelectronic products, and can realize rapid scheduling and flexible switching of screening tests for different models of optoelectronic products by replacing test cables and setting upper computer software parameters.

[0017] The automated testing equipment includes host computer software, temperature and humidity detection module, vibration table control module, high and low temperature test chamber control module, and optoelectronic product test module; the host computer software is used to control other modules, control each module to perform automated operation and testing according to the test process, and automatically identify and save the test results; the temperature and humidity detection module is used to monitor the temperature and humidity of the test environment, output data to the host computer software, save it together with the test data, and alarm when the temperature and humidity indicators exceed the requirements of the process documents; the vibration table control module is used to automatically control the magnitude and vibration time of the vibration table according to the mechanical vibration test conditions of the optoelectronic product input by the host computer, monitor the vibration control curve in real time and output it to the host computer software; the high and low temperature test chamber control module is used to automatically control the test chamber temperature, temperature change rate and insulation time according to the temperature test conditions of the optoelectronic product input by the host computer, monitor the temperature control curve in real time and output it to the host computer software; the optoelectronic product test module is used to perform automated testing according to the optoelectronic product test items and test time input by the host computer, automatically interpret the test data, and output the test data electronic form.

[0018] When the universal device for optoelectronic product screening test of this embodiment is used, first, the optoelectronic product to be tested is connected to the universal test equipment in sequence through the test cable, and the vibration table and the high and low temperature test chamber are connected through the communication cable; then, the environmental stress screening test conditions and test process of the optoelectronic product of this model are input into the automated test equipment through the host computer software, and the automated test equipment controls the vibration table and the high and low temperature test chamber to set the test conditions according to the input conditions; then, the test items of the optoelectronic product of this model are selected through the host computer software, and the optoelectronic product test module in the automated test equipment performs automated testing before the test; after confirming that the product and equipment are in normal status, the screening test is formally carried out, and the automated test equipment automatically carries out the test and the test during the test according to the test process and test conditions. After the test is completed, the data is automatically interpreted, and an electronic form of the test data is output, which includes information such as temperature and humidity, and test time.

[0019] Each universal device contains a universal test module and is equipped with test cables that match the electrical connector models of various optoelectronic products. It can realize the functions of co-line production and flexible switching, and has strong versatility and capacity expansion capabilities. Using this universal device for optoelectronic product screening tests can greatly improve test reliability, test automation level and production efficiency.

[0020] The above is only a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the technical principles of the present invention. These improvements and modifications should also be regarded as the scope of protection of the present invention.

Claims

1. A universal device for photoelectric product screening test, characterized in that: include: Automated testing equipment, test cables, communication cables; Use automated testing equipment to test cables and communication cables; One end of the test cable is connected to the automated test equipment, and the other end is an electrical connector that matches the connector of the optoelectronic product being tested, and is used to connect the automated test equipment and the optoelectronic product; One end of the communication cable is connected to the automated testing equipment, and the other end is connected to the vibration table and the high and low temperature test chamber, so as to realize the automated control and real-time data interaction of the automated testing equipment on the vibration table and the high and low temperature test chamber.

2. The universal device for photoelectric product screening test according to claim 1, characterized in that: The test cables are replaceable and can be used to realize automated testing and inspection of screening tests for different types of optoelectronic products.

3. The universal device for photoelectric product screening test according to claim 2, characterized in that: The automated testing equipment includes host computer software, temperature and humidity detection module, vibration table control module, high and low temperature test chamber control module, and optoelectronic product test module; the host computer software is used to control other modules, control each module to perform automated operation and testing according to the test process, and automatically identify and save the test results; the temperature and humidity detection module is used to monitor the temperature and humidity of the test environment, output data to the host computer software, save it together with the test data, and alarm when the temperature and humidity indicators exceed the requirements of the process documents; the vibration table control module is used to automatically control the magnitude and vibration time of the vibration table according to the mechanical vibration test conditions of the optoelectronic product input by the host computer, monitor the vibration control curve in real time and output it to the host computer software; the high and low temperature test chamber control module is used to automatically control the test chamber temperature, temperature change rate and insulation time according to the temperature test conditions of the optoelectronic product input by the host computer, monitor the temperature control curve in real time and output it to the host computer software; The optoelectronic product test module is used to perform automated testing based on the optoelectronic product test items and test time input by the host computer, automatically interpret the test data, and output the test data electronic form.

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