Testing device of docking control driver

Abstract

The invention discloses a testing device for a docking control driver, which is used for testing the docking control driver. The testing device of the butt joint control driver comprises a signal conditioning device, signals between a control device and a product to be tested are subjected to conversion and unified operation, and the signal conversion and unified operation comprises power supply voltage acquisition and conversion, mode switch contact simulation output, power supply on-off control and other operations. The signal conditioning equipment is connected with the control equipment through the data acquisition card; the 1553B bus communication module is used for controlling the 1553B bus communication function of the equipment and the product to be tested; the control equipment is used for controlling a test process, collecting, processing and displaying test data, sending an instruction according to a 1553B communication protocol, and receiving and analyzing return data of the 1553B bus communication module; the test cable is used for signal transmission between the signal conditioning equipment and the to-be-tested product; and the power supply supplies power to the to-be-tested product.

Description

Technical Field

[0001] The present application relates to the field of electronic product testing devices, and in particular to a testing device for a docking control driver. Background Art

[0002] In the process of developing docking control drivers, operators usually perform manual testing and debugging according to the test items. For different test items, operators are usually required to build different test environments, and use various test instruments to collect test data, and then manually record the collected data. Therefore, traditional manual testing and debugging require high professionalism of operators and inevitably take a lot of time, which undoubtedly limits the efficiency of R&D and testing. Summary of the invention

[0003] The technical problem to be solved by the present application is how to improve the integration of the test device while reducing the execution difficulty of the test items.

[0004] In order to solve the above technical problems, the present application provides a test device for a docking control driver, comprising: Signal conditioning equipment converts and uniformly operates the signals between the control equipment and the product to be tested. The signal conversion and uniform operation include: power supply voltage acquisition conversion, power supply current acquisition conversion, analog telemetry signal acquisition conversion, OC gate signal acquisition conversion, thermistor signal acquisition conversion, OC gate command output, potentiometer analog voltage output, switch contact analog output, power supply on-off control. The signal conditioning equipment is connected to the control equipment through a data acquisition card; 1553B bus communication module, used to control the 1553B bus communication function between the device and the product to be tested; Control equipment, control signal conditioning equipment to test, and collect, process and display test data. At the same time, it can send instructions according to the 1553B communication protocol, and receive and analyze the return data of the 1553B bus communication module; A test cable, used for signal transmission between the signal conditioning device and the product to be tested; Power supply, which provides power to the product under test.

[0005] Preferably, the data acquisition card can collect the power supply voltage signal, power supply current signal, analog telemetry signal, OC gate signal, and thermistor signal converted by the signal conditioning and adapter device to generate test data, and send the test data to the control device.

[0006] Preferably, the signal conditioning switching device further includes: Integrated OC gate circuit chip, capable of outputting OC gate instructions to implement OC gate instruction output operations; The analog output card can output the potentiometer analog voltage signal, and supports stepless adjustment of the output potentiometer analog voltage signal within the voltage range of 0~5V, thereby realizing the operation of potentiometer analog voltage output; A first relay and a first relay integrated driver chip, wherein the first relay is connected between switch contacts of the product to be tested, and the first relay integrated driver chip simulates the conduction and disconnection between the switch contacts by controlling the opening and closing of the first relay, thereby realizing the operation of the switch contact simulation output; The second relay and the second relay integrated driving chip are connected between the power supply and the product to be tested, and the second relay integrated driving chip controls the opening and closing of the second relay to realize the on-off control operation of the power supply.

[0007] Preferably, connectors are fixedly provided at both ends of the test cable, and the signal conditioning adapter is detachably connected to the product to be tested via the test cable.

[0008] Preferably, the signal conditioning switching device further includes: A signal conditioning transfer box, the signal conditioning transfer box comprising a front panel and a rear panel, The front panel is provided with a 220V power switch and a plurality of display modules capable of displaying the voltage and current of the power supply. The rear panel is provided with a data acquisition and transmission interface for connecting a data acquisition card, a connector interface for connecting a product to be tested, a power supply interface for connecting a DC power supply, and a 220V main power socket.

[0009] Preferably, the power supply includes at least two 60-140V adjustable power supplies, at least two 22-40V adjustable power supplies and at least two 26-32V adjustable power supplies.

[0010] One or more technical solutions provided in this application have at least the following technical effects or advantages: The test device of the docking control driver can simulate a variety of test environments to facilitate the execution of test items, and can centrally collect, process and display test data. Through these test data, the performance parameters of the product under specific circumstances can be monitored and evaluated in real time to ensure that the product functions and performance meet the design requirements. Compared with traditional purely manual testing and debugging, the test device of the docking control driver not only saves a lot of manpower, but also significantly improves the test efficiency. Therefore, this solution can improve the integration of the test device and reduce the difficulty of executing the test items. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] In order to more clearly illustrate the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0012] Figure 1 It is a schematic diagram of the composition structure of the test device for the docking control driver provided in an embodiment of the present application; Figure 2 It is a schematic diagram of the electrical connection relationship of the test device for docking control driver provided in the embodiment of the present application; Figure 3 It is a schematic diagram of the power supply voltage signal acquisition process provided in an embodiment of the present application; Figure 4 It is a schematic diagram of the analog telemetry signal acquisition process provided in the embodiment of the present application; Figure 5 It is a schematic diagram of the OC gate signal acquisition process provided by the embodiment of the present application; Figure 6 It is a schematic diagram of the thermistor signal measurement principle provided in the embodiment of the present application; Figure 7 It is a schematic diagram of the output process of the potentiometer analog voltage signal provided in the embodiment of the present application; Figure 8 is a schematic diagram of the switch contact signal control process provided in an embodiment of the present application; Fig. 9 It is a schematic diagram of the basic control principle of the switch contact signal control circuit provided in the embodiment of the present application; Fig.10 It is a schematic diagram of the power supply on-off control process provided by an embodiment of the present application; Fig.11 It is a schematic diagram of the basic principle of power supply on-off control provided in an embodiment of the present application. DETAILED DESCRIPTION

[0013] The following will be combined with the drawings of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the embodiments described in the present application are only some embodiments of the present application, not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present application.

[0014] Please refer to Figure 1 , the test device for docking control driver includes: Signal conditioning equipment converts and uniformly operates the signals between the control equipment and the product to be tested. The signal conversion and uniform operation include: power supply voltage acquisition conversion, power supply current acquisition conversion, analog telemetry signal acquisition conversion, OC gate signal acquisition conversion, thermistor signal acquisition conversion, OC gate command output, potentiometer analog voltage output, switch contact analog output, power supply on-off control. The signal conditioning equipment is connected to the control equipment through a data acquisition card; Among them, Figure 1 As shown, the signal conditioning device includes a power supply control and acquisition module, an analog signal acquisition module, an OC gate signal acquisition module, a thermistor acquisition module, an OC gate instruction output module, a potentiometer analog voltage output module and a switch contact analog output module. The power supply control and acquisition module is used to implement the power supply voltage acquisition conversion operation, the power supply current acquisition conversion and the power supply on-off control operation, the analog signal acquisition module is used to implement the analog telemetry signal acquisition conversion operation, the OC gate signal acquisition module is used to implement the OC gate signal acquisition conversion operation, the thermistor acquisition module is used to implement the thermistor signal acquisition conversion operation, the OC gate instruction output module is used to implement the OC gate instruction output operation, the potentiometer analog voltage output module is used to implement the potentiometer analog voltage output operation, and the switch contact analog output module is used to implement the switch contact analog output operation.

[0015] 1553B bus communication module, used to control the 1553B bus communication function between the device and the product to be tested; The control device controls the signal conditioning device to perform the test, and collects, processes and displays the test data. At the same time, the control device can send instructions according to the 1553B communication protocol, that is, the control device sends instructions through the 1553B bus communication module. The control device can also receive and parse the return data of the 1553B bus communication module. The control device is provided with a host computer software so that the operator can perform test-related operations. In this embodiment, the control device is a test computer; A test cable, used for signal transmission between the signal conditioning device and the product to be tested; The power supply is used to supply power to the product to be tested. The power supply in this embodiment is a DC power supply. Figure 1 The DC power supply is connected to the product to be tested through the signal conditioning device, and the signal conditioning device can control the on and off of the connection between the DC power supply and the product to be tested.

[0016] For details, please refer to Figure 2The data acquisition card can acquire the power supply voltage signal, power supply current signal, analog telemetry signal, OC gate signal, and thermistor signal converted by the signal conditioning and switching device to generate test data, and send the test data to the control device. The signal conditioning device implements the power supply voltage acquisition conversion, power supply current acquisition conversion, analog telemetry signal acquisition conversion, OC gate signal acquisition conversion, and thermistor signal acquisition conversion operations through the data acquisition card.

[0017] Please refer to Figure 3 , Figure 3 This is a schematic diagram of the power supply voltage signal acquisition process. Since the range threshold of the data acquisition card is usually ±10V, and the power supply voltage should normally be +100V, +28V and +29V, the power supply voltage signal needs to be converted in the signal conditioning equipment before being acquired by the data acquisition card. The specific conversion method is to first divide the voltage through resistance so that the power supply voltage signal does not exceed the range threshold of ±10V, and then through impedance conversion, the power supply voltage signal is in a high-impedance state to the input port and in a low-impedance state to the acquisition port of the data acquisition card, thereby meeting the requirements of high-precision acquisition.

[0018] The power supply current signal acquisition also needs to pass through the Hall current sensor, because the data acquisition card can usually only collect voltage signals. Based on the Hall effect principle, the Hall current sensor can convert the current signal passing through into a voltage signal in a non-contact manner, and the values ​​of the two are linearly proportional. Pass the power supply line through the hole in the middle of the Hall current sensor, and the Hall current sensor can output a voltage value that is proportional to the current in the power supply line. After the voltage is amplified by the operational amplifier circuit and connected to the analog acquisition channel of the data acquisition card, the voltage value can be read through the host computer software of the control device, and the actual current size can be obtained through parameter conversion.

[0019] The test device of the docking control driver can collect a total of 50 analog telemetry signals. Each acquisition channel is independent of each other, the acquisition accuracy is all 16 bits, and the acquisition frequency can be set by software, up to 10kSps. In this embodiment, the telemetry signals and their voltage ranges actually used by the docking control driver are as follows: Serial number Telemetry signal name Voltage range 1 A machine self-check status measurement 0 ~ 5V 2 Self-check status measurement of machine B 0 ~ 5V 3 C machine self-test status measurement 0 ~ 5V 4 Automatic control working status 0 ~ 5V 5 Control circuit +5V measurement 0 ~ 5V 6 Control circuit +12V measurement 0 ~ 5V 7 Control circuit - 12V measurement 0 ~ 5V 8 Main 1553B5V measurement 0 ~ 5V 9 1553B5V measurement 0 ~ 5V 10 Separation preparation completed 0 ~ 5V 11 Separation self-test completed 0 ~ 5V 12 Drive circuit +12V measurement 0 ~ 5V 13 Drive circuit - 12V measurement 0 ~ 5V 14 Main drive combined motor steering measurement 0 ~ 5V 15 A set of docking lock motor steering measurements 0 ~ 5V 16 Two sets of docking lock motor steering measurement 0 ~ 5V 17 Contact signal 0 ~ 5V 18 Signal 0 ~ 5V 19 Proximity signal 0 ~ 5V 20 Separate sensor signal 0 ~ 5V 21 Docking lock 1 locking signal 0 ~ 5V 22 Docking lock 1 unlock signal 0 ~ 5V 23 Docking lock 2 lock signal 0 ~ 5V 24 Docking lock 2 unlock signal 0 ~ 5V 25 Limit position signal 0 ~ 5V 26 Docking position signal 0 ~ 5V 27 Initial position signal 0 ~ 5V 28 Lock 1 lock signal 0 ~ 5V 29 Lock 1 unlock signal 0 ~ 5V 30 Lock 2 lock signal 0 ~ 5V 31 Lock 2 unlock signal 0 ~ 5V 32 Lock 3 lock signal 0 ~ 5V 33 Lock 3 unlock signal 0 ~ 5V 34 Electromagnetic drag mechanism locking signal 0 ~ 5V 35 Electromagnetic drag mechanism unlocking signal 0 ~ 5V 36 Close to analog signal 0 ~ 5V 37 Separating analog signals 0 ~ 5V 38 Rod displacement sensor RWY1 0 ~ 5V 39 Rod displacement sensor RWY2 0 ~ 5V 40 Rod displacement sensor RWY3 0 ~ 5V 41 Active docking lock sensor SD1-WY 0 ~ 5V 42 Active docking lock sensor SD2-WY 0 ~ 5V 43 Controllable damper analog signal 0 ~ 5V 44 Docking ready state 0 ~ 5V The docking control driver actually uses a total of 44 telemetry signals; Please refer to Figure 4 , Figure 4It is a schematic diagram of the analog telemetry signal acquisition process. The voltage of all analog telemetry signals does not exceed the threshold value of ±10V, so the analog telemetry signal can be directly connected to the analog acquisition channel of the data acquisition card, and then collected through the host computer software of the control device. In this embodiment, the selected data acquisition card can withstand a maximum overvoltage of ±30V, an input impedance of 1GΩ, a sampling accuracy of 16 bits, and a maximum sampling rate of 500kS / s, which fully meets the acquisition and safety requirements.

[0020] Please refer to Figure 5 , Figure 5 This is a schematic diagram of the OC gate signal acquisition process. Since the collected OC gate signal is the output of the OC gate circuit, and the OC gate is the collector open gate, the OC gate signal is first connected to Vcc through a 10KΩ pull-up resistor, and then the OC gate signal is connected to the analog acquisition channel of the data acquisition card. The host computer software of the control device can read the voltage value, compare the voltage value with the threshold voltage, and determine the on-off state of the OC gate, which is displayed in real time on the interface of the host computer software.

[0021] Please refer to Figure 6 , Figure 6 : is a schematic diagram of thermistor signal measurement principle. In this embodiment, the test equipment is a test device connected to the control driver, and the product under test is the product to be tested; the test equipment can collect 1-way temperature sensor signal in the product under test. Since the temperature sensor uses a thermistor, and the data acquisition card can only collect voltage signals, the thermistor Rt is connected in series with the reference resistor 7.5k and connected to a 5V power supply. The data acquisition card is used to collect the voltage across the reference resistor 7.5k to reversely calculate the resistance value of the thermistor Rt.

[0022] Specifically, the signal conditioning switching device also includes: Integrated OC gate circuit chip, capable of outputting OC gate instructions to implement OC gate instruction output operations; Among them, the OC gate drive circuit of the integrated OC gate circuit chip adopts a Darlington tube structure, and the drive current can reach 500mA; the OC gate instruction list actually used by the docking control driver is: Serial number Command name 1 Separation allowed (GNC) 2 Separation Start (GNC) 3 Mechanism reset (P command) 4 Docking preparation (P command) 5 Separation allowed (P command) 6 Separation start (P command) 7 Switch to A machine command (P command) 8 Switch to machine B command (P command) 9 Switch to C machine command (P command) 10 1553B Master switch to standby (P command) 11 1553B Standby machine switches to master machine (P command) 12 28V ground wire main circuit cut to standby circuit (P command) 13 28V ground wire standby circuit cuts off main circuit (P command) 14 Lock 1 motor main switch standby (P command) 15 Lock 1 motor standby switch main (P command) 16 Lock 2 motor main switch standby (P command) 17 Lock 2 motor standby switch to main (P command) 18 Lock 3 motor main switch standby (P command) 19 Lock 3 motor standby switch main (P command) 20 Automatic control shutdown (P command) 21 Docking lock 1 locked (P command) 22 Unlock docking lock 1 (P command) 23 Docking lock 2 locked (P command) 24 Docking lock 2 unlock (P command) 25 Motor stop (P command) 26 Lock backup motor 1 locks (P command) 27 Lock backup motor 2 lock closed (P command) 28 Lock backup motor 3 lock closed (P command) 29 1553B host switch to standby machine (K command) 30 1553B Standby machine switches to master machine (K command) 31 28V ground wire main circuit cut to backup circuit (K command) 32 28V ground wire standby circuit cuts off main circuit (K command) 33 Lock 1 motor main switch standby (K command) 34 Lock 1 motor standby switch main (K command) 35 Lock 2 motor main switch standby (K command) 36 Lock 2 motor standby switch main (K command) 37 Lock 3 motor main switch standby (K command) 38 Lock 3 motor standby switch main (K command) 39 Robot arm docking preparation (K command) 40 Robot arm separation completed (K command) 41 Automatic control shutdown (K command) 42 Docking ready (K command) 43 Electromagnetic drag mechanism lock (K command) 44 To docking position (K command) 45 Electromagnetic drag mechanism unlocking (K command) 46 Lock and close (K command) 47 Lock unlock (K command) 48 Butt lock (K order) 49 Unlock the docking lock (K command) 50 To the limit position (K command) 51 Pull back to the initial position (K command) 52 Motor stop (K command) 53 Controllable damper energized (K command) 54 Controllable damper de-energized (K command) 55 Lock backup motor 1 unlock (K command) 56 Lock backup motor 2 unlock (K command) 57 Lock backup motor 3 unlock (K command) 58 Geodesy Command 1 59 Geodesy Command 2 It records the 59 OC gate instructions actually used by the docking control driver.

[0023] The analog output card can output the potentiometer analog voltage signal, and supports stepless adjustment of the output potentiometer analog voltage signal within the voltage range of 0~5V, thereby realizing the operation of potentiometer analog voltage output; Please refer to Figure 7 , Figure 7This is the output flow chart of the potentiometer analog voltage signal. The test equipment can output 8-way potentiometer analog voltage signals. The host computer software of the control equipment can adjust the voltage in a stepless manner within the range of 0~5V and display the voltage value in real time. The list of 8-way potentiometer analog voltage signals actually used by the docking control driver is as follows: Serial number Signal name 1 Rod displacement sensor RWY1 2 Rod displacement sensor RWY2 3 Rod displacement sensor RWY3 4 Rod differential sensor RZC1 5 Rod differential sensor RZC2 6 Rod differential sensor RZC3 7 Active docking lock sensor SD1-WY 8 Active docking lock sensor SD2-WY The signal names of the 8-way potentiometer analog voltage signals in this embodiment are recorded. Since all analog signal outputs are within the range of 0-5V, they are directly connected to the output channels of the analog output card, and then the output is controlled by the host computer software.

[0024] A first relay and a first relay integrated driver chip, wherein the first relay is connected between switch contacts of the product to be tested, and the first relay integrated driver chip simulates the conduction and disconnection between the switch contacts by controlling the opening and closing of the first relay, thereby realizing the operation of the switch contact simulation output; Among them, the test equipment can output 130 switch contact signals. The user can set the output switch contact signals through the interface of the host computer software. The list of switch contact signals actually used by the docking control driver is as follows: Serial number Signal name 1 Docking position sensor SHW_DJ contact 1 2 Docking position sensor SHW_DJ contact 2 3 Docking position sensor SHW_DJ contact 3 4 Limit position sensor SHW_JX contact 1 5 Limit position sensor SHW_JX contact 2 6 Limit position sensor SHW_JX contact 3 7 Initial position sensor SCS1 contact 1 8 Initial position sensor SCS1 contact 2 9 Initial position sensor SCS1 contact 3 10 Initial position sensor SCS2 contact 1 11 Initial position sensor SCS2 contact 2 12 Initial position sensor SCS2 contact 3 13 Initial position sensor SCS3 contact 1 14 Initial position sensor SCS3 contact 2 15 Initial position sensor SCS3 contact 3 16 Lock 1 electric unlock sensor SB1_JS contact 1 17 Lock 1 electric unlock sensor SB1_JS contact 2 18 Lock 1 electric lock sensor SB1_SD contact 1 19 Lock 1 electric lock sensor SB1_SD contact 2 20 Lock 2 electric unlock sensor SB2_JS contact 1 21 Lock 2 electric unlock sensor SB2_JS contact 2 22 Lock 2 electric lock sensor SB2_SD contact 1 23 Lock 2 electric lock sensor SB2_SD contact 2 24 Lock 3 electric unlock sensor SB3_JS contact 1 25 Lock 3 electric unlock sensor SB3_JS contact 2 26 Lock 3 electric lock sensor SB3_SD contact 1 27 Lock 3 electric lock sensor SB3_SD contact 2 28 Proximity sensor SJJ1 contact 1 29 Proximity sensor SJJ1 contact 2 30 Proximity sensor SJJ1 contact 3 31 Proximity sensor SJJ2 contact 1 32 Proximity sensor SJJ2 contact 2 33 Proximity sensor SJJ2 contact 3 34 Proximity sensor SJJ3 contact 1 35 Proximity sensor SJJ3 contact 2 36 Proximity sensor SJJ3 contact 3 37 Proximity sensor SJJ4 contact 1 38 Proximity sensor SJJ4 contact 2 39 Proximity sensor SJJ4 contact 3 40 One set of active docking lock sensor SD1_SD contacts 41 One set of active docking lock unlocking sensor SD1_JS contacts 42 A set of driven docking lock sensor SD3_SD contacts 43 One set of driven docking lock unlocking sensor SD3_JS contacts 44 One set of driven docking lock sensor SD5_SD contacts 45 One set of driven docking lock unlocking sensor SD5_JS contacts 46 One set of driven docking lock sensor SD7_SD contacts 47 One set of driven docking lock unlocking sensor SD7_JS contacts 48 A set of driven docking lock sensor SD9_SD contacts 49 One set of driven docking lock unlocking sensor SD9_JS contacts 50 A set of driven docking lock sensor SD11_SD contacts 51 One set of driven docking lock unlocking sensor SD11_JS contacts 52 Two sets of active docking lock sensors SD2_SD contacts 53 Two sets of active docking lock unlocking sensor SD2_JS contacts 54 Two sets of driven docking lock sensor SD4_SD contact 55 Two sets of driven docking lock unlocking sensor SD4_JS contacts 56 Two sets of driven docking lock sensor SD6_SD contact 57 Two sets of driven docking lock unlocking sensor SD6_JD contacts 58 Two sets of driven docking lock sensor SD8_SD contact 59 Two sets of driven docking lock unlocking sensor SD8_JS contacts 60 Two sets of driven docking lock sensor SD10_SD contact 61 Two sets of driven docking lock unlocking sensor SD10_JS contacts 62 Two sets of driven docking lock sensor SD12_SD contact 63 Two sets of driven docking lock unlocking sensor SD12_JS contacts 64 Electromagnetic drag mechanism locking sensor SY1-SD1 65 Electromagnetic drag mechanism locking sensor SY1-SD2 66 Electromagnetic drag mechanism locking sensor SY2-SD1 67 Electromagnetic drag mechanism locking sensor SY2-SD2 68 Electromagnetic drag mechanism locking sensor SY3-SD1 69 Electromagnetic drag mechanism locking sensor SY3-SD2 70 Electromagnetic drag mechanism locking sensor SY4-SD1 71 Electromagnetic drag mechanism locking sensor SY4-SD2 72 Electromagnetic drag mechanism locking sensor SY5-SD1 73 Electromagnetic drag mechanism locking sensor SY5-SD2 74 Electromagnetic drag mechanism unlocking sensor SY1-JS1 75 Electromagnetic drag mechanism unlocking sensor SY1-JS2 76 Electromagnetic drag mechanism unlocking sensor SY2-JS1 77 Electromagnetic drag mechanism unlocking sensor SY2-JS2 78 Electromagnetic drag mechanism unlocking sensor SY3-JS1 79 Electromagnetic drag mechanism unlocking sensor SY3-JS2 80 Electromagnetic drag mechanism unlocking sensor SY4-JS1 81 Electromagnetic drag mechanism unlocking sensor SY4-JS2 82 Electromagnetic drag mechanism unlocking sensor SY5-JS1 83 Electromagnetic drag mechanism unlocking sensor SY5-JS2 84 Unbalance sensor SST1 contact 1 85 Unbalance sensor SST1 contact 2 86 Unbalance sensor SST1 contact 3 87 Unbalance sensor SST2 contact 1 88 Unbalance sensor SST2 contact 2 89 Unbalance sensor SST2 contact 3 90 Unbalance sensor SST3 contact 1 91 Unbalance sensor SST3 contact 2 92 Unbalance sensor SST3 contact 3 93 Unbalance sensor SST4 contact 1 94 Unbalance sensor SST4 contact 2 95 Unbalance sensor SST4 contact 3 96 Unbalance sensor SST5 contact 1 97 Unbalance sensor SST5 contact 2 98 Unbalance sensor SST5 contact 3 99 Sensor SBH1 contact 1 (long signal) 100 Sensor SBH1 contact 2 (long signal) 101 Sensor SBH1 contact 3 (short signal) 102 Sensor SBH1 contact 4 (short signal) 103 Sensor SBH2 contact 1 (long signal) 104 Sensor SBH2 contact 2 (long signal) 105 Sensor SBH2 contact 3 (short signal) 106 Sensor SBH2 contact 4 (short signal) 107 Sensor SBH3 contact 1 (long signal) 108 Sensor SBH3 contact 2 (long signal) 109 Sensor SBH3 contact 3 (short signal) 110 Sensor SBH3 contact 4 (short signal) 111 Separation sensor SFL1 contact 1 112 Separation sensor SFL1 contact 2 113 Separation sensor SFL1 contact 3 114 Separation sensor SFL2 contact 1 115 Separation sensor SFL2 contact 2 116 Separation sensor SFL2 contact 3 The docking control driver actually uses a total of 116 switch contact signals, each of which is controlled on and off by a corresponding relay; please refer to Figure 8 , Figure 8 Schematic diagram of the switch contact signal control process. In order to realize the function of controlling the switch contact signal using the host computer software, the digital channel of the data acquisition card is used in this embodiment to control the control end of the first relay integrated driver chip, thereby controlling the first relay to realize the switching between the open and closed states of the switch. The basic control principle of the switch contact signal control circuit is as follows: Fig. 9 As shown, Fig. 9 The first relay in the circuit is driven by the first relay integrated driver chip. Figure 8 and Fig. 9 The relay in is the first relay, Figure 8 The driving chip in is the first relay integrated driving chip.

[0025] The second relay and the second relay integrated driving chip are connected between the power supply and the product to be tested, and the second relay integrated driving chip controls the opening and closing of the second relay to realize the on-off control operation of the power supply.

[0026] Please refer to Fig.10 and Fig.11 , Fig.10 and Fig.11 The relay in represents the second relay, Fig.10 and Fig.11 The driver chip in the figure represents the second relay driver chip; the digital channel of the data acquisition card is used to control the control end of the second relay driver chip, and then the second relay is controlled to switch between the open and closed states of the switch, thereby realizing the on-off control of the power supply.

[0027] Specifically, connectors are respectively fixed at both ends of the test cable, and the signal conditioning adapter is detachably connected to the product to be tested through the test cable. Specifically, the signal conditioning adapter is detachably connected to the test cable through a connector, and at the same time, the product to be tested is detachably connected to the test cable through a connector.

[0028] Specifically, the signal conditioning switching device also includes: A signal conditioning transfer box, the signal conditioning transfer box comprising a front panel and a rear panel, The front panel is provided with 6 display modules capable of displaying the voltage and current of the power supply, which are used to monitor the voltage and current of the power supply in real time. The front panel is also provided with a 220V power switch capable of controlling the 220V main power input; the rear panel is provided with a data acquisition and transmission interface for connecting a data acquisition card, a connector interface for connecting a product to be tested, a power supply interface for connecting a DC power supply, and a 220V main power socket, wherein the number and model of the connector interfaces are flexibly set according to the actual signal nodes, the power supply interface can be connected to the power supply or other external DC power supplies, and the power supply interface and the 220V main power socket are both used to power the signal conditioning equipment.

[0029] Specifically, the power supply includes 2 60~140V adjustable power supplies, with a rated power of 150W and a peak power of 200W; 2 22~40V adjustable power supplies, with a rated power of 200W and a peak power of 400W; and 2 26~32V adjustable power supplies, with a rated power of 5W and a peak power of 10W. In the docking control driver test equipment, the reason for setting different types of power supplies and their power parameters is mainly to meet the power supply requirements of the product to be tested in different working modes. Setting two of each type of power supply is convenient for testing two products to be tested, one main and one backup, at the same time, thereby ensuring the reliability and safety of the test process.

[0030] The data acquisition card is used as a separate device in this embodiment, but in practice the data acquisition card can also be integrated into a signal conditioning device or a control device as a part of the signal conditioning device or the control device; the product to be tested and the product under test involved in this application both refer to the docking control driver.

[0031] The workflow of the test device for docking control driver can be: first, the host computer software of the control device generates the corresponding control command and inputs it to the signal conditioning device through the data acquisition card, then the signal conditioning device adjusts and converts the corresponding electrical signal according to different instructions and sends the required input signal to the product to be tested; the product makes corresponding actions after receiving the input signal, and then sends the feedback signal back to the signal conditioning device, the signal conditioning device transmits the test data to the host computer through the data acquisition card, and finally displays it on the interface of the host computer software. Another 1553B bus communication process of docking control driver is similar to the above workflow. The test computer sends instructions and receives and analyzes data from the product under test through the 1553B bus communication module, which specifically involves the following links: sending self-test instructions and receiving self-test results during system initialization and configuration; sending control instructions and data requests during the test, receiving the status information and fault information of the product under test; real-time monitoring of the status of the product under test, and fault detection; recording test results, generating detailed test reports and displaying them in real time on the interface of the host computer software; the control device automatically sends instructions, receives data and automatically determines the test results according to the preset test process.

[0032] It should also be noted that in this specification, the terms "include", "comprises" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, an element defined by the sentence "comprises a ..." does not exclude the presence of other identical elements in the process, method, article or device including the element.

Claims

1. A test device for a docking control driver, characterized in that: include: Signal conditioning equipment converts and uniformly operates the signals between the control equipment and the product to be tested. The signal conversion and uniform operation include: power supply voltage acquisition conversion, power supply current acquisition conversion, analog telemetry signal acquisition conversion, OC gate signal acquisition conversion, thermistor signal acquisition conversion, OC gate command output, potentiometer analog voltage output, switch contact analog output, power supply on-off control. The signal conditioning equipment is connected to the control equipment through a data acquisition card; 1553B bus communication module, used to control the 1553B bus communication function between the device and the product to be tested; Control equipment, control signal conditioning equipment to test, and collect, process and display test data. At the same time, it can send instructions according to the 1553B communication protocol, and receive and analyze the return data of the 1553B bus communication module; A test cable, used for signal transmission between the signal conditioning device and the product to be tested; Power supply, which provides power to the product under test.

2. The test device for docking control driver according to claim 1, characterized in that: The data acquisition card can collect the power supply voltage signal, power supply current signal, analog telemetry signal, OC gate signal, and thermistor signal converted by the signal conditioning and switching device to generate test data, and send the test data to the control device.

3. The test device for docking control driver according to claim 1, characterized in that: The signal conditioning switching device also includes: Integrated OC gate circuit chip, capable of outputting OC gate instructions to realize the operation of OC gate instruction output; The analog output card can output the potentiometer analog voltage signal, and supports stepless adjustment of the output potentiometer analog voltage signal within the voltage range of 0~5V, thereby realizing the operation of potentiometer analog voltage output; A first relay and a first relay integrated driver chip, wherein the first relay is connected between switch contacts of the product to be tested, and the first relay integrated driver chip simulates the conduction and disconnection between the switch contacts by controlling the opening and closing of the first relay, thereby realizing the operation of the switch contact simulation output; The second relay and the second relay integrated driving chip are connected between the power supply and the product to be tested, and the second relay integrated driving chip controls the opening and closing of the second relay to realize the on-off control operation of the power supply.

4. The test device for docking control driver according to claim 1, characterized in that: Connectors are fixedly mounted at both ends of the test cable, and the signal conditioning adapter is detachably connected to the product to be tested via the test cable.

5. The test device for docking control driver according to claim 1, characterized in that: The signal conditioning switching device also includes: A signal conditioning transfer box, the signal conditioning transfer box comprising a front panel and a rear panel, The front panel is provided with a 220V power switch and a plurality of display modules capable of displaying the voltage and current of the power supply. The rear panel is provided with a data acquisition and transmission interface for connecting a data acquisition card, a connector interface for connecting a product to be tested, a power supply interface for connecting a DC power supply, and a 220V main power socket.

6. The test device for docking control driver according to claim 1, characterized in that: The power supply includes at least two 60-140V adjustable power supplies, at least two 22-40V adjustable power supplies and at least two 26-32V adjustable power supplies.

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