Distance detection device, detection method and processing equipment

Abstract

The invention relates to a distance detection device and method and machining equipment, the distance detection device comprises a machining head for machining a machined part, the distance detection device is fixed to the machining head, and after the height of the surface of the machined part is detected through the distance detection device, the machining head is adjusted for machining according to the height. The distance detection device is detachably connected with the processing head, so that the detection device is convenient to mount and dismount, and the distance detection device is flexibly adapted to various processing heads and can apply external force with the same axial degree and the same direction to the distance detection device so as to perform probe extension and contraction movement; the situation that the detection device needs to reach a reset point to reset when stretching out and contracting back at different positions is avoided, resetting at the same X-axis position and the Y-axis position is achieved, then the surface distance of a machined object is rapidly measured, the movement duration is shortened, and the working efficiency is improved. Meanwhile, the problem that the extension distance of the detection device is too short due to insufficient moving space of the machining head is solved by utilizing the lever principle. The device moves in the same axis and in the same direction, damage to the surface of a machined object is small, cost and maintenance cost are low, and the overall structure is simple and compact.

Description

Technical Field

[0001] The present invention relates to the field of distance detection, and in particular to a distance detection device, a distance detection method and a processing equipment. Background Art

[0002] The distance detection device plays an important role in many fields. For example, it can be used on a mobile carrier or a non-mobile carrier for remote sensing, obstacle avoidance, mapping, modeling, etc.; it can also be used in workpiece processing, such as laser engraving, laser marking and other fields. The current detection structure first applies a downward external force to the upper part of the probe, releases the probe, and completes the detection distance focus. Then, an upward external force is applied from the bottom to shrink the probe. Therefore, the force of the probe extension and the force of the probe contraction are not applied in the same direction. Since the probe is under the working area and obstacles are not allowed, the force of the probe contraction applied from the bottom must be outside the working area, otherwise it may damage the surface of the workpiece. As a result, after each distance detection, the detection device must run outside the working area to contract the probe, resulting in cumbersome detection steps and a waste of detection time. There is also a solution using electromagnetic detection. The principle of the electromagnetic detection solution is that only the detection component 10 needs to be powered on to achieve the extension-contraction of the probe. The disadvantage is that the detection time is short (2-3s). If it exceeds 2-3s, it cannot continue to extend due to severe heat. The probe will retract directly, resulting in the inability to complete multi-point curved surface detection. The longer the detection duration, the larger the detection component size and the more expensive it is.

[0003] Chinese Patent Publication No. CN118392093A proposes a distance detector and processing equipment, the distance detector includes a shell, a detection member and a trigger member, part of the detection member is slidably inserted in the shell along its length direction; the trigger member is connected to the detection member, and can move with the extension and retraction of the detection member to trigger the sensing component arranged at the first installation position. The technical solution of the present application can improve the experience of the distance detector. The distance detector of this patent needs to be reset at the push member after each distance detection, resulting in a longer detection stroke and inconvenient detection.

[0004] Chinese Patent Publication No. CN118393463A proposes a processing equipment, including an equipment body and a distance detector, the equipment body is provided with a state conversion part; the distance detector includes a shell and a detection part, the detection part is retractably inserted into the shell, the detection part has a detection position and an idle position relative to the shell, when the detection part needs to switch its position relative to the shell, the state conversion part is arranged relative to the detection part, and the state conversion part is used to adjust the position of the detection part so that the detection part moves between the idle position and the detection position. The technical solution of the present application can realize the automatic retraction of the detection part in the distance detector and avoid the complex structure of the distance detector. This patent also needs to be reset at the push part before the next distance detection can be performed, resulting in the need to move the laser processing equipment to the push part for reset each time the distance detection is performed, which is more cumbersome. Summary of the invention

[0005] The technical problem to be solved by the present invention is that the current detection structure first applies a downward external force to the upper part of the probe, releases the probe, and after completing the distance detection, applies an upward external force from the bottom to retract the probe. Therefore, the force applied to extend the probe and the force applied to retract the probe are not in the same direction. At the same time, the working area is below the probe, and no obstacles are allowed. Therefore, the force applied to retract the probe from the bottom must be outside the working area. As a result, after each distance detection, the detection device must run outside the working area to retract the probe, resulting in cumbersome detection steps and a waste of detection time. In view of the above-mentioned defects of the prior art, a distance detection device, a detection method and a processing device are provided.

[0006] In order to solve the above technical problems, the technical solution adopted by the present invention is:

[0007] A distance detection device is constructed, including a shell, a through hole is provided at the lower end of the shell, a pressing shaft and a detection member are provided in the shell, the pressing shaft moves along the length direction of the pressing shaft, a sliding block is connected to the lower end of the pressing shaft, the sliding block moves with the pressing shaft to push the detection member to move, the detection member can pass through the through hole at the lower end and move along the length direction of the detection member, a preset position is also provided in the shell, and an external force with the same axial degree and the same direction is applied to the detection device so that the sliding block moves to different preset positions in the shell to change the length of the detection member extending out of the shell.

[0008] The distance detection device of the above structure applies a vertical downward force to the pressing shaft to make the pressing shaft move along its length direction and push the sliding block to move, thereby pushing the detection member to move. The sliding block is fixed after moving to a preset position. At this time, the extended length of the detection member is the maximum length required to be extended. At the same time, the vertical downward force continues to be applied to the pressing shaft to move the pressing shaft to other preset positions. After the detection member is subjected to force, the length of the detection member extending out of the shell is changed to realize the detection of the distance of the processing surface. After the detection is completed, the detection member returns to the longest extended length position for re-detection, so as to realize repeated detection.

[0009] In the above-mentioned distance pain measuring device, preferably, an elastic member is arranged in the shell, and the elastic member is deformed under the action of the sliding block. The sliding block moves to different preset positions in the shell under the external force of the same axis and direction applied to the detection device and the force of the elastic member to change the length of the detection member extending out of the shell.

[0010] The distance detection device of the above structure is provided with an elastic member, which is compressed when the sliding block moves and provides a preload force for the sliding block to return to its initial position when the elastic member rebounds under pressure, so that the sliding block and the detection member can return to the preset initial position every time, and the detection accuracy is higher.

[0011] In the above distance detection device, preferably, a preset groove is provided in the shell, and a plurality of preset positions are formed in the preset groove, and when the sliding block moves to different preset positions in the shell, the length of the detection member extending out of the shell is the same or not completely the same.

[0012] The distance detection device of the above structure is provided with multiple groups of preset grooves in the shell, and different preset positions are set accordingly. When the sliding block is in different preset positions, the extended length of the detection member is the same or not completely the same. It can be seen from the above that when the sliding block is placed in the preset position, the extended length of the detection member is the maximum. Since the maximum value can be changed by setting multiple groups of preset positions, it is convenient to move the sliding block to different preset positions to change the maximum length of the extension of the detection needle, so as to adapt to the maximum position of different processing surfaces, and the scope of application is wider.

[0013] In the above-mentioned distance detection device, preferably, the preset positions include multiple groups of high points, multiple groups of low points and multiple groups of intermediate points, and the high points, intermediate points and low points are arranged in sequence in the preset groove, an intermediate point is arranged between the low point and the high point, and the preset groove is arranged in a loop.

[0014] The distance detection device of the above structure has different extension lengths when the sliding block is placed at different high points, low points and middle points. In some embodiments, when the sliding block is placed at the high point, the detection member can be extended by a smaller distance, and in some embodiments, when the sliding block is placed at the high point, the detection member can be extended by a larger distance, and the situation at the low point can be the opposite of that at the high point. Since the preset groove is arranged in a loop, the sliding block can circulate between the high point, the middle point and the low point to realize the cyclic movement of the detection member of the distance detection device under the action of external force in the same direction of the same axis.

[0015] In the above-mentioned distance detection device, preferably, the sliding block interacts with the positioning member, the positioning member is placed in a preset groove, the position of the positioning member in the preset groove is changed when the sliding block moves, and the position of the sliding block is fixed when the positioning member is placed in the preset position of the preset groove.

[0016] The distance detection device of the above structure fixes the sliding block by connecting the positioning piece with the preset groove, which is convenient for setting the shape of the preset groove. The positioning piece is more convenient to set, which facilitates the installation and disassembly of the product and improves the applicability of the product.

[0017] In the above-mentioned distance detection device, preferably, the positioning member is a probe hook connected to the shell at one end, the other end of the probe hook is a movable end, the preset groove is placed on the sliding block, and the movable end of the hook moves in the preset groove of the sliding block to change the relative position of the detection member and the sliding block.

[0018] The distance detection device of the above structure fixes the fixed end of the hook in the shell, and the movable end slides in the preset groove to adjust the hook to the preset position of the preset groove. After being fixed at the preset position, it is pulled to the shell and the sliding block to fix it, thereby realizing the adjustment of the extended length of the detection member, and after applying pressing force to the pressing member, the movable end moves in the preset groove to make the sliding smoother, the connection more stable, and the operation more convenient.

[0019] In the above distance detection device, preferably, the positioning member is a latching tooth provided on the housing, a preset groove is provided on the sliding block corresponding to the latching tooth, and the position of the detection member is changed when the latching tooth is placed at different positions of the preset groove.

[0020] In the above-mentioned distance detection device, preferably, the sliding block includes a probe pressure rod and a probe locking piece, the lower end of the probe pressure rod is provided with a pressure rod slope surface, and the upper end of the probe locking piece is provided with a locking piece slope surface corresponding to the pressure rod slope surface, the movement of the pressure rod slope surface generates a rotational force on the locking piece slope surface to move the sliding block and change the position of the locking tooth in the preset groove to change the position of the detection piece.

[0021] The distance detection device of the above structure generates a rotational force on the slope surface of the locking piece through the slope surface of the pressure rod, and drives the locking piece to rotate horizontally or move vertically. It cannot rotate during vertical movement, so that the locking piece moves downward and compresses the second compression spring until it moves to the lowest point and rotates into the preset groove and locks at different positions along the trajectory of the preset groove to change the extension length of the detection needle, and then applies pressure to the elastic piece through the detection needle to achieve extension and contraction movement.

[0022] In the above distance detection device, preferably, the positioning member is a probe ball disposed on the sliding block, the preset groove is disposed inside the housing, and the probe ball moves in the preset groove to change the position of the detection member.

[0023] In the above-mentioned distance detection device, preferably, the elastic member includes a first compression spring of the probe arranged between the sliding block and the detection member, or the first compression spring of the probe is embedded in the detection member, and a second compression spring of the probe is arranged between the sliding block and the shell. The sliding block reaches a preset position in the shell under the action of external force and / or the force of the second compression spring of the probe to change the length of the detection member extending out of the shell. The detection member detects the surface position of the object through the first compression spring of the probe to determine whether the surface is detected.

[0024] The distance detection device of the above structure realizes locking at different positions by the movement trajectory of the detection ball in the preset groove to change the extension length of the detection needle, and then applies pressure to the first compression spring of the probe through the detection needle to realize extension and contraction movement, thereby detecting the surface position of the object and determining whether the surface is detected.

[0025] In the above-mentioned distance detection device, preferably, the detection member is connected to a probe sensing stop member, a stop member travel groove is provided on the side of the shell, and the probe sensing stop member moves in the stop member travel groove. The detection device also includes a sensing component corresponding to the sensing stop member, and the sensing stop member can trigger the sensing component when it moves to different positions, and the extension state of the detection member is detected by the sensing component.

[0026] The distance detection device of the above structure is provided with a sensing stopper that moves with the detection member and passes through the shell. The travel groove provided on the shell can limit the travel of the detection member. At the same time, the sensing component detects the position of the sensing stopper to know the extension state of the detection member, which is convenient for sensing detection of the state of the detection member and triggering the sensing component.

[0027] In the above-mentioned distance detection device, preferably, the sensing component includes a fixing part, and a PCBA board arranged in the fixing part, and a plurality of groups of signal components are arranged on the PCBA board along the movement direction of the detection part, and the signal components include a signal transmitting end and a signal receiving end, and the probe sensing stopper moves between the signal transmitting end and the signal receiving end, and when a group of signal components fails to work normally, the probe sensing stopper is placed at the position where the group of signal components is located.

[0028] The distance detection device of the above structure is provided with a signal component. When the sensing stopper blocks the signal transmission and reception of a certain group of signal components, the surface sensing stopper is at the height corresponding to the current signal component. The height of the processing surface can be known. The height can be set consistent with the height of the processing head, or a certain height compensation can be set so that the processing head can perform processing operations according to the height or the compensated height, thereby achieving a better processing effect.

[0029] In the above distance detection device, preferably, the detection device further comprises a pressing component, and the pressing component can generate a force on the pressing shaft to make the pressing shaft move;

[0030] Or the pressing component is an electromagnetic ring arranged on the sliding block, and the electromagnetic ring generates a force on the pressing shaft after being energized, and can provide different magnitudes of force on the pressing shaft according to the magnitude of the energized current.

[0031] The distance detection device of the above structure presses the pressing shaft through the pressing assembly, and the pressing assembly has a rotating shaft that rotates to use the lever principle to make the pressing shaft generate pressing force, which avoids the detection device occupying a large space in the height direction due to the long pressing shaft, saves more space in the height direction, and the same processing head can achieve a longer detection distance. Alternatively, an electromagnetic ring is used, and the electromagnetic ring is energized to make it magnetic and push the detection part downward. It can be placed in different preset positions according to the size of the energized current, and the preset position control is more flexible.

[0032] In the above-mentioned distance detection device, preferably, the pressing assembly includes a pressing rotating block, and a pressing fixed block connected to the pressing rotating block through a first rotating axis, the pressing rotating block rotates relative to the pressing fixed block, the pressing rotating block includes a force-bearing end, and a probe contact end in contact with the pressing axis, the force-bearing end is subjected to force to cause the pressing rotating block to rotate, driving the probe contact end to apply pressing force to the pressing axis.

[0033] The pressing assembly of the distance detection device of the above structure is connected by a fixed block and a rotating block. The rotating block is connected by rotating relative to the fixed block to fix the position of the pressing assembly. During the lifting process of the processing head, it can contact the rotating block to rotate the rotating block, and then the contact end of the probe contacts the pressing axis and generates pressing force on it, thereby making full use of the space in the X direction to realize the pressing action of the detection device.

[0034] In the above-mentioned distance detection device, preferably, the force-bearing end is connected to a bearing, the probe contact end is provided with an inclined surface, the inclined surface is in contact with the pressing shaft, and a rotating block is also provided on the pressing rotating block, and the rotating block limits the pressing rotating block so that the pressing rotating block has the same initial pressing position.

[0035] The inclined surface provided at the contact end of the probe of the distance detection device of the above structure makes the contact surface between the rotating block and the pressing shaft larger when the rotating block rotates, providing a more uniform and vertical downward pressing force, and the movement effect of the detection device is better. At the same time, the rotating block provided stops the rotating block during the reset process after the pressing action is completed, avoiding excessive reset, allowing it to enter the next pressing action more quickly, and at the same time limiting the pressing block so that the pressing rotating block has the same initial pressing position.

[0036] A distance detection method is constructed, in which an external force is applied to a detection device to move a sliding block to drive a detection member to move. By applying an external force in the same axis and direction to the detection device, the sliding block is moved to different preset positions to change the preset length of the extended detection member. The extended length of the detection member is changed by the movement of the detection member at the preset position to perform distance detection, and after detection, the extended length of the detection member returns to the preset length.

[0037] The above-mentioned distance detection method applies a vertical downward force to the pressing shaft to make the pressing shaft move along its length direction and push the sliding block to move, thereby pushing the detection member to move, and the sliding block is fixed after moving to different preset positions. At this time, the extended length of the detection member is the maximum length required to be extended. At the same time, the vertical downward force continues to be applied to the pressing shaft to make the pressing shaft move to other preset positions. After the detection member is subjected to force, the length of the detection member extending out of the shell is changed to realize the detection of the distance of the processing surface. After the detection is completed, the detection member returns to the longest length position at a deep depth for re-detection to realize repeated detection.

[0038] In the above-mentioned distance detection method, preferably, the sliding block is moved to different preset positions by applying external force in the same axis and direction to the detection device, and the sliding block is moved to different preset positions under the action of external force in the same axis and direction applied to the detection device and the force of the elastic member to change the preset length of the extension of the detection member.

[0039] The above-mentioned distance detection method is achieved by setting an elastic member, which is compressed when the sliding block moves and provides a preload force for the sliding block to return to its initial position when the elastic member rebounds under pressure, so that the sliding block and the detection member can return to the preset initial position every time, and the detection accuracy is higher.

[0040] In the above distance detection method, preferably, the detection device applies external force to the sliding block in the same direction along its length direction to reset the detection member, and repeatedly moves the sliding block along its length direction to perform distance detection.

[0041] The above-mentioned distance detection method realizes the detection of the distance of the processing surface by driving the elastic part to change the length of the detection part extending out of the shell after the detection part is subjected to force, and the elastic part is squeezed by force during the detection process. After the detection is completed, the elastic part recovers its deformation and pushes the detection part to the set position for re-detection, so as to realize repeated detection.

[0042] A processing device is constructed, including a processing head for processing a workpiece, wherein the processing head is connected to the distance detection device as described above, and the height of the surface of the workpiece is detected by the distance detection device and the processing head is adjusted according to the height for processing.

[0043] The processing equipment of the above structure applies the aforementioned distance detection device to the processing head, which facilitates the processing head to detect the distance of the processing surface, and then adjusts the working mode of the processing head to achieve better processing effects. Moreover, since the detection height of the distance detection device is adjustable, it can be applied to different processing heads for processing operations to realize the detection of the distance of the processing surface.

[0044] In the above-mentioned processing equipment, preferably, the processing equipment also includes a moving device, which drives the processing head to move in three-dimensional directions, wherein a movable block is arranged on the Z-direction moving device, and the movable block moves with the processing head, and a pressing component is arranged on the side of the processing head, and the pressing component moves with the processing head only in the X direction and the Y direction, and when the processing head moves in the Z direction, the pressing component applies a force to the pressing shaft, and a sensing component is arranged in the processing head, and the sensing component detects the state of the detection component.

[0045] The processing equipment with the above structure realizes precise positioning through movement in three-dimensional directions, and the movement in the Z direction drives the movable block to move. The movable block provides pressing force to the pressing component, so that the processing head can realize self-resetting during the movement in the Z direction, and then quickly enter the measurement of the surface distance of the next processing object, thereby improving work efficiency.

[0046] The beneficial effects of the present invention are: judging the working state of the processing operation by detecting the extended state of the probe needle shaft, if it is in the extended state, the distance of the processing object can be detected and the focusing of the processing head can be completed, if it is in the retracted state, the probe needle shaft can be moved to release, and the probe needle shaft is kept in the retracted state when the processing head is working, avoiding the need to reset the detection device to the reset point when extending and retracting at different positions, realizing resetting at the same XY axis position and then quickly measuring the surface distance of the processing object, reducing the movement time and improving work efficiency. The distance detection device is connected to the processing head by magnetic suction, which is convenient for the rapid installation and disassembly of the detection device, and is flexibly adapted to various processing heads and realizes the extension and retraction movement of the probe in the same axis and direction. At the same time, the lever principle is used to solve the problem that the extension distance of the detection device is too short due to insufficient activity space of the processing head. At the same time, this scheme has less damage to the surface of the object, low cost and maintenance cost, and simple and compact overall structure. Compared with the sensor detection scheme, this scheme can continuously detect the surface position information of the processing object to generate the surface information of the processing object. Compared with the electromagnetic detection scheme, it is low in cost, compact in structure, and more reliable. BRIEF DESCRIPTION OF THE DRAWINGS

[0047] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the present invention will be further described below in conjunction with the accompanying drawings and embodiments. The drawings described below are only some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative work:

[0048] Figure 1 It is a three-dimensional structural schematic diagram of a processing device according to a preferred embodiment 1 of the present invention;

[0049] Figure 2 This is a schematic diagram of the structure of the connection between the distance detection device and the laser motion device according to the first preferred embodiment of the present invention;

[0050] Figure 3 It is a schematic diagram of the three-dimensional structure of the distance detection device according to the first preferred embodiment of the present invention;

[0051] Figure 4 This is a schematic diagram of the explosion structure of the distance detection device according to the first preferred embodiment of the present invention;

[0052] Figure 5 It is a schematic diagram of a partial explosion structure of a distance detection device according to a preferred embodiment 1 of the present invention;

[0053] Figure 6 It is a schematic cross-sectional structure diagram of the movable end of the probe hook in the initial position according to the first preferred embodiment of the present invention;

[0054] Figure 7It is a schematic cross-sectional structure diagram of the movable end of the probe hook in the ascending section according to the first preferred embodiment of the present invention;

[0055] Figure 8 It is a schematic cross-sectional structure diagram of the first preferred embodiment of the present invention, in which the movable end of the probe hook is at the first high point;

[0056] Fig. 9 This is a schematic cross-sectional structure diagram of the movable end of the probe hook at a positioning point according to a preferred embodiment 1 of the present invention;

[0057] Fig.10 It is a schematic cross-sectional structure diagram of the first preferred embodiment of the present invention, in which the movable end of the probe hook is at the second highest point;

[0058] Fig.11 It is a schematic cross-sectional structure diagram of the movable end of the probe hook in the falling section of the preferred embodiment 1 of the present invention;

[0059] Fig.12 A schematic diagram of the direction in which the movable end of the probe hook moves in the hook sliding slot according to the first preferred embodiment of the present invention;

[0060] Fig.13 This is a schematic diagram of the exploded structure of the pressing assembly of the first preferred embodiment of the present invention;

[0061] Fig.14 It is a schematic diagram of the three-dimensional structure of the pressing component in the preferred embodiment 1 of the present invention in a non-pressed state;

[0062] Fig.15 It is a schematic diagram of the three-dimensional structure of the pressing component in the preferred embodiment 1 of the present invention in a pressing state;

[0063] Fig.16 It is a schematic diagram of the three-dimensional structure of the sensing component of the first preferred embodiment of the present invention;

[0064] Fig.17 This is a schematic diagram of the explosion structure of the induction component of the first preferred embodiment of the present invention;

[0065] Fig.18 It is a structural schematic diagram of the sensing component of the preferred embodiment 1 of the present invention being placed in the first signal component state;

[0066] Fig.19 It is a structural schematic diagram of the sensing component of the preferred embodiment 1 of the present invention being placed in the second signal component state;

[0067] Fig. 20 It is a structural schematic diagram of the processing equipment in the preferred embodiment 1 of the present invention in a pressing state;

[0068] Fig.21 This is a schematic diagram of the structure of the connection between the pressing assembly and the laser motion device according to the first preferred embodiment of the present invention;

[0069] Fig. 22 This is a schematic diagram of the side structure of a laser and a detection device according to a preferred embodiment of the present invention;

[0070] Fig.23 This is a schematic diagram of the axial structure of the laser and the detection device of the preferred embodiment 1 of the present invention;

[0071] Fig.24 This is a schematic diagram of the structure of a laser, a detection device and a motion device according to a preferred embodiment of the present invention;

[0072] Fig.25 It is a structural schematic diagram of the processing equipment in the preferred embodiment 1 of the present invention in a non-pressed state;

[0073] Fig.26 It is a structural schematic diagram of the processing equipment of the preferred embodiment 1 of the present invention in a state where the processing equipment is not pressed and the probe needle shaft is extended;

[0074] Fig. 27 This is a schematic diagram of another axial side structure of the connection between the laser and the motion device in the preferred embodiment 1 of the present invention;

[0075] Fig.28 It is a schematic diagram of another axial side structure of the connection between the processing equipment and the pressing assembly of the preferred embodiment 1 of the present invention;

[0076] Fig.29 The preferred embodiment of the present invention is Fig.28 A is an enlarged structural diagram;

[0077] Fig.30 This is a schematic diagram of the structure of the connection between the detection device and the laser according to the second preferred embodiment of the present invention;

[0078] Fig.31 This is a schematic diagram of the explosion structure of the detection device of the second preferred embodiment of the present invention;

[0079] Fig.32 It is a schematic cross-sectional structural diagram of a detection device according to a second preferred embodiment of the present invention;

[0080] Fig.33 This is another schematic diagram of the connection structure of the detection device of the second preferred embodiment of the present invention;

[0081] Fig.34 A schematic diagram of the rotation direction of the probe locking member of the detection device of the second preferred embodiment of the present invention;

[0082] Fig.35 This is a schematic diagram of the structure of the connection between the detection device and the laser according to the third preferred embodiment of the present invention;

[0083] Fig.36This is a schematic diagram of the explosion structure of the detection device of the third preferred embodiment of the present invention;

[0084] Fig.37 It is a schematic diagram of the cross-section structure of the detection device of the third preferred embodiment of the present invention;

[0085] Fig.38 It is a schematic cross-sectional structure diagram of a detection ball placed at a high point in a groove according to a third preferred embodiment of the present invention;

[0086] Fig.39 It is a schematic cross-sectional structure diagram of a detection ball placed at a transition point in a groove according to a third preferred embodiment of the present invention;

[0087] Fig.40 It is a schematic cross-sectional structure diagram of a detection ball in a state of being placed at a low point in a groove according to a third preferred embodiment of the present invention;

[0088] Fig.41 It is a schematic diagram of the unfolded structure of the ball sliding groove of the third preferred embodiment of the present invention;

[0089] Fig.42 This is a schematic diagram of the motion trajectory of the detection ball in the ball sliding groove of the preferred embodiment 3 of the present invention. DETAILED DESCRIPTION

[0090] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the following will be described clearly and completely in combination with the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are partial embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work belong to the protection scope of the present invention.

[0091] The distance detection device and detection method of the preferred embodiment 1 of the present invention; Figure 3 As shown, it includes a probe assembly 10 and a pressing assembly 11 for applying a pressing force to the probe assembly. The pressing assembly 11 applies an external force to the probe assembly 10 to press the probe assembly to adjust the length of the extended distance of the probe assembly, thereby achieving distance measurement through the probe assembly. A sensing assembly 12 is provided on the side of the probe assembly 10, and the sensing assembly senses and detects the extended state of the probe assembly to improve the accuracy of distance detection. The detection device can be used in conjunction with a laser engraving machine to detect the distance between the surface of the processed object and the laser. Figure 1-2As shown, the laser 2 is mounted on a bracket, and the bracket includes two groups of laser Y-axis motion devices 5 arranged opposite to each other, and a laser X-axis motion device 4 connecting the two ends of the laser Y-axis motion device, and the laser X-axis motion device can move back and forth along the Y direction on the laser Y-axis motion device, one group of X-axis laser motion devices is provided with a laser Z-axis motion device 3, and the laser Z-axis motion device can move back and forth along the X direction on the laser X-axis motion device, and the laser is arranged on the laser Z-axis motion device, and can move back and forth along the Z direction on the laser Z-axis motion device. The laser X-axis motion device 4 and the laser Y-axis motion device 5 enclose a processing area, and the laser performs processing operations in the processing area, and the processing operations may include laser engraving, laser cutting, laser marking, etc. In this application, laser engraving is used as an example for illustration. The laser X-axis motion device 4 can move on the laser Y-axis motion device to drive the laser and the laser X-axis motion device to move in the Y direction of the processing area, and the laser Z-axis motion device can move on the laser X-axis motion device to drive the laser and the laser Z-axis motion device to move in the X direction of the processing area, so as to realize the laser engraving operation after the laser accurately locates the coordinates at any position in the processing area. The laser moves on the laser Z-axis motion device to adjust the optimal distance between the laser and the point or surface to be engraved, so that the laser and the point or surface to be engraved of the object to be engraved are at the optimal engraving distance, and the height of the point or surface to be engraved of the object to be engraved is detected by the detection device, and then the position of the laser in the Z direction is adjusted by the laser Z-axis motion device to achieve the optimal engraving position, so as to ensure that the engraving effect of each position of the uneven or variable height surface to be engraved is optimal when engraving.

[0092] Specifically, Figure 3-4As shown, the probe assembly 10 includes a probe lower shell 1002 and a probe upper shell 1001 covering the probe lower shell, a probe slider 1003 is arranged between the probe upper shell 1001 and the probe lower shell 1002, and a pressing shaft 1000 extending out of the upper end of the shell is arranged at the upper end of the probe slider, the pressing shaft and the probe slider can be integrally formed, and applying pressing force to the pressing shaft to make it move so that the probe slider moves with the pressing shaft, and a sliding groove is arranged on the probe lower shell, and the probe slider is placed in the sliding groove and can slide up and down. The probe assembly 10 also includes a probe needle shaft 1006 disposed between the probe upper shell and the probe lower shell, the probe needle shaft partially extends out of the lower end of the shell, and partially is placed in the shell, a probe first compression spring 1007 is disposed between the probe slider 1003 and the upper end of the probe needle shaft 1006, a center hole is disposed at the lower end of the probe slider, the probe needle shaft 1006 is coaxially mounted with the center hole, and the probe needle shaft passes through the center hole and moves vertically (in the Z-axis direction) in the center hole, the probe first compression spring 1007 is coaxially mounted with the probe needle shaft 1006, and the upper end of the probe first compression spring 1007 abuts against the probe slider 1003, and the lower end abuts against the probe needle shaft 1006. The distance detection device also includes a probe sensing stopper 1004 fixedly connected to the probe needle shaft 1006 as a whole, limiting the probe needle shaft in the probe slider, and the probe first compression spring is disposed in the probe slider, and the probe slider limits the probe sensing stopper 1004 from moving vertically (in the Z-direction). At the same time, the probe needle shaft can move up and down in the center hole of the probe slider to compress the first compression spring of the probe. After the compressed first compression spring of the probe is reset, it can also push the probe needle shaft to reset.

[0093] Furthermore, if Figure 3-4As shown, the probe assembly 10 also includes two groups of probe second compression springs 1008 arranged below the probe slider 1003. The probe second compression springs are arranged in two groups and are respectively arranged on both sides of the probe needle shaft. The upper end of the probe second compression spring contacts the lower end of the probe slider, and the lower end contacts the probe lower shell. The probe slider can slide in the sliding groove and squeeze the probe second compression spring, and after the pressure of the probe second compression spring is released, the probe second compression spring resets to reset the probe slider. In order to avoid the deformation of the probe second compression spring after being compressed and causing it to be unable to reset, the probe second compression spring is sleeved on the probe compression spring stopper 1009, and the probe slider is also provided with two groups of vertical through holes corresponding to the probe compression spring stopper. When the probe slider slides downward, the probe compression spring stopper is placed in the vertical through hole. A probe hook 1005 is also provided in the probe lower shell, one end of the probe hook is fixedly arranged in the probe lower shell, and the other end of the probe hook moves relative to the probe slider to achieve the positioning of the probe needle shaft extending to different lengths. The side of the probe lower shell 1002 is provided with a sensing block travel groove 1011, and the probe sensing block moves in the sensing block travel groove to achieve avoidance, and the probe sensing block passes through the sensing block travel groove and can correspond to the sensing component to achieve the sensing component's judgment of the extended distance of the probe needle shaft. In order to facilitate the connection of the probe component to the laser, two groups of probe magnets 1010 are provided on the side of the probe lower shell 1002. The probe component is installed on the laser by adsorption of the probe magnet and the laser. The probe component can also be connected to the laser by screws or other installation methods, which are not specifically limited here.

[0094] Furthermore, if Figure 5-6As shown, a hook sliding groove 1012 is provided on the side of the probe slider 1003, one end of the probe hook is fixed in the probe lower shell, and the other end slides in the hook sliding groove. It slides to different positions corresponding to different extension lengths of the probe needle shaft, so as to realize the distance of the probe assembly detecting the surface of the processed object. It can also lock the position of the probe slider in the probe lower shell at different positions, which is more convenient for adjusting the position of the probe needle shaft. The hook sliding groove 1012 is in the shape of a heart, which includes an ascending section 10124, the lower end of the ascending section is set as the initial point 10120, and the upper end is set as the first high point 10122. The ascending section is connected with a downward inclined section 10125, and the first high point is located above the downward inclined section in the vertical direction. When the probe hook is at the first high point, it falls vertically into the downward inclined section, and the end of the downward inclined section forms a positioning point 10121. The hook sliding block 1012 also includes an upper inclined section 10126 connected to the lower inclined section, the end of the upper inclined section forms a second high point 10123, the upper inclined section is connected to a falling section 10127, the second high point is located above the falling section in the vertical direction, when the probe hook is at the second high point 10123, it vertically falls into the falling section, and the end of the falling section is the initial point. In the present application, only two groups of high points and one group of positioning points are set, and the lower inclined section 10125 and the upper inclined section 10126 can also be connected after the upper inclined section 10126 as needed, and a new positioning point 10121 is formed, thereby realizing the limit at different positions, but it is necessary to ensure that the probe hook enters the lower inclined section after vertically falling from the high point. It should be noted that the first high point 10122 and the second high point 10123 can also be set to different heights, and when multiple groups of positioning points are set, the height positions of the positioning points can also be set to be not completely the same.

[0095] Furthermore, if Figure 3-4As shown, when assembling the probe assembly 10, first install one end of the probe hook 1005 on the hole of the probe lower shell 1002 through the through hole, then place the probe needle shaft 1006 and the probe first compression spring 1007 in the center hole of the probe slider 1003, and use the probe sensing stopper 1004 to limit the probe needle shaft 1006 and the probe first compression spring 1007 in the probe slider 1003. It should be noted that at this time the probe needle shaft can move relative to the probe slider, and the probe needle shaft 1006 can compress the probe first compression spring 1007, or the thrust of the probe first compression spring can push the probe needle shaft to move relative to the probe slider. When the lower end of the probe needle shaft is subjected to pressure, the probe needle shaft moves upward to reduce its extended length and compress the probe first compression spring 1007. When the pressure on the lower end is cancelled, the first compression spring 1007 is compressed and reset to push the extended length of the probe needle shaft to a preset value. At the same time, the first compression spring 1007 of the probe can also be eliminated, so that when the lower end of the probe needle shaft is not subjected to force, it moves downward by its gravity to extend to a preset length. Relatively speaking, it is better to set the first compression spring of the probe to apply a pre-tightening force to it, which can avoid the measurement error caused by the shaking of the probe needle shaft and achieve better effect when measuring distance. Then the second compression spring 1008 of the probe is sleeved on the outside of the probe compression spring stopper 1009, and then placed in the hole on the side of the probe slider. Then the above-mentioned slider component is installed in the sliding groove of the probe lower shell 1002 with the probe hook, and the other end of the probe hook is placed in the hook sliding groove 1012, and the probe upper shell 1001 is fastened, and then the probe magnet 1010 is fixed to the probe lower shell, and the probe assembly is assembled.

[0096] like Figure 3-4As shown, the probe assembly 10 is assembled, and its first compression spring 1007 is compressed and in a stressed state and provides a downward force to the probe needle shaft, and the second compression spring 1008 is also in a compressed and stressed state, and at this time, the probe slider is placed at the top, the probe needle shaft extends the shortest distance, the pressing shaft 1000 extends the longest distance, the probe slider is placed at the top, and the movable end of the probe hook is placed at the initial point 10120. The first compression spring 1007 and the second compression spring 1008 can also be in the original length non-stressed state, and the compressed state enables the probe slider 1003 and the probe needle shaft 1006 to have a pre-tightening force at the initial position. The second compression spring 1008 can bounce the probe slider open when it is compressed, so that the probe slider is at the top, and the first compression spring 1007 can bounce the probe needle shaft 1006 open when it is compressed, so that the probe needle shaft 1006 is in the initial position. If the probe first compression spring 1007 and the probe second compression spring 1008 are in a non-compressed state in the initial state of the probe needle shaft 1006 and the probe slider 1003, it cannot be completely guaranteed that the probe needle shaft 1006 and the probe slider 1003 are in a precise predetermined position during the movement of the probe assembly 10. It is necessary to set the probe first compression spring and the probe second compression spring to a reasonable length, and the reset force cannot be changed after long-term use. Therefore, in the initial state, the probe first compression spring 1007 and the probe second compression spring 1008 are both subjected to a certain extrusion force to ensure that the probe needle shaft 1006 and the probe slider 1003 accurately reach the predetermined position during the movement. Part of the probe sensing block 1004 passes through the sensing block travel slot 1011 and is placed above the sensing block travel slot. When the pressing shaft 1000 is subjected to a vertical downward pressing force in the initial position, the pressing shaft drives the probe slider 1003 to move downward and drives the probe needle shaft 1006 to move downward. During the downward movement of the probe needle shaft, the second compression spring 1008 of the probe is compressed. The second compression spring 1008 of the probe is in a compressed state. The probe slider moves downward under the action of an external force. The probe needle shaft moves downward and extends and continues to compress the second compression spring of the probe. After the pressing force is canceled, the reset force of the second compression spring of the probe resets the probe slider. At this time, the probe needle shaft 1006 is in an extended state. The Z-axis motor is controlled to drive the laser head 2 and the detection device 10 to descend. When the probe needle shaft touches the surface of the workpiece during the downward exploration, the surface of the workpiece generates a thrust on the probe needle shaft after the probe needle shaft contacts the surface of the workpiece, causing the probe needle shaft to move upward. The probe needle shaft probe sensing stopper 1004 will move synchronously, which will drive the probe sensing stopper to move upward. When the probe sensing stopper is separated from the first signal component, it indicates that the surface of the workpiece has been detected. After the contact signal is detected, the detection device and the laser rise, and the reset force of the first compression spring 1007 of the probe resets the probe needle shaft. The first compression spring 1007 and the second compression spring 1008 of the probe are always in a compressed state, and the compression degree is greater after the force is applied. After the force is removed, the reset drives the probe needle shaft to move. The working principle of the probe assembly 10 is explained below. The probe slider 1003 moves vertically up and down, such as Fig.12As shown, the movable end of the probe hook 1005 performs a circular reciprocating motion along the track in the hook sliding groove 1012, and moves at various slot positions in the groove, thereby realizing the extension and retraction of the probe needle shaft 1006. Figure 6 The probe hook of the probe assembly is shown in the initial state, at which the active end of the probe hook is at the initial point 10120, and at this time the first compression spring 1007 and the second compression spring of the probe are both in a compressed state, while the probe needle shaft 1006 extends the shortest distance and the pressing shaft 1000 extends the longest distance. Figure 7 The probe hook of the probe assembly is shown in the state of being in the ascending section relative to the probe slider 1003. When pressure is applied to the pressing shaft 1000 to make it move linearly downward, the probe slider 1003 is driven to move downward, so that the movable end of the probe hook gradually rises in the ascending section 10124. At this time, the extended distance of the probe needle shaft 1006 gradually increases, and the compression degree of the probe second compression spring 1008 gradually increases. Figure 8 The probe hook of the probe assembly is shown in the state of being at the first high point, and the pressure on the pressing shaft is continuously applied. When the pressing shaft is stressed so that the movable end of the probe hook is at the first high point 10122, the probe needle shaft extends the longest distance, the pressing shaft extends the shortest distance, and the second compression spring of the probe is in the maximum compression state. At this time, the pressing force on the pressing shaft 1000 is released. Fig. 9 The probe hook of the probe assembly is shown in a state of being at a positioning point. When the pressing force of the pressing shaft 1000 disappears, the rebound force generated by the pressure of the second compression spring 1008 of the probe generates a vertical upward thrust on the probe slider, causing the probe slider to move upward in a straight line. At this time, the movable end of the probe hook moves downward relative to the probe slider 1003. Since the first high point is directly above the lower inclined section in the vertical direction, the probe hook will move downward relative to the probe slider to the lower inclined section 10125. Due to the inclined setting of the lower inclined section, the movable end of the probe hook 1005 moves relative to the probe slider in the direction of the lower inclined section to the positioning point 10121. At this time, the probe needle shaft 1006 is in an extended state. At the same time, the probe needle shaft can elastically move in the center hole of the probe slider 1003 under the rebound force of the first compression spring 1007 of the probe, which is convenient for detecting the processed surface. Fig. 9 As shown, it can be used to detect the distance of the surface of the processed object.

[0097] Furthermore, in Fig. 9 The state of the positioning point shown in FIG. 1 continues to apply a pressing force to the pressing shaft 1000 to make it move linearly downward, and the probe slider 1003 also moves linearly downward, as shown in FIG. Fig.10 The probe hook of the probe assembly is shown in the state of being at the second highest point. At this time, the movable end of the probe hook 1005 moves relative to the probe slider 1003 in the upper inclined section 10126 and continues to move to the second highest point 10123. When the pressing force of the pressing shaft 1000 is released again, as shown in FIG. Fig.11The probe hook of the probe assembly is shown in the state of being in the falling section relative to the probe slider 1003. The second compression spring 1008 of the probe is compressed and rebounds to generate a vertical upward thrust on the probe slider, so that the probe slider moves upward in a straight line, and the movable end of the probe hook moves downward in a straight line relative to the probe slider 1003. Since the second highest point is directly above the falling section in the vertical direction, the probe hook will move downward to the falling section relative to the probe slider 1003, and since the end point of the falling section is the initial point, the probe hook will return to the initial point position. At this time, the probe needle shaft 1006 is in a retracted state (i.e., the extended length is the shortest), and the pressing shaft is in a state of maximum extended distance, thereby forming the following Figure 6 The state shown in FIG. 1 forms a complete cycle motion, and the pressing shaft 1000 can be pressed again to make the movable end of the probe hook 1005 move back and forth relative to the probe slider 1003 in the hook stroke groove 1012, so that the motion trajectory relative to the probe slider 1003 is as shown in FIG. Fig.12 shown.

[0098] As for the first compression spring 1007 of the probe, when the movable end of the probe hook 1005 is at the positioning point 10121 in the hook sliding groove 1012, the current extension distance of the probe needle shaft 1006 is recorded as the maximum extension length in the current state. When the lower end of the probe needle shaft is subjected to a vertical upward force, the probe needle shaft will be pushed to move upward. The extension length of the probe needle shaft in the current state gradually decreases, and the first compression spring of the probe is compressed at the same time. After the external force at the lower end of the probe needle shaft is cancelled, the rebound of the first compression spring of the probe will push the probe needle shaft back to the maximum extension length in the current state. Therefore, the first compression spring of the probe can restore the probe needle shaft to the preset length in the current state when it is not subjected to external thrust, so that the maximum extension length of the probe needle shaft in subsequent detections in the current state is the same, and the measurement accuracy is higher.

[0099] Furthermore, in order to adapt to the measurement of different surface distances of the processed object, the above-mentioned probe assembly 10 can be set to different extension lengths as needed. When the extension length of the probe assembly 10 is set to be large, the activity space of the laser device on the Z axis is relatively limited, which will cause the probe needle shaft 1006 to extend insufficiently. Therefore, the setting can be set to apply external force to the probe assembly by setting a pressing assembly 11, and the pressing assembly uses the lever principle to solve the problem of insufficient extension of the probe needle shaft caused by the limited activity space of the laser Z axis.

[0100] Furthermore, if Fig.13As shown, the pressing assembly 11 includes a pressing fixed block 1102 and a pressing rotating block 1101 connected to the pressing fixed block. A first rotating shaft 1107 is arranged at one end of the pressing fixed block, and the middle of the pressing rotating block is connected to the first rotating shaft, and a torsion spring 1103 is arranged at the connecting shaft. The other end of the pressing rotating block fixes the first rotating shaft through a gasket 1105 and a clamping spring 1106 so that the pressing fixed block and the pressing rotating block can rotate relative to each other along the first rotating shaft 1107. The other end of the pressing fixed block can be fixedly mounted on the Z-axis profile of the laser, so that the pressing fixed block is fixedly arranged relative to the Z-axis fixing part. One end of the pressing rotating block 1101 contacts the movable block 3001, and the other end rotates through the first rotating shaft 1107 to drive the probe contact end 11011 to rotate, thereby realizing the pressing of the pressing shaft.

[0101] Furthermore, if Fig.13 As shown, the pressing and fixing block 1102 is L-shaped as a whole, and includes a horizontal arm 11021 and a vertical arm 11022, which are connected to form an integral body, and the first rotating shaft 1107 is disposed at the end of the vertical arm 11022, and the end of the horizontal portion 11021 forms a fixed end 11020, which is used to be fixedly connected to the Z-axis profile of the laser to fix the pressing and fixing block. Setting the pressing and fixing block into an L-shape can further reduce the space required for the pressing assembly to move, and at the same time, its horizontal arm can also play a certain blocking role on the pressing and rotating block, thereby limiting the rotation stroke of the pressing and rotating block. The force-bearing end 11010 of the pressing rotating block is provided with a second rotating shaft 1108, on which a bearing 1104 and a retaining spring 1106 are sleeved, and the position where the first rotating shaft is connected to the pressing rotating block can be arranged closer to the force-bearing end, so that the distance from the first rotating shaft to the force-bearing end is smaller than the distance from the first rotating shaft to the probe contact end. At this time, the force-bearing end 11010 can be driven to move in the Z direction by other moving parts that move integrally with the laser head and contact the bearing. The movement of the force-bearing end 11010 drives the probe contact end 11011 to move in the opposite direction through the first rotating shaft 1107 and contact the probe assembly to achieve pressing. At the same time, in order to achieve a better pressing effect, the probe contact end 11011 is set as an inclined surface toward the probe assembly, which optimizes the force applied angle between the probe contact end and the pressing shaft when rotating, and achieves a better pressing effect.

[0102] Furthermore, if Fig.13 As shown, when the pressing assembly 11 is assembled, the second rotating column 1108 is embedded in the pressing rotating block 1101, and then the bearing 1104 is placed on the second rotating shaft and clamped with the clamping spring 1106. Then the first rotating shaft 1107 is embedded in the pressing rotating block 1102, and then the torsion spring 1103 is placed on the first rotating shaft, and the pressing rotating block is fixed to the pressing fixed block with the gasket 1105 and the clamping spring 1106 to make it complete, and finally the pressing assembly 11 is fixed on the Z-axis profile of the laser.

[0103] When the pressing assembly 11 is working, Figure 14-15 As shown, when the bearing 1104 is subjected to a vertical upward external force applied by a fixing member that moves integrally with the laser, the pressing and rotating block 1101 rotates around the first rotating shaft 1107, and causes the first torsion spring to rotate and deform, and at this time, the probe contact end 11011 moves downward and presses the probe assembly, exerting downward pressure on the probe assembly 10, causing it to perform the aforementioned action, thereby achieving the detection assembly to measure the distance of the surface of the workpiece. When the external force applied to the bearing 1104 is removed, the first torsion spring resets and drives the pressing and rotating block 1101 to reset, and a rotating stopper 11012 is set on the pressing and rotating block to prevent the inertia generated when the first torsion spring is reset from driving the pressing and rotating block to continue rotating, providing the same initial position of the pressing and rotating block 1101 for the next pressing action. Of course, the rotating stopper 11012 is not necessarily set, and the reciprocating pressing function can also be achieved without the rotating stopper 11012.

[0104] Furthermore, if Figure 16-17 As shown, the detection device also includes a sensing component 12, which contacts the probe component and detects the extension and retraction state of the probe component. The sensing component 12 includes a sensing fixture 1201 and a sensing PCBA board 1202, and the sensing PCBA board is respectively provided with a first signal transmitting end 1203, a first signal receiving end 1204, a second signal transmitting end 1205 and a second signal receiving end 1206. The sensing PCBA board 1202 is fixed on the sensing fixture, and then the sensing component is fixed on the laser. The first signal transmitting end and the first signal receiving end are correspondingly arranged and are on the same horizontal line, and the second signal transmitting end and the second signal receiving end are correspondingly arranged and are on the same horizontal line. A gap is provided between the signal transmitting end and the signal receiving end, and the probe sensing block 1004 is placed in the gap. Since the probe sensing block moves up and down synchronously with the probe needle shaft, the movement of the probe needle shaft 1006 can be known through the movement state of the probe sensing block 1004. The first signal transmitting end 1203 and the first signal receiving end 1204 are placed below the second signal transmitting end 1205 and the second signal receiving end 1206. Fig.18 As shown, when the probe assembly is in the retracted state, the probe sensing block 1004 is placed between the second signal transmitting end and the second signal receiving end, and blocks the signal transmission and reception of the second signal transmitting end and the second signal receiving end, while the first signal transmitting end and the first signal receiving end can be in a normal receiving state. At this time, the probe assembly is in the retracted state. Fig.19As shown, when the probe sensing block 1004 is placed between the first signal transmitting end and the first signal receiving end, and blocks the signal transmission and reception of the first signal transmitting end and the first signal receiving end, while the second signal transmitting end and the second signal receiving end can be in a normal receiving state, then the probe assembly is in an extended state. It should be noted that more groups of signal transmission and reception can also be set to cope with the induction detection of the probe extension length in various situations when the aforementioned probe assembly is set with multiple groups of positioning points.

[0105] The sensing component 12 cooperates with the detection device 10 to work. When the probe needle shaft 1006 extends to the position where the probe sensing stopper 1004 is in the sensing first signal component position, the main program knows that the probe needle shaft 1006 is in the extended state, and then the laser continues to descend. When the probe needle shaft contacts the surface of the workpiece, the probe needle shaft contacts the workpiece surface and is supported vertically by the workpiece to cause the probe needle shaft to move upward. The probe needle shaft will drive the probe sensing stopper 1004 to move upward and disengage from the sensing first signal component. The signal change of the first signal component is fed back to the main program. At this time, the main program obtains the feedback signal of the first signal component, representing that the position is the detected workpiece surface, and records the Z-axis height at this time. The single-point height position detection of the engraved object is completed, the laser is adjusted to the optimal distance again, and then the probe needle shaft is retracted. According to the detected engraved surface height information, the program automatically calculates the optimal engraving position corresponding to the laser by the engraving focal length. After the laser moves to the optimal focal length position with the surface of the workpiece to be processed, the engraving operation begins.

[0106] like Figure 18-19 and Figure 22-23 As shown, two photoelectric sensors are arranged inside the sensing component 12 up and down along the Z direction. The sensing component 12 is fixed on the inner side of the laser head 2, and a through-slot structure is arranged at a corresponding position on the side of the laser head 2. The probe sensing block 1004 can pass through the through-slot structure on the side of the laser head and move up and down along the Z direction. When the probe needle shaft 1006 is extended to different lengths, the corresponding probe sensing block 1004 is in different positions, and the two photoelectric sensors inside the sensing component 12 can be triggered correspondingly at different positions, so that the main program can identify the extension and retraction states of the probe. When the probe sensing block 1004 triggers the photoelectric sensor above the sensing component 12, the program is informed that the probe is in the retracted state at this time. When the probe sensing block 1004 triggers the photoelectric sensor below the sensing component 12, the program is informed that the probe is in the extended state at this time. When the probe sensing block 1004 changes from the trigger state to the critical point of the photoelectric sensor below the sensing component 12 from the trigger state to the release state, the surface state of the engraving object is detected.

[0107] A processing device according to a preferred embodiment of the present invention includes the aforementioned distance detection device. The specific content of the distance detection device is as described above and will not be repeated here. The distance detection device can be used in laser processing equipment such as laser engraving machines, laser cutting machines, and laser marking machines, or processing equipment such as printers that need to detect the surface height of the processed object. The distance detection device can be used to detect the distance between the processing head of the processing equipment and the processing position, or to detect the flatness of the processing surface. For example, in laser processing equipment such as laser engraving, the processing head is often configured as a laser engraving head for emitting engraving laser. The surface position of the engraved object is detected by the distance detection device. The position of the laser engraving head can be calculated according to the focal length to ensure the best engraving effect. It can also be used to detect the flatness of the processing surface of the processed object and generate surface information of the surface of the processed object to achieve variable height multi-point measurement. When measuring the distance between the laser engraving head and the processing surface, the probe needle axis in the retracted state can be aligned with the light outlet of the laser engraving head. At this time, the distance detected by the probe assembly is the actual distance between the laser engraving head and the processing surface, and the laser engraving head can be focused according to the distance; it can also be set to an uneven state. At this time, the height difference in the uneven state needs to be recorded, and then the distance compensation needs to be performed when calculating the actual distance, and then the focus is adjusted according to the compensated distance. This application does not limit the height of the probe needle axis in the retracted state and the laser light outlet, and both should fall within the protection scope of this application.

[0108] Furthermore, if Figure 20-21 As shown, the pressing component 11 is installed on the laser Z-axis profile 3, and the sensing component 12 is installed inside the laser 2, as shown in FIG. Figure 22-23 As shown, the probe assembly 10 is then adsorbed onto the laser 2 through the probe magnet 1010. An adsorption area can be set on the laser to facilitate the installation of the probe assembly, and magnetic adsorption also facilitates disassembly and installation. At the same time, the probe magnet adsorption structure can also effectively replace and install various lasers. The laser equipped with the probe assembly 10 and the sensing assembly 12 is fixed on the laser Z-axis laser connecting block. Other structures that are easy to disassemble can also be used to connect the probe assembly 10 to the laser for easy replacement and installation, such as snap connections, screw connections, etc.

[0109] Furthermore, if Fig.24 As shown, the laser Z-axis fixes the laser on the Z-axis moving component through the laser connecting block 300. The laser Z-axis motor can drive the Z-axis moving component to move up and down along the Z direction. The Z-axis moving component and the laser connecting block 300 move in a fixed and synchronous manner, thereby driving the laser connecting block 300 to move up and down along the Z direction.

[0110] When using the machine, the user fixes the probe assembly 10 on the laser head. The program executes the action of first resetting the laser head 2 to the starting position (X=0, Y=0, Z=0). When resetting, the laser head is first raised to reset the laser head to the Z axis 0 initial position, and then reset the X and Y axes to the 0 initial position. At this time, two situations may occur:

[0111] If the probe needle shaft is in the retracted state, when the program resets the Z position, the laser head 2 is first raised to reset the laser head 2 to the Z axis 0 initial position. During the rising process, the probe assembly 10 contacts the pressing assembly 11, and the pressing assembly 11 continues to press the needle assembly 10. After the laser head rises to the highest position and completes the 0 position reset, it drops a short distance to release the probe needle shaft, and the probe needle shaft 1006 is in the extended state. At this time, the probe sensing stopper 1004 triggers the photoelectric sensor located at the lower position in the sensing assembly 12. At this time, the main program knows that the probe is in the extended state according to the feedback signal of the photoelectric sensor. In this case, the program will not continue to execute the X and Y axis reset action, because moving the laser head when the probe needle shaft is in the extended state may scratch the engraved object. At this time, the program will let the laser head rise to the Z-axis initial position 0 again. During this rising process, the probe component 10 contacts the pressing component 11, and the pressing component 11 continues to press the needle component 10. After the laser head rises to the highest position and completes the 0 position reset, it drops a short distance to release the probe needle shaft. The probe needle shaft 1006 is in a retracted state. At this time, the probe sensing block 1004 triggers the photoelectric sensor located in the upper position of the sensing component 12. At this time, the main program determines that the probe needle shaft is in a retracted state according to the photoelectric sensor signal, and then the main program continues to drive the laser head back to the X and Y axes to the 0 initial position, realizing the initial position reset function of the entire machine.

[0112] If the probe needle shaft 1006 is in the extended state, when the program resets the Z position, the laser head 2 is first raised to reset the laser head 2 to the Z axis 0 initial position. During the rising process, the probe assembly 10 contacts the pressing assembly 11, and the pressing assembly 11 continues to press the needle assembly 10. After the laser head rises to the highest position and completes the 0 position reset, it drops a short distance and releases the probe needle shaft. The probe needle shaft 1006 is in the retracted state. At this time, the probe sensing block 1004 triggers the photoelectric sensor located in the upper position of the sensing assembly 12. At this time, the main program determines that the probe is in the retracted state according to the photoelectric sensor signal. Then the main program continues to drive the laser head back to the X and Y axes to the 0 initial position to realize the initial position reset function of the whole machine.

[0113] The laser connection block 300 is fixed on the movable block 3001. The laser connection block 300 is fixed integrally with the laser head 2, and the movable block 3001 moves synchronously with the laser 2. After receiving the engraving instruction, when the laser 2 equipped with the probe assembly 10 moves vertically upward along the Z axis, the movable block 3001 on the laser Z axis also moves vertically upward synchronously. When it touches the bearing 1104 of the pressing assembly 11, it drives the pressing rotating block 1101 to rotate clockwise around the pressing first rotating axis 1107, as shown in FIG. Fig. 20 As shown, the pressing rotating block 1101 contacts the pressing shaft 1000 and exerts a pressing force thereon. Fig. 20As shown, when the pressing shaft 1000 moves downward and drives the probe slider 1003 to move vertically downward, the probe slider 1003 of the probe assembly 10 is pushed to the lowest point, and the second compression spring 1008 of the probe is in a compressed state. At the same time, the probe hook 1005 of the probe assembly moves to the first high point of the hook sliding groove 1012 relative to the probe slider 1003. At this time, after the laser 2 moves to the highest point and triggers the induction switch, the laser 2 and the movable block 3001 continue to move downward, and the external force applied by the movable block 3001 to the bearing 1004 of the pressing assembly 10 disappears. The pressing rotating block 1101 is separated from the pressing shaft 1000 of the probe assembly 10 under the resilience of the torsion spring 1103, and the probe slider 1003 moves upward after being subjected to the resilience of the second compression spring 1108 of the compressed probe. At this time, the other end of the probe hook moves to the positioning point of the hook sliding groove relative to the probe slider 1003. The probe sensing block 1004 is placed between the first signal transmitting end 1203 and the first signal receiving end 1204 and blocks the transmission and reception of the signal. The second signal transmitting end 1205 and the second signal receiving end 1206 are not blocked and are in a normal receiving state, indicating that the probe needle shaft 1006 of the probe assembly 10 is in an extended state at this time. The probe needle shaft 1006 can be elastically moved in the center hole of the probe slider under the rebound force of the probe first compression spring 1007, and can be used to detect the distance of the surface of the workpiece. During the detection process, due to the aforementioned action, the probe needle shaft 1006 is in an extended state, and the probe sensing block 1004 is at the first signal assembly. The laser continues to descend until the probe needle shaft contacts the surface of the workpiece. During the continued descent process, the probe needle shaft moves upward under the action of the surface of the workpiece and drives the probe sensing block 1004 to move upward. After the movement, the probe sensing block is separated from the first signal assembly position. At this time, the surface of the workpiece can be detected, and the Z-axis height is recorded, so as to know the distance between the engraving head and the surface of the workpiece. When the detection distance is completed, the main program drives the movable block of the laser working platform to move vertically upward, and then the movable block 3001 touches the bearing 1104 of the pressing component 11, driving the pressing rotating block to rotate clockwise around the first rotating axis 1107. Then the pressing rotating block 1101 will touch the pressing axis 1000 again, and make the probe slider 1103 move vertically downward, pushing the probe slider of the probe assembly 10 to the lowest point. At this time, the movable end of the probe hook 1005 moves relative to the probe slider 1003 in the hook sliding groove until it moves to the second highest point. At this time, the second compression spring of the probe is in a compressed state.At the same time, when the laser 2 moves to the highest point and triggers the induction switch, the laser 2 moves downward, and the laser 2 and the movable block 3001 continue to move downward until the external force applied by the movable block 3001 to the bearing 1004 of the pressing assembly 10 disappears, and the pressing and rotating block 1101 is separated from the pressing shaft 1000 of the probe assembly 10 under the rebound force of the torsion spring 1103, and the probe slider 1003 moves upward after being subjected to the rebound force of the second compression spring 1108 of the probe in a compressed state, and the probe hook 1005 is subjected to the force relative to the probe slider 1003 in the hook sliding groove 1012 and moves along the hook sliding groove. After moving to the initial point position, the probe sensing block 1004 is placed between the second signal transmitting end 1205 and the second signal receiving end 1206 and blocks the transmission and reception of signals. The first signal transmitting end 1203 and the first signal receiving end 1204 are not blocked and are in a normal receiving state. At this time, the probe needle shaft 1006 of the probe assembly 10 is in a retracted state. At this time, the laser calculates the optimal engraving position of the detection point on the Z axis according to the previously recorded detection point distance and focal length, and moves to the optimal distance position between the aforementioned laser head and the workpiece for processing. After the processing at this position is completed, it is moved to other positions and the movable block 3001 is repeatedly moved vertically to apply force to the bearing 1104, so that the pressing and rotating block 1101 rotates and applies pressure to the pressing shaft 1000, thereby driving the probe slider 1003 to move vertically and linearly, and then the probe hook 1005 is moved in various positions in the hook sliding groove, so as to achieve repeated pressing of the probe slider 1003, so that the probe needle shaft 1006 is extended and retracted under the external force of the same axis and direction, avoiding the extension and retraction movement of the detection device at different XY positions, reducing the movement time, and improving work efficiency. At the same time, the pressing assembly can be reset at the engraving position, and there is no need to reset the probe needle shaft to the surface of the workpiece, so as to avoid multiple contacts with the workpiece surface causing damage to the workpiece surface and affecting subsequent processing. The above description is only a preferred embodiment of the present invention, and does not limit the patent scope of the present invention. All equivalent structural changes made by using the contents of the present invention specification and drawings under the inventive concept of the present invention, or directly / indirectly applied in other related technical fields are included in the patent protection scope of the present invention.

[0114] The detection device of the present invention can be used to determine the optimal engraving position of the laser head of the laser engraving machine. The laser engraving machine can achieve a good engraving effect only at the laser focus. When the detection device is in the initial position, the X, Y, and Z axes return to zero, and the probe needle shaft is in a retracted state. At this time, the laser and the detection device will move to the X, Y axis coordinates according to the instruction, and the laser Z axis direction moves upward to zero, and the state of the probe needle shaft of the detection device is detected. If the probe needle shaft is in an extended state, the probe can detect the distance of the processed object to complete the laser focusing. If the probe needle shaft is in a retracted state, the laser Z axis direction moves upward to zero, and the probe needle shaft is pressed to release the probe needle shaft in an extended state. At this time, the probe needle shaft can detect the distance of the processed object to complete the laser focusing. After the laser focusing is completed, the state of the probe needle shaft is detected. If the probe needle shaft is in an extended state, the laser Z axis direction moves upward to zero, and the probe needle shaft is pressed to make the probe needle shaft in a retracted state. At this time, the laser starts to work. If the probe needle shaft is in a retracted state, the laser can start to work. When the work is completed, the position of the probe needle shaft is detected. If the probe needle shaft is in a retracted state, the laser can return to the initial position. If the probe needle shaft is in an extended state, the laser Z-axis moves upward to zero. When the probe needle shaft is pressed to retract the probe, the laser can return to the initial position. The probe needle shaft is in an extended state only when detecting. It is in a retracted state when working and moving in a non-detection state.

[0115] The engraving process from the initial position to a set position within the working range is as follows: after completing the XYZ initial position reset, the main program drives the laser head 2 to the specified engraving position (the laser head reaches the set X, Y position, and the Z axis is at the lower position after the 0 initial position reset). At this time, the probe needle shaft 1006 is in a retracted state, and the main program drives the laser head 2 to rise in the Z direction. After the laser head rises to the highest position and completes the 0 position reset, it descends a short distance to release the probe needle shaft, and the probe needle shaft 1006 is in an extended state. At this time, the probe sensing block 1004 triggers the photoelectric sensor located at the lower position in the sensing component 12. At this time, the main program knows that the probe needle shaft is in an extended state based on the photoelectric sensor signal. Continue to lower the laser head position in the Z direction until the bottom end of the probe needle shaft 1006 contacts the surface of the engraving. At this time, continue to lower the laser head, the probe needle shaft contacts the surface of the engraving, and the contact point on the surface of the engraving pushes the probe needle shaft upward, so that the constant signal received by the probe sensing block 1004 from the photoelectric sensor located at the lower position in the trigger sensing component 12 is triggered into a changing signal, thereby feeding back to the main program that this position is the height position of the surface of the engraving. When more than one detection point needs to be detected, after completing the detection of one point, the laser head rises to a certain height (the position where the probe pressing component 11 and the pressing shaft 1000 do not apply force) and then continues to descend to detect the position information of the second point and record it. This cycle is repeated until all the required detection points are detected. The laser head rises to the initial 0 position of the Z axis and then descends a short distance to release the probe needle shaft, and the probe is retracted at this time. At this time, the probe sensing block 1004 triggers the photoelectric sensor located at the upper position in the sensing component 12. At this time, the main program determines that the probe is in a retracted state according to the photoelectric sensor signal. Then the main program generates the height information of the surface to be engraved (plane / curved surface) according to the recorded positions of each point on the engraving surface. The program will automatically calculate the optimal engraving distance and Z-axis position of the laser head based on the height information and the laser focal length, start engraving, and complete an engraving process.

[0116] Furthermore, the measurement of the processing distance can also be applied to the detection of the surface flatness of the processing surface. After the above steps are performed at the first position to obtain the distance of the processing surface at the first position, the measurement can be applied to the detection of the surface flatness of the processing surface. Fig. 27 As shown, the motor 40 drives the belt 41 to rotate and drives the laser to move to other positions to repeat the above steps to obtain the distance of the processing surface at the second position. If the distances between the first position and the second position are different, it can be determined that the processing surface is not placed horizontally.

[0117] The distance detection device and detection method of the second preferred embodiment of the present invention; Fig.30 As shown, the probe assembly 60 is fixed to the laser 2, and by applying a pressing force to the pressing shaft 6000, the probe needle shaft 6006 can also extend and retract under the same axiality and the same direction of external force.

[0118] Furthermore, if Figure 31-32 As shown, the probe assembly 60 includes a probe housing 6007, a through hole is arranged inside the probe housing, a probe needle shaft 6006 is arranged in the through hole, and a probe second compression spring 6005 is sleeved on the outside of the probe needle shaft, and a probe bottom plate 6008 is arranged at the through hole at the lower end of the probe housing, the probe bottom plate fixes the probe second compression spring in the probe housing, and a through hole is arranged in the middle of the probe bottom plate, and the probe needle shaft can move in the through hole to change the extension distance. When the probe second compression spring 6005 is compressed, it will apply an upward rebound force to the probe sensing stopper 6004, thereby ensuring that the probe locking member 6002 and the probe pressure rod 6001 are in close contact. The upper end of the probe needle shaft 6006 is connected to a probe sensing stopper 6004, and the second compression spring of the probe is placed between the probe sensing stopper and the probe bottom plate, and the probe housing is provided with a groove for the movement of the probe sensing stopper, and the probe sensing stopper partially passes through the groove and moves between the aforementioned sensing components to detect the motion state of the probe component. The specific method is the same as the above, and will not be repeated here. The upper end of the probe sensing stopper is connected to a probe first compression spring 6003, and the upper end of the probe first compression spring is connected to a probe locking component 6002. The upper end of the probe pressure rod is integrally connected to a pressing shaft 6000, and the pressing shaft passes through the through hole at the upper end of the probe housing and contacts with the pressing component to realize the pressing movement. When the pressing shaft is forced to move downward, it drives the probe pressure rod to move downward, and pushes the probe locking component to move downward. The second compression spring of the probe is compressed to generate an upward rebound force on the probe sensing stopper and push the probe needle shaft to move upward. The specific movement method is the same as that of Example 1, and will not be repeated here.

[0119] Furthermore, if Figure 31-34As shown, a pressure rod groove 60011 is provided on the side of the probe pressure rod 6001, a locking member groove 60021 is also provided on the side of the probe locking member corresponding to the pressure rod groove, and a housing boss 60070 is provided on the inner wall of the probe housing side corresponding to the pressure rod groove and the locking member groove, and after the pressing force is applied to the pressing shaft, the housing boss can move up and down relative to the pressure rod groove and the locking member groove. In order to achieve locking after rotation, a pressure rod slope surface 60010 is provided at the lower end of the probe pressure rod 6001, and a locking member slope surface 60020 is provided at the upper end of the probe locking member 6002. When the pressing shaft is forced to move downward, the pressure rod slope surface generates a slope surface force on the locking member slope surface, and the slope surface force is decomposed into a vertical force and a horizontal force. The vertical force makes the probe locking member move vertically downward, and the horizontal force will drive the probe locking member to rotate. However, since the housing boss is placed at the locking member groove, it cannot rotate in the horizontal direction and can only achieve downward movement in the vertical direction. When the shell boss 6007 moves to the bottom of the locking groove, the horizontal force will act to rotate the probe locking piece. In order to fix the position after rotation, a shell tooth 60071 is arranged in the shell boss 60070. When the horizontal force rotates the probe locking piece, the shell tooth is placed under the probe locking piece so that it cannot move in the vertical direction, thereby achieving limiting. Continue to apply force to the pressing shaft to rotate the probe locking piece. The shell boss rotates to the locking groove relative to the needle locking piece 6002. At this time, it can move in the vertical direction, but cannot rotate in the horizontal direction.

[0120] Furthermore, if Figure 31-34As shown, when the pressing shaft 6000 moves downward under the pressing force transmitted by the pressing assembly, the probe pressing rod 6001, the probe locking member 6002, the probe sensing stopper 6004 and the probe needle shaft 6006 all move downward in the probe housing 6007, and at this time, the pressing rod groove 60011 and the locking member groove 60021 all slide in the housing boss 60070, and the pressing rod slope surface 60010 contacts the locking member slope surface 60020 and applies a slope surface force to the locking member slope surface 60020. The slope surface force can be decomposed into vertical movement force and horizontal rotation force. The vertical movement force causes the probe locking piece to move vertically downward, while the horizontal rotation force is due to the resistance encountered by the locking piece groove 60021 in the outer shell boss 60070, so that the probe locking piece 6002 cannot rotate and can only maintain vertical downward movement. During the continuous downward movement, the second compression spring 6005 of the probe is in a continuous compression state, the locking piece groove 60021 is disengaged from the outer shell boss 60070, and the horizontal rotation force will cause the probe locking piece to rotate. When the probe locking member 6002 moves to the lowest point, the locking member slope surface 60020 rotates to the outer shell tooth 60071. After the pressure on the pressing shaft is cancelled, the probe second compression spring 6005 is in a compressed state and has resilience, and applies a vertical upward resilience force to the probe locking member 6002, so that the locking member slope surface 60020 is clamped at the outer shell tooth 60071. At this time, the probe needle shaft 6000 is in an extended state, and the probe first compression spring connected to the upper end of the probe needle shaft can adjust the extension distance of the probe needle shaft to achieve the measurement of the processing surface distance. The specific method is the same as that in Example 1 and will not be repeated here. When the pressing force is continuously applied to the pressing shaft 6000, the inclined surface 60010 of the pressing rod contacts the inclined surface 60020 of the locking member and applies an inclined surface force to the inclined surface of the locking member. The inclined surface force can be decomposed into a vertical movement force and a horizontal rotation force. The vertical movement force causes the probe locking member to move vertically downward, and the horizontal rotation force causes the probe locking member 6002 to rotate. The vertical movement force causes the probe locking member to move vertically downward to the lowest point. When the locking member groove 60021 rotates to the housing boss 60070, the probe The second compression spring 6005 is in a compressed state. At this time, after the pressing force of the pressing shaft is cancelled, the second compression spring of the probe is reset to apply an upward rebound force to the probe locking member 6002, so that the locking member groove 60021 moves along the shell boss to reset to the initial point. At this time, the probe needle shaft 6006 will be in a retracted state. By repeatedly applying pressing force to the pressing shaft, the extension and retraction movement of the probe needle shaft can be realized. In combination with the aforementioned pressing component, external force can be applied in the same axial degree and in the same direction to perform telescopic movement.A plurality of groups of locking grooves 60021 may be provided on the side of the probe locking member 6002, and a locking slope surface 60020 may be provided between each group of locking grooves, so that each time the pressing shaft is pressed, one group of locking grooves may be rotated to another group of locking grooves to achieve resetting, and the angles of the locking slope surfaces may also be set to be unequally different to achieve positioning at different positions. At this time, the extension distances of the probe needle shafts are not exactly the same, so that measurement of machining surfaces at different distances can be achieved, and the application is more extensive.

[0121] The distance detection device and detection method of the third preferred embodiment of the present invention; Fig.35 As shown, the probe assembly 50 is connected to the laser 2, and the probe needle shaft 5006 can be extended and retracted by applying an external force in the same axial direction to the pressing shaft 5000.

[0122] Furthermore, if Fig.36 As shown, the probe assembly 50 includes a probe housing 5004 with an upper and lower opening and an internal movable channel, a probe needle shaft 5006 is arranged in the probe housing, a probe second compression spring 5003 is arranged outside the probe needle shaft, and the probe second compression spring is placed in the probe housing, a probe bottom plate 5005 is arranged at the lower opening of the probe housing, the probe bottom plate fixes the probe second compression spring in the probe housing, and a through hole is arranged in the middle of the probe bottom plate, and the probe needle shaft passes through the through hole to achieve extension and contraction movement. The upper end of the probe needle shaft 5006 is connected to a probe pressure rod 5001, and the upper end of the probe pressure rod is connected to a pressing shaft 5000, which passes through the through hole at the upper end of the probe housing and contacts with the pressing assembly to achieve pressing movement. When the pressing shaft is forced to move downward, it drives the probe pressure rod to move downward and pushes the probe needle shaft to move downward. A circular annular groove 5008 is provided in the middle of the probe pressure rod 5001, and a probe ball 5002 is provided in the circular annular groove. The probe ball can rotate freely in the circular annular groove. A ball sliding groove 5007 is provided inside the probe housing corresponding to the probe ball. When the pressing shaft is forced to move downward, the probe ball will slide in the ball sliding groove to achieve positioning. The probe ball 5002 can also be replaced by a fixed protrusion, which is fixedly connected to the probe pressure rod 5001 and moves synchronously. The fixed protrusion can also achieve positioning at different positions in the ball sliding groove 5007. However, at this time, the probe pressure rod and the fixed protrusion rotate while moving up and down in the housing, while in the form of a probe ball, only the probe pressure rod only needs to move up and down in the housing.

[0123] Furthermore, in the third embodiment, a circular annular groove is provided in the middle of the probe pressure rod 5001, and the probe needle shaft can also be connected to the sensing stopper and the sensing component to detect the extended state of the sensing probe needle shaft. At the same time, the upper end of the probe needle shaft should be connected through the probe first compression spring (not shown in the figure), so as to achieve the measurement of the surface position of the workpiece by compressing the probe first compression spring when the probe needle shaft is in the extended state as described in the first and second embodiments, and this part will not be described in detail in this embodiment.

[0124] Furthermore, if Figure 41-42 As shown, the ball sliding groove 5007 forms multiple groups of high points 50070 and transition points 50071 in the groove, and multiple groups of low points 50072 in the groove are set, and multiple groups of rising sections 50073 and descending sections 50074 in the groove are set in the ball sliding groove, and the ends of the rising section and the descending section are the transition point 50071 in the groove and the high point 50070 or the low point 50072 in the groove, respectively, and the high point and the low point in the groove will fall into the descending section in the groove and move to the transition point 50071 in the groove when falling in the vertical direction. The height of the high point 50070 in the groove is higher than the height of the low point 50072 in the groove, and is higher than the height of the transition point 50071 in the groove. The heights of the multiple groups of high points in the groove can be set to be different, and the heights of the multiple groups of low points in the groove can also be set to be different, so that the distances of the probe needle shaft extending are different at different high points and low points in the groove.

[0125] Furthermore, if Figure 37-42As shown, in the initial state, the probe needle shaft 5006 is in a retracted state, the pressing shaft 5000 is in a maximum extended state, and at this time the ball 5002 is placed at the high point 50070 in the groove. When the pressing shaft 5000 is forced to move vertically downward, it drives the probe pressing piece 5001 to move downward. At this time, the probe ball 5002 also moves downward in the vertical direction until it moves in the vertical direction and contacts the descending section 50074 in the groove. The probe ball will move along the descending section in the groove until the probe ball moves to the transition point 50071 in the groove and reaches the lowest point. At this time, the probe needle shaft 50 06 The extended distance is the maximum, and the second compression spring of the probe is in a contracted state. When the pressing force on the pressing shaft is cancelled, the second compression spring 5003 of the probe rebounds under pressure and provides a vertical upward rebound force to the probe pressure rod. The probe ball 5002 also moves vertically upward until it moves in the vertical direction to contact the rising section 50073 in the groove. The probe ball will move along the rising section in the groove until the probe ball moves to the low point 50072 in the groove. At this time, the probe needle shaft 5006 is in an extended state, and the distance of the machining surface can be measured by compressing the first compression spring of the probe through the probe needle shaft. When the pressing shaft 5000 is again subjected to a vertical downward pressing force to drive the probe pressing piece 5001 to move downward, the probe ball 5002 also moves downward in the vertical direction until it moves in the vertical direction to contact the descending section 50074 in the groove. The probe ball will move along the descending section in the groove until the probe ball moves to another transition point 50071 in the groove. At this time, the second compression spring of the probe is in a compressed state. After the pressing force of the pressing shaft 5000 is cancelled again, the second compression spring 5003 of the probe rebounds under pressure and provides a vertical upward rebound force to the probe pressure rod. The probe ball 5002 also moves vertically upward until it moves along the vertical direction to the rising section 50073 in the groove. After that, the probe ball will move along the rising section in the groove and reach another high point 50070 in the groove. The probe needle shaft is in a retracted state. In this way, the probe ball can be extended and retracted under the action of external force in the same direction and with the same axial degree through the circular motion trajectory of the probe ball in the groove wall of the ball sliding groove, and the pressing assembly is equipped.

[0126] The distance detection device and detection method of the fourth preferred embodiment of the present invention are different from the above three embodiments in that a magnet is set at the upper end of the probe needle shaft, and the magnetic force of the magnet is changed by energizing the magnet to realize the extension and contraction movement of the probe needle shaft under the external force of the same axial degree and the same direction. However, since this movement method easily causes the probe needle shaft to heat up, it needs to be stopped and cooled after a long period of detection work before detection again. Alternatively, the probe needle shaft is pressed after power is turned on to change the extension length, and then the probe needle shaft applies an upward force to the first compression spring of the probe to realize distance detection and return the probe needle shaft to the initial position under the rebound force of the first compression spring of the probe. At the same time, the second compression spring of the probe can also be set on the probe needle shaft. At this time, after power is turned on, a downward force is generated on the probe needle shaft, and the downward pressure can be set according to the size of the power-on current, or the circuit is gradually increased to continuously provide a downward force to the probe needle shaft, and at the same time, the second compression spring of the probe is compressed. After the power is canceled, the downward force of the probe needle shaft disappears, and the second compression spring of the probe rebounds to return the probe needle shaft to the initial position. The only difference from the first embodiment at this time is that downward pressure is applied to the probe needle shaft through electromagnetic induction, and the other steps are the same as those in the first embodiment and will not be repeated here.

[0127] It should be understood that the present invention is described by some embodiments, and those skilled in the art will appreciate that various changes or equivalent substitutions may be made to these features and embodiments without departing from the spirit and scope of the present invention. In addition, under the teachings of the present invention, these features and embodiments may be modified to adapt to specific circumstances and materials without departing from the spirit and scope of the present invention. Therefore, the present invention is not limited by the specific embodiments disclosed herein, and all embodiments falling within the scope of the claims of this application are within the scope of protection of the present invention.

Claims

1. A distance detection device, comprising a housing, a through hole is provided at the lower end of the housing, a pressing shaft and a detection member are provided in the housing, the pressing shaft can move along the length direction of the pressing shaft, a sliding block is connected to the lower end of the pressing shaft, the sliding block moves with the pressing shaft to push the detection member to move, the detection member can pass through the through hole at the lower end and move along the length direction of the detection member, characterized in that: The shell is also provided with preset positions, and external forces with the same axiality and direction are applied to the detection device to make the sliding block move to different preset positions in the shell to change the length of the detection member extending out of the shell.

2. The distance detection device according to claim 1, characterized in that: An elastic member is arranged in the shell, and the elastic member is deformed under the action of the sliding block. The sliding block moves to different preset positions in the shell under the external force of the same axis and direction applied to the detection device and the force of the elastic member to change the length of the detection member extending out of the shell.

3. The distance detection device according to claim 2, characterized in that: A preset groove is arranged in the shell, and a plurality of preset positions are formed in the preset groove. When the sliding block moves to different preset positions in the shell, the length of the detection member extending out of the shell is the same or different.

4. The distance detection device according to claim 3, characterized in that: The preset positions include multiple groups of high points, multiple groups of low points and multiple groups of intermediate points, and the high points, intermediate points and low points are arranged in sequence in the preset groove, an intermediate point is arranged between the low point and the high point, and the preset groove is arranged in a loop.

5. The distance detection device according to claim 3, characterized in that: The sliding block interacts with the positioning member, the positioning member is placed in a preset groove, and the position of the positioning member in the preset groove is changed when the sliding block moves, and the position of the sliding block is fixed when the positioning member is placed in a preset position of the preset groove.

6. The distance detection device according to claim 5, characterized in that: The positioning member is a probe hook connected to the housing at one end, and the other end of the probe hook is a movable end. The preset groove is placed on the sliding block, and the movable end of the hook moves in the preset groove of the sliding block to change the relative position of the detection member and the sliding block.

7. The distance detection device according to claim 5, characterized in that: The positioning member is a latching tooth arranged on the housing, and a preset groove is arranged on the sliding block corresponding to the latching tooth. When the latching tooth is placed at different positions in the preset groove, the position of the detection member is changed.

8. The distance detection device according to claim 6, characterized in that: The sliding block includes a probe pressure rod and a probe locking piece. The lower end of the probe pressure rod is provided with a pressure rod slope surface, and the upper end of the probe locking piece is provided with a locking piece slope surface corresponding to the pressure rod slope surface. The movement of the pressure rod slope surface generates a rotational force on the locking piece slope surface to move the sliding block and change the relative position of the locking tooth in the preset groove to change the position of the detection piece.

9. The distance detection device according to claim 5, characterized in that: The positioning member is a probe ball disposed on the sliding block, the preset groove is disposed inside the housing, and the probe ball moves in the preset groove to change the position of the detection member.

10. The distance detection device according to claim 1, characterized in that: The elastic member includes a first compression spring of the probe arranged between the sliding block and the detection member, or the first compression spring of the probe is embedded in the detection member, and a second compression spring of the probe is arranged between the sliding block and the shell. The sliding block reaches a preset position in the shell under the action of external force and / or the force of the second compression spring of the probe to change the length of the detection member extending out of the shell. The detection member detects the surface position of the object through the first compression spring of the probe to determine whether the surface is detected.

11. The distance detection device according to any one of claims 1 to 10, characterized in that: The detection member is connected to a probe sensing stop member, a stop member travel groove is provided on the side of the shell, the probe sensing stop member moves in the stop member travel groove, the detection device also includes a sensing component corresponding to the sensing stop member, the sensing stop member can trigger the sensing component when it moves to different positions, and the extension state of the detection member is detected by the sensing component.

12. The distance detection device according to claim 11, characterized in that: The sensing component includes a fixing part and a PCBA board arranged in the fixing part. A plurality of groups of signal components are arranged on the PCBA board along the movement direction of the detection part. The signal components include a signal transmitting end and a signal receiving end. The probe sensing stopper moves between the signal transmitting end and the signal receiving end. When a group of signal components cannot work normally, the probe sensing stopper is placed at the position where the group of signal components is located.

13. The distance detection device according to claim 1, characterized in that: The detection device also includes a pressing component, which can generate a force on the pressing shaft to make the pressing shaft move; Or the pressing component is an electromagnetic ring arranged on the sliding block, and the electromagnetic ring generates a force on the pressing shaft after being energized, and can provide different magnitudes of force on the pressing shaft according to the magnitude of the energized current.

14. The distance detection device according to claim 13, characterized in that: The pressing assembly includes a pressing rotating block and a pressing fixed block connected to the pressing rotating block via a first rotating shaft. The pressing rotating block rotates relative to the pressing fixed block. The pressing rotating block includes a force-bearing end and a probe contact end in contact with the pressing shaft. The force-bearing end is subjected to force to cause the pressing rotating block to rotate, driving the probe contact end to apply pressing force to the pressing shaft.

15. The distance detection device according to claim 14, characterized in that: The force-bearing end is connected with a bearing, the probe contact end is provided with an inclined surface, the inclined surface is in contact with the pressing shaft, and a rotating block is also provided on the pressing rotating block, the rotating block limits the pressing rotating block so that the pressing rotating block has the same initial pressing position.

16. A distance detection method, wherein an external force is applied to a detection device to move a sliding block to drive a detection member to move, characterized in that: By applying external force of the same axis and direction to the detection device, the sliding block moves to different preset positions to change the preset length of the detection member. The detection member moves at the preset position to change the extension length of the detection member to perform distance detection, and after detection, the extension length of the detection member returns to the preset length.

17. The distance detection method according to claim 16, characterized in that: By applying external force of the same axis and direction to the detection device, the sliding block moves to different preset positions. By applying external force of the same axis and direction on the detection device and the force of the elastic member, the sliding block moves to different preset positions to change the preset length of the detection member.

18. The distance detection method according to claim 16, characterized in that: The external force of the detection device is used to apply a force in the same direction along the length direction of the sliding block to reset the detection member, and the sliding block is repeatedly moved along the length direction to perform distance detection.

19. A processing device, comprising a processing head for processing a workpiece, characterized in that: The processing head is connected to a distance detection device as described in any one of claims 1 to 15, and the processing head is adjusted according to the height after the height of the processing workpiece surface is detected by the distance detection device to perform processing.

20. The processing equipment according to claim 19, characterized in that: The processing equipment also includes a motion device, which drives the processing head to move in three-dimensional directions, wherein a movable block is arranged on the Z-direction motion device, and the movable block moves with the processing head. A pressing component is arranged on the side of the processing head, and the pressing component moves with the processing head only in the X direction and the Y direction. When the processing head moves in the Z direction, the pressing component applies a force to the pressing shaft. A sensing component is arranged in the processing head, and the sensing component detects the state of the detection component.

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