Screen flatness measuring device and method based on Shack-Hartmann microlens array
Through the screen flatness measurement method based on the Shackhartmann microlens array, the problem of cumbersome detection operations and limited accuracy in the prior art is solved, and the fast, simple and efficient detection of the screen flatness is achieved.
Patent Information
- Application Number
- CN202510017326.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-06
- Publication Date
- 2025-02-14
AI Technical Summary
The existing screen flatness detection methods have problems such as cumbersome operation, limited accuracy, and are not suitable for rapid detection of large-scale production lines. Especially laser interferometry equipment is expensive, and laser triangulation does not measure the screen with low surface reflectivity or glossy surface measurement results. Accurate, machine vision measurement accuracy is limited by image sensor resolution and image processing algorithms.
Using the screen flatness measurement method based on the Shack Hartman microlens array, the diameter of each spot on the monitor is obtained through the combination of the Shack Hartman microlens array and the monitor, and the spot diameter fluctuation rate is calculated. If the volatility is low and the average diameter is less than the preset threshold, it is determined that the screen flatness meets the preset conditions.
It realizes fast, simple and efficient detection of screen flatness, without high-precision mobile devices or scanning of spliced target surfaces, and the detection method is simpler and more effective.
Smart Images
Figure CN119437101A_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the technical field of optical non-contact measurement, and in particular to a device and method for measuring the flatness of a mobile phone screen based on the Shack-Hartmann microlens technology. Background Art
[0002] Existing screen flatness detection methods mainly include mechanical measurement and optical measurement. Mechanical measurement methods, such as using micrometers or coordinate measuring machines, evaluate flatness by contact measurement of screen surface height changes. Although this method has high accuracy, the operation process is cumbersome and requires point-by-point measurement. The measurement speed is slow and it is easy to cause scratches and other damage to the screen. It is not suitable for rapid detection on large-scale production lines. Optical measurement methods, such as laser interferometry, laser triangulation, and machine vision measurement, have overcome some shortcomings of mechanical measurement methods to a certain extent, but there are still some problems. For example, laser interferometry equipment is expensive and has high environmental requirements. Laser triangulation may not be accurate for screens with low surface reflectivity or glossy surfaces. The accuracy of machine vision measurement is limited by the resolution of the image sensor and the image processing algorithm. If the resolution of the image sensor is not high or the image processing algorithm is not perfect, the measurement results will be inaccurate. Summary of the invention
[0003] In view of the above technical problems, the technical solution adopted by the present invention is: According to a first aspect of the present application, a screen flatness measurement method based on a Shack-Hartmann microlens array is provided, and the method is applied to a screen flatness measurement system based on a Shack-Hartmann microlens array, and the system comprises: a screen flatness measurement device based on a Shack-Hartmann microlens array and a processor; wherein the screen flatness measurement device based on a Shack-Hartmann microlens array comprises a Shack-Hartmann microlens array and a monitor, wherein the monitor is located above the Shack-Hartmann microlens array, and the screen to be measured is located below the Shack-Hartmann microlens array; the processor is communicatively connected to the device, and the processor is used to perform the following steps: S100, acquiring each light spot on the monitor to obtain a light spot matrix A=(A 1，1 , A 1，2 , …, A 1，j , …, A 1，m , …, A i，1 , A i，2 , …, A i，j , …, A i，m , …, A n，1 , A n，2 , …, A n，j , …, A n，m ), i=1,2,…,n,j=1,2,…,m; where Ai，j is the light spot in the i-th row and j-th column on the monitor, n is the number of rows of the light spot on the monitor, and m is the number of columns of the light spot on the monitor.
[0004] S200, obtaining the diameter of each light spot in A to obtain a light spot diameter list D corresponding to A = (D 1，1 , D 1，2 , …, D 1，j , …, D 1，m , …, D i，1 , D i，2 , …, D i，j , …, D i，m , …, D n，1 , D n，2 , …, D n，j , …, D n，m ); where D i，j A i，j diameter.
[0005] S300, based on D, determine the spot diameter fluctuation rate η corresponding to D = (1 / (n×m))×∑ n i=1 ∑ m j=1 (A i，j -((1 / (n×m))×∑ n i=1 ∑ m j=1 A i，j )) 2 .
[0006] S400, if η<η' and (1 / (n×m))×∑ n i=1 ∑ m j=1 A i，j <D', it is determined that the flatness of the screen to be measured meets the preset flatness condition; wherein η' is the preset spot diameter fluctuation rate threshold, and D' is the preset spot diameter threshold.
[0007] Furthermore, after step S400, the method further includes the following steps: S500, if η<η' and (1 / (n×m))×∑ n i=1 ∑ m j=1 A i，j ≥D', then adjust the distance between the screen to be measured and the Shack-Hartmann microlens array and / or adjust the distance between the Shack-Hartmann microlens array and the monitor; proceed to S510; S510, if η<η' and (1 / (n×m))×∑n i=1 ∑ m j=1 A i，j <D', it is determined that the flatness of the screen to be measured meets the preset flatness condition; S520, after adjusting the distance between the screen to be measured and the Shack-Hartmann microlens array and / or adjusting the distance between the Shack-Hartmann microlens array and the monitor for several times, if η<η' and (1 / (n×m))×∑ n i=1 ∑ m j=1 A i，j ≥D', it is determined that the flatness of the screen to be measured does not meet the preset flatness condition.
[0008] Furthermore, after step S400, the method further includes the following steps: S600, if η≥η', obtain the difference between each spot diameter in D and the average spot diameter corresponding to D, so as to obtain a spot diameter difference list ΔD=(ΔD 1，1 , ΔD 1，2 ,…,ΔD 1，j ,…,ΔD 1，m ,…,ΔD i，1 , ΔD i，2 ,…,ΔD i，j ,…,ΔD i，m ,…,ΔD n，1 , ΔD n，2 ,…,ΔD n，j ,…,ΔD n，m ); where ΔD i，j D i，j The difference in average spot diameter corresponding to D; S610, traverse ΔD, if ΔD i，j >ΔD', then A i，j Determine the initial abnormal light spot to obtain the initial abnormal light spot list E = (E1, E2, ..., E p ,…,E q ), p = 1, 2, …, q; where E p is the pth initial abnormal light spot determined, q is the number of initial abnormal light spots determined; S620, traverse E, if E p The brightness is less than the preset spot brightness threshold and E p The location and E p If the distance of the corresponding preset standard position is greater than the preset distance threshold, E p Determine the target abnormal light spot to obtain the target abnormal light spot list F=(F1,F2,…,F x, …, F y ), x=1, 2, …, y; where F x is the xth target abnormal light spot determined, and y is the number of target abnormal light spots determined; S630 , determining the flatness δ=y / (n×m) of the screen to be measured according to y, n and m.
[0009] Furthermore, D i，j Obtained through the following steps: S210, get A i，j The corresponding smallest circle; S220, A i，j The diameter of the corresponding smallest circle is determined as D i，j .
[0010] Furthermore, the number of Shack-Hartmann microlenses in the Shack-Hartmann microlens array is positively correlated with the size of the screen to be measured.
[0011] According to another aspect of the present application, a screen flatness measuring device based on the Shack-Hartmann microlens array is also provided, the device comprising: a Shack-Hartmann microlens array and a monitor; wherein the monitor is located above the Shack-Hartmann microlens array, and the screen to be measured is placed below the Shack-Hartmann microlens array.
[0012] Furthermore, the monitor is used to monitor the parameters of the light spot.
[0013] Furthermore, the material of the Shack-Hartmann microlenses in the Shack-Hartmann microlens array is silicon dioxide.
[0014] The present invention has at least the following beneficial effects: The screen flatness measurement method based on the Shack-Hartmann microlens array of the present invention obtains each light spot on the monitor to obtain a light spot matrix A; obtains the diameter of each light spot in A to obtain a light spot diameter list D corresponding to A; according to D, determines the light spot diameter fluctuation rate η corresponding to D; if η<η' and (1 / (n×m))×∑ n i=1 ∑ m j=1 A i，j <D', it is determined that the flatness of the screen to be measured meets the preset flatness condition, thereby realizing the measurement of the flatness of the screen to be measured; the method of the present invention only needs to place the microlens array above the screen, without the need for high-precision mobile equipment, and without scanning the spliced target surface, and the detection method is simpler and more efficient. BRIEF DESCRIPTION OF THE DRAWINGS
[0015] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.
[0016] Figure 1 A flowchart of steps executed by a processor according to an embodiment of the present invention; Figure 2 A schematic structural diagram of a device for measuring screen flatness of a Shack-Hartmann microlens array provided in an embodiment of the present invention. DETAILED DESCRIPTION
[0017] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present invention.
[0018] It should be noted that, based on the present disclosure, those skilled in the art should understand that an aspect described herein can be implemented independently of any other aspect, and two or more of these aspects can be combined in various ways. For example, any number of aspects described herein can be used to implement a device and / or practice a method. In addition, other structures and / or functionalities other than one or more of the aspects described herein can be used to implement this device and / or practice this method.
[0019] The following will refer to Figure 1 The flowchart of the screen flatness measurement method based on the Shack-Hartmann microlens array is shown, and a screen flatness measurement method based on the Shack-Hartmann microlens array is introduced.
[0020] The screen flatness measurement method based on the Shack-Hartmann microlens array is applied to a screen flatness measurement system based on the Shack-Hartmann microlens array, the system comprising: Figure 2 The screen flatness measuring device and processor based on the Shack-Hartmann microlens array are shown; wherein the screen flatness measuring device based on the Shack-Hartmann microlens array comprises a Shack-Hartmann microlens array and a monitor, wherein the monitor is located above the Shack-Hartmann microlens array, and the screen to be measured is located below the Shack-Hartmann microlens array.
[0021] The processor is communicatively connected to the device, and the processor is used to perform the following steps: S100, acquiring each light spot on the monitor to obtain a light spot matrix A=(A 1，1 , A 1，2 , …, A 1，j , …, A 1，m , …, A i，1 , A i，2 , …, A i，j , …, A i，m , …, A n，1 , A n，2 , …, A n，j , …, A n，m ), i=1,2,…,n,j=1,2,…,m; where A i，j is the light spot in the i-th row and j-th column on the monitor, n is the number of rows of the light spot on the monitor, and m is the number of columns of the light spot on the monitor.
[0022] In this embodiment, a Shack-Hartmann microlens array for achieving focusing is placed above the screen to be measured; then, the light source is turned on, and after the light passes through the screen to be measured, it is focused on the monitor through the Shack-Hartmann microlens array, and the flatness of the screen is detected by observing and analyzing the size and position of the light spot; thus, each light spot on the monitor can be acquired to obtain the light spot matrix A.
[0023] S200, obtaining the diameter of each light spot in A to obtain a light spot diameter list D corresponding to A = (D 1，1 , D 1，2 , …, D 1，j , …, D 1，m , …, D i，1 , D i，2 , …, D i，j , …, D i，m , …, D n，1 , D n，2 , …, D n，j , …, D n，m ); where D i，j A i，j diameter.
[0024] In this embodiment, it can be understood that the light spot on the monitor is approximately circular. When the distance between the monitor and the Shack-Hartmann microlens array and the distance between the Shack-Hartmann microlens array and the screen to be measured are both in an ideal state, the higher the flatness of the screen to be measured, the smaller the diameter of the corresponding light spot on the monitor; D i，j It can be obtained by following the steps below: S210, get A i，j The corresponding smallest circle.
[0025] S220, A i，jThe diameter of the corresponding smallest circle is determined as D i，j .
[0026] In this embodiment, a minimum circle may be set for the light spot, and the diameter of the minimum circle is determined as the diameter of the corresponding light spot.
[0027] S300, based on D, determine the spot diameter fluctuation rate η corresponding to D = (1 / (n×m))×∑ n i=1 ∑ m j=1 (A i，j -((1 / (n×m))×∑ n i=1 ∑ m j=1 A i，j )) 2 .
[0028] In this embodiment, the variance corresponding to the spot diameter in D is determined as the spot diameter fluctuation rate η corresponding to D. The larger the spot diameter fluctuation rate η corresponding to D, the greater the difference in spot diameters in D. The smaller the spot diameter fluctuation rate η corresponding to D, the smaller the difference in spot diameters in D.
[0029] S400, if η<η' and (1 / (n×m))×∑ n i=1 ∑ m j=1 A i，j <D', it is determined that the flatness of the screen to be measured meets the preset flatness condition; wherein η' is the preset spot diameter fluctuation rate threshold, and D' is the preset spot diameter threshold.
[0030] In this embodiment, if η<η' and (1 / (n×m))×∑ n i=1 ∑ m j=1 A i，j <D', indicating that the spot diameters in D are relatively balanced, and the corresponding average spot diameter is less than the preset spot diameter threshold, it can be directly determined that the flatness of the screen to be measured meets the preset flatness condition; the preset flatness condition may be that the flatness is equal to 100%.
[0031] Furthermore, after step S400, the method further includes the following steps: S500, if η<η' and (1 / (n×m))×∑ n i=1 ∑ m j=1 A i，j≥D', then adjust the distance between the screen to be measured and the Shack-Hartmann microlens array and / or adjust the distance between the Shack-Hartmann microlens array and the monitor; proceed to S510.
[0032] S510, if η<η' and (1 / (n×m))×∑ n i=1 ∑ m j=1 A i，j <D', it is determined that the flatness of the screen to be measured meets the preset flatness condition.
[0033] S520, after adjusting the distance between the screen to be measured and the Shack-Hartmann microlens array and / or adjusting the distance between the Shack-Hartmann microlens array and the monitor for several times, if η<η' and (1 / (n×m))×∑ n i=1 ∑ m j=1 A i，j ≥D', it is determined that the flatness of the screen to be measured does not meet the preset flatness condition.
[0034] In this embodiment, if η<η' and (1 / (n×m))×∑ n i=1 ∑ m j=1 A i，j ≥D', indicating that the spot diameters in D are relatively balanced, but the corresponding average spot diameter is greater than or equal to the preset spot diameter threshold. This may be because the distance between the screen to be measured and the Shack-Hartmann microlens array and / or the distance between the Shack-Hartmann microlens array and the monitor is not adjusted to the ideal state, or the overall flatness of the screen is uneven. In this case, the distance between the screen to be measured and the Shack-Hartmann microlens array and / or the distance between the Shack-Hartmann microlens array and the monitor can be adjusted. Each time the adjustment is made, η and η' and (1 / (n×m))×∑ n i=1 ∑ m j=1 A i，j The relationship between D' and D' is used to determine whether the flatness of the screen to be measured meets the preset flatness condition.
[0035] After adjusting the distance between the screen to be measured and the Shack-Hartmann microlens array and / or adjusting the distance between the Shack-Hartmann microlens array and the monitor several times, if η<η' and (1 / (n×m))×∑ n i=1 ∑ m j=1 A i，j≥D', it means that the problem is not the distance between the screen and the Shack-Hartmann microlens array and / or the distance between the Shack-Hartmann microlens array and the monitor, but the overall flatness of the screen to be measured is not uniform.
[0036] Furthermore, after step S400, the method further includes the following steps: S600, if η≥η', obtain the difference between each spot diameter in D and the average spot diameter corresponding to D, so as to obtain a spot diameter difference list ΔD=(ΔD 1，1 , ΔD 1，2 ,…,ΔD 1，j ,…,ΔD 1，m ,…,ΔD i，1 , ΔD i，2 ,…,ΔD i，j ,…,ΔD i，m ,…,ΔD n，1 , ΔD n，2 ,…,ΔD n，j ,…,ΔD n，m ); where ΔD i，j D i，j The difference in average spot diameter corresponding to D.
[0037] In this embodiment, if η≥η′, it means that the spot diameters in D vary greatly, and the difference between each spot diameter in D and the average spot diameter corresponding to D can be obtained to obtain a spot diameter difference list ΔD.
[0038] S610, traverse ΔD, if ΔD i，j >ΔD', then A i，j Determine the initial abnormal light spot to obtain the initial abnormal light spot list E = (E1, E2, ..., E p ,…,E q ), p = 1, 2, …, q; where E p is the pth determined initial abnormal light spot, and q is the number of determined initial abnormal light spots.
[0039] S620, traverse E, if E p The brightness is less than the preset spot brightness threshold and E p The location and E p If the distance of the corresponding preset standard position is greater than the preset distance threshold, E p Determine the target abnormal light spot to obtain the target abnormal light spot list F=(F1,F2,…,F x , …, F y ), x=1, 2, …, y; where F x is the xth target abnormal light spot determined, and y is the number of target abnormal light spots determined.
[0040] In this embodiment, a larger spot diameter cannot directly determine that the corresponding area of the screen to be measured has a lower flatness. It is necessary to further combine the brightness and position of the spot to determine whether it is a target abnormal spot. It can be understood that E p The corresponding preset standard position is the position where the center point of the corresponding Shack-Hartmann microlens is vertically projected onto the monitor.
[0041] S630 , determining the flatness δ=y / (n×m) of the screen to be measured according to y, n and m.
[0042] In this embodiment, the flatness of the screen to be measured can be determined through the above steps. When the screen to be measured is not flat, there is a height difference between the screens to be measured, and the spot sizes generated by the defocus amount on the monitor are different. By detecting the defocused spot size on the monitor, the flatness detection of the screen to be measured can be completed, and the flatness of the screen to be measured can be adjusted by adjusting the defocused spot size; if the two defocused spot sizes are relatively the same and cannot be judged by the naked eye, the defocused spot brightness and position can be used for detection.
[0043] The greater the degree of defocus, the lower the brightness of the light spot, and the farther the light spot position is from the ideal light spot position. The lower the degree of defocus, the higher the brightness of the light spot, and the closer the light spot position is from the ideal light spot position. By judging the brightness of the defocused light spot on the monitor, the flatness of the screen to be tested can also be detected. The brightness and position of the light spot are combined with the detection of the light spot size to improve the detection accuracy.
[0044] The present invention does not detect the flatness of the screen to be tested by laser ranging or machine vision, so there is no need to accurately move the triangulated laser rangefinder or scan the screen to be tested, and the detection method is simpler and more effective.
[0045] The screen flatness measurement method based on the Shack-Hartmann microlens array of this embodiment obtains each light spot on the monitor to obtain a light spot matrix A; obtains the diameter of each light spot in A to obtain a light spot diameter list D corresponding to A; according to D, determines the light spot diameter fluctuation rate η corresponding to D; if η<η' and (1 / (n×m))×∑ n i=1 ∑ m j=1 A i，j <D', it is determined that the flatness of the screen to be measured meets the preset flatness condition, thereby realizing the measurement of the flatness of the screen to be measured; the method of the present invention only needs to place the microlens array above the screen, without the need for high-precision mobile equipment, and without scanning the spliced target surface, and the detection method is simpler and more efficient.
[0046] In an exemplary embodiment, a screen flatness measuring device based on a Shack-Hartmann microlens array is also provided, characterized in that the device comprises: a Shack-Hartmann microlens array and a monitor; wherein the monitor is located above the Shack-Hartmann microlens array, and the area below the Shack-Hartmann microlens array is used to place a screen to be measured.
[0047] Furthermore, the monitor is used to monitor the parameters of the light spot.
[0048] Furthermore, the material of the Shack-Hartmann microlenses in the Shack-Hartmann microlens array is silicon dioxide.
[0049] In this embodiment, the larger the size of the Shack-Hartmann microlens array, the higher the precision, the better the focusing effect, and the larger the coverage area; the material of the Shack-Hartmann microlens array is silicon dioxide.
[0050] In addition, although the steps of the method in the present disclosure are described in a specific order in the drawings, this does not require or imply that the steps must be performed in this specific order, or that all the steps shown must be performed to achieve the desired results. Additionally or alternatively, some steps may be omitted, multiple steps may be combined into one step, and / or one step may be decomposed into multiple steps, etc.
[0051] Although some specific embodiments of the present invention have been described in detail by way of example, it should be understood by those skilled in the art that the above examples are only for illustration, not for limiting the scope of the present invention. It should also be understood by those skilled in the art that various modifications may be made to the embodiments without departing from the scope and spirit of the present invention.
Claims
1. A screen flatness measurement method based on Shack-Hartmann microlens array, characterized in that: The method is applied to a screen flatness measurement system based on a Shack-Hartmann microlens array, and the system comprises: a screen flatness measurement device based on a Shack-Hartmann microlens array and a processor; wherein the screen flatness measurement device based on a Shack-Hartmann microlens array comprises a Shack-Hartmann microlens array and a monitor, wherein the monitor is located above the Shack-Hartmann microlens array, and the screen to be measured is located below the Shack-Hartmann microlens array; the processor is communicatively connected to the device, and the processor is used to perform the following steps: S100, acquiring each light spot on the monitor to obtain a light spot matrix A=(A 1，1 , A 1，2 , …, A 1，j , …, A 1，m , …, A i，1 , A i，2 , …, A i，j , …, A i，m , …, A n，1 , A n，2 , …, A n，j , …, A n，m ), i=1,2,…,n,j=1,2,…,m; where A i，j is the light spot of the i-th row and j-th column on the monitor, n is the number of rows of the light spot on the monitor, and m is the number of columns of the light spot on the monitor; S200, obtaining the diameter of each light spot in A to obtain a light spot diameter list D corresponding to A = (D 1，1 , D 1，2 , …, D 1，j , …, D 1，m , …, D i，1 , D i，2 , …, D i，j , …, D i，m , …, D n，1 , D n，2 , …, D n，j , …, D n，m ); where D i，j A i，j The diameter of S300, based on D, determine the spot diameter fluctuation rate η corresponding to D = (1 / (n×m))×∑ n i=1 ∑ m j=1 (A i，j -((1 / (n×m))×∑ n i=1 ∑ m j=1 A i，j )) 2 ; S400, if η<η' and (1 / (n×m))×∑ n i=1 ∑ m j=1 A i，j <D', it is determined that the flatness of the screen to be measured meets the preset flatness condition; wherein η' is the preset spot diameter fluctuation rate threshold, and D' is the preset spot diameter threshold.
2. The screen flatness measurement method based on the Shack-Hartmann microlens array according to claim 1, characterized in that: After step S400, the method further comprises the following steps: S500, if η<η' and (1 / (n×m))×∑ n i=1 ∑ m j=1 A i，j ≥D', then adjust the distance between the screen to be measured and the Shack-Hartmann microlens array and / or adjust the distance between the Shack-Hartmann microlens array and the monitor; proceed to S510; S510, if η<η' and (1 / (n×m))×∑ n i=1 ∑ m j=1 A i，j <D', it is determined that the flatness of the screen to be measured meets the preset flatness condition; S520, after adjusting the distance between the screen to be measured and the Shack-Hartmann microlens array and / or adjusting the distance between the Shack-Hartmann microlens array and the monitor for several times, if η<η' and (1 / (n×m))×∑ n i=1 ∑ m j=1 A i，j ≥D', it is determined that the flatness of the screen to be measured does not meet the preset flatness condition.
3. The screen flatness measurement method based on Shack-Hartmann microlens array according to claim 1, characterized in that: After step S400, the method further comprises the following steps: S600, if η≥η', obtain the difference between each spot diameter in D and the average spot diameter corresponding to D, so as to obtain a spot diameter difference list ΔD=(ΔD 1，1 , ΔD 1，2 ,…,ΔD 1，j ,…,ΔD 1，m ,…,ΔD i，1 , ΔD i，2 ,…,ΔD i，j ,…,ΔD i，m ,…,ΔD n，1 , ΔD n，2 ,…,ΔD n，j ,…,ΔD n，m ); where ΔD i，j D i，j The difference in average spot diameter corresponding to D; S610, traverse ΔD, if ΔD i，j >ΔD', then A i，j Determine the initial abnormal light spot to obtain the initial abnormal light spot list E = (E1, E2, ..., E p , …, E q ), p = 1, 2, …, q; where E p is the pth initial abnormal light spot determined, q is the number of initial abnormal light spots determined; S620, traverse E, if E p The brightness is less than the preset spot brightness threshold and E p The location and E p If the distance of the corresponding preset standard position is greater than the preset distance threshold, E p Determine the target abnormal light spot to obtain the target abnormal light spot list F=(F1,F2,…,F x , …, F y ), x=1, 2, …, y; where F x is the xth target abnormal light spot determined, and y is the number of target abnormal light spots determined; S630 , determining the flatness δ=y / (n×m) of the screen to be measured according to y, n and m.
4. The screen flatness measurement method based on Shack-Hartmann microlens array according to claim 1, characterized in that: D i，j Obtained through the following steps: S210, get A i，j The corresponding smallest circle; S220, A i，j The diameter of the corresponding smallest circle is determined as D i，j .
5. The screen flatness measurement method based on Shack-Hartmann microlens array according to claim 1, characterized in that: The number of Shack-Hartmann microlenses in the Shack-Hartmann microlens array is positively correlated with the size of the screen to be measured.
6. A screen flatness measurement device based on a Shack-Hartmann microlens array, characterized in that: The device comprises: a Shack-Hartmann microlens array and a monitor; wherein the monitor is located above the Shack-Hartmann microlens array, and a screen to be measured is placed below the Shack-Hartmann microlens array.
7. The screen flatness measuring device based on the Shack-Hartmann microlens array according to claim 6, characterized in that: The monitor is used to monitor the parameters of the light spot.
8. The screen flatness measuring device based on Shack-Hartmann microlens array according to claim 6, characterized in that: The material of the Shack-Hartmann microlenses in the Shack-Hartmann microlens array is silicon dioxide.