Method, system and device for determining test parameters of memory and storage medium

Abstract

The invention discloses a method, a system and a device for determining test parameters of a memory and a storage medium. The method comprises the following steps: acquiring performance demand information of the memory; determining a first parameter type according to the performance demand information and a preset performance parameter table; performing a first performance test on the memory based on the first parameter type to obtain a first test result; under the condition that the first test result represents that the performance value of the memory is greater than or equal to the expected performance value, configuring the first parameter type as a test parameter of the memory; under the condition that the first test result represents that the performance value of the memory is smaller than the expected performance value, correcting the first parameter type to obtain a second parameter type; and configuring the second parameter type as a test parameter of the memory. The corresponding parameter type can be determined according to the performance requirement of the memory, so that the test meets the performance requirement, and the test efficiency is improved.

Description

Technical Field

[0001] The present invention relates to the field of memory testing technology, and in particular to a method, system, device and storage medium for determining test parameters of a memory. Background Art

[0002] Currently, when testing produced memories, specific parameter types are usually tested.

[0003] However, when the performance requirements of the memory are different, the test of a specific parameter type often cannot meet the performance requirements, or there are unnecessary parameter type tests, resulting in low test efficiency. Summary of the invention

[0004] In view of this, an embodiment of the present invention aims to provide a method, system, device and storage medium for determining test parameters of a memory, which can determine the corresponding parameter type according to the performance requirements of the memory, so that the test meets the performance requirements and improves the test efficiency.

[0005] In a first aspect, an embodiment of the present invention provides a method for determining test parameters of a memory, comprising: Acquire performance requirement information of a memory, wherein the performance requirement information represents an expected performance value of the memory; Determine a first parameter type according to the performance requirement information and a preset performance parameter table, where the first parameter type includes one or more parameters; Performing a first performance test on the memory based on the first parameter type to obtain a first test result, wherein the first performance test represents testing a performance value of the memory after adjusting a parameter value of the first parameter type, and comparing the performance value of the memory with an expected performance value to obtain a first comparison result; When the first test result indicates that the performance value of the memory is greater than or equal to the expected performance value, configuring the first parameter type as a test parameter of the memory; In a case where the first test result indicates that the performance value of the memory is less than the expected performance value, the first parameter type is modified to obtain a second parameter type, wherein a difference set between the second parameter type and the first parameter type is not equal to an empty set, and a second test result of performing a second performance test on the memory based on the second parameter type indicates that the performance value of the memory is greater than or equal to the expected performance value; The second parameter type is configured as a test parameter of the memory.

[0006] In some optional embodiments, determining the first parameter type according to the performance requirement information and a preset performance parameter table includes: Acquire a first parameter range in the preset performance parameter table according to the performance requirement information, where the first parameter range represents a parameter range associated with the performance requirement information; Determine a first threshold value according to the performance requirement information and a preset correlation table, wherein the first threshold value represents a correlation threshold value between a parameter and the performance requirement information; The first parameter type is determined according to the first threshold and the first parameter range.

[0007] In some optional embodiments, acquiring a first parameter range in the preset performance parameter table according to the performance requirement information includes: Acquire performance impact information of each parameter in the preset performance parameter table, wherein the performance impact information represents change information of each performance indicator when the parameter changes; Determining a plurality of parameters associated with the performance requirement information according to the performance requirement information and the performance impact information; A plurality of parameters associated with the performance requirement information are configured as the first parameter range.

[0008] In some optional embodiments, determining the first parameter type according to the first threshold and the first parameter range includes: Determine, according to the performance impact information, a correlation value between each parameter in the first parameter range and a preset performance indicator in the performance requirement information; Comparing the correlation value of each parameter in the first parameter range with the first threshold value to obtain a second comparison result; The parameter whose correlation value indicated by the second comparison result is greater than or equal to the first threshold is configured as the first parameter type.

[0009] In some optional embodiments, determining, according to the performance impact information, a correlation value between each parameter in the first parameter range and a preset performance indicator in the performance requirement information includes: When determining the change in the M parameter unit of the first parameter range according to the performance impact information, the change range of the preset performance indicator, the M parameter representing any parameter of the first parameter range; A correlation value between the M parameter and the preset performance indicator is determined according to the variation range.

[0010] In some optional embodiments, the modifying the first parameter type to obtain the second parameter type includes: Establishing a Gaussian distribution of the correlation value, wherein a first coordinate value of the Gaussian distribution represents the correlation value, and a second coordinate value of the Gaussian distribution represents each parameter within the first parameter range; Obtaining a first distribution range of the first parameter type in the Gaussian distribution, where the first distribution range represents a first value interval of the second coordinate value; The first value interval is increased by a preset unit interval to obtain a second value interval; All parameters in the second value range are configured as the second parameter type.

[0011] In some optional embodiments, when the performance requirement information represents expected performance values ​​of a plurality of preset performance indicators of the memory, the method further includes: Obtaining a performance difference between a performance expectation value and a current performance value of each of the preset performance indicators, wherein the current performance value represents a performance value of the preset performance indicator before performing the first performance test; Acquire performance impact information of N parameters in the second parameter type, where the performance impact information represents change information of each performance indicator when the N parameters change, and the N parameters represent any one parameter in the second parameter type; Determine, based on the performance impact information, a correlation map between the N parameters and the plurality of preset performance indicators, respectively, wherein the correlation map is used to indicate changes in performance values ​​of the plurality of preset performance indicators when a unit of the N parameter changes; The parameter value of the N parameter is determined according to the association map and the performance difference.

[0012] In a second aspect, an embodiment of the present invention provides a memory testing system, including: A first module is used to obtain performance requirement information of a memory, where the performance requirement information represents an expected performance value of the memory; A second module is used to determine a first parameter type according to the performance requirement information and a preset performance parameter table, where the first parameter type includes one or more parameters; A third module is used to perform a first performance test on the memory based on the first parameter type to obtain a first test result, wherein the first performance test represents a performance value of the memory tested after adjusting a parameter value of the first parameter type, and compares the performance value of the memory with an expected performance value to obtain a first comparison result; A fourth module is used to configure the first parameter type as a test parameter of the memory when the first test result indicates that the performance value of the memory is greater than or equal to the expected performance value; A fifth module is configured to, when the first test result indicates that the performance value of the memory is less than the expected performance value, modify the first parameter type to obtain a second parameter type, wherein a difference set between the second parameter type and the first parameter type is not equal to an empty set, and a second test result of performing a second performance test on the memory based on the second parameter type indicates that the performance value of the memory is greater than or equal to the expected performance value; A sixth module is used to configure the second parameter type as a test parameter of the memory.

[0013] In a third aspect, an embodiment of the present invention provides a memory testing device, which is applied to a smart card, and the device includes: at least one processor; at least one memory for storing at least one program; When the at least one program is executed by the at least one processor, the at least one processor implements the method as described above.

[0014] In a fourth aspect, an embodiment of the present invention provides a computer-readable storage medium, in which a program executable by a processor is stored. When the program executable by the processor is executed by the processor, it is used to perform the method as described above.

[0015] Implementation of the embodiments of the present invention includes the following beneficial effects: The embodiments of the present invention provide a method for determining test parameters of a memory, including: obtaining performance requirement information of the memory, the performance requirement information representing an expected performance value of the memory; determining a first parameter type according to the performance requirement information and a preset performance parameter table, the first parameter type including one or more parameters; performing a first performance test on the memory based on the first parameter type to obtain a first test result, the first performance test representing a performance value of the memory after adjusting the parameter value of the first parameter type, and comparing the performance value of the memory with the expected performance value to obtain a first comparison result; in the case where the first test result represents that the performance value of the memory is greater than or equal to the expected performance value, configuring the first parameter type as a test parameter of the memory; in the case where the first test result represents that the performance value of the memory is less than the expected performance value, modifying the first parameter type to obtain a second parameter type, wherein a difference set between the second parameter type and the first parameter type is not equal to an empty set, and a second test result of performing a second performance test on the memory based on the second parameter type represents that the performance value of the memory is greater than or equal to the expected performance value; configuring the second parameter type as a test parameter of the memory. The present application can effectively make up for the shortcomings of existing testing methods. Different parameter types are selected for performance testing through the performance requirement information of the memory, so as to determine the parameter type that meets the performance expectations. Therefore, the corresponding parameter type can be determined according to the performance requirements of the memory, so that the test meets the performance requirements and improves the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is a schematic diagram of the steps of a method for determining test parameters of a memory provided by an embodiment of the present invention; Figure 2 is a structural block diagram of a memory test system provided by an embodiment of the present invention; Figure 3 It is a structural block diagram of a memory testing device provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0017] In order to make the purpose, technical solution and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention.

[0018] It should be noted that, although the functional modules are divided in the device schematic diagram and the logical order is shown in the flowchart, in some cases, the steps shown or described may be performed in a different order than the module division in the device or the order in the flowchart. The terms "first", "second", etc. in the specification, claims or the above drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence.

[0019] An embodiment of the present invention provides a method for determining a test parameter of a memory, comprising: obtaining performance requirement information of the memory, the performance requirement information representing an expected performance value of the memory; determining a first parameter type according to the performance requirement information and a preset performance parameter table, the first parameter type including one or more parameters; performing a first performance test on the memory based on the first parameter type to obtain a first test result, the first performance test representing a performance value of the memory after adjusting a parameter value of the first parameter type, and comparing the performance value of the memory with the expected performance value to obtain a first comparison result; in a case where the first test result represents that the performance value of the memory is greater than or equal to the expected performance value, configuring the first parameter type as a test parameter of the memory; in a case where the first test result represents that the performance value of the memory is less than the expected performance value, modifying the first parameter type to obtain a second parameter type, wherein a difference set between the second parameter type and the first parameter type is not equal to an empty set, and a second test result of performing a second performance test on the memory based on the second parameter type represents that the performance value of the memory is greater than or equal to the expected performance value; and configuring the second parameter type as a test parameter of the memory. The present application can effectively make up for the shortcomings of existing testing methods. Different parameter types are selected for performance testing through the performance requirement information of the memory, so as to determine the parameter type that meets the performance expectations. Therefore, the corresponding parameter type can be determined according to the performance requirements of the memory, so that the test meets the performance requirements and improves the test efficiency.

[0020] The embodiments of the present invention are further described below in conjunction with the accompanying drawings.

[0021] like Figure 1 As shown, an embodiment of the present invention provides a method for determining test parameters of a memory, which includes the following steps.

[0022] S100: Acquire performance requirement information of a memory, where the performance requirement information represents an expected performance value of the memory.

[0023] Specifically, the performance requirement information can be the performance requirement required by the customer, or it can be the performance requirement determined according to the corresponding usage scenario of the memory, and there is no specific limitation. For example, the memory used in smart phones has specific requirements for read and write speed, storage capacity and power consumption, considering the user's frequent application startup, multi-tasking, photo and video storage and other operations. The read and write speed is expected to respond quickly to ensure smooth operation of the system; the storage capacity must be large enough to accommodate various applications, photos, videos and other data; the power consumption should be as low as possible to extend the battery life of the mobile phone. In the data center scenario, the memory used by the server focuses more on performance expectations in terms of large-capacity storage, stable performance under high-concurrency read and write operations, and data reliability. These specific expected indicators together constitute the performance requirement information of the memory, which clarifies the performance goals that need to be achieved when the parameters are determined later.

[0024] S200. Determine a first parameter type according to the performance requirement information and a preset performance parameter table, where the first parameter type includes one or more parameters.

[0025] Specifically, the preset performance parameter table is an important reference material compiled after long-term memory research and development, production and actual application feedback. It covers various parameters closely related to memory performance and the corresponding performance under different combinations of these parameters. From the hardware level, it includes the process parameters of the memory chip (such as transistor size, gate oxide thickness and other parameters that affect the electrical performance and physical characteristics of the chip), the organizational structure parameters of the memory unit (the number of rows and columns of the memory array, the number of Banks (memory channels) and other parameters that affect the storage capacity and read and write methods); from the perspective of electrical performance, there are parameters such as operating voltage, current driving capability, signal timing, etc.; there are also parameters such as cache strategy and address mapping method at the software control level. Through a large number of experimental tests and data analysis in actual applications, it is clear that the performance level that the memory can roughly achieve in terms of read and write speed, storage capacity, power consumption, data reliability, etc. under different parameter combinations provides a basis for determining the appropriate parameter type according to performance requirements.

[0026] Based on the obtained performance requirement information, search for parameter combinations that can meet the corresponding performance requirements in the preset performance parameter table. For example, if the performance requirement information emphasizes high read and write speeds and large storage capacity, then search for parameters related to improving read and write speeds (such as optimizing signal timing, increasing operating voltage to speed up transistor switching, etc.) and parameters for increasing storage capacity (such as increasing the size of the storage array, expanding the number of banks, etc.) in the parameter table, and classify these related parameters found into the first parameter type, which often includes multiple parameters, which work together to affect whether the memory can achieve the expected performance.

[0027] In some optional embodiments, determining the first parameter type according to the performance requirement information and a preset performance parameter table includes: obtaining a first parameter range in the preset performance parameter table according to the performance requirement information, the first parameter range representing a parameter range associated with the performance requirement information; determining a first threshold according to the performance requirement information and a preset correlation table, the first threshold representing a correlation threshold between a parameter and the performance requirement information; and determining the first parameter type according to the first threshold and the first parameter range.

[0028] Specifically, based on the performance requirement information obtained, parameters associated with the performance requirement information are searched in the preset performance parameter table, that is, the performance expectation represented by the performance requirement information can be adjusted through the associated parameters. For example, if the performance requirement information emphasizes achieving higher read and write speeds and lower power consumption, then search the table for parameters related to improved read and write speeds and reduced power consumption. For read and write speeds, parameters related to optimized signal timing may be found; these parameters associated with the performance requirement information constitute the first parameter range. Through such a search process, a parameter range that preliminarily meets performance expectations can be screened out, in preparation for further determining the specific parameter type.

[0029] The preset correlation table is mainly used to measure the correlation between different parameters and performance requirement information. It is constructed through a large amount of experimental analysis, statistical data and experience knowledge in professional fields. The table records the weights or correlation values ​​of the impact of each parameter on different performance indicators (such as read and write speed, storage capacity, power consumption, etc.), which are the embodiment of the correlation value. For example, for the parameter of working voltage, in terms of affecting the read and write speed, the correlation value is set to 0.8 (the value here is only an example, which is actually obtained based on specific quantitative analysis), indicating that the working voltage has a strong correlation with the read and write speed; while for the secondary structural parameters inside a certain storage unit, its correlation value in terms of affecting the read and write speed is 0.2, indicating that the correlation is relatively weak. Combined with the performance indicators that are focused on in the performance requirement information, the corresponding parameter correlation threshold is searched in the preset correlation table. For example, if the performance requirement information focuses on the read and write speed, then the correlation thresholds corresponding to all parameters related to the read and write speed are searched in the correlation table, such as setting the parameters with a correlation value greater than or equal to 0.4 (first threshold) with the read and write speed in the first parameter range as the first parameter type. Among them, for those key parameters that have a greater impact on improving the reading and writing speed (such as key time node parameters in signal timing, etc.), the corresponding correlation values ​​are relatively high, which means that a slight change in these parameters may have a more significant impact on the expected performance indicator of reading and writing speed; while for some auxiliary parameters that have relatively little impact on reading and writing speed, their correlation values ​​are lower.

[0030] After obtaining the first parameter range and the first threshold, the parameters that are finally included in the first parameter type are determined based on the correlation value and the first parameter range. Normally, parameters that are within the first parameter range and have a higher correlation value (greater than the first threshold) will be selected into the first parameter type first. For example, a signal timing parameter related to the read and write speed is within the previously determined first parameter range, and at the same time, in the preset correlation table, the correlation value of this parameter to the read and write speed reaches 0.8 (greater than the first threshold of 0.4), indicating that this parameter plays a key role in meeting the read and write speed requirements in the performance requirement information, then it will be included in the first parameter type. On the contrary, for some parameters that are within the first parameter range but have a lower correlation value (less than the first threshold of 0.4), whether to include them is determined based on actual conditions (such as overall parameter quantity control, synergy of other parameters, etc.). Through such a screening process, those parameters that have a greater impact on achieving performance expectations and a strong correlation are selected from a large number of parameter ranges that initially meet the performance requirements to form a first parameter type. The parameters in this type will serve as the focus of subsequent performance testing and parameter adjustment, in the hope of adjusting the values ​​of these parameters to make the performance of the memory reach or approach the expected value set by the performance requirement information.

[0031] In some optional embodiments, obtaining a first parameter range in the preset performance parameter table according to the performance requirement information includes: obtaining performance impact information of each parameter in the preset performance parameter table, the performance impact information characterizing change information of each performance indicator when the parameter changes; determining a plurality of parameters associated with the performance requirement information according to the performance requirement information and the performance impact information; and configuring the plurality of parameters associated with the performance requirement information to be within the first parameter range.

[0032] Specifically, the performance impact information reflects the changes in various performance indicators when the parameters change. Taking the operating voltage parameter as an example, its performance impact information will record how the performance indicators such as the read and write speed, power consumption, and data stability of the memory change accordingly when the operating voltage increases or decreases. For example, as the operating voltage increases, the read and write speed will increase, because the switching speed of the transistor will increase with the increase in voltage, and the data read and write operations can be completed more quickly; but at the same time, power consumption will also increase, and excessive voltage may also affect the stability of the data, resulting in an increased probability of error. For storage unit structure parameters, when the number of rows and columns of the storage array changes, the storage capacity will change accordingly (an increase in the number of rows and columns usually increases the storage capacity), but the read and write speed may be affected to a certain extent because operations such as address decoding become complicated. These specific change information is the embodiment of the performance impact information.

[0033] Usually, performance requirement information involves multiple performance indicators, so it is necessary to comprehensively consider the influence of various aspects to determine the associated parameters. For example, in the case of requiring both high read and write speeds and low power consumption, it is necessary not only to find parameters that can improve the read and write speeds (such as the signal timing parameters mentioned above), but also to consider those parameters that will not excessively increase power consumption while adjusting the read and write speeds, or even help reduce power consumption (for example, adopting a suitable cache strategy can both speed up the read and write speeds and reduce the increase in power consumption caused by frequent access to storage units, so the cache strategy parameters will also be determined as associated parameters). Through such a comprehensive and integrated analysis, multiple associated parameters that meet different performance expectations are determined. The multiple parameters associated with the performance requirement information that are screened out are configured as the first parameter range. The "range" here emphasizes the range composed of multiple parameters, that is, the first parameter range is composed of multiple parameters.

[0034] In some optional embodiments, determining the first parameter type based on the first threshold and the first parameter range includes: determining, based on the performance impact information, a correlation value between each parameter in the first parameter range and a preset performance indicator in the performance requirement information; comparing the correlation value of each parameter in the first parameter range with the first threshold to obtain a second comparison result; and configuring the parameter whose correlation value indicated by the second comparison result is greater than or equal to the first threshold as the first parameter type.

[0035] Specifically, for each parameter in the first parameter range, the correlation value with the preset performance indicator in the performance requirement information is determined based on the performance impact information of each parameter. The correlation value is a quantitative representation of the degree to which the parameter affects the preset performance indicator. For example, if the preset performance indicators in the performance requirement information include the three items of read and write speed, power consumption and storage capacity, for the parameter of the operating voltage in the first parameter range, by checking the performance impact information, it can be seen that: when the operating voltage changes within a certain range, the read and write speed may show a more obvious linear change (for example, for every 0.1V increase in voltage, the read and write speed increases by 20%), and the impact on power consumption is also more significant (an increase in voltage will increase power consumption by a certain proportion), while there is basically no direct impact on storage capacity. At this time, a quantitative method can be used to determine the correlation value, such as setting a score system with a full score of 1, and scoring according to the importance and change range of the parameter's impact on each preset performance indicator. Assuming that after comprehensive evaluation, the correlation value of the working voltage to the read and write speed is 0.4 points (indicating a high degree of influence), the correlation value to the power consumption is 0.3 points (the influence is also relatively obvious), and the correlation value to the storage capacity is 0 points (no direct influence). These correlation values ​​for different preset performance indicators together constitute the correlation value of the working voltage parameter and the entire performance requirement information. In the same way, the correlation values ​​of other parameters in the first parameter range (such as signal timing, cache strategy and other parameters) and the preset performance indicators are also determined respectively, and the specific details are not repeated here.

[0036] The first threshold is previously determined based on the performance requirement information and the preset correlation table. It represents the correlation threshold between the parameter and the performance requirement information, and is a boundary threshold for distinguishing the importance of the parameter to meeting the performance requirement information. By comparing the correlation values ​​of each parameter in the first parameter range with the first threshold, those parameters that really play a key role in meeting the performance requirement information and have a strong correlation can be screened out, providing a basis for finally determining the first parameter type. For example, assuming that the correlation value of a certain parameter is lower than the first threshold, it means that although the parameter is in the first parameter range (that is, it is initially judged to be related to the performance requirement), its actual impact on meeting the preset performance indicators in the performance requirement information is relatively small, and it may not need to be considered in the subsequent determination of the parameter type; and parameters with a correlation value greater than or equal to the first threshold mean that they play a more important role in achieving performance expectations.

[0037] Continuing with the working voltage parameter mentioned above as an example, assuming that the first threshold determined for the preset performance indicator of read and write speed is 0.3 (which means that the parameters with a correlation value of 0.3 or above are considered to have a more important impact on the read and write speed), and the previously determined correlation value of the working voltage to the read and write speed is 0.4, then the correlation value of the working voltage parameter in terms of read and write speed is greater than the first threshold; looking at the preset performance indicator of power consumption, if the first threshold is set to 0.2, the correlation value of the working voltage to power consumption is 0.3, which is also greater than the first threshold. According to this comparison method, for all parameters in the first parameter range, for each preset performance indicator, their correlation values ​​are compared with the corresponding first threshold, and the results of comparing each parameter with the first threshold in terms of different performance indicators are obtained. Combining these results forms the second comparison result.

[0038] Based on the second comparison result, the parameters whose correlation values ​​are greater than or equal to the first threshold are configured as the first parameter type. Parameters whose correlation values ​​are greater than or equal to the first threshold have a sufficiently important impact on satisfying the preset performance indicators in the performance requirement information, and they are the key parameters that are most likely to enable the memory to reach the expected performance level by adjusting their values. For example, if the correlation value of the signal timing parameter in terms of read and write speed is greater than the first threshold, and the correlation value of the cache strategy parameter in terms of reducing power consumption and improving read and write speed is greater than or equal to the first threshold, then the signal timing parameter, cache strategy parameter and other parameters that meet the conditions will be included in the first parameter type. When performing memory performance testing later, the parameters in these first parameter types will be adjusted and tested with different values, and the actual performance changes of the memory will be observed, so as to find the best combination of parameter values, so that the performance of the memory can meet the expected requirements set by the performance requirement information as much as possible, and ensure the efficient and stable operation of the memory in actual application scenarios.

[0039] In some optional embodiments, determining the correlation value between each parameter in the first parameter range and the preset performance indicator in the performance requirement information according to the performance impact information includes: determining the change amplitude of the preset performance indicator when the M parameter unit of the first parameter range changes according to the performance impact information, the M parameter representing any parameter in the first parameter range; and determining the correlation value between the M parameter and the preset performance indicator according to the change amplitude.

[0040] Specifically, the performance impact information records the impact of each parameter on different performance indicators of the memory under different value changes. For each parameter in the first parameter range (here, M parameter is used to represent any one of the parameters), the specific change of the preset performance indicator when the parameter changes by a unit is extracted.

[0041] Example of method for determining the change range: Take the common parameter of working voltage as an example, assuming that it is within the first parameter range. Check the performance impact information to see the impact on the preset performance indicator of read / write speed when the working voltage increases by 1V (1V here is the unit change). If it is known through a large number of experimental tests or past application experience that the read / write speed increases by 100MB / s (only an example value) for every 1V increase in working voltage, then "100MB / s" is the change range of the preset performance indicator of read / write speed when the unit change of the working voltage M parameter is changed. For another example, for the parameter of the number of rows and columns of the storage array (which can also be regarded as the M parameter), when the number of rows and columns increases by 1 row (unit change), the preset performance indicator of storage capacity may increase by 1GB (hypothetical value), then "1GB" is the change range of storage capacity when the unit change of the number of rows and columns is changed. For different M parameters and corresponding preset performance indicators, the specific change range value under this unit change can be determined by consulting the experimental data, simulation analysis results or actual application feedback recorded in the performance impact information, and the specific determination method is not limited here.

[0042] The correlation value is intended to quantify the influence of the M parameter on the preset performance index, and its value reflects the importance of the parameter in affecting the corresponding performance index. The change range is the key basis for determining the correlation value. Generally, the larger the change range, the more significant the influence of the parameter on the corresponding performance index, and the higher the correlation value.

[0043] A relative quantitative scoring system can be used to determine the correlation value, such as setting a score between 0 and 1 to indicate the strength of the correlation. Taking the preset performance indicator of read and write speed as an example, a reference standard is set: if the change in the read and write speed exceeds a certain large value (such as 500MB / s, for illustration only) when a certain M parameter unit changes, then the parameter is considered to have a strong correlation with the read and write speed, and a correlation value of 0.8 can be assigned; if the change is at a medium level (such as 100MB / s to 300MB / s), the correlation value is set to 0.5; if the change is small (less than 100MB / s), the correlation value is set to 0.2, etc.

[0044] For example, it was mentioned earlier that for every 1V increase in the operating voltage, the read / write speed increases by 100MB / s. According to the above-set scoring rules, the correlation value between the operating voltage M parameter and the read / write speed preset performance indicator can be determined to be 0.5. For other M parameters and corresponding different preset performance indicators, their correlation values ​​are determined based on their respective change ranges and with reference to similar quantitative scoring rules, so as to clearly reflect the differences in the degree of influence of various parameters on different performance indicators, and provide strong data support for subsequent steps such as screening key parameters and determining parameter types.

[0045] S300, performing a first performance test on the memory based on the first parameter type to obtain a first test result, wherein the first performance test represents testing a performance value of the memory after adjusting a parameter value of the first parameter type, and comparing the performance value of the memory with an expected performance value to obtain a first comparison result.

[0046] Specifically, for each parameter in the first parameter type, it is necessary to adjust the value within a reasonable range. This reasonable range is usually determined based on relevant technical specifications, past experience and theoretical analysis. Take the operating voltage as an example. If it is in the first parameter type and it is known that the normal operating voltage range of the memory is between 1.0V-1.8V, then different values ​​are selected within this range for trial. For example, start with a lower value and gradually increase the voltage in a certain step size (such as 0.1V) to observe the performance changes of the memory under different voltage values. The operation method is similar for other parameters. For example, for cache policy parameters, different cache levels or cache sizes can be set, and different cache levels can be switched in turn or the value of the cache size can be changed. Comprehensive attempts are made within the effective setting range allowed, so as to comprehensively examine the performance of the memory under different parameter value combinations.

[0047] In the process of adjusting the parameter values ​​in the first parameter type, it is necessary to test multiple key performance indicators of the memory. Common performance indicators include read and write speed, storage capacity, power consumption, and data stability (such as the error rate of read and write data, etc.). For the test of read and write speed, a large number of data blocks will be written to the memory through a special test tool, and then the data will be read out according to certain rules, and the time taken to complete the read and write operation will be recorded to calculate the specific value of the read and write speed, such as how many read and write operations can be completed per second or the amount of data read and written per unit time, etc.; in terms of storage capacity, the actual amount of data that can be stably stored will be accurately measured by gradually filling data until the memory reaches a full load state or a prompt that it cannot continue to store appears; power consumption testing uses professional power consumption measuring instruments to record the power consumption of the memory when it is in different working states (such as standby, read and write operations, etc.); data stability testing can measure data stability by repeating read and write operations multiple times, comparing whether the written and read data are consistent, and counting the proportion of erroneous data.

[0048] The various performance values ​​of the memory obtained through the above test are compared one by one with the performance expectation values ​​set in the performance requirement information initially obtained. For example, if the performance expectation value requires the read and write speed to reach 1000MB / s, and the actual test result is 800MB / s, it means that under the current parameter value setting, the performance index of the read and write speed does not reach the expected value; for another example, the power consumption set by the performance expectation value cannot exceed 1W under a specific working state, and the actual test result is 0.8W, which shows that the power consumption index meets the expected value requirement. Through such a comprehensive and detailed comparison, a comprehensive first comparison result is formed, which clearly reflects whether the parameter adjustment currently made based on the first parameter type can make the overall performance of the memory reach the expected level. If each performance indicator is greater than or equal to the corresponding performance expectation value, then the first comparison result is that the performance of the memory meets the expectations; on the contrary, if some performance indicators are lower than the expected value, it means that the parameter type needs to be further adjusted and optimized, so as to hope that the performance of the memory can better meet the goals set by the performance requirement information through subsequent improvement measures.

[0049] S400: When the first test result indicates that the performance value of the memory is greater than or equal to an expected performance value, configure the first parameter type as a test parameter of the memory.

[0050] Specifically, when the first test result indicates that the performance value of the memory is greater than or equal to the expected performance value, it means that the parameter value combination set based on the first parameter type can enable the memory to achieve the expected performance level. Configuring the first parameter type as the test parameter of the memory provides a reliable reference standard for subsequent production, quality inspection, and practical application. In the process of mass production of memory, configuration and testing according to these parameters can ensure that each memory product produced can stably achieve the expected performance, ensure the consistency of product performance, and help improve the overall quality and market competitiveness of the product.

[0051] S500. When the first test result indicates that the performance value of the memory is less than the expected performance value, the first parameter type is modified to obtain a second parameter type, wherein the difference set between the second parameter type and the first parameter type is not equal to an empty set, and a second test result of a second performance test performed on the memory based on the second parameter type indicates that the performance value of the memory is greater than or equal to the expected performance value.

[0052] Specifically, when the first test result shows that the performance value of the memory is less than the expected performance value, it means that the parameter value combination corresponding to the first parameter type cannot enable the memory to reach the expected performance level, and there is a performance bottleneck, so it needs to be corrected. This is to further determine more appropriate parameter settings to meet the performance requirements of the actual application scenario for the memory in terms of read and write speed, storage capacity, power consumption, etc., to ensure that the memory can run stably and efficiently in the corresponding system.

[0053] First, it is necessary to analyze which performance indicators in the first test results have not reached the expected values ​​and the size of the gap with the expected values, and find the reasons in combination with the working principle of the memory and the mutual influence relationship between the parameters. For example, if the read and write speeds are much lower than the expected values, it may be because the signal timing parameter settings involved in the first parameter type are not optimized enough, resulting in a large delay in data transmission; or the organizational structure of the storage unit limits the efficiency of parallel read and write operations; or it may be that the cache strategy has not fully played its role, resulting in frequent access to the storage unit and reducing the overall read and write speed. In terms of power consumption, if the actual power consumption is higher than the expected value, it may be that the operating voltage is set too high, or some circuit modules are in an unnecessary high energy consumption state under the current parameter configuration. Through such a comprehensive and in-depth analysis, the key factors affecting performance are clearly identified, providing targeted directions for correcting parameter types.

[0054] The first parameter type is modified to obtain the second parameter type, and the modification methods mainly include: Adjust the value range or adjustment method of existing parameters: For example, for signal timing parameters, if the previous value range is too narrow or the adjustment step is inappropriate, resulting in failure to find the best timing configuration, then the value range can be expanded in the second parameter type, and the adjustment step can be refined to explore the appropriate signal timing more carefully; for operating voltage parameters, if it is found that the current voltage setting is not conducive to the balance between power consumption and read and write speed, you can reselect the value within a more reasonable voltage range for trial, such as further narrowing the original wider voltage range to a sub-range that is more likely to meet performance requirements based on experience or theoretical analysis.

[0055] Introduce new parameters: If the analysis shows that some factors not included in the first parameter type limit the memory performance, it is necessary to introduce the relevant parameters into the second parameter type. For example, if it is suspected that the internal error correction mechanism of the storage unit (such as ECC, error checking and correction) has an impact on the read and write speed and data stability, but this parameter has not been considered before, then the ECC-related parameters (such as the encoding method of the error correction code, the length of the check bit, etc.) can be included in the second parameter type. By adjusting the values ​​of these newly introduced parameters, they work together with the original parameters to improve the performance of the memory.

[0056] The process of performing a second performance test on the memory based on the second parameter type is similar to the first performance test. It is also necessary to adjust the various parameters contained in the second parameter type within a reasonable value range, and test the key performance indicators of the memory (such as read and write speed, storage capacity, power consumption, data stability, etc.). For example, for the newly introduced ECC-related parameters, different error correction code encoding methods and check bit length combinations will be set. At the same time, combined with the adjusted signal timing, operating voltage and other parameters, data is written and read to the memory according to a certain test process, and the actual performance value of the memory under these different parameter value combinations is measured and recorded. When the performance value cannot meet the expected performance value, repeat the above-mentioned method of introducing new parameters to correct the first parameter type, and continue the second performance test until the corrected first parameter type can meet the expected performance value, and then configure the corrected first parameter type as the second parameter type.

[0057] When the second test result indicates that the performance value of the memory is greater than or equal to the expected performance value, it means that the memory can reach the expected performance level after the parameter type is corrected. After configuring the second parameter type as the test parameter of the memory, the consistency of product quality can be ensured during the production process, and the memory can be guaranteed to run stably according to the expected performance in the system integration application, so that it can better meet the requirements of actual applications for memory performance and improve the performance and reliability of the entire system.

[0058] In some optional embodiments, the modification of the first parameter type to obtain the second parameter type includes: establishing a Gaussian distribution of the association value, wherein a first coordinate value of the Gaussian distribution represents the association value, and a second coordinate value of the Gaussian distribution represents each parameter of the first parameter range; obtaining a first distribution range of the first parameter type in the Gaussian distribution, wherein the first distribution range represents a first value interval of the second coordinate value; increasing the first value interval by a preset unit interval to obtain a second value interval; and configuring all parameters of the second value interval to be the second parameter type.

[0059] Specifically, Gaussian distribution, also known as normal distribution, is a common probability distribution model with the characteristics of being high in the middle, low on both sides, and symmetrical. The Gaussian distribution of correlation values ​​is introduced here to analyze the distribution of correlation values ​​between each parameter in the first parameter range and the performance requirement information from the perspective of probability statistics, so as to screen and adjust the parameters more scientifically and reasonably, and find out the parameter combination that may be more helpful to improve the memory performance.

[0060] In this Gaussian distribution, the first coordinate value represents the correlation value, which reflects the quantitative value of the influence of each parameter on the preset performance indicators in the performance requirement information, and the range is usually between 0 and 1 (specifically determined according to the set correlation value quantification rule, which is not limited here). The second coordinate value represents each parameter in the first parameter range, that is, each parameter involved in the analysis is placed as a variable on the horizontal axis of this distribution. By collecting and arranging the correlation values ​​corresponding to each parameter, this distribution is constructed according to the statistical law of Gaussian distribution, so that parameters with higher correlation values ​​are relatively closer to the center and have a higher probability density in the distribution, while parameters with lower correlation values ​​are distributed on both sides with a relatively small probability density.

[0061] For example, assuming that there are multiple parameters such as operating voltage, signal timing, cache strategy, etc. in the first parameter range, these parameters and their correlation values ​​are plotted correspondingly in the Gaussian distribution according to their respective correlation values ​​with preset performance indicators such as read and write speed and power consumption. For example, if the operating voltage has a higher comprehensive correlation value with read and write speed and power consumption, then its corresponding point in this distribution will be closer to the center position, reflecting its relatively more important characteristics and greater impact on meeting performance requirements.

[0062] The first parameter type is a set of parameters that have been previously screened and determined to have an important impact on meeting performance requirements. In the constructed Gaussian distribution of correlation values, the distribution range of these parameters is determined, that is, the first distribution range, which represents the first value interval of the second coordinate value (i.e., each parameter). This value interval is determined by observing the position of the parameters in the first parameter type in the Gaussian distribution, and usually covers the range of parameters with relatively high correlation values, located in the center area of ​​the Gaussian distribution, or meeting the previously set strong correlation conditions. For example, through analysis, it is found that the horizontal coordinate range corresponding to the operating voltage, signal timing and other parameters in the first parameter type in the Gaussian distribution of correlation values ​​is roughly from parameter A to parameter B (parameters A and B here are specific parameters arranged in order, just examples), and this range is the first distribution range. It represents the distribution interval corresponding to the set of parameters that have a greater impact on performance in the initial determination, reflects the concentration and range of these parameters in terms of correlation values, and provides a basic reference for further adjustment of the parameter range in the future.

[0063] Since the first test result shows that the performance value of the memory is less than the expected performance value, it means that the parameter range covered by the current first parameter type is not comprehensive or accurate enough, and the best parameter combination to meet the performance requirements has not been found. The purpose of increasing the preset unit interval in the first value interval is to expand the search range of the parameters, try to include some parameters that originally have a slightly lower correlation value but may be helpful in improving performance in a wider exploration, and provide more possibilities for finding a suitable parameter combination.

[0064] The setting of the preset unit interval needs to take into account many factors, such as the total number of parameters, the complexity of the correlation between parameters, and past experience. If the preset unit interval is set too large, it may introduce too many parameters with weak correlation and not critical to performance improvement, increasing the complexity and workload of the test; if it is set too small, it may not be able to effectively expand a more suitable parameter range, and it is still difficult to find a parameter combination that meets performance requirements. For example, based on the overall distribution of parameters, the preset unit interval can be set to a range that includes several adjacent parameters, and the specific number can be determined based on actual analysis and experience.

[0065] Example of obtaining the second value interval: Assuming that the first value interval is from parameter A to parameter B, and the preset unit interval is set to include a range of 3 adjacent parameters, then after expanding the first value interval to both sides to include a range of 3 adjacent parameters, the new interval obtained is the second value interval, such as from parameter C to parameter D (here C is before A, D is after B, and includes the corresponding extended parameter range), this second value interval covers a wider parameter range than the first value interval.

[0066] Configuring all parameters in the second value range as the second parameter type is based on the idea of ​​expanding the parameter search range and considering as comprehensively as possible those parameters that may be useful in improving memory performance. Although these newly included parameters may be relatively low in the initial correlation value evaluation, through further performance testing after the range is expanded, it is found that they can make the performance of the memory reach or exceed the expected performance value under different parameter value combinations or in synergy with other parameters. After being configured as the second parameter type, a second performance test will be performed based on these parameters. By adjusting their values ​​and observing the actual performance changes of the memory, it is verified whether the parameter range expansion is effective and whether a suitable parameter combination that meets the performance requirements can be found, thereby promoting the entire memory performance optimization process, so that it can ultimately achieve the expected performance level in actual applications.

[0067] In some optional embodiments, when the performance requirement information represents the expected performance values ​​of multiple preset performance indicators of the memory, the method further includes: obtaining a performance difference between the expected performance value and the current performance value of each of the preset performance indicators, the current performance value representing the performance value of the preset performance indicator before the first performance test is performed; obtaining performance impact information of N parameters in the second parameter type, the performance impact information representing the change information of each performance indicator when the N parameter changes, and the N parameter representing any one parameter in the second parameter type; determining an association map between the N parameter and the multiple preset performance indicators based on the performance impact information, the association map being used to indicate the change in performance values ​​of the multiple preset performance indicators when the N parameter unit changes; and determining the parameter value of the N parameter according to the association map and the performance difference.

[0068] Specifically, the performance difference is a key indicator to measure how far each preset performance indicator is from the expected performance level. By comparing the performance expectation with the current performance value before the first performance test, the room for improvement or reduction in each performance aspect can be clearly identified. For example, for the preset performance indicator of read and write speed, if the performance expectation is 1000MB / s and the current performance value is 600MB / s, then the performance difference is 400MB / s, which indicates that the read and write speed needs to be increased by a certain amount by adjusting the parameters to meet expectations.

[0069] These performance differences are obtained by calculating the expected performance values ​​recorded in the performance requirement information and the known current performance values ​​(which can be obtained through preliminary testing or based on the existing specifications of the memory). Such calculations are performed for each preset performance indicator to obtain a complete set of performance difference values, which can fully reflect the memory's performance improvement needs in various aspects and provide a basis for subsequent targeted parameter adjustments.

[0070] The performance impact information has been mentioned above, which describes in detail the changes of various performance indicators when the parameters change. For any N parameters in the second parameter type, the purpose of obtaining its performance impact information is to understand the specific impact mode and degree of this parameter on all preset performance indicators, so as to subsequently build an association map and determine the appropriate parameter value.

[0071] Example of acquisition method: Assuming that the N parameter is the operating voltage, its performance impact information can be obtained from the previously established performance parameter table or through experimental test data. For example, when the operating voltage increases, the read and write speed will increase accordingly, but the power consumption will also increase, and the storage capacity will not be affected or will only change slightly (these changes may be reflected in specific numerical relationships, such as every 0.1V increase in the operating voltage will increase the read and write speed by 100MB / s, and the power consumption will increase by 0.1W, etc.). The acquisition of this information helps to fully understand the actual impact of the N parameter on each preset performance indicator under different value changes.

[0072] The correlation map intuitively represents the relationship between the N parameter and multiple preset performance indicators. The correlation map can show the change in the performance value of each preset performance indicator when the N parameter unit changes, obtain the comprehensive impact of the N parameter on different performance aspects, and then determine the appropriate parameter value while considering the balanced improvement of multiple performance indicators.

[0073] Example of the construction process: Taking the N parameter as the working voltage as an example, suppose a simple association map is constructed. In the map, the horizontal axis represents the unit change of the working voltage (such as 0.1V as a unit), and the vertical axis corresponds to different preset performance indicators (such as read and write speed, power consumption, storage capacity). According to the performance impact information obtained, when the working voltage changes from an initial value, a curve is drawn in the map showing that the read and write speed increases with the increase in voltage (such as the 100MB / s increase for every 0.1V mentioned earlier), and a curve for the increase in power consumption (0.1W increase for every 0.1V) and a straight line for the storage capacity to remain basically unchanged are drawn at the same time (assuming that the storage capacity is not affected by the working voltage). In this way, a correlation map between the working voltage and multiple preset performance indicators is constructed, through which the comprehensive impact of changes in the working voltage on each performance indicator can be intuitively seen.

[0074] Using the correlation map and performance difference to determine the parameter value of the N parameter is a process that comprehensively considers the balanced improvement of multiple performance indicators. First, determine the magnitude and direction of each preset performance indicator that needs to be improved or adjusted based on the performance difference (such as the read and write speed needs to be improved, the power consumption needs to be reduced, etc.). Then, find the value range or specific value of the N parameter that can simultaneously meet these performance adjustment requirements in the correlation map.

[0075] Determination process example: Assume that according to the association map, when parameter A increases by one unit, performance index a increases by 20%, performance index b increases by 10%, and performance index c decreases by 10%; when parameter B increases by one unit, performance index a increases by 10%, performance index b increases by 20%, and performance index c increases by 10%; when parameter C increases by one unit, performance index a increases by 10%, performance index b increases by 10%, and performance index c increases by 20%. The current performance value of performance index a is 50%, and the performance expectation value is 80%. The current performance value of performance index b is 60%, and the performance expectation value is 80%. The current performance value of performance index c is 60%, and the performance expectation value is 90%. Then the performance difference of performance index a is 30%, the performance difference of performance index b is 20%, and the performance difference of performance index c is 30%. Then, according to the calculation formula AX+BY+CZ=(performance index a≥80%, performance index b≥80%, performance index c≥90%), the corresponding values ​​of X, Y and Z are determined, that is, AX is used as the parameter value of parameter A, BX is used as the parameter value of parameter B, and CX is used as the parameter value of parameter C.

[0076] S600: Configure the second parameter type as a test parameter of the memory.

[0077] Specifically, the second parameter type is obtained by modifying the first parameter type, and the second performance test result based on the second parameter type shows that the performance value of the memory can be greater than or equal to the expected performance value. This means that the parameters and value combinations contained in the second parameter type have been verified to be effective configurations that can enable the memory to achieve the expected performance level, so they are configured as test parameters, thereby providing test parameters for subsequent tests of other memories of the same type.

[0078] It is very important to have clear and effective test parameters in multiple links such as memory production, quality inspection and actual application integration. Using the second parameter type as the test parameter can ensure that each product is parameterized according to this standard configuration during mass production of memory, thereby ensuring the consistency of product performance and reducing quality problems caused by performance fluctuations.

[0079] Record each parameter involved in the second parameter type and its corresponding value in detail and accurately to form standardized documentation. For example, if the second parameter type includes operating voltage, signal timing, cache strategy, and ECC (error checking and correction) related parameters, then it is necessary to record the specific value of the operating voltage (such as 1.5V), the precise duration of each key time node of the signal timing (such as the rising edge time of the read and write signal is 1ns, etc.), the specific mode of the cache strategy (such as the use of a specific cache algorithm and cache size setting), and the specific configuration of the ECC parameters (such as the encoding method of the error correction code, the length of the check bit, etc.). These records will serve as a formal reference for the memory test parameters to facilitate subsequent query, use, and sharing.

[0080] Implementation of the embodiments of the present invention includes the following beneficial effects: The embodiments of the present invention provide a method for determining test parameters of a memory, including: obtaining performance requirement information of the memory, the performance requirement information representing an expected performance value of the memory; determining a first parameter type according to the performance requirement information and a preset performance parameter table, the first parameter type including one or more parameters; performing a first performance test on the memory based on the first parameter type to obtain a first test result, the first performance test representing a performance value of the memory after adjusting the parameter value of the first parameter type, and comparing the performance value of the memory with the expected performance value to obtain a first comparison result; in the case where the first test result represents that the performance value of the memory is greater than or equal to the expected performance value, configuring the first parameter type as a test parameter of the memory; in the case where the first test result represents that the performance value of the memory is less than the expected performance value, modifying the first parameter type to obtain a second parameter type, wherein a difference set between the second parameter type and the first parameter type is not equal to an empty set, and a second test result of performing a second performance test on the memory based on the second parameter type represents that the performance value of the memory is greater than or equal to the expected performance value; configuring the second parameter type as a test parameter of the memory. The present application can effectively make up for the shortcomings of existing testing methods. Different parameter types are selected for performance testing through the performance requirement information of the memory, so as to determine the parameter type that meets the performance expectations. Therefore, the parameter types under different performance requirements can be obtained, and the corresponding parameter types can be determined according to the performance requirements of the memory, so that the test meets the performance requirements and improves the test efficiency.

[0081] Second, refer to Figure 2 , an embodiment of the present invention provides a memory testing system, comprising: A first module is used to obtain performance requirement information of a memory, where the performance requirement information represents an expected performance value of the memory; A second module is used to determine a first parameter type according to the performance requirement information and a preset performance parameter table, where the first parameter type includes one or more parameters; A third module is used to perform a first performance test on the memory based on the first parameter type to obtain a first test result, wherein the first performance test represents a performance value of the memory tested after adjusting a parameter value of the first parameter type, and compares the performance value of the memory with an expected performance value to obtain a first comparison result; A fourth module is used to configure the first parameter type as a test parameter of the memory when the first test result indicates that the performance value of the memory is greater than or equal to the expected performance value; A fifth module is configured to, when the first test result indicates that the performance value of the memory is less than the expected performance value, modify the first parameter type to obtain a second parameter type, wherein a difference set between the second parameter type and the first parameter type is not equal to an empty set, and a second test result of performing a second performance test on the memory based on the second parameter type indicates that the performance value of the memory is greater than or equal to the expected performance value; A sixth module is used to configure the second parameter type as a test parameter of the memory.

[0082] It can be seen that the contents of the above method embodiments are all applicable to the present system embodiments, the functions specifically implemented by the present system embodiments are the same as those of the above method embodiments, and the beneficial effects achieved are also the same as those achieved by the above method embodiments.

[0083] Thirdly, refer to Figure 3 , an embodiment of the present invention provides a memory testing device, comprising: at least one processor; at least one memory for storing at least one program; When at least one program is executed by at least one processor, the at least one processor implements the above method.

[0084] It can be seen that the contents of the above method embodiments are all applicable to the present device embodiments, the functions specifically implemented by the present device embodiments are the same as those of the above method embodiments, and the beneficial effects achieved are also the same as those achieved by the above method embodiments.

[0085] In a fourth aspect, in addition, the embodiments of the present application further disclose a computer program product or a computer program, which is stored in a computer storable medium. The processor of a computer device can read the computer program from a computer readable storage medium, and the processor executes the computer program so that the computer device executes the above method or the above system. Similarly, the contents in the above method embodiments are all applicable to the storage medium embodiments, and the functions specifically implemented by the storage medium embodiments are the same as those in the above method embodiments, and the beneficial effects achieved are also the same as those achieved by the above method embodiments.

[0086] It is understood that all or some steps and systems in the disclosed method above can be implemented as software, firmware, hardware and appropriate combinations thereof. Some physical components or all physical components can be implemented as software executed by a processor, such as a central processing unit, a digital information processor or a microprocessor, or implemented as hardware, or implemented as an integrated circuit, such as an application-specific integrated circuit. Such software can be distributed on a computer-readable medium, and the computer-readable medium can include a computer storage medium (or a non-transitory medium) and a communication medium (or a temporary medium). As known to those of ordinary skill in the art, the term computer storage medium includes volatile and non-volatile, removable and non-removable media implemented in any method or technology for storing information (such as computer-readable instructions, data structures, program modules or other data). Computer storage media include, but are not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, digital versatile disk (DVD) or other optical disk storage, magnetic cassette, magnetic tape, disk storage or other magnetic storage device, or any other medium that can be used to store desired information and can be accessed by a computer. Furthermore, it is well known to those skilled in the art that communication media generally contain computer readable instructions, data structures, program modules, or other data in modulated data information such as carrier waves or other transport mechanisms, and may include any information delivery media.

[0087] The embodiments of the present invention are described in detail above with reference to the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made within the knowledge scope of ordinary technicians in the technical field without departing from the purpose of the present invention.

Claims

1. A method for determining test parameters of a memory, characterized in that: include: Acquire performance requirement information of a memory, wherein the performance requirement information represents an expected performance value of the memory; Determine a first parameter type according to the performance requirement information and a preset performance parameter table, where the first parameter type includes one or more parameters; Performing a first performance test on the memory based on the first parameter type to obtain a first test result, wherein the first performance test represents testing a performance value of the memory after adjusting a parameter value of the first parameter type, and comparing the performance value of the memory with an expected performance value to obtain a first comparison result; When the first test result indicates that the performance value of the memory is greater than or equal to the expected performance value, configuring the first parameter type as a test parameter of the memory; In a case where the first test result indicates that the performance value of the memory is less than the expected performance value, the first parameter type is modified to obtain a second parameter type, wherein a difference set between the second parameter type and the first parameter type is not equal to an empty set, and a second test result of performing a second performance test on the memory based on the second parameter type indicates that the performance value of the memory is greater than or equal to the expected performance value; The second parameter type is configured as a test parameter of the memory.

2. The method according to claim 1, characterized in that The determining the first parameter type according to the performance requirement information and the preset performance parameter table includes: Acquire a first parameter range in the preset performance parameter table according to the performance requirement information, where the first parameter range represents a parameter range associated with the performance requirement information; Determine a first threshold value according to the performance requirement information and a preset correlation table, wherein the first threshold value represents a correlation threshold value between a parameter and the performance requirement information; The first parameter type is determined according to the first threshold and the first parameter range.

3. The method according to claim 2, characterized in that The obtaining a first parameter range in the preset performance parameter table according to the performance requirement information includes: Acquire performance impact information of each parameter in the preset performance parameter table, wherein the performance impact information represents change information of each performance indicator when the parameter changes; Determining a plurality of parameters associated with the performance requirement information according to the performance requirement information and the performance impact information; A plurality of parameters associated with the performance requirement information are configured as the first parameter range.

4. The method according to claim 3, characterized in that The determining the first parameter type according to the first threshold and the first parameter range includes: Determine, according to the performance impact information, a correlation value between each parameter in the first parameter range and a preset performance indicator in the performance requirement information; Comparing the correlation value of each parameter in the first parameter range with the first threshold value to obtain a second comparison result; The parameter whose correlation value indicated by the second comparison result is greater than or equal to the first threshold is configured as the first parameter type.

5. The method according to claim 4, characterized in that The determining, according to the performance impact information, a correlation value between each parameter in the first parameter range and a preset performance indicator in the performance requirement information includes: When determining the change in the M parameter unit of the first parameter range according to the performance impact information, the change range of the preset performance indicator, the M parameter representing any parameter of the first parameter range; A correlation value between the M parameter and the preset performance indicator is determined according to the variation range.

6. The method according to claim 4, characterized in that The step of modifying the first parameter type to obtain a second parameter type includes: Establishing a Gaussian distribution of the correlation value, wherein a first coordinate value of the Gaussian distribution represents the correlation value, and a second coordinate value of the Gaussian distribution represents each parameter within the first parameter range; Obtaining a first distribution range of the first parameter type in the Gaussian distribution, where the first distribution range represents a first value interval of the second coordinate value; The first value interval is increased by a preset unit interval to obtain a second value interval; All parameters in the second value range are configured as the second parameter type.

7. The method according to claim 1, characterized in that In a case where the performance requirement information represents expected performance values ​​of a plurality of preset performance indicators of the memory, the method further includes: Obtaining a performance difference between a performance expectation value and a current performance value of each of the preset performance indicators, wherein the current performance value represents a performance value of the preset performance indicator before performing the first performance test; Acquire performance impact information of N parameters in the second parameter type, where the performance impact information represents change information of each performance indicator when the N parameters change, and the N parameters represent any one parameter in the second parameter type; Determine, based on the performance impact information, a correlation map between the N parameters and the plurality of preset performance indicators, respectively, wherein the correlation map is used to indicate changes in performance values ​​of the plurality of preset performance indicators when a unit of the N parameter changes; The parameter value of the N parameter is determined according to the association map and the performance difference.

8. A memory testing system, characterized in that: include: A first module is used to obtain performance requirement information of a memory, where the performance requirement information represents an expected performance value of the memory; A second module is used to determine a first parameter type according to the performance requirement information and a preset performance parameter table, where the first parameter type includes one or more parameters; A third module is used to perform a first performance test on the memory based on the first parameter type to obtain a first test result, wherein the first performance test represents a performance value of the memory tested after adjusting a parameter value of the first parameter type, and compares the performance value of the memory with an expected performance value to obtain a first comparison result; A fourth module is used to configure the first parameter type as a test parameter of the memory when the first test result indicates that the performance value of the memory is greater than or equal to the expected performance value; A fifth module is configured to, when the first test result indicates that the performance value of the memory is less than the expected performance value, modify the first parameter type to obtain a second parameter type, wherein a difference set between the second parameter type and the first parameter type is not equal to an empty set, and a second test result of performing a second performance test on the memory based on the second parameter type indicates that the performance value of the memory is greater than or equal to the expected performance value; A sixth module is used to configure the second parameter type as a test parameter of the memory.

9. A memory testing device, characterized in that: include: at least one processor; at least one memory for storing at least one program; When the at least one program is executed by the at least one processor, the at least one processor implements the method according to any one of claims 1 to 7.

10. A computer-readable storage medium storing a program executable by a processor, characterized in that: The processor-executable program is used to perform the method according to any one of claims 1 to 7 when executed by the processor.

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