Method for detecting residual amount of atomization substrate and atomization equipment

Abstract

According to the embodiment of the invention, the invention provides a method for detecting the residual amount of an atomization substrate and atomization equipment. The method comprises the following steps: acquiring a plurality of parameters associated with a current atomization action of an atomization substrate, wherein the plurality of parameters at least comprise at least one of the following items: a time interval between the current atomization action and a previous atomization action, or an environment temperature of the atomization substrate when the current atomization action occurs; on the basis of the multiple parameters, the consumption of the current atomization action on the atomization matrix is determined; and determining a remaining amount of the atomized substrate based at least on the consumption amount. In this way, the accuracy of detection of the remaining amount of the atomized matrix can be improved.

Description

Technical Field

[0001] Example embodiments of the present disclosure generally relate to the field of atomization devices, and more particularly to a method for detecting a remaining amount of an atomized substrate and an atomization device. Background Art

[0002] In recent years, the consumer group of atomization devices such as electronic cigarettes has gradually increased in the market, and they are increasingly favored by consumers. At present, mainstream electronic cigarettes on the market are usually equipped with a liquid storage tank to hold the e-liquid. Such a liquid storage tank usually adopts a non-transparent tank structure, that is, such a liquid storage tank is usually non-transparent, which makes it impossible for users to directly observe the current remaining amount of e-liquid in the liquid storage tank. It is expected that information indicating the remaining amount of e-liquid in the liquid storage tank can be intuitively obtained. Summary of the invention

[0003] Embodiments of the present disclosure provide a method for detecting the remaining amount of an atomized substrate and an atomization device.

[0004] In a first aspect of the present disclosure, a method for detecting the remaining amount of an atomized substrate is provided. The method comprises: obtaining a plurality of parameters associated with a current atomization action on an atomized substrate, the plurality of parameters comprising at least one of the following: a time interval between a current atomization action and a previous atomization action, or an ambient temperature of the atomized substrate when the current atomization action occurs; determining the consumption of the atomized substrate by the current atomization action based on the plurality of parameters; and determining the remaining amount of the atomized substrate based at least on the consumption.

[0005] In some embodiments of the first aspect, determining the consumption of the atomized substrate by the atomization action includes: determining multiple consumption efficiency coefficients corresponding to multiple parameters, each of the multiple efficiency coefficients indicating the degree of influence of the corresponding parameter on the consumption efficiency of the atomized substrate; and determining the consumption based on the multiple consumption efficiency coefficients, the measured duration of the current atomization action and the baseline consumption rate of the atomized substrate.

[0006] In some embodiments of the first aspect, determining multiple consumption efficiency coefficients corresponding to multiple parameters respectively includes: for each parameter of the multiple parameters, obtaining a predetermined parameter coefficient mapping for the parameter, the parameter coefficient mapping indicating the correspondence between different parameter values ​​of the parameter and different consumption efficiency coefficient values; and determining the consumption efficiency coefficient value corresponding to the current value of the parameter based on the parameter coefficient mapping.

[0007] In some embodiments of the first aspect, determining the consumption based on multiple consumption efficiency coefficients, the measured duration of the atomization action and the benchmark consumption rate of the atomized substrate includes: using multiple parameters to convert the measured duration into an equivalent duration of the atomization action; and calculating the consumption based on the equivalent duration and the benchmark consumption rate.

[0008] In some embodiments of the first aspect, determining the consumption based on multiple consumption efficiency coefficients, the measured duration of the atomization action and the baseline consumption rate of the atomized substrate includes: using multiple parameters to convert the baseline consumption rate into an equivalent consumption rate of the atomized substrate; and calculating the consumption based on the equivalent consumption rate and the measured duration.

[0009] In some embodiments of the first aspect, determining the remaining amount of the atomized substrate includes at least one of the following: updating the remaining amount of the atomized substrate after the previous atomization action based on the consumption, or calculating the remaining amount based on the consumption, the corresponding consumption of the previous atomization action occurring before the atomization action, and the initial amount of the atomized substrate.

[0010] In some embodiments of the first aspect, the plurality of parameters further comprises at least one of: a measured duration of the nebulization action, or a flow rate of the airflow caused by the nebulization action.

[0011] In some embodiments of the first aspect, the consumption efficiency coefficient corresponding to the time interval decreases as the time interval increases.

[0012] In some embodiments of the first aspect, the consumption efficiency coefficient corresponding to the ambient temperature increases as the ambient temperature increases.

[0013] In a second aspect of the present disclosure, an atomization device is provided. The atomization device includes: a liquid storage tank configured to accommodate an atomization substrate; and a processor configured to: obtain multiple parameters associated with a current atomization action on the atomization substrate, the multiple parameters at least including at least one of the following: a time interval between a current atomization action and a previous atomization action, or an ambient temperature of the atomization substrate when the current atomization action occurs; based on the multiple parameters, determine the consumption of the atomization substrate by the current atomization action; and determine the remaining amount of the atomization substrate based at least on the consumption.

[0014] In a third aspect of the present disclosure, an atomization device is provided. The atomization device includes: a parameter acquisition module configured to acquire multiple parameters associated with a current atomization action on an atomized substrate, the multiple parameters including at least one of the following: a time interval between a current atomization action and a previous atomization action, or an ambient temperature of the atomized substrate when the current atomization action occurs; a consumption determination module configured to determine the consumption of the atomized substrate by the current atomization action based on the multiple parameters; and a remaining amount determination module configured to determine the remaining amount of the atomized substrate based at least on the consumption.

[0015] It will be understood from the following description that, according to an embodiment of the present disclosure, a method for detecting the remaining amount of an atomized substrate is provided for an atomization device. A plurality of parameters associated with the current atomization action of the atomized substrate are obtained, and the consumption of the atomized substrate is determined based on these parameters, and then the remaining amount of the atomized substrate is determined. In this way, the accuracy of detecting the remaining amount of the atomized substrate can be improved. Other benefits will be described below in conjunction with the corresponding embodiments.

[0016] It should be understood that the contents described in this content section are not intended to limit the key features or important features of the embodiments of the present disclosure, nor are they intended to limit the scope of the present disclosure. Other features of the present disclosure will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The above and other features, advantages and aspects of the embodiments of the present disclosure will become more apparent with reference to the following detailed description in conjunction with the accompanying drawings. In the accompanying drawings, the same or similar reference numerals represent the same or similar elements, wherein:

[0018] Figure 1 A schematic diagram showing an example of an atomization device according to an embodiment of the present disclosure;

[0019] Figure 2 A flow chart showing a process of detecting the remaining amount of atomized substrate according to some embodiments of the present disclosure;

[0020] Figure 3 A schematic diagram showing an example parameter coefficient mapping for flow rate according to some embodiments of the present disclosure;

[0021] Figure 4 A schematic diagram showing an example parameter coefficient mapping for atomization duration according to some embodiments of the present disclosure;

[0022] Figure 5 A schematic diagram showing an example parameter coefficient mapping for atomization interval according to some embodiments of the present disclosure;

[0023] Figure 6 A schematic diagram showing an example parameter coefficient mapping for ambient temperature according to some embodiments of the present disclosure; and

[0024] Figure 7 A block diagram of an atomization device according to some embodiments of the present disclosure is shown. DETAILED DESCRIPTION

[0025] Embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although certain embodiments of the present disclosure are shown in the accompanying drawings, it should be understood that the present disclosure can be implemented in various forms and should not be construed as being limited to the embodiments set forth herein. On the contrary, these embodiments are provided to provide a more thorough and complete understanding of the present disclosure. It should be understood that the drawings and embodiments of the present disclosure are only for exemplary purposes and are not intended to limit the scope of protection of the present disclosure.

[0026] In the description of the embodiments of the present disclosure, the term "including" and similar terms should be understood as open inclusion, that is, "including but not limited to". The term "based on" should be understood as "based at least in part on". The term "one embodiment" or "the embodiment" should be understood as "at least one embodiment". The term "some embodiments" should be understood as "at least some embodiments". Other explicit and implicit definitions may be included below. The terms "first", "second", etc. may refer to different or the same objects. Other explicit and implicit definitions may be included below.

[0027] Herein, unless explicitly stated, executing a step “in response to A” does not mean executing the step immediately after “A” but may include one or more intermediate steps.

[0028] As briefly mentioned above, mainstream electronic cigarettes on the market are usually equipped with a liquid storage tank with a non-transparent tank structure to contain the e-liquid. It is expected that information indicating the remaining amount of e-liquid in the liquid storage tank can be obtained intuitively.

[0029] Traditionally, the cumulative puffing time method is often used to detect the current remaining amount of oil, and the light-emitting diode (LED) indicator light scheme is used to indicate the current remaining amount of oil. With this scheme, the puffing time is accumulated as long as the user puffs. When the accumulated total time reaches a certain set threshold, the indicator light effect can remind the user of the current remaining amount of oil. However, when only considering the puffing time factor, differences in factors such as the puffing intensity will cause the measurement results to be inaccurate. This will lead to the problem that the indicator light has not indicated that the oil has been consumed. The above describes the problem of inaccurate measurement results of the remaining oil in electronic cigarettes. It should be understood that similar problems exist in the detection of the remaining amount of atomization matrix in other types of atomization devices.

[0030] To this end, an embodiment of the present disclosure provides a solution for detecting the remaining amount of an atomized substrate. A plurality of parameters associated with the current atomization action of the atomized substrate are obtained. These parameters include at least the time interval between the current atomization action and the previous atomization action, or the ambient temperature of the atomized substrate when the current atomization action occurs. Based on these parameters, the consumption of the atomized substrate is determined, and then the remaining amount of the atomized substrate is determined. According to an embodiment of the present disclosure, the influence of various factors on the consumption of the atomized substrate is comprehensively considered. In this way, the metering result of the remaining amount of the atomized substrate can be made more accurate.

[0031] Some example embodiments of the present disclosure will be described below with reference to the accompanying drawings. Please note that in some descriptions of the embodiments, certain specific values ​​may be involved in order to better help readers understand. These values ​​are exemplary and may vary according to specific application scenarios, and do not limit the scope of the present disclosure in any way.

[0032] Figure 1 Schematic diagram of an example of an atomization device 100 of an embodiment of the present disclosure is shown. The atomization device 100 here may be, for example, an electronic cigarette. Figure 1 As shown, the atomization device 100 includes a processor 110 and a liquid storage tank 120. It is understood that although only one liquid storage tank 120 is shown in the figure, the atomization device 100 may include one or more liquid storage tanks 120 in practice, and the present disclosure does not limit the liquid storage tank 120. The liquid storage tank 120 is used to contain an atomization matrix (e.g., e-liquid).

[0033] In some embodiments, the atomizing device 100 further includes a nozzle (not shown in the figure). The nozzle can be integrally formed with other parts of the atomizing device 100 (e.g., the liquid storage tank 120), or can be formed separately and installed on other parts of the atomizing device 100 in a detachable manner. In some embodiments, the atomizing device 100 further includes a power source (not shown in the figure). The power source (e.g., a battery) is used to power the atomizing device 100.

[0034] The processor 110 may be any type of electronic device with computing capabilities. The processor 110 may be, for example, a microprocessor (MPU), a system on a chip (SOC), a processor (CPU), a microcontroller (MCU), and the like. In an embodiment of the present disclosure, the processor 110 may execute a method for detecting the remaining amount of the atomized substrate. The processor 110 may determine the remaining amount of the atomized substrate in the liquid storage tank 120. In some embodiments, the processor 110 may also indicate that the information prompt component presents a prompt message (e.g., indicates that the LED component is lit) to prompt the user that the remaining amount of the atomized substrate in the current liquid storage tank 120 is small when the remaining amount is less than a threshold value.

[0035] It should be understood that the structures and functions of the various parts in the ambient atomization device 100 are described for exemplary purposes only, and do not imply any limitation on the scope of the present disclosure.

[0036] Some example embodiments of the present disclosure will be described in detail below with reference to examples of the accompanying drawings.

[0037] Figure 2 A flow chart of a process 200 for detecting the remaining amount of aerosolized substrate according to some embodiments of the present disclosure is shown. The process 200 may be implemented at the processor 110.

[0038] In box 210, the processor 110 obtains multiple parameters associated with the current atomization action of the atomized substrate. For example, in the case where the atomization device 100 is an electronic cigarette, the atomized substrate can be the e-cigarette oil in the electronic cigarette, and the atomization action can be the suction action of the e-cigarette oil. The multiple parameters here include at least one of the time interval between the current atomization action and the previous atomization action, or the ambient temperature of the atomized substrate when the current atomization action occurs. In some embodiments, the atomization device 100 also includes at least one sensor. The processor 110 can obtain the time interval and the ambient temperature through the at least one sensor. For example, the processor 110 can obtain the ambient temperature of the atomized substrate through a temperature sensor. The temperature sensor can be located at any suitable position of the atomization device 100, such as on a chip where the processor 110 is located. For example, the time interval can be provided by a built-in or external timer of the processor 110.

[0039] In some embodiments, these parameters may also include the measured duration of the atomization action, which may also be referred to as the actual atomization duration. The measured duration refers to the duration from the start of the atomization action to the end of the atomization action. The processor 110 may, for example, obtain such a measured duration through a built-in or external timer of the processor 110. In some embodiments, these parameters may also include the airflow velocity caused by the atomization action, which may also be referred to as the atomization velocity. The airflow here is the airflow caused by the atomization gas after the atomization device 100 atomizes the atomization substrate (for example, the airflow caused by the user's suction). The processor 110 may, for example, obtain the airflow velocity through a flow velocity sensor. In some embodiments, these parameters may also include the air pressure in the liquid storage bin 120. The processor 110 may, for example, obtain the air pressure in the liquid storage bin 120 through an air pressure sensor. It is understood that these parameters may also include any other appropriate parameters (for example, the height of the remaining atomization substrate in the liquid storage bin 120, the frequency of the atomization action, etc.), which are not limited in the present disclosure. In the embodiment of the present disclosure, these parameters can be obtained by using existing sensors, timers, etc. of the atomization device 110 without the need for additional components.

[0040] In block 220, the processor 110 determines the consumption of the atomized substrate by the current atomization action based on multiple parameters. In some embodiments, the processor 110 can output the predicted consumption corresponding to the coefficients based on the coefficients, for example, using a trained neural network.

[0041] In some embodiments, the processor 110 can also directly calculate these parameters, and the calculation result obtained can indicate the consumption of the atomized substrate. The processor 110 can determine multiple consumption efficiency coefficients corresponding to multiple parameters respectively. Each consumption efficiency coefficient in the multiple efficiency coefficients here indicates the influence degree of the corresponding parameter on the consumption efficiency of the atomized substrate. Exemplarily, taking the four parameters including the airflow velocity caused by the atomization action, the measurement duration of the atomization action, the time interval between the current atomization action and the previous atomization action, and the ambient temperature of the atomized substrate when the current atomization action occurs as an example, the multiple consumption efficiency coefficients corresponding to these four parameters can be, for example, the coefficient Sn corresponding to the flow velocity, the coefficient Dn corresponding to the atomization duration, the coefficient In corresponding to the atomization interval, and the coefficient Tn corresponding to the ambient temperature. The coefficient Sn corresponding to the flow velocity can indicate the influence degree of the airflow velocity caused by the atomization action on the consumption efficiency of the atomized substrate. The coefficient Dn corresponding to the atomization duration can indicate the influence degree of the measurement duration of the atomization action on the consumption efficiency of the atomized substrate. The coefficient In corresponding to the atomization interval can indicate the influence degree of the time interval between the current atomization action and the previous atomization action on the consumption efficiency of the atomized substrate. The coefficient Tn corresponding to the ambient temperature can indicate the degree of influence of the ambient temperature of the atomized substrate on the consumption efficiency of the atomized substrate when the current atomization action occurs.

[0042] Regarding the manner of determining multiple consumption efficiency coefficient values ​​corresponding to multiple consumption efficiency coefficients, in some embodiments, the processor 110 may obtain a predetermined parameter coefficient mapping for each parameter in the multiple parameters. The parameter coefficient mapping here indicates the correspondence between different parameter values ​​of the parameter and different consumption efficiency coefficient values. The parameter coefficient mapping here may be, for example, a parameter-coefficient corresponding table, a parameter-coefficient corresponding fitting curve, etc. The processor 110 may determine the consumption efficiency coefficient value corresponding to the current value of the parameter based on the parameter value corresponding to the parameter and such a parameter coefficient mapping. For example, the corresponding consumption efficiency coefficient value may be found by looking up the table through the parameter value corresponding to the parameter.

[0043] As for the parameter of atomization flow rate, the greater the atomization flow rate, the more smoke is carried away by the airflow, so that there is no accumulated smoke in the airway, more smoke is produced, and the consumption of atomization substrate is greater. Therefore, the consumption efficiency coefficient Sn of atomization flow rate increases with the increase of atomization flow rate. Figure 3FIG. 3 is a schematic diagram showing an example parameter coefficient map 300 for flow rate according to some embodiments of the present disclosure. Figure 3 As shown, the parameter coefficient map 300 shows the corresponding relationship between the airflow velocity parameter caused by the atomization action and the corresponding consumption efficiency coefficient. The processor 110 can determine the coefficient Sn corresponding to the flow velocity based on the determined flow velocity value and the parameter coefficient map 300. For example, if the current flow velocity is 80, the processor 110 can determine the ordinate corresponding to the curve at the flow velocity 80 as the coefficient value of the coefficient Sn corresponding to the flow velocity.

[0044] As for the parameter of atomization time, the longer the atomization time is, the smaller the proportion of the time occupied by temperature rise is, that is, the longer the time of atomizing the e-liquid is, the higher the efficiency is. Therefore, the consumption efficiency coefficient Dn of the atomization time increases with the increase of the atomization time. Figure 4 FIG. 4 is a schematic diagram showing an example parameter coefficient mapping 400 of atomization duration according to some embodiments of the present disclosure. Figure 4 As shown, the parameter coefficient map 400 shows the corresponding relationship between the parameter of the measured duration of the atomization action (i.e., the atomization duration) and its corresponding consumption efficiency coefficient. The processor 110 can determine the coefficient Dn corresponding to the atomization duration based on the determined value of the atomization duration and the parameter coefficient map 400. For example, if the current atomization duration is 6000, the processor 110 can determine the ordinate corresponding to the curve at the atomization duration 6000 as the coefficient value of the coefficient Dn corresponding to the atomization duration.

[0045] As for the parameter of atomization interval, the longer the atomization interval is, the more the heating element cools down, the longer it takes to reheat, the longer it takes to atomize the atomization matrix, and the efficiency decreases. Therefore, the consumption efficiency coefficient In of the atomization interval decreases as the atomization interval increases. Figure 5 FIG. 5 is a schematic diagram showing an example parameter coefficient map 500 for atomization interval according to some embodiments of the present disclosure. Figure 5 As shown, the parameter coefficient map 500 shows the corresponding relationship between the time interval between the current atomization action and the previous atomization action (i.e., the atomization interval) and the corresponding consumption efficiency coefficient. The processor 110 can determine the coefficient In corresponding to the atomization interval based on the determined value of the atomization interval and the parameter coefficient map 500. For example, if the current atomization interval is 50000, the processor 110 can determine the ordinate corresponding to the curve at the atomization interval 50000 as the coefficient value of the coefficient In corresponding to the atomization interval.

[0046] As for the parameter of ambient temperature, the higher the ambient temperature, the shorter the time it takes to reach the atomization temperature point of the heating element, the longer the time it takes to atomize the atomized matrix, and the higher the efficiency. Therefore, the consumption efficiency coefficient Tn of ambient temperature increases with the increase of ambient temperature. Figure 6 As shown, the parameter coefficient map 600 shows the corresponding relationship between the parameter of the ambient temperature of the atomized substrate when the current atomization action occurs and the corresponding consumption efficiency coefficient. The processor 110 can determine the coefficient Tn corresponding to the ambient temperature based on the determined value of the ambient temperature and the parameter coefficient map 600. For example, if the current ambient temperature is 45, the processor 110 can determine the ordinate corresponding to the curve at the ambient temperature 45 as the coefficient value of the coefficient Tn corresponding to the ambient temperature.

[0047] In this embodiment, by using this predetermined mapping, the coefficients of various parameters can be quickly determined by table lookup without causing excessive calculation and resource consumption.

[0048] Further, the processor 110 can determine the consumption based on multiple consumption efficiency coefficients, the measured duration of the current atomization action, and the reference consumption rate of the atomization substrate. The measured duration of the current atomization action here is regarded as the actual atomization duration of the current user, which can be represented by Xn, for example. The reference consumption rate of the atomization substrate here is the amount of atomization substrate consumed per unit time, which can be, for example, an inherent property of the atomization substrate. That is, the reference consumption rate corresponding to the same atomization substrate is the same. The reference consumption rate can be represented by G, for example. In an embodiment of the present disclosure, multiple parameters or factors should be considered comprehensively. To this end, a multidimensional variable fitting algorithm can be used to detect the remaining amount. Taking into account multiple variable factors, a multivariate gradient descent or ascent method is used to calculate the actual consumption, as described below.

[0049] In some embodiments, the processor 110 may use multiple parameters to convert the measured duration into an equivalent duration of the atomization action, and then calculate the consumption based on the equivalent duration and the reference consumption rate. For example, the processor 110 may determine the consumption by the following formula:

[0050] Kn=Sn*Dn*In*Tn (1)

[0051] [H0,H1,……,Hn] T =[K0,K1,…,Kn]·[X0,X1,…,Xn] T (2)

[0052] H=(H0+H1+…+Hn)*G (3)

[0053] Wherein, formula (2) can also be expressed as Hn=Kn*Xn, where n represents the nth atomization action. For the nth atomization, the processor 110 can, for example, use formula (1) to determine the fitting coefficient Kn of multiple consumption efficiency coefficients. The processor 110 can then use formula (2) to determine the consumption coefficient Hn of the atomization matrix corresponding to the nth atomization, and Hn can be regarded as the equivalent duration converted from the measured duration Xn of the nth atomization. Therefore, the consumption of the atomization matrix by the nth atomization is Hn*G. Furthermore, the processor 110 can, for example, use formula (3) to determine the total consumption H from the 0th atomization to the nth atomization.

[0054] In some embodiments, the processor 110 may also use multiple parameters to convert the reference consumption rate into an equivalent consumption rate of the atomized substrate, and then calculate the consumption based on the equivalent consumption rate and the measurement duration. For example, the processor 110 may determine the consumption by the following formula:

[0055] The consumption of the nth time = Kn*Xn*G = Xn*(Kn*G) (4)

[0056] In this case, Kn*G can be regarded as converting the reference consumption speed G into the equivalent consumption speed of the nth atomization. The processor 110 can determine the consumption corresponding to the nth atomization action by calculating the product between the equivalent consumption speed Kn*G and the measured duration Xn.

[0057] Continue to refer Figure 2 At block 230, processor 110 determines a remaining amount of aerosolized substrate based at least on the consumed amount.

[0058] In some embodiments, the processor 110 may update the remaining amount of the atomized substrate after the previous atomization action based on the consumption. For example, the processor 110 may store the remaining amount after the previous atomization action. After determining the consumption of this atomization action, the processor 110 may determine the remaining amount of the atomized substrate after this atomization action by subtracting the consumption of this atomization action from the remaining amount after the previous atomization action. The processor 110 may determine the remaining amount, for example, by the following formula:

[0059] R″=R′-H′ (5)

[0060] Among them, R' is the remaining amount after the previous atomization action, H' is the consumption of this atomization action, and R' is the remaining amount of the atomized substrate after this atomization action.

[0061] In some embodiments, the processor 110 may also calculate the remaining amount based on the consumption, the corresponding consumption of the previous atomization action that occurred before the atomization action, and the initial amount of the atomization substrate. For example, the processor 110 may store the initial amount of the atomization substrate and the corresponding consumption of at least one previous atomization action before the current atomization action. After the processor 110 determines the consumption of this atomization action, it can determine the remaining amount of the atomization substrate after this atomization action by subtracting the corresponding consumption of the previous atomization action and the consumption of this atomization action from the initial amount. The processor 110 may determine the remaining amount, for example, by the following formula:

[0062] R=SH (6)

[0063] Among them, S is the initial amount of the atomized substrate, H is the sum of the corresponding consumption of the previous atomization action and the consumption of this atomization action, and R is the remaining amount of the atomized substrate after this atomization action.

[0064] In the example embodiments described above, the atomization duration, atomization interval, atomization flow rate, and ambient temperature are all taken into consideration in the calculation of the atomized substrate residual amount. However, it should be understood that this is only exemplary, and other factors may also be considered, or different combinations of the above factors may be considered. For example, in some other embodiments, only the atomization duration and atomization interval may be considered, or on the basis of considering the atomization duration and atomization interval, at least one of the atomization flow rate and ambient temperature may be considered.

[0065] In summary, according to an embodiment of the present disclosure, for an atomization device, a processor can obtain multiple parameters associated with the current atomization action of an atomized substrate. The processor can determine the consumption of the atomized substrate based on these parameters, and then determine the remaining amount of the atomized substrate. In this way, the accuracy of detecting the remaining amount of the atomized substrate can be improved.

[0066] Figure 7 A schematic structural block diagram of an atomization device 700 according to some embodiments of the present disclosure is shown. Each module / component in the atomization device 700 may be implemented by hardware, software, firmware or any combination thereof.

[0067] The atomizing device 700 includes a parameter acquisition module 710, which is configured to acquire multiple parameters associated with the current atomization action of the atomized substrate, and the multiple parameters include at least one of the following: the time interval between the current atomization action and the previous atomization action, or the ambient temperature of the atomized substrate when the current atomization action occurs. The atomizing device 700 also includes a consumption determination module 720, which is configured to determine the consumption of the atomized substrate by the current atomization action based on the multiple parameters. The atomizing device 700 also includes a remaining amount determination module 730, which is configured to determine the remaining amount of the atomized substrate based at least on the consumption.

[0068] In some embodiments, the consumption determination module 720 includes: an efficiency coefficient determination module, configured to determine multiple consumption efficiency coefficients corresponding to multiple parameters respectively, each of the multiple efficiency coefficients indicating the degree of influence of the corresponding parameter on the consumption efficiency of the atomized substrate; and a first determination module, configured to determine the consumption based on the multiple consumption efficiency coefficients, the measured duration of the current atomization action and the baseline consumption speed of the atomized substrate.

[0069] In some embodiments, the efficiency coefficient determination module is further configured to: for each parameter among multiple parameters, obtain a predetermined parameter coefficient mapping for the parameter, the parameter coefficient mapping indicating the correspondence between different parameter values ​​of the parameter and different consumption efficiency coefficient values; and determine the consumption efficiency coefficient value corresponding to the current value of the parameter based on the parameter coefficient mapping.

[0070] In some embodiments, the first determination module includes: a first conversion module configured to convert the measured duration into an equivalent duration of the atomization action using multiple parameters; and a first calculation module configured to calculate the consumption based on the equivalent duration and a reference consumption speed.

[0071] In some embodiments, the first determination module includes: a second conversion module configured to convert a reference consumption rate into an equivalent consumption rate of the atomized substrate using multiple parameters; and a second calculation module configured to calculate the consumption amount based on the equivalent consumption rate and the measurement duration.

[0072] In some embodiments, the remaining amount determination module 730 includes at least one of the following: a remaining amount updating module, configured to update the remaining amount of the atomization substrate after the previous atomization action based on the consumption, or a remaining amount calculation module, configured to calculate the remaining amount based on the consumption, the corresponding consumption of the previous atomization action occurring before the atomization action, and the initial amount of the atomization substrate.

[0073] In some embodiments, the plurality of parameters further comprises at least one of the following: a measured duration of the nebulization action, or a flow rate of the airflow caused by the nebulization action.

[0074] In some embodiments, the consumption efficiency coefficient corresponding to the time interval decreases as the time interval increases.

[0075] In some embodiments, the consumption efficiency coefficient corresponding to the ambient temperature increases as the ambient temperature increases.

[0076] The units and / or modules included in the atomization device 700 can be implemented in various ways, including software, hardware, firmware, or any combination thereof. In some embodiments, one or more units and / or modules can be implemented using software and / or firmware, such as machine executable instructions stored on a storage medium. In addition to or as an alternative to machine executable instructions, some or all of the units and / or modules in the atomization device 700 can be implemented at least in part by one or more hardware logic components. As an example and not limitation, exemplary types of hardware logic components that can be used include field programmable gate arrays (FPGAs), application specific integrated circuits (ASICs), application specific standard products (ASSPs), systems on chips (SOCs), complex programmable logic devices (CPLDs), and the like.

[0077] According to an exemplary implementation of the present disclosure, a machine-readable storage medium is also provided, on which machine-executable instructions are stored, wherein the machine-executable instructions are executed by a processor to implement the method described above. According to an exemplary implementation of the present disclosure, a program product is also provided, which is tangibly stored on a non-transitory machine-readable medium and includes machine-executable instructions, and the machine-executable instructions are executed by a processor to implement the method described above.

[0078] Various aspects of the present disclosure are described herein with reference to the flowcharts and / or block diagrams of the methods, devices, equipment, and program products implemented according to the present disclosure. It should be understood that each box in the flowchart and / or block diagram and the combination of each box in the flowchart and / or block diagram can be implemented by machine-readable program instructions.

[0079] These machine-readable program instructions can be provided to a processing unit of a general-purpose computer, a special-purpose computer, a server, a single-chip microcomputer and its cluster or other programmable data processing device, so as to produce a machine, so that when these instructions are executed by the machine, the programmable data processing device and / or other equipment, a device that implements the functions / actions specified in one or more boxes in the flowchart and / or block diagram is generated. These machine-readable program instructions can also be stored in a machine-readable storage medium, and these instructions make the machine, the programmable data processing device and / or other equipment work in a specific way, so that the machine-readable medium storing the instructions includes a manufactured product, which includes instructions for implementing various aspects of the functions / actions specified in one or more boxes in the flowchart and / or block diagram.

[0080] Machine-readable program instructions may be loaded onto a machine, other programmable data processing apparatus, or other device so that a series of operational steps are performed on the machine, other programmable data processing apparatus, or other device to produce a machine-implemented process, thereby causing the instructions executed on the machine, other programmable data processing apparatus, or other device to implement the functions / actions specified in one or more boxes in the flowchart and / or block diagram.

[0081] The flow chart and block diagram in the accompanying drawings show the possible architecture, function and operation of the system, method and program product according to multiple implementations of the present disclosure. In this regard, each square frame in the flow chart or block diagram can represent a part of a module, program segment or instruction, and a part of a module, program segment or instruction comprises one or more executable instructions for realizing the logical function of the specification. In some implementations as replacements, the function marked in the square frame can also occur in a sequence different from that marked in the accompanying drawings. For example, two continuous square frames can actually be executed substantially in parallel, and they can also be executed in the opposite order sometimes, depending on the function involved. It should also be noted that each square frame in the block diagram and / or flow chart, and the combination of the square frames in the block diagram and / or flow chart can be realized by a special hardware-based system that performs the function or action of the specification, or can be realized by a combination of special hardware and machine instructions.

[0082] The above descriptions of various implementations of the present disclosure are exemplary, non-exhaustive, and not limited to the disclosed implementations. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the described implementations. The selection of terms used herein is intended to best explain the principles of the implementations, practical applications, or improvements to the technology in the market, or to enable other persons of ordinary skill in the art to understand the various implementations disclosed herein.

Claims

1. A method for detecting the remaining amount of an atomized substrate, comprising: Acquire a plurality of parameters associated with a current atomization action of the atomized substrate, wherein the plurality of parameters include at least one of the following: The time interval between the current atomization action and the previous atomization action, or The ambient temperature of the atomized substrate when the current atomization action occurs; Based on the multiple parameters, determining the consumption of the atomization substrate by the current atomization action; as well as Based at least on the consumed amount, a remaining amount of the aerosolized substrate is determined.

2. The method according to claim 1, wherein determining the consumption of the atomization substrate by the atomization action comprises: Determining a plurality of consumption efficiency coefficients corresponding to the plurality of parameters respectively, each of the plurality of consumption efficiency coefficients indicating a degree of influence of the corresponding parameter on the consumption efficiency of the atomized substrate; as well as The consumption amount is determined based on the plurality of consumption efficiency coefficients, a measured duration of the current atomization action and a reference consumption rate of the atomized substrate.

3. The method according to claim 2, wherein determining a plurality of consumption efficiency coefficients respectively corresponding to the plurality of parameters comprises: For each parameter of the plurality of parameters, Obtaining a predetermined parameter coefficient map for the parameter, the parameter coefficient map indicating a correspondence between different parameter values ​​of the parameter and different consumption efficiency coefficient values; as well as According to the parameter coefficient mapping, a consumption efficiency coefficient value corresponding to the current value of the parameter is determined.

4. The method of claim 2, wherein determining the consumption amount based on the plurality of consumption efficiency coefficients, the measured duration of the atomization action, and a reference consumption rate of the atomized substrate comprises: Using the plurality of parameters, converting the measured duration into an equivalent duration of the atomization action; as well as The consumption amount is calculated based on the equivalent duration and the reference consumption speed.

5. The method of claim 2, wherein determining the consumption amount based on the plurality of consumption efficiency coefficients, the measured duration of the atomization action, and a reference consumption rate of the atomized substrate comprises: Using the plurality of parameters, converting the reference consumption rate into an equivalent consumption rate of the atomized substrate; as well as Based on the equivalent consumption speed and the measurement duration, the consumption amount is calculated.

6. The method of claim 1, wherein determining the remaining amount of the atomized substrate comprises at least one of the following: Based on the consumption, updating the remaining amount of the atomized substrate after the previous atomization action, or The remaining amount is calculated based on the consumption amount, the corresponding consumption amount of a previous nebulization action occurring before the nebulization action and the initial amount of the nebulized substrate.

7. The method according to claim 1, wherein the plurality of parameters further comprises at least one of the following: the measured duration of the nebulizing action, or The airflow rate caused by the atomization action. 8 . The method according to claim 2 , wherein the consumption efficiency coefficient corresponding to the time interval decreases as the time interval increases. 9 . The method according to claim 2 , wherein the consumption efficiency coefficient corresponding to the ambient temperature increases as the ambient temperature increases.

10. An atomization device, comprising: a liquid storage tank configured to contain an aerosolized substrate; as well as The processor is configured as: Acquire a plurality of parameters associated with a current atomization action of the atomized substrate, wherein the plurality of parameters include at least one of the following: the time interval between the current atomization action and the previous atomization action, or The ambient temperature of the atomized substrate when the current atomization action occurs; Based on the multiple parameters, determining the consumption of the atomization substrate by the current atomization action; as well as Based at least on the consumed amount, a remaining amount of the aerosolized substrate is determined.

11. An atomization device, comprising: A parameter acquisition module is configured to acquire a plurality of parameters associated with a current atomization action on an atomized substrate, wherein the plurality of parameters include at least one of the following: a time interval between the current atomization action and a previous atomization action, or an ambient temperature of the atomized substrate when the current atomization action occurs; A consumption determination module is configured to determine the consumption of the atomization substrate by the current atomization action based on the multiple parameters; as well as The remaining amount determination module is configured to determine the remaining amount of the atomized substrate based at least on the consumption amount.

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