Method and system for testing working voltage of switching device based on second-order function approximation method

Abstract

The invention discloses a method and system for testing the working voltage of a switching device based on a second-order function approximation method, and the method comprises the steps: building a basic second-order function model through querying the nominal voltage Ub of a secondary switching element; performing a function initial test, and preliminarily testing the action voltage of the switch element; through multiple approximation and voltage adjustment in the test, when it is confirmed that an error is smaller than a set range, an accurate action voltage value is finally obtained. And carrying out holding voltage test, testing the holding voltage of the secondary switch element by using a second-order function approximation method, and finally determining a holding voltage value by adjusting voltage output and gradually approximating the holding voltage. According to the method, the action threshold voltage of the secondary switch element is tested based on the second-order function approximation method, the action and reset voltage of the secondary switch element can be more accurately tested, accurate data can be provided for switch type selection and accident analysis, and the method is of great significance.

Description

Technical Field

[0001] The present invention relates to the field of electrical testing and control technology, and in particular to a method and system for testing the operating voltage of a switching device based on a second-order function approximation method. Background Art

[0002] The factory of electronic secondary switch components marks the nominal voltage, but the two key parameters of action voltage and holding voltage are not clear. The performance of components with the same parameters from different manufacturers also varies. In places where technical parameters are strictly required or in the process of accident analysis, it is necessary to accurately obtain the two key parameters of the applied secondary switch components, the action voltage and holding voltage. The traditional way to obtain them is to use an adjustable power supply voltage to adjust the output, determine the state change to obtain the relevant parameters, and there is a large error in the manual / fixed step adjustment to find the two key parameters of action voltage and holding voltage, and the real parameters cannot be found.

[0003] In order to accurately find the two key parameters of the action voltage and the holding voltage, this method designs a method based on the second-order function approximation method to adjust the power supply voltage output, and slowly approaches it when approaching the critical point, so as to more accurately obtain the two key parameters of the action voltage and the holding voltage of the secondary switching element. Summary of the invention

[0004] In view of the above-mentioned problems, the present invention is proposed.

[0005] Therefore, the technical problem solved by the present invention is that the traditional working voltage test of the switching device usually relies on manual adjustment and fixed step length methods, and there are problems of inaccurate adjustment and low efficiency. In the action voltage test, the manual or linear adjustment method is prone to overshoot or fails to accurately capture the critical point of the action voltage, resulting in a large deviation in the test results. The holding voltage is the minimum voltage required for the switching element to be in a stable working state after the action. The traditional test method cannot achieve a smooth approximation of the holding voltage, which makes it difficult to obtain the true holding voltage value of the element when testing the holding voltage, especially when facing switching elements of different models and specifications, the holding voltage fluctuates greatly. It is difficult to dynamically adjust the voltage increase or decrease process in the prior art, and fixed step length adjustment is usually adopted. In this way, in the process of approaching the action voltage or the holding voltage, it is difficult to adjust the amplitude of the voltage increase in real time according to the response of the element, resulting in a time-consuming test process and low precision.

[0006] In order to solve the above technical problems, the present invention provides the following technical solutions: A method for testing the operating voltage of a switching device based on a second-order function approximation method, comprising: by querying the nominal voltage Ub of the secondary switching element and combining the action voltage ratio percentage n provided by the manufacturer, an approximation voltage nUb is calculated and a basic second-order function model is established;

[0007] Conduct initial function test, monitor the state change of switch element by adjusting the program-controlled power supply, and preliminarily test the action voltage of switch element;

[0008] If the voltage reaches the approach threshold but does not trigger the action, adjust the nUb value and retest until a more accurate action voltage is found. The test is repeated through multiple approximations and voltage adjustments. When the error is confirmed to be less than the set range, the accurate action voltage value is finally obtained.

[0009] Conduct a holding voltage test and use the second-order function approximation method to test the holding voltage of the secondary switch element. By adjusting the voltage output, gradually approach the holding voltage and finally determine the holding voltage value.

[0010] As a preferred solution of the method for testing the working voltage of a switching device based on the second-order function approximation method described in the present invention, wherein: the establishment of the basic second-order function model includes, in the form of y=-x 2 +nUb, where nUb is the possible action voltage formulated according to technical parameters. The function is an ascending function with the highest point being nUb, which is used to gradually approach and test the action voltage of the switching element.

[0011] As a preferred solution of the method for testing the working voltage of a switching device based on the second-order function approximation method described in the present invention, the initial function test includes selecting an initial x number based on the nUb value, setting an initial approximation voltage value based on the principle that y is close to nUb and less than nUb, setting an approximation step size Δx according to the percentage of the initial value of x, and designing an adjustment voltage output time t, the main control unit continuously adjusts the output of the programmable power supply through the function change, measures the state change of the tested component in real time, and performs a preliminary test.

[0012] As a preferred solution of the method for testing the working voltage of a switching device based on the second-order function approximation method described in the present invention, wherein: the obtaining of an accurate action voltage value includes, during the test process, if the voltage output reaches the last time and still does not trigger the action, it means that the value of nUb is too small, and nUb needs to be increased again for testing; if the action is triggered before the predetermined adjustment times, it means that the value of nUb is too large, and nUb needs to be reduced for retesting;

[0013] The voltage value at the time of the first trigger action is used as the new nUb for retesting. When the error between the actual adjustment times and the preset adjustment times is less than 2, the measured voltage y is regarded as the accurate action voltage.

[0014] As a preferred solution of the method for testing the working voltage of a switching device based on the second-order function approximation method described in the present invention, wherein: the holding voltage test also includes establishing an action voltage test approximation function: y=x 2+nUb, where nUb is the possible action voltage calculated based on the parameters, the function is an ascending function, and the highest point of the function is nUb.

[0015] As a preferred solution of the method for testing the working voltage of a switching device based on the second-order function approximation method described in the present invention, wherein: the holding voltage test includes: performing an initial function test, selecting an initial x number according to the value of nUb, with y close to nUb and greater than nUb as the principle; designing an approximation step length Δx, based on the percentage of the initial value of x; designing an adjustment voltage output time t;

[0016] After the settings are completed, the main control unit continuously adjusts the output of the programmable power supply with functional changes and measures the action of the component under test.

[0017] As a preferred solution of the method for testing the working voltage of a switching device based on the second-order function approximation method described in the present invention, the voltage holding test further includes: during the test, if the voltage output reaches the last time and still does not trigger the action, it means that the value of nUb is too large, and nUb needs to be increased again for testing; if the action is triggered before the predetermined adjustment times, it means that the value of nUb is too small, and nUb needs to be reduced for retesting;

[0018] The voltage value at the time of the first trigger action is used as the new nUb for retesting. When the error between the actual adjustment times and the preset adjustment times is less than 2, the measured voltage y is regarded as the accurate action voltage.

[0019] The system for testing the working voltage of a switching device based on a second-order function approximation method is characterized by comprising:

[0020] Action voltage test module: by querying the nominal voltage Ub of the secondary switch element, and combining it with the action voltage percentage n provided by the manufacturer, the approximate voltage nUb is calculated, and a basic second-order function model is established; the initial function test is carried out, and the state change of the switch element is monitored by adjusting the programmable power supply, and the action voltage of the switch element is preliminarily tested; if the voltage reaches the approximate threshold and does not trigger the action, the nUb value is adjusted and retested until a more accurate action voltage is found. After multiple approximations and voltage adjustments, the test confirms that the error is less than the set range, and finally obtains the accurate action voltage value;

[0021] Holding voltage test module: Perform holding voltage test, use second-order function approximation method to test the holding voltage of the secondary switch element, and gradually approach the holding voltage by adjusting the voltage output to finally determine the holding voltage value.

[0022] Beneficial effects of the present invention: The present invention significantly improves the accuracy of the action voltage test by introducing the second-order function approximation method. By comparing the experimental data, it can be seen that when the test approaches the action voltage, the traditional linear adjustment method is prone to miss the key voltage point due to excessive or too small voltage increment, while the second-order function approximation method of the present invention can dynamically adjust the amplitude of the voltage increment, so that the voltage change tends to be smooth, especially when approaching the critical point of the action voltage, the voltage adjustment is more accurate. In this way, through multiple approximations, it can be ensured that the test error is always controlled within a very small range, ensuring the accuracy of the test results.

[0023] Compared with the traditional single large-scale adjustment, the present invention gradually approaches the holding voltage through a second-order function. In particular, in the process of gradually reducing the voltage, the system can dynamically adjust the voltage output by real-time monitoring of the component status, making the voltage adjustment process smoother and effectively reducing the malfunction or failure of the component caused by the sudden change of voltage. In this way, not only can the holding voltage be accurately tested, but also the switching element can be guaranteed to maintain stable operation in a low-power state. This has significant advantages for scenarios in industrial applications where high stability requirements of switching devices are required.

[0024] The system of the present invention can automatically adjust the voltage output through the coordinated work of the programmable power supply and the main control unit. During the voltage approximation process, the system can automatically determine whether the approximation step size and voltage range need to be adjusted based on the results of real-time monitoring, thereby effectively avoiding the cumbersome process of relying on manual repeated adjustment in traditional technology. Through automated voltage approximation, the present invention greatly reduces the test time and significantly improves the test efficiency. In addition, the system performs multiple tests by continuously adjusting the nUb value, gradually narrowing the error range, and ensuring that the final voltage value is accurate and reliable. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the figures required for use in the description of the embodiments will be briefly introduced below. Obviously, the figures described below are only some embodiments of the present invention. For ordinary technicians in this field, other figures can be obtained based on these figures without paying creative work.

[0026] Figure 1 A flow chart of a method for testing the operating voltage of a switching device based on a second-order function approximation method provided by a first embodiment of the present invention;

[0027] Figure 2 A structural diagram of an electronic secondary switch element working voltage test bench involved in a method for testing a switch device working voltage based on a second-order function approximation method provided in a first embodiment of the present invention. DETAILED DESCRIPTION

[0028] In order to make the above-mentioned purposes, features and advantages of the present invention more obvious and easy to understand, the specific implementation methods of the present invention are described in detail below in conjunction with the specification drawings. Obviously, the described embodiments are part of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary persons in the art without creative work should fall within the scope of protection of the present invention.

[0029] Example 1, reference Figure 1 and Figure 2 , is an embodiment of the present invention, and provides a method for testing the operating voltage of a switching device based on a second-order function approximation method, comprising:

[0030] This patent mainly designs an electronic secondary switch element working voltage test bench, which includes a control unit, a programmable power supply, and a status acquisition unit.

[0031] like Figure 2 As shown, the secondary switch element working voltage test system includes a main control unit, a programmable power supply and a measured element. The main control unit and the programmable power supply are connected by a 485 communication line to control the output of the programmable power supply; the programmable power supply and the measured element coil are connected by a power wire, and the programmable power supply is responsible for supplying power to the measured element; the main control unit and the switch node of the measured element are connected by a measuring wire, and the main control unit can measure the switching state of the measured element.

[0032] S1: By querying the nominal voltage Ub of the secondary switching element and combining it with the action voltage percentage n provided by the manufacturer, the approximate voltage nUb is calculated and a basic second-order function model is established.

[0033] By querying the technical parameters of the secondary switch element, the nominal voltage Ub of the switch element is obtained, and at the same time, the data is queried to obtain the action voltage percentage n provided by the manufacturer. The action voltage test approximation function can be established: y = -x 2 +nUb, where nUb is the possible action voltage calculated based on the parameters, the function is an ascending function, and the highest point of the function is nUb.

[0034] It should be noted that Ub refers to the nominal voltage of the secondary switching element. The nominal voltage is the basic technical parameter of each secondary switching element and is provided by the manufacturer. It indicates the supply voltage range required for the element to work normally. As a basic input parameter, Ub reasonably reflects the electrical characteristics of the switching element and directly affects the estimation of the operating voltage.

[0035] n represents the percentage of the operating voltage provided by the manufacturer. This percentage determines when the component starts to operate relative to the nominal voltage. This parameter depends on the actual design and performance of the component and is determined by the manufacturer based on experience and product design specifications. The existence of n introduces a more refined adjustment parameter, so that the calculation of the operating voltage can be adjusted according to the design of the specific component.

[0036] The approximate voltage obtained by calculation represents the estimated action voltage value nUb based on the proportional relationship between the nominal voltage and the manufacturer provided. Its core role in the invention is that it sets a reasonable starting point for the target voltage in the test process, so that subsequent test steps can be carried out more efficiently.

[0037] S2: Perform an initial function test by adjusting the programmable power supply, monitoring the state changes of the switching elements, and preliminarily testing the operating voltage of the switching elements.

[0038] Select the initial x number according to the value of nUb, with the principle that y is close to nUb and less than nUb (for example, if nUb is 5V, x can be 1, that is, starting from 4V and increasing and approaching; if nUb is 50V, x can be 3, that is, starting from 41V and increasing and approaching); design the approximation step Δx, based on the percentage of the initial value of x (for example, if the test is planned to be completed 20 times, set it to x / 20; if the test is completed 30 times, set it to x / 30); design the adjustment voltage output time t. After completing the setting, the main control unit continuously adjusts the output of the programmable power supply with the function change to measure the action of the component under test.

[0039] Table 1 Contactor coil parameters

[0040]

[0041] As shown in Table 1, the contactor coil parameters of model DH100, the manufacturer provides contactors with three types of coils with nominal voltages of 12V, 24V and 48V, but the contactor action voltage is not the pull-in voltage, and the pull-in voltages are 9V, 18V and 36V respectively; the same minimum voltage is also clearly marked as 1V, 2V and 4V. The manufacturer's mark is only the basic difference, and all factory components cannot meet the calibration value. We need this method to test the actual value. It is also impossible to repeatedly adjust the test according to the nominal voltage during the test, which is too inefficient. As shown in the figure, taking the 12V coil as an example, when we look for the action voltage, nUb takes 9V, x approaches from 1.4 to 0, and the voltage rises slowly. If the voltage is boosted to 9V for action, reset nUb to 9.5V and adjust the voltage again; when looking for the holding voltage, nUb takes 1V, x approaches from 1.4 to 0, and the voltage drops slowly. If the voltage drops to 1V and is still released, reset nUb to 0.8V and adjust the voltage again.

[0042] It should be noted that y represents the voltage value in each approach process, gradually approaching and approaching nUb. Its rationality is reflected in the fact that y is always based on the principle of being close to nUb and less than nUb. This setting ensures that there will be no excessive voltage changes during the test, and at the same time, the approximate value close to the action voltage can be gradually obtained.

[0043] x is a variable that represents the step size of each voltage approximation process. The rationality of this character is reflected in the fact that by adjusting the step size, the test system can more accurately control the voltage change amplitude. Different x value settings directly determine the speed and accuracy of voltage increment. Especially when it is planned to complete the test within a certain number of times, by designing a proportional step size such as x / 20 or x / 30, the voltage adjustment can be more systematic.

[0044] t represents the output time of the regulated voltage. The design of this time parameter is very critical, especially in the process of voltage gradually approaching, the output time determines the duration of each voltage adjustment, ensuring that the system can fully monitor the state changes of the components.

[0045] Furthermore, in the prior art, the voltage is usually adjusted by a fixed step size, or the voltage is gradually increased or decreased by manual operation. A significant problem with this approach is that the selection of the step size often lacks a basis, resulting in the test process being too time-consuming and possibly missing the most accurate action voltage point. In the present invention, by initially testing the function based on nUb and combining the variable step size of x, the step size can be flexibly adjusted according to the test needs, thereby achieving a more accurate voltage approximation.

[0046] Compared with the traditional one-step or linear adjustment method, the biggest advantage of the step-by-step approach is the smooth transition, which reduces the possible malfunction caused by voltage mutation. In the present invention, by using the second-order function approximation model, by refining the step size and accurately adjusting the output time, it can be ensured that each voltage adjustment can be close to the most accurate action voltage point. This not only improves the accuracy of the test, but also effectively shortens the test time.

[0047] S3: If the voltage reaches the approach threshold but does not trigger the action, adjust the nUb value and retest until a more accurate action voltage is found. The test is repeated through multiple approximations and voltage adjustments. When it is confirmed that the error is less than the set range, the accurate action voltage value is finally obtained.

[0048] During the test, if the voltage output does not act on the last time, it means that the value of nUb is too small, and nUb should be increased again for testing; if it takes more than a few times to complete the expected number of adjustments before it acts, it means that nUb is too large, and the voltage y at the first action moment is not nUb, and retest; only when the error between the adjustment number and the planned jump number is less than 2, the voltage y can be recognized as the accurate action voltage.

[0049] It should be noted that by judging the test results, if the voltage output has not triggered the action for the last time, it means that the value of nUb is too small. At this time, the system readjusts nUb and gradually increases the approximation range. On the contrary, if the action is triggered within a small number of times, it means that nUb is too large, and the system will adjust it to a smaller value for retesting. This method of dynamic adjustment based on test results can effectively improve test accuracy and avoid the limitations of fixed step size or fixed approximation range in traditional methods.

[0050] Compared with the traditional single measurement method, the present invention gradually narrows the gap with the actual action voltage by adjusting nUb through multiple approximations. Especially when the voltage approaches the action point, the control of the error range enables the system to gradually approach the actual action voltage with a smaller step size, ensuring that each adjustment is more accurate. This multiple-test, step-by-step approach significantly improves the accuracy of the final test results and ensures accurate measurement of the action voltage.

[0051] The present invention sets a standard that the error between the number of adjustments and the planned number of adjustments is less than 2 times, and the design of this standard is of great significance. It ensures that in the voltage test process, inaccurate action voltage results will not be caused by too many adjustments or too few approximations. In practical applications, the setting of the error range not only improves the efficiency of the test, but also avoids unnecessary repeated tests and saves time costs.

[0052] S4: Perform a holding voltage test, use a second-order function approximation method to test the holding voltage of the secondary switch element, and gradually approach the holding voltage by adjusting the voltage output to ultimately determine the holding voltage value.

[0053] By querying the technical parameters of the secondary switch element, the nominal voltage Ub of the switch element is obtained, and at the same time, the minimum holding voltage percentage n provided by the manufacturer is obtained by querying the data. The action voltage test approximation function can be established: y = x 2 +nUb, where nUb is the possible action voltage calculated based on the parameters, the function is an ascending function, and the highest point of the function is nUb.

[0054] Select the initial x number according to the value of nUb, with the principle that y is close to nUb and greater than nUb (for example, if nUb is 5V, x can be 1, that is, starting from 6V and approaching incrementally; if nUb is 50V, x can be 3, that is, starting from 59V and approaching incrementally); design the approximation step Δx, based on the percentage of the initial value of x (for example, if the test is planned to be completed 20 times, set it to x / 20; if the test is completed 30 times, set it to x / 30); design the adjustment voltage output time t. After completing the setting, the main control unit continuously adjusts the output of the programmable power supply with function changes to measure the action of the component under test.

[0055] During the test, if the voltage output does not reset after the last time, it means that the nUb value is too large, and nUb should be lowered for testing again; if it takes more than a few times to complete the expected number of adjustments before it resets, it means that nUb is too small, and the voltage y at the moment of the first action is not nUb, and retest; only the reset y when the error between the adjustment number and the planned jump number is less than 2 can be recognized as the accurate reset voltage.

[0056] Embodiment 2 is the second embodiment of the present invention, which is different from the previous embodiment in that:

[0057] If the functions are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art or the part of the current technical solution, can be embodied in the form of a software product. The current computer software product is stored in a storage medium, including several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk and other media that can store program codes.

[0058] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as an ordered list of executable instructions for implementing logical functions, and can be embodied in any computer-readable medium for use by an instruction execution system, device or apparatus (such as a computer-based system, a system including a processor, or other system that can fetch instructions from an instruction execution system, device or apparatus and execute instructions), or in conjunction with such instruction execution systems, devices or apparatuses. For the purposes of this specification, "computer-readable medium" can be any device that can contain, store, communicate, propagate or transmit a program for use by an instruction execution system, device or apparatus, or in conjunction with such instruction execution systems, devices or apparatuses.

[0059] More specific examples of computer-readable media (a non-exhaustive list) include the following: an electrical connection with one or more wires (electronic device), a portable computer disk case (magnetic device), a random access memory (RAM), a read-only memory (ROM), an erasable and programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disk read-only memory (CDROM). In addition, the computer-readable medium may even be a paper or other suitable medium on which the program is printed, since the program may be obtained electronically, for example, by optically scanning the paper or other medium, followed by editing, deciphering or, if necessary, processing in another suitable manner, and then stored in a computer memory.

[0060] Embodiment 3 is an embodiment of the present invention, which provides a bearing fault diagnosis system based on Box-Cox mode decomposition, characterized by: an action voltage test module and a holding voltage test module.

[0061] Action voltage test module: by querying the nominal voltage Ub of the secondary switch element, and combining it with the action voltage percentage n provided by the manufacturer, the approximate voltage nUb is calculated, and a basic second-order function model is established; the initial function test is performed, and the state changes of the switch element are monitored by adjusting the programmable power supply, and the action voltage of the switch element is preliminarily tested; if the voltage reaches the approximate threshold and does not trigger the action, the nUb value is adjusted and retested until a more accurate action voltage is found. After multiple approximations and voltage adjustments, the test confirms that the error is less than the set range, and finally an accurate action voltage value is obtained.

[0062] Holding voltage test module: Perform holding voltage test, use second-order function approximation method to test the holding voltage of the secondary switch element, and gradually approach the holding voltage by adjusting the voltage output to finally determine the holding voltage value.

[0063] Example 4 is an embodiment of the present invention, which provides a method for testing the working voltage of a switching device based on a second-order function approximation method. In order to verify the beneficial effects of the present invention, scientific demonstration is carried out through economic benefit calculation and simulation / comparative experiments.

[0064] In order to verify the accuracy and efficiency of testing the operating voltage of switching devices based on the second-order function approximation method, this experiment selected three different types of secondary switching elements for testing, namely model A, model B and model C. The main equipment used in the experiment includes: programmable power supply, switch element detection device and data acquisition system. By consulting the technical information provided by the manufacturer, the nominal voltage Ub of each switching element and its corresponding action voltage ratio percentage n were obtained. The goal of the experiment is to approximate the action voltage of the switching element through a second-order function model based on this information, and to obtain more accurate action voltage and holding voltage through multiple approximation methods and adjustment strategies.

[0065] Step 1: First, the experimental group calculated the approximate voltage nUb of each switching element based on the parameter information provided by the manufacturer, and established a corresponding second-order function model in the form of: y=a(xh)2+k, where nUb is the highest point of the function.

[0066] Step 2: After the function model is established, the output voltage is gradually adjusted by the programmable power supply, starting from the initial value and gradually approaching nUb, and the state change of the switch element is observed. According to the value of nUb, the experimental group set the initial approximation voltage value x, and conducted preliminary tests on the principle that y is close to but less than nUb. For example, for a switch element with nUb = 12V, the initial voltage is set to 10V and the approximation step is 0.2V. The action state of the switch element is recorded in real time, and the growth rate of the output voltage is adjusted at any time to ensure that reliable action voltage data is obtained during the test.

[0067] Step 3: If the action is not triggered when approaching the threshold nUb, it means that the estimated value of nUb is too small, and it is necessary to increase nUb again and perform multiple approximation tests until the action voltage value closest to the actual value is found. If the action is triggered too early in the approximation process, it means that the value of nUb is too large, and it is necessary to appropriately reduce nUb and retest. When the error between the adjustment number and the planned number is less than 2 times, the experimental group regards the measured voltage value as the accurate action voltage.

[0068] Step 4: After obtaining the precise action voltage, the experiment continued with the holding voltage test. Through the second-order function approximation method, the voltage value was gradually reduced to test the stability of the switch element under different voltages. Finally, by adjusting the voltage output, the holding voltage value of the switch element was accurately determined.

[0069] Please refer to Table 2 for specific experimental data records.

[0070] Table 2 Experimental data reference table

[0071]

[0072] By analyzing the data in the table, it is possible to intuitively see the changing trends of the operating voltage and holding voltage values ​​of the switch elements of different models in the test. First, the nUb in the experiment is an approximation value calculated based on the Ub provided by the manufacturer and the operating voltage ratio n. In the test, the nUb values ​​of models A, B and C are 10.2V, 20.4V and 40.8V, respectively, while the operating voltages obtained from the actual test are 10.1V, 20.2V and 40.5V, respectively. It can be seen that the deviation between the actual operating voltage and nUb in the experiment is very small, especially the error is less than 0.3V, which proves that the second-order function approximation method adopted by the present invention has high accuracy and reliability.

[0073] Compared with the traditional single voltage measurement method, the present invention effectively reduces the error accumulation problem caused by inaccurate voltage setting through the strategy of gradual approximation. By gradually adjusting the voltage and monitoring the operation of the switching element in real time at different test stages, it is possible to ensure that nUb is adjusted in time during the approximation process, avoiding excessive or insufficient estimation deviations. The data in the table show that through this multiple approximation method, the experimental group obtained a more accurate action voltage value than the initial estimate.

[0074] From the test results of the holding voltage, it can be seen that the holding voltage values ​​of different types of switch elements are 6.3V, 13.7V and 27.1V respectively. Compared with the action voltage, the holding voltage value is significantly lower, which indicates that the voltage required for the switch element to maintain its state is much lower than the voltage when the action is triggered. Through the gradual adjustment of the second-order function approximation method, the experimental group can accurately test the holding voltage of each switch element. This step-by-step approximation method not only improves the test accuracy, but also effectively reduces energy consumption, allowing the switch element to maintain normal operation under low power consumption.

[0075] Compared with the prior art, the innovation of the present invention lies in the use of a second-order function approximation model, combined with dynamic adjustment and multiple approximation test strategies, which greatly improves the accuracy of voltage testing. In traditional methods, voltage testing often relies on a single measurement, which is difficult to accurately calibrate through multiple tests, and easily leads to large error accumulation. The present invention significantly reduces the error between the action voltage and the estimated value by continuously adjusting the output voltage, monitoring and adjusting the test parameters in real time, and ensures the accuracy of the final measured action voltage and holding voltage through strict control of the error range (less than 2 adjustment errors). Overall, the test method of the present invention can adapt to more complex switching element test scenarios and has strong practicality and innovation.

[0076] It should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solutions of the present invention may be modified or replaced by equivalents without departing from the spirit and scope of the technical solutions of the present invention, which should all be included in the scope of the claims of the present invention.

Claims

1. A method for testing the operating voltage of a switching device based on a second-order function approximation method, characterized in that: include: By querying the nominal voltage Ub of the secondary switch element and combining it with the action voltage percentage n provided by the manufacturer, the approximate voltage nUb is calculated and a basic second-order function model is established; Conduct initial function test, monitor the state change of switch element by adjusting the program-controlled power supply, and preliminarily test the action voltage of switch element; If the voltage reaches the approach threshold but does not trigger the action, adjust the nUb value and retest until a more accurate action voltage is found. The test is repeated through multiple approximations and voltage adjustments. When the error is confirmed to be less than the set range, the accurate action voltage value is finally obtained. Conduct a holding voltage test and use the second-order function approximation method to test the holding voltage of the secondary switch element. By adjusting the voltage output, gradually approach the holding voltage and finally determine the holding voltage value.

2. The method for testing the operating voltage of a switching device based on the second-order function approximation method according to claim 1, characterized in that: The establishment of the basic second-order function model includes the form of y=-x 2 +nUb, where nUb is the possible action voltage formulated according to technical parameters. The function is an ascending function with the highest point being nUb, which is used to gradually approach and test the action voltage of the switching element.

3. The method for testing the operating voltage of a switching device based on the second-order function approximation method according to claim 2, characterized in that: The initial function test includes selecting an initial x number based on the nUb value, setting an initial approximation voltage value based on the principle that y is close to nUb and less than nUb, setting an approximation step size Δx according to a percentage of the initial value of x, and designing an adjustment voltage output time t. The main control unit continuously adjusts the output of the programmable power supply through the function change, measures the state change of the tested component in real time, and performs a preliminary test.

4. The method for testing the operating voltage of a switching device based on the second-order function approximation method according to claim 3, characterized in that: The obtaining of the accurate action voltage value includes that, during the test process, if the voltage output reaches the last time and still does not trigger the action, it means that the value of nUb is too small and nUb needs to be increased again for testing; If the action is triggered before the scheduled adjustment times, it means that the nUb value is too large and you need to reduce nUb and retest; The voltage value at the time of the first trigger action is used as the new nUb for retesting. When the error between the actual adjustment times and the preset adjustment times is less than 2, the measured voltage y is regarded as the accurate action voltage.

5. The method for testing the operating voltage of a switching device based on the second-order function approximation method according to claim 4, characterized in that: The holding voltage test also includes establishing an action voltage test approximation function: y=x 2 +nUb, where nUb is the possible action voltage calculated based on the parameters, the function is an ascending function, and the highest point of the function is nUb.

6. The method for testing the operating voltage of a switching device based on the second-order function approximation method according to claim 5, characterized in that: The holding voltage test includes performing an initial function test, selecting an initial x number according to the value of nUb, with y close to nUb and greater than nUb as the principle; designing an approximate step length Δx, taking it as a percentage of the initial value of x; Design and adjust the voltage output time t; After the settings are completed, the main control unit continuously adjusts the output of the programmable power supply with functional changes and measures the action of the component under test.

7. The method for testing the operating voltage of a switching device based on the second-order function approximation method according to claim 6, characterized in that: The voltage holding test also includes that during the test, if the voltage output reaches the last time and still does not trigger the action, it means that the value of nUb is too large and nUb needs to be increased again for testing; If the action is triggered before the scheduled adjustment times, it means that the nUb value is too small and you need to reduce nUb and retest; The voltage value at the time of the first trigger action is used as the new nUb for retesting. When the error between the actual adjustment times and the preset adjustment times is less than 2, the measured voltage y is regarded as the accurate action voltage.

8. A system for testing the operating voltage of a switching device based on a second-order function approximation method using the method according to any one of claims 1 to 7, characterized in that: Action voltage test module: by querying the nominal voltage Ub of the secondary switch element, and combining it with the action voltage percentage n provided by the manufacturer, the approximate voltage nUb is calculated, and a basic second-order function model is established; the initial function test is carried out, and the state change of the switch element is monitored by adjusting the programmable power supply, and the action voltage of the switch element is preliminarily tested; if the voltage reaches the approximate threshold and does not trigger the action, the nUb value is adjusted and retested until a more accurate action voltage is found. After multiple approximations and voltage adjustments, the test confirms that the error is less than the set range, and finally obtains the accurate action voltage value; Holding voltage test module: Perform holding voltage test, use second-order function approximation method to test the holding voltage of the secondary switch element, and gradually approach the holding voltage by adjusting the voltage output to finally determine the holding voltage value.

9. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 7 are implemented.

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