Display panel and display device

Abstract

The embodiment of the invention provides a display panel and a display device. The display panel comprises a display area, the display area comprises a plurality of data lines arranged in the first direction, the data lines extend in the second direction, and the second direction intersects with the first direction; the first frame area is located on one side of the display area; the control signal line and the test signal line are both located in the first frame area; the first test bonding pad and the second test bonding pad are located in the first frame area, the control signal line is coupled with the first test bonding pad, and the test signal line is coupled with the second test bonding pad; the plurality of switch modules are located in the first frame area, the switch modules are respectively coupled with the control signal line, the test signal line and the data line, and the switch modules are used for providing a test signal received by the test signal line through the second test bonding pad to the data line under the condition that the control signal line receives the control signal through the first test bonding pad. According to the technical scheme, the narrow frame design of the display panel can be achieved.

Description

Technical Field

[0001] The present disclosure relates to the field of display technology, and in particular to a display panel and a display device. Background Art

[0002] In a display device, a lighting test needs to be performed on the display panel to determine whether there is any abnormality in the picture. In order to implement the lighting test, a lighting test circuit is provided in the display panel. In the related art, the setting method of the lighting test circuit is not conducive to the narrow frame design of the display panel. Summary of the invention

[0003] Embodiments of the present disclosure provide a display panel and a display device to solve or alleviate one or more technical problems in the prior art.

[0004] As a first aspect of an embodiment of the present disclosure, an embodiment of the present disclosure provides a display panel, including:

[0005] A display area includes a plurality of data lines arranged along a first direction, the data lines extending along a second direction, and the second direction intersecting the first direction;

[0006] A first frame area, located at one side of the display area;

[0007] A control signal line, located in the first border area;

[0008] A test signal line, located in the first border area;

[0009] A first test pad and a second test pad are located in the first frame area, the control signal line is coupled to the first test pad, and the test signal line is coupled to the second test pad;

[0010] Multiple switch modules are located in the first border area. The switch modules are coupled to the control signal line, the test signal line and the data line respectively. The switch modules are used to provide the test signal received by the test signal line through the second test pad to the data line when the control signal line receives the control signal through the first test pad.

[0011] In some embodiments, the first border area includes a first sub-border area and a second sub-border area, the first sub-border area is located between the display area and the second sub-border area, the control signal line, the test signal line and the switch module are all located in the first sub-border area, and the first test pad and the second test pad are both located in the second sub-border area.

[0012] In some embodiments, the second sub-frame area includes a middle area distributed along the first direction and end areas located on both sides of the middle area;

[0013] The first test pad is at least located in one end region, at least one end of the control signal line is coupled to the first test pad in the corresponding end region, and the first test pad is used to receive a control signal to provide to the control signal line; and / or,

[0014] The first test pad is located in the middle area, the control signal line is coupled to the first test pad in the middle area, and the first test pad is used to receive a control signal to provide to the control signal line.

[0015] In some embodiments, the second sub-frame area includes a middle area distributed along the first direction and end areas located on both sides of the middle area;

[0016] The second test pad is at least located in one end region, at least one end of the test signal line is coupled to the second test pad in the corresponding end region, and the second test pad is used to receive a test signal to provide to the test signal line; and / or,

[0017] The second test pad is located in the middle area, the test signal line is coupled to the second test pad in the middle area, and the second test pad is used to receive a test signal to provide it to the test signal line.

[0018] In some embodiments, the second sub-frame area includes a middle area distributed along the first direction and end areas located on both sides of the middle area;

[0019] The number of the test signal line is one, the first test pad is located in one end region, and the second test pad is located in the other end region; or,

[0020] There are multiple test signal lines and multiple second test pads. The first test pad and a part of the second test pads are located in one end area, and another part of the second test pads are located in another end area. A part of the test signal lines are coupled to the second test pads in one end area, and another part of the test signal lines are coupled to the second test pads in the other end area.

[0021] In some embodiments,

[0022] The first test pad is also located in the middle area, and the control signal line is also coupled to the first test pad in the middle area; and / or,

[0023] The second test pad is also located in the middle area, and the test signal line is also coupled to the second test pad in the middle area.

[0024] In some embodiments, different test signal lines are coupled to different second test pads.

[0025] In some embodiments, the plurality of data lines include a plurality of data line groups, each data line group includes W data lines, the display panel includes W test signal lines, and the W data lines in each data line group are coupled to the W test signal lines one-to-one through a switch module.

[0026] In some embodiments, the display panel also includes binding pins located in the second sub-frame area, the first test pad and the second test pad are coupled to the corresponding binding pins, the binding pins are used to bind and connect with the circuit board, and after the binding pins are bound and connected with the circuit board, the control signal line and the test signal line are provided with a common ground signal.

[0027] In some embodiments, the plurality of switch modules correspond one-to-one to the plurality of data lines, and the switch module comprises a transistor, a gate of the transistor is coupled to the control signal line, and a first electrode and a second electrode of the transistor are coupled to the test signal line and the data line respectively.

[0028] As a second aspect of the embodiments of the present disclosure, the embodiments of the present disclosure provide a display device, including the display panel in the embodiments of the present disclosure.

[0029] In the display panel of the disclosed embodiment, the control signal line, the test signal line, the first test pad, the second test pad, and the switch module are all located in the first frame area, so that the control signal line, the test signal line and the switch module can be connected in the first frame area, the control signal line located in the first frame area and the first test pad can be directly connected in the first frame area, and the test signal line located in the first frame area and the second test pad can be directly connected in the first frame area. In this way, the connection line between the control signal line and the first test pad can be located in the first frame area, and no longer occupies the space of other frames; the connection line between the test signal line and the second test pad can be located in the first frame area, and no longer occupies the space of other frames, which is conducive to reducing the width of other frames and realizing the narrow frame design of the display panel.

[0030] The above summary is for illustrative purposes only and is not intended to be limiting in any way. In addition to the illustrative aspects, embodiments and features described above, further aspects, embodiments and features of the present disclosure will be readily apparent by reference to the accompanying drawings and the following detailed description. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] In the accompanying drawings, unless otherwise specified, the same reference numerals throughout the multiple drawings represent the same or similar parts or elements. These drawings are not necessarily drawn to scale. It should be understood that these drawings only depict some embodiments according to the present disclosure and should not be regarded as limiting the scope of the present disclosure.

[0032] Figure 1 is a schematic diagram of a display panel;

[0033] Figure 2 It is a schematic diagram of the lighting test circuit in the display panel;

[0034] Figure 3 for Figure 1 A is an enlarged schematic diagram of part A in an actual product;

[0035] Figure 4 is a schematic diagram of a display panel in an embodiment of the present disclosure;

[0036] Figure 5 for Figure 4 The schematic diagram of the lighting test circuit in the figure;

[0037] Figure 6 is a schematic diagram of a display panel in an embodiment of the present disclosure;

[0038] Figure 7 for Figure 6 The schematic diagram of the lighting test circuit in the figure;

[0039] Figure 8 is a schematic diagram of a display panel in an embodiment of the present disclosure;

[0040] Fig. 9 for Figure 8 The schematic diagram of the lighting test circuit in the figure;

[0041] Fig.10 is a schematic diagram of a display panel in an embodiment of the present disclosure;

[0042] Fig.11 for Fig.10 The schematic diagram of the lighting test circuit in the figure;

[0043] Fig.12 A distribution method of multiple test pads in the end area.

[0044] Description of reference numerals: 10. Display area; 20. Peripheral area; 21 / 24. Lighting test signal line; 25. Data driver chip; 26. Binding pin; 30. First border area; 320. Middle area; 321. End area. DETAILED DESCRIPTION

[0045] In the following, only some exemplary embodiments are briefly described. As those skilled in the art will appreciate, the described embodiments may be modified in various ways without departing from the spirit or scope of the present disclosure, and different embodiments may be combined arbitrarily without conflict. Therefore, the drawings and descriptions are considered to be illustrative in nature and not restrictive.

[0046] Figure 1is a schematic diagram of a display panel; Figure 2 The following is a schematic diagram of the lighting test circuit in the display panel. Figure 1 and Figure 2 As shown, the display panel includes a display area 10 and a peripheral area 20 surrounding the display area 10, and the peripheral area 20 may include an upper frame located above the display area 10, a left frame located on the left side of the display area 10, a right frame located on the right side of the display area 10, and a lower frame located below the display area 10. The display panel also includes a plurality of columns of sub-pixels located in the display area 10 and a plurality of data lines S connected to the plurality of columns of sub-pixels in a one-to-one correspondence. Each data line S is used to provide a data signal to a corresponding column of sub-pixels. In order to ensure the quality of the display panel, it is necessary to perform electrical detection on the sub-pixels of the display panel, that is, to perform a lighting test on the display panel.

[0047] like Figure 1 and Figure 2 As shown, the display panel further includes a lighting test line 21, a lighting test pad 22 and a switch module 23 located in the peripheral area 20. One end of the lighting test line 21 is connected to the lighting test pad 22, and the lighting test line 21 is connected to the data line S through the switch module 23. For example, Figure 2 As shown, the lighting test trace 21 includes a control signal line SWL and a test signal line, and the test signal line includes a first test signal line DL1, a second test signal line DL2, and a third test signal line DL3. The lighting test pad 22 includes a first test pad SW and a second test pad. One end of the control signal line SWL is connected to the first test pad SW. The first test signal line DL1, the second test signal line DL2, and the third test signal line DL3 are respectively connected to the three second test pads D1, D2, and D3. The switch module 23 may include a thin film transistor, and one data line S corresponds to one switch module 23. The gate of the thin film transistor is coupled to the control signal line SWL, the first electrode of the thin film transistor is coupled to the test signal line, and the second electrode of the thin film transistor is coupled to the data line S.

[0048] The test signal line includes a first test signal line DL1, a second test signal line DL2 and a third test signal line DL3. Every three data lines S can be divided into a group of data lines S. The three data lines S in each group of data lines S are respectively connected to the first test signal line DL1, the second test signal line DL2 and the third test signal line DL3 through thin film transistors. For example, the data line S1 is coupled to the second electrode of the thin film transistor T1, and the first test signal line DL1 is coupled to the first electrode of the thin film transistor T1; the data line S2 is coupled to the second electrode of the thin film transistor T2, and the second test signal line DL2 is coupled to the first electrode of the thin film transistor T2; the data line S3 is coupled to the second electrode of the thin film transistor T3, and the third test signal line DL3 is coupled to the first electrode of the thin film transistor T3. The control signal line SWL is coupled to the gate of each thin film transistor.

[0049] During the lighting test, the control signal line SWL provides a signal to each thin film transistor to control the conduction of the thin film transistor, and the test signal on the test signal line is provided to the corresponding data line S to light up each sub-pixel in the display panel to determine whether the picture is abnormal. The lighting test is used to control product defects and prevent defective products from entering the subsequent process, thereby improving product yield and reducing production costs.

[0050] like Figure 1 As shown, in the related art, the lighting test wiring 21 and the switch module 23 are arranged on the upper frame, and the lighting test pad 22 is arranged on the lower frame. In order to improve the driving capability of the lighting test, the lighting test pad 22 is usually arranged in the left end area 321a and the right end area 321b of the lower frame. In order to achieve double-sided driving, the lighting test wiring 21 needs to be connected to the lighting test pad 22 of the left end area 321a and the right end area 321b of the lower frame. Therefore, the lighting test wiring 21 needs to run through the left frame and the right frame so as to be connected to the lighting test pad 22 of the left end area 321a of the lower frame, and to the lighting test pad 22 of the right end area 321b of the lower frame. The double-sided driving method causes the left frame and the right frame to be wider.

[0051] In order to save the wiring space on the left and right sides, a single-sided drive can be used, that is, a portion of the lighting test wiring 21 is connected to the lighting test pad 22 of the left end area 321a of the lower frame, and the other portion of the lighting test wiring 21 is connected to the lighting test pad 22 of the right end area 321b of the lower frame. In this way, the number of wirings of the left and right frames can be reduced, and the left and right frames can save about 1 / 2 of the space. The single-sided drive method is likely to cause insufficient driving force for the lighting test wiring 21, resulting in inconsistent driving capabilities of the left, right, and middle parts of the display panel, which in turn leads to uneven lighting display, interference with the display image, and false detection.

[0052] like Figure 1 As shown, the display panel further includes a binding pin 26 and a data driving chip 25 located in the lower frame area. The lighting test pad 22 is connected to the corresponding binding pin 26. The lower end of the data line S is connected to the data driving chip 25.

[0053] Figure 3 for Figure 1The enlarged schematic diagram of part A in the product. In some display panels, the upper corners of the display area 10 are displayed in a special shape, and correspondingly, the sub-pixels in the upper corners are distributed in a special shape. When the light test traces are distributed in the upper frame, the lighting test traces 21 need to be routed along the special-shaped areas of the upper corners, which increases the difficulty of routing. In addition, the lighting test traces 21 need to be bent in the special-shaped areas, which increases the wiring space of the lighting test traces 21, and further increases the width of the left and right frames, which is not conducive to achieving a narrow frame design.

[0054] In order to solve some problems in the related art, an embodiment of the present disclosure provides a display panel.

[0055] Figure 4 is a schematic diagram of a display panel in an embodiment of the present disclosure, Figure 5 for Figure 4 The schematic diagram of the lighting test circuit in the figure; Figure 6 is a schematic diagram of a display panel in an embodiment of the present disclosure, Figure 7 for Figure 6 The schematic diagram of the lighting test circuit in the figure; Figure 8 is a schematic diagram of a display panel in an embodiment of the present disclosure, Fig. 9 for Figure 8 The schematic diagram of the lighting test circuit in the figure; Fig.10 is a schematic diagram of a display panel in an embodiment of the present disclosure, Fig.11 for Fig.10 The lighting test circuit diagram in the figure. Figure 4-Figure 11 As shown, the display panel includes a display area 10 and a first frame area 30. The display area 10 includes a plurality of data lines S arranged along a first direction X, and the data lines S extend along a second direction Y, and the second direction Y intersects the first direction X. Exemplarily, the second direction Y is perpendicular to the first direction X. The first frame area 30 is located at one side of the display area 10, for example, the first frame area 30 is located at the lower side of the display area 10.

[0056] The display panel further includes a lighting test trace 24 and a lighting test pad 22. The lighting test trace 24 may include a control signal line SWL and a test signal line. The lighting test pad 22 may include a first test pad SW and a second test pad.

[0057] The display panel may further include a plurality of switch modules 23. The control signal line SWL is located in the first frame area 30. The control signal line SWL may extend along the first direction X in the first frame area 30. The test signal line is located in the first frame area 30. The test signal line may extend along the first direction X in the first frame area 30. The first test pad SW and the second test pad are both located in the first frame area 30, the control signal line SWL is coupled to the first test pad SW, and the test signal line is coupled to the second test pad.

[0058] A plurality of switch modules 23 are located in the first border area 30. The switch modules 23 are coupled to the control signal line SWL, the test signal line and the data line S, respectively. The switch module 23 is used to provide the test signal received by the test signal line through the second test pad to the data line S when the control signal line SWL receives the control signal through the first test pad SW. Exemplarily, the control signal line SWL can receive the control signal through the first test pad SW, for example, the control signal can be applied to the first test pad SW, thereby providing the control signal to the control signal line SWL. The control signal on the control signal line SWL can control the switch module 23 to be turned on. The test signal line can receive the test signal through the second test pad, for example, the test signal can be applied to the second test pad, thereby providing the test signal to the test signal line. When the switch module 23 is turned on, the switch module 23 can provide the test signal on the test signal line to the data line S.

[0059] The display panel also includes a plurality of columns of sub-pixels located in the display area 10. The plurality of data lines S correspond to the plurality of columns of sub-pixels one by one, and each data line S provides a data signal for a corresponding column of sub-pixels. When the control signal line SWL receives a control signal, the control signal controls the switch module 23 to be turned on, and the test signal on the test signal line is provided to the data line S, so as to perform a lighting test on the display panel.

[0060] It should be noted that the display panel may further include a second frame area, a third frame area, and a fourth frame area, the second frame area and the first frame area 30 are located on two opposite sides of the display area 10, and the third frame area and the fourth frame area are located on the other two opposite sides of the display area 10. For example, the first frame area 30 is the lower frame of the display panel, the second frame area is the upper frame of the display panel, and the third frame area and the fourth frame area are the left frame and the right frame of the display panel, respectively.

[0061] In related technologies, such as Figure 1 and Figure 2 As shown, the lighting test line 21 (including the control signal line SWL and the test signal line) and the switch module 23 for lighting test are arranged in the upper frame, which results in a relatively large width of the upper frame of the display panel. The lighting test pad 22 is arranged in the lower frame. In order to achieve the connection with the lighting test pad 22, the lighting test line 21 needs to pass through the left frame and the right frame, which results in a relatively large width of the left frame and the right frame of the display panel. Therefore, the display panel of the related art is not conducive to the narrow frame design.

[0062] In the display panel of the embodiment of the present disclosure, the control signal line SWL, the test signal line, the first test pad SW, the second test pad and the switch module 23 are all located in the first frame area 30, so that the control signal line SWL, the test signal line and the switch module 23 can be connected in the first frame area 30, the control signal line SWL located in the first frame area 30 and the first test pad SW can be directly connected in the first frame area 30, and the test signal line located in the first frame area 30 and the second test pad can be directly connected in the first frame area 30. In this way, the connection line between the control signal line SWL and the first test pad SW can be located in the first frame area 30, and no longer occupies the space of other frames; the connection line between the test signal line and the second test pad can be located in the first frame area 30, and no longer occupies the space of other frames, which is conducive to reducing the width of other frames and realizing the narrow frame design of the display panel.

[0063] In addition, in the display panel of the embodiment of the present disclosure, when the lighting test trace 21 is connected to the lighting test pad 22, the lighting test trace 21 and the lighting test pad 22 are both located in the first frame area 30. Therefore, the lighting test trace 21 and the lighting test pad 22 can be directly connected in the first frame area 30, and the lighting test trace 21 no longer needs to pass through the irregular area at the upper corner of the display area 10. Therefore, the irregular display area 10 of the display area 10 will not affect the lighting test trace 21, which facilitates wiring. In addition, the setting of the lighting test trace 21 does not interfere with the irregular display, making it easier to achieve irregular display.

[0064] Exemplarily, the first border area 30 can be located on the lower side of the display area 10, so that the first border area 30 is the lower border of the display panel. In the display panel disclosed in the present invention, the control signal line SWL, the test signal line, the first test pad SW and the second test pad and the switch module 23 are all located in the lower border, which is conducive to realizing the narrow border design of the upper border, left border and right border of the display panel.

[0065] like Figure 4-Figure 11 As shown, the plurality of switch modules 23 may correspond to the plurality of data lines S one by one. The switch module 23 may include a transistor, a gate of the transistor is coupled to the control signal line SWL, and a first electrode and a second electrode of the transistor are respectively coupled to the test signal line and the data line S. For example, the transistor may be a thin film transistor. One of the first electrode and the second electrode of the transistor may be a source electrode, and the other may be a drain electrode.

[0066] It should be noted that the switch module 23 is not limited to a transistor, and the switch module 23 may also be other modules with a switch function or include a plurality of transistors.

[0067] Exemplarily, the number of the control signal lines SWL may be one or more, and the gates of the plurality of switch modules 23 may be coupled to the same control signal line SWL or to different control signal lines SWL.

[0068] The number of the test signal lines may be one or more. When there are more than one test signal lines, transistors corresponding to different data lines S may be coupled to the same test signal line, or transistors corresponding to different data lines S may be coupled to different test signal lines.

[0069] In one embodiment, the first frame area 30 may include a first sub-frame area and a second sub-frame area, and the first sub-frame area is located between the display area 10 and the second sub-frame area. Figure 4 As shown. The control signal line SWL, the test signal line and the switch module 23 can be located in the first sub-frame area, and the first test pad SW and the second test pad are both located in the second sub-frame area. Setting the control signal line SWL, the test signal line and the switch module 23 in the first sub-frame area is conducive to the connection of the data line S with the control signal line SWL and the test signal line through the switch module 23. Usually, the second sub-frame area is used to connect with external electrical components, and setting the first test pad SW and the second test pad in the second sub-frame area is conducive to the external application of corresponding signals to the first test pad SW and the second test pad, which is convenient for lighting test.

[0070] like Figure 4 As shown, the second sub-frame area may include a middle area 320 distributed along the first direction X and end areas 321 located on both sides of the middle area. For example, the left end area 321a is located on the left side of the middle area 320, and the right end area 321b is located on the right side of the middle area 320. It should be noted that there is no obvious boundary between the middle area 320 and the end area 321. The middle area and the end area are in a relative division relationship. The left end area 321a and the right end area 321b are located on the left and right sides of the middle area 320, respectively.

[0071] In one embodiment, the first test pad SW is at least located in one end region, at least one end of the control signal line SWL is coupled to the first test pad SW in the corresponding end region, and the first test pad SW is used to receive a control signal to provide to the control signal line SWL.

[0072] like Figure 8 and Fig. 9As shown, the first test pad SW is located in the left end area 321a, the left end of the control signal line SWL is coupled to the first test pad SW in the left end area 321a, and the control signal line SWL receives the control signal through the first test pad SW in the left end area 321a. In other embodiments, the first test pad SW may be located in the right end area 321b, the right end of the control signal line SWL is coupled to the first test pad SW in the right end area 321b, and the control signal line SWL receives the control signal through the first test pad SW in the right end area 321b. The first test pad SW is set in the left end area 321a or the right end area 321b, so that the first test pad SW only occupies the space of one end area, saving the space of the other end area and facilitating the arrangement of other components in the other end area.

[0073] like Figure 4-Figure 7 As shown, the first test pad SW is located in the left end area 321a and the right end area 321b, the left end of the control signal line SWL is connected to the first test pad SW in the left end area 321a, and the right end of the control signal line SWL is connected to the first test pad SW in the right end area 321b, so that the first test pads SW on both sides can provide control signals to the control signal line SWL, thereby improving the driving capability of the control signal line SWL.

[0074] In one embodiment, Figure 6-Figure 11 As shown, the first test pad SW may be located in the middle area, and the control signal line SWL is coupled to the first test pad SW in the middle area. The first test pad SW is used to receive a control signal to provide to the control signal line SWL.

[0075] Exemplarily, in order to avoid unilateral driving of the control signal line SWL resulting in insufficient driving capability at the other end of the control signal line SWL, the first test pad SW can be set in the middle area to provide a control signal from the middle of the control signal line SWL to ensure that the driving capabilities at both ends of the control signal line SWL are balanced and avoid insufficient unilateral driving capability.

[0076] In one embodiment, the second test pad is at least located in an end region, at least one end of the test signal line is coupled to the second test pad in the corresponding end region, and the second test pad is used to receive a test signal to provide to the test signal line.

[0077] like Figure 8 and Fig. 9As shown, the second test pad is located in the left end area 321a or the right end area 321b. The left end of the test signal line is coupled to the second test pad in the left end area 321a, and the test signal line receives the control signal through the first test pad SW in the left end area 321a; or, the right end of the test signal line is coupled to the second test pad in the right end area 321b, and the test signal line receives the control signal through the second test pad in the right end area 321b. The second test pad is set in the left end area 321a or the right end area 321b, so that the second test pad only occupies the space of one end area, saving the space of the other end area.

[0078] like Fig. 9 As shown, the number of test signal lines can be multiple, for example, the number of test signal lines is three, namely, the first test signal line DL1, the second test signal line DL2 and the third test signal line DL3. A second test pad D2 is provided in the left end area 321a, and two second test pads D1 and D3 are provided in the right end area 321b. The left end of the second test signal line DL2 is connected to the second test pad D2 in the left end area 321a; the first test signal line DL1 and the third test signal line DL3 are connected to the two second test pads D1 and D3 in the right end area 321b, respectively.

[0079] like Figure 4-Figure 7 As shown, the second test pad is located in the left end area 321a and the right end area 321b, the left end of the test signal line is connected to the second test pad in the left end area 321a, and the right end of the test signal line is connected to the second test pad in the right end area 321b, so that the second test pads on both sides can provide test signals to the test signal line, which improves the driving capability of the test signal line, is beneficial to uniform lighting display in the lighting test, and improves the accuracy of the lighting test.

[0080] For example, in Figure 4-Figure 7 In the embodiment, two ends of each test signal line are respectively connected to the second test pads in the corresponding end area.

[0081] In one embodiment, Figure 6-Figure 11 As shown, the second test pad can be located in the middle area, and the test signal line is coupled to the second test pad in the middle area. The second test pad is used to receive a test signal to provide it to the test signal line. The middle area is provided with a first test pad SW and second test pads D1, D2, and D3. The control signal line is connected to the first test pad SW in the middle area. The first test signal line DL1, the second test signal line DL2, and the third test signal line DL3 are respectively connected to the second test pads D1, D2, and D3 in the middle area.

[0082] Exemplarily, in order to avoid uneven lighting display caused by unilateral driving of the test signal line, a second test pad can be set in the middle area to provide a test signal from the middle of the test signal line to ensure that the test signal line has a balanced driving capability for the data lines S at both ends of the display area 10, thereby avoiding uneven lighting display caused by insufficient unilateral driving capability.

[0083] In one embodiment, the number of test signal lines is one. The number of control signal lines SWL may also be one. The first test pad SW is located in one of the end areas, and the second test pad is located in the other end area. For example, the first test pad SW is located in the left end area 321a, and the second test pad is located in the right end area 321b. Thus, one end of the control signal line SWL is connected to the first test pad SW of the corresponding end area, and one end of the test signal line is connected to the second test pad of the corresponding end area. In this way, the first test pad SW and the second test pad are arranged on both sides, respectively, to avoid all the test pads being located on the same side and occupying a large space, and the test pads on both sides occupy a small space, which is conducive to reducing the width of the first border area 30 and is conducive to reducing the lower border.

[0084] In one embodiment, the number of the first test pads SW is multiple, and the number of the second test pads is multiple. The first test pads SW are located in the end areas on both sides of the middle area, that is, the first test pads SW are located in the left end area 321a and the right end area 321b. The two ends of the control signal line SWL are respectively connected to the first test pads SW of the corresponding end area. The second test pads are located in the end areas on both sides of the middle area, that is, the second test pads are located in the left end area 321a and the right end area 321b. The two ends of each test signal line are respectively connected to the second test pads of the corresponding end area.

[0085] For example, Figure 4 and Figure 5 As shown, the number of control signal lines SWL is one, and the number of first test pads SW is two. The two first test pads SW are respectively located in the left end area 321a and the right end area 321b. The number of test signal lines is three, namely the first test signal line DL1, the second test signal line DL2, and the third test signal line DL3. The number of second test pads is 6. The 6 second test pads are respectively located in the left end area 321a and the right end area 321b, that is, the left end area 321a and the right end area 321b are each provided with 3 second test pads D1, D2 and D3. The left ends of the first test signal line DL1, the second test signal line DL2, and the third test signal line DL3 are respectively connected to the second test pads D1, D2, and D3 of the left end area 321a, and the right ends of the first test signal line DL1, the second test signal line DL2, and the third test signal line DL3 are respectively connected to the second test pads D1, D2, and D3 of the right end area 321b.

[0086] For example, Figure 5 As shown, in the end area, multiple test pads can be arranged side by side. This method is suitable for a space with a small width and a large length.

[0087] It should be noted that, for the first border area 30, the width is the dimension perpendicular to the extension direction of the first border area 30, and the length is the dimension along the extension direction of the first border area 30. In the drawings of this description, the width of the first border area 30 is the dimension of the first border area 30 in the second direction Y, and the length of the first border area 30 is the dimension of the first border area 30 in the first direction X.

[0088] Fig.12 It is a distribution method of multiple test pads in the end area. Fig.12 As shown, in the end area, multiple test pads can be arranged alternately in sequence. This method is suitable for a space with a larger width and a smaller length.

[0089] In one embodiment, the number of test signal lines is multiple, and the number of second test pads is multiple. Exemplarily, the number of second test pads may correspond to the number of test signal lines one by one. The first test pad SW and a part of the second test pads are located in one end region, and another part of the second test pads are located in another end region, a part of the test signal lines are coupled to the second test pads in one end region, and another part of the test signal lines are coupled to the second test pads in the other end region.

[0090] For example, Figure 8 and Fig. 9 As shown, the number of control signal lines SWL is one, and the number of first test pads SW is one. The first test pad SW is located in the left end area 321a. The number of test signal lines is three, namely the first test signal line DL1, the second test signal line DL2, and the third test signal line DL3. The number of second test pads is three. The three second test pads correspond to the three test signal lines one by one. The first test signal line DL1, the second test signal line DL2, and the third test signal line DL3 correspond to the second test pads D1, D2, and D3 one by one. The first test pad SW and the second test pad D2 are located in the left end area 321a, and the second test pads D1 and D3 are located in the right end area 321b. The control signal line SWL is coupled to the first test pad SW, the second test signal line DL2 is coupled to the second test pad D2 in the left end area 321a, and the first test signal line DL1 and the third test signal line DL3 are coupled to the second test pads D1 and D3 in the right end area 321b, respectively.

[0091] like Fig. 9As shown in FIG. 1 , the first test pad SW and the second test pad are arranged in the left end area 321a and the right end area 321b, so that the number of test pads in the end area can be reduced. When the space for arranging the test pads is insufficient, for example, when the width and length of the space for arranging the test pads are both small, Fig. 9 Arrangement shown. Fig. 9 Compared with the method shown Fig.12 , optimizing the test pads from a double-row arrangement to a single-row arrangement, saving the width of the lower border and facilitating the narrow border design of the lower border.

[0092] In one embodiment, Figure 6-Figure 9 As shown, the first test pad SW is also located in the middle area, and the control signal line SWL is also coupled to the first test pad SW in the middle area.

[0093] For example, Figure 6-Figure 9 As shown, the second test pad is also located in the middle area, and the test signal line is also coupled to the second test pad in the middle area. Figure 6-Figure 9 In the embodiment, the number of second test pads located in the middle area corresponds to the number of test signal lines, and the first test signal line DL1, the second test signal line DL2, and the third test signal line DL3 are coupled to the three second test pads D1, D2, and D3 in a one-to-one correspondence. It can be understood that the number of second test pads located in the middle area can be less than the number of test signal lines, that is, only a part of the test signal lines are coupled to the second test pads located in the middle area. For example, the middle area is only provided with second test pads D1 and D2, and the first test signal line DL1 and the second test signal line DL2 are coupled to the three second test pads D1 and D2 in a one-to-one correspondence.

[0094] In this way, the control signal line SWL or the test signal line can receive signals not only from the end but also from the middle, which improves the driving capability of the control signal line SWL or the test signal line, avoids uneven lighting display caused by insufficient driving capability during the lighting test, and improves the test accuracy.

[0095] Exemplarily, different test signal lines are coupled to different second test pads. That is, one second test pad is coupled to only one test signal line and only provides a test signal to one test signal line. In this way, the strength of the test signal provided to each test signal line can be guaranteed to avoid uneven lighting display.

[0096] In one embodiment, the plurality of data lines S may include a plurality of groups of data lines S, each group of data lines S may include W data lines S. The display panel includes W test signal lines. The W data lines S in each group of data lines S are coupled to the W test signal lines one by one through a switch module 23.

[0097] like Figure 4-Figure 11 As shown, each group of data lines S may include three data lines S, the display panel includes three test signal lines, the three data lines S in each group of data lines S correspond to the three test signal lines one by one, and each data line S is coupled to the corresponding test signal line through the switch module 23. For example, Figure 5 In the embodiment, the first data line S1 is connected to the first test signal line DL1 through the transistor T1; the second data line S2 is connected to the second test signal line DL2 through the transistor T2; the third data line S3 is connected to the third test signal line DL3 through the transistor T3; the m-2 data line S m-2 Through the transistor T m-2 Connected to the first test signal line DL1; the m-1th data line S m-1 Through the transistor T m-1 Connected to the second test signal line DL2; the mth data line S m Through the transistor T m Connected to the third test signal line DL3; the n-2th data line S n-2 Through the transistor T n-2 Connected to the first test signal line DL1; the n-1th data line S n-1 Through the transistor T n-1 Connected to the second test signal line DL2; the nth data line S n Through the transistor T n Connected to the third test signal line DL3; wherein m and n are both positive integers, n is the number of data lines S, and m≤n-3. It should be noted that n may be an integer multiple of W or not. When n is not an integer multiple of W, each data line S in the last group of data lines S may be connected to W test signal lines in sequence.

[0098] It should be noted that, in the above embodiment, there is one control signal line SWL, and in other embodiments, the number of control signal lines SWL can be set to more as needed. In the above embodiment, there are three test signal lines, and in other embodiments, the number of test signal lines can be set as needed, which can be less than three or more than three.

[0099] like Figure 4 As shown, the display panel may further include a binding pin 26 located in the second sub-frame area. The first test pad SW and the second test pad are coupled to the corresponding binding pin 26. The binding pin 26 is used to bind and connect with the circuit board. After the binding pin 26 is bound and connected with the circuit board, the control signal line SWL and the test signal line are provided with a common ground signal.

[0100] In the display panel, after the lighting test is completed, the display panel needs to be bound and connected to the circuit board through the binding pin 26. After the binding pin 26 is bound and connected to the circuit board, a common ground signal is provided to the control signal line SWL and the test signal line through the circuit board, so that a stable signal is provided to the control signal line SWL and the test signal line, and the signal will not affect the normal operation of the display panel, thereby improving the working stability of the display panel.

[0101] In other embodiments, after the lighting test is completed, a common ground signal may be provided to the first test pad SW and the second test pad in other ways. For example, a common ground pad may be provided on the display panel, and after the lighting test is completed, the first test pad SW and the second test pad may be short-circuited with the common ground pad, thereby providing a common ground signal to the first test pad SW and the second test pad.

[0102] Exemplarily, the display panel may further include a data driver chip, and the data driver chip may be located in the second sub-frame area. The data driver chip may be located on a side of the second sub-frame area close to the first sub-frame area, and the data line S is connected to the data driver chip 25, such as Figure 4 and Figure 5 Exemplarily, the switch module 23 may include a transistor, a gate of the transistor is coupled to the control signal line SWL, a first electrode of the transistor is coupled to the test signal line, a second electrode of the transistor is coupled to the data line S, and the data line S is also connected to the data driving chip.

[0103] During the lighting test, the control signal line SWL provides a control signal to control the transistor to be turned on, and the test signal line sends a test signal to the data line S to perform a lighting test on the display panel. During normal display, a shutdown signal can be provided to the control signal line SWL to turn off each transistor, so that the test signal line is disconnected from the data line S; the data driver chip provides a display data signal to the data line S for display.

[0104] In the display panel of the embodiment of the present disclosure, the control signal line SWL, the test signal line, the first test pad SW, the second test pad and the switch module 23 are all located in the first frame area 30, so that the control signal line SWL, the test signal line and the switch module 23 can be connected in the first frame area 30, the control signal line SWL located in the first frame area 30 and the first test pad SW can be directly connected in the first frame area 30, and the test signal line located in the first frame area 30 and the second test pad can be directly connected in the first frame area 30. In this way, the connection line between the control signal line SWL and the first test pad SW can be located in the first frame area 30, and no longer occupies the space of other frames; the connection line between the test signal line and the second test pad can be located in the first frame area 30, and no longer occupies the space of other frames, which is conducive to reducing the width of other frames and realizing the narrow frame design of the display panel.

[0105] An embodiment of the present disclosure further provides a display device, comprising the display panel in any embodiment of the present disclosure.

[0106] The display device may be any product or component with a display function, such as a mobile phone, a tablet computer, a television, a monitor, a laptop computer, a digital photo frame, a navigator, or the like.

[0107] In the description of this specification, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present disclosure and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present disclosure.

[0108] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of the present disclosure, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0109] In the present disclosure, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection, an electrical connection, or a communication; it can be a direct connection, or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present disclosure can be understood according to specific circumstances.

[0110] In the present disclosure, unless otherwise clearly specified and limited, a first feature being “above” or “below” a second feature may include that the first and second features are in direct contact, or may include that the first and second features are not in direct contact but are in contact through another feature between them. Moreover, a first feature being “above”, “above”, and “above” a second feature includes that the first feature is directly above and obliquely above the second feature, or simply indicates that the first feature is higher in level than the second feature. A first feature being “below”, “below”, and “below” a second feature includes that the first feature is directly above and obliquely above the second feature, or simply indicates that the first feature is lower in level than the second feature.

[0111] The disclosure above provides many different embodiments or examples to implement different structures of the present disclosure. In order to simplify the present disclosure, the components and settings of specific examples are described above. Of course, they are only examples, and the purpose is not to limit the present disclosure. In addition, the present disclosure can repeat reference numbers and / or reference letters in different examples, and this repetition is for the purpose of simplification and clarity, which itself does not indicate the relationship between the various embodiments and / or settings discussed.

[0112] The above are only specific embodiments of the present disclosure, but the protection scope of the present disclosure is not limited thereto. Any technician familiar with the technical field can easily think of various changes or substitutions within the technical scope disclosed in the present disclosure, which should be included in the protection scope of the present disclosure. Therefore, the protection scope of the present disclosure should be based on the protection scope of the claims.

Claims

1. A display panel, characterized in that: include: A display area, comprising a plurality of data lines arranged along a first direction, wherein the data lines extend along a second direction, and the second direction intersects the first direction; A first border area, located at one side of the display area; A control signal line, located in the first border area; A test signal line, located in the first border area; A first test pad and a second test pad are located in the first border area, the control signal line is coupled to the first test pad, and the test signal line is coupled to the second test pad; A plurality of switch modules are located in the first border area, and the switch modules are respectively coupled to the control signal line, the test signal line and the data line. The switch modules are used to provide the test signal received by the test signal line through the second test pad to the data line when the control signal line receives the control signal through the first test pad.

2. The display panel according to claim 1, characterized in that: The first border area includes a first sub-border area and a second sub-border area. The first sub-border area is located between the display area and the second sub-border area. The control signal line, the test signal line and the switch module are all located in the first sub-border area. The first test pad and the second test pad are both located in the second sub-border area.

3. The display panel according to claim 2, characterized in that: The second sub-frame area includes a middle area distributed along the first direction and end areas located on both sides of the middle area; The first test pad is located at least in one of the end regions, at least one end of the control signal line is coupled to the first test pad in the corresponding end region, and the first test pad is used to receive a control signal to provide to the control signal line; and / or, The first test pad is located in the middle area, the control signal line is coupled to the first test pad in the middle area, and the first test pad is used to receive a control signal to provide to the control signal line.

4. The display panel according to claim 2, characterized in that: The second sub-frame area includes a middle area distributed along the first direction and end areas located on both sides of the middle area; The second test pad is at least located in one of the end regions, at least one end of the test signal line is coupled to the second test pad in the corresponding end region, and the second test pad is used to receive a test signal to provide to the test signal line; and / or, The second test pad is located in the middle area, the test signal line is coupled to the second test pad in the middle area, and the second test pad is used to receive a test signal to provide to the test signal line.

5. The display panel according to claim 2, characterized in that: The second sub-frame area includes a middle area distributed along the first direction and end areas located on both sides of the middle area; The number of the test signal line is one, the first test pad is located in one of the end regions, and the second test pad is located in the other end region; or, There are multiple test signal lines, and there are multiple second test pads. The first test pad and a part of the second test pads are located in one of the end areas, and another part of the second test pads are located in another end area. A part of the test signal lines are coupled to the second test pads in one of the end areas, and another part of the test signal lines are coupled to the second test pads in another end area.

6. The display panel according to claim 5, characterized in that: The first test pad is also located in the middle area, and the control signal line is also coupled to the first test pad in the middle area; and / or, The second test pad is also located in the middle area, and the test signal line is also coupled to the second test pad in the middle area.

7. The display panel according to claim 2, characterized in that: Different of the test signal lines are coupled to different of the second test pads.

8. The display panel according to claim 2, characterized in that: The plurality of data lines include a plurality of data line groups, each data line group includes W data lines, the display panel includes W test signal lines, and the W data lines in each data line group are coupled to the W test signal lines in a one-to-one correspondence through one of the switch modules.

9. The display panel according to claim 2, characterized in that: The display panel also includes binding pins located in the second sub-frame area, the first test pad and the second test pad are coupled to the corresponding binding pins, the binding pins are used to bind and connect with the circuit board, and after the binding pins are bound and connected with the circuit board, the control signal line and the test signal line are provided with a common ground signal.

10. The display panel according to claim 1, characterized in that: The plurality of switch modules correspond one-to-one to the plurality of data lines. The switch module comprises a transistor, a gate of the transistor is coupled to the control signal line, and a first electrode and a second electrode of the transistor are respectively coupled to the test signal line and the data line.

11. A display device, characterized in that: A display panel comprising any one of claims 1-10.

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