Broadband impedance scanning method and device

Abstract

The invention provides a broadband impedance scanning method and device, the device comprises an input device, a display device and a scanning case, the scanning case comprises an embedded computer and an FPGA control card, and the embedded computer comprises a scanning control unit, a circuit modeling unit and an impedance analysis unit. The FPGA control card comprises a scanning signal generator unit, a digital circuit model unit, a wave recording unit and a digital simulation IO unit, the scanning signal generator unit is connected with the scanning control unit, the digital circuit model unit and the wave recording unit, and the digital circuit model unit is further connected with the circuit model unit and the digital simulation IO unit. The wave recording unit is further connected with the impedance analysis unit and the digital simulation IO unit, and the digital simulation IO unit is further connected to the controller to be tested. The impedance scanning device is convenient to carry and transport, the complexity of wiring in the process of building an experiment environment is reduced, and the experiment efficiency is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of power system analysis, and in particular to a broadband impedance scanning method and device. Background Art

[0002] With the access of power electronic devices such as doubly-fed wind turbines, direct-drive wind turbines, photovoltaic power generation equipment, and DC transmission systems to the power grid, the oscillation characteristics of the power system in the subsynchronous frequency and supersynchronous frequency range are complex and changeable. By obtaining the impedance characteristics of power equipment in the subsynchronous frequency and supersynchronous frequency range, we can effectively understand the impact of power equipment access on the subsynchronous frequency and supersynchronous frequency damping characteristics of the power grid.

[0003] At present, the characteristic impedance of power equipment in the subsynchronous frequency and supersynchronous frequency range is tested by using an impedance scanning signal generator and a real-time simulation device. When testing the controller of the power equipment under test, the wiring between the scanning signal generator, the real-time simulation device and the power equipment controller is complicated, and the debugging time for setting up the experimental environment is very long. In addition, due to the large number of test equipment, it is not convenient to move to the site for testing. Summary of the invention

[0004] In view of this, the present invention provides a broadband impedance scanning method and device to solve at least one of the above-mentioned problems.

[0005] In order to achieve the above object, the present invention adopts the following scheme:

[0006] According to a first aspect of the present invention, an embodiment of the present invention provides a broadband impedance scanning device, the device comprising: an input device, a display device and a scanning chassis, the input device and the display device are respectively communicatively connected to the scanning chassis, the scanning chassis comprises an embedded computer and an FPGA control card, the embedded computer comprises a scanning control unit, a circuit modeling unit and an impedance analysis unit, the FPGA control card comprises a scanning signal generator unit, a digitized circuit model unit, a recording unit and a digital analog IO unit, the scanning signal generator unit is respectively communicatively connected to the scanning control unit, the digitized circuit model unit and the recording unit, the digitized circuit model unit is also respectively communicatively connected to the circuit modeling unit and the digital analog IO unit, the recording unit is also respectively communicatively connected to the impedance analysis unit and the digital analog IO unit, and the digital analog IO unit is also communicatively connected to the controller to be tested.

[0007] As an embodiment of the present invention, the circuit modeling unit in the above-mentioned device is used to establish a main circuit model and a power grid model corresponding to the controller to be tested, and download the main circuit model and the power grid model to the digital circuit model unit.

[0008] As an embodiment of the present invention, the scanning control unit in the above-mentioned device is used to control the scanning signal generator unit to output scanning signals with different frequencies and phases, and the scanning signals are applied to the main circuit model and power grid model in the digital circuit model unit as disturbance signals.

[0009] As an embodiment of the present invention, the digital circuit model unit in the above device is used to output the solution results of the main circuit model and the power grid model to which the disturbance signal is applied to the controller to be tested through the digital analog IO unit.

[0010] As an embodiment of the present invention, the digital analog IO unit in the above-mentioned device is also used to perform analog-to-digital conversion on the control signal returned by the controller to be tested, and send the digital control signal after analog-to-digital conversion to the digital circuit model unit for real-time calculation to determine the next state.

[0011] As an embodiment of the present invention, the recording unit in the above-mentioned device is used to continuously record the input and output signals on the scanning signal generator unit and the digital analog IO unit in real time, and package the input and output signals to the impedance analysis unit for impedance analysis to calculate the impedance of the controller to be tested under different test conditions.

[0012] According to the second aspect of the present invention, an embodiment of the present invention further provides a wideband impedance scanning method, in which the wideband impedance scanning is completed by the wideband impedance scanning device as described above, and the method comprises: a circuit modeling unit establishes a main circuit model and a power grid model corresponding to the controller to be tested, and downloads the main circuit model and the power grid model to a digital circuit model unit; a scanning control unit controls a scanning signal generator unit to output scanning signals of different frequencies and phases, and the scanning signals are applied to the main circuit model and the power grid model in the digital circuit model unit as disturbance signals; the digital circuit model unit outputs the solution results of the main circuit model and the power grid model to which the disturbance signals are applied to the controller to be tested through a digital analog IO unit; the controller to be tested gives a feedback control signal according to the solution result sent by the digital analog IO unit, and sends the feedback control signal to the digital circuit model unit through the digital analog IO unit, and the digital circuit model unit performs real-time solution to determine the next state; a recording unit continuously records the input and output signals on the scanning signal generator unit and the digital analog IO unit in real time; an impedance analysis unit performs impedance analysis according to the input and output signals recorded by the recording unit to calculate the impedance of the controller to be tested under different test conditions.

[0013] As an embodiment of the present invention, in the above method, the scanning control unit controls the scanning signal generator unit to output scanning signals of different frequencies and phases, and the scanning signals are applied to the main circuit model and the power grid model in the digital circuit model unit as disturbance signals, including: the scanning control unit sends a preset frequency and amplitude sequence to the scanning signal generator unit; after the scanning signal generator unit receives the frequency and amplitude sequence, it generates three-phase voltage and current signals with a phase difference of 120 degrees through a built-in multiple groups of sinusoidal signal generators; the scanning signal generator unit injects the generated three-phase voltage and current signals into the main circuit model and the power grid model in the digital circuit model unit.

[0014] As an embodiment of the present invention, in the above method, the impedance analysis unit performs impedance analysis according to the input and output signals recorded by the recording unit to calculate the impedance of the controller to be tested under different test conditions, including:

[0015] The impedance analysis unit obtains the impedance of the controller under test at different frequencies by comparing and analyzing the three-phase voltage and current signals injected by the scanning signal generator unit recorded by the recording unit and the grid voltage and grid-side current signals of the digital analog IO unit port.

[0016] According to the third aspect of the present invention, an embodiment of the present invention further provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the above method when executing the computer program.

[0017] According to a fourth aspect of the present invention, an embodiment of the present invention further provides a computer-readable storage medium having a computer program stored thereon, wherein the computer program implements the steps of the above method when executed by a processor.

[0018] According to a fifth aspect of the present invention, an embodiment of the present invention further provides a computer program product, comprising a computer program / instructions, which implement the steps of the above method when executed by a processor.

[0019] The broadband impedance scanning method and device proposed in the present invention can realize the test of the controller to be tested by only using an embedded computer and an FPGA control card in a scanning chassis. It is an impedance scanning device that is easy to carry and transport. Moreover, in this embodiment, the digital current model, the wave recording module, and the scanning signal generator are all implemented in the same FPGA control card, which reduces the complexity of wiring in the process of setting up the experimental environment and improves the experimental efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the prior art descriptions. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work. In the drawings:

[0021] Figure 1 It is a structural schematic diagram of a broadband impedance scanning device provided in an embodiment of the present application;

[0022] Figure 2 A schematic diagram of a flow chart of a broadband impedance scanning method provided in an embodiment of the present application;

[0023] Figure 3 is a schematic diagram of a process of adding a scanning signal provided in an embodiment of the present application;

[0024] Figure 4 It is a structural schematic diagram of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0025] To make the purpose, technical solution and advantages of the embodiments of the present invention more clear, the embodiments of the present invention are further described in detail below in conjunction with the accompanying drawings. Here, the exemplary embodiments of the present invention and their descriptions are used to explain the present invention, but are not intended to limit the present invention.

[0026] like Figure 1 The figure shows a schematic diagram of the structure of a broadband impedance scanning device provided in an embodiment of the present application, wherein the device comprises: an input device 100, a display device 200 and a scanning chassis 300, wherein the input device 100 and the display device 200 are respectively connected to the scanning chassis 300 for communication, wherein the scanning chassis 300 comprises an embedded computer 310 and an FPGA control card 320, and the embedded computer 310 comprises a scanning control unit 311, a circuit modeling unit 312 and an impedance analysis unit 313, and the FPGA control card 320 comprises a scanning signal generator unit 321, a digital circuit model unit 322, a wave recording unit 323 and a digital analog IO unit 324. The connection relationship between the above-mentioned units is as follows: the scanning signal generator unit 321 is respectively communicated with the scanning control unit 311, the digital circuit model unit 322 and the recording unit 323, the digital circuit model unit 322 is also respectively communicated with the circuit modeling unit 312 and the digital analog IO unit 324, the recording unit 323 is also respectively communicated with the impedance analysis unit 313 and the digital analog IO unit 324, and the digital analog IO unit 324 is also communicated with the controller to be tested 400.

[0027] In this embodiment, the input device 100 is a device for information input, including but not limited to a keyboard, a touch tablet, a voice input device, etc. The display device 200 can be a common display. The input device 100 and the display device 200 are connected to the scanning chassis 300 for communication, specifically, they are connected to the embedded computer 310 in the scanning chassis 300 through a USB bus, thereby realizing the human-computer interaction function. The embedded computer 310 and the FPGA control card 320 can be connected through a PCI or PCI Express bus. The digital analog IO unit 324 in the FPGA control card 320 is connected to the controller 400 to be tested through ±10V analog voltage signals and 24V digital IO signals.

[0028] The circuit modeling unit 312 is used to establish a main circuit model and a power grid model corresponding to the controller 400 to be tested, and download the main circuit model and the power grid model to the digital circuit model unit 322 .

[0029] The scanning control unit 311 is used to control the scanning signal generator unit 321 to output scanning signals with different frequencies and phases. The scanning signals are applied to the main circuit model and the power grid model in the digital circuit model unit 322 as disturbance signals.

[0030] The digital circuit model unit 322 is used to output the solution results of the main circuit model and the power grid model to which the disturbance signal is applied to the controller 400 to be tested through the digital analog IO unit 324 .

[0031] The digital analog IO unit 324 is also used to perform analog-to-digital conversion on the control signal returned by the controller under test 400, and send the converted digital control signal to the digital circuit model unit 322 for real-time calculation to determine the next state.

[0032] The recording unit 323 is used to continuously record the input and output signals on the scanning signal generator unit 321 and the digital analog IO unit 324 in real time, and package the input and output signals to the impedance analysis unit 313 for impedance analysis to calculate the impedance of the controller 400 under different test conditions.

[0033] The scanning control unit 311, the circuit modeling unit 312 and the impedance analysis unit 313 may be software running in the embedded computer 310, while the scanning signal generator unit 321, the digital circuit model unit 322 and the wave recording unit 323 are virtual hardware in the FPGA control card 320, which run in the FPGA chip in the FPGA control card 320. The digital analog IO unit 324 is an actual circuit, which is installed on the circuit board of the FPGA control card 320.

[0034] From the above, it can be seen that the broadband impedance scanning device proposed in the present invention only needs an embedded computer and an FPGA control card in a scanning chassis to realize the test of the controller to be tested. It is an impedance scanning device that is easy to carry and transport. Moreover, in this embodiment, the digital current model, recording module, and scanning signal generator are all implemented in the same FPGA control card, which reduces the complexity of wiring in the process of setting up the experimental environment and improves the experimental efficiency.

[0035] based on Figure 1 A broadband impedance scanning device, such as Figure 2 As shown, the embodiment of the present application also provides a broadband impedance scanning method, which includes the following steps:

[0036] Step S201: The circuit modeling unit establishes a main circuit model and a power grid model corresponding to the controller to be tested, and downloads the main circuit model and the power grid model to the digital circuit model unit.

[0037] Step S202: the scanning control unit controls the scanning signal generator unit to output scanning signals with different frequencies and phases, and the scanning signals are applied to the main circuit model and the power grid model in the digital circuit model unit as disturbance signals.

[0038] Preferably, Figure 3 As shown, this step may specifically include the following sub-steps:

[0039] Step S2021: the scanning control unit sends a preset frequency and amplitude sequence to the scanning signal generator unit;

[0040] Step S2022: After receiving the frequency and amplitude sequence, the scanning signal generator unit generates three-phase voltage and current signals with a phase difference of 120 degrees through multiple sets of built-in sinusoidal signal generators;

[0041] Step S2023: the scanning signal generator unit injects the generated three-phase voltage and current signals into the main circuit model and the power grid model in the digital circuit model unit.

[0042] Step S203: the digital circuit model unit outputs the solution results of the main circuit model and the power grid model to which the disturbance signal is applied to the controller to be tested through the digital analog IO unit.

[0043] Step S204: the controller under test generates a feedback control signal according to the calculation result sent by the digital analog IO unit, and sends the feedback control signal to the digital circuit model unit through the digital analog IO unit, and the digital circuit model unit performs real-time calculation to determine the next state.

[0044] Step S205: The recording unit continuously records the input and output signals of the scanning signal generator unit and the digital analog IO unit in real time.

[0045] Step S206: the impedance analysis unit performs impedance analysis according to the input and output signals recorded by the wave recording unit to calculate the impedance of the controller to be tested under different test conditions.

[0046] Preferably, in this step, the impedance analysis unit can obtain the impedance of the controller to be tested at different frequencies by comparing and analyzing the three-phase voltage and current signals injected by the scanning signal generator unit recorded by the recording unit and the grid voltage and grid-side current signals of the digital analog IO unit port.

[0047] From the above, it can be seen that the broadband impedance scanning method proposed in the present invention only requires an embedded computer and an FPGA control card in a scanning chassis to realize the test of the controller to be tested. It is an impedance scanning device that is easy to carry and transport. Moreover, in this embodiment, the digital current model, recording module, and scanning signal generator are all implemented in the same FPGA control card, which reduces the complexity of wiring in the process of setting up the experimental environment and improves the experimental efficiency.

[0048] The wideband impedance scanning method and device are further described below by taking the test of characteristic impedance of a certain type of wind turbine generator controller in the subsynchronous frequency and supersynchronous frequency range as an example.

[0049] 1) Hardware Configuration

[0050] The scanning chassis 300 in the above scheme can adopt the PXIe-1071, 4-slot 3U PXI Express chassis produced by NI. The embedded computer 310 in the scheme adopts the PXIe-8862, 2.6GHz 8-core i7 controller, which is equipped with 16GB memory and 512GB solid-state hard disk. The FPGA control card 320 in the scheme adopts the PXIe-7868 multi-function reconfigurable I / O module, which is equipped with 18 analog outputs and 6 analog inputs with a sampling rate of up to 1Msps, as well as 48 digital input and output ports.

[0051] In the experiment, in addition to the above-configured scanning chassis 30, a controller to be tested 400, a keyboard, a display and several connecting wires are also required. The controller to be tested 400 in this implementation case is described by taking a doubly-fed wind turbine converter of a certain manufacturer as an example.

[0052] 2) Experimental wiring

[0053] The wiring scheme between the controller to be tested 400 and the FPGA control card 320 in the scanning chassis 300 is shown in Table 1. The FPGA control card 320 is required to provide 18 analog outputs, 12 digital outputs, and 20 digital input interfaces.

[0054] Table 1

[0055]

[0056]

[0057] 3) Create wind turbine main circuit model and power grid model

[0058] In this implementation case, the Simulink toolbox of Matlab software is selected as the circuit modeling unit 312 software running in the embedded computer 310, and the circuit model is imported into the FPGA control card 320 using VeriStand software to become a digital circuit model that can be solved in real time. The specific implementation steps are as follows:

[0059] The first step is to establish a wind turbine model and a model in the circuit modeling unit 312 software, that is, to use the Matlab software Simulink toolbox to establish a wind turbine main circuit and an infinite power system model.

[0060] The second step is to set the correspondence between the electrical nodes of the digital circuit model unit 322 and the digital analog IO unit 324, find NIVeriStandSignalProbe in the Simulink Library Browser, and place it on the electrical node where the external signal needs to be brought out.

[0061] In the third step, the circuit modeling unit 312 is used to generate a digital model that can be imported into the FPGA control card 320, and Simulink is used to compile and generate the NIVeriStand.tlc file.

[0062] The fourth step is to import the model generated by the circuit modeling unit 312 software into the FPGA control card 320, create a project using the VeriStand software, open Simulink to compile and generate the NIVeriStand.tlc file, and use the Edit Mappings tool under the Tools menu to associate the signal defined by the NIVeriStandSignalProbe with the digital analog IO unit 324 in the FPGA control card 320.

[0063] 4) Scan the impedance of the controller under test

[0064] During the impedance scanning process, the scanning control unit 311 in the embedded computer 310 is first run. After the scanning control unit 311 starts running, the preset frequency and amplitude sequence is transmitted to the scanning signal generator unit 321 in the control FPGA control card 320. The scanning control unit 311 only transmits one group of frequency and amplitude signals each time. After the scanning of the group of signals is completed, the next group of frequency and amplitude signals is transmitted until the entire frequency and amplitude sequence is transmitted.

[0065] After receiving the frequency and amplitude signals from the scanning control unit 311, the scanning signal generator unit 321 in the FPGA control card 320 generates voltage and current scanning waveforms with a phase difference of 120 degrees through the built-in multiple groups of sinusoidal signal generators. The sinusoidal signal generator can be implemented by the IP core of the FPGA.

[0066] The scanning signal generator unit 321 injects the generated three-phase voltage and current signals into the digital circuit model unit 322. The calculation result of the digital circuit model unit 322 is sent to the controller under test 400 through the digital analog IO unit 324. The controller under test 400 calculates the signal sent by the digital analog IO unit 324 and gives a feedback control signal after settlement. The feedback signal is sent back to the digital circuit model unit 322 through the digital analog IO unit 324 to realize the closed loop of the control and simulation system.

[0067] 5) Analyze the impedance of the controller under test

[0068] During the scanning process, the signals of the scanning signal generator unit 321 and the digital analog IO unit 324 are recorded by the recording unit 323 in the FPGA control card 320. The recorded data is first stored in the cache and then transmitted to the impedance analysis unit 313 in the embedded computer 310 through the DMA channel.

[0069] The impedance analysis unit 313 can obtain the impedance of the controller 400 under test at different frequencies by comparing and analyzing the three-phase voltage and current signals injected by the scanning signal generator unit 321 collected by the recording unit 323 and the grid voltage and grid-side current signals on the port of the digital analog IO unit 324.

[0070] Figure 4 is a schematic diagram of an electronic device provided by an embodiment of the present invention. Figure 4 The electronic device shown is a general data processing device, which includes a general computer hardware structure, which at least includes a processor 801 and a memory 802. The processor 801 and the memory 802 are connected via a bus 803. The memory 802 is suitable for storing one or more instructions or programs executable by the processor 801. The one or more instructions or programs are executed by the processor 801 to implement the steps in the above-mentioned broadband impedance scanning method.

[0071] The processor 801 may be an independent microprocessor or a collection of one or more microprocessors. Thus, the processor 801 executes the commands stored in the memory 802 to execute the method flow of the embodiment of the present invention as described above to realize the processing of data and the control of other devices. The bus 803 connects the above-mentioned multiple components together, and at the same time connects the above-mentioned components to the display controller 804 and the display device and the input / output (I / O) device 805. The input / output (I / O) device 805 may be a mouse, a keyboard, a modem, a network interface, a touch input device, a somatosensory input device, a printer, and other devices known in the art. Typically, the input / output (I / O) device 805 is connected to the system via an input / output (I / O) controller 806.

[0072] The memory 802 may store software components such as an operating system, a communication module, an interaction module, and an application program. Each of the modules and applications described above corresponds to a set of executable program instructions that implement one or more functions and methods described in the embodiments of the invention.

[0073] An embodiment of the present invention further provides a computer-readable storage medium on which a computer program is stored. When the computer program is executed by a processor, the steps of the above-mentioned broadband impedance scanning method are implemented.

[0074] An embodiment of the present invention further provides a computer program product, including a computer program / instruction, which implements the steps of the above-mentioned broadband impedance scanning method when executed by a processor.

[0075] In summary, the broadband impedance scanning method and device proposed in the present invention can realize the test of the controller to be tested by only using an embedded computer and an FPGA control card in a scanning chassis. It is an impedance scanning device that is easy to carry and transport. Moreover, in this embodiment, the digital current model, recording module, and scanning signal generator are all implemented in the same FPGA control card, which reduces the complexity of wiring in the process of setting up the experimental environment and improves the experimental efficiency.

[0076] The preferred embodiments of the present invention are described above with reference to the accompanying drawings. Many features and advantages of these embodiments are clear from this detailed description, and therefore the claims are intended to cover all such features and advantages of these embodiments that fall within their true spirit and scope. In addition, since many modifications and changes are easily conceivable to those skilled in the art, it is not intended to limit the embodiments of the present invention to the precise structure and operation illustrated and described, but all suitable modifications and equivalents falling within its scope may be covered.

[0077] Those skilled in the art will appreciate that embodiments of the present invention may be provided as methods, systems, or computer program products. Therefore, the present invention may take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware. Moreover, the present invention may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0078] The present invention is described with reference to flowcharts and / or block diagrams of methods, devices (systems), and computer program products according to embodiments of the present invention. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as the combination of processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0079] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0080] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0081] The specific embodiments described above further illustrate the objectives, technical solutions and beneficial effects of the present invention in detail. It should be understood that the above description is only a specific embodiment of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A broadband impedance scanning device, characterized in that: The device includes: an input device, a display device and a scanning chassis, the input device and the display device are respectively connected to the scanning chassis in communication, the scanning chassis includes an embedded computer and an FPGA control card, the embedded computer includes a scanning control unit, a circuit modeling unit and an impedance analysis unit, the FPGA control card includes a scanning signal generator unit, a digital circuit model unit, a recording unit and a digital analog IO unit, the scanning signal generator unit is respectively connected to the scanning control unit, the digital circuit model unit and the recording unit in communication, the digital circuit model unit is also respectively connected to the circuit modeling unit and the digital analog IO unit in communication, the recording unit is also respectively connected to the impedance analysis unit and the digital analog IO unit in communication, and the digital analog IO unit is also connected to the controller to be tested in communication.

2. The broadband impedance scanning device according to claim 1, characterized in that: The circuit modeling unit is used to establish a main circuit model and a power grid model corresponding to the controller to be tested, and download the main circuit model and the power grid model to the digital circuit model unit.

3. The broadband impedance scanning device according to claim 2, characterized in that: The scanning control unit is used to control the scanning signal generator unit to output scanning signals with different frequencies and phases, and the scanning signals are applied to the main circuit model and the power grid model in the digital circuit model unit as disturbance signals.

4. The broadband impedance scanning device according to claim 3, characterized in that: The digital circuit model unit is used to output the solution results of the main circuit model and the power grid model to which the disturbance signal is applied to the controller to be tested through the digital analog IO unit.

5. The broadband impedance scanning device according to claim 4, characterized in that: The digital analog IO unit is also used to perform analog-to-digital conversion on the control signal returned by the controller to be tested, and send the digital control signal after analog-to-digital conversion to the digital circuit model unit for real-time calculation to determine the next state.

6. The broadband impedance scanning device according to claim 5, characterized in that: The recording unit is used to continuously record the input and output signals on the scanning signal generator unit and the digital analog IO unit in real time, and package the input and output signals to the impedance analysis unit for impedance analysis to calculate the impedance of the controller under different test conditions.

7. A broadband impedance scanning method, characterized in that: The broadband impedance scanning device according to claim 1 performs broadband impedance scanning, and the method comprises: The circuit modeling unit establishes a main circuit model and a power grid model corresponding to the controller to be tested, and downloads the main circuit model and the power grid model to the digital circuit model unit; The scanning control unit controls the scanning signal generator unit to output scanning signals of different frequencies and phases, and the scanning signals are applied to the main circuit model and the power grid model in the digital circuit model unit as disturbance signals; The digital circuit model unit outputs the solution results of the main circuit model and the power grid model to which the disturbance signal is applied to the controller to be tested through the digital analog IO unit; The controller to be tested gives a feedback control signal according to the solution result sent by the digital analog IO unit, and sends the feedback control signal to the digital circuit model unit through the digital analog IO unit, and the digital circuit model unit performs real-time solution to determine the next state; The recording unit continuously records the input and output signals of the scanning signal generator unit and the digital analog IO unit in real time; The impedance analysis unit performs impedance analysis according to the input and output signals recorded by the wave recording unit to calculate the impedance of the controller to be tested under different test conditions.

8. The broadband impedance scanning method according to claim 7, wherein: The scanning control unit controls the scanning signal generator unit to output scanning signals with different frequencies and phases, and the scanning signals are applied as disturbance signals to the main circuit model and the power grid model in the digital circuit model unit, including: The scanning control unit sends a preset frequency and amplitude sequence to the scanning signal generator unit; After receiving the frequency and amplitude sequence, the scanning signal generator unit generates three-phase voltage and current signals with a phase difference of 120 degrees through a built-in multiple groups of sinusoidal signal generators; The scanning signal generator unit injects the generated three-phase voltage and current signals into the main circuit model and the power grid model in the digital circuit model unit.

9. The broadband impedance scanning method according to claim 8, characterized in that: The impedance analysis unit performs impedance analysis according to the input and output signals recorded by the wave recording unit to calculate the impedance of the controller under different test conditions, including: The impedance analysis unit obtains the impedance of the controller under test at different frequencies by comparing and analyzing the three-phase voltage and current signals injected by the scanning signal generator unit recorded by the recording unit and the grid voltage and grid-side current signals of the digital analog IO unit port.

10. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 7 to 9 are implemented.

11. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 7 to 9 are implemented.

12. A computer program product comprising a computer program / instructions, characterized in that When the computer program / instructions are executed by a processor, the steps of the method according to any one of claims 7 to 9 are implemented.

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