Steel nail finished product impurity detection system

By designing a collaboratively working impurity detection system for finished steel nails, using image processing technology and standard appearance pattern detection, the problem of insufficient detection accuracy of impurity distribution state detection in the prior art is solved, and high-precision impurity recognition and Visual identification.

CN119477859AInactive Publication Date: 2025-02-18NANJING YUANFANSU NETWORK TECH CO LTD
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Patent Information

Application Number
CN202411588818.X
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Priority Date
2024-01-25
Filing Date
2024-11-08
Publication Date
2025-02-18
Estimated Expiration
Not applicable · inactive patent

AI Technical Summary

Technical Problem

The lack of a high-precision detection mechanism for the impurity distribution state of the finished steel nail products in the prior art makes it difficult to implement high-precision detection of the impurity distribution state of each finished steel nail product.

Method used

A steel nail finished impurity detection system was designed to realize real-time shooting of finished steel nail products by collaborative control equipment, finished product shooting equipment, sequence enhancement equipment, front-end processing mechanism, mid-end processing mechanism and tail-end processing mechanism. Image processing and impurity recognition. The specific steps include: detecting matching image chunking based on standard appearance patterns, obtaining the grayscale value in the target image chunking, calculating the reference value ratio, and issuing an impurity recognition command based on the ratio threshold.

Benefits of technology

The visual identification of the impurity distribution status of finished steel nails is realized, the detection accuracy and efficiency are improved, and the basic data of impurity distribution status is provided.

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Abstract

The invention relates to a steel nail finished product impurity detection system, and the system comprises a cooperative control device which is used for sending a shooting triggering request to a finished product shooting device once after a steel nail production line completes the production of a single steel nail finished product; and the tail end processing mechanism is used for dividing the number of the second gray numerical values in the target image blocks by the number of the first gray numerical values to obtain a reference numerical value ratio, sending an impurity identification command when the reference numerical value ratio is greater than or equal to a set ratio threshold value, and otherwise, sending an impurity unidentified command. The steel nail finished product impurity detection system is reliable in logic and stable in operation. The impurity distribution state corresponding to the steel nail finished product can be intelligently detected based on various visual data of the steel nail finished product, and the impurity identification command or the impurity unidentified command is correspondingly sent, so that visual identification of the impurity distribution state corresponding to the steel nail finished product is realized.
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Description

Technical Field

[0001] The invention relates to the field of image analysis, and in particular to a system for detecting impurities in finished steel nail products. Background Art

[0002] Although the research on image analysis has achieved a lot of results and has been applied to specific objects in many fields, there are still many problems in establishing a common theoretical basis, which need to be further solved. For example, the accurate representation of images, the representation of surface information at different resolution levels, the establishment of a hierarchical structure of representation, the use and determination of surface color and state information, the perception process of motion state, the method of obtaining information from optical flow, and the method of applying relevant specialized information in visual perception.

[0003] Prior art CN116380849A provides an indirect detection method for the uniformity of impurities in a 4H-SiC single crystal. The method uses a lifetime test device to perform laser injection on the surface of a silicon carbide wafer to generate electron-hole pairs in the wafer, and then removes the external light injection to obtain a minority carrier lifetime distribution mapping image based on the change in conductivity. Since the main factor affecting the lifetime distribution in the crystal is the effect between N impurities and deep energy levels, the impurity distribution of the entire wafer can be indirectly judged based on the unevenness of the lifetime region on the crystal surface. The method provided by the application can not only quickly obtain the uniformity of impurities on the wafer, but also the method is simple to operate and takes less time. In addition, there is still room for improvement and perfection in the application of image analysis in some specific sub-sectors. For example, the prior art lacks a high-precision detection mechanism for the impurity distribution state corresponding to the finished steel nails. Due to the small size of the finished steel nails, the difference between different impurity distribution states is relatively subtle, resulting in high-precision detection of the impurity distribution state corresponding to each finished steel nail. Summary of the invention

[0004] According to the present invention, a system for detecting impurities in finished steel nails is provided, the system comprising: The collaborative control device is used to send a shooting trigger request to the finished product shooting device after the steel nail production line completes the production of a single steel nail finished product; Finished product shooting equipment, used for performing a shooting operation on a single finished steel nail product every time a shooting trigger request is received, so as to obtain and output a corresponding real-time shooting picture; An order enhancement device, connected to the finished product shooting device and comprising a picture receiving component, a first enhancement component, a second enhancement component, a third enhancement component and a picture output component, for performing gamma correction processing, salt and pepper noise removal processing and pulse interference removal processing on the order of the received real-time shooting pictures to obtain and output corresponding order-enhanced pictures; A front-end processing mechanism is connected to the order enhancement device, and is used to receive the order enhancement picture, detect each matching image block in the order enhancement picture based on the standard shape pattern corresponding to the finished steel nail product, and output the matching image block with the largest area as the target image block; A mid-end processing mechanism, connected to the front-end processing mechanism, for obtaining grayscale values ​​corresponding to each pixel in the target image block, taking the grayscale values ​​that are the same as other grayscale values ​​as the first grayscale value, and taking the grayscale values ​​that are different from other grayscale values ​​as the second grayscale value; a tail-end processing mechanism connected to the middle-end processing mechanism, and configured to divide the number of second grayscale values ​​in the target image block by the number of first grayscale values ​​to obtain a reference value ratio, and to issue an impurity recognition command when the reference value ratio is greater than or equal to a set ratio threshold, otherwise, to issue an impurity non-recognition command; Among them, based on the detection order of the standard appearance pattern corresponding to the finished steel nail, each matching image block in the picture is enhanced, and the matching image block with the largest area is output as the target image block, including: the standard appearance pattern corresponding to the finished steel nail is a plurality of frames, and the plurality of frames of the standard appearance pattern are respectively taken from different perspectives of the standard finished steel nail in the factory state, and only include a single piece of standard finished steel nail.

[0005] In order to solve the technical problems in the related fields, the present invention provides a technical solution that can detect the matching image blocks in the order-enhanced picture after targeted optimization processing based on the standard shape pattern corresponding to the finished steel nail, take the matching image block with the largest area as the target image block, obtain the grayscale values ​​corresponding to the pixels in the target image block, take the grayscale values ​​that are the same as other grayscale values ​​among the grayscale values ​​as the first grayscale value, and take the grayscale values ​​that are different from other grayscale values ​​among the grayscale values ​​as the second grayscale value, thereby providing reliable basic data for the impurity distribution state corresponding to the finished steel nail, and dividing the number of second grayscale values ​​in the target image block by the number of first grayscale values ​​to obtain a reference value ratio, and when the reference value ratio is greater than or equal to the set ratio threshold, issuing an impurity recognition command, otherwise, issuing an impurity non-recognition command, thereby realizing visual identification of the impurity distribution state corresponding to the finished steel nail. DETAILED DESCRIPTION

[0006] The following is a detailed description of an embodiment of the system for detecting impurities in finished steel nails of the present invention.

[0007] First embodiment

[0008] According to the first embodiment of the present invention, a finished steel nail impurity detection system is shown, and the system includes: The collaborative control device is used to send a shooting trigger request to the finished product shooting device after the steel nail production line completes the production of a single steel nail finished product; For example, the collaborative control device is used to send a shooting trigger request to the finished product shooting device after the steel nail production line completes the production of a single steel nail finished product, including: a programmable logic device can be selected to implement the collaborative control device, which is used to send a shooting trigger request to the finished product shooting device after the steel nail production line completes the production of a single steel nail finished product; Finished product shooting equipment, used for performing a shooting operation on a single finished steel nail product every time a shooting trigger request is received, so as to obtain and output a corresponding real-time shooting picture; An order enhancement device, connected to the finished product shooting device and comprising a picture receiving component, a first enhancement component, a second enhancement component, a third enhancement component and a picture output component, for performing gamma correction processing, salt and pepper noise removal processing and pulse interference removal processing on the order of the received real-time shooting pictures to obtain and output corresponding order-enhanced pictures; Specifically, a numerical simulation mode may be selected to implement gamma correction processing, salt and pepper noise removal processing, and pulse interference removal processing on the received real-time shooting picture order, so as to obtain and output the simulation and test of the processing process of the corresponding order-enhanced picture; A front-end processing mechanism is connected to the order enhancement device, and is used to receive the order enhancement picture, detect each matching image block in the order enhancement picture based on the standard shape pattern corresponding to the finished steel nail product, and output the matching image block with the largest area as the target image block; A mid-end processing mechanism, connected to the front-end processing mechanism, for obtaining grayscale values ​​corresponding to each pixel in the target image block, taking the grayscale values ​​that are the same as other grayscale values ​​as the first grayscale value, and taking the grayscale values ​​that are different from other grayscale values ​​as the second grayscale value; a tail-end processing mechanism connected to the middle-end processing mechanism, and configured to divide the number of second grayscale values ​​in the target image block by the number of first grayscale values ​​to obtain a reference value ratio, and to issue an impurity recognition command when the reference value ratio is greater than or equal to a set ratio threshold, otherwise, to issue an impurity non-recognition command; Among them, based on the detection order of the standard shape pattern corresponding to the finished steel nail, each matching image block in the picture is enhanced, and the matching image block with the largest area is output as the target image block, including: the standard shape pattern corresponding to the finished steel nail is a plurality of frames, and the plurality of frames of the standard shape pattern are respectively a plurality of frames of imaging pictures of the standard finished steel nail in the factory state taken from different perspectives, and only include a single piece of the standard finished steel nail; Among them, the number of second grayscale values ​​in the target image block is divided by the number of first grayscale values ​​to obtain a reference value ratio, and when the reference value ratio is greater than or equal to a set ratio threshold, an impurity recognition command is issued, otherwise, an impurity unrecognized command is issued, including: using MATLAB toolbox to simulate the data processing process of dividing the number of second grayscale values ​​in the target image block by the number of first grayscale values ​​to obtain a reference value ratio, and when the reference value ratio is greater than or equal to a set ratio threshold, an impurity recognition command is issued, otherwise, an impurity unrecognized command is issued.

[0009] Second embodiment

[0010] A finished steel nail impurity detection system according to a second embodiment of the present invention includes: The collaborative control device is used to send a shooting trigger request to the finished product shooting device after the steel nail production line completes the production of a single steel nail finished product; Finished product shooting equipment, used for performing a shooting operation on a single finished steel nail product every time a shooting trigger request is received, so as to obtain and output a corresponding real-time shooting picture; An order enhancement device, connected to the finished product shooting device and comprising a picture receiving component, a first enhancement component, a second enhancement component, a third enhancement component and a picture output component, for performing gamma correction processing, salt and pepper noise removal processing and pulse interference removal processing on the order of the received real-time shooting pictures to obtain and output corresponding order-enhanced pictures; A front-end processing mechanism is connected to the order enhancement device, and is used to receive the order enhancement picture, detect each matching image block in the order enhancement picture based on the standard shape pattern corresponding to the finished steel nail product, and output the matching image block with the largest area as the target image block; A mid-end processing mechanism, connected to the front-end processing mechanism, for obtaining grayscale values ​​corresponding to each pixel in the target image block, taking the grayscale values ​​that are the same as other grayscale values ​​as the first grayscale value, and taking the grayscale values ​​that are different from other grayscale values ​​as the second grayscale value; a tail-end processing mechanism connected to the middle-end processing mechanism, and configured to divide the number of second grayscale values ​​in the target image block by the number of first grayscale values ​​to obtain a reference value ratio, and to issue an impurity recognition command when the reference value ratio is greater than or equal to a set ratio threshold, otherwise, to issue an impurity non-recognition command; a volume detection component, connected to the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism, respectively, and used to measure the current real-time volume values ​​of the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism respectively; Wherein, the volume detection component is respectively connected with the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism, and is used to respectively measure the current real-time volume values ​​of the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism, including: the volume detection component includes a plurality of volume measurement units, which are respectively connected with the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism, so as to complete the measurement of the current real-time volume values ​​of the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism; The volume detection component includes a plurality of volume measurement units, which are respectively connected to the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism to complete the measurement of the current real-time volume values ​​of the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism respectively. The plurality of volume measurement units are a plurality of visual detectors, which are respectively connected to the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism to complete the measurement of the current real-time volume values ​​of the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism respectively; Wherein, the plurality of volume measurement units are a plurality of visual detectors, which are used to be connected to the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism respectively, so as to complete the measurement of the current real-time volume values ​​of the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism respectively, including: the structures of the plurality of visual detectors are the same; Among them, the multiple volume measurement units are multiple visual detectors, which are used to be connected to the order enhancement device, the front-end processing mechanism, the mid-end processing mechanism and the tail-end processing mechanism respectively, so as to complete the separate measurement of the current real-time volume values ​​of the order enhancement device, the front-end processing mechanism, the mid-end processing mechanism and the tail-end processing mechanism respectively, and also include: each of the multiple visual detectors includes a stereo camera.

[0011] Third embodiment

[0012] A finished steel nail impurity detection system according to a third embodiment of the present invention includes: The collaborative control device is used to send a shooting trigger request to the finished product shooting device after the steel nail production line completes the production of a single steel nail finished product; Finished product shooting equipment, used for performing a shooting operation on a single finished steel nail product every time a shooting trigger request is received, so as to obtain and output a corresponding real-time shooting picture; An order enhancement device, connected to the finished product shooting device and comprising a picture receiving component, a first enhancement component, a second enhancement component, a third enhancement component and a picture output component, for performing gamma correction processing, salt and pepper noise removal processing and pulse interference removal processing on the order of the received real-time shooting pictures to obtain and output corresponding order-enhanced pictures; A front-end processing mechanism is connected to the order enhancement device, and is used to receive the order enhancement picture, detect each matching image block in the order enhancement picture based on the standard shape pattern corresponding to the finished steel nail product, and output the matching image block with the largest area as the target image block; A mid-end processing mechanism, connected to the front-end processing mechanism, for obtaining grayscale values ​​corresponding to each pixel in the target image block, taking the grayscale values ​​that are the same as other grayscale values ​​as the first grayscale value, and taking the grayscale values ​​that are different from other grayscale values ​​as the second grayscale value; a tail-end processing mechanism connected to the middle-end processing mechanism, and configured to divide the number of second grayscale values ​​in the target image block by the number of first grayscale values ​​to obtain a reference value ratio, and to issue an impurity recognition command when the reference value ratio is greater than or equal to a set ratio threshold, otherwise, to issue an impurity non-recognition command; A synchronous operation mechanism, connected to the plurality of volume measurement units of the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism respectively, for performing synchronous operations between the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism in pairs; Wherein, the synchronous operation mechanism is respectively connected to a plurality of volume measurement units of the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism, and is used to perform a synchronous operation between the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism, including: the synchronous operation mechanism performs a synchronous operation between the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism based on a square wave waveform; And wherein, the synchronous operation mechanism is respectively connected to multiple volume measurement units of the order enhancement device, the front-end processing mechanism, the mid-end processing mechanism and the tail-end processing mechanism, and is used to perform synchronous operations between the order enhancement device, the front-end processing mechanism, the mid-end processing mechanism and the tail-end processing mechanism, including: using an ASIC chip to implement the synchronous operation mechanism.

[0013] In addition, in the finished steel nail impurity detection system, an order enhancement device is connected to the finished product shooting device and includes a picture receiving component, a first enhancement component, a second enhancement component, a third enhancement component and a picture output component, which is used to perform gamma correction processing, salt and pepper noise removal processing and pulse interference removal processing on the received real-time shooting picture order to obtain and output the corresponding order enhanced picture, including: the first enhancement component, the second enhancement component and the third enhancement component are used to perform gamma correction processing, salt and pepper noise removal processing and pulse interference removal processing on the received picture data respectively.

[0014] According to the embodiments of the present invention, it can be concluded that the present invention mainly has the following significant technical effects: Firstly, the real-time shooting images obtained by shooting a single steel nail product are sequentially optimized for gamma correction, salt and pepper noise removal, and pulse interference removal to obtain a sequence-enhanced image with better image quality, thereby improving the accuracy and efficiency of subsequent impurity detection of steel nail products; Secondly: based on the standard shape pattern corresponding to the finished steel nail, detect each matching image block in the order-enhanced picture after targeted optimization processing, take the matching image block with the largest area as the target image block, obtain each grayscale value corresponding to each pixel in the target image block, take the grayscale value that is the same as other grayscale values ​​as the first grayscale value, and take the grayscale value that is different from other grayscale values ​​as the second grayscale value, so as to provide reliable basic data for the impurity distribution state corresponding to the finished steel nail; Again: divide the number of second grayscale values ​​in the target image block by the number of first grayscale values ​​to obtain a reference value ratio. When the reference value ratio is greater than or equal to the set ratio threshold, an impurity recognition command is issued, otherwise, an impurity non-recognition command is issued, thereby achieving visual identification of the impurity distribution state corresponding to the finished steel nail.

[0015] Therefore, the impurity detection system for finished steel nails of the present invention is logically reliable and operates stably. Since it can intelligently detect the impurity distribution state corresponding to the finished steel nails based on various visualized data of the finished steel nails, and issue an impurity identification command or an impurity non-identification command accordingly, it can realize the visual identification of the impurity distribution state corresponding to the finished steel nails.

[0016] Many modifications and changes can be made to the techniques and data structures described and illustrated herein without departing from the spirit and scope of the claims. Therefore, it should be understood that the methods and devices described herein are exemplary only and are not intended to limit the claims.

Claims

1. A finished steel nail impurity detection system, characterized in that: The system comprises: The collaborative control device is used to send a shooting trigger request to the finished product shooting device after the steel nail production line completes the production of a single steel nail finished product; Finished product shooting equipment, used for performing a shooting operation on a single finished steel nail product every time a shooting trigger request is received, so as to obtain and output a corresponding real-time shooting picture; An order enhancement device, connected to the finished product shooting device and comprising a picture receiving component, a first enhancement component, a second enhancement component, a third enhancement component and a picture output component, for performing gamma correction processing, salt and pepper noise removal processing and pulse interference removal processing on the order of the received real-time shooting pictures to obtain and output corresponding order-enhanced pictures; A front-end processing mechanism is connected to the order enhancement device, and is used to receive the order enhancement picture, detect each matching image block in the order enhancement picture based on the standard shape pattern corresponding to the finished steel nail product, and output the matching image block with the largest area as the target image block; A mid-end processing mechanism, connected to the front-end processing mechanism, for obtaining grayscale values ​​corresponding to each pixel in the target image block, taking the grayscale values ​​that are the same as other grayscale values ​​as the first grayscale value, and taking the grayscale values ​​that are different from other grayscale values ​​as the second grayscale value; a tail-end processing mechanism connected to the middle-end processing mechanism, and configured to divide the number of second grayscale values ​​in the target image block by the number of first grayscale values ​​to obtain a reference value ratio, and to issue an impurity recognition command when the reference value ratio is greater than or equal to a set ratio threshold, otherwise, to issue an impurity non-recognition command; Among them, based on the detection order of the standard appearance pattern corresponding to the finished steel nail, each matching image block in the picture is enhanced, and the matching image block with the largest area is output as the target image block, including: the standard appearance pattern corresponding to the finished steel nail is a plurality of frames, and the plurality of frames of the standard appearance pattern are respectively taken from different perspectives of the standard finished steel nail in the factory state, and only include a single piece of standard finished steel nail.

2. The finished steel nail impurity detection system according to claim 1, characterized in that: The number of second grayscale values ​​in the target image block is divided by the number of first grayscale values ​​to obtain a reference value ratio, and when the reference value ratio is greater than or equal to a set ratio threshold, an impurity recognition command is issued, otherwise, an impurity non-recognition command is issued, including: using MATLAB toolbox to simulate the data processing process of dividing the number of second grayscale values ​​in the target image block by the number of first grayscale values ​​to obtain a reference value ratio, and when the reference value ratio is greater than or equal to a set ratio threshold, an impurity recognition command is issued, otherwise, an impurity non-recognition command is issued.

3. The finished steel nail impurity detection system according to claim 2, characterized in that: The system further comprises: a volume detection component, connected to the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism, respectively, and used to measure the current real-time volume values ​​of the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism respectively; Among them, the volume detection component is respectively connected with the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism, and is used to respectively measure the current real-time volume values ​​of the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism, including: the volume detection component includes multiple volume measurement units, which are respectively connected with the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism to complete the respective measurement of the current real-time volume values ​​of the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism.

4. The finished steel nail impurity detection system according to claim 3, characterized in that: The volume detection component includes a plurality of volume measurement units, which are used to be connected to the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism respectively, so as to complete the measurement of the current real-time volume values ​​of the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism respectively, including: the plurality of volume measurement units are a plurality of visual detectors, which are used to be connected to the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism respectively, so as to complete the measurement of the current real-time volume values ​​of the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism respectively.

5. The finished steel nail impurity detection system according to claim 4, characterized in that: The multiple volume measurement units are multiple visual detectors, which are used to be connected to the order enhancement device, the front-end processing mechanism, the mid-end processing mechanism and the tail-end processing mechanism respectively, so as to complete the respective measurements of the current real-time volume values ​​of the order enhancement device, the front-end processing mechanism, the mid-end processing mechanism and the tail-end processing mechanism, including: the structures of the multiple visual detectors are the same.

6. The impurity detection system for finished steel nails according to claim 5, characterized in that: The multiple volume measurement units are multiple visual detectors, which are used to be connected to the order enhancement device, the front-end processing mechanism, the mid-end processing mechanism and the tail-end processing mechanism respectively to complete the separate measurement of the current real-time volume values ​​of the order enhancement device, the front-end processing mechanism, the mid-end processing mechanism and the tail-end processing mechanism respectively, and also include: each of the multiple visual detectors includes a stereo camera.

7. The finished steel nail impurity detection system according to any one of claims 3 to 6, characterized in that: The system further comprises: The synchronous operation mechanism is respectively connected to the multiple volume measurement units of the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism, and is used to perform synchronous operations between the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism.

8. The finished steel nail impurity detection system according to claim 7, characterized in that: The synchronous operation mechanism is respectively connected to a plurality of volume measurement units of the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism, and is used to perform synchronous operations between the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism, including: the synchronous operation mechanism performs synchronous operations between the order enhancement device, the front-end processing mechanism, the middle-end processing mechanism and the tail-end processing mechanism based on a square wave waveform.

9. The impurity detection system for finished steel nails according to claim 7, characterized in that: The synchronous operation mechanism is respectively connected to the multiple volume measurement units of the order enhancement device, the front-end processing mechanism, the mid-end processing mechanism and the tail-end processing mechanism, and is used to perform synchronous operations between the order enhancement device, the front-end processing mechanism, the mid-end processing mechanism and the tail-end processing mechanism, including: using an ASIC chip to implement the synchronous operation mechanism.

Citation Information

Patent Citations

  • Method for detecting doping uniformity in 4H-SiC single crystal

    CN116380849A