Testing system and method for testing nvme hard disk power-on time
By designing a test system including PCIE state machine and clock circuit, it is possible to test the power-on time of the server hard disk without using professional instruments, solving the problem of high testing costs in the prior art and achieving the effect of reducing the testing costs.
Patent Information
- Application Number
- CN202411501821.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-25
- Publication Date
- 2025-02-28
- Estimated Expiration
- 2044-10-25
AI Technical Summary
In the prior art, the power-on time test of server hard disks requires the use of professional instruments, resulting in high testing costs.
A test system is designed, including a PCIE state machine, a logging module, a log analysis module and a power-on time analysis module. By continuously sending ICMP echo request data to the server host and waiting for a response, the hard disk power-on time is obtained in combination with the clock circuit.
The hard disk power-on time can be tested without using professional instruments, reducing the cost of server hard disk testing.
Smart Images

Figure CN119537114A_ABST
Abstract
Description
Technical Field
[0001] The invention belongs to the technical field of server hard disk testing, and in particular relates to a testing system and method for testing the power-on time of an NVME hard disk. Background Art
[0002] The server's hard disk is one of the important components of the server. Therefore, the server hard disk is tested to obtain the physical state, performance, and data reading and writing capabilities of the server hard disk. The physical state includes the hard disk's circuit board, electronic components, disk surface, etc., to ensure that there is no obvious damage, cracks, or scratches. These checks are to ensure that the hard disk has no physical damage, because even minor damage may affect the normal operation and life of the hard disk. Performance tests include data reading and writing speed, seek time, etc. There are also hard disk compatibility and stability tests to ensure the compatibility of the hard disk with the server system and its stability under long-term operation. This includes multiple power on and off tests, long-term read and write tests, etc., to verify whether the hard disk can operate stably under various working conditions.
[0003] The server hard disk test also includes an important aspect, which is the test of the power-on time of the hard disk. However, the test of the power-on time of the server hard disk in the prior art requires the use of professional instruments, and professional instruments are expensive, making the hard disk test costly.
[0004] Therefore, how to improve the existing power-on time detection method in server hard disk testing so as to test the hard disk power-on time without using professional instruments, thereby reducing the server hard disk testing cost, is a technical problem that urgently needs to be solved. Summary of the invention
[0005] The purpose of the present invention is to provide a test system and method for testing the power-on time of an NVMe hard disk, so as to improve the power-on time detection method in the existing server hard disk test, so as to test the hard disk power-on time without using professional instruments, thereby reducing the server hard disk test cost.
[0006] In order to solve the above technical problems, the technical solution adopted by the present invention is as follows:
[0007] A test system for testing the power-on time of an NVMe hard disk, comprising a PCIE state machine, a log recording module, a log analysis module and a power-on time analysis module, wherein the PCIE state machine is provided with a command sending module, the command sending module is connected to the log recording module, and the log recording module is connected to the log analysis module;
[0008] It also includes a clock circuit module, wherein the clock circuit is electrically connected to the PCIE state machine;
[0009] The PCIE state machine is used to indicate the state of the PCIE device interface and convert data;
[0010] The command sending module is used to continuously send ICMP echo request data to the server host and continuously wait for the host to return an ICMP echo reply;
[0011] The log recording module is used to record all logs in the PCIE state machine;
[0012] The log analysis module is used to analyze all logs generated by the PCIE state machine and determine the working status of the communication link of the PCIE state machine;
[0013] The clock circuit is used to generate and provide an accurate and stable clock signal;
[0014] The power-on time analysis module is used to obtain the corresponding log record of the hard disk power-on time point based on the log analysis result, and obtain the corresponding hard disk power-on time based on the log record acquisition log and clock circuit.
[0015] Preferably, the clock circuit module includes a first chip, a second chip, an inductor, a first capacitor, a second capacitor, a third capacitor, a fourth capacitor and a crystal oscillator.
[0016] One end of the inductor is connected to the power output end, and the other end is connected to the first capacitor; the VCC port of the first chip is connected to the first capacitor and the second capacitor respectively, the first capacitor and the second capacitor are connected in parallel and grounded after being connected in parallel, and the first capacitor and the second capacitor are both connected to the SCLK port of the second chip. The X port of the second chip is connected to the third capacitor, and the other end of the third capacitor is grounded; the RFOUT port of the second chip is connected to the fourth capacitor;
[0017] The OUT port of the first chip is connected to the RFIN port of the second chip, the GND port of the second chip is grounded, and the GND port of the first port is grounded. The voltage output by the power output terminal is 3.3V;
[0018] One end of the crystal oscillator is respectively connected to the X port of the second chip and the third capacitor, and the other end is respectively connected to the RFINOUT port of the second chip and the fourth capacitor.
[0019] Preferably, the voltage output by the power output terminal is 3.3V.
[0020] Preferably, the command sending module includes a command routing and scheduling module, a Windows PowerShell module, and an Ansible module;
[0021] The command routing and scheduling module is used to build a command routing and scheduling mechanism based on the Windows message processing mechanism, process various user interface events through command IDs, and associate the command IDs with corresponding processing functions through message mapping;
[0022] The Windows PowerShell module is used to provide a command line shell and script environment, and manage the system by writing scripts or directly entering commands in the command line, including file operations, service management, and system status checks;
[0023] The Ansible module is used to execute remote management tasks, remote commands, manage users and groups, and scheduled tasks.
[0024] Preferably, the log analysis module includes a log file acquisition module, a log text parsing and keyword grabbing module, and the log file acquisition module is connected to the log text parsing and keyword grabbing module;
[0025] The log file acquisition module acquires log files from the specified server and path. The log files come from the program execution or batch script execution of the project, have a centralized storage path and a unified log name format, and are acquired from the specified path of the specified server after the program or script is executed by configuring the address of the test environment server and the execution log storage path, and are taken locally and passed into the tool for processing;
[0026] The log text parsing and keyword grabbing module parses the execution result log. The log file is usually large and complex and needs to be parsed to obtain useful information. The log text parsing and keyword grabbing module extracts the text content according to the encoding format of the log text, extracts the information into log information strings one by one, grabs text keywords as feature terms according to the set feature value labels, and represents each information string in vector form according to the dimensions that make up the feature vector, and then extracts the log information in which the ICMP echo request data is sent and the log in which the host returns the ICMP echo reply.
[0027] Preferably, the power-on time analysis module obtains a log of the PCIE state machine being in the L0 state based on the extracted log of sending ICMP echo request data and the host returning an ICMP echo reply, and then obtains a log record of the hard disk power-on time point, and obtains the corresponding hard disk power-on time based on the log record and the clock circuit.
[0028] In a second aspect, a test method for testing the power-on time of an NVMe hard disk is provided, which is implemented based on a test system for testing the power-on time of an NVMe hard disk as described in any one of the preceding claims, and includes the following steps:
[0029] S1: Start the server, and continuously send ICMP echo request data to the server host through the command sending module in the PCIE state machine, and continuously wait for the host to return the ICMP echo reply;
[0030] S2: After the server is started, the log recording module records all the logs of the server and transmits them to the log analysis module;
[0031] S3: The log analysis module parses the acquired log information and extracts the logs of sending ICMP echo request data and returning ICMP echo reply data from the log information;
[0032] S4: The power-on time analysis module obtains the log of the PCIE state machine being in the L0 state based on the extracted ICMP echo request data and the log of the ICMP echo reply returned by the host, obtains the log record of the hard disk power-on time point, and obtains the corresponding hard disk power-on time based on the log record and the clock circuit;
[0033] S5: Output the hard disk power-on time.
[0034] Preferably, the specific process in step S3 is:
[0035] S31: The log file acquisition module acquires the log file from the specified server and path. By configuring the address of the test environment server and the execution log storage path, when the program or script is executed, the log file is acquired from the specified path of the specified server, and is taken locally and passed to the tool for processing;
[0036] S32: Log text parsing and keyword capture module parses the execution result log, extracts the text content according to the encoding format of the log text, extracts the information into log information strings one by one, captures text keywords as feature terms according to the set feature value labels, and represents each information string in vector form according to the dimensions that make up the feature vector, and then extracts the log information in which the ICMP echo request data is sent and the log of the ICMP echo reply returned by the host.
[0037] The beneficial effects of the present invention include:
[0038] The present invention provides a test system and method for testing the power-on time of an NVME hard disk, comprising a PCIE state machine, a log recording module, a log analysis module and a power-on time analysis module, wherein a command sending module is provided in the PCIE state machine, the command sending module is connected to the log recording module, and the log recording module is connected to the log analysis module; the PCIE state machine also comprises a clock circuit module, and the clock circuit is electrically connected to the PCIE state machine; the PCIE state machine is used to indicate the state of a PCIE device interface and convert data; the command sending module is used to continuously send ICMP echo request data to a server host, and continuously wait for the host to return an ICMP echo response; the log recording module is used to record all logs in the PCIE state machine; the log analysis module is used to analyze all logs generated by the PCIE state machine, and judge the working state of a communication link of the PCIE state machine; the clock circuit is used to generate and provide an accurate and stable clock signal; the power-on time analysis module is used to obtain the corresponding log record of the hard disk power-on time point based on the log analysis result, and obtain the log based on the log record and the clock circuit to obtain the corresponding hard disk power-on time.
[0039] First, by setting up a PCIE state machine including a command sending module, ICMP echo request data is continuously sent to the server host when the server starts, and the host is continuously waiting for the ICMP echo reply to be returned. The log recording module is combined to record all logs, and then the log is parsed through the log analysis module, and the log information in which the ICMP echo request data is sent and the log of the ICMP echo reply returned by the host is extracted, and then the log of the L0 state of the PCIE state machine is obtained. The whole process is simple and fast.
[0040] Secondly, after obtaining the log of the PCIE state machine L0 state, the clock circuit generates and provides an accurate and stable clock signal, and the corresponding time of the log of the PCIE state machine L0 state is obtained, which is the power-on time of the nvme hard disk. Therefore, the present invention measures the power-on time of the nvme hard disk by setting a PCIE state machine including a command sending module and combining it with the clock circuit, avoiding the power-on time of the nvme hard disk tested by professional instruments, and reducing the server nvme hard disk test cost. BRIEF DESCRIPTION OF THE DRAWINGS
[0041] Figure 1 The present invention is a flow chart of a method for testing the power-on time of an NVMe hard disk.
[0042] Figure 2 The present invention is a schematic diagram of the composition structure of the test system for testing the power-on time of the NVMe hard disk.
[0043] Figure 3 The figure is a schematic diagram of the circuit structure of the clock circuit module of the present invention.
[0044] Figure symbols: L is an inductor, C1 is a first capacitor, C2 is a second capacitor, C3 is a third capacitor, C4 is a fourth capacitor, U1 is a first chip, U2 is a second chip, and G is a crystal oscillator. DETAILED DESCRIPTION
[0045] The following is combined with Figure 1 to Figure 3 The present invention is further described in detail:
[0046] Example 1
[0047] See attached Figure 1 As shown, a test system for testing the power-on time of an NVMe hard disk includes a PCIE state machine, a log recording module, a log analysis module, a clock circuit module and a power-on time analysis module, wherein a command sending module is provided in the PCIE state machine, the command sending module is connected to the log recording module, and the log recording module is connected to the log analysis module. The clock circuit is electrically connected to the PCIE state machine; the PCIE state machine is used to indicate the state of the PCIE device interface and the conversion data; the command sending module is used to continuously send ICMP echo request data to the server host, and continuously wait for the host to return the ICMP echo reply; the log recording module is used to record all logs in the PCIE state machine; the log analysis module is used to analyze all logs generated by the PCIE state machine and determine the working state of the communication link of the PCIE state machine; the clock circuit is used to generate and provide an accurate and stable clock signal; the power-on time analysis module is used to obtain the corresponding log record of the hard disk power-on time point based on the log analysis result, and obtain the log and the clock circuit based on the log record to obtain the corresponding hard disk power-on time.
[0048] By setting a PCIE state machine including a command sending module, ICMP echo request data is continuously sent to the server host at the start of the server, and the host is continuously waiting for the ICMP echo reply to be returned, and all logs are recorded in combination with the log recording module, and then the log is parsed by the log analysis module, and the log information is extracted from which the ICMP echo request data is sent and the log of the ICMP echo reply returned by the host is obtained, and then the log of the PCIE state machine L0 state is obtained, and the whole process is simple and fast. After obtaining the log of the PCIE state machine L0 state, the clock circuit is combined to generate and provide an accurate and stable clock signal, and the corresponding time of the log of the PCIE state machine L0 state is obtained, which is the power-on time of the nvme hard disk. Therefore, the present invention measures the power-on time of the nvme hard disk by setting a PCIE state machine including a command sending module and combining the clock circuit to avoid testing the power-on time of the nvme hard disk by professional instruments, thereby reducing the server nvme hard disk test cost.
[0049] Example 2
[0050] On the basis of Example 1, the clock circuit module includes a first chip U1, a second chip U2, an inductor L, a first capacitor C1, a second capacitor C2, a third capacitor C3, a fourth capacitor C4 and a crystal oscillator G. One end of the inductor L is connected to the power output end, and the other end is connected to the first capacitor C1; the VCC port of the first chip U1 is connected to the first capacitor C1 and the second capacitor C2 respectively, the first capacitor C1 and the second capacitor C2 are connected in parallel, and grounded after parallel connection, and the first capacitor C1 and the second capacitor C2 are both connected to the SCLK port of the second chip U2. The X port of the second chip U2 is connected to the third capacitor C3, and the other end of the third capacitor C3 is grounded; the RFOUT port of the second chip U2 is connected to the fourth capacitor C4; the OUT port of the first chip U1 is connected to the RFIN port of the second chip U2, the GND port of the second chip U2 is grounded, and the GND port of the first port is grounded. The voltage output by the power output end is 3.3V. One end of the crystal oscillator G is respectively connected to the X port of the second chip U2 and the third capacitor C3, and the other end is respectively connected to the RFINOUT port of the second chip U2 and the fourth capacitor C4.
[0051] When the circuit is working, it generates an oscillation signal with a stable frequency through the crystal resonance effect of the crystal oscillator G, and then provides an accurate and stable clock signal based on the oscillation signal with a stable frequency, thereby providing an accurate time reference for the system.
[0052] The command sending module includes a command routing and scheduling module, a Windows PowerShell module, and an Ansible module. The command routing and scheduling module is used to build a command routing and scheduling mechanism based on the Windows message processing mechanism, process various user interface events through command IDs, and associate command IDs with corresponding processing functions through message mapping. The Windows PowerShell module is used to provide a command line shell and scripting environment, and manage the system by writing scripts or directly entering commands in the command line, including file operations, service management, and system status checks. The Ansible module is used to execute remote management tasks, remote commands, manage users and groups, and scheduled tasks.
[0053] Example 3
[0054] On the basis of Example 1 or Example 2, the log analysis module includes a log file acquisition module, a log text parsing and keyword grabbing module, and the log file acquisition module is connected to the log text parsing and keyword grabbing module. The log file acquisition module acquires the log file from the specified server and path, and the log file comes from the program execution or batch script execution of the project, and has a centralized storage path and a unified log name format. By configuring the address of the test environment server and the execution log storage path, when the program or script is executed, the log file is acquired under the specified path of the specified server, and it is taken locally and imported into the tool for processing. The log text parsing and keyword grabbing module parses the execution result log. The log file is usually large and complex, and it needs to be parsed to obtain useful information. The log text parsing and keyword grabbing module extracts the text content according to the encoding format of the log text, extracts the information into log information strings one by one, and according to the set feature value label, grabs the text keywords as feature entries, and according to the dimensions that constitute the feature vector, each information string is represented in a vector form, and then extracts the log information from which the ICMP echo request data is sent and the host returns the ICMP echo reply log.
[0055] In this embodiment, the power-on time analysis module obtains a log of the PCIE state machine being in the L0 state based on the extracted log of sending ICMP echo request data and the ICMP echo reply returned by the host, and then obtains the log record of the hard disk power-on time point, and obtains the precise time reference provided by the log and clock circuit based on the log record, and then obtains the precise power-on time of the corresponding hard disk.
[0056] A method for testing the power-on time of an NVMe hard disk is implemented based on a test system for testing the power-on time of an NVMe hard disk as described in any one of the preceding claims, and comprises the following steps:
[0057] S1: Start the server, and continuously send ICMP echo request data to the server host through the command sending module in the PCIE state machine, and continue to wait for the host to return the ICMP echo reply. Since the power-on time point of the nvme hard disk can be judged by the L0 state of the PCIE state machine, that is, when the PCIE state machine is in the L0 state, it can be determined that the nvme hard disk is powered on successfully. The PCIE state machine is in the L0 state, which means that the communication link of the PCIE state machine is in a normal working state. Therefore, the command sending module in the PCIE state machine continuously sends ICMP echo request data to the server host, waiting for the host to return the ICMP echo reply. When the command sending module in the PCIE state machine can normally send ICMP echo request data to the server host, and the host returns the ICMP echo reply, it means that the communication link of the PCIE state machine is in a normal working state, that is, the nvme hard disk is powered on successfully, and the time point at this time is the nvme hard disk power-on time.
[0058] S2: After the server is started, the log recording module records all logs of the server and transmits them to the log analysis module. The log recording module records all logs of the server in order to obtain the log of the command sending module sending ICMP echo request data to the server host and the log of the host returning ICMP echo reply, so that the subsequent log analysis module can parse the obtained log information and extract the log of sending ICMP echo request data and returning ICMP echo reply from the log information.
[0059] S3: The log analysis module parses the acquired log information and extracts the logs of sending ICMP echo request data and returning ICMP echo reply from the log information. By extracting the logs of sending ICMP echo request data and returning ICMP echo reply from the log information, it is convenient to obtain the time of the corresponding logs of sending ICMP echo request data and returning ICMP echo reply from the clock circuit module.
[0060] S4: The power-on time analysis module obtains the log of the PCIE state machine being in the L0 state based on the extracted ICMP echo request data and the log of the ICMP echo reply returned by the host, obtains the log record of the hard disk power-on time point, and obtains the corresponding hard disk power-on time based on the log record by obtaining the log and clock circuit module.
[0061] S5: Output the hard disk power-on time.
[0062] The specific process in step S3 is:
[0063] S31: The log file acquisition module acquires the log file from the specified server and path. By configuring the address of the test environment server and the execution log storage path, when the program or script is executed, the log file is acquired from the specified path of the specified server, and is taken locally and passed to the tool for processing;
[0064] S32: Log text parsing and keyword capture module parses the execution result log, extracts the text content according to the encoding format of the log text, extracts the information into log information strings one by one, captures text keywords as feature terms according to the set feature value labels, and represents each information string in vector form according to the dimensions that make up the feature vector, and then extracts the log information in which the ICMP echo request data is sent and the log of the ICMP echo reply returned by the host.
[0065] In summary, the test system and method for testing the power-on time of an NVME hard disk provided by the present invention include a PCIE state machine, a log recording module, a log analysis module and a power-on time analysis module, wherein a command sending module is provided in the PCIE state machine, the command sending module is connected to the log recording module, and the log recording module is connected to the log analysis module; further comprising a clock circuit module, the clock circuit being electrically connected to the PCIE state machine; the PCIE state machine is used to indicate the state of the PCIE device interface and convert data; the command sending module is used to continuously send ICMP echo request data to the server host, and continuously wait for the host to return an ICMP echo reply; the log recording module is used to record all logs in the PCIE state machine; the log analysis module is used to analyze all logs generated by the PCIE state machine, and determine the working state of the communication link of the PCIE state machine; the clock circuit is used to generate and provide an accurate and stable clock signal; the power-on time analysis module is used to obtain the corresponding log record of the hard disk power-on time point based on the log analysis result, and obtain the log and the clock circuit based on the log record to obtain the corresponding hard disk power-on time.
[0066] By setting up a PCIE state machine including a command sending module, ICMP echo request data is continuously sent to the server host when the server starts, and the host is continuously waiting for the ICMP echo reply to be returned. In addition, all logs are recorded in combination with the log recording module, and then the log is parsed by the log analysis module, and the log information in which the ICMP echo request data is sent and the log of the ICMP echo reply returned by the host is extracted, thereby obtaining the log of the L0 state of the PCIE state machine. The whole process is simple and fast.
[0067] After obtaining the log of the PCIE state machine L0 state, the clock circuit generates and provides an accurate and stable clock signal, and the corresponding time of the log of the PCIE state machine L0 state is obtained, which is the power-on time of the nvme hard disk. Therefore, the present invention measures the power-on time of the nvme hard disk by setting a PCIE state machine including a command sending module and combining it with the clock circuit, avoiding the need to test the power-on time of the nvme hard disk through professional instruments, thereby reducing the server nvme hard disk test cost.
Claims
1. A test system for testing the power-on time of an nvme hard disk, characterized in that: It includes a PCIE state machine, a log recording module, a log analysis module and a power-on time analysis module, wherein the PCIE state machine is provided with a command sending module, the command sending module is connected to the log recording module, and the log recording module is connected to the log analysis module; It also includes a clock circuit module, wherein the clock circuit is electrically connected to the PCIE state machine; The PCIE state machine is used to indicate the state of the PCIE device interface and convert data; The command sending module is used to continuously send ICMP echo request data to the server host and continuously wait for the host to return an ICMP echo reply; The log recording module is used to record all logs in the PCIE state machine; The log analysis module is used to analyze all logs generated by the PCIE state machine and determine the working status of the communication link of the PCIE state machine; The clock circuit is used to generate and provide an accurate and stable clock signal; The power-on time analysis module is used to obtain the corresponding log record of the hard disk power-on time point based on the log analysis result, and obtain the corresponding hard disk power-on time based on the log record acquisition log and clock circuit.
2. A test system for testing the power-on time of an nvme hard disk according to claim 1, characterized in that: The clock circuit module includes a first chip, a second chip, an inductor, a first capacitor, a second capacitor, a third capacitor, a fourth capacitor and a crystal oscillator. One end of the inductor is connected to the power output end, and the other end is connected to the first capacitor; the VCC port of the first chip is connected to the first capacitor and the second capacitor respectively, the first capacitor and the second capacitor are connected in parallel and grounded after being connected in parallel, and the first capacitor and the second capacitor are both connected to the SCLK port of the second chip. The X port of the second chip is connected to the third capacitor, and the other end of the third capacitor is grounded; the RFOUT port of the second chip is connected to the fourth capacitor; The OUT port of the first chip is connected to the RFIN port of the second chip, the GND port of the second chip is grounded, and the GND port of the first port is grounded. The voltage output by the power output terminal is 3.3V; One end of the crystal oscillator is respectively connected to the X port of the second chip and the third capacitor, and the other end is respectively connected to the RFINOUT port of the second chip and the fourth capacitor.
3. A test system for testing the power-on time of an nvme hard disk according to claim 2, characterized in that: The voltage outputted by the power output terminal is 3.3V.
4. A test system for testing the power-on time of an nvme hard disk according to claim 1, characterized in that: The command sending module includes a command routing and scheduling module, a Windows PowerShell module, and an Ansible module; The command routing and scheduling module is used to build a command routing and scheduling mechanism based on the Windows message processing mechanism, process various user interface events through command IDs, and associate the command IDs with corresponding processing functions through message mapping; The Windows PowerShell module is used to provide a command line shell and script environment, and manage the system by writing scripts or directly entering commands in the command line, including file operations, service management, and system status checks; The Ansible module is used to execute remote management tasks, remote commands, manage users and groups, and scheduled tasks.
5. A test system for testing the power-on time of an nvme hard disk according to claim 1, characterized in that: The log analysis module includes a log file acquisition module, a log text parsing and keyword grabbing module, and the log file acquisition module is connected to the log text parsing and keyword grabbing module; The log file acquisition module acquires log files from the specified server and path. The log files come from the program execution or batch script execution of the project, have a centralized storage path and a unified log name format, and are configured with the address of the test environment server and the execution log storage path. After the program or script is executed, the log files are acquired in the specified path of the specified server, and are taken locally and passed into the tool for processing; The log text parsing and keyword grabbing module parses the execution result log. The log file is usually large and complex and needs to be parsed to obtain useful information. The log text parsing and keyword grabbing module extracts the text content according to the encoding format of the log text, extracts the information into log information strings one by one, grabs text keywords as feature terms according to the set feature value labels, and represents each information string in vector form according to the dimensions that make up the feature vector, and then extracts the log information in which the ICMP echo request data is sent and the log in which the host returns the ICMP echo reply.
6. A test system for testing the power-on time of an nvme hard disk according to claim 5, characterized in that: The power-on time analysis module obtains a log of the PCIE state machine being in the L0 state based on the extracted log of sending ICMP echo request data and the ICMP echo reply returned by the host, and then obtains a log record of the hard disk power-on time point, and obtains the corresponding hard disk power-on time based on the log record acquisition log and clock circuit.
7. A method for testing the power-on time of an nvme hard disk, implemented based on a test system for testing the power-on time of an nvme hard disk according to any one of claims 1 to 6, characterized in that: The following steps are involved: S1: Start the server, and continuously send ICMP echo request data to the server host through the command sending module in the PCIE state machine, and continuously wait for the host to return the ICMP echo reply; S2: After the server is started, the log recording module records all the logs of the server and transmits them to the log analysis module; S3: The log analysis module parses the acquired log information and extracts the logs of sending ICMP echo request data and returning ICMP echo reply data from the log information; S4: The power-on time analysis module obtains the log of the PCIE state machine being in the L0 state based on the extracted ICMP echo request data and the log of the ICMP echo reply returned by the host, obtains the log record of the hard disk power-on time point, and obtains the corresponding hard disk power-on time based on the log record and the clock circuit; S5: Output the hard disk power-on time.
8. A method for testing the power-on time of an nvme hard disk according to claim 7, characterized in that: The specific process in step S3 is: S31: The log file acquisition module acquires the log file from the specified server and path. By configuring the address of the test environment server and the execution log storage path, when the program or script is executed, the log file is acquired from the specified path of the specified server, and is taken locally and passed to the tool for processing; S32: Log text parsing and keyword capture module parses the execution result log, extracts the text content according to the encoding format of the log text, extracts the information into log information strings one by one, captures text keywords as feature terms according to the set feature value labels, and represents each information string in vector form according to the dimensions that make up the feature vector, and then extracts the log information in which the ICMP echo request data is sent and the log of the ICMP echo reply returned by the host.
Citation Information
Patent Citations
Method and system for shortening power-on time for solid state drive serving as system disk
CN107656875A
Hard disk SMART log analysis method and device, computer equipment and storage medium
CN112380043A
Solid state disk data recording method, device and equipment and medium
CN115617556A
Memory device and operating method thereof
CN115729734A
Storage device and operating method thereof
US20230069623A1