Calibration method and device of strain acquisition equipment, electronic equipment and storage medium

Abstract

The invention discloses a calibration method and device of strain acquisition equipment, electronic equipment and a storage medium. The method comprises the following steps: receiving a plurality of first strain values sent by a strain gauge; a plurality of second strain values sent by the strain acquisition device are received, the second strain values are generated based on strain signal values sent by the strain gauge, and the strain signal values are generated based on the first strain values corresponding to the second strain values; obtaining a calibration coefficient of the strain acquisition equipment based on the plurality of first strain values and the plurality of second strain values; the calibration coefficient is sent to the strain acquisition equipment, and the calibration coefficient is used for calibrating parameters of the strain acquisition equipment. Therefore, the calibration coefficient can be automatically calculated through the calibration device based on the plurality of first strain values and the plurality of second strain values, and the calibration coefficient is issued to the strain acquisition device, so that automatic calibration of the strain acquisition device is realized, a lot of manpower and material resources are saved, and the calibration efficiency and accuracy of the strain acquisition device are improved.

Description

Technical Field

[0001] The present invention relates to the technical field of equipment calibration, and in particular to a calibration method, device, electronic equipment and storage medium for strain acquisition equipment. Background Art

[0002] Strain acquisition equipment refers to equipment that collects strain values. In order for the strain acquisition equipment to accurately collect strain values, the strain acquisition equipment needs to be calibrated. However, the calibration method of strain acquisition equipment in related technologies requires manual recording and calculation of data, with many repetitive operations and a large workload, which consumes a lot of manpower and material resources, and has problems of low efficiency and low accuracy. Summary of the invention

[0003] The present invention aims to solve one of the technical problems in the above-mentioned technology at least to some extent.

[0004] To this end, an object of the present invention is to propose a calibration method for a strain acquisition device, which can automatically calculate a calibration coefficient based on a plurality of first strain values ​​and a plurality of second strain values ​​through the calibration device, and send it to the strain acquisition device to realize automatic calibration of the strain acquisition device, thereby saving a lot of manpower and material resources and improving the efficiency and accuracy of the calibration of the strain acquisition device.

[0005] The second objective of the present invention is to provide a calibration device for strain acquisition equipment.

[0006] A third objective of the present invention is to provide an electronic device.

[0007] A fourth object of the present invention is to provide a computer-readable storage medium.

[0008] An embodiment of the first aspect of the present invention proposes a calibration method for a strain acquisition device, which is applicable to the calibration device, and the method includes: receiving multiple first strain values ​​sent by a strain gauge; receiving multiple second strain values ​​sent by the strain acquisition device, wherein the second strain value is generated based on the strain signal value sent by the strain gauge, and the strain signal value is generated based on the first strain value corresponding to the second strain value; obtaining a calibration coefficient of the strain acquisition device based on the multiple first strain values ​​and the multiple second strain values; and sending the calibration coefficient to the strain acquisition device, wherein the calibration coefficient is used to calibrate the parameters of the strain acquisition device.

[0009] According to the calibration method of the strain acquisition device of the embodiment of the present invention, the calibration device receives multiple first strain values ​​sent by the strain gauge, receives multiple second strain values ​​sent by the strain acquisition device, wherein the second strain value is generated based on the strain signal value sent by the strain gauge, and the strain signal value is generated based on the first strain value corresponding to the second strain value, and based on the multiple first strain values ​​and the multiple second strain values, obtains the calibration coefficient of the strain acquisition device, and sends the calibration coefficient to the strain acquisition device, wherein the calibration coefficient is used to calibrate the parameters of the strain acquisition device. Thus, the calibration coefficient can be automatically calculated based on the multiple first strain values ​​and the multiple second strain values ​​by the calibration device, and sent to the strain acquisition device, so as to realize the automatic calibration of the strain acquisition device, save a lot of manpower and material resources, and improve the efficiency and accuracy of the calibration of the strain acquisition device.

[0010] In addition, the calibration method of the strain acquisition device proposed in the above embodiment of the present invention may also have the following additional technical features:

[0011] In one embodiment of the present invention, obtaining the calibration coefficient of the strain acquisition device based on multiple first strain values ​​and multiple second strain values ​​includes: generating a set of data based on first strain values ​​and second strain values ​​having a corresponding relationship; and obtaining the calibration coefficient based on multiple sets of data.

[0012] In one embodiment of the present invention, obtaining the calibration coefficient based on multiple sets of data includes: determining a sample point in a two-dimensional coordinate system corresponding to a set of data based on a first strain value and a second strain value having a corresponding relationship in a set of data; fitting the sample points corresponding to the multiple sets of data to obtain a target line segment; and obtaining the calibration coefficient based on a function parameter corresponding to the target line segment.

[0013] An embodiment of the second aspect of the present invention proposes another calibration method for a strain acquisition device, which is applicable to a strain gauge. The method includes: sending multiple first strain values ​​to a calibration device; generating a strain signal value based on the first strain value; and sending the multiple strain signal values ​​to a strain acquisition device, wherein the strain signal value is used to generate a second strain value corresponding to the first strain value.

[0014] According to the calibration method of the strain acquisition device of the embodiment of the present invention, the strain gauge sends multiple first strain values ​​to the calibration device, generates strain signal values ​​based on the first strain values, and sends the multiple strain signal values ​​to the strain acquisition device, wherein the strain signal values ​​are used to generate the second strain value corresponding to the first strain value. Thus, the strain gauge can send the multiple first strain values ​​to the calibration device, and send the multiple strain signal values ​​to the strain acquisition device, so as to realize the automatic calibration of the strain acquisition device, save a lot of manpower and material resources, and improve the efficiency and accuracy of the calibration of the strain acquisition device.

[0015] In addition, the calibration method of the strain acquisition device proposed in the above embodiment of the present invention may also have the following additional technical features:

[0016] In one embodiment of the present invention, generating a strain signal value based on the first strain value includes: converting the first strain value to obtain the strain signal value.

[0017] In one embodiment of the present invention, before sending the plurality of first strain values ​​to the calibration device, the method further includes: generating the plurality of first strain values ​​according to a set period.

[0018] An embodiment of the third aspect of the present invention proposes another calibration method for a strain acquisition device, which is applicable to the strain acquisition device, and the method includes: receiving multiple strain signal values ​​sent by a strain gauge, wherein the strain signal value is generated based on a first strain value of the strain gauge; generating a second strain value corresponding to the first strain value based on the strain signal value; sending the multiple second strain values ​​to a calibration device; receiving a calibration coefficient of the strain acquisition device sent by the calibration device; and calibrating the parameters of the strain acquisition device based on the calibration coefficient.

[0019] According to the calibration method of the strain acquisition device of the embodiment of the present invention, the strain acquisition device receives multiple strain signal values ​​sent by the strain gauge, wherein the strain signal value is generated based on the first strain value of the strain gauge, generates a second strain value corresponding to the first strain value based on the strain signal value, sends the multiple second strain values ​​to the calibration device, receives the calibration coefficient of the strain acquisition device sent by the calibration device, and calibrates the parameters of the strain acquisition device based on the calibration coefficient. Thus, the strain acquisition device can send the multiple second strain values ​​to the calibration device, and receive the calibration coefficient sent by the calibration device, so as to realize the automatic calibration of the strain acquisition device, save a lot of manpower and material resources, and improve the efficiency and accuracy of the calibration of the strain acquisition device.

[0020] An embodiment of the fourth aspect of the present invention proposes a calibration device for a strain acquisition device, which is suitable for calibration equipment, and the device includes: a first receiving module, used to receive multiple first strain values ​​sent by a strain gauge; a second receiving module, used to receive multiple second strain values ​​sent by the strain acquisition device, wherein the second strain value is generated based on the strain signal value sent by the strain gauge, and the strain signal value is generated based on the first strain value corresponding to the second strain value; an acquisition module, used to obtain a calibration coefficient of the strain acquisition device based on multiple first strain values ​​and multiple second strain values; a sending module, used to send the calibration coefficient to the strain acquisition device, wherein the calibration coefficient is used to calibrate the parameters of the strain acquisition device.

[0021] The calibration device of the strain acquisition device of the embodiment of the present invention receives multiple first strain values ​​sent by the strain gauge, receives multiple second strain values ​​sent by the strain acquisition device, wherein the second strain value is generated based on the strain signal value sent by the strain gauge, and the strain signal value is generated based on the first strain value corresponding to the second strain value, obtains the calibration coefficient of the strain acquisition device based on the multiple first strain values ​​and the multiple second strain values, and sends the calibration coefficient to the strain acquisition device, wherein the calibration coefficient is used to calibrate the parameters of the strain acquisition device. Thus, the calibration coefficient can be automatically calculated based on the multiple first strain values ​​and the multiple second strain values ​​by the calibration device, and sent to the strain acquisition device, so as to realize the automatic calibration of the strain acquisition device, save a lot of manpower and material resources, and improve the efficiency and accuracy of the calibration of the strain acquisition device.

[0022] In addition, the calibration device for strain acquisition equipment proposed in the above embodiment of the present invention may also have the following additional technical features:

[0023] In one embodiment of the present invention, the acquisition module is further used to: generate a set of data based on the first strain value and the second strain value having a corresponding relationship; and obtain the calibration coefficient based on multiple sets of data.

[0024] In one embodiment of the present invention, the acquisition module is also used to: determine a sample point in a two-dimensional coordinate system corresponding to a set of data based on a first strain value and a second strain value having a corresponding relationship in a set of data; fit the sample points corresponding to multiple sets of data to obtain a target line segment; and obtain the calibration coefficient based on the function parameters corresponding to the target line segment.

[0025] The fifth aspect embodiment of the present invention proposes another calibration device for a strain acquisition device, which is suitable for a strain gauge. The device includes: a first sending module, used to send multiple first strain values ​​to the calibration device; a generating module, used to generate a strain signal value based on the first strain value; a second sending module, used to send the multiple strain signal values ​​to the strain acquisition device, wherein the strain signal value is used to generate a second strain value corresponding to the first strain value.

[0026] The calibration device of the strain acquisition device of the embodiment of the present invention sends multiple first strain values ​​to the calibration device, generates strain signal values ​​based on the first strain values, and sends the multiple strain signal values ​​to the strain acquisition device, wherein the strain signal value is used to generate a second strain value corresponding to the first strain value. Thus, the strain gauge can send multiple first strain values ​​to the calibration device, and send multiple strain signal values ​​to the strain acquisition device, so as to realize automatic calibration of the strain acquisition device, save a lot of manpower and material resources, and improve the efficiency and accuracy of the calibration of the strain acquisition device.

[0027] In addition, the calibration device for strain acquisition equipment proposed in the above embodiment of the present invention may also have the following additional technical features:

[0028] In one embodiment of the present invention, the generating module is further used to: convert the first strain value to obtain the strain signal value.

[0029] In one embodiment of the present invention, before sending the plurality of first strain values ​​to the calibration device, the generating module is further used to: generate the plurality of first strain values ​​according to a set period.

[0030] The sixth aspect embodiment of the present invention proposes another calibration device for strain acquisition equipment, which is suitable for strain acquisition equipment, and the device includes: a first receiving module, used to receive multiple strain signal values ​​sent by a strain gauge, wherein the strain signal value is generated based on the first strain value of the strain gauge; a generating module, used to generate a second strain value corresponding to the first strain value based on the strain signal value; a sending module, used to send the multiple second strain values ​​to a calibration device; a second receiving module, used to receive the calibration coefficient of the strain acquisition equipment sent by the calibration device; and a calibration module, used to calibrate the parameters of the strain acquisition equipment based on the calibration coefficient.

[0031] The calibration device of the strain acquisition device of the embodiment of the present invention receives multiple strain signal values ​​sent by the strain gauge, wherein the strain signal value is generated based on the first strain value of the strain gauge, generates a second strain value corresponding to the first strain value based on the strain signal value, sends the multiple second strain values ​​to the calibration device, receives the calibration coefficient of the strain acquisition device sent by the calibration device, and calibrates the parameters of the strain acquisition device based on the calibration coefficient. Thus, the strain acquisition device can send the multiple second strain values ​​to the calibration device, and receive the calibration coefficient sent by the calibration device, so as to realize the automatic calibration of the strain acquisition device, save a lot of manpower and material resources, and improve the efficiency and accuracy of the calibration of the strain acquisition device.

[0032] The seventh aspect embodiment of the present invention proposes an electronic device, comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the program, the calibration method of the strain acquisition device as described in the first to third aspects embodiments of the present invention is implemented.

[0033] The electronic device of the embodiment of the present invention executes a computer program stored in a memory through a processor, receives multiple first strain values ​​sent by a strain gauge, receives multiple second strain values ​​sent by a strain acquisition device, wherein the second strain value is generated based on the strain signal value sent by the strain gauge, and the strain signal value is generated based on the first strain value corresponding to the second strain value, obtains a calibration coefficient of the strain acquisition device based on the multiple first strain values ​​and the multiple second strain values, and sends the calibration coefficient to the strain acquisition device, wherein the calibration coefficient is used to calibrate the parameters of the strain acquisition device. Thus, the calibration coefficient can be automatically calculated by the calibration device based on the multiple first strain values ​​and the multiple second strain values, and sent to the strain acquisition device, so as to realize automatic calibration of the strain acquisition device, save a lot of manpower and material resources, and improve the efficiency and accuracy of calibration of the strain acquisition device.

[0034] The eighth embodiment of the present application proposes a computer-readable storage medium on which a computer program is stored. When the program is executed by a processor, the calibration method of the strain acquisition device as described in the first to third embodiments of the present application is implemented.

[0035] The computer-readable storage medium of the embodiment of the present invention receives multiple first strain values ​​sent by the strain gauge, receives multiple second strain values ​​sent by the strain acquisition device, wherein the second strain value is generated based on the strain signal value sent by the strain gauge, and the strain signal value is generated based on the first strain value corresponding to the second strain value, obtains the calibration coefficient of the strain acquisition device based on the multiple first strain values ​​and the multiple second strain values, and sends the calibration coefficient to the strain acquisition device, wherein the calibration coefficient is used to calibrate the parameters of the strain acquisition device. Thus, the calibration coefficient can be automatically calculated based on the multiple first strain values ​​and the multiple second strain values ​​by the calibration device, and sent to the strain acquisition device, so as to realize the automatic calibration of the strain acquisition device, save a lot of manpower and material resources, and improve the efficiency and accuracy of the calibration of the strain acquisition device.

[0036] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] The above and / or additional aspects and advantages of the present invention will become apparent and easily understood from the following description of the embodiments in conjunction with the accompanying drawings, in which:

[0038] Figure 1 A schematic diagram of a flow chart of a calibration method for a strain acquisition device according to an embodiment of the present invention;

[0039] Figure 2 A schematic diagram of a flow chart of a calibration method for a strain acquisition device according to another embodiment of the present invention;

[0040] Figure 3 A schematic diagram of a flow chart of a calibration method for a strain acquisition device according to another embodiment of the present invention;

[0041] Figure 4 An interactive schematic diagram of a calibration method for a strain acquisition device according to an embodiment of the present invention;

[0042] Figure 5 A schematic diagram of the structure of a calibration device for a strain acquisition device according to an embodiment of the present invention;

[0043] Figure 6 is a schematic structural diagram of a calibration device for a strain acquisition device according to another embodiment of the present invention;

[0044] Figure 7 is a schematic structural diagram of a calibration device for a strain acquisition device according to another embodiment of the present invention;

[0045] Figure 8 FIG. 1 is a schematic structural diagram of an electronic device according to an embodiment of the present invention. DETAILED DESCRIPTION

[0046] Embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended to be used to explain the present invention, and should not be construed as limiting the present invention.

[0047] The following describes the calibration method, device, electronic device and storage medium of the strain acquisition device according to the embodiments of the present invention in conjunction with the accompanying drawings.

[0048] Figure 1 The present invention is a flowchart of a calibration method for a strain acquisition device according to an embodiment of the present invention. The present invention is applicable to a calibration device. The calibration device is not limited in many ways, for example, it may include a computer. For example, calibration software is deployed on the calibration device, and the calibration method for the strain acquisition device according to the embodiment of the present invention can be implemented through the calibration software.

[0049] like Figure 1 As shown, the calibration method of the strain acquisition device according to the embodiment of the present invention includes:

[0050] S101, receiving a plurality of first strain values ​​sent by a strain gauge.

[0051] It should be noted that there are no excessive limitations on the strain gauge, for example, it may include a resistance strain gauge, a voltage strain gauge, etc. The first strain value may include a strain value of the target object collected by the strain gauge, and may also include a strain value applied to the target object by the strain gauge. The target object refers to an object that undergoes strain.

[0052] S102, receiving a plurality of second strain values ​​sent by a strain acquisition device, wherein the second strain values ​​are generated based on strain signal values ​​sent by a strain gauge, and the strain signal values ​​are generated based on first strain values ​​corresponding to the second strain values.

[0053] It should be noted that there are no excessive restrictions on the strain acquisition device, for example, it may include a strain sensor.

[0054] It should be noted that there are no excessive restrictions on the strain signal value, for example, it may include a voltage value, a resistance value, etc.

[0055] It should be noted that there is a corresponding relationship between the first strain value, the strain signal value, and the second strain value. For example, the first strain value and the strain signal value correspond one to one, and one first strain value and one strain signal value may correspond to at least one second strain value.

[0056] For example, the calibration device may receive a plurality of first strain values ​​A1, A2, and A3 sent by the strain gauge, and may also receive a plurality of second strain values ​​B1, B2, and B3 sent by the strain acquisition device.

[0057] The second strain value B1 is generated based on the strain signal value C1 sent by the strain gauge, and the strain signal value C1 is generated based on the first strain value A1 corresponding to the second strain value B1.

[0058] The second strain value B2 is generated based on the strain signal value C2 sent by the strain gauge, and the strain signal value C2 is generated based on the first strain value A2 corresponding to the second strain value B2.

[0059] The second strain value B3 is generated based on the strain signal value C3 sent by the strain gauge, and the strain signal value C3 is generated based on the first strain value A3 corresponding to the second strain value B3.

[0060] S103: Obtain a calibration coefficient of a strain acquisition device based on the multiple first strain values ​​and the multiple second strain values.

[0061] In the embodiments of the present disclosure, the calibration coefficient of the strain acquisition device is obtained based on the multiple first strain values ​​and the multiple second strain values, which may include the following possible implementations:

[0062] Method 1: obtaining a first average value of a plurality of first strain values, obtaining a second average value of a plurality of second strain values, and obtaining a calibration coefficient based on the first average value and the second average value.

[0063] In one embodiment, obtaining a calibration coefficient based on the first average value and the second average value includes taking a ratio or a difference between the first average value and the second average value as the calibration coefficient.

[0064] Method 2: Based on the first strain value and the second strain value having a corresponding relationship, a set of data is generated, and the calibration coefficient is obtained based on multiple sets of data.

[0065] For example, the calibration device can receive multiple first strain values ​​A1, A2, A3 sent by the strain gauge, and can also receive multiple second strain values ​​B1, B2, B3 sent by the strain acquisition device. A set of data can be generated based on the first strain value A1 and the second strain value B1 with a corresponding relationship, a set of data can be generated based on the first strain value A2 and the second strain value B2 with a corresponding relationship, and a set of data can be generated based on the first strain value A3 and the second strain value B3 with a corresponding relationship.

[0066] In one embodiment, obtaining the calibration coefficient based on multiple sets of data includes obtaining the difference between the first strain value and the second strain value in each set of data, and obtaining the calibration coefficient based on the difference corresponding to the multiple sets of data. For example, the average value of the difference corresponding to the multiple sets of data can be used as the calibration coefficient.

[0067] In one embodiment, obtaining the calibration coefficient based on multiple sets of data includes obtaining the ratio of the first strain value to the second strain value in each set of data, and obtaining the calibration coefficient based on the ratio corresponding to the multiple sets of data. For example, the average value of the ratio corresponding to the multiple sets of data can be used as the calibration coefficient.

[0068] In one embodiment, obtaining the calibration coefficient based on multiple sets of data includes determining a sample point in a two-dimensional coordinate system corresponding to a set of data based on a first strain value and a second strain value having a corresponding relationship in a set of data, fitting the sample points corresponding to the multiple sets of data to obtain a target line segment, and obtaining the calibration coefficient based on a function parameter corresponding to the target line segment. Thus, in this method, line segment fitting can be performed based on multiple sets of data, and the calibration coefficient can be obtained based on the function parameter corresponding to the target line segment.

[0069] It should be noted that the function parameter corresponding to the target line segment refers to the function parameter between the first strain value and the second strain value, for example, it may include the function parameter between the first independent variable value as the dependent variable and the second independent variable value as the independent variable.

[0070] It should be noted that there are no excessive restrictions on the fitting method, for example, it may include linear fitting, curve fitting, etc. If linear fitting is performed on sample points corresponding to multiple sets of data to obtain a target line segment, the function parameters corresponding to the target line segment may include a linear function parameter.

[0071] S104, sending the calibration coefficient to the strain acquisition device, wherein the calibration coefficient is used to calibrate the parameters of the strain acquisition device.

[0072] It should be noted that the calibration coefficient is used to calibrate the parameters of the strain acquisition device, and any calibration method using the calibration coefficient in the related art may be referred to, and no excessive limitation is made here. No excessive limitation is made on the parameters of the strain acquisition device.

[0073] In summary, according to the calibration method of the strain acquisition device of the embodiment of the present invention, the calibration device receives multiple first strain values ​​sent by the strain gauge, receives multiple second strain values ​​sent by the strain acquisition device, wherein the second strain value is generated based on the strain signal value sent by the strain gauge, and the strain signal value is generated based on the first strain value corresponding to the second strain value, and based on the multiple first strain values ​​and the multiple second strain values, obtains the calibration coefficient of the strain acquisition device, and sends the calibration coefficient to the strain acquisition device, wherein the calibration coefficient is used to calibrate the parameters of the strain acquisition device. Thus, the calibration coefficient can be automatically calculated by the calibration device based on the multiple first strain values ​​and the multiple second strain values, and sent to the strain acquisition device, so as to realize the automatic calibration of the strain acquisition device, save a lot of manpower and material resources, and improve the efficiency and accuracy of the calibration of the strain acquisition device.

[0074] Figure 2 FIG. 1 is a flow chart of a calibration method for a strain acquisition device according to another embodiment of the present invention, which is applicable to a strain gauge.

[0075] like Figure 2 As shown, the calibration method of the strain acquisition device according to the embodiment of the present invention includes:

[0076] S201, sending a plurality of first strain values ​​to a calibration device.

[0077] It should be noted that the first strain value may include the strain value of the target object collected by the strain gauge, and may also include the strain value applied to the target object by the strain gauge. The target object refers to an object that undergoes strain.

[0078] In one embodiment, before sending the multiple first strain values ​​to the calibration device, the multiple first strain values ​​of the target object are collected.

[0079] In one embodiment, before sending the plurality of first strain values ​​to the calibration device, the plurality of first strain values ​​are generated according to a set period. It should be noted that the set period is not limited to too many, for example, it may include 5 seconds.

[0080] S202: Generate a strain signal value based on the first strain value.

[0081] In one embodiment, generating a strain signal value based on the first strain value includes performing data preprocessing on the first strain value to obtain a processed first strain value, and generating a strain signal value based on the processed first strain value. It should be noted that data preprocessing is not too limited, for example, it may include data cleaning, data integration, data conversion, data reduction, etc.

[0082] In one embodiment, generating the strain signal value based on the first strain value includes converting the first strain value to obtain the strain signal value. For example, the first strain value may be input into a setting algorithm, and the setting algorithm outputs the strain signal value.

[0083] S203: Send the multiple strain signal values ​​to a strain acquisition device, wherein the strain signal values ​​are used to generate a second strain value corresponding to the first strain value.

[0084] For example, the strain gauge can send multiple first strain values ​​A1, A2, and A3 to the calibration device, and the strain gauge can generate a strain signal value C1 based on the first strain value A1, a strain signal value C2 based on the first strain value A2, and a strain signal value C3 based on the first strain value A3, and send the strain signal values ​​C1, C2, and C3 to the strain acquisition device. The strain signal value C1 is used to generate a second strain value B1 corresponding to the first strain value A1, the strain signal value C2 is used to generate a second strain value B2 corresponding to the first strain value A2, and the strain signal value C3 is used to generate a second strain value B3 corresponding to the first strain value A3.

[0085] In summary, according to the calibration method of the strain acquisition device of the embodiment of the present invention, the strain gauge sends multiple first strain values ​​to the calibration device, generates strain signal values ​​based on the first strain values, and sends the multiple strain signal values ​​to the strain acquisition device, wherein the strain signal values ​​are used to generate the second strain value corresponding to the first strain value. Thus, the strain gauge can send multiple first strain values ​​to the calibration device, and send multiple strain signal values ​​to the strain acquisition device, so as to realize the automatic calibration of the strain acquisition device, save a lot of manpower and material resources, and improve the efficiency and accuracy of the calibration of the strain acquisition device.

[0086] Figure 3 The figure is a flow chart of a calibration method for a strain acquisition device according to another embodiment of the present invention, which is applicable to strain acquisition devices.

[0087] like Figure 3 As shown, the calibration method of the strain acquisition device according to the embodiment of the present invention includes:

[0088] S301 : Receive a plurality of strain signal values ​​sent by a strain gauge, wherein the strain signal value is generated based on a first strain value of the strain gauge.

[0089] For the relevant contents of step S301, please refer to the above embodiment, which will not be repeated here.

[0090] S302: Generate a second strain value corresponding to the first strain value based on the strain signal value.

[0091] S303: Send the plurality of second strain values ​​to a calibration device.

[0092] It should be noted that the strain acquisition device can generate a second strain value based on the strain signal value. The generation of the second strain value can be achieved by using any strain acquisition method in the relevant technology, which is not limited here.

[0093] For example, the strain acquisition device can receive multiple strain signal values ​​C1, C2, and C3 sent by the strain gauge, wherein the strain signal value C1 is generated based on the first strain value A1 of the strain gauge, the strain signal value C2 is generated based on the first strain value A2 of the strain gauge, and the strain signal value C3 is generated based on the first strain value A3 of the strain gauge.

[0094] The strain acquisition device can generate a second strain value B1 corresponding to the first strain value A1 based on the strain signal value C1, generate a second strain value B2 corresponding to the first strain value A2 based on the strain signal value C2, and generate a second strain value B3 corresponding to the first strain value A3 based on the strain signal value C3, and send multiple second strain values ​​B1, B2, and B3 to the calibration device.

[0095] S304, receiving the calibration coefficient of the strain acquisition device sent by the calibration device.

[0096] S305: Calibrate the parameters of the strain acquisition device based on the calibration coefficient.

[0097] For the relevant contents of steps S304-S305, please refer to the above embodiment and will not be repeated here.

[0098] In summary, according to the calibration method of the strain acquisition device of the embodiment of the present invention, the strain acquisition device receives multiple strain signal values ​​sent by the strain gauge, wherein the strain signal value is generated based on the first strain value of the strain gauge, and based on the strain signal value, generates a second strain value corresponding to the first strain value, sends the multiple second strain values ​​to the calibration device, receives the calibration coefficient of the strain acquisition device sent by the calibration device, and calibrates the parameters of the strain acquisition device based on the calibration coefficient. Thus, the strain acquisition device can send multiple second strain values ​​to the calibration device, and receive the calibration coefficient sent by the calibration device, so as to realize the automatic calibration of the strain acquisition device, save a lot of manpower and material resources, and improve the efficiency and accuracy of the calibration of the strain acquisition device.

[0099] Figure 4The figure is an interactive schematic diagram of a calibration method for a strain acquisition device according to an embodiment of the present invention.

[0100] like Figure 4 As shown, the calibration method of the strain acquisition device according to the embodiment of the present invention includes:

[0101] S401: The strain gauge generates a plurality of first strain values ​​according to a set period.

[0102] S402: The strain gauge sends a plurality of first strain values ​​to a calibration device.

[0103] S403: The strain gauge generates a strain signal value based on the first strain value.

[0104] S404: The strain gauge sends a plurality of strain signal values ​​to a strain acquisition device.

[0105] S405: The strain acquisition device generates a second strain value corresponding to the first strain value based on the strain signal value.

[0106] S406: The strain acquisition device sends the plurality of second strain values ​​to the calibration device.

[0107] S407: The calibration device obtains a calibration coefficient of the strain acquisition device based on the multiple first strain values ​​and the multiple second strain values.

[0108] S408, the calibration device sends the calibration coefficient to the strain acquisition device.

[0109] S409: The calibration device calibrates the parameters of the strain acquisition device based on the calibration coefficient.

[0110] For the relevant contents of steps S401-S409, please refer to the above embodiment and will not be repeated here.

[0111] In order to implement the above embodiment, the present invention further provides a calibration device for strain acquisition equipment, which is suitable for calibrating equipment.

[0112] Figure 5 FIG. 4 is a schematic structural diagram of a calibration device for a strain acquisition device according to an embodiment of the present invention.

[0113] like Figure 5 As shown, the calibration device 500 of the strain acquisition device according to the embodiment of the present invention includes: a first receiving module 501 , a second receiving module 502 , an acquisition module 503 and a sending module 504 .

[0114] The first receiving module 501 is used to receive a plurality of first strain values ​​sent by the strain gauge;

[0115] The second receiving module 502 is used to receive a plurality of second strain values ​​sent by the strain acquisition device, wherein the second strain value is generated based on the strain signal value sent by the strain gauge, and the strain signal value is generated based on the first strain value corresponding to the second strain value;

[0116] The acquisition module 503 is used to obtain the calibration coefficient of the strain acquisition device based on the plurality of the first strain values ​​and the plurality of the second strain values;

[0117] The sending module 504 is used to send the calibration coefficient to the strain acquisition device, wherein the calibration coefficient is used to calibrate the parameters of the strain acquisition device.

[0118] In one embodiment of the present invention, the acquisition module 503 is further used to: generate a set of data based on the first strain value and the second strain value having a corresponding relationship; and obtain the calibration coefficient based on multiple sets of data.

[0119] In one embodiment of the present invention, the acquisition module 503 is also used to: determine a sample point in a two-dimensional coordinate system corresponding to a set of data based on a first strain value and a second strain value having a corresponding relationship in a set of data; fit the sample points corresponding to multiple sets of data to obtain a target line segment; and obtain the calibration coefficient based on the function parameters corresponding to the target line segment.

[0120] It should be noted that for details not disclosed in the calibration device of the strain acquisition device in the embodiment of the present invention, please refer to the details disclosed in the calibration method of the strain acquisition device in the embodiment of the present invention, which will not be repeated here.

[0121] In summary, the calibration device of the strain acquisition device of the embodiment of the present invention receives multiple first strain values ​​sent by the strain gauge, receives multiple second strain values ​​sent by the strain acquisition device, wherein the second strain value is generated based on the strain signal value sent by the strain gauge, and the strain signal value is generated based on the first strain value corresponding to the second strain value, and obtains the calibration coefficient of the strain acquisition device based on the multiple first strain values ​​and the multiple second strain values, and sends the calibration coefficient to the strain acquisition device, wherein the calibration coefficient is used to calibrate the parameters of the strain acquisition device. Therefore, the calibration coefficient can be automatically calculated based on the multiple first strain values ​​and the multiple second strain values ​​by the calibration device, and sent to the strain acquisition device, so as to realize the automatic calibration of the strain acquisition device, save a lot of manpower and material resources, and improve the efficiency and accuracy of the calibration of the strain acquisition device.

[0122] In order to implement the above embodiment, the present invention also provides a calibration device for strain acquisition equipment, which is applicable to strain gauges.

[0123] Figure 6FIG. 4 is a schematic structural diagram of a calibration device for a strain acquisition device according to another embodiment of the present invention.

[0124] like Figure 6 As shown, the calibration device 600 of the strain acquisition device according to the embodiment of the present invention includes: a first sending module 601 , a generating module 602 and a second sending module 603 .

[0125] The first sending module 601 is used to send multiple first strain values ​​to the calibration device;

[0126] The generating module 602 is used to generate a strain signal value based on the first strain value;

[0127] The second sending module 603 is used to send the multiple strain signal values ​​to a strain acquisition device, wherein the strain signal value is used to generate a second strain value corresponding to the first strain value.

[0128] In one embodiment of the present invention, the generating module 602 is further configured to: convert the first strain value to obtain the strain signal value.

[0129] In one embodiment of the present invention, before sending the plurality of first strain values ​​to the calibration device, the generating module 602 is further configured to: generate the plurality of first strain values ​​according to a set period.

[0130] It should be noted that for details not disclosed in the calibration device of the strain acquisition device in the embodiment of the present invention, please refer to the details disclosed in the calibration method of the strain acquisition device in the embodiment of the present invention, which will not be repeated here.

[0131] In summary, the calibration device of the strain acquisition device of the embodiment of the present invention sends multiple first strain values ​​to the calibration device, generates strain signal values ​​based on the first strain values, and sends multiple strain signal values ​​to the strain acquisition device, wherein the strain signal value is used to generate a second strain value corresponding to the first strain value. Thus, the strain gauge can send multiple first strain values ​​to the calibration device, and send multiple strain signal values ​​to the strain acquisition device, so as to realize automatic calibration of the strain acquisition device, save a lot of manpower and material resources, and improve the efficiency and accuracy of the calibration of the strain acquisition device.

[0132] In order to implement the above embodiment, the present invention further provides a calibration device for strain acquisition equipment, which is applicable to strain acquisition equipment.

[0133] Figure 7 FIG. 4 is a schematic structural diagram of a calibration device for a strain acquisition device according to another embodiment of the present invention.

[0134] like Figure 7As shown, the calibration device 700 of the strain acquisition device according to the embodiment of the present invention includes: a first receiving module 701 , a generating module 702 , a sending module 703 , a second receiving module 704 and a calibration module 705 .

[0135] The first receiving module 701 is used to receive a plurality of strain signal values ​​sent by a strain gauge, wherein the strain signal value is generated based on a first strain value of the strain gauge;

[0136] The generating module 702 is used to generate a second strain value corresponding to the first strain value based on the strain signal value;

[0137] The sending module 703 is used to send the plurality of second strain values ​​to a calibration device;

[0138] The second receiving module 704 is used to receive the calibration coefficient of the strain acquisition device sent by the calibration device;

[0139] The calibration module 705 is used to calibrate the parameters of the strain acquisition device based on the calibration coefficient.

[0140] It should be noted that for details not disclosed in the calibration device of the strain acquisition device in the embodiment of the present invention, please refer to the details disclosed in the calibration method of the strain acquisition device in the embodiment of the present invention, which will not be repeated here.

[0141] In summary, the calibration device of the strain acquisition device of the embodiment of the present invention receives multiple strain signal values ​​sent by the strain gauge, wherein the strain signal value is generated based on the first strain value of the strain gauge, generates a second strain value corresponding to the first strain value based on the strain signal value, sends the multiple second strain values ​​to the calibration device, receives the calibration coefficient of the strain acquisition device sent by the calibration device, and calibrates the parameters of the strain acquisition device based on the calibration coefficient. Thus, the strain acquisition device can send the multiple second strain values ​​to the calibration device, and receive the calibration coefficient sent by the calibration device, so as to realize the automatic calibration of the strain acquisition device, save a lot of manpower and material resources, and improve the efficiency and accuracy of the calibration of the strain acquisition device.

[0142] In order to implement the above embodiment, Figure 8 As shown, an embodiment of the present invention proposes an electronic device 800, including: a memory 801, a processor 802, and a computer program stored in the memory 801 and executable on the processor 802. When the processor 802 executes the program, the calibration method of the strain acquisition device described above is implemented.

[0143] The electronic device of the embodiment of the present invention executes a computer program stored in a memory through a processor, receives multiple first strain values ​​sent by a strain gauge, receives multiple second strain values ​​sent by a strain acquisition device, wherein the second strain value is generated based on the strain signal value sent by the strain gauge, and the strain signal value is generated based on the first strain value corresponding to the second strain value, obtains a calibration coefficient of the strain acquisition device based on the multiple first strain values ​​and the multiple second strain values, and sends the calibration coefficient to the strain acquisition device, wherein the calibration coefficient is used to calibrate the parameters of the strain acquisition device. Thus, the calibration coefficient can be automatically calculated by the calibration device based on the multiple first strain values ​​and the multiple second strain values, and sent to the strain acquisition device, so as to realize automatic calibration of the strain acquisition device, save a lot of manpower and material resources, and improve the efficiency and accuracy of calibration of the strain acquisition device.

[0144] In order to implement the above embodiment, the embodiment of the present invention provides a computer-readable storage medium, on which a computer program is stored. When the program is executed by a processor, the above calibration method of the strain acquisition device is implemented.

[0145] The computer-readable storage medium of the embodiment of the present invention stores a computer program and is executed by a processor, receives a plurality of first strain values ​​sent by a strain gauge, receives a plurality of second strain values ​​sent by a strain acquisition device, wherein the second strain value is generated based on the strain signal value sent by the strain gauge, and the strain signal value is generated based on the first strain value corresponding to the second strain value, obtains a calibration coefficient of the strain acquisition device based on the plurality of first strain values ​​and the plurality of second strain values, and sends the calibration coefficient to the strain acquisition device, wherein the calibration coefficient is used to calibrate the parameters of the strain acquisition device. Thus, the calibration coefficient can be automatically calculated by the calibration device based on the plurality of first strain values ​​and the plurality of second strain values, and sent to the strain acquisition device, so as to realize automatic calibration of the strain acquisition device, save a lot of manpower and material resources, and improve the efficiency and accuracy of calibration of the strain acquisition device.

[0146] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the present invention.

[0147] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0148] In the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0149] In the present invention, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, a first feature being "above", "above" or "above" a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being "below", "below" or "below" a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0150] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine the different embodiments or examples described in this specification and the features of the different embodiments or examples, without contradiction.

[0151] Although the embodiments of the present invention have been shown and described above, it is to be understood that the above embodiments are exemplary and are not to be construed as limitations of the present invention. A person skilled in the art may change, modify, replace and vary the above embodiments within the scope of the present invention.

Claims

1. A calibration method for a strain acquisition device, characterized in that: Suitable for calibrating equipment, the method comprises: receiving a plurality of first strain values ​​sent by the strain gauge; Receiving a plurality of second strain values ​​sent by a strain acquisition device, wherein the second strain values ​​are generated based on strain signal values ​​sent by the strain gauge, and the strain signal values ​​are generated based on first strain values ​​corresponding to the second strain values; Obtaining a calibration coefficient of the strain acquisition device based on a plurality of the first strain values ​​and a plurality of the second strain values; The calibration coefficient is sent to the strain acquisition device, wherein the calibration coefficient is used to calibrate the parameters of the strain acquisition device.

2. The method according to claim 1, characterized in that The obtaining, based on the plurality of the first strain values ​​and the plurality of the second strain values, a calibration coefficient of the strain acquisition device comprises: Generate a set of data based on the first strain value and the second strain value having a corresponding relationship; The calibration coefficients are obtained based on multiple sets of data.

3. The method according to claim 2, characterized in that The obtaining of the calibration coefficient based on multiple sets of data includes: Based on a first strain value and a second strain value having a corresponding relationship in a set of data, determining a sample point in a two-dimensional coordinate system corresponding to the set of data; Fit the sample points corresponding to multiple groups of data to obtain the target line segment; The calibration coefficient is obtained based on the function parameter corresponding to the target line segment.

4. A calibration method for a strain acquisition device, characterized in that: Applicable to a strain gauge, the method comprises: sending a plurality of first strain values ​​to a calibration device; generating a strain signal value based on the first strain value; The plurality of strain signal values ​​are sent to a strain acquisition device, wherein the strain signal values ​​are used to generate a second strain value corresponding to the first strain value.

5. The method according to claim 4, characterized in that The generating a strain signal value based on the first strain value comprises: The first strain value is converted to obtain the strain signal value.

6. The method according to claim 4, characterized in that Before sending the plurality of first strain values ​​to the calibration device, the method further includes: A plurality of the first strain values ​​are generated according to a set period.

7. A calibration method for a strain acquisition device, characterized in that: Applicable to strain acquisition equipment, the method comprises: receiving a plurality of strain signal values ​​sent by a strain gauge, wherein the strain signal values ​​are generated based on a first strain value of the strain gauge; Based on the strain signal value, generating a second strain value corresponding to the first strain value; sending a plurality of said second strain values ​​to a calibration device; Receiving the calibration coefficient of the strain acquisition device sent by the calibration device; Based on the calibration coefficient, the parameters of the strain acquisition device are calibrated.

8. A calibration device for a strain acquisition device, characterized in that: Suitable for calibrating equipment, the device comprises: A first receiving module, used for receiving a plurality of first strain values ​​sent by the strain gauge; A second receiving module, configured to receive a plurality of second strain values ​​sent by a strain acquisition device, wherein the second strain values ​​are generated based on the strain signal values ​​sent by the strain gauge, and the strain signal values ​​are generated based on the first strain values ​​corresponding to the second strain values; An acquisition module, configured to obtain a calibration coefficient of the strain acquisition device based on a plurality of the first strain values ​​and a plurality of the second strain values; A sending module is used to send the calibration coefficient to the strain acquisition device, wherein the calibration coefficient is used to calibrate the parameters of the strain acquisition device.

9. A calibration device for a strain acquisition device, characterized in that: Suitable for a strain gauge, the device comprises: A first sending module, used for sending a plurality of first strain values ​​to a calibration device; A generating module, configured to generate a strain signal value based on the first strain value; The second sending module is used to send the multiple strain signal values ​​to the strain acquisition device, wherein the strain signal value is used to generate a second strain value corresponding to the first strain value.

10. A calibration device for a strain acquisition device, characterized in that: Applicable to strain acquisition equipment, the device comprises: A first receiving module, configured to receive a plurality of strain signal values ​​sent by a strain gauge, wherein the strain signal value is generated based on a first strain value of the strain gauge; A generating module, configured to generate a second strain value corresponding to the first strain value based on the strain signal value; A sending module, used for sending a plurality of the second strain values ​​to a calibration device; A second receiving module, used for receiving the calibration coefficient of the strain acquisition device sent by the calibration device; A calibration module is used to calibrate the parameters of the strain acquisition device based on the calibration coefficient.

11. An electronic device, characterized in that: include: A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the program, the calibration method for the strain acquisition device according to any one of claims 1 to 7 is implemented.

12. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the program is executed by a processor, the calibration method of the strain acquisition device according to any one of claims 1 to 7 is implemented.

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